CN113049946B - Board card test system - Google Patents
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- CN113049946B CN113049946B CN202110314329.5A CN202110314329A CN113049946B CN 113049946 B CN113049946 B CN 113049946B CN 202110314329 A CN202110314329 A CN 202110314329A CN 113049946 B CN113049946 B CN 113049946B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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Abstract
The invention discloses a board test system, wherein detection in the system can transmit voltage signals of pins (in a power supply interface to be tested on a mainboard to be tested) corresponding to the detection to a processing device one by one, the processing device can judge whether the pins corresponding to the voltage signals are normal or not according to the actual voltage values of the received voltage signals and corresponding preset standard voltage values, and a prompting device is controlled to prompt a judgment result, so that expensive actual external equipment is not required to be purchased, the test cost is reduced, excessive manual participation is not required, and the labor cost is low.
Description
Technical Field
The invention relates to the field of servers, in particular to a board card testing system.
Background
With the rapid development of current computing power and the prevalence of big data, servers have become popular, and a motherboard of a server needs to be tested in various types before being shipped from a factory, which includes testing a plurality of power supply interfaces thereon, however, a mature test system is lacking in the prior art to complete the task, and usually, an actual external device (such as a video card or a network card) is connected to the motherboard for testing, but the price of each actual external device is expensive, such a test mode is costly, and it is difficult to complete the testing of all power supply interfaces on the motherboard.
Therefore, how to provide a solution to the above technical problem is a problem that needs to be solved by those skilled in the art.
Disclosure of Invention
The invention aims to provide a board testing system, which does not need to purchase expensive actual external equipment, reduces the testing cost, does not need excessive manual participation and has lower labor cost.
In order to solve the above technical problem, the present invention provides a board testing system, including:
the first ends of the probes are used for being correspondingly connected with pins in a power supply interface to be tested on a mainboard to be tested one by one, and the second ends of the probes are connected with the processing device and used for transmitting voltage signals of the pins corresponding to the probes to the processing device;
the processing device is used for judging whether the pin corresponding to the voltage signal is normal or not according to the received actual voltage value of the voltage signal and the corresponding preset standard voltage value, and controlling the prompting device to prompt a judgment result;
the prompting device.
Preferably, the board card testing system further includes:
a plurality of probe fixing plates for fixing at least one set of probes;
and each group of probes corresponds to the pins in one corresponding power supply interface to be tested one by one.
Preferably, the pins include a voltage input pin and a ground pin;
the processing device comprises:
the first signal gating chip is used for outputting one of all the voltage signals received by the input end at each time under the control of the processor;
the voltage reduction device with an output end connected with the input end of the analog-to-digital converter is used for reducing the voltage value of the received voltage signal by a preset proportion and then outputting the voltage value;
the analog-to-digital converter is connected with the processor at the output end and is used for performing analog-to-digital conversion on the voltage signal after the voltage value is reduced;
the first end of each probe is connected with the second end of each probe corresponding to the grounding pin, the second end of each probe is respectively connected with the detection end of the processor and the level pull-up circuit, and the control end of each second signal gating chip is connected with the processor and used for outputting one of all the voltage signals received by the input end at a time under the control of the processor;
the processor is configured to amplify the voltage value of the received voltage signal by the preset proportion to obtain the actual voltage value of the voltage signal, judge whether a pin corresponding to the voltage signal is normal according to a preset standard voltage value and the actual voltage value, and prompt a judgment result through the prompting device, and when the second signal gating chip is controlled to provide a voltage signal of the designated ground pin, judge whether the ground pin is normal according to the level state of the detection end of the processor, and prompt the judgment result through the prompting device;
the power supply is respectively connected with the first signal gating chip, the second signal gating chip and the processor and is used for supplying power to the first signal gating chip, the second signal gating chip and the processor;
and the second end of the probe corresponding to the appointed one of the grounding pins is only grounded with the grounding end of the power supply.
Preferably, the voltage reduction means comprises:
the voltage proportional reducing circuit is used for reducing the voltage value of the received voltage signal by a preset proportion, and the output end of the voltage proportional reducing circuit is connected with the input end of the operational amplifier voltage follower;
the operational amplifier voltage follower with the output end as the output end of the voltage reduction device is used for keeping the voltage value of the voltage signal after the voltage value reduction unchanged.
Preferably, the board card testing system further includes:
and the overcurrent protection device is used for switching off when the current value of the current of the overcurrent protection device is greater than a preset value.
Preferably, the overcurrent protection device is a self-recovery fuse.
Preferably, the processor is a single chip microcomputer.
Preferably, the prompting device is:
and the light emitting diode LED matrix is used for prompting each judgment result under the control of the processing device.
Preferably, the processing device is further configured to send each determination result to the motherboard to be tested.
Preferably, the board card testing system further includes:
and the compression joint device is respectively connected with the mainboard to be tested and the processing device and is used for moving the mainboard to be tested under the control of the processing device so that pins in the power supply interface to be tested are connected with the corresponding probes one by one.
The invention provides a board test system, wherein detection in the system can transmit voltage signals of pins (in a power supply interface to be tested on a mainboard to be tested) corresponding to the detection to a processing device one by one, the processing device can judge whether the pins corresponding to the voltage signals are normal or not according to the actual voltage values of the received voltage signals and corresponding preset standard voltage values, and control a prompting device to prompt a judgment result, so that expensive actual external equipment is not required to be purchased, the test cost is reduced, excessive manual participation is not required, and the labor cost is low.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed in the prior art and the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a board testing system according to the present invention;
FIG. 2 is a schematic structural diagram of a processing apparatus according to the present invention.
Detailed Description
The core of the invention is to provide a board testing system, which does not need to purchase expensive actual external equipment, reduces the testing cost, does not need excessive manual participation and has lower labor cost.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a board test system provided in the present invention, the board test system further includes:
the first ends of the probes 1 are used for being correspondingly connected with pins in a power supply interface to be tested on a mainboard to be tested one by one, and the second ends of the probes 1 are connected with the processing device 2 and used for transmitting voltage signals of the pins corresponding to the probes to the processing device 2;
the processing device 2 is used for judging whether the pin corresponding to the voltage signal is normal according to the actual voltage value of the received voltage signal and the corresponding preset standard voltage value, and controlling the prompting device 3 to prompt a judgment result;
and a presentation device 3.
Specifically, in view of the technical problems in the above background art, in combination with consideration that a power supply interface on a server motherboard has a plurality of pins, and voltage values of the pins are different, and in order to detect the power supply interface without using an actual external device, in the embodiment of the present invention, the pins are connected in one-to-one correspondence through the probes 1, and voltage signals on the pins are led out through the probes 1 so as to determine whether the corresponding pins are normal by detecting the voltage signals, so that the second end of each probe 1 is connected to the processing device 2, the processing device 2 compares a specific voltage value with a corresponding preset standard voltage value to determine whether the pins corresponding to the voltage signals are normal, and finally, the prompting device 3 prompts a determination result so that a worker can know the determination result as soon as possible.
The specific number of the probes 1 may be determined by the number of the power supply interfaces to be tested and the number of the pins in each power supply interface, and usually all the pins in all the power supply interfaces on the motherboard to be tested are uniformly tested, so as to implement the full coverage test.
The prompting device 3 may be of various types, such as a display, and the like, and the embodiment of the present invention is not limited herein.
Specifically, when the actual voltage value of the received voltage signal is judged according to the corresponding preset standard voltage value, whether the ratio of the absolute value of the difference between the actual voltage value and the corresponding preset standard voltage value is greater than a preset threshold value or not can be judged, if so, the pin voltage corresponding to the voltage signal is proved to be abnormal, and if not, the pin voltage corresponding to the voltage signal is proved to be normal.
The preset threshold may be set autonomously, for example, may be 3%, and the embodiment of the present invention is not limited herein.
Specifically, the probe 1 may be of various types, for example, a cup-shaped probe, and the embodiment of the present invention is not limited herein.
The invention provides a board test system, wherein detection in the system can transmit voltage signals of pins (in a power supply interface to be tested on a mainboard to be tested) corresponding to the detection to a processing device one by one, the processing device can judge whether the pins corresponding to the voltage signals are normal or not according to the actual voltage values of the received voltage signals and corresponding preset standard voltage values, and control a prompting device to prompt a judgment result, so that expensive actual external equipment is not required to be purchased, the test cost is reduced, excessive manual participation is not required, and the labor cost is low.
On the basis of the above-described embodiment:
as a preferred embodiment, the board card testing system further includes:
a plurality of probe 1 fixing plates for fixing at least one set of probes 1;
each group of probes 1 corresponds to pins in one corresponding power supply interface to be tested.
In particular, considering that the number of the pins is large, the number of the probes 1 is large, and in order to facilitate sorting and operation of workers, the fixing plate for the probes 1 in the embodiment of the invention can fix the probes 1, so that the workers can manage and operate a large number of probes 1 conveniently, and the work efficiency is improved.
To better explain the embodiments of the present invention, please refer to fig. 2, fig. 2 is a schematic structural diagram of a processing apparatus according to the present invention, as a preferred embodiment, the pins include a voltage input pin and a ground pin;
the processing apparatus 2 includes:
a first signal gating chip 21 having a first end connected to the second end of each probe 1 corresponding to the voltage input pin, a second end connected to the input end of the voltage reduction device 23, and a control end connected to the processor 25, for outputting one of all voltage signals received at the input end at a time under the control of the processor 25;
the voltage reduction device 23 is connected with the input end of the analog-to-digital converter 24 at the output end and is used for reducing the voltage value of the received voltage signal by a preset proportion and outputting the reduced voltage value;
the analog-to-digital converter 24 with an output end connected with the processor 25 is used for performing analog-to-digital conversion on the voltage signal after the voltage value reduction;
a second signal gating chip 22, the first end of which is connected to the second end of each probe 1 corresponding to the ground pin, the second end of which is connected to the detection end of the processor 25 and the level pull-up circuit 27, and the control end of which is connected to the processor 25, for outputting one of all the voltage signals received by the input end at a time under the control of the processor 25;
the processor 25 is configured to amplify the voltage value of the received voltage signal by a preset ratio to obtain an actual voltage value of the voltage signal, determine whether a pin corresponding to the voltage signal is normal according to a preset standard voltage value and the actual voltage value, and prompt a determination result through the prompting device 3, and when the second signal gating chip 22 is controlled to provide a voltage signal of an appointed grounding pin, determine whether the grounding pin is normal according to a level state of a detection end of the second signal gating chip, and prompt the determination result through the prompting device 3;
the power supply 26 is respectively connected with the first signal gating chip 21, the second signal gating chip 22 and the processor 25 and is used for supplying power to the first signal gating chip 21, the second signal gating chip 22 and the processor 25;
the second end of the probe 1 corresponding to the designated one of the ground pins is only grounded to the ground terminal of the power supply 26.
Specifically, considering that all pins of the power supply interface may be divided into two types, one type is a voltage input pin, the server motherboard may provide a positive voltage to an external device through the pin, and the other type is a ground GND pin, a voltage value of which is usually zero, so two different detection circuits need to be designed to implement two different sets of detection logics, it should be mentioned that, in order to facilitate the processor 25 in the embodiment of the present invention to compare and determine the voltage value of the voltage signal of the pin in the power supply interface to be detected of the server motherboard, the second end of the probe 1 corresponding to any one of the ground pins may be grounded to the power supply of the processor 25, and during the specific comparison and determination, the state of the ground pin "grounded to its own power supply" may be determined by determining the voltage value state of the other ground pins or the voltage input pins, for example, when it is determined that the voltage values of the consecutive voltage input pins are always jittering, or when it is determined that the voltage signals of the consecutive ground pins cannot make the level of the detection end low, the ground pin "grounded to its own power supply" abnormal state may be determined.
The first signal gating chip 21 and the second signal gating chip 22 are respectively used for managing a voltage input pin and a ground pin, each path of input signal in the signal gating chips specifically corresponds to which pin, the signal gating chips are designed when a circuit structure is designed, and the processor 25 can respectively control the two signal gating chips to output one voltage signal each time according to a sequence when pin testing is needed, and then detection can be started only when different judgment logics are provided for the ground pin and the voltage input pin.
In order to make the voltage value of the voltage signal received by the analog-to-digital converter 24 be within the working voltage range of the voltage signal itself, the voltage reduction device 23 may reduce the voltage value of the voltage signal in advance, wherein the preset ratio may be set autonomously, for example, the preset ratio may be reduced to one tenth of the original ratio.
Specifically, when processing the voltage signal corresponding to the voltage input pin, the processor 25 may first amplify and restore the voltage value of the voltage signal in a digital form to an actual voltage value according to a preset proportion, and then compare the actual voltage value with the preset standard voltage value corresponding to the pin, and when detecting the voltage signal corresponding to the ground pin, because the voltage value of the voltage signal corresponding to the ground pin is zero under normal conditions, the level of the detection end of the processor can be set to a low level, when controlling the second signal gating chip 22 to provide the voltage signal of the designated ground pin, the processor may determine whether the level state of the detection end of the processor is changed to the low level, if the level state is changed to the low level, the ground pin may be proved to be normal, otherwise, the processor may be abnormal.
Of course, the processing device 2 may be in various forms other than the specific configuration in the embodiment of the present invention, and the embodiment of the present invention is not limited herein.
As a preferred embodiment, the voltage reduction device 23 comprises:
a voltage scale reduction circuit 231 having an input terminal as an input terminal of the voltage reduction device 23 and an output terminal connected to an input terminal of the operational amplifier voltage follower 232, for reducing the voltage value of the received voltage signal by a preset ratio;
the operational amplifier voltage follower 232 whose output terminal is the output terminal of the voltage reduction device 23 is used to keep the voltage value of the voltage signal after the voltage value reduction unchanged.
Specifically, the voltage scaling circuit 231 may scale the voltage value, and considering that if the power of the voltage signal with the scaled voltage value cannot satisfy the working power of the analog-to-digital converter 24, the analog-to-digital converter 24 may further reduce the voltage value of the voltage signal with the scaled voltage value in the working process, so as to affect the accuracy of the test, in this embodiment of the present invention, the operational amplifier voltage follower 232 keeps the voltage value of the voltage signal with the scaled voltage value unchanged, so as to improve the accuracy of the detection result.
Of course, the voltage reduction device 23 may be in other forms besides this structure, and the embodiment of the present invention is not limited herein.
As a preferred embodiment, the board test system further includes:
the overcurrent protection device 4 is connected with the second end of the probe 1 corresponding to the appointed grounding pin, and the second end of the overcurrent protection device is grounded with the grounding end of the power supply 26, and is used for switching off when the current value of the current is larger than the preset value.
Specifically, in the wiring process, if a certain voltage input pin is grounded through the probe 1 and the power supply 26 due to design errors of workers and the like, the power supply 26 may be damaged, so that the overcurrent protection device 4 is designed in the embodiment of the present invention, and once a wiring error occurs and the current value of the current of the overcurrent protection device is too large, the overcurrent protection device 4 is disconnected, so as to form protection for the power supply 26.
As a preferred embodiment, the over-current protection device 4 is a self-healing fuse.
In particular, the self-recovery fuse tube has the advantages of small volume, low cost and self-recovery.
Of course, the overcurrent protection device 4 may be of other types besides the self-healing fuse, and the embodiment of the present invention is not limited herein.
As a preferred embodiment, the processor 25 is a single chip.
Specifically, the single chip microcomputer has the advantages of being small in size, low in cost, long in service life and the like.
Of course, the processor 25 may be of various types other than a single chip, and the embodiment of the present invention is not limited herein.
As a preferred embodiment, the prompting device 3 is:
a Light-Emitting Diode (LED) matrix for prompting each judgment result under the control of the processing device 2.
Specifically, each LED in the LED matrix may be used to indicate the state of the designated pin through its own color under the control of the processor 25, for example, the abnormal state may be represented by red, the normal state may be represented by green, and the like, and the embodiment of the present invention is not limited herein.
The general indicator light can be further arranged in the LED matrix, after the processor 25 completes the test on all pins to be tested, if abnormal pins exist, the general indicator light can be controlled to be in a first color, and if abnormal pins do not exist, the general indicator light can be controlled to be in a second color.
Specifically, LEDs have the advantages of small size, low cost, and long life.
Of course, the prompting device 3 may be of other types besides the LED, and the embodiment of the present invention is not limited herein.
As a preferred embodiment, the processing device 2 is further configured to send each determination result to the motherboard to be tested.
Specifically, processing apparatus 2 sends each judged result to the mainboard that awaits measuring after, and the mainboard that awaits measuring can carry out the record with judged result (with test log's form), follow-up staff alright in order looking over when needing, for example when returning the mainboard to the factory maintenance, maintenance person can know the pin of anomaly and overhaul through the log swiftly, is favorable to improving work efficiency.
As a preferred embodiment, the board test system further includes:
and the compression joint device is respectively connected with the mainboard to be tested and the processing device 2 and is used for moving the mainboard to be tested under the control of the processing device 2 so that the pins in the power supply interface to be tested are connected with the corresponding probes 1 one by one.
Specifically, in order to further improve the automation degree, the embodiment of the invention further provides a crimping device, so that the manpower can be liberated, after the mainboard to be tested is prevented from being on the carrier plate, the processing device 2 can connect the pins in the power supply interface to be tested with the corresponding probes 1 one by one through the crimping device and start testing, the automation degree is improved, and the manpower cost is reduced.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising a … …" does not exclude the presence of another identical element in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A board testing system, comprising:
the first ends of the probes are used for being correspondingly connected with pins in a power supply interface to be tested on a mainboard to be tested one by one, and the second ends of the probes are connected with the processing device and used for transmitting voltage signals of the pins corresponding to the probes to the processing device;
the processing device is used for judging whether the pins corresponding to the voltage signals are normal according to the received actual voltage values of the voltage signals and the corresponding preset standard voltage values, and controlling the prompting device to prompt the judgment results, and the processing device comprises: the voltage reduction device is used for reducing the voltage value of the received voltage signal, and the operational amplifier voltage follower is used for keeping the voltage value of the reduced voltage signal unchanged; the processing device also comprises a first signal gating chip and a second signal gating chip; the method comprises the steps that a first signal gating chip detects a voltage signal corresponding to a grounding pin, and whether the grounding pin is normal or not is judged according to the level state of a detection end of the first signal gating chip; the second signal gating chip is connected in series with the voltage reduction device and the operational amplifier voltage follower and is used for amplifying the voltage value of the received voltage signal by the preset proportion to obtain the actual voltage value of the voltage signal and judging whether the pin corresponding to the voltage signal is normal or not according to the preset standard voltage value and the actual voltage value;
the prompting device.
2. A board test system according to claim 1, further comprising:
a plurality of probe fixing plates for fixing at least one set of probes;
and each group of probes corresponds to the pins in the corresponding power supply interface to be tested one by one.
3. The board test system of claim 2, wherein the pins include a voltage input pin and a ground pin;
the processing device comprises:
the first signal gating chip is used for outputting one of all the voltage signals received by the input end at each time under the control of the processor;
the voltage reduction device with an output end connected with the input end of the analog-to-digital converter is used for reducing the voltage value of the received voltage signal by a preset proportion and then outputting the voltage value;
the analog-to-digital converter is connected with the processor at the output end and is used for performing analog-to-digital conversion on the voltage signal after the voltage value is reduced;
the first end of each probe is connected with the second end of each probe corresponding to the grounding pin, the second end of each probe is respectively connected with the detection end of the processor and the level pull-up circuit, and the control end of each second signal gating chip is connected with the processor and used for outputting one of all the voltage signals received by the input end at a time under the control of the processor;
the processor is configured to amplify the voltage value of the received voltage signal by the preset proportion to obtain the actual voltage value of the voltage signal, judge whether a pin corresponding to the voltage signal is normal according to the preset standard voltage value and the actual voltage value, and prompt a judgment result through the prompting device, and when the second signal gating chip is controlled to provide a voltage signal of the designated ground pin, judge whether the ground pin is normal according to the level state of the detection end of the processor, and prompt the judgment result through the prompting device;
the power supply is respectively connected with the first signal gating chip, the second signal gating chip and the processor and is used for supplying power to the first signal gating chip, the second signal gating chip and the processor;
and the second end of the probe corresponding to the appointed one of the grounding pins is only grounded with the grounding end of the power supply.
4. A board test system as in claim 3, wherein the voltage reduction means comprises:
the voltage proportional reducing circuit is used for reducing the voltage value of the received voltage signal by a preset proportion, and the output end of the voltage proportional reducing circuit is connected with the input end of the operational amplifier voltage follower;
the operational amplifier voltage follower with the output end as the output end of the voltage reduction device is used for keeping the voltage value of the voltage signal with the reduced voltage value unchanged.
5. The board test system of claim 4, further comprising:
and the overcurrent protection device is used for switching off when the current value of the current of the overcurrent protection device is greater than a preset value.
6. The board card testing system of claim 5, wherein the over-current protection device is a self-healing fuse.
7. A board card test system as in claim 3, wherein the processor is a single chip microcomputer.
8. The board card test system of claim 1, wherein the prompting device is:
and the light emitting diode LED matrix is used for prompting each judgment result under the control of the processing device.
9. The board card test system according to claim 8, wherein the processing device is further configured to send each determination result to the motherboard to be tested.
10. A board test system according to any of claims 1 to 9, characterized in that it further comprises:
and the compression joint device is respectively connected with the mainboard to be tested and the processing device and is used for moving the mainboard to be tested under the control of the processing device so that pins in the power supply interface to be tested are connected with the corresponding probes one by one.
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| CN111505483A (en) * | 2020-04-27 | 2020-08-07 | 苏州浪潮智能科技有限公司 | Test fixture and equipment of connector interface |
| CN111581038A (en) * | 2020-04-27 | 2020-08-25 | 苏州浪潮智能科技有限公司 | VGA test fixture and equipment |
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| CN113049946A (en) | 2021-06-29 |
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