CN110187256A - A kind of apparatus for testing chip and method - Google Patents
A kind of apparatus for testing chip and method Download PDFInfo
- Publication number
- CN110187256A CN110187256A CN201910343623.1A CN201910343623A CN110187256A CN 110187256 A CN110187256 A CN 110187256A CN 201910343623 A CN201910343623 A CN 201910343623A CN 110187256 A CN110187256 A CN 110187256A
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- 238000012360 testing method Methods 0.000 title claims abstract description 128
- 238000000034 method Methods 0.000 title claims abstract description 30
- 238000001514 detection method Methods 0.000 claims abstract description 41
- 239000000758 substrate Substances 0.000 claims abstract description 25
- 239000000523 sample Substances 0.000 claims description 22
- 230000005611 electricity Effects 0.000 claims description 8
- 230000000694 effects Effects 0.000 abstract description 11
- 238000010586 diagram Methods 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000011897 real-time detection Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/21—Pc I-O input output
- G05B2219/21137—Analog to digital conversion, ADC, DAC
Abstract
The invention discloses a kind of apparatus for testing chip and method, which includes test substrate and test bench, the test substrate include power supply module, voltage detection module and voltage management module, can place chip to be measured on the test bench；Power supply module in the apparatus for testing chip can provide the voltage of various types, size for the chip to be measured, and the chip to be measured is enable to carry out multi-party bit test in the apparatus for testing chip；In addition, in the test process of chip to be measured, the voltage detection module can detect the real-time voltage at the chip both ends to be measured, the power supply module can be adjusted in real time the supply voltage at chip both ends to be measured based on the real-time voltage and the voltage management module, so that the voltages keep constant at the chip both ends to be measured, ensure that chip to be measured in the test effect of the apparatus for testing chip.
Description
Technical field
The present invention designs electronic product test device field, in particular to a kind of apparatus for testing chip and method.
Background technique
In existing chip testing industry, the test of chip various functions is typically carried out with apparatus for testing chip,
In the production test procedure of chip, realized simply, fast, accurately, efficiently in order to facilitate between chip to be measured and test substrate
Connection, it usually needs use probe as connection medium；It is realized using probe and is connected between chip to be measured and test substrate, no
Improve only production efficiency, moreover it is possible to improve measuring accuracy.
In the test process of chip, the power supply module tested on substrate can be the chip power supply to be measured, so as to be measured
Chip is tested under specified voltage, moreover, usually requiring to carry out the supply voltage of power supply module during the test
Monitoring；It is general that only the voltage at power supply module both ends is monitored in existing method, i.e., the voltage etc. at power supply module both ends
It is same as the voltage at the chip both ends to be measured.But due to making to connect by probe between the power supply module and chip to be measured
, when probe flows through biggish electric current, the contact resistance in probe can generate biggish partial pressure, lead to chip both ends to be measured
Voltage is smaller than the voltage that power supply module exports, and has influenced seriously the test effect of chip to be measured, causes test effect excessively poor very
It is extremely unavailable.
Summary of the invention
It is an object of the invention to overcome the deficiencies in the prior art, and the present invention provides a kind of apparatus for testing chip and sides
Method, the voltage at apparatus for testing chip real-time detection chip both ends to be measured during the test, according to the electricity at chip both ends to be measured
Pressure adjusts the supply voltage at the chip both ends to be measured in real time, so that the voltage at the chip both ends to be measured keeps permanent
It is fixed, it ensure that the effect of test.
Correspondingly, the apparatus for testing chip includes test base the embodiment of the invention provides a kind of apparatus for testing chip
Plate and test bench are placed with chip to be measured on the test bench；
The chip to be measured includes the first input pin and the first output pin and the second input pin and the second output
Pin；
The test substrate includes power supply module, voltage detection module and voltage management module；
The power supply module includes power supply module output end, power supply module input terminal and power supply module signal input part, institute
It states power supply module output end to be electrically connected with first input pin, first output pin and the power supply module input terminal
Electrical connection；
The voltage detection module includes voltage detection module output end, voltage detection module input terminal and voltage detecting mould
Block signal output end, the voltage detection module output end are electrically connected with second input pin, second output pin
It is electrically connected with the voltage detection module input terminal；
The voltage management module includes voltage management module by signal input terminal and voltage management module by signal output end, institute
It states voltage detection module signal output end to be electrically connected with the voltage management module by signal input terminal, the voltage management module letter
Number output end is electrically connected with the power supply module signal input part.
Optional embodiment, test zone is provided on the test substrate, and the test bench is set to the test section
On domain.
Optional embodiment, the power supply module are power supply chip, and the power supply chip includes that power supply chip output is drawn
Foot, power supply chip input pin and power supply chip signal input pin；
Power supply chip output contact and power supply chip input contact are correspondingly provided in the test zone；
One end of the power supply chip output contact is electrically connected with the power supply chip output pin, and the other end passes through setting
Probe in the test bench is electrically connected with first input pin；
One end of power supply chip input contact is electrically connected with the power supply chip input pin, and the other end passes through setting
Probe in the test bench is electrically connected with first output pin.
Optional embodiment, the voltage detection module are Hall voltage sensor, the Hall voltage sensor packet
Include sensor output pin, sensor input pin and sensor signal output pin；
Sensor output contact and sensor detection input contact are correspondingly provided in the test zone；
One end of the sensor output contact is electrically connected with the sensor output pin, and the other end is by being arranged in institute
The probe stated in test bench is electrically connected with second input pin；
One end of sensor input contact is electrically connected with the sensor input pin, and the other end is by being arranged in institute
The probe stated in test bench is electrically connected with second output pin.
Optional embodiment, the voltage management module are single-chip microcontroller, and the single-chip microcontroller includes single-chip microcomputer signal input
Pin and single-chip microcomputer signal output pin；
The single-chip microcomputer signal input pin is electrically connected with the sensor signal output pin, and the single-chip microcomputer signal is defeated
Pin is electrically connected with the power supply chip signal input pin out.
The embodiment of the invention provides a kind of apparatus for testing chip, the power supply chip in the apparatus for testing chip can be institute
It states chip to be measured and the voltage of various types, size is provided, so that the chip to be measured is carried out in the apparatus for testing chip more
Azimuth testing；In addition, the Hall voltage sensor can detect the chip both ends to be measured in the test process of chip to be measured
Real-time voltage, the power supply chip can based on the real-time voltage and the single-chip microcontroller to the supply voltage at chip both ends to be measured into
Row is adjusted in real time, so that the voltages keep constant at the chip both ends to be measured, ensure that chip to be measured is filled in the chip testing
The test effect set.
In addition, the embodiment of the invention also provides a kind of chip detecting method, the chip detecting method includes:
Supply voltage is loaded at the both ends of chip to be measured；
The real-time voltage at chip both ends to be measured is detected, and obtains corresponding real-time voltage value signal；
Voltage compensation value signal is generated based on the real-time voltage value signal；
Supply voltage based on chip to be measured described in the voltage compensation value Signal Regulation.
Optional embodiment, the both ends in chip to be measured load supply voltage, comprising:
Supply voltage is loaded at the both ends of chip to be measured based on the power supply module on test substrate.
Optional embodiment, the real-time voltage at the detection chip both ends to be measured, and obtain corresponding real-time voltage value
Signal, comprising:
The real-time voltage that chip both ends to be measured are detected based on the voltage detection module on test substrate is obtained corresponding real-time
Voltage value signal；
The real-time voltage value signal is transmitted to the voltage management mould on the test substrate by the voltage detection module
In block.
Optional embodiment, it is described that voltage compensation value signal is generated based on the real-time voltage value signal, comprising:
The real-time voltage value signal is converted to corresponding real-time voltage digital value by the voltage management module；
The voltage management module subtracts each other the real-time voltage digital value with predetermined voltage threshold, obtains real-time voltage and mends
Value is repaid, generates corresponding real-time voltage compensation value signal, and real-time voltage compensation value signal is transmitted to the power supply mould
In block.
Optional embodiment, the supply voltage based on chip to be measured described in the voltage compensation value Signal Regulation,
Include:
Supply voltage of the power supply module based on chip to be measured described in the real-time voltage offset Signal Regulation.
The embodiment of the invention provides a kind of chip detecting method, which can be described by power supply chip
Chip to be measured provides the voltage of various types, size, and the chip to be measured is enable to carry out in the apparatus for testing chip in many ways
Bit test；In addition, the Hall voltage sensor can detect the reality at the chip both ends to be measured in the test process of chip to be measured
When voltage, the power supply chip 12 can based on the real-time voltage and the single-chip microcontroller to the supply voltage at chip both ends to be measured into
Row is adjusted in real time, so that the voltages keep constant at the chip both ends to be measured, ensure that the test effect of chip to be measured.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it is clear that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
Other attached drawings are obtained according to these attached drawings.
Fig. 1 is the structural schematic diagram of apparatus for testing chip in the embodiment of the present invention；
Fig. 2 is the structural schematic diagram that substrate is tested in the embodiment of the present invention；
Fig. 3 is the three dimensional structure diagram of test bench in the embodiment of the present invention；
The connection schematic diagram of apparatus for testing chip in Fig. 4 embodiment of the present invention；
Fig. 5 is the flow diagram of chip detecting method in the embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts all other
Embodiment shall fall within the protection scope of the present invention.
Embodiment one:
Fig. 1 is the structural schematic diagram of apparatus for testing chip in the embodiment of the present invention.
The embodiment of the invention provides a kind of apparatus for testing chip, the apparatus for testing chip includes test substrate 1 and surveys
Seat 2 is tried, is placed with chip 3 to be measured on the test bench 2.
Specifically, the chip to be measured 3 includes corresponding first input pin 31 and the first output pin 33 and second
Input pin 32 and the second output pin 34.
Fig. 2 is the structural schematic diagram that substrate is tested in the embodiment of the present invention, and Fig. 3 is three of test bench in the embodiment of the present invention
Tie up structural schematic diagram.
In embodiments of the present invention, the test substrate 1 passes through the probe and the core to be measured in test bench 2 for convenience
Piece 3 connects, and test zone 11 is provided on the test substrate 1, and the test bench 2 is set on the test zone 11.
Specifically, the test substrate 1 includes power supply module, voltage detection module and voltage management module.
The connection schematic diagram of apparatus for testing chip in Fig. 4 embodiment of the present invention.
Wherein, the power supply module includes power supply module output end, power supply module input terminal and the input of power supply module signal
End, the power supply module output end are electrically connected with first input pin 31, first output pin 33 and the power supply
Module input electrical connection, the power supply module and the chip 3 to be measured form closed circuit, can be by the power supply module
The chip to be measured 3 is powered.
Preferably, the power supply module is the power supply chip 12 of TPS40304 type, uses power supply chip 12 to be described to be measured
Chip 3 is powered, and is mainly had the advantage that on the one hand, and the power supply chip has the advantages of small in size and convenient and flexible installation, energy one
Simplify the overall structure of the apparatus for testing chip with determining degree；On the other hand, the power supply chip 12 has wider adjusting model
It encloses, and the power supply to power supply chip 12 can be adjusted in real time according to actual needs, different electricity can be provided for chip 3 to be measured
Pressure, to meet the test of all kinds of chips.
Specifically, the power supply chip 12 includes power supply chip output pin 121, power supply chip input pin 122 and supplies
Electrical chip signal input pin 123；Since probe is vertically set in the test bench 2, in order to facilitate power supply chip 12
It is connect between the chip to be measured by probe, is correspondingly provided with power supply chip output contact and confession in the test zone 11
Electrical chip inputs contact: one end of the power supply chip output contact is electrically connected with the power supply chip output pin 121, another
End is electrically connected by the probe being arranged in the test bench 2 with first input pin 31；The power supply chip input touching
One end of point be electrically connected with the power supply chip input pin 122, the other end by the probe that is arranged in the test bench 2 and
First output pin 33 is electrically connected.In embodiments of the present invention, the power supply chip 12 is connected by USB and external power supply
It connects, the external power supply is that the operation of the power supply chip 12 is powered, and the power supply chip 12 is formed with the chip 3 to be measured again
Closed circuit can provide the test voltage of needs by the power supply chip 12 for the chip 3 to be measured.
Wherein, the voltage detection module includes voltage detection module output end, voltage detection module input terminal and voltage
Detection module signal output end, the voltage detection module output end are electrically connected with second input pin 32, and described second
Output pin 34 is electrically connected with the voltage detection module input terminal；Between the voltage monitoring module and the chip to be measured 3
Closed circuit is formed, the real-time voltage at 3 both ends of chip to be measured is monitored by the voltage detection module.
Preferably, the voltage detection module is Hall voltage sensor 13；The Hall voltage sensor 13 can be surveyed
The voltage of random waveform is measured, and measurement range is wide, measurement accuracy is high, suitable for different chips to be measured 3 and different test tune
Section；In addition, the isolation voltage of the Hall voltage sensor 13 can have good up to 9600Vrms between the power supply chip 12
Good electrical isolation, will not have an impact the operation of the power supply chip 12.
Specifically, the Hall voltage sensor 13 includes sensor output pin 131,132 and of sensor input pin
Sensor signal output pin 133；Since probe is vertically set in the test bench 2, in order to facilitate Hall voltage biography
It is connected between sensor 13 and the chip to be measured by probe, is correspondingly provided with sensor output contact in the test zone 11
Input contact is detected with sensor；One end of the sensor output contact is electrically connected with the sensor output pin 131, separately
One end passes through the probe being arranged in the test bench 2 and connect with the second input pin electricity 32；The sensor input touching
One end of point is electrically connected with the sensor input pin 132, and the other end passes through the probe being arranged in the test bench and institute
State the electrical connection of the second output pin 34.In embodiments of the present invention, shape between the Hall voltage sensor 13 and chip to be measured 3
At closed circuit, the real-time voltage at 3 both ends of chip to be measured, the Hall electricity are monitored by the Hall voltage sensor 13
Pressure sensor 13 can generate corresponding real-time voltage value signal according to the real-time voltage.
Wherein, the voltage management module includes voltage management module by signal input terminal and the output of voltage management module by signal
End, the voltage detection module signal output end are electrically connected with the voltage management module by signal input terminal, the voltage management
Module by signal output end is electrically connected with the power supply module signal input part, and the voltage management module, which plays, accepts the voltage
The effect of detection module and the power supply module.
Preferably, the voltage management module is the single-chip microcontroller 14 of MSP430 type, and the single-chip microcontroller includes single-chip microcomputer signal
Input pin 141 and single-chip microcomputer signal output pin 142；
Wherein, the single-chip microcomputer signal input pin 141 is electrically connected with the sensor signal output pin 133；It is described
The real-time voltage value signal that Hall voltage sensor 13 generates is defeated through the sensor signal output pin 133, single-chip microcomputer signal
Enter pin 141 to be transferred in the single-chip microcontroller 14；Particularly, the single-chip microcontroller 14 has analog-digital conversion function, the single-chip microcontroller 14
The real-time voltage value signal can be converted to corresponding real-time voltage digital value；In addition, being provided in the single-chip microcontroller 14 pre-
If voltage threshold, the single-chip microcontroller 14 subtracts each other the real-time voltage digital value with the predetermined voltage threshold, obtains voltage and mends
Value is repaid, and generates corresponding voltage compensation value signal.
Wherein, the single-chip microcomputer signal output pin 142 is electrically connected with the power supply chip signal input pin 123, institute
The voltage compensation value signal for stating the generation of single-chip microcontroller 14 draws through the single-chip microcomputer signal output pin 142, the input of power supply chip signal
Foot 123 is transferred in the power supply chip 12, and the power supply chip 12 is treated according to the voltage compensation value signal and surveys chip 3
Supply voltage is adjusted in real time.
The embodiment of the invention provides a kind of apparatus for testing chip, the operating mode of the apparatus for testing chip is as follows: institute
Stating power supply chip 12 is that the chip 3 to be measured is powered, and is tested the chip 3 to be measured；In test process, the Hall electricity
Pressure sensor 13 detects the real-time voltage of the chip to be measured 3, obtains corresponding real-time voltage value signal, and by the real-time electricity
Pressure value signal is transferred in the single-chip microcontroller 14；The single-chip microcontroller 14 is according to the voltage compensation value signal acquisition voltage compensation value
Signal, and the voltage compensation value signal is transferred in the power supply chip 12；The power supply chip 12 is according to the voltage
The supply voltage that compensation value signal treats survey chip 3 is adjusted in real time, so that the supply voltage of the chip to be measured 3 keeps permanent
It is fixed, it ensure that the test effect of chip 3 to be measured.
The embodiment of the invention provides a kind of apparatus for testing chip, the power supply chip 12 in the apparatus for testing chip can be
The chip to be measured 3 provides the voltage of various types, size, enable the chip to be measured 3 in the apparatus for testing chip into
The multi-party bit test of row；In addition, the Hall voltage sensor 13 can detect the core to be measured in the test process of chip 3 to be measured
The real-time voltage at 3 both ends of piece, the power supply chip 12 can be based on the real-time voltages and the single-chip microcontroller 14 to 3 liang of chip to be measured
The supply voltage at end is adjusted in real time, so that the voltages keep constant at 3 both ends of chip to be measured, ensure that chip 3 to be measured
In the test effect of the apparatus for testing chip.
Embodiment two:
Fig. 5 is the flow diagram of chip detecting method in the embodiment of the present invention.
The embodiment of the invention provides a kind of chip detecting method, the chip detecting method includes:
S51: supply voltage is loaded at the both ends of chip to be measured；
In embodiments of the present invention, it is loaded and is supplied at the both ends of the chip 3 to be measured based on the power supply module on test substrate
Piezoelectric voltage.
Preferably, the power supply module is the power supply chip 12, based on the power supply chip 12 in the chip 3 to be measured
Both ends load supply voltage.
S52: detecting the real-time voltage at chip both ends to be measured, and obtains corresponding real-time voltage value signal；
In embodiments of the present invention, the real-time of 3 both ends of chip to be measured is detected based on the voltage detection module on test substrate 1
Voltage obtains corresponding real-time voltage value signal；Then, the real-time voltage value signal is transmitted to by the voltage detection module
In voltage management module on the test substrate 1.
Preferably, the voltage detection module is Hall voltage sensor 13；In inventive embodiments, the Hall voltage
Closed circuit is formed between sensor 13 and the chip to be measured 3, is detected by the Hall voltage sensor 13 described to be measured
The real-time voltage of chip 3, the Hall voltage sensor 13 can generate corresponding real-time voltage value according to the real-time voltage and believe
Number.
Preferably, the voltage management module is single-chip microcontroller 14；In inventive embodiments, the Hall voltage sensor 13
It is electrically connected with the single-chip microcontroller 14, the real-time voltage value signal that the Hall voltage sensor 13 generates can be transferred to the monolithic
Postorder processing is carried out in machine 14.
S53: voltage compensation value signal is generated based on the real-time voltage value signal；
The real-time voltage value signal is converted to corresponding real-time voltage digital value by the voltage management module；Then,
The voltage management module subtracts each other the real-time voltage digital value with predetermined voltage threshold, obtains real-time voltage offset, produces
Raw corresponding real-time voltage compensates value signal, and real-time voltage compensation value signal is transmitted in the power supply module.
In embodiments of the present invention, there is analog-digital conversion function in the single-chip microcontroller 14, the voltage management module 14 is first
The real-time voltage value signal is converted into corresponding real-time voltage digital value.
Predetermined voltage threshold is provided in the single-chip microcontroller 14；
Then, the single-chip microcontroller 14 subtracts each other the real-time voltage digital value with the predetermined voltage threshold, obtains real-time
Voltage compensation value, and generate corresponding real-time voltage compensation value signal.
The single-chip microcontroller 14 is electrically connected with the power supply chip 12, and the single-chip microcontroller 14 is by the 14 hi voltage compensation value
Signal is transmitted in the power supply chip 12.
S54: the supply voltage based on chip to be measured described in the voltage compensation value Signal Regulation.
Supply voltage of the power supply module based on chip 3 to be measured described in the voltage compensation value Signal Regulation.
In embodiments of the present invention, the power supply chip 12 can compensate value signal according to the real-time voltage, adjust load
To the supply voltage at 3 both ends of chip to be measured, so that the voltages keep constant at 3 both ends of chip to be measured, ensure that be measured
Test effect of the chip 3 in the apparatus for testing chip.
The embodiment of the invention provides a kind of chip detecting method, which can be institute by power supply chip 12
It states chip 3 to be measured and the voltage of various types, size is provided, the chip to be measured 3 is enable to carry out in the apparatus for testing chip
Multi-party bit test；In addition, the Hall voltage sensor 13 can detect the chip to be measured 3 in the test process of chip 3 to be measured
The real-time voltage at both ends, the power supply chip 12 can be based on the real-time voltages and the single-chip microcontroller 14 to 3 both ends of chip to be measured
Supply voltage adjusted in real time so that the voltages keep constant at 3 both ends of chip to be measured, ensure that chip 3 to be measured
Test effect.
In addition, it is provided for the embodiments of the invention a kind of apparatus for testing chip above and method is described in detail,
Herein should be using a specific example illustrates the principle and implementation of the invention, the explanation of above embodiments is
It is used to help understand method and its core concept of the invention；At the same time, for those skilled in the art, according to the present invention
Thought, there will be changes in the specific implementation manner and application range, in conclusion the content of the present specification should not be understood
For limitation of the present invention.
Claims (10)
1. a kind of apparatus for testing chip, which is characterized in that the apparatus for testing chip includes test substrate and test bench, the survey
Chip to be measured is placed on examination seat；
The chip to be measured includes that the first input pin and the first output pin and the second input pin and the second output are drawn
Foot；
The test substrate includes power supply module, voltage detection module and voltage management module；
The power supply module includes power supply module output end, power supply module input terminal and power supply module signal input part, the confession
Electric module output end is electrically connected with first input pin, and first output pin is electrically connected with the power supply module input terminal
It connects；
The voltage detection module includes voltage detection module output end, voltage detection module input terminal and voltage detection module letter
Number output end, the voltage detection module output end are electrically connected with second input pin, second output pin and institute
State the electrical connection of voltage detection module input terminal；
The voltage management module includes voltage management module by signal input terminal and voltage management module by signal output end, the electricity
Pressure detection module signal output end is electrically connected with the voltage management module by signal input terminal, and the voltage management module by signal is defeated
Outlet is electrically connected with the power supply module signal input part.
2. apparatus for testing chip according to claim 1, which is characterized in that be provided with test section on the test substrate
Domain, the test bench are set on the test zone.
3. apparatus for testing chip according to claim 2, which is characterized in that the power supply module is power supply chip, described
Power supply chip includes power supply chip output pin, power supply chip input pin and power supply chip signal input pin；
Power supply chip output contact and power supply chip input contact are correspondingly provided in the test zone；
One end of the power supply chip output contact is electrically connected with the power supply chip output pin, and the other end is by being arranged in institute
The probe stated in test bench is electrically connected with first input pin；
One end of power supply chip input contact is electrically connected with the power supply chip input pin, and the other end is by being arranged in institute
The probe stated in test bench is electrically connected with first output pin.
4. apparatus for testing chip according to claim 2, which is characterized in that the voltage detection module is Hall voltage biography
Sensor, the Hall voltage sensor include sensor output pin, sensor input pin and sensor signal output pin；
Sensor output contact and sensor detection input contact are correspondingly provided in the test zone；
One end of the sensor output contact is electrically connected with the sensor output pin, and the other end is by being arranged in the survey
Probe in examination seat is electrically connected with second input pin；
One end of sensor input contact is electrically connected with the sensor input pin, and the other end is by being arranged in the survey
Probe in examination seat is electrically connected with second output pin.
5. apparatus for testing chip according to claim 2 or 3, which is characterized in that the voltage management module is single-chip microcontroller,
The single-chip microcontroller includes single-chip microcomputer signal input pin and single-chip microcomputer signal output pin；
The single-chip microcomputer signal input pin is electrically connected with the sensor signal output pin, and the single-chip microcomputer signal output is drawn
Foot is electrically connected with the power supply chip signal input pin.
6. a kind of chip detecting method, which is characterized in that the chip detecting method includes:
Supply voltage is loaded at the both ends of chip to be measured；
The real-time voltage at chip both ends to be measured is detected, and obtains corresponding real-time voltage value signal；
Voltage compensation value signal is generated based on the real-time voltage value signal；
Supply voltage based on chip to be measured described in the voltage compensation value Signal Regulation.
7. chip detecting method according to claim 6, which is characterized in that the both ends in chip to be measured load power supply
Voltage, comprising:
Supply voltage is loaded at the both ends of chip to be measured based on the power supply module on test substrate.
8. chip detecting method according to claim 7, which is characterized in that the real-time electricity at the detection chip both ends to be measured
Pressure, and obtain corresponding real-time voltage value signal, comprising:
The real-time voltage that chip both ends to be measured are detected based on the voltage detection module on test substrate, obtains corresponding real-time voltage
Value signal；
The real-time voltage value signal is transmitted in the voltage management module on the test substrate by the voltage detection module.
9. chip detecting method according to claim 8, which is characterized in that described to be produced based on the real-time voltage value signal
Raw voltage compensation value signal, comprising:
The real-time voltage value signal is converted to corresponding real-time voltage digital value by the voltage management module；
The voltage management module subtracts each other the real-time voltage digital value with predetermined voltage threshold, obtains real-time voltage compensation
Value generates corresponding real-time voltage compensation value signal, and real-time voltage compensation value signal is transmitted to the power supply module
In.
10. chip detecting method according to claim 9, which is characterized in that described to be based on the voltage compensation value signal
Adjust the supply voltage of the chip to be measured, comprising:
Supply voltage of the power supply module based on chip to be measured described in the real-time voltage offset Signal Regulation.
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