CN112130089A - Module pin connectivity testing device and system - Google Patents
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- CN112130089A CN112130089A CN202010875637.0A CN202010875637A CN112130089A CN 112130089 A CN112130089 A CN 112130089A CN 202010875637 A CN202010875637 A CN 202010875637A CN 112130089 A CN112130089 A CN 112130089A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
Abstract
The application relates to a module pin connectivity testing device and system. The module pin connectivity test device includes: the device comprises an electric signal acquisition circuit, a control unit, a grounding probe and a test probe corresponding to a pin to be tested of a module to be tested; the grounding probe is used for connecting a grounding pin of a tested module, the testing probe is used for connecting a corresponding pin to be tested, the electric signal acquisition circuit is connected with the grounding probe, the testing probe and the control unit and used for acquiring electric signals and sending the electric signals to the control unit, and the control unit obtains a corresponding numerical value according to the electric signals and judges the connectivity of the pin to be tested connected with the testing probe according to the numerical value. The module pin connectivity testing device can realize connectivity test of a pin to be tested, the connectivity test can be realized without starting up and running a tested module or matching with an AT command, the testing mode is simple, the time consumption is short, and the testing efficiency can be greatly improved.
Description
Technical Field
The present application relates to the field of electrical technologies, and in particular, to a device and a system for testing connectivity of a module pin.
Background
Before a functional module leaves a factory, an electrical connectivity test is usually performed on pins of the module. For example, to make the wireless communication module exert its value normally, it is necessary to perform the verification of the electrical connectivity test on all the produced wireless communication modules.
The connectivity test adopted at present is to perform an electrical connectivity test on the module in a power-on running state by using a test fixture in cooperation with a related at (attention) command. The mode can only test the module which is started to run, and needs the corresponding AT command to be matched, the test process is too time-consuming and labor-consuming, and the test efficiency is low.
Disclosure of Invention
In view of the above, it is desirable to provide a module pin connectivity test apparatus and system capable of improving test efficiency.
A module pin connectivity test device comprises an electric signal acquisition circuit, a control unit, a grounding probe and a test probe corresponding to a pin to be tested of a tested module;
the grounding probe is used for connecting a grounding pin of the tested module, the testing probe is used for connecting a corresponding pin to be tested, the electric signal acquisition circuit is connected with the grounding probe, the testing probe and the control unit and used for acquiring electric signals and sending the electric signals to the control unit, the control unit obtains a corresponding numerical value according to the electric signals and judges the connectivity of the pin to be tested connected with the testing probe according to the numerical value.
In one embodiment, the number of the test probes is multiple and equal to that of the pins to be tested, the electrical signal acquisition circuit comprises a multi-way selection switch, a resistor and a power supply, and the multi-way selection switch comprises a control end, an output end and multiple input ends equal to that of the test probes;
the utility model discloses a multi-channel selection switch, including power supply, ground probe, control unit, multiplexer, power supply, ground probe, control unit, and the common port is connected the one end of resistance and the ground probe, the other end of resistance is connected the control unit, and the common port is connected the output of multi-channel selection switch, corresponding test probe is connected to multi-channel selection switch's input, multi-channel selection switch's control end is connected the control unit, the control unit control multi-channel selection switch's output switches on with each input in proper order, and the receipt switch-.
In one embodiment, the control unit includes an analog-to-digital converter and a control chip, an input end of the analog-to-digital converter is connected to the output end of the multi-way selection switch and the resistor, an output end of the analog-to-digital converter is connected to the control chip, and the control chip is connected to a control end of the multi-way selection switch.
In one embodiment, the power supply is a dc power supply.
In one embodiment, the number of the test probes and the number of the electrical signal acquisition circuits are multiple and equal to the number of the pins to be tested; the electric signal acquisition circuit acquires corresponding electric signals and sends the electric signals to the control unit.
In one embodiment, the control unit comprises a multi-channel analog-to-digital converter and a control chip, wherein one input end of the multi-channel analog-to-digital converter is connected with an electric signal acquisition circuit, and the output end of the multi-channel analog-to-digital converter is connected with the control chip.
In one embodiment, the electrical signal comprises a voltage signal;
and the control unit obtains a voltage value according to the voltage signal, obtains that the connectivity of the pin connected with the test probe is in a normal state when the voltage value is larger than zero and smaller than a preset value, and obtains that the connectivity of the pin connected with the test probe is in an abnormal state otherwise.
In one embodiment, the abnormal state includes a floating state and a short circuit state;
and the control unit determines that the connectivity of the pin to be tested connected with the test probe is in a short-circuit state when the voltage value is equal to zero, and determines that the connectivity of the pin to be tested connected with the test probe is in a suspended state when the voltage value is equal to the preset value.
In one embodiment, the control unit is further configured to generate a test report according to the connectivity of each pin under test.
Above-mentioned module pin connectivity testing arrangement adopts the ground connection probe to be connected with the ground connection pin of the module that awaits measuring, the test probe corresponds with the pin that awaits measuring of the module that awaits measuring and is connected, through signal of telecommunication acquisition circuit connection ground connection probe and test probe, thereby signal of telecommunication acquisition circuit, the test probe, the pin that awaits measuring, ground connection pin and ground connection probe form the return circuit, the signal of telecommunication that signal of telecommunication acquisition circuit gathered can reflect the state in return circuit, thereby through sending the signal of telecommunication to the control unit, the control unit obtains corresponding numerical value and judges the connectivity of the pin that awaits measuring that the test probe is connected. Therefore, the connectivity test of the pin to be tested is realized, the connectivity test can be realized without starting up and running the tested module and matching with an AT command, the test mode is simple, the time consumption is short, and the test efficiency can be greatly improved.
A module pin connectivity test system comprises a terminal and the module pin connectivity test device, wherein the module pin connectivity test device is connected with the terminal.
The module pin connectivity test system adopts the module pin connectivity test device, and similarly, the efficiency of performing connectivity test on the module pins can be improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present application, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a module pin connectivity test apparatus according to an embodiment;
FIG. 2 is a schematic structural diagram of a module pin connectivity test apparatus in another embodiment;
FIG. 3 is a block diagram of a modular pin connectivity test system according to an embodiment.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Embodiments of the present application are set forth in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or be connected to the other element through intervening elements. Further, "connection" in the following embodiments is understood to mean "electrical connection", "communication connection", or the like, if there is a transfer of electrical signals or data between the connected objects.
As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," etc., specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof.
In one embodiment, as shown in fig. 1, a module pin connectivity test apparatus 100 is provided, which includes an electrical signal acquisition circuit 103, a control unit 105, a ground probe, and a test probe 101 corresponding to a pin to be tested of a module under test. The pin to be tested refers to a pin in the module to be tested, which needs to test connectivity, and does not include a ground pin of the module to be tested.
The grounding probe is used for connecting a grounding pin of the tested module. The test probes 101 are used to connect corresponding pins to be tested. Specifically, the connection mode of the ground probe and the ground pin of the tested module may be direct contact for electrical connection, or may be electrical connection through a wire, so that the ground probe and the ground pin form a conducting line; the connection mode of the test probe 101 and the pin to be tested may be direct contact for electrical connection or through a wire, so that the test probe 101 and the pin to be tested form a conducting circuit. The electric signal acquisition circuit 103 is connected to the ground probe, the test probe 101 and the control unit 105, and is configured to acquire an electric signal and send the electric signal to the control unit 105. The control unit 105 obtains a corresponding value according to the electrical signal, and determines connectivity of the pin to be tested connected to the test probe 101 according to the value.
The grounding probe is connected with the grounding pin to form a conducting circuit, the test probe 101 is connected with the corresponding pin to be tested to form a conducting circuit, and the grounding probe and the test probe are connected through the electric signal acquisition circuit 103, so that the electric signal acquisition circuit 103, the test probe 101, the pin to be tested, the grounding pin and the grounding probe form a loop; if the connectivity of the pin to be detected is normal, the loop is electrified, and the electric signal acquired by the electric signal acquisition circuit 103 is normal; if the connectivity of the pin to be tested is abnormal, the electric signal acquired by the electric signal acquisition circuit 103 is abnormal. Therefore, the electrical signal collected by the electrical signal collecting circuit 103 can be analyzed to determine the connectivity of the pin to be tested connected by the test probe 101. Specifically, the control unit 105 may analyze whether a value corresponding to the electrical signal meets a preset condition, so as to determine connectivity of a pin to be tested connected to the test probe 101; if the preset condition is met, the connectivity of the pin to be tested connected with the test probe 101 is in a normal state, otherwise, the connectivity is in an abnormal state.
The electrical signal may include any one of a voltage signal and a current signal. For example, taking an electrical signal as a voltage signal as an example, the electrical signal acquisition circuit 103 acquires the voltage signal and sends the voltage signal to the control unit 105, and the control unit 105 obtains a corresponding voltage value according to the electrical signal and judges connectivity of a pin to be tested, to which the test probe 101 connected to the electrical signal acquisition circuit 103 is connected, according to the voltage value.
Specifically, one test probe 101 corresponds to one pin to be tested, i.e., the corresponding relationship between the test probe 101 and the pin to be tested is one-to-one. The corresponding relationship between the electrical signal acquisition circuit 103 and the test probes 101 can be one-to-many, that is, the plurality of test probes 101 share one electrical signal acquisition circuit 103, and the electrical signal acquisition circuit 103 is sequentially connected with one of the plurality of test probes 101 to acquire electrical signals in turn; the control unit 105 determines the connectivity of the to-be-tested pin corresponding to the currently connected test probe 101 according to the electrical signal, so as to sequentially obtain the connectivity of the to-be-tested pin connected to each test probe 101. The corresponding relationship between the electrical signal acquisition circuit 103 and the test probe 101 can also be one-to-one, that is, one electrical signal acquisition circuit 103 is connected with one test probe 101; the control unit 105 determines connectivity of the pin to be tested connected to the corresponding test probe 101 according to the electrical signals acquired by each electrical signal acquisition circuit 103.
The module pin connectivity testing device 100 is characterized in that a grounding probe is connected with a grounding pin of a module to be tested, a testing probe 101 is correspondingly connected with a pin to be tested of the module to be tested, and the grounding probe and the testing probe 101 are connected through an electric signal acquisition circuit 103, so that the electric signal acquisition circuit 103, the testing probe 101, the pin to be tested, the grounding pin and the grounding probe form a loop, an electric signal acquired by the electric signal acquisition circuit 103 can reflect the state of the loop, and the control unit 105 obtains a corresponding numerical value according to the electric signal and judges the connectivity of the pin to be tested, wherein the pin to be tested is connected with the testing probe 101. Therefore, the connectivity test of the pin to be tested is realized, the connectivity test can be realized without starting up and running the tested module and matching with an AT command, the test mode is simple, the time consumption is short, and the test efficiency can be greatly improved.
In one embodiment, the number of the test probes 101 is equal to the number of the pins to be tested. Referring to fig. 2, the electrical signal acquisition circuit 103 includes a multi-way selection switch 1031, a resistor R1 and a power supply VCC, and the multi-way selection switch 1031 includes a control terminal, an output terminal and a plurality of input terminals equal in number to the test probes 101.
Supply power VCC connecting resistance R1's one end and ground probe, specifically, supply power VCC's positive pole connecting resistance R1's one end, the ground probe is connected to supply power VCC's negative pole, connects the ground pin of the module that awaits measuring with ground connection through the ground probe. The other end of the resistor R1 is connected to the control unit 105, and the common terminal VT is connected to the output terminal of the multi-path selection switch 1031; the input terminals of the multiplexing switches 1031 are connected to the corresponding test probes 101, that is, one input terminal of the multiplexing switch 1031 is connected to one corresponding test probe 101; the control end of the multi-way selector switch 1031 is connected to the control unit 105, and the control unit 105 controls the output end of the multi-way selector switch 1031 to be sequentially connected to each input end and receives the electric signals collected when the input ends are connected.
The multiplexing switch 1031 is used to select one of the plurality of probes to be tested for connection. Specifically, when the control unit 105 controls the first input terminal of the multi-way selection switch 1031 to connect with the output terminal of the multi-way selection switch 1031, the power supply VCC, the resistor R1, the output terminal of the multi-way selection switch 1031, the first input terminal of the multi-way selection switch 1031, the first test probe, the first pin to be tested, the ground pin and the ground probe form a loop, and the control unit 105 determines connectivity of the first pin to be tested connected with the first test probe according to an electrical signal of the common terminal VT connected between the multi-way selection switch 1031 and the resistor R1. Similarly, when the control unit 105 controls the second input terminal of the multi-way selection switch 1031 to connect with the output terminal of the multi-way selection switch 1031, the power supply VCC, the resistor R1, the output terminal of the multi-way selection switch 1031, the second input terminal of the multi-way selection switch 1031, the second test probe, the second pin to be tested, the ground pin and the ground probe form a loop, and the control unit 105 determines connectivity of the second pin to be tested connected with the second test probe according to an electrical signal of the common terminal VT connected between the multi-way selection switch 1031 and the resistor R1.
An electric signal acquisition circuit 103 consisting of a power supply VCC, a resistor R1 and a multi-way selection switch 1031 is connected with the test probe 101, so that the voltage of the power supply VCC is applied to a pin to be tested of a module to be tested after passing through a resistor R1, and the control unit 105 detects the connectivity of the pin to be tested according to an electric signal at the common terminal VT; therefore, the test probes used for the test are switched and selected by switching the input ends, the connectivity of each pin to be tested can be measured in turn by adopting the electric signal acquisition circuit 103, and the test device is simple in structure and convenient to test.
Specifically, the control unit 105 includes an analog-to-digital converter ADC and a control chip (not shown), wherein an input terminal of the analog-to-digital converter ADC is connected to the output terminal of the multiplexing switch 1031 and the resistor R1, specifically, the common terminal VT connected to the output terminal of the multiplexing switch 1031 and the resistor R1; the output end of the ADC is connected to the control chip, and the control chip is connected to the control end of the multi-way selector switch 1031.
The ADC collects the electrical signals at the resistor R1 and the common terminal VT of the multi-way selector switch 1031, performs analog-to-digital conversion on the electrical signals to obtain values, and outputs the values to the control chip, and the control chip determines the connectivity of the pin to be tested to which the test probe 101 is connected according to the values after the analog-to-digital conversion. Therefore, the connectivity of the pin to be tested is judged according to the collected electric signals, the startup of the module to be tested is not needed, and an AT command is not needed, so that the test method is simple and convenient.
Specifically, the control unit 105 may be an MCU (micro control unit) including an analog-to-digital converter ADC and a control chip. It is understood that in other embodiments, the control unit 105 may also be other devices including an analog-to-digital converter ADC and a control chip.
In one embodiment, the power supply VCC is a dc power supply. The dc power supply provides a dc voltage to resistor R1. In particular, the dc power source may be a battery, or may be a voltage converter for receiving mains power and converting the voltage into dc voltage.
In another embodiment, the number of the test probes 101 and the number of the electrical signal acquisition circuits 103 are both multiple and equal to the number of the pins to be tested. That is, one test probe 101 corresponds to one electric signal acquisition circuit 103. The electric signal acquisition circuit 103 acquires a corresponding electric signal and transmits the electric signal to the control unit 105. Specifically, the electrical signal acquisition circuit 103 may include a power supply, a resistor and a switch, wherein a positive electrode of the power supply is connected to one end of the resistor, a negative electrode of the power supply is connected to the ground probe, the other end of the resistor is connected to the corresponding test probe 101 through the switch, and a common end of the resistor and the switch is connected to the control unit 105.
Each test probe 101 is correspondingly connected with an electric signal acquisition circuit 103 for electric signal acquisition, and the electric signal acquisition can be realized.
Specifically, the control unit 105 includes a multi-channel analog-to-digital converter and a control chip, wherein an input end of the multi-channel analog-to-digital converter is connected to the electrical signal acquisition circuit 103, and an output end of the multi-channel analog-to-digital converter is connected to the control chip. Therefore, one multi-channel analog-to-digital converter is adopted to receive the electric signals of the electric signal acquisition circuits 103, and the electric signals are output to the control chip after being subjected to analog-to-digital conversion respectively, so that a plurality of analog-to-digital converters are not needed, and the cost can be reduced.
In one embodiment, the electrical signal comprises a voltage signal. The control unit 105 obtains a voltage value according to the voltage signal; when the voltage value is greater than zero and less than the preset value, the control unit 105 obtains that the connectivity of the pin connected to the test probe 101 is in a normal state, otherwise, if the voltage value is not greater than zero and less than the preset value, the connectivity of the pin connected to the test probe 101 is in an abnormal state.
The preset value is set according to the actual circuit condition. For example, as shown in fig. 2, the preset value is equal to the voltage provided by the power supply VCC; under the condition that a loop formed by the electric signal acquisition circuit 103, the test probe 101, the pin to be tested, the ground pin and the ground probe is in a normal path, the voltage of the resistor R1 and the common terminal VT of the multi-way selector switch 1031 is greater than zero and less than the voltage of the power supply VCC.
Specifically, the control unit 105 performs analog-to-digital conversion on the voltage signal to obtain a voltage value. For example, the control unit 105 includes an analog-to-digital converter and a control chip, the analog-to-digital converter performs analog-to-digital conversion on the voltage signal and outputs a voltage value to the control chip, when the voltage value of the control chip is greater than zero and smaller than a preset value, the connectivity of the pin connected to the test probe 101 is obtained to be in a normal state, otherwise, the connectivity of the pin connected to the test probe 101 is obtained to be in an abnormal state. Connectivity analysis is carried out by collecting voltage, and processing logic is simple, so that connectivity test is simple and test efficiency is high.
In one embodiment, the abnormal state includes a floating state and a short circuit state; when the voltage value is equal to zero, the control unit 105 determines that the connectivity of the pin to be tested connected with the test probe 101 is in a short-circuit state, and when the voltage value is equal to a preset value, determines that the connectivity of the pin to be tested connected with the test probe 101 is in a suspended state. By distinguishing the suspension state from the short-circuit state according to the voltage value, different abnormal conditions can be refined, and the connectivity test result is more accurate.
For example, as shown in fig. 2, the preset value is equal to the voltage provided by the power supply VCC. The correspondence between the voltage value obtained by the control unit 105 from the voltage signal and the connectivity of the corresponding determination is shown in table 1 below.
TABLE 1
| VT | Pin status |
| VCC | Is suspended in the air |
| 0V<VT<VCC | Is normal |
| 0V | Short circuit |
If the voltage value corresponding to the voltage signal acquired by the electric signal acquisition circuit 103 is equal to the voltage of the power supply VCC, the pin to be tested connected with the test probe 101 connected with the electric signal acquisition circuit 103 is determined to be in a suspended state; if the voltage value corresponding to the voltage signal acquired by the electrical signal acquisition circuit 103 is equal to zero, determining that the pin to be tested connected with the test probe 101 connected with the electrical signal acquisition circuit 103 is in a short circuit state; if the voltage value corresponding to the voltage signal acquired by the electrical signal acquisition circuit 103 is greater than zero and less than the voltage of the power supply VCC, it is determined that the pin to be tested connected to the test probe 101 connected to the electrical signal acquisition circuit 103 is in a normal state.
In one embodiment, the control unit 105 is further configured to generate a test report according to the connectivity of each pin under test. Specifically, the contents of the test report include information indicating the connectivity of each pin under test. By generating the test report, the test report is convenient for the staff to check.
Further, the control unit 105 may mark the serial number of the pin to be tested, whose connectivity is in an abnormal state, according to the test result to be highlighted, so as to facilitate identification by the staff. For example, the content of the test report includes the number of each pin to be tested and the connectivity obtained by the corresponding test, the control unit 105 marks the number of the pin to be tested in an abnormal state in red, and when the worker views the test report, the worker can obviously know which pins to be tested have abnormal connectivity by looking at the red mark.
In one embodiment, a module pin connectivity test system is provided, which comprises a terminal and the module pin connectivity test apparatus 100 described above, the module pin connectivity test apparatus 100 being connected to the terminal. Specifically, the control unit 105 of the module pin connectivity testing apparatus 100 is connected to the terminal, and is configured to send information identifying the testing result to the terminal for displaying.
The module pin connectivity test system adopts the module pin connectivity test device 100, and similarly, the efficiency of performing connectivity test on the module pins can be improved.
In one embodiment, the terminal may be a personal computer. It is understood that in other embodiments, the terminal may also be other devices, such as a mobile phone, a tablet, a smart wearable device, and the like.
Specifically, the control unit 105 of the module pin connectivity testing apparatus 100 may generate a test report and send the test report to the terminal, and further, the test report may be marked with a red number of the pin to be tested in an abnormal state. Of course, it can be understood that the control unit 105 of the module pin connectivity testing apparatus 100 may also send the tested connectivity of each pin to be tested to the terminal, and the terminal generates and outputs a test report, and further, the test report may be marked with a red number of the pin to be tested in an abnormal state.
As shown in fig. 3, the control unit 105 is connected to the terminal 200. Specifically, the control unit 105 may be connected to the terminal 200 through a USB (Universal Serial Bus) or a UART (Universal Asynchronous Receiver/Transmitter).
In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A module pin connectivity test device is characterized by comprising an electric signal acquisition circuit, a control unit, a grounding probe and a test probe corresponding to a pin to be tested of a tested module;
the grounding probe is used for connecting a grounding pin of the tested module, the testing probe is used for connecting a corresponding pin to be tested, the electric signal acquisition circuit is connected with the grounding probe, the testing probe and the control unit and used for acquiring electric signals and sending the electric signals to the control unit, the control unit obtains a corresponding numerical value according to the electric signals and judges the connectivity of the pin to be tested connected with the testing probe according to the numerical value.
2. The apparatus for testing connectivity of a module pin according to claim 1, wherein the number of the test probes is equal to the number of the pins to be tested, the electrical signal acquisition circuit comprises a multi-way selection switch, a resistor and a power supply, the multi-way selection switch comprises a control terminal, an output terminal and a plurality of input terminals equal to the number of the test probes;
the utility model discloses a multi-channel selection switch, including power supply, ground probe, control unit, multiplexer, power supply, ground probe, control unit, and the common port is connected the one end of resistance and the ground probe, the other end of resistance is connected the control unit, and the common port is connected the output of multi-channel selection switch, corresponding test probe is connected to multi-channel selection switch's input, multi-channel selection switch's control end is connected the control unit, the control unit control multi-channel selection switch's output switches on with each input in proper order, and the receipt switch-.
3. The apparatus according to claim 2, wherein the control unit comprises an analog-to-digital converter and a control chip, an input terminal of the analog-to-digital converter is connected to the output terminal of the multiplexer switch and the resistor, an output terminal of the analog-to-digital converter is connected to the control chip, and the control chip is connected to the control terminal of the multiplexer switch.
4. The apparatus according to claim 2, wherein the power supply is a dc power supply.
5. The device for testing the connectivity of the module pins according to claim 1, wherein the number of the test probes and the number of the electrical signal acquisition circuits are both multiple and equal to the number of the pins to be tested; the electric signal acquisition circuit acquires corresponding electric signals and sends the electric signals to the control unit.
6. The apparatus as claimed in claim 5, wherein the control unit comprises a multi-channel analog-to-digital converter and a control chip, an input terminal of the multi-channel analog-to-digital converter is connected to an electrical signal acquisition circuit, and an output terminal of the multi-channel analog-to-digital converter is connected to the control chip.
7. The module pin connectivity testing apparatus of claim 1, wherein the electrical signal comprises a voltage signal;
and the control unit obtains a voltage value according to the voltage signal, obtains that the connectivity of the pin connected with the test probe is in a normal state when the voltage value is larger than zero and smaller than a preset value, and obtains that the connectivity of the pin connected with the test probe is in an abnormal state otherwise.
8. The module pin connectivity testing apparatus according to claim 7, wherein the abnormal state includes a floating state and a short circuit state;
and the control unit determines that the connectivity of the pin to be tested connected with the test probe is in a short-circuit state when the voltage value is equal to zero, and determines that the connectivity of the pin to be tested connected with the test probe is in a suspended state when the voltage value is equal to the preset value.
9. The apparatus according to claim 1, wherein the control unit is further configured to generate a test report according to the connectivity of each pin under test.
10. A module pin connectivity test system, comprising terminals and a module pin connectivity test apparatus according to any of claims 1-9, said module pin connectivity test apparatus being connected to said terminals.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| CN113189470A (en) * | 2021-04-01 | 2021-07-30 | 深圳市广和通无线股份有限公司 | Test circuit, test system and test method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113049946A (en) * | 2021-03-24 | 2021-06-29 | 山东英信计算机技术有限公司 | Board card test system |
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| CN114997103A (en) * | 2022-07-18 | 2022-09-02 | 北京云枢创新软件技术有限公司 | One-to-many component connectivity detection system based on interconnection design data |
| CN114912392B (en) * | 2022-07-18 | 2022-09-30 | 北京云枢创新软件技术有限公司 | Connectivity detection configuration system for design data |
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