CN101738534B - Voltage test device and voltage test method - Google Patents
Voltage test device and voltage test method Download PDFInfo
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- CN101738534B CN101738534B CN 200810178142 CN200810178142A CN101738534B CN 101738534 B CN101738534 B CN 101738534B CN 200810178142 CN200810178142 CN 200810178142 CN 200810178142 A CN200810178142 A CN 200810178142A CN 101738534 B CN101738534 B CN 101738534B
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Abstract
The invention discloses a voltage test device and a voltage test method. The voltage test device is used to test a first circuit board, wherein the circuit board comprises a fist connector. The voltage test device is couple with a power supply unit so as to obtain input voltage from the power supply unit, and the power supply unit provides a power supply for the first circuit board. The voltage test device comprises a voltage generating unit, a connection part and a comparison module, wherein the voltage generating unit is used to receive the input voltage and converts the input voltage to a preset voltage; the connection part is used to be coupled with the fist connector of the first circuit board and obtain a first measurement voltage from the fist connector; and the comparison module is coupled with the connection part and the voltage generating unit separately, receives the first measurement voltage and the preset voltage and compares the first measurement voltage with the preset voltage to provide the test result.
Description
Technical field
The present invention is relevant for a kind of proving installation, and particularly relevant for a kind of voltage test device and voltage test method.
Background technology
Along with improving rapidly of electronic industry, Liu Tong Related product quality or kind all are to change with rapid changepl. never-ending changes and improvementsly on the market, and popularizing rapidly of computer is exactly a tangible example.And the motherboard indispensable significant components that is computer, the good and the bad of its quality can determine the usefulness of whole computer.So in order to improve the quality of computer, manufacturer all can improve the reliability of motherboard by test usually.
In the process of producing, for motherboard is carried out functional test, traditional way is that the necessary electronic element is installed on the motherboard, directly powers on and tests.For example: the central processing unit on the motherboard (CPU) is power supply just now after CPU installs.
Yet this kind way has certain risk, if the abnormity of power supply of motherboard, or the connector of electronic component is unusual, might cause to make these electronic components damage after power supply, thereby bring economically loss to manufacturer.
Summary of the invention
The object of the present invention is to provide a kind of voltage test device and voltage test method, to improve the disappearance of prior art.
The present invention proposes a kind of voltage test device, and in order to the test first circuit board, this circuit board comprises first connector.Voltage test device couples power-supply unit, and to obtain input voltage by power-supply unit, power-supply unit provides power supply to first circuit board.Voltage test device comprises voltage generation unit, connecting portion and comparison module.The voltage generation unit receives input voltage and converts input voltage to predeterminated voltage.Connecting portion is in order to coupling first connector of first circuit board, and obtains first by first connector and measure voltage.Comparison module couples connecting portion and voltage generation unit respectively, receives first and measures voltage and predeterminated voltage, and relatively first measure voltage and predeterminated voltage, so that test result to be provided.
The present invention also proposes a kind of voltage test method, and in order to the test first circuit board, this circuit board is provided with first connector, and power-supply unit provides power supply to first circuit board.Voltage test method may further comprise the steps: receive input voltage by power-supply unit; Change this input voltage and become predeterminated voltage; Obtain first by first connector and measure voltage; And relatively first measure voltage and predeterminated voltage, so that a test result to be provided.
Beneficial effect of the present invention is, when motherboard is tested, before the necessary electronic element is not installed in motherboard as yet, whether the power supply state that can detect mainboard power supply is normal, can avoid under the mainboard power supply abnormal conditions, load onto electronic components test running and cause the situation of burning, reach the purpose of detecting host plate the connector power supply capacity.
For above and other objects of the present invention, feature and advantage can be become apparent, preferred embodiment cited below particularly, and conjunction with figs. are described in detail below.
Description of drawings
Figure 1 shows that structure block schematic diagram according to the voltage test device of a preferred embodiment of the present invention.
Figure 2 shows that effect synoptic diagram according to the voltage test device of a preferred embodiment of the present invention.
Figure 3 shows that process flow diagram according to the voltage test method of a preferred embodiment of the present invention.
Embodiment
Figure 1 shows that structure block schematic diagram according to the voltage test device of a preferred embodiment of the present invention.The voltage test device 1 that present embodiment provided is in order to measure the electric power thus supplied of first connector 21 on the first circuit board 2.In the present embodiment, first circuit board 2 is a motherboard, and first connector 21 is central processing unit (CPU) socket.First circuit board 2 also comprises power-supply unit 22.In other embodiments, first circuit board 2 is the motherboard of a computer apparatus, and power-supply unit 22 is the power supply unit of above-mentioned computer apparatus, and power-supply unit 22 is not arranged on the first circuit board 2, and the present invention is not limited this.
Above-mentioned voltage test device 1 comprises second circuit board 11, tertiary circuit plate 12, voltage generation unit 110, connecting portion 120, comparison module 130 and indicating member 140.
Connecting portion 120 comprises second connector 1201, the 3rd connector 1202 and the 4th connector 1203, wherein second connector 1201 and the 3rd connector 1202 are arranged on the second circuit board 11, and second connector 1201 couples the 3rd connector 1202, the four connectors 1203 and is arranged on the tertiary circuit plate 12.Voltage generation unit 110 is arranged on the tertiary circuit plate 12 with comparison module 130, and indicating member 140 can be arranged on the tertiary circuit plate 12 or independent in addition the setting.Above-mentioned the 4th connector 1203 couples comparison module 130, and comparison module 130 also couples voltage generation unit 110 and indicating member 140 respectively.
In addition, above-mentioned second circuit board 11 can be coupled to first connector 21 on the first circuit board 2 by second connector 1201, and second circuit board 11 can be coupled to the 4th connector 1203 on the tertiary circuit plate 12 by the 3rd connector 1202.
Above-mentioned power-supply unit 22 is in order to provide power supply to first circuit board 2.In addition, the voltage generation unit 110 of voltage test device 1 couples power-supply unit 22, to obtain an input voltage by power-supply unit 22.In the present embodiment, power-supply unit 22 provides the 12V input voltage to voltage generation unit 110, and voltage generation unit 110 receives this 12V input voltage and it is changed, to become a stable 5V input voltage.
In addition, voltage generation unit 110 is also in order to convert above-mentioned input voltage to one or more predeterminated voltages, to provide to comparison module 130, wherein predeterminated voltage can comprise the default normal voltage of central processing unit core voltage (Vcore) and/or the voltage adjustment voltage (VTT regulatorvoltage) of central processing unit.In other embodiments, power-supply unit 22 also can directly provide the 5V input voltage to voltage generation unit 110, and the present invention does not limit the input voltage that power-supply unit 22 is provided.
The voltage test device 1 that present embodiment provided can utilize second connector 1201 of connecting portion 120 to couple first connector 21, to obtain one or more measurement voltages by first connector 21.Above-mentioned measurement voltage can pass through the end that second connector 1201, the 3rd connector 1202 and the 4th connector 1203 are imported comparison module 130, makes comparison module 130 can receive above-mentioned measurement voltage.Comparison module 130 also receives the predeterminated voltage that above-mentioned voltage generation unit 110 is provided.
Thus, but comparison module 130 comparative quantities are surveyed voltage and predeterminated voltage, so that a test result to be provided.For example: it is 1.8V that the Vcore of voltage test device 1 obtained first connector 21 measures voltage, and the predeterminated voltage that voltage generation unit 110 provided (the preset standard voltage of Vcore) is 1.8V, then 130 pairs of above-mentioned measurement voltages of comparison module (1.8V) compare with predeterminated voltage (1.8V), can judge these two voltages is consistent, so comparison module 130 can provide one for example to test the test result of passing through, for example, test result is a high-potential voltage.
Similar, for example: it for example is 1.5V that the Vcore of voltage test device 1 obtained first connector 21 measures voltage, and the predeterminated voltage that voltage generation unit 110 is provided is 1.8V, then 130 pairs of above-mentioned measurement voltages of comparison module (1.5V) compare with predeterminated voltage (1.8V), it is inconsistent can judging these two voltages, so comparison module 130 can provide one for example to test the test result of not passing through, this test result for example is a low-potential voltage.
In the present embodiment, indicating member 140 can comprise one or more light-emitting components, such as but not limited to light emitting diode (LED).When if comparison module 130 judges that measuring voltage does not meet predeterminated voltage, then the test result that provided of comparison module 130 will make the light emitting diode of indicating member 140 send ruddiness, with the voltage of reminding tester's first connector 21 problem is arranged, directly do not plug central processing unit.
If comparison module 130 judges when measuring the voltage conforms predeterminated voltages, then the test result that provided of comparison module 130 makes the light emitting diode of indicating member 140 send green glow, is normal with the voltage of representing first connector 21.Between above-mentioned comparison module 130 and indicating member 140, reverser can be set, make comparison module 130 can utilize reverser to control the operation of light emitting diode.
In other embodiments, indicating member 140 also can comprise audio units such as loudspeaker come instructed voltage proving installation 1 with voice or voice mode test result.The present invention does not limit the kind of indicating member 140.
Figure 2 shows that the effect synoptic diagram according to the voltage test device of a preferred embodiment of the present invention, the voltage test device 1 that it is depicted as preferred embodiment of the present invention provides is installed on the synoptic diagram on first connector 21 of first motherboard 2.Because the area of first connector 21 is less, so second circuit board 11 is designed to and the similar structure of first connector, 21 areas.Second connector 1201 is positioned at the bottom of second circuit board 11, disposes a plurality of and contact site 211 corresponding stitch 1,204 first connector 21.These stitch 1204 coupling with contact site 211 partly is to obtain one or more measurement voltages.All the other non-stitch that couple 1204 can reach the purpose of bed hedgehopping voltage test device 1, thereby prevent that voltage test device 1 from damaging other by pressure and being positioned at electronic component on the circuit board.The 4th connector 1203 is positioned at tertiary circuit plate 12 bottoms, and the 3rd connector 1202 with second circuit board 11 couples one to one respectively.Thereby the measurement voltage that second connector 1201 is obtained guides to tertiary circuit plate 12.
After voltage test device 1 is installed on first connector 21 of first circuit board 2 (motherboard), the connector of voltage generation unit 110 with power-supply unit 22 coupled, to obtain the input voltage of voltage test device 1.Whether in the present embodiment, voltage test device 1 also can comprise power supply display unit (figure does not show), couples voltage generation unit 110, normal in order to show the measurement jig power supply.For example, this power supply display unit can be light emitting diode (LED), if voltage test device 1 receives input voltage, then LED is luminous with display voltage proving installation 1 operate as normal.
After receiving input voltage, voltage generation unit 110 is converted into many group predeterminated voltage values with this input voltage, and exports comparison module 130 to.Comparison module 130 receives the predeterminated voltage value respectively and measures magnitude of voltage, and compares, so that test result to be provided.Indicating member 140 acceptance test results are to indicate first connector, 21 electric power thus supplied.
Figure 3 shows that process flow diagram according to the voltage test method of a preferred embodiment of the present invention.
Please refer to Fig. 1～Fig. 3.The voltage test method that preferred embodiment of the present invention provided.
In voltage test method, voltage generation unit 110 is coupled power-supply unit 22 to receive input voltage (step S30).
After obtaining input voltage, voltage generation unit 110 these input voltages of conversion become a plurality of predeterminated voltages (step S31).For example, in the present embodiment, voltage generation unit 110 can comprise a plurality of resistance, thereby input voltage is converted to a plurality of predeterminated voltages, comprising the predeterminated voltage of central processing unit core voltage (Vcore).
Step S32 obtains to measure voltage.Voltage test device 1 is installed on first connector 21, and first connector 21 (CPU socket) has a plurality of contact sites, and second connector, 1201 coupling contact sites 211 are to obtain to measure magnitude of voltage.
Step S33, comparison module 130 receive the predeterminated voltage value respectively and measure magnitude of voltage, and compare, the output comparative result.
Step S34 utilizes the test result of indicating member 140 display voltage proving installations 1.For example, in the present embodiment, indicating member 140 can be a plurality of light emitting diodes, for example, and led module.If the measurement magnitude of voltage that comparison module 130 receives meets the predeterminated voltage value, then export control signal, the light emitting diode of control indicating member 140 sends green glow, and is normal to show 21 power supplies of 2 pairs first connectors of first circuit board this moment; If situation is opposite, then export control signal, the light emitting diode of control indicating member 140 sends ruddiness, and with the caution user, this moment, 21 power supplies of first connector were undesired, tested then and might burn if insert entity CPU.
In sum, the voltage test device that present embodiment provided can be when testing motherboard, before the necessary electronic element is not installed in motherboard as yet, whether the power supply state that detects mainboard power supply is normal, can avoid under the mainboard power supply abnormal conditions, load onto electronic components test running and cause the situation of burning, reach the purpose of detecting host plate the connector power supply capacity.This device can be monitored to save cost at important mainboard power supplies such as central processing unit core voltages in practical application.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; have in the technical field under any and know the knowledgeable usually; without departing from the spirit and scope of the present invention; when can doing a little change and retouching, so protection scope of the present invention is as the criterion when looking claims person of defining.
Claims (10)
1. voltage test device, in order to the test first circuit board, above-mentioned first circuit board comprises first connector, above-mentioned voltage test device couples power-supply unit, to obtain input voltage from above-mentioned power-supply unit, above-mentioned power-supply unit provides power supply to above-mentioned first circuit board, it is characterized in that, above-mentioned voltage test device comprises:
The voltage generation unit receives above-mentioned input voltage, and changes above-mentioned input voltage and become predeterminated voltage;
Connecting portion in order to coupling above-mentioned first connector of above-mentioned first circuit board, and is obtained first from above-mentioned first connector and is measured voltage; And
Comparison module couples above-mentioned connecting portion and above-mentioned voltage generation unit respectively, and receives above-mentioned first measurement voltage and the above-mentioned predeterminated voltage, and above-mentioned comparison module more above-mentioned first measures voltage and above-mentioned predeterminated voltage, so that test result to be provided.
2. voltage test device according to claim 1, it is characterized in that, above-mentioned connecting portion comprises second connector, the 3rd connector and the 4th connector, above-mentioned second connector and the 3rd connector are arranged on second circuit board, and above-mentioned second connector couples above-mentioned the 3rd connector, above-mentioned the 4th connector and above-mentioned voltage generation unit and above-mentioned comparison module are arranged on the tertiary circuit plate, wherein above-mentioned second circuit board is coupled to above-mentioned first connector on the above-mentioned first circuit board by above-mentioned second connector, and above-mentioned second circuit board is coupled to above-mentioned the 4th connector on the above-mentioned tertiary circuit plate by above-mentioned the 3rd connector.
3. voltage test device according to claim 1 is characterized in that above-mentioned voltage test device also comprises indicating member, and above-mentioned indicating member couples above-mentioned comparison module and receives above-mentioned test result to indicate the above-mentioned test result of above-mentioned voltage test device.
4. voltage test device according to claim 3, it is characterized in that above-mentioned indicating member comprises a plurality of light-emitting components, if the above-mentioned first measurement voltage is same as above-mentioned predeterminated voltage, then above-mentioned test result is passed through for test, and above-mentioned these light-emitting components send green glow.
5. voltage test device according to claim 3, it is characterized in that above-mentioned indicating member comprises a plurality of indicator elments, if the above-mentioned first measurement voltage is not same as above-mentioned predeterminated voltage, then above-mentioned test result is not passed through for test, and above-mentioned these indicator elments send ruddiness.
6. voltage test device according to claim 1, it is characterized in that above-mentioned first circuit board is a motherboard, above-mentioned first connector is the central processing unit socket, wherein above-mentioned central processing unit socket comprises a plurality of contact sites, above-mentioned these contact sites of above-mentioned connecting portion coupling part.
7. voltage test method, in order to the test first circuit board, above-mentioned first circuit board comprises first connector, and power-supply unit couples the voltage generation unit and provides power supply to above-mentioned first circuit board, it is characterized in that above-mentioned voltage test method may further comprise the steps:
Above-mentioned voltage generation unit receives input voltage;
Above-mentioned voltage generation unit is changed above-mentioned input voltage and is become predeterminated voltage;
Obtain first from above-mentioned first connector and measure voltage; And
More above-mentioned first measures voltage and above-mentioned predeterminated voltage, so that test result to be provided.
8. voltage test method according to claim 7 is characterized in that, if the above-mentioned first measurement voltage is same as above-mentioned predeterminated voltage, then above-mentioned test result is passed through for test.
9. voltage test method according to claim 7 is characterized in that, if the above-mentioned first measurement voltage is inequality in above-mentioned predeterminated voltage, then above-mentioned test result is not passed through for test.
10. voltage test method according to claim 7 is characterized in that, above-mentioned voltage test method also comprises:
Utilize indicating member to indicate above-mentioned test result.
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| Application Number | Priority Date | Filing Date | Title |
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| CN 200810178142 CN101738534B (en) | 2008-11-24 | 2008-11-24 | Voltage test device and voltage test method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 200810178142 CN101738534B (en) | 2008-11-24 | 2008-11-24 | Voltage test device and voltage test method |
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| CN101738534B true CN101738534B (en) | 2013-07-31 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11828799B2 (en) * | 2022-01-24 | 2023-11-28 | Universal Scientific Industrial (Shanghai) Co., Ltd. | Electrical property testing device of evaluation board |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104330606B (en) * | 2013-07-22 | 2018-03-20 | 技嘉科技股份有限公司 | Measure the voltage of power supply and the tool and its method for measurement of electric current |
| CN111367727B (en) * | 2018-12-25 | 2023-11-17 | 中兴通讯股份有限公司 | Connector structure, and method and device for calculating time delay difference |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101149889A (en) * | 2006-09-18 | 2008-03-26 | 昆达电脑科技(昆山)有限公司 | Display signal detecting device and method |
| CN101174235A (en) * | 2006-10-31 | 2008-05-07 | 佛山市顺德区顺达电脑厂有限公司 | Test board and test system |
| CN101261598A (en) * | 2007-03-06 | 2008-09-10 | 鸿富锦精密工业（深圳）有限公司 | Mainboard test circuit |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101149889A (en) * | 2006-09-18 | 2008-03-26 | 昆达电脑科技(昆山)有限公司 | Display signal detecting device and method |
| CN101174235A (en) * | 2006-10-31 | 2008-05-07 | 佛山市顺德区顺达电脑厂有限公司 | Test board and test system |
| CN101261598A (en) * | 2007-03-06 | 2008-09-10 | 鸿富锦精密工业（深圳）有限公司 | Mainboard test circuit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11828799B2 (en) * | 2022-01-24 | 2023-11-28 | Universal Scientific Industrial (Shanghai) Co., Ltd. | Electrical property testing device of evaluation board |
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