TWM458558U - Control interface for testing system - Google Patents

Description

Control interface for the inspection system

This creation is about a control interface, especially a control interface that can be used to detect the system.

Printed circuit boards or integrated circuits in today's electronic products must undergo various functional tests at every stage of the manufacturing process. Figure 1 is a schematic diagram of a prior art detection system. As shown in FIG. 1, the detection system 1 includes an electronic device 11, a power supply 12, a measuring instrument 13, a control interface 14, a test fixture 15, and a test object 16, wherein the components are connected as shown. The lines for controlling signals, measurement signals, and power signals provided by the control interface 14, the measuring instrument 13, and the power supply 12, respectively, are integrated on the test fixture 15. The test fixture 15 can then be electrically connected between the object to be tested 16 and the test instrument 13 by means of a switch, and the object 16 can be replaced by a manual or machine, and the tests can be completed semi-automatically.

However, since the control interface 14 is usually disposed on the same test machine as the test fixture 15, and the different integrated circuits or printed circuit boards are waiting for the object to be measured, different specifications or types of control interfaces 14 are required. Today, many different control interfaces 14 are replaced on the test machine and/or on the computer (PC) side of the test machine. However, the control interface 14 must be manually extracted during the replacement process, and the control interface 14 and the test Between the machine and/or the computer (PC) end connected to the test machine, it is usually connected through the male and female sockets. However, the frequent drawing and pulling action often causes the connection terminals between the male and female sockets to collide and be damaged.

In general, the number of connection terminals of the male and female sockets described above is related to the number of probes of the control interface 14 or the test fixture 15. As the number of probes of the test fixture 15 increases, the number of connection terminals of the control interface 14 generally also increases, causing variations in the size and size of the control interface 14, which in turn creates compatibility problems during assembly. Another solution is to miniaturize the connection terminals without changing the size or size of the control interface 14, but miniaturization will be more likely to cause collision damage caused by manual assembly.

Therefore, there is a need for a control interface for a detection system that has a programmable function, and the control interface does not need to be frequently replaced to improve the convenience of the user, which is a key point that the relevant practitioners would like to overcome.

An example of the present invention provides a control interface for a detection system, comprising: a power control circuit, comprising: a power management module coupled to a power source and an electronic device; and a relay module, It includes at least two relays, each of which is electrically connected to the electronic device, and a control circuit coupled to the electronic device.

An example of the present invention may further provide a control interface for a detection system, comprising: a power control circuit coupled to a power source and an electronic device; and a control circuit comprising: an interface module Contains: a signal solution And the at least one buffer driver is coupled to the signal decoder; and the at least two control modules are respectively coupled to the at least one buffer driver.

An example of the present invention provides a programmable control interface, comprising: a power management module coupled to a power supply and an electronic device; at least one driver coupled to the power management module And the electronic device; at least two relays respectively coupled to the at least one driver; a signal decoder coupled to the electronic device; at least one buffer driver coupled to the signal decoder; and at least two The group control module is coupled to the at least one buffer driver.

Other objects, advantages and novel features of the present invention can be found by referring to the following detailed examples of the present invention.

1, 2, 3, 4‧ ‧ inspection system

11, 21, 31, 41‧‧‧ electronic devices

12, 22, 32, 42‧‧‧ power supply

13‧‧‧Measurement instruments

14, 23, 33, 43‧‧‧ control interface

15, 24, 34, 44‧‧‧ test fixtures

16, 25, 35, 45‧‧‧ test objects

231, 331, 431‧‧‧ power control circuit

232, 332, 432‧‧‧ control circuit

233, 333, 433‧‧‧ Power Management Module

234, 334, 434‧‧‧ relay modules

235, 335, 435‧‧‧ interface modules

236-1, 236-2...236-n‧‧‧ROM read and write control module

336-1, 336-2...336-n‧‧‧ROM read and write control module

436-1, 436-2...436-n‧‧‧ROM read and write control module

335a, 435a‧‧SCL and SDA Control Signal Decoder

335b, 435b‧‧‧buffer and line drivers

434a‧‧‧ drive

434b1, 434b2, ...434bn‧‧‧ relay

437‧‧‧ Voltage Regulator

I1, i2, i3‧‧‧ input

O1, o2, o3‧‧‧ output

I/O1, I/O2‧‧‧ input/output

P1, P2, P2'‧‧‧ power signal

P3, P3-1, P3-2~P3-n‧‧‧ power signal

P4, P5‧‧‧ power signal

C1‧‧‧ control signal

C2, C2-1, C2-2...C2-n‧‧‧ control signals

C3, C3-1, C3-2...C3-n‧‧‧ control signals

C4, C4-1, C4-2...C4-n‧‧‧ control signals

D1, D1-1, D1-2...D1-n‧‧‧ data signals

A detailed description of the pre-production abstract and the above preferred examples will be better understood when viewed in conjunction with the accompanying drawings. However, it should be understood that the creation is not limited to the precise arrangement and equipment provided. In addition, the elements shown in the drawings are not necessarily drawn to scale. For example, the dimensions of some of the elements may be exaggerated relative to the other elements for clarity. In the drawings: FIG. 1 is a schematic diagram of a detection system in the prior art; FIG. 2 is a schematic diagram of a detection system according to an example of the present creation; FIG. 3 is a schematic diagram of a detection system according to another example of the present creation; 4 is a schematic diagram of a detection system in accordance with another example of the present creation; and FIG. 5 is a flow chart of a method of operation of the detection system in accordance with an example of the present creation.

Reference will now be made in detail to the examples illustrated in the accompanying drawings. Wherever possible, the same reference numerals will be used to refer to the

2 is a schematic diagram of a detection system 2 in accordance with one example of the present creation. The detection system 2 can include an electronic device 21, a power supply 22, a control interface 23, a test fixture 24, and a test object 25. The control interface 23 is coupled to the electronic device 21, the power supply 22, and the test fixture 24, respectively.

The electronic device 21 can generate at least one control signal. The control interface 23 can also include a power control circuit 231 and a control circuit 232. The power control circuit 231 receives and processes the power signal P1 from the power supply 22 and the control signals C1 and C2 from the electronic device 21, and generates power signals P2 and P3 according to the power signal P1 and the control signals C1 and C2, and generates the power signals. P2 and P3 are output to the test fixture 24. The control circuit 232 receives and processes the control signal C3 from the electronic device 21, and generates a control signal C4 according to the control signal C3, and outputs the control signal C4 to the test fixture 24. The power signals P2 and P3 and the control signal C4 can be transmitted to the object to be tested 25 electrically connected to the test fixture 24, so as to be the object to be tested 25 and the circuit or electronic components thereon (for example, resistors, capacitors, inductors, amplifiers, Memory (Random access memory, "RAM", Read only memory, "ROM", Electrically Erasable Programmable Read Only Memory, "EEPROM" or Flash ROM), IC chip, Gamma IC or others) is used to test various electrical signals.

In addition, the control interface 23 can also perform an operation of reading data from the object to be tested 25. When the object to be tested 25 receives the control signal C4 and/or the power signals P2 and P3 from the control interface 23, the object to be tested 25 can generate the data signal D1 and output it to the control interface 23. The data signal D1 is transmitted back to the electronic device 21 through the control circuit 232. Therefore, the control interface 23 can read the ROM data inside the IC of the object to be tested 25 and the circuit or electronic component (such as EEPROM, Flash ROM, IC chip, Gamma IC or the like) on the object to be tested 25, so as to be on the electronic device 21. The data is compared to determine whether the information on the object to be tested 25 is correct.

The electronic device 21 may be, but not limited to, a server, a host computer, an industrial computer, a personal computer, a laptop computer, a notebook computer, a tablet computer, a microprocessor, a smart personal device, or the like in this embodiment. The electronic device 21 can have at least one signal transmission port (not shown), and the signal transmission port can be a universal serial bus (USB) port, and a high-efficiency series bus bar (Institute of Electrical and Institute of Electrical and Electronics (Institute of Electrical and Institute of Electrical and Electronics). Electronic Engineers) released IEEE1394), a Bluetooth port, an Infrared Data Association (IrDA) port, an Ethernet network port, a Serial Peripheral Interface ("SPI") port, a Inter-Integrated Circuit (I ² C)埠, a General Purpose Input/Output (“GPIO”)埠, a Peripheral Component Interconnect (“PCI”)埠, a PCI Express埠, Serial advanced technology attachment (Serial ATA) or SATA Serial ATA or SATA, Print port (LPT), Parallel port Or a parallel port (or Serial Port, "Com" or serial port, RS-232, RS-422, RS-485).

The control interface 23 can include a USB port connector (Type A or Type B USB port), an IEEE 1394 port connector, an Ethernet connector, an SPI connector, an I ² C connector, and a GPIO connection. , a PCI connector, a PCI Express port connector, a SATA port connector, a printer, a connector, a parallel port or a serial port (if it corresponds to Bluetooth® or IrDA埠, there is no physical connection Device). Therefore, each of the electronic device 21 and the control interface 23 can support data transmission of one of the following, such as a universal serial bus (USB) (type A or type B), IEEE 1394, Bluetooth, IrDA, Ethernet, SPI, I ² C, a GPIO, PCI, PCI Express, Serial Advanced Technology Attach (Sequence ATA or SATA) protocol, Printer Print port LPT, Parallel Parallel port and Serial Serial Port. In addition, the type of communication protocol between the electronic device 21 and the control interface 23 can be mutually supported by the two.

Please continue to refer to FIG. 2 , wherein the control interface 23 may further include input terminals i1 , i2 , i3 and input/output terminals I/O1 respectively receiving the power signal P1 from the power supply 22 and/or from the electronic device 21 . Control signals C1, C2, C3. The control interface 23 can also include an output terminal o1, o2 and an input/output terminal I/O2 that output a power signal P2, P3 and/or a control signal C4, respectively.

The power control circuit 231 can include a power management module 233 and a relay module 234. The power management module 233 is coupled to the input terminal i1 for receiving the power signal P1 from the power supply 22; the power management module 233 is coupled to the input terminal i2 for receiving the control signal C1 from the electronic device 21. Relay module 234 is coupled The input terminal i3 is configured to receive the control signal C2 from the electronic device 21. The power management module 233 generates the power signals P2 and P2' according to the received power signal P1 and the control signal C1, and outputs the power signal P2 through the output terminal o1, and outputs the power signal P2' to the relay module 234. The relay module 234 can be coupled to the power management module 233 for receiving the power signal P2' from the power management module 233, and then generating the power signal P3 according to the power signal P2' and the control signal C2, and outputting the terminal o2 The power supply signal P3 is output.

The control circuit 232 can include an interface module 235 and at least two sets of ROM read/write control modules 236-1, 236-2, ... 236-n, where n is a positive integer greater than or equal to 2. The interface module 235 can include, but is not limited to, an Inter-Integrated Circuit (I ² C) and/or a Serial Peripheral Interface Bus (SPI) circuit. The interface module 235 is coupled to the input/output terminal I/O1 for receiving the control signal C3 from the electronic device 21. The ROM read/write control modules 236-1, 236-2, ... 236-n are respectively coupled to the interface module 235, and output the control signal C4 through the input/output terminal I/O2.

The control signal C1 from the electronic device 21 is used to control the power management module 233 to determine whether the power signal P1 from the power supply 22 is converted into the power signal P2 by the control power management module 233. The power supply signal P2 is outputted from the output terminal o1 to the test fixture 24 and the object to be tested 25. The power signal P2 can be used as a load power source for the object to be tested 25, and has a DC voltage of about 3.3 volts (V) to 30 V and a maximum current of 10 amps (A).

Wherein, the control signal C2 from the electronic device 21 is used to control The relay module 234 determines whether the power supply signal P3 is output to the test fixture 24 and the object to be tested 25 and the circuit or electronic component thereon, such as an EEPROM, through the output terminal o2, so as to cooperate with the input/output terminal I. The control signal C4 output by /O2 provides a required test voltage when testing various electrical signals of the EEPROM.

The control signal C3 from the electronic device 21 is used to control the interface module 235 to generate the control signal C4. The control signal C4 can have a test serial data line (SCL) and serial data ( Serial Clock Line (SDA) analog signal waveform, then read and write control modules 236-1, 236-2, ... 236-n through at least 2 sets of ROM, and through input/output I/O2, The control signal C4 including the SCL and SDA analog signal waveforms is output to the test fixture 24 and the object to be tested 25 and circuit or electronic components thereon, such as an EEPROM, for testing various electrical signals of the EEPROM.

In addition, when the object to be tested 25 and the circuit or electronic component thereon, such as an EEPROM, receive the control signal C4 and/or the power signals P2 and P3 from the control interface 23, the object under test 25 can generate the data signal D1, the data. The signal D1 may have a data serial data line (SCL) and a serial clock line (SDA) analog signal waveform of the ROM data inside the IC such as an EEPROM, and the input of the control interface 23 is provided. /output I / O2, through at least two groups of ROM read and write control modules 236-1, 236-2, ... 236-n, and then transmit the data signal D1 containing the SCL and SDA analog signal waveforms to The interface module 235 and the interface module 235 output the data signal D1 including the SCL and SDA analog signal waveforms to the electronic device 21 through the input/output terminal I/O1. In this way, the electronic device 21 can be connected with the object to be tested 25 The circuit or electronic component thereon, such as an EEPROM or the like, internal ROM data is compared to determine whether the data on the object to be tested 25 is correct.

In summary, the power supply 22 cooperates with the power management module 233, the relay module 234, and the electronic device 21 of the control interface 23, and can cooperate with the object to be tested 25 to provide required timing for voltage switching management and voltage tightening. Test items, etc. In other words, the control object 25 can be used for control of the multi-purpose input or output test power by controlling the relay module 234 having at least two relays. The hardware circuit of the control interface 23 can be matched with the control signal change (for example, the high/low level change) on the electronic device 21 (for example, the PC end), and the interface module 235 such as I ² C or SPI can be used, and at least two groups or more can be used. The ROM read/write control modules 236-1, 236-2, ... 236-n are electrically connected to the object to be tested 25, and can read or write the EEPROM, Flash ROM, Gamma IC on the object to be tested 25. IC internal ROM data. Once the user/detector needs to compare the IC ROM, the protocol and the command can be provided on the line (On Board), and at least two or more different ROMs can be read/written at a time. In other words, at least two or more sets of ROMs can be read/written on the circuit design.

In addition, with the customer's required measurement items, the instrumentation measurement can be used for multi-function data extractor (such as Agilent 34970A), oscilloscope or electric meter. If the measurement voltage can be customized to expand multiple sets of voltages. It can also test current, frequency, resistance, etc., and use test software control.

Through the control interface to read and write ROM and control voltage, as well as the control and data return of the measuring instrument, the engineering staff can set different parameters according to different types of objects to be tested. If the same type of object to be tested only needs to read the corresponding parameters, Quickly set this up The items to be measured by the block to be tested are transmitted back to the PC end after the measurement is started, and the final result of each object to be tested is analyzed and compared, and stored as a report and stored back to the server.

3 is a schematic diagram of a detection system 3 in accordance with another example of the present creation. Referring to FIG. 3, the structure of the detection system 3 can be similar to that of the detection system 2 shown in FIG. 2, wherein the control module 332 of the control interface 33, the interface module 335 can include an SCL and SDA control signal decoder 335a. And at least one buffer and line driver 335b. The SCL and SDA control signal decoder 335a is configured to receive the control signal C3 from the electronic device 31, and the at least one buffer and line driver 335b is coupled to the SCL and SDA control signal decoder 335a and at least two groups of ROM read/write control. Between modules 336-1, 336-2, ... 336-n.

4 is a schematic diagram of a detection system 4 in accordance with another example of the present creation. Referring to FIG. 4, the structure of the detection system 4 can be similar to the detection system 3 shown in FIG. 3, and the power control circuit 431 of the control interface 43 can further include at least one voltage regulator 437; and the relay module 434 can include at least A driver 434a and at least two or more relays 434b1, 434b2, ..., 434bn, n are positive integers greater than or equal to two. The driver 434a is coupled to the input terminal i3 for receiving the control signal C2 from the electronic device 41. The driver 434a can be coupled to the power management module 433 for receiving the power signal P2' from the power management module 433. The at least two or more relays 434b1, 434b2, ... 434bn are respectively coupled to the driver 434a, and output the power signal P3 through the output terminal o2.

In summary, the electronic device 41 can pass through at least two or more relays 434b1, 434b2, ..., 434bn and at least two or more The control interface 43 of the ROM read/write control modules 436-1, 436-2, ... 436-n and the test fixture 44, at least two or more circuits or electronic components to be tested, such as EEPROM, on the object 45 to be tested At the same time, test, or read or compare the ROM data inside the IC.

For example, as shown in FIG. 4, the object to be tested 45 may have, but is not limited to, n devices to be tested, such as an EEPROM, and the control interface 43 may pass through the test fixture 44 to read n ROM read/write control modules 436-1, 436. -2, ... 436-n and corresponding n relays 434b1, 434b2, ... 434bn are respectively coupled to corresponding n components to be tested on the object to be tested 45, such as EEPROM, and then the electronic device 41 It is possible to test n components to be tested at the same time, or to read or compare ROM data inside the IC.

The electronic device 41 can transmit the n control signals C2-1, C2-2, ..., C2-n to the relay module 434 of the control interface 43 through at least one signal transmission port (not shown). And n control signals C3-1, C3-2, ... C3-n to the interface module 435 of the control interface 43. Then, the driver 434a in the relay module 434 receives the n control signals C2-1, C2-2, ..., C2-n from the electronic device 41, and then sequentially assigns them to the drivers 434a. n relays 434b1, 434b2, ... 434bn for generating n power supply signals P3-1, P3-2, ..., P3-n, and n power supply signals P3-1, by output terminal o2, P3-2, ..., P3-n are output to the test fixture 44 and the object to be tested 45. The SCL and SDA control signal decoder 435a in the interface module 435 receives n control signals C3-1, C3-2, ..., C3-n from the electronic device 41, and generates n simulations with SCL and SDA. The signal waveform control signals C4-1, C4-2, ... C4-n are sequentially assigned to the sub-sequences through the buffer and line driver 435b. The n ROM read/write control modules 436-1, 436-2, ... 436-n are coupled to the buffer and line driver 435b, and the SCL and SDA are included by the input/output terminal I/O2. The n control signals C4-1, C4-2, ..., C4-n of the analog signal waveform are output to the test fixture 44 and the object to be tested 45.

Then, the n power supply signals P3-1, P3-2, ..., P3-n and the corresponding n control signals C4-1, C4, 2, ..., C4-n can pass through the test fixture 44. The n devices to be tested corresponding to the object to be tested 45, such as EEPROM, can be tested at the same time, or n devices to be tested, such as EEPROM, can generate n data signals D1 with SCL and SDA analog signal waveforms. -1, D1-2, ... D1-n, and pass the data signals D1-1, D1-2, ... D1-n through the input/output terminal I/O2 of the control interface 43 n ROM read/write control modules 436-1, 436-2, ... 436-n are transmitted to the buffer and line driver 435b, and then the buffer and line driver 435b passes the input/output terminal I/O1, n The data signals D1-1, D1-2, ..., D1-n are output to the electronic device 41, so that the n pieces of the device to be tested, such as the EEPROM, can be simultaneously read or compared with the ROM data inside the IC.

In addition, referring to FIG. 4, the power control circuit 431 of the control interface 43 may further include at least one voltage regulator 437. The power management module 433 can generate the power signals P2, P2', and P4 according to the received power signal P1 and the control signal C1, and then output the power signal P4 to the voltage regulator 437. The voltage regulator 437 can be coupled to the power management module 433 for receiving the power signal P4 from the power management module 433. After the power signal P4 is converted into the power signal P5 by the voltage regulator 437, the output terminal o3 is used. The power signal P5 is output to the test fixture 44 and the object to be tested 45. And the regulator 437 It can be, but is not limited to, a 1.2V to 9.7V Voltage Regulator and can provide a power signal P5, such as a programming voltage (VPP) power supply, as one-time programmable on the object to be tested 45 (One Time) Programmable, OTP) The specific power supply required for the IC to write.

5 is a flow chart of a method of operation of a detection system in accordance with one example of the present teachings. Referring to FIG. 5, in step 501, the test software is started; in step 502, the model (the model measurement parameter that the engineer has set) is input; in step 503, the user mode is entered; in step 504, Putting the test object on the test fixture; in step 505, scanning the barcode (Barcode) on the object to be tested in a manual or automatic manner; in step 506, pressing the fixture, measuring The thimble is topped to the measuring point of the object to be tested; in step 507, the test page on the test software is pressed to start; in step 508, the measurement is started, and the checksum and amount of the ROM in the IC are measured according to the customer's demand. Measure voltage or current, frequency, etc.; in step 509, the measurement ends, the test software analysis is correct than the ROM on the object to be tested, and whether the measurement data is within the range is judged to pass (PASS) or fail (FAIL). In step 510, the pass or fail of the object to be tested and its related data are stored into a report according to the bar code of the object to be tested, and returned to the server (Server); in step 511, the pull-up is performed. Fix the fixture and take out the object to be tested, then repeat steps 504 to 511 to enter An analyte under test until the test is completed for all the specimens, the end of the entire operation process.

In summary, the advantage of this creation is that the timing can be freely defined through the control interface. In addition to the I ² C and SPI common formats, the modification program can be adjusted according to the client's own protocol and timing; The way to adjust the integration of fixtures, software, control interface and measuring instruments to meet the measurement methods required by customers; and support multiple ROM readings, multiple relays and hundreds of voltages. Data measurement and product judgment. Then, the measurement data obtained after the test is transmitted to the electronic device to analyze, judge or measure the measurement data (for example, voltage, current, impedance, waveform, checksum or the like of the object to be tested). Compare and then make test results. The electronic device can also make each test result into a report, report or record.

In describing a representative example of the present invention, the present specification may have presented the method and/or process of the present invention as a specific sequence of steps. However, since the method or process does not rely on the specific order of the steps herein, the method or process should not be limited to the specific sequence of the steps. Those of ordinary skill in the art will appreciate that other sequences of steps may be employed. Therefore, the specific order of the steps in this specification should not be construed as limiting the scope of the patent application. In addition, the scope of the patent application for the method and/or process of the present invention should not be limited to the execution of the various steps in this order, and those skilled in the art can readily appreciate that the sequence may vary and still belong to the present invention. The spirit and scope of creation.

Those skilled in the art will appreciate that changes can be made to such examples without departing from the broad inventive concepts of the above examples. Therefore, it is to be understood that the present invention is not limited to the specific examples disclosed, but is intended to cover all modifications of the present invention as defined by the scope of the appended claims.

2‧‧‧Detection system

21‧‧‧Electronic devices

22‧‧‧Power supply

23‧‧‧Control interface

231‧‧‧Power Control Circuit

232‧‧‧Control circuit

233‧‧‧Power Management Module

234‧‧‧Relay module

235‧‧‧Interface module

236-1~236-n‧‧‧ROM read and write control module

24‧‧‧Test fixture

25‧‧‧Test object

I1, i2, i3‧‧‧ input

O1, o2‧‧‧ output

I/O1, I/O2‧‧‧ input/output

Claims (21)

A control interface for a detection system, comprising: a power control circuit, comprising: a power management module coupled to a power source and an electronic device; and a relay module comprising at least two relays The at least two relays are electrically connected to the electronic device, respectively; and a control circuit coupled to the electronic device. The control module of claim 1, wherein the relay module further comprises at least one driver coupled to the power management module, the electronic device, and the at least two relays. The control interface of claim 1, wherein the power management module receives a first power signal from the power source and a first control signal from the electronic device, and outputs a second power signal. The control interface of claim 2, wherein the at least one driver receives at least one second control signal from the electronic device, and the at least two relays respectively output at least one third power signal. The control circuit of the first aspect of the invention, wherein the control circuit further comprises: an interface module coupled to the electronic device; and at least two control modules coupled to the interface module. The control interface of claim 5, wherein the interface module receives at least one third control signal from the electronic device, and the at least two control modules respectively output at least one fourth control signal. For example, in the control interface of claim 5, wherein the interface module further comprises: a signal decoder coupled to the electronic device; and at least one buffer driver coupled between the signal decoder and the at least two sets of control modules. For example, in the control interface of claim 1, the power control circuit further includes at least one voltage regulator coupled to the power management module and outputting a fourth power signal. A control interface for a detection system, comprising: a power control circuit coupled to a power supply and an electronic device; and a control circuit comprising: an interface module comprising: a signal decoder, And coupled to the electronic device; and at least one buffer driver coupled to the signal decoder; and at least two sets of control modules respectively coupled to the at least one buffer driver. The power control module further includes a power management module coupled to the power source and the electronic device, respectively. The control interface of claim 10, wherein the power management module receives a first power signal from the power source and a first control signal from the electronic device, and outputs a second power signal. For example, in the control interface of claim 10, the power control circuit further includes a relay module, and the relay module is respectively coupled to the power management module And the electronic device. The control module of claim 12, wherein the relay module further includes: at least one driver coupled to the power management module and the electronic device; and at least two relays coupled to the At least one drive. The control interface of claim 13, wherein the at least one driver receives at least one second control signal from the electronic device, and the at least two relays respectively output at least one third power signal. The control interface of claim 9, wherein the signal decoder receives at least one third control signal from the electronic device, and the at least two control modules respectively output at least one fourth control signal. For example, in the control interface of claim 10, the power control circuit further includes at least one voltage regulator coupled to the power management module and outputting a fourth power signal. A programmable control interface includes: a power management module coupled to a power supply and an electronic device; at least one driver coupled to the power management module and the electronic device; at least two a relay, which is coupled to the at least one driver; a signal decoder coupled to the electronic device; at least one buffer driver coupled to the signal decoder; and at least two sets of control modules respectively coupled Connected to the at least one buffer driver. For example, in the control interface of claim 17, wherein the power management module receives a first power signal from the power source and a first control signal from the electronic device, and outputs a second power signal. The control interface of claim 17, wherein the at least one driver receives at least one second control signal from the electronic device, and the at least two relays respectively output at least one third power signal. The control interface of claim 17, wherein the signal decoder receives at least one third control signal from the electronic device, and the at least two groups of control modules respectively output at least one fourth control signal. The control interface of claim 17 further includes at least one voltage regulator coupled to the power management module and outputting a fourth power signal.