CN103424682A - Chip testing device and testing method - Google Patents
Chip testing device and testing method Download PDFInfo
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- CN103424682A CN103424682A CN2012101523407A CN201210152340A CN103424682A CN 103424682 A CN103424682 A CN 103424682A CN 2012101523407 A CN2012101523407 A CN 2012101523407A CN 201210152340 A CN201210152340 A CN 201210152340A CN 103424682 A CN103424682 A CN 103424682A
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Abstract
The invention relates to a chip testing device and a testing method. An electric energy testing jig of the testing device uses a conveying machine table on the side of a testing table base to arrange and locate the multiple electrode pins of a preset chip in the multiple testing jack fields of the testing table base in an inserting mode respectively, and an electrical performance test is carried out on all the electrode pins of the preset chip through an inspection set. Good products of the preset chip with the electrode pins forming passages after the test are conveyed to a testing base of a function test jig through the conveying machine table, a testing circuit board of a testing base is used for carrying out an executive function test on the preset chip, and a testing result is displayed by connecting a preset screen through a display card. The purpose of carrying out synchronous detection on electrical properties and operational functions of the preset chip is achieved, so that the using yield of the preset chip is improved, and good executive and operational functions are maintained.
Description
Technical field
The present invention is to provide a kind of apparatus for testing chip and detection method, espespecially default chip is carried out to the proving installation that electric energy and execution function etc. detect, respectively by electric energy detection tool, Function detection tool, preset the test of chip, with the yield that improves default chip, there is good execution, operational function.
Background technology
Along with making rapid progress constantly of high-tech industry is progressive, electronics, the function of electric product constantly expands, increase, cause the modern more and more many for the functional requirement of sci-tech product, range of application is also more and more wide, and, in order to satisfy the demands of consumers, the dealer also promotes electronics one after another, the application function of electric product, reach the result of use of diversification so electronics, make important member in electric product, there is executive routine, computing, IC chip (or the processor ［ MCU ］ of function such as control, single-chip, microprocessor etc.), also must there is stronger execution function, the various electronics that are applied to, chip in electric product, have epochmaking status, but be applied at present electronics, chip in electric product, because thering are many electrical utmost point pin, gold thread (Bonding Wire) displacement or fracture between pad (PAD) and wafer core modern (CORE) easily occur in manufacture process, cause local utmost point pin to form short circuit and can't transmission signal or electric energy, must pay special attention to, again, the execution of chip, calculation function, it is also considerable use function, whether the enforcement, the running that are enough to affect electronics, electric product be normal, so before chip is used, must be for the electric energy of a plurality of utmost point pin of chip, carry out operating capability etc., carry out careful detection, otherwise poor because of the short circuit of utmost point pin or the executive capability of chip, will directly cause the running abnormal of electronics, electric product, be manufacture for electronics, electric product at present, produce the required heavy problem that is.
And at present for chip (or processor ［ MCU), single-chip, microprocessor etc.) detection, it is all the formative stage at chip, crystal grain semi-manufacture after wafer semi-manufacture before the moulding of chip place or cutting, carry out preliminary detection, so so detect, can must carry out other detection after the chip moulding, the effect of test is unsatisfactory again; Moreover, because electrically utmost point pin is quite a lot of, quite thin, detected being not easy of also becoming or checked unreally after the chip moulding, in practical application or while implementing, still there are many disappearances and inconvenience, as:
(1) a plurality of utmost point pin of chip phenomenon that easily is short-circuited, after chip is located on circuit board, just find that chip can't operate, then chip is removed, and so will cause assembling, detect the uncertainty increase of operation, and the fraction defective of chip product also promotes.
(2) chip is detected or assembling process, all must utilize mechanical arm to move transports, but chip in carrying, mechanical arm vacuum, inhale put, in the handover process, also quite easily because contraposition is incorrect, external force collision etc., cause the distortion of utmost point pin, bending, fracture, the damage of chip, cause the utmost point pin of chip can't the transmission electronic signal, power supply, cause and use function undesired.
Therefore, to how to solve a plurality of utmost point pin of current chip and detect the disappearance and deficiency that is difficult for, causes the product fraction defective to promote, and the process of chip detection operation is loaded down with trivial details, the inconvenience and the puzzlement that also easily cause chip to damage, be the direction place of being engaged in this journey improvement that the dealer desires most ardently.
Therefore, the inventor is because above-mentioned problem and disappearance, be to collect related data, via in many ways assessing and considering, and, to engage in the many years of experience of the industry accumulation, via constantly studying and revising, beginning to design this kind can be by electric energy detection and the use Function detection of a plurality of utmost point pin of chip, promote the yield of chip product, the handover number of times of minimizing chip detection process, the apparatus for testing chip of the work efficiency of raising chip detection and the patent of invention of detection method are born.
Summary of the invention
Fundamental purpose of the present invention is to be to provide a kind of apparatus for testing chip and detection method, wherein said proving installation is to comprise the electric energy detection tool, the Function detection tool, and board is transported in the utilization of electric energy detection tool, to preset a plurality of utmost point pin of chip plugs respectively, be positioned to test a plurality of detection jacks of pedestal, and carry out testing electrical property by the check unit, default chip non-defective unit after testing again, by the detection pedestal that transports board and be transported to the Function detection tool, carry out functional test and preset chip by the testing circuit plate, connect default screen to show testing result by display card again, the operational function that electrically reaches reached default chip carries out the synchronous purpose detected, to improve the use yield of default chip, and keep good execution, operational function.
Secondary objective of the present invention is to be to provide a kind of apparatus for testing chip and detection method, the electric energy detection tool of described proving installation, Function detection tool, to be installed on workbench simultaneously, with electric energy and the use function of synchronously carrying out detection chip, avoid carrying, the movement of chip detection process, reduce failure rate, spoilage that the chip detection operation produces, and can reduce the product fraction defective of chip.
In order to achieve the above object, the invention provides a kind of apparatus for testing chip, is to comprise electric energy detection tool, Function detection tool, wherein:
Described electric energy detection tool is the test pedestal be provided with for default chip positioning, and adjacent test pedestal side is provided with the board that transports that transports default chip, and be provided with a plurality of detection jacks that plug respectively for a plurality of utmost point pin of presetting chip in the test pedestal, and a plurality of detection jack is electrically to be connected with respectively in default each utmost point pin of chip being carried out to the check unit of testing electrical property;
Described Function detection tool is to be arranged at electric energy detection tool side, be provided with and accept the detection pedestal that transports the default chip that board transports, be electrically to be connected with in presetting chip to carry out the testing circuit plate of functional test and detect pedestal, and be provided with for connecting default screen to show the display card of testing result in the testing circuit plate.
During enforcement, described electric energy detection tool and Function detection tool are to be arranged at workbench, and workbench is provided with for transporting board slide rail toward polyslip between the detection pedestal of the test pedestal of electric energy detection tool, Function detection tool.
During enforcement, the check unit of described electric energy detection tool, be built-in measurement loop of default chip being carried out to 4 line formula weights surveys, to preset chip, carries out the voltage/current characteristic measurement.
During enforcement, described electric energy detection tool transport board, be to be provided with being positioned at the vacuum cups of test board seat.
During enforcement, the testing circuit plate of described Function detection tool, the motherboard of using for host computer, and be preset with circuit layout and a plurality of electronic components.
During enforcement, the set display card of testing circuit plate of described Function detection tool, be provided with the electric connector be electrically connected with default screen, and electric connector is USB (universal serial bus) or HDMI (High Definition Multimedia Interface) or digital video interface.
In order to achieve the above object, the present invention also provides a kind of detection method of chip, and the step of its chip detection is:
(a) will preset the test pedestal that chip is placed in the electric energy detection tool;
(b) utilize the check unit of electric energy detection tool, the default chip on the test pedestal is carried out to voltage/current (V/I) characteristic and measure;
(c) whether a plurality of pins of default chip form path, if not, i.e. execution step (d), if, i.e. execution step (e);
(d) default chip is that defective products is reclaimed;
(e) utilization is transported board and will be preset the detection pedestal that chip is transferred to the Function detection tool;
(f) utilize and detect pedestal and testing circuit plate, preset execution, the operational function test of chip, and utilize the display card of testing circuit plate to be connected with outside default screen to show testing result;
(g) default chip whether tool carry out, operational function, if not, i.e. execution step (d), if, i.e. execution step (h);
(h) default chip detection completes.
During enforcement, described electric energy detection tool and Function detection tool are to be arranged at workbench, and workbench is provided with for transporting board slide rail toward polyslip between the detection pedestal of the test pedestal of electric energy detection tool, Function detection tool.
During enforcement, the voltage/current characteristic of described step (b) measures, and is that throughput survey time road is carried out 4 line formula weights to default chip and surveyed, and determines with two end points the impedance detection that voltage, another two end points are determined electric current by measuring loop.
During enforcement, the test voltage of determining voltage in described measurement loop, be 3 volts of 0 ﹒ 1 volt～3 ﹒, and determine electric current measuring current, be 0 ﹒ 1 micromicroampere～2 micromicroamperes.
The operational function that electrically reaches that the present invention can reach default chip carries out the synchronous purpose detected, and to improve the use yield of default chip, and keeps good execution, operational function.
The accompanying drawing explanation
Fig. 1 is stereo appearance figure of the present invention;
The A part partial enlarged drawing that Fig. 2 is Fig. 1 of the present invention;
Fig. 3 is the stereo appearance figure of the present invention while applying;
Fig. 4 is the stereo appearance figure that the present invention transports chip;
Fig. 5 is the side view that the present invention transports chip;
Fig. 6 is process flow diagram of the present invention (one);
Fig. 7 is process flow diagram of the present invention (two).
Description of reference numerals: 1-electric energy detection tool; 11-tests pedestal; The 110-storage tank; 111-detects jack; 12-checks unit; The 121-switch; The 122-button; The 123-display lamp number; 2-transports board; The 21-slip base; The 22-operating handle; The 211-slide rail; The 23-vacuum cups; 3-Function detection tool; 31-testing circuit plate; The 33-display card; 32-detects pedestal; The 331-electric connector; The 320-accommodating groove; The 34-power supply unit; The 321-spliced eye; The 4-chip; 41-utmost point pin; The 5-workbench.
Embodiment
For reaching above-mentioned purpose and effect, the technology used in the present invention means and structure thereof, hereby draw and illustrate with regard to preferred embodiment of the present invention that in detail its features and functions is as follows, in order to do profit, understands fully.
Refer to shown in Fig. 1 to Fig. 5, stereo appearance figure during for the A part partial enlarged drawing of stereo appearance figure of the present invention, Fig. 1, application, transport chip stereo appearance figure, transport the side view of chip, can know and find out in figure, apparatus for testing chip of the present invention, to comprise electric energy detection tool 1, transport board 2 and Function detection tool 3, wherein:
Described electric energy detection tool 1 is to be provided with test pedestal 11, and be provided with storage tank 110 in test pedestal 11, and storage tank 110 bottoms are to be provided with a plurality of detection jacks 111, and a plurality of detection jacks 111 are for electrically being connected with respectively in check unit 12, and checking unit 12 is the display lamp numbers 123 etc. that are provided with a plurality of switches 121, button 122 and a plurality of demonstration testing results of carrying out the electric energy detection effect.
The described board 2 that transports is to be provided with slip base 21, and slip base 21 bottoms are provided with slide rail 211 can be for laterally sliding, moving, and the side of slip base 21 is provided with operating handle 22, and utilize operating handle 22 to be provided with vacuum cups 23, control vacuum cups 23 for operating handle and carry out displacement longitudinally.
Described Function detection tool 3 is to be provided with testing circuit plate 31, be provided with on testing circuit plate 31 and detect pedestal 32, and be provided with accommodating groove 320 in detecting pedestal 32, and accommodating groove 320 bottoms are provided with a plurality of spliced eyes 321, a plurality of spliced eyes 321 are for being electrically connected to respectively testing circuit plate 31, be provided with display card 33 in testing circuit plate 31 again, display card 33 is to be provided with one or more electric connector 331, and electric connector 331 is USB (universal serial bus) (the relevant specifications such as USB2 ﹒ 0 or USB3 ﹒ 0) or the electric connectors 331 such as HDMI (High Definition Multimedia Interface) (HDMI) or digital video interface (DVI) that can transmit video-audio signal, separately in testing circuit plate 31, be provided with power supply unit 34, to supply Function detection tool 3 required electricity consumption.
Above-mentioned each member is when the group structure, test pedestal 11 sides in electric energy detection tool 1, the slide rail 211 of board 2 is transported in installing, and slip base 21 is assembled on slide rail 211, be positioned at test pedestal 11 1 sides, and by the operating handle 22 of slip base 21 sides and vacuum cups 23, the movable storage tank 110 to being positioned at test board seat 11, and adjacent electric energy detection tool 1, transport the side of board 2, the testing circuit plate 31 of Function detection tool 3 is set again, and for detecting pedestal 32 on testing circuit plate 31, vacuum cups 23 contraposition when slippage for slip base 21, and the display card on testing circuit plate 31 33, can be electrically connected outside default screen by electric connector 331 and (can be computer screen, liquid crystal display screen or light emitting diode ［ LED ］ screen, digital photo frame or panel computer or notebook computer etc.), for showing electric energy detection tool 1, the detection data of Function detection tool 3 or various related datas etc., can organize and form apparatus for testing chip of the present invention.
And electric energy detection tool 1 of the present invention, transport board 2 and Function detection tool 3, to assemble, be arranged on workbench 5, and detect the test pedestal 11 of tool 1 for electric energy, the detection pedestal 32 of Function detection tool 3, be arranged at slide rail 211 sides of the slip base 21 that transports board 2, and slip base 21 is horizontal slip on slide rail 211, during displacement, the operating handle 22 of slip base 21 sides, vacuum cups 23, can slide with slip base 21, and respectively to being positioned at side examination pedestal 11 and detecting pedestal 32, handover path while with the vacuum cups 23 that shortens slip base 21, drawing default chip 4, time, reducing default chip 4 collided by external force in the process of transporting, the chance of the undue influences such as vibrations, can promote the quality of default chip 4 and detect the operation yield, and the electric energy detection tool 1 on workbench 5, transport board 2 and Function detection tool 3, in the detection of presetting chip 4, transport process, required electric power can be by direct power supply unit 34 supplies, can be for presetting smoothly the detection operation of chip 4.
Can be accumulator, dry cell, rechargeable battery or electrically be inserted in commercial power socket or generator etc. with electric wire as for described power supply unit 34; And electric energy detection tool 1, transport board 2 and Function detection tool 3 and can electrically be connected with respectively in check unit 12, and checked the operation of unit 12, preset the trace routine of chip 4.
Refer to shown in Fig. 1 to Fig. 7, stereo appearance figure, the stereo appearance figure that transports chip, the side view that transports chip, process flow diagram (), process flow diagram (two) during for the A part partial enlarged drawing of stereo appearance figure of the present invention, Fig. 1, application, can know and find out in figure, apparatus for testing chip of the present invention is when being detected operation, and the step of its detection is:
(100) will preset chip 4 and utilize the vacuum cups 23 that transports board 2 to draw, and give the storage tank 110 of the test pedestal 11 that is placed in electric energy detection tool 1.
(101) the check unit 12 of recycling electric energy detection tool 1, to the default chip 4 on test pedestal 11, carry out voltage/current (V/I) characteristic and measure.
(102) whether a plurality of pins 41 of the default chip 4 of test, form path, if not, i.e. execution step (103), if, i.e. execution step (104).
(103) a plurality of utmost point pin 41 or part utmost point pin 41 produces short circuits, can't switch on, and default chip 4 is defective products and is reclaimed.
(104) utilize the vacuum cups 23 transport board 2, after presetting chip 4 and drawing, and be transferred to the detection pedestal 32 of Function detection tool 3.
(105) utilize and detect pedestal 32 and testing circuit plate 31, preset execution, the operational function test of chip 4, and can utilize the display card 33 of testing circuit plate 31, be connected with outside default screen to show related data or the data of testing result.
(106) detect default chip 4 whether tool carry out, operational function, if not, i.e. execution step (103), if, i.e. execution step (107).
(107) default chip 4 has detected, can be for being installed on the circuit board or motherboard of default electronics, electric product.
And the test pedestal 11 of electric energy detection tool 1, inner for being provided with storage tank 110, and storage tank 110 bottoms are to be provided with a plurality of detection jacks 111, and electrically be connected with respectively in check unit 12, ought transport the slip base 21 of board 2, vacuum cups 23 by side is drawn default chip 4, and will preset the storage tank 110 that chip 4 is placed in test pedestal 11, a plurality of utmost point pin 41 for default chip 4, insert respectively respectively the detecting in jack 111 of storage tank 110 bottoms, by checking unit 12 for default chip 4, carrying out voltage/current (V/I) characteristic measures, it is that 4 line formulas (4-wire) measurements are carried out to default chip 4 in throughput survey time road, determine voltage by measuring loop with 2 end points, another 2 end points are determined the impedance detection of electric current, and measure the test voltage of determining voltage in loop, can be 1 volt of 3 volts of (V)～3 ﹒ of 0 ﹒ (V), determine the measuring current of electric current, can be 0 ﹒ 1 micromicroampere (mA)～2 micromicroampere (mA), (as: 30 seconds in the given time, 35 seconds or 60 seconds etc., can be according to the difference that detects character and default chip 4, the adjustment that is increased detection time or reduce detection time), measure a plurality of utmost point pin 41 internal pads (PAD) of default chip 4 to gold thread (Bonding Wire) resistance value (Z) between wafer core (CORE), judged gold thread whether path (Open) or short circuit (Short), judge whether conducting or open circuit of a plurality of utmost point pin 41, if a plurality of utmost point pin 41 are conducting, default chip 4 is non-defective unit, can carry out follow-up Function detection, if a plurality of utmost point pin 41 are for opening circuit, default chip 4 is defective products, must recycling.
And electric energy detection tool 1 is in being detected operation process, can be by a plurality of switches 121, the button 122 of check facility 12, carry out the operation of electric energy detection, and can show testing result by a plurality of display lamp numbers 123, a plurality of display lamp numbers 123 can be color or other colors such as red, yellow, blue, green, and can be set as in normal, fault, detection, the various deixises such as path or short degree, and can distinguish the result that inspection is surveyed by display lamp number 123.
As for Function detection tool 3, in the slip base 21 that transports board 2, draw default chip 4 with vacuum cups 23 self-test pedestals 11, and will preset the accommodating groove 320 that chip 4 is placed in detection pedestal 32, a plurality of utmost point pin 41 for default chip 4, insert respectively in each spliced eye 321 of accommodating groove 320 bottoms, after testing circuit plate 31 being switched on by power supply unit 34, can be by the default chip 4 of testing circuit plate 31 operation, carry out executive routine, computing, process electric signal or transmission signal or stored routine, the existing function of the various default chips 4 such as data, and (can be computer screen by the outside default screen of electric connector 331 connection of display card 33, liquid crystal display screen or light emitting diode ［ LED ］ screen, digital photo frame or panel computer or notebook computer etc.), the testing result that shows the default chip 4 of testing circuit plate 31 test, whether the various functions of the default chip 4 of judgement are normal, if it is that function is normal that default chip 4 detects, be non-defective unit, can supply follow-up installation exercise, if but default chip 4 detect for function undesired, for defective products, must be reclaimed.
The power path of default chip 4 first being carried out to a plurality of utmost point pin 41 detects, and will keep default chip 4 non-defective units of power path, used again the detection of function, avoid being detected for the defective products of short circuit, the unlikely phenomenon that causes the detection defective products of taking a lot of work consuming time, and be the default chip 4 of non-defective unit after detecting, used again Function detection, and can promote product yield and the quality of presetting chip 4, be arranged on default electronics, during electric product, also can promote the application function of default chip 4, guarantee default electronics, the application of electric product is normal, be difficult for occurring the situation of default chip 4 faults.
Therefore, the foregoing is only preferred embodiment of the present invention, non-so limit to the scope of the claims of the present invention, apparatus for testing chip of the present invention and detection method, to utilize electric energy detection tool 1, transport board 2 and Function detection tool 3, draw default chip 4 by the vacuum cups 23 that transports board 2, be transferred to the test pedestal 11 of electric energy detection tool 1, preset power path or the short circuit of more than 4 utmost point pin 41 of chip, to detect again the normal default chip 4 into path, by the vacuum cups 23 that transports board 2, default chip 4 is transported to the detection pedestal 32 of Function detection tool 3, preset the functional test that makes of chip 4, can reach default chip 4 is carried out to the detection of electric energy and function, guarantee the normal purpose of application of default chip 4, be loaded on electronics for default chip 4 subsequent group, when the motherboard of electric product or circuit board, can operate normally, to promote the product yield of default chip 4, the use effect of the default chip 4 of gain, therefore such as can reach the structure of aforementioned effect, device is contained by the present invention all should, this kind of simple and easy modification and equivalent structure change, all should in like manner be contained in the scope of the claims of the present invention, close and give Chen Ming.
The apparatus for testing chip of the invention described above and detection method when reality is carried out, for thering is following advantage, as:
(1) at default chip 4, planted before the circuit board of electronics, electric product, utilize electric energy detection tool 1, the path of presetting more than 4 utmost point pin 41 of chip detects, preset again the use Function detection of chip 4 by Function detection tool 3, promote the yield of default chip 4, can normal operation during use.
(2) electric energy detection tool 1, the adjacent setting of Function detection tool 3, transport the default board 2 of default chip 4, can shorten shipping time and path that vacuum cups 23 is drawn default chip 4, reduce the factor that default chip 4 is damaged, promote the normal detection yield of default chip 4.
Therefore, the present invention is the design mainly for apparatus for testing chip, and can utilize the electric energy detection tool, transport board and Function detection tool etc., transport the test pedestal of default chip to the electric energy detection tool with the vacuum cups that transports board, preset the test of power path of a plurality of utmost point pin of chip, to preset with vacuum cups the detection pedestal that chip is transported to the Function detection tool again, preset the use Function detection of chip, to reach the product yield that promotes default chip, good using character is main key protection point, and after first presetting the electric energy detection of chip, non-defective unit is used Function detection again, avoid increasing the time of detecting the operation invalid detection, make default chip there is better quality, the advantage of application efficiency, also can promote default chip and be installed on electronics, the executive capability of electric product, but, the foregoing is only preferred embodiment of the present invention, non-so limit to the scope of the claims of the present invention, therefore such as use simple and easy modification and the equivalent structure that instructions of the present invention and graphic content are done to change, all should in like manner be contained in the scope of the claims of the present invention, close and give Chen Ming.
Claims (10)
1. an apparatus for testing chip, is characterized in that, be to comprise electric energy detection tool, Function detection tool, wherein:
Described electric energy detection tool is the test pedestal be provided with for default chip positioning, and adjacent test pedestal side is provided with the board that transports that transports default chip, and be provided with a plurality of detection jacks that plug respectively for a plurality of utmost point pin of presetting chip in the test pedestal, and a plurality of detection jack is electrically to be connected with respectively in default each utmost point pin of chip being carried out to the check unit of testing electrical property;
Described Function detection tool is to be arranged at electric energy detection tool side, be provided with and accept the detection pedestal that transports the default chip that board transports, be electrically to be connected with in presetting chip to carry out the testing circuit plate of functional test and detect pedestal, and be provided with for connecting default screen to show the display card of testing result in the testing circuit plate.
2. apparatus for testing chip according to claim 1, it is characterized in that, described electric energy detection tool and Function detection tool are to be arranged at workbench, and workbench is provided with for transporting board slide rail toward polyslip between the detection pedestal of the test pedestal of electric energy detection tool, Function detection tool.
3. apparatus for testing chip according to claim 1, is characterized in that, the check unit of described electric energy detection tool is built-in measurement loop of default chip being carried out to 4 line formula weights surveys, to preset chip, carries out the voltage/current characteristic measurement.
4. apparatus for testing chip according to claim 1, is characterized in that, described electric energy detection tool transport board, be to be provided with being positioned at the vacuum cups of test board seat.
5. apparatus for testing chip according to claim 1, is characterized in that, the testing circuit plate of described Function detection tool, and the motherboard of using for host computer, and be preset with circuit layout and a plurality of electronic components.
6. apparatus for testing chip according to claim 1, it is characterized in that, the set display card of testing circuit plate of described Function detection tool, be provided with the electric connector be electrically connected with default screen, and electric connector is USB (universal serial bus) or HDMI (High Definition Multimedia Interface) or digital video interface.
7. the detection method of a chip, is characterized in that, the step of its chip detection is:
(a) will preset the test pedestal that chip is placed in the electric energy detection tool;
(b) utilize the check unit of electric energy detection tool, the default chip on the test pedestal is carried out to voltage/current (V/I) characteristic and measure;
(c) whether a plurality of pins of default chip form path, if not, i.e. execution step (d), if, i.e. execution step (e);
(d) default chip is that defective products is reclaimed;
(e) utilization is transported board and will be preset the detection pedestal that chip is transferred to the Function detection tool;
(f) utilize and detect pedestal and testing circuit plate, preset execution, the operational function test of chip, and utilize the display card of testing circuit plate to be connected with outside default screen to show testing result;
(g) default chip whether tool carry out, operational function, if not, i.e. execution step (d), if, i.e. execution step (h);
(h) default chip detection completes.
8. the detection method of chip according to claim 7, it is characterized in that, described electric energy detection tool and Function detection tool are to be arranged at workbench, and workbench is provided with for transporting board slide rail toward polyslip between the detection pedestal of the test pedestal of electric energy detection tool, Function detection tool.
9. the detection method of chip according to claim 7, it is characterized in that, the voltage/current characteristic of described step (b) measures, and is that throughput survey time road is carried out 4 line formula weights to default chip and surveyed, and determines with two end points the impedance detection that voltage, another two end points are determined electric current by measuring loop.
10. the detection method of chip according to claim 9, is characterized in that, the test voltage of determining voltage in described measurement loop, is 3 volts of 0 ﹒ 1 volt～3 ﹒, and determine electric current measuring current, be 0 ﹒ 1 micromicroampere～2 micromicroamperes.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105182217A (en) * | 2015-08-25 | 2015-12-23 | 东莞中之光电股份有限公司 | Chip detection device for testing braider |
| TWI586212B (en) * | 2016-01-25 | 2017-06-01 | 酷碼科技股份有限公司 | Light control module, light module and assembly frame |
| CN112309488A (en) * | 2019-07-26 | 2021-02-02 | 第一检测有限公司 | Chip testing method |
| CN113835019A (en) * | 2021-11-25 | 2021-12-24 | 河北圣昊光电科技有限公司 | Automatic chip alignment device and method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105182217A (en) * | 2015-08-25 | 2015-12-23 | 东莞中之光电股份有限公司 | Chip detection device for testing braider |
| CN105182217B (en) * | 2015-08-25 | 2017-11-07 | 东莞中之光电股份有限公司 | A kind of chip detection device for testing braider |
| TWI586212B (en) * | 2016-01-25 | 2017-06-01 | 酷碼科技股份有限公司 | Light control module, light module and assembly frame |
| CN112309488A (en) * | 2019-07-26 | 2021-02-02 | 第一检测有限公司 | Chip testing method |
| CN112309488B (en) * | 2019-07-26 | 2024-04-12 | 第一检测有限公司 | Chip testing method |
| CN113835019A (en) * | 2021-11-25 | 2021-12-24 | 河北圣昊光电科技有限公司 | Automatic chip alignment device and method |
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