KR101056723B1 - Aging test device for mobile phone charger or switched mode power supply - Google Patents

Abstract

The present invention relates to a mobile phone charger or an aging test device for SMPS, and can properly check and detect whether there is a cable abnormality such as checking a short circuit or disconnection of a connection terminal. It can be inspected and detected up to the abnormality, and it can be easily checked by the inspector because it detects and displays the high voltage and the low voltage through the inspection of the variation of the output voltage. Not only can it be detected, but a variety of devices can be inspected through the switch selection in one device, and the inspection efficiency can be improved while more precise and accurate inspection can be performed. On aging test devices for mobile phone chargers or SMPS A.

Description

Aging test device for mobile phone charger or switching mode power supply {AGING TEST DEVICE FOR PORTABLE PHONE CHARGER OR SWITCHING MODE POWER SUPPLY}

The present invention relates to an aging test apparatus for checking and detecting an abnormality of a mobile phone charger or a switching mode power supply (hereinafter referred to as "SMPS"), and more particularly, to change the time using an MPU and an ADC function. By detecting the voltage value according to the test, it is possible to check and detect the abnormality of the device according to the change of time, and to inspect all kinds of devices having a difference in output such as voltage as one device. To a cell phone charger or an aging test device for SMPS.

In general, the power supply device has a linear type and a switching type. Among them, the switching type SMPS has a small size, high efficiency, and stable output. It is used as a main power supply.

For example, a mobile phone charger having a SMPS as a main power supply, as shown in FIG. 1, a main body 1 having a body portion 4 having a built-in SMPS and a PCB and a plug 5 protruding from the body portion And an input / output (I / O) connector 2 connected to the main body 1 by a cable 3.

At this time, the input / output connector 2 is configured to be coupled to the receptacle 8 installed at the lower end of the mobile phone 7 to enable mobile phone charging, as shown in FIG. It consists of a connection terminal.

Here, by connecting a resistor to the minus part of pin 4, the value of the charging current can be configured to vary according to the value of the used resistor, which is called an ID resistor.

These ID resistors may be used depending on the product, and sometimes may not be used.

Such a mobile phone charger or SMPS may be configured in various types having a difference in output such as a voltage and a current according to a use purpose. In the mobile phone charger, voltages of 6V, 5V, and 4V are typically applied.

Meanwhile, in producing a mobile phone charger or an adapter, an inspection process for checking whether a produced product exhibits proper operation characteristics without any abnormality is essential. Looking at a conventional inspection method, there is simply a voltage output. The problem is that only the test is conducted to check whether there is a failure, and that the short-circuit or open of the pins of the connection terminals are not checked at all. there was.

In addition, when the ID resistor is used in connection, there is a problem in that it is not possible to check and detect the abnormality of the ID resistance, and there is a problem in that it is impossible to check and detect the abnormality of the device according to the change of time due to the use of the device.

In addition, various types of devices having different outputs, such as a difference in voltage and current, are used, and there is an inconvenience in that all devices of various types cannot be inspected with one device.

SUMMARY OF THE INVENTION The present invention has been made in view of the above-described problems, and by using a microprocessor unit (MPU) and an analog to digital convertor (ADC) function, it is possible to detect a voltage value according to a change in time according to a change in time. It also provides a mobile phone charger or an aging test device for SMPS that enables the user to check and detect the abnormality of the device and to inspect as a single device a variety of devices having a difference in output such as voltage. There is this.

The present invention enables to properly inspect and detect the presence of cable abnormality, such as to check the short (short) or open (open) between the pins of the connection terminal, and when used by connecting the ID resistor to the ID resistance It provides the aging test device for mobile phone charger or SMPS to detect and detect abnormality and to detect the high and low voltage by checking the change of output voltage when the mobile phone charger or SMPS is loaded. have.

An aging test apparatus for a mobile phone charger or an SMPS of the present invention for achieving the above object includes: a test device connection part provided on a single substrate to connect a plurality of test devices;

A device selection switch unit configured to select a variety for a test process of a test device connected to the test device connection unit;

Check the voltage output of the test device connected to the test device connection part to check for disconnection or short circuit between the pins and / or abnormality of the ID resistance, and for cable abnormality to check whether the output voltage changes when the test device is loaded. Identification and voltage inspection unit;

Read the switching status of the selected varieties according to the selection of the device selection switch unit to enable the aging test of the corresponding varieties, and check the presence of cable abnormality and transfer the voltage value according to the voltage value and time checked from the voltage inspection unit. An MPU for detecting an abnormal occurrence of a high voltage and a low voltage through a comparison operation with a reference value, and for controlling an output of the abnormality display part when an abnormality occurs according to an inspection of a test device;

An abnormality display unit for displaying whether or not the cable abnormality is checked and the inspector can confirm the abnormality when the abnormality detection is detected through the voltage tester and the MPU;

A product recognition display unit for displaying whether a tester can immediately check whether a corresponding test device is connected through the test device connection unit; Characterized in that it comprises a.

Preferably, the test device connection portion is composed of a 5-pin connector structure corresponding to the 5-pin connection terminal of the input and output connectors of the test device;

The cable is checked for abnormality and the voltage tester connects a load resistor to the Vcc (+) side of the test equipment connection, connects an ID resistor to pin 4, and resistors and a diode are serially connected to pins 2, 4, and GND, respectively. Is connected and connected;

The product recognition display unit may be configured to connect the product recognition LED to the SHIELD side of the test device connection unit.

Preferably, the abnormality occurrence display portion cable inspection LED for displaying the occurrence of the abnormality according to the cable inspection of the test device;

A voltage check LED for indicating whether an output voltage fluctuates under load of a test device;

High voltage and low voltage LEDs and buzzers to indicate when an abnormal occurrence of high voltage and low voltage is detected through the MPU; As shown in FIG.

According to the present invention, it is possible to properly check and detect whether there is a cable abnormality such as checking the short circuit or disconnection of the connecting terminal, and when using connecting ID resistor, it is possible to inspect and detect the abnormality of this ID resistance. By inspecting whether the output voltage is fluctuating and detecting the high voltage and low voltage and displaying the status, the inspector can easily check. In particular, it is possible to check and detect the abnormality of the device according to the change of time, Useful switch effects can be achieved through the selection of switches in one device.

The present invention can increase the inspection efficiency while performing a more precise and accurate inspection can provide the usefulness to increase the reliability according to the inspection of the product, such as a mobile phone charger or SMPS.

1 is a diagram showing a mobile phone charger conventionally used.
Figure 2 is a block diagram showing the connection terminal of the input and output connector in a typical mobile phone charger.
Figure 3 is a block diagram showing an aging test apparatus for a mobile phone charger or SMPS according to an embodiment of the present invention.
4 is a main circuit diagram illustrating an aging test apparatus for a mobile phone charger or an SMPS according to an embodiment of the present invention.
Figure 5 is a photograph showing a sampling product shown to help understand the aging test apparatus for a mobile phone charger or SMPS according to an embodiment of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. The present invention will become more apparent from the following detailed description when taken in conjunction with the accompanying drawings.

In the mobile phone charger or SMPS aging test apparatus 100 according to an embodiment of the present invention, as shown in Figs. 3 and 4, the test device connection unit 110, the device selection switch unit 120, cable abnormality check and voltage inspection unit 130, the MPU 140, the abnormality occurrence display unit 150, and the product recognition display unit 160.

The test device connection unit 110 is configured to increase the inspection efficiency according to an aging test by connecting and testing a plurality of test devices (for example, a mobile phone charger or an SMPS) with one test device. It consists of a 5-pin connector structure corresponding to the 5-pin connection terminal of the input / output connector of the test device.

The test device connection unit 110 may be configured such that four device connection units 110 are provided on one substrate, as in the sampling product shown in FIG. 5, but the present invention is not limited thereto. I will do it.

The device selection switch unit 120 is a switch for selecting a variety of products for the test device connected to the aging test device 100 of the present invention through the test device connection unit 110, having a difference in output voltage It is a component that enables selective inspection of all kinds of test equipments by connecting and connecting them.

The cable abnormality check and voltage tester 130 checks the voltage output of the test device connected to the test device connection unit 110 to check the disconnection or short circuit between pins and / or the ID resistance, as well as the test device. The load resistance (ROAD1) is connected to the Vcc (+) side of the test device connection unit 110 so that the above-described inspection can be easily performed. Connect ID resistor (ID) to the side, and connect resistor (R9), R8 (R3) and diode (D3) (D2) (D1) in series connection to pin 2, pin 4 and GND side respectively. do.

In this case, two resistors R31 and R32 are connected and connected to the load resistor ROAD, and two resistors R22 and R30 are connected and connected to the ID resistor ID to induce voltage distribution. It is preferable to configure the signal to send the signal to 140 to protect the MPU (140).

The MPU 140 reads the switching state of the breed selected according to the breed selection of the device selection switch unit 120 to enable the aging test of the breed, and stores the test time setting to connect the plurality of test apparatus 110. It is to control the performance of the operation so that it can sequentially test the test device connected to the).

In detail, the MPU 140 receives the output voltage value at the load of the test device according to the change of the voltage value and the time of the test device checked from the cable checker 130 and the voltage checker 130 to perform a comparison operation with the reference value. By detecting the occurrence of abnormality of the high voltage and the low voltage through, and is configured to control the output of the abnormality occurrence display unit 150 in the event of an abnormality according to the inspection of the test device.

The abnormality occurrence display unit 150 is a component for displaying the abnormality of the cable and checking the abnormality of the test device when the abnormality detection of the test device through the voltage inspection unit 130 and the MPU 140.

In this case, the abnormality occurrence display unit 150 includes a cable check LED 151 for displaying an abnormal occurrence according to the cable test of the test device, a voltage test LED 152 for displaying whether or not the output voltage changes when the test device is loaded, The high voltage and low voltage LEDs 153 and 154 for indicating an abnormal occurrence of high voltage and low voltage through a comparison operation in the MPU and a buzzer 155 for buzzer sound generation are included.

The product recognition display unit 160 is to display whether the tester can directly check whether the test device is connected through the test device connection unit 110, the product recognition LED (161) on the SHIELD side of the test device connection unit 110 ) May be configured to connect.

Referring to the operation and operation of the mobile phone charger or SMPS aging test device 100 according to the present invention having the above-described configuration is as follows.

First, the type of test device to be inspected is selected through the device selection switch unit 120.

Variety selection of the test equipment is mostly because the difference in the voltage output can be selected as the varieties by voltage, modification and modification can be made without being particularly limited thereto.

If the selection of varieties is made, the test device of the corresponding breed to be tested is connected to the test device connection unit 110 provided with a plurality.

At this time, when the test device is connected through the test device connection unit 110, by checking the cable abnormality check and the voltage output from the test device in the voltage inspection unit 130 to check the disconnection and short circuit of the Vcc and GND of the test device. If the ID resistor is installed, the ID resistor is checked.

For example, if GND is short-circuited in the test equipment, the voltage of the test equipment is output as 0v.If Vcc is short-circuited, the corresponding output voltage is output.If the type of test equipment is 5v output, it is output as 5v. In this case, no voltage is generated.

In addition, when the ID resistor is installed, if the ID resistor is 180 mW, the voltage output should be about 2.2 v. If the voltage resistance is completely different, it can be detected that the ID resistor is abnormal.

As such, when there is no abnormality in the cable when checking whether there is a cable abnormality and testing the test device through the voltage inspection unit 130, the product recognition LED 161 of the product recognition display unit 160 is turned on, which is an aging test apparatus of the present invention. On the 100 side, the test device is normally connected and the tester is confirmed that there is no problem.

Alternatively, in contrast, when an error occurs in the test device, the cable check LED 151 of the error occurrence display unit 150 is turned on under the control of the MPU 140 to display the tester.

Subsequently, when the power of the aging test apparatus 100 of the present invention is turned on, the MPU 140 reads the switching state selected through the device selection switch unit 120 during the initial operation to further check the test device for the corresponding breed. According to the setting of the test time, a plurality of test devices connected to the test device connection unit 110 are sequentially tested.

At this time, the cable abnormality check and voltage inspection unit 130 checks whether there is a change in the output voltage of the test device according to the change of time and sends the checked voltage value to the MPU 140, the output voltage of the test device is If it is detected that the voltage is changed, the voltage check LED 152 and the MPU 140 perform a comparison operation with a reference value to detect an abnormal occurrence of the high voltage and the low voltage.

For example, if the corresponding type of the test equipment has a 5v output, the reference value is 4.5v to 5.5v, and the checked voltage value is 4v, the MPU 140 detects as a low voltage and the abnormality occurrence display unit 150 The low voltage LED 154 is turned on and a buzzer sound is generated through the buzzer 155.

When the checked voltage value is 6v, the MPU 140 detects the high voltage to light the high voltage LED 153 of the abnormality occurrence display unit 150 and generates a buzzer sound through the buzzer 155.

Further, when there is a variation in the output voltage of the test device to be inspected, the MPU 140 turns on the voltage test LED 152 of the abnormality occurrence display unit 150 to display the tester to confirm it.

Aging test device for mobile phone charger or SMPS to check and detect the abnormality of the device according to the change of time, and to inspect all kinds of devices with different output such as voltage as one device The purpose is to provide.

As described above, the mobile phone charger or the aging test apparatus for SMPS 100 according to the present invention can check and detect the presence of a cable abnormality such as checking a short circuit or disconnection of a connection terminal, It can inspect and detect the abnormality of ID resistance, and it can be easily checked by the inspector by detecting and displaying the high voltage and the low voltage through the inspection of the change of output voltage. It is possible to check and detect the presence and presence of various types of equipment in one device.

The embodiments described above are merely illustrative of the preferred embodiments of the present invention and are not limited to these embodiments, and various modifications and variations may be made by those skilled in the art within the spirit and scope of the present invention. Substitutions may be made, which will fall within the technical scope of the present invention.

110: test device connection
120: device selection switch unit
130: cable abnormality check and voltage inspection
140: MPU
150: display of abnormality
160: product recognition display

Claims (3)

A plurality of test device connection parts provided on one substrate to connect a plurality of test devices;
A device selection switch unit configured to select a variety for a test process of a test device connected to the test device connection unit;
Check the voltage output of the test device connected to the test device connection part to check for disconnection or short circuit between the pins and / or abnormality of the ID resistance, and for cable abnormality to check whether the output voltage changes when the test device is loaded. Identification and voltage inspection unit;
Read the switching status of the selected varieties according to the selection of the device selection switch unit to enable the aging test of the corresponding varieties, and check the presence of cable abnormality and transfer the voltage value according to the voltage value and time checked from the voltage inspection unit. An MPU for detecting an abnormal occurrence of a high voltage and a low voltage through a comparison operation with a reference value, and for controlling an output of the abnormality display part when an abnormality occurs according to an inspection of a test device;
An abnormality display unit for displaying whether or not the cable abnormality is checked and the inspector can confirm the abnormality when the abnormality detection is detected through the voltage tester and the MPU;
A product recognition display unit for displaying whether a tester can immediately check whether a corresponding test device is connected through the test device connection unit; Aging test device for a mobile phone charger or SMPS, comprising a. The method of claim 1,
The test device connection part is configured with a 5-pin connector structure corresponding to the 5-pin connection terminal of the input / output connector of the test device;
The cable is checked for abnormality and the voltage tester connects a load resistor to the Vcc (+) side of the test equipment connection, connects an ID resistor to pin 4, and resistors and a diode are serially connected to pins 2, 4 and GND, respectively. Is connected and connected;
The product recognition display unit is a mobile phone charger or SMPS aging test device, characterized in that configured by connecting the product recognition LED to the SHIELD side of the test device connection unit. The method of claim 1,
The abnormality occurrence display unit includes a cable inspection LED for displaying an abnormality caused by a cable inspection of a test device;
A voltage check LED for indicating whether an output voltage fluctuates under load of a test device;
High voltage and low voltage LEDs and buzzers to indicate when an abnormal occurrence of high voltage and low voltage is detected through the MPU; Aging test device for a mobile phone charger or SMPS, comprising a.

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