CN109143113B - Method, device and system for monitoring power supply of PCIE external plug-in card - Google Patents
Method, device and system for monitoring power supply of PCIE external plug-in card Download PDFInfo
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- CN109143113B CN109143113B CN201810820803.XA CN201810820803A CN109143113B CN 109143113 B CN109143113 B CN 109143113B CN 201810820803 A CN201810820803 A CN 201810820803A CN 109143113 B CN109143113 B CN 109143113B
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- 238000012544 monitoring process Methods 0.000 title claims abstract description 58
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- 230000002159 abnormal effect Effects 0.000 claims abstract description 59
- 230000005856 abnormality Effects 0.000 claims abstract description 25
- 238000005070 sampling Methods 0.000 claims description 26
- 238000013213 extrapolation Methods 0.000 claims description 6
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R31/40—Testing power supplies
Abstract
The application discloses a method, a device and a system for monitoring a power supply of a PCIE external plug-in card. The method comprises the steps of firstly, obtaining an actual voltage value and an actual current value of a power supply circuit of the PCIE external plug-in card; then, comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result; and finally, determining that the power supply circuit is abnormal according to the voltage comparison result and the actual current value. The method compares the actual voltage value of the power circuit of the PCIE external card with the theoretical voltage interval to determine whether the actual voltage value is different from the theoretical voltage interval, and can also determine the abnormality of the power circuit by combining the actual current value of the power circuit. Therefore, even under the condition that the actual voltage value is normal, the method can realize effective monitoring on the power supply of the externally-inserted PCIE externally-inserted card according to the actual current value.
Description
Technical Field
The present application relates to the field of computer storage technologies, and in particular, to a method, an apparatus, and a system for monitoring a PCIE add-in card power supply.
Background
In the storage Controller, a Baseboard Management Controller (BMC) or a Hardware Monitor (Hardware Monitor) is generally used to Monitor each power supply on the motherboard. However, these monitoring methods do not monitor the power supply externally plugged to the PCIE (Peripheral Component Interconnect Express) card of the controller.
In addition, the current power monitoring mode is usually to monitor whether the voltage of the power circuit on the controller motherboard is normal, but this mode of monitoring the voltage of the power circuit cannot monitor other problems when the voltage is normal, so the monitoring effect is limited.
Disclosure of Invention
In order to solve the above problems, the present application provides a method, an apparatus, and a system for monitoring a PCIE add-in card power supply, so as to solve the problem that the PCIE add-in card power supply cannot be effectively monitored.
The embodiment of the application discloses the following technical scheme:
in a first aspect of the present application, a method for monitoring a PCIE add-in card power supply is provided, including:
acquiring an actual voltage value and an actual current value of a power supply circuit of the PCIE external plug-in card; the power supply circuit supplies power to the load circuit;
comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result; the theoretical voltage interval is an allowable floating interval of a theoretical voltage value of the power supply circuit;
and determining that the power supply circuit is abnormal according to the voltage comparison result and the actual current value.
Optionally, the comparing the actual voltage value with the theoretical voltage interval of the power circuit to obtain a voltage comparison result specifically includes:
if the actual voltage value exceeds the theoretical voltage interval, determining that the actual voltage value is abnormal, and taking the abnormal actual voltage value as a voltage comparison result;
and if the actual voltage value does not exceed the theoretical voltage interval, determining that the actual voltage value is normal, and taking the actual voltage value as a voltage comparison result.
Optionally, the determining whether the power circuit is abnormal according to the voltage comparison result and the actual current value specifically includes
If the voltage comparison result is that the actual voltage value is abnormal, determining that the power supply circuit is abnormal;
and if the actual current value is 0, determining that at least one broken circuit exists in the power supply circuit and the load circuit.
Optionally, the method further includes:
comparing the actual current value with a theoretical current value of the power circuit to obtain a current comparison result;
and determining that the load circuit has a fault according to the current comparison result and the actual current value.
Optionally, the comparing the actual current value with the theoretical current value of the power supply circuit to obtain a current comparison result specifically includes:
if the actual current value is larger than the theoretical current value, determining that the actual current value is too large, and taking the too large actual current value as a current comparison result;
and if the actual current value is not larger than the theoretical current value, determining that the actual current value is not too large, and taking the actual current value as a current comparison result.
Optionally, the determining that the load circuit has the fault according to the current comparison result and the actual current value specifically includes
If the current comparison result is that the actual current value is too large, determining that a pin of a chip in the load circuit has a fault;
and if the actual current value is 0, determining that at least one broken circuit exists in the power supply circuit and the load circuit.
Optionally, the method further includes:
outputting the power supply circuit with abnormality and/or the load circuit with failure.
In a second aspect of the present application, a device for monitoring a PCIE add-in card power supply is provided, the device includes: the device comprises a first acquisition module, a first comparison module and a first abnormity determining module;
the first obtaining module is used for obtaining an actual voltage value and an actual current value of a first power supply circuit of the PCIE extrapolation card; the first power supply circuit supplies power to a first load circuit;
the first comparison module is used for comparing the actual voltage value with a theoretical voltage interval of the first power supply circuit to obtain a voltage comparison result; the theoretical voltage interval is an allowable floating interval of a theoretical voltage value of the first power supply circuit;
and the first abnormity determining module is used for determining that the first power supply circuit is abnormal according to the voltage comparison result and the actual current value.
Optionally, the apparatus further comprises: the second acquisition module, the second comparison module and the second abnormity determining module;
the second obtaining module is used for obtaining an actual voltage value and an actual current value of a second power supply circuit of the PCIE extrapolation card; the second power supply circuit supplies power to a second load circuit;
the second comparison module is used for comparing the actual voltage value of the second power supply circuit with the theoretical voltage interval of the second power supply circuit to obtain a second voltage comparison result; the theoretical voltage interval of the second power supply circuit is an allowable floating interval of the theoretical voltage value of the second power supply circuit;
and the second abnormity determining module is used for determining that the second power supply circuit is abnormal according to the second voltage comparison result and the actual current value of the second power supply circuit.
In a third aspect of the present application, a system for monitoring a power supply of a PCIE add-in card is provided, where the system includes:
the system comprises a first power supply circuit of the PCIE external plug-in card, a power supply monitor, a mainboard of a controller, a first load circuit, a first sampling resistor and an interface of the PCIE external plug-in card; the power supply monitor is connected with the first power supply circuit through the first sampling resistor, and the I of the power supply monitor2The interface C is communicated with the mainboard through an interface of the PCIE external plug-in card; the first sampling resistor is connected in series between the first power supply circuit and the first load circuit;
the first power supply circuit is used for supplying power to the first load circuit;
the power supply monitor is used for measuring an actual voltage value and an actual current value of the first power supply circuit and transmitting the actual voltage value and the actual current value of the first power supply circuit to the mainboard;
the main board is used for acquiring the actual voltage value and the actual current value of the first power supply circuit measured by the power supply monitor through an interface of the PCIE external plug-in card; comparing the actual voltage value of the first power supply circuit with the theoretical voltage interval of the first power supply circuit to obtain a first voltage comparison result; determining that the first power supply circuit is abnormal according to the first voltage comparison result and the actual current value of the first power supply circuit; the first theoretical voltage interval is an allowable floating interval of a theoretical voltage value of the first power supply circuit.
Optionally, the main board is further configured to:
comparing the actual current value of the first power supply circuit with a theoretical current value of the first power supply circuit to obtain a first current comparison result;
and determining that the first load circuit has a fault according to the first current comparison result and the actual current value of the first power supply circuit.
Optionally, the main board is further configured to:
the first power supply circuit in which abnormality exists and/or the first load circuit in which failure exists are/is outputted.
Optionally, the system further includes: the second power supply circuit, the second load circuit and the second sampling resistor of the PCIE external plug-in card;
the power supply monitor is also connected with the second power supply circuit through the second sampling resistor; the second sampling resistor is connected in series between the second power supply circuit and the second load circuit;
the second power supply circuit is used for supplying power to the second load circuit;
the power supply monitor is further used for measuring an actual voltage value and an actual current value of the second power supply circuit and transmitting the actual voltage value and the actual current value of the second power supply circuit to the mainboard;
the mainboard is also used for acquiring the actual voltage value and the actual current value of the second power supply circuit; comparing the actual voltage value of the second power supply circuit with the theoretical voltage interval of the second power supply circuit to obtain a second voltage comparison result; determining that the second power supply circuit is abnormal according to the second voltage comparison result and the actual current value of the second power supply circuit; the theoretical voltage interval of the second power supply circuit is an allowable floating interval of the theoretical voltage value of the second power supply circuit.
Compared with the prior art, the method has the following beneficial effects:
the method for monitoring the power supply of the PCIE external plug-in card comprises the steps of firstly, obtaining an actual voltage value and an actual current value of a power supply circuit of the PCIE external plug-in card; then, comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result; and finally, determining that the power supply circuit is abnormal according to the voltage comparison result and the actual current value. The method compares the actual voltage value of the power circuit of the PCIE external card with the theoretical voltage interval to determine whether the actual voltage value is different from the theoretical voltage interval, and can also determine the abnormality of the power circuit by combining the actual current value of the power circuit. Therefore, even under the condition that the actual voltage value is normal, the method can realize effective monitoring on the power supply of the externally-inserted PCIE externally-inserted card according to the actual current value.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a flowchart of a method for monitoring a power supply of a PCIE add-in card according to an embodiment of the present invention;
fig. 2 is a flowchart of a method for monitoring a power supply of a PCIE add-in card according to a second embodiment of the present application;
fig. 3 is a schematic structural diagram of a device for monitoring a power supply of a PCIE add-in card according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of a system for monitoring a power supply of a PCIE add-in card according to an embodiment of the system of the present application.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present application more comprehensible, embodiments accompanying the drawings are described in detail below. First, a background of the present application will be described.
At present, in the technical field of computer storage, a means for monitoring the power supply of the external-plug PCIE card of the controller is lacking, so that a technician cannot find the abnormality of the power supply of the external-plug PCIE card in time. In addition, when monitoring the power supply circuit of the main board, only the voltage is usually monitored, and thus, it is impossible to effectively monitor and determine an abnormality other than the voltage.
In order to solve the problems, the inventor provides a method, a device and a system for monitoring a power supply of a PCIE add-in card through research, and can realize effective monitoring of the power supply of the PCIE add-in card through measurement of various physical parameters of a power supply circuit. The method, the apparatus, and the system for monitoring the power supply of the PCIE add-in card provided in the present application are described in detail below with reference to the accompanying drawings.
The first embodiment of the method comprises the following steps:
referring to fig. 1, this figure is a flowchart of a method for monitoring a power supply of a PCIE add-in card according to an embodiment of the present application.
As shown in fig. 1, a method for monitoring a power supply of a PCIE add-in card provided in the embodiment of the present application includes:
step 101: and acquiring the actual voltage value and the actual current value of the power circuit of the PCIE extrapolation card.
In this embodiment, the power circuit supplies power to the load circuit. The inventor finds that when the power supply of the PCIE add-in card is abnormal, at least one of the actual voltage value and the actual current value of the power supply circuit during operation is abnormal. Therefore, in order to monitor the power supply abnormality, the actual voltage value and the actual current value of the power supply circuit of the PCIE add-in card during operation are first obtained in this step.
Step 102: and comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result.
It should be noted that, before the PCIE add-in card power supply is monitored in this embodiment, the theoretical voltage value when the power supply circuit normally operates and the allowable floating ratio of the theoretical voltage value are known in advance. According to the theoretical voltage value and the allowable floating proportion, the theoretical voltage interval of the power supply circuit can be obtained. That is, when the actual voltage value of the power supply circuit is within the theoretical voltage interval, it can be determined that the actual voltage value is normal; and when the actual voltage value of the power supply circuit exceeds the theoretical voltage interval, the fact that the actual voltage value is abnormal can be determined. For ease of understanding, the following is exemplified.
For example, the theoretical voltage value of the power circuit is 1.5V, the allowable floating ratio of the theoretical voltage value is ± 5%, and accordingly, the lower limit of the theoretical voltage interval of the power circuit is 1.5 × V (1-5%), the upper limit thereof is 1.5 × V (1+ 5%), and the theoretical voltage interval is [1.425V, 1.575V ] can be calculated.
If the actual voltage value obtained in step 101 is 1.6V, that is, exceeds the theoretical voltage interval, it may be determined that the actual voltage value is abnormal, and the actual voltage value is abnormal as a voltage comparison result; if the actual voltage value obtained in step 101 is 1.4V, that is, exceeds the theoretical voltage interval, it may also be determined that the actual voltage value is abnormal, and the actual voltage value is abnormal as a voltage comparison result; if the actual voltage value obtained in step 101 is 1.52V, that is, the theoretical voltage interval is not exceeded, it may be determined that the actual voltage value is normal, and the actual voltage value is normal as a voltage comparison result.
Step 103: and determining that the power supply circuit is abnormal according to the voltage comparison result and the actual current value.
Since the actual voltage value of the power supply circuit should be within the theoretical voltage interval under the normal operation, if the voltage comparison result is that the actual voltage value is abnormal, that is, the actual voltage value of the power supply circuit exceeds the theoretical voltage interval, it may be determined that the power supply circuit is abnormal.
In addition, under the condition of normal operation, the actual current value of the power supply circuit is not necessarily 0, so if the actual current value is 0, no matter whether the actual voltage value is in the theoretical voltage interval, the following can be determined according to the actual current value: at least one open circuit is shared between the power circuit and the load circuit.
In the method for monitoring the power supply of the PCIE add-in card provided in the embodiment of the present application, first, an actual voltage value and an actual current value of a power supply circuit of the PCIE add-in card are obtained; then, comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result; and finally, determining that the power supply circuit is abnormal according to the voltage comparison result and the actual current value. The method compares the actual voltage value of the power circuit of the PCIE external card with the theoretical voltage interval to determine whether the actual voltage value is different from the theoretical voltage interval, and can also determine the abnormality of the power circuit by combining the actual current value of the power circuit. Therefore, even under the condition that the actual voltage value is normal, the method can realize effective monitoring on the power supply of the externally-inserted PCIE externally-inserted card according to the actual current value.
In addition, when applying a PCIE add-in card power supply, a technician also expects to be able to monitor whether a load circuit powered by the power supply circuit has a fault. For this reason, the inventor further provides another method for monitoring a PCIE add-in card power supply based on the first method embodiment, and can determine a fault of a load circuit by measuring an actual current value and comparing the actual current value with a theoretical current value. Embodiments of the method are described in detail below with reference to the accompanying drawings.
The second method embodiment:
referring to fig. 2, this figure is a flowchart of a method for monitoring a power supply of a PCIE add-in card according to an embodiment of the present application.
As shown in fig. 2, the method for monitoring a power supply of a PCIE add-in card provided in the embodiment of the present application includes:
step 201: and acquiring the actual voltage value and the actual current value of the power circuit of the PCIE extrapolation card.
Step 202: and comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result.
Step 203: and determining that the power supply circuit is abnormal according to the voltage comparison result and the actual current value.
In this embodiment, steps 201 to 203 are the same as steps 101 to 103 in the previous embodiment, and the specific implementation of steps 201 to 203 can be referred to the description in the previous embodiment, which is not described in detail herein.
On the basis of the above steps, the method for monitoring a PCIE add-in card power supply provided in this embodiment further includes the following steps:
and step 204, comparing the actual current value with a theoretical current value of the power circuit to obtain a current comparison result.
The current value at the time of normal operation of the power supply circuit is referred to as a theoretical current value. In the case where there is a failure in the load circuit, there is a high possibility that an abnormality, for example, a value larger than a theoretical current value, exists in an actual current value at the time of the power supply current operation. Therefore, in order to monitor whether the load circuit has a fault, before monitoring whether the load circuit has a fault, the theoretical current value of the power supply circuit in normal operation is known in advance.
If the actual current value is larger than the theoretical current value, determining that the actual current value is too large, and taking the too large actual current value as a current comparison result; and if the actual current value is not larger than the theoretical current value, determining that the actual current value is not too large, and taking the actual current value as a current comparison result.
And step 205, determining that the load circuit has a fault according to the current comparison result and the actual current value.
Because the actual current value of the power supply circuit in normal operation is not larger than the theoretical current value, if the current comparison result is that the actual current value is too large, that is, the actual current value is larger than the theoretical current value, it can be determined that a pin of a chip in the load circuit has a fault.
In addition, in the case where both the power supply circuit and the load circuit are normally operated, the actual current value of the power supply circuit must not be 0, and therefore, if the actual current value is 0, it can be determined that at least one open circuit is present in the power supply circuit and the load circuit in common.
It is understood that the execution time of step 204 and step 205 is not limited in this embodiment, and step 204 and step 205 may be executed before step 102 and step 103, or may be executed simultaneously with step 102 and step 103, and of course, may also be executed after the execution of step 102 and step 103 is completed.
In the method for monitoring a PCIE add-in card power supply provided in this embodiment, the method obtains not only the actual voltage value of the power supply circuit, but also the actual current value of the power supply circuit. The combination of the actual voltage value and the actual current value can monitor the abnormality of the power supply circuit, and can also monitor the fault of the load circuit supplied by the power supply circuit.
The method can be applied to the abnormal monitoring of different power supply circuits of the PCIE external plug-in card power supply and the fault monitoring of load circuits powered by different power supply circuits. Different power supply circuits are monitored separately, and similarly, different load circuits powered by different power supply circuits are also monitored separately.
For example, the first load circuit is powered by the first power supply circuit, and the second load circuit is powered by the second power supply circuit. According to the method provided by the embodiment, it can be specifically monitored whether the power circuit has an abnormality or not, and whether the load circuit has a fault or not, in the first power circuit and the second power circuit. Therefore, the method can help technicians to realize quick positioning of problem points, and further effectively improve the reflection rate and the reflection accuracy of the PCIE card external plug-in power supply and load problems.
In addition, in order to facilitate prompting of a technician that there is an abnormal power circuit and a faulty load circuit, the method for monitoring a PCIE add-in card power supply provided in this embodiment may further include:
outputting the power supply circuit with abnormality and/or the load circuit with failure.
As an example, the different power supply circuits each have an identification symbol that is distinct from the other power supply circuits, i.e. one power supply circuit corresponds to a unique one of the identification symbols. When the power supply circuit is determined to be abnormal, the identification symbol corresponding to the power supply circuit is output, for example, the identification symbol is displayed on a screen after the output. And the technician can determine the abnormal power supply circuit according to the corresponding relation between the identification symbol and the power supply circuit.
Similarly, the load circuits which are responsible for supplying power by different power supply circuits respectively have an identification symbol which is different from the identification symbols of the load circuits which are supplied power by other power supply circuits, that is, the load circuit supplied power by one power supply circuit corresponds to a unique identification symbol. When a fault of a certain load circuit is determined, the identifier corresponding to the load circuit is output, for example, the identifier is displayed on a screen after the output. And the technician can determine the load circuit with the fault according to the corresponding relation between the identifier and the load circuit.
The above is only one exemplary way of outputting the power supply circuit having an abnormality and/or the load circuit having a failure for the present embodiment. Obviously, the present embodiment may also output the abnormal power supply circuit and/or the failed load circuit in other manners, so as to prompt a technician to repair the abnormal power supply circuit and/or the failed load circuit. Here, the output mode of the power supply circuit having an abnormality and/or the load circuit having a failure is not limited.
Based on the foregoing embodiment, the present application further provides a device for monitoring a PCIE add-in card power supply. The device is described in detail below with reference to the accompanying drawings.
The embodiment of the device is as follows:
referring to fig. 3, the drawing is a schematic structural diagram of a device for monitoring a power supply of a PCIE add-in card according to an embodiment of the present application.
As shown in fig. 3, the apparatus for monitoring a power supply of a PCIE add-in card provided in the embodiment of the present application includes:
a first obtaining module 301, a first comparing module 302, and a first abnormality determining module;
the first obtaining module 301 is configured to obtain an actual voltage value and an actual current value of a first power circuit of the PCIE add-in card; the first power supply circuit supplies power to a first load circuit;
the first comparing module 302 is configured to compare the actual voltage value with a theoretical voltage interval of the first power supply circuit to obtain a voltage comparison result; the theoretical voltage interval is an allowable floating interval of a theoretical voltage value of the first power supply circuit;
the first anomaly determination module 303 is configured to determine that an anomaly exists in the first power supply circuit according to the voltage comparison result and the actual current value.
In the above, the device for monitoring the power supply of the PCIE add-in card provided in the embodiment of the present application. The device determines whether the actual voltage value is different from the theoretical voltage interval or not by comparing the actual voltage value with the theoretical voltage interval of the first power supply circuit of the PCIE external plug-in card, and can also determine whether the first power supply circuit is abnormal by combining the actual current value of the first power supply circuit. Therefore, even if the actual voltage value is normal, the device can realize effective monitoring of the power supply of the externally-inserted PCIE externally-inserted card according to the actual current value.
In addition, in order to implement monitoring of multiple power supply circuits of a PCIE power supply by the apparatus, the apparatus provided in the embodiment of the present application may further include: the second acquisition module, the second comparison module and the second abnormity determining module;
the second obtaining module is used for obtaining an actual voltage value and an actual current value of a second power supply circuit of the PCIE add-in card; the second power supply circuit supplies power to a second load circuit;
the second comparison module is used for comparing the actual voltage value of the second power supply circuit with the theoretical voltage interval of the second power supply circuit to obtain a second voltage comparison result; the theoretical voltage interval of the second power supply circuit is an allowable floating interval of the theoretical voltage value of the second power supply circuit;
and the second abnormity determining module is used for determining that the second power supply circuit is abnormal according to the second voltage comparison result and the actual current value of the second power supply circuit.
The device can effectively monitor a plurality of power supply circuits, and further can respectively determine the abnormality of different power supply circuits according to the first abnormality determination module and the second abnormality determination module. The monitoring of the PCIE external card power supply with a plurality of power supply circuits is realized.
Based on the foregoing embodiment, the present application further provides a device for monitoring a PCIE add-in card power supply. The device is described in detail below with reference to the accompanying drawings.
The embodiment of the system is as follows:
referring to fig. 4, the figure is a schematic structural diagram of a system for monitoring a power supply of a PCIE add-in card according to an embodiment of the present application.
As shown in fig. 4, the system for monitoring a power supply of a PCIE add-in card provided in the embodiment of the present application includes:
a first power circuit 401 of the PCIE add-in card, a power monitor 402, a motherboard 403, a first load circuit 404, a first sampling resistor 405, and an interface 406 of the PCIE add-in card; wherein, the power supply monitor 402 is connected to the first power supply circuit 401 via the first sampling resistor 405, and I of the power supply monitor 4022The interface C communicates with the motherboard 403 through the interface 406 of the PCIE add-in card; the first sampling resistor 405 is connected in series between the first power supply circuit 401 and the first load circuit 404; said I2The interface C is contained in the interface of the PCIE external plug-in card and is a part of the interface of the PCIE external plug-in card;
the first power circuit 401 is configured to supply power to the first load circuit 404;
the power supply monitor 402 is configured to measure an actual voltage value and an actual current value of the first power supply circuit 401, and transmit the actual voltage value and the actual current value of the first power supply circuit 401 to the motherboard 403;
the main board 403 is configured to obtain an actual voltage value and an actual current value of the first power circuit 401; comparing the actual voltage value of the first power supply circuit 401 with the theoretical voltage interval of the first power supply circuit 401 to obtain a first voltage comparison result; and determining that there is an abnormality in the first power supply circuit 401 according to the first voltage comparison result and the actual current value of the first power supply circuit 401; the first theoretical voltage interval is an allowable floating interval of the theoretical voltage value of the first power supply circuit 401.
Optionally, the interface of the PCIE add-in card may be a PCIE Gold Finger (Gold Finger).
As a specific embodiment, if the actual voltage value of the first power circuit 401 exceeds the theoretical voltage interval of the first power circuit 401, the main board 403 determines that the actual voltage value of the first power circuit 401 is abnormal, and takes the abnormal actual voltage value of the first power circuit 401 as a first voltage comparison result; if the actual voltage value of the first power circuit 401 does not exceed the theoretical voltage interval of the first power circuit 401, the main board 403 determines that the actual voltage value of the first power circuit 401 is normal, and takes the actual voltage value of the first power circuit 401 as a first voltage comparison result. If the first voltage comparison result is that the actual voltage value of the first power supply circuit 401 is abnormal, the main board 403 determines that the first power supply circuit 401 is abnormal; if the actual current value of the first power supply circuit 401 is 0, the main board 403 determines that there is at least one open circuit in the first power supply circuit 401 and the first load circuit 404.
In the above, the system for monitoring the power supply of the PCIE add-in card provided in the embodiment of the present application. In the system, the main board mainly executes the operation of the method for monitoring the power supply of the PCIE add-in card provided in the foregoing method embodiment. The mainboard determines whether the actual voltage value is different from the theoretical voltage interval or not by comparing the actual voltage value of the first power supply circuit of the PCIE external plug-in card with the theoretical voltage interval, and meanwhile, the mainboard can also determine that the first power supply circuit is abnormal by combining the actual current value of the first power supply circuit. Therefore, even if the actual voltage value is normal, the system can realize effective monitoring of the power supply of the externally-inserted PCIE externally-inserted card according to the actual current value.
In addition, in order to implement the monitoring of the failure of the first load circuit of the PCIE add-in card power supply through the system, in the system, the motherboard may be further configured to:
comparing the actual current value of the first power supply circuit with a theoretical current value of the first power supply circuit to obtain a first current comparison result; and determining that the first load circuit has a fault according to the first current comparison result and the actual current value of the first power supply circuit.
As a specific example, if the actual current value of the first power supply circuit is greater than the theoretical current value of the first power supply circuit, the main board determines that the actual current value of the first power supply circuit is too large, and takes the actual current value of the first power supply circuit as a first current comparison result; and if the actual current value of the first power supply circuit is not larger than the theoretical current value of the first power supply circuit, the mainboard determines that the actual current value of the first power supply circuit is not too large, and the actual current value of the first power supply circuit is not too large as a first current comparison result. If the first current comparison result shows that the actual current value of the first power supply circuit is too large, the main board determines that a pin of a chip in the first load circuit has a fault; and if the actual current value of the first power supply circuit is 0, the main board determines that at least one broken circuit exists in the first power supply circuit and the first load circuit.
In addition, in order to prompt the technician that there are abnormal power circuits and faulty load circuits, in the system, the motherboard may further be configured to:
the first power supply circuit in which abnormality exists and/or the first load circuit in which failure exists are/is outputted.
In addition, in order to implement monitoring of multiple power supply circuits of the PCIE add-in card power supply through the system, the system provided in the embodiment of the present application may further include: the second power supply circuit, the second load circuit and the second sampling resistor of the PCIE external plug-in card;
in the system, the power supply monitor can also be connected with the second power supply circuit through the second sampling resistor; the second sampling resistor is connected in series between the second power supply circuit and the second load circuit;
the second power supply circuit is used for supplying power to the second load circuit;
the power supply monitor is further used for measuring an actual voltage value and an actual current value of the second power supply circuit and transmitting the actual voltage value and the actual current value of the second power supply circuit to the mainboard;
the mainboard is also used for acquiring the actual voltage value and the actual current value of the second power supply circuit; comparing the actual voltage value of the second power supply circuit with the theoretical voltage interval of the second power supply circuit to obtain a second voltage comparison result; determining that the second power supply circuit is abnormal according to the second voltage comparison result and the actual current value of the second power supply circuit; the theoretical voltage interval of the second power supply circuit is an allowable floating interval of the theoretical voltage value of the second power supply circuit.
As a specific implementation manner, if the actual voltage value of the second power supply circuit exceeds the theoretical voltage interval of the second power supply circuit, the main board determines that the actual voltage value of the second power supply circuit is abnormal, and takes the abnormal actual voltage value of the second power supply circuit as a second voltage comparison result; and if the actual voltage value of the second power supply circuit does not exceed the theoretical voltage interval of the second power supply circuit, the mainboard determines that the actual voltage value of the second power supply circuit is normal, and takes the actual voltage value of the second power supply circuit as a second voltage comparison result. If the second voltage comparison result is that the actual voltage value of the second power supply circuit is abnormal, the mainboard determines that the second power supply circuit is abnormal; and if the actual current value of the second power supply circuit is 0, the mainboard determines that at least one broken circuit exists in the second power supply circuit and the second load circuit.
In the above system, the main board still executes the operation of the method for monitoring the power supply of the PCIE add-in card provided in the foregoing method embodiment. The mainboard determines whether the actual voltage value is different from the theoretical voltage interval or not by comparing the actual voltage value of the second power supply circuit of the PCIE external plug-in card with the theoretical voltage interval, and meanwhile, the mainboard can also determine that the second power supply circuit is abnormal by combining the actual current value of the second power supply circuit. Therefore, even if the actual voltage value of the second power supply circuit is normal, the system can effectively monitor the second power supply circuit of the externally-inserted PCIE externally-inserted card according to the actual current value of the second power supply circuit.
In addition, in order to implement the monitoring of the failure of the second load circuit of the PCIE add-in card power supply through the system, in the system, the motherboard may be further configured to:
comparing the actual current value of the second power supply circuit with a theoretical current value of the second power supply circuit to obtain a second current comparison result; and determining that the second load circuit has a fault according to the second current comparison result and the actual current value of the second power supply circuit.
As a specific example, if the actual current value of the second power supply circuit is greater than the theoretical current value of the second power supply circuit, the main board determines that the actual current value of the second power supply circuit is too large, and takes the actual current value of the second power supply circuit as a second current comparison result; and if the actual current value of the second power supply circuit is not larger than the theoretical current value of the second power supply circuit, the mainboard determines that the actual current value of the second power supply circuit is not too large, and the actual current value of the second power supply circuit is not too large as a second current comparison result. If the second current comparison result is that the actual current value of the second power supply circuit is too large, the main board determines that a pin of a chip in the second load circuit has a fault; and if the actual current value of the second power supply circuit is 0, the mainboard determines that at least one broken circuit exists in the second power supply circuit and the second load circuit.
In addition, in order to prompt the technician that there are abnormal power circuits and faulty load circuits, in the system, the motherboard may further be configured to:
outputting the second power supply circuit with abnormality and/or the second load circuit with failure.
It should be noted that, in the system for monitoring a PCIE add-in card power supply provided in the embodiment of the present application, an actual current value and an actual voltage value are different when different power supply circuits work. In order to ensure that the sampling resistor works normally, the resistance values and the powers of the first sampling resistor and the second sampling resistor are also determined by the power supply circuit.
For example, if the voltage drop of the first sampling resistor is 80mV, the resistance value of the first sampling resistor is 80mV/5A, i.e., 16 mOhm, in the first power supply circuit having the theoretical voltage value of 1.5V and the theoretical current value of 5A. The power of the first sampling resistor can be calculated by the power calculation formula P ═ I2R is calculated to be 0.4W. However, according to the de-rated use requirement of the sampling resistor, the first sampling resistor needs to be usedTo ensure sufficient overcurrent capacity, for example, 1W of power can be taken. The first sample resistance specification is thus determined to be 16 milliohms and to have an operating power above 0.4W.
It should be noted that, in the present specification, all the embodiments are described in a progressive manner, and the same and similar parts among the embodiments may be referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the apparatus and system embodiments, since they are substantially similar to the method embodiments, they are described in a relatively simple manner, and reference may be made to some of the descriptions of the method embodiments for related points. The above-described embodiments of the apparatus and system are merely illustrative, and the units described as separate parts may or may not be physically separate, and the parts suggested as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
The above description is only one specific embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (7)
1. A method for monitoring a power supply of a PCIE external card is characterized by comprising the following steps:
acquiring an actual voltage value and an actual current value of a power supply circuit of the PCIE external plug-in card; the power supply circuit supplies power to the load circuit;
comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result; the theoretical voltage interval is an allowable floating interval of a theoretical voltage value when the power supply circuit works normally;
comparing the actual voltage value with a theoretical voltage interval of the power circuit to obtain a voltage comparison result, specifically comprising:
if the actual voltage value exceeds the theoretical voltage interval, determining that the actual voltage value is abnormal, and taking the abnormal actual voltage value as a voltage comparison result;
if the actual voltage value does not exceed the theoretical voltage interval, determining that the actual voltage value is normal, and taking the actual voltage value as a voltage comparison result;
if the voltage comparison result is that the actual voltage value is abnormal, determining that the power supply circuit is abnormal;
comparing the actual current value with a theoretical current value of the power circuit to obtain a current comparison result, specifically comprising: if the actual current value is larger than the theoretical current value, determining that the actual current value is too large, and taking the too large actual current value as a current comparison result; if the actual current value is not larger than the theoretical current value, determining that the actual current value is not too large, and taking the actual current value as a current comparison result;
determining that the load circuit has a fault according to the current comparison result and the actual current value, specifically comprising: if the current comparison result is that the actual current value is too large, determining that a pin of a chip in the load circuit has a fault; and if the actual current value is 0, determining that at least one broken circuit exists in the power supply circuit and the load circuit.
2. The method of claim 1, further comprising:
outputting the power supply circuit with abnormality and/or the load circuit with failure.
3. A device for monitoring a power supply of a PCIE external card is characterized by comprising: the device comprises a first acquisition module, a first comparison module and a first abnormity determining module;
the first obtaining module is used for obtaining an actual voltage value and an actual current value of a first power supply circuit of the PCIE extrapolation card; the first power supply circuit supplies power to a first load circuit;
the first comparison module is used for comparing the actual voltage value of the first power supply circuit with the theoretical voltage interval of the first power supply circuit to obtain a first voltage comparison result; the theoretical voltage interval of the first power supply circuit is an allowable floating interval of a theoretical voltage value when the first power supply circuit works normally;
the first comparing module is specifically configured to determine that the actual voltage value of the first power supply circuit is abnormal if the actual voltage value of the first power supply circuit exceeds the theoretical voltage interval of the first power supply circuit, and use the abnormal actual voltage value of the first power supply circuit as a first voltage comparing result; if the actual voltage value of the first power supply circuit does not exceed the theoretical voltage interval of the first power supply circuit, determining that the actual voltage value of the first power supply circuit is normal, and taking the actual voltage value of the first power supply circuit as a first voltage comparison result; the first abnormality determining module is specifically configured to determine that the first power supply circuit is abnormal if the first voltage comparison result indicates that the actual voltage value of the first power supply circuit is abnormal;
the first comparing module is further configured to compare an actual current value of the first power supply circuit with a theoretical current value of the first power supply circuit to obtain a current comparison result, and specifically includes: if the actual current value of the first power supply circuit is larger than the theoretical current value of the first power supply circuit, determining that the actual current value of the first power supply circuit is too large, and taking the actual current value of the first power supply circuit as a current comparison result; if the actual current value of the first power supply circuit is not larger than the theoretical current value of the first power supply circuit, determining that the actual current value of the first power supply circuit is not too large, and taking the actual current value of the first power supply circuit as a current comparison result;
the first abnormality determining module is further configured to determine that the first load circuit has a fault according to the current comparison result and an actual current value of the first power supply circuit, and specifically includes: if the current comparison result is that the actual current value of the first power supply circuit is too large, determining that a pin of a chip in the first load circuit has a fault; determining that at least one open circuit coexists in the first power supply circuit and the first load circuit if the actual current value of the first power supply circuit is 0.
4. The apparatus of claim 3, further comprising: the second acquisition module, the second comparison module and the second abnormity determining module;
the second obtaining module is used for obtaining an actual voltage value and an actual current value of a second power supply circuit of the PCIE extrapolation card; the second power supply circuit supplies power to a second load circuit;
the second comparison module is used for comparing the actual voltage value of the second power supply circuit with the theoretical voltage interval of the second power supply circuit to obtain a second voltage comparison result; the theoretical voltage interval of the second power supply circuit is an allowable floating interval of a theoretical voltage value when the second power supply circuit works normally;
and the second abnormity determining module is used for determining that the second power supply circuit is abnormal according to the second voltage comparison result and the actual current value of the second power supply circuit.
5. A system for monitoring a power supply of a PCIE external card is characterized by comprising:
the system comprises a first power supply circuit of the PCIE external plug-in card, a power supply monitor, a mainboard, a first load circuit, a first sampling resistor and an interface of the PCIE external plug-in card; the power supply monitor is connected with the first power supply circuit through the first sampling resistor, and the I of the power supply monitor2The interface C is communicated with the mainboard through an interface of the PCIE external plug-in card; the first sampling resistor is connected in series between the first power supply circuit and the first load circuit;
the first power supply circuit is used for supplying power to the first load circuit;
the power supply monitor is used for measuring an actual voltage value and an actual current value of the first power supply circuit and transmitting the actual voltage value and the actual current value of the first power supply circuit to the mainboard;
the mainboard is used for acquiring an actual voltage value and an actual current value of the first power supply circuit; comparing the actual voltage value of the first power supply circuit with the theoretical voltage interval of the first power supply circuit to obtain a first voltage comparison result; the theoretical voltage interval of the first power supply circuit is an allowable floating interval of a theoretical voltage value when the first power supply circuit works normally;
the main board is specifically configured to determine that an actual voltage value of the first power supply circuit is abnormal if the actual voltage value of the first power supply circuit exceeds a theoretical voltage interval of the first power supply circuit, and use the abnormal actual voltage value of the first power supply circuit as a first voltage comparison result; if the actual voltage value of the first power supply circuit does not exceed the theoretical voltage interval, determining that the actual voltage value of the first power supply circuit is normal, and taking the actual voltage value of the first power supply circuit as a first voltage comparison result;
the main board is specifically configured to determine that the first power supply circuit is abnormal if the first voltage comparison result indicates that the actual voltage value of the first power supply circuit is abnormal;
the main board is further configured to:
comparing the actual current value of the first power supply circuit with the theoretical current value of the first power supply circuit to obtain a current comparison result, specifically comprising: if the actual current value of the first power supply circuit is larger than the theoretical current value of the first power supply circuit, determining that the actual current value of the first power supply circuit is too large, and taking the actual current value of the first power supply circuit as a current comparison result; if the actual current value of the first power supply circuit is not larger than the theoretical current value of the first power supply circuit, determining that the actual current value of the first power supply circuit is not too large, and taking the actual current value of the first power supply circuit as a current comparison result;
determining that the first load circuit has a fault according to the current comparison result and the actual current value of the first power supply circuit, specifically comprising: if the current comparison result is that the actual current value of the first power supply circuit is too large, determining that a pin of a chip in the first load circuit has a fault; determining that at least one open circuit coexists in the first power supply circuit and the first load circuit if the actual current value of the first power supply circuit is 0.
6. The system of claim 5, wherein the motherboard is further configured to:
the first power supply circuit in which abnormality exists and/or the first load circuit in which failure exists are/is outputted.
7. The system of any one of claims 5 to 6, further comprising: the second power supply circuit, the second load circuit and the second sampling resistor of the PCIE external plug-in card;
the power supply monitor is also connected with the second power supply circuit through the second sampling resistor; the second sampling resistor is connected in series between the second power supply circuit and the second load circuit;
the second power supply circuit is used for supplying power to the second load circuit;
the power supply monitor is also used for measuring the actual voltage value and the actual current value of the second power supply circuit and transmitting the actual voltage value and the actual current value of the second power supply circuit to the mainboard;
the mainboard is also used for acquiring the actual voltage value and the actual current value of the second power supply circuit; comparing the actual voltage value of the second power supply circuit with the theoretical voltage interval of the second power supply circuit to obtain a second voltage comparison result; determining that the second power supply circuit is abnormal according to the second voltage comparison result and the actual current value of the second power supply circuit; and the theoretical voltage interval of the second power supply circuit is an allowable floating interval of a theoretical voltage value when the second power supply circuit works normally.
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| CN201810820803.XA CN109143113B (en) | 2018-07-24 | 2018-07-24 | Method, device and system for monitoring power supply of PCIE external plug-in card |
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| CN201810820803.XA CN109143113B (en) | 2018-07-24 | 2018-07-24 | Method, device and system for monitoring power supply of PCIE external plug-in card |
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