CN115184822A - HI-POT testing device with multi-channel switching and contact self-checking method thereof - Google Patents
HI-POT testing device with multi-channel switching and contact self-checking method thereof Download PDFInfo
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/385—Arrangements for measuring battery or accumulator variables
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
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- G—PHYSICS
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Abstract
The invention relates to a multi-channel switching HI-POT testing device and a contact self-checking method thereof. The device realizes the contact self-detection of the signal transmission element by the mutual cooperation of the controller, the first control switch and the wiring self-detection module, thereby preventing the misjudgment of a test result and improving the test accuracy of a tester on the tested element; an interlocking circuit is formed by the first control switch and the wiring self-checking module, so that the test and the contact self-checking circuit can be prevented from working simultaneously, and therefore all electronic components in the device are burnt out, and the test safety is improved.
Description
Technical Field
The invention relates to the technical field of battery cell testing, in particular to a multi-channel switching HI-POT testing device and a contact self-checking method thereof.
Background
The HI-pot tester is mainly used for high-voltage testing, AC voltage-withstand and leakage-voltage testing and DC voltage-withstand and leakage-voltage testing of a battery core. The HI-POT tester is directly connected with the positive electrode and the negative electrode of the battery cell through the probes to test the high voltage applied to the two sides of the battery cell, and can simply and quickly detect a single battery cell, but when detecting a large number of battery cells, the HI-POT tester is connected with the battery cell through a large number of relay switches, so that a large amount of manpower is consumed, and the efficiency is low; and whether the contact between the probe and the battery cell is normal or not cannot be determined, so that the error rate of the detection result is high.
Disclosure of Invention
The embodiment of the invention provides a multi-channel switching HI-POT testing device and a contact self-detection method thereof, which are used for solving the technical problem that whether a probe is normally contacted with a battery cell cannot be determined when the battery cell is detected by using the existing HI-POT test, so that the error rate of a detection result is high.
In order to achieve the above object, the embodiments of the present invention provide the following technical solutions:
a multi-channel switching HI-POT testing device comprises a tester, a signal transmission element and a tested element, wherein the signal transmission element is used for being connected with the tested element, the multi-channel switching HI-POT testing device further comprises a controller, a first control switch and a wiring self-checking module, the controller is connected with an input end of the tester, an anode output end of the tester is connected with an input end of the first control switch, an output end of the first control switch is respectively connected with the wiring self-checking module and the signal transmission element, and a cathode output end of the tester is respectively connected with the wiring self-checking module and the signal transmission element;
the controller is used for controlling the operation of the tester, the first control switch and the wiring self-checking module so that the tester tests the tested element;
and the wiring self-checking module is used for detecting whether the signal transmission element corresponding to the wiring self-checking module is in normal contact or not according to whether the input end of the controller receives a feedback signal or not.
Preferably, the multi-channel switching HI-POT test apparatus includes a second control switch, the second control switch is configured to turn on or off the connection between the controller and the tester, an input end of the second control switch is connected to the controller, and an output end of the second control switch is connected to the tester.
Preferably, the multi-channel switching HI-POT test device comprises a serial port module for storing and recording test data of the tester, and the serial port module is respectively connected with the controller and the tester.
Preferably, the wiring self-test module includes a switch element having at least two sets of normally open contacts, one set of normally open contacts of the switch element is connected to the positive electrode or the negative electrode of the tested element through the signal transmission element, and the other set of normally open contacts of the switch element is connected to the input end of the controller after being connected to the positive electrode or the negative electrode of the tested element through the signal transmission element.
Preferably, the controller is a PLC.
Preferably, the signal transmission element is a dual probe.
Preferably, the multi-channel switching HI-POT test device comprises a channel wiring module, an output end of the tester is connected with an input end of the channel wiring module, and an output end of the channel wiring module is respectively connected with the wiring self-checking module and the first control switch; the channel wiring module is used for automatically switching and conducting the element to be tested corresponding to the pulse signal and the tester connecting loop according to the pulse signal output by the controller, a plurality of positive electrode wiring channels and a plurality of negative electrode wiring channels are arranged on the output end of the channel wiring module, each positive electrode wiring channel of the channel wiring module is connected with the positive electrode of the element to be tested through the first control switch and the signal transmission element, and each negative electrode wiring channel of the channel wiring module is connected with the negative electrode of the element to be tested through the signal transmission element.
Preferably, the channel wiring module comprises a positive channel wiring submodule and a negative channel wiring submodule, the positive channel wiring submodule and the negative channel wiring submodule are all provided with input wiring channels connected with the tester, the output end of the positive channel wiring submodule is provided with a plurality of positive wiring channels, the output end of the negative channel wiring submodule is provided with a plurality of negative wiring channels, each positive wiring channel is connected with the input end of the first control switch, and each negative wiring channel is respectively connected with the signal transmission element and the wiring self-checking module.
The invention also provides a contact self-checking method of the multi-channel switching HI-POT testing device, which comprises the following steps:
connecting a test loop according to the HI-POT test device switched by the multiple channels;
inputting a 0V power supply to a group of normally open contacts of a wiring self-checking module, controlling a first control switch corresponding to the wiring self-checking module to be closed, and judging whether an input end of a controller corresponding to the first control switch receives a signal fed back by the 0V power supply;
if yes, the tested element and the signal transmission element are normally contacted;
if not, the tested element is not in normal contact with the signal transmission element or the test loop is abnormal.
The invention also provides terminal equipment, which comprises a processor and a memory;
the memory is used for storing program codes and transmitting the program codes to the processor;
the processor is used for executing the contact self-detection method of the HI-POT testing device for multi-channel switching according to the instructions in the program codes.
According to the technical scheme, the embodiment of the invention has the following advantages: the HI-POT testing device comprises a tester, a signal transmission element, a tested element, a controller, a first control switch and a wiring self-checking module, wherein the signal transmission element is used for being connected with the tested element, the controller is connected with the input end of the tester, the positive output end of the tester is connected with the input end of the first control switch, the output end of the first control switch is respectively connected with the wiring self-checking module and the signal transmission element, and the negative output end of the tester is respectively connected with the wiring self-checking module and the signal transmission element. The HI-POT testing device with multi-channel switching realizes the contact self-detection of the signal transmission element by the mutual matching of the controller, the first control switch and the wiring self-detection module, prevents the misjudgment of a testing result and improves the testing accuracy of a tester on the tested element; an interlock circuit is formed by the first control switch and the wiring self-checking module, so that the simultaneous work of the test circuit and the contact self-checking circuit can be prevented, each electronic component in the multi-channel switching HI-POT test device is burnt out, and the test safety is improved; the method solves the technical problem that when the battery cell is detected by the existing HI-POT test, whether the contact between the probe and the battery cell is normal or not can not be determined, so that the error rate of the detection result is high.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
FIG. 1 is a block diagram of a multi-channel switched HI-POT test apparatus according to an embodiment of the present invention;
FIG. 2 is a block diagram of a multi-channel switched HI-POT testing apparatus according to another embodiment of the present invention;
FIG. 3 is a block diagram of a multi-channel switched HI-POT test apparatus according to another embodiment of the present invention;
fig. 4 is a block diagram of a multi-channel switched HI-POT test apparatus according to another embodiment of the present invention.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the embodiments described below are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the application provides a multi-channel switching HI-POT testing device and a contact self-detection method thereof, which are used for solving the technical problem that whether a probe is normally contacted with a battery cell cannot be determined when the battery cell is detected by using the existing HI-POT test, so that the error rate of a detection result is high.
The first embodiment is as follows:
fig. 1 is a block diagram of a multi-channel switching HI-POT test apparatus according to an embodiment of the present invention.
As shown in fig. 1, an embodiment of the present invention provides a multi-channel switched HI-POT test apparatus, including a tester 10, a signal transmission element 20, and a device under test 30, where the signal transmission element 20 is used for connecting the device under test 30, the apparatus further includes a controller 40, a first control switch 50, and a wiring self-checking module 60, where the controller 40 is connected to an input end of the tester 10, an anode output end of the tester 10 is connected to an input end of the first control switch 50, an output end of the first control switch 50 is respectively connected to the wiring self-checking module 60 and the signal transmission element 20, and a cathode output end of the tester 10 is respectively connected to the wiring self-checking module 60 and the signal transmission element 20.
In the embodiment of the present invention, the tester 10 is mainly used for testing the insulation resistance, the short circuit, the voltage resistance, and the like of the device 30 to be tested, and detecting whether the device 30 to be tested is a qualified product. The signal transmission element 20 may be an electronic component with conductive transmission signal, which may be a probe. The tested element 30 may be a battery cell, or may be another product that needs to be tested for performance.
In an embodiment of the present invention, the controller 40 may control operations of the tester 10, the first control switch 50 and the wiring self-test module 60, so that the tester 10 performs a test on the dut 30.
It should be noted that the controller 40 may be a PLC. In this embodiment, the PLC controls the first control switch 50 and the wiring self-test module 60 to operate, so as to implement contact self-test and instrument calibration on the signal transmission element in the multi-channel switching HI-POT test apparatus, thereby ensuring the test accuracy.
In an embodiment of the present invention, the first control switch 50 can be used to connect or disconnect the circuit connecting the tester 10 and the device under test 30.
It should be noted that the first control switch 50 may be a relay.
In the embodiment of the present invention, the wiring self-checking module 60 may be configured to detect whether the signal transmission element 20 corresponding to the wiring self-checking module 60 is in normal contact according to whether the input terminal of the controller 10 receives the feedback signal.
It should be noted that, because the signal transmission element 20 is a dual probe, each signal transmission element 20 is connected to one wiring self-test module 60, that is, at least two connection terminals are provided on each wiring self-test module 60, the two connection terminals are respectively connected to first ends of two probes in the signal transmission element 20, second ends of two probes in the signal transmission element 20 are connected to the element to be tested, and a first end of the first control switch 50 is connected to a first end of one probe in the signal transmission element 20. The wiring self-test module 60 may be constituted by a relay, contactor or circuit breaker. In the present embodiment, the wiring self-test module 60 is a relay as a case illustration, the HI-POT test apparatus with multi-channel switching is configured to load a 0V voltage signal to a normally open contact of the relay to one probe in the signal transmission element 20, and another probe in the signal transmission element 20 is connected to another set of normally open contacts of the relay to a first input end of the PLC; whether the signal transmission element is normally contacted or not is automatically detected, the PLC outputs high level through an output end corresponding to a first input end to control a first control switch 50 to be connected with a loop, a double probe in the signal transmission element 20 is pressed down to be in contact connection with a tested element 30, at the moment, the double probe in the signal transmission element 20 is contacted with the tested element 30 to form a conduction test loop, and a 0V voltage signal can be fed back to the first input end of the PLC, so that whether the contact is normal or not is judged; if the first input end of the PLC receives a feedback signal of the 0V voltage signal, it indicates that the signal transmission element 20 is normally contacted; otherwise, the signal transmission element 20 is in poor contact or the test loop of the multi-channel switched HI-POT test device is abnormal, so that the contact self-test of the multi-channel switched HI-POT test device is realized. A set of normally closed contacts of the relay of the wiring self-test module 60 is connected in series with the coil of the first control switch 50 to form an interlock circuit, so that the test and the contact self-test circuit can be prevented from working simultaneously, and therefore, all electronic components in the multi-channel switching HI-POT test device are burnt out. The contact self-detection of the multi-channel switching HI-POT testing device can judge whether the probe in the signal transmission element 20 is in contact with the element 30 to be tested or not, so that misjudgment is prevented.
The invention provides a multi-channel switching HI-POT testing device which comprises a tester, a signal transmission element, a tested element, a controller, a first control switch and a wiring self-checking module, wherein the signal transmission element is used for being connected with the tested element, the controller is connected with the input end of the tester, the positive output end of the tester is connected with the input end of the first control switch, the output end of the first control switch is respectively connected with the wiring self-checking module and the signal transmission element, and the negative output end of the tester is respectively connected with the wiring self-checking module and the signal transmission element. The HI-POT testing device with multi-channel switching realizes the contact self-detection of the signal transmission element by the mutual matching of the controller, the first control switch and the wiring self-detection module, prevents the misjudgment of a testing result and improves the testing accuracy of a tester on the tested element; an interlocking circuit is formed by the first control switch and the wiring self-checking module, so that the simultaneous work of the testing circuit and the contact self-checking circuit can be prevented, each electronic component in the multi-channel switching HI-POT testing device is burnt out, and the testing safety is improved; the method solves the technical problem that whether the contact between the probe and the battery cell is normal or not can not be determined when the battery cell is detected by adopting the HI-POT test in the prior art, so that the error rate of the detection result is high.
Fig. 2 is a block diagram of a multi-channel switched HI-POT test apparatus according to another embodiment of the present invention.
In one embodiment of the present invention, as shown in fig. 2, the multi-channel switching HI-POT test apparatus includes a second control switch 70, the second control switch 70 is used to turn on or off the connection between the controller 40 and the tester 10, the input terminal of the second control switch 70 is connected to the controller 40, and the output terminal of the second control switch 70 is connected to the tester 10.
The second control switch 70 may be a relay. In the embodiment of the present application, the second control switch 70 plays a role of relay control between the controller 40 and the tester 10, so that the multi-channel switched HI-POT test apparatus can control the tester 10 conveniently, and the multi-channel switched HI-POT test apparatus can be operated automatically or manually.
Fig. 3 is a block diagram of a multi-channel switched HI-POT test apparatus according to another embodiment of the present invention.
As shown in fig. 3, in the embodiment of the present invention, the multi-channel switching HI-POT test apparatus includes a serial module 80 for storing and recording test data of the tester, and the serial module 80 is connected to the controller 40 and the tester 10, respectively.
It should be noted that the serial module 80 may be a serial server. In this embodiment, the multi-channel switching HI-POT test apparatus records and collects data of the test instrument 10 for the tested element 30 through the serial port module 80, and may also implement remote control of the serial port module 80 through the serial port module 80.
As shown in fig. 1, in an embodiment of the present invention, the wiring self-test module 60 includes a switching element having at least two sets of normally open contacts, one set of normally open contacts of the switching element is connected to the positive electrode or the negative electrode of the tested element 30 through the signal transmission element 20, and the other set of normally open contacts of the switching element is connected to the input terminal of the controller 10 after being connected to the positive electrode or the negative electrode of the tested element 30 through the signal transmission element 20.
It should be noted that the switching element may be a relay.
Fig. 4 is a block diagram of a multi-channel switching HI-POT test apparatus according to another embodiment of the present invention.
As shown in fig. 4, in an embodiment of the present invention, the multi-channel switching HI-POT test apparatus includes a channel connection module 90, an output terminal of the tester 10 is connected to an input terminal of the channel connection module 90, and output terminals of the channel connection module 90 are respectively connected to the connection self-test module 60 and the first control switch 50; the channel wiring module 90 is used for automatically switching and conducting a circuit connecting the tested element 30 corresponding to the pulse signal and the tester 10 according to the pulse signal output by the controller 40, a plurality of positive electrode wiring channels and a plurality of negative electrode wiring channels are arranged on the output end of the channel wiring module 90, each positive electrode wiring channel of the channel wiring module 90 is connected with the positive electrode of one tested element 30 through the first control switch 50 and the signal transmission element 20, and each negative electrode wiring channel of the channel wiring module 90 is connected with the negative electrode of the tested element 30 through the signal transmission element 20. Wherein, the channel wiring module 90 includes a positive electrode channel wiring submodule and a negative electrode channel wiring submodule, the positive electrode channel wiring submodule and the negative electrode channel wiring submodule are all provided with input wiring channels connected with the tester 10, the output end of the positive electrode channel wiring submodule is provided with a plurality of positive electrode wiring channels, the output end of the negative electrode channel wiring submodule is provided with a plurality of negative electrode wiring channels, each positive electrode wiring channel is connected with the input end of the first control switch 50, and each negative electrode wiring channel is respectively connected with the signal transmission element 20 and the wiring self-checking module 60.
It should be noted that the channel wiring module 90 is integrated on a circuit board. In this embodiment, the multi-channel switching HI-POT test apparatus selects the device under test 30 by using the controller 40 and switches channels to connect the test loop corresponding to the device under test 30 through the channel connection module 90.
In the embodiment of the present invention, the multi-channel switching HI-POT test apparatus uses the controller 40 to control the output of the tester 10 through the second control switch 70, the channel wiring module 90 switches the multi-channel to the probes in each signal transmission element 20 according to the output of the tester 10 and the controller 40, when a test is required, the controller 40 controls the attraction of the first switch element 50 so that the probe in the corresponding signal transmission element 20 is pressed down to contact the tested element 30, and the controller 40 outputs the test related parameters to the two ends of the tested element 30 to implement the test on the tested element 30; the multi-channel switching HI-POT testing device can sequentially switch on the testing loop of the tested element 30 through the channel wiring module 90 according to the control program in the controller 40, realize the automatic testing of a large number of testing elements 30 and improve the testing efficiency.
Example two:
the embodiment of the invention also provides a contact self-checking party of the multi-channel switching HI-POT testing device, which comprises the following steps:
connecting a test loop according to the HI-POT test device switched by the multiple channels;
inputting a 0V power supply to a group of normally open contacts of a wiring self-checking module, controlling a first control switch corresponding to the wiring self-checking module to be closed, and judging whether an input end of a controller corresponding to the first control switch receives a signal fed back by the 0V power supply;
if yes, the tested element and the signal transmission element are normally contacted;
if not, the tested element is not in normal contact with the signal transmission element or the test loop is abnormal.
It should be noted that, because one set of normally open contacts of the wiring self-checking module is connected with one probe of the signal transmission element, and the other probe of the signal transmission element is connected with the other set of normally open contacts of the wiring self-checking module, a 0V voltage signal is loaded to the normally open contacts of the wiring self-checking module and then is sent to one probe of the signal transmission element, and the other probe of the signal transmission element is connected to the other set of normally open contacts of the relay and then is sent to the first input end of the controller; then, a high level is output through an output end of the controller corresponding to the first input end to control a first control switch to be connected with a loop, a double probe in the signal transmission element is pressed down to be in contact connection with the tested element, at the moment, the double probe in the signal transmission element is in contact with the tested element to form a conduction test loop, and a 0V voltage signal can be fed back to the first input end of the controller, so that whether the contact is normal or not is judged; if the first input end of the PLC of the controller receives a feedback signal of a 0V voltage signal, the signal transmission element is normally contacted; otherwise, the contact of the signal transmission element is poor or the test loop of the multi-channel switching HI-POT test device is abnormal, so that the contact self-test of the multi-channel switching HI-POT test device is realized. The contents of the multi-channel switched HI-POT test apparatus in the second embodiment are described in detail in the first embodiment, and the contents of the multi-channel switched HI-POT test apparatus in the second embodiment are not described in detail in this second embodiment.
Example three:
the invention also provides terminal equipment, which comprises a processor and a memory;
a memory for storing the program code and transmitting the program code to the processor;
and the processor is used for executing the contact self-checking method of the HI-POT testing device for multi-channel switching according to instructions in the program codes.
Illustratively, a computer program may be partitioned into one or more modules/units, stored in memory and executed by a processor to complete the application. One or more modules/units may be a series of computer program instruction segments capable of performing certain functions, the instruction segments being used to describe the execution of the computer program in the terminal device.
The terminal device may be a desktop computer, a notebook, a palm computer, a cloud server, or other computing device. The terminal device may include, but is not limited to, a processor, a memory. Those skilled in the art will appreciate that the terminal device is not limited and may include more or fewer components than those shown, or some components may be combined, or different components, e.g., the terminal device may also include input output devices, network access devices, buses, etc.
The Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The storage may be an internal storage unit of the terminal device, such as a hard disk or a memory of the terminal device. The memory may also be an external storage device of the terminal device, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like provided on the terminal device. Further, the memory may also include both an internal storage unit of the terminal device and an external storage device. The memory is used for storing computer programs and other programs and data required by the terminal device. The memory may also be used to temporarily store data that has been output or is to be output.
It can be clearly understood by those skilled in the art that, for convenience and simplicity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk, and various media capable of storing program codes.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A multi-channel switching HI-POT testing device comprises a tester, a signal transmission element and a tested element, wherein the signal transmission element is used for being connected with the tested element, and the multi-channel switching HI-POT testing device is characterized by further comprising a controller, a first control switch and a wiring self-checking module, wherein the controller is connected with the input end of the tester, the positive output end of the tester is connected with the input end of the first control switch, the output end of the first control switch is respectively connected with the wiring self-checking module and the signal transmission element, and the negative output end of the tester is respectively connected with the wiring self-checking module and the signal transmission element;
the controller is used for controlling the operation of the tester, the first control switch and the wiring self-checking module so that the tester tests the tested element;
and the wiring self-checking module is used for detecting whether the signal transmission element corresponding to the wiring self-checking module is in normal contact or not according to whether the input end of the controller receives a feedback signal or not.
2. The multi-channel switched HI-POT test apparatus of claim 1, further comprising a second control switch for turning on or off the connection between the controller and the tester, wherein an input of the second control switch is connected to the controller, and an output of the second control switch is connected to the tester.
3. The multi-channel switched HI-POT test apparatus according to claim 1, further comprising a serial module for storing and recording test data of the tester, wherein the serial module is connected to the controller and the tester, respectively.
4. The multi-channel switching HI-POT test device according to claim 1, wherein the wiring self-test module comprises a switch element having at least two normally open contact sets, one normally open contact set of the switch element is connected to the positive electrode or the negative electrode of the tested element through the signal transmission element, and the other normally open contact set of the switch element is connected to the input terminal of the controller after being connected to the positive electrode or the negative electrode of the tested element through the signal transmission element.
5. The multi-channel switched HI-POT test apparatus of claim 1, wherein the controller is a PLC.
6. The multi-channel switched HI-POT test apparatus of claim 1, wherein the signal transmission element is a dual probe.
7. The multi-channel switched HI-POT test apparatus according to claim 1, comprising a channel wiring module, wherein an output terminal of the tester is connected to an input terminal of the channel wiring module, and an output terminal of the channel wiring module is connected to the wiring self-test module and the first control switch, respectively; the channel wiring module is used for automatically switching and conducting the element to be tested corresponding to the pulse signal and the tester connecting loop according to the pulse signal output by the controller, a plurality of positive electrode wiring channels and a plurality of negative electrode wiring channels are arranged on the output end of the channel wiring module, each positive electrode wiring channel of the channel wiring module is connected with the positive electrode of the element to be tested through the first control switch and the signal transmission element, and each negative electrode wiring channel of the channel wiring module is connected with the negative electrode of the element to be tested through the signal transmission element.
8. The multi-channel switched HI-POT test apparatus according to claim 7, wherein the channel connection module comprises a positive channel connection submodule and a negative channel connection submodule, each of the positive channel connection submodule and the negative channel connection submodule is provided with an input connection channel connected to the tester, an output terminal of the positive channel connection submodule is provided with a plurality of positive connection channels, an output terminal of the negative channel connection submodule is provided with a plurality of negative connection channels, each positive connection channel is connected to an input terminal of the first control switch, and each negative connection channel is connected to the signal transmission element and the wiring self-checking module respectively.
9. A contact self-checking method of a multi-channel switching HI-POT testing device is characterized by comprising the following steps:
switching on the test loop according to the multi-channel switched HI-POT test arrangement of any of claims 1-8;
inputting a 0V power supply to a group of normally open contacts of a wiring self-checking module, controlling a first control switch corresponding to the wiring self-checking module to be closed, and judging whether an input end of a controller corresponding to the first control switch receives a signal fed back by the 0V power supply;
if yes, the tested element and the signal transmission element are normally contacted;
if not, the tested element is not in normal contact with the signal transmission element or the test loop is abnormal.
10. A terminal device comprising a processor and a memory;
the memory is used for storing program codes and transmitting the program codes to the processor;
the processor, configured to execute the contact self-test method of the multi-channel switched HI-POT test apparatus according to the instructions in the program code, according to claim 9.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210909661.0A CN115184822A (en) | 2022-07-29 | 2022-07-29 | HI-POT testing device with multi-channel switching and contact self-checking method thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210909661.0A CN115184822A (en) | 2022-07-29 | 2022-07-29 | HI-POT testing device with multi-channel switching and contact self-checking method thereof |
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| CN115184822A true CN115184822A (en) | 2022-10-14 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20230003800A1 (en) * | 2021-07-02 | 2023-01-05 | Sk On Co., Ltd. | Contact test device for hi-pot test and hi-pot test system having the same |
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- 2022-07-29 CN CN202210909661.0A patent/CN115184822A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20230003800A1 (en) * | 2021-07-02 | 2023-01-05 | Sk On Co., Ltd. | Contact test device for hi-pot test and hi-pot test system having the same |
| US11754628B2 (en) * | 2021-07-02 | 2023-09-12 | Sk On Co., Ltd. | Contact test device for hi-pot test and hi-pot test system having the same |
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