TWI759466B - 用於進行自動化測試的系統及使用自動化測試設備以進行測試的方法 - Google Patents

用於進行自動化測試的系統及使用自動化測試設備以進行測試的方法 Download PDF

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Publication number
TWI759466B
TWI759466B TW107113557A TW107113557A TWI759466B TW I759466 B TWI759466 B TW I759466B TW 107113557 A TW107113557 A TW 107113557A TW 107113557 A TW107113557 A TW 107113557A TW I759466 B TWI759466 B TW I759466B
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Taiwan
Prior art keywords
test
primitive
primitives
control server
program
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TW107113557A
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English (en)
Chinese (zh)
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TW201842447A (zh
Inventor
羅特姆 納鴻
瑞貝卡 托伊
佩琳 潘
俊森 劉
里昂 陳
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日商愛德萬測試股份有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G01R31/287—Procedures; Software aspects

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
TW107113557A 2017-04-28 2018-04-20 用於進行自動化測試的系統及使用自動化測試設備以進行測試的方法 TWI759466B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/582,137 2017-04-28
US15/582,137 US10451668B2 (en) 2017-04-28 2017-04-28 Test program flow control

Publications (2)

Publication Number Publication Date
TW201842447A TW201842447A (zh) 2018-12-01
TWI759466B true TWI759466B (zh) 2022-04-01

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TW107113557A TWI759466B (zh) 2017-04-28 2018-04-20 用於進行自動化測試的系統及使用自動化測試設備以進行測試的方法

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Country Link
US (1) US10451668B2 (enExample)
JP (1) JP6748671B2 (enExample)
KR (1) KR102481257B1 (enExample)
CN (1) CN109031086B (enExample)
TW (1) TWI759466B (enExample)

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TWI813505B (zh) * 2022-11-15 2023-08-21 瑞昱半導體股份有限公司 使用複數種儀器以進行複數種電路測試的方法以及建立可用於複數種儀器之通用格式檔案的方法
TWI900102B (zh) * 2023-07-31 2025-10-01 旺矽科技股份有限公司 基於節點流程的自動化設備客製化功能開發系統、運作方法、檢測系統與非暫態電腦可讀取儲存媒體

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CN112115013A (zh) * 2019-06-21 2020-12-22 昆山纬绩资通有限公司 测试数据汇总系统与其方法
US12320851B2 (en) 2020-03-05 2025-06-03 Advantest Corporation Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socket
US11860229B2 (en) 2020-03-05 2024-01-02 Advantest Corporation Device interface board supporting devices with multiple different standards to interface with the same socket
KR20230038407A (ko) * 2020-07-21 2023-03-20 주식회사 아도반테스토 상이한 테스트 활동이 테스트 대상 장치 리소스의 서브세트를 활용하는, 하나 이상의 테스트 대상 장비를 테스트하는 자동 테스트 장비, 프로세스 및 컴퓨터 프로그램
CN112649717B (zh) * 2020-09-15 2024-07-26 深圳市几米物联有限公司 一种测试方法、装置、终端设备及存储介质
CN114474149B (zh) * 2021-12-21 2024-04-05 深圳优地科技有限公司 自动化测试方法、装置、服务器及可读存储介质
CN115617665A (zh) * 2022-10-21 2023-01-17 道普信息技术有限公司 一种基于流程引擎和jmeter的性能测试方法及系统

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US20140237292A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Gui implementations on central controller computer system for supporting protocol independent device testing
US20150028908A1 (en) * 2013-07-24 2015-01-29 Advantest Corporation High speed tester communication interface between test slice and trays
TW201511505A (zh) * 2013-09-14 2015-03-16 Chunghwa Telecom Co Ltd ＩＰｖ６ＣＥ標準之自動化測試系統

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI813505B (zh) * 2022-11-15 2023-08-21 瑞昱半導體股份有限公司 使用複數種儀器以進行複數種電路測試的方法以及建立可用於複數種儀器之通用格式檔案的方法
TWI900102B (zh) * 2023-07-31 2025-10-01 旺矽科技股份有限公司 基於節點流程的自動化設備客製化功能開發系統、運作方法、檢測系統與非暫態電腦可讀取儲存媒體

Also Published As

Publication number Publication date
KR102481257B1 (ko) 2022-12-23
TW201842447A (zh) 2018-12-01
US10451668B2 (en) 2019-10-22
US20180313891A1 (en) 2018-11-01
KR20180121408A (ko) 2018-11-07
CN109031086B (zh) 2023-04-25
CN109031086A (zh) 2018-12-18
JP2018200305A (ja) 2018-12-20
JP6748671B2 (ja) 2020-09-02

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