KR102481257B1 - 시험 프로그램 흐름 제어 기법 - Google Patents

시험 프로그램 흐름 제어 기법 Download PDF

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KR102481257B1
KR102481257B1 KR1020180049196A KR20180049196A KR102481257B1 KR 102481257 B1 KR102481257 B1 KR 102481257B1 KR 1020180049196 A KR1020180049196 A KR 1020180049196A KR 20180049196 A KR20180049196 A KR 20180049196A KR 102481257 B1 KR102481257 B1 KR 102481257B1
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test
flows
primitive
control server
dut
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KR20180121408A (ko
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로템 나훔
레베카 토이
보일람 판
정정 리우
레온 첸
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주식회사 아도반테스토
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G01R31/287—Procedures; Software aspects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/60—Software deployment
    • G06F8/61—Installation

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
KR1020180049196A 2017-04-28 2018-04-27 시험 프로그램 흐름 제어 기법 Active KR102481257B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/582,137 2017-04-28
US15/582,137 US10451668B2 (en) 2017-04-28 2017-04-28 Test program flow control

Publications (2)

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KR20180121408A KR20180121408A (ko) 2018-11-07
KR102481257B1 true KR102481257B1 (ko) 2022-12-23

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US (1) US10451668B2 (enExample)
JP (1) JP6748671B2 (enExample)
KR (1) KR102481257B1 (enExample)
CN (1) CN109031086B (enExample)
TW (1) TWI759466B (enExample)

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KR200490761Y1 (ko) * 2019-01-16 2020-02-11 제이제이티솔루션 주식회사 Ssd 테스트 장비용 도킹 어셈블리 및 이를 포함하는 ssd 테스트 장비
CN112115013A (zh) * 2019-06-21 2020-12-22 昆山纬绩资通有限公司 测试数据汇总系统与其方法
US12320851B2 (en) 2020-03-05 2025-06-03 Advantest Corporation Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socket
US11860229B2 (en) 2020-03-05 2024-01-02 Advantest Corporation Device interface board supporting devices with multiple different standards to interface with the same socket
KR20230038407A (ko) * 2020-07-21 2023-03-20 주식회사 아도반테스토 상이한 테스트 활동이 테스트 대상 장치 리소스의 서브세트를 활용하는, 하나 이상의 테스트 대상 장비를 테스트하는 자동 테스트 장비, 프로세스 및 컴퓨터 프로그램
CN112649717B (zh) * 2020-09-15 2024-07-26 深圳市几米物联有限公司 一种测试方法、装置、终端设备及存储介质
CN114474149B (zh) * 2021-12-21 2024-04-05 深圳优地科技有限公司 自动化测试方法、装置、服务器及可读存储介质
CN115617665A (zh) * 2022-10-21 2023-01-17 道普信息技术有限公司 一种基于流程引擎和jmeter的性能测试方法及系统
TWI813505B (zh) * 2022-11-15 2023-08-21 瑞昱半導體股份有限公司 使用複數種儀器以進行複數種電路測試的方法以及建立可用於複數種儀器之通用格式檔案的方法
TWI900102B (zh) * 2023-07-31 2025-10-01 旺矽科技股份有限公司 基於節點流程的自動化設備客製化功能開發系統、運作方法、檢測系統與非暫態電腦可讀取儲存媒體

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US20140237292A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Gui implementations on central controller computer system for supporting protocol independent device testing
US20150028908A1 (en) 2013-07-24 2015-01-29 Advantest Corporation High speed tester communication interface between test slice and trays

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JPH1139180A (ja) * 1997-07-16 1999-02-12 Mitsubishi Electric Corp 半導体デバイステストシステムおよびそのサーバ装置
US6205407B1 (en) * 1998-02-26 2001-03-20 Integrated Measurement Systems, Inc. System and method for generating test program code simultaneously with data produced by ATPG or simulation pattern capture program
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JP4779906B2 (ja) * 2006-09-21 2011-09-28 横河電機株式会社 Ｌｓｉテストシステム
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JP2012167958A (ja) * 2011-02-10 2012-09-06 Nippon Syst Wear Kk 試験情報表示装置、方法、プログラム、および該ソフトウェアを格納したコンピュータ可読媒体
US20140237292A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Gui implementations on central controller computer system for supporting protocol independent device testing
US20150028908A1 (en) 2013-07-24 2015-01-29 Advantest Corporation High speed tester communication interface between test slice and trays

Also Published As

Publication number Publication date
TWI759466B (zh) 2022-04-01
TW201842447A (zh) 2018-12-01
US10451668B2 (en) 2019-10-22
US20180313891A1 (en) 2018-11-01
KR20180121408A (ko) 2018-11-07
CN109031086B (zh) 2023-04-25
CN109031086A (zh) 2018-12-18
JP2018200305A (ja) 2018-12-20
JP6748671B2 (ja) 2020-09-02

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