JP6748671B2 - テストプログラムフロー制御 - Google Patents

テストプログラムフロー制御 Download PDF

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Publication number
JP6748671B2
JP6748671B2 JP2018084431A JP2018084431A JP6748671B2 JP 6748671 B2 JP6748671 B2 JP 6748671B2 JP 2018084431 A JP2018084431 A JP 2018084431A JP 2018084431 A JP2018084431 A JP 2018084431A JP 6748671 B2 JP6748671 B2 JP 6748671B2
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Japan
Prior art keywords
test
flows
program
control server
dut
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Japanese (ja)
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JP2018200305A5 (enExample
JP2018200305A (ja
Inventor
ナホム ロテム
ナホム ロテム
トイ レベッカ
トイ レベッカ
ファン ボイラム
ファン ボイラム
リュー ジュンツォン
リュー ジュンツォン
チェン レオン
チェン レオン
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Advantest Corp
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Advantest Corp
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Publication of JP2018200305A5 publication Critical patent/JP2018200305A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G01R31/287—Procedures; Software aspects

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
JP2018084431A 2017-04-28 2018-04-25 テストプログラムフロー制御 Active JP6748671B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/582,137 2017-04-28
US15/582,137 US10451668B2 (en) 2017-04-28 2017-04-28 Test program flow control

Publications (3)

Publication Number Publication Date
JP2018200305A JP2018200305A (ja) 2018-12-20
JP2018200305A5 JP2018200305A5 (enExample) 2019-06-27
JP6748671B2 true JP6748671B2 (ja) 2020-09-02

Family

ID=63917144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018084431A Active JP6748671B2 (ja) 2017-04-28 2018-04-25 テストプログラムフロー制御

Country Status (5)

Country Link
US (1) US10451668B2 (enExample)
JP (1) JP6748671B2 (enExample)
KR (1) KR102481257B1 (enExample)
CN (1) CN109031086B (enExample)
TW (1) TWI759466B (enExample)

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KR200490761Y1 (ko) * 2019-01-16 2020-02-11 제이제이티솔루션 주식회사 Ssd 테스트 장비용 도킹 어셈블리 및 이를 포함하는 ssd 테스트 장비
CN112115013A (zh) * 2019-06-21 2020-12-22 昆山纬绩资通有限公司 测试数据汇总系统与其方法
US12320851B2 (en) 2020-03-05 2025-06-03 Advantest Corporation Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socket
US11860229B2 (en) 2020-03-05 2024-01-02 Advantest Corporation Device interface board supporting devices with multiple different standards to interface with the same socket
KR20230038407A (ko) * 2020-07-21 2023-03-20 주식회사 아도반테스토 상이한 테스트 활동이 테스트 대상 장치 리소스의 서브세트를 활용하는, 하나 이상의 테스트 대상 장비를 테스트하는 자동 테스트 장비, 프로세스 및 컴퓨터 프로그램
CN112649717B (zh) * 2020-09-15 2024-07-26 深圳市几米物联有限公司 一种测试方法、装置、终端设备及存储介质
CN114474149B (zh) * 2021-12-21 2024-04-05 深圳优地科技有限公司 自动化测试方法、装置、服务器及可读存储介质
CN115617665A (zh) * 2022-10-21 2023-01-17 道普信息技术有限公司 一种基于流程引擎和jmeter的性能测试方法及系统
TWI813505B (zh) * 2022-11-15 2023-08-21 瑞昱半導體股份有限公司 使用複數種儀器以進行複數種電路測試的方法以及建立可用於複數種儀器之通用格式檔案的方法
TWI900102B (zh) * 2023-07-31 2025-10-01 旺矽科技股份有限公司 基於節點流程的自動化設備客製化功能開發系統、運作方法、檢測系統與非暫態電腦可讀取儲存媒體

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JP2944256B2 (ja) * 1991-06-10 1999-08-30 三菱電機株式会社 デバッグ用プログラム作成方法
JPH1139180A (ja) * 1997-07-16 1999-02-12 Mitsubishi Electric Corp 半導体デバイステストシステムおよびそのサーバ装置
US6205407B1 (en) * 1998-02-26 2001-03-20 Integrated Measurement Systems, Inc. System and method for generating test program code simultaneously with data produced by ATPG or simulation pattern capture program
US6978410B1 (en) * 1999-09-25 2005-12-20 Advantest Corp. Test language conversion method
CN1243341C (zh) * 2001-03-22 2006-02-22 株式会社鼎新 测试语言转换方法
US6788077B2 (en) 2001-12-20 2004-09-07 Abb Inc. Automated test sequence editor and engine for transformer testing
US7379860B1 (en) 2002-03-29 2008-05-27 Cypress Semiconductor Corporation Method for integrating event-related information and trace information
JP2009544012A (ja) 2006-07-10 2009-12-10 アステリオン・インコーポレイテッド 試験システムで処理を実行するシステムおよび方法
JP4779906B2 (ja) * 2006-09-21 2011-09-28 横河電機株式会社 Ｌｓｉテストシステム
JP2008139137A (ja) * 2006-12-01 2008-06-19 Yokogawa Electric Corp 試験装置及びそのデバッグシステム
US7587293B2 (en) * 2007-05-09 2009-09-08 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor CP (circuit probe) test management system and method
US20090113245A1 (en) 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus
US20090112548A1 (en) 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
JP5115208B2 (ja) * 2008-01-21 2013-01-09 富士通株式会社 測定／試験アクセス制御装置及び方法並びにそのプログラム
US8078424B2 (en) * 2008-09-29 2011-12-13 Advantest Corporation Test apparatus
US8775884B2 (en) * 2009-03-04 2014-07-08 Alcatel Lucent Method and apparatus for position-based scheduling for JTAG systems
US8514919B2 (en) 2009-08-26 2013-08-20 Bae Systems National Security Solutions Inc. Synthetic instrument unit
JP2012167958A (ja) * 2011-02-10 2012-09-06 Nippon Syst Wear Kk 試験情報表示装置、方法、プログラム、および該ソフトウェアを格納したコンピュータ可読媒体
US10048304B2 (en) * 2011-10-25 2018-08-14 Teradyne, Inc. Test system supporting simplified configuration for controlling test block concurrency
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US9952276B2 (en) * 2013-02-21 2018-04-24 Advantest Corporation Tester with mixed protocol engine in a FPGA block
US20140236527A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems
US20140237292A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Gui implementations on central controller computer system for supporting protocol independent device testing
US9310427B2 (en) * 2013-07-24 2016-04-12 Advantest Corporation High speed tester communication interface between test slice and trays
TWI538444B (zh) * 2013-09-14 2016-06-11 Chunghwa Telecom Co Ltd IPv6 CE standard automated test system

Also Published As

Publication number Publication date
KR102481257B1 (ko) 2022-12-23
TWI759466B (zh) 2022-04-01
TW201842447A (zh) 2018-12-01
US10451668B2 (en) 2019-10-22
US20180313891A1 (en) 2018-11-01
KR20180121408A (ko) 2018-11-07
CN109031086B (zh) 2023-04-25
CN109031086A (zh) 2018-12-18
JP2018200305A (ja) 2018-12-20

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