TWI755505B - sheet expansion device - Google Patents

sheet expansion device Download PDF

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TWI755505B
TWI755505B TW107109815A TW107109815A TWI755505B TW I755505 B TWI755505 B TW I755505B TW 107109815 A TW107109815 A TW 107109815A TW 107109815 A TW107109815 A TW 107109815A TW I755505 B TWI755505 B TW I755505B
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workpiece
expansion
sheet
elastic wave
wave detection
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TW107109815A
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TW201835992A (en
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政田孝行
川口吉洋
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日商迪思科股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67132Apparatus for placing on an insulating substrate, e.g. tape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • H01L2221/68336Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer
    • H01L2221/68386Separation by peeling

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Dicing (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

[課題]提供一種片擴張裝置,其可不殘留未分割區域而分割工件或薄膜狀接著劑,並且抑制發生擴張片的斷裂。[解決手段] 片擴張裝置係具備:環狀框架固定手段(20),其係固定環狀框架(11);擴張手段(30、31),其等係推壓擴張片(12)而使其擴張;彈性波檢測感測器(50、51、52、53),其係檢測工件(13)或薄膜狀接著劑因擴張片擴張而沿著分割起點(16)斷裂時所產生的彈性波;以及控制手段(40)。控制手段係以工件或薄膜狀接著劑完全斷裂時之來自彈性波檢測感測器的輸出訊號之值為基準,作為閾值而預先記憶,當因擴張片擴張而進行分割時,來自彈性波檢測感測器的輸出訊號未達到閾值時,視為存在未斷裂區域而輸出錯誤訊號。[Problem] To provide a sheet expanding device capable of dividing a workpiece or a film-like adhesive without leaving an undivided region and suppressing the occurrence of breakage of the expanding sheet. [Solution] The sheet expansion device is provided with: annular frame fixing means (20) for fixing the annular frame (11); expansion means (30, 31) for pressing the expansion sheet (12) to make it Expansion; elastic wave detection sensors (50, 51, 52, 53), which detect the elastic waves generated when the workpiece (13) or the film-like adhesive is broken along the dividing starting point (16) due to the expansion of the expansion sheet; and means of control (40). The control means is based on the value of the output signal from the elastic wave detection sensor when the workpiece or the film-like adhesive is completely broken, and is stored in advance as a threshold value. When the output signal of the detector does not reach the threshold, it is considered that there is an unbroken area and an error signal is output.

Description

片擴張裝置sheet expansion device

本發明係關於一種用來分割晶圓等工件或薄膜狀接著劑的片擴張裝置。The present invention relates to a sheet expansion device for dividing workpieces such as wafers or film-like adhesives.

一種對於半導體晶圓沿著分割預定線照射具有穿透性的雷射光束,藉由吸收多光子,形成成為分割起點的改質層,以改質層為分割起點而分割晶圓的技術已被公開。此外,一種作為改質層以外的分割起點,形成雷射加工槽或切割槽等的技術也眾所周知。當沿著分割預定線而分割形成有分割起點的晶圓等大致為圓板狀的工件時,首先,將工件黏貼在繃緊於環狀框架的擴張片上。又,藉由對擴張片進行擴張,給予工件外力,從分割起點使貫穿於厚度方向的裂痕產生而分割工件(參照專利文獻1)。A technology in which a semiconductor wafer is irradiated with a penetrating laser beam along a predetermined dividing line, and a modified layer is formed as the starting point of the dividing by absorbing multiple photons, and the wafer is divided by using the modified layer as the starting point of the dividing. public. In addition, a technique for forming laser processing grooves, dicing grooves, etc. as a starting point of division other than the modified layer is also known. When dividing a substantially disk-shaped workpiece, such as a wafer having a starting point for division, along the planned division line, first, the workpiece is adhered to the expansion piece that is stretched on the annular frame. In addition, by expanding the expansion piece, an external force is applied to the workpiece, and a crack penetrating in the thickness direction is generated from the starting point of division, and the workpiece is divided (refer to Patent Document 1).

此外,一種將在背面具有稱為DAF(Die Attach Film;晶粒貼覆膜)的幾μm~100μm左右之厚度的由環氧樹脂等構成的薄膜狀接著劑的工件加以分割的技術已被公開。若工件和DAF共同藉由擴張片的擴張而被分割時,則會形成DAF附著的晶片。晶片最後被加熱,經由DAF而與預定的對象接合(參照專利文獻2)。In addition, there has been disclosed a technique for dividing a workpiece having a thin film adhesive made of epoxy resin or the like with a thickness of several μm to 100 μm called DAF (Die Attach Film) on the backside. . When the workpiece and the DAF are both divided by the expansion of the expansion sheet, a wafer to which the DAF is attached will be formed. The wafer is finally heated and bonded to a predetermined object via DAF (refer to Patent Document 2).

在藉由如上述的擴張片的擴張而進行工件的分割(擴張斷裂)的片擴張裝置方面,係在保持擴張片周邊部的環狀框架與擴張片之中黏貼有工件的區域之間,藉由往工件的厚度方向產生相對移動,而使擴張片擴張。例如,眾所周知的片擴張裝置,其結構係固定保持環狀框架,利用頂起構件頂起擴張片。In the sheet expansion device for dividing (expanding and breaking) a workpiece by the expansion of the expansion sheet as described above, it is connected between the annular frame holding the peripheral portion of the expansion sheet and the region of the expansion sheet to which the workpiece is adhered. The expansion piece is expanded by relative movement in the thickness direction of the workpiece. For example, a well-known sheet expansion device has a structure in which a ring-shaped frame is fixed and held, and the expansion sheet is pushed up by a push-up member.

若頂起構件的相對頂起不足時,則擴張片的擴張會不足。於是,由於不能將外力適當地作用於工件,所以工件無法被充分地分割,而會在一部分的分割預定線產生未分割區域。此處,所謂未分割區域,係指沿著分割預定線的區域之中,無貫穿於厚度方向的裂痕,未適當地分割工件的區域。另一方面,若頂起構件的相對頂起過量,則擴張片會不耐擴張而斷裂。If the relative push-up of the push-up member is insufficient, the expansion of the expansion piece will be insufficient. Then, since the external force cannot be properly applied to the workpiece, the workpiece cannot be sufficiently divided, and undivided regions are generated in some of the planned division lines. Here, the undivided region refers to a region in which there is no crack penetrating in the thickness direction among the regions along the line to be divided, and the workpiece is not properly divided. On the other hand, if the relative push-up of the push-up member is excessive, the expansion sheet may not be resistant to expansion and break.

頂起構件對於環狀框架的相對頂起量的適當值,會隨著分割工件而形成的各個晶片的大小或擴張片的種類等而不同。因此,要預先進行實驗等,取得適合晶片的大小或擴張片的種類的頂起量之值,將頂起構件的相對頂起量設定在其適當的值後,再實施擴張片的擴張。 [習知技術文獻] [專利文獻]The appropriate value of the relative lift amount of the lift member with respect to the annular frame varies depending on the size of each wafer formed by dividing the workpiece, the type of the expansion piece, and the like. Therefore, an experiment or the like is performed in advance to obtain a value of the push-up amount suitable for the size of the wafer or the type of the expansion sheet, and the relative push-up amount of the push-up member is set to an appropriate value before expanding the expansion sheet. [Prior Art Documents] [Patent Documents]

[專利文獻1]日本特許第3408805號公報 [專利文獻2]日本特開2009-272503號公報[Patent Document 1] Japanese Patent No. 3408805 [Patent Document 2] Japanese Patent Laid-Open No. 2009-272503

[發明所欲解決的課題] 然而,即使是基於預先取得的值而設定頂起構件的相對頂起量的情況,因工件或擴張片的性質偏差等原因,而在實際進行擴張斷裂時,也有殘留未分割區域之虞。因此,有時會比上述的適當頂起量某種程度多一些設定頂起量。此頂起量的增加,係操作裝置的操作者以目測量進行估測,所以為了要得到不使未分割區域產生且不使擴張片斷裂的最適當值,需要經驗或技巧。[Problem to be Solved by the Invention] However, even in the case of setting the relative lifting amount of the lifting member based on a value acquired in advance, when the actual expansion fracture occurs due to the variation in the properties of the workpiece or the expansion piece, etc. There is a risk of remaining undivided areas. Therefore, the jacking amount may be set somewhat more than the above-mentioned proper jacking amount. This increase in the lift amount is estimated by the operator of the operating device by visual measurement, so experience or skill is required to obtain the optimum value that does not generate an undivided area and does not break the expansion piece.

本發明係鑒於這種問題而完成,其目的在於提供一種可不殘留未分割區域而分割沿著分割預定線所分割的工件或沿著各個晶片所分割的薄膜狀接著劑,並且抑制發生擴張片斷裂的片擴張裝置。The present invention has been made in view of such a problem, and an object of the present invention is to provide a thin-film adhesive that can divide a workpiece divided along a line to divide or divided along each wafer without leaving an undivided region, and suppress the occurrence of breakage of the expansion sheet sheet expansion device.

[解決課題的技術手段] 本發明係一種片擴張裝置,其係在經由擴張片而將工件支撐於中央有開口的環狀框架的形態下,擴張擴張片,沿著分割起點而分割該工件,或者沿著各個晶片而分割薄膜狀接著劑,該擴張片係黏貼於沿著交叉的多條分割預定線而形成有該分割起點的該工件或黏貼於分割後的各個晶片背面的該薄膜狀接著劑的背面者,該片擴張裝置具備:環狀框架固定手段,其係具有支撐工件單元的環狀框架的支撐面,並固定載置於支撐面上的環狀框架;擴張手段,其係以推壓部推壓該環狀框架固定手段所固定的該環狀框架的內周與該工件的外周之間的擴張片,以擴張擴張片;彈性波檢測感測器,其係擴張擴張片後,檢測沿著分割起點而該工件斷裂時或沿著各個晶片而薄膜狀接著劑斷裂時所產生的彈性波;以及控制手段,其中,控制手段具備:記憶部,其係以沿著分割起點而工件完全斷裂時或沿著各個晶片而薄膜狀接著劑完全斷裂時之來自彈性波檢測感測器的輸出訊號之值為基準,作為閾值而預先記憶,當擴張擴張片後,沿著分割起點而斷裂工件之際或沿著各個晶片而斷裂薄膜狀接著劑之際,在來自彈性波檢測感測器的輸出訊號未達到閾值時,視為存在未斷裂區域而輸出錯誤訊號。[Technical Means for Solving the Problem] The present invention relates to a sheet expanding device that expands the expanding sheet in a form of supporting the workpiece on a ring-shaped frame having an opening in the center via the expanding sheet, and divides the workpiece along the dividing starting point, Alternatively, the film-like adhesive is divided along each wafer, and the expansion sheet is adhered to the workpiece having the dividing starting point formed along a plurality of intersecting planned dividing lines, or the film-like adhesive adhered to the back surface of each divided wafer. On the back side of the agent, the sheet expansion device is provided with: annular frame fixing means having a support surface for supporting the annular frame of the workpiece unit, and fixing the annular frame placed on the support surface; The pressing part pushes the expansion piece between the inner circumference of the annular frame and the outer circumference of the workpiece fixed by the annular frame fixing means, so as to expand the expansion piece; the elastic wave detection sensor is after expanding the expansion piece , detecting elastic waves generated when the workpiece is broken along the starting point of division or when the film adhesive is broken along each wafer; and control means, wherein the control means includes: a memory part for recording along the starting point of division When the workpiece is completely broken or the film adhesive is completely broken along each wafer, the value of the output signal from the elastic wave detection sensor is based on the value, which is stored as a threshold value in advance. When breaking the workpiece or breaking the thin-film adhesive along each wafer, if the output signal from the elastic wave detection sensor does not reach the threshold value, it is considered that there is an unbroken area, and an error signal is output.

藉由本發明的片擴張裝置,由於預先將工件或薄膜狀接著劑良好斷裂時的彈性波作為閾值而加以記憶,在擴張斷裂中將來自彈性波檢測感測器的輸出訊號之值與閾值比較,與閾值同等時,可判斷為完全斷裂,所以可使擴張片成為最適當的擴張狀態。此外,由於藉由在擴張斷裂中將來自彈性波檢測感測器的輸出訊號之值與閾值比較,因可進行未斷裂區域是否殘留的判斷,所以可防止未斷裂的情況。According to the sheet expansion device of the present invention, since the elastic wave when the workpiece or the film adhesive is well fractured is memorized as a threshold value in advance, the value of the output signal from the elastic wave detection sensor is compared with the threshold value during the expansion fracture. When it is equal to the threshold value, it can be determined that it is completely broken, so that the expansion piece can be brought into the most appropriate expansion state. In addition, by comparing the value of the output signal from the elastic wave detection sensor with the threshold value during the expansion fracture, it is possible to judge whether or not the unbroken area remains, so that the unbroken situation can be prevented.

[發明功效] 藉由本發明,可得到一種片擴張裝置,其可不殘留未分割區域而分割沿著分割預定線所分割的工件或沿著各個晶片所分割的薄膜狀接著劑,並且抑制發生擴張片的斷裂。[Effect of the Invention] According to the present invention, a sheet expanding device can be obtained, which can divide a workpiece divided along a planned dividing line or a film-like adhesive divided along each wafer without leaving an undivided region, and suppress the generation of expanded sheets. break.

以下,就關於本實施形態的片擴張裝置進行說明。圖1為關於本實施形態的片擴張裝置的立體圖。圖2與圖3為顯示片擴張裝置的第1形態的剖面圖,圖4為顯示片擴張裝置的第2形態的剖面圖,圖5為顯示片擴張裝置的第3形態的剖面圖,圖6為顯示片擴張裝置的第4形態的剖面圖。首先,參照圖1至圖3,說明第1至第4形態共通的片擴張裝置的結構。再者,片擴張裝置並不受此結構限定,可以適當變更。Hereinafter, the sheet expansion device of the present embodiment will be described. FIG. 1 is a perspective view of the sheet expansion device according to the present embodiment. 2 and 3 are cross-sectional views showing the first aspect of the sheet expansion device, FIG. 4 is a cross-sectional view showing the second aspect of the sheet expansion device, FIG. 5 is a cross-sectional view showing the third aspect of the sheet expansion device, and FIG. 6 It is a sectional view showing the fourth aspect of the sheet expansion device. First, with reference to FIGS. 1-3, the structure of the sheet expansion apparatus common to the 1st to 4th forms is demonstrated. In addition, the sheet expansion device is not limited to this structure, and can be appropriately changed.

圖1所示的片擴張裝置1,係保持構成工件單元10的環狀框架11,藉由使繃緊於環狀框架11上的擴張片12擴張,而使工件13分割者。在環狀框架11的中央形成有為擴張片12所覆蓋的圓形狀的開口14。擴張片12在開口14的周邊區域被固定於環狀框架11的背面側,且在開口14的內側區域為可彈性變形。此擴張片12的可彈性變形的部分被黏貼於大致呈圓板狀的工件13的背面。工件13的外徑小於環狀框架11的開口14的內徑,在工件13的外周13a與環狀框架11的內周(開口14的內緣部)之間有徑向的間隙。The sheet expansion device 1 shown in FIG. 1 holds the annular frame 11 constituting the workpiece unit 10, and divides the workpiece 13 by expanding the expansion sheet 12 stretched on the annular frame 11. A circular opening 14 covered with the expansion piece 12 is formed in the center of the annular frame 11 . The expansion piece 12 is fixed to the back side of the annular frame 11 in the peripheral region of the opening 14 , and is elastically deformable in the inner region of the opening 14 . The elastically deformable portion of the expansion piece 12 is adhered to the back surface of the workpiece 13 having a substantially disc shape. The outer diameter of the workpiece 13 is smaller than the inner diameter of the opening 14 of the annular frame 11 , and there is a radial gap between the outer circumference 13 a of the workpiece 13 and the inner circumference of the annular frame 11 (the inner edge of the opening 14 ).

在工件13的表面設有交叉成格子狀的多條分割預定線15(參照圖1),在為分割預定線15所區劃的各區域形成有各種元件(圖示省略)。此外,在工件13的內部,沿著分割預定線15形成有成為分割起點的改質層16(參照圖2)。再者,改質層16係指:藉由照射雷射,使工件13內部的密度、折射率、機械強度或其他的物理特性成為與周圍不同的狀態,強度比周圍低的區域。在本實施形態中,雖然例示改質層16作為分割起點,但分割起點若使工件13的強度低而成為分割時的起點即可,例如也可以是雷射加工槽、切割槽、劃線。A plurality of planned dividing lines 15 (refer to FIG. 1 ) intersecting in a lattice shape are provided on the surface of the workpiece 13 , and various elements (not shown) are formed in each region defined by the planned dividing lines 15 . In addition, inside the workpiece 13 , a modified layer 16 serving as a starting point for division is formed along the line to be divided 15 (see FIG. 2 ). In addition, the modified layer 16 refers to a region where the density, refractive index, mechanical strength, or other physical properties inside the workpiece 13 are different from those in the surroundings by irradiating a laser, and the intensity is lower than that of the surroundings. In this embodiment, the modified layer 16 is exemplified as the starting point for division, but the starting point for division may be a starting point for division if the strength of the workpiece 13 is low.

片擴張裝置1具備保持工件單元10的環狀框架11的框架固定手段20。框架固定手段20具備俯視為四角形的支撐台21、以及從上方覆蓋支撐台21的支撐面22的蓋板23。支撐台21由多支支撐腳24從下側支撐。在支撐台21與蓋板23各自的中央形成有和環狀框架11的開口14大致相同直徑的圓形開口25、26。The sheet expansion device 1 includes frame fixing means 20 for holding the annular frame 11 of the workpiece unit 10 . The frame fixing means 20 includes a support base 21 having a quadrangular shape in plan view, and a cover plate 23 that covers the support surface 22 of the support base 21 from above. The support table 21 is supported from the lower side by a plurality of support legs 24 . Circular openings 25 and 26 having substantially the same diameter as the opening 14 of the annular frame 11 are formed in the centers of the support base 21 and the cover plate 23 .

如圖2所示,工件單元10係使工件13朝向上方,在支撐面22上載置環狀框架11。在此狀態下,若將蓋板23安裝於支撐台21上時,環狀框架11就為支撐台21的支撐面22與蓋板23所夾住而保持,並且擴張片12的可彈性變形的部分與工件13位於圓形開口25、26的內側。蓋板23為未圖示的夾具等所固定於支撐台21上,藉此,環狀框架11以固定狀態被牢固地保持。As shown in FIG. 2 , the workpiece unit 10 places the annular frame 11 on the support surface 22 with the workpiece 13 facing upward. In this state, when the cover plate 23 is installed on the support table 21, the annular frame 11 is held by the support surface 22 of the support table 21 and the cover plate 23, and the elastically deformable elastic deformation of the expansion piece 12 is maintained. Parts and workpiece 13 are located inside circular openings 25,26. The cover plate 23 is fixed to the support base 21 by a jig or the like not shown, whereby the annular frame 11 is firmly held in a fixed state.

在片擴張裝置1的中央具備升降台30。升降台30具有俯視大致為圓形的外周形狀,且其直徑小於框架固定手段20的圓形開口25、26的內徑。升降台30係經由多個滾珠螺桿機構31而從下側被支撐。各滾珠螺桿機構31具有馬達31a、從馬達31a向上方延伸並為馬達31a所旋轉的滾珠螺桿31b、與滾珠螺桿31b螺合的螺母31c、以及螺母31c所連結的支撐腳31d。螺母31c與支撐腳31d限制以滾珠螺桿31b的軸線為中心的旋轉,在支撐腳31d的上端固定有升降台30。因此,驅動各滾珠螺桿機構31的馬達31a而滾珠螺桿31b旋轉時,螺母31c與支撐腳31d就會上下移動而使升降台30升降。升降台30可移動到位於支撐台21下方的待機位置與位於支撐台21上方的頂起位置(參照圖3),在從待機位置往頂起位置移動時,係通過圓形開口25、26的內側,將擴張片12從下方向上方推壓。藉由此推壓,擴張片12被擴張。即,藉由推壓擴張片12的推壓部即升降台30與使升降台30升降的滾珠螺桿機構31,構成使擴張片12擴張的擴張手段。The lift table 30 is provided in the center of the sheet expansion apparatus 1 . The lift table 30 has a substantially circular outer peripheral shape in plan view, and its diameter is smaller than the inner diameter of the circular openings 25 and 26 of the frame fixing means 20 . The lift table 30 is supported from the lower side via a plurality of ball screw mechanisms 31 . Each ball screw mechanism 31 includes a motor 31a, a ball screw 31b extending upward from the motor 31a and rotated by the motor 31a, a nut 31c screwed to the ball screw 31b, and a support leg 31d to which the nut 31c is coupled. The nut 31c and the support leg 31d restrict the rotation about the axis of the ball screw 31b, and the lift table 30 is fixed to the upper end of the support leg 31d. Therefore, when the motor 31a of each ball screw mechanism 31 is driven and the ball screw 31b is rotated, the nut 31c and the support leg 31d move up and down, and the lift table 30 is raised and lowered. The lift table 30 can be moved to a standby position below the support table 21 and a jack-up position above the support table 21 (see FIG. 3 ). When moving from the standby position to the jack-up position, it passes through the circular openings 25 and 26 Inside, the expansion piece 12 is pressed from below to above. By this pressing, the expansion piece 12 is expanded. That is, the expansion means for expanding the expansion piece 12 is constituted by the lift table 30 , which is a pressing portion that presses the expansion piece 12 , and the ball screw mechanism 31 for raising and lowering the lift table 30 .

在升降台30的外緣,遍及全周設有多個滾輪33。如圖2所示,多個滾輪33係分別以軸部33a為中心而可旋轉地被支撐於形成於升降台30外緣的階梯部34內。在升降台30上升時,各滾輪33接觸擴張片12的下表面而進行推壓。各滾輪33推壓擴張片12的位置為位在環狀框架11的內周(開口14的內緣部)與工件13的外周13a之間的區域。On the outer edge of the lift table 30, a plurality of rollers 33 are provided over the entire circumference. As shown in FIG. 2 , each of the plurality of rollers 33 is rotatably supported in a stepped portion 34 formed on the outer edge of the lift table 30 with the shaft portion 33 a as the center. When the lift table 30 ascends, each roller 33 contacts the lower surface of the expansion piece 12 and presses it. The position where each roller 33 presses the expansion piece 12 is an area between the inner circumference of the annular frame 11 (the inner edge of the opening 14 ) and the outer circumference 13 a of the workpiece 13 .

在以上的片擴張裝置1方面,若驅動滾珠螺桿機構31的馬達31a而使升降台30從待機位置往上方緩慢移動,就會如圖2所示,多個滾輪33接觸位於圓形開口25、26內側的擴張片12的下表面。若使升降台30再往上方移動時,就會將擴張片12的工件13的黏貼區域上推,藉由圖3以箭形符號F1所示的方向之力拉扯擴張片12。藉此,將擴張片12的工件13的黏貼區域向徑向擴張。於是,對於工件13,往擴徑方向的外力起作用,會以形成於工件13內的改質層16(圖2)為起點,在工件13的厚度方向產生裂痕。藉由給予外力到裂痕貫穿工件13的表裡,而沿著分割預定線15(圖1) 分割為各個晶片C(圖3)。藉由將滾珠螺桿機構31用於擴張手段,可以微細高精度來調整升降台30的升降,或者使升降台30的升降速度成為可變而適當地管理工件13的斷裂速度。In the above-mentioned sheet expanding device 1, if the motor 31a of the ball screw mechanism 31 is driven to slowly move the lift table 30 upward from the standby position, as shown in FIG. 26 The lower surface of the expansion sheet 12 inside. If the lift table 30 is moved further upwards, the sticking area of the workpiece 13 of the expansion sheet 12 will be pushed up, and the expansion sheet 12 will be pulled by the force in the direction indicated by the arrow F1 in FIG. 3 . Thereby, the adhesive region of the workpiece 13 of the expansion piece 12 is expanded radially. Then, an external force in the diameter-expanding direction acts on the workpiece 13 to generate cracks in the thickness direction of the workpiece 13 starting from the modified layer 16 ( FIG. 2 ) formed in the workpiece 13 . By applying an external force to the front and back of the workpiece 13 , the cracks penetrate the workpiece 13 , and are divided into individual wafers C ( FIG. 3 ) along the dividing line 15 ( FIG. 1 ). By using the ball screw mechanism 31 as the expansion means, the lifting and lowering of the lift table 30 can be adjusted with fine precision and high precision, or the lifting and lowering speed of the lift table 30 can be changed to appropriately manage the fracture speed of the workpiece 13 .

如圖3所示,當以升降台30頂起擴張片12而使其擴張時,擴張片12的角度會在升降台30的外緣部分改變。藉由配置多個滾輪33,可抑制擴張片12在升降台30的外緣部分的摩擦,使其順利擴張。As shown in FIG. 3 , when the expansion piece 12 is pushed up by the lift table 30 to expand, the angle of the expansion piece 12 changes at the outer edge of the lift table 30 . By arranging the plurality of rollers 33 , the friction of the expansion piece 12 on the outer edge portion of the lift table 30 can be suppressed, and the expansion can be made smoothly.

工件13的分割完畢後,驅動滾珠螺桿機構31的馬達31a,使升降台30下降到待機位置。接著,解除框架固定手段20的環狀框架11的固定,而從片擴張裝置1卸下工件單元10。After the division of the workpiece 13 is completed, the motor 31a of the ball screw mechanism 31 is driven, and the lift table 30 is lowered to the standby position. Next, the fixing of the annular frame 11 by the frame fixing means 20 is released, and the workpiece unit 10 is removed from the sheet expanding device 1 .

在如以上的片擴張裝置1的擴張斷裂方面,如圖3,到工件13被完全分割為全部的晶片C為止,需要使升降台30移動到上方。若升降台30對於擴張片12的頂起量不足,則沿著工件13的分割預定線15的區域之中,未被適當分割的未分割區域會殘留。另一方面,若升降台30的頂起量過大時,則有擴張片12不耐擴張而產生斷裂之虞。因此,一般要求適切地設定升降台30的頂起量。然而,隨著擴張片12或工件13的性質的偏差,要不殘留未分割區域而進行分割所需的外力會微妙地不同,所以難以同樣地設定升降台30的頂起量。本實施形態係可按照工件13的分割狀態而容易管理升降台30的頂起量者,茲將其特點說明於下。In the expansion and fracture of the sheet expansion apparatus 1 as described above, until the workpiece 13 is completely divided into all the wafers C as shown in FIG. 3 , it is necessary to move the lift table 30 upward. If the lifting amount of the elevating table 30 with respect to the expansion piece 12 is insufficient, an undivided region that has not been properly divided remains in the region along the line 15 to be divided into the workpiece 13 . On the other hand, when the lifting amount of the lift table 30 is too large, the expansion sheet 12 may not be resistant to expansion and may be broken. Therefore, it is generally required to appropriately set the jacking amount of the lift table 30 . However, since the external force required for dividing without leaving an undivided region differs subtly according to the properties of the expansion piece 12 or the workpiece 13 , it is difficult to set the jacking amount of the lift table 30 in the same way. In this embodiment, the lifting amount of the lift table 30 can be easily managed according to the divided state of the workpiece 13, and the characteristics thereof will be described below.

圖2及圖3所示的第1形態的片擴張裝置1具備控制手段40、通知手段41、以及彈性波檢測感測器50。控制手段40係總括控制片擴張裝置1者,係由執行各種處理的處理器或記憶體等所構成。通知手段41係可用畫面顯示、發光、聲音等通知後述的錯誤狀態者,係由設於片擴張裝置1上的顯示畫面、發光部、揚聲器等所構成。The sheet expansion apparatus 1 of the first aspect shown in FIGS. 2 and 3 includes a control means 40 , a notification means 41 , and an elastic wave detection sensor 50 . The control means 40 collectively controls the sheet expansion apparatus 1, and is constituted by a processor, a memory, and the like that execute various processes. The notification means 41 notifies an error state to be described later by means of screen display, light emission, sound, and the like, and is composed of a display screen, a light-emitting unit, a speaker, and the like provided in the sheet expansion apparatus 1 .

彈性波檢測感測器50係由例如具備檢測彈性波的功能的AE感測器(Acoustic Emission Sensor;聲發射感測器)所構成。具體而言,彈性波檢測感測器50具備固定於固定凸緣(圖示省略)內部的超音波振盪器(圖示省略)。超音波振盪器係用例如鈦酸鋇(BaTiO3 )、鋯鈦酸鉛(Pb(Zi、Ti)O3 )、鈮酸鋰(LiNbO3 )、鉭酸鋰(LiTaO3 )等材料形成,具有將振動變換成電壓(振動訊號)的性質。The elastic wave detection sensor 50 is constituted by, for example, an AE sensor (Acoustic Emission Sensor; acoustic emission sensor) having a function of detecting elastic waves. Specifically, the elastic wave detection sensor 50 includes an ultrasonic oscillator (not shown) fixed inside a fixing flange (not shown). Ultrasonic oscillators are made of materials such as barium titanate (BaTiO 3 ), lead zirconate titanate (Pb(Zi, Ti) O 3 ), lithium niobate (LiNbO 3 ), and lithium tantalate (LiTaO 3 ), and have The property of converting vibration into voltage (vibration signal).

如圖2及圖3所示,彈性波檢測感測器50安裝於升降台30上,特別是在升降台30之中滾輪33的正下方的位置配置彈性波檢測感測器50。如圖3,一使擴張片12擴張時,伴隨工件13的斷裂,就會釋放應變能作為彈性波。因為此工件13的分割而產生的彈性波會經由:接觸擴張片12的滾輪33與通過軸部33a來支撐滾輪33的升降台30,而傳播到彈性波檢測感測器50。彈性波檢測感測器50檢測傳播的彈性波,將輸出訊號輸出到控制手段40。As shown in FIGS. 2 and 3 , the elastic wave detection sensor 50 is mounted on the lift table 30 , and particularly, the elastic wave detection sensor 50 is disposed in the lift table 30 at a position directly below the roller 33 . As shown in FIG. 3 , when the expansion sheet 12 is expanded, along with the fracture of the workpiece 13 , strain energy is released as an elastic wave. The elastic wave generated by the division of the workpiece 13 propagates to the elastic wave detection sensor 50 via the roller 33 contacting the expansion sheet 12 and the lift table 30 supporting the roller 33 through the shaft portion 33a. The elastic wave detection sensor 50 detects the propagating elastic wave, and outputs an output signal to the control means 40 .

彈性波檢測感測器50檢測到的輸出訊號為訊號處理部(圖示省略)所變換成輸出電壓後,被輸入到控制手段40。控制手段40具有記憶部40a、比較部40b、以及驅動控制部40c。記憶部40a係由上述的記憶體所構成,預先記憶有表示工件13分割完畢的狀態的彈性波檢測感測器50的輸出訊號作為閾值資料。比較部40b係於片擴張裝置1正在進行擴張斷裂之中,比較記憶於記憶部40a的閾值與來自彈性波檢測感測器50的輸出訊號,並判斷輸出訊號是否達到閾值。驅動控制部40c係控制滾珠螺桿機構31的馬達31a動作的部位。按照比較部40b的判斷結果,以驅動控制部40c控制馬達31a動作的繼續或停止。The output signal detected by the elastic wave detection sensor 50 is converted into an output voltage by a signal processing unit (not shown), and then input to the control means 40 . The control means 40 includes a memory unit 40a, a comparison unit 40b, and a drive control unit 40c. The memory unit 40a is composed of the above-mentioned memory, and stores in advance, as threshold data, the output signal of the elastic wave detection sensor 50 indicating the state in which the workpiece 13 has been divided. The comparison part 40b compares the threshold value stored in the memory part 40a with the output signal from the elastic wave detection sensor 50, and determines whether the output signal reaches the threshold value when the sheet expansion device 1 is undergoing expansion and fracture. The drive control unit 40 c is a portion that controls the operation of the motor 31 a of the ball screw mechanism 31 . According to the determination result of the comparison part 40b, the drive control part 40c controls the continuation or stop of the operation of the motor 31a.

更詳細係基於工件13不殘留未分割區域而被良好地斷裂(分割)為各晶片C時的彈性波檢測感測器50的輸出訊號,來設定上述閾值。圖7為顯示彈性波檢測感測器50的檢測結果之例的圖形。在圖7的圖形中,縱軸為彈性波檢測感測器50輸出的AE值,橫軸為經過時間,係檢測升降台30開始上升後到使其停止的結果。工件13被斷裂而產生彈性波時,AE值就會變大。圖7所示的AE值的輸出波形W1係顯示工件13不殘留未分割區域而被完全斷裂為各晶片C的情況。基於此輸出波形W1,設定閾值。例如,作為由輸出波形W1所描繪的區域內的面積所表示的AE值的累積輸出作為閾值來設定。當設定閾值時,藉由使升降台30的頂起量多一些,容易判定分割完畢的時點。如此得到的閾值被記憶於記憶部40a。More specifically, the threshold value is set based on the output signal of the elastic wave detection sensor 50 when the workpiece 13 is well fractured (divided) into each wafer C without leaving an undivided region. FIG. 7 is a graph showing an example of the detection result of the elastic wave detection sensor 50 . In the graph of FIG. 7 , the vertical axis represents the AE value output by the elastic wave detection sensor 50 , and the horizontal axis represents the elapsed time, which is the result of detecting the elevating stage 30 after it started to rise until it stopped. When the workpiece 13 is broken and an elastic wave is generated, the AE value increases. The output waveform W1 of the AE value shown in FIG. 7 shows that the workpiece 13 is completely broken into the respective wafers C without leaving undivided regions. Based on this output waveform W1, a threshold value is set. For example, the threshold value is set as the cumulative output of the AE value represented by the area within the region drawn by the output waveform W1. When the threshold value is set, it is easy to determine when the division is completed by increasing the lift-up amount of the lift table 30 . The threshold value thus obtained is stored in the memory unit 40a.

接著,將支撐未分割工件13的工件單元10設定於片擴張裝置1上,並驅動滾珠螺桿機構31的馬達31a,一面使升降台30以預定速度上升,一面以控制手段40監控彈性波檢測感測器50的輸出訊號。控制手段40以比較部40b比較記憶於記憶部40a的閾值與來自彈性波檢測感測器50的輸出訊號,進行預定的處理或動作管理。具體而言,將作為閾值所記憶的圖7的輸出波形W1的累積輸出(以輸出波形W1所描繪的區域內的面積)與實際所得到的彈性波檢測感測器50的AE值的輸出波形的累積輸出(以輸出波形所描繪的區域內的面積)加以 比較,而在此等累積輸出為同等時,可判斷為未分割區域未殘留而工件13被完全斷裂。另一方面,如圖7所示的輸出波形W2,在AE值的累積輸出(以輸出波形W2所描繪的區域內的面積)未達到為閾值之輸出波形W1的累積輸出時,可判斷為工件13的斷裂不足,而殘留未分割區域。Next, the workpiece unit 10 supporting the undivided workpiece 13 is set on the sheet expanding device 1, and the motor 31a of the ball screw mechanism 31 is driven to raise the lift table 30 at a predetermined speed, while monitoring the elastic wave detection sense by the control means 40. The output signal of the detector 50. The control means 40 compares the threshold value stored in the memory unit 40a with the output signal from the elastic wave detection sensor 50 by the comparison unit 40b, and performs predetermined processing or operation management. Specifically, the cumulative output of the output waveform W1 of FIG. 7 memorized as the threshold value (the area in the region depicted by the output waveform W1 ) and the output waveform of the AE value of the elastic wave detection sensor 50 actually obtained The accumulated outputs of 2 (in the area within the region delineated by the output waveform) are compared, and when these accumulated outputs are equal, it can be determined that the undivided region does not remain and the workpiece 13 is completely broken. On the other hand, as shown in the output waveform W2 shown in FIG. 7 , when the cumulative output of the AE value (the area within the region delineated by the output waveform W2 ) does not reach the cumulative output of the output waveform W1 which is the threshold value, it can be determined as a workpiece 13 is insufficiently fractured, leaving unsegmented areas.

作為基於以上的比較結果而進行的處理或動作管理,例如,當來自彈性波檢測感測器50的輸出訊號達到閾值時,以驅動控制部40c使滾珠螺桿機構31的馬達31a的動作(升降台30的頂起動作)停止。由於在來自彈性波檢測感測器50的輸出訊號與閾值等同時,可判斷為工件13被完全斷裂,所以在此時點,對於擴張片12的頂起量為足夠,判定為可使升降台30停止。此外,由於在此時點的升降台30的頂起量為必要最小限度,所以過大的負荷不施加於擴張片12,可防止斷裂。即,可用適切之最適當的頂起量,使對擴張片12的推壓完成。再者,也可以控制成:估計一些檢測誤差,在經過預定時間(預定的驅動量)後,而不是來自彈性波檢測感測器50的輸出訊號達到閾值的瞬間,來使滾珠螺桿機構31的馬達31a停止。As processing and operation management based on the above comparison results, for example, when the output signal from the elastic wave detection sensor 50 reaches a threshold value, the drive control unit 40c operates the motor 31a of the ball screw mechanism 31 (elevating table 30 jacking action) to stop. Since it can be determined that the workpiece 13 is completely broken at the same time as the output signal from the elastic wave detection sensor 50 and the threshold value, etc., at this point, the amount of lifting of the expansion piece 12 is sufficient, and it is determined that the lift table 30 can be lifted. stop. In addition, since the lift-up amount of the lift table 30 at this point is the minimum necessary, an excessive load is not applied to the expansion piece 12, and breakage can be prevented. That is, the pressing of the expansion piece 12 can be completed with the most appropriate amount of lifting. Furthermore, it is also possible to control such that some detection errors are estimated, and after a predetermined time (predetermined driving amount) has elapsed, rather than the moment when the output signal from the elastic wave detection sensor 50 reaches the threshold value, the ball screw mechanism 31 can be controlled. The motor 31a is stopped.

此外,預先進行實驗等,作為基準頂起量,取得適合工件13或擴張片12的種類或加工條件的頂起量之值,在某工件13的分割步驟,使升降台30向上方移動到基準頂起量時,藉由記憶於記憶部40a的閾值與來自彈性波檢測感測器50的輸出訊號的比較,也可以判斷工件13的分割是否已完畢。雖然使升降台30向上方移動到基準頂起量,但來自彈性波檢測感測器50的輸出訊號卻如圖7的輸出波形W2,未達到閾值時,判斷為未斷裂區域殘留於工件13上。此情況,表示存在未斷裂區域的錯誤訊號會從比較部40b被輸出。錯誤訊號一被輸出,控制手段40就會進行預定的錯誤處理。In addition, an experiment or the like is performed in advance to obtain a value of the lifting amount suitable for the type of the workpiece 13 or the expansion piece 12 or the processing conditions as the reference lifting amount, and in the dividing step of a certain workpiece 13, the lifting table 30 is moved upward to the reference value. At the time of the lifting amount, it can also be judged whether or not the division of the workpiece 13 has been completed by comparing the threshold value stored in the memory unit 40a with the output signal from the elastic wave detection sensor 50 . Although the lift table 30 is moved upward to the reference lift amount, the output signal from the elastic wave detection sensor 50 is the output waveform W2 shown in FIG. . In this case, an error signal indicating that there is an unbroken area is output from the comparison unit 40b. As soon as the error signal is output, the control means 40 performs predetermined error processing.

在錯誤處理方面,可用通知手段41使錯誤狀態的通知進行。接到錯誤狀態的通知,操作片擴張裝置1的操作者就會進行調整升降台30的頂起量等的對應。此時,控制手段40也可以繼續彈性波檢測感測器50的輸出訊號與閾值的比較,繼續判定及通知有無未斷裂區域。如此一來,基於未分割區域是否實際殘留的檢測結果,而不是以操作者的目測量來估測,可高精度地調整升降台30的頂起量。此外,作為錯誤處理,控制手段40自動調整升降台30的頂起量亦可。In error handling, the notification means 41 can be used to perform notification of the error state. Upon receiving the notification of the error state, the operator of the operation piece expansion device 1 will adjust the jacking amount of the lift table 30 and the like. At this time, the control means 40 may continue to compare the output signal of the elastic wave detection sensor 50 with the threshold value, and continue to determine and notify whether there is an unbroken area. In this way, based on the detection result of whether or not the undivided area actually remains, rather than estimation by the operator's visual measurement, the lifting amount of the lift table 30 can be adjusted with high accuracy. In addition, as error processing, the control means 40 may automatically adjust the jacking amount of the lift table 30 .

再者,假如因某些原因而產生擴張片12的破壞時,也可以藉由控制手段40與彈性波檢測感測器50檢測出來。彈性波檢測感測器50配置於接近接觸擴張片12的滾輪33的位置,因擴張片12的破壞而發生的彈性波容易傳播到彈性波檢測感測器50。由於擴張片12被破壞時所產生的彈性波與通常工件13因擴張斷裂而斷裂時所產生的彈性波的波形等不同,所以能夠辨別。在和工件13的斷裂時不同的異常的彈性波被彈性波檢測感測器50檢測出來時,控制手段40可判斷為產生了擴張片12的破壞。或者,預先以彈性波檢測感測器50檢測擴張片12破壞時的彈性波並使其記憶於記憶部40a,以比較部40b比較此記憶資料與所檢測出的異常的彈性波,也可以判斷是否產生了擴張片12的破壞。任一情況都判斷為產生了擴張片12的破壞時,控制手段40最好執行經由通知手段41而對操作者的通知、或滾珠螺桿機構31的馬達31a的動作停止,以防止損害的擴大。Furthermore, if the expansion sheet 12 is damaged due to some reasons, it can also be detected by the control means 40 and the elastic wave detection sensor 50 . The elastic wave detection sensor 50 is arranged at a position close to the roller 33 in contact with the expansion sheet 12 , and elastic waves generated by the breakage of the expansion sheet 12 easily propagate to the elastic wave detection sensor 50 . Since the elastic wave generated when the expansion sheet 12 is broken is different from the waveform or the like of the elastic wave generated when the workpiece 13 is generally broken due to expansion fracture, it can be discriminated. When the elastic wave detection sensor 50 detects an abnormal elastic wave different from the breakage of the workpiece 13 , the control means 40 can determine that the expansion sheet 12 is broken. Alternatively, the elastic wave when the expansion sheet 12 is broken is detected in advance by the elastic wave detection sensor 50 and stored in the memory unit 40a, and the comparison unit 40b compares the stored data with the detected abnormal elastic wave to determine Whether the expansion sheet 12 is damaged. In any case, when it is determined that the expansion piece 12 is broken, the control means 40 preferably informs the operator via the notification means 41 or stops the operation of the motor 31a of the ball screw mechanism 31 to prevent the damage from expanding.

設置彈性波檢測感測器的位置或彈性波檢測感測器的種類,可以是和以上說明的第1形態不同者,作為其變化例,將第2、第3及第4形態的片擴張裝置顯示於圖4至圖6。第2、第3及第4各形態係除了彈性波檢測感測器以外的元件都和上述的第1形態共通,共通的元件的說明省略。The position at which the elastic wave detection sensor is installed or the type of the elastic wave detection sensor may be different from those of the first aspect described above. As a modification example, the second, third, and fourth aspects of the sheet expansion device are used. shown in Figures 4 to 6. In each of the second, third, and fourth forms, elements other than the elastic wave detection sensor are common to the above-described first form, and the description of the common elements is omitted.

圖4所示的第2形態的片擴張裝置1,係彈性波檢測感測器51接觸擴張片12者。彈性波檢測感測器51係在徑向(以圖4的上下方向為垂直方向時的水平方向)位於工件13的中央附近,對於擴張片12從下表面側接觸。The sheet expansion device 1 of the second aspect shown in FIG. 4 is one in which the elastic wave detection sensor 51 is in contact with the expansion sheet 12 . The elastic wave detection sensor 51 is located in the vicinity of the center of the workpiece 13 in the radial direction (horizontal direction when the vertical direction in FIG. 4 is the vertical direction), and contacts the expansion sheet 12 from the lower surface side.

彈性波檢測感測器51為滾珠螺桿機構35所從下側支撐。滾珠螺桿機構35具有馬達35a、從馬達35a向上方延伸並為馬達35a所旋轉的滾珠螺桿35b、與滾珠螺桿35b螺合並限制旋轉的螺母35c、以及螺母35c連結的支撐腳35d,在支撐腳35d的上端支撐彈性波檢測感測器51。驅動馬達35a而滾珠螺桿35b旋轉時,螺母35c與支撐腳35d就會上下移動,並使彈性波檢測感測器51升降。藉由滾珠螺桿機構31的驅動而升降台30進行升降動作時,就會將滾珠螺桿機構35驅動控制成彈性波檢測感測器51也連動升降,維持彈性波檢測感測器51接觸擴張片12的狀態。而且,因工件13的斷裂而產生的彈性波會經過黏貼有工件13的擴張片12,傳播到彈性波檢測感測器51。The elastic wave detection sensor 51 is supported from the lower side by the ball screw mechanism 35 . The ball screw mechanism 35 includes a motor 35a, a ball screw 35b that extends upward from the motor 35a and is rotated by the motor 35a, a nut 35c that is screwed to the ball screw 35b and restricts rotation, and a support leg 35d connected to the nut 35c. The upper end of the elastic wave detection sensor 51 is supported. When the motor 35a is driven and the ball screw 35b is rotated, the nut 35c and the support leg 35d move up and down, and the elastic wave detection sensor 51 is moved up and down. When the elevating table 30 moves up and down by the drive of the ball screw mechanism 31 , the ball screw mechanism 35 is driven and controlled so that the elastic wave detection sensor 51 also moves up and down in conjunction, and the elastic wave detection sensor 51 is kept in contact with the expansion sheet 12 . status. Furthermore, the elastic wave generated by the fracture of the workpiece 13 propagates to the elastic wave detection sensor 51 through the expansion sheet 12 to which the workpiece 13 is adhered.

圖5所示的第3形態的片擴張裝置1,係在工件13的上方配置彈性波檢測感測器52。彈性波檢測感測器52從工件13離開,因工件13的斷裂而產生的彈性波會作為在空中傳播的音波,到達彈性波檢測感測器52。彈性波檢測感測器52和上述的AE感測器不同,係由可檢測包含可聽頻帶的較低頻率的聲波的麥克風所構成,將工件13斷裂時所產生的空氣的振動變換為電氣訊號後,輸出到控制手段40。In the sheet expansion apparatus 1 of the third aspect shown in FIG. 5 , the elastic wave detection sensor 52 is arranged above the workpiece 13 . The elastic wave detection sensor 52 is separated from the workpiece 13 , and the elastic wave generated by the breakage of the workpiece 13 reaches the elastic wave detection sensor 52 as a sound wave propagating in the air. Unlike the above-mentioned AE sensor, the elastic wave detection sensor 52 is composed of a microphone capable of detecting sound waves of lower frequencies including an audible frequency band, and converts the vibration of the air generated when the workpiece 13 is broken into an electrical signal After that, it is output to the control means 40 .

為了使彈性波檢測感測器52的檢測條件穩定,當升降台30進行頂起動作時,希望將工件13與彈性波檢測感測器52的距離保持於一定。即,與升降台30連動而使彈性波檢測感測器52升降動作即可。In order to stabilize the detection conditions of the elastic wave detection sensor 52 , it is desirable to keep the distance between the workpiece 13 and the elastic wave detection sensor 52 constant when the lift table 30 is jacked up. That is, the elastic wave detection sensor 52 may be moved up and down in conjunction with the lift table 30 .

圖6所示的第4形態的片擴張裝置1,不在升降台30而是在框架固定手段20之側,設有彈性波檢測感測器53。彈性波檢測感測器53係插入形成於蓋板23上的孔部,抵接於工件單元10的環狀框架11。工件13斷裂時所產生的彈性波會從擴張片12經由環狀框架11而傳播到彈性波檢測感測器53。The sheet expansion apparatus 1 of the fourth aspect shown in FIG. 6 is provided with an elastic wave detection sensor 53 not on the lift table 30 but on the side of the frame fixing means 20 . The elastic wave detection sensor 53 is inserted into a hole formed in the cover plate 23 and abuts against the annular frame 11 of the workpiece unit 10 . The elastic wave generated when the workpiece 13 is broken propagates from the expansion sheet 12 to the elastic wave detection sensor 53 via the annular frame 11 .

圖4與圖6的各形態的彈性波檢測感測器51、53,係與上述的第1形態(圖2、圖3)的彈性波檢測感測器50同樣,可由AE感測器構成。藉由使用AE感測器,可進行不易受到周圍噪音等影響的高精度的檢測。各彈性波檢測感測器50、51及53,彈性波的傳播路徑係依接觸的對象甚至感測器而互異,可適當選擇適合各個條件的不同的AE感測器來使用。The elastic wave detection sensors 51 and 53 of the respective aspects of FIGS. 4 and 6 may be constituted by AE sensors, similarly to the elastic wave detection sensor 50 of the first aspect ( FIGS. 2 and 3 ) described above. By using the AE sensor, high-precision detection that is not easily affected by ambient noise and the like can be performed. For the elastic wave detection sensors 50 , 51 and 53 , the propagation paths of elastic waves differ from each other depending on the contacted objects and even the sensors. Different AE sensors suitable for each condition can be appropriately selected and used.

如以上,在本實施形態中,檢測因工件13的斷裂而產生的彈性波,一面與顯示工件13良好斷裂時的彈性波的閾值的進行比較,一面進行擴張片12的擴張,並基於比較的結果,進行錯誤訊號的輸出或升降台30的動作控制等。藉此,可容易設定適切之最適當的擴張片12的擴張狀態,而不依賴操作者以目測量調整之類之難度高的管理。As described above, in the present embodiment, the elastic wave generated by the fracture of the workpiece 13 is detected, and the expansion of the expansion sheet 12 is performed while comparing with the threshold value of the elastic wave indicating the good fracture of the workpiece 13, and based on the comparison As a result, the output of an error signal, the operation control of the lift table 30, and the like are performed. Thereby, the expansion state of the most appropriate expansion piece 12 can be easily set, without relying on the operator's difficult management such as visual adjustment.

作為本實施形態的片擴張裝置1的分割加工對象的工件13,可以使用例如半導體元件晶圓、光元件晶圓、封裝基板、半導體基板、無機材料基板、氧化物晶圓等各種工件。就半導體元件晶圓而言,可以使用元件形成後的矽晶圓或化合物半導體晶圓。就光元件晶圓而言,可以使用元件形成後的藍寶石晶圓或碳化矽晶圓。此外,就封裝基板而言,可以使用CSP(Chip Size Package;晶片尺寸封裝)基板,就半導體基板而言,可以使用矽或砷化鎵等,就無機材料基板而言,可以使用藍寶石、陶瓷、玻璃等。再者,就氧化物晶圓而言,可以使用元件形成後或元件形成前的鉭酸鋰、鈮酸鋰。Various workpieces such as semiconductor element wafers, optical element wafers, package substrates, semiconductor substrates, inorganic material substrates, and oxide wafers can be used as the workpieces 13 to be divided and processed by the sheet expansion apparatus 1 of the present embodiment. As the semiconductor element wafer, a silicon wafer or a compound semiconductor wafer after element formation can be used. As the optical element wafer, a sapphire wafer or a silicon carbide wafer after element formation can be used. In addition, as a package substrate, a CSP (Chip Size Package) substrate can be used, as a semiconductor substrate, silicon, gallium arsenide, etc. can be used, and as an inorganic material substrate, sapphire, ceramic, glass etc. In addition, as the oxide wafer, lithium tantalate and lithium niobate can be used after element formation or before element formation.

此外,本發明的片擴張裝置的分割加工的對象並不限於如上述的工件。例如,也可以以黏貼於分割工件所得到的各個晶片背面的DAF(Die Attach Film;晶粒貼覆膜)之類的薄膜狀接著劑作為分割的對象。薄膜狀接著劑可以在將工件分割為各個晶片時和工件共同分割,也可以在分割為各個晶片後只使薄膜狀接著劑分割。In addition, the object of the division|segmentation process of the sheet|seat expansion apparatus of this invention is not limited to the workpiece|work mentioned above. For example, a film-like adhesive such as DAF (Die Attach Film) to be adhered to the back surface of each wafer obtained by dividing the workpiece may be used as the object of division. The thin film adhesive may be divided together with the workpiece when the workpiece is divided into individual wafers, or only the thin film adhesive may be divided after the division into the individual wafers.

此外,在本實施形態中,雖然例示了對於框架固定手段20(環狀框架11)使升降台30(擴張片12之中工件13的黏貼部分)升降移動的型式的片擴張裝置1,但也可以和此相反,應用於使環狀框架11升降移動而不使工件13移動的型式的片擴張裝置。具體而言,將相當於升降台30的部分變更為不升降而在一定位置支撐擴張片12及工件13的支撐台,將相當於框架固定手段20的部分變更為可升降移動的升降部。當進行擴張斷裂時,使保持環狀框架11的升降部向下方移動。此時,雖然支撐台本身不移動,但利用伴隨環狀框架11向下方移動的拉力,將擴張片12一面推壓到支撐台上一面擴張。因此,和上述實施形態的升降台30同樣,支撐台起作用作為推壓擴張片12的工件13黏貼區域的推壓部。In addition, in the present embodiment, the sheet expanding device 1 of the type in which the lifting table 30 (the portion where the workpiece 13 is adhered among the expanding sheets 12 ) is moved up and down with respect to the frame fixing means 20 (ring frame 11 ) is exemplified. Conversely, it can be applied to a sheet expanding device of a type that moves the annular frame 11 up and down without moving the workpiece 13 . Specifically, the part corresponding to the elevating table 30 is changed to a support table that supports the expansion piece 12 and the workpiece 13 at a predetermined position without raising and lowering, and the part corresponding to the frame fixing means 20 is changed to an elevating part that can move up and down. When expanding and breaking, the lifting portion holding the annular frame 11 is moved downward. At this time, although the support table itself does not move, the expansion piece 12 is expanded while being pressed against the support table by the pulling force accompanying the downward movement of the annular frame 11 . Therefore, like the lift table 30 of the above-described embodiment, the support table functions as a pressing portion that presses the area where the workpiece 13 of the expansion sheet 12 is adhered.

將這種不使工件13移動而使環狀框架11升降移動的型式的片擴張裝置應用於圖4或圖5的形態時,由於工件13的上下方向位置不變化,所以可變成彈性波檢測感測器51、52不進行升降動作的結構。When the sheet expanding device of the type in which the annular frame 11 is moved up and down without moving the workpiece 13 is applied to the form shown in FIG. 4 or FIG. 5 , since the vertical position of the workpiece 13 does not change, a sense of elastic wave detection can be obtained. The measuring devices 51 and 52 are configured so that they do not move up and down.

應用本發明的片擴張裝置可以單獨使用,也可以用作自由組合多個加工單元所構成的群集模組系統(cluster module system)的一部分。The sheet expansion apparatus to which the present invention is applied may be used alone, or may be used as a part of a cluster module system in which a plurality of processing units can be freely combined.

此外,雖然說明了本發明的各實施形態,但作為本發明的其他實施形態,也可以是將上述實施形態及變化例全體或部分組合者。In addition, although each embodiment of this invention was described, as another embodiment of this invention, the above-mentioned embodiment and modification example may be combined in whole or in part.

此外,本發明的實施形態並不受上述實施形態及變化例限定,在不脫離本發明的技術性思想的宗旨的範圍內,都可以各式各樣地變更、置換、變形。再者,若因技術進步或衍生的別的技術而可以用別的做法實現本發明的技術性思想,則也可以用該方法實施。因此,申請專利的範圍涵蓋了可包含於本發明的技術性思想的範圍內的所有的實施形態。In addition, the embodiment of the present invention is not limited to the above-described embodiment and modification examples, and various changes, substitutions, and deformations can be made without departing from the spirit of the technical idea of the present invention. Furthermore, if the technical idea of the present invention can be realized by another method due to technological progress or other derived technologies, this method can also be used. Therefore, the scope of the patent application covers all the embodiments that can be included in the scope of the technical idea of the present invention.

[產業上的可利用性] 如以上說明,本發明在使擴張片擴張而使工件或薄膜狀接著劑分割的片擴張裝置方面,具有不殘留未分割區域而可確實分割,並可抑制發生擴張片的斷裂這種效果,為有助於提高生產性或高精度的分割加工的片擴張裝置。[Industrial Applicability] As described above, the present invention has a sheet expansion device that expands an expansion sheet and divides a workpiece or a film-like adhesive, and has the ability to reliably divide without leaving an undivided region, and to suppress the occurrence of expansion. The effect of breaking the sheet is a sheet expanding device that contributes to improved productivity or high-precision division processing.

1‧‧‧片擴張裝置10‧‧‧工件單元11‧‧‧環狀框架12‧‧‧擴張片13‧‧‧工件13a‧‧‧外周14‧‧‧開口15‧‧‧分割預定線16‧‧‧改質層20‧‧‧框架固定手段21‧‧‧支撐台22‧‧‧支撐面23‧‧‧蓋板1‧‧‧Piece expansion device 10‧‧‧Workpiece unit 11‧‧‧Ring frame 12‧‧‧Expanding piece 13‧‧‧Workpiece 13a‧‧‧Outer periphery 14‧‧‧Opening 15‧‧‧Planning line for dividing 16‧ ‧‧Modified layer 20‧‧‧Frame fixing means 21‧‧‧Support table 22‧‧‧Support surface 23‧‧‧Cover plate

24:支撐腳 24: Support feet

25:圓形開口 25: round opening

26:圓形開口 26: Round opening

30:升降台(擴張手段、推壓部) 30: Lifting table (expansion means, pressing part)

31:滾珠螺桿機構(擴張手段) 31: Ball screw mechanism (expansion means)

33:滾輪(擴張手段、推壓部) 33: Roller (expansion means, pressing part)

34:階梯部 34: Step part

35:滾珠螺桿機構 35: Ball screw mechanism

40:控制手段 40: Control Means

40a:記憶部 40a: Memory Department

40b:比較部 40b: Comparison Section

40c:驅動控制部 40c: Drive Control Department

41:通知手段 41: Notification Means

50:彈性波檢測感測器 50: Elastic wave detection sensor

51:彈性波檢測感測器 51: Elastic wave detection sensor

52:彈性波檢測感測器 52: Elastic wave detection sensor

53:彈性波檢測感測器 53: Elastic wave detection sensor

C:晶片 C: wafer

圖1為關於本實施形態的片擴張裝置的立體圖。 圖2為顯示第1形態的片擴張裝置的剖面圖。 圖3為顯示以第1形態的片擴張裝置分割工件的狀態的剖面圖。 圖4為顯示第2形態的片擴張裝置的剖面圖。 圖5為顯示第3形態的片擴張裝置的剖面圖。 圖6為顯示第4形態的片擴張裝置的剖面圖。 圖7為顯示彈性波檢測感測器的檢測結果的曲線圖。FIG. 1 is a perspective view of the sheet expansion device according to the present embodiment. Fig. 2 is a cross-sectional view showing the sheet expansion device of the first aspect. 3 is a cross-sectional view showing a state in which the workpiece is divided by the sheet expanding device of the first aspect. FIG. 4 is a cross-sectional view showing the sheet expansion device of the second aspect. Fig. 5 is a cross-sectional view showing the sheet expansion device of the third aspect. Fig. 6 is a cross-sectional view showing the sheet expansion device of the fourth aspect. FIG. 7 is a graph showing the detection result of the elastic wave detection sensor.

1‧‧‧片擴張裝置 1‧‧‧Sheet expansion device

10‧‧‧工件單元 10‧‧‧Workpiece unit

11‧‧‧環狀框架 11‧‧‧Ring frame

12‧‧‧擴張片 12‧‧‧Expansion

13‧‧‧工件 13‧‧‧Workpiece

13a‧‧‧外周 13a‧‧‧Peripheral

14‧‧‧開口 14‧‧‧Opening

16‧‧‧改質層 16‧‧‧Modified layer

20‧‧‧框架固定手段 20‧‧‧Frame fixing means

21‧‧‧支撐台 21‧‧‧Support

22‧‧‧支撐面 22‧‧‧Support surface

23‧‧‧蓋板 23‧‧‧Cover

24‧‧‧支撐腳 24‧‧‧Support feet

25‧‧‧圓形開口 25‧‧‧Circular opening

26‧‧‧圓形開口 26‧‧‧Circular opening

30‧‧‧升降台(擴張手段、推壓部) 30‧‧‧Lifting table (expansion means, pressing part)

31‧‧‧滾珠螺桿機構(擴張手段) 31‧‧‧Ball screw mechanism (expansion means)

31a‧‧‧馬達 31a‧‧‧motor

31b‧‧‧滾珠螺桿 31b‧‧‧ball screw

31c‧‧‧螺母 31c‧‧‧nut

31d‧‧‧支撐腳 31d‧‧‧Support feet

33‧‧‧滾輪(擴張手段、推壓部) 33‧‧‧Roller (expanding means, pressing part)

33a‧‧‧軸部 33a‧‧‧Shaft

34‧‧‧階梯部 34‧‧‧Steps

40‧‧‧控制手段 40‧‧‧Control means

40a‧‧‧記憶部 40a‧‧‧Memory Department

40b‧‧‧比較部 40b‧‧‧Comparison

40c‧‧‧驅動控制部 40c‧‧‧Drive control section

41‧‧‧通知手段 41‧‧‧Means of notification

50‧‧‧彈性波檢測感測器 50‧‧‧Elastic wave detection sensor

Claims (1)

一種片擴張裝置,其係在經由擴張片而將工件支撐於中央有開口的環狀框架的形態下,擴張該擴張片,並沿著分割起點而分割該工件,或者沿著各個晶片而分割薄膜狀接著劑,該擴張片係黏貼於沿著交叉的多條分割預定線而形成有該分割起點的該工件或黏貼於分割後的各個晶片背面的該薄膜狀接著劑的背面, 該片擴張裝置具備: 環狀框架固定手段,其係具有支撐工件單元的該環狀框架的支撐面,並固定載置於該支撐面上的該環狀框架; 擴張手段,其係以推壓部推壓該環狀框架固定手段所固定的該環狀框架的內周與該工件的外周之間的該擴張片,以擴張該擴張片; 彈性波檢測感測器,其係擴張該擴張片後,檢測沿著該分割起點而該工件斷裂時或沿著各個晶片而該薄膜狀接著劑斷裂時所產生的彈性波;以及 控制手段, 其中,該控制手段具備:記憶部,其係以沿著該分割起點而該工件完全斷裂時或沿著各個晶片而該薄膜狀接著劑完全斷裂時之來自該彈性波檢測感測器的輸出訊號之值為基準,作為閾值而預先記憶, 當擴張該擴張片後,沿著該分割起點而斷裂該工件時或沿著各個晶片而斷裂該薄膜狀接著劑之際,在來自該彈性波檢測感測器的該輸出訊號未達到閾值時,視為存在未斷裂區域而輸出錯誤訊號。A sheet expansion device that expands the expansion sheet in the form of supporting a workpiece on a ring-shaped frame with an opening in the center via the expansion sheet, and divides the workpiece along the starting point of division, or divides the film along the respective wafers The expansion sheet is adhered to the workpiece with the starting point of division formed along the intersecting multiple planned division lines, or to the back of the film-shaped adhesive attached to the back of each wafer after division, the sheet expansion device comprising: an annular frame fixing means having a support surface for supporting the annular frame of the workpiece unit, and fixing the annular frame placed on the support surface; expanding means for pressing the annular frame with a pressing portion the expansion piece between the inner circumference of the annular frame and the outer circumference of the workpiece fixed by the annular frame fixing means, so as to expand the expansion piece; the elastic wave detection sensor detects the edge of the expansion piece after expanding the expansion piece elastic waves generated when the workpiece is broken along the division starting point or when the thin film adhesive is broken along the respective wafers; and a control means, wherein the control means includes: a memory portion which is arranged along the division starting point When the workpiece is completely broken or the film adhesive is completely broken along each wafer, the value of the output signal from the elastic wave detection sensor is based on the reference value, which is stored in advance as a threshold value. After expanding the expansion sheet, When the workpiece is broken along the dividing starting point or when the film adhesive is broken along each wafer, when the output signal from the elastic wave detection sensor does not reach the threshold value, it is considered that there is an unbroken area and Error signal is output.
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