TWI747536B - 探針 - Google Patents

探針 Download PDF

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Publication number
TWI747536B
TWI747536B TW109134128A TW109134128A TWI747536B TW I747536 B TWI747536 B TW I747536B TW 109134128 A TW109134128 A TW 109134128A TW 109134128 A TW109134128 A TW 109134128A TW I747536 B TWI747536 B TW I747536B
Authority
TW
Taiwan
Prior art keywords
probe
plunger
elastic body
flange
thrust
Prior art date
Application number
TW109134128A
Other languages
English (en)
Chinese (zh)
Other versions
TW202120933A (zh
Inventor
村中光代
荒木聖人
剱崎真一
北市幸裕
Original Assignee
日商村田製作所股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商村田製作所股份有限公司 filed Critical 日商村田製作所股份有限公司
Publication of TW202120933A publication Critical patent/TW202120933A/zh
Application granted granted Critical
Publication of TWI747536B publication Critical patent/TWI747536B/zh

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
TW109134128A 2019-10-04 2020-09-30 探針 TWI747536B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2019183984 2019-10-04
JP2019-183984 2019-10-04
JP2020011320 2020-01-28
JP2020-011320 2020-01-28

Publications (2)

Publication Number Publication Date
TW202120933A TW202120933A (zh) 2021-06-01
TWI747536B true TWI747536B (zh) 2021-11-21

Family

ID=75338054

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109134128A TWI747536B (zh) 2019-10-04 2020-09-30 探針

Country Status (4)

Country Link
JP (1) JP7136362B2 (enrdf_load_stackoverflow)
CN (1) CN114223098B (enrdf_load_stackoverflow)
TW (1) TWI747536B (enrdf_load_stackoverflow)
WO (1) WO2021065702A1 (enrdf_load_stackoverflow)

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW528871B (en) * 1999-02-18 2003-04-21 Capital Formation Inc Spring probe
JP2005061876A (ja) * 2003-08-19 2005-03-10 Japan Electronic Materials Corp プローブユニット及びこのプローブユニットの製造方法
CN101038301A (zh) * 2000-09-22 2007-09-19 因泰斯特Ip公司 用于具有主动柔顺性的测试头的操纵器
CN101178427A (zh) * 2006-11-10 2008-05-14 株式会社友华 中继连接器
CN101720269A (zh) * 2007-02-23 2010-06-02 英泰斯特股份有限公司 测试头操作器
WO2010088077A1 (en) * 2009-01-30 2010-08-05 Delaware Capital Formation, Inc. Flat plunger round barrel test probe
TW201234017A (en) * 2010-11-17 2012-08-16 Nhk Spring Co Ltd Probe unit
TW201614238A (en) * 2014-08-29 2016-04-16 Yokowo Seisakusho Kk Plunger, contact probe, socket, and plunger manufacturing method
WO2018116568A1 (ja) * 2016-12-22 2018-06-28 株式会社村田製作所 プローブ構造
WO2019069576A1 (ja) * 2017-10-06 2019-04-11 株式会社村田製作所 プローブ
TW201935010A (zh) * 2018-02-09 2019-09-01 日商村田製作所股份有限公司 探針

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04136578U (ja) * 1991-06-10 1992-12-18 群馬日本電気株式会社 スプリングプローブ
JP2977467B2 (ja) * 1995-06-19 1999-11-15 株式会社シキノハイテック 回路基板検査用のジグ
JPH118003A (ja) * 1997-06-13 1999-01-12 Sony Corp コンタクト式接続装置
US6109964A (en) * 1998-04-06 2000-08-29 Andrew Corporation One piece connector for a coaxial cable with an annularly corrugated outer conductor
EP0955397B1 (de) * 1998-05-04 2004-04-21 Saurer GmbH & Co. KG Offenend-Spinnvorrichtung
DE19835932A1 (de) * 1998-05-04 1999-11-11 Schlafhorst & Co W Offenend-Spinnvorrichtung
US6583636B2 (en) * 2000-05-12 2003-06-24 Delaware Capitol Formation BGA on-board tester
JP2002156387A (ja) * 2000-11-20 2002-05-31 Seiko Epson Corp 半導体測定装置のコンタクトピン
JP2002202323A (ja) * 2000-12-28 2002-07-19 Fujikura Ltd プローブピン並びにこれ用いたコネクタ及びプローバ
US7029304B2 (en) * 2004-02-04 2006-04-18 John Mezzalingua Associates, Inc. Compression connector with integral coupler
KR200388336Y1 (ko) * 2005-03-23 2005-06-30 주식회사 제이엔에스 컨택트 프로브
DE102008022100A1 (de) * 2008-04-15 2009-10-22 Rohde & Schwarz Gmbh & Co. Kg Koaxiales Steckverbindungsteil mit thermischer Entkopplung
US7740499B1 (en) * 2009-02-11 2010-06-22 Itt Manufacturing Enterprises, Inc. Electrical connector including a bayonet locking device
KR101094215B1 (ko) * 2009-09-07 2011-12-14 주식회사 만도 공기현가장치
DE102009058722B4 (de) * 2009-12-17 2017-10-05 Amphenol-Tuchel Electronics Gmbh Steckverbinder mit einer drehfedergelagerten Überwurfmutter
US9854839B2 (en) * 2012-01-31 2018-01-02 Altria Client Services Llc Electronic vaping device and method
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers
US8547128B1 (en) * 2012-05-06 2013-10-01 Jerzy Roman Sochor Contact probe with conductively coupled plungers
CN103643704B (zh) * 2013-12-21 2015-11-18 佛山市新城开发建设有限公司 一种用于探测沉管隧道砂基础密实度检测仪
CN207884000U (zh) * 2018-01-25 2018-09-18 天津同力重工有限公司 一种轴间差速插头
US10396510B1 (en) * 2018-06-29 2019-08-27 Huber + Suhner Ag Coaxial connector with compensator
CN109038056B (zh) * 2018-08-20 2024-05-24 广东贝达海洋科学有限公司 一种应用于浮标上的电缆防扭装置
CN209043188U (zh) * 2018-12-13 2019-06-28 卡尔迈耶（中国）有限公司 一种用于分条整经机的层厚测量装置

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW528871B (en) * 1999-02-18 2003-04-21 Capital Formation Inc Spring probe
CN101038301A (zh) * 2000-09-22 2007-09-19 因泰斯特Ip公司 用于具有主动柔顺性的测试头的操纵器
JP2005061876A (ja) * 2003-08-19 2005-03-10 Japan Electronic Materials Corp プローブユニット及びこのプローブユニットの製造方法
CN101178427A (zh) * 2006-11-10 2008-05-14 株式会社友华 中继连接器
CN101720269A (zh) * 2007-02-23 2010-06-02 英泰斯特股份有限公司 测试头操作器
TW201037319A (en) * 2009-01-30 2010-10-16 Capital Formation Inc Flat plunger round barrel test probe
WO2010088077A1 (en) * 2009-01-30 2010-08-05 Delaware Capital Formation, Inc. Flat plunger round barrel test probe
CN102301250A (zh) * 2009-01-30 2011-12-28 特拉华资本构造公司 扁平柱塞圆筒测试探针
TW201234017A (en) * 2010-11-17 2012-08-16 Nhk Spring Co Ltd Probe unit
TW201614238A (en) * 2014-08-29 2016-04-16 Yokowo Seisakusho Kk Plunger, contact probe, socket, and plunger manufacturing method
WO2018116568A1 (ja) * 2016-12-22 2018-06-28 株式会社村田製作所 プローブ構造
WO2019069576A1 (ja) * 2017-10-06 2019-04-11 株式会社村田製作所 プローブ
TW201935010A (zh) * 2018-02-09 2019-09-01 日商村田製作所股份有限公司 探針

Also Published As

Publication number Publication date
WO2021065702A1 (ja) 2021-04-08
JPWO2021065702A1 (enrdf_load_stackoverflow) 2021-04-08
CN114223098A (zh) 2022-03-22
TW202120933A (zh) 2021-06-01
JP7136362B2 (ja) 2022-09-13
CN114223098B (zh) 2024-04-12

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