JPWO2021065702A1 - - Google Patents

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Publication number
JPWO2021065702A1
JPWO2021065702A1 JP2021551177A JP2021551177A JPWO2021065702A1 JP WO2021065702 A1 JPWO2021065702 A1 JP WO2021065702A1 JP 2021551177 A JP2021551177 A JP 2021551177A JP 2021551177 A JP2021551177 A JP 2021551177A JP WO2021065702 A1 JPWO2021065702 A1 JP WO2021065702A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021551177A
Other languages
Japanese (ja)
Other versions
JP7136362B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021065702A1 publication Critical patent/JPWO2021065702A1/ja
Application granted granted Critical
Publication of JP7136362B2 publication Critical patent/JP7136362B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
JP2021551177A 2019-10-04 2020-09-25 プローブ Active JP7136362B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2019183984 2019-10-04
JP2019183984 2019-10-04
JP2020011320 2020-01-28
JP2020011320 2020-01-28
PCT/JP2020/036221 WO2021065702A1 (ja) 2019-10-04 2020-09-25 プローブ

Publications (2)

Publication Number Publication Date
JPWO2021065702A1 true JPWO2021065702A1 (enrdf_load_stackoverflow) 2021-04-08
JP7136362B2 JP7136362B2 (ja) 2022-09-13

Family

ID=75338054

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021551177A Active JP7136362B2 (ja) 2019-10-04 2020-09-25 プローブ

Country Status (4)

Country Link
JP (1) JP7136362B2 (enrdf_load_stackoverflow)
CN (1) CN114223098B (enrdf_load_stackoverflow)
TW (1) TWI747536B (enrdf_load_stackoverflow)
WO (1) WO2021065702A1 (enrdf_load_stackoverflow)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04136578U (ja) * 1991-06-10 1992-12-18 群馬日本電気株式会社 スプリングプローブ
JPH095392A (ja) * 1995-06-19 1997-01-10 Shikino Hightech:Kk 回路基板検査用のジグ
JPH118003A (ja) * 1997-06-13 1999-01-12 Sony Corp コンタクト式接続装置
JPH11345659A (ja) * 1998-04-06 1999-12-14 Andrew Corp 環状に波形が付けられた外側導体を備えた同軸ケ―ブル用のワンピ―ス型コネクタ―
JP2002107422A (ja) * 2000-05-12 2002-04-10 Delaware Capital Formation Inc 検査治具および検査方法
JP2005061876A (ja) * 2003-08-19 2005-03-10 Japan Electronic Materials Corp プローブユニット及びこのプローブユニットの製造方法
JP2011518410A (ja) * 2008-04-15 2011-06-23 ローデ ウント シュワルツ ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディット ゲゼルシャフト 熱的な分離部を備える同軸プラグコネクタ部品
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers
WO2013116568A2 (en) * 2012-01-31 2013-08-08 Altria Client Services Inc. Electronic smoking article
US10396510B1 (en) * 2018-06-29 2019-08-27 Huber + Suhner Ag Coaxial connector with compensator

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0955397B1 (de) * 1998-05-04 2004-04-21 Saurer GmbH & Co. KG Offenend-Spinnvorrichtung
DE19835932A1 (de) * 1998-05-04 1999-11-11 Schlafhorst & Co W Offenend-Spinnvorrichtung
US6396293B1 (en) * 1999-02-18 2002-05-28 Delaware Capital Formation, Inc. Self-closing spring probe
CN100582786C (zh) * 2000-09-22 2010-01-20 英特斯特公司 用于具有主动柔顺性的测试头的操纵器
JP2002156387A (ja) * 2000-11-20 2002-05-31 Seiko Epson Corp 半導体測定装置のコンタクトピン
JP2002202323A (ja) * 2000-12-28 2002-07-19 Fujikura Ltd プローブピン並びにこれ用いたコネクタ及びプローバ
US7029304B2 (en) * 2004-02-04 2006-04-18 John Mezzalingua Associates, Inc. Compression connector with integral coupler
KR200388336Y1 (ko) * 2005-03-23 2005-06-30 주식회사 제이엔에스 컨택트 프로브
JP4845031B2 (ja) * 2006-11-10 2011-12-28 株式会社ヨコオ 中継コネクター
WO2008103328A1 (en) * 2007-02-23 2008-08-28 Intest Corporation Test head manipulator
US8105119B2 (en) * 2009-01-30 2012-01-31 Delaware Capital Formation, Inc. Flat plunger round barrel test probe
US7740499B1 (en) * 2009-02-11 2010-06-22 Itt Manufacturing Enterprises, Inc. Electrical connector including a bayonet locking device
KR101094215B1 (ko) * 2009-09-07 2011-12-14 주식회사 만도 공기현가장치
DE102009058722B4 (de) * 2009-12-17 2017-10-05 Amphenol-Tuchel Electronics Gmbh Steckverbinder mit einer drehfedergelagerten Überwurfmutter
WO2012067125A1 (ja) * 2010-11-17 2012-05-24 日本発條株式会社 プローブユニット
US8547128B1 (en) * 2012-05-06 2013-10-01 Jerzy Roman Sochor Contact probe with conductively coupled plungers
CN103643704B (zh) * 2013-12-21 2015-11-18 佛山市新城开发建设有限公司 一种用于探测沉管隧道砂基础密实度检测仪
JP6395297B2 (ja) * 2014-08-29 2018-09-26 株式会社ヨコオ プランジャ、コンタクトプローブ、ソケット及びプランジャの製造方法
DE112017005724T5 (de) * 2016-12-22 2019-08-22 Murata Manufacturing Co., Ltd. Sondenstruktur
JP6711469B2 (ja) * 2017-10-06 2020-06-17 株式会社村田製作所 プローブ
CN207884000U (zh) * 2018-01-25 2018-09-18 天津同力重工有限公司 一种轴间差速插头
JP2019138768A (ja) * 2018-02-09 2019-08-22 株式会社村田製作所 プローブ
CN109038056B (zh) * 2018-08-20 2024-05-24 广东贝达海洋科学有限公司 一种应用于浮标上的电缆防扭装置
CN209043188U (zh) * 2018-12-13 2019-06-28 卡尔迈耶（中国）有限公司 一种用于分条整经机的层厚测量装置

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04136578U (ja) * 1991-06-10 1992-12-18 群馬日本電気株式会社 スプリングプローブ
JPH095392A (ja) * 1995-06-19 1997-01-10 Shikino Hightech:Kk 回路基板検査用のジグ
JPH118003A (ja) * 1997-06-13 1999-01-12 Sony Corp コンタクト式接続装置
JPH11345659A (ja) * 1998-04-06 1999-12-14 Andrew Corp 環状に波形が付けられた外側導体を備えた同軸ケ―ブル用のワンピ―ス型コネクタ―
JP2002107422A (ja) * 2000-05-12 2002-04-10 Delaware Capital Formation Inc 検査治具および検査方法
JP2005061876A (ja) * 2003-08-19 2005-03-10 Japan Electronic Materials Corp プローブユニット及びこのプローブユニットの製造方法
JP2011518410A (ja) * 2008-04-15 2011-06-23 ローデ ウント シュワルツ ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディット ゲゼルシャフト 熱的な分離部を備える同軸プラグコネクタ部品
WO2013116568A2 (en) * 2012-01-31 2013-08-08 Altria Client Services Inc. Electronic smoking article
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers
US10396510B1 (en) * 2018-06-29 2019-08-27 Huber + Suhner Ag Coaxial connector with compensator

Also Published As

Publication number Publication date
WO2021065702A1 (ja) 2021-04-08
TWI747536B (zh) 2021-11-21
CN114223098A (zh) 2022-03-22
TW202120933A (zh) 2021-06-01
JP7136362B2 (ja) 2022-09-13
CN114223098B (zh) 2024-04-12

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