TWI736196B - Sheet for forming resin film, composite sheet for forming resin film, and method for regenerating silicon wafer - Google Patents

Sheet for forming resin film, composite sheet for forming resin film, and method for regenerating silicon wafer Download PDF

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TWI736196B
TWI736196B TW109110851A TW109110851A TWI736196B TW I736196 B TWI736196 B TW I736196B TW 109110851 A TW109110851 A TW 109110851A TW 109110851 A TW109110851 A TW 109110851A TW I736196 B TWI736196 B TW I736196B
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resin film
sheet
film forming
silicon wafer
mass
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TW202030287A (en
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佐伯尚哉
山本大輔
米山裕之
稲男洋一
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日商琳得科股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
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    • C09J7/00Adhesives in the form of films or foils
    • C09J7/10Adhesives in the form of films or foils without carriers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
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    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
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    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
    • C09J133/18Homopolymers or copolymers of nitriles
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    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/185Joining of semiconductor bodies for junction formation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
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    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
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    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature

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Abstract

本發明提供一種樹脂膜形成用薄片,其係用以貼附於矽晶圓,並於該矽晶圓上形成樹脂膜之薄片,且滿足下述要件(I)~(III)之再加工性及端部密著性優異者, The present invention provides a sheet for forming a resin film, which is used to attach to a silicon wafer and form a sheet of resin film on the silicon wafer, and meets the reworkability of the following requirements (I) to (III) And excellent end adhesion,

要件(I):前述樹脂膜形成用薄片之與矽晶圓貼附側之表面(α)之表面粗糙度(Ra)為50nm以下, Requirement (I): The surface roughness (Ra) of the surface (α) on the side where the resin film forming sheet is attached to the silicon wafer is 50 nm or less,

要件(II):前述樹脂膜形成用薄片之表面(α)之對於矽晶圓之黏著力(α 1)係1.0~7.0N/25mm, Requirement (II): The adhesion force (α 1) of the surface (α) of the aforementioned resin film forming sheet to the silicon wafer is 1.0~7.0N/25mm,

要件(III):前述樹脂膜形成用薄片之與矽晶圓貼附側係相反側之表面(β)對於由特定黏著劑所形成之具有厚度10~50μm之黏著劑層之黏著薄片之黏著劑層之黏著力(β 1)為4.0N/25mm以上。 Requirement (III): The surface (β ) of the aforementioned resin film forming sheet opposite to the silicon wafer attaching side is an adhesive for an adhesive sheet formed of a specific adhesive with an adhesive layer with a thickness of 10-50μm The layer adhesion ( β 1) is above 4.0N/25mm.

Description

樹脂膜形成用薄片、樹脂膜形成用複合薄片、及矽晶圓之再生方法 Sheet for forming resin film, composite sheet for forming resin film, and method for regenerating silicon wafer

本發明係關於樹脂膜形成用薄片,及具有於支持薄片上層合有構成該樹脂膜形成用薄片之樹脂膜形成用複合薄片,以及矽晶圓之再生方法。 The present invention relates to a sheet for forming a resin film, a composite sheet for forming a resin film having the sheet for forming the resin film laminated on a support sheet, and a method for regenerating a silicon wafer.

近年來進行著使用所謂稱為倒裝方式之封裝法之半導體裝置之製造。倒裝方式中,於基板之電路面上所裝載之凸塊等具有電極之半導體晶片(以下亦僅稱為「晶片」),晶片之電極與基板接合。因此,有晶片與基板接合之側為相反側之表面(以下亦稱為「晶片之背面」)露出之情形。 In recent years, the manufacture of semiconductor devices using a so-called flip-chip packaging method has been proceeding. In the flip-chip method, a semiconductor chip with electrodes such as bumps mounted on the circuit surface of the substrate (hereinafter also referred to as "chip"), and the electrodes of the chip are bonded to the substrate. Therefore, there are cases where the surface (hereinafter also referred to as "the back surface of the chip") on the opposite side where the chip and the substrate are bonded is exposed.

成為該露出之晶片之背面形成由有機材料構成之樹脂膜,作為附樹脂膜之晶片有被封裝於半導體裝置之情形。該樹脂膜可承擔下述功能:用以防止切割步驟或封裝之後產生裂痕之作為保護膜之功能,或者用以於墊板部或另一半導體晶片等其他基材上接著所獲得之晶片之作為接著薄膜之功能。 A resin film made of an organic material is formed on the back surface of the exposed chip, and a chip with a resin film may be packaged in a semiconductor device. The resin film can perform the following functions: as a protective film to prevent cracks after the dicing step or encapsulation, or to follow the obtained chip on a backing board or another semiconductor chip or other substrate Then the function of the film.

一般該附樹脂膜之晶片係藉由旋轉塗佈法等將含樹脂之組成物之溶液塗佈於晶圓之背面形成塗膜後,使該塗膜乾燥及硬化,形成樹脂膜,並切割所獲得之附樹脂膜之晶圓而製造。 Generally, the resin film-attached wafer is coated with a resin-containing composition solution on the back of the wafer by a spin coating method to form a coating film, and the coating film is dried and hardened to form a resin film and cut The obtained wafer with resin film is manufactured.

另外,亦可將硬化性之樹脂膜形成用薄片貼附於晶圓之背面,於晶圓之切割前後藉由能量線之照射或加熱,使該樹脂膜形成用薄片硬化後製得樹脂膜,而製造附樹脂膜之晶圓或附樹脂膜之晶片。 In addition, a curable resin film forming sheet can be attached to the back of the wafer, and the resin film forming sheet can be cured by curing the resin film forming sheet before and after the wafer is diced to obtain a resin film. And to manufacture wafers with resin film or chips with resin film.

作為於如此晶片之背面或晶圓之背面上形成亦承擔作為保護膜或接著薄膜之功能之樹脂膜材料,提案出各種樹脂膜形成用薄片。 As a resin film material that is formed on the back surface of such a wafer or the back surface of the wafer and also functions as a protective film or an adhesive film, various sheets for forming a resin film have been proposed.

例如專利文獻1中揭示,含有由丙烯酸系共聚物構成之聚合物成分、能量線硬化性成分、染料或顏料、無機填料、及光聚合起始劑之能量線硬化型保護膜形成層係具有被2片剝離薄片夾著之構成之晶片保護用薄膜。 For example, Patent Document 1 discloses that an energy-ray-curable protective film forming layer containing a polymer component composed of an acrylic copolymer, an energy-ray-curable component, a dye or pigment, an inorganic filler, and a photopolymerization initiator has a A wafer protection film sandwiched by two release sheets.

根據專利文獻1之記載,該晶片保護用薄膜係藉由能量線之照射,可形成雷射標記認識性、硬度、及與晶圓之密著性良好之保護膜,且與已往之晶片保護用薄膜相比較,可簡化步驟。 According to Patent Document 1, the chip protection film is irradiated with energy rays to form a protective film with good laser mark visibility, hardness, and adhesion to the wafer, and is compatible with conventional chip protection. Compared with thin films, the steps can be simplified.

另外,專利文獻2中揭示,具有基材及黏著劑層之切割膠帶,與於該切割膠帶之黏著劑層上被著色,且具有具特定彈性率之晶圓背面保護薄膜之切割膠帶一體型晶圓背面保護薄膜。 In addition, Patent Document 2 discloses that a dicing tape with a substrate and an adhesive layer is colored on the adhesive layer of the dicing tape and has a dicing tape integrated crystal with a wafer backside protective film with a specific elasticity. Round back protective film.

根據專利文獻2之記載,該晶圓背面保護薄膜係半導 體晶圓之切割步驟中,與半導體晶圓之保持力良好。 According to Patent Document 2, the protective film for the backside of the wafer is a semiconductor In the dicing step of the bulk wafer, the holding force with the semiconductor wafer is good.

〔先前技術文獻〕 [Prior technical literature]

〔專利文獻〕 〔Patent Documents〕

[專利文獻1]日本特開2009-138026號公報 [Patent Document 1] JP 2009-138026 A

[專利文獻2]日本特開2010-199543號公報 [Patent Document 2] JP 2010-199543 A

有時,將記載於專利文獻1及2之保護薄膜貼附於晶圓上之步驟中,貼附於晶圓上之保護薄膜之位置產生位移時,引起於晶圓上附著異物之狀態,如該晶圓上亦含有異物之狀態貼附保護薄膜。該等狀況時難以從晶圓再加工(再剝離)一旦貼附於晶圓上之保護薄膜。 Sometimes, in the step of attaching the protective film described in Patent Documents 1 and 2 to the wafer, when the position of the protective film attached to the wafer is shifted, foreign matter is attached to the wafer, such as A protective film is attached to the wafer with foreign matter. Under these conditions, it is difficult to reprocess (re-peel) the protective film once attached to the wafer from the wafer.

特別是揭示於專利文獻1及2之保護薄膜係將貼附時與晶圓之密著性或貼附後與晶圓之保持力之提升作為目的者,一旦貼附於晶圓上時與晶圓之密著性高,故非常難以再加工。 In particular, the protective film disclosed in Patent Documents 1 and 2 aims to improve the adhesion to the wafer during attachment or the retention of the wafer after attachment. Once attached to the wafer, it interacts with the wafer The round has high adhesion, so it is very difficult to reprocess.

亦即,施予力而強制地剝離貼附於晶圓之保護薄膜時可能會損害晶圓,或者即使不損壞晶圓剝離保護薄膜時,於晶圓上有殘存一部分之保護薄膜之情形。 That is, when force is applied to forcibly peel off the protective film attached to the wafer, the wafer may be damaged, or even when the protective film is peeled off without damaging the wafer, a part of the protective film may remain on the wafer.

專利文獻1及2中有關所記載之保護薄膜,雖然有進行從與貼附時之晶圓之密著性,或與貼附後之晶圓之保持力之觀點之檢討,但是未進行任何有關一旦貼附於晶圓之 保護薄膜之再加工性之檢討。 The protective films described in Patent Documents 1 and 2 have been reviewed from the viewpoint of adhesion to the wafer at the time of attachment or retention of the wafer after attachment, but nothing has been done. Once attached to the wafer Review of the reworkability of the protective film.

並且,不僅貼附保護薄膜與晶圓後立即注意到重新貼附保護薄膜之必要性,貼附後晶圓上貼附有保護薄膜之積層體之狀態靜置24小時左右後亦注意到之情形多。 In addition, not only the need to re-attach the protective film was noticed immediately after attaching the protective film and the wafer, but also the state of the laminated body with the protective film attached to the wafer after the attaching was noticed after being allowed to stand for about 24 hours. many.

將保護薄膜貼附於晶圓後,當時間愈經過愈提升晶圓與保護薄膜之密著性,故一般難以再加工保護薄膜。 After the protective film is attached to the wafer, the adhesion between the wafer and the protective film is improved as time passes, so it is generally difficult to reprocess the protective film.

另外,亦可思及重視貼附於矽晶圓後之再加工性,使用粗糙地設計之與晶圓貼附側之表面之保護薄膜,如此保護薄膜係與晶圓貼附後,端部容易產生浮起或剝落,而產生端部密著性劣化之問題。 In addition, we can also think about the reworkability after attaching to the silicon wafer, and use a rough-designed protective film on the surface of the wafer attaching side, so that the end of the protective film is easy to attach to the wafer. Floating or peeling occurs, resulting in deterioration of end adhesion.

本發明係鑒於上述問題點所進行者,目的在於提供再加工性及端部密著性優異之樹脂膜形成用薄片,及於支持薄片上具有該樹脂膜形成用薄片層合構成樹脂膜形成用複合薄片,以及矽晶圓之再生方法。 The present invention was made in view of the above-mentioned problems, and the object is to provide a resin film forming sheet with excellent reworkability and end adhesion, and a support sheet having the resin film forming sheet laminated to form a resin film forming sheet Composite wafers, and methods for regenerating silicon wafers.

本發明者們發現,經調整黏著力之樹脂膜形成用薄片,該黏著力係對於與矽晶圓貼附側之表面之表面粗糙度及矽晶圓之黏著力,以及對於與該表面係相反側之另一表面之一般黏著薄片之黏著劑層之黏著力,可解決上述課題而完成本發明。 The inventors have found that the resin film forming sheet with adjusted adhesive force is related to the surface roughness of the surface attached to the silicon wafer and the adhesive force of the silicon wafer, as well as to the opposite to the surface. The adhesive force of the adhesive layer of the general adhesive sheet on the other surface of the side can solve the above-mentioned problems and complete the present invention.

亦即,本發明係提供下述〔1〕~〔10〕。 That is, the present invention provides the following [1] to [10].

〔1〕一種樹脂膜形成用薄片,其係用以貼附於矽晶 圓,並於該矽晶圓上形成樹脂膜之薄片,且滿足下述要件(I)~(III), [1] A sheet for forming a resin film, which is used to attach to a silicon crystal Round, and form a thin sheet of resin film on the silicon wafer, and meet the following requirements (I) ~ (III),

要件(I):前述樹脂膜形成用薄片之表面(α)之與矽晶圓貼附側之表面粗糙度(Ra)為50nm以下, Requirement (I): The surface roughness (Ra) of the surface (α) of the aforementioned resin film forming sheet on the side where the silicon wafer is attached is 50 nm or less,

要件(II):前述樹脂膜形成用薄片之表面(α)之對於矽晶圓之黏著力(α 1)係1.0~7.0N/25mm, Requirement (II): The adhesion force (α 1) of the surface (α) of the aforementioned resin film forming sheet to the silicon wafer is 1.0~7.0N/25mm,

要件(III):前述樹脂膜形成用薄片之表面(β)之與矽晶圓貼附側係相反側之對於由黏著劑所形成之具有黏著劑層之黏著薄片之黏著劑層之黏著力(β 1)為4.0N/25mm以上, Requirement (III): The surface ( β ) of the aforementioned resin film forming sheet is the opposite side of the silicon wafer attaching side to the adhesive layer of the adhesive layer formed by the adhesive with the adhesive layer ( β 1) is 4.0N/25mm or more,

前述黏著劑係含有具有源自丁基丙烯酸酯及丙烯酸之結構單元,質量平均分子量為60萬~100萬之丙烯酸系樹脂100質量份,與交聯劑0.01~10質量份, The aforementioned adhesive contains 100 parts by mass of acrylic resin having structural units derived from butyl acrylate and acrylic acid and a mass average molecular weight of 600,000 to 1 million, and 0.01 to 10 parts by mass of a crosslinking agent,

前述黏著薄片具有厚度10~50μm之黏著劑層。 The aforementioned adhesive sheet has an adhesive layer with a thickness of 10-50 μm.

〔2〕如〔1〕之樹脂膜形成用薄片,其中,23℃之儲藏彈性模數係0.10~20GPa。 [2] The sheet for forming a resin film as in [1], wherein the storage elastic modulus at 23°C is 0.10-20 GPa.

〔3〕如〔1〕或〔2〕之樹脂膜形成用薄片,其中,前述樹脂膜形成用薄片之表面(β)之對於水之接觸角係70~110°。 [3] The resin film forming sheet of [1] or [2], wherein the contact angle of the surface (β ) of the resin film forming sheet with respect to water is 70 to 110°.

〔4〕如〔1〕~〔3〕中任一項之樹脂膜形成用薄片,其中,其係含有聚合物成分(A)及硬化性成分(B)。 [4] The resin film forming sheet according to any one of [1] to [3], which contains a polymer component (A) and a curable component (B).

〔5〕如〔4〕之樹脂膜形成用薄片,其中,聚合物成分(A)含有丙烯酸系聚合物(A1)。 [5] The sheet for forming a resin film according to [4], wherein the polymer component (A) contains an acrylic polymer (A1).

〔6〕如〔5〕之樹脂膜形成用薄片,其中,丙烯酸系聚合物(A1)具有源自烷基(甲基)丙烯酸酯之結構單位(a1)及源自腈系單體之結構單位(a2)之丙烯酸系共聚物。 [6] The resin film forming sheet according to [5], wherein the acrylic polymer (A1) has a structural unit (a1) derived from an alkyl (meth)acrylate and a structural unit derived from a nitrile monomer (a2) The acrylic copolymer.

〔7〕如〔1〕~〔6〕中任一項之樹脂膜形成用薄片,其中,其係用以於矽晶圓上形成保護膜。 [7] The resin film forming sheet according to any one of [1] to [6], wherein it is used to form a protective film on a silicon wafer.

〔8〕一種樹脂膜形成用複合薄片,其具有於支撐薄片上層合如〔1〕~〔7〕中任一項之樹脂膜形成用薄片之構成。 [8] A composite sheet for forming a resin film, which has a structure in which the resin film forming sheet according to any one of [1] to [7] is laminated on a support sheet.

〔9〕如〔8〕之樹脂膜形成用複合薄片,其中,前述樹脂膜形成用薄片具有被兩片支撐薄片夾住之構成。 [9] The composite sheet for forming a resin film according to [8], wherein the sheet for forming a resin film has a structure sandwiched by two supporting sheets.

〔10〕一種矽晶圓之再生方法,其係從矽晶圓上直接貼附有如〔1〕~〔7〕中任一項之樹脂膜形成用薄片之表面(α)之層合體,再加工該樹脂膜形成用薄片而再生矽晶圓之方法,且其具有下述步驟(1)~步驟(2), [10] A method for regenerating silicon wafers, which is to directly attach a laminate of the surface (α) of the resin film forming sheet as in any one of [1] to [7] from the silicon wafer, and then process The method for regenerating a silicon wafer by using a sheet for forming a resin film has the following steps (1) to (2),

步驟(1):於前述層合體之前述樹脂膜形成用薄片之表面(β)上,貼附具有基材及黏著劑層之黏著薄片之該黏著劑層之步驟, Step (1): a step of attaching the adhesive layer of the adhesive sheet having the base material and the adhesive layer on the surface (β) of the resin film forming sheet of the aforementioned laminate,

步驟(2):拉伸步驟(1)中之貼附於前述樹脂膜形成用薄片之表面(β)上的前述黏著薄片,而再加工前述矽晶圓上所貼附之前述樹脂膜形成用薄片之步驟。 Step (2): Stretching the adhesive sheet attached to the surface ( β ) of the resin film forming sheet in the stretching step (1), and then processing the resin film attached to the silicon wafer for forming The step of thin slices.

本發明之樹脂膜形成用薄片係再加工性及端 部密著性優異。 Reworkability and fineness of the sheet for forming a resin film of the present invention Excellent adhesion.

因此,一旦將本發明之樹脂膜形成用薄片貼附於矽晶圓後,產生重新貼附之必要性時,不損壞矽晶圓,且可邊抑制附著於矽晶圓上而殘存之貼附有樹脂膜形成用薄片之一部分,可邊從矽晶圓再加工該樹脂膜形成用薄片。其結果,有關再加工該樹脂膜形成用薄片後之矽晶圓,可再利用。 Therefore, once the resin film forming sheet of the present invention is attached to a silicon wafer, when there is a need for reattachment, the silicon wafer is not damaged, and the remaining attachment can be suppressed while adhering to the silicon wafer. There is a part of the resin film forming sheet, and the resin film forming sheet can be reprocessed from the silicon wafer. As a result, the silicon wafer after reprocessing the resin film forming sheet can be reused.

並且,本說明書中「再加工樹脂膜形成用薄片」意指再剝離一旦貼附於矽晶圓上之樹脂膜形成用薄片。 In addition, the "sheet for forming a reprocessed resin film" in this specification means a sheet for forming a resin film that is once attached to a silicon wafer by peeling off again.

另外,「樹脂膜形成用薄片之再加工性」意指貼附於矽晶圓後,再加工時不損壞矽晶圓,且於矽晶圓上未殘存樹脂膜形成用薄片之一部分,可再剝離之性質。 In addition, the "reworkability of the resin film forming sheet" means that after being attached to the silicon wafer, the silicon wafer is not damaged during reprocessing, and there is no part of the resin film forming sheet remaining on the silicon wafer. The nature of peeling.

1a、1b、1c、1d:樹脂膜形成用複合薄片 1a, 1b, 1c, 1d: composite sheet for resin film formation

10:樹脂膜形成用薄片 10: Sheets for resin film formation

11、11’:支撐薄片 11, 11’: Support sheet

12:夾具接著層 12: Fixture then layer

[圖1]本發明之一態樣之樹脂膜形成用複合薄片之剖面圖。 [Fig. 1] A cross-sectional view of a composite sheet for forming a resin film according to an aspect of the present invention.

本說明書之記載中,各成分之質量平均分子量(Mw)及數平均分子量(Mn)之值係藉由凝膠滲透色譜(GPC)法所測定之標準聚苯乙烯換算之值,具體而言基於記載於實施例之方法所測定之值。 In the description of this specification, the values of the mass average molecular weight (Mw) and number average molecular weight (Mn) of each component are calculated by the standard polystyrene conversion value measured by the gel permeation chromatography (GPC) method, specifically based on Record the value measured by the method in the examples.

另外,本說明書中例如「(甲基)丙烯酸酯」意指作為表示「丙烯酸酯」及「甲基丙烯酸酯」之兩者之用語所 使用,有關其他類似用語亦相同。 In addition, in this specification, for example, "(meth)acrylate" means the term used for both "acrylate" and "methacrylate". Use, and other similar terms are also the same.

再者,本說明書中「能量射線」意指例如紫外線或電子束線等,紫外線為佳。 Furthermore, "energy ray" in this specification means, for example, ultraviolet rays or electron beams, and ultraviolet rays are preferred.

〔樹脂膜形成用薄片〕 〔Sheet for resin film formation〕

本發明之樹脂膜形成用薄片係用以貼附於矽晶圓,並於該矽晶圓上形成樹脂膜之薄片,且滿足下述要件(I)~(III), The resin film forming sheet of the present invention is used for attaching to a silicon wafer and forming a resin film on the silicon wafer, and satisfies the following requirements (I) to (III),

要件(I):前述樹脂膜形成用薄片之表面(α)之與矽晶圓貼附側之表面粗糙度(Ra)為50nm以下(以下亦僅稱為「表面(α)之表面粗糙度(Ra)」), Requirement (I): The surface roughness (Ra) of the surface (α) of the aforementioned resin film forming sheet that is attached to the silicon wafer is 50 nm or less (hereinafter also simply referred to as "surface (α) surface roughness ( Ra)”),

要件(II):前述樹脂膜形成用薄片之表面(α)之對於矽晶圓之黏著力(α 1)係1.0~7.0N/25mm(以下亦僅稱為「表面(α)之黏著力(α 1)」), Requirement (II): The adhesive force (α 1) of the surface (α) of the aforementioned resin film forming sheet to the silicon wafer is 1.0~7.0N/25mm (hereinafter also simply referred to as "the adhesive force of the surface (α) ( α 1)”),

要件(III):前述樹脂膜形成用薄片之表面(β)之與矽晶圓貼附側係相反側之對於由黏著劑所形成之具有黏著劑層之黏著薄片之黏著劑層之黏著力(β 1)(以下亦僅稱為「表面(β)之黏著力(β 1)」)為4.0N/25mm以上, Requirement (III): The surface ( β ) of the aforementioned resin film forming sheet is the opposite side of the silicon wafer attaching side to the adhesive layer of the adhesive layer formed by the adhesive with the adhesive layer ( β 1) (hereinafter also only referred to as "the adhesion force ( β 1) of the surface (β )") is 4.0N/25mm or more,

前述黏著劑係含有具有源自丁基丙烯酸酯及丙烯酸之結構單元,質量平均分子量為60萬~100萬之丙烯酸系樹脂100質量份,與交聯劑0.01~10質量份, The aforementioned adhesive contains 100 parts by mass of acrylic resin having structural units derived from butyl acrylate and acrylic acid, a mass average molecular weight of 600,000 to 1 million, and 0.01 to 10 parts by mass of a crosslinking agent,

前述黏著薄片具有厚度10~50μm之黏著劑層。 The aforementioned adhesive sheet has an adhesive layer with a thickness of 10-50 μm.

本發明之樹脂膜形成用薄片之表面(α)係 與矽晶圓貼附側之面,表面(β)係與矽晶圓貼附後,用以從矽晶圓將該樹脂膜形成用薄片再加工而與汎用黏著薄片之黏著劑層貼附之貼附面。 The surface (α) of the resin film forming sheet of the present invention is the surface on the side where the silicon wafer is attached, and the surface ( β ) is used to form the resin film from the silicon wafer after attaching it to the silicon wafer The adhesive surface that is reprocessed and attached to the adhesive layer of the general-purpose adhesive sheet.

並且,沒有特別限制本發明之樹脂膜形成用薄片之形態,例如亦可為長膠膠帶狀標籤、葉標籤(Leaf label)等形態。 In addition, the form of the sheet for forming a resin film of the present invention is not particularly limited. For example, it may be in the form of a long adhesive tape-like label, a leaf label, and the like.

另外,本發明之一態樣之樹脂膜形成用薄片係可由藉由1種之組成物形成之一層所構成之單層薄片,亦可由藉由2種以上之組成物形成之二層以上所構成之複層薄片。 In addition, the resin film forming sheet of one aspect of the present invention may be a single-layer sheet composed of one layer formed of one type of composition, or may be composed of two or more layers formed of two or more types of composition. The multi-layer sheet.

並且,本發明之一態樣之樹脂膜形成用薄片係由二層以上所構成之複層薄片時,有關表面(α)側之層之形成材料之組成物(α’)與表面(β)側之層之形成材料之組成物(β’)係滿足上述要件(I)~(III)之方式分別調整所含有成分之種類或摻合量為佳。因此,組成物(α’)與組成物(β’)係彼此相異者為佳。 In addition, when the resin film forming sheet of one aspect of the present invention is a multi-layer sheet composed of two or more layers, the composition (α') and the surface ( β ) of the layer forming material on the surface (α) side The composition (β ') of the forming material of the side layer should meet the above-mentioned requirements (I) to (III) by adjusting the types or blending amounts of the contained components. Therefore, it is preferable that the composition (α') and the composition ( β ') are different from each other.

<要件(I)> <Requirements (I)>

藉由滿足上述要件(I),本發明之樹脂膜形成用薄片與晶圓貼附後,可抑制晶圓之端部之浮起或剝落之產生,且端部密著性優異者。 By satisfying the above-mentioned requirement (I), after the resin film forming sheet of the present invention is attached to the wafer, the floating or peeling of the end of the wafer can be suppressed, and the end adhesion is excellent.

亦即,表面(α)之表面粗糙度(Ra)超過50nm時,將所獲得之樹脂膜形成用薄片貼附於矽晶圓時,與矽晶圓之密著性不充分,變成特別是於矽晶圓之端部容易產 生浮起或剝落,劣化端部密著性。如此密著性之降低,特別是產生端部密著性之降低時,亦變成切割時所使用洗淨水侵入至該樹脂膜形成用薄片與矽晶圓之界面,而造成污染矽晶圓之表面或者是產生切割時之碎裂之原因。 That is, when the surface roughness (Ra) of the surface (α) exceeds 50 nm, when the obtained resin film forming sheet is attached to the silicon wafer, the adhesion to the silicon wafer is insufficient, and it becomes particularly The end of silicon wafer is easy to produce Floating or peeling, deteriorating end adhesion. Such a decrease in adhesion, especially when the end adhesion decreases, will also cause the washing water used during dicing to penetrate into the interface between the resin film forming sheet and the silicon wafer, causing contamination of the silicon wafer. The surface may be the cause of chipping during cutting.

從上述觀點而言作為本發明之一態樣之樹脂膜形成用薄片之表面(α)之表面粗糙度(Ra)係佳為40nm以下,較佳為35nm以下,更佳為30nm以下,最佳為25nm以下。 From the above viewpoint, the surface roughness (Ra) of the surface (α) of the resin film forming sheet as one aspect of the present invention is preferably 40 nm or less, preferably 35 nm or less, more preferably 30 nm or less, most preferably It is 25nm or less.

另外,從使再加工性更提升之樹脂膜形成用薄片之設定之觀點而言,表面(α)之表面粗糙度(Ra)係佳為5nm以上,較佳為10nm以上,更佳為15nm以上。 In addition, from the viewpoint of setting the sheet for forming a resin film that improves reworkability, the surface roughness (Ra) of the surface (α) is preferably 5 nm or more, preferably 10 nm or more, and more preferably 15 nm or more .

並且,本說明書中表面(α)之表面粗糙度(Ra)係依JIS B0601:2001所測定之值,更具體而言意味藉由記載於實施例之方法所測定之值。 In addition, the surface roughness (Ra) of the surface (α) in this specification is a value measured in accordance with JIS B0601:2001, and more specifically means a value measured by the method described in the examples.

另外,表面(α)之表面粗糙度(Ra)係藉由將例如樹脂膜形成用薄片中所含有之無機填料或著色劑等微粒子成分之種類、平均粒徑、及含量等適宜設定而可調整。另外,藉由於樹脂膜形成用薄片之表面(α)上貼合具有表面之粗糙凹凸面之剝離薄膜之凹凸面,並轉印凹凸形狀之方法亦可調整。 In addition, the surface roughness (Ra) of the surface (α) can be adjusted by appropriately setting the type, average particle size, and content of fine particles such as inorganic fillers or colorants contained in the resin film forming sheet. . In addition, it can also be adjusted by a method of bonding the uneven surface of the release film with rough uneven surface on the surface (α) of the resin film forming sheet, and transferring the uneven shape.

<要件(II)> <Requirements (II)>

本發明之樹脂膜形成用薄片係藉由滿足要件(II),可邊良好地保持與矽晶圓之貼附後之密著性,特別是端部 密著性,可邊即使已經過24小時左右亦可再加工者。 The sheet for forming a resin film of the present invention satisfies the requirement (II), and can maintain good adhesion to the silicon wafer after being attached, especially at the ends Adhesion, which can be processed even after 24 hours.

例如揭示於專利文獻1及2般,已往之樹脂膜形成用薄片係將與矽晶圓之密著性及保持性之提升作為目的之情形多,進行著用以提升如要件(II)所特定之表面(α)之黏著力之值之材料設計。 For example, as disclosed in Patent Documents 1 and 2, the conventional resin film forming sheet used to improve the adhesion and retention of the silicon wafer in many cases, and the improvement is performed as specified in the requirement (II) The material design of the value of the adhesion of the surface (α).

然而,表面(α)之黏著力(α 1)超過7.0N/25mm時,有將所獲得之樹脂膜形成用薄片貼附於矽晶圓後之再加工變難之傾向。特別是因貼附於矽晶圓後之時間愈經過,矽晶圓與樹脂膜形成用薄片之密著性愈提升,故從矽晶圓強制地再加工樹脂膜形成用薄片時,藉由其再加工之力會有損壞矽晶圓之情形。 However, when the adhesive force (α 1) of the surface (α) exceeds 7.0N/25mm, it tends to be difficult to reprocess the obtained resin film forming sheet after attaching it to the silicon wafer. In particular, as the time elapsed after being attached to the silicon wafer, the adhesion between the silicon wafer and the resin film forming sheet is improved. Therefore, when the resin film forming sheet is forcibly reprocessed from the silicon wafer, the The force of reprocessing may damage the silicon wafer.

另一方面,表面(α)之黏著力(α 1)未達1.0N/25mm時,與矽晶圓之密著性不充分,特別是將所獲得之樹脂膜形成用薄片貼附於矽晶圓時,於矽晶圓之端部容易產生浮起或剝落,劣化端部密著性。 On the other hand, when the adhesive force (α 1) of the surface (α) is less than 1.0N/25mm, the adhesion to the silicon wafer is insufficient, especially when the obtained resin film forming sheet is attached to the silicon wafer When it is round, it is easy to float or peel off at the end of the silicon wafer, which deteriorates the adhesion of the end.

於是,本發明之樹脂膜形成用薄片中,將表面(α)之黏著力(α 1)調整至如要件(II)所特定之範圍。 Therefore, in the resin film forming sheet of the present invention, the adhesive force (α 1) of the surface (α) is adjusted to the range specified by the requirement (II).

本發明之一態樣之樹脂膜形成用薄片之表面(α)之黏著力(α 1)係從提升與矽晶圓之密著性,特別是從與矽晶圓之貼附後提升端部密著性之樹脂膜形成用薄片之設定之觀點而言,佳為1.3N/25mm以上,較佳為1.5N/25mm以上,更佳為1.8N/25mm以上,最佳為2.0N/25mm以上,從提升再加工性之樹脂膜形成用薄片之設定之觀點而言,佳為6.8N/25mm以下,較佳為 6.5N/25mm以下,更佳為6.0N/25mm以下,最佳為5.5N/25mm以下。 The adhesive force (α 1) of the surface (α) of the resin film forming sheet of one aspect of the present invention is to improve the adhesion with the silicon wafer, especially from the end after being attached to the silicon wafer From the viewpoint of the setting of the adhesive resin film forming sheet, it is preferably 1.3N/25mm or more, preferably 1.5N/25mm or more, more preferably 1.8N/25mm or more, most preferably 2.0N/25mm or more From the viewpoint of setting the sheet for forming a resin film to improve reworkability, it is preferably 6.8N/25mm or less, preferably 6.5N/25mm or less, more preferably 6.0N/25mm or less, most preferably 5.5N/25mm or less.

並且,本說明書中表面(α)之黏著力(α 1)意味藉由實施例記載之方法所測定之值。 In addition, the adhesive force (α 1) of the surface (α) in this specification means the value measured by the method described in the examples.

另外,表面(α)之黏著力(α 1)係適宜地選擇樹脂膜形成用薄片之表面(α)側之層之形成材料之組成物所含有之聚合物成分、硬化性成分、無機填料,及添加劑等種類或含量,如成為上述範圍之方式可調整。具體而言,若考量適宜組合樹脂膜形成用薄片中所含有各成分之項目之事項,則可容易調整。 In addition, the adhesive force (α 1) of the surface (α) is an appropriate selection of polymer components, curable components, and inorganic fillers contained in the composition of the layer forming material on the surface (α) side of the resin film forming sheet. The type or content of additives and additives can be adjusted as long as they fall within the above-mentioned range. Specifically, it can be easily adjusted if consideration is given to appropriately combining the items of each component contained in the sheet for forming a resin film.

<要件(III)> <Requirement (III)>

本發明之樹脂膜形成用薄片係藉由滿足要件(III),即使已經過24小時左右亦成為可再加工者。 The sheet for forming a resin film of the present invention satisfies the requirement (III) and becomes reworkable even after about 24 hours have passed.

將本發明之樹脂膜形成用薄片貼附於矽晶圓後,該樹脂膜形成用薄片產生需要再剝離之情形時,於該樹脂膜形成用薄片之表面(β)貼附汎用黏著薄片之黏著劑層,藉由拉伸該黏著薄片而從矽晶圓可再加工該樹脂膜形成用薄片。 After attaching the resin film forming sheet of the present invention to a silicon wafer, when the resin film forming sheet needs to be peeled off again, attach a general-purpose adhesive sheet to the surface (β) of the resin film forming sheet The agent layer can reprocess the resin film forming sheet from the silicon wafer by stretching the adhesive sheet.

此時,表面(β)之黏著力(β 1)未達4.0N/25mm時,即使於表面(β)貼附該黏著薄片之黏著劑層,並與該黏著薄片一起剝離該樹脂膜形成用薄片,一部分之該樹脂膜形成用薄片殘存於矽晶圓上之傾向高,再加工後之矽晶圓不可再利用。 At this time, when the adhesive force ( β 1) of the surface (β ) is less than 4.0N/25mm, even if the adhesive layer of the adhesive sheet is attached to the surface (β ), the resin film formation is peeled off together with the adhesive sheet Flake, a part of the resin film forming flake has a high tendency to remain on the silicon wafer, and the reprocessed silicon wafer cannot be reused.

從上述觀點而言,本發明之一態樣之樹脂膜形成用薄片之表面(β)之黏著力(β 1)係佳為4.5N/25mm以上,較佳為5.0N/25mm以上。 From the above viewpoint, the adhesive force ( β 1) of the surface (β ) of the resin film forming sheet of one aspect of the present invention is preferably 4.5 N/25 mm or more, more preferably 5.0 N/25 mm or more.

另外,作為表面(β)之黏著力之上限值,雖然沒有特別限制,但是表面(β)之黏著力(β 1)係通常20N/25mm以下。 In addition, although the upper limit of the adhesive force of the surface (β ) is not particularly limited, the adhesive force ( β 1) of the surface (β ) is usually 20 N/25 mm or less.

要件(III)所特定之樹脂膜形成用薄片之表面(β)之黏著力(β 1)係由黏著劑所形成之具有黏著劑層之黏著薄片對於該黏著劑層之黏著力, The adhesive force ( β 1) of the surface (β ) of the resin film forming sheet specified in the requirement (III) is the adhesive force of the adhesive sheet with the adhesive layer formed by the adhesive to the adhesive layer,

黏著劑係含有具有源自丁基丙烯酸酯及丙烯酸之結構單元,質量平均分子量為60萬~100萬之丙烯酸酯系樹脂100質量份,與交聯劑0.01~10質量份, The adhesive system contains 100 parts by mass of acrylate resin having structural units derived from butyl acrylate and acrylic acid, with a mass average molecular weight of 600,000 to 1 million, and 0.01 to 10 parts by mass of a crosslinking agent,

黏著薄片具有厚度10~50μm之黏著劑層。 The adhesive sheet has an adhesive layer with a thickness of 10-50μm.

此黏著劑之組成係特定市售之一般之丙烯酸酯系黏著劑,要件(III)係特定表面(β)之對於由一般之丙烯酸酯系黏著劑所形成之黏著劑層之黏著力。 The composition of this adhesive is a specific commercially available general acrylic adhesive, and the requirement (III) is the adhesion of the specific surface ( β ) to the adhesive layer formed by the general acrylic adhesive.

並且,滿足要件(III)之黏著劑係廣泛地流通於市場之非常一般之丙烯酸酯系黏著劑。 In addition, the adhesive that satisfies the requirement (III) is a very general acrylic adhesive that is widely circulated in the market.

因此,從矽晶圓將本發明之樹脂膜形成用薄片再加工時,所使用之黏著薄片之選擇性係非常廣泛,使用具有一般之由丙烯酸酯系黏著劑所構成之黏著劑層黏著薄片可再加工。 Therefore, when the resin film forming sheet of the present invention is reprocessed from a silicon wafer, the selectivity of the adhesive sheet used is very wide, and the adhesive sheet can be used with an adhesive layer composed of a general acrylic adhesive. Reprocessing.

並且,更具體而言表面(β)之黏著力(β 1)意味藉由記載於實施例之方法所測定之值。 And, more specifically, the adhesive force ( β 1) of the surface (β ) means the value measured by the method described in the examples.

另外,表面(β)之黏著力(β 1)係適宜地選擇樹脂膜形成用薄片之表面(β)側之層之形成材料之組成物所含有之聚合物成分、硬化性成分、無機填料及添加劑等種類或含量,而可調整為如上述範圍。具體而言若考量適宜組合樹脂膜形成用薄片中所含有之各成分之項目之事項,則可容易調整。 Further, the adhesion surface (beta]) of 1) is suitably selected based resin film-forming polymer component with a surface of the sheet to form a layer of the composition (beta]) side of the material contained, the curable component, an inorganic filler, and The type or content of additives and the like can be adjusted to the above-mentioned range. Specifically, it can be easily adjusted if consideration is given to appropriately combining the items of each component contained in the sheet for forming a resin film.

本發明之一態樣之樹脂膜形成用薄片中,從使再加工性更提升之樹脂膜形成用薄片之觀點而言,表面(β)之黏著力(β 1)係較表面(α)之黏著力(α 1)之黏著力更高之值為佳。 One aspect of the present invention is formed of a resin film sheet, so that the resin film is then further processed to enhance the viewpoint of forming the sheet, the adhesion surface (beta]) of 1) than the surface-based ([alpha]) of Adhesive force (α 1) has a higher value of adhesion.

從上述觀點而言,作為黏著力(β 1)與黏著力(α 1)之差〔(β 1)-(α 1)〕,佳為0~8.0N/25mm,較佳為0.1~7.0N/25mm,更佳為0.5~6.0N/25mm,最佳為1.5~5.5N/25mm。 From the above point of view, the difference between the adhesive force ( β 1) and the adhesive force (α 1) [( β 1)-(α 1)] is preferably 0~8.0N/25mm, more preferably 0.1~7.0N /25mm, more preferably 0.5~6.0N/25mm, most preferably 1.5~5.5N/25mm.

本發明之一態樣之樹脂膜形成用薄片之23℃之儲藏彈性模數係佳為0.10~20GPa,較佳為0.15~15GPa,更佳為0.20~10GPa,最佳為0.30~5.0GPa。 The storage elastic modulus at 23°C of the resin film forming sheet of one aspect of the present invention is preferably 0.10-20 GPa, preferably 0.15-15 GPa, more preferably 0.20-10 GPa, most preferably 0.30-5.0 GPa.

若該儲藏彈性模數係0.10GPa以上,則將樹脂膜形成用薄片貼附於矽晶圓後,再度剝離時抑制該樹脂膜形成用薄片之如拉絲之變形現象,矽晶圓上未殘存一部分之樹脂膜形成用薄片,可剝離樹脂膜形成用薄片。 If the storage modulus of elasticity is 0.10GPa or more, after attaching the resin film forming sheet to the silicon wafer, when peeling it off again, the resin film forming sheet is prevented from being deformed such as wire drawing, and no part remains on the silicon wafer The sheet for forming a resin film can be peeled off the sheet for forming a resin film.

另一方面,若該儲藏彈性模數係20GPa以下,則對於矽晶圓之密著性可良好地設定。 On the other hand, if the storage elastic modulus is 20 GPa or less, the adhesion to the silicon wafer can be set well.

並且,本說明書中樹脂膜形成用薄片之儲藏彈性模數意味藉由記載於實施例方法所測定之值。 In addition, the storage elastic modulus of the resin film forming sheet in this specification means the value measured by the method described in the examples.

本發明之一態樣之樹脂膜形成用薄片之表面(β)之對於水之接觸角係從使再加工性更提升之樹脂膜形成用薄片之觀點而言,佳為70~110°,較佳為75~100°,更佳為80~95°,最佳為83~93°。 The contact angle of the surface (β ) of the resin film forming sheet of the present invention with respect to water is preferably 70 to 110° from the viewpoint of the resin film forming sheet for improving reworkability, which is more Preferably it is 75~100°, more preferably 80~95°, most preferably 83~93°.

並且,本說明書中樹脂膜形成用薄片之表面(β)之對於水之接觸角係意味藉由記載於實施例之方法所測定之值。 In addition, in this specification, the contact angle of the surface (β ) of the resin film forming sheet with respect to water means the value measured by the method described in the examples.

<樹脂膜形成用薄片之構成成分> <Components of sheet for forming resin film>

本發明之一態樣之樹脂膜形成用薄片係只要是滿足要件(I)~(III)之具有表面(α)及表面(β)者就沒有特別限制,但含有聚合物成分(A)及硬化性成分(B)者較佳。 The sheet for forming a resin film of one aspect of the present invention is not particularly limited as long as it satisfies the requirements (I) to (III) and has a surface (α) and a surface ( β ), but it contains a polymer component (A) and The curable component (B) is preferable.

再者,本發明之一態樣之樹脂膜形成用薄片係從滿足如要件(I)~(III)之形成表面(α)及表面(β)之觀點而言,不損及本發明之效果之範圍內含有上述成分(A)及(B)之同時,亦可含有無機填料(C)、著色劑(D)、偶合劑(E)、流平劑(F)、及選自汎用添加劑(G)之1種以上。 Furthermore, the resin film forming sheet of one aspect of the present invention does not impair the effects of the present invention from the viewpoint of satisfying the formation surface (α) and surface (β) of the requirements (I) to (III) While the above-mentioned components (A) and (B) are contained within the range, it may also contain inorganic fillers (C), colorants (D), coupling agents (E), leveling agents (F), and general additives ( G) One or more types.

以下,說明有關可成為本發明之一態樣之樹脂膜形成用薄片之構成成分之上述成分(A)~(G)。 Hereinafter, the above-mentioned components (A) to (G) which can be the constituent components of the resin film forming sheet of one aspect of the present invention will be explained.

〔聚合物成分(A)〕 〔Polymer component (A)〕

本說明書中「聚合物成分」意指質量平均分子量(Mw)為2萬以上,並具有至少1種之重複單元之化合物。 In this specification, "polymer component" means a compound having a mass average molecular weight (Mw) of 20,000 or more and having at least one type of repeating unit.

本發明之一態樣所使用之樹脂膜形成用薄片係藉由含有聚合物成分(A),可賦予可翹性及造膜性,並且,具有良好之薄片狀之形狀維持性。其結果可將樹脂膜形成用薄片之23℃之儲藏彈性模數調整至上述之範圍。 The resin film forming sheet used in one aspect of the present invention contains the polymer component (A) to impart warpability and film forming properties, and has good sheet-like shape maintenance. As a result, the storage elastic modulus at 23°C of the resin film forming sheet can be adjusted to the above-mentioned range.

作為聚合物成分(A)之質量平均分子量(Mw),從將所獲得之樹脂膜形成用薄片之23℃之儲藏彈性模數調整至上述之範圍之觀點而言,佳為2萬以上,較佳為2萬~300萬,更佳為5萬~200萬,最佳為10萬~150萬。 As the mass average molecular weight (Mw) of the polymer component (A), from the viewpoint of adjusting the storage elastic modulus at 23°C of the obtained resin film forming sheet to the above-mentioned range, it is preferably 20,000 or more. Preferably, it is 20,000 to 3 million, more preferably 50,000 to 2 million, and most preferably 100,000 to 1.5 million.

本發明之一態樣之樹脂膜形成用薄片中之聚合物成分(A)之含量係相對於樹脂膜形成用薄片之總量(100質量%),佳為5~50質量%,較佳為8~40質量%,更佳為10~35質量%,最佳為15~30質量%。 The content of the polymer component (A) in the resin film forming sheet of one aspect of the present invention is relative to the total amount (100% by mass) of the resin film forming sheet, preferably 5-50% by mass, more preferably 8-40% by mass, more preferably 10-35% by mass, most preferably 15-30% by mass.

並且,本說明書中「相對於樹脂膜形成用薄片之總量之成分(A)之含量」係與「相對於樹脂膜形成用薄片之形成材料之組成物中之有效成分之總量之成分(A)之含量」同義,針對以下所說明之其他成分之含量亦同義。 In addition, in this specification, "the content of the component (A) relative to the total amount of the resin film forming sheet" is the same as the "component relative to the total amount of active ingredients in the composition of the resin film forming sheet ( The content of A)" has the same meaning, and the content of other ingredients explained below is also synonymous.

亦即,與所特定之各成分之含量之「相對於樹脂膜形成用薄片之總量(100質量%)」之語句亦可取代為「相對於樹脂膜形成用薄片之形成材料之組成物之有效成分之 總量(100質量%)」之語句,與特定之含量係同義。 That is, the phrase "relative to the total amount of the resin film forming sheet (100% by mass)" with respect to the content of each component specified can be replaced with "relative to the composition of the forming material of the resin film forming sheet" Of the active ingredients The phrase "total amount (100% by mass)" is synonymous with the specific content.

再者,上述之「有效成分」意味去除對組成物中之溶劑等直接地及間接地所反應或所形成之薄片之物性未造成影響之物質之成分,具體而言意味水及有機溶劑等溶劑以外之成分。 Furthermore, the above-mentioned "active ingredient" means the removal of components that directly and indirectly react with solvents in the composition or that do not affect the physical properties of the formed flakes, and specifically means solvents such as water and organic solvents. Other ingredients.

作為聚合物成分(A),含有丙烯酸系聚合物(A1)較佳,亦可含有丙烯酸系聚合物(A1)以外之聚酯、苯氧基樹脂、聚碳酸酯、聚醚、聚胺酯、聚矽氧烷、橡膠系聚合物等非丙烯酸系聚合物(A2)。 As the polymer component (A), it is preferable to contain an acrylic polymer (A1), and it may also contain polyester, phenoxy resin, polycarbonate, polyether, polyurethane, and polysilicon other than the acrylic polymer (A1). Non-acrylic polymers such as oxanes and rubber polymers (A2).

該等聚合物成分可單獨或組合2種以上使用。 These polymer components can be used individually or in combination of 2 or more types.

作為對於本發明之一態樣之樹脂膜形成用薄片中所含有聚合物成分(A)之總量(100質量%),丙烯酸系聚合物(A1)之含量係佳為50~100質量%,較佳為60~100質量%,更佳為70~100質量%,最佳為80~100質量%。 As for the total amount (100% by mass) of the polymer component (A) contained in the resin film forming sheet of one aspect of the present invention, the content of the acrylic polymer (A1) is preferably 50-100% by mass, It is preferably from 60 to 100% by mass, more preferably from 70 to 100% by mass, and most preferably from 80 to 100% by mass.

(丙烯酸系聚合物(A1)) (Acrylic polymer (A1))

丙烯酸系聚合物(A1)之質量平均分子量(Mw)係從對樹脂膜形成用薄片賦予可翹性及造膜性,並將樹脂膜形成用薄片之23℃之儲藏彈性模數調整至上述範圍之觀點而言,佳為2萬~300萬,較佳為10萬~150萬,更佳為15萬~120萬,最佳為25萬~100萬。 The mass average molecular weight (Mw) of the acrylic polymer (A1) is based on imparting warpability and film forming properties to the resin film forming sheet, and adjusting the storage elastic modulus of the resin film forming sheet at 23°C to the above range From a standpoint, it is preferably 20,000 to 3 million, preferably 100,000 to 1.5 million, more preferably 150,000 to 1.2 million, and most preferably 250,000 to 1 million.

作為丙烯酸系聚合物(A1),從樹脂膜形成用薄片之黏著力(α 1)及(β 1)調整至上述範圍之觀點 而言,具有源自烷基(甲基)丙烯酸酯之結構單元(a1)之丙烯酸系聚合物較佳,特別是從樹脂膜形成用薄片之黏著力(α 1)調整至上述範圍之觀點而言,具有該結構單元(a1)及源自腈系單體之結構單元(a2)之丙烯酸系共聚物更佳。 The acrylic polymer (A1) has a structural unit derived from an alkyl (meth)acrylate from the viewpoint of adjusting the adhesive force (α 1) and ( β 1) of the resin film forming sheet to the above range The acrylic polymer of (a1) is preferable, especially from the viewpoint of adjusting the adhesive force (α 1) of the resin film forming sheet to the above range, it has the structural unit (a1) and a nitrile-based monomer The acrylic copolymer of the structural unit (a2) is more preferable.

並且,本發明之一態樣所使用丙烯酸系聚合物(A1)係除了結構單元(a1)及(a2)以外,亦可進一步具有烷基(甲基)丙烯酸酯及不相當於腈系單體之源自其他單體之結構單元(a3)。 In addition, the acrylic polymer (A1) used in one aspect of the present invention may have, in addition to the structural units (a1) and (a2), an alkyl (meth)acrylate and a monomer that is not equivalent to a nitrile It is derived from the structural unit (a3) of other monomers.

並且,丙烯酸系聚合物(A1)可單獨或組合2種以上使用。 In addition, the acrylic polymer (A1) can be used alone or in combination of two or more kinds.

另外,丙烯酸系聚合物(A1)係共聚物時,該共聚物之形態係亦可嵌段共聚物、無規共聚物、交替共聚物、接枝共聚物之任一者。 In addition, when the acrylic polymer (A1) is a copolymer, the morphology of the copolymer may be any of a block copolymer, a random copolymer, an alternating copolymer, and a graft copolymer.

(結構單元(a1)) (Structural unit (a1))

作為構成結構單元(a1)之烷基(甲基)丙烯酸酯之烷基之碳數,從對樹脂膜形成用薄片賦予可翹性及造膜性之觀點而言,佳為1~18,較佳為1~12,更佳為1~8。 As the carbon number of the alkyl group of the alkyl (meth)acrylate constituting the structural unit (a1), from the viewpoint of imparting warpability and film forming properties to the resin film forming sheet, it is preferably 1 to 18, which is more Preferably it is 1-12, more preferably 1-8.

作為烷基(甲基)丙烯酸酯可列舉例如甲基(甲基)丙烯酸酯、乙基(甲基)丙烯酸酯、丙基(甲基)丙烯酸酯、丁基(甲基)丙烯酸酯、戊基(甲基)丙烯酸酯、2-乙基己基(甲基)丙烯酸酯、異辛基(甲基)丙烯酸酯、n-辛基(甲基)丙烯酸酯、n-壬基(甲基)丙 烯酸酯、異壬基(甲基)丙烯酸酯、癸基(甲基)丙烯酸酯、十二烷基(甲基)丙烯酸酯、十八烷基(甲基)丙烯酸酯等。 Examples of alkyl (meth)acrylates include methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, butyl (meth)acrylate, pentyl (Meth) acrylate, 2-ethylhexyl (meth) acrylate, isooctyl (meth) acrylate, n-octyl (meth) acrylate, n-nonyl (meth) acrylate Acrylate, isononyl (meth)acrylate, decyl (meth)acrylate, dodecyl (meth)acrylate, octadecyl (meth)acrylate, etc.

並且,該等烷基(甲基)丙烯酸酯係可單獨或組合2種以上使用。 Moreover, these alkyl (meth)acrylates can be used individually or in combination of 2 or more types.

該等中具有碳數1~3之烷基之烷基(甲基)丙烯酸酯較佳,甲基(甲基)丙烯酸酯更佳。 Among these, alkyl (meth)acrylates having an alkyl group having 1 to 3 carbon atoms are preferred, and methyl (meth)acrylates are more preferred.

丙烯酸系聚合物(A1)中之具有碳數1~3之源自烷基烷基(甲基)丙烯酸酯之結構單元(a1-1)之含量係相對於丙烯酸系聚合物(A1)之全結構單元(100質量%),佳為5~99質量%,較佳為10~98質量%,更佳為20~97質量%,最佳為25~97質量%。 The content of structural units (a1-1) derived from alkyl alkyl (meth)acrylates with carbon numbers of 1 to 3 in the acrylic polymer (A1) is relative to the total content of the acrylic polymer (A1) The structural unit (100% by mass) is preferably 5 to 99% by mass, preferably 10 to 98% by mass, more preferably 20 to 97% by mass, and most preferably 25 to 97% by mass.

丙烯酸系聚合物(A1)中之結構單元(a1)之含量係相對於丙烯酸系聚合物(A1)之全結構單元(100質量%),佳為50質量%以上,較佳為50~99質量%,更佳為55~98質量%,最佳為60~97質量%。 The content of the structural unit (a1) in the acrylic polymer (A1) is relative to the total structural unit (100% by mass) of the acrylic polymer (A1), preferably 50% by mass or more, more preferably 50~99% by mass %, more preferably 55 to 98% by mass, most preferably 60 to 97% by mass.

(結構單元(a2)) (Structural unit (a2))

作為構成結構單元(a2)之腈系單體,可列舉例如(甲基)丙烯腈、α-氯(甲基)丙烯腈、α-乙氧基(甲基)丙烯腈、富馬腈等。 Examples of the nitrile monomer constituting the structural unit (a2) include (meth)acrylonitrile, α-chloro(meth)acrylonitrile, α-ethoxy(meth)acrylonitrile, fumaronitrile, and the like.

並且,該等腈系單體係可單獨或組合2種以上使用。 In addition, these nitrile-based single systems can be used alone or in combination of two or more types.

該等中(甲基)丙烯腈較佳。 Among these, (meth)acrylonitrile is preferred.

丙烯酸系聚合物(A1)中之源自腈系單體之 結構單元(a2)之含量係相對於丙烯酸系聚合物(A1)之全結構單元(100質量%),佳為1~50質量%,較佳為5~45質量%,更佳為10~42質量%,再更佳為15~40質量%,最佳為20~35質量%。 Acrylic polymer (A1) is derived from nitrile monomer The content of the structural unit (a2) is relative to the total structural unit (100% by mass) of the acrylic polymer (A1), preferably 1-50% by mass, preferably 5-45% by mass, more preferably 10~42 % By mass, more preferably 15-40% by mass, most preferably 20-35% by mass.

若結構單元(a2)之含量係1質量%以上,則容易將所獲得之樹脂膜形成用薄片之表面(α)之黏著力(α 1)調整至上述範圍。另一方面,若結構單元(a2)之含量係50質量%以下,則容易將該樹脂膜形成用薄片之表面(β)之黏著力(β 1)調整至上述範圍。 If the content of the structural unit (a2) is 1% by mass or more, it is easy to adjust the adhesive force (α 1) of the surface (α) of the obtained resin film forming sheet to the above-mentioned range. On the other hand, if the content of the structural unit (a2) is 50% by mass or less, it is easy to adjust the adhesive force ( β 1) of the surface (β ) of the resin film forming sheet to the above-mentioned range.

(結構單元(a3)) (Structural unit (a3))

丙烯酸系聚合物(A1)係不損及本發明之效果之範圍內,除了上述結構單元(a1)及(a2)以外,烷基(甲基)丙烯酸酯及腈系單體亦可具有源自不相當於其他單體之結構單元(a3)。 Acrylic polymer (A1) is within the range that does not impair the effect of the present invention. In addition to the above-mentioned structural units (a1) and (a2), alkyl (meth)acrylate and nitrile monomers may also be derived from It is not equivalent to the structural unit (a3) of other monomers.

作為構成結構單元(a3)之其他單體,可列舉例如含羥基單體、含羧基單體、含環氧基單體等具有官能基之含官能基單體;乙酸乙烯酯、丙酸乙烯酯等乙烯酯類單體;乙烯、丙烯、異丁烯等烯烴類單體;苯乙烯、甲基苯乙烯、乙烯基甲苯等芳香族乙烯基單體:丁二烯、異戊二烯等二烯系單體等。 Examples of other monomers constituting the structural unit (a3) include functional group-containing monomers having functional groups such as hydroxyl group-containing monomers, carboxyl group-containing monomers, and epoxy group-containing monomers; vinyl acetate and vinyl propionate And other vinyl ester monomers; olefin monomers such as ethylene, propylene, and isobutylene; aromatic vinyl monomers such as styrene, methyl styrene, and vinyl toluene: diene monomers such as butadiene and isoprene体等。 Body and so on.

從將樹脂膜形成用薄片之黏著力(α 1)及(β 1)調整至上述範圍之觀點而言,本發明之一態樣所使用丙烯酸系聚合物(A1)係含有源自羥基之單體之結構 單元(a3-1)為較佳。 From the viewpoint of adjusting the adhesive force (α 1) and ( β 1) of the resin film forming sheet to the above range, the acrylic polymer (A1) used in one aspect of the present invention contains a monomer derived from a hydroxyl group. The structural unit (a3-1) of the body is preferable.

作為含有羥基之單體,可列舉例如2-羥乙基(甲基)丙烯酸酯、2-羥丙基(甲基)丙烯酸酯、3-羥丙基(甲基)丙烯酸酯、2-羥丁基(甲基)丙烯酸酯、3-羥丁基(甲基)丙烯酸酯、4-羥丁基(甲基)丙烯酸酯等羥烷基(甲基)丙烯酸酯類;乙烯醇、烯丙醇等不飽和醇類等。 Examples of monomers containing hydroxyl groups include 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, 3-hydroxypropyl (meth)acrylate, 2-hydroxybutyl Hydroxyalkyl (meth)acrylates such as methyl (meth)acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc.; vinyl alcohol, allyl alcohol, etc. Unsaturated alcohols, etc.

該等中2-羥乙基(甲基)丙烯酸酯為較佳。 Among these, 2-hydroxyethyl (meth)acrylate is preferred.

丙烯酸系聚合物(A1)中源自含羥基單體之結構單元(a3-1)之含量係從將樹脂膜形成用薄片之黏著力(α 1)及(β 1)調整至上述範圍之觀點而言,相對於丙烯酸系聚合物(A1)之全結構單元(100質量%),佳為0.5~30質量%,較佳為1~25質量%,更佳為2~20質量%,最佳為3~15質量%,特佳為3.5~12質量%。 The content of the structural unit (a3-1) derived from the hydroxyl-containing monomer in the acrylic polymer (A1) is based on the viewpoint of adjusting the adhesive force (α 1) and (β 1) of the resin film forming sheet to the above range In terms of the total structural unit (100% by mass) of the acrylic polymer (A1), it is preferably 0.5-30% by mass, preferably 1-25% by mass, more preferably 2-20% by mass, most preferably It is 3-15% by mass, particularly preferably 3.5-12% by mass.

再者,丙烯酸系聚合物(A1)中之源自含環氧基單體之結構單元之含量增多時,提升所獲得之樹脂膜形成用薄片與矽晶圓之密著性,而有提升黏著力(α 1)之值之傾向。因此,丙烯酸系聚合物(A1)中之源自含環氧基單體之結構單元之含量係愈少愈佳。 Furthermore, when the content of the structural unit derived from the epoxy group-containing monomer in the acrylic polymer (A1) increases, the adhesion between the obtained resin film forming sheet and the silicon wafer is improved, and the adhesion is improved The tendency of the value of force (α 1). Therefore, the content of the structural unit derived from the epoxy group-containing monomer in the acrylic polymer (A1) is as small as possible.

作為本發明之一態樣所使用丙烯酸系聚合物(A1)中之源自含環氧基單體之結構單元(a3-2)之含量係從上述觀點而言,相對於丙烯酸系聚合物(A1)之全結構單元(100質量%),佳為0~15質量%,較佳為0~10質量%,更佳為0~5質量%,最佳為0~3.5質量%。 The content of the structural unit (a3-2) derived from the epoxy group-containing monomer in the acrylic polymer (A1) used as one aspect of the present invention is based on the above-mentioned point of view, relative to the acrylic polymer ( The total structural unit (100% by mass) of A1) is preferably 0 to 15% by mass, preferably 0 to 10% by mass, more preferably 0 to 5% by mass, and most preferably 0 to 3.5% by mass.

作為含環氧基單體,可列舉例如縮水甘油基 (甲基)丙烯酸酯、β-甲基縮水甘油基(甲基)丙烯酸酯、(3,4-環氧基環己基)甲基(甲基)丙烯酸酯、3-環氧基環-2-羥丙基(甲基)丙烯酸酯等環氧基含有(甲基)丙烯酸酯;縮水甘油基丁烯酸酯、烯丙基縮水甘油基醚等含非丙烯系環氧基單體等。 Examples of epoxy group-containing monomers include glycidyl (meth)acrylate, β -methylglycidyl (meth)acrylate, (3,4-epoxycyclohexyl)methyl(meth)acrylate, (Meth)acrylate containing epoxy groups such as acrylate and 3-epoxycyclo-2-hydroxypropyl (meth)acrylate; glycidyl crotonate, allyl glycidyl ether Containing non-propylene-based epoxy monomers, etc.

使用環氧系熱硬化性成分作為後述之硬化性成分(B)時,因羧基與環氧系熱硬化性成分中之環氧基會產生反應,故丙烯酸系聚合物(A1)中之源自含羧基單體之結構單元之含量係愈少愈佳。 When an epoxy-based thermosetting component is used as the curable component (B) described later, the carboxyl group reacts with the epoxy group in the epoxy-based thermosetting component, so the acrylic polymer (A1) is derived from The content of the structural unit of the carboxyl group-containing monomer is as small as possible.

使用環氧系熱硬化性成分作為硬化性成分(B)時,本發明之一態樣所使用之源自含羧基單體之結構單元(a3-3)之含量係相對於丙烯酸系聚合物(A1)之全結構單元(100質量%),佳為0~10質量%,較佳為0~5質量%,更佳為0~2質量%,最佳為0質量%(未含有結構單元(a3-3))。 When an epoxy-based thermosetting component is used as the curable component (B), the content of the structural unit (a3-3) derived from the carboxyl group-containing monomer used in one aspect of the present invention is relative to the acrylic polymer ( The total structural unit (100% by mass) of A1) is preferably 0-10% by mass, preferably 0-5% by mass, more preferably 0-2% by mass, and most preferably 0% by mass (without structural unit ( a3-3)).

並且,本說明書中具有源自含環氧基單體之結構單元之質量平均分子量係2萬以上之丙烯酸系聚合物係雖然具有熱硬化性,但是並非硬化性成分(B),包含在聚合物成分(A)之概念。 In addition, in this specification, the acrylic polymer system with a mass average molecular weight of 20,000 or more derived from the epoxy-containing monomer has a thermosetting property, but it is not a curable component (B) and is included in the polymer The concept of ingredient (A).

作為含羧基單體,可列舉例如(甲基)丙烯酸、馬來酸、富馬酸、衣康酸等。 As a carboxyl group-containing monomer, (meth)acrylic acid, maleic acid, fumaric acid, itaconic acid, etc. are mentioned, for example.

本發明之一態樣所使用丙烯酸系聚合物(A1)中之結構單元(a3)之含量係相對於丙烯酸系聚合物(A1)之全結構單元(100質量%),佳為0~30質量 %,較佳為1~20質量%,更佳為2~10質量%。 The content of the structural unit (a3) in the acrylic polymer (A1) used in one aspect of the present invention is relative to the total structural unit (100% by mass) of the acrylic polymer (A1), preferably 0-30 mass %, preferably 1-20% by mass, more preferably 2-10% by mass.

(非丙烯酸系樹脂(A2)) (Non-acrylic resin (A2))

本發明之一態樣之樹脂膜形成用薄片係視需要作為上述丙烯酸系聚合物(A1)以外之聚合物成分,亦可含有非丙烯酸系聚合物(A2)。 The sheet for forming a resin film according to one aspect of the present invention may optionally contain a non-acrylic polymer (A2) as a polymer component other than the acrylic polymer (A1) described above.

作為非丙烯酸系聚合物(A2),可列舉例如聚酯、苯氧基樹脂、聚碳酸酯、聚醚、聚胺酯、聚矽氧烷、橡膠系聚合物等。 Examples of the non-acrylic polymer (A2) include polyester, phenoxy resin, polycarbonate, polyether, polyurethane, polysiloxane, rubber-based polymer, and the like.

該等非丙烯酸系聚合物(A2)可單獨或組合2種以上使用。 These non-acrylic polymers (A2) can be used alone or in combination of two or more kinds.

作為非丙烯酸系聚合物(A2)之質量平均分子量(Mw)係佳為2萬以上,較佳為2萬~10萬,更佳為2萬~8萬。 The mass average molecular weight (Mw) of the non-acrylic polymer (A2) is preferably 20,000 or more, preferably 20,000 to 100,000, and more preferably 20,000 to 80,000.

〔硬化性成分(B)〕 〔Sclerosing component (B)〕

硬化性成分(B)係使樹脂膜形成用薄片硬化,分擔形成硬質之樹脂膜之任務,質量平均分子量(Mw)為未達2萬之化合物。 The curable component (B) is a compound whose mass average molecular weight (Mw) is less than 20,000 by hardening the sheet for forming a resin film and sharing the task of forming a hard resin film.

本發明所使用樹脂膜形成用薄片係作為硬化性成分(B),含有熱硬化性成分(B1)與能量射線硬化性成分(B2)之至少1種較佳,從抑制樹脂膜形成用薄片所形成之樹脂膜之著色之觀點而言,使硬化反應充分地進行之觀點而言,以及降低成本之觀點而言,含有熱硬化性成分 (B1)更佳。 The resin film forming sheet used in the present invention is preferably used as the curable component (B), and preferably contains at least one of a thermosetting component (B1) and an energy ray curable component (B2). From the viewpoint of coloring of the formed resin film, the viewpoint of allowing the curing reaction to proceed sufficiently, and the viewpoint of reducing the cost, it contains a thermosetting component (B1) is better.

作為熱硬化性成分(B1),係含有具有至少藉由加熱進行反應之官能基之化合物較佳,含有具有環氧基之化合物(B11)更佳。 As a thermosetting component (B1), it is preferable to contain the compound which has a functional group which reacts by heating at least, and it is more preferable to contain the compound (B11) which has an epoxy group.

另外,能量射線硬化性成分(B2),係含有具有藉由能量射線照射進行反應之官能基之化合物(B21)為佳。 In addition, the energy ray curable component (B2) preferably contains a compound (B21) having a functional group that reacts by energy ray irradiation.

具有該等硬化性成分之官能基彼此進行反應,並藉由形成三次元網目構造而實現硬化。 The functional groups with these curable components react with each other, and harden is achieved by forming a three-dimensional mesh structure.

藉由與成分(A)一起組合而使用,硬化性成分(B)之質量平均分子量(Mw)係從可抑制樹脂膜形成用薄片之形成材料之組成物之黏度,並使操作性提升等之觀點而言,佳為未達20,000,較佳為10,000以下,更佳為100~10,000。 When used in combination with component (A), the mass average molecular weight (Mw) of the curable component (B) can suppress the viscosity of the composition of the forming material of the resin film forming sheet and improve the workability. From a viewpoint, it is preferably less than 20,000, preferably 10,000 or less, and more preferably 100 to 10,000.

(熱硬化性成分(B1)) (Thermosetting component (B1))

作為熱硬化性成分(B1),環氧系熱硬化性成分較佳。 As the thermosetting component (B1), epoxy-based thermosetting components are preferred.

環氧系熱硬化性成分係使用具有環氧基之化合物(B11)再組合熱硬化劑(B12)者較佳。 The epoxy-based thermosetting component is preferably a compound having an epoxy group (B11) in combination with a thermosetting agent (B12).

作為具有環氧基之化合物(B11)(以下,亦稱為「環氧化合物(B11)」),可列舉例如多官能系環氧樹脂、雙酚A、二縮水甘油基醚及其氫化物、甲酚酚醛清漆環氧樹脂等之酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、聯苯基型環氧樹脂、雙酚A型環氧樹脂、雙酚F 型環氧樹脂、亞苯基骨架型環氧樹脂等之分子中具有2官能以上之環氧化合物等。 Examples of the compound (B11) having an epoxy group (hereinafter, also referred to as "epoxy compound (B11)") include, for example, polyfunctional epoxy resins, bisphenol A, diglycidyl ether and hydrogenated products thereof, Cresol novolac epoxy resin, novolac epoxy resin, dicyclopentadiene epoxy resin, biphenyl epoxy resin, bisphenol A epoxy resin, bisphenol F Type epoxy resins, phenylene skeleton type epoxy resins, and other epoxy compounds having two or more functions in the molecule.

該等環氧化合物(B11)可單獨或組合2種以上使用。 These epoxy compounds (B11) can be used individually or in combination of 2 or more types.

該等中從將樹脂膜形成用薄片之黏著力(α 1)及(β 1)調整至上述範圍之觀點而言,含有選自酚醛清漆型環氧樹脂及聯苯基型環氧樹脂中之1種以上較佳,特別是從將樹脂膜形成用薄片之黏著力(α 1)調整至上述範圍之觀點而言,含有聯苯基型環氧樹脂較佳,含有聯苯基芳烷型環氧樹脂更佳。 Among them, from the viewpoint of adjusting the adhesive force (α 1) and ( β 1) of the resin film forming sheet to the above-mentioned range, they contain selected from novolak type epoxy resins and biphenyl type epoxy resins. One or more types are preferable, especially from the viewpoint of adjusting the adhesive force (α 1) of the resin film forming sheet to the above range, it is preferable to contain a biphenyl type epoxy resin, and a biphenyl arane type ring Oxygen resin is better.

選自酚醛清漆型環氧樹脂及聯苯基型環氧樹脂中之1種以上之合計含量係相對於環氧化合物(B11)之總量(100質量%),佳為70~100質量%,較佳為80~100質量%,更佳為90~100質量%,最佳為95~100質量%。 The total content of one or more selected from novolak-type epoxy resins and biphenyl-type epoxy resins is based on the total amount (100% by mass) of the epoxy compound (B11), preferably 70-100% by mass, It is preferably from 80 to 100% by mass, more preferably from 90 to 100% by mass, and most preferably from 95 to 100% by mass.

另外,從將樹脂膜形成用薄片之黏著力(α 1)調整至上述範圍之觀點而言,聯苯基型環氧樹脂之含量係相對於環氧化合物(B11)之總量(100質量%),佳為70~100質量%,較佳為80~100質量%,更佳為90~100質量%,最佳為95~100質量%。 In addition, from the viewpoint of adjusting the adhesive force (α 1) of the resin film forming sheet to the above range, the content of the biphenyl type epoxy resin is relative to the total amount (100% by mass) of the epoxy compound (B11) ), preferably 70-100% by mass, more preferably 80-100% by mass, more preferably 90-100% by mass, most preferably 95-100% by mass.

環氧化合物(B11)之含量係相對於成分(A)100質量份,佳為1~500質量份,較佳為3~300質量份,更佳為5~150質量份,最佳為10~100質量份。 The content of the epoxy compound (B11) is relative to 100 parts by mass of the component (A), preferably 1 to 500 parts by mass, preferably 3 to 300 parts by mass, more preferably 5 to 150 parts by mass, and most preferably 10~ 100 parts by mass.

(熱硬化劑(B12)) (Thermal hardener (B12))

熱硬化劑(B12)係作為對於環氧化合物(B11)之硬化劑做功能。 The thermosetting agent (B12) functions as a curing agent for the epoxy compound (B11).

作為熱硬化劑1分子中具有2個以上之可與環氧基反應之官能基之化合物較佳。 It is preferable as a compound which has 2 or more functional groups which can react with an epoxy group in 1 molecule of a thermosetting agent.

作為該官能基可列舉苯酚性羥基、醇性羥基、胺基、羧基,及酸酐等。該等中苯酚性羥基、胺基、或酸酐較佳、苯酚性羥基及胺基較佳,胺基更佳。 As this functional group, a phenolic hydroxyl group, an alcoholic hydroxyl group, an amino group, a carboxyl group, acid anhydride, etc. are mentioned. Among these, a phenolic hydroxyl group, an amino group, or an acid anhydride is preferable, a phenolic hydroxyl group and an amino group are preferable, and an amino group is more preferable.

作為具有苯酚基之苯酚系熱硬化劑,可列舉例如多官能系苯酚樹脂、聯苯酚、酚醛清漆型苯酚樹脂、雙環戊二烯型苯酚樹脂、新酚型苯酚樹脂、芳烷型苯酚樹脂等。 Examples of the phenol-based thermosetting agent having a phenol group include polyfunctional phenol resins, biphenols, novolak-type phenol resins, dicyclopentadiene-type phenol resins, neophenol-type phenol resins, and aralkyl-type phenol resins.

作為具有胺基之胺系熱硬化劑,可列舉例如二氰基二醯胺(DICY)等。 Examples of the amine-based thermosetting agent having an amino group include dicyanodiamide (DICY) and the like.

該等熱硬化劑(B12)可單獨或組合2種以上使用。 These thermosetting agents (B12) can be used alone or in combination of two or more kinds.

從該等中將樹脂膜形成用薄片之黏著力(α 1)及(β 1)調整至上述範圍之觀點而言,含有苯酚系熱硬化劑為佳。 Among these, from the viewpoint of adjusting the adhesive strength (α 1) and ( β 1) of the resin film forming sheet to the above-mentioned range, it is preferable to contain a phenol-based thermosetting agent.

苯酚系熱硬化劑之含量係相對於熱硬化劑(B12)之總量(100質量%),佳為50~100質量%,較佳為70~100質量%,更佳為80~100質量%,最佳為90~100質量%。 The content of the phenol-based thermosetting agent is relative to the total amount (100% by mass) of the thermosetting agent (B12), preferably 50-100% by mass, preferably 70-100% by mass, more preferably 80-100% by mass , The best is 90-100% by mass.

熱硬化劑(B12)之含量係相對於環氧化合物 (B11)100質量份,佳為0.1~500質量份,較佳為1~200質量份。 The content of thermal hardener (B12) is relative to epoxy compound (B11) 100 parts by mass, preferably 0.1 to 500 parts by mass, more preferably 1 to 200 parts by mass.

另外,本發明之一態樣之樹脂膜形成用薄片中,從將樹脂膜形成用薄片之黏著力(α 1)及(β 1)調整至上述範圍之觀點而言,作為環氧化合物(B1)含有聯苯基型環氧樹脂,且作為熱硬化劑(B12)含有苯酚系熱硬化劑,併用兩成分較佳。 Further, one aspect of the present invention is formed of a resin film sheet, and 1) adjusts the film-forming resin of the adhesion of the sheet (α 1) to view the above range, the epoxy compound (B1 ) It contains a biphenyl type epoxy resin, and contains a phenol-based thermosetting agent as the thermosetting agent (B12), and it is preferable to use two components in combination.

並且,此時作為聚合物成分(A)含有具有源自腈系單體之結構單元(a2-1)之丙烯酸系聚合物(A1)更佳。 Furthermore, at this time, it is more preferable to contain an acrylic polymer (A1) having a structural unit (a2-1) derived from a nitrile monomer as the polymer component (A).

(硬化促進劑(B13)) (Hardening accelerator (B13))

本發明之一態樣之樹脂膜形成用薄片係從藉由該薄片之加熱調整硬化速度之觀點而言,亦可含有硬化促進劑(B13)。 The sheet for forming a resin film according to one aspect of the present invention may contain a hardening accelerator (B13) from the viewpoint of adjusting the hardening speed by heating the sheet.

硬化促進劑(B13)係作為熱硬化性成分(B1),併用環氧化合物(B11)較佳。 The curing accelerator (B13) is used as the thermosetting component (B1), and an epoxy compound (B11) is preferably used in combination.

作為硬化促進劑(B13),可列舉例如三乙烯二胺、苄二甲基胺、三乙醇胺、二甲基乙醇胺、三(二甲基甲胺)苯酚等3級胺類;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥甲基咪唑、2-苯基-4-甲基-5-羥甲基咪唑等咪唑類;三丁基膦、二苯基膦、三苯基膦等有機膦類;四苯基鏻四苯基硼酸鹽、三苯基膦四苯基硼酸鹽等四苯基硼鹽等。 Examples of the hardening accelerator (B13) include tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylethanolamine, and tris(dimethylmethylamine)phenol; 2-methylimidazole , 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, etc. Imidazoles; organic phosphines such as tributyl phosphine, diphenyl phosphine, and triphenyl phosphine; tetraphenyl boron salts such as tetraphenyl phosphonium tetraphenyl borate, triphenyl phosphine tetraphenyl borate, etc.

該等硬化促進劑(B13)可單獨或組合2種以上使 用。 These hardening accelerators (B13) can be used alone or in combination of two or more use.

硬化促進劑(B13)之含量係從提升由樹脂膜形成用薄片所形成之樹脂膜之接著性之觀點而言,相對於環氧化合物(B11)及熱硬化劑(B12)之合計量100質量份,佳為0.01~10質量份,較佳為0.1~6質量份,更佳為0.3~4質量份。 The content of the hardening accelerator (B13) is based on the total amount of the epoxy compound (B11) and the thermosetting agent (B12) from the viewpoint of improving the adhesiveness of the resin film formed by the resin film forming sheet, which is 100 mass Parts, preferably 0.01-10 parts by mass, preferably 0.1-6 parts by mass, more preferably 0.3-4 parts by mass.

(能量射線硬化性成分(B2)) (Energy ray hardening component (B2))

作為能量射線硬化性成分(B2),雖然可單獨使用具有藉由能量射線照射進行反應之官能基之化合物(B21),但是使用與化合物(B21)一起組合之光聚合起始劑(B22)較佳。 As the energy ray curable component (B2), although the compound (B21) having a functional group that reacts by energy ray irradiation can be used alone, it is better to use a photopolymerization initiator (B22) combined with the compound (B21). good.

(具有藉由能量射線照射進行反應之官能基之化合物(B21)) (Compound (B21) having a functional group that reacts by energy ray irradiation)

作為具有藉由能量射線照射進行反應之官能基之化合物(B21)(以下,亦稱為「能量射線反應性化合物(B21)」),可列舉例如三羥甲基丙烷三丙烯酸酯、季戊四醇三丙烯酸酯、季戊四醇四丙烯酸酯、二季戊四醇單羥基五丙烯酸酯、二季戊四醇六丙烯酸酯、1,4-丁二醇酯二丙烯酸酯、1,6-己二醇二丙烯酸酯、低聚酯丙烯酸酯、聚胺酯丙烯酸酯系低聚物、環氧丙烯酸酯、聚醚丙烯酸酯、衣康酸低聚物等。 Examples of the compound (B21) having a functional group that reacts by energy ray irradiation (hereinafter also referred to as "energy ray reactive compound (B21)") include trimethylolpropane triacrylate and pentaerythritol triacrylate Esters, pentaerythritol tetraacrylate, dipentaerythritol monohydroxy pentaacrylate, dipentaerythritol hexaacrylate, 1,4-butanediol diacrylate, 1,6-hexanediol diacrylate, oligoester acrylate, Polyurethane acrylate oligomer, epoxy acrylate, polyether acrylate, itaconic acid oligomer, etc.

該等能量射線反應性化合物(B21)可單獨或組合2 種以上使用。 These energy ray reactive compounds (B21) can be used alone or in combination 2 More than one kind of use.

並且,能量射線反應性化合物(B21)之質量平均分子量(Mw)佳為100~30,000,較佳為300~10,000。 In addition, the mass average molecular weight (Mw) of the energy ray reactive compound (B21) is preferably 100 to 30,000, more preferably 300 to 10,000.

能量射線反應性化合物(B21)之含量係相對於成分(A)100質量份,佳為含有1~1500質量份,較佳為含有3~1200質量份。 The content of the energy ray reactive compound (B21) is based on 100 parts by mass of the component (A), preferably 1 to 1500 parts by mass, and more preferably 3 to 1200 parts by mass.

(光聚合起始劑(B22)) (Photopolymerization initiator (B22))

藉由上述之與能量射線反應性化合物(B21)一起併用之光聚合起始劑(B22),縮短聚合硬化時間,即使減少光線照射量亦可進行樹脂膜形成用薄片之硬化。 With the aforementioned photopolymerization initiator (B22) used in combination with the energy ray reactive compound (B21), the polymerization curing time is shortened, and the resin film forming sheet can be cured even if the amount of light exposure is reduced.

作為光聚合起始劑(B22),可列舉例如苯偶姻化合物、苯乙酮化合物、醯基氧化膦化合物、二茂鈦化合物、噻噸酮化合物、過氧化物化合物等。 As a photopolymerization initiator (B22), a benzoin compound, an acetophenone compound, an phosphine oxide compound, a titanocene compound, a thioxanthone compound, a peroxide compound, etc. are mentioned, for example.

作為更具體之光聚合起始劑,可列舉例如1-羥基環己基苯基酮、苯偶姻、苯偶姻甲基醚、苯偶姻乙醚、苯偶姻異丙醚、苄基二苯基硫醚、四甲基秋蘭姆、偶氮二異丁腈、二苄、丁二酮、β-爬行蒽醌、2,4,6-三甲基苯甲醯二苯基氧化膦等。 As more specific photopolymerization initiators, for example, 1-hydroxycyclohexyl phenyl ketone, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzyl diphenyl Thioether, tetramethylthiuram, azobisisobutyronitrile, dibenzyl, butanedione, β -creeping anthraquinone, 2,4,6-trimethylbenzyl diphenyl phosphine oxide, etc.

該等光聚合起始劑可單獨或組合2種以上使用。 These photopolymerization initiators can be used alone or in combination of two or more kinds.

光聚合起始劑(B22)之含量係使樹脂膜形成用薄片之硬化反應充分地進行,從抑制殘留物之產生之觀點而言,相對於能量射線反應性化合物(B21)100質量份,佳為0.1~10質量份,較佳為1~5質量份。 The content of the photopolymerization initiator (B22) is such that the curing reaction of the resin film forming sheet is sufficiently advanced. From the viewpoint of suppressing the generation of residues, it is preferably relative to 100 parts by mass of the energy ray reactive compound (B21) It is 0.1 to 10 parts by mass, preferably 1 to 5 parts by mass.

本發明之一態樣之樹脂膜形成用薄片中之硬化性成分(B)之含量係相對於樹脂膜形成用薄片之總量(100質量%),佳為5~50質量%,較佳為8~40質量%,更佳為10~30質量%,最佳為12~25質量%。 The content of the curable component (B) in the resin film forming sheet of one aspect of the present invention is relative to the total amount (100% by mass) of the resin film forming sheet, preferably 5-50% by mass, and more preferably 8-40% by mass, more preferably 10-30% by mass, most preferably 12-25% by mass.

並且,上述「硬化性成分(B)之含量」係指上述環氧化合物(B11)、熱硬化劑(B12),與含硬化促進劑(B13)之熱硬化性成分(B1),以及能量射線反應性化合物(B21),與含光聚合起始劑(B22)之能量射線硬化性成分(B2)之合計含量。 In addition, the "content of the curable component (B)" refers to the epoxy compound (B11), the thermosetting agent (B12), the thermosetting component (B1) containing the curing accelerator (B13), and energy rays The total content of the reactive compound (B21) and the energy ray curable component (B2) containing the photopolymerization initiator (B22).

作為本發明之一態樣之樹脂膜形成用薄片中之聚合物成分(A)及硬化性成分(B)之合計含量,相對於樹脂膜形成用薄片之總量(100質量%),佳為40質量%以上,較佳為50質量%以上,更佳為60質量%以上,最佳為70質量%以上。 The total content of the polymer component (A) and the curable component (B) in the resin film forming sheet as one aspect of the present invention is preferably relative to the total amount (100% by mass) of the resin film forming sheet 40% by mass or more, preferably 50% by mass or more, more preferably 60% by mass or more, most preferably 70% by mass or more.

〔無機填料(C)〕 〔Inorganic filler (C)〕

本發明之一態樣之樹脂膜形成用薄片係亦可進一步含有無機填料(C)。 The sheet for forming a resin film according to an aspect of the present invention may further contain an inorganic filler (C).

藉由含有無機填料(C),可將由樹脂膜形成用薄片所形成之樹脂膜之熱膨脹參數調整至適度範圍,並且,最適化附樹脂膜之晶片之熱膨脹參數,而可提升已嵌入該晶片之半導體裝置之信賴性。另外,亦可降低由樹脂膜形成用薄片所形成之樹脂膜之吸濕率。 By containing the inorganic filler (C), the thermal expansion parameter of the resin film formed by the resin film forming sheet can be adjusted to an appropriate range, and the thermal expansion parameter of the chip with the resin film can be optimized, and the embedded chip can be improved The reliability of semiconductor devices. In addition, the moisture absorption rate of the resin film formed of the resin film forming sheet can also be reduced.

作為無機填料(C),可列舉例如矽石、氧化 鋁、滑石、碳酸鈣、氧化鈦、氧化鐵、碳化矽、氮化硼等粉末、將該等經球形化之微珠、單結晶纖維及玻璃纖維等。 As the inorganic filler (C), for example, silica, oxide Powders such as aluminum, talc, calcium carbonate, titanium oxide, iron oxide, silicon carbide, boron nitride, etc., spheroidized microbeads, single crystal fibers, glass fibers, etc.

該等無機填料(C)係可單獨或組合2種以上使用。 These inorganic fillers (C) can be used individually or in combination of 2 or more types.

該等中矽石及氧化鋁較佳。 The silica and alumina are preferred.

作為無機填料(C)之平均粒徑,從將樹脂膜形成用薄片之表面(α)之表面粗糙度(Ra)調整至上述範圍之觀點而言,佳為400nm以下,較佳為300nm以下,更佳為200nm以下,最佳為100nm以下,另一方面,從使用樹脂膜形成用薄片所製造之附樹脂膜之晶片之信賴性良好地設定之觀點而言,佳為10nm以上,較佳為20nm以上。 As the average particle diameter of the inorganic filler (C), from the viewpoint of adjusting the surface roughness (Ra) of the surface (α) of the resin film forming sheet to the above range, it is preferably 400 nm or less, preferably 300 nm or less, It is more preferably 200 nm or less, and most preferably 100 nm or less. On the other hand, from the viewpoint of setting the reliability of a resin film-attached wafer manufactured using a resin film forming sheet, it is preferably 10 nm or more, and more preferably Above 20nm.

並且,本說明書中無機填料(C)之平均粒徑係使用雷射繞射散射式粒度分布測定裝置所測定之值,意味體積中位粒徑(D50)。 In addition, the average particle size of the inorganic filler (C) in this specification is a value measured using a laser diffraction scattering type particle size distribution measuring device, and means the volume median particle size (D 50 ).

本發明之一態樣之樹脂膜形成用薄片中之無機填料(C)之含量係從將樹脂膜形成用薄片之表面(α)之表面粗糙度(Ra)調整至上述範圍之觀點而言,相對於樹脂膜形成用薄片之總量(100質量%),佳為0~50質量%,較佳為0~45質量%,更佳為0~40質量%,最佳為0~30質量%。 The content of the inorganic filler (C) in the resin film forming sheet of one aspect of the present invention is from the viewpoint of adjusting the surface roughness (Ra) of the surface (α) of the resin film forming sheet to the above-mentioned range. Relative to the total amount (100% by mass) of the resin film forming sheet, preferably 0-50% by mass, more preferably 0-45% by mass, more preferably 0-40% by mass, most preferably 0-30% by mass .

並且,將本發明之一態樣之樹脂膜形成用薄片設為由2種以上之組成物形成之二層以上構成之覆層體時,包含於該樹脂膜形成用薄片之表面(α)側之層之形 成材料之組成物中之無機填料(C)係減小平均粒徑,亦減少含量,而調整表面(α)之表面粗糙度(Ra)較佳。 In addition, when the resin film forming sheet of one aspect of the present invention is a cladding body composed of two or more layers formed of two or more compositions, it is included on the surface (α) side of the resin film forming sheet The form of layers The inorganic filler (C) in the composition of the material reduces the average particle size and also reduces the content, and it is better to adjust the surface roughness (Ra) of the surface (α).

另一方面,表面(β)側之層之形成材料之組成物中對表面(α)之表面粗糙度(Ra)未造成影響之範圍內,亦可摻合平均粒徑為0.01μm以上之無機填料(C’)。 On the other hand, in the composition of the layer forming material on the surface (β ) side that does not affect the surface roughness (Ra) of the surface (α), inorganic particles with an average particle size of 0.01 μm or more can also be blended. Filler (C').

作為無機填料(C’)之平均粒徑,通常為0.01~5μm,佳為0.02~3μm。 The average particle size of the inorganic filler (C') is usually 0.01 to 5 μm, preferably 0.02 to 3 μm.

〔著色劑(D)〕 〔Colorant (D)〕

本發明之一態樣之樹脂膜形成用薄片進一步亦可包含著色劑(D)。 The sheet for forming a resin film of one aspect of the present invention may further include a colorant (D).

藉由樹脂膜形成用薄片含有著色劑(D),將具有由樹脂膜形成用薄片形成之樹脂膜之半導體晶片組入機器時,遮蔽由周圍之裝置所產生之紅外線等,可防止半導體晶片之錯誤作動。 When the resin film forming sheet contains the coloring agent (D), when the semiconductor chip with the resin film formed from the resin film forming sheet is incorporated into the machine, the infrared rays generated by the surrounding devices can be shielded, and the semiconductor chip can be prevented from being damaged. Wrong action.

作為著色劑(D),可使用有機或無機之顏料及染料。 As the colorant (D), organic or inorganic pigments and dyes can be used.

作為染料,可使用即使例如酸性染料、反應染料、直接染料、分散染料、陽離子染料等之任一者之染料。 As the dye, any one of acid dyes, reactive dyes, direct dyes, disperse dyes, and cationic dyes can be used.

另外,作為顏料,沒有特別限制,可適宜地選自習知之顏料而使用。 In addition, there are no particular restrictions on the pigment, and it can be suitably selected from conventional pigments and used.

從該等中電磁波或者紅外線之遮蔽性良好,且使介由激光打標法之識別性更提升之觀點而言,黑色顏料較佳。 From the viewpoint of good shielding properties of electromagnetic waves or infrared rays, and improved recognition by laser marking method, black pigments are preferable.

作為黑色顏料,雖然可列舉例如碳黑、氧化鐵、二氧 化錳、苯胺黑、活性碳等,但是從提高半導體晶片之信賴性之觀點而言,碳黑較佳。 As black pigments, although examples include carbon black, iron oxide, and dioxygen Manganese, aniline black, activated carbon, etc., but from the viewpoint of improving the reliability of semiconductor wafers, carbon black is preferable.

並且,該等著色劑(D)係可單獨或組合2種以上使用。 Moreover, these coloring agents (D) can be used individually or in combination of 2 or more types.

作為著色劑(D)之平均粒徑,從將樹脂膜形成用薄片之表面(α)之表面粗糙度(Ra)調整至上述範圍之觀點而言,佳為400nm以下,較佳為300nm以下,更佳為200nm以下,最佳為100nm以下,另外,佳為10nm以上,較佳為20nm以上。 The average particle diameter of the colorant (D) is preferably 400 nm or less, preferably 300 nm or less from the viewpoint of adjusting the surface roughness (Ra) of the surface (α) of the resin film forming sheet to the above-mentioned range. It is more preferably 200 nm or less, most preferably 100 nm or less, and more preferably 10 nm or more, and more preferably 20 nm or more.

並且,本說明書中著色劑(D)之平均粒徑係使用雷射繞射散射式粒度分布測定裝置所測定之值,意味體積中位粒徑(D50)。 In addition, the average particle size of the colorant (D) in this specification is a value measured by a laser diffraction scattering type particle size distribution measuring device, and means the volume median particle size (D 50 ).

本發明之一態樣之樹脂膜形成用薄片中之著色劑(D)之含量係相對於樹脂膜形成用薄片之總量(100質量%),佳為0.01~30質量%,較佳為0.05~25質量%,更佳為0.1~15質量%,最佳為0.15~5質量%。 The content of the coloring agent (D) in the resin film forming sheet of one aspect of the present invention is relative to the total amount (100% by mass) of the resin film forming sheet, preferably 0.01-30% by mass, more preferably 0.05 ~25% by mass, more preferably 0.1-15% by mass, most preferably 0.15-5% by mass.

〔偶合劑(E)〕 〔Coupling agent (E)〕

本發明之一態樣之樹脂膜形成用薄片係進一步亦可包含偶合劑(E)。 The sheet for forming a resin film of one aspect of the present invention may further include a coupling agent (E).

藉由含有偶合劑(E),不損及所獲得之由樹脂膜形成用薄片形成之樹脂膜之耐熱性,亦可提升耐水性。另外,亦賦予與矽晶圓之貼附後之端部密著性之提升。 By containing the coupling agent (E), the heat resistance of the obtained resin film formed of the resin film forming sheet is not impaired, and the water resistance can also be improved. In addition, it also improves the adhesion to the end of the silicon wafer after attachment.

作為偶合劑(E),與具有成分(A)或成分 (B)之官能基反應之化合物較佳,矽烷偶合劑更佳。 As a coupling agent (E), with component (A) or component The functional group reaction compound of (B) is preferable, and the silane coupling agent is more preferable.

作為矽烷偶合劑,可列舉例如γ-環氧丙基三甲氧矽烷、γ-環氧丙基甲基二乙氧基矽烷、β-(3,4-環氧基環己基)乙基三甲氧矽烷、γ-(甲基丙烯醯)三甲氧矽烷、γ-胺丙基三甲氧矽烷、N-6-(胺乙基)-γ-胺丙基三甲氧矽烷、N-6-(胺乙基)-γ-胺丙基甲基二乙氧基矽烷、N-苯基-γ-胺丙基三甲氧矽烷、γ-脲基丙基三乙氧基矽烷、γ-巰丙基三甲氧矽烷、γ-巰丙基甲基二甲氧矽烷、雙(3-三乙氧基甲矽烷基丙基)四硫烷、甲基三甲氧矽烷、甲基三乙氧矽烷、乙烯三甲氧矽烷、乙烯三乙醯氧基矽烷、咪唑矽烷等。 As the silane coupling agent, for example, γ-glycidoxypropyltrimethoxysilane, γ-glycidylmethyldiethoxysilane, β -(3,4-epoxycyclohexyl)ethyltrimethoxysilane , Γ-(methacrylic acid) trimethoxysilane, γ-aminopropyltrimethoxysilane, N-6-(aminoethyl)-γ-aminopropyltrimethoxysilane, N-6-(aminoethyl) -γ-Aminopropylmethyl diethoxysilane, N-phenyl-γ-aminopropyltrimethoxysilane, γ-ureidopropyltriethoxysilane, γ-mercaptopropyltrimethoxysilane, γ -Mercaptopropyl methyl dimethyl dimethyl oxysilane, bis (3-triethoxy silyl propyl) tetrasulfane, methyl trimethoxy silane, methyl triethoxy silane, ethylene trimethoxy silane, ethylene triethyl Oxyoxysilane, imidazole silane, etc.

該等偶合劑(E)係可單獨或者組合2種以上使用。 These coupling agents (E) can be used individually or in combination of 2 or more types.

作為偶合劑(E),低聚物型偶合劑較佳。 As the coupling agent (E), an oligomer type coupling agent is preferred.

作為亦包含低聚物型偶合劑之偶合劑(E)之分子量,佳為100~15000,較佳為150~10000,更佳為200~5000,再更佳為250~3000,最佳為350~2000。 As the molecular weight of the coupling agent (E) which also contains the oligomer type coupling agent, it is preferably 100 to 15000, preferably 150 to 10000, more preferably 200 to 5000, still more preferably 250 to 3000, most preferably 350 ~2000.

並且,可思及藉由含有偶合劑(E),被著體之矽晶圓或者樹脂膜形成用薄片中包含無機填料(C)時與無機填料(C)之表面鍵結,提升接著性或凝集性,亦提升樹脂膜形成用薄片之黏著力(α 1)。 In addition, it is conceivable that by containing the coupling agent (E), when the silicon wafer or resin film forming sheet of the body contains the inorganic filler (C), it bonds with the surface of the inorganic filler (C) to improve the adhesion or Cohesiveness also improves the adhesive force (α 1) of the resin film forming sheet.

因此,從獲得再加工性優異之樹脂膜形成用薄片之觀點而言,本發明之一態樣之樹脂膜形成用薄片中之偶合劑(E)之含量係愈少愈佳。 Therefore, from the viewpoint of obtaining a sheet for forming a resin film with excellent reworkability, the content of the coupling agent (E) in the sheet for forming a resin film according to one aspect of the present invention should be as small as possible.

本發明之一態樣之樹脂膜形成用薄片中之偶合劑 (E)之含量係相對於樹脂膜形成用薄片之總量(100質量%),從上述觀點而言,佳為3.0質量%以下,較佳為1.5質量%以下,更佳為0.8質量%以下,最佳為0.3質量%以下,另一方面,從良好地設定該樹脂膜形成用薄片之與矽晶圓之貼附後之端部密著性之觀點而言,以及從將樹脂膜形成用薄片之表面(β)之黏著力(β 1)調整至上述範圍之觀點而言,佳為0.01質量%以上,較佳為0.05質量%以上,更佳為0.10質量%以上。 The content of the coupling agent (E) in the resin film forming sheet of one aspect of the present invention is relative to the total amount (100% by mass) of the resin film forming sheet, and from the above viewpoint, it is preferably 3.0% by mass or less , Preferably 1.5% by mass or less, more preferably 0.8% by mass or less, and most preferably 0.3% by mass or less. From the viewpoint of part adhesion and from the viewpoint of adjusting the adhesive force ( β 1) of the surface (β ) of the resin film forming sheet to the above range, it is preferably 0.01% by mass or more, more preferably 0.05% by mass % Or more, more preferably 0.10 mass% or more.

〔流平劑(F)〕 〔Leveling agent (F)〕

本發明之一態樣之樹脂膜形成用薄片中進一步亦可含有流平劑(F)。 The sheet for forming a resin film of one aspect of the present invention may further contain a leveling agent (F).

藉由含有流平劑(F)可將所獲得之樹脂膜形成用薄片之表面(α)之黏著力(α 1)容易調整至上述範圍。 By containing the leveling agent (F), the adhesive force (α 1) of the surface (α) of the obtained resin film forming sheet can be easily adjusted to the above-mentioned range.

作為流平劑(F),可列舉例如聚矽氧系流平劑、氟系流平劑、丙烯系流平劑、乙烯系流平劑、及氟系與丙烯系已複合化之流平劑等。 As the leveling agent (F), for example, silicone-based leveling agents, fluorine-based leveling agents, propylene-based leveling agents, ethylene-based leveling agents, and fluorine-based and propylene-based leveling agents have been combined. Wait.

該等流平劑(F)可單獨或組合2種以上使用。 These leveling agents (F) can be used individually or in combination of 2 or more types.

從可將該等中樹脂膜形成用薄片之表面(α)之黏著力(α 1)容易調整至上述範圍之觀點而言,含有聚矽氧系流平劑較佳。 From the viewpoint that the adhesive force (α 1) of the surface (α) of the resin film forming sheet can be easily adjusted to the above-mentioned range, it is preferable to contain a silicone-based leveling agent.

並且,樹脂膜形成用薄片中含有流平劑(F)時,容易將表面(α)之黏著力(α 1)調整至上述範圍,降低表面(β)之黏著力(β 1),有降低樹脂膜形 成用薄片之再加工性之虞。因此,於樹脂膜形成用薄片之表面(β)側,流平劑之含量愈少愈佳。 In addition, when the resin film forming sheet contains a leveling agent (F), the adhesive force (α 1) of the surface (α) can be easily adjusted to the above range, and the adhesive force ( β 1) of the surface (β) will be reduced. There is a concern about the reworkability of the sheet for forming a resin film. Therefore, on the surface ( β ) side of the sheet for forming a resin film, the content of the leveling agent should be as small as possible.

從將所獲得之樹脂膜形成用薄片之表面(α)之黏著力(α 1)調整至上述範圍之觀點而言,流平劑(F)之含量係相對於樹脂膜形成用薄片之總量(100質量%),佳為0.010質量%以上,較佳為0.050質量%以上,更佳為0.100質量%以上。 From the viewpoint of adjusting the adhesive force (α 1) of the surface (α) of the obtained resin film forming sheet to the above range, the content of the leveling agent (F) is relative to the total amount of the resin film forming sheet (100% by mass), preferably 0.010% by mass or more, more preferably 0.050% by mass or more, more preferably 0.100% by mass or more.

另外,從將該樹脂膜形成用薄片之表面(β)之黏著力(β 1)調整至上述範圍之觀點而言,流平劑(F)之含量係相對於樹脂膜形成用薄片之總量(100質量%),佳為0.500質量%以下,較佳為0.300質量%以上,更佳為0.200質量%以上。 In addition, from the viewpoint of adjusting the adhesive force ( β 1) of the surface (β ) of the resin film forming sheet to the above range, the content of the leveling agent (F) is relative to the total amount of the resin film forming sheet (100% by mass), preferably 0.500% by mass or less, more preferably 0.300% by mass or more, more preferably 0.200% by mass or more.

再者,從將樹脂膜形成用薄片之黏著力(α 1)及(β 1)平衡良好地調整之觀點而言,本發明之樹脂膜形成用薄片含有流平劑之薄片時,作為該樹脂膜形成用薄片之一態樣,具有由包含流平劑之組成物(α’)形成之層與由實質上未包含流平劑之組成物(β’)形成之層之複層薄片較佳。 Furthermore, from the viewpoint of adjusting the adhesive force (α 1) and ( β 1) of the resin film forming sheet in a good balance, when the resin film forming sheet of the present invention contains a leveling agent, it is used as the resin One aspect of the film forming sheet is preferably a multi-layer sheet having a layer formed of a composition (α') containing a leveling agent and a layer formed of a composition (β') substantially not containing a leveling agent .

組成物(α’)成為樹脂膜形成用薄片之表面(α)側之層之形成材料,組成物(β’)成為樹脂膜形成用薄片之表面(β)側之層之形成材料。 The composition (α') becomes the forming material of the layer on the surface (α) side of the resin film forming sheet, and the composition ( β ') becomes the forming material of the layer on the surface (β ) side of the resin film forming sheet.

組成物(α’)中之流平劑(F)之含量係從將表面(α)之黏著力(α 1)調整至上述範圍之觀點,相對於組成物(α’)所含有之有效成分之總量(100質量 %),佳為0.010~10質量%,較佳為0.050~7質量%,更佳為0.100~5質量%,最佳為0.150~2質量%。 The content of the leveling agent (F) in the composition (α') is based on the viewpoint of adjusting the adhesive force (α 1) of the surface (α) to the above range, relative to the effective ingredients contained in the composition (α') The total amount (100 mass %), preferably 0.010-10 mass%, more preferably 0.050-7 mass%, more preferably 0.100-5 mass%, most preferably 0.150-2 mass%.

另一方面,組成物(β’)中之流平劑(F)之含量係從將表面(β)之黏著力(β 1)調整至上述範圍之觀點而言,相對於組成物(β’)所含有之有效成分之總量(100質量%),佳為0~0.500質量%,較佳為0~0.100質量%,更佳為0~0.010質量%,最佳為0~0.001質量%。 On the other hand, the content of the leveling agent (F) in the composition (β ') is from the viewpoint of adjusting the adhesive force ( β 1) of the surface (β ) to the above range, relative to the composition ( β ') ) The total amount (100% by mass) of the active ingredients contained is preferably 0~0.500% by mass, more preferably 0~0.100% by mass, more preferably 0~0.010% by mass, and most preferably 0~0.001% by mass.

〔汎用添加劑(G)〕 〔General purpose additives (G)〕

本發明之一態樣所使用樹脂膜形成用薄片中,不損及本發明之效果之範圍內,上述成分以外視需要亦可含有汎用添加劑(G)。 In the resin film forming sheet used in one aspect of the present invention, within the range that does not impair the effects of the present invention, general additives (G) may be contained in addition to the above-mentioned components as necessary.

作為汎用添加劑(G),可列舉例如交聯劑、增塑劑、抗靜電劑、抗氧化劑、離子捕集劑、除氣劑、鏈轉移劑等。 Examples of general-purpose additives (G) include crosslinking agents, plasticizers, antistatic agents, antioxidants, ion trapping agents, degassing agents, chain transfer agents, and the like.

該等中含有交聯劑為佳。 It is preferable that these contain a crosslinking agent.

作為交聯劑可列舉例如異氰酸酯系交聯劑、環氧系交聯劑、氮丙啶系交聯劑、金屬螯合物系交聯劑、胺系交聯劑、胺基樹脂系交聯劑等。該等交聯劑係可單獨或組合2種以上使用。 Examples of the crosslinking agent include isocyanate-based crosslinking agents, epoxy-based crosslinking agents, aziridine-based crosslinking agents, metal chelate-based crosslinking agents, amine-based crosslinking agents, and amine-based resin-based crosslinking agents Wait. These crosslinking agents can be used alone or in combination of two or more kinds.

本發明之一態樣之樹脂膜形成用薄片中之該等汎用添加劑(G)之分別含量係相對於樹脂膜形成用薄片之總量(100質量%),佳為0~10質量%,較佳為 0~5質量%,更佳為0~2質量%。 The respective content of the general additives (G) in the resin film forming sheet of one aspect of the present invention is relative to the total amount of the resin film forming sheet (100% by mass), preferably 0-10% by mass. Jiawei 0 to 5 mass%, more preferably 0 to 2 mass%.

<樹脂膜形成用薄片之製造方法> <Manufacturing Method of Sheet for Forming Resin Film>

作為本發明之一態樣之樹脂膜形成用薄片之製造方法沒有特別限制,可藉由習知之方法製造。 The manufacturing method of the resin film forming sheet|seat which is one aspect of this invention is not specifically limited, It can manufacture by a conventional method.

例如調製成為樹脂膜形成用薄片之形成材料之含上述之各成分之樹脂膜形成用組成物後,適宜地添加有機溶劑進行稀釋,而獲得樹脂膜形成用組成物之溶液。然後,藉由習知之塗佈方法於支撐薄片上塗佈該樹脂膜形成用組成物之溶液形成塗膜,使該塗膜乾燥而可製造樹脂膜形成用薄片。 For example, after preparing a resin film forming composition containing the above-mentioned components as a forming material for a resin film forming sheet, an organic solvent is appropriately added and diluted to obtain a solution of the resin film forming composition. Then, the solution of the composition for forming a resin film is coated on a support sheet by a conventional coating method to form a coating film, and the coating film is dried to produce a sheet for forming a resin film.

另外,本發明之一態樣之樹脂膜形成用薄片係二層以上之覆層體時,作為該樹脂膜形成用薄片之製造方法,可列舉例如於2片以上之支撐薄片上分別塗佈樹脂膜形成用組成物之溶液形成塗膜,並且,貼合該塗膜形成塗膜之積膜後,使乾燥而製造之方法等。 In addition, when the resin film forming sheet of one aspect of the present invention is a two or more layered body, the method for producing the resin film forming sheet includes, for example, applying resin to two or more supporting sheets. A method of forming a coating film from a solution of the composition for film formation, and then laminating the coating film to form a build-up film of the coating film, and then drying it to manufacture it.

作為樹脂膜形成用組成物之溶液之調製所使用之有機溶劑,可列舉例如甲苯、乙酸乙酯、甲基乙基酮等。 Examples of the organic solvent used for the preparation of the solution of the composition for forming a resin film include toluene, ethyl acetate, methyl ethyl ketone, and the like.

已摻合有機溶劑時之樹脂膜形成用組成物之溶液之固體成分濃度係佳為10~80質量%,較佳為20~70質量%,更佳為30~65質量%。 The solid content concentration of the solution of the resin film forming composition when the organic solvent has been blended is preferably 10 to 80% by mass, preferably 20 to 70% by mass, and more preferably 30 to 65% by mass.

作為塗佈方法可列舉例如旋轉塗佈法、噴塗法、棒塗法、刮刀塗佈法、輥塗法、輥刀塗佈法、刮刀塗佈法、模 塗法、凹版塗佈法等。 Examples of coating methods include spin coating, spray coating, bar coating, knife coating, roll coating, roll coating, knife coating, and die coating. Coating method, gravure coating method, etc.

本發明之一態樣之樹脂膜形成用薄片之厚度係視用途可適宜設定,佳為3~300μm,較佳為5~250μm,更佳為7~200μm。 The thickness of the resin film forming sheet of one aspect of the present invention can be appropriately set depending on the application, and is preferably 3 to 300 μm, preferably 5 to 250 μm, and more preferably 7 to 200 μm.

並且,樹脂膜形成用薄片係由2層以上所構成之複層薄片時,該複層薄片之總厚度亦在於上述範圍較佳。 In addition, when the resin film forming sheet is a multi-layer sheet composed of two or more layers, the total thickness of the multi-layer sheet is also preferably within the above-mentioned range.

<樹脂膜形成用薄片之用途> <Use of sheet for forming resin film>

本發明之一態樣之樹脂膜形成用薄片被貼附於倒裝方式之晶片用半導體晶圓或者半導體晶片等之矽晶圓之等之工件之背面,可於工件上形成樹脂膜。此樹脂膜具有作為保護半導體晶圓或者半導體晶片等之工件之背面之保護膜之功能。例如貼附於半導體晶圓時,因樹脂膜具有補強晶圓之機能,故可防止晶圓之損壞等。 The resin film forming sheet of one aspect of the present invention is attached to the back surface of a workpiece such as a flip chip semiconductor wafer or a silicon wafer such as a semiconductor wafer, and a resin film can be formed on the workpiece. This resin film has a function as a protective film for protecting the back surface of a semiconductor wafer or a workpiece such as a semiconductor wafer. For example, when attached to a semiconductor wafer, the resin film has the function of reinforcing the wafer, so it can prevent damage to the wafer.

亦即,本發明之一態樣之樹脂膜形成用薄片係為了於矽晶圓上形成保護膜之保護膜形成用薄片較佳。 That is, the resin film forming sheet of one aspect of the present invention is preferably a protective film forming sheet for forming a protective film on a silicon wafer.

另外,由本發明之一態樣之樹脂膜形成用薄片形成之樹脂膜亦可賦予作為接著薄膜之功能。亦即,使用本發明之一態樣之樹脂膜形成用薄片所形成之樹脂膜具有作為接著薄膜之功能時,具有該樹脂膜之晶片可接著於墊板部或另一半導體晶片等之其他基材上(晶片裝載部上),而為了製造半導體裝置可賦予生產性之提升。 In addition, the resin film formed from the resin film forming sheet of one aspect of the present invention may also be provided with a function as an adhesive film. That is, when the resin film formed using the resin film forming sheet of one aspect of the present invention functions as an adhesive film, a wafer with the resin film can be attached to a backing board or another semiconductor wafer or other substrates. On the material (on the wafer loading part), the productivity can be improved for the manufacture of semiconductor devices.

亦即,為了於矽晶圓上形成接著薄膜本發明之一態樣之樹脂膜形成用薄片亦可設為接著薄膜形成用薄片。 That is, in order to form an adhesive film on a silicon wafer, the resin film forming sheet of one aspect of the present invention can also be used as an adhesive film forming sheet.

〔樹脂膜形成用複合薄片之構成〕 [Composition of composite sheet for resin film formation]

本發明之樹脂膜形成用複合薄片(以下,亦僅稱為「複合薄片」)係具有於支撐薄片上層合有可形成上述之樹脂膜之本發明之樹脂膜形成用薄片之構成。 The composite sheet for forming a resin film of the present invention (hereinafter, also simply referred to as a "composite sheet") has a structure in which the resin film forming sheet of the present invention capable of forming the above-mentioned resin film is laminated on a support sheet.

並且,對於本發明之一態樣之複合薄片之形態沒有特別限制,例如亦可長膠膠帶狀、葉標籤等之形態。 In addition, there is no particular limitation on the form of the composite sheet of one aspect of the present invention. For example, it may be in the form of a long adhesive tape, leaf label, and the like.

圖1係本發明之一態樣之樹脂膜形成用複合薄片之剖面圖。 Fig. 1 is a cross-sectional view of a composite sheet for forming a resin film according to one aspect of the present invention.

作為本發明之一態樣之複合薄片,如圖1(a)所示,可列舉於支撐薄片11上具有直接層合有樹脂膜形成用薄片10之構成之複合薄片1a。 As a composite sheet of one aspect of the present invention, as shown in FIG. 1(a), a composite sheet 1a having a structure in which a resin film forming sheet 10 is directly laminated on a support sheet 11 is exemplified.

作為本發明之一態樣之複合薄片之樹脂膜形成用薄片10之形狀,可具有與被著體之矽晶圓大概相同之形狀或者矽晶圓之形狀之形狀即可。 The shape of the resin film forming sheet 10 of the composite sheet, which is one aspect of the present invention, may have approximately the same shape as the silicon wafer of the object or the shape of the silicon wafer.

並且,雖然圖1(a)之複合薄片1a係支撐薄片11與樹脂膜形成用薄片10大概相同之形狀,但是如圖1(b)所示,亦可樹脂膜形成用薄片10之形狀係較支撐薄片11之形狀更小之複合薄片1b。 In addition, although the composite sheet 1a of FIG. 1(a) has approximately the same shape as the supporting sheet 11 and the resin film forming sheet 10, as shown in FIG. 1(b), the shape of the resin film forming sheet 10 may also be more The supporting sheet 11 is a composite sheet 1b with a smaller shape.

另外,作為本發明之一態樣之複合薄片係如圖1(c)所示,可列舉具有環狀之夾具接著層12之複合薄片1c。 In addition, as one aspect of the composite sheet of the present invention, as shown in FIG.

環狀之夾具接著層12係與環圈框架等治具接著時,使對於該治具之接著力提升之目的而設置,可由具有基材 (芯材)之兩面黏著薄片或者黏著劑形成。 When the ring-shaped jig adhesive layer 12 is attached to a jig such as a ring frame, it is set for the purpose of improving the adhesive force of the jig. It can be provided with a base material (Core material) is formed by adhesive sheets or adhesives on both sides.

並且,圖1(c)所示之複合薄片1c中相對於圖1(a)之複合薄片1a,雖然表示進一步設置有夾具接著層12之構成,但是作為本發明之一態樣之複合薄片,亦可列舉於圖1(b)之複合薄片1b之支撐薄片11之面上設置有夾具接著層12之構成之複合薄片。 In addition, in the composite sheet 1c shown in FIG. 1(c), with respect to the composite sheet 1a of FIG. It can also be enumerated in the composite sheet 1b of FIG. 1(b) where the supporting sheet 11 is provided with a clamp adhesive layer 12 on the surface of the composite sheet.

作為本發明之一態樣之複合薄片如圖1(d)所示,亦可作為樹脂膜形成用薄片10具有被2片之支撐薄片11、11’夾住之構成之複合薄片1d。 As shown in Fig. 1(d), a composite sheet as one aspect of the present invention can also be a composite sheet 1d having a structure sandwiched between two supporting sheets 11, 11' as a resin film forming sheet 10.

並且,亦可與複合薄片1d之構成同樣地於圖1(b)之複合薄片1b之所露出之樹脂膜形成用薄片10之面上設置與支撐薄片11為另一支撐薄片。 In addition, as in the structure of the composite sheet 1d, the exposed resin film forming sheet 10 of the composite sheet 1b of FIG. 1(b) may be provided with the support sheet 11 as another support sheet.

另外,亦可同樣地於圖1(c)所示之複合薄片1c之樹脂膜形成用薄片10之面上及夾具接著層12之面上設置與支撐薄片11為另一支撐薄片。 In addition, the surface of the resin film forming sheet 10 and the surface of the jig adhesive layer 12 of the composite sheet 1c shown in FIG.

<支撐薄片> <Support sheet>

本發明之一態樣之複合薄片具有之支撐薄片分擔防止灰塵等附著於樹脂膜形成用薄片之表面之剝離薄片,或者為了於切割步驟等保護樹脂膜形成用薄片之表面之切割薄片等之任務。 The supporting sheet of the composite sheet of one aspect of the present invention shares the task of a peeling sheet to prevent dust and the like from adhering to the surface of the resin film forming sheet, or a cutting sheet to protect the surface of the resin film forming sheet in the cutting step, etc. .

本發明所使用之支撐薄片係具有樹脂薄膜之構成較佳。 The supporting sheet used in the present invention preferably has a resin film.

作為該樹脂薄膜可列舉例如低密度聚乙烯(LDPE) 薄膜或直鏈低密度聚乙烯(LLDPE)薄膜等聚乙烯薄膜、乙烯‧丙烯共聚物薄膜、聚丙烯薄膜、聚丁烯薄膜、聚丁二烯薄膜、聚甲基戊烯薄膜、聚氯乙烯薄膜、氯乙烯共聚物薄膜、聚乙烯對苯二甲酸乙二酯薄膜、聚乙烯萘二甲酸薄膜、聚丁烯對苯二甲酸乙二酯薄膜、聚胺酯薄膜、乙烯‧乙酸乙烯共聚物薄膜、離聚物樹脂薄膜、乙烯‧(甲基)丙烯酸共聚物薄膜、乙烯‧(甲基)丙烯酸酯共聚物薄膜、聚苯乙烯薄膜、聚碳酸酯薄膜、聚醯亞胺薄膜、氟樹脂薄膜等。 Examples of the resin film include low-density polyethylene (LDPE) Film or polyethylene film such as linear low density polyethylene (LLDPE) film, ethylene-propylene copolymer film, polypropylene film, polybutene film, polybutadiene film, polymethylpentene film, polyvinyl chloride film , Vinyl chloride copolymer film, polyethylene terephthalate film, polyethylene naphthalate film, polybutylene terephthalate film, polyurethane film, ethylene·vinyl acetate copolymer film, ionomer Material resin film, ethylene‧(meth)acrylic acid copolymer film, ethylene‧(meth)acrylate copolymer film, polystyrene film, polycarbonate film, polyimide film, fluororesin film, etc.

作為本發明之一態樣所使用之支撐薄片係可由1種類之樹脂薄膜所構成之單層薄膜,亦可由已層合2種以上之樹脂薄膜所構成之層合薄膜。 The support sheet used as one aspect of the present invention may be a single-layer film composed of one type of resin film, or a laminated film composed of two or more types of resin films laminated.

另外,上述之樹脂薄膜亦可為交聯薄膜。 In addition, the above-mentioned resin film may also be a cross-linked film.

並且,亦可使用將該等樹脂薄膜著色者或施予印刷者等。 In addition, it is also possible to use a coloring resin film, a printing application, and the like.

再者,樹脂薄膜可為藉由將熱可塑性樹脂押出而形成薄片化者,亦可為已延伸者,亦可使用藉由特定手段將硬化性樹脂薄膜化及硬化而薄片化者。 In addition, the resin film may be formed into a thin sheet by extruding a thermoplastic resin, or may be stretched, or may be formed into a thin sheet by thinning and curing the curable resin by a specific method.

該等樹脂薄膜中從耐熱性優異,且因具有適度柔軟性而具有擴展適應性,故亦容易維持拾取適應性之觀點而言,包含聚丙烯薄膜之樹脂薄膜較佳。 Among these resin films, a resin film containing a polypropylene film is preferred from the viewpoint that it has excellent heat resistance and has moderate flexibility and expandability, and therefore it is easy to maintain pick-up suitability.

並且,作為具有包含聚丙烯薄膜之樹脂薄膜之支撐薄片之構成,可僅由聚丙烯薄膜構成之單層構造,亦可由聚丙烯薄膜與其他樹脂薄膜構成之複層構造。 In addition, as the structure of the support sheet having a resin film containing a polypropylene film, a single-layer structure composed of only a polypropylene film may be used, or a multi-layer structure composed of a polypropylene film and other resin films may also be used.

樹脂膜形成用薄片係熱硬化性時,藉由構成支撐薄片之樹脂薄膜具有耐熱性,抑制支撐薄片之介由熱之損害,而可抑制半導體裝置之製造製程所產生之不利。 When the sheet for forming a resin film is thermosetting, the resin film constituting the support sheet has heat resistance, so that the support sheet is prevented from being damaged by heat, and the disadvantages caused by the manufacturing process of the semiconductor device can be suppressed.

將支撐薄片作為用於防止灰塵等附著於樹脂膜形成用薄片之表面之剝離薄片時,作為該支撐薄片,與矽晶圓之貼附時或者切割步驟時由樹脂膜形成用薄片可容易地剝離樹脂薄膜較佳。 When the support sheet is used as a peeling sheet to prevent dust and the like from adhering to the surface of the resin film forming sheet, the support sheet can be easily peeled off from the resin film forming sheet during the attaching to the silicon wafer or the dicing step. A resin film is preferred.

另外,作為該支撐薄片,於上述之樹脂薄膜之表面已施予剝離處理之樹脂薄膜亦可使用。 In addition, as the support sheet, a resin film that has been subjected to a peeling treatment on the surface of the above-mentioned resin film can also be used.

作為該剝離處理之方法,於上述之樹脂薄膜之表面上設置由剝離劑形成之剝離膜之方法較佳。 As a method of the peeling treatment, a method of providing a peeling film formed of a release agent on the surface of the above-mentioned resin film is preferable.

作為該剝離劑,可列舉例如包含選自丙烯系樹脂、醇酸系樹脂、聚矽氧系樹脂、氟系樹脂、不飽和聚酯系樹脂、聚烯烴系樹脂、蠟系樹脂等之樹脂之剝離劑等。 The release agent includes, for example, release of resins selected from acrylic resins, alkyd resins, silicone resins, fluorine resins, unsaturated polyester resins, polyolefin resins, wax resins, etc.剂 etc.

將支撐薄片作為用於為了於切割步驟等保護樹脂膜形成用薄片之表面之切割薄片時,作為該支撐薄片,於上述之樹脂薄膜上具有由黏著劑形成之黏著劑層之黏著薄片較佳。 When the support sheet is used as a dicing sheet for protecting the surface of the resin film forming sheet in the cutting step, etc., the support sheet is preferably an adhesive sheet having an adhesive layer formed of an adhesive on the above-mentioned resin film.

作為包含於該黏著劑之黏著性樹脂,著眼於黏著性樹脂之構造時,可列舉例如丙烯系樹脂、聚胺酯系樹脂、橡膠系樹脂、聚矽氧烷系樹脂、乙烯基醚系樹脂等,著眼於功能時,可列舉例如能量射線硬化型樹脂等。 As the adhesive resin contained in the adhesive, when focusing on the structure of the adhesive resin, for example, acrylic resins, polyurethane resins, rubber resins, polysiloxane resins, vinyl ether resins, etc. can be cited. In the case of function, for example, an energy ray curable resin etc. can be mentioned.

本發明之一態樣中,從良好地設定拾取性之觀點而言,含有能量射線硬化型樹脂之黏著劑較佳。 In one aspect of the present invention, from the viewpoint of setting a good pick-up property, an adhesive containing an energy ray-curable resin is preferable.

並且,將由含有能量射線硬化型樹脂之黏著劑所形成之黏著劑層設置於樹脂薄膜上時,該黏著劑層亦可照射能量射線而硬化之黏著劑層、亦可照射能量射線前之未硬化之黏著劑層。並且,使用具有能量射線照射前之未硬化之黏著劑層之支撐薄片時,亦可拾取步驟前照射能量射線使該黏著劑層硬化。 In addition, when an adhesive layer formed of an adhesive containing energy ray-curable resin is placed on the resin film, the adhesive layer can also be an adhesive layer that is cured by irradiation with energy rays, or it can be uncured before being irradiated with energy rays. The adhesive layer. In addition, when using a support sheet with an uncured adhesive layer before the energy ray irradiation, it is also possible to irradiate the energy ray before the pickup step to harden the adhesive layer.

作為支撐薄片之厚度,雖然視用途可適宜地選擇,但是佳為10~500μm,較佳為20~350μm,更佳為30~200μm。 As the thickness of the support sheet, although it can be appropriately selected depending on the application, it is preferably 10 to 500 μm, preferably 20 to 350 μm, and more preferably 30 to 200 μm.

並且,上述之支撐薄片之厚度係不僅構成支撐薄片之樹脂薄膜之厚度,具有黏著劑層或剝離膜之情形時亦包含該黏著劑層或剝離膜之厚度。 In addition, the thickness of the above-mentioned support sheet is not only the thickness of the resin film constituting the support sheet, but also includes the thickness of the adhesive layer or the release film when there is an adhesive layer or a release film.

<夾具接著層> <Fixture Adhesive Layer>

夾具接著層係可由具有基材(芯材)之兩面黏著薄片或者含有黏著劑之黏著劑組成物形成。 The jig adhesive layer can be formed of a double-sided adhesive sheet with a base material (core material) or an adhesive composition containing an adhesive.

作為該基材(芯材)可列舉作為上述之支撐薄片可使用之樹脂薄膜、聚丙烯薄膜較佳。 As the base material (core material), a resin film or a polypropylene film that can be used as the above-mentioned support sheet is preferable.

另外,作為上述黏著劑可列舉例如丙烯系樹脂、聚胺酯系樹脂、橡膠系樹脂、聚矽氧烷系樹脂、乙烯基醚系樹脂等。 In addition, examples of the above-mentioned adhesive include acrylic resins, polyurethane resins, rubber resins, polysiloxane resins, vinyl ether resins, and the like.

夾具接著層之厚度係佳為1~80μm,較佳為5~60μm,更佳為10~40μm。 The thickness of the clamp adhesive layer is preferably 1 to 80 μm, preferably 5 to 60 μm, and more preferably 10 to 40 μm.

〔矽晶圓之再生方法〕 〔Method of regenerating silicon wafer〕

本發明係亦提供由於矽晶圓上直接貼附有本發明之樹脂膜形成用薄片之表面(α)之層合體再加工該樹脂膜形成用薄片而再生矽晶圓之方法。 The present invention also provides a method for regenerating the silicon wafer by directly attaching the laminated body of the surface (α) of the resin film forming sheet of the present invention to the silicon wafer and processing the resin film forming sheet.

本發明之矽晶圓之再生方法係具有下述之步驟(1)~(2)。 The silicon wafer regeneration method of the present invention has the following steps (1) to (2).

步驟(1):於前述層合體之前述樹脂膜形成用薄片之表面(β)上貼附基材及黏著劑層所具有黏著薄片之該黏著劑層之步驟, Step (1): a step of attaching the substrate and the adhesive layer of the adhesive sheet of the adhesive layer on the surface (β) of the resin film forming sheet of the laminate,

步驟(2):拉伸步驟(1)中於前述樹脂膜形成用薄片之表面(β)上貼附有前述黏著薄片,而再加工前述矽晶圓上所貼附之前述樹脂膜形成用薄片之步驟。 Step (2): In the stretching step (1), the adhesive sheet is attached to the surface (β ) of the resin film forming sheet, and the resin film forming sheet attached to the silicon wafer is processed again的步。 The steps.

本發明之矽晶圓之再生方法係於矽晶圓上貼附本發明之樹脂膜形成用薄片後產生需要再加工之情形時,不損壞矽晶圓,且邊抑制貼附有之樹脂膜形成用薄片之一部分附著於矽晶圓上而殘存邊可再加工,利用本發明之樹脂膜形成用薄片之性質。 The method for regenerating the silicon wafer of the present invention is to attach the resin film forming sheet of the present invention to the silicon wafer, and when there is a need for reprocessing, the silicon wafer is not damaged and the formation of the attached resin film is suppressed A part of the sheet is attached to the silicon wafer and the remaining side can be reprocessed, using the properties of the sheet for forming a resin film of the present invention.

並且,本發明之一態樣之矽晶圓之再生方法係不僅適用於矽晶圓上緊接於直接貼附有本發明之樹脂膜形成用薄片之表面(α)之層合體,亦可適用於對於貼附起經過24小時左右而已提升矽晶圓與樹脂膜形成用薄片之密著性之狀態之層合體。 In addition, the method for regenerating a silicon wafer according to one aspect of the present invention is not only applicable to the laminated body on the silicon wafer immediately adjacent to the surface (α) on which the resin film forming sheet of the present invention is directly attached, but also applicable It is a laminate in a state where the adhesion between the silicon wafer and the resin film forming sheet has been improved after about 24 hours from the attachment.

以下,針對本發明之矽晶圓之再生方法之步驟(1)及步驟(2)進行說明。 Hereinafter, the steps (1) and (2) of the silicon wafer regeneration method of the present invention will be described.

<步驟(1)> <Step (1)>

步驟(1)係於前述層合體之前述樹脂膜形成用薄片之表面(β)上貼附具有基材及黏著劑層之黏著薄片之該黏著劑層之步驟。 Step (1) is a step of attaching the adhesive layer of the adhesive sheet having the substrate and the adhesive layer on the surface (β) of the resin film forming sheet of the laminate.

作為本步驟所使用之黏著薄片,具有基材及黏著劑層。 As the adhesive sheet used in this step, it has a substrate and an adhesive layer.

作為該基材樹脂薄膜較佳,可列舉於上述之支撐薄片之項目所例示之樹脂薄膜。 The base resin film is preferable, and the resin film exemplified in the item of the support sheet mentioned above can be cited.

作為該黏著劑層要件(III)所特定之具有源自丁基丙烯酸酯及丙烯酸之結構單元,且含有由質量平均分子量係60萬~100萬之丙烯系樹脂100質量份與交聯劑0.01~10質量份之黏著劑所形成之厚度10~50μm之黏著劑層較佳。 As the adhesive layer requirement (III), it has structural units derived from butyl acrylate and acrylic acid, and contains 100 parts by mass of propylene resin with a mass average molecular weight of 600,000 to 1,000,000 and a crosslinking agent of 0.01~ An adhesive layer with a thickness of 10-50 μm formed by 10 parts by mass of the adhesive is preferable.

惟,本發明之一態樣中除了上述之黏著劑以外,若表面(β)之黏著力(β 1)可形成在於上述之範圍之黏著劑層之黏著劑,則可使用。 However, in one aspect of the present invention, in addition to the above-mentioned adhesive, if the adhesive force ( β 1) of the surface (β ) can be formed into an adhesive of the adhesive layer within the above-mentioned range, it can be used.

作為該黏著薄片之形狀,雖然沒有特別限定,但是從下列步驟(2)之操作性之觀點而言,與樹脂膜形成用薄片相同形狀,或者較樹脂膜形成用薄片更大形狀之黏著薄片較佳。 Although the shape of the adhesive sheet is not particularly limited, from the viewpoint of the operability of the following step (2), it is the same shape as the resin film forming sheet, or an adhesive sheet having a larger shape than the resin film forming sheet good.

作為本步驟之表面(β)與黏著薄片之黏著劑層之貼附方法,可使用機械貼附,亦可以人工操作貼附。 As the method of attaching the surface ( β ) to the adhesive layer of the adhesive sheet in this step, either mechanical attachment or manual attachment can be used.

並且,於矽晶圓貼附上述之本發明之一態樣之複合薄片所具有之樹脂膜形成用薄片之表面(α),且於表面(β)側已層合作為切割薄片支撐薄片時,亦可利用該切割薄片作為本步驟之黏著薄片。 In addition, when the surface (α) of the resin film forming sheet of the composite sheet of one aspect of the present invention is attached to the silicon wafer, and the surface ( β ) side has been laminated to form a dicing sheet support sheet, The cut sheet can also be used as the adhesive sheet in this step.

<步驟(2)> <Step (2)>

步驟(2)係拉伸步驟(1)中於前述樹脂膜形成用薄片之表面(β)上貼附有前述黏著薄片,而再加工前述矽晶圓上所貼附之前述樹脂膜形成用薄片之步驟。 In step (2), in the stretching step (1), the adhesive sheet is attached to the surface (β ) of the resin film forming sheet, and the resin film forming sheet attached to the silicon wafer is processed.的步。 The steps.

本步驟中係使用本發明之樹脂膜形成用薄片,因該樹脂膜形成用薄片之黏著力(α 1)及(β 1)在於上述之範圍,故藉由拉伸步驟(1)中於表面(β)貼附有黏著薄片,樹脂膜形成用薄片亦一起被沿拖,由矽晶圓可再加工前述樹脂膜形成用薄片。 In this step, the resin film forming sheet of the present invention is used. Since the adhesive force (α 1) and ( β 1) of the resin film forming sheet are within the above range, the stretching step (1) is applied to the surface ( β ) Adhesive sheets are attached, and the resin film forming sheets are also dragged along. The aforementioned resin film forming sheets can be reprocessed from the silicon wafer.

沒有特別限制作為拉伸黏著薄片時之速度及角度,可適宜設定。 There is no particular limitation as to the speed and angle when the adhesive sheet is stretched, and can be set appropriately.

另外,雖然本步驟中亦可使用機械拉伸黏著薄片,但是從操作性之觀點而言,以人工操作拉伸黏著薄片,並且,由矽晶圓再加工前述樹脂膜形成用薄片較佳。 In addition, although the mechanically stretched adhesive sheet can also be used in this step, from the viewpoint of operability, it is preferable to manually stretch the adhesive sheet, and to reprocess the aforementioned resin film forming sheet from a silicon wafer.

並且,本步驟中去除樹脂膜形成用薄片後視需要亦可以乙醇等之有機溶劑洗淨矽晶圓之表面。 In addition, after removing the resin film forming sheet in this step, if necessary, the surface of the silicon wafer can be cleaned with an organic solvent such as ethanol.

經由上述之步驟,可再生一旦貼附有樹脂膜形成用薄片之矽晶圓。 Through the above steps, it is possible to regenerate the silicon wafer once attached with the resin film forming sheet.

〔實施例〕 [Example]

製造例1~8所使用之各成分之質量平均分子量(Mw)或者數平均分子量(Mn)之測定法係如下所述。 The method for measuring the mass average molecular weight (Mw) or number average molecular weight (Mn) of each component used in Production Examples 1 to 8 is as follows.

<質量平均分子量(Mw)、數平均分子量(Mn)> <Mass average molecular weight (Mw), number average molecular weight (Mn)>

下述條件下藉由凝膠滲透色譜裝置(東曹股份有限公司製造,商品名「HLC-8220GPC」)進行測定,而使用標準聚苯乙烯換算之測定值。 The measurement was performed with a gel permeation chromatography device (manufactured by Tosoh Co., Ltd., trade name "HLC-8220GPC") under the following conditions, and the measured value in terms of standard polystyrene was used.

(測定條件) (Measurement conditions)

管柱:「TSK guard column HXL-H」「TSK gel GMHXL(×2)」「TSK gel G2000HXL」(任一者均東曹股份有限公司製造) Column: "TSK guard column HXL-H", "TSK gel GMHXL(×2)", "TSK gel G2000HXL" (manufactured by Tosoh Corporation)

管柱溫度:40℃ Column temperature: 40℃

展開溶劑:四氫呋喃 Developing solvent: tetrahydrofuran

流速:1.0mL/min Flow rate: 1.0mL/min

製造例1~8 Manufacturing examples 1~8

(樹脂膜形成用組成物之溶液之調製) (Preparation of solution of composition for resin film formation)

摻合表1所示種類及摻合量之各成分而分別調製樹脂膜形成用組成物(1)~(8)(表1中「簡稱為組成物(1)~(8)」)後,進一步以甲基乙基酮稀釋,調製固體成分濃度61質量%之組成物之溶液。 After blending each component of the type and blending amount shown in Table 1 to prepare resin film forming compositions (1) to (8) (referred to as "compositions (1) to (8)" in Table 1), It was further diluted with methyl ethyl ketone to prepare a solution of a composition having a solid content concentration of 61% by mass.

並且,表1中之各成分之摻合量係相對於各組成物之總量(成分(A)~(G)之合計摻合量)100質量%之比例(單位:質量%(有效成分比))。另外,記載於表1之各成分之細節係如下所述。 In addition, the blending amount of each component in Table 1 is relative to the total amount of each composition (the total blending amount of components (A) ~ (G)) 100% by mass (unit: mass% (effective component ratio) )). In addition, the details of each component described in Table 1 are as follows.

<聚合物成分(A)> <Polymer component (A)>

(A-1):甲基丙烯酸酯(MA)與2-羥乙基丙烯酸酯(HEA)共聚所獲得之丙烯共聚物(構成比率:MA/HEA=95/5(質量%),Mw=80萬)。 (A-1): Propylene copolymer obtained by copolymerizing methacrylate (MA) and 2-hydroxyethyl acrylate (HEA) (composition ratio: MA/HEA=95/5 (mass%), Mw=80 ten thousand).

(A-2):n-丁基丙烯酸酯(BA)、乙基丙烯酸酯(EA)、丙烯腈(AN)與縮水甘油基丙烯酸甲酯(GMA)共聚所獲得之丙烯共聚物(構成比率:BA/EA/AN/GMA=39/29/29/3(質量%),Mw=80萬)。 (A-2): Propylene copolymer obtained by copolymerization of n-butyl acrylate (BA), ethacrylate (EA), acrylonitrile (AN) and glycidyl methyl acrylate (GMA) (composition ratio: BA/EA/AN/GMA=39/29/29/3 (mass%), Mw=800,000).

(A-3):n-丁基丙烯酸酯(BA)、甲基丙烯酸酯(MA)、縮水甘油基丙烯酸甲酯(GMA)與2-羥乙基丙烯酸酯(HEA)共聚所獲得之丙烯共聚物(構成比率:BA/MA/GMA/HEA=55/10/20/15(質量%),Mw=80萬)。 (A-3): Propylene copolymer obtained by copolymerization of n-butyl acrylate (BA), methacrylate (MA), glycidyl methyl acrylate (GMA) and 2-hydroxyethyl acrylate (HEA) Material (composition ratio: BA/MA/GMA/HEA=55/10/20/15 (mass%), Mw=800,000).

(A-4):n-丁基丙烯酸酯(BA)、乙基丙烯酸酯(EA)與縮水甘油基丙烯酸甲酯(GMA)共聚所獲得之丙烯共聚物(構成比率:BA/EA/GMA=53/44/3(質量%),Mw=80萬)。 (A-4): Propylene copolymer obtained by copolymerizing n-butyl acrylate (BA), ethacrylate (EA) and glycidyl methyl acrylate (GMA) (composition ratio: BA/EA/GMA= 53/44/3 (mass%), Mw=800,000).

<硬化性成分(B)> <Sclerosing component (B)>

(B-1):加成丙烯醯基之甲酚酚醛清漆型環氧樹脂(日本化藥股份有限公司製造,商品名「CNA-147」,相當於前述成分(B11)之環氧化合物)。 (B-1): Cresol novolac type epoxy resin with addition of acryl group (manufactured by Nippon Kayaku Co., Ltd., trade name "CNA-147", equivalent to the epoxy compound of the aforementioned component (B11)).

(B-2):聯苯基芳烷型環氧樹脂(日本化藥股份有限公司製造,商品名「NC-3000H」,相當於前述成分(B11)之環氧化合物)。 (B-2): Biphenylarane type epoxy resin (manufactured by Nippon Kayaku Co., Ltd., trade name "NC-3000H", equivalent to the epoxy compound of the aforementioned component (B11)).

(B-3):雙酚A型環氧樹脂(三菱化學股份有限公司製造,商品名「jER828」,相當於前述成分(B11)之環氧化合物)。 (B-3): Bisphenol A epoxy resin (manufactured by Mitsubishi Chemical Corporation, trade name "jER828", equivalent to the epoxy compound of the aforementioned component (B11)).

(B-4):雙酚A型環氧樹脂(三菱化學股份有限公司製造,商品名「jER1055」,相當於前述成分(B11)之環氧化合物)。 (B-4): Bisphenol A epoxy resin (manufactured by Mitsubishi Chemical Corporation, trade name "jER1055", which corresponds to the epoxy compound of the aforementioned component (B11)).

(B-5):二環戊二烯型環氧樹脂(DIC股份有限公司製造,商品名「EPICLON HP-7200HH」,相當於前述成分(B11)之環氧化合物)。 (B-5): Dicyclopentadiene epoxy resin (manufactured by DIC Co., Ltd., trade name "EPICLON HP-7200HH", equivalent to the epoxy compound of the aforementioned component (B11)).

(B-6):伸聯苯芳烷型苯酚樹脂(明和化成股份有限公司製造,商品名「MEH-7851-H」,相當於前述成分(B12)之熱硬化劑)。 (B-6): Biphenylarane-type phenol resin (manufactured by Minghe Chemical Co., Ltd., trade name "MEH-7851-H", equivalent to the thermosetting agent of the aforementioned component (B12)).

(B-7):二氰基二醯胺(ADEKA股份有限公司製造,商品名「ADEKA HARDENER3636AS」,相當於前述成分(B12)之熱硬化劑)。 (B-7): Dicyanodiamide (manufactured by ADEKA Co., Ltd., trade name "ADEKA HARDENER 3636AS", equivalent to the thermosetting agent of the aforementioned component (B12)).

(B-8):咪唑系硬化促進劑(四國化成工業股份有限公司製造,商品名「Curezol 2PHZ」,相當於前述成分(B13)之硬化促進劑)。 (B-8): Imidazole-based hardening accelerator (manufactured by Shikoku Chemical Industry Co., Ltd., trade name "Curezol 2PHZ", equivalent to the hardening accelerator of the aforementioned component (B13)).

<無機填料(C)> <Inorganic Filler (C)>

(C-1):矽石填料(平均粒徑=50nm)。 (C-1): Silica filler (average particle size=50nm).

(C-2):矽石填料(平均粒徑=500nm)。 (C-2): Silica filler (average particle size=500nm).

<著色劑(D)> <Colorant (D)>

(D-1):碳黑(平均粒徑=28nm)。 (D-1): Carbon black (average particle size=28nm).

<矽烷偶合劑(E)> <Silane Coupling Agent (E)>

(E-1):矽烷偶合劑(信越化學工業股份有限公司製造,商品名「KBM-403」)。 (E-1): Silane coupling agent (manufactured by Shin-Etsu Chemical Co., Ltd., trade name "KBM-403").

<流平劑(F)> <Leveling agent (F)>

(F-1):聚矽氧系流平劑(摩曼帝夫特性材料日本公司製造,商品名「XF 42-334」)。 (F-1): Polysiloxane-based leveling agent (manufactured by Momentif Properties Japan Co., Ltd., trade name "XF 42-334").

<汎用添加劑(G)> <General additives (G)>

(G-1):異氰酸酯系交聯劑(TOYOCHEM股份有限公司製造,商品名「BHS 8515」)。 (G-1): Isocyanate-based crosslinking agent (manufactured by TOYOCHEM Co., Ltd., trade name "BHS 8515").

Figure 109110851-A0101-12-0052-1
Figure 109110851-A0101-12-0052-1

實施例1 Example 1

於由已施予剝離處理之樹脂薄膜所構成之第1之支撐薄片(琳得科公司製造,商品名「SP-PET 3811」、厚度:38μm)之剝離處理面上塗佈製造例2所調製之樹脂膜形成用組成物(2)之溶液,使乾燥而形成塗膜(α’)。 The first support sheet (manufactured by Lintec Co., Ltd., trade name "SP-PET 3811", thickness: 38μm) of the first support sheet composed of a resin film that has been peeled off is coated on the peeling surface prepared by manufacturing example 2 The solution of the composition (2) for forming a resin film is dried to form a coating film (α').

然後,於與第1之支撐薄片相同之第2之支撐薄片之 剝離處理面上塗佈製造例1所調製之樹脂膜形成用組成物(1)之溶液,使乾燥形成塗膜(β’)。 Then, the solution of the resin film formation composition (1) prepared in Manufacturing Example 1 was applied to the release treatment surface of the second support sheet which was the same as the first support sheet, and dried to form a coating film ( β ') .

之後,貼合此2片之支撐薄片上所形成之塗膜(α’)與(β’),於120℃進行乾燥處理2分鐘,形成2層之合計之厚度係25μm之樹脂膜形成用薄片,製作由第1之支撐薄片/樹脂膜形成用薄片/第2之支撐薄片所構成之樹脂膜形成用複合薄片。 After that, the coating films (α') and ( β ') formed on the two support sheets were bonded together, and dried at 120°C for 2 minutes to form a resin film forming sheet with a total thickness of 25μm. To prepare a composite sheet for forming a resin film composed of the first supporting sheet/resin film forming sheet/the second supporting sheet.

另外,該複合薄片中第1之支撐薄片去除時所露出之該樹脂膜形成用薄片之表面係與矽晶圓貼附側之「表面(α)」,去除第2之支撐薄片時所露出之該樹脂膜形成用薄片之表面係「表面(β)」。 In addition, in the composite sheet, the surface of the resin film forming sheet exposed when the first support sheet is removed is the "surface (α)" on the silicon wafer attaching side, and the second support sheet is exposed when the second support sheet is removed. The surface of the resin film forming sheet is "surface ( β )".

實施例2 Example 2

實施例1中取代「製造例2所調製之樹脂膜形成用組成物(2)之溶液」,使用「製造例3所調製之樹脂膜形成用組成物(3)之溶液」以外,同樣地製作樹脂膜形成用複合薄片。 In Example 1, instead of "the solution of the resin film formation composition (2) prepared in the production example 2", the same was made except that the "solution of the resin film formation composition (3) prepared in the production example 3" was used. Composite sheet for resin film formation.

實施例3 Example 3

實施例1中取代「製造例2所調製之樹脂膜形成用組成物(2)之溶液」,使用「製造例4所調製之樹脂膜形成用組成物(4)之溶液」以外,同樣地製作樹脂膜形成用複合薄片。 In Example 1, instead of "the solution of the resin film formation composition (2) prepared in the production example 2", the same was made except that the "solution of the resin film formation composition (4) prepared in the production example 4" was used. Composite sheet for resin film formation.

實施例4 Example 4

實施例1中取代「製造例2所調製之樹脂膜形成用組成物(2)之溶液」,除了使用「製造例5所調製之樹脂膜形成用組成物(5)之溶液」以外,同樣地製作樹脂膜形成用複合薄片。 In Example 1, the "solution of the resin film forming composition (2) prepared in Production Example 2" was replaced in the same manner, except that the "solution of the resin film forming composition (5) prepared in Production Example 5" was used. A composite sheet for forming a resin film was produced.

實施例5 Example 5

於由已施予剝離處理之樹脂薄膜所構成之第1之支撐薄片(琳得科公司製造,商品名「SP-PET3811」,厚度:38μm)之剝離處理面上塗佈製造例6所調製之樹脂膜形成用組成物(6)之溶液形成塗膜後,於120℃進行乾燥處理2分鐘,而形成厚度25μm之樹脂膜形成用薄片。 The first support sheet (manufactured by Lindeco, trade name "SP-PET3811", thickness: 38μm) composed of a resin film that has been peeled off is coated on the peeling surface prepared by manufacturing example 6 After the solution of the resin film forming composition (6) forms a coating film, it is dried at 120°C for 2 minutes to form a resin film forming sheet having a thickness of 25 μm.

然後,貼合所形成之樹脂膜形成用薄片之表面和與第1之支撐薄片相同者之第2之支撐薄片之剝離處理面,製作由第1之支撐薄片/樹脂膜形成用薄片/第2之支撐薄片所構成之樹脂膜形成用複合薄片。 Then, the surface of the formed resin film forming sheet and the peeling treatment surface of the second support sheet, which is the same as the first support sheet, are bonded to produce a first support sheet/resin film forming sheet/second A composite sheet for forming a resin film composed of the support sheet.

比較例1 Comparative example 1

實施例5中取代「製造例6所調製之樹脂膜形成用組成物(6)之溶液」,除了使用「製造例3所調製之樹脂膜形成用組成物(3)之溶液」以外,同樣地製作樹脂膜形成用複合薄片。 In Example 5, in place of the "solution of the resin film formation composition (6) prepared in Production Example 6", the same was used except that the "solution of the resin film formation composition (3) prepared in Production Example 3" was used A composite sheet for forming a resin film was produced.

比較例2 Comparative example 2

實施例5中取代「製造例6所調製之樹脂膜形成用組成物(6)之溶液」,除了使用「製造例7所調製之樹脂膜形成用組成物(7)之溶液」以外,同樣地製作樹脂膜形成用複合薄片。 In Example 5, in place of the "solution of the resin film forming composition (6) prepared in Production Example 6", the same was used except that the "solution of the resin film forming composition (7) prepared in Production Example 7" was used. A composite sheet for forming a resin film was produced.

比較例3 Comparative example 3

實施例5中取代「製造例6所調製之樹脂膜形成用組成物(6)之溶液」,除了使用「製造例8所調製之樹脂膜形成用組成物(8)之溶液」以外,同樣地製作樹脂膜形成用複合薄片。 In Example 5, in place of the "solution of the resin film formation composition (6) prepared in Production Example 6", the same was used except that the "solution of the resin film formation composition (8) prepared in Production Example 8" was used. A composite sheet for forming a resin film was produced.

使用實施例及比較例所製作之複合薄片,如下述進行以下之物性值之測定及評價。表2表示該等結果。 Using the composite sheets produced in the examples and comparative examples, the following physical property values were measured and evaluated as follows. Table 2 shows these results.

<要件(I):樹脂膜形成用薄片之表面(α)之表面粗糙度(Ra)之測定> <Requirement (I): Measurement of the surface roughness (Ra) of the surface (α) of the resin film forming sheet>

去除實施例及比較例所製作之複合薄片具有之第1之支撐薄片,相對於所露出之樹脂膜形成用薄片之表面(α),使用接觸式表面粗糙度計(三豐股份有限公司製造,商品名「SURFTEST SV-3000」),將截止值λ c設為0.8mm,將評價長度Ln設為4mm,依JIS B0601:2001測定。 The first supporting sheet of the composite sheets produced in the examples and comparative examples was removed, and a contact surface roughness meter (manufactured by Mitutoyo Co., Ltd., The product name is "SURFTEST SV-3000"), the cut-off value λ c is set to 0.8 mm, and the evaluation length Ln is set to 4 mm, and it is measured in accordance with JIS B0601:2001.

<要件(II):對於矽晶圓之樹脂膜形成用薄片之表面 (α)之黏著力之測定> <Requirement (II): For the surface of the resin film forming sheet of the silicon wafer (α) Measurement of adhesion>

去除實施例及比較例所製作之複合薄片具有之第1之支撐薄片,使用膠帶貼片機(琳得科(股)製造,商品名「Adwill RAD-3600 F/12」),於70℃邊加熱邊貼附所露出之樹脂膜形成用薄片之表面(α)與經# 2000研磨之矽晶圓(直徑:200mm、厚度:600μm)之研磨面。 Remove the first support sheet of the composite sheet produced in the Examples and Comparative Examples, and use a tape placement machine (manufactured by Lindeco Co., Ltd., trade name "Adwill RAD-3600 F/12") at 70°C Attach the exposed surface (α) of the resin film forming sheet and the polished surface of the #2000 polished silicon wafer (diameter: 200mm, thickness: 600μm) while heating.

然後,去除複合薄片之第2之支撐薄片,使用2kg輥於70℃加熱之加熱板上貼附所露出之樹脂膜形成用薄片之表面(β)與作為裱褙膠帶所使用之市售之黏著薄片(琳得科(股)製造,商品名「PET 50(A)PAT1」,寬度:25mm)之黏著劑層後,23℃、50%RH(相對濕度)之環境下靜置24小時。 Then, remove the second support sheet of the composite sheet, and use a 2kg roller to paste the exposed surface ( β ) of the resin film forming sheet on a hot plate heated at 70°C and a commercially available adhesive sheet used as a laminating tape (Lintec Co., Ltd., trade name "PET 50 (A) PAT1", width: 25mm) after the adhesive layer, and then stand for 24 hours at 23°C and 50%RH (relative humidity).

靜置後,使用萬能試驗機((股)島津製作所製造,商品名「Autograph AG-IS」)以剝離角度180°、剝離速度0.3m/min之條件進行拉伸試驗,測定由矽晶圓之表面剝離保護膜形成用薄片與裱褙膠帶時之負載。將此負載之值設為矽晶圓之對於樹脂膜形成用薄片之表面(α)之黏著力。 After standing still, a universal testing machine (manufactured by Shimadzu Corporation, trade name "Autograph AG-IS") was used to conduct a tensile test under the conditions of a peeling angle of 180° and a peeling speed of 0.3m/min. The load when the protective film forming sheet and the mounting tape are peeled off the surface. The value of this load is set as the adhesive force of the silicon wafer to the surface (α) of the resin film forming sheet.

並且,進行作為裱褙膠帶所使用之上述之市售之黏著薄片之拉伸試驗時,於保護膜形成用薄片和該黏著薄片之黏著劑層之界面未進行剝離,具有於該保護膜形成用薄片和矽晶圓之界面可安定地剝離程度之黏著力。 In addition, when the tensile test of the above-mentioned commercially available adhesive sheet used as the laminating tape was performed, the protective film formation sheet and the adhesive layer of the adhesive sheet did not peel off at the interface, and there was no peeling on the protective film formation sheet The adhesive strength of the interface with the silicon wafer can be stably peeled off.

<要件(III):對於黏著薄片之黏著劑層樹脂膜形成用薄 片之表面(β)之黏著力之測定> <Requirement (III): Measurement of the adhesive force on the surface (β ) of the sheet for forming the adhesive layer resin film of the adhesive sheet>

於室溫(25℃)使用橡膠輥矽晶圓上貼附樹脂膜形成用薄片之固定用之兩面黏著膠帶(琳得科(股)製,商品名「TL-4100S-50」)。並且,選擇該兩面黏著膠帶於拉伸試驗時可充分地固定保護膜形成用薄片者。 Use a rubber roller at room temperature (25°C) to attach a double-sided adhesive tape for fixing the resin film forming sheet on the silicon wafer (Lintec Co., Ltd., trade name "TL-4100S-50"). In addition, the double-sided adhesive tape was selected to be able to sufficiently fix the protective film forming sheet during the tensile test.

然後,去除此兩面黏著膠帶之接著面與於實施例及比較例所製作之複合薄片具有之第1之支撐薄片,使用膠帶貼片機(琳得科(股)製,商品名「Adwill RAD-3600 F/12」)於室溫貼附所露出之樹脂膜形成用薄片之表面(α)。 Then, the adhesive surface of the double-sided adhesive tape and the first supporting sheet of the composite sheet produced in the Examples and Comparative Examples were removed, and a tape placement machine (manufactured by Lindke (Stock), trade name "Adwill RAD-") was used. 3600 F/12”) Attach the exposed surface (α) of the resin film forming sheet at room temperature.

之後,去除複合薄片具有之第2之支撐薄片,使用2kg輥於23℃貼附所露出之樹脂膜形成用薄片之表面(β)與後述之黏著薄片之黏著劑層,並且,23℃、50%RH(相對濕度)之環境下靜置20分鐘。 After that, the second support sheet of the composite sheet was removed, and the exposed surface ( β ) of the resin film forming sheet and the adhesive layer of the later-mentioned adhesive sheet were pasted at 23°C using a 2kg roller, and 23°C, 50°C Let stand for 20 minutes in an environment of %RH (relative humidity).

靜置後,使用萬能試驗機((股)島津製作所製造,商品名「Autograph AG-IS」),以剝離角度180°、剝離速度0.3m/min之條件進行拉伸試驗,測定由保護膜形成用薄片之表面(β)剝離黏著薄片時之負載。將此負載之值設為黏著薄片之對於黏著劑層之樹脂膜形成用薄片之表面(β)之黏著力。 After standing, a universal testing machine (manufactured by Shimadzu Corporation, trade name "Autograph AG-IS") was used to perform a tensile test under the conditions of a peeling angle of 180° and a peeling speed of 0.3m/min to measure the formation of the protective film The load when peeling the adhesive sheet with the surface ( β) of the sheet. The value of this load is set as the adhesive force of the adhesive sheet to the surface (β ) of the resin film forming sheet of the adhesive layer.

(貼附於表面(β)之黏著薄片之細節) (Details of the adhesive sheet attached to the surface ( β ))

使用於由已施予電暈處理之乙烯-甲基丙烯酸甲酯共聚物(構成比率:乙烯/甲基丙烯酸甲酯=90/10(質量 比))所構成之樹脂薄膜之電暈處理面上具有由下述黏著劑組成物所形成之厚度20μm之黏著劑層之黏著薄片。 Used for corona-treated ethylene-methyl methacrylate copolymer (composition ratio: ethylene/methyl methacrylate=90/10 (mass Compared with)), the corona-treated surface of the resin film composed of the resin film has an adhesive sheet with a 20μm thick adhesive layer formed of the following adhesive composition.

黏著劑組成物:相對於共聚丁基丙烯酸酯(BA)及丙烯酸(AA)所獲得之丙烯共聚物(BA/AA=90/10(質量比)、Mw=70萬)100質量份,摻合甲苯二異氰酸酯系交聯劑(商品名「Coronate L」,NIPPON POLYURETHANE INDUSTRY公司製造)5質量份者。 Adhesive composition: 100 parts by mass of propylene copolymer (BA/AA=90/10 (mass ratio), Mw=700,000) obtained by copolybutyl acrylate (BA) and acrylic acid (AA), blended 5 parts by mass of toluene diisocyanate-based crosslinking agent (trade name "Coronate L", manufactured by NIPPON POLYURETHANE INDUSTRY).

<樹脂膜形成用薄片之23℃之儲藏彈性模數之測定> <Measurement of storage elastic modulus of sheet for resin film formation at 23°C>

複數層合已去除於實施例及比較例所製作之複合薄片具有之2片之支撐薄片而所構成之樹脂膜形成用薄片後,製作厚度0.18mm、寬度4.5mm、長度20.0mm之試驗樣品。 After multiple lamination of the resin film forming sheet constituted by removing the two supporting sheets of the composite sheets produced in the Examples and Comparative Examples, a test sample with a thickness of 0.18 mm, a width of 4.5 mm, and a length of 20.0 mm was produced.

針對該試驗樣品,使用動態黏彈性測定裝置(TA instruments公司製造,商品名「DMA Q800」),以拉伸模式於頻率11Hz、23℃、大氣環境下測定樹脂膜形成用薄片之23℃之儲藏彈性模數(單位:GPa)。 For this test sample, a dynamic viscoelasticity measuring device (manufactured by TA instruments, trade name "DMA Q800") was used to measure the storage of the resin film forming sheet at 23°C in a tensile mode at a frequency of 11 Hz, 23°C, and an atmospheric environment. Elastic modulus (unit: GPa).

<對於樹脂膜形成用薄片之表面(β)之水之接觸角之測定> <Measurement of the contact angle of water on the surface (β ) of the resin film forming sheet>

去除於實施例及比較例所製作之複合薄片具有之第2之支撐薄片,對所露出之樹脂膜形成用薄片之表面(β)滴下蒸餾水10ml後,靜置10分鐘。 The second supporting sheet of the composite sheet produced in the Examples and Comparative Examples was removed, and 10 ml of distilled water was dropped on the surface (β ) of the exposed resin film forming sheet, and then it was allowed to stand for 10 minutes.

靜置後使用自動接觸角測定器(KRUSS公司製造, 商品名「DSA 100S」),測定表面(β)與水滴形成之角度,將該角度設為「對於表面(β)之水之接觸角」。 After standing still, use an automatic contact angle measuring device (manufactured by KRUSS, trade name "DSA 100S") to measure the angle formed by the surface (β ) and the water droplet, and set this angle as the "contact angle of water to the surface (β )" .

<評價(1):樹脂膜形成用薄片之再加工性> <Evaluation (1): Reworkability of sheet for forming resin film>

去除於實施例及比較例所製作之複合薄片具有之第1之支撐薄片,使用膠帶貼片機(琳得科(股)製造,商品名「Adwill RAD-3600 F/12」),邊於70℃加熱邊貼附所露出之樹脂膜形成用薄片之表面(α)與經# 2000研磨之矽晶圓(直徑:200mm、厚度:600μm)之研磨面,然後,於23℃、50%RH(相對濕度)之環境下靜置24小時。 The first supporting sheet of the composite sheet produced in the examples and comparative examples was removed, and a tape placement machine (manufactured by Lindeke (stock), trade name "Adwill RAD-3600 F/12") was used, with a side of 70 Attach the exposed surface (α) of the resin film forming sheet and the polished surface of the #2000 polished silicon wafer (diameter: 200mm, thickness: 600μm) while heating at 23°C, 50%RH( Let stand for 24 hours in an environment with relative humidity.

靜置後,去除複合薄片具有之第2之支撐薄片,於室溫(25℃)貼附所露出之樹脂膜形成用薄片之表面(β)與市售之汎用切割膠帶(琳得科(股)製造,商品名「Adwill D-510T」,上述要件(III)所具有由特定之黏著劑所形成之黏著劑層之黏著薄片)之黏著層之表面,並且,靜置20分鐘。 After standing, remove the second support sheet of the composite sheet, and paste the exposed surface ( β ) of the resin film forming sheet and a commercially available general dicing tape (Lindeke (Stock) at room temperature (25°C) ) Manufactured with the trade name "Adwill D-510T", the above-mentioned requirement (III) has the surface of the adhesive layer of the adhesive layer formed by the specific adhesive, and let it stand for 20 minutes.

之後,以人工操作之方式拉伸汎用切割膠帶,由矽晶圓再加工樹脂膜形成用薄片時,觀察是否可再加工,以及再加工後之矽晶圓之表面上有無殘存物之附著,藉由下述基準評價樹脂膜形成用薄片之再加工性。 After that, manually stretch the general-purpose dicing tape. When reprocessing the resin film forming sheet from the silicon wafer, observe whether it can be reprocessed and whether there is any residue on the surface of the reprocessed silicon wafer. The reworkability of the resin film forming sheet was evaluated based on the following criteria.

A:從矽晶圓可完全地剝離保護膜形成用薄片。再加工後之矽晶圓上未觀察到目視可確認之保護膜形成用薄片之殘存物。 A: The protective film forming sheet can be completely peeled from the silicon wafer. No visible residues of the protective film formation sheet were observed on the silicon wafer after reprocessing.

B:從矽晶圓可剝離保護膜形成用薄片。雖然再加工後之矽晶圓上觀察到某些保護膜形成用薄片之殘存物,但是若使用乙醇擦拭則可完全地去除之程度。 B: The protective film formation sheet can be peeled from the silicon wafer. Although some residues of the protective film forming sheet were observed on the silicon wafer after reprocessing, it can be completely removed if wiped with ethanol.

C:再生中損壞矽晶圓,或即使不損壞矽晶圓而亦可再加工,但是再加工後之矽晶圓上確認到難以使用乙醇擦拭程度之保護膜形成用薄片之殘存物。 C: The silicon wafer was damaged during regeneration, or the silicon wafer can be reprocessed even if the silicon wafer is not damaged. However, the reprocessed silicon wafer confirmed the residue of the protective film forming sheet to the extent that it is difficult to wipe with ethanol.

<評價(2):樹脂膜形成用薄片之端部密著性> <Evaluation (2): Adhesion of the end of the resin film forming sheet>

去除於實施例及比較例所製作之複合薄片具有之第1之支撐薄片,使用膠帶貼片機(琳得科(股)製造,商品名「Adwill RAD-3600 F/12」),邊於70℃加熱邊貼附所露出之樹脂膜形成用薄片之表面(α)與經# 2000研磨之矽晶圓(直徑:200mm、厚度:600μm)之研磨面,然後,亦去除第2之支撐薄片,貼附矽晶圓與樹脂膜形成用薄片。 The first supporting sheet of the composite sheet produced in the examples and comparative examples was removed, and a tape placement machine (manufactured by Lindeke (stock), trade name "Adwill RAD-3600 F/12") was used, with a side of 70 Attach the exposed surface (α) of the resin film forming sheet and the polished surface of the #2000 polished silicon wafer (diameter: 200mm, thickness: 600μm) while heating at ℃, and then remove the second support sheet. Attach a silicon wafer and a sheet for forming a resin film.

之後,目視觀察貼附有樹脂膜形成用薄片之矽晶圓之端部,並且,視0.5mm以上之卷曲或缺失之數,藉由下述基準評價樹脂膜形成用薄片之端部密著性。 After that, visually observe the end of the silicon wafer to which the resin film forming sheet is attached, and evaluate the end adhesion of the resin film forming sheet based on the following criteria based on the number of curls or deletions of 0.5 mm or more .

A:0.5mm以上之卷曲或缺失之數係0處。 A: The number of curls or deletions above 0.5mm is 0.

B:0.5mm以上之卷曲或缺失之數係1~4處。 B: The number of crimps or deletions above 0.5mm is 1~4.

C:0.5mm以上之卷曲或缺失之數係5處以上。 C: The number of crimps or deletions of 0.5 mm or more is 5 or more.

Figure 109110851-A0101-12-0061-2
Figure 109110851-A0101-12-0061-2

藉由表2得知,本發明之一態樣之實施例1~5所製作之樹脂膜形成用薄片成為再加工性及端部密著性之兩者均優異之結果。 Table 2 shows that the resin film forming sheets produced in Examples 1 to 5, which are one aspect of the present invention, have excellent results in both reworkability and end adhesion.

另一方面,比較例1之樹脂膜形成用薄片係因表面(β)之黏著力(β 1)之值低,故使用黏著薄片再加工該樹脂膜形成用薄片之操作時,該樹脂膜形成用薄片之一部分殘存於矽晶圓上,成為再加工性劣化之結果。 On the other hand, the resin film forming sheet of Comparative Example 1 has a low surface ( β ) adhesion force ( β 1) value, so when the adhesive sheet is used to reprocess the resin film forming sheet, the resin film is formed A part of the thin film remains on the silicon wafer as a result of deterioration in reworkability.

另外,比較例3之樹脂膜形成用薄片係因表面(α)之黏著力(α 1)之值高,故再加工黏著薄片使用該樹脂膜形成用薄片之操作之途中,損壞矽晶圓,成為再加工性劣化之結果。 In addition, the resin film forming sheet of Comparative Example 3 has a high adhesive force (α 1) value on the surface (α), so the silicon wafer is damaged during the operation of using the resin film forming sheet to reprocess the adhesive sheet. As a result of deterioration of reworkability.

並且,比較例2之樹脂膜形成用薄片係雖然再加工性良好,但是矽晶圓之貼附後之端部成為密著性劣化之結果。 In addition, although the sheet system for forming a resin film of Comparative Example 2 has good reworkability, the end of the silicon wafer after attachment is a result of deterioration in adhesion.

〔產業上利用可能性〕 〔Possibility of industrial use〕

本發明之一態樣之樹脂膜形成用薄片係適宜作為保護半導體晶片之背面之保護膜之形成材料,或者作為可接著於沖模墊部或其他部位上之接著薄膜之形成材料。 The resin film forming sheet of one aspect of the present invention is suitable as a material for forming a protective film for protecting the back surface of a semiconductor chip, or as a material for forming an adhesive film that can be attached to a die pad or other parts.

Claims (6)

一種樹脂膜形成用薄片,其係用以貼附於矽晶圓,並於該矽晶圓上形成樹脂膜之樹脂膜形成用薄片,且滿足下述要件(I)~(III),並且前述樹脂膜形成用薄片之表面(β)之對於水之接觸角係70~110°, A sheet for forming a resin film, which is a sheet for forming a resin film for attaching to a silicon wafer and forming a resin film on the silicon wafer, and satisfies the following requirements (I) to (III), and the foregoing The contact angle of the surface (β ) of the resin film forming sheet to water is 70~110°, 要件(I):前述樹脂膜形成用薄片之表面(α)之與矽晶圓貼附側之表面粗糙度(Ra)為50nm以下, Requirement (I): The surface roughness (Ra) of the surface (α) of the aforementioned resin film forming sheet on the side where the silicon wafer is attached is 50 nm or less, 要件(II):前述樹脂膜形成用薄片之表面(α)之對於矽晶圓之黏著力(α 1)係1.0~7.0N/25mm, Requirement (II): The adhesion force (α 1) of the surface (α) of the aforementioned resin film forming sheet to the silicon wafer is 1.0~7.0N/25mm, 要件(III):前述樹脂膜形成用薄片之表面(β)之與矽晶圓貼附側係相反側之對於由黏著劑所形成之具有黏著劑層之黏著薄片之黏著劑層之黏著力(β 1)為4.0N/25mm以上, Requirement (III): The surface ( β ) of the aforementioned resin film forming sheet is the opposite side of the silicon wafer attaching side to the adhesive layer of the adhesive layer formed by the adhesive with the adhesive layer ( β 1) is 4.0N/25mm or more, 前述黏著劑係含有具有源自丁基丙烯酸酯及丙烯酸之結構單元,質量平均分子量為60萬~100萬之丙烯酸系樹脂100質量份,與交聯劑0.01~10質量份, The aforementioned adhesive contains 100 parts by mass of acrylic resin having structural units derived from butyl acrylate and acrylic acid, a mass average molecular weight of 600,000 to 1 million, and 0.01 to 10 parts by mass of a crosslinking agent, 前述黏著薄片具有厚度10~50μm之黏著劑層。 The aforementioned adhesive sheet has an adhesive layer with a thickness of 10-50 μm. 如申請專利範圍第1項之樹脂膜形成用薄片,其中,23℃之儲藏彈性模數係0.10~20GPa。 For example, the sheet for forming a resin film in the first item of the scope of patent application, wherein the storage modulus of elasticity at 23°C is 0.10-20GPa. 如申請專利範圍第1或2項之樹脂膜形成用薄片,其中,其係用以於矽晶圓上形成保護膜。 Such as the sheet for forming a resin film in the first or second patent application, which is used to form a protective film on a silicon wafer. 一種樹脂膜形成用複合薄片,其具有於支撐薄片上層合如申請專利範圍第1~3項中任一項之樹脂膜形成用薄片之構成。 A composite sheet for forming a resin film, which has a structure in which the resin film forming sheet according to any one of items 1 to 3 in the scope of the patent application is laminated on a support sheet. 如申請專利範圍第4項之樹脂膜形成用複合薄片,其中,前述樹脂膜形成用薄片具有被兩片支撐薄片夾住之構成。 The composite sheet for forming a resin film according to claim 4, wherein the sheet for forming a resin film has a structure sandwiched by two supporting sheets. 一種矽晶圓之再生方法,其係從矽晶圓上直接貼附有如申請專利範圍第1~3項中任一項之樹脂膜形成用薄片之表面(α)之層合體,再加工該樹脂膜形成用薄片而再生矽晶圓之方法,且其具有下述步驟(1)~(2), A method for regenerating a silicon wafer, which is to directly attach a laminate of the surface (α) of the resin film forming sheet as in any one of the scope of patent application items 1 to 3 on the silicon wafer, and then process the resin A method for regenerating silicon wafers with thin films for film formation, and it has the following steps (1)~(2), 步驟(1):於前述層合體之前述樹脂膜形成用薄片之表面(β)上,貼附具有基材及黏著劑層之黏著薄片之該黏著劑層之步驟, Step (1): a step of attaching the adhesive layer of the adhesive sheet having the base material and the adhesive layer on the surface (β) of the resin film forming sheet of the laminate, 步驟(2):拉伸步驟(1)中之貼附於前述樹脂膜形成用薄片之表面(β)上的前述黏著薄片,而再加工前述矽晶圓上所貼附之前述樹脂膜形成用薄片之步驟。 Step (2): Stretching the adhesive sheet attached to the surface (β) of the resin film forming sheet in the step (1), and then processing the resin film attached to the silicon wafer The step of thin slices.
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