TWI715995B - 氟系基板、銅箔基板及印刷電路板 - Google Patents
氟系基板、銅箔基板及印刷電路板 Download PDFInfo
- Publication number
- TWI715995B TWI715995B TW108119921A TW108119921A TWI715995B TW I715995 B TWI715995 B TW I715995B TW 108119921 A TW108119921 A TW 108119921A TW 108119921 A TW108119921 A TW 108119921A TW I715995 B TWI715995 B TW I715995B
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- Prior art keywords
- fluorine
- inorganic filler
- substrate
- reinforcing material
- material layer
- Prior art date
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- 239000000758 substrate Substances 0.000 title claims abstract description 137
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 79
- 239000010949 copper Substances 0.000 title abstract description 3
- 229910052802 copper Inorganic materials 0.000 title abstract description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 title abstract 6
- 239000011256 inorganic filler Substances 0.000 claims abstract description 82
- 229910003475 inorganic filler Inorganic materials 0.000 claims abstract description 82
- 239000012779 reinforcing material Substances 0.000 claims abstract description 65
- 239000011347 resin Substances 0.000 claims abstract description 63
- 229920005989 resin Polymers 0.000 claims abstract description 63
- 239000000463 material Substances 0.000 claims abstract description 29
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- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims description 111
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- 229910052731 fluorine Inorganic materials 0.000 claims description 111
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- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 14
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- PEVRKKOYEFPFMN-UHFFFAOYSA-N 1,1,2,3,3,3-hexafluoroprop-1-ene;1,1,2,2-tetrafluoroethene Chemical compound FC(F)=C(F)F.FC(F)=C(F)C(F)(F)F PEVRKKOYEFPFMN-UHFFFAOYSA-N 0.000 claims description 4
- 229920001577 copolymer Polymers 0.000 claims description 4
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 4
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 4
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical group FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 claims description 4
- 229910052582 BN Inorganic materials 0.000 claims description 3
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 3
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 3
- 229920001774 Perfluoroether Polymers 0.000 claims description 3
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 claims description 3
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 claims description 3
- 229910002113 barium titanate Inorganic materials 0.000 claims description 3
- 229910052810 boron oxide Inorganic materials 0.000 claims description 3
- 229910000019 calcium carbonate Inorganic materials 0.000 claims description 3
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical compound [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 claims description 3
- 239000000292 calcium oxide Substances 0.000 claims description 3
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 claims description 3
- AOWKSNWVBZGMTJ-UHFFFAOYSA-N calcium titanate Chemical compound [Ca+2].[O-][Ti]([O-])=O AOWKSNWVBZGMTJ-UHFFFAOYSA-N 0.000 claims description 3
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 claims description 3
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 claims description 3
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 3
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 claims description 3
- 239000000945 filler Substances 0.000 claims description 3
- 229910052749 magnesium Inorganic materials 0.000 claims description 3
- 239000011777 magnesium Substances 0.000 claims description 3
- VTHJTEIRLNZDEV-UHFFFAOYSA-L magnesium dihydroxide Chemical compound [OH-].[OH-].[Mg+2] VTHJTEIRLNZDEV-UHFFFAOYSA-L 0.000 claims description 3
- 239000000347 magnesium hydroxide Substances 0.000 claims description 3
- 229910001862 magnesium hydroxide Inorganic materials 0.000 claims description 3
- 239000000395 magnesium oxide Substances 0.000 claims description 3
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 3
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 claims description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 3
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 claims description 3
- 239000011148 porous material Substances 0.000 claims description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims 1
- 238000000034 method Methods 0.000 description 11
- -1 polytetrafluoroethylene Polymers 0.000 description 10
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- LLZRNZOLAXHGLL-UHFFFAOYSA-J titanic acid Chemical compound O[Ti](O)(O)O LLZRNZOLAXHGLL-UHFFFAOYSA-J 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
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- AFCARXCZXQIEQB-UHFFFAOYSA-N N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CCNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 AFCARXCZXQIEQB-UHFFFAOYSA-N 0.000 description 1
- 239000000020 Nitrocellulose Substances 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
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- 238000005259 measurement Methods 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000004227 thermal cracking Methods 0.000 description 1
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- H—ELECTRICITY
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Abstract
本發明公開一種氟系基板、銅箔基板及印刷電路板。氟系基板包括一增強材料層和一氟系樹脂層,增強材料層包括一基材和一第一無機填料,第一無機填料附著於基材上,並分散於增強材料層中,第一無機填料的粒徑為0.02微米至1微米。氟系樹脂層包覆增強材料層,氟系樹脂層包括一第二無機填料,第二無機填料的粒徑為大於1微米至100微米。
Description
本發明涉及一種氟系基板、銅箔基板及印刷電路板,特別是涉及一種適用於高頻傳輸的氟系基板、銅箔基板及印刷電路板。
隨著科技的進步,高頻傳輸已是無法避免的趨勢。為因應高頻傳輸的需求,業界對於電路基板的特性要求也因此日益提升。一般而言,高頻基板需具有較高的介電常數(dielectric constant,Dk)、較低的介電損耗(dielectric dissipation factor,Df)以及較高的導熱特性,藉此兼具良好的介電性能以及熱傳導特性。使電路基板可應用於基站天線、衛星雷達、汽車用雷達、無線通訊天線或是功率放大器的高頻電路基板。
氟系基板因具有較低的介電損耗,以及可通過樹脂含量調控介電常數的優勢,而被廣泛應用於高頻電路基板。現有技術中,通常會於氟系基板中添加高含量的無機填料,以提升其介電性能以及熱傳導特性。然而,當無機填料的含量過高時,會導致銅箔與氟系基板間的接著性不佳,於加工鑽孔或鍍孔操作時,銅箔容易自氟系基板上脫落。且無機填料的含量過高時,無機填料容易分散不均,進而影響氟系基板特性的均勻性和穩定性。
為了解決上述無機填料的信賴性問題,現有技術中提供了在銅箔與氟系基板間設置接著膜材,或塗佈接著樹脂的技術手段,以提升銅箔與氟系基板的接著強度。但設置接著膜材或塗佈接著樹脂的方式,成本較高且製程較為繁瑣。另外,接著膜材或接著樹脂的存在,會影響整體氟系基板的特性,而無法兼具高介電和高熱傳導的特性。
本發明所要解決的技術問題在於,針對現有技術的不足提供一種氟系基板、銅箔基板及印刷電路板。
為了解決上述的技術問題,本發明所採用的其中一技術方案是,提供一種氟系基板。氟系基板包括一增強材料層和一氟系樹脂層,增強材料層包括一基材和一第一無機填料,第一無機填料附著於基材上並分散於增強材料層中,第一無機填料的粒徑為0.02微米至1微米。氟系樹脂層包覆增強材料層,氟系樹脂層包括一第二無機填料,第二無機填料的粒徑為大於1微米至100微米。
為了解決上述的技術問題,本發明所採用的另外一技術方案是,提供一種銅箔基板。銅箔基板包括一氟系基板和一銅箔,銅箔設置於氟系基板上,氟系基板包括一增強材料層和一氟系樹脂層。增強材料層包括一基材和一第一無機填料。其中,第一無機填料附著於基材上並分散於增強材料層中,第一無機填料的粒徑為0.02微米至1微米。氟系樹脂層包覆增強材料層,氟系樹脂層包括一第二無機填料,第二無機填料的粒徑為大於1微米至100微米。
為了解決上述的技術問題,本發明所採用的另外一技術方案是,提供一種印刷電路板。印刷電路板包括一氟系基板和一電路層,電路層設置於氟系基板上。氟系基板包括一增強材料層和一氟系樹脂層。增強材料層包括一基材和一第一無機填料。其中,第一無機填料附著於基材上並分散於增強材料層中,第一無機填料的粒徑為0.02微米至1微米。氟系樹脂層包覆增強材料層,氟系樹脂層包括一第二無機填料,第二無機填料的粒徑為大於1微米至100微米。
本發明的其中一有益效果在於,本發明所提供的氟系基板、銅箔基板及印刷電路板,其能通過“氟系樹脂層包覆於所述增強材料層外”、“調控第一無機填料的粒徑為0.02微米至1微米”以及“調控第二無機填料的粒徑為大於1微米至100微米”的技術方案,使氟系基板、銅箔基板及印刷電路板兼具良好的介電性能和熱傳導特性,且仍具有良好的接著信賴性。
為使能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與圖式,然而所提供的圖式僅用於提供參考與說明,並非用來對本發明加以限制。
以下是通過特定的具體實施例來說明本發明所公開有關“氟系基板、銅箔基板及印刷電路板”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。
應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件或者信號,但這些元件或者信號不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一信號與另一信號。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。
請參閱圖1所示,圖1為本發明第一實施例的銅箔基板的側視剖面示意圖。本發明提供一種銅箔基板1,其包括一增強材料層10、一氟系樹脂層20和一銅箔30。本發明的銅箔基板1兼具有優異的介電特性和良好的熱傳導特性,而可應用於高頻電路板。並且,本發明可在不設置接著膜層或不塗佈接著樹脂的情況下,使銅箔基板1具有較高的剝離強度。即使後續在鑽孔或鍍孔的製程時,銅箔30仍具有良好的接著信賴性,不會輕易與氟系樹脂層20分離。
本實施例中,增強材料層10包括一基材11和一第一無機填料12。增強材料層10的厚度為40微米至100微米。基材11可以是一纖維布或絕緣紙,但不以此為限。基材11的材料可以是玻璃纖維、碳纖維、石墨纖維、氧化鋁纖維、碳化矽纖維、氮化矽纖維、硼纖維或其組合物。較佳的,基材11的材料可以是玻璃纖維,但不以此為限。
第一無機填料12附著於基材11上,並平均分散於增強材料層10中除了基材11的部分。第一無機填料12的粒徑為0.02微米至1微米(例如20至1000奈米之間的正整數)。第一無機填料12可以是二氧化矽、二氧化鈦、氫氧化鋁、氧化鋁、氫氧化鎂、氧化鎂、碳酸鈣、氧化硼、氧化鈣、鈦酸鍶、鈦酸鋇、鈦酸鈣、鈦酸鎂、氮化硼、氮化鋁、碳化矽、二氧化鈰或其任意組合。
其中,二氧化矽可以為熔融型或是結晶型的二氧化矽,若考量整體銅箔基板1的介電特性,較優選為熔融型二氧化矽。二氧化鈦可以是金紅石(rutile)、銳鈦礦(anatase)或板鈦礦(brookite)構型的二氧化鈦,若考量整體銅箔基板1的介電特性,較優選為金紅石構型的二氧化鈦。
請合併參閱圖2至4所示,圖2為本發明中增強材料層10的示意圖。圖3和圖4分別為圖2中III部分和IV部分的局部放大圖。在本實施例中,基材11為一纖維布,若進一步觀察增強材料層10的結構,可發現一部分的第一無機填料12,填補於纖維布的孔隙(如圖2所示)。而另一部份的第一無機填料12,填補於纖維布的紗束111於末端或中段的間隙中(如圖3、4所示)。本發明通過第一無機填料12的使用,可提升基材11本身的結構強度,更可提升增強材料層10於X-Z平面上的介電常數穩定性以及尺寸安定性。
再請參閱圖1所示,氟系樹脂層20包覆增強材料層10。具體來說,氟系樹脂層20可以是形成於增強材料層10的相對兩側,夾設於增強材料層10外(如圖1所示),也可以完整包覆於增強材料層10外。氟系樹脂層20的厚度為70微米至180微米。
氟系樹脂層20中包括一第二無機填料21,第二無機填料21的粒徑為大於1微米至100微米(例如1至100微米之間的正整數),第二無機填料21設置於增強材料層10上,並分散於氟系樹脂層20。第二無機填料21可以是二氧化矽、二氧化鈦、氫氧化鋁、氧化鋁、氫氧化鎂、氧化鎂、碳酸鈣、氧化硼、氧化鈣、鈦酸鍶、鈦酸鋇、鈦酸鈣、鈦酸鎂、氮化硼、氮化鋁、碳化矽、二氧化鈰或其任意組合。
前述增強材料層10和氟系樹脂層20所構成的結構合稱作氟系基板。而氟系基板中的第一無機填料12和第二無機填料21可以是相同或不同的材料。於其中一實施例,當第一無機填料12和第二無機填料21為相同材料時,可提升增強材料層10和氟系樹脂層20之間的相容性,以增加銅箔基板1的剝離強度。於另一實施例中,第一無機填料12和第二無機填料21可以是不同的材料,並可通過選用不同材料的無機填料,以調整銅箔基板1的介電常數或其他特性。
銅箔30設置於氟系樹脂層20上,並可依銅箔基板1的種類不同,選擇設置不同數量的銅箔30。例如:選擇於氟系基板上設置一銅箔30,可製得單面銅箔基板(如圖1所示);若選擇於氟系基板上設置二銅箔30,可製得雙面銅箔基板(如圖7所示)。關於雙面銅箔基板的具體結構,將於後詳述。
請合併參閱圖1、5所示,圖5為本發明銅箔基板1的製備方法的流程圖。銅箔基板1的製備方法包括以下步驟:首先,提供一基材11(步驟S100)。於基材11上施以一第一溶液(步驟S102)。乾燥施有第一溶液的基材11,以形成一增強材料層10(步驟S104)。
在步驟S102中,於基材11上施以第一溶液的方式,可以是將基材11含浸於第一溶液中,或是將第一溶液塗佈於基材11上。第一溶液中包括:濃度為50wt%至80wt%的第一無機填料12、濃度為10wt%至40wt%的氟系樹脂、濃度為1wt%至10wt%的含氟聚合物、濃度為0.1wt%至50wt%的低分子量聚四氟乙烯以及濃度為0.1wt%至10wt%的含浸助劑。
在本實施例中,氟系樹脂可以是聚四氟乙烯樹脂,但不以此為限。含氟聚合物可以是四氟乙烯/全氟烷氧基乙烯基醚共聚物(PFA)或全氟乙烯丙烯共聚物(FEP)。低分子量聚四氟乙烯可通過熱裂解降解法或輻照降解法製得,低分子量聚四氟乙烯的分子量為2000至200000。較佳的,低分子量聚四氟乙烯的分子量為10000至100000。含浸助劑可以是但不限於:羥乙基纖維素、硝化纖維素、聚甲基苯乙烯、聚甲基丙烯酸甲酯、聚乙二醇或其任意組合。含浸助劑的添加可調整樹脂組成物的黏度,而可避免因黏度過高導致表面粗糙,而影響增強材料層10的成膜平整性。或是避免因黏度過低,導致增強材料層10表面形成有孔洞。
於基材11上施以第一溶液後,第一無機填料12會填補於基材11的縫隙,並平均分散設置於基材11上。第一無機填料12的使用,可提升基材11本身的結構強度,以及提升增強材料層10於X-Z平面上介電常數的均勻性。由於第一無機填料12是填補於基材11的縫隙,故較不會有因第一無機填料12含量過高,而影響接著信賴性的問題。
在步驟S104中,乾燥施有第一溶液的基材11,以形成增強材料層10的方式,可以包括三階段的升溫步驟:使基材11依序於80°C至120°C的溫度下乾燥、於200°C至240°C的溫度下烘烤,以及於340°C至360°C的溫度下燒結。且在乾燥、烘烤和燒結的各個步驟中,至少維持20分鐘。然而,本發明不以此為限。
銅箔基板1的製備方法包括:於增強材料層10上施以一第二溶液(步驟S106)。乾燥施有第二溶液的增強材料層10,以於增強材料層10上形成一氟系樹脂層20,而製得氟系基板(步驟S108)。
在步驟S106中,於增強材料層10上施以第二溶液的步驟,可以是將增強材料層10含浸於第二溶液中,或是將第二溶液塗佈於增強材料層10外。第二溶液中包括濃度為20wt%至70wt%的第二無機填料21、濃度為10wt%至70wt%的氟系樹脂、濃度為1wt%至10wt%的含氟聚合物、濃度為0.1wt%至50wt%的低分子量聚四氟乙烯以及濃度為0.1wt%至10wt%的含浸助劑。其中,第二溶液中的氟系樹脂、含氟聚合物、低分子量聚四氟乙烯和含浸助劑,與第一溶液中相似,故於此不再贅述。
通過調控含氟聚合物的含量,可使氟系樹脂層20具有良好的加工性。舉例來說,若氟系樹脂層20中含氟聚合物的用量大於10wt%時,在熱壓銅箔的過程中容易出現流膠,而影響銅箔基板1的加工性和厚度均勻性。若氟系樹脂層20中含氟聚合物的用量小於1wt%時,則銅箔30容易剝落。
低分子量聚四氟乙烯(分子量為2000至200000,較佳分子量為10000至100000)因分子鏈較短,而具有較佳的排列能力。因此,在適當溫度下進行燒結或壓合製程時,低分子量聚四氟乙烯的添加,可增加氟系樹脂層20的結晶度,進而提升氟系樹脂層20的熱傳導係數。
於增強材料層10上施以第二溶液後,第二無機填料21會設置於增強材料層10上。
在步驟S108中,乾燥施有第二溶液的增強材料層10製得氟系基板的方式,可以包括三階段的升溫步驟:使增強材料層10依序於80°C至120°C的溫度下乾燥、200°C至240°C的溫度下烘烤,以及在340°C至360°C的溫度下燒結。且在乾燥、烘烤和燒結的各個步驟中,至少維持20分鐘。然而,本發明不以此為限。
於其他實施例中,可多次重覆步驟S106和步驟S108。也就是重複於增強材料層10上施以第二溶液並乾燥的步驟,以便形成特定厚度的氟系樹脂層20。由於氟系樹脂層20的厚度可依需求進行調整,於本發明中,氟系樹脂層20較佳的厚度為50微米至150微米(例如50至150微米之間的正整數)。
最後,銅箔基板1的製備方法包括:於氟系基板的氟系樹脂層20上設置一銅箔30,製得一銅箔基板1(步驟S110)。設置銅箔30的方式是在溫度為340°C至360°C、壓力為45kg/cm
2至55kg/cm
2的條件下持續熱壓2小時,使銅箔30貼合於氟系樹脂層20上。接著,以1°C/min至4°C/min的降溫速率先降溫至250°C,再調控以10°C/min的降溫速率由250°C降至室溫,從而提升氟系樹脂層20的結晶度,並可改善銅箔基板1的導熱特性。然而,本發明不以此為限。
根據上述內容,通過執行前述步驟S100至步驟S104,可形成增強材料層10。通過執行前述步驟S106和步驟S108,可於增強材料層10外形成氟系樹脂層20。值得注意的是,氟系基板的製備方式並不限於上述,實際操作時可重複執行上述步驟S100至步驟S108,形成多個由氟系樹脂層20/增強材料層10/氟系樹脂層20所構成的結構。並且,可將多個氟系樹脂層20/增強材料層10/氟系樹脂層20所構成的結構堆疊設置,以達到目標的厚度,如圖6所示。
圖6為本發明第二實施例的銅箔基板1,其中,氟系基板是由依序堆疊設置的氟系樹脂層20/增強材料層10/氟系樹脂層20/氟系樹脂層20/增強材料層10/氟系樹脂層20所構成,而銅箔30形成於氟系樹脂層20上,以形成一單面銅箔基板。
除此之外,亦可利用上述製備方法,製備得雙面銅箔基板,也就是於氟系基板的相對兩側各設置一銅箔30。請參閱圖7所示,圖7為本發明第三實施例的銅箔基板的側視剖面示意圖。圖7的銅箔基板1與圖1的銅箔基板1的差異在於:氟系基板的相對兩側上都設置有一銅箔30。圖7中的增強材料層10、氟系樹脂層20以及銅箔30的結構與前述相似,於此不再贅述。
另外,於其他實施例中,銅箔基板1可再經由蝕刻顯影,對銅箔30進行圖案化,形成一電路層。進而製得兼具高介電和高熱傳導的特性的印刷電路板,且可適用於高頻傳輸。
為了證實本發明的銅箔基板兼具高介電和高熱傳導的特性,本發明製備了不同的銅箔基板1,各銅箔基板1的製程參數如下表1所示。並對各銅箔基板1進行物性評估,評估方式包括: (1)熱傳導分析測試:根據ASTM-D5470測試方法,使用界面材料熱阻及熱傳導係數量測儀器(臺灣瑞領科技股份有限公司;型號LW-9389)進行熱傳導分析測試。 (2)介電常數(10 GHz):使用介電分析儀(Dielectric Analyzer)(型號HP Agilent E4991A),測試在頻率10G Hz時的介電常數。 (3)介電損耗(10 GHz):使用介電分析儀(Dielectric Analyzer)(型號HP Agilent E4991A),測試在頻率10G Hz時的介電損耗。 (4)剝離強度測試:根據IPC-TM-650-2.4.8測試方法,測試銅箔基板的剝離強度。
表1:實施例1至4和比較例1至4的銅箔基板的製備條件和物性評估。
實施例 | 比較例 | ||||||||
1 | 2 | 3 | 4 | 1 | 2 | 3 | 4 | ||
第一無機填料 | 成分 | TiO 2 | SiO 2 | TiO 2 | SiO 2 | Al 2O 3 | BN | TiO 2 | SiO 2 |
粒徑(μm) | 0.05 | 0.3 | 0.05 | 0.5 | 10 | 6 | 8 | 2 | |
於增強材料層中的含量 | 70% | 50% | 80% | 50% | 70% | 50% | 80% | 65% | |
增強材料層厚度(μm) | 40 | 40 | 40 | 60 | 40 | 40 | 40 | 60 | |
第二無機填料 | 成分 | Al 2O 3 | BN | TiO 2 | Al 2O 3 | Al 2O 3 | BN | TiO 2 | SiO 2 |
粒徑(μm) | 10 | 6 | 8 | 10 | 10 | 6 | 8 | 2 | |
於氟系樹脂層中的含量 | 60% | 20% | 70% | 50% | 80% | 50% | 80% | 65% | |
氟系樹脂層厚度(μm) | 90 | 90 | 90 | 70 | 90 | 90 | 90 | 70 | |
物性評估 | |||||||||
熱傳導係數(W/mK) | 1.0 | 1.8 | 1.2 | 0.87 | 0.93 | 1.3 | 1.01 | 0.75 | |
介電常數(10GHz) | 6.52 | 3.53 | 11.4 | 3.50 | 6.49 | 3.51 | 11.2 | 3.47 | |
介電損耗(10GHz) | 0.0020 | 0.0015 | 0.0019 | 0.0020 | 0.0025 | 0.0021 | 0.0023 | 0.0031 | |
剝離強度(lb/in) | 11.2 | 12.3 | 10.3 | 13.3 | 3.7 | 2.9 | 3.1 | 4.2 |
根據表1的結果所示,本發明通過調控增強材料層10中第一無機填料12的粒徑大小,可製備獲得兼具高介電特性、高熱傳導特性以及高剝離強度的氟系基板、銅箔基板1以及印刷電路板。具體來說,本發明的銅箔基板1的熱傳導係數為0.7 W/mK至1.8 W/mK、介電常數(10GHz)為3.5至11.4、介電損耗(10GHz)為0.0015至0.0020、剝離強度為10.3 lb/in至13.3 lb/in。
[實施例的有益效果]
本發明的其中一有益效果在於,本發明所提供的氟系基板、銅箔基板1及印刷電路板,其能通過“氟系樹脂層20包覆所述增強材料層10”、“調控第一無機填料12的粒徑為0.02微米至1微米”以及“調控第二無機填料21的粒徑為大於1微米至100微米”的技術方案,使氟系基板、銅箔基板1以及印刷電路板兼具良好的介電性能和熱傳導特性,且仍具有良好的接著信賴性。
更進一步來說,本發明通過“調控增強材料層10中第一無機填料12的含量”以及“調控氟系樹脂層20中第二無機填料21的含量”的技術方案,使基材11上附著有適量的第一無機填料12和第二無機填料21,在提升介電性能和熱傳導特性之餘,仍可維持銅箔基板1以及印刷電路板的接著信賴性。
以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的申請專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的申請專利範圍內。
1 | 銅箔基板 | ||
10 | 增強材料層 | 11 | 基材 |
111 | 紗束 | ||
12 | 第一無機填料 | ||
20 | 氟系樹脂層 | 21 | 第二無機填料 |
30 | 銅箔 |
圖1為本發明第一實施例的銅箔基板的側視剖面示意圖。
圖2為圖1中增強材料層的立體示意圖。
圖3為圖2的III部分的放大示意圖。
圖4為圖2的IV部分的放大示意圖。
圖5為本發明銅箔基板的製作方法的流程圖。
圖6為本發明第二實施例的銅箔基板的側視剖面示意圖。
圖7為本發明第三實施例的銅箔基板的側視剖面示意圖。
1 | 銅箔基板 | ||
10 | 增強材料層 | 11 | 基材 |
12 | 第一無機填料 | ||
20 | 氟系樹脂層 | 21 | 第二無機填料 |
30 | 銅箔 |
Claims (10)
- 一種氟系基板,包括:一增強材料層,其包括一基材和一第一無機填料,所述第一無機填料附著於所述基材上並分散於所述增強材料層中;其中,所述第一無機填料的粒徑為0.02微米至1微米;以及一氟系樹脂層,其包覆所述增強材料層,所述氟系樹脂層包括一第二無機填料,所述第二無機填料的粒徑為大於1微米至100微米;其中,形成所述氟系樹脂層中的一溶液中包含1wt%至10wt%的一含氟聚合物,所述含氟聚合物是四氟乙烯/全氟烷氧基乙烯基醚共聚物或全氟乙烯丙烯共聚物。
- 如申請專利範圍第1項所述的氟系基板,其中,所述第一無機填料和所述第二無機填料為二氧化矽、二氧化鈦、氫氧化鋁、氧化鋁、氫氧化鎂、氧化鎂、碳酸鈣、氧化硼、氧化鈣、鈦酸鍶、鈦酸鋇、鈦酸鈣、鈦酸鎂、氮化硼、氮化鋁、碳化矽、二氧化鈰或其任意組合。
- 如申請專利範圍第1項所述的氟系基板,其中,所述增強材料層的厚度為40微米至100微米。
- 如申請專利範圍第1項所述的氟系基板,其中,所述氟系樹脂層的厚度為70微米至180微米。
- 如申請專利範圍第1項所述的氟系基板,其中,所述基材為一纖維布,所述第一無機填料填補於所述纖維布的孔隙以及所述纖維布的紗束的間隙。
- 如申請專利範圍第1項所述的氟系基板,其中,所述增強材料層中所述第一無機填料的含量為50wt%至80wt%。
- 如申請專利範圍第1項所述的氟系基板,其中,所述氟系樹脂層中所述第二無機填料的含量為20wt%至70wt%。
- 如申請專利範圍第1項所述的氟系基板,其中,所述氟系樹脂 層完整包覆所述增強材料層。
- 一種銅箔基板,包括:一氟系基板,其包括:一增強材料層,其包括一基材和一第一無機填料;其中,所述第一無機填料附著於所述基材上並分散於所述增強材料層中,所述第一無機填料的粒徑為0.02微米至1微米;以及一氟系樹脂層,其包覆所述增強材料層,所述氟系樹脂層包括一第二無機填料,所述第二無機填料的粒徑為大於1微米至100微米;其中,形成所述氟系樹脂層中的一溶液中包含1wt%至10wt%的一含氟聚合物,所述含氟聚合物是四氟乙烯/全氟烷氧基乙烯基醚共聚物或全氟乙烯丙烯共聚物;以及一銅箔,其設置於所述氟系基板上。
- 一種印刷電路板,包括:一氟系基板,其包括:一增強材料層,其包括一基材和一第一無機填料;其中,所述第一無機填料附著於所述基材上並分散於所述增強材料層中,所述第一無機填料的粒徑為0.02微米至1微米;以及一氟系樹脂層,其包覆所述增強材料層,所述氟系樹脂層包括一第二無機填料,所述第二無機填料的粒徑為大於1微米至100微米;其中,形成所述氟系樹脂層中的一溶液中包含1wt%至10wt%的一含氟聚合物,所述含氟聚合物是四氟乙烯/全氟烷氧基乙烯基醚共聚物或全氟乙烯丙烯共聚物;以及一電路層,其設置於所述氟系基板上。
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