TWI690700B - 產生氣體分析裝置及產生氣體分析方法 - Google Patents

產生氣體分析裝置及產生氣體分析方法 Download PDF

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Publication number
TWI690700B
TWI690700B TW105131917A TW105131917A TWI690700B TW I690700 B TWI690700 B TW I690700B TW 105131917 A TW105131917 A TW 105131917A TW 105131917 A TW105131917 A TW 105131917A TW I690700 B TWI690700 B TW I690700B
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Taiwan
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sample holder
cooling
sample
heating
air
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TW105131917A
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English (en)
Chinese (zh)
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TW201727211A (zh
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秋山秀之
山田健太郎
竹內俊公
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日商日立高新技術科學股份有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/44—Sample treatment involving radiation, e.g. heat
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4806—Details not adapted to a particular type of sample
    • G01N25/4826—Details not adapted to a particular type of sample concerning the heating or cooling arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/42—Low-temperature sample treatment, e.g. cryofixation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/22—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on combustion or catalytic oxidation, e.g. of components of gas mixtures
    • G01N25/44—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on combustion or catalytic oxidation, e.g. of components of gas mixtures the heat developed being transferred to a fixed quantity of fluid
    • G01N25/46—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on combustion or catalytic oxidation, e.g. of components of gas mixtures the heat developed being transferred to a fixed quantity of fluid for investigating the composition of gas mixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
TW105131917A 2015-11-20 2016-10-03 產生氣體分析裝置及產生氣體分析方法 TWI690700B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2015227370 2015-11-20
JP2015-227370 2015-11-20
JP2016173395A JP6366657B2 (ja) 2015-11-20 2016-09-06 発生ガス分析装置及び発生ガス分析方法
JP2016-173395 2016-09-06

Publications (2)

Publication Number Publication Date
TW201727211A TW201727211A (zh) 2017-08-01
TWI690700B true TWI690700B (zh) 2020-04-11

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JP (1) JP6366657B2 (enExample)
KR (1) KR102051178B1 (enExample)
CN (1) CN106908307B (enExample)
TW (1) TWI690700B (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6505166B2 (ja) * 2017-07-21 2019-04-24 株式会社日立ハイテクサイエンス 発生ガス分析装置及び発生ガス分析方法
CN110954435B (zh) * 2019-12-20 2024-11-29 江西尚昌建设有限公司 一种多因素耦合作用下的蒸发速率测量装置及方法
CN113551842B (zh) * 2021-06-23 2023-01-24 鞍钢蒂森克虏伯（重庆）汽车钢有限公司 一种在线检测退火炉水冷设备泄漏的方法及系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200806968A (en) * 2006-05-09 2008-02-01 Sumitomo Seika Chemicals Sample introduction system
US20110239792A1 (en) * 2008-12-10 2011-10-06 Shimadzu Corporation Headspace Sample Introduction Device
JP2015137906A (ja) * 2014-01-22 2015-07-30 株式会社島津製作所 炭素測定装置

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Publication number Priority date Publication date Assignee Title
JPS59180651U (ja) * 1983-05-20 1984-12-03 塩野義製薬株式会社 自動元素分析機用オ−トサンプラ−
JPH0331762A (ja) * 1989-06-29 1991-02-12 Mitsubishi Kasei Corp 固体試料の分解方法
JPH05298961A (ja) * 1992-04-22 1993-11-12 Hitachi Ltd 携帯形電子計算機
JP3123843B2 (ja) * 1992-12-17 2001-01-15 日本電子株式会社 プラズマフレームを用いた試料気化装置
JP2531427B2 (ja) * 1993-02-24 1996-09-04 株式会社島津製作所 炭素測定装置
JPH08327615A (ja) * 1995-03-24 1996-12-13 Shimadzu Corp 試料採取装置
JP3965234B2 (ja) * 1997-10-20 2007-08-29 フロンティア・ラボ株式会社 熱分析装置
JP2002372483A (ja) * 2001-04-09 2002-12-26 Toshiba Microelectronics Corp 脱離ガス分析装置及びその分析方法
KR101102414B1 (ko) * 2010-05-28 2012-01-05 한국표준과학연구원 열전 소자 특성 측정 장치 및 그 측정 방법
KR101246318B1 (ko) * 2011-04-27 2013-03-21 현대제철 주식회사 가열로
JP5935908B2 (ja) * 2013-01-24 2016-06-15 株式会社島津製作所 試料加熱装置及び元素分析計
JP5949603B2 (ja) * 2013-03-08 2016-07-06 株式会社島津製作所 試料冷却装置
JP6107593B2 (ja) * 2013-10-21 2017-04-05 株式会社島津製作所 元素分析装置
CN104483423B (zh) * 2014-12-31 2016-03-09 同方威视技术股份有限公司 样品采集和热解析进样装置和方法以及痕量检测设备

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200806968A (en) * 2006-05-09 2008-02-01 Sumitomo Seika Chemicals Sample introduction system
US20110239792A1 (en) * 2008-12-10 2011-10-06 Shimadzu Corporation Headspace Sample Introduction Device
JP2015137906A (ja) * 2014-01-22 2015-07-30 株式会社島津製作所 炭素測定装置

Also Published As

Publication number Publication date
KR20170059387A (ko) 2017-05-30
JP6366657B2 (ja) 2018-08-01
CN106908307A (zh) 2017-06-30
CN106908307B (zh) 2019-06-28
KR102051178B1 (ko) 2019-12-02
TW201727211A (zh) 2017-08-01
JP2017102101A (ja) 2017-06-08

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