TWI690498B - Heat treatment method of glass substrate - Google Patents
Heat treatment method of glass substrate Download PDFInfo
- Publication number
- TWI690498B TWI690498B TW106101769A TW106101769A TWI690498B TW I690498 B TWI690498 B TW I690498B TW 106101769 A TW106101769 A TW 106101769A TW 106101769 A TW106101769 A TW 106101769A TW I690498 B TWI690498 B TW I690498B
- Authority
- TW
- Taiwan
- Prior art keywords
- glass substrate
- heat treatment
- low
- friction sheet
- glass
- Prior art date
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B32/00—Thermal after-treatment of glass products not provided for in groups C03B19/00, C03B25/00 - C03B31/00 or C03B37/00, e.g. crystallisation, eliminating gas inclusions or other impurities; Hot-pressing vitrified, non-porous, shaped glass products
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
- Y02P40/57—Improving the yield, e-g- reduction of reject rates
Abstract
一種玻璃基板的熱處理方法,其在利用支持構件2從下方支持玻璃基板1的狀態下,進行用以減小玻璃基板1的熱收縮率的熱處理,將低摩擦片材3至少配置於玻璃基板1的下表面1b的被支持區域的周緣部1c、與對向於該周緣部1c的支持構件2的上表面2a之間,並且將低摩擦片材3的上表面3a的靜摩擦係數設為0.5以下,且將低摩擦片材3的上表面3a的表面粗糙度Ra設為玻璃基板1的下表面1b的表面粗糙度Ra的5倍以上的大小。A heat treatment method for a glass substrate, in which the support member 2 supports the glass substrate 1 from below, heat treatment is performed to reduce the thermal shrinkage of the glass substrate 1, and the low-friction sheet 3 is disposed at least on the glass substrate 1 Between the peripheral edge portion 1c of the supported area of the lower surface 1b and the upper surface 2a of the supporting member 2 facing the peripheral edge portion 1c, and the static friction coefficient of the upper surface 3a of the low-friction sheet 3 is set to 0.5 or less In addition, the surface roughness Ra of the upper surface 3a of the low-friction sheet 3 is 5 times or more the surface roughness Ra of the lower surface 1b of the glass substrate 1.
Description
本發明是有關於一種用以減小玻璃基板的熱收縮率的熱處理方法。The invention relates to a heat treatment method for reducing the thermal shrinkage rate of a glass substrate.
眾所周知,近年來,智慧型電話(smart phone)或平板型終端等行動終端急速普及,用以使行動終端薄型化及輕量化,進而使其高性能化等的技術開發的競爭激烈度增加。因此,對於行動終端所搭載的液晶顯示器或有機電致發光(Electroluminescence,EL)顯示器等平板顯示器(以下稱為FPD,flat panel display)的基板而言,使用厚度薄的玻璃基板的情況亦增多。As we all know, in recent years, mobile terminals such as smart phones and tablet-type terminals have been rapidly popularized to increase the fierce competition in technology development for thinning and lightening mobile terminals and further improving their performance. Therefore, for the substrates of flat panel displays (hereinafter referred to as FPD (flat panel display)) such as liquid crystal displays or organic electroluminescence (EL) displays mounted on mobile terminals, thin glass substrates are also frequently used.
在FPD的製造步驟中,通常執行在玻璃基板的表面形成薄膜狀的電路(電路圖案)的成膜處理,但在成膜處理中,作為處理對象的玻璃基板會曝露於高溫中。因此,在玻璃基板的熱收縮率大的情況下,無法在玻璃基板的表面形成規定精度的電路圖案,無法確保所期望的電氣特性的可能性升高。因此,對於FPD用的玻璃基板而言,不可或缺的是熱收縮率低且尺寸熱穩定性優異。In the manufacturing process of the FPD, a film forming process for forming a thin-film circuit (circuit pattern) on the surface of the glass substrate is usually performed. However, in the film forming process, the glass substrate to be processed is exposed to high temperature. Therefore, when the thermal shrinkage rate of the glass substrate is large, a circuit pattern with a predetermined accuracy cannot be formed on the surface of the glass substrate, and the possibility that the desired electrical characteristics cannot be secured increases. Therefore, it is indispensable for the glass substrate for FPD to have a low thermal shrinkage rate and excellent dimensional thermal stability.
因此,例如在專利文獻1中揭示了對玻璃基板實施熱處理,以改善玻璃基板的尺寸熱穩定性的技術。於專利文獻1中,在將作為熱處理對象的玻璃板直接載置於支持構件(耐熱性玻璃陶瓷板)的上表面的狀態下執行熱處理。 [現有技術文獻] [專利文獻]Therefore, for example,
[專利文獻1]日本專利特開平5-330835號公報[Patent Document 1] Japanese Patent Laid-Open No. 5-330835
[發明所欲解決之課題] 然而,在利用專利文獻1所揭示的方法來對薄玻璃基板實施了熱處理的情況下,有時會在熱處理後的玻璃基板的平面方向上產生大的應變。若產生此種應變,則例如會產生如下所述的問題。[Problems to be Solved by the Invention] However, when a thin glass substrate is heat-treated by the method disclosed in
即,在FPD的製造步驟中,為了提高生產效率而實現低成本化,一般進行所謂的多倒角,即,於一大塊玻璃基板統一地形成電路圖案等之後,從該一大塊玻璃基板切出製品尺寸的多個玻璃基板。在該情況下,若在玻璃基板的平面方向上存在大的應變,則在切出之後,玻璃基板會隨著應變釋放而產生變形。結果是在將玻璃基板彼此貼合來製作面板時,預先形成的電路圖案之間產生偏差,從而導致製品不良。That is, in the manufacturing process of the FPD, in order to improve production efficiency and achieve cost reduction, so-called multi-chamfering is generally performed, that is, after a circuit pattern is uniformly formed on a large glass substrate, from the large glass substrate Cut out multiple glass substrates of product size. In this case, if there is a large strain in the plane direction of the glass substrate, the glass substrate will be deformed as the strain is released after cutting. As a result, when the glass substrates are bonded to each other to produce a panel, there is a deviation between the circuit patterns formed in advance, resulting in defective products.
本發明的課題在於藉由用以減小玻璃基板的熱收縮率的熱處理,抑制玻璃基板產生應變。 [解決課題之手段]An object of the present invention is to suppress the occurrence of strain in the glass substrate by heat treatment for reducing the thermal shrinkage of the glass substrate. [Means to solve the problem]
本申請案的發明人等在將玻璃基板直接載置於支持構件上的狀態下進行熱處理,並觀察了此期間的玻璃基板的舉動。結果已知:作為應變在熱處理後增大的玻璃基板的特徵,觀察到了干涉條紋。該干涉條紋是因如下空隙而產生,該空隙產生在玻璃基板的下表面的被支持區域與支持構件的上表面之間。認為產生所述空隙的主要原因在於:玻璃基板的下表面的被支持區域的周緣部(在支持玻璃基板的整個下表面的情況下,尤其為玻璃基板的下表面與端面交叉的交叉部)卡在支持構件的上表面上,阻止玻璃基板追隨(follow)於支持構件的上表面。因此,本申請案的發明人等基於如上所述的見解而提出本申請案的發明。The inventors of the present application performed heat treatment while placing the glass substrate directly on the support member, and observed the behavior of the glass substrate during this period. As a result, it is known that interference fringes are observed as a characteristic of a glass substrate whose strain increases after heat treatment. The interference fringes are caused by voids generated between the supported region on the lower surface of the glass substrate and the upper surface of the support member. It is considered that the main reason for the occurrence of the void is that the peripheral portion of the supported region of the lower surface of the glass substrate (when supporting the entire lower surface of the glass substrate, in particular, the intersection of the lower surface of the glass substrate and the end surface) card On the upper surface of the support member, the glass substrate is prevented from following the upper surface of the support member. Therefore, the inventors of the present application filed the invention of the present application based on the findings described above.
即,為了解決所述課題而創造的本發明是一種玻璃基板的熱處理方法,其在利用支持構件從下方支持玻璃基板的狀態下,進行用以減小所述玻璃基板的熱收縮率的熱處理,所述玻璃基板的熱處理方法的特徵在於:將低摩擦片材至少配置於玻璃基板的下表面的被支持區域的周緣部、與對向於所述周緣部的支持構件的上表面之間,並且將低摩擦片材的上表面的靜摩擦係數(static friction coefficient)設為0.5以下,且將低摩擦片材的上表面的表面粗糙度Ra設為玻璃基板的下表面的表面粗糙度Ra的5倍以上的大小。此處,「表面粗糙度Ra」是基於JIS B0601:2001所規定的方法進行測定所得的值,「靜摩擦係數」是基於JIS K7125:1999所規定的方法進行測定所得的值。而且,「被支持區域」是玻璃基板下表面中的受到低摩擦片材支持的區域,其有時為玻璃基板的整個下表面,有時小於玻璃基板的下表面。That is, the present invention created to solve the above problem is a heat treatment method for a glass substrate, which performs heat treatment to reduce the thermal shrinkage of the glass substrate while supporting the glass substrate from below with a support member, The heat treatment method of the glass substrate is characterized in that a low-friction sheet is arranged at least between the peripheral portion of the supported region on the lower surface of the glass substrate and the upper surface of the supporting member facing the peripheral portion, and The static friction coefficient of the upper surface of the low-friction sheet is set to 0.5 or less, and the surface roughness Ra of the upper surface of the low-friction sheet is 5 times the surface roughness Ra of the lower surface of the glass substrate Above the size. Here, "surface roughness Ra" is a value measured based on the method prescribed in JIS B0601:2001, and "static friction coefficient" is a value measured based on the method prescribed in JIS K7125:1999. Moreover, the “supported area” is an area supported by the low-friction sheet in the lower surface of the glass substrate, which is sometimes the entire lower surface of the glass substrate, and sometimes smaller than the lower surface of the glass substrate.
根據此種構成,玻璃基板的至少下表面的被支持區域的周緣部與低摩擦片材的上表面接觸。由於低摩擦片材的上表面的靜摩擦係數小至0.5以下,故而玻璃基板下表面的被支持區域的周緣部會在低摩擦片材上滑動,玻璃基板以追隨其支持面(低摩擦片材的上表面、或低摩擦片材及支持構件的上表面)的方式受到導引。結果是不易在玻璃基板下表面的被支持區域與其支持面之間形成空隙,能夠抑制伴隨熱處理的應變的產生。According to this configuration, at least the peripheral portion of the supported region of the lower surface of the glass substrate is in contact with the upper surface of the low-friction sheet. Since the static friction coefficient of the upper surface of the low-friction sheet is as small as 0.5 or less, the peripheral portion of the supported area on the lower surface of the glass substrate slides on the low-friction sheet, and the glass substrate follows its supporting surface (low-friction sheet The upper surface, or the upper surface of the low-friction sheet and the supporting member) is guided. As a result, it is not easy to form a gap between the supported region on the lower surface of the glass substrate and its supporting surface, and it is possible to suppress the generation of strain accompanying heat treatment.
此處,若玻璃基板的下表面周緣部與低摩擦片材的上表面過於密合,則有可能產生如下問題,即在熱處理後,無法剝離玻璃基板。因此,在本申請案的發明中,將低摩擦片材的上表面的表面粗糙度Ra設為玻璃基板的下表面的表面粗糙度Ra的5倍以上的大小,從而緩和兩者的密合狀態。藉此,即使在熱處理後,亦能夠從低摩擦片材上剝離玻璃基板。Here, if the periphery of the lower surface of the glass substrate is too close to the upper surface of the low-friction sheet, there is a possibility that the glass substrate cannot be peeled off after the heat treatment. Therefore, in the invention of the present application, the surface roughness Ra of the upper surface of the low-friction sheet is set to 5 times or more the surface roughness Ra of the lower surface of the glass substrate, so as to ease the adhesion state of the two . Thereby, even after the heat treatment, the glass substrate can be peeled from the low-friction sheet.
在所述構成中,低摩擦片材的厚度較佳為0.01 mm~2 mm。藉此,低摩擦片材的上表面不易受到支持構件的上表面的狀態的影響。而且,亦無如下問題,該問題是指低摩擦片材的熱容量增大,在熱處理時產生大能量損失(energy loss)。In the above configuration, the thickness of the low-friction sheet is preferably 0.01 mm to 2 mm. With this, the upper surface of the low-friction sheet is not easily affected by the state of the upper surface of the support member. Furthermore, there is no problem that the heat capacity of the low-friction sheet increases and a large energy loss (energy loss) occurs during heat treatment.
在所述構成中,低摩擦片材的靜摩擦係數較佳為0.2以下。藉此,玻璃基板的下表面周緣部會更順利地在低摩擦片材的上表面上滑動,因此,玻璃基板容易追隨其支持面。In the above configuration, the static friction coefficient of the low-friction sheet is preferably 0.2 or less. As a result, the peripheral portion of the lower surface of the glass substrate slides on the upper surface of the low-friction sheet more smoothly, so the glass substrate easily follows the supporting surface.
在所述構成中,低摩擦片材較佳為包含具有層狀結晶構造的無機物。藉此,容易減小摩擦係數,並且能夠提高耐熱性。In the above configuration, the low-friction sheet preferably contains an inorganic substance having a layered crystal structure. With this, the friction coefficient is easily reduced, and the heat resistance can be improved.
在所述構成中,低摩擦片材較佳為可剝離地鋪設於支持構件的上表面。藉此,即使在低摩擦片材損傷的情況下,亦能夠容易地更換低摩擦片材。In the above configuration, the low-friction sheet is preferably detachably laid on the upper surface of the support member. Thereby, even in the case where the low-friction sheet is damaged, the low-friction sheet can be easily replaced.
在所述構成中,亦可以使玻璃基板的整個下表面成為被支持區域的方式,將低摩擦片材設置於玻璃基板的整個下表面、與對向於所述整個下表面的支持構件的上表面之間。藉此,支持玻璃基板的整個支持面包含低摩擦片材,因此,玻璃基板會更順利地追隨其支持面。In the above configuration, the entire lower surface of the glass substrate may be a supported region, and the low-friction sheet may be provided on the entire lower surface of the glass substrate and on the support member facing the entire lower surface Between the surfaces. As a result, the entire supporting surface supporting the glass substrate includes the low-friction sheet, so the glass substrate will follow its supporting surface more smoothly.
在所述構成中,亦可以使玻璃基板的下表面的除了周緣部以外的區域成為被支持區域的方式,使玻璃基板的下表面的周緣部從低摩擦片材伸出。藉此,能夠利用玻璃基板的伸出部來對玻璃基板進行操作,因此,將玻璃基板載置於低摩擦片材上的載置作業、或從低摩擦片材上取出所述玻璃基板的取出作業變得容易。 [發明的效果]In the above configuration, the region of the lower surface of the glass substrate other than the peripheral portion may be a supported region, and the peripheral portion of the lower surface of the glass substrate may protrude from the low-friction sheet. Thereby, the glass substrate can be manipulated by the extending portion of the glass substrate. Therefore, the placement operation of placing the glass substrate on the low-friction sheet or the removal of the glass substrate from the low-friction sheet Homework becomes easy. [Effect of invention]
如上所述,根據本發明,能夠藉由用以減小玻璃基板的熱收縮率的熱處理,抑制玻璃基板產生應變。As described above, according to the present invention, it is possible to suppress the occurrence of strain in the glass substrate by the heat treatment for reducing the thermal shrinkage rate of the glass substrate.
以下,參照隨附圖式來對一實施形態的玻璃基板的熱處理方法進行說明。Hereinafter, the heat treatment method of the glass substrate of one embodiment will be described with reference to the accompanying drawings.
如圖1(a)及圖1(b)所示,作為熱處理對象的玻璃基板1載置於低摩擦片材3的上表面3a,所述低摩擦片材3配置於支持構件(承載板)2的上表面2a。而且,在此種支持形態下,將玻璃基板1導入至熱處理裝置(熱處理爐)而進行加熱,藉此,執行用以減小玻璃基板的熱收縮率的熱處理步驟。再者,亦可在熱處理步驟之前,設置將玻璃基板1洗淨的洗淨步驟。若預先設置此種洗淨步驟,則能夠防止附著於玻璃基板1表面的異物隨著熱處理而燒結於玻璃基板1的表面。As shown in FIGS. 1( a) and 1 (b ), the
以下,分別對玻璃基板1以及熱處理步驟中所使用的低摩擦片材3、支持構件2及熱處理裝置10進行詳述。Hereinafter, the
[玻璃基板] 玻璃基板1呈俯視矩形形狀,該玻璃基板1的尺寸較佳為500 mm見方以上,更佳為700 mm見方以上,進而較佳為1000 mm見方以上,最佳為1300 mm見方以上。一般而言,玻璃基板1的尺寸越大,則熱處理後的玻璃基板1越容易產生應變。因此,玻璃基板1的尺寸越大,則越容易享受到本實施形態的效果。再者,玻璃基板1不限於矩形形狀,亦可為三角形或五邊形以上的多邊形、圓形(包含橢圓形)、不規則形狀等。[Glass substrate] The
玻璃基板1的厚度為0.7 mm以下,較佳為0.5 mm以下,更佳為0.4 mm以下,最佳為0.3 mm以下。通常,厚度越小,則自重越小,因此,難以追隨支持構件2的上表面。因此,越是厚度薄的玻璃基板1,則低摩擦片材3的效果越大。而且,玻璃基板1的厚度越小,則亦能夠使對於以玻璃基板1作為構成組件的製品(例如FPD)的薄型化或輕量化等的貢獻度越高。然而,若玻璃基板1的厚度太小,則無法確保玻璃基板1所要求的最低限度的強度。因此,玻璃基板1的厚度較佳為1 μm以上,更佳為3 μm以上,最佳為5 μm以上。The thickness of the
玻璃基板1的應變點為650℃以上,較佳為660℃以上,更佳為670℃以上,最佳為680℃以上。應變點越高,則越容易減小熱收縮率。另一方面,若應變點過高,則玻璃基板1的生產性會顯著下降,因此,玻璃基板1的應變點較佳為725℃以下,更佳為720℃以下,最佳為715℃以下。再者,此處所謂的應變點是基於美國材料試驗學會(American Society for Testing and Materials,ASTM)C336所規定的方法進行測定所得的值。The strain point of the
具有所述尺寸、厚度及應變點的玻璃基板1例如能夠由矽酸鹽玻璃、二氧化矽玻璃、硼矽酸玻璃、鈉玻璃、無鹼玻璃等形成。在本實施形態中,使用由所述各種玻璃中的最不易產生經時劣化的無鹼玻璃形成的玻璃基板。此處,所謂無鹼玻璃,是指實質上不含有鹼成分(鹼金屬氧化物)的玻璃,具體而言,是指鹼成分的含量為3000 ppm以下的玻璃。作為無鹼玻璃,使用鹼成分的含量較佳為1000 ppm以下,更佳為500 ppm以下,最佳為300 ppm以下的無鹼玻璃。The
玻璃基板1的下表面1b的表面粗糙度Ra較佳為2.0 nm以下,更佳為1.0 nm以下,進而更佳為0.5 nm以下,最佳為0.2 nm以下。再者,玻璃基板1的上表面1a的表面粗糙度Ra可與下表面1b相同,亦可與下表面1b不同。The surface roughness Ra of the
玻璃基板1例如藉由溢流下引(overflow down-draw)法、流孔下引(slot down-draw)法、碾平(roll out)法、浮式(float)法、上引(up draw)法、再曳引(redraw)法製造。在本實施形態中,使用藉由溢流下引法製造的玻璃基板。The
[低摩擦片材][Low friction sheet]
在該實施形態中,低摩擦片材3配置於玻璃基板1的整個下表面1b、與對向於該下表面1b的支持構件2的上表面2a之間。即,在該實施形態中,玻璃基板1的整個下表面1b設為玻璃基板1的被支持區域。進而,低摩擦片材3具有向玻璃基板1的外方側伸出的伸出部3c。再者,低摩擦片材3亦可僅設置於與玻璃基板1的下表面1b中的周緣部1c(圖中的影線部分)相對應的區域。而且,亦可省略伸出部3c。即,玻璃基板1的端面與低摩擦片材3的端面處於同一個面。當然,低摩擦片材3的端面亦可位於較玻璃基板1的端面稍靠內側的位置。在該情況下,玻璃基板1的被支持區域小於玻璃基板1的下表面1b。In this embodiment, the low-
為了抑制伴隨熱處理的玻璃基板1的應變的產生,需要在玻璃基板1充分地追隨低摩擦片材3的上表面3a的狀態下開始熱處理。因此,低摩擦片材3的上表面3a的靜摩擦係數設定為0.5以下。低摩擦片材3的上表面3a的靜摩擦係數較佳為0.4以下,更佳為0.3以下,尤佳為0.2以下。靜摩擦係數越小,則越能夠抑制伴隨熱處理而產生的玻璃基板1的平面方向的應變。再者,低摩擦片材3的下表面3b的靜摩擦係數並無特別限定,可與上表面3a相同,亦可與上表面3a不同。In order to suppress the occurrence of the strain of the
此處,若低摩擦片材3的上表面3a的表面平滑性過高,則有時低摩擦片材3與玻璃基板1會過度地密合,導致玻璃基板1在熱處理中裂開,或在熱處理後,玻璃基板1貼附於低摩擦片材3而無法將兩者分離。而且,當將玻璃基板1載置於低摩擦片材3的上表面3a時,亦存在如下情況,即,接觸部位依序貼附,玻璃基板1難以充分地追隨低摩擦片材3的上表面3a。尤其,使用於顯示器用途的玻璃基板要求高的表面平滑性,因此,一般使用表面粗糙度Ra極小的玻璃基板(例如Ra為0.2 nm左右),故而容易產生如上所述的問題。因此,為了緩和低摩擦片材3的上表面3a與玻璃基板1的下表面1b的密合,低摩擦片材3的上表面3a的表面粗糙度Ra設定為玻璃基板1的下表面1b的表面粗糙度Ra的5倍以上的大小。較佳為10倍以上,更佳為20倍以上,最佳為50倍以上。Here, if the surface smoothness of the
低摩擦片材3的上表面3a的表面粗糙度Ra較佳為0.02 μm以上。更佳為0.05 μm以上,進而較佳為0.1 μm以上,進而更佳為0.2 μm以上,最佳為0.5 μm以上。藉由預先設定於所述範圍內,能夠抑制玻璃基板1與低摩擦片材3的貼附。另一方面,若表面粗糙度Ra過大,則靜摩擦係數會變大,因此,低摩擦片材3的上表面3a的表面粗糙度Ra較佳設為5 μm以下。再者,低摩擦片材3的下表面3b的表面粗糙度Ra並無特別限定,可與上表面3a相同,亦可與上表面3a不同。The surface roughness Ra of the
當將玻璃基板1的下表面1b的表面粗糙度Ra設為Ra1,將支持構件2的上表面2a的表面粗糙度Ra設為Ra2時,低摩擦片材3的厚度較佳為大於Ra1與Ra2的相加值。更佳為Ra1+Ra2+10 μm以上,進而更佳為Ra1+Ra2+50 μm以上,最佳為Ra1+Ra2+100 μm以上。藉由預先設定於所述範圍,能夠容易地將玻璃基板1與支持構件2分離,從而易於享受低摩擦片材3的功能。另一方面,若低摩擦片材3的厚度過大,則熱容量會增大,熱處理時的能量損失增大。而且,低摩擦片材3的製作成本亦有可能會升高。因此,低摩擦片材3的厚度較佳設為Ra1+Ra2+2000 μm以下。具體而言,低摩擦片材3的厚度較佳為0.01 mm~2 mm。When the surface roughness Ra of the
低摩擦片材3較佳為預先設為能夠從支持構件2上拆除的形態。藉此,在低摩擦片材3損傷的情況下,能夠容易地進行更換。結果是容易抑制隨著低摩擦片材3的損傷而引起的玻璃基板1的品質下降。具體而言,例如將低摩擦片材3不經由黏接層等而直接鋪設於支持構件2的上表面2a,並且將低摩擦片材3的下表面3b的表面粗糙度Ra設定為大於支持構件2的上表面2a的表面粗糙度Ra。The low-
低摩擦片材3較佳為包含具有層狀結晶構造的無機物。作為具有層狀結晶構造的無機物,例如有石墨、氮化硼、二硫化鉬、滑石(talc)、雲母(mica)等。其中,考慮到廉價且容易製造為片狀,較佳為使用石墨。構成低摩擦片材3的所述無機物的純度以質量%計,較佳為99.0%以上。更佳為99.5%以上,進而更佳為99.8%以上,最佳為99.9%以上。純度越高,則越能夠抑制例如由金屬等雜質引起的對玻璃基板造成的擦傷。在本實施形態中,使用所述各種無機物中的較廉價、亦容易大型化且純度為99.9%的石墨。The low-
對於熱處理後的玻璃基板1,能夠在不對應變或熱收縮率的不均產生影響的範圍內,將相對於玻璃基板1的低摩擦片材3的尺寸減小。藉此,玻璃基板1的載置及取出作業變得容易。在考慮作業性的情況下,低摩擦片材3的面積相對於玻璃基板1的整個下表面1b的面積的比例較佳設為0.5以上且為1.0以下。更佳為0.6以上且不足1.0,進而更佳為0.7以上且不足1.0,最佳為0.7以上且為0.9以下。For the
若以所述方式來對低摩擦片材3的靜摩擦係數與表面粗糙度Ra進行設定,則能夠享受如下所述的效果。即,不易維持如下狀態,該狀態如圖2(a)所示,玻璃基板1的下表面1b的周緣部1c(尤其為下表面1b與端面1d的交叉部1x)卡在低摩擦片材3的上表面3a上,在玻璃基板1與低摩擦片材3之間形成空隙C。即使暫時產生圖2(a)的狀態,玻璃基板1的下表面1b的周緣部1c亦會在低摩擦片材3的上表面3a上向外方側(X方向)滑動,隨之,玻璃基板1的下表面1b一面下降(Y方向),一面接近低摩擦片材3。而且,玻璃基板1從圖2(a)的狀態進一步下降,藉此,即使玻璃基板1的下表面1b的周緣部1c開始與低摩擦片材3的上表面3a發生面接觸,玻璃基板1的下表面1b的周緣部1c亦會在低摩擦片材3的上表面3a上向外方側(X方向)滑動,隨之,玻璃基板1的下表面1b一面下降(Y方向),一面接近低摩擦片材3。藉此,如圖2(b)所示,玻璃基板1正確地追隨低摩擦片材3的上表面3a。結果是不易在玻璃基板1的下表面1b與低摩擦片材3的上表面3a之間形成空隙C,能夠抑制伴隨熱處理的應變的產生。而且,如圖2(b)所示,即使在玻璃基板1追隨低摩擦片材3的狀態下進行熱處理,由於兩者未過度地密合,故而在熱處理後,亦能夠容易地從低摩擦片材3上分離玻璃基板1。If the static friction coefficient and the surface roughness Ra of the low-
[支持構件] 支持構件2從下方側支持作為熱處理對象的玻璃基板1及低摩擦片材3,且能夠使用玻璃、陶瓷、金屬等具有耐熱性的材料。其中,較佳為使用熱膨脹係數低且耐熱衝擊性高的結晶化玻璃作為支持構件2。[Support Member] The
支持構件2的厚度較佳為0.5 mm~4.0 mm。更佳為0.5 mm~3.5 mm,進而較佳為0.5 mm~3.0 mm,進而更佳為0.5 mm~2.5 mm,最佳為1.0 mm~2.5 mm。藉由預先設定於所述範圍,支持構件2發生熱變形的可能性低,而且,支持構件2的熱容量亦不會增大,不會在熱處理時產生大能量損失。因此,能夠精度良好且有效率地對玻璃基板1進行熱處理。The thickness of the
[熱處理裝置][Heat treatment device]
執行熱處理的熱處理裝置較佳為使用不包括搬送裝置的批次式爐或逐片式爐。於此種爐中,玻璃基板1在靜置狀態下接受熱處理,因此,能夠抑制伴隨搬送的玻璃基板1的滑動。結果是容易在玻璃基板1的面內保持均一的溫度分佈,能夠抑制熱收縮率的不均、或由溫度分佈引起的應變或形狀的惡化。而且,亦能夠減少在熱處理中,因與爐內構件發生碰撞而導致破損的可能性。在本實施形態中,如圖3所示,使用批次式爐的熱處理裝置10。The heat treatment apparatus that performs heat treatment is preferably a batch furnace or a piece-by-piece furnace that does not include a transfer device. In such a furnace, the
如圖3所示,熱處理裝置10包括:玻璃室(glass chamber)11;升降台13,其在載置有玻璃架12的狀態下,相對於玻璃室11升降移動;爐壁14,其收容玻璃室11;以及加熱器15,其從外部對玻璃室11進行加熱。該熱處理裝置10配設於無塵室(clean room)內。總之,熱處理步驟在無塵室內執行。As shown in FIG. 3, the
玻璃室11呈下端開口的有蓋筒狀,且內部具有熱處理空間S。該玻璃室11藉由使石英玻璃一體成形而形成為有蓋筒狀,藉由無接縫的連續的面來劃分形成熱處理空間S。
The
玻璃架12具有沿著上下方向設置為多段狀的多個收容部16,各收容部16是由豎立設置於升降台上的至少一對柱部12a、與可裝卸地安裝於柱部12a的架板12b劃分形成。柱部12a及架板12b均由石英玻璃形成。在本實施形態中,採用格子狀的框體作為架板12b,於架板12b的上表面設置有多個插銷狀突起。而且,橫置狀態的玻璃基板1由包括低摩擦片材3的支持構件2從下方側支持,且由插銷狀突起從下方側支持。以下亦將以支持構件2支持玻璃基板1者稱為組合件。
The
升降台13具有載置有玻璃架12的石英玻璃製的載置部13a,當該載置部13a位於上升位置時,玻璃室11的下端開口部封閉,玻璃架12配置於熱處理空間S內。另一方面,當載置部13a下降至下降位置時,相對於載置於載置部13a的玻璃架12,進行組合件的裝入及卸出。
The lifting table 13 has a placing
爐壁14呈下端開口的有蓋筒狀,且整體包含耐火物。於爐壁14的側部內壁面安裝有加熱器15。例如使用以鎳鉻合金(nichrome)系發熱體為代表的金屬系發熱體作為加熱器15。
The
亦可於熱處理裝置10中,另外設置從外部對玻璃室11進行冷卻的冷卻單元(例如送風機)。藉由預先設置此種冷卻單元,能夠效率良好地對由加熱器15加熱後的熱處理空間的環境進行冷卻。In the
其次,對具有以上構成的熱處理裝置所執行的熱處理步驟進行說明。在熱處理步驟中,依序實施升溫步驟、保溫步驟及降溫步驟。Next, the heat treatment steps performed by the heat treatment apparatus having the above configuration will be described. In the heat treatment step, the temperature increase step, the heat preservation step, and the temperature decrease step are sequentially performed.
在實施升溫步驟之前,先使升降台13的載置部13a位於下降位置,且將組合件裝入至玻璃架12的各收容部16之後,使升降台13進行上升移動,將玻璃架12配置於玻璃室11內的熱處理空間S。再者,例如藉由能夠從下方側支持組合件的機器叉(robot fork),將組合件裝入至各收容部16(以及在熱處理後,從各收容部16卸出組合件)。Before performing the temperature raising step, first place the mounting
升溫步驟是使玻璃基板1的溫度上升至規定溫度的步驟,此處,對加熱器的輸出進行調整,使得玻璃基板1以10℃/分鐘以上,較佳為15℃/分鐘以上,更佳為20℃/分鐘以上的升溫速度升溫。然而,若玻璃基板1的升溫速度過快,則玻璃基板1破損等的可能性會升高,因此,升溫速度設為100℃/分鐘以下,更佳為設為80℃/分鐘以下。The temperature raising step is a step of raising the temperature of the
接著,在升溫步驟中,從外部對玻璃室11(玻璃室11內的熱處理空間S)進行加熱,直至玻璃基板1的溫度為規定溫度為止。當將玻璃基板1的應變點設為T[單位:℃]時,對玻璃室11進行加熱,直至玻璃基板1的溫度較佳為T℃以下,更佳為(T-10℃)以下,進而較佳為(T-20℃)以下,進而更佳為(T-30℃)以下,尤佳為(T-40℃)以下,最佳為(T-50℃)以下為止。藉此,能夠儘量防止伴隨熱處理的玻璃基板1的形狀變化,且能夠減小玻璃基板1的熱收縮率。然而,若玻璃基板1未充分地被加熱,則無法適當地減小玻璃基板1的熱收縮率。因此,對玻璃室11進行加熱,直至玻璃基板1的溫度為(T-200℃)以上為止。Next, in the temperature increasing step, the glass chamber 11 (the heat treatment space S in the glass chamber 11) is heated from the outside until the temperature of the
在保溫步驟中,將已加熱至規定溫度的玻璃基板1在所述規定溫度下保持規定時間(具體而言為0.5分鐘~60分鐘)。藉此,能夠適當地減小各個玻璃基板1的熱收縮率,且能夠減小玻璃基板1相互間的熱收縮率的不均。In the heat retention step, the
在降溫步驟中,使玻璃基板1的溫度逐步下降。降溫速度較佳為1℃/分鐘以上,更佳為5℃/分鐘以上,進而較佳為10℃/分鐘以上。藉此,能夠使降溫步驟的處理時間縮短,且能夠提高玻璃基板1的生產性。然而,若降溫速度過快,則無法充分地減小玻璃基板1的熱收縮率,而且玻璃基板1的翹曲增大的可能性升高。因此,降溫速度較佳為100℃/分鐘以下,更佳為80℃/分鐘以下。In the temperature lowering step, the temperature of the
再者,利用以下所述的方法,將玻璃基板1中所殘留的應變作為因應變而產生的應力進行測定。玻璃基板1中的應變能夠利用光學雙折射的測定,即正交的直線偏振波的光路差的測定來估算。將光路差設為R(nm),因應變而產生的應力(準確而言為偏差應力)F(MPa)表示為F=R/(C×L)。此處,L為偏振波通過的距離(cm),C(nm/cm)為取決於玻璃的比例常數,且被稱為光彈性常數(photoelastic constant)。In addition, by the method described below, the strain remaining in the
對於熱處理後的玻璃基板1而言,因殘留的應變而產生的最大應力較佳為1 MPa以下。更佳為0.8 MPa以下,進而更佳為0.6 MPa以下,最佳為0.5 MPa以下。若處於所述範圍,則即使分割切斷,亦能夠抑制玻璃基板1的變形。For the
以上,對本發明實施形態的玻璃基板的熱處理方法進行了說明,但本發明的實施形態並不限定於此,能夠在不脫離本發明宗旨的範圍內實施各種變更。 [實施例]In the above, the heat treatment method of the glass substrate according to the embodiment of the present invention has been described, but the embodiment of the present invention is not limited to this, and various modifications can be made without departing from the gist of the present invention. [Example]
分別於在將低摩擦片材配置於支持構件的上表面,且將玻璃基板載置於該低摩擦片材的上表面的狀態下實施熱處理的情況(以下,亦將其稱為「實施例」)下,以及於在將玻璃基板直接載置於支持構件的上表面的狀態下實施熱處理的情況(以下,亦將其稱為「比較例1及比較例2」)下,在熱處理前後,進行確認玻璃基板的平面方向的應變的確認試驗。When the low friction sheet is arranged on the upper surface of the support member and the glass substrate is placed on the upper surface of the low friction sheet, the heat treatment is performed (hereinafter, it will also be referred to as "Example") ), and in the case where the heat treatment is performed with the glass substrate directly placed on the upper surface of the support member (hereinafter, also referred to as "Comparative Example 1 and Comparative Example 2"), before and after the heat treatment, A confirmation test to confirm the strain in the plane direction of the glass substrate.
當實施確認試驗時,在實施例中,準備4個包含支持構件/低摩擦片材/玻璃基板的組合件,在比較例1及比較例2中,準備4個包含支持構件/玻璃基板的組合件。接著,對該些各組合件實施熱處理。When the confirmation test was carried out, in the examples, four combinations including the supporting member/low friction sheet/glass substrate were prepared, and in Comparative Examples 1 and 2, four combinations including the supporting member/glass substrate were prepared. Pieces. Next, heat treatment is performed on each of these assemblies.
作為熱處理對象的玻璃基板在實施例、比較例1及比較例2中通用。使用厚度為0.5 mm的730 mm×920 mm的矩形形狀的玻璃基板(具體而言為日本電氣硝子股份有限公司製造的無鹼玻璃基板OA-11)作為玻璃基板。玻璃基板的線性熱膨脹係數為37×10-7 /℃(30℃~380℃),應變點為685℃,光彈性常數為30 nm/cm。而且,玻璃基板的下表面的表面粗糙度Ra為0.2 nm。再者,玻璃基板的上表面的表面粗糙度Ra雖不會直接影響確認試驗的結果,但為與玻璃基板的下表面相同的程度。The glass substrates to be heat-treated are common to Examples, Comparative Examples 1 and 2. As the glass substrate, a rectangular glass substrate with a thickness of 0.5 mm of 730 mm×920 mm (specifically, an alkali-free glass substrate OA-11 manufactured by NEC Glass Co., Ltd.) was used. The linear thermal expansion coefficient of the glass substrate is 37×10 -7 /℃ (30℃~380℃), the strain point is 685℃, and the photoelastic constant is 30 nm/cm. Furthermore, the surface roughness Ra of the lower surface of the glass substrate is 0.2 nm. In addition, although the surface roughness Ra of the upper surface of the glass substrate does not directly affect the result of the confirmation test, it is the same level as the lower surface of the glass substrate.
在實施例、比較例1及比較例2中,支持構件的除了表面粗糙度Ra及靜摩擦係數以外的條件通用。使用厚度為4 mm的830 mm×1020 mm的矩形形狀的結晶化玻璃板(具體而言為日本電氣硝子股份有限公司製造的耐思瑞(NEOCERAM)N-0)作為支持構件。該支持構件的線性熱膨脹係數為-1×10-7 /℃(30℃~750℃)。支持構件的上表面的表面粗糙度Ra在比較例1中為0.8 μm,在比較例2中為0.5 nm。支持構件的上表面的靜摩擦係數在比較例1中為1.3,在比較例2中為0.8。再者,在比較例1、2中,使用了藉由研磨對所述結晶化玻璃板的表面進行調整後的結晶化玻璃板。實施例中的支持構件的上表面的表面粗糙度Ra及靜摩擦係數不會直接影響確認試驗的結果,因此未進行測定,而使用與比較例1相同程度的表面粗糙度Ra及靜摩擦係數。In Examples, Comparative Examples 1 and 2, the conditions of the support member other than the surface roughness Ra and the static friction coefficient are common. A rectangular-shaped crystallized glass plate (specifically, NEOCERAM N-0 manufactured by Nippon Electric Glass Co., Ltd.) of 830 mm×1020 mm with a thickness of 4 mm was used as a support member. The linear thermal expansion coefficient of the support member is -1×10 -7 /℃ (30℃~750℃). The surface roughness Ra of the upper surface of the support member was 0.8 μm in Comparative Example 1, and 0.5 nm in Comparative Example 2. The static friction coefficient of the upper surface of the support member was 1.3 in Comparative Example 1, and 0.8 in Comparative Example 2. In addition, in Comparative Examples 1 and 2, a crystallized glass plate whose surface was adjusted by polishing was used. The surface roughness Ra and the static friction coefficient of the upper surface of the support member in the examples did not directly affect the results of the confirmation test. Therefore, the surface roughness Ra and the static friction coefficient of the same degree as in Comparative Example 1 were not measured.
使用厚度為200 μm的730 mm×920 mm的矩形形狀的石墨(純度為99.9%以上)作為低摩擦片材。低摩擦片材的上表面的表面粗糙度Ra為1.0 μm,靜摩擦係數為0.1~0.2。再者,低摩擦片材的下表面的表面粗糙度Ra及靜摩擦係數雖不會直接影響確認試驗的結果,但為與低摩擦片材的上表面相同的程度。As a low-friction sheet, a 730 mm × 920 mm rectangular graphite (purity of 99.9% or more) with a thickness of 200 μm was used. The surface roughness Ra of the upper surface of the low-friction sheet is 1.0 μm, and the static friction coefficient is 0.1 to 0.2. In addition, although the surface roughness Ra and the static friction coefficient of the lower surface of the low-friction sheet do not directly affect the results of the confirmation test, they are the same as the upper surface of the low-friction sheet.
熱處理條件在實施例、比較例1及比較例2中通用。熱處理條件是使室溫左右的玻璃基板以10℃/分鐘的升溫速度升溫至650℃之後,以650℃保持3分鐘,然後,使玻璃基板以60℃/分鐘的降溫速度降溫至室溫。再者,在用於試驗的全部玻璃基板中,熱處理前的因應變而產生的最大應力值為0.3 MPa~0.4 MPa。The heat treatment conditions are common to Examples, Comparative Examples 1 and 2. The heat treatment condition is to raise the temperature of the glass substrate around room temperature to 650°C at a temperature increase rate of 10°C/min, hold it at 650°C for 3 minutes, and then cool the glass substrate to room temperature at a temperature decrease rate of 60°C/min. In addition, in all the glass substrates used for the test, the maximum stress value due to strain before heat treatment was 0.3 MPa to 0.4 MPa.
將所述確認試驗的試驗結果表示於表1。The test results of the confirmation test are shown in Table 1.
[表1]
表1亦表明在實施例中,構成玻璃基板的支持面的低摩擦片材的上表面的靜摩擦係數為0.5以下,且低摩擦片材的上表面的表面粗糙度Ra為玻璃基板的表面粗糙度Ra的5倍以上。另一方面,在比較例1中,構成玻璃基板的支持面的支持構件的上表面的靜摩擦係數超過0.5,且支持構件的上表面的表面粗糙度Ra為玻璃基板的表面粗糙度Ra的5倍以上。而且,在比較例2中,構成玻璃基板的支持面的支持構件的上表面的靜摩擦係數超過0.5,且支持構件的上表面的表面粗糙度Ra不足玻璃基板的表面粗糙度Ra的5倍。Table 1 also shows that in the examples, the static friction coefficient of the upper surface of the low-friction sheet constituting the support surface of the glass substrate is 0.5 or less, and the surface roughness Ra of the upper surface of the low-friction sheet is the surface roughness of the glass substrate Ra more than 5 times. On the other hand, in Comparative Example 1, the static friction coefficient of the upper surface of the support member constituting the support surface of the glass substrate exceeded 0.5, and the surface roughness Ra of the upper surface of the support member was 5 times the surface roughness Ra of the glass substrate the above. Furthermore, in Comparative Example 2, the static friction coefficient of the upper surface of the support member constituting the support surface of the glass substrate exceeds 0.5, and the surface roughness Ra of the upper surface of the support member is less than 5 times the surface roughness Ra of the glass substrate.
結果是在實施例中,對於全部的試樣,熱處理後的玻璃基板的因應變而產生的最大應力的值為0.3 MPa~0.4 MPa,未出現由熱處理引起的變化。相對於此,在比較例1中,熱處理後的玻璃基板的最大應力值為超過1.0 MPa的大的值。進而,在比較例2中,支持構件的上表面的表面粗糙度Ra不足玻璃基板的表面粗糙度Ra的5倍,因此,當玻璃基板與支持構件過度地密合,在熱處理時產生了玻璃基板與支持構件的熱膨脹差時,因該熱膨脹差而導致玻璃基板破損(在熱處理中破損)。因此,本發明的熱處理方法可謂在抑制伴隨熱處理的應變的產生方面有用。As a result, in the examples, for all the samples, the value of the maximum stress due to the strain of the glass substrate after the heat treatment was 0.3 MPa to 0.4 MPa, and no change due to the heat treatment occurred. In contrast, in Comparative Example 1, the maximum stress value of the glass substrate after the heat treatment was a large value exceeding 1.0 MPa. Furthermore, in Comparative Example 2, the surface roughness Ra of the upper surface of the support member was less than 5 times the surface roughness Ra of the glass substrate. Therefore, when the glass substrate and the support member were excessively adhered, the glass substrate was generated during the heat treatment When there is a difference in thermal expansion from the support member, the glass substrate is damaged due to the difference in thermal expansion (breakage during heat treatment). Therefore, the heat treatment method of the present invention can be said to be useful in suppressing the generation of strain accompanying heat treatment.
結合所述確認試驗,評價玻璃基板伴隨熱處理而以何種程度進行熱收縮,即評價玻璃基板的熱收縮率。依照以下的(1)-(5)所示的順序,測定、計算出玻璃基板的熱收縮率。 (1)如圖4(a)所示,準備160 mm×30 mm的短條狀試樣G作為玻璃基板的試樣。 (2)使用粒度為1000的耐水研磨紙,分別在短條狀試樣G的長邊方向的兩端部的從端緣向長邊方向中央側偏移了20 mm~40 mm左右的位置,形成沿著短邊方向延伸的標記M。 (3)沿著長邊方向,將形成有標記M的短條狀試樣一分為二,製作試樣片Ga、Gb。 (4)利用熱處理裝置,僅對兩個試樣片Ga、Gb中的任一個試樣片(此處為試樣片Gb)進行熱處理。依照如下順序實施熱處理,即,以5℃/分鐘的升溫速度從常溫升溫至500℃→以500℃保持一小時→以5℃/分鐘的降溫速度降溫至常溫。 (5)以所述形態,對試樣片Gb實施熱處理之後,並排地配置未實施熱處理的試樣片Ga、與實施熱處理後的試樣片Gb,利用雷射顯微鏡來讀取兩個試樣片Ga、Gb中的標記M的位置偏移量ΔL1 、ΔL2 ,基於下述的數式而計算出熱收縮率[單位:ppm]。再者,下述數式中的L0 為熱處理前的標記M間的分隔距離。 熱收縮率=[{ΔL1 (μm)+ΔL2 (μm)}×103 ]/L0 (mm)In conjunction with the confirmation test, the degree to which the glass substrate thermally shrinks along with the heat treatment, that is, the thermal shrinkage rate of the glass substrate is evaluated. The thermal shrinkage rate of the glass substrate was measured and calculated according to the procedures shown in (1) to (5) below. (1) As shown in FIG. 4(a), a short strip-shaped sample G of 160 mm×30 mm is prepared as a glass substrate sample. (2) Using water-resistant abrasive paper with a particle size of 1000, the positions of both ends of the short strip G in the longitudinal direction are offset by about 20 mm to 40 mm from the edge to the central side in the longitudinal direction, A mark M extending in the short-side direction is formed. (3) Along the longitudinal direction, the short strip-shaped sample on which the mark M is formed is divided into two to prepare sample pieces Ga and Gb. (4) Using a heat treatment apparatus, only one of the two sample pieces Ga and Gb (here, the sample piece Gb) is heat-treated. The heat treatment was performed in the following order, that is, the temperature was raised from normal temperature to 500°C at a temperature increase rate of 5°C/min → held at 500°C for one hour → the temperature was lowered to normal temperature at a temperature decrease rate of 5°C/min. (5) In the above-mentioned form, after the heat treatment of the sample piece Gb, the unheated sample piece Ga and the heat-treated sample piece Gb are arranged side by side, and two samples are read by a laser microscope The positional deviation amounts ΔL 1 and ΔL 2 of the mark M in the sheets Ga and Gb were calculated based on the following formulas [unit: ppm]. In addition, L 0 in the following formula is the separation distance between the marks M before heat treatment. Thermal shrinkage rate = [{ΔL 1 (μm) + ΔL 2 (μm)} × 10 3 ]/L 0 (mm)
依照所述順序測定、計算出的玻璃基板的熱收縮率均為10 ppm左右的非常小的值。The thermal shrinkage rates of the glass substrates measured and calculated in this order are very small values around 10 ppm.
根據以上內容,可理解本發明在減小玻璃基板的熱收縮率,且抑制伴隨熱處理的應變的產生方面有用。From the above, it can be understood that the present invention is useful in reducing the thermal shrinkage rate of a glass substrate and suppressing the generation of strain accompanying heat treatment.
1‧‧‧玻璃基板1a‧‧‧上表面1b‧‧‧下表面1c‧‧‧周緣部1d‧‧‧端面1x‧‧‧交叉部2‧‧‧支持構件2a‧‧‧上表面3‧‧‧低摩擦片材3a‧‧‧上表面3b‧‧‧下表面3c‧‧‧伸出部10‧‧‧熱處理裝置11‧‧‧玻璃室12‧‧‧玻璃架12a‧‧‧柱部12b‧‧‧架板13‧‧‧升降台13a‧‧‧載置部14‧‧‧爐壁15‧‧‧加熱器16‧‧‧收容部A-A‧‧‧線C‧‧‧空隙G‧‧‧短條狀試樣Ga‧‧‧試樣片Gb‧‧‧試樣片L0
‧‧‧分隔距離M‧‧‧標記S‧‧‧熱處理空間X‧‧‧方向Y‧‧‧方向ΔL1
‧‧‧位置偏移量ΔL2
‧‧‧位置偏移量1‧‧‧Glass substrate 1a‧‧‧
圖1(a)~圖1(b)是表示本發明實施形態的熱處理方法執行時的玻璃基板的支持形態的圖,圖1(a)是其俯視圖,圖1(b)是圖1(a)所示的A-A線箭視剖面圖。 圖2(a)~圖2(b)是表示相對於圖1(a)~圖1(b)的低摩擦片材的玻璃基板周緣部的載置形態的變化情況的放大圖。 圖3是實施本發明實施形態的熱處理方法時所使用的熱處理裝置的剖面圖。 圖4(a)~圖4(c)是用以對玻璃基板的熱收縮率的測定順序進行說明的圖。1(a) to 1(b) are diagrams showing the supporting form of the glass substrate when the heat treatment method of the embodiment of the present invention is executed, FIG. 1(a) is a plan view thereof, and FIG. 1(b) is FIG. 1(a). ) Shows the arrow AA line sectional view. FIGS. 2( a) to 2 (b) are enlarged views showing changes in the mounting form of the peripheral portion of the glass substrate with respect to the low-friction sheet of FIGS. 1 (a) to 1 (b ). 3 is a cross-sectional view of a heat treatment apparatus used when implementing the heat treatment method according to the embodiment of the present invention. 4( a) to 4 (c) are diagrams for explaining the measurement procedure of the thermal shrinkage rate of the glass substrate.
1‧‧‧玻璃基板 1‧‧‧Glass substrate
1a‧‧‧上表面 1a‧‧‧upper surface
1c‧‧‧周緣部 1c‧‧‧Perimeter
2‧‧‧支持構件 2‧‧‧Support component
2a‧‧‧上表面 2a‧‧‧upper surface
3‧‧‧低摩擦片材 3‧‧‧Low friction sheet
3a‧‧‧上表面 3a‧‧‧upper surface
3c‧‧‧伸出部 3c‧‧‧Extended part
A-A‧‧‧線 A-A‧‧‧line
Claims (7)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-063975 | 2016-03-28 | ||
JP2016063975A JP6598071B2 (en) | 2016-03-28 | 2016-03-28 | Method for heat treatment of glass substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201733934A TW201733934A (en) | 2017-10-01 |
TWI690498B true TWI690498B (en) | 2020-04-11 |
Family
ID=59983014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106101769A TWI690498B (en) | 2016-03-28 | 2017-01-19 | Heat treatment method of glass substrate |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6598071B2 (en) |
CN (1) | CN107235622B (en) |
TW (1) | TWI690498B (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007084379A (en) * | 2005-09-21 | 2007-04-05 | Nippon Electric Glass Co Ltd | Method and apparatus for heat-treating sheet glass, and heat-treating tool |
JP2009298697A (en) * | 2009-08-12 | 2009-12-24 | Nippon Electric Glass Co Ltd | Setter for heat treatment of glass substrate |
TW201114714A (en) * | 2009-09-18 | 2011-05-01 | Nippon Electric Glass Co | Fabricating and processing methods of glass film, and glass film laminated body |
TW201422425A (en) * | 2012-11-09 | 2014-06-16 | Nippon Electric Glass Co | Glass film laminate and electronic and electric devices |
TW201446667A (en) * | 2013-04-05 | 2014-12-16 | Nippon Electric Glass Co | Glass substrate and gradual cooling method thereof |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000077318A (en) * | 1998-08-26 | 2000-03-14 | Tokyo Electron Ltd | Heat treatment apparatus |
JP2002114537A (en) * | 2000-10-04 | 2002-04-16 | Nippon Electric Glass Co Ltd | Setter for heat treatment of glass substrate |
JP2009227564A (en) * | 2008-02-29 | 2009-10-08 | Inax Corp | Setter for heat treatment of glass substrate, its producing method and method for heat treatment of glass substrate |
JP2009204292A (en) * | 2008-02-29 | 2009-09-10 | Inax Corp | Heat treatment setter for glass substrate, method for manufacturing the same, and heat treatment method for glass substrate |
US9617654B2 (en) * | 2012-12-21 | 2017-04-11 | Exxonmobil Research And Engineering Company | Low friction coatings with improved abrasion and wear properties and methods of making |
-
2016
- 2016-03-28 JP JP2016063975A patent/JP6598071B2/en active Active
-
2017
- 2017-01-19 TW TW106101769A patent/TWI690498B/en active
- 2017-03-27 CN CN201710190346.6A patent/CN107235622B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007084379A (en) * | 2005-09-21 | 2007-04-05 | Nippon Electric Glass Co Ltd | Method and apparatus for heat-treating sheet glass, and heat-treating tool |
JP2009298697A (en) * | 2009-08-12 | 2009-12-24 | Nippon Electric Glass Co Ltd | Setter for heat treatment of glass substrate |
TW201114714A (en) * | 2009-09-18 | 2011-05-01 | Nippon Electric Glass Co | Fabricating and processing methods of glass film, and glass film laminated body |
TW201422425A (en) * | 2012-11-09 | 2014-06-16 | Nippon Electric Glass Co | Glass film laminate and electronic and electric devices |
TW201446667A (en) * | 2013-04-05 | 2014-12-16 | Nippon Electric Glass Co | Glass substrate and gradual cooling method thereof |
Also Published As
Publication number | Publication date |
---|---|
CN107235622A (en) | 2017-10-10 |
TW201733934A (en) | 2017-10-01 |
JP2017178636A (en) | 2017-10-05 |
CN107235622B (en) | 2020-11-27 |
JP6598071B2 (en) | 2019-10-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6910299B2 (en) | Glass substrate and display device equipped with it | |
KR102254593B1 (en) | Method for reducing warpage developing in glass plate due to chemical strengthening treatment, method for producing glass plate for chemical strengthening, and method for producing chemically strengthened glass plate | |
TWI520917B (en) | Glass substrate manufacturing method and glass substrate | |
JP5428288B2 (en) | Glass plate manufacturing method and manufacturing equipment | |
JP6380101B2 (en) | Glass substrate and slow cooling method thereof | |
JP5241223B2 (en) | Glass plate manufacturing method and manufacturing equipment | |
TWI690498B (en) | Heat treatment method of glass substrate | |
JP6379678B2 (en) | Manufacturing method of glass substrate | |
KR101769670B1 (en) | Method of making glass substrate and glass substrate | |
TWI679174B (en) | Heat treatment method of glass substrate and manufacturing method of glass substrate | |
WO2016068069A1 (en) | Glass base plate heat processing method and glass base plate production method | |
JP2016160128A (en) | Production method of glass substrate | |
CN105217942B (en) | The manufacturing method and glass substrate of glass substrate | |
JPH08165133A (en) | Method for thermally treating glass plate | |
JP6403458B2 (en) | Manufacturing method of glass substrate | |
JP2012167014A (en) | Method and equipment for producing glass plate | |
JP2016011235A (en) | Manufacturing method of glass substrate | |
JP3118788B2 (en) | Glass article annealing furnace | |
JP3698170B2 (en) | Heat treatment method for glass plate for display device | |
US20050092026A1 (en) | Curved support fixtures for shape control | |
CN112218836A (en) | Method of compensating for warp in a glass article | |
JP2016011237A (en) | Manufacturing method of glass substrate | |
JP2016124747A (en) | Production method of glass substrate, and production apparatus of glass substrate | |
JP2016011233A (en) | Manufacturing method of glass substrate | |
JP2016124746A (en) | Production method of glass substrate, and production apparatus of glass substrate |