TW201733934A - Heat treatment method for glass substrate carrying out heat treatment for reducing the hot shrinkage rate of the glass substrate 1 - Google Patents

Heat treatment method for glass substrate carrying out heat treatment for reducing the hot shrinkage rate of the glass substrate 1 Download PDF

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TW201733934A
TW201733934A TW106101769A TW106101769A TW201733934A TW 201733934 A TW201733934 A TW 201733934A TW 106101769 A TW106101769 A TW 106101769A TW 106101769 A TW106101769 A TW 106101769A TW 201733934 A TW201733934 A TW 201733934A
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glass substrate
heat treatment
friction sheet
low friction
glass
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TW106101769A
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TWI690498B (en
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川口貴弘
三和晋吉
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日本電氣硝子股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B32/00Thermal after-treatment of glass products not provided for in groups C03B19/00, C03B25/00 - C03B31/00 or C03B37/00, e.g. crystallisation, eliminating gas inclusions or other impurities; Hot-pressing vitrified, non-porous, shaped glass products
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57Improving the yield, e-g- reduction of reject rates

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
  • Liquid Crystal (AREA)
  • Surface Treatment Of Glass (AREA)

Abstract

This invention discloses a heat treatment method for a glass substrate. The heat treatment method comprises three steps: at least disposing a low-friction sheet 3 between a peripheral side 1c of a supported region of a lower surface 1b of the glass substrate 1 and an upper surface 2a of a supporting member 2 opposite to the peripheral side 1c by carrying out heat treatment for reducing the hot shrinkage rate of the glass substrate 1 in a state of supporting the glass substrate 1 from the downside by using the supporting member 2; setting the static friction coefficient of the upper surface 3a of the low-friction sheet 3 to be lower than 0.5; and setting the surface roughness Ra of the upper surface 3a of the low-friction sheet 3 to be more than 5 times as much as the surface roughness Ra of the lower surface 1b of the glass substrate 1.

Description

玻璃基板的熱處理方法Glass substrate heat treatment method

本發明是有關於一種用以減小玻璃基板的熱收縮率的熱處理方法。The present invention relates to a heat treatment method for reducing the heat shrinkage rate of a glass substrate.

眾所周知,近年來,智慧型電話(smart phone)或平板型終端等行動終端急速普及,用以使行動終端薄型化及輕量化,進而使其高性能化等的技術開發的競爭激烈度增加。因此,對於行動終端所搭載的液晶顯示器或有機電致發光(Electroluminescence,EL)顯示器等平板顯示器(以下稱為FPD,flat panel display)的基板而言,使用厚度薄的玻璃基板的情況亦增多。In recent years, mobile terminals such as smart phones or tablet terminals have been rapidly popularized, and the competition for the development of technologies such as high-performance and high-performance is increasing. Therefore, in the case of a substrate such as a liquid crystal display or an organic electroluminescence (EL) display such as a flat panel display (hereinafter referred to as an FPD), a thin glass substrate is used.

在FPD的製造步驟中,通常執行在玻璃基板的表面形成薄膜狀的電路(電路圖案)的成膜處理,但在成膜處理中,作為處理對象的玻璃基板會曝露於高溫中。因此,在玻璃基板的熱收縮率大的情況下,無法在玻璃基板的表面形成規定精度的電路圖案,無法確保所期望的電氣特性的可能性升高。因此,對於FPD用的玻璃基板而言,不可或缺的是熱收縮率低且尺寸熱穩定性優異。In the manufacturing process of the FPD, a film forming process of forming a film-like circuit (circuit pattern) on the surface of the glass substrate is usually performed. However, in the film forming process, the glass substrate to be processed is exposed to a high temperature. Therefore, when the heat shrinkage rate of the glass substrate is large, a circuit pattern having a predetermined accuracy cannot be formed on the surface of the glass substrate, and there is a high possibility that the desired electrical characteristics cannot be secured. Therefore, it is indispensable for the glass substrate for FPD that the heat shrinkage rate is low and the dimensional thermal stability is excellent.

因此,例如在專利文獻1中揭示了對玻璃基板實施熱處理,以改善玻璃基板的尺寸熱穩定性的技術。於專利文獻1中,在將作為熱處理對象的玻璃板直接載置於支持構件(耐熱性玻璃陶瓷板)的上表面的狀態下執行熱處理。 [現有技術文獻] [專利文獻]Therefore, for example, Patent Document 1 discloses a technique of performing heat treatment on a glass substrate to improve dimensional thermal stability of the glass substrate. In Patent Document 1, heat treatment is performed in a state where a glass plate to be heat-treated is directly placed on the upper surface of a support member (heat-resistant glass ceramic plate). [Prior Art Document] [Patent Literature]

[專利文獻1]日本專利特開平5-330835號公報[Patent Document 1] Japanese Patent Laid-Open No. Hei 5-330835

[發明所欲解決之課題] 然而,在利用專利文獻1所揭示的方法來對薄玻璃基板實施了熱處理的情況下,有時會在熱處理後的玻璃基板的平面方向上產生大的應變。若產生此種應變,則例如會產生如下所述的問題。[Problems to be Solved by the Invention] However, when the thin glass substrate is subjected to heat treatment by the method disclosed in Patent Document 1, a large strain may be generated in the planar direction of the glass substrate after the heat treatment. If such a strain occurs, for example, the following problems occur.

即,在FPD的製造步驟中,為了提高生產效率而實現低成本化,一般進行所謂的多倒角,即,於一大塊玻璃基板統一地形成電路圖案等之後,從該一大塊玻璃基板切出製品尺寸的多個玻璃基板。在該情況下,若在玻璃基板的平面方向上存在大的應變,則在切出之後,玻璃基板會隨著應變釋放而產生變形。結果是在將玻璃基板彼此貼合來製作面板時,預先形成的電路圖案之間產生偏差,從而導致製品不良。In other words, in the manufacturing process of the FPD, in order to improve the production efficiency and to reduce the cost, a so-called multi-chamfering is generally performed, that is, after a circuit pattern or the like is uniformly formed on a large glass substrate, the large glass substrate is removed from the glass substrate. A plurality of glass substrates of the product size are cut out. In this case, if there is a large strain in the planar direction of the glass substrate, the glass substrate is deformed by strain release after the cutting. As a result, when the glass substrates are bonded to each other to form a panel, variations occur between the circuit patterns formed in advance, resulting in product defects.

本發明的課題在於藉由用以減小玻璃基板的熱收縮率的熱處理,抑制玻璃基板產生應變。 [解決課題之手段]An object of the present invention is to suppress strain on a glass substrate by heat treatment for reducing the heat shrinkage rate of the glass substrate. [Means for solving the problem]

本申請案的發明人等在將玻璃基板直接載置於支持構件上的狀態下進行熱處理,並觀察了此期間的玻璃基板的舉動。結果已知:作為應變在熱處理後增大的玻璃基板的特徵,觀察到了干涉條紋。該干涉條紋是因如下空隙而產生,該空隙產生在玻璃基板的下表面的被支持區域與支持構件的上表面之間。認為產生所述空隙的主要原因在於:玻璃基板的下表面的被支持區域的周緣部(在支持玻璃基板的整個下表面的情況下,尤其為玻璃基板的下表面與端面交叉的交叉部)卡在支持構件的上表面上,阻止玻璃基板追隨(follow)於支持構件的上表面。因此,本申請案的發明人等基於如上所述的見解而提出本申請案的發明。The inventors of the present application performed heat treatment in a state where the glass substrate was directly placed on the support member, and observed the behavior of the glass substrate during this period. As a result, it was known that interference fringes were observed as characteristics of a glass substrate in which strain was increased after heat treatment. This interference fringe is caused by a void which is generated between the supported region of the lower surface of the glass substrate and the upper surface of the support member. The main cause of the occurrence of the void is that the peripheral portion of the supported region of the lower surface of the glass substrate (in the case of supporting the entire lower surface of the glass substrate, especially the intersection of the lower surface and the end surface of the glass substrate) is stuck. On the upper surface of the support member, the glass substrate is prevented from following the upper surface of the support member. Therefore, the inventors of the present application and the like have proposed the invention of the present application based on the findings as described above.

即,為了解決所述課題而創造的本發明是一種玻璃基板的熱處理方法,其在利用支持構件從下方支持玻璃基板的狀態下,進行用以減小所述玻璃基板的熱收縮率的熱處理,所述玻璃基板的熱處理方法的特徵在於:將低摩擦片材至少配置於玻璃基板的下表面的被支持區域的周緣部、與對向於所述周緣部的支持構件的上表面之間,並且將低摩擦片材的上表面的靜摩擦係數(static friction coefficient)設為0.5以下,且將低摩擦片材的上表面的表面粗糙度Ra設為玻璃基板的下表面的表面粗糙度Ra的5倍以上的大小。此處,「表面粗糙度Ra」是基於JIS B0601:2001所規定的方法進行測定所得的值,「靜摩擦係數」是基於JIS K7125:1999所規定的方法進行測定所得的值。而且,「被支持區域」是玻璃基板下表面中的受到低摩擦片材支持的區域,其有時為玻璃基板的整個下表面,有時小於玻璃基板的下表面。In other words, the present invention has been made in order to solve the above problems, and is a heat treatment method for a glass substrate, in which a heat treatment for reducing the heat shrinkage ratio of the glass substrate is performed in a state where the glass substrate is supported from below by a support member. The heat treatment method of the glass substrate is characterized in that the low friction sheet is disposed at least between a peripheral portion of the supported region of the lower surface of the glass substrate and an upper surface of the support member opposed to the peripheral portion, and The static friction coefficient of the upper surface of the low friction sheet is set to 0.5 or less, and the surface roughness Ra of the upper surface of the low friction sheet is set to be 5 times the surface roughness Ra of the lower surface of the glass substrate. The above size. Here, the "surface roughness Ra" is a value measured by a method defined in JIS B0601:2001, and the "static friction coefficient" is a value measured by a method defined in JIS K7125:1999. Further, the "supported region" is a region supported by the low friction sheet in the lower surface of the glass substrate, which may be the entire lower surface of the glass substrate, and may be smaller than the lower surface of the glass substrate.

根據此種構成,玻璃基板的至少下表面的被支持區域的周緣部與低摩擦片材的上表面接觸。由於低摩擦片材的上表面的靜摩擦係數小至0.5以下,故而玻璃基板下表面的被支持區域的周緣部會在低摩擦片材上滑動,玻璃基板以追隨其支持面(低摩擦片材的上表面、或低摩擦片材及支持構件的上表面)的方式受到導引。結果是不易在玻璃基板下表面的被支持區域與其支持面之間形成空隙,能夠抑制伴隨熱處理的應變的產生。According to this configuration, the peripheral edge portion of the supported region of at least the lower surface of the glass substrate is in contact with the upper surface of the low friction sheet. Since the static friction coefficient of the upper surface of the low friction sheet is as small as 0.5 or less, the peripheral portion of the supported region of the lower surface of the glass substrate slides on the low friction sheet, and the glass substrate follows the support surface (low friction sheet) The manner of the upper surface, or the upper surface of the low friction sheet and the support member, is guided. As a result, it is difficult to form a void between the supported region on the lower surface of the glass substrate and the support surface thereof, and it is possible to suppress the occurrence of strain accompanying the heat treatment.

此處,若玻璃基板的下表面周緣部與低摩擦片材的上表面過於密合,則有可能產生如下問題,即在熱處理後,無法剝離玻璃基板。因此,在本申請案的發明中,將低摩擦片材的上表面的表面粗糙度Ra設為玻璃基板的下表面的表面粗糙度Ra的5倍以上的大小,從而緩和兩者的密合狀態。藉此,即使在熱處理後,亦能夠從低摩擦片材上剝離玻璃基板。Here, when the peripheral edge portion of the lower surface of the glass substrate is too close to the upper surface of the low friction sheet, there is a possibility that the glass substrate cannot be peeled off after the heat treatment. Therefore, in the invention of the present application, the surface roughness Ra of the upper surface of the low friction sheet is set to be five times or more the surface roughness Ra of the lower surface of the glass substrate, thereby relaxing the adhesion state of the two. . Thereby, the glass substrate can be peeled off from the low friction sheet even after the heat treatment.

在所述構成中,低摩擦片材的厚度較佳為0.01 mm~2 mm。藉此,低摩擦片材的上表面不易受到支持構件的上表面的狀態的影響。而且,亦無如下問題,該問題是指低摩擦片材的熱容量增大,在熱處理時產生大能量損失(energy loss)。In the above configuration, the thickness of the low friction sheet is preferably from 0.01 mm to 2 mm. Thereby, the upper surface of the low friction sheet is less susceptible to the state of the upper surface of the support member. Further, there is no problem that the heat capacity of the low friction sheet is increased, and a large energy loss is generated at the time of heat treatment.

在所述構成中,低摩擦片材的靜摩擦係數較佳為0.2以下。藉此,玻璃基板的下表面周緣部會更順利地在低摩擦片材的上表面上滑動,因此,玻璃基板容易追隨其支持面。In the above configuration, the static friction coefficient of the low friction sheet is preferably 0.2 or less. Thereby, the peripheral portion of the lower surface of the glass substrate slides more smoothly on the upper surface of the low friction sheet, and therefore, the glass substrate easily follows the support surface.

在所述構成中,低摩擦片材較佳為包含具有層狀結晶構造的無機物。藉此,容易減小摩擦係數,並且能夠提高耐熱性。In the above configuration, the low friction sheet preferably contains an inorganic substance having a layered crystal structure. Thereby, the friction coefficient is easily reduced, and heat resistance can be improved.

在所述構成中,低摩擦片材較佳為可剝離地鋪設於支持構件的上表面。藉此,即使在低摩擦片材損傷的情況下,亦能夠容易地更換低摩擦片材。In the above configuration, the low friction sheet is preferably peelably laid on the upper surface of the support member. Thereby, even in the case where the low friction sheet is damaged, the low friction sheet can be easily replaced.

在所述構成中,亦可以使玻璃基板的整個下表面成為被支持區域的方式,將低摩擦片材設置於玻璃基板的整個下表面、與對向於所述整個下表面的支持構件的上表面之間。藉此,支持玻璃基板的整個支持面包含低摩擦片材,因此,玻璃基板會更順利地追隨其支持面。In the above configuration, the entire lower surface of the glass substrate may be a supported region, and the low friction sheet may be provided on the entire lower surface of the glass substrate and the supporting member opposed to the entire lower surface. Between the surfaces. Thereby, the entire supporting surface of the supporting glass substrate contains the low friction sheet, and therefore, the glass substrate can more smoothly follow the supporting surface.

在所述構成中,亦可以使玻璃基板的下表面的除了周緣部以外的區域成為被支持區域的方式,使玻璃基板的下表面的周緣部從低摩擦片材伸出。藉此,能夠利用玻璃基板的伸出部來對玻璃基板進行操作,因此,將玻璃基板載置於低摩擦片材上的載置作業、或從低摩擦片材上取出所述玻璃基板的取出作業變得容易。 [發明的效果]In the above configuration, the peripheral portion of the lower surface of the glass substrate may be extended from the low friction sheet so that the region other than the peripheral portion of the lower surface of the glass substrate is the supported region. Thereby, since the glass substrate can be operated by the extending portion of the glass substrate, the mounting operation of placing the glass substrate on the low friction sheet or taking out the glass substrate from the low friction sheet can be taken out. The job becomes easy. [Effects of the Invention]

如上所述,根據本發明,能夠藉由用以減小玻璃基板的熱收縮率的熱處理,抑制玻璃基板產生應變。As described above, according to the present invention, strain can be suppressed from occurring in the glass substrate by heat treatment for reducing the heat shrinkage rate of the glass substrate.

以下,參照隨附圖式來對一實施形態的玻璃基板的熱處理方法進行說明。Hereinafter, a heat treatment method of a glass substrate according to an embodiment will be described with reference to the accompanying drawings.

如圖1(a)及圖1(b)所示,作為熱處理對象的玻璃基板1載置於低摩擦片材3的上表面3a,所述低摩擦片材3配置於支持構件(承載板)2的上表面2a。而且,在此種支持形態下,將玻璃基板1導入至熱處理裝置(熱處理爐)而進行加熱,藉此,執行用以減小玻璃基板的熱收縮率的熱處理步驟。再者,亦可在熱處理步驟之前,設置將玻璃基板1洗淨的洗淨步驟。若預先設置此種洗淨步驟,則能夠防止附著於玻璃基板1表面的異物隨著熱處理而燒結於玻璃基板1的表面。As shown in Fig. 1 (a) and Fig. 1 (b), the glass substrate 1 as a heat treatment target is placed on the upper surface 3a of the low friction sheet 3, and the low friction sheet 3 is placed on a support member (carrier plate). The upper surface 2a of 2. Further, in such a support form, the glass substrate 1 is introduced into a heat treatment apparatus (heat treatment furnace) and heated, whereby a heat treatment step for reducing the heat shrinkage rate of the glass substrate is performed. Further, a washing step of washing the glass substrate 1 may be provided before the heat treatment step. When such a cleaning step is provided in advance, it is possible to prevent foreign matter adhering to the surface of the glass substrate 1 from being sintered on the surface of the glass substrate 1 by heat treatment.

以下,分別對玻璃基板1以及熱處理步驟中所使用的低摩擦片材3、支持構件2及熱處理裝置10進行詳述。Hereinafter, the glass substrate 1 and the low friction sheet 3, the support member 2, and the heat treatment apparatus 10 used in the heat treatment step will be described in detail.

[玻璃基板] 玻璃基板1呈俯視矩形形狀,該玻璃基板1的尺寸較佳為500 mm見方以上,更佳為700 mm見方以上,進而較佳為1000 mm見方以上,最佳為1300 mm見方以上。一般而言,玻璃基板1的尺寸越大,則熱處理後的玻璃基板1越容易產生應變。因此,玻璃基板1的尺寸越大,則越容易享受到本實施形態的效果。再者,玻璃基板1不限於矩形形狀,亦可為三角形或五邊形以上的多邊形、圓形(包含橢圓形)、不規則形狀等。[Glass substrate] The glass substrate 1 has a rectangular shape in plan view, and the size of the glass substrate 1 is preferably 500 mm square or more, more preferably 700 mm square or more, further preferably 1000 mm square or more, and most preferably 1300 mm square or more. . In general, the larger the size of the glass substrate 1, the more easily the glass substrate 1 after heat treatment is strained. Therefore, the larger the size of the glass substrate 1, the easier it is to enjoy the effects of the present embodiment. Further, the glass substrate 1 is not limited to a rectangular shape, and may be a polygon having a triangle or a pentagon or more, a circular shape (including an elliptical shape), an irregular shape, or the like.

玻璃基板1的厚度為0.7 mm以下,較佳為0.5 mm以下,更佳為0.4 mm以下,最佳為0.3 mm以下。通常,厚度越小,則自重越小,因此,難以追隨支持構件2的上表面。因此,越是厚度薄的玻璃基板1,則低摩擦片材3的效果越大。而且,玻璃基板1的厚度越小,則亦能夠使對於以玻璃基板1作為構成組件的製品(例如FPD)的薄型化或輕量化等的貢獻度越高。然而,若玻璃基板1的厚度太小,則無法確保玻璃基板1所要求的最低限度的強度。因此,玻璃基板1的厚度較佳為1 μm以上,更佳為3 μm以上,最佳為5 μm以上。The thickness of the glass substrate 1 is 0.7 mm or less, preferably 0.5 mm or less, more preferably 0.4 mm or less, and most preferably 0.3 mm or less. In general, the smaller the thickness, the smaller the self-weight, and therefore it is difficult to follow the upper surface of the support member 2. Therefore, the thinner the glass substrate 1 is, the more the effect of the low friction sheet 3 is. Further, as the thickness of the glass substrate 1 is smaller, the contribution to the thinning or weight reduction of a product (for example, FPD) having the glass substrate 1 as a constituent component can be made higher. However, if the thickness of the glass substrate 1 is too small, the minimum strength required for the glass substrate 1 cannot be ensured. Therefore, the thickness of the glass substrate 1 is preferably 1 μm or more, more preferably 3 μm or more, and most preferably 5 μm or more.

玻璃基板1的應變點為650℃以上,較佳為660℃以上,更佳為670℃以上,最佳為680℃以上。應變點越高,則越容易減小熱收縮率。另一方面,若應變點過高,則玻璃基板1的生產性會顯著下降,因此,玻璃基板1的應變點較佳為725℃以下,更佳為720℃以下,最佳為715℃以下。再者,此處所謂的應變點是基於美國材料試驗學會(American Society for Testing and Materials,ASTM)C336所規定的方法進行測定所得的值。The strain point of the glass substrate 1 is 650 ° C or higher, preferably 660 ° C or higher, more preferably 670 ° C or higher, and most preferably 680 ° C or higher. The higher the strain point, the easier it is to reduce the heat shrinkage rate. On the other hand, when the strain point is too high, the productivity of the glass substrate 1 is remarkably lowered. Therefore, the strain point of the glass substrate 1 is preferably 725 ° C or lower, more preferably 720 ° C or lower, and most preferably 715 ° C or lower. Further, the strain point referred to herein is a value measured by a method defined by American Society for Testing and Materials (ASTM) C336.

具有所述尺寸、厚度及應變點的玻璃基板1例如能夠由矽酸鹽玻璃、二氧化矽玻璃、硼矽酸玻璃、鈉玻璃、無鹼玻璃等形成。在本實施形態中,使用由所述各種玻璃中的最不易產生經時劣化的無鹼玻璃形成的玻璃基板。此處,所謂無鹼玻璃,是指實質上不含有鹼成分(鹼金屬氧化物)的玻璃,具體而言,是指鹼成分的含量為3000 ppm以下的玻璃。作為無鹼玻璃,使用鹼成分的含量較佳為1000 ppm以下,更佳為500 ppm以下,最佳為300 ppm以下的無鹼玻璃。The glass substrate 1 having the above-described size, thickness, and strain point can be formed, for example, of tellurite glass, ceria glass, borosilicate glass, soda glass, alkali-free glass, or the like. In the present embodiment, a glass substrate formed of an alkali-free glass which is less likely to cause deterioration over time among the various glasses is used. Here, the alkali-free glass means a glass which does not substantially contain an alkali component (alkali metal oxide), and specifically refers to a glass having an alkali component content of 3,000 ppm or less. As the alkali-free glass, the alkali component content is preferably 1000 ppm or less, more preferably 500 ppm or less, and most preferably 300 ppm or less.

玻璃基板1的下表面1b的表面粗糙度Ra較佳為2.0 nm以下,更佳為1.0 nm以下,進而更佳為0.5 nm以下,最佳為0.2 nm以下。再者,玻璃基板1的上表面1a的表面粗糙度Ra可與下表面1b相同,亦可與下表面1b不同。The surface roughness Ra of the lower surface 1b of the glass substrate 1 is preferably 2.0 nm or less, more preferably 1.0 nm or less, still more preferably 0.5 nm or less, and most preferably 0.2 nm or less. Further, the surface roughness Ra of the upper surface 1a of the glass substrate 1 may be the same as that of the lower surface 1b or may be different from the lower surface 1b.

玻璃基板1例如藉由溢流下引(overflow down-draw)法、流孔下引(slot down-draw)法、碾平(roll out)法、浮式(float)法、上引(up draw)法、再曳引(redraw)法製造。在本實施形態中,使用藉由溢流下引法製造的玻璃基板。The glass substrate 1 is subjected to, for example, an overflow down-draw method, a slot down-draw method, a roll out method, a float method, and an up draw. Method, redraw method. In the present embodiment, a glass substrate produced by an overflow down-draw method is used.

[低摩擦片材][low friction sheet]

在該實施形態中,低摩擦片材3配置於玻璃基板1的整個下表面1b、與對向於該下表面1b的支持構件2的上表面2a之間。即,在該實施形態中,玻璃基板1的整個下表面1b設為玻璃基板1的被支持區域。進而,低摩擦片材3具有向玻璃基板1的外方側伸出的伸出部3c。再者,低摩擦片材3亦可僅設置於與玻璃基板1的下表面1b中的周緣部1c(圖中的影線部分)相對應的區域。而且,亦可省略伸出部3c。即,玻璃基板1的端面與低摩擦片材3的端面處於同一個面。當然,低摩擦片材3的端面亦可位於較玻璃基板1的端面稍靠內側的位置。在該情況下,玻璃基板1的被支持區域小於玻璃基板1的下表面1b。In this embodiment, the low friction sheet 3 is disposed between the entire lower surface 1b of the glass substrate 1 and the upper surface 2a of the support member 2 opposed to the lower surface 1b. That is, in this embodiment, the entire lower surface 1b of the glass substrate 1 is a supported region of the glass substrate 1. Further, the low friction sheet 3 has a projecting portion 3c that protrudes toward the outer side of the glass substrate 1. Further, the low friction sheet 3 may be provided only in a region corresponding to the peripheral portion 1c (hatched portion in the drawing) in the lower surface 1b of the glass substrate 1. Moreover, the extension portion 3c can also be omitted. That is, the end surface of the glass substrate 1 is on the same surface as the end surface of the low friction sheet 3. Of course, the end surface of the low friction sheet 3 may be located slightly inside the end surface of the glass substrate 1. In this case, the supported area of the glass substrate 1 is smaller than the lower surface 1b of the glass substrate 1.

為了抑制伴隨熱處理的玻璃基板1的應變的產生,需要在玻璃基板1充分地追隨低摩擦片材3的上表面3a的狀態下開始熱處理。因此,低摩擦片材3的上表面3a的靜摩擦係數設定為0.5以下。低摩擦片材3的上表面3a的靜摩擦係數較佳為0.4以下,更佳為0.3以下,尤佳為0.2以下。靜摩擦係數越小,則越能夠抑制伴隨熱處理而產生的玻璃基板1的平面方向的應變。再者,低摩擦片材3的下表面3b的靜摩擦係數並無特別限定,可與上表面3a相同,亦可與上表面3a不同。In order to suppress the generation of the strain of the glass substrate 1 accompanying the heat treatment, it is necessary to start the heat treatment in a state where the glass substrate 1 sufficiently follows the upper surface 3a of the low friction sheet 3. Therefore, the static friction coefficient of the upper surface 3a of the low friction sheet 3 is set to 0.5 or less. The static friction coefficient of the upper surface 3a of the low friction sheet 3 is preferably 0.4 or less, more preferably 0.3 or less, and particularly preferably 0.2 or less. The smaller the static friction coefficient is, the more the strain in the planar direction of the glass substrate 1 due to the heat treatment can be suppressed. Further, the static friction coefficient of the lower surface 3b of the low friction sheet 3 is not particularly limited, and may be the same as the upper surface 3a or may be different from the upper surface 3a.

此處,若低摩擦片材3的上表面3a的表面平滑性過高,則有時低摩擦片材3與玻璃基板1會過度地密合,導致玻璃基板1在熱處理中裂開,或在熱處理後,玻璃基板1貼附於低摩擦片材3而無法將兩者分離。而且,當將玻璃基板1載置於低摩擦片材3的上表面3a時,亦存在如下情況,即,接觸部位依序貼附,玻璃基板1難以充分地追隨低摩擦片材3的上表面3a。尤其,使用於顯示器用途的玻璃基板要求高的表面平滑性,因此,一般使用表面粗糙度Ra極小的玻璃基板(例如Ra為0.2 nm左右),故而容易產生如上所述的問題。因此,為了緩和低摩擦片材3的上表面3a與玻璃基板1的下表面1b的密合,低摩擦片材3的上表面3a的表面粗糙度Ra設定為玻璃基板1的下表面1b的表面粗糙度Ra的5倍以上的大小。較佳為10倍以上,更佳為20倍以上,最佳為50倍以上。Here, if the surface smoothness of the upper surface 3a of the low friction sheet 3 is too high, the low friction sheet 3 and the glass substrate 1 may excessively adhere to each other, causing the glass substrate 1 to be cracked during heat treatment, or After the heat treatment, the glass substrate 1 is attached to the low friction sheet 3, and the two cannot be separated. Further, when the glass substrate 1 is placed on the upper surface 3a of the low-friction sheet 3, there is also a case where the contact portions are sequentially attached, and it is difficult for the glass substrate 1 to sufficiently follow the upper surface of the low-friction sheet 3. 3a. In particular, since a glass substrate used for display applications requires high surface smoothness, a glass substrate having a very small surface roughness Ra (for example, Ra is about 0.2 nm) is generally used, and thus the above-described problems are apt to occur. Therefore, in order to alleviate the adhesion of the upper surface 3a of the low friction sheet 3 to the lower surface 1b of the glass substrate 1, the surface roughness Ra of the upper surface 3a of the low friction sheet 3 is set to the surface of the lower surface 1b of the glass substrate 1. The size of the roughness Ra is more than 5 times. It is preferably 10 times or more, more preferably 20 times or more, and most preferably 50 times or more.

低摩擦片材3的上表面3a的表面粗糙度Ra較佳為0.02 μm以上。更佳為0.05 μm以上,進而較佳為0.1 μm以上,進而更佳為0.2 μm以上,最佳為0.5 μm以上。藉由預先設定於所述範圍內,能夠抑制玻璃基板1與低摩擦片材3的貼附。另一方面,若表面粗糙度Ra過大,則靜摩擦係數會變大,因此,低摩擦片材3的上表面3a的表面粗糙度Ra較佳設為5 μm以下。再者,低摩擦片材3的下表面3b的表面粗糙度Ra並無特別限定,可與上表面3a相同,亦可與上表面3a不同。The surface roughness Ra of the upper surface 3a of the low friction sheet 3 is preferably 0.02 μm or more. More preferably, it is 0.05 μm or more, further preferably 0.1 μm or more, further preferably 0.2 μm or more, and most preferably 0.5 μm or more. By setting in advance within the above range, the adhesion of the glass substrate 1 and the low friction sheet 3 can be suppressed. On the other hand, when the surface roughness Ra is too large, the static friction coefficient is increased. Therefore, the surface roughness Ra of the upper surface 3a of the low friction sheet 3 is preferably 5 μm or less. Further, the surface roughness Ra of the lower surface 3b of the low friction sheet 3 is not particularly limited, and may be the same as the upper surface 3a or may be different from the upper surface 3a.

當將玻璃基板1的下表面1b的表面粗糙度Ra設為Ra1,將支持構件2的上表面2a的表面粗糙度Ra設為Ra2時,低摩擦片材3的厚度較佳為大於Ra1與Ra2的相加值。更佳為Ra1+Ra2+10 μm以上,進而更佳為Ra1+Ra2+50 μm以上,最佳為Ra1+Ra2+100 μm以上。藉由預先設定於所述範圍,能夠容易地將玻璃基板1與支持構件2分離,從而易於享受低摩擦片材3的功能。另一方面,若低摩擦片材3的厚度過大,則熱容量會增大,熱處理時的能量損失增大。而且,低摩擦片材3的製作成本亦有可能會升高。因此,低摩擦片材3的厚度較佳設為Ra1+Ra2+2000 μm以下。具體而言,低摩擦片材3的厚度較佳為0.01 mm~2 mm。When the surface roughness Ra of the lower surface 1b of the glass substrate 1 is Ra1 and the surface roughness Ra of the upper surface 2a of the support member 2 is Ra2, the thickness of the low friction sheet 3 is preferably larger than Ra1 and Ra2. The added value. More preferably, Ra1+Ra2+ is 10 μm or more, and further preferably Ra1+Ra2+50 μm or more, and most preferably Ra1+Ra2+100 μm or more. By setting in advance in the above range, the glass substrate 1 and the support member 2 can be easily separated, and the function of the low friction sheet 3 can be easily enjoyed. On the other hand, if the thickness of the low friction sheet 3 is too large, the heat capacity increases, and the energy loss at the time of heat treatment increases. Moreover, the manufacturing cost of the low friction sheet 3 is also likely to increase. Therefore, the thickness of the low friction sheet 3 is preferably set to be Ra1 + Ra 2+ 2000 μm or less. Specifically, the thickness of the low friction sheet 3 is preferably from 0.01 mm to 2 mm.

低摩擦片材3較佳為預先設為能夠從支持構件2上拆除的形態。藉此,在低摩擦片材3損傷的情況下,能夠容易地進行更換。結果是容易抑制隨著低摩擦片材3的損傷而引起的玻璃基板1的品質下降。具體而言,例如將低摩擦片材3不經由黏接層等而直接鋪設於支持構件2的上表面2a,並且將低摩擦片材3的下表面3b的表面粗糙度Ra設定為大於支持構件2的上表面2a的表面粗糙度Ra。The low friction sheet 3 is preferably in a form that can be removed from the support member 2 in advance. Thereby, when the low friction sheet 3 is damaged, it can be easily replaced. As a result, it is easy to suppress the deterioration of the quality of the glass substrate 1 due to the damage of the low friction sheet 3. Specifically, for example, the low friction sheet 3 is directly laid on the upper surface 2a of the support member 2 without passing through an adhesive layer or the like, and the surface roughness Ra of the lower surface 3b of the low friction sheet 3 is set larger than the support member. The surface roughness Ra of the upper surface 2a of 2.

低摩擦片材3較佳為包含具有層狀結晶構造的無機物。作為具有層狀結晶構造的無機物,例如有石墨、氮化硼、二硫化鉬、滑石(talc)、雲母(mica)等。其中,考慮到廉價且容易製造為片狀,較佳為使用石墨。構成低摩擦片材3的所述無機物的純度以質量%計,較佳為99.0%以上。更佳為99.5%以上,進而更佳為99.8%以上,最佳為99.9%以上。純度越高,則越能夠抑制例如由金屬等雜質引起的對玻璃基板造成的擦傷。在本實施形態中,使用所述各種無機物中的較廉價、亦容易大型化且純度為99.9%的石墨。The low friction sheet 3 preferably contains an inorganic substance having a layered crystal structure. Examples of the inorganic material having a layered crystal structure include graphite, boron nitride, molybdenum disulfide, talc, mica, and the like. Among them, graphite is preferably used in view of being inexpensive and easy to manufacture into a sheet shape. The purity of the inorganic material constituting the low friction sheet 3 is preferably 99.0% by mass or more. More preferably, it is 99.5% or more, further preferably 99.8% or more, and most preferably 99.9% or more. The higher the purity, the more it is possible to suppress scratches on the glass substrate caused by impurities such as metal. In the present embodiment, graphite which is relatively inexpensive and which is easy to increase in size and has a purity of 99.9% is used.

對於熱處理後的玻璃基板1,能夠在不對應變或熱收縮率的不均產生影響的範圍內,將相對於玻璃基板1的低摩擦片材3的尺寸減小。藉此,玻璃基板1的載置及取出作業變得容易。在考慮作業性的情況下,低摩擦片材3的面積相對於玻璃基板1的整個下表面1b的面積的比例較佳設為0.5以上且為1.0以下。更佳為0.6以上且不足1.0,進而更佳為0.7以上且不足1.0,最佳為0.7以上且為0.9以下。In the glass substrate 1 after the heat treatment, the size of the low friction sheet 3 with respect to the glass substrate 1 can be reduced within a range that does not affect the variation or the unevenness of the heat shrinkage rate. Thereby, the mounting and taking-out work of the glass substrate 1 becomes easy. When the workability is considered, the ratio of the area of the low friction sheet 3 to the area of the entire lower surface 1b of the glass substrate 1 is preferably 0.5 or more and 1.0 or less. It is more preferably 0.6 or more and less than 1.0, more preferably 0.7 or more and less than 1.0, and most preferably 0.7 or more and 0.9 or less.

若以所述方式來對低摩擦片材3的靜摩擦係數與表面粗糙度Ra進行設定,則能夠享受如下所述的效果。即,不易維持如下狀態,該狀態如圖2(a)所示,玻璃基板1的下表面1b的周緣部1c(尤其為下表面1b與端面1d的交叉部1x)卡在低摩擦片材3的上表面3a上,在玻璃基板1與低摩擦片材3之間形成空隙C。即使暫時產生圖2(a)的狀態,玻璃基板1的下表面1b的周緣部1c亦會在低摩擦片材3的上表面3a上向外方側(X方向)滑動,隨之,玻璃基板1的下表面1b一面下降(Y方向),一面接近低摩擦片材3。而且,玻璃基板1從圖2(a)的狀態進一步下降,藉此,即使玻璃基板1的下表面1b的周緣部1c開始與低摩擦片材3的上表面3a發生面接觸,玻璃基板1的下表面1b的周緣部1c亦會在低摩擦片材3的上表面3a上向外方側(X方向)滑動,隨之,玻璃基板1的下表面1b一面下降(Y方向),一面接近低摩擦片材3。藉此,如圖2(b)所示,玻璃基板1正確地追隨低摩擦片材3的上表面3a。結果是不易在玻璃基板1的下表面1b與低摩擦片材3的上表面3a之間形成空隙C,能夠抑制伴隨熱處理的應變的產生。而且,如圖2(b)所示,即使在玻璃基板1追隨低摩擦片材3的狀態下進行熱處理,由於兩者未過度地密合,故而在熱處理後,亦能夠容易地從低摩擦片材3上分離玻璃基板1。When the static friction coefficient and the surface roughness Ra of the low friction sheet 3 are set as described above, the following effects can be enjoyed. In other words, it is difficult to maintain a state in which the peripheral edge portion 1c of the lower surface 1b of the glass substrate 1 (particularly, the intersection portion 1x of the lower surface 1b and the end surface 1d) is caught in the low friction sheet 3 as shown in Fig. 2(a). On the upper surface 3a, a gap C is formed between the glass substrate 1 and the low friction sheet 3. Even if the state of FIG. 2(a) is temporarily generated, the peripheral edge portion 1c of the lower surface 1b of the glass substrate 1 slides on the outer side (X direction) on the upper surface 3a of the low friction sheet 3, and accordingly, the glass substrate The lower surface 1b of 1 is lowered on one side (Y direction), and the low friction sheet 3 is approached on one side. Further, the glass substrate 1 is further lowered from the state of FIG. 2(a), whereby even if the peripheral edge portion 1c of the lower surface 1b of the glass substrate 1 comes into surface contact with the upper surface 3a of the low friction sheet 3, the glass substrate 1 The peripheral edge portion 1c of the lower surface 1b also slides outward (X direction) on the upper surface 3a of the low friction sheet 3, and accordingly, the lower surface 1b of the glass substrate 1 is lowered (Y direction), and the surface is nearly low. Friction sheet 3. Thereby, as shown in FIG. 2(b), the glass substrate 1 correctly follows the upper surface 3a of the low friction sheet 3. As a result, it is difficult to form the void C between the lower surface 1b of the glass substrate 1 and the upper surface 3a of the low friction sheet 3, and the occurrence of strain accompanying the heat treatment can be suppressed. Further, as shown in FIG. 2(b), even if the heat treatment is performed in a state where the glass substrate 1 follows the low friction sheet 3, since the two are not excessively adhered, it is possible to easily remove the low friction sheet after the heat treatment. The glass substrate 1 is separated on the material 3.

[支持構件] 支持構件2從下方側支持作為熱處理對象的玻璃基板1及低摩擦片材3,且能夠使用玻璃、陶瓷、金屬等具有耐熱性的材料。其中,較佳為使用熱膨脹係數低且耐熱衝擊性高的結晶化玻璃作為支持構件2。[Support member] The support member 2 supports the glass substrate 1 and the low friction sheet 3 to be heat-treated from the lower side, and a material having heat resistance such as glass, ceramics, or metal can be used. Among them, it is preferable to use a crystallized glass having a low coefficient of thermal expansion and high thermal shock resistance as the support member 2.

支持構件2的厚度較佳為0.5 mm~4.0 mm。更佳為0.5 mm~3.5 mm,進而較佳為0.5 mm~3.0 mm,進而更佳為0.5 mm~2.5 mm,最佳為1.0 mm~2.5 mm。藉由預先設定於所述範圍,支持構件2發生熱變形的可能性低,而且,支持構件2的熱容量亦不會增大,不會在熱處理時產生大能量損失。因此,能夠精度良好且有效率地對玻璃基板1進行熱處理。The thickness of the support member 2 is preferably from 0.5 mm to 4.0 mm. More preferably, it is 0.5 mm to 3.5 mm, further preferably 0.5 mm to 3.0 mm, more preferably 0.5 mm to 2.5 mm, and most preferably 1.0 mm to 2.5 mm. By setting in advance in the above range, the possibility that the support member 2 is thermally deformed is low, and the heat capacity of the support member 2 does not increase, and a large energy loss does not occur at the time of heat treatment. Therefore, the glass substrate 1 can be heat-treated with high precision and efficiency.

[熱處理裝置][heat treatment device]

執行熱處理的熱處理裝置較佳為使用不包括搬送裝置的批次式爐或逐片式爐。於此種爐中,玻璃基板1在靜置狀態下接受熱處理,因此,能夠抑制伴隨搬送的玻璃基板1的滑動。結果是容易在玻璃基板1的面內保持均一的溫度分佈,能夠抑制熱收縮率的不均、或由溫度分佈引起的應變或形狀的惡化。而且,亦能夠減少在熱處理中,因與爐內構件發生碰撞而導致破損的可能性。在本實施形態中,如圖3所示,使用批次式爐的熱處理裝置10。The heat treatment apparatus that performs the heat treatment preferably uses a batch furnace or a sheet-by-piece furnace that does not include the conveying device. In such a furnace, the glass substrate 1 is subjected to heat treatment in a standing state, and therefore, the sliding of the glass substrate 1 accompanying the conveyance can be suppressed. As a result, it is easy to maintain a uniform temperature distribution in the plane of the glass substrate 1, and it is possible to suppress unevenness in heat shrinkage rate or deterioration in strain or shape due to temperature distribution. Moreover, it is also possible to reduce the possibility of breakage due to collision with the inner member of the furnace during the heat treatment. In the present embodiment, as shown in Fig. 3, a heat treatment apparatus 10 for a batch furnace is used.

如圖3所示,熱處理裝置10包括:玻璃室(glass chamber)11;升降台13,其在載置有玻璃架12的狀態下,相對於玻璃室11升降移動;爐壁14,其收容玻璃室11;以及加熱器15,其從外部對玻璃室11進行加熱。該熱處理裝置10配設於無塵室(clean room)內。總之,熱處理步驟在無塵室內執行。As shown in FIG. 3, the heat treatment apparatus 10 includes a glass chamber 11 and a lifting table 13 that moves up and down with respect to the glass chamber 11 in a state in which the glass frame 12 is placed; the furnace wall 14 houses the glass. a chamber 11; and a heater 15 that heats the glass chamber 11 from the outside. The heat treatment device 10 is disposed in a clean room. In summary, the heat treatment step is performed in a clean room.

玻璃室11呈下端開口的有蓋筒狀,且內部具有熱處理空間S。該玻璃室11藉由使石英玻璃一體成形而形成為有蓋筒狀,藉由無接縫的連續的面來劃分形成熱處理空間S。The glass chamber 11 has a lid-shaped cylindrical shape with a lower end open, and has a heat treatment space S inside. The glass chamber 11 is formed into a lid-shaped cylindrical shape by integrally molding quartz glass, and the heat treatment space S is defined by a continuous surface having no seam.

玻璃架12具有沿著上下方向設置為多段狀的多個收容部16,各收容部16是由豎立設置於升降台上的至少一對柱部12a、與可裝卸地安裝於柱部12a的架板12b劃分形成。柱部12a及架板12b均由石英玻璃形成。在本實施形態中,採用格子狀的框體作為架板12b,於架板12b的上表面設置有多個插銷狀突起。而且,橫置狀態的玻璃基板1由包括低摩擦片材3的支持構件2從下方側支持(以下,亦將其稱為「組合件」),且由插銷狀突起從下方側支持。The glass frame 12 has a plurality of accommodating portions 16 which are provided in a plurality of stages in the vertical direction, and each of the accommodating portions 16 is at least a pair of column portions 12a erected on the elevating table and detachably attached to the column portion 12a. The board 12b is divided and formed. Both the column portion 12a and the shelf plate 12b are formed of quartz glass. In the present embodiment, a lattice-shaped frame body is used as the shelf plate 12b, and a plurality of pin-shaped projections are provided on the upper surface of the shelf plate 12b. In addition, the glass substrate 1 in the horizontal state is supported by the support member 2 including the low friction sheet 3 from the lower side (hereinafter also referred to as "assembly"), and is supported by the plug-like projection from the lower side.

升降台13具有載置有玻璃架12的石英玻璃製的載置部13a,當該載置部13a位於上升位置時,玻璃室11的下端開口部封閉,玻璃架12配置於熱處理空間S內。另一方面,當載置部13a下降至下降位置時,相對於載置於載置部13a的玻璃架12,進行組合件的裝入及卸出。The lifting table 13 has a mounting portion 13a made of quartz glass on which the glass frame 12 is placed. When the placing portion 13a is at the raised position, the lower end opening of the glass chamber 11 is closed, and the glass frame 12 is disposed in the heat treatment space S. On the other hand, when the placing portion 13a is lowered to the lowered position, the assembly is loaded and unloaded with respect to the glass frame 12 placed on the placing portion 13a.

爐壁14呈下端開口的有蓋筒狀,且整體包含耐火物。於爐壁14的側部內壁面安裝有加熱器15。例如使用以鎳鉻合金(nichrome)系發熱體為代表的金屬系發熱體作為加熱器15。The furnace wall 14 has a closed cylindrical shape with a lower end open and contains a refractory as a whole. A heater 15 is attached to the inner wall surface of the side wall of the furnace wall 14. For example, a metal-based heating element typified by a nichrome-based heating element is used as the heater 15.

亦可於熱處理裝置10中,另外設置從外部對玻璃室11進行冷卻的冷卻單元(例如送風機)。藉由預先設置此種冷卻單元,能夠效率良好地對由加熱器15加熱後的熱處理空間的環境進行冷卻。A cooling unit (for example, a blower) that cools the glass chamber 11 from the outside may be additionally provided in the heat treatment apparatus 10. By providing such a cooling unit in advance, it is possible to efficiently cool the environment of the heat treatment space heated by the heater 15.

其次,對具有以上構成的熱處理裝置所執行的熱處理步驟進行說明。在熱處理步驟中,依序實施升溫步驟、保溫步驟及降溫步驟。Next, the heat treatment step performed by the heat treatment apparatus having the above configuration will be described. In the heat treatment step, the temperature increasing step, the holding step, and the cooling step are sequentially performed.

在實施升溫步驟之前,先使升降台13的載置部13a位於下降位置,且將組合件裝入至玻璃架12的各收容部16之後,使升降台13進行上升移動,將玻璃架12配置於玻璃室11內的熱處理空間S。再者,例如藉由能夠從下方側支持組合件的機器叉(robot fork),將組合件裝入至各收容部16(以及在熱處理後,從各收容部16卸出組合件)。Before the temperature increasing step is performed, the placing portion 13a of the lifting platform 13 is placed at the lowered position, and after the assembly is placed in each of the accommodating portions 16 of the glass frame 12, the lifting table 13 is moved upward, and the glass frame 12 is placed. The heat treatment space S in the glass chamber 11. Further, for example, the assembly is attached to each of the housing portions 16 (and the assembly is discharged from each of the housing portions 16 after heat treatment) by a robot fork that can support the assembly from the lower side.

升溫步驟是使玻璃基板1的溫度上升至規定溫度的步驟,此處,對加熱器的輸出進行調整,使得玻璃基板1以10℃/分鐘以上,較佳為15℃/分鐘以上,更佳為20℃/分鐘以上的升溫速度升溫。然而,若玻璃基板1的升溫速度過快,則玻璃基板1破損等的可能性會升高,因此,升溫速度設為100℃/分鐘以下,更佳為設為80℃/分鐘以下。The temperature increasing step is a step of raising the temperature of the glass substrate 1 to a predetermined temperature. Here, the output of the heater is adjusted so that the glass substrate 1 is 10 ° C / min or more, preferably 15 ° C / min or more, more preferably The temperature rise rate of 20 ° C / min or more is raised. However, if the temperature rise rate of the glass substrate 1 is too fast, the possibility that the glass substrate 1 is broken or the like is increased. Therefore, the temperature increase rate is 100 ° C / min or less, and more preferably 80 ° C / min or less.

接著,在升溫步驟中,從外部對玻璃室11(玻璃室11內的熱處理空間S)進行加熱,直至玻璃基板1的溫度為規定溫度為止。當將玻璃基板1的應變點設為T[單位:℃]時,對玻璃室11進行加熱,直至玻璃基板1的溫度較佳為T℃以下,更佳為(T-10℃)以下,進而較佳為(T-20℃)以下,進而更佳為(T-30℃)以下,尤佳為(T-40℃)以下,最佳為(T-50℃)以下為止。藉此,能夠儘量防止伴隨熱處理的玻璃基板1的形狀變化,且能夠減小玻璃基板1的熱收縮率。然而,若玻璃基板1未充分地被加熱,則無法適當地減小玻璃基板1的熱收縮率。因此,對玻璃室11進行加熱,直至玻璃基板1的溫度為(T-200℃)以上為止。Next, in the temperature increasing step, the glass chamber 11 (heat treatment space S in the glass chamber 11) is heated from the outside until the temperature of the glass substrate 1 is a predetermined temperature. When the strain point of the glass substrate 1 is T [unit: ° C], the glass chamber 11 is heated until the temperature of the glass substrate 1 is preferably T ° C or less, more preferably (T - 10 ° C) or less, and further It is preferably (T-20 ° C) or less, more preferably (T-30 ° C) or less, still more preferably (T-40 ° C) or less, and most preferably (T-50 ° C) or less. Thereby, the shape change of the glass substrate 1 accompanying heat processing can be prevented as much as possible, and the heat shrinkage rate of the glass substrate 1 can be reduced. However, if the glass substrate 1 is not sufficiently heated, the heat shrinkage rate of the glass substrate 1 cannot be appropriately reduced. Therefore, the glass chamber 11 is heated until the temperature of the glass substrate 1 is (T-200 ° C) or more.

在保溫步驟中,將已加熱至規定溫度的玻璃基板1在所述規定溫度下保持規定時間(具體而言為0.5分鐘~60分鐘)。藉此,能夠適當地減小各個玻璃基板1的熱收縮率,且能夠減小玻璃基板1相互間的熱收縮率的不均。In the heat retention step, the glass substrate 1 heated to a predetermined temperature is held at the predetermined temperature for a predetermined time (specifically, 0.5 minute to 60 minutes). Thereby, the heat shrinkage rate of each of the glass substrates 1 can be appropriately reduced, and the unevenness of the heat shrinkage ratio between the glass substrates 1 can be reduced.

在降溫步驟中,使玻璃基板1的溫度逐步下降。降溫速度較佳為1℃/分鐘以上,更佳為5℃/分鐘以上,進而較佳為10℃/分鐘以上。藉此,能夠使降溫步驟的處理時間縮短,且能夠提高玻璃基板1的生產性。然而,若降溫速度過快,則無法充分地減小玻璃基板1的熱收縮率,而且玻璃基板1的翹曲增大的可能性升高。因此,降溫速度較佳為100℃/分鐘以下,更佳為80℃/分鐘以下。In the temperature lowering step, the temperature of the glass substrate 1 is gradually lowered. The cooling rate is preferably 1 ° C / min or more, more preferably 5 ° C / min or more, and still more preferably 10 ° C / min or more. Thereby, the processing time of the temperature decreasing step can be shortened, and the productivity of the glass substrate 1 can be improved. However, if the temperature drop rate is too fast, the heat shrinkage rate of the glass substrate 1 cannot be sufficiently reduced, and the possibility that the warpage of the glass substrate 1 increases increases. Therefore, the temperature drop rate is preferably 100 ° C / min or less, more preferably 80 ° C / min or less.

再者,利用以下所述的方法,將玻璃基板1中所殘留的應變作為因應變而產生的應力進行測定。玻璃基板1中的應變能夠利用光學雙折射的測定,即正交的直線偏振波的光路差的測定來估算。將光路差設為R(nm),因應變而產生的應力(準確而言為偏差應力)F(MPa)表示為F=R/(C×L)。此處,L為偏振波通過的距離(cm),C(nm/cm)為取決於玻璃的比例常數,且被稱為光彈性常數(photoelastic constant)。Further, the strain remaining in the glass substrate 1 was measured as a stress due to strain by the method described below. The strain in the glass substrate 1 can be estimated by measurement of optical birefringence, that is, measurement of optical path difference of orthogonal linearly polarized waves. The optical path difference is set to R (nm), and the stress (accurately, the deviation stress) F (MPa) due to the strain is expressed as F = R / (C × L). Here, L is a distance (cm) through which a polarized wave passes, and C (nm/cm) is a proportional constant depending on glass, and is called a photoelastic constant.

對於熱處理後的玻璃基板1而言,因殘留的應變而產生的最大應力較佳為1 MPa以下。更佳為0.8 MPa以下,進而更佳為0.6 MPa以下,最佳為0.5 MPa以下。若處於所述範圍,則即使分割切斷,亦能夠抑制玻璃基板1的變形。In the glass substrate 1 after the heat treatment, the maximum stress due to the residual strain is preferably 1 MPa or less. More preferably, it is 0.8 MPa or less, further preferably 0.6 MPa or less, and most preferably 0.5 MPa or less. When it is in the above range, deformation of the glass substrate 1 can be suppressed even if the division is performed.

以上,對本發明實施形態的玻璃基板的熱處理方法進行了說明,但本發明的實施形態並不限定於此,能夠在不脫離本發明宗旨的範圍內實施各種變更。 [實施例]In the above, the heat treatment method of the glass substrate of the embodiment of the present invention has been described. However, the embodiment of the present invention is not limited thereto, and various modifications can be made without departing from the spirit and scope of the invention. [Examples]

分別於在將低摩擦片材配置於支持構件的上表面,且將玻璃基板載置於該低摩擦片材的上表面的狀態下實施熱處理的情況(以下,亦將其稱為「實施例」)下,以及於在將玻璃基板直接載置於支持構件的上表面的狀態下實施熱處理的情況(以下,亦將其稱為「比較例1及比較例2」)下,在熱處理前後,進行確認玻璃基板的平面方向的應變的確認試驗。The heat treatment is performed in a state where the low friction sheet is placed on the upper surface of the support member and the glass substrate is placed on the upper surface of the low friction sheet (hereinafter, also referred to as "the embodiment"). In the case where the heat treatment is performed in a state where the glass substrate is directly placed on the upper surface of the support member (hereinafter, also referred to as "Comparative Example 1 and Comparative Example 2"), it is carried out before and after the heat treatment. A confirmation test for confirming the strain in the plane direction of the glass substrate was performed.

當實施確認試驗時,在實施例中,準備4個包含支持構件/低摩擦片材/玻璃基板的組合件,在比較例1及比較例2中,準備4個包含支持構件/玻璃基板的組合件。接著,對該些各組合件實施熱處理。When the confirmation test was carried out, in the examples, four assemblies including the supporting member/low friction sheet/glass substrate were prepared, and in Comparative Example 1 and Comparative Example 2, four combinations including the supporting member/glass substrate were prepared. Pieces. Next, heat treatment is performed on each of the assemblies.

作為熱處理對象的玻璃基板在實施例、比較例1及比較例2中通用。使用厚度為0.5 mm的730 mm×920 mm的矩形形狀的玻璃基板(具體而言為日本電氣硝子股份有限公司製造的無鹼玻璃基板OA-11)作為玻璃基板。玻璃基板的線性熱膨脹係數為37×10-7 /℃(30℃~380℃),應變點為685℃,光彈性常數為30 nm/cm。而且,玻璃基板的下表面的表面粗糙度Ra為0.2 nm。再者,玻璃基板的上表面的表面粗糙度Ra雖不會直接影響確認試驗的結果,但為與玻璃基板的下表面相同的程度。The glass substrate to be subjected to heat treatment was used in Examples, Comparative Example 1, and Comparative Example 2. As the glass substrate, a 730 mm × 920 mm rectangular-shaped glass substrate (specifically, an alkali-free glass substrate OA-11 manufactured by Nippon Electric Glass Co., Ltd.) having a thickness of 0.5 mm was used. The glass substrate has a linear thermal expansion coefficient of 37 × 10 -7 / ° C (30 ° C to 380 ° C), a strain point of 685 ° C, and a photoelastic constant of 30 nm / cm. Further, the surface roughness Ra of the lower surface of the glass substrate was 0.2 nm. Further, although the surface roughness Ra of the upper surface of the glass substrate did not directly affect the result of the confirmation test, it was the same as the lower surface of the glass substrate.

在實施例、比較例1及比較例2中,支持構件的除了表面粗糙度Ra及靜摩擦係數以外的條件通用。使用厚度為4 mm的830 mm×1020 mm的矩形形狀的結晶化玻璃板(具體而言為日本電氣硝子股份有限公司製造的耐思瑞(NEOCERAM)N-0)作為支持構件。該支持構件的線性熱膨脹係數為-1×10-7 /℃(30℃~750℃)。支持構件的上表面的表面粗糙度Ra在比較例1中為0.8 μm,在比較例2中為0.5 nm。支持構件的上表面的靜摩擦係數在比較例1中為1.3,在比較例2中為0.8。再者,在比較例1、2中,使用了藉由研磨對所述結晶化玻璃板的表面進行調整後的結晶化玻璃板。實施例中的支持構件的上表面的表面粗糙度Ra及靜摩擦係數不會直接影響確認試驗的結果,因此未進行測定,而使用與比較例1相同程度的表面粗糙度Ra及靜摩擦係數。In the examples, the comparative examples 1 and the comparative example 2, the conditions of the support member other than the surface roughness Ra and the static friction coefficient were common. A 830 mm × 1020 mm rectangular crystallized glass plate (specifically, NEOCERAM N-0 manufactured by Nippon Electric Glass Co., Ltd.) having a thickness of 4 mm was used as a supporting member. The support member has a coefficient of linear thermal expansion of -1 x 10 -7 / ° C (30 ° C to 750 ° C). The surface roughness Ra of the upper surface of the support member was 0.8 μm in Comparative Example 1, and 0.5 nm in Comparative Example 2. The static friction coefficient of the upper surface of the support member was 1.3 in Comparative Example 1, and 0.8 in Comparative Example 2. Further, in Comparative Examples 1 and 2, a crystallized glass plate obtained by adjusting the surface of the crystallized glass plate by polishing was used. The surface roughness Ra and the static friction coefficient of the upper surface of the support member in the examples did not directly affect the results of the confirmation test. Therefore, the surface roughness Ra and the static friction coefficient were the same as those of Comparative Example 1, and the measurement was not performed.

使用厚度為200 μm的730 mm×920 mm的矩形形狀的石墨(純度為99.9%以上)作為低摩擦片材。低摩擦片材的上表面的表面粗糙度Ra為1.0 μm,靜摩擦係數為0.1~0.2。再者,低摩擦片材的下表面的表面粗糙度Ra及靜摩擦係數雖不會直接影響確認試驗的結果,但為與低摩擦片材的上表面相同的程度。A rectangular shape graphite of 730 mm × 920 mm (purity of 99.9% or more) having a thickness of 200 μm was used as the low friction sheet. The upper surface of the low friction sheet has a surface roughness Ra of 1.0 μm and a static friction coefficient of 0.1 to 0.2. Further, although the surface roughness Ra and the static friction coefficient of the lower surface of the low friction sheet did not directly affect the results of the confirmation test, they were the same as the upper surface of the low friction sheet.

熱處理條件在實施例、比較例1及比較例2中通用。熱處理條件是使室溫左右的玻璃基板以10℃/分鐘的升溫速度升溫至650℃之後,以650℃保持3分鐘,然後,使玻璃基板以60℃/分鐘的降溫速度降溫至室溫。再者,在用於試驗的全部玻璃基板中,熱處理前的因應變而產生的最大應力值為0.3 MPa~0.4 MPa。The heat treatment conditions were common to the examples, Comparative Example 1 and Comparative Example 2. The heat treatment conditions were such that the glass substrate at room temperature was heated to 650 ° C at a temperature increase rate of 10 ° C /min, and then held at 650 ° C for 3 minutes, and then the glass substrate was cooled to room temperature at a temperature drop rate of 60 ° C / min. Further, in all the glass substrates used for the test, the maximum stress value due to the strain before the heat treatment was 0.3 MPa to 0.4 MPa.

將所述確認試驗的試驗結果表示於表1。The test results of the confirmation test are shown in Table 1.

[表1] [Table 1]

表1亦表明在實施例中,構成玻璃基板的支持面的低摩擦片材的上表面的靜摩擦係數為0.5以下,且低摩擦片材的上表面的表面粗糙度Ra為玻璃基板的表面粗糙度Ra的5倍以上。另一方面,在比較例1中,構成玻璃基板的支持面的支持構件的上表面的靜摩擦係數超過0.5,且支持構件的上表面的表面粗糙度Ra為玻璃基板的表面粗糙度Ra的5倍以上。而且,在比較例2中,構成玻璃基板的支持面的支持構件的上表面的靜摩擦係數超過0.5,且支持構件的上表面的表面粗糙度Ra不足玻璃基板的表面粗糙度Ra的5倍。Table 1 also shows that in the embodiment, the static friction coefficient of the upper surface of the low friction sheet constituting the support surface of the glass substrate is 0.5 or less, and the surface roughness Ra of the upper surface of the low friction sheet is the surface roughness of the glass substrate. Ra is more than 5 times. On the other hand, in Comparative Example 1, the static friction coefficient of the upper surface of the support member constituting the support surface of the glass substrate exceeded 0.5, and the surface roughness Ra of the upper surface of the support member was 5 times the surface roughness Ra of the glass substrate. the above. Further, in Comparative Example 2, the static friction coefficient of the upper surface of the support member constituting the support surface of the glass substrate exceeded 0.5, and the surface roughness Ra of the upper surface of the support member was less than 5 times the surface roughness Ra of the glass substrate.

結果是在實施例中,對於全部的試樣,熱處理後的玻璃基板的因應變而產生的最大應力的值為0.3 MPa~0.4 MPa,未出現由熱處理引起的變化。相對於此,在比較例1中,熱處理後的玻璃基板的最大應力值為超過1.0 MPa的大的值。進而,在比較例2中,支持構件的上表面的表面粗糙度Ra不足玻璃基板的表面粗糙度Ra的5倍,因此,當玻璃基板與支持構件過度地密合,在熱處理時產生了玻璃基板與支持構件的熱膨脹差時,因該熱膨脹差而導致玻璃基板破損(在熱處理中破損)。因此,本發明的熱處理方法可謂在抑制伴隨熱處理的應變的產生方面有用。As a result, in the examples, the maximum stress due to the strain of the glass substrate after the heat treatment was 0.3 MPa to 0.4 MPa for all the samples, and no change due to the heat treatment occurred. On the other hand, in Comparative Example 1, the maximum stress value of the glass substrate after the heat treatment was a large value exceeding 1.0 MPa. Further, in Comparative Example 2, the surface roughness Ra of the upper surface of the support member was less than 5 times the surface roughness Ra of the glass substrate. Therefore, when the glass substrate and the support member were excessively adhered, a glass substrate was generated during the heat treatment. When the thermal expansion of the support member is inferior, the glass substrate is broken (broken during heat treatment) due to the difference in thermal expansion. Therefore, the heat treatment method of the present invention can be said to be useful in suppressing the generation of strain accompanying heat treatment.

結合所述確認試驗,評價玻璃基板伴隨熱處理而以何種程度進行熱收縮,即評價玻璃基板的熱收縮率。依照以下的(1)-(5)所示的順序,測定、計算出玻璃基板的熱收縮率。 (1)如圖4(a)所示,準備160 mm×30 mm的短條狀試樣G作為玻璃基板的試樣。 (2)使用粒度為1000的耐水研磨紙,分別在短條狀試樣G的長邊方向的兩端部的從端緣向長邊方向中央側偏移了20 mm~40 mm左右的位置,形成沿著短邊方向延伸的標記M。 (3)沿著長邊方向,將形成有標記M的短條狀試樣一分為二,製作試樣片Ga、Gb。 (4)利用熱處理裝置,僅對兩個試樣片Ga、Gb中的任一個試樣片(此處為試樣片Gb)進行熱處理。依照如下順序實施熱處理,即,以5℃/分鐘的升溫速度從常溫升溫至500℃→以500℃保持一小時→以5℃/分鐘的降溫速度降溫至常溫。 (5)以所述形態,對試樣片Gb實施熱處理之後,並排地配置未實施熱處理的試樣片Ga、與實施熱處理後的試樣片Gb,利用雷射顯微鏡來讀取兩個試樣片Ga、Gb中的標記M的位置偏移量ΔL1 、ΔL2 ,基於下述的數式而計算出熱收縮率[單位:ppm]。再者,下述數式中的L0 為熱處理前的標記M間的分隔距離。 熱收縮率=[{ΔL1 (μm)+ΔL2 (μm)}×103 ]/L0 (mm)In conjunction with the confirmation test, it was evaluated how much the glass substrate was thermally contracted with heat treatment, that is, the heat shrinkage rate of the glass substrate was evaluated. The heat shrinkage ratio of the glass substrate was measured and calculated in the order shown by the following (1)-(5). (1) As shown in Fig. 4 (a), a short strip sample G of 160 mm × 30 mm was prepared as a sample of a glass substrate. (2) The water-resistant abrasive paper having a particle size of 1000 is used, and the end portions of the short-length sample G in the longitudinal direction are shifted from the end edge to the center in the longitudinal direction by about 20 mm to 40 mm, respectively. A mark M extending in the short side direction is formed. (3) The short strip sample formed with the mark M is divided into two along the longitudinal direction to prepare sample pieces Ga and Gb. (4) Only one of the two sample pieces Ga and Gb (here, the sample piece Gb) is heat-treated by the heat treatment apparatus. The heat treatment was carried out in the following order, i.e., the temperature was raised from normal temperature to 500 ° C at a temperature increase rate of 5 ° C / minute → at 500 ° C for one hour → at a temperature drop rate of 5 ° C / minute to a normal temperature. (5) After heat-treating the sample piece Gb in the above-described form, the sample piece Ga not subjected to the heat treatment and the sample piece Gb after the heat treatment are placed side by side, and two samples are read by a laser microscope. The positional shift amounts ΔL 1 and ΔL 2 of the marks M in the sheets Ga and Gb are calculated based on the following equations (unit: ppm). Further, L 0 in the following formula is a separation distance between the marks M before heat treatment. Heat shrinkage rate = [{ΔL 1 (μm) + ΔL 2 (μm)} × 10 3 ] / L 0 (mm)

依照所述順序測定、計算出的玻璃基板的熱收縮率均為10 ppm左右的非常小的值。The heat shrinkage rate of the glass substrate measured and calculated according to the above procedure was a very small value of about 10 ppm.

根據以上內容,可理解本發明在減小玻璃基板的熱收縮率,且抑制伴隨熱處理的應變的產生方面有用。From the above, it can be understood that the present invention is useful in reducing the heat shrinkage rate of the glass substrate and suppressing the generation of strain accompanying the heat treatment.

1‧‧‧玻璃基板 1a‧‧‧上表面 1b‧‧‧下表面 1c‧‧‧周緣部 1d‧‧‧端面 1x‧‧‧交叉部 2‧‧‧支持構件 2a‧‧‧上表面 3‧‧‧低摩擦片材 3a‧‧‧上表面 3b‧‧‧下表面 3c‧‧‧伸出部 10‧‧‧熱處理裝置 11‧‧‧玻璃室 12‧‧‧玻璃架 12a‧‧‧柱部 12b‧‧‧架板 13‧‧‧升降台 13a‧‧‧載置部 14‧‧‧爐壁 15‧‧‧加熱器 16‧‧‧收容部 A-A‧‧‧線 C‧‧‧空隙 G‧‧‧短條狀試樣 Ga‧‧‧試樣片 Gb‧‧‧試樣片 L0 ‧‧‧分隔距離 M‧‧‧標記 S‧‧‧熱處理空間 X‧‧‧方向 Y‧‧‧方向 ΔL1 ‧‧‧位置偏移量 ΔL2 ‧‧‧位置偏移量1‧‧‧Glass substrate 1a‧‧‧ Upper surface 1b‧‧‧ Lower surface 1c‧‧‧ Peripheral part 1d‧‧‧ End face 1x‧‧‧ Intersection 2‧‧‧ Supporting member 2a‧‧‧ Upper surface 3‧‧ ‧ Low-friction sheet 3a‧‧‧ Upper surface 3b‧‧‧ Lower surface 3c‧‧‧ Extension 10‧‧‧ Heat treatment unit 11‧‧‧Glass room 12‧‧‧ Glass holder 12a‧‧‧ Column 12b‧ ‧‧板板13‧‧‧Elevator 13a‧‧‧Loading Department 14‧‧‧Walls 15‧‧‧Heaters 16‧‧‧Inclusion Department AA‧‧‧C‧‧‧Gap G‧‧‧ Short Strip sample Ga‧‧‧sample piece Gb‧‧‧sample piece L 0 ‧‧‧Separation distance M‧‧‧Market S‧‧‧ Heat treatment space X‧‧‧ Direction Y‧‧‧ Direction ΔL 1 ‧ ‧ Position offset ΔL 2 ‧‧‧ position offset

圖1(a)~圖1(b)是表示本發明實施形態的熱處理方法執行時的玻璃基板的支持形態的圖,圖1(a)是其俯視圖,圖1(b)是圖1(a)所示的A-A線箭視剖面圖。 圖2(a)~圖2(b)是表示相對於圖1(a)~圖1(b)的低摩擦片材的玻璃基板周緣部的載置形態的變化情況的放大圖。 圖3是實施本發明實施形態的熱處理方法時所使用的熱處理裝置的剖面圖。 圖4(a)~圖4(c)是用以對玻璃基板的熱收縮率的測定順序進行說明的圖。1(a) to 1(b) are views showing a support form of a glass substrate at the time of execution of the heat treatment method according to the embodiment of the present invention, wherein Fig. 1(a) is a plan view thereof, and Fig. 1(b) is a view of Fig. 1(a). ) AA line arrow view of the cross section shown. 2( a ) to 2 ( b ) are enlarged views showing changes in the mounting form of the peripheral edge portion of the glass substrate of the low friction sheet of FIGS. 1( a ) to 1 ( b ). Fig. 3 is a cross-sectional view showing a heat treatment apparatus used in carrying out the heat treatment method according to the embodiment of the present invention. 4( a ) to 4 ( c ) are diagrams for explaining a procedure for measuring the heat shrinkage rate of the glass substrate.

1‧‧‧玻璃基板 1‧‧‧ glass substrate

1a‧‧‧上表面 1a‧‧‧ upper surface

1c‧‧‧周緣部 1c‧‧‧The Peripheral Department

2‧‧‧支持構件 2‧‧‧Support components

2a‧‧‧上表面 2a‧‧‧Upper surface

3‧‧‧低摩擦片材 3‧‧‧Low-friction sheet

3a‧‧‧上表面 3a‧‧‧Upper surface

3c‧‧‧伸出部 3c‧‧‧Outreach

A-A‧‧‧線 A-A‧‧‧ line

Claims (7)

一種玻璃基板的熱處理方法,其在利用支持構件從下方支持玻璃基板的狀態下,進行用以減小所述玻璃基板的熱收縮率的熱處理,所述玻璃基板的熱處理方法的特徵在於: 將低摩擦片材至少配置於所述玻璃基板的下表面的被支持區域的周緣部、與對向於所述周緣部的所述支持構件的上表面之間,並且 將所述低摩擦片材的上表面的靜摩擦係數設為0.5以下,且將所述低摩擦片材的上表面的表面粗糙度Ra設為所述玻璃基板的下表面的表面粗糙度Ra的5倍以上的大小。A heat treatment method for a glass substrate, wherein a heat treatment for reducing a heat shrinkage rate of the glass substrate is performed in a state where a glass substrate is supported from below by a support member, and the heat treatment method for the glass substrate is characterized by: The friction sheet is disposed at least between a peripheral portion of the supported region of the lower surface of the glass substrate and an upper surface of the support member opposite to the peripheral portion, and the upper surface of the low friction sheet The static friction coefficient of the surface is set to 0.5 or less, and the surface roughness Ra of the upper surface of the low friction sheet is set to be 5 or more times the surface roughness Ra of the lower surface of the glass substrate. 如申請專利範圍第1項所述的玻璃基板的熱處理方法,其中 所述低摩擦片材的厚度為0.01 mm~2 mm。The method for heat-treating a glass substrate according to claim 1, wherein the low-friction sheet has a thickness of 0.01 mm to 2 mm. 如申請專利範圍第1項或第2項所述的玻璃基板的熱處理方法,其中 所述低摩擦片材的靜摩擦係數為0.2以下。The method for heat-treating a glass substrate according to the first or second aspect of the invention, wherein the low friction sheet has a static friction coefficient of 0.2 or less. 如申請專利範圍第1項至第3項中任一項所述的玻璃基板的熱處理方法,其中 所述低摩擦片材包含具有層狀結晶構造的無機物。The heat treatment method for a glass substrate according to any one of claims 1 to 3, wherein the low friction sheet contains an inorganic material having a layered crystal structure. 如申請專利範圍第1項至第4項中任一項所述的玻璃基板的熱處理方法,其中 所述低摩擦片材可剝離地鋪設於所述支持構件的上表面。The heat treatment method for a glass substrate according to any one of claims 1 to 4, wherein the low friction sheet is peelably laid on an upper surface of the support member. 如申請專利範圍第1項至第5項中任一項所述的玻璃基板的熱處理方法,其中 以使所述玻璃基板的整個下表面成為所述被支持區域的方式,將所述低摩擦片材設置於所述玻璃基板的整個下表面、與對向於所述整個下表面的所述支持構件的上表面之間。The method for heat-treating a glass substrate according to any one of the items 1 to 5, wherein the low friction sheet is formed such that the entire lower surface of the glass substrate becomes the supported region. The material is disposed between the entire lower surface of the glass substrate and the upper surface of the support member opposite to the entire lower surface. 如申請專利範圍第1項至第5項中任一項所述的玻璃基板的熱處理方法,其中 以使所述玻璃基板的下表面的除了周緣部以外的區域成為所述被支持區域的方式,使所述玻璃基板的下表面的周緣部從所述低摩擦片材伸出。The method for heat-treating a glass substrate according to any one of the first aspect of the present invention, wherein the region of the lower surface of the glass substrate other than the peripheral portion is the supported region. A peripheral portion of the lower surface of the glass substrate is projected from the low friction sheet.
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