TWI681836B - Laser processing system and laser processing method - Google Patents
Laser processing system and laser processing method Download PDFInfo
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- TWI681836B TWI681836B TW107111551A TW107111551A TWI681836B TW I681836 B TWI681836 B TW I681836B TW 107111551 A TW107111551 A TW 107111551A TW 107111551 A TW107111551 A TW 107111551A TW I681836 B TWI681836 B TW I681836B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
- B23K26/046—Automatically focusing the laser beam
- B23K26/048—Automatically focusing the laser beam by controlling the distance between laser head and workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/0869—Devices involving movement of the laser head in at least one axial direction
Abstract
Description
本發明是有關於一種可根據加工對象物的彎曲而調節高度的雷射加工系統及雷射加工方法。 The invention relates to a laser processing system and a laser processing method which can adjust the height according to the bending of the object to be processed.
雷射加工是指如下方式:利用聚光透鏡將雷射光束聚光成一個焦點形態,將上述焦點照射至加工對象物的表面或內部而進行加工。 Laser processing refers to a method in which a laser beam is condensed into a focal point form by a condenser lens, and the focal point is irradiated onto the surface or inside of the object to be processed.
於將雷射光束聚光至一個焦點而進行加工時,可獲得較高的能量密度,故而可利用上述雷射光束的焦點切割製品或於製品表面進行標記加工。聚光的雷射光束的尺寸根據雷射光束的波長、聚光透鏡的焦距、入射的雷射光束的直徑等而發生變化,雷射光束只有於聚光的焦點位置實施加工才可獲得更精確且穩定的加工品質。 When the laser beam is condensed to a focal point for processing, a higher energy density can be obtained, so the focal point of the laser beam can be used to cut the product or perform marking processing on the surface of the product. The size of the focused laser beam changes according to the wavelength of the laser beam, the focal length of the condenser lens, the diameter of the incident laser beam, etc. The laser beam can only be processed more accurately at the focal point And stable processing quality.
然而,因加工對象物彎曲等各種因素而加工對象物的各部位的高度會不同。 However, the height of each part of the object to be processed varies due to various factors such as bending of the object to be processed.
將於進行雷射加工時實現加工的高度稱為焦點深度 (Depth of Focus,DOF),若加工的製品的表面脫離焦點位置,則無法實現加工或對加工品質產生不良影響,因此重要的是固定地保持照射雷射光束的雷射照射部與加工對象物之間的距離。 The height that will be processed during laser processing is called the depth of focus (Depth of Focus, DOF), if the surface of the processed product is out of focus, the processing cannot be achieved or the processing quality is adversely affected, so it is important to keep the laser irradiation portion and the object to be processed irradiated with the laser beam fixedly the distance between.
為了固定地保持雷射照射部與加工對象物之間的距離,首先可於測定加工對象物的各部位的高度後,基於測定到的資料而調整雷射照射部的高度來照射雷射光束。 In order to maintain a fixed distance between the laser irradiation part and the object to be processed, first, after measuring the height of each part of the object to be processed, the height of the laser irradiation part may be adjusted based on the measured data to irradiate the laser beam.
然而,於此種方式中,單獨執行用以測定加工對象物的各部位的高度的資料獲取動作與照射雷射光束的加工動作。因此,加工對象物需經過雷射頭至少2次而較為繁瑣,從而於減少加工時間方面存在極限。 However, in this mode, the data acquisition operation for measuring the height of each part of the object to be processed and the processing operation for irradiating the laser beam are separately performed. Therefore, the object to be processed needs to pass through the laser head at least twice, which is cumbersome, and there is a limit in reducing the processing time.
本發明提供一種雷射加工系統及雷射加工方法,其同時執行用以測定加工對象物的各部位的高度的資料獲取動作與照射雷射光束的加工動作,藉此可減少加工對象物的加工時間。 The present invention provides a laser processing system and a laser processing method, which simultaneously executes a data acquisition operation for measuring the height of each part of a processing object and a processing operation of irradiating a laser beam, thereby reducing the processing of the processing object time.
本發明的一觀點的雷射加工方法是利用沿加工方向排列的雷射照射部與高度測定部同時對加工對象物進行高度測定與雷射加工者,其包括下列步驟:藉由上述高度測定部而測定上述加工對象物的第1區域的高度的步驟; 使上述加工對象物相對於上述雷射照射部及上述高度測定部進行相對移動而將上述雷射照射部定位至上述加工對象物的第1區域上,將上述高度測定部定位至與上述加工對象物的第1區域不同的第2區域上的步驟;於上述雷射照射部到達上述第1區域上時,基於藉由上述高度測定部測定到的上述第1區域的高度而調節上述雷射照射部及上述高度測定部的高度的步驟;及於上述雷射照射部對上述第1區域照射雷射光束的期間,上述高度測定部測定上述第2區域的高度的步驟;且於測定上述第2區域的高度的步驟中,可於由上述高度測定部測定到的上述第2區域的測定資料中反映上述高度測定部的高度變化而算出上述第2區域的高度資訊。 A laser processing method according to an aspect of the present invention uses a laser irradiation portion and a height measuring portion arranged along the processing direction to simultaneously measure the height of the object to be processed and the laser processing, and includes the following steps: And the step of measuring the height of the first region of the object to be processed; The object to be processed is relatively moved with respect to the laser irradiation unit and the height measurement unit to position the laser irradiation unit on the first region of the object to be processed, and the height measurement unit is positioned to be in contact with the object to be processed A step on the second area that is different from the first area of the object; when the laser irradiation section reaches the first area, adjusting the laser irradiation based on the height of the first area measured by the height measuring section The step of measuring the height of the portion and the height measuring portion; and the step of measuring the height of the second area by the height measuring portion while the laser irradiating portion irradiates the first area with a laser beam; In the step of the height of the area, the height information of the second area can be calculated by reflecting the height change of the height measuring portion in the measurement data of the second area measured by the height measuring portion.
於一實施例中,在上述高度測定部的高度增加或減小時,可對藉由上述高度測定部測定到的上述第2區域的測定資料減去或相加上述高度測定部的高度變化而算出上述第2區域的高度資訊。 In one embodiment, when the height of the height measuring section increases or decreases, the measurement data of the second area measured by the height measuring section can be calculated by subtracting or adding the height change of the height measuring section Height information of the above second area.
於一實施例中,上述第1區域為上述加工對象物的一端部的區域,可於上述第1區域經過上述高度測定部後且在到達上述雷射照射部前開始調節上述雷射照射部的高度。 In one embodiment, the first area is an area at one end of the object to be processed. After the first area passes through the height measuring portion and before reaching the laser irradiating portion, the adjustment of the laser irradiating portion can be started. height.
於一實施例中,以上述雷射照射部可到達對上述第1區域的特定部位照射雷射光束的目標高度的方式多次變更上述雷射照射部的高度直至上述雷射照射部的高度到達上述目標高度。 In one embodiment, the height of the laser irradiation unit is changed multiple times until the height of the laser irradiation unit reaches the target height that the laser irradiation unit can reach the target height for irradiating the laser beam to a specific part of the first region The above target height.
於一實施例中,可進行多次上述雷射照射部的高度變更而每次變更特定的單位高度。 In one embodiment, the height of the laser irradiation unit may be changed multiple times and the specific unit height may be changed each time.
於一實施例中,上述高度測定部可每隔特定距離的測定間隔以測定上述加工對象物的高度,上述雷射照射部的高度變更次數小於將上述高度測定部與上述雷射照射部之間的距離除以上述高度測定部的上述測定間隔所得的值。 In one embodiment, the height measurement unit may measure the height of the object to be processed at a measurement interval of a specific distance, and the number of times the height of the laser irradiation unit changes is less than that between the height measurement unit and the laser irradiation unit The distance is divided by the value obtained by the measurement interval of the height measuring section.
於一實施例中,可利用藉由上述高度測定部測定到的測定資料的移動平均算出上述加工對象物的高度資訊。 In one embodiment, the height information of the object to be processed can be calculated using the moving average of the measurement data measured by the height measuring unit.
本發明的一觀點的雷射加工系統包括:作業台,搭載加工對象物;高度測定部,測定上述加工對象物的各區域的高度;雷射照射部,對上述加工對象物照射雷射光束;頭部,以上述雷射照射部與上述高度測定部沿加工方向排列的方式支持上述雷射照射部與上述高度測定部;升降驅動部,用以調節上述頭部的高度;及控制部,控制上述升降驅動部的驅動,且上述作業台及上述頭部中的至少一者可沿與上述雷射光束的光軸方向交叉的方向移動,上述高度測定部因上述頭部的高度發生變化而改變高度,上述控制部可於藉由上述高度測定部測定到的測定資料中反映上述高度測定部的高度變化而算出上述加工對象物的高度資訊,基於上述高度資訊而控制上述升降驅動部。 A laser processing system according to an aspect of the present invention includes: a work table on which a processing object is mounted; a height measurement unit that measures the height of each region of the processing object; a laser irradiation unit that irradiates the processing object with a laser beam; The head, supporting the laser irradiation part and the height measuring part in such a manner that the laser irradiation part and the height measuring part are arranged along the processing direction; the lifting drive part for adjusting the height of the head; and the control part, controlling Driven by the elevating drive unit, and at least one of the worktable and the head can move in a direction crossing the optical axis direction of the laser beam, and the height measuring unit changes due to a change in the height of the head The height, the control unit may calculate the height information of the object to be processed by reflecting the height change of the height measurement unit in the measurement data measured by the height measurement unit, and control the lift drive unit based on the height information.
於一實施例中,上述控制部於上述高度測定部的高度增加或減小時,可對藉由上述高度測定部測定到的測定資料減去或相加上述高度測定部的高度變化而算出上述加工對象物的高度資訊。 In one embodiment, when the height of the height measuring part increases or decreases, the control part may subtract or add the height change of the height measuring part to the measurement data measured by the height measuring part to calculate the processing The height information of the object.
於一實施例中,上述加工對象物相對於上述雷射照射部而沿與上述雷射光束的光軸方向交叉的方向移動,上述控制部能夠以如下方式控制上述升降驅動部:於上述加工對象物的一端部區域經過上述高度測定部後且於到達上述雷射照射部前,開始調節上述雷射照射部的高度。 In one embodiment, the object to be processed moves relative to the laser irradiation unit in a direction crossing the optical axis direction of the laser beam, and the control unit can control the elevating drive unit as follows: After one end region of the object passes through the height measuring section and before reaching the laser irradiation section, the height of the laser irradiation section is adjusted.
於一實施例中,上述控制部能夠以如下方式控制上述升降驅動部:以上述雷射照射部可到達對上述加工對象物的特定部位照射雷射光束的目標高度的方式多次變更上述雷射照射部的高度直至上述雷射照射部的高度到達上述目標高度。 In one embodiment, the control unit can control the lift drive unit in such a manner that the laser irradiation unit changes the laser light multiple times so that the laser irradiation unit can reach a target height for irradiating a specific portion of the object to be processed with the laser beam The height of the irradiated part until the height of the laser irradiated part reaches the target height.
於一實施例中,上述控制部能夠以如下方式控制上述升降驅動部:進行多次上述雷射照射部的高度變更而每次變更特定的單位高度。 In one embodiment, the control unit can control the lift drive unit in such a manner that the height of the laser irradiation unit is changed multiple times and the specific unit height is changed every time.
於一實施例中,上述高度測定部可每隔特定距離的測定間隔以測定上述加工對象物的高度,上述雷射照射部的高度變更次數小於將上述高度測定部與上述雷射照射部之間的距離除以上述高度測定部的上述測定間隔所得的值。 In one embodiment, the height measurement unit may measure the height of the object to be processed at a measurement interval of a specific distance, and the number of times the height of the laser irradiation unit changes is less than that between the height measurement unit and the laser irradiation unit The distance is divided by the value obtained by the measurement interval of the height measuring section.
於一實施例中,上述控制部可利用藉由上述高度測定部測定到的測定資料的移動平均算出上述加工對象物的高度資訊。 In one embodiment, the control unit may calculate the height information of the object to be processed using the moving average of the measurement data measured by the height measurement unit.
本發明的實施例的雷射加工系統及雷射加工方法同時執行用以測定加工對象物的各部位的高度的資料獲取動作與照射雷射光束的加工動作,藉此可減少加工對象物的加工時間。 The laser processing system and the laser processing method of the embodiment of the present invention simultaneously perform the data acquisition operation for measuring the height of each part of the processing object and the processing operation of irradiating the laser beam, thereby reducing the processing of the processing object time.
10‧‧‧作業台 10‧‧‧operating table
20‧‧‧雷射照射部 20‧‧‧Laser exposure department
30‧‧‧高度測定部 30‧‧‧Altitude Measurement Department
40‧‧‧頭部 40‧‧‧Head
50‧‧‧升降驅動部 50‧‧‧ Lifting drive
60‧‧‧控制部 60‧‧‧Control Department
100‧‧‧雷射加工系統 100‧‧‧Laser processing system
G‧‧‧間隔 G‧‧‧Interval
g1、g2、g21、g3‧‧‧測定資料 g1, g2, g21, g3 ‧‧‧ measured data
H1、H2、H3‧‧‧高度 H1, H2, H3‧‧‧ Height
h1、h2、h3‧‧‧高度資訊 h1, h2, h3‧‧‧ altitude information
L‧‧‧雷射光束 L‧‧‧Laser beam
T0‧‧‧特定時點 T 0 ‧‧‧ specific time
T1、T2‧‧‧整體雷射加工時間 T 1 , T 2 ‧‧‧ Overall laser processing time
t1、t2‧‧‧整體時間 t 1 , t 2 ‧‧‧ overall time
TA0、TA‧‧‧加工對象物 TA 0 、TA‧‧‧Object to be processed
TA1‧‧‧第1區域
TA1‧‧‧
TA2‧‧‧第2區域
TA2‧‧‧
TA3‧‧‧第3區域
TA3‧‧‧
△H1‧‧‧高度變化量 △H1‧‧‧Altitude change
△H2‧‧‧高度變化量 △H2‧‧‧Altitude change
圖1是概念性地表示實施例的雷射加工系統的一例的圖。 FIG. 1 is a diagram conceptually showing an example of a laser processing system of an embodiment.
圖2是用以說明加工對象物的一例的圖。 2 is a diagram for explaining an example of an object to be processed.
圖3a及圖3b是用以說明比較例的雷射加工方法的圖。 3a and 3b are diagrams for explaining the laser processing method of the comparative example.
圖4是概念性地表示實施例的雷射加工系統的動作的圖。 4 is a diagram conceptually showing the operation of the laser processing system of the embodiment.
圖5a至圖5c是依序表示圖4的雷射加工系統的動作的圖。 5a to 5c are diagrams showing the operation of the laser processing system of FIG. 4 in sequence.
圖6是表示圖3a及圖3h的比較例的雷射加工系統的雷射加工時間的示例的圖表。 6 is a graph showing an example of laser processing time of the laser processing system of the comparative example of FIGS. 3a and 3h.
圖7是表示圖4的實施例的雷射加工系統的雷射加工時間的示例的圖表。 7 is a graph showing an example of laser processing time of the laser processing system of the embodiment of FIG. 4.
圖8是表示於特定時點變更雷射照射部的高度的示例的圖表。 8 is a graph showing an example of changing the height of a laser irradiation unit at a specific time.
圖9是表示自特定時點前變更雷射照射部的高度的示例的圖表。 FIG. 9 is a graph showing an example of changing the height of the laser irradiation unit from before a specific time point.
以下,參照隨附圖式,詳細地對本發明的實施例進行說明。於圖中,相同的參照符號表示相同的構成要素,為了明確地進行說明,可放大各構成要素的尺寸或厚度。 Hereinafter, referring to the accompanying drawings, embodiments of the present invention will be described in detail. In the drawings, the same reference numerals denote the same constituent elements, and the size or thickness of each constituent element may be exaggerated for the sake of clear explanation.
如“第1”、“第2”等的包括序數的用語可用於說明各種構成要素,但構成要素並不受用語的限定。用語僅以將一個構成要素區分於其他構成要素為目的而使用。例如,可不脫離本發明的發明申請專利範圍而將第1構成要素命名為第2構成要素,相似地,亦可將第2構成要素命名為第1構成要素。用語“及/或”包括多個相關項目的組合或多個相關項目中的任一項目。 Terms including ordinal numbers such as "first" and "second" can be used to describe various constituent elements, but the constituent elements are not limited by the terms. The term is used only for the purpose of distinguishing one component from other components. For example, the first component may be named the second component without departing from the scope of the invention patent application of the present invention, and similarly, the second component may be named the first component. The term "and/or" includes a combination of multiple related items or any of the multiple related items.
圖1是概念性地表示實施例的雷射加工系統100的一例的圖。圖2是用以說明加工對象物TA0的一例的圖。
FIG. 1 is a diagram conceptually showing an example of a
參照圖1,雷射加工系統100包括搭載加工對象物TA0的作業台10、及對加工對象物TA0照射雷射光束L的雷射照射部20。
Referring to FIG. 1, a
作業台10及雷射照射部20中的至少一者可沿與雷射光束L的光軸方向交叉的方向移動。
At least one of the table 10 and the
作為一例,作業台10可沿與雷射光束L的光軸方向垂直的方向移動。因此,搭載於作業台10的加工對象物TA0可與作業台10一併沿與雷射光束L的光軸方向垂直的方向移動。 As an example, the table 10 can move in a direction perpendicular to the optical axis direction of the laser beam L. Therefore, the object to be processed TA 0 mounted on the table 10 can be moved in the direction perpendicular to the optical axis direction of the laser beam L together with the table 10.
雷射照射部20可對加工對象物TA0的特定區域照射雷射光束L。例如,雷射照射部20能夠以於加工對象物TA0的內部或表面凝聚雷射光束L的焦點的方式照射雷射光束L。作為一例,
可將雷射光束L聚光至加工對象物TA0的內部而形成重組區域。作為另一例,可將雷射光束L聚光至加工對象物TA0的表面而於加工對象物TA0的表面形成槽。
The
隨著作業台10移動而沿與作業台10的移動方向相反的方向(即加工方向)對加工對象物TA0照射雷射光束L。 As the work table 10 moves, the laser beam L is irradiated to the object TA 0 in a direction opposite to the moving direction of the work table 10 (that is, the processing direction).
然而,加工對象物TA0的理想狀態是呈平坦的形態,但因加工對象物TA的彎曲現象等各種原因而加工對象物TA實際上會不平坦。參照圖2,加工對象物TA彎曲而加工對象物TA的上部表面高度會不固定。此處,高度定義為以作業台10的上部表面為基準的高度。 However, the ideal state of the object to be processed TA 0 is flat, but the object to be processed TA is actually not flat due to various reasons such as the bending phenomenon of the object to be processed TA. Referring to FIG. 2, the object TA is curved, and the height of the upper surface of the object TA may not be fixed. Here, the height is defined as the height based on the upper surface of the table 10.
於在加工對象物TA的上部表面高度不固定的狀態下,藉由雷射照射部20照射的雷射光束L聚光至距作業台10特定的高度的情形時,雷射光束L聚光至加工對象物TA的位置不固定、或完全不於加工對象物TA的一部分區域聚光等會造成加工品質明顯降低。
In the case where the height of the upper surface of the object TA is not fixed, when the laser beam L irradiated by the
考量到此種方面,雷射加工系統100可更包括:高度測定部30,測定加工對象物TA的各區域的高度;頭部40,以高度測定部30與雷射照射部20沿加工方向排列的方式支持上述高度測定部及上述雷射照射部;升降驅動部50,用以調節支持雷射照射部20的頭部40的高度;及控制部60,基於藉由高度測定部30測定到的測定資料而控制升降驅動部50的驅動。
In consideration of this aspect, the
高度測定部30測定加工對象物TA的各區域的高度。加
工對象物TA的各區域的高度可為實現雷射加工的高度,即焦點深度(Depth of Focus:DOF)。
The
作為一例,加工對象物TA相對於高度測定部30進行相對移動,高度測定部30以特定的時間間隔測定加工對象物TA的高度。因此,藉由高度測定部30以每隔特定距離的測定間隔來測定加工對象物TA的高度。高度測定部30可沿加工方向配置至雷射照射部20的下游。高度測定部30可沿加工對象物TA的移動方向配置至雷射照射部20的上游。因此,於藉由雷射照射部20而對加工對象物的一部分區域照射雷射光束L前,可藉由高度測定部30而測定上述加工對象物TA的一部分區域的高度。
As an example, the object TA is moved relative to the
高度測定部30與雷射照射部20可隔開特定的間隔。高度測定部30與雷射照射部20之間的間隔G可為70mm以上。高度測定部30與雷射照射部20之間的間隔G可為1000mm以下。此處,高度測定部30與雷射照射部20之間的間隔G可為自高度測定部30的中心至雷射照射部20的中心為止的距離。
The
高度測定部30可藉由非接觸方式而測定加工對象物TA的高度。高度測定部30可為非接觸位移感測器。非接觸位移感測器可利用雷射或超音波測定距加工對象物TA的距離而測定加工對象物TA的高度。此處,非接觸位移感測器屬於通常所熟知的公知技術,因此省略對非接觸位移感測器的詳細說明。
The
控制部60可基於藉由高度測定部30測定到的測定資料而控制升降驅動部50來調節雷射照射部20的高度。升降驅動部
50可藉由調節支持高度測定部30與雷射照射部20的頭部40的高度而調節雷射照射部20的高度。
The
然而,先前為了利用此種高度測定部30調節雷射照射部20的高度而採用如下方式:於藉由高度測定部30而測定加工對象物TA的各區域的高度後,基於測定到的此種資料而調節雷射照射部20的高度,實施雷射加工。
However, in the past, in order to adjust the height of the
圖3a及圖3b是用以說明比較例的雷射加工方法的圖。 3a and 3b are diagrams for explaining the laser processing method of the comparative example.
根據比較例,如圖3a般首先藉由高度測定部30而測定加工對象物TA的各區域的高度。於加工對象物TA的各區域的高度測定結束後,如圖3b般基於藉由高度測定部30測定到的資料而調整頭部40的高度,藉由雷射照射部20而對加工對象物TA照射雷射光束L。
According to the comparative example, first, as shown in FIG. 3A, the height of each area of the object TA is measured by the
比較例的雷射加工方法於實現對加工對象物TA的加工時,為了測定加工對象物TA的各區域的高度而需將加工對象物TA移動1次以上,為了對加工對象物TA的各區域照射雷射光束L而需將加工對象物TA移動1次。因此,於比較例的雷射加工方法中,必須將加工對象物TA移動2次以上,因此存在雷射加工時間增加的問題。 In the laser processing method of the comparative example, in order to measure the height of each area of the object TA, it is necessary to move the object TA once or more in order to measure the height of each area of the object TA. To irradiate the laser beam L, it is necessary to move the object TA once. Therefore, in the laser processing method of the comparative example, it is necessary to move the object TA to be processed twice or more, so there is a problem that the laser processing time increases.
考量到此種方面,於實施例的雷射加工系統100及雷射加工方法中欲提供一種為了減少雷射加工時間而同時對加工對象物TA進行高度測定與雷射加工的裝置及方法。
Taking this aspect into consideration, the
如上所述,可藉由同時進行高度測定與雷射加工而將加 工對象物TA的移動次數減少一半以上,藉此可減少雷射加工時間。 As mentioned above, the height measurement and laser processing can be performed simultaneously The number of movements of the object TA is reduced by more than half, thereby reducing the laser processing time.
圖4是概念性地表示實施例的雷射加工系統100的動作的圖,圖5a至圖5c是依序表示圖4的雷射加工系統100的動作的圖。方便起見,於圖4及圖5a至圖5c中省略對升降驅動部50及控制部60的圖示。
4 is a diagram conceptually showing the operation of the
參照圖4,於實施例的雷射加工系統100中,在沿加工對象物TA的移動方向配置於上游的高度測定部30測定加工對象物TA的一區域的高度的期間,沿加工對象物TA的移動方向配置於下游的雷射照射部20可對加工對象物TA的其他區域照射雷射光束L。
Referring to FIG. 4, in the
參照圖5a,作業台10朝一方向、例如左側方向移動。因此,搭載於作業台10的加工對象物TA朝左側方向移動。
Referring to FIG. 5a, the
沿加工對象物TA的移動方向配置於上游的高度測定部30首先測定加工對象物TA的第1區域TA1的高度。第1區域TA1可為加工對象物TA的一端部區域。然而,第1區域TA1並不限定於此,亦可為除加工對象物TA的兩端部以外的中間區域。
The
此時,高度測定部30的高度H1不發生變化,因此可基於在高度測定部30測定到的測定資料g1而算出第1區域TA1的高度資訊h1。作為一例,於測定資料g1為加工對象物TA的第1區域TA1與高度測定部30之間的距離的情形時,第1區域TA1的高度資訊h1可為自高度測定部30的高度H1減去上述測定資料
g1所得的值。
At this time, the height H1 of the
參照圖5b,加工對象物TA相對於雷射照射部20及高度測定部30移動而雷射照射部20位於上述第1區域TA1上,高度測定部30位於與第1區域TA1鄰接的第2區域TA2上。第2區域TA2可沿加工對象物TA的移動方向位於第1區域TA1的上游。
Referring to FIG. 5b, the object to be processed TA moves relative to the
控制部60基於藉由高度測定部30測定到的第1區域TA1的測定資料而控制升降驅動部50,藉此調節頭部40的高度。例如,控制部60基於第1區域TA1的高度資訊而控制升降驅動部50,藉此調節頭部40的高度。因此,即便加工對象物TA的高度發生變化,由頭部40支持的雷射照射部20亦可將雷射光束L聚光照射至加工對象物TA的第1區域TA1的特定深度。
The
然而,因調節頭部40的高度而高度測定部30的高度H2與雷射照射部20一併發生變化。藉由高度測定部30對第2區域TA2測定到的測定資料g2產生因高度測定部30的高度H2發生變化引起的誤差,因此變得難以將第2區域TA2的測定資料g2直接用於算出第2區域TA2的高度資訊h2。
However, the height H2 of the
例如,如圖5b般於高度測定部30上升特定的高度△H1的狀態下測定到的第2區域TA2的測定資料g2較於高度測定部30不上升的狀態下測定到的第2區域TA2的測定資料g21增大△H1。
For example, as shown in FIG. 5b, the measurement data g2 of the second area TA2 measured in a state where the
考量到因此種高度測定部30的高度變化引起的測定資
料的誤差或失真,控制部60於第2區域TA2的測定資料中反映高度測定部30的高度變化而算出第2區域TA2的高度資訊並儲存。例如,若高度測定部30的高度變高△H1,則控制部60可基於對第2區域TA2的測定資料g2減去高度變化量△H1所得的值而算出第2區域TA2的高度資訊h2。與圖式不同,若高度測定部30的高度降低△H1,則控制部60可基於對第2區域TA2的測定資料相加高度變化量△H1所得的值而算出第2區域TA2的高度資訊h2。
Considering the measurement data caused by the height change of the
參照圖5c,加工對象物TA相對於雷射照射部20及高度測定部30移動而雷射照射部20位於第2區域TA2上,高度測定部30位於與第2區域TA2鄰接的第3區域TA3上。第3區域TA3可沿加工對象物TA的移動方向位於第2區域TA2的上游。
Referring to FIG. 5c, the object TA moves relative to the
控制部60基於第2區域TA2的高度資訊h2而控制升降驅動部50,藉此調節頭部40的高度。因此,即便加工對象物TA的高度發生變化,支持於頭部40的雷射照射部20亦可將雷射光束L聚光照射至第2區域TA2的特定深度。
The
因調節頭部40的高度而高度測定部30的高度H3與雷射照射部20一併發生變化。考量到因此種高度測定部30的高度變化量△H2引起的誤差或失真,控制部60可於第3區域TA3的測定資料g3中反映高度測定部30的高度變化量△H2而算出第3區域TA3的高度資訊h3。
The height H3 of the
如上所述,於雷射照射部20對一區域照射雷射光束L
的期間,高度測定部30測定鄰接的其他區域的高度而補償高度變化量,藉此可減少加工時間,並且將高度測定的誤差最小化而防止加工品質下降。
As described above, the
圖6是表示圖3a及圖3b的比較例的雷射加工系統100的雷射加工時間的示例的圖表,圖7是表示圖4的實施例的雷射加工系統100的雷射加工時間的示例的圖表。
6 is a graph showing an example of the laser processing time of the
參照圖3a、圖3b及圖6,於照射雷射光束L前,首先測定加工對象物TA的各區域的高度。此時,花費用以測定各區域的高度的整體時間t1。 3a, 3b, and 6, before irradiating the laser beam L, the height of each area of the object TA is first measured. At this time, it takes the entire time t 1 to measure the height of each area.
於各區域的高度測定結束後,加工對象物TA移動至初始位置,之後基於測定到的測定資料而調節雷射照射部20的高度來對加工對象物TA照射雷射光束L。此時,花費用以對加工對象物TA照射雷射光束L的整體時間t2。
After the height measurement of each area is completed, the object TA is moved to the initial position, and then the laser beam L is irradiated to the object TA by adjusting the height of the
如上所述,比較例的雷射加工系統100於對加工對象物TA的高度測定全部結束後照射雷射光束L,故而整體雷射加工時間T1與用以進行高度測定的整體時間t1與用以照射雷射光束L的整體時間t2之和相同或大於上述和。
As described above, the
與此相反,參照圖4及圖7,於實施例的雷射加工系統100中,加工對象物TA沿特定的方向移動,高度測定部30開始測定加工對象物TA的各區域的高度。
In contrast, referring to FIGS. 4 and 7, in the
即便於對加工對象物TA的各區域的高度測定全部結束之前,自加工對象物TA經過雷射照射部20的下部時起,雷射照
射部20即開始照射雷射光束L。此時,雖為藉由高度測定部30對加工對象物TA的各區域進行的高度測定全部結束前的狀態,但加工對象物TA中的經過雷射照射部20的下部的區域的高度為測定結束的狀態。
That is, before the height measurement of each area of the object TA is completed, the laser light is irradiated from the time when the object TA passes through the lower part of the
因此,於實施例的雷射加工系統100中,在雷射照射部20改變高度而對加工對象物TA照射雷射光束L的同時,高度測定部30可考量高度變化而測定加工對象物TA的高度。
Therefore, in the
如上所述,不分離高度測定步驟與雷射加工步驟而一併實施,藉此可減少整體雷射加工時間。於實施例的雷射加工系統100中,整體雷射加工時間T2小於用以對加工對象物TA進行高度測定的整體時間t1與用以照射雷射光束L的整體時間t2之和。
As described above, the step of measuring the height and the step of laser processing are not performed separately, thereby reducing the overall laser processing time. The laser processing system according to
另一方面,於支持高度測定部30與雷射照射部20的頭部40沿光軸方向變更位置的過程中,會對升降驅動部50產生負載。例如,參照圖5a及圖5b,於加工對象物TA初次到達雷射照射部20的下部時,能夠以雷射照射部20可到達將雷射光束L照射至加工對象物TA的一端部區域的特定深度的目標高度變化量△H1的方式調節雷射照射部20的高度。此時,所需的雷射照射部20的高度變化量△H1會大於支持雷射照射部20的頭部40可於基準時間內移動的單位移動量。因此,會對使頭部40上升的升降驅動部50產生負載。
On the other hand, as the position of the
考量到此種方面,實施例的控制部60能夠以如下方式控制升降驅動部50:於加工對象物TA的一端部區域經過高度測
定部30後且在到達雷射照射部20前,開始調節雷射照射部20的高度。
Taking this aspect into consideration, the
即,控制部60並非於加工對象物TA的一端部區域到達雷射照射部20的較短的瞬間調節雷射照射部20的高度,而是於加工對象物TA的一端部區域到達雷射照射部20前開始進行高度調節,從而可於相對較長的時間內調節雷射照射部20的高度。因此,控制部60能夠以多次變更雷射照射部20的高度直至雷射照射部20的高度到達目標高度的方式控制升降驅動部50。控制部60能夠以進行多次雷射照射部20的高度變更而每次變更單位高度的方式控制升降驅動部50。變更雷射照射部20的高度的單位高度可為0.1μm至1.0μm。
That is, the
控制部60能夠以逐漸或階段式地表現出支持雷射照射部20的頭部40的高度變化的方式控制升降驅動部50的驅動。
The
圖8是表示於特定時點變更雷射照射部20的高度的示例的圖表,圖9是表示於特定時點前變更雷射照射部20的高度的示例的圖表。
8 is a graph showing an example of changing the height of the
參照圖8,於至特定時點T0為止雷射照射部20的高度變化需要△H1的情形時,可一次將雷射照射部20上升△H1。然而,於此種雷射照射部20的高度變化量△H1變大的情形,例如於在雷射照射部20的高度方向上較單位移動量大10倍以上或100倍以上的情形時,會對升降驅動部50產生負載。此處,雷射照射部20的單位移動量可與頭部40的單位移動量相同。
Referring to FIG. 8, when the height change of the
與此相反,參照圖9,於控制部60以自特定時點T0前的時點至特定時點T0為止將雷射照射部20上升多次、例如5次的方式控制升降驅動部50的驅動的情形時,可防止或減少對升降驅動部50產生負載的情形。
In contrast, referring to FIG. 9, in order from a particular point in time before the time point 0 T control unit 60-0 until the
於上述實施例中,將雷射照射部20的高度變更次數例示為5次,但並不限定於此,可進行各種變形。然而,雷射照射部20的高度變更次數可小於將高度測定部30與雷射照射部20之間的距離除以高度測定部30的測定間隔所得的值。
In the above-mentioned embodiment, the number of times of changing the height of the
高度測定部30與雷射照射部20之間存在特定間隔,故而自加工對象物TA的一區域經過高度測定部30後至到達雷射照射部20為止存在時間差。控制部60可利用此種時間差階段式地使頭部40上升或下降。
Since there is a certain interval between the
藉由高度測定部30測定到的測定資料可每隔特定的測定間隔儲存至記憶體變數且進行實時監測。將加工方向上的位置值除以測定間隔而進行計數,計數所得的值可用作儲存各區域的測定資料的記憶體變數的地址值。
The measurement data measured by the
沿加工方向而每隔特定的測定間隔實施測定的高度測定部30可儲存進入至實際實現加工的加工對象物TA的區域而產生的初始測定資料值與儲存此種初始測定資料值的記憶體變數地址。於初始測定資料值為n、儲存初始測定資料值的記憶體變數地址為m、初始測定資料值n為正數值且將階段(Step)次數設為5個階段的情形時,分別於記憶體變數地址m-1、m-2、m-3、m
-4儲存n-{(n/5)*1}、n-{(n/5)*2}、n-{(n/5)*3}、n-{(n/5)*4}的值作為高度資料值。
The
若初始測定資料值n為負數值,則可於記憶體變數地址m-1、m-2、m-3、m-4儲存n-{(n/5)*1}、n-{(n/5)*2}、n-{(n/5)*3}、n-{(n/5)*4}的值。 If the initial measured data value n is a negative value, you can store n-{(n/5)*1}, n-{(n at the memory variable address m-1, m-2, m-3, m-4 /5)*2}, n-{(n/5)*3}, n-{(n/5)*4} values.
而且,為了自藉由高度測定部30測定到的測定資料值去除雜訊,控制部60可使用移動平均濾波器。
Furthermore, in order to remove noise from the measured data value measured by the
作為一例,可基於藉由高度測定部30測定到的測定資料的加權移動平均值而算出加工對象物TA的高度資訊。例如,可基於相較當前藉由高度測定部30測定到的當前資料值而對過去藉由高度測定部30測定到的過去資料值賦予加權值的加權移動平均值而算出加工對象物TA的高度資訊。於當前測定到的當前資料值為nt、最近測定到的3個過去資料值為nt-1、nt-2、nt-3時,移動平均濾波器可算出作為儲存資料的(nt-3*10+nt-2*10+nt-1*10+nt)/31。移動平均濾波器於使用包括當前資料值的最近4個資料值的情形時,不應用最初3個資料值而可自輸入第4個資料值的時點起開始應用。
As an example, the height information of the object TA can be calculated based on the weighted moving average of the measurement data measured by the
控制部60可藉由使用此種移動平均濾波器而有效地去除藉由高度測定部30測定到的測定資料中的雜訊。
The
另一方面,於上述實施例中,以於雷射加工系統100中作業台10進行水平移動且頭部40進行垂直移動的示例為中心進行了說明,但並不限定於此。例如,作業台10當然亦可進行垂直
移動,且頭部40進行水平移動。
On the other hand, in the above-mentioned embodiment, the example in which the table 10 moves horizontally and the
以上,對本發明的實施例進行了說明,但上述實施例僅為示例,於本領域內具有常識者應理解可根據上述實施例實現各種變形及等同的其他實施例。 In the above, the embodiments of the present invention have been described, but the above embodiments are only examples, and those of ordinary skill in the art should understand that various modifications and equivalent other embodiments can be implemented according to the above embodiments.
10‧‧‧作業台 10‧‧‧operating table
20‧‧‧雷射照射部 20‧‧‧Laser exposure department
30‧‧‧高度測定部 30‧‧‧Altitude Measurement Department
40‧‧‧頭部 40‧‧‧Head
100‧‧‧雷射加工系統 100‧‧‧Laser processing system
L‧‧‧雷射光束 L‧‧‧Laser beam
TA‧‧‧加工對象物 TA‧‧‧Object to be processed
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