TWI678529B - Apparatus and method for detecting defect of optical film - Google Patents

Abstract

The invention provides an optical film defect detection device and method. The optical film defect detection device of the present invention includes a receiving unit that receives defect information of an optical film roll from at least one inspection device; a defect position determination unit determines a corresponding one of the optical film rolls based on the defect information. Defect locations on a two-dimensional plane; a search unit that searches for areas on the plane where more than a set number of defects exist based on the defect locations; and a defect detection unit that searches for the number of defects contained in the searched areas And the interval between defects to detect periodic defects.

Description

Optical film defect detection device and method

The present invention relates to a technology for detecting defects occurring during the manufacturing process of an optical film.

Generally speaking, during the manufacturing process of an optical film roll, when many defects occur in a certain area, the area is regarded as a special management area and further inspected by the quality inspection personnel.

At this time, the quality inspector observes the defect detection distribution map (two-dimensional graph) to determine whether it is a periodic defect. However, the proficiency of the quality inspection personnel is different, and it is difficult to detect the difference in the gap reference between the defects caused by the change in the X / Y axis scale of the defect detection chart, so it is difficult to correctly perform for a large number of rollers And the consistent identification and management of periodic defects. In addition, when an inspection by a quality inspector is carried out, there are problems that require a lot of cost and time for the inspection operation.

Advance technical literature Patent literature

[Patent Document 1] Korean Patent Laid-Open No. 2003-0046267

An object of the present invention is to provide a defect detection device and method for detecting a manufacturing process of an optical film. Defects that occur periodically.

An optical film defect detection device comprising: a receiving unit that receives defect information of an optical film roll from at least one inspection device; a defect position determination unit that determines a correspondence with the optical film roll based on the defect information A defect position on a two-dimensional plane; a search unit that searches for a region on the two-dimensional plane where there are more than a set number of defects on the two-dimensional plane; and a defect detection unit that detects Detects periodic defects by the number of defects and the interval between defects.

2. The optical film defect detection device according to the aforementioned item 1, wherein the search unit sets a search area of a certain size including each of the defect locations for each defect location, and sequentially changes the search area of the search area with the respective defect locations as the center. The position is searched in each of the search areas, and there are areas in which more than the previously set number of defects exist.

3. The optical film defect detection device according to the aforementioned item 1, wherein the search unit sets a plurality of search areas of a certain size with each defect position as a center coordinate, and searches each search area for the presence of more than the previously set number of defects. Area.

4. The optical film defect detection device according to the aforementioned item 1, wherein the search section divides the two-dimensional plane into a plurality of search areas of a certain size, and each of the search search and division areas has more than the set number of defects. Existing area.

5. The optical film defect detection device according to the aforementioned item 1, wherein the searching section On the two-dimensional plane, a search area of a certain size is set, and the position of the search area is sequentially changed by a certain distance, and each search area is searched for areas in which there are more than the set number of defects.

6. The optical film defect detection device according to the aforementioned item 1, wherein the defect detection section includes: a memory section that stores a position of the searched region; a candidate region determination unit determines a defect candidate based on the position of the searched region; A region; and a defect judging unit, based on the number of defects included in the defect candidate region and the interval between the defects, to determine whether the periodic defect exists in the defect candidate region.

7. The optical film defect detection device according to the item 6, wherein the candidate region determining section determines the searched region as the defect candidate region.

8. The optical film defect detection device according to the item 7, wherein the candidate region determining unit is configured to integrate the overlapping or continuous regions when there is an overlapping or continuous region in the searched region, and determine the integrated region as The aforementioned defect candidate area.

9. The optical film defect detection device according to the item 8, wherein the candidate region determining unit determines, for each of the searched region or the integrated region, a region having a minimum size including all defects included in each region as The aforementioned defect candidate area.

10. The optical film defect detection device according to the item 6, wherein the memory section uses a two-dimensional array to store position information of the searched area.

11. The optical film defect detection device according to the item 6, wherein the defect detection section is based on the length direction of the roller in the defect candidate area, and when the number of defects contained in the same row is equal to or greater than a set value, and The number of identical intervals among the intervals between defects contained in this row is set When the value is greater than or equal to the predetermined value, it is judged as the aforementioned periodic defect.

12. The optical film defect detection device according to the aforementioned item 1, wherein the defect detection section includes: a defect detection information generating section that generates defect detection information when the periodic defect is detected, and the defect detection information includes relevant optical films Information on the occurrence of the aforementioned periodic defects in the process line of.

13. The optical film defect detection device according to the item 12, wherein the defect detection information generating section transmits the defect detection information to a terminal device of a manager of a process management system, and a terminal device of a worker of a process line of the optical film. And at least one of the alarm devices on the process line.

14. An optical film defect detection method, comprising the following steps: a stage of receiving defect information of an optical film roll from at least one inspection device; and determining a two-dimensional plane corresponding to the optical film roll according to the defect information Stage of defect positions on the basis of the above; a stage of searching the aforementioned two-dimensional plane for a region having more than a set number of defects on the two-dimensional plane according to the aforementioned defect position; and according to the number of defects contained in the previously searched region and between defects Interval, the stage of detecting periodic defects.

15. The optical film defect detection method according to the aforementioned item 14, wherein in the search stage, for each defect position of the two-dimensional plane, a search area of a certain size including the respective defect positions is set, with the respective defect positions as the center in order. The position of the search area is changed, and in each search area, areas in which more than the previously set number of defects exist are searched.

16. The optical film defect detection method according to the aforementioned item 14, wherein the aforementioned search stage A plurality of search areas of a certain size are set with each defect position as the center coordinate, and in each search area, an area in which more than the previously set number of defects exist is searched.

17. The optical film defect detection method according to the aforementioned item 14, wherein the search stage divides the two-dimensional plane into a plurality of search areas of a certain size, and each of the search search divided areas has more than the set number of defects. Existing area.

18. The optical film defect detection method according to the aforementioned item 14, wherein the search stage is on the plane, a search area of a certain size is set, the position of the search area is sequentially changed, and each search area is searched for more than the previously set number The area where the defect exists.

19. The optical film defect detection method according to the foregoing item 14, wherein the detection stage includes the following stages: a stage of storing the position of the searched region; a stage of determining a candidate defect region based on the position of the searched region; and The number of defects included in the defect candidate area and the interval between the defects determine the stage of the existence of the periodic defect in the defect candidate area.

20. The optical film defect detection method according to the aforementioned item 19, wherein in the aforementioned stage of determining a candidate candidate region, the previously searched region is determined as the aforementioned candidate candidate region.

21. The optical film defect detection method according to the item 20, wherein in the aforementioned stage of determining a candidate defect area, when there is an overlapped or continuous area in the searched area, the overlapped or continuous area is integrated, and the integration is performed. Is determined as the aforementioned defect candidate area.

22. The optical film defect detection method according to the aforementioned item 21, wherein in the step of determining a candidate defect area, for each of the searched area or the integrated area, the minimum size of all defects contained in each area will be included. The region is determined as the aforementioned defect candidate region.

23. The optical film defect detection method according to item 19, wherein the storage stage uses a two-dimensional array to store position information of the searched area.

24. The optical film defect detection method according to the aforementioned item 19, wherein the aforementioned judging stage is in the aforementioned defect candidate area, based on the length direction of the aforementioned roller, when the number of defects contained in the same row is more than a set value, and When the number of the same intervals among the intervals between the defects included in the rows is a set value or more, it is determined as the aforementioned periodic defects.

25. The optical film defect detection method according to the aforementioned item 14, further comprising: a stage of generating defect detection information when the aforementioned periodic defects are detected, and the aforementioned defect detection information includes the aforementioned periodic defects related to a process line of the optical film Of where it happened.

26. The optical film defect detection method according to the aforementioned item 25, further comprising: transmitting the foregoing defect detection information to a terminal device of a manager of a process management system, a terminal device of an operator of a process line of the optical film, and a process Stage of at least one of the online alarm devices.

27. A computer program combined with hardware and stored in a recording medium for performing the following stages: a stage of receiving defect information of an optical film roll from at least one inspection device; a decision is made based on the aforementioned defect information A stage of a defect position on a two-dimensional plane corresponding to the optical film roll; a stage of searching for a region on the two-dimensional plane where there are more than a set number of defects, based on the defect position; and The number of defects in the area and the interval between defects, the stage of detecting periodic defects.

According to the present invention, by automatically judging the occurrence of periodic defects contained in an optical film, regardless of the production volume of the optical film, the quality of the optical film can be managed by a consistent benchmark, and the periodic defects can be shortened by Inspection time to improve productivity.

In addition, according to the present invention, since the occurrence of periodic defects of the optical film can be quickly grasped and notified, the occurrence of the periodic defects can be promptly dealt with to reduce the loss of production of the optical film.

100‧‧‧ Optical film defect detection device

110‧‧‧Receiving Department

120‧‧‧Defect position determination section

130‧‧‧Search Department

140‧‧‧Defect detection department

141‧‧‧Memory

142‧‧‧Alternative area decision department

143‧‧‧Defect judgment department

144‧‧‧Defect detection information generation department

FIG. 1 is a configuration diagram of an optical film defect detection device according to an embodiment of the present invention.

Fig. 2 is a detailed configuration diagram of a defect detection unit according to an embodiment of the present invention.

FIG. 3 is an exemplary diagram for explaining a process of searching for a defective area.

FIG. 4 is an exemplary diagram for explaining a process of searching for a defective area.

FIG. 5 is an exemplary diagram for explaining a process of searching for a defective area.

FIG. 6 is an explanatory diagram for explaining a process of searching for a defective area.

FIG. 7 is a diagram illustrating the setting of a defect candidate area.

FIG. 8 is a diagram illustrating the setting of a defect candidate area.

FIG. 9 is a diagram illustrating the setting of a defect candidate area.

FIG. 10 is a diagram illustrating the setting of a defect candidate area.

FIG. 11 is a diagram illustrating the setting of a defect candidate area.

FIG. 12 is an illustration diagram for explaining a judgment process of a periodic defect.

FIG. 13 is an illustration diagram for explaining a judgment process of a periodic defect.

FIG. 14 is a flowchart of a defect detection method for an optical film according to an embodiment of the present invention.

Fig. 15 is a flowchart showing a periodic defect detection process according to an embodiment of the present invention.

Forms used to implement the invention

Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. The following detailed description is provided to assist in an inclusive understanding of the methods, devices, and / or systems described in this specification. However, these descriptions are merely examples, and the present invention is not limited by these descriptions.

When describing the embodiment of the present invention, when it is judged that the specific description of the related conventional technology may make the gist of the present invention unclear, the detailed description thereof may be omitted. The terminology described below is a term defined in consideration of the function of the present invention, and may be different depending on the intentions, conventions, and the like of users and operators. Therefore, the definition should be based on the entire content of this specification. The terms used in the detailed description are only used to describe the embodiments of the present invention, and are not intended to be restrictive. Different meanings are used as long as they are not clear. The expressions in the singular include the meaning in the plural. In this description, expressions such as "including" or "having" are used to refer to any characteristic, number, phase, action, element, part or combination of these. The existence or possibility of a characteristic, number, phase, action, element, part or combination of these.

FIG. 1 is a configuration diagram of an optical film defect detection device according to an embodiment of the present invention.

Referring to FIG. 1, an optical film defect detection device 100 according to an embodiment of the present invention includes a receiving section 110, a defect position determination section 120, a search section 130, and a defect detection section 140.

The receiving unit 110 receives defect information of the optical film roll from at least one inspection device. At this time, each inspection device means a device that is arranged at different positions on the process line of the optical film and is used to detect defects occurring during the process of the optical film and generate defect information about the detected defects.

For example, the inspection device can be constituted as follows: a process line included in the optical film, a camera module disposed on the optical film, and the camera module is used to photograph the optical film and detect defects from the captured image. Again, therefore. Based on the optical film, a light source may be provided on the opposite side of the face of the camera module. The camera module may also be configured to capture light emitted from the light source and passed through the optical film. At this time, when there is a defect in the optical film, the light transmittance of the portion is reduced, so the defect can be easily detected.

Furthermore, the defect information generated by the inspection device may include the position, size, and brightness of the detected defect, the image of the detected defect, the start time and end time of the inspection, and the like.

The defect position determination unit 120 determines a defect position on a two-dimensional plane corresponding to the optical film roll based on the defect information received from the inspection device.

For example, the defect position determination unit 120 may constitute a two-dimensional plane corresponding to the length and width of the optical film roll, integrate defect information received from each inspection device, and determine the defect position of the two-dimensional plane. At this time, the defect position on the two-dimensional plane can be determined based on the defect position included in the defect information received from each inspection device. The length and width of the optical film roll can be set in advance.

The search unit 130 searches an area on the two-dimensional plane where there are more than a set number of defects, based on the defect positions determined by the defect position determination unit 120.

For example, the search unit 130 sets a search area of a certain size, while scanning the set search area on a two-dimensional plane, and calculates the number of defects contained in the search area, thereby searching for areas with more than a set number of defects. . This will be specifically described with reference to FIGS. 3 to 6.

In Figs. 3 to 6, the area shown by the dotted line represents the search area, and the area shown by the circle represents the defect location. In addition, in FIG. 3 to FIG. 6, the search area is shown as a quadrangular shape, but it is not limited to this. For example, the search shape may be circular or may be transformed into an appropriate shape according to a user's selection. Again, search The size of the shape can be set by the user in consideration of calculation load, calculation accuracy, and the like.

According to an embodiment of the present invention, the search unit 130 may set a search area of a certain size including each defect position for each defect position included in the two-dimensional plane. Then, the search unit 130 can change the position of the search area around each defect position, and search each search area for a region in which there are more than a set number of defects.

Specifically, referring to FIG. 3, the search unit 130 may set a search area 321 including a specific defect 310 among a plurality of defects included in the two-dimensional plane 300. Then, the search unit 130 may calculate the number of defects in the set search area 321 and determine whether the number of defects is equal to or greater than the set number.

Next, the search unit 130 may use the position of the defect 310 as the center, move the search area 321 toward the X axis direction by a certain distance, and calculate the number of defects in the search area 322 at the moved position to determine whether the number of defects is set. More than that.

Next, the search unit 130 may use the position of the defect 310 as the center, and further move the search area 322 toward the X axis direction by a certain distance. At the moved position, calculate the number of defects in the search area 323 to determine whether the number of defects is set More than that.

Next, the search unit 130 may use the position of the defect 310 as the center, move the search area 323 toward the Y axis direction by a certain distance, and calculate the number of defects in the search area 324 at the moved position to determine whether the number of defects is set. More than that.

In this way, the search unit 130 may specify the defect 310 as the center, move the search area in a certain distance and sequentially move in the X-axis and Y-axis directions, calculate the number of defects in the search area at each position, and search includes more than the set number Defective area.

Furthermore, in the example shown in the figure, the moving distance of the search area can be set in advance by the user.

In addition, the search unit 130 may set a search area for each defect contained in the two-dimensional plane 300 in the same manner, while moving to the set search area and at each position, to determine whether the number of defects contained in the search area is already More than the set number.

In addition, according to another embodiment of the present invention, the search unit 130 may set a search area of a certain size centered on each defect position on a two-dimensional plane, and search each search area for a set number of defects or more. region.

As a specific example, referring to FIG. 4, the search unit 130 may set search areas 410, 420, 430, 440, 450 of a certain size with each defect as a center coordinate for each defect included in the two-dimensional plane 400. Then, the search unit 130 may calculate the number of defects for each of the search areas 410, 420, 430, 440, and 450, and search for an area including more than a set number of defects.

In addition, according to still another embodiment of the present invention, the search unit 130 may divide the two-dimensional plane into a plurality of search areas of a certain size, and in each search area that is searched and divided, there are areas in which a set number of defects exist.

As a specific example, referring to FIG. 5, the search unit 130 may divide the two-dimensional plane 500 into search areas 510, 520, 530, and 540 of a certain size. Then, the search unit 130 may calculate the number of defects included in each of the search areas 510, 520, 530, and 540, and determine whether or not a defect having a set number or more is included.

In addition, according to still another embodiment of the present invention, the search unit 130 may set a search area of a certain size on a two-dimensional plane, and sequentially change the position of the search area within the two-dimensional plane. The number of defects above the area.

As a specific example, referring to FIG. 6, the search unit 130 may set a specific position on the two-dimensional plane 600 to a search area 610 with a certain size. Then, the search unit 130 may calculate the number of defects in the set search area 610, and determine Whether the number of broken defects is more than the set number.

Next, the search unit 130 can cause the search area 610 to sequentially move in the Y-axis direction at a certain distance, and calculate the number of defects in the search areas 620, 630, 640, and 650 at each position to determine whether the number of defects is set. More than that.

Furthermore, when the search area cannot be moved further in the Y-axis direction, the search unit 130 may move the search area to the X-axis direction by a certain distance, and calculate the number of defects in the search area 660 to determine whether the number of defects is set. More than that.

Next, the search unit 130 can move the search area 660 to the X-axis direction in sequence again at a certain distance, calculate the number of defects in the search area at each position, and determine whether the number of defects is more than the set number.

With this type of method, the search unit 130 can scan the entire area of the two-dimensional plane 600 in the search area, calculate the number of defects in the search area at each position, and search for an area with more than a set number of defects.

Furthermore, in the example shown in FIG. 6, the moving direction and moving distance of the search area can be set in advance by the user.

The defect detection unit 140 may detect a periodic defect based on the number of defects contained in the area searched by the search unit 130 and the interval between the defects. Here, cyclical badness means a defect that occurs periodically at a certain interval. Specifically, the defect detection unit 140 may set one or more defect candidate regions based on the region searched by the search unit 130. In addition, the defect detection unit 140 may calculate the number of defects in the set candidate defect area based on the longitudinal direction of the optical film roll. At this time, when the number of defects is equal to or greater than the set value, the interval between defects is calculated, and periodic defects are detected.

FIG. 2 is a detailed configuration diagram of the defect detection unit 140 according to an embodiment of the present invention.

2, a defect detection unit 140 according to an embodiment of the present invention includes a memory unit 141, a candidate region determination unit 142, a defect determination unit 143, and a defect detection information generation unit 144.

The memory unit 141 may store the position of an area searched by the search unit 130 and having a set number of defects. Specifically, the memory unit 141 may store a position on a two-dimensional plane of a region searched by the search unit 130. According to an embodiment of the present invention, the memory unit 141 may be implemented in the form of an image buffer constituted by a two-dimensional array corresponding to a two-dimensional plane. The two-dimensional array is used to store the position of the area searched by the search unit 120. .

The candidate region determination unit 142 may determine one or more defect candidate regions based on the positions of the searched regions stored in the memory unit 141.

For example, the candidate region determination unit 142 may determine each searched region stored in the memory unit 141 as a defect candidate region.

At this time, according to an embodiment of the present invention, the candidate region determination unit 142 is a searched region stored in the memory unit 141, and when there is an overlapping or continuous region, the overlapping or continuous region is integrated, and the integrated The area is determined as a defect candidate area. At this time, in order to integrate overlapping or continuous areas, a labeling algorithm such as the Blob Labeling algorithm can also be used.

As a specific example, referring to FIG. 7, on the two-dimensional plane 710 corresponding to the optical film roll, the areas 711, 712, and 713 searched by the search unit 120 can be stored in a memory portion composed of a two-dimensional array, respectively. Corresponding positions 721, 722, and 723 of the storage area 720 of 141.

At this time, the candidate region determination unit 142 may determine the regions searched by the search unit 130, that is, the regions of 721, 722, and 723, as the defect candidate regions, respectively.

As another example, in FIG. 7, since the area of 721 and the area of 722 are continuous areas, the candidate area The domain determining unit 142 may combine the areas of 721 and 722 into one area 724 as shown in the example of FIG. 8, and determine the areas of the integrated areas 724 and 723 as defect candidate areas, respectively.

As another example, referring to FIG. 9, on the two-dimensional plane 910 corresponding to the optical film roll, the regions 911, 912, and 913 searched by the search unit 120 may be stored in a memory unit composed of a two-dimensional array, respectively. Corresponding positions 921, 922, and 923 of the storage area 920 of 141.

At this time, the candidate region determination unit 142 may determine the regions searched by the search unit 130, that is, the regions of 921, 922, and 923, as the defect candidate regions, respectively.

As another example, since the searched region stored in the memory unit 141, the region of 921 and the region of 922 are overlapped regions, the candidate region determining unit 142 may compare the region of 921 and the region of 922 as shown in FIG. 10 In the example shown, one area 924 is integrated, and the integrated areas 924 and 923 are determined as defect candidate areas, respectively.

In addition, according to an embodiment of the present invention, the candidate area determination unit 142 may determine, as each area of the area searched by the search unit 130 or the integrated area, a minimum-size area including all defects included in each area as Defect candidate area.

As a specific example, referring to FIGS. 10 and 11, the candidate region determination unit 142 may set a minimum region 925 including all defects included in each region for each of the integrated region 924 and the unintegrated region 923. 926. The set minimum regions 925 and 926 are respectively determined as defect candidate regions.

Furthermore, in the example shown in FIG. 11, the smallest area is shown as a quadrangular shape, but the shape is not limited to this. The shape of the smallest area may be various shapes such as a circle.

The defect judging unit 143 is based on each defect candidate area, and detects the periodic defects based on the number of defects contained in the same line and the interval between the defects contained in the same line based on the length direction of the optical film roll. trap.

As a specific example, referring to FIG. 12, the defect judging unit 143 is attached to each of the defect candidate regions 1210 and 1220, and calculates the number of defects included in the same line based on the length direction of the optical film roll, thereby determining whether there is any Defects above the set number exist. For example, if the number of defects used to determine the existence of periodic defects is three, in the case of the defect candidate area 1210, a row containing three or more defects does not exist, but in the case of the defect candidate area 1220, it includes four Defective row 1221 exists.

Therefore, the defect determination unit 143 calculates the interval 1310 between the defects and calculates the number of the same interval for the row 1221 including four defects, as in the example shown in FIG. 13. At this time, when the number of the same interval is equal to or greater than the set number, the defect determination unit 143 may determine that it is a periodic defect. For example, it is assumed that the number of identical intervals that have been set to determine periodic defects is 3, and the interval between defects included in line 1221 is the same interval. Since the number of identical intervals is 4 in line 1221, the defect judging unit 143 can finally It is determined that there is a periodic defect at a position corresponding to the row 1221 of the optical film roll.

When the periodic defect is detected, the defect detection information generating unit 144 may generate defect detection information about the detected periodic defect. At this time, the defect detection information may include, for example, information on the occurrence positions of the periodic defects on the process line of the optical film, and the occurrence positions of the periodic defects on the process line of the optical film may be based on the occurrence of the periodic defects detected on the optical film. Position to calculate. For example, the defect detection information generating unit 144 can determine the optical film based on the distance from the starting position of the optical film to the occurrence position of the periodic defect detected by the optical film based on the transport direction of the optical film in the process line of the optical film. Occurrence of periodic defects in the process line.

In addition, according to an embodiment of the present invention, the defect detection information generating unit 144 may transmit the generated defect detection information to, for example, a terminal device of a manager of a process management system or a terminal of an operator of a process line. The device or the alarm device on the process line can quickly deal with the occurrence of periodic defects.

FIG. 14 is a flowchart of a defect detection method of an optical film according to an embodiment of the present invention.

Referring to FIG. 14, the optical film defect detection device 100 receives defect information of an optical film roll from at least one inspection device (1410).

Thereafter, the optical film defect detection device 100 determines a defect position on a two-dimensional plane corresponding to the optical film roll based on the received defect information (1420).

Thereafter, the optical film defect detection device 100 searches for a region on the two-dimensional plane where there are more than a set number of defects, based on the determined defect position (1430).

For example, the optical film defect detection device 100 may set a search area of a certain size including each defect position for each defect position on a two-dimensional plane, and sequentially change the position of the search area with each defect position as the center, and search each search area. There are areas where a set number of defects exist.

As another example, the optical film defect detection device 100 may set a plurality of search areas of a certain size in which each defect position contained in the two-dimensional plane is a central coordinate, and search each search area for a region in which more than a set number of defects exist. .

As yet another example, the optical film defect detection device 100 may divide a two-dimensional plane into a plurality of search areas of a certain size, and search each search area for areas in which more than the previously set number of defects exist.

As a further example, the optical film defect detection device 100 may set a search area of a certain size on a two-dimensional plane, and change the position of the aforementioned search area in sequence at a certain distance, and search each search area for a set number or more. The area where the defect exists.

Thereafter, the optical film defect detection device 100 detects periodic defects based on the number of defects contained in the searched area and the interval between the defects (1440).

Thereafter, the optical film defect detection device 100 generates defect detection information on the detected periodic defects (1450). At this time, the defect detection information may include, for example, information about the occurrence position of the periodic defect in the process line of the optical film.

Thereafter, the optical film defect detection device 100 transmits the generated defect detection information to, for example, a terminal device of a manager of a process management system, a terminal device of a worker on a process line, or an alarm device on a process line (1460).

Fig. 15 is a flowchart showing a periodic defect detection process according to an embodiment of the present invention.

Referring to FIG. 15, the optical film defect detection device 100 stores the position of the area searched in the search stage 1430 of FIG. 14 (1510). At this time, the optical film defect detection device 100 may use a two-dimensional array to store position information of the searched area.

Thereafter, the optical film defect detection device 100 determines a defect candidate region based on the position of the searched region (1520).

For example, the optical film defect detection device 100 may determine each of the searched regions as a defect candidate region.

As another example, the optical film defect detection device 100 may integrate the overlapping or continuous areas when the searched area has overlapping or continuous areas, and determine the integrated area as a defect candidate area.

As still another example, the optical film defect detection device 100 may determine, as each of the searched regions or the integrated regions, a minimum size region including all defects included in each region as a candidate defect region.

Thereafter, the optical film defect detection device 100 determines the presence or absence of a periodic defect based on the number of defects contained in the defect candidate area and the interval between the defects (1530).

For example, the optical film defect detection device 100 may use the length direction of the roller in the defect candidate area as a reference, and the number of defects included in the same row is equal to or greater than a set value. Among the intervals between the included defects, the same interval When the number is more than the set value, it is judged as a periodic defect.

The flowcharts in Figures 15 and 16 are divided into multiple stages to represent the aforementioned method, but at least some of the stages can be executed in a different order, combined with other stages, omitted, subdivided into stages, or added to the flowchart not shown. It can be executed in more than one stage.

The embodiment of the present invention may include a computer-readable storage medium including a program for executing a method described in this specification by a computer. The foregoing computer-readable memory media may include program instructions, regional data files, regional data structures, etc., alone or in combination. The aforementioned media may be specially designed for the purpose of the present invention, or may be media generally used in the field of computer software. Examples of computer-readable storage media include: magnetic media such as hard disks, floppy disks, and magnetic tapes; optical recording media such as CD-ROMs and DVDs; magnetic-optical media such as floppy disks; and ROM, RAM, flash memory, etc. A hardware device specially constructed to execute program instructions. Examples of program instructions include not only mechanical codes written by a compiler, but also high-level language codes that can be executed by a computer using an interpreter.

As mentioned above, although several embodiment of this invention was described, these embodiment is shown as an example, and it does not intend to limit the scope of the invention. These new embodiments can be implemented in various other forms, and various omissions, substitutions, and changes can be made without departing from the scope of the invention. These embodiments and modifications thereof are included in the scope or gist of the invention, and are included in the invention described in the scope of patent application, and the equivalent scope thereof.

Claims (27)

An optical film defect detection device includes a receiving unit that receives defect information of an optical film roll from at least one inspection device; a defect position determining unit determines two corresponding to the optical film roll according to the defect information. Defect locations on the two-dimensional plane; the search unit sets a search area of a certain size, and searches for the presence of more than a set number of defects on the two-dimensional plane while changing the position of the search area based on the defect location. Regions; and a defect detection unit that detects periodic defects based on the number of defects contained in the searched region and the interval between the defects. For example, the optical film defect detection device of the first patent application range, wherein the search unit sets the search area including the respective defect locations for each defect location, and sequentially changes the search area of the search area with the respective defect locations as the center. The position is searched in each of the search areas, and there are areas in which more than the previously set number of defects exist. For example, the optical film defect detection device of the first patent application range, wherein the foregoing search area includes a plurality of search areas of a certain size with each defect position as a center coordinate, and the search unit searches each of the search areas, including the previously set Areas where more than a few defects exist. For example, the optical film defect detection device according to the first patent application range, wherein the search area includes the two-dimensional plane divided into a plurality of search areas of a certain size, and the search section searches the divided search areas, including An area where a set number or more of defects exist. For example, the optical film defect detection device of the first patent application range, wherein the search unit sequentially changes the position of the search area at a certain distance, and searches each search area for areas in which more than the previously set number of defects exist. . For example, the optical film defect detection device of the first patent application range, wherein the defect detection section includes: a memory section that stores the position of the searched area; a candidate area determination section determines a defect based on the position of the searched area The candidate area; and the defect judgment unit, based on the number of defects contained in the defect candidate area and the interval between the defects, determines whether the periodic defect exists in the defect candidate area. For example, the optical film defect detection device of the sixth scope of the application for patent, wherein the candidate region determining section determines the searched region as the defect candidate region. For example, the optical film defect detection device of the seventh scope of the application for a patent, wherein the candidate area determination unit is located in the searched area, and when there is an overlapping or continuous area, the overlapping or continuous area is integrated, and the integrated area is integrated. It is determined as the aforementioned defect candidate area. For example, the optical film defect detection device of the eighth patent application range, wherein the candidate region determination unit is an area having the smallest size of all defects contained in each region for each of the searched region or the integrated region, It is determined as the aforementioned defect candidate area. For example, the optical film defect detection device of the sixth scope of the patent application, wherein the memory section uses a two-dimensional array to store position information of the searched area. For example, the optical film defect detection device of the sixth scope of the application for patent, wherein the aforementioned defect detection section is located in the aforementioned candidate area of the defect, and based on the length direction of the aforementioned roller, when the number of defects contained in the same row is more than a set value When the number of the same interval among the intervals between the defects included in the row is equal to or greater than the set value, it is judged as the aforementioned periodic defect. For example, the optical film defect detection device of the first patent application range, wherein the aforementioned defect detection section includes a defect detection information generating section which generates defect detection information when the aforementioned periodic defects are detected, and the aforementioned defect detection information includes relevant optical films Information on the occurrence of the aforementioned periodic defects in the process line of. For example, the optical film defect detection device of the 12th patent application scope, wherein the aforementioned defect detection information generating section transmits the aforementioned defect detection information to a terminal device of a manager of a process management system, and a terminal of an operator of a process line of the aforementioned optical film At least one of a device and an alarm device on a process line. An optical film defect detection method includes the following stages: a stage of receiving defect information of an optical film roll from at least one inspection device; and determining a two-dimensional plane corresponding to the optical film roll according to the foregoing defect information. The stage of the defect location; a stage of setting a search area of a certain size, and searching for the area on the two-dimensional plane where there are more than a set number of defects, while changing the position of the search area based on the defect location; and The period of periodic defects is detected based on the number of defects contained in the searched area and the interval between the defects. For example, the defect detection method of optical film defect No. 14 of the application, wherein the aforementioned search stage is to set the aforementioned search area including the aforementioned respective defect positions for each of the aforementioned defect positions of the two-dimensional plane, centering on the aforementioned respective defect positions in order, The position of the search area is changed, and in each search area, areas in which more than the previously set number of defects exist are searched. For example, the defect detection method for an optical film according to item 14 of the patent application, wherein the search area includes a plurality of search areas with each defect position as a center coordinate, and each search area is searched in the search stage, and there are more than the previously set number of defects. Existing area. For example, the optical film defect detection method for item 14 of the patent application range, wherein the aforementioned search area includes dividing the aforementioned two-dimensional plane into a plurality of search areas of a certain size, and among the search areas divided during the aforementioned search stage, there are the aforementioned settings The number of defects above the area. For example, in the method for detecting an optical film defect according to item 14 of the patent application, the search phase sequentially changes the position of the search area, and searches each search area for areas in which more than the previously set number of defects exist. For example, the method for detecting an optical film defect according to item 14 of the patent application, wherein the aforementioned detection stage includes the following stages: a stage of storing the position of the searched region; a stage of determining a candidate defect region based on the position of the searched region; and Based on the number of defects included in the defect candidate area and the interval between the defects, it is determined whether there is a stage in which the periodic defect exists in the defect candidate area. For example, in the method for detecting a defect of an optical film according to item 19 of the application, in the aforementioned stage of determining a candidate candidate region, the previously searched region is determined as the aforementioned candidate candidate region. For example, the optical film defect detection method of the patent application No. 20, wherein the aforementioned stage of determining candidate defect areas is in the searched area, and when there are overlapping or continuous areas, the overlapping or continuous areas are integrated, and The integrated area is determined as the aforementioned defect candidate area. For example, the optical film defect detection method of the scope of application for patent No. 21, wherein the aforementioned stage for determining candidate defect areas is the minimum of all defects contained in each area for the searched area or the integrated area. The area of the size is determined as the aforementioned defect candidate area. For example, the defect detection method for an optical film according to item 19 of the application, wherein the storage stage uses a two-dimensional array to store the position information of the searched area. For example, the optical film defect detection method for item 19 of the patent application range, wherein the aforementioned judgment stage is in the aforementioned candidate area of the defect, based on the length direction of the aforementioned roller, and when the number of defects contained in the same row is more than a set value, When the number of the same intervals among the intervals between the defects included in the row is a set value or more, it is judged as the aforementioned periodic defect. For example, the method for detecting defect of an optical film according to item 14 of the application, further includes a stage of generating defect detection information when the aforementioned periodic defect is detected, and the aforementioned defect detection information includes the aforementioned periodic defect related to the process line of the optical film Of where it happened. For example, the optical film defect detection method of the scope of application for patent No. 25, which further includes transmitting the aforementioned defect detection information to a terminal device of a manager of a process management system, a terminal device of an operator of a process line of the aforementioned optical film, and a process Stage of at least one of the online alarm devices. A computer program that is integrated with hardware and stored in a recording medium to perform the following stages: a stage of receiving defect information of an optical film roll from at least one inspection device; and based on the foregoing defect information, a decision is made with the foregoing The stage of the defect position on the two-dimensional plane corresponding to the optical film roll; a search area of a certain size is set, and according to the defect position, the position of the search area is changed, and the two-dimensional plane is searched. A stage of an area in which more than a number of defects are present; and a stage of detecting a periodic defect based on the number of defects contained in the searched area and the interval between the defects.