TW201632870A - System and method for inspecting optical film, apparatus and method for managing quality of optical film - Google Patents

Abstract

Disclosed is a system and method for inspecting optical film, an apparatus and a method for managing quality of optical film. One of the embodiments for disclosed inspecting system of optical film includes: a first inspecting device, which is arranged at a specific location in the production line of the optical film and conducts defect inspection on optical films,; and a second inspecting device, which is arranged at the rear section of the first inspecting device with respect to the conveying direction of the optical films and conducts inspection on defects of the optical film,. The first inspecting device and the second inspecting device calculate a conveying distance of the optical films on the optical film production line, and synchronize based on the distance from one to another as well as the conveying distance of the optical films.

Description

Optical film inspection system and method, and optical film quality management device and method

Embodiments of the present invention relate to a technique for inspecting an optical film in a production step of an optical film to manage the quality of the produced optical film.

For manufacturers of polarizing films used in the production of LCD (Liquid Crystal Display) optical materials, in-line (IN-LINE) automatic optical inspection is used for real-time inspection of high-speed production products. Automated Optical Inspection system (hereinafter referred to as automatic optical inspection machine). In general, the on-line automatic optical inspection machine can discard the marked portion or perform additional inspection by the inspector in a subsequent step by applying ink or a bar code mark to the defect generation position.

However, due to the different proficiency or inspection standards of the inspectors, the inspection results may vary depending on the inspector. The inspection work performed by the inspector has a large cost and time.

[Previous Technical Literature] [Patent Literature]

[Patent Document 1] Korean Patent Publication No. 2013-0012379

Embodiments of the present invention provide an inspection system and method for inspecting an optical film of an optical film in a production step of an optical film, and a quality management device and method for the optical film.

An inspection system for an optical film, comprising: a first inspection device disposed at a specific position on an optical film production line to detect defects of the optical film; and a second inspection device based on a transfer direction of the optical film Arranging in the subsequent stage of the first inspection device to detect defects of the optical film; the first inspection device and the second inspection device calculate a transfer distance of the optical film on the optical film production line, and based on a distance between each other And the transfer distance of the above optical film is synchronized.

2. The optical film inspection system according to the above 1, wherein the first inspection device and the second inspection device calculate a transfer distance of the optical film by using an encoder signal, wherein the encoder signal is specified by the optical film production line. Encoder generation.

3. The optical film inspection system according to the above 1, wherein the first inspection device calculates a transfer distance of the optical film by an encoder signal, and the encoder signal is generated by a specific encoder disposed on the optical film production line, The second inspection device calculates the transfer distance of the optical film by using an encoder signal, and the encoder signal is generated by another encoder disposed on the optical film production line and having the same resolution as the specific encoder. .

4. The optical film inspection system according to the above 1, wherein the first inspection device performs the second inspection when the transfer distance of the optical film calculated after the start of the defect detection coincides with the distance from the second inspection device. The device transmits an inspection start signal, and the second inspection device starts defect detection when receiving the inspection start signal, and calculates a transfer distance of the optical film.

5. The optical film inspection system according to the above 1, wherein the first inspection device transmits an inspection end signal to the second inspection device when the defect detection is completed, and the second inspection device receives the inspection end signal. In the case where the transfer distance of the optical film calculated after receiving the inspection end signal is the same as the distance from the first inspection device, the defect detection is ended.

6. The optical film inspection system according to the above 1, wherein the first inspection device and the second inspection device determine a position of the detected defect based on a transfer distance of the optical film, and generate a position including the detected defect. Defect information.

7. The optical film inspection system according to the above 6, wherein the first inspection device and the second inspection device receive a roll alternate signal from a winding portion of the optical film, based on the roll up to the volume The distance between the winding portion and the transfer distance of the optical film calculated from the time point when the alternating signal is received is generated with respect to the defect data of the roll before the alternation, and the defect data is generated until the time point of the volume alternating signal is received. The defect data includes defect information other than the defect data of the section not wound by the winding portion.

8. The optical film inspection system according to the above 7, wherein the first inspection device and the second inspection device generate defect data corresponding to the alternate roll when the roll alternate signal is received, the defect data. Included in the section that is not wound by the winding portion Trapped information.

9. The optical film inspection system according to the above 8, wherein the first inspection device and the second inspection device are corrected to be wound by the winding portion so as to match a position of the defect of the alternate roll. The location of the defect contained in the defect data of the interval.

10. The optical film inspection system according to the above 8, wherein the first inspection device and the second inspection device initialize a transfer distance of the optical film based on a time point at which the roll alternating signal is received, and the initial transfer distance is The benchmark determines the location of the defect to be detected after receiving the above-mentioned volume alternation signal.

11. The optical film inspection system according to the above 6, further comprising an alarm device that receives the defect data from the first inspection device and the second inspection device, and based on the received defect data At least one of the number, type, interval, and distribution of defects produces a warning signal.

12. An optical film inspection method, which is an optical film inspection method of an inspection apparatus, which is disposed at a specific position on an optical film production line and detects defects of the optical film, and the optical film inspection method includes the following stages: The inspection device disposed before the specific position based on the transfer direction of the optical film receives the inspection start signal to detect the defect of the optical film; and calculates the transfer of the optical film from the time point when the inspection start signal is received. a distance; determining whether the calculated transfer distance is equal to a distance up to an inspection device disposed after the specific position; and When the calculated transfer distance coincides with the distance up to the inspection device disposed in the subsequent stage, the inspection start signal is transmitted to the inspection device disposed in the subsequent stage.

13. The optical film inspection method according to 12 above, further comprising the step of: receiving an inspection end signal from the inspection device disposed in the preceding stage; and calculating a transfer distance of the optical film from a time point when the inspection end signal is received; Determining whether the transfer distance of the optical film calculated from the time point when the end of the inspection signal is received is the same as the distance from the inspection device disposed in the preceding stage; and the optical film calculated from the time point when the inspection end signal is received When the transfer distance is equal to the distance up to the inspection device disposed in the preceding stage, the defect detection is completed; and the inspection end signal is transmitted to the inspection device disposed in the subsequent stage.

14. The optical film inspection method according to the above 13, wherein the transfer distance of the optical film is calculated by an encoder signal, and the encoder signal is disposed on the optical film production line and shared with the inspection device disposed in the front and rear stages. The specific encoder is generated.

15. The optical film inspection method according to the above 13, wherein the transfer distance of the optical film is calculated by an encoder signal, and the encoder signal is disposed on the optical film production line and has an inspection device disposed in the front and rear stages. The encoder is generated using the same resolution as the encoder.

16. The optical film inspection method according to the above 12, further comprising the step of determining a position of the detected defect based on the calculated transfer distance of the optical film; A defect data is generated that includes the location of the defect detected above.

17. The optical film inspection method of 16 above, further comprising the steps of: receiving a roll alternating signal from a winding portion wound around the optical film; and generating a relative rotation based on a distance up to the winding portion The defect data of the preceding volume is the defect data generated before the time point when the alternating signal of the volume is received, except for the defect data other than the defect data that is not wound by the winding portion.

18. The optical film inspection method of the above 17, further comprising the step of generating defect data relating to the alternately wound volume including the defect data of the unwrapped section.

19. The optical film inspection method according to the above 18, wherein the step of generating the defect data with respect to the alternately wound volume is corrected in accordance with the position of the defect of the alternately wound roll, relative to the volume not being used by the volume The position of the defect contained in the defect data of the section around the winding.

20. The optical film inspection method according to the above 18, wherein at the stage of generating the defect data with respect to the alternately wound volume, the transfer distance of the optical film is initialized based on a time point at which the volume alternate signal is received, and initialized. The transfer distance is a position that determines the defect to be detected after receiving the above-mentioned volume alternate signal.

An optical film quality management device comprising: a data combining unit that receives defect data from a plurality of inspection devices disposed at different positions of an optical film production line, and combines the received defect data; and the cutting model determining unit is based on the above The combined defect data determines the cutting size and cutting position of the optical film; The inspection method determining unit determines an inspection method for each region of the optical film based on the combined defect data.

22. The quality management device for an optical film according to 21 above, wherein said plurality of defect data includes defect position information.

23. The optical film quality management device according to the above 22, wherein the data combining unit merges the plurality of defect data based on the defect position information.

24. The quality management device for an optical film according to the above 23, wherein the defect data further includes information relating to a transfer distance of the optical film on the optical film production line, wherein the data combining unit is based on the defect position information and the optical film. The transfer distance and the length of the predetermined optical film roll are combined with the received defect data.

25. The optical film quality management device according to the above 24, wherein the data combining unit combines the defect data of the received defect data up to the length of the predetermined optical film roll based on the transfer distance of the optical film to generate a defect data. Defect data of the volume before the alternation.

26. The quality management device for an optical film according to the above 24, wherein the data combining unit combines the defect data exceeding the length of the predetermined optical film roll in the received defect data based on the transfer distance of the optical film to generate an alternating Defect information of the subsequent volume.

27. The optical film quality management device according to the above 26, wherein the data combining unit is configured to initialize a transfer distance of the optical film for a defect data exceeding a length of the predetermined optical film roll, and correct the transfer distance based on the initial transfer distance. The defect location information is combined and merged to generate defect data relative to the alternate volume.

28. The optical film quality management device according to 21 above, wherein the cutting model determining unit calculates the light based on the cutting size and the cutting position based on the combined defect data. The film yield is determined, and the cutting size and cutting position of the optical film are determined based on the calculated yield.

29. The optical film quality management device according to the above 28, wherein the yield of the optical film includes a chamfer yield and a test article yield.

In the quality management device for an optical film according to the above aspect 22, the inspection method determination unit classifies the defects included in the combined defect data according to the defect type, and determines the respective regions based on the defect type and position after the classification. Inspection method.

In the quality management apparatus for an optical film according to the above aspect 21, the merged defect data includes information relating to an uninspected area, and the inspection method determining unit determines the inspection method for the uninspected area as the full inspection.

32. The optical film quality management device according to 21, wherein the merged defect data includes information relating to an area generated by an overflow, and the inspection method determining unit determines the inspection method for the area in which the overflow occurs. an examination.

33. The quality management device for an optical film according to 21, further comprising a batch configuration determining unit that maximizes the inspection method based on the respective regions, the cutting size and the cutting position of the optical film. The method of determining the area of the optical film is determined by including the area determined as the simple inspection method.

34. An optical film quality management method comprising the steps of: receiving defect data from a plurality of inspection devices disposed at different locations of an optical film production line; Combining the received defect data; determining the cutting size and the cutting position of the optical film based on the combined defect data; and determining the inspection method of each region of the optical film based on the combined defect data.

35. The method of claim 34, wherein the plurality of defect data includes defect location information.

36. The optical film quality management method according to the above 35, wherein the plurality of defect data are combined based on the defect position information in the merged stage.

37. The optical film quality management method according to the above 36, wherein the defect data further includes information relating to a transfer distance of the optical film on the optical film production line, and the phase of the combination is based on the defect position information and the optical film. The transfer distance and the length of the predetermined optical film roll are combined with the received defect data.

38. The optical film quality management method according to the above 37, wherein, in the step of combining, the defect data of the received defect data up to the length of the predetermined optical film roll is combined based on the transfer distance of the optical film to generate a relative Defects in the volume before the alternation.

39. The optical film quality management method according to the above 37, wherein, in the step of combining, the defect data exceeding the length of the predetermined optical film roll in the received defect data is combined based on the transfer distance of the optical film to generate Defect data of the alternate volume.

40. The optical film quality management method according to the above 39, wherein, in the merging step, the defect data exceeding the length of the predetermined optical film roll is initialized by the transfer distance of the optical film, and is corrected based on the initial transfer distance. The defect location information is combined and merged to generate defect data relative to the alternate volume.

41. The optical film quality management method according to the above 34, wherein the step of determining the cutting size and the cutting position of the optical film comprises the step of: calculating the optical film based on the cutting size and the cutting position based on the combined defect data. Yield; and the cutting size and cutting position of the optical film are determined based on the calculated yield.

42. The optical film quality management method according to 41 above, wherein the yield of the optical film comprises a chamfer yield and a test article yield.

43. The optical film quality management method according to 35 above, wherein the step of determining the inspection method of each region of the optical film comprises the step of classifying the defects contained in the combined defect data according to the defect type; The type and location of defects after classification determine the inspection methods for each of the above areas.

44. The optical film quality management method according to the above 34, wherein the combined defect data includes information related to an uninspected area, and an inspection method for the unchecked area is determined at a stage of determining an inspection method of each area of the optical film. Decided to check all.

45. The optical film quality management method according to the above 34, wherein the plurality of defect data includes information related to an area generated by an overflow, and the stage of the inspection method for determining each area of the optical film is to generate the overflow. The inspection method for the area is determined to be the full inspection.

46. The optical film quality management method according to the above 34, further comprising the step of, based on the inspection method of each of the regions, the cutting size and the cutting position of the optical film, to maximize the inclusion of the simple inspection method. The way of the area, the above optical film is determined The composition of the product batch.

According to the embodiment of the present invention, by automatically analyzing the quality of the roll produced in the in-line film production step, and using the analyzed information to select an effective product size, the chamfer yield can be improved.

Moreover, by determining the appropriate product lot configuration based on the location of the defect and specifying the inspection method for each batch, the personnel and time required for the quality inspection in the subsequent steps can be reduced.

100‧‧‧Quality Management System

110‧‧‧Optical film inspection system

111‧‧‧1st inspection device

112‧‧‧2nd inspection device

113‧‧‧Announcement device

120‧‧‧Quality management device

200‧‧‧ optical film production line

210‧‧‧Encoder

220‧‧‧Winding Department

221, 222‧ ‧ core

230‧‧‧Optical film

121‧‧‧Information Integration Department

123‧‧‧Cutting Model Determination Department

125‧‧‧Check Method Determination Department

127‧‧‧Batch Composition Department

Fig. 1 is a schematic configuration diagram of an optical film quality management system according to an embodiment of the present invention.

Fig. 2 is a view showing an example of the operation of the inspection apparatus according to an embodiment of the present invention.

Fig. 3 is a view showing the configuration of a quality management device 120 according to an embodiment of the present invention.

4a to 4f are diagrams for explaining an optical film cutting model.

5a to 5c are diagrams for explaining the composition of the product batch.

Fig. 6 is a flow chart showing an optical film inspection method of an embodiment.

Fig. 7 is a flow chart showing an optical film inspection method according to another embodiment.

Fig. 8 is a flow chart showing an optical film inspection method according to still another embodiment.

Fig. 9 is a flow chart showing an optical film quality management method according to an embodiment of the present invention.

Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. The following detailed description is provided to assist in a comprehensive understanding of the methods, devices, and/or systems described herein. However, it is for illustrative purposes only, and the invention is not limited thereto.

In the description of the embodiments of the present invention, the detailed description of the prior art of the present invention will be omitted, and the detailed description of the present invention will be omitted. Further, the term language described later is a term defined in consideration of the function of the present invention, and the user can change the term according to the intention or convention of the user. Therefore, the definition of the above terms must be made based on the overall content of the present specification. The terms used in the detailed description are merely for describing the embodiments of the present invention and are not intended to be limiting. The expression of the singular form includes the meaning of the plural form as long as it is not explicitly indicated otherwise. In the present description, the expression "including" or "having" is used to mean a certain feature, number, stage, action, element, part or combination thereof, and should not be construed as excluding one or The existence or possibility of more than one of the other characteristics, numbers, stages, actions, elements, parts, or combinations thereof.

Fig. 1 is a schematic configuration diagram of a quality management system according to an embodiment of the present invention.

Referring to Fig. 1, a quality management system 100 according to an embodiment of the present invention includes an optical film inspection system 110 and a quality management device 120.

The optical film inspection system 110 can include a plurality of inspection devices 111, 112 and an alarm device 113 disposed at different locations of the optical film production line 200. In the illustrated example, two inspection devices 111 and 112 are exemplified, but the invention is not limited thereto, and two or more inspection devices may be disposed as needed. Further, each of the inspection apparatuses 111 and 112 can be disposed at any position of the optical film production line 200 as long as it is suitable for detecting the position of the defect generated in the step of the optical film.

Hereinafter, for convenience of explanation, the inspection device 111 disposed in the front stage of the optical film production line 200 with reference to the transfer direction of the optical film 230 is referred to as a first inspection device, and the inspection device 112 disposed in the subsequent stage is referred to as a second inspection device.

The first inspection device 111 and the second inspection device 112 may include a camera module disposed on the optical film 230, and may be configured to capture the optical film 230 by the camera module and detect defects based on the captured image. Further, the first inspection device 111 and the second inspection device 112 may be provided with a light source on the opposite side of the surface on which the camera module is located, with reference to the optical film 230. The camera module can be configured to capture light that is emitted from the light source and transmitted through the optical film 230. In this case, when there is a defect in the optical film 230, the portion is reduced in light transmittance, and the defect can be easily detected.

Further, the first inspection device 111 and the second inspection device 112 can generate defect data including information related to the detected defect. For example, the defect data may include the lot number of the optical film, the position of the detected defect, the size, the brightness, the image of the defect, the start and end time of the inspection, and the like. At this time, the batch number of the optical film is used to identify the optical film roll.

Further, the first inspection device 111 and the second inspection device 112 can calculate the transfer distance of the optical film 230 on the optical film production line 200.

For example, the first inspection device 111 and the second inspection device 112 share an encoder signal generated by a specific encoder 210 disposed on the optical film production line 200, and the transfer distance of the optical film 230 is calculated by the encoder signal.

Further, in the example shown in FIG. 1, one encoder 210 disposed on the optical film production line 200 is illustrated. However, the present invention is not limited thereto, and may have the same resolution unlike the illustrated example. (Resolution) a plurality of encoders. In this case, the first inspection device 111 can calculate the transfer distance of the optical film 230 by using the encoder signal generated by one of the plurality of encoders, and the second inspection device 112 can use the encoder signal generated by the other encoder. Computational optics The transfer distance of the film 230.

Moreover, the encoder signal generated by the encoder 210 can include the transfer speed of the optical film 230 transferred over the optical film production line 200. Therefore, the first inspection device 111 and the second inspection device 112 multiply the time elapsed after the time when the inspection is started by the encoder signal, and the transfer distance of the optical film 230 can be calculated. Further, the first inspection device 111 and the second inspection device 112 can determine the position of the defect detected in the optical film 230 based on the calculated transfer distance of the optical film 230.

Further, the first inspection device 111 and the second inspection device 112 may store information on the distance from each other. Further, the first inspection device 111 and the second inspection device 112 can be synchronized based on the transfer distance of the optical film 230 calculated by the encoder signal and the distance between them.

Further, the first inspection device 111 and the second inspection device 112 are disposed on the optical film production line 200, and information relating to the distance from the winding portion 220 of the optical film 230 for winding the completion step may be stored. Further, the first inspection device 111 and the second inspection device 112 can synchronize with the winding portion 220 based on the transfer distance of the optical film calculated by the encoder signal and the distance up to the winding portion 220.

A detailed description of the synchronization between the first inspection device 111 and the second inspection device 112 will be described below with reference to Fig. 2 .

The alarm device 113 receives the defect data from the first inspection device 111 and the second inspection device, and generates a warning signal based on at least one of the number, type, interval, and distribution of the defects included in the received defect data.

For example, the alarm device 113 accumulates the defect data received from the first inspection device 111 or the second inspection device 112, and the number of defects included in the fixed section is in the fixed area. A warning signal may be generated if the number of defects included is more than a predetermined number.

In another example, the alarm device 113 has a linearity in the case where the defect at the same interval within the fixed section is less than or equal to a predetermined number in the defect data received from the first inspection device 111 or the second inspection device 112, or the distribution within the fixed interval is linear. In the case of a warning signal.

In still another example, when the intensity of the defect included in the fixed section of the defect data received from the first inspection apparatus 111 or the second inspection apparatus 112 is equal to or greater than a predetermined value, the alarm device 113 may generate a warning signal.

In still another example, when the defect information received from the first inspection device 111 or the second inspection device 112 includes a defect designated as a main defect, the alarm device 113 may generate a warning signal.

Furthermore, the alarm device 113 can be provided with a display mechanism, and the generated warning signal can be displayed using the display mechanism. In this way, the manager can immediately identify an abnormality in the production line.

The quality management device 120 receives the defect data from the first inspection device 111 and the second inspection device 112. Further, the quality management device 120 determines the cutting size and position of the optical film based on the received defect data, thereby determining the inspection method for each region of the optical film. A detailed description related to the quality management apparatus will be made later with reference to FIG.

Fig. 2 is a view showing an example of the operation of the inspection apparatus according to an embodiment of the present invention. In the illustrated example, L1 indicates the distance between the first inspection device 111 and the second inspection device 112. Further, L2 indicates the distance between the first inspection device 111 and the winding portion 220, and L3 indicates the distance between the second inspection device 112 and the winding portion 220.

Referring to Fig. 2, the first inspection device 111 uses the encoder signal to start the light. The transfer distance of the optical film 230 is calculated at the time point of the defect detection of the film 230. Then, when the transfer distance of the optical film 230 by the first inspection device 111 matches the distance L1 up to the second inspection device 112, the inspection start signal can be transmitted to the second inspection device 112.

Further, when the second inspection device 112 receives the inspection start signal from the first inspection device 111, the second inspection device 112 can detect the defect of the optical film 230 from the time point when the inspection start signal is received. Specifically, the second inspection device 112 detects the defect of the optical film 230 from the time point when the first inspection device 111 receives the inspection start signal, and calculates the transfer distance of the optical film 230 by the encoder signal. Thereby, the optical film 230 can be synchronized with the inspection start position of the defect data generated by the first inspection device 111 and the inspection start position of the defect data generated by the second inspection device 112.

Further, when the first inspection device 111 ends the detection of the defect of the optical film 230, the inspection end signal can be transmitted to the second inspection device 112. The second inspection device 112 that has received the inspection end signal from the first inspection device 111 can determine whether or not the transfer distance of the optical film 230 calculated from the time point when the inspection end signal is received is different from the distance from the first inspection device 111. L1 is consistent. Then, when the transfer distance of the optical film 230 calculated after the time when the inspection end signal is received by the second inspection device 112 coincides with the distance L1 up to the first inspection device 111, the inspection of the optical film 230 can be completed. Thereby, the optical film 230 can be synchronized with the inspection end position of the defect data generated by the first inspection device 111 and the inspection end position generated by the second inspection device 112.

Further, the first inspection device 111 and the second inspection device 112 are disposed on the optical film production line 200, and can be operated in synchronization with the winding portion 220 of the wound optical film 230.

Referring to Fig. 1, the winding portion 220 may have two or more cores 221, 222, and The optical film 230 is wound by the respective cores 221, 222. For example, the winding portion 220 continuously winds the transferred optical film 230 by the core 221, and cuts the wound optical film 230 according to specific conditions to generate a roll. Then, the winding portion 220 continuously winds the optical film 230 transferred from the position after the cutting by the other core 222, and another roll can be produced. In other words, after the cores are alternated, the optical film 230 wound by the winding portion 220 can form a roll that is separated from the optical film 230 that is wound before the core is alternated. Therefore, the first inspection device 111 and the second inspection device 112 need to be paired. Each volume generates defect data separately.

When the winding portions 220 alternate the cores 221 and 222, the winding detection signals can be transmitted to the first inspection device 111 and the second inspection device 112. When the first inspection device 111 and the second inspection device 112 receive the volume alternate signal from the winding unit 220, the defect data generation for the volume before the replacement is completed, and the defect data with respect to the alternate volume can be generated.

Specifically, when the first inspection device 111 receives the roll alternate signal from the winding unit 220, the optical film 230 is calculated based on the distance L2 up to the winding portion 220 and the time point at which the roll alternate signal is received. The transfer distance and the defect data generated in the defect data generated by the winding portion 220 in the defect data generated at the time point when the alternate signal is received are generated, and the defect data with respect to the roll before the alternation can be generated.

Further, when the first inspection device 111 receives the roll alternate signal from the winding unit 220, the transfer distance of the optical film 230 is calculated based on the distance L2 up to the winding portion 220 and the time point at which the roll alternate signal is received. Defect data may be generated with respect to the alternately wound volume, the defect data including defect data of the defect data generated by the winding portion 220 in the defect data generated at the time point when the volume alternate signal is received.

Similarly, when the second inspection device 112 receives the roll alternate signal from the winding unit 220, the second inspection device 112 is based on the distance L3 up to the winding portion 220 and the time when the roll alternate signal is received. The transfer distance of the optical film calculated from the inter-point, and the defect data generated in the defect data generated by the winding portion 220 in the defect data generated at the time of receiving the alternate signal of the roll can be generated before the alternation Volume defect information.

Further, when the second inspection device 112 receives the roll alternate signal from the winding unit 220, the transfer distance of the optical film 230 is calculated based on the distance L3 up to the winding portion 220 and the time point at which the roll alternate signal is received. Defect data may be generated with respect to the alternately wound volume, the defect data including defect data of the defect data generated by the winding portion 220 in the defect data generated at the time point when the volume alternate signal is received.

For example, when the optical film is transferred by the first inspection device 111 at a time point when the winding signal is received from the winding unit 220, the distance between the first inspection device 111 and the winding portion 220 is assumed to be In the case of 10 m, the optical film 230 in the range of 290 to 300 m is not wound by the winding portion 220, and after the cores of the winding portion 220 are alternated, the core is wound by the alternating core. Therefore, the first inspection device 111 can include the defect data of the defect data generated at the time point when the volume alternate signal is received with respect to the defect data in the range of 0 to 290 m in relation to the defect data of the volume before the alternation, and the 290~ Defect data in the 300m interval is included in the defect data relative to the alternate volume.

Furthermore, the defect data relative to the alternate volume includes defect data relative to the defect data in the 290-300 m interval and the defect detected after the time point when the alternate signal is received. At this time, the defect data in the interval of 290 to 300 m is used as the reference for the defect data in the interval of 0 to 10 m, and the defect detected after the time point when the alternating signal is received, is after the replacement. Defects detected after 10m as a reference. Therefore, in the case of generating defect data relative to the alternate volume, it is necessary to make the position and the defect of the defect The actual defects in the subsequent volumes are in the same position.

Therefore, first, the first inspection apparatus 111 can correct the position of the defect included in the defect data with respect to the 290-300 m section so as to match the actual position of the defect in the alternate roll. For example, in the case of a defect detected at a location of 292m, the position of the defect can be corrected to 2m, and the defect detected at the 295m location can be corrected to 5m. Furthermore, the position of the corrected defect can be calculated by a variety of methods. As an example, the position of the corrected defect can be calculated by the following mathematical formula 1.

[Math 1] Lm=Ld-L+L2

At this time, Lm indicates the position of the corrected defect, Ld indicates the position of the defect before the correction, L indicates the transfer distance of the optical film calculated from the inspection start time point to the reception volume alternate signal, and L2 indicates the winding portion 220 and the 1 Check the distance between the devices 111.

Further, the first inspection device 111 initializes the transfer distance of the optical film 230 based on the time point at which the roll alternate signal is received, and determines the defect detection position based on the initial transfer distance. For example, the first inspection device 111 can initialize the transfer distance of the optical film 230 to the distance L2 up to the winding portion 220 based on the time point at which the roll alternate signal is received. In this case, the position of the detected defect is L2+x in the case where the transfer distance of the optical film 230 is x from the time point when the alternate signal is received until the time when the defect is detected.

Further, as described above, the first inspection device 111 and the second inspection device 112 operate in synchronization. Therefore, if the distance L1 between the first inspection device 111 and the second inspection device 112 is 5 m, the optical film calculated by the first inspection device 111 at the time when the winding alternate signal is received from the winding portion 220 is assumed. When the transfer distance is 300 m, the second inspection device The transfer distance of the optical film calculated at 111 was 295 m. Further, if the distance L3 between the second inspection device 111 and the winding portion 220 is 5 m, the optical film 230 in the interval of 290 to 295 m at the time point when the alternate signal is received is not yet wound by the winding portion 220. After the cores of the winding portions 220 are alternated, the cores are wound by alternating cores. Therefore, the second inspection device 112 can include the defect data in the defect data generated at the time point when the volume alternate signal is received with respect to the defect data in the range of 0 to 290 m, relative to the defect data of the volume before the alternation, and relative to 290. Defect data in the ~295m range is included in the defect data relative to the alternate volume.

Further, similarly to the first inspection device 111, the second inspection device 112 can correct the position of the defect included in the defect data with respect to the 290 to 295 m section so as to match the actual position of the defect in the alternate roll. For example, in the case of a defect detected at a location of 291 m, the position of the defect can be corrected to 1 m, and the defect detected at the location of 294 m can be corrected to 4 m.

Further, the second inspection device 112 initializes the transfer distance of the optical film 230 based on the time point at which the roll alternate signal is received, and determines the defect detection position based on the initial transfer distance. For example, the second inspection device 111 can initialize the transfer distance of the optical film 230 to the distance L3 up to the winding portion 220 based on the time point at which the roll alternate signal is received. In this case, when the transfer distance of the optical film 230 is x from the time point when the roll alternate signal is received until the time when the defect is detected, the position of the detected defect calculated by the second inspection device 111 is L3+x.

In addition, the defect data of the roll before the alternation and the generation of the defect data with respect to the alternate roll are performed by the first inspection device 111 and the second inspection device 112 as described above, but are not limited thereto. It can also be performed by the quality management device 120 as will be described later.

Fig. 3 is a view showing the configuration of a quality management device according to an embodiment of the present invention.

Referring to Fig. 3, quality management device 120 includes data integration unit 121, cutting model determination unit 123, inspection method determination unit 125, and batch configuration unit 127.

The data integration unit 121 receives the defect data generated by the first inspection device 111 and the second inspection device 112, and can combine the received defect data. For example, the data merging unit 121 may combine the two pieces of data into one after the defect data received from the first inspection device 111 and the defect data received from the second inspection device 112 are removed. Thereby, the material combining section 121 can generate a defect data containing information related to all defects detected from the optical film. At this time, the repeated data can be judged by the position of the defect.

Further, the defect data generated by the first inspection device 111 and the second inspection device 112 may include information on the transfer distance of the optical film 230 on the optical film production line 200. For example, as described above, the first inspection device 111 and the second inspection device 112 can measure the transfer distance of the optical film 230 on the optical film production line from the respective inspection start time points based on the encoder information, and the first inspection device 111 and the first inspection device 111 2 The defect data generated by the inspection device 112 may include information relating to the measured transfer distance of the optical film 230.

The data combining unit 121 can combine the information related to the transfer distance of the optical film and the defect position information contained in the defect data received from the first inspection device 111 and the second inspection device 112 based on the length of the predetermined optical film roll. Defect data received from the first inspection device 111 and the second inspection device 112. At this time, the length of the optical film roll can be set in advance by the user.

Specifically, when the winding portion 220 winds the optical film 230 only by the length of the optical film roll set in advance, the wound optical film 230 can be cut to form a roll, and the core 221 or 222 can be alternated. The optical film 230 is transferred after being wound from the place of cutting. At this time, the first The inspection device 111 and the second inspection device 112 are disposed on the optical film production line 200 on the front side of the winding portion 220 with respect to the direction in which the optical film 230 is transferred. Therefore, the first inspection device 111 and the second inspection device 112 are generated by the first inspection device 111 and the second inspection device 112. The defect data of the optical film is inconsistent with the length of the roll before the alternation. Therefore, the data integration unit 121 is based on the information on the transfer distance of the optical film contained in the defect data received from the first inspection device 111 and the second inspection device 112, and the received defect data is equivalent to only the predetermined optical. The defect data of the length of the film roll, whereby the defect data relative to the roll before the alternation can be generated.

For example, in FIG. 2, the distance L2 between the first inspection device 111 and the winding portion 220 is 30 m, and the distance L3 between the second inspection device 112 and the winding portion 220 is 20 m, and a predetermined optical film roll is assumed. When the length is 100 m, the winding portion 220 alternates the core after winding the optical film roll of 100 m. At this time, the transfer distance of the optical film 230 measured by the first inspection device 111 was 130 m, and the transfer distance of the optical film 230 measured by the second inspection device 112 was 120 m. Therefore, the data merging unit 121 combines the defect data in which the transfer distance of the optical film in the defect data received from the first inspection device 111 and the second inspection device 112 is 100 m, and can generate the combined data with respect to the roll before the alternation.

Then, the data merging unit 121 combines the defect data of the optical film transfer distance exceeding 100 m in the defect data received from the first inspection device 111 and the second inspection device 112, and generates defect data with respect to the alternately wound volume.

Further, when the data merging unit 121 generates the defect data with respect to the alternate volume, the data merging unit 121 can initialize the transfer distance of the optical film received from the first inspection device 111 and the second inspection device 112 to 0 m. Then, the data combining unit 121 can correct the defect data received from the first inspection device 111 and the second inspection device 112 based on the transfer distance of the initialized optical film. The location of the defect contained. Then, the material combining unit 121 merges the corrected defect data, and generates defect data with respect to the alternate volume. For example, in the case where the defect detected at the 130m point in the defect data received from the first inspection device 111, the position of the defect can be corrected to 30 m, and the defect data received from the second inspection device 112 is at 120 m. The detected defect can be corrected to 20m.

Furthermore, the combined defect data may include information related to the area where the overflow occurred and the unchecked area. In this case, the area where the overflow occurs may be an area in which the number of defects that can be processed by the first inspection device 111 or the second inspection device 112 is detected. For example, when the first inspection device 111 and the second inspection device 112 overflow in a specific region of the optical film 230, information relating to the area where the overflow occurs may be included in the defect data, thereby using the data combining unit. The defect data combined with 121 may also contain information related to the area in which the spill occurred.

Further, the information related to the uninspected area may be information related to an area that has not been inspected due to an error of the first inspection apparatus 111 or the second inspection apparatus 112. For example, when the inspection of the optical film 230 is temporarily interrupted by the first inspection device 111 due to an error, an area that is not inspected by the first inspection device 111 is generated. At this time, after the first inspection device 111 restarts the inspection of the optical film 230, it is possible to generate defect data separated from the defect data generated at the time of the interruption of the inspection, and each defect data has a different lot number.

The data merging unit 121 may have a lot number with respect to the optical film currently being manufactured, and receive a defect having a lot number different from the lot number of the optical film currently in the manufacturing process from the first inspection device 111. In the case of the data, the difference between the end time of the previously received defect data and the start time of the defect data different from the batch number is converted into a distance, and the uninspected area is set, so that the combined defect data is included and not checked. Regional related information.

The cutting model determination unit 123 can determine the cutting model including the cutting size and position of the optical film based on the defect data combined by the data combining unit 121.

Specifically, the cutting model determination unit 123 calculates the yield based on the cut size and position of the optical film based on the combined defect data, and can determine the cutting size and position at which the calculated yield is the largest as the cutting of the optical film. Size and location. At this point, the yield can include the chamfer yield and the test yield. Further, the cutting model determining unit 123 can determine the cutting size and position of the optical film such that the overall yield of the chamfered yield and the test article yield are maximized.

Further, regarding the chamfering yield, when the optical film roll is cut by, for example, a specific cutting size, it may mean the number of articles which can be obtained from the roll of the optical film. For example, the chamfering yield can be calculated using Mathematical Formula 2.

[Math 2] Chamfer yield = area of the roll / area of the product

Further, regarding the yield of the test article, when the optical film roll is cut by, for example, a specific cutting size and position, it may mean the number of products which can be obtained from the roll of the optical film, and the product which does not contain defects in the obtained product. The ratio of the number.

For example, the test article yield can be calculated using Mathematical Formula 3.

[Math 3] Inspection product yield = quantity of good product / quantity of all products

For example, the cutting model determining unit 153 can cut the optical film roll by changing the cutting position by the x-axis and the y-axis with respect to the size of the predetermined product, and can calculate the inspection product yield.

The yield calculation of the cutting model determining unit 153 will be described below with reference to Figs. 4a to 4f. The line is specific.

4a to 4f show an example of virtually cutting an optical film in accordance with the cutting size and position. In the illustrated example, the portion indicated by dots indicates the defect detected in the optical film.

4a to 4c show the case where the optical film is cut in the same size, and FIG. 4a shows an example in which the optical film is cut to the left with respect to the advance direction of the optical film, and the optical film is cut in the form of a quadrangular sheet. 4b shows a case where the optical film is cut off to the right side, and FIG. 4c shows an example in which the optical film is cut off based on the center.

According to the drawing, in the case of Figs. 4a to 4c, the number of products to be chamfered is 14. In the case of Fig. 4a, the number of sheets containing no defects among the 14 sheets was seven, which was eight in the case of Fig. 4b and seven in the case of Fig. 4c. Therefore, if the test article yield is calculated separately, it is 50% in the case of Fig. 4a, about 57.1% in the case of Fig. 4b, and 50% in the case of Fig. 4c. Therefore, it can be seen that the test article of Fig. 4b has a higher yield than that of Figs. 4a and 4c.

Furthermore, in the case of Figures 4a and 4c, the overall yield is 700, and in the case of Figure 4b, the overall yield is about 799.4.

4d to 4f show the case where the optical film is cut to a size different from that of Figs. 4a to 4c, and Fig. 4d shows that the optical film is cut to the left by the direction in which the optical film advances, and the optical film is cut in the form of a quadrilateral sheet. In the case of the case, FIG. 4e shows an example in which the center of the film is cut as a reference, and FIG. 4f shows an example in which the optical film is cut off to the right side.

According to the drawing, in the case of Figs. 4d to 4f, the number of products to be chamfered is 10 each. In the case of Fig. 4d, the number of sheets containing no defects among the ten sheets was three, and four in the case of Fig. 4e and Fig. 4f. In this way, if the test yield is calculated separately, It can be seen that it is 30% in the case of Fig. 4d and 40% in the case of Fig. 4e and Fig. 4f. Therefore, it can be seen that the test pieces of Figs. 4e and 4f have higher yields than those of Fig. 4d.

Furthermore, the overall yield of Figure 4d is 300, and the overall yield of Figure 4e and Figure 4f is 400.

Referring to the overall yield of the example shown in Figs. 4a to 4f, it is understood that the example shown in Fig. 4b shows the highest overall yield. Therefore, the cutting model determining unit 123 can determine the cutting position and size of the optical film as in the example shown in FIG. 4b.

The inspection method determination unit 125 can determine the inspection method of each region of the optical film based on the defect data combined by the data integration unit 121. In this case, the inspection method for each region may be an inspection method that is additionally performed in a subsequent step after the optical film roll is manufactured.

Specifically, the inspection method determination unit 125 can classify the defects included in the defect data combined by the data integration unit 131 according to the defect type, and determine the inspection method of each region based on the type and location of the defect after classification. At this time, the types of defects can be classified into bright spot defects, air bubbles, scratches, dense defects, pitch defects, etc., and the inspection methods for the classified defects may include inspection, reflection inspection, full inspection, Visual inspection, etc.

For example, the inspection method determining unit 125 classifies the region including the defect and the region not including the defect based on the combined defect data, and can determine the inspection method such that the region not including the defect is subjected to a simple inspection such as visual inspection.

Further, in the case of the region including the defect, the inspection method determining unit 125 classifies the defect according to the type, and can determine the inspection method for the region by using an inspection method specified in advance according to the type of the defect after the classification.

Moreover, the inspection method determining unit 125 can generate an overflow area or an unchecked area. The domain determines the inspection method by performing a full inspection.

The batch configuration unit 127 can determine the product batch by including the simple inspection area to the maximum extent based on the inspection method of each area determined by the inspection method determination unit 125 and the number of products of each predetermined product lot. Composition. At this time, the product lot is a binding unit for identifying the optical film after cutting.

5a to 5c are diagrams for explaining the composition of the product batch.

FIG. 5A shows a method of inspecting the cutting position of the optical film by the cutting model determining unit 123 and the respective regions determined by the inspection method determining unit 125. In the illustrated example, the area where the inspection method is not indicated can be assumed to be a simple checker as an area where no defect is detected.

Referring to Fig. 5b, if the number of products constituting one product lot is assumed to be four, the product lot is formed in the lateral direction or the vertical direction based on the cutting direction.

Specifically, in the case where the product lot is configured in the vertical direction, only the simple inspection area is included in the case of the lot 510, and the entire inspection area is included in the case of the lot 520. In addition, when it is demonstrated that the product lot is formed in the horizontal direction, both the lot 530 and the lot 540 contain all the inspection areas. Therefore, the batch forming unit 127 can determine the product lots 510 and 520 in the vertical direction.

In this method, the results of the batch of articles constituting all regions relative to the optical film are shown in Figure 5c. In Fig. 5c, the parts indicated by the same numerals refer to the sheets contained in the same batch.

Fig. 6 is a flow chart showing an optical film inspection method of an embodiment.

Referring to Fig. 6, the inspection apparatus is disposed on the optical film production based on the direction in which the optical film is transferred. The inspection device at the front of the line receives the inspection start signal (610).

Upon receiving the inspection start signal, the inspection device starts inspection of the optical film (620), and calculates the optical film transfer distance (630) from the time point when the inspection start signal is received.

Then, the inspection device determines whether or not the calculated transfer distance L of the optical film is equal to the distance L1 until the inspection device disposed in the subsequent stage of the optical film production line based on the transfer direction of the optical film (640), and if they match, The inspection device disposed in the subsequent stage transmits an inspection start signal (650).

Fig. 7 is a flow chart showing an optical film inspection method according to another embodiment.

Referring to Fig. 7, the inspection apparatus receives an inspection end signal (710) from an inspection apparatus disposed in front of the optical film production line with reference to the direction in which the optical film is transferred.

When the inspection end signal is received, the inspection device calculates the transfer distance of the optical film from the time point when the inspection end signal is received (720).

Then, the inspection device determines whether or not the calculated transfer distance L of the optical film is equal to the distance L1 from the direction in which the optical film is transferred to the inspection device that transmits the inspection end signal (730), and if it is identical, the optical film is terminated. Check (740).

Then, the inspection device transmits an inspection end signal (750) to the inspection device disposed in the subsequent stage.

Fig. 8 is a flow chart showing an optical film inspection method according to still another embodiment.

Referring to Figure 8, the inspection device receives a roll alternating signal (810) from the winding portion 220.

Then, the inspection device generates a defect data (820) relative to the volume before the alternation based on the distance up to the winding portion 220, the defect data being the time point at which the volume alternate signal is received The defect data generated so far is excluded from the defect data other than the defect data which is not wound by the winding portion 220.

Then, the inspection device generates defect data (830) relative to the alternate volume, the defect data including the defect data generated at the time point when the volume alternate signal is received, relative to the interval not wound by the winding portion 220 Defect information.

At this time, the inspection apparatus can correct the position of the defect included in the defect data with respect to the section not wound by the winding section 220 so as to coincide with the defect position of the alternately wound roll.

Further, the inspection device can initialize the transfer distance of the optical film to the distance up to the winding portion 220 based on the time point at which the roll alternate signal is received, and determine the transfer signal based on the initial transfer distance. The location of the defect detected.

Further, the optical film inspection method shown in FIGS. 6 to 8 can be performed by the first inspection device 111 or the second inspection device 112.

Fig. 9 is a flow chart showing an optical film quality management method according to an embodiment of the present invention.

Referring to Fig. 9, the optical film quality management device 120 can receive defect data (910) from a plurality of inspection devices disposed at different positions of the optical film production line, respectively.

The optical film quality management device 120 then merges the received defect data to generate merged defect data (920).

At this time, the defect data may include information related to the transfer distance of the optical film on the optical film production line, and the quality management device 120 of the optical film may be combined based on the defect position information, the transfer distance of the optical film, and the length of the predetermined optical film roll. Received from multiple inspection devices Trapped information.

Specifically, the quality management device 120 of the optical film can generate the defect data up to the length of the predetermined optical film roll based on the transfer distance of the optical film and the defect data received from the plurality of inspection devices. Volume defect information.

Moreover, the optical film quality management device 120 generates a defect relative to the alternate roll based on the transfer distance of the optical film and the defect data exceeding the length of the predetermined optical film roll in the defect data received by the plurality of inspection devices. data. At this time, the optical film quality management device 120 corrects the defect data exceeding the length of the predetermined optical film roll, and corrects the transfer distance of the optical film by initializing the transfer distance, and then merging the defect position information based on the initial transfer distance, thereby generating a relative Defects in the volume after the alternation.

Furthermore, the combined defect data may include information related to the unchecked area or information related to the area in which the overflow occurs.

Then, the optical film quality management device 120 determines the cutting size and the cutting position of the optical film based on the combined defect data (930).

At this time, the quality management device 120 of the optical film can calculate the yield of the optical film according to the cutting size and the cutting position based on the combined defect data, and can determine the cutting size of the optical film based on the calculated yield and Cutting position. Moreover, the yield of the optical film can include the chamfer yield and the yield of the test article.

Then, the optical film quality management device 120 determines an inspection method (940) of each region of the optical film based on the combined defect data.

At this time, the quality management device 120 of the optical film classifies the defects included in the combined defect data according to the defect type, and can determine each type based on the type and location of the defect. Regional inspection method.

Further, in the case where the merged defect data includes information related to the unexamined area or the area where the overflow occurs, the optical film quality management device 120 can determine the inspection method for the area as the full inspection.

Then, the optical film quality management device 120 determines the optical film product batch based on the inspection method of each region after the determination, the cutting size and the cutting position of the optical film, and the region determined to be the simple inspection method to the maximum extent. Substructure (950).

In the flowcharts shown in FIG. 6 to FIG. 9, the above method is divided into a plurality of stages, but at least some of the stages may be changed in order, or may be combined with other stages, or may be omitted, or may be divided into details. The stage may be carried out, or may be performed by adding one or more stages not shown.

Furthermore, embodiments of the present invention may include a computer readable recording medium including a program for executing the method described in the specification on a computer. The above computer readable recording medium may include program commands, area data files, area data structures, and the like, alone or in combination. The above media may be specially designed for the present invention, or may be generally available to users in the field of computer software. In the case of a computer-readable recording medium, magnetic media such as a hard disk, a floppy disk, and a magnetic tape, such as a CD-ROM (compact disk read only memory), a DVD (digital) Versatile disc, digital versatile disc, etc., such as floppy disk and other magnetic-optical media and such as ROM (Read Only Memory), RAM (Random Access Memory, random access memory), flash A hardware device specially configured by a program such as a memory to store and execute a program. The program command example includes not only the machine language code produced by the compiler, but also the use of an interpreter. A high-level language code that can be executed by a computer.

The representative embodiments of the present invention have been described in detail above, but it is understood by those of ordinary skill in the art that the present invention can be variously modified without departing from the scope of the invention. Therefore, the scope of the present invention is not limited to the embodiments described, and is defined not only by the scope of the patent application described below but also by the scope of the patent application.

100‧‧‧Quality Management System

110‧‧‧Optical film inspection system

111‧‧‧1st inspection device

112‧‧‧2nd inspection device

113‧‧‧Announcement device

120‧‧‧Quality management device

200‧‧‧ optical film production line

210‧‧‧Encoder

220‧‧‧Winding Department

221, 222‧ ‧ core

230‧‧‧Optical film

Claims (46)

An optical film inspection system comprising: a first inspection device disposed at a specific position on an optical film production line to detect defects of an optical film; and a second inspection device disposed on the basis of a transfer direction of the optical film The first inspection device detects a defect of the optical film, and the first inspection device and the second inspection device calculate a transfer distance of the optical film on the optical film production line, based on the distance between the optical film and the above The transfer distance of the optical film is synchronized. The optical film inspection system according to claim 1, wherein the first inspection device and the second inspection device calculate a transfer distance of the optical film by using an encoder signal, wherein the encoder signal is disposed on the optical device A specific encoder is generated on the film line. The optical film inspection system according to claim 1, wherein the first inspection device calculates a transfer distance of the optical film by using an encoder signal, wherein the encoder signal is specified by the optical film production line. Encoder generation, wherein the second inspection device calculates a transfer distance of the optical film by using an encoder signal, wherein the encoder signal is disposed on the optical film production line and has the same resolution as the specific encoder. Other encoders are generated. The inspection system for an optical film according to claim 1, wherein the first inspection device is configured such that the distance between the optical film calculated after the start of the defect detection and the distance from the second inspection device are the same The second inspection device transmits The start signal is detected, and the second inspection device starts the defect detection when receiving the inspection start signal, and calculates the transfer distance of the optical film. The inspection system for an optical film according to claim 1, wherein the first inspection device transmits an inspection end signal to the second inspection device when the defect detection is completed, and the second inspection device receives the inspection signal. In the case of the above-described inspection end signal, when the transfer distance of the optical film calculated after receiving the inspection end signal is the same as the distance from the first inspection device, the defect detection is ended. The inspection system for an optical film according to claim 1, wherein the first inspection device and the second inspection device determine a position of the detected defect based on a transfer distance of the optical film, and generate the detection including the detection Defect information on the location of the defect. The inspection system for an optical film according to claim 6, wherein the first inspection device and the second inspection device receive a roll alternate signal from a winding portion of the optical film. And generating, based on the distance from the winding portion and the transfer distance of the optical film calculated from the time point when the roll alternating signal is received, the defect data of the roll before the alternation, the defect data receiving the volume alternating signal The defect data generated up to the time point is in addition to the defect data other than the defect data of the section not wound by the winding portion. The inspection system for an optical film according to claim 7, wherein the first inspection device and the second inspection device receive the roll control In the case of the number, the defect data is generated with respect to the alternately wound volume, the defect data including the defect data with respect to the section not wound by the winding portion. The inspection system for an optical film according to claim 8, wherein the first inspection device and the second inspection device are corrected in accordance with a position of a defect of the alternately wound roll. The position of the defect contained in the defect data in the section where the winding portion is wound. The optical film inspection system according to claim 8, wherein the first inspection device and the second inspection device initialize a transfer distance of the optical film based on a time point at which the roll alternate signal is received, and The initial transfer distance is a position that determines the defect to be detected after receiving the above-mentioned volume alternate signal. The inspection system for an optical film according to claim 6, further comprising an alarm device that receives the defect data from the first inspection device and the second inspection device, and based on the received defect data A warning signal is generated by at least one of the number, type, interval, and distribution of defects included in the defect. An optical film inspection method is an optical film inspection method of an inspection device, which is disposed at a specific position on an optical film production line and detects defects of the optical film, and the optical film inspection method is characterized by comprising the following stages: The inspection device disposed before the specific position based on the transfer direction of the optical film receives the inspection start signal to detect the defect of the optical film; and calculates the optical film from the time point when the inspection start signal is received. Transfer distance Determining whether the calculated transfer distance matches the distance up to the inspection device disposed in the subsequent stage of the specific position; and when the calculated transfer distance matches the distance to the inspection device disposed in the subsequent stage, The inspection device in the latter stage transmits an inspection start signal. The optical film inspection method according to claim 12, further comprising the step of: receiving an inspection end signal from an inspection device disposed in the preceding stage; and calculating the optical film from a time point when the inspection end signal is received The transfer distance is determined. It is determined whether the transfer distance of the optical film calculated from the time point when the end of the inspection signal is received is the same as the distance from the inspection device disposed in the previous stage; and the time from the receipt of the inspection end signal is started. When the calculated transfer distance of the optical film matches the distance until the inspection device disposed in the preceding stage, the defect detection is completed, and the inspection end signal is transmitted to the inspection device disposed in the subsequent stage. The optical film inspection method according to claim 13, wherein the transfer distance of the optical film is calculated by using an encoder signal, and the encoder signal is disposed on the optical film production line and disposed in the front and rear sections. The specific encoder shared by the inspection device is generated. The optical film inspection method according to claim 13, wherein the transfer distance of the optical film is calculated by using an encoder signal, and the encoder signal is disposed on the optical film production line and has a configuration and Rear inspection device The encoder is generated using the same resolution as the encoder. The optical film inspection method according to claim 12, further comprising the step of: determining a position of the detected defect based on the calculated transfer distance of the optical film; and generating the defect including the detection Defect information at the location. The optical film inspection method according to claim 16, further comprising the steps of: receiving a roll alternating signal from a winding portion that winds the optical film; and based on a distance up to the winding portion Generating, according to the defect data of the pre-alternating volume, the defect data is a defect data generated before the time point when the alternating volume signal is received, except for the defect data other than the defect data not wound by the winding portion data. The optical film inspection method of claim 17, further comprising the step of generating defect data relating to the alternately wound volume including the defect data of the unwrapped section. The method for inspecting an optical film according to claim 18, wherein the step of generating a defect data relative to the alternately wound volume is corrected in accordance with a position of the defect of the alternately wound roll The position of the defect contained in the defect data in the section where the winding portion is wound. The method for inspecting an optical film according to claim 18, wherein the step of generating the defect data relative to the alternate roll is to initialize the transfer of the optical film based on the time point at which the alternating signal of the volume is received. Distance and initialization The sending distance is based on the position of the defect to be detected after receiving the above-mentioned volume alternating signal. A quality management device for an optical film, comprising: a data merging unit that receives defect data from a plurality of inspection devices disposed at different positions of the optical film production line, and combines the received defect data; and the cutting model determining unit is based on the combination The defect data determines the cutting size and the cutting position of the optical film, and the inspection method determining unit determines the inspection method for each region of the optical film based on the combined defect data. The optical film quality management device according to claim 21, wherein the plurality of defect data includes defect location information. The optical film quality management device according to claim 22, wherein the data combining unit merges the plurality of defect data based on the defect position information. The quality management device for an optical film according to claim 23, wherein the defect data further includes information relating to a transfer distance of the optical film on the optical film production line, wherein the data combining unit is based on the defect position information, The transfer distance of the optical film and the length of the predetermined optical film roll are combined with the received defect data. The quality management device for an optical film according to claim 24, wherein the data combining unit merges the defect data of the received defect data into the length of the predetermined optical film roll based on the transfer distance of the optical film. To generate defect data relative to the volume before the alternation. The quality management device for an optical film according to claim 24, wherein The data combining unit combines the defect data of the received defect data exceeding the length of the predetermined optical film roll based on the transfer distance of the optical film to generate defect data with respect to the alternate roll. The optical film quality management device according to claim 26, wherein the data merging portion initializes the transfer distance of the optical film for the defect data exceeding the length of the predetermined optical film roll, and initializes The transfer distance is corrected based on the defect position information, and then combined to generate defect data with respect to the alternate volume. The quality management device for an optical film according to claim 21, wherein the cutting model determining unit calculates a yield of the optical film based on the cutting size and the cutting position based on the combined defect data, and based on the calculation The yield is determined by the cutting size and cutting position of the above optical film. The optical film quality management device according to claim 28, wherein the yield of the optical film comprises a chamfer yield and a test article yield. The optical film quality management device according to claim 22, wherein the inspection method determining unit classifies the defects included in the combined defect data according to the defect type, based on the defect type and position after the classification. Determine the inspection methods for each of the above areas. The quality management device for an optical film according to claim 21, wherein the merged defect data includes information related to an uninspected area, and the inspection method determining unit determines the inspection method for the uninspected area as the total number. an examination. The quality management device for an optical film according to claim 21, wherein The merged defect data includes information relating to an area generated by an overflow, and the inspection method determining unit determines the inspection method for the area in which the overflow occurs to be the full inspection. The quality control device for an optical film according to claim 21, further comprising a batch configuration determining unit, wherein the batch configuration determining unit is based on the inspection method of each of the regions, the cutting size and the cutting position of the optical film, The composition of the product of the above optical film is determined in such a manner as to include the area determined to be the simple inspection method to the maximum extent. An optical film quality management method comprising the steps of: receiving defect data from a plurality of inspection devices disposed at different positions of an optical film production line; and combining the received defect data; determining the above based on the combined defect data The cutting size and the cutting position of the optical film; and the inspection method for determining each region of the optical film based on the combined defect data. The method for managing quality of an optical film according to claim 34, wherein the plurality of defect data includes defect location information. The method for managing quality of an optical film according to claim 35, wherein the plurality of defect data are combined based on the defect location information in the phase of the combination. The method for managing quality of an optical film according to claim 36, wherein the defect data further includes information relating to a transfer distance of the optical film on the optical film production line, At the stage of the combination, the received defect data is combined based on the defect position information, the transfer distance of the optical film, and the length of the predetermined optical film roll. The method for managing quality of an optical film according to claim 37, wherein the merging phase is based on the transfer distance of the optical film and the received defect data until the length of the predetermined optical film roll is Defect data to generate defect data relative to the volume before the alternation. The method for managing quality of an optical film according to claim 37, wherein the step of combining is based on the transfer distance of the optical film and the defect of the received defect data exceeding the length of the predetermined optical film roll. Data to generate defect data relative to the alternate volume. The method for managing quality of an optical film according to claim 39, wherein at the stage of the combination, the defect data exceeding the length of the predetermined optical film roll is initialized to initialize the transfer distance of the optical film, and is initialized. The transfer distance is corrected based on the defect position information, and then combined to generate defect data with respect to the alternate roll. The method for managing quality of an optical film according to claim 34, wherein the step of determining the cutting size and the cutting position of the optical film comprises the following stages: calculating the cutting size and the cutting position based on the combined defect data; The yield of the optical film obtained above is determined; and the cutting size and the cutting position of the optical film are determined based on the calculated yield. The method for quality management of an optical film according to claim 41, wherein the yield of the optical film comprises a chamfer yield and a test article yield. The method for managing quality of an optical film as described in claim 35, wherein The stage of the inspection method for determining each region of the optical film includes the following steps: classifying the defects included in the combined defect data according to the defect type; and determining the above regions based on the type and location of the defect after the classification Inspection method. The optical film quality management method according to claim 34, wherein the combined defect data includes information related to an uninspected area, and the stage of the inspection method for determining each area of the optical film is The inspection method of the inspection area is determined to be the full inspection. The optical film quality management method according to claim 34, wherein the plurality of defect data includes information related to an area generated by an overflow, and the stage of the inspection method for determining each area of the optical film is The inspection method for the area where the above overflow occurs is determined as a full check. The optical film quality management method according to claim 34, further comprising the step of: based on the inspection method of each of the regions, the cutting size and the cutting position of the optical film, and the maximum inclusion is determined as The method of the area of the simple inspection method determines the composition of the product of the above optical film.