TWI673215B - Cushioning material - Google Patents

Cushioning material Download PDF

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TWI673215B
TWI673215B TW106144936A TW106144936A TWI673215B TW I673215 B TWI673215 B TW I673215B TW 106144936 A TW106144936 A TW 106144936A TW 106144936 A TW106144936 A TW 106144936A TW I673215 B TWI673215 B TW I673215B
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cover
buffer material
storage container
storage
side rib
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TW106144936A
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TW201827313A (en
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堀尾朋広
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日商Sumco股份有限公司
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Abstract

一種緩衝材(100),其於將收納半導體晶圓的收納容器 (7)捆包於捆包箱中時,配置於收納容器(7)與捆包箱之間;收納容器(7)包括:本體(81)、蓋(83)及保持部(91);緩衝材(100)具有包括與蓋(83)的上表面接觸的上部收納部(13A)的上部緩衝材(1),上部收納部(13A)包括:與蓋(83)的上表面分離而對向的上部對向面(14)、以及從上部對向面(14)突出且與蓋(83)的上表面接觸的上部側肋(17),上部側肋(17)以接觸的狀態設置在與蓋(83)的上表面區域接觸的位置,所述位置位於至少設置有保持部(91)的區域的正上方。 A buffer material (100) for a storage container for storing semiconductor wafers (7) When packed in a packing box, it is arranged between the storage container (7) and the packing box; the storage container (7) includes: a main body (81), a cover (83), and a holding portion (91); a buffer The material (100) has an upper buffer material (1) including an upper storage portion (13A) in contact with the upper surface of the cover (83), and the upper storage portion (13A) includes: separated from the upper surface of the cover (83) and facing The upper facing surface (14) and the upper side rib (17) protruding from the upper facing surface (14) and in contact with the upper surface of the cover (83). The upper side rib (17) is provided in contact with the upper side rib (17). A position where the upper surface area of the cover (83) is in contact with, and the position is directly above the area where at least the holding portion (91) is provided.

Description

緩衝材 Cushioning material

本發明是有關於一種緩衝材。The present invention relates to a buffer material.

於運輸半導體晶圓的情況下,將多個半導體晶圓收納於收納容器中,捆包於捆包箱中後利用搬送裝置來運輸捆包箱。In the case of transporting a semiconductor wafer, a plurality of semiconductor wafers are stored in a storage container, and after being packed in a packing box, the packing box is transported by a transfer device.

運輸時,存在捆包箱從搬送裝置中掉落等,衝擊力等外力作用於收納容器的情況。因此,需要不會因外力而使半導體晶圓變形・損傷的結構。此種結構有於收納容器與捆包箱之間設置有緩衝材的結構。During transportation, the packing box may fall from the conveying device, and an external force such as an impact force may be applied to the storage container. Therefore, a structure that does not deform or damage the semiconductor wafer by an external force is required. This structure has a structure in which a buffer material is provided between the storage container and the packing box.

文獻1(日本專利特開2014-5078號公報)中記載有如下的捆包體,其設置有:收納包裝體的收納箱、搭載包裝體的獨立托板、以及與包裝體及獨立托板的至少一者接觸的作為緩衝材的發泡材。Document 1 (Japanese Patent Laid-Open No. 2014-5078) describes the following packaging body, which is provided with a storage box for storing the packaging body, an independent pallet on which the packaging body is mounted, and A foamed material as a cushioning material that at least one of them contacts.

文獻1中亦記載有,由聚烯烴、聚苯乙烯、聚胺基甲酸酯等緩衝能力優異的發泡材料構成獨立托板,來作為緩衝材。Document 1 also describes that an independent pallet is formed of a foam material having excellent cushioning ability such as polyolefin, polystyrene, and polyurethane as a cushioning material.

文獻2(日本專利特開2013-249126號公報)中記載有如下的結構:於將收納半導體晶圓的基板收納容器搭載於托板上的結構中,於托板的搭載面上設置有彈性緩衝體。Document 2 (Japanese Patent Laid-Open No. 2013-249126) describes a structure in which a substrate storage container for storing a semiconductor wafer is mounted on a pallet, and an elastic buffer is provided on the mounting surface of the pallet. body.

文獻2中指出,蕭式00硬度為20°~120°的彈性緩衝體較佳。具體而言可列舉彈性體或橡膠。Reference 2 points out that an elastic buffer having a hardness of 20 ° to 120 ° is preferred. Specific examples include elastomers and rubbers.

文獻3(日本專利特開2010-132331號公報)中記載有如下的捆包體,其包括:密合於半導體收納容器的全方位面來保護的多個內側發泡緩衝材、收納半導體收納容器的瓦楞紙板箱、以及設置於內側發泡緩衝材與瓦楞紙板箱的內面之間的多個黏彈性固體緩衝材。Document 3 (Japanese Patent Laid-Open No. 2010-132331) describes a packaging body including a plurality of inner foaming buffer materials that are closely adhered to and protected by the omnidirectional surface of a semiconductor storage container, and a semiconductor storage container Corrugated cardboard box, and a plurality of viscoelastic solid buffer materials disposed between the inner foaming buffer material and the inner surface of the corrugated cardboard box.

文獻4(日本專利特開2011-016549號公報)中記載有於半導體晶圓箱與托板之間設置底板的結構。底板為由2片合成樹脂瓦楞紙板來夾持圓柱狀彈性體的緩衝材。Document 4 (Japanese Patent Laid-Open No. 2011-016549) describes a structure in which a bottom plate is provided between a semiconductor wafer box and a pallet. The bottom plate is a cushioning material that sandwiches a cylindrical elastic body by two sheets of synthetic resin corrugated cardboard.

文獻4中記載有亦可使用發泡苯乙烯製的緩衝材來代替底板。亦記載有於半導體晶圓箱的上表面設置蓋體,且於蓋體的背面設置海綿狀的聚胺基甲酸酯來吸收衝擊的結構。Document 4 describes that a cushioning material made of expanded styrene may be used instead of the bottom plate. It also describes a structure in which a cover is provided on the upper surface of the semiconductor wafer box, and a sponge-like polyurethane is provided on the back of the cover to absorb the impact.

文獻5(日本專利特開2014-151963號公報)中記載有以將晶圓收納容器的上下夾入的方式設置有上部緩衝體以及下部緩衝體的捆包體。Document 5 (Japanese Patent Laid-Open No. 2014-151963) describes a packing body in which an upper buffer body and a lower buffer body are provided so as to sandwich the upper and lower sides of a wafer storage container.

上部緩衝體包括:收納晶圓收納容器的上部的上凹部、以及設置於上凹部的外周且與晶圓收納容器的上端面接觸的擠壓肋。The upper buffer body includes an upper recessed portion for storing an upper portion of the wafer storage container, and a pressing rib provided on an outer periphery of the upper recessed portion and in contact with an upper end surface of the wafer storage container.

於下部緩衝體的底面上設置有衝擊吸收用突起。衝擊吸收用突起藉由在收納有晶圓收納容器的容器掉落而撞擊地板時,因撞擊的衝擊而破碎,從而吸收衝擊能量,以使衝擊不會傳遞至半導體晶圓。A shock absorbing protrusion is provided on the bottom surface of the lower buffer. The impact absorbing protrusion is broken by the impact of the impact when the container containing the wafer storage container is dropped and hits the floor, thereby absorbing impact energy so that the impact is not transmitted to the semiconductor wafer.

為了保持為半導體晶圓不相互接觸,且於容器內不移動的方式,收納容器於內部具備槽或突起等保持部。In order to keep the semiconductor wafers from contacting each other and not to move inside the container, the storage container includes a holding portion such as a groove or a protrusion inside.

收納容器的外形並不限定於單純的箱型。存在如下結構,其具備:沿著所收納的半導體晶圓的形狀的圓弧狀部分、或於放置收納容器的情況下用以防止底面的局部接觸的腳部。The outer shape of the storage container is not limited to a simple box type. There are structures including a circular arc-shaped portion along the shape of the semiconductor wafer to be stored, or a leg portion for preventing local contact of the bottom surface when the storage container is placed.

因此,收納容器中,於施加衝擊的情況下使半導體晶圓變形・損傷的可能性高的部位為何處,依存於內部的結構或外形。Therefore, the location of the storage container where a semiconductor wafer is likely to be deformed or damaged when an impact is applied depends on the internal structure or external shape.

另外,若設置緩衝材,則捆包體的重量或體積增加,作業性惡化,因此亦需要留意位置或尺寸。In addition, if a buffer material is provided, the weight or volume of the package body increases, and workability deteriorates. Therefore, it is also necessary to pay attention to the position or size.

然而,如以下所述,文獻1至文獻5中記載的結構未對使半導體晶圓變形・損傷的可能性高的部位與低的部位加以區分而設置緩衝材。因此,存在無法保護半導體晶圓不受外力影響的情況、或作業性惡化的情況。However, as described below, the structures described in Documents 1 to 5 do not distinguish between a portion that is highly likely to deform and damage a semiconductor wafer and a portion that is low, and a buffer material is provided. Therefore, there are cases where the semiconductor wafer cannot be protected from external forces or the workability is deteriorated.

文獻1至文獻4中記載的結構是收納箱與緩衝材接觸的位置為上表面或者底面的整個面,未對使半導體晶圓變形・損傷的可能性高的部位與低的部位加以區分。The structure described in Documents 1 to 4 is such that the position where the storage box contacts the buffer material is the entire surface of the upper surface or the bottom surface, and does not distinguish between portions that are likely to deform or damage the semiconductor wafer and portions that are low.

文獻2中記載的結構是於托板上以一定間隔來設置平面矩形的彈性緩衝體的結構,未對使半導體晶圓變形・損傷的可能性高的部位與低的部位加以區分。The structure described in Document 2 is a structure in which a flat rectangular elastic buffer is provided at a certain interval on the pallet, and does not distinguish between a portion that is highly likely to deform and damage the semiconductor wafer and a portion that is low.

文獻3中記載的結構是於收納箱的全方位面上密合有緩衝材的結構,未對使半導體晶圓變形・損傷的可能性高的部位與低的部位加以區分。此種結構中,收納箱的重量或體積增加而作業性惡化。The structure described in Document 3 is a structure in which a cushioning material is closely adhered to the omnidirectional surface of the storage box, and a portion having a high possibility of deformation or damage to the semiconductor wafer is not distinguished from a portion having a low probability. In such a structure, the weight or volume of the storage box increases, and workability deteriorates.

文獻5中記載的結構雖指定了上表面肋與收納箱的位置關係,但其是以蓋體與肋不接觸的方式來防止蓋的振動的結構,並非對使半導體晶圓變形・損傷的可能性高的部位加以保護的結構。Although the structure described in Document 5 specifies the positional relationship between the upper surface ribs and the storage box, the structure prevents the lid from vibrating so that the lid body and the ribs do not contact each other. This is not a possibility of deforming or damaging the semiconductor wafer. Structure that protects high-sex areas.

文獻5中記載的結構雖指定了衝擊吸收用突起的位置及形狀,但設置於不與收納箱接觸的外側,並非對使半導體晶圓變形・損傷的可能性高的部位加以保護的結構。Although the structure described in Document 5 specifies the position and shape of the shock absorbing protrusion, it is provided on the outer side that does not contact the storage box, and is not a structure that protects a portion that is highly likely to deform or damage the semiconductor wafer.

本發明是鑒於所述課題而形成,目的在於提供一種可對使半導體晶圓變形・損傷的可能性高的部位加以保護、作業效率優異的結構的緩衝材。The present invention has been made in view of the above-mentioned problems, and an object thereof is to provide a buffer material having a structure that can protect a portion that is highly likely to deform or damage a semiconductor wafer and has excellent work efficiency.

本發明的緩衝材是於將收納半導體晶圓的收納容器捆包於捆包箱中時,配置於所述收納容器與所述捆包箱之間的緩衝材,其特徵在於:所述收納容器包括: 上表面開放的箱型的本體、遮蓋所述上表面的蓋、及保持部,所述保持部設置於所述蓋的背面側,與容納於所述本體內的所述半導體晶圓的上部周緣抵接來限制所述半導體晶圓的移動;所述緩衝材具有包括與所述蓋的上表面接觸的上部收納部的上部緩衝材,所述上部收納部包括:與所述蓋的上表面分離而對向的上部對向面、以及從所述上部對向面突出且與所述蓋的上表面接觸的上部側肋,所述上部側肋設置在與所述蓋的上表面區域接觸的位置,所述位置位於至少設置有所述保持部的區域的正上方。The buffer material of the present invention is a buffer material arranged between the storage container and the packing box when the storage container containing the semiconductor wafer is packed in a packing box, wherein the storage container is characterized in that: It includes: a box-shaped body with an open upper surface, a cover covering the upper surface, and a holding portion, the holding portion being provided on the back side of the cover, and the semiconductor wafer accommodated in the body. An upper peripheral edge abuts to restrict movement of the semiconductor wafer; the buffer material includes an upper buffer material including an upper storage portion that is in contact with an upper surface of the cover, and the upper storage portion includes: An upper facing surface facing away from the surface and an upper side rib protruding from the upper facing surface and contacting the upper surface of the cover, the upper side rib being provided in contact with the upper surface area of the cover The position is directly above an area where at least the holding portion is provided.

依據本發明,以按壓保持部的方式,上部側肋設置於上部緩衝材上。保持部為半導體晶圓與收納容器接觸的部位,於施加衝擊的情況下,使半導體晶圓變形・損傷的可能性高。因此,藉由以按壓保持部的方式設置上部側肋,可於衝擊時優先保護使半導體晶圓變形・損傷的可能性高的部位。According to the present invention, the upper side rib is provided on the upper buffer material so as to press the holding portion. The holding portion is a portion where the semiconductor wafer is in contact with the storage container. When an impact is applied, the semiconductor wafer is likely to be deformed or damaged. Therefore, by providing the upper side ribs so as to press the holding portion, it is possible to preferentially protect a portion that is likely to deform or damage the semiconductor wafer during impact.

本發明的緩衝材中較佳為,所述上部側肋的平面形狀為十字形。In the buffer material of the present invention, it is preferable that a planar shape of the upper side rib is a cross shape.

依據本發明,即便相對於收納容器,緩衝材的平面上的設置角度偏移90°,亦於可按壓保持部的位置上坐落有上部側肋,因此可提高設置緩衝材時的位置的自由度,作業效率優異。According to the present invention, even if the installation angle of the buffer material on the plane of the storage container is shifted by 90 °, the upper side rib is located at a position where the holding portion can be pressed, so that the degree of freedom in the position when the buffer material is installed can be improved. , Excellent operation efficiency.

本發明的緩衝材中較佳為,所述上部側肋於十字的交叉部設置有上部側孔。In the buffer material of the present invention, it is preferable that the upper side rib is provided with an upper side hole at an intersection of the cross.

依據本發明,於緩衝材與收納容器接觸的狀態下亦可從孔中辨認出收納容器。因此,能夠容易地確認緩衝材是否確實地保持於收納容器中。另外,藉由握住孔部的內周,容易從收納容器中拆卸緩衝材,因此作業效率優異。According to the present invention, the storage container can be recognized from the hole even when the buffer material is in contact with the storage container. Therefore, it is possible to easily confirm whether or not the buffer material is reliably held in the storage container. In addition, it is easy to detach the buffer material from the storage container by holding the inner periphery of the hole portion, so the work efficiency is excellent.

本發明的緩衝材中較佳為,所述收納容器包括以從底面突出的方式設置於所述底面的至少一對腳部,所述緩衝材具有包括與所述底面接觸的下部收納部的下部緩衝材,並且所述下部收納部包括:與所述腳部分離而與所述收納容器的所述底面對向的下部對向面、以及從所述下部對向面突出且與所述收納容器的所述底面接觸的下部側肋。In the buffer material of the present invention, preferably, the storage container includes at least a pair of leg portions provided on the bottom surface so as to protrude from the bottom surface, and the buffer material has a lower portion including a lower storage portion that is in contact with the bottom surface. A cushioning material, and the lower storage portion includes a lower facing surface separated from the leg portion and facing the bottom surface of the storage container, and a protruding portion protruding from the lower facing surface and facing the storage portion A lower side rib that the bottom surface of the container contacts.

依據本發明,於下部側肋與收納容器的底面接觸的狀態下,腳部與下部對向面分離。因此,可防止腳部接觸下部對向面而使收納容器的底面從下部側肋上浮起,可確實地保護收納容器的底面。According to the present invention, in a state where the lower side ribs are in contact with the bottom surface of the storage container, the leg portion is separated from the lower facing surface. Therefore, it is possible to prevent the bottom portion of the storage container from floating from the lower side ribs by preventing the feet from coming into contact with the lower facing surface, and to reliably protect the bottom surface of the storage container.

本發明的緩衝材中較佳為,所述緩衝材具有與所述蓋及所述底面接觸的中部緩衝材,所述中部緩衝材包括:板狀的中部緩衝材本體;中部蓋收納部,設置於所述中部緩衝材本體的底面,具有與所述蓋的上表面分離而對向的蓋對向面、及從所述蓋對向面突出且與所述蓋的上表面接觸的蓋側肋;以及中部底面收納部,設置於所述中部緩衝材本體的上表面,具有與所述腳部分離而與所述收納容器的所述底面對向的底面對向面、及從所述底面對向面突出且與所述收納容器的所述底面接觸的底面側肋;並且所述蓋側肋設置在與所述蓋的上表面區域接觸的位置,所述位置位於至少設置有所述保持部的區域的正上方。In the buffer material of the present invention, preferably, the buffer material has a middle buffer material that is in contact with the cover and the bottom surface, and the middle buffer material includes: a plate-shaped middle buffer material body; a middle cover storage portion; The bottom surface of the middle buffer material body has a cover facing surface separated from the upper surface of the cover and facing, and a cover side rib protruding from the cover facing surface and contacting the upper surface of the cover. And a middle bottom surface storage portion provided on the upper surface of the middle cushion material body, having a bottom surface facing away from the leg portion and facing the bottom surface of the storage container, and from the bottom surface, A bottom surface side rib protruding downward from the bottom surface and in contact with the bottom surface of the storage container; and the cover side rib is provided at a position contacting an upper surface area of the cover, the position is located at least The area of the holding portion is directly above.

依據本發明,以按壓保持部的方式,蓋側肋設置於中部緩衝材上。保持部為半導體晶圓與收納容器接觸的部位,於施加衝擊的情況下,使半導體晶圓變形・損傷的可能性高。因此,藉由以按壓保持部的方式設置蓋側肋,可於衝擊時優先保護使半導體晶圓變形・損傷的可能性高的部位。According to the present invention, the lid-side rib is provided on the middle cushioning material in a manner of pressing the holding portion. The holding portion is a portion where the semiconductor wafer is in contact with the storage container. When an impact is applied, the semiconductor wafer is likely to be deformed or damaged. Therefore, by providing the cover-side ribs so as to press the holding portion, it is possible to preferentially protect a portion that is likely to deform or damage the semiconductor wafer during impact.

另外,依據本發明,於底面側肋與收納容器的底面接觸的狀態下,腳部與底面對向面分離。因此,可防止腳部接觸底面對向面而使收納容器的底面從底面側肋上浮起,可確實地保護收納容器的底面。In addition, according to the present invention, in a state where the bottom surface side ribs are in contact with the bottom surface of the storage container, the leg portion and the bottom surface are separated face to face. Therefore, it is possible to prevent the feet from coming into contact with the bottom surface to face the bottom surface of the storage container from floating from the bottom surface side ribs, and to reliably protect the bottom surface of the storage container.

進而,依據本發明,中部緩衝材可設置於收納容器的上表面,亦可設置於底面,因此亦可作為上部緩衝材或下部緩衝材來使用。另外,可將收納容器於高度方向上多層地收納。Furthermore, according to the present invention, the middle buffer material can be provided on the upper surface or the bottom surface of the storage container, and therefore can also be used as an upper buffer material or a lower buffer material. In addition, the storage container can be stored in multiple layers in the height direction.

本發明的緩衝材中較佳為,所述上部收納部、所述下部收納部、所述中部蓋收納部、所述中部底面收納部排列有多組。In the buffer material of the present invention, it is preferable that the upper storage portion, the lower storage portion, the middle cover storage portion, and the middle bottom storage portion are arranged in a plurality of groups.

依據本發明,可利用1組的上部緩衝材、中部緩衝材、下部緩衝材來保護4個以上的收納容器,因此運輸或捆包時的作業效率優異。According to the present invention, since one set of the upper buffer material, the middle buffer material, and the lower buffer material can be used to protect four or more storage containers, the work efficiency during transportation or packing is excellent.

本發明的緩衝材較佳為包含發泡倍率為20倍以上、40倍以下的發泡體。The buffer material of the present invention preferably contains a foam having a foaming ratio of 20 times to 40 times.

依據本發明,由於由發泡倍率為20倍以上、40倍以下的發泡體來構成緩衝材,故而能夠兼顧可耐受來自外部的衝擊的硬度、與吸收衝擊的柔軟度。According to the present invention, since the cushioning material is composed of a foam having a foaming magnification of 20 times or more and 40 times or less, both the hardness that can withstand external impact and the flexibility that absorbs the impact can be achieved.

本發明的緩衝材較佳為包含發泡聚胺基甲酸酯、發泡聚乙烯、發泡聚丙烯、或者發泡聚苯乙烯中的任一者。The buffer material of the present invention preferably contains any one of expanded polyurethane, expanded polyethylene, expanded polypropylene, or expanded polystyrene.

依據本發明,容易將緩衝材形成為發泡倍率為20倍以上、40倍以下的發泡體。According to the present invention, it is easy to form the buffer material into a foam having a foaming magnification of 20 times or more and 40 times or less.

本發明的緩衝材是於將收納半導體晶圓的收納容器捆包於捆包箱中時,配置於所述收納容器與所述捆包箱之間的緩衝材,其特徵在於:所述收納容器包括:上表面開放的箱型的本體;遮蓋所述上表面的蓋;保持部,設置於所述蓋的背面側,與容納於所述本體內的所述半導體晶圓的上部周緣抵接來限制所述半導體晶圓的移動;以及以從底面突出的方式設置於所述底面的端部的至少一對腳部;所述緩衝材具有與所述蓋的上表面及所述收納容器的所述底面接觸的中部緩衝材,所述中部緩衝材包括:板狀的中部緩衝材本體;中部蓋收納部,設置於所述中部緩衝材本體的底面,具有與所述蓋的上表面分離而對向的蓋對向面、及從所述蓋對向面突出且與所述蓋的上表面接觸的蓋側肋;以及中部底面收納部,設置於所述中部緩衝材本體的上表面,具有與所述腳部分離而與所述收納容器的所述底面對向的底面對向面、及從所述底面對向面突出且與所述收納容器的所述底面接觸的底面側肋;並且所述蓋側肋設置在與所述蓋的上表面區域接觸的位置,所述位置位於至少設置有所述保持部的區域的正上方。The buffer material of the present invention is a buffer material arranged between the storage container and the packing box when the storage container containing the semiconductor wafer is packed in a packing box, wherein the storage container is characterized in that: It includes: a box-shaped body with an open upper surface; a cover covering the upper surface; a holding portion provided on a back side of the cover and abutting on an upper peripheral edge of the semiconductor wafer accommodated in the main body; Restricting movement of the semiconductor wafer; and at least a pair of leg portions provided at ends of the bottom surface so as to protrude from the bottom surface; the buffer material has a space between the upper surface of the lid and the storage container. The middle cushioning material in contact with the bottom surface, the middle cushioning material includes: a plate-shaped middle cushioning material body; a middle cover accommodating portion disposed on the bottom surface of the middle cushioning material body, and having a space separated from the upper surface of the cover and opposed to And a cover-side rib protruding from the cover-opposing surface and in contact with the upper surface of the cover; and a middle bottom surface storage portion provided on the upper surface of the middle cushion material body and having The foot A bottom surface facing away from the bottom surface facing the bottom surface of the storage container, and a bottom surface side rib protruding from the bottom surface facing the surface and contacting the bottom surface of the storage container; and A cover-side rib is provided at a position in contact with an upper surface area of the cover, and the position is located directly above an area where at least the holding portion is provided.

依據本發明,以按壓保持部的方式,蓋側肋設置於中部緩衝材上。保持部是半導體晶圓與收納容器接觸的部位,於施加衝擊的情況下使半導體晶圓變形・損傷的可能性高。因此,可於衝擊時優先保護使半導體晶圓變形・損傷的可能性高的部位。According to the present invention, the lid-side rib is provided on the middle cushioning material in a manner of pressing the holding portion. The holding portion is a portion where the semiconductor wafer is in contact with the storage container, and the semiconductor wafer is highly likely to be deformed or damaged when an impact is applied. Therefore, it is possible to preferentially protect a portion that is likely to deform or damage the semiconductor wafer during impact.

另外,依據本發明,於底面側肋與收納容器的底面接觸的狀態下,腳部與底面對向面分離。因此,可防止腳部接觸底面對向面而使收納容器的底面從底面側肋上浮起,可確實地保護收納容器的底面。In addition, according to the present invention, in a state where the bottom surface side ribs are in contact with the bottom surface of the storage container, the leg portion and the bottom surface are separated face to face. Therefore, it is possible to prevent the feet from coming into contact with the bottom surface to face the bottom surface of the storage container from floating from the bottom surface side ribs, and to reliably protect the bottom surface of the storage container.

進而,依據本發明,中部緩衝材可設置於收納容器的上表面,亦可設置於底面,因此亦可作為上部緩衝材或下部緩衝材來使用。另外,可將收納容器於高度方向上多層地收納。 Furthermore, according to the present invention, the middle buffer material can be provided on the upper surface or the bottom surface of the storage container, and therefore can also be used as an upper buffer material or a lower buffer material. In addition, the storage container can be stored in multiple layers in the height direction.

以下,基於圖式,對適合於本發明的實施形態進行詳細說明。Hereinafter, embodiments suitable for the present invention will be described in detail based on the drawings.

首先,參照圖1~圖3,對本實施形態的緩衝材的概略構成進行簡單說明。First, with reference to FIGS. 1-3, the outline structure of the cushioning material of this embodiment is demonstrated briefly.

如圖1~圖3所示,緩衝材100是於將收納容器7捆包於未圖示的捆包箱中時,配置於收納容器7與捆包箱之間的緩衝材,包括上部緩衝材1、下部緩衝材3、以及中部緩衝材5。As shown in FIG. 1 to FIG. 3, the cushioning material 100 includes the upper cushioning material, which is disposed between the storage container 7 and the packaging box when the storage container 7 is packed in a packing box (not shown). 1. Lower buffer material 3 and middle buffer material 5.

圖1中,於上部緩衝材1與中部緩衝材5之間設置3個上層的收納容器7,且於中部緩衝材5與下部緩衝材3之間設置3個下層的收納容器7。In FIG. 1, three upper storage containers 7 are provided between the upper buffer material 1 and the middle buffer material 5, and three lower storage containers 7 are provided between the middle buffer material 5 and the lower buffer material 3.

緩衝材100更包括設置於下部緩衝材3的底面上的振動吸收材9。The buffer material 100 further includes a vibration absorbing material 9 provided on the bottom surface of the lower buffer material 3.

以上為本實施形態的緩衝材100的概略構成的說明。This concludes the description of the schematic configuration of the cushioning material 100 of this embodiment.

繼而,對收納容器7、以及本實施形態的緩衝材100的構成的詳情進行說明。Next, the details of the configuration of the storage container 7 and the cushioning material 100 of the present embodiment will be described.

首先,對於收納容器7的結構,參照圖2、圖4、圖5A、及圖5B來進行說明。First, the structure of the storage container 7 will be described with reference to FIGS. 2, 4, 5A, and 5B.

收納容器7為圖2所示的收納半導體晶圓200的容器,例如為前開門運輸箱(Front Opening Shipping Box,FOSB)。如圖4所示,收納容器7具有:上表面開放的箱型的本體81、以及遮蓋上表面的蓋83。The storage container 7 is a container for storing the semiconductor wafer 200 shown in FIG. 2, and is, for example, a Front Opening Shipping Box (FOSB). As shown in FIG. 4, the storage container 7 includes a box-shaped body 81 with an open upper surface, and a cover 83 covering the upper surface.

本體81包括腳部87。The body 81 includes a leg portion 87.

腳部87是以從本體81的底面86突出的方式設置於底面86的端部的至少一對腳。此處,於四角各設置1個。The leg portion 87 is at least a pair of feet provided at an end portion of the bottom surface 86 so as to protrude from the bottom surface 86 of the main body 81. Here, one for each of the four corners is provided.

如圖2及圖4所示,於收納容器7的本體81內設置形成有收納槽的梳型的晶圓收納部85,所述收納槽用以空出間隔來收納多個半導體晶圓200。As shown in FIGS. 2 and 4, a comb-shaped wafer storage portion 85 having a storage groove formed in the main body 81 of the storage container 7 is provided to store a plurality of semiconductor wafers 200 with a gap.

晶圓收納部85包括:與半導體晶圓200的外緣側部接觸的側部收納部85A、以及與半導體晶圓200的外緣底部接觸的底部收納部85B。The wafer storage portion 85 includes a side storage portion 85A that is in contact with the outer edge side portion of the semiconductor wafer 200, and a bottom storage portion 85B that is in contact with the bottom portion of the outer edge of the semiconductor wafer 200.

此處,側部收納部85A於本體81的對向的內周側面上設置有1對。底部收納部85B於底面86的正上方設置有2個。2個側部收納部85A相互平行地配置於槽的排列方向上。Here, one pair of side accommodating portions 85A is provided on the opposite inner peripheral side surface of the main body 81. Two bottom storage portions 85B are provided directly above the bottom surface 86. The two side accommodating portions 85A are arranged parallel to each other in the arrangement direction of the grooves.

蓋83是平面形狀為矩形的板狀構件,如圖4、圖5A、及圖5B所示,具有一對鎖部89、及保持部91。The cover 83 is a plate-shaped member having a rectangular planar shape, and has a pair of lock portions 89 and a holding portion 91 as shown in FIGS. 4, 5A, and 5B.

鎖部89是將蓋83固定於本體81上的構件,如圖5A所示,包括鎖棒89A、鎖棒89B及鎖桿89C。The lock portion 89 is a member that fixes the cover 83 to the main body 81 and, as shown in FIG. 5A, includes a lock rod 89A, a lock rod 89B, and a lock rod 89C.

鎖棒89A、鎖棒89B是沿著蓋83的對向的邊來設置的構件,可朝著圖5A的D1、D2的方向移動。The lock lever 89A and the lock lever 89B are members provided along the opposite sides of the cover 83, and are movable in the directions of D1 and D2 in FIG. 5A.

鎖桿89C是從鎖部89的側面突出的桿。The lock lever 89C is a lever protruding from the side of the lock portion 89.

鎖桿89C藉由擠入鎖部側,而使鎖棒89A朝著D1的方向移動,且使鎖棒89B朝著D2的方向移動,從而於蓋83的外側擠出。擠出的鎖棒89A、鎖棒89B的前端與本體81的凹部81A扣合,將蓋83鎖定於本體81上而固定。於鎖定的狀態下,使鎖桿89C的位置返回原處,藉此將鎖棒89A、鎖棒89B拉回至蓋83的內側,解除鎖定。The lock lever 89C is pushed into the lock portion side, so that the lock rod 89A is moved in the direction of D1, and the lock rod 89B is moved in the direction of D2, so as to be squeezed out of the cover 83. The front ends of the extruded lock bars 89A and 89B are engaged with the recessed portions 81A of the main body 81, and the cover 83 is locked to the main body 81 and fixed. In the locked state, return the position of the lock lever 89C to the original position, thereby pulling the lock lever 89A and the lock lever 89B back to the inside of the cover 83 to release the lock.

如圖5B所示,保持部91是設置於蓋83的背面側的縱長的梳形構件,設置於鎖部89之間。保持部91藉由將容納於本體81內的半導體晶圓200的上部周緣插入梳齒之間且使其抵接,來限制半導體晶圓200的軸方向的移動或者直徑方向的轉動,以半導體晶圓200不相互接觸的方式保持。As shown in FIG. 5B, the holding portion 91 is a vertically long comb-shaped member provided on the back side of the cover 83 and is provided between the lock portions 89. The holding portion 91 limits the movement in the axial direction or the rotation in the diameter direction of the semiconductor wafer 200 by inserting the upper peripheral edge of the semiconductor wafer 200 housed in the main body 81 between the comb teeth and abutting them, and the semiconductor wafer 200 The circles 200 are held without touching each other.

圖5B中,保持部91是以成為與蓋83的構成矩形的1條邊平行的方式,與半導體晶圓200的排列方向(縱方向)平行地設置於蓋83的中央部。In FIG. 5B, the holding portion 91 is provided in the center portion of the cover 83 in parallel with the arrangement direction (longitudinal direction) of the semiconductor wafer 200 so as to be parallel to one side of the rectangular configuration of the cover 83.

以上為收納容器7的結構的說明。This concludes the description of the structure of the storage container 7.

繼而,參照圖2、圖6A、圖6B及圖6C,對上部緩衝材1的結構進行說明。Next, the structure of the upper buffer material 1 is demonstrated with reference to FIG. 2, FIG. 6A, FIG. 6B, and FIG. 6C.

上部緩衝材1為設置於上層的收納容器7的上表面的緩衝材,是平面形狀為矩形的板材。如圖6A及圖6C所示,上部緩衝材1包括與收納容器7的蓋83接觸的上部收納部13A、上部收納部13B、上部收納部13C。The upper buffer material 1 is a buffer material provided on the upper surface of the storage container 7 on the upper layer, and is a plate material having a rectangular planar shape. As shown in FIGS. 6A and 6C, the upper buffer material 1 includes an upper storage portion 13A, an upper storage portion 13B, and an upper storage portion 13C that are in contact with the lid 83 of the storage container 7.

上部收納部13A、上部收納部13B、上部收納部13C是設置於上部緩衝材1的底面,以嵌入收納容器7的上端的方式而受到保持的形狀的凹部。此處是平面形狀為矩形的凹部。上部收納部13A、上部收納部13B、上部收納部13C包括上部對向面14、上部側肋15、上部側肋17、上部側孔19、增強肋21。The upper storage part 13A, the upper storage part 13B, and the upper storage part 13C are recessed parts of the shape provided in the bottom surface of the upper buffer material 1, and hold | maintained so that it may fit in the upper end of the storage container 7. Here is a concave portion having a rectangular planar shape. The upper storage portion 13A, the upper storage portion 13B, and the upper storage portion 13C include an upper facing surface 14, an upper side rib 15, an upper side rib 17, an upper side hole 19, and a reinforcing rib 21.

上部對向面14是與收納容器7的蓋83分離而對向的面,為上部收納部13A、上部收納部13B、上部收納部13C的底面。The upper facing surface 14 is a surface facing away from the lid 83 of the storage container 7 and is a bottom surface of the upper storage portion 13A, the upper storage portion 13B, and the upper storage portion 13C.

上部側肋15、上部側肋17是從上部對向面14上突出的縱長的肋,至少一者與蓋83的上表面接觸,且於接觸的狀態下設置在與蓋83的上表面區域(此處,由圖5A的符號91所示的虛線所包圍的區域)接觸的位置,所述位置位於至少設置有保持部91的區域的正上方。The upper side ribs 15 and the upper side ribs 17 are longitudinal ribs protruding from the upper facing surface 14. At least one of the ribs is in contact with the upper surface of the cover 83 and is provided in a region of the upper surface of the cover 83 in a state of contact. (Here, an area surrounded by a dotted line indicated by a reference numeral 91 in FIG. 5A) a position of contact directly above the area where at least the holding portion 91 is provided.

此處,如圖2所示,於位於設置有保持部91的區域的正上方的與蓋83的上表面區域接觸的位置上設置上部側肋17。進而,上部側肋17設置於其延伸存在方向(縱方向)與保持部91的延伸存在方向一致的位置。Here, as shown in FIG. 2, the upper side ribs 17 are provided at positions directly above the region where the holding portion 91 is provided and in contact with the upper surface region of the cover 83. Further, the upper-side rib 17 is provided at a position where the extending direction (longitudinal direction) of the upper side rib 17 coincides with the extending direction of the holding portion 91.

保持部91為保持半導體晶圓200的構件,因於衝擊時使半導體晶圓200變形・損傷的可能性高,故而藉由上部側肋17按壓保持部91,可優先保護保持部91。The holding portion 91 is a member that holds the semiconductor wafer 200. Since the semiconductor wafer 200 is highly likely to be deformed or damaged during an impact, the holding portion 91 is pressed by the upper side ribs 17 to preferentially protect the holding portion 91.

上部側肋15與上部側肋17是以相互正交的方式設置,藉由上部側肋15與上部側肋17,平面形狀成為十字形。藉由是十字形,即便上部緩衝材1的平面上的設置角度偏移90°,亦於可按壓保持部91的位置上坐落有上部側肋15、上部側肋17中的任一者。The upper side ribs 15 and the upper side ribs 17 are provided so as to be orthogonal to each other, and the upper side ribs 15 and the upper side ribs 17 have a planar shape in a cross shape. With the cross shape, even if the installation angle on the plane of the upper buffer material 1 is shifted by 90 °, any one of the upper side rib 15 and the upper side rib 17 is located at a position where the holding portion 91 can be pressed.

因此,可提高設置上部緩衝材1時的位置的自由度,作業效率優異。Therefore, the degree of freedom in the position when the upper buffer material 1 is installed can be improved, and the work efficiency is excellent.

上部側孔19是設置於上部側肋15、上部側肋17的十字的交叉部的貫通孔。The upper-side hole 19 is a through-hole provided in an intersection of the cross of the upper-side rib 15 and the upper-side rib 17.

上部側孔19用於在上部緩衝材1設置於收納容器7中的狀態下,辨認出收納容器7的上表面。上部側孔19亦用於代替從收納容器7中拆卸上部緩衝材1時的把手。具體而言,藉由握住上部側孔19的內周,容易拆卸上部緩衝材1。The upper side hole 19 is used to identify the upper surface of the storage container 7 in a state where the upper buffer material 1 is provided in the storage container 7. The upper side hole 19 is also used instead of a handle when the upper buffer material 1 is removed from the storage container 7. Specifically, the upper buffer material 1 can be easily removed by holding the inner periphery of the upper side hole 19.

增強肋21是為了將上部收納部13A、上部收納部13B、上部收納部13C的鄰接的側面連結而設置的L字型的肋,對上部收納部13A、上部收納部13B、上部收納部13C的側面進行增強。The reinforcing rib 21 is an L-shaped rib provided to connect the adjacent side surfaces of the upper storage portion 13A, the upper storage portion 13B, and the upper storage portion 13C. The reinforcement ribs 21 are provided to the upper storage portion 13A, the upper storage portion 13B, and the upper storage portion 13C. Enhance the sides.

以上為上部緩衝材1的結構的說明。The above is the description of the structure of the upper buffer material 1.

繼而,參照圖2、圖3、圖7A、圖7B及圖7C,對下部緩衝材3的結構進行說明。Next, the structure of the lower buffer material 3 will be described with reference to FIGS. 2, 3, 7A, 7B, and 7C.

下部緩衝材3是設置於下層的收納容器7的底面上的緩衝材,是平面形狀為矩形的板材。下部緩衝材3包括與收納容器7的底面接觸的下部收納部31A、下部收納部31B、下部收納部31C。The lower cushioning material 3 is a cushioning material provided on the bottom surface of the storage container 7 in the lower layer, and is a plate material having a rectangular planar shape. The lower buffer material 3 includes a lower storage portion 31A, a lower storage portion 31B, and a lower storage portion 31C that are in contact with the bottom surface of the storage container 7.

下部收納部31A、下部收納部31B、下部收納部31C是嵌入收納容器7的下端而得到保持的形狀的凹部。此處是平面形狀為矩形的凹部。下部收納部31A、下部收納部31B、下部收納部31C包括下部對向面33、下部側肋35、下部側孔37。The lower storage portion 31A, the lower storage portion 31B, and the lower storage portion 31C are recessed portions of a shape that fits into the lower end of the storage container 7 and is retained. Here is a concave portion having a rectangular planar shape. The lower storage portion 31A, the lower storage portion 31B, and the lower storage portion 31C include a lower facing surface 33, a lower side rib 35, and a lower side hole 37.

下部對向面33是與腳部87分離而與收納容器7的底面86對向的面,為下部收納部31A、下部收納部31B、下部收納部31C的底面。The lower facing surface 33 is a surface separated from the leg portion 87 and opposed to the bottom surface 86 of the storage container 7, and is a bottom surface of the lower storage portion 31A, the lower storage portion 31B, and the lower storage portion 31C.

如圖2及圖3所示,腳部87是以跨越下部側肋35的方式來設置,因此下部側肋35不與腳部87的底面接觸。 As shown in FIGS. 2 and 3, since the leg portion 87 is provided so as to straddle the lower side rib 35, the lower side rib 35 does not contact the bottom surface of the leg portion 87.

由於下部對向面33與腳部87分離,故而如圖2及圖3所示,下部側肋35的高度H1是在與收納容器7的底面86接觸的狀態下,腳部87與下部對向面33分離的高度。 Since the lower facing surface 33 is separated from the leg portion 87, as shown in FIGS. 2 and 3, the height H1 of the lower side rib 35 is in a state in contact with the bottom surface 86 of the storage container 7, and the leg portion 87 faces the lower portion. The height of the surface 33 separation.

因此,可防止腳部87接觸下部對向面33而使收納容器7的底面86從下部側肋35上浮起,可確實地保護收納容器7的底面86。 Therefore, it is possible to prevent the bottom portion 86 of the storage container 7 from floating from the lower side rib 35 by preventing the leg portion 87 from contacting the lower facing surface 33, and to securely protect the bottom surface 86 of the storage container 7.

下部側肋35是從下部對向面33上突出的肋,如圖2及圖3所示,設置在與收納容器7的底面86接觸的位置。 The lower side rib 35 is a rib protruding from the lower facing surface 33 and is provided at a position in contact with the bottom surface 86 of the storage container 7 as shown in FIGS. 2 and 3.

下部側肋35較佳為設置在與底部收納部85B對向的位置(此處為正下方)。原因如下所述。 The lower side rib 35 is preferably provided at a position facing the bottom storage portion 85B (directly below). The reason is as follows.

圖2及圖3中,底部收納部85B由於設置於底面86的正上方,故而若對底面86施加衝擊,則衝擊傳遞至底部收納部85B,存在使半導體晶圓200變形‧損傷的可能性。因此,藉由將下部側肋35設置在與底部收納部85B對向的位置,可隔著底面86來按壓底部收納部85B。藉此,可優先保護底部收納部85B,故而較佳。 In FIGS. 2 and 3, since the bottom storage portion 85B is disposed directly above the bottom surface 86, if an impact is applied to the bottom surface 86, the impact is transmitted to the bottom storage portion 85B, and the semiconductor wafer 200 may be deformed and damaged. Therefore, by providing the lower side rib 35 at a position facing the bottom storage portion 85B, the bottom storage portion 85B can be pressed across the bottom surface 86. Thereby, since the bottom storage part 85B can be protected preferentially, it is preferable.

下部側孔37是設置於下部側肋35上的貫通孔,用於在下部緩衝材3設置於收納容器7中的狀態下,辨認出收納容器7的底面。下部側孔37亦用於代替從收納容器7中拆卸下部緩衝材3時的把手。具體而言,藉由握住下部側孔37的內周,容易拆卸下部緩衝材3。The lower side hole 37 is a through hole provided in the lower side rib 35 and is used to identify the bottom surface of the storage container 7 in a state where the lower buffer material 3 is provided in the storage container 7. The lower side hole 37 is also used instead of a handle when the lower cushioning material 3 is removed from the storage container 7. Specifically, the lower buffer member 3 can be easily removed by holding the inner periphery of the lower side hole 37.

以上為下部緩衝材3的結構的說明。The above is the description of the structure of the lower buffer material 3.

繼而,參照圖2、圖3、圖8A、圖8B、圖9A及圖9B,對中部緩衝材5的結構進行說明。Next, the structure of the middle buffer material 5 will be described with reference to FIGS. 2, 3, 8A, 8B, 9A, and 9B.

中部緩衝材5是設置於上層的收納容器7的底面、以及下層的收納容器7的上表面的緩衝材,包括板狀的中部緩衝材本體51。The middle buffer material 5 is a buffer material provided on the bottom surface of the upper storage container 7 and the upper surface of the lower storage container 7, and includes a plate-shaped middle buffer material body 51.

中部緩衝材本體51於底面上具有中部蓋收納部53A、中部蓋收納部53B、中部蓋收納部53C。The middle buffer material main body 51 includes a middle cover storage portion 53A, a middle cover storage portion 53B, and a middle cover storage portion 53C on the bottom surface.

中部蓋收納部53A、中部蓋收納部53B、中部蓋收納部53C是嵌入收納容器7的上端而受到保持的凹部。此處是平面形狀為矩形的凹部。The middle lid storage part 53A, the middle lid storage part 53B, and the middle lid storage part 53C are recessed parts which fit into and hold the upper end of the storage container 7. Here is a concave portion having a rectangular planar shape.

中部蓋收納部53A、中部蓋收納部53B、中部蓋收納部53C包括蓋對向面54、蓋側肋55、蓋側肋57、蓋側孔59、蓋側增強肋61。The middle lid storage portion 53A, the middle lid storage portion 53B, and the middle lid storage portion 53C include a lid facing surface 54, a lid side rib 55, a lid side rib 57, a lid side hole 59, and a lid side reinforcing rib 61.

蓋對向面54是與收納容器7的蓋83對向的面,為中部蓋收納部53A、中部蓋收納部53B、中部蓋收納部53C的底面。The lid facing surface 54 is a surface opposed to the lid 83 of the storage container 7, and is a bottom surface of the middle lid storage portion 53A, the middle lid storage portion 53B, and the middle lid storage portion 53C.

蓋側肋55、蓋側肋57是從蓋對向面54突出的肋,至少一者與蓋83的上表面接觸,且於接觸的狀態下設置在與蓋83的上表面區域接觸的位置,所述位置位於至少設置有保持部91的區域的正上方。此處,如圖2所示,於位於設置有保持部91的區域的正上方的與蓋83的上表面區域接觸的位置設置蓋側肋57。進而,蓋側肋57設置於其延伸存在方向(縱方向)與保持部91的延伸存在方向一致的位置。The cover-side rib 55 and the cover-side rib 57 are ribs protruding from the cover-opposing surface 54, and at least one of them is in contact with the upper surface of the cover 83, and is provided at a position in contact with the upper surface area of the cover 83 in the state of contact, The position is directly above an area where at least the holding portion 91 is provided. Here, as shown in FIG. 2, a cover-side rib 57 is provided at a position in contact with the upper surface area of the cover 83 directly above the area where the holding portion 91 is provided. Further, the cover-side rib 57 is provided at a position where the extending direction (longitudinal direction) of the lid-side rib 57 coincides with the extending direction of the holding portion 91.

因此,與上部側肋17同樣地,藉由蓋側肋57按壓保持部91,可優先保護保持部91。Therefore, similarly to the upper-side rib 17, by pressing the holding portion 91 by the cover-side rib 57, the holding portion 91 can be protected with priority.

蓋側肋55與蓋側肋57是以相互交叉的方式設置,藉由蓋側肋55與蓋側肋57,平面形狀成為十字形。The cover-side rib 55 and the cover-side rib 57 are provided so as to cross each other, and the planar shape becomes a cross shape by the cover-side rib 55 and the cover-side rib 57.

藉由是十字形,即便中部緩衝材5的平面上的設置角度偏移90°,亦於可按壓保持部91的位置上坐落有蓋側肋55、蓋側肋57中的任一者。With the cross shape, even if the setting angle on the plane of the middle cushioning material 5 is shifted by 90 °, any one of the lid-side rib 55 and the lid-side rib 57 is located at a position where the holding portion 91 can be pressed.

蓋側孔59是設置於蓋側肋55、蓋側肋57的十字的交叉部的貫通孔,亦用於代替從收納容器7中拆卸中部緩衝材5時的把手。The cover-side hole 59 is a through hole provided at the intersection of the cross of the cover-side rib 55 and the cover-side rib 57, and is also used in place of a handle when the middle buffer material 5 is removed from the storage container 7.

蓋側增強肋61是為了將中部蓋收納部53A、中部蓋收納部53B、中部蓋收納部53C的鄰接的側面連結而設置的L字型的肋,對中部蓋收納部53A、中部蓋收納部53B、中部蓋收納部53C的側面進行增強。The cover-side reinforcing rib 61 is an L-shaped rib provided to connect the adjacent side surfaces of the middle cover storage portion 53A, the middle cover storage portion 53B, and the middle cover storage portion 53C, and the center cover storage portion 53A and the middle cover storage portion 53B, the side of the middle lid storage portion 53C is reinforced.

中部緩衝材本體51於上表面具有中部底面收納部71A、中部底面收納部71B、中部底面收納部71C。The middle buffer material body 51 has a middle bottom surface storage portion 71A, a middle bottom surface storage portion 71B, and a middle bottom surface storage portion 71C on the upper surface.

中部底面收納部71A、中部底面收納部71B、中部底面收納部71C是嵌入收納容器7的下端而得到保持的形狀的凹部。此處,是平面形狀為矩形的凹部。中部底面收納部71A、中部底面收納部71B、中部底面收納部71C包括底面對向面73、底面側肋75。The middle bottom surface storage portion 71A, the middle bottom surface storage portion 71B, and the middle bottom surface storage portion 71C are recessed portions of a shape that is fitted into and held by the lower end of the storage container 7. Here, it is a recessed part whose planar shape is rectangular. The middle bottom surface storage portion 71A, the middle bottom surface storage portion 71B, and the middle bottom surface storage portion 71C include a bottom surface facing surface 73 and a bottom surface side rib 75.

底面對向面73是與腳部87分離而與收納容器7的底面86對向的面,為中部底面收納部71A、中部底面收納部71B、中部底面收納部71C的底面。The bottom surface facing surface 73 is a surface separated from the leg portion 87 and opposed to the bottom surface 86 of the storage container 7, and is a bottom surface of the middle bottom surface storage portion 71A, the middle bottom surface storage portion 71B, and the middle bottom surface storage portion 71C.

底面側肋75是從中部底面收納部71A、中部底面收納部71B、中部底面收納部71C突出的肋,如圖2及圖3所示,設置在與收納容器7的底面86接觸的位置。The bottom side ribs 75 are ribs protruding from the middle bottom surface storage portion 71A, the middle bottom surface storage portion 71B, and the middle bottom surface storage portion 71C, and are provided at positions contacting the bottom surface 86 of the storage container 7 as shown in FIGS. 2 and 3.

底面對向面73由於與腳部87分離,故而如圖2及圖3所示,底面側肋75的高度H2是在與收納容器7的底面86接觸的狀態下,腳部87與底面對向面73分離的高度。Since the bottom surface facing surface 73 is separated from the leg portion 87, as shown in FIGS. 2 and 3, the height H2 of the bottom surface side rib 75 is in a state in which the leg portion 87 and the bottom surface are in contact with the bottom surface 86 of the storage container 7. The height at which the facing surface 73 is separated.

因此,可防止腳部87接觸底面對向面73而使收納容器7的底面86從下部側肋35上浮起,可確實地保護收納容器7的底面86。Therefore, the bottom portion 86 of the storage container 7 can be prevented from floating from the lower side rib 35 by contacting the bottom portion 87 with the bottom portion 87 and the bottom portion 86 of the storage container 7 can be reliably protected.

以上為中部緩衝材5的結構的說明。The above is the description of the structure of the middle buffer material 5.

繼而,對構成緩衝材100的材料進行說明。Next, a material constituting the buffer material 100 will be described.

緩衝材100需要可耐受來自外部的衝擊而不會破損的硬度、以及可吸收衝擊而不會使衝擊傳遞至收納容器7的程度的柔軟度。滿足如上所述的必要條件的材料較佳為發泡倍率為20倍以上、40倍以下的發泡體。The shock absorbing material 100 needs to have hardness that can withstand external impact without being damaged, and flexibility that can absorb the impact without transmitting the impact to the storage container 7. The material satisfying the above-mentioned necessary conditions is preferably a foam having a foaming ratio of 20 times or more and 40 times or less.

具體的發泡體可列舉:發泡聚胺基甲酸酯、發泡聚乙烯、發泡聚丙烯、或者發泡聚苯乙烯。Specific examples of the foam include expanded polyurethane, expanded polyethylene, expanded polypropylene, and expanded polystyrene.

以上為構成緩衝材100的材料的說明。The above is a description of the materials constituting the buffer material 100.

繼而,參照圖2及圖3,對振動吸收材9的結構進行說明。Next, the configuration of the vibration absorbing material 9 will be described with reference to FIGS. 2 and 3.

振動吸收材9是於將收納容器7由緩衝材100來捆包的狀態下,吸收當放置於地板上時所產生的振動的構件,包括板材9A、板材9B、以及彈性體9C。The vibration absorbing material 9 includes a plate member 9A, a plate member 9B, and an elastic body 9C while absorbing the vibration generated when the storage container 7 is packed with the buffer material 100 when the storage container 7 is packed.

板材9A、板材9B是相互對向而設置,且分別與緩衝材及地板接觸的構件。板材9A、板材9B例如包括塑膠板。The plate materials 9A and 9B are members that are provided facing each other and are in contact with the buffer material and the floor, respectively. The plates 9A and 9B include, for example, a plastic plate.

彈性體9C是藉由隨著振動進行彈性變形來吸收振動的構件,是以夾持於板材9A、板材9B中的方式來設置。彈性體9C例如包括聚胺基甲酸酯、合成橡膠、聚乙烯。The elastic body 9C is a member that absorbs vibration by being elastically deformed in response to the vibration, and is provided so as to be sandwiched between the plate materials 9A and 9B. The elastomer 9C includes, for example, polyurethane, synthetic rubber, and polyethylene.

以上為振動吸收材9的結構的說明。This concludes the description of the structure of the vibration absorbing material 9.

以上為本實施形態的緩衝材100、以及收納容器7的構成的詳情的說明。The above is the description of the details of the configuration of the buffer material 100 and the storage container 7 according to this embodiment.

如上所述,依據本實施形態,緩衝材100具有上部緩衝材1,上部緩衝材1包括上部側肋17,其與蓋83接觸,且於接觸的狀態下設置在與蓋83的上表面區域接觸的位置,所述位置位於至少設置有保持部91的區域的正上方。As described above, according to the present embodiment, the cushioning material 100 has the upper cushioning material 1, and the upper cushioning material 1 includes the upper side ribs 17, which are in contact with the cover 83, and are provided in contact with the upper surface area of the cover 83 in a state of contact. At a position directly above an area where at least the holding portion 91 is provided.

因此,若將上部緩衝材1設置於收納容器7中,則上部側肋17可按壓保持部91,可於衝擊時優先保護使半導體晶圓200變形・損傷的可能性高的保持部91。Therefore, if the upper buffer material 1 is provided in the storage container 7, the upper side rib 17 can press the holding portion 91, and the holding portion 91 that has a high possibility of deforming or damaging the semiconductor wafer 200 during impact can be preferentially protected.

依據本實施形態,由於上部側肋15、上部側肋17的平面形狀為十字形,故而即便相對於收納容器7,上部緩衝材1的平面上的設置角度偏移90°,亦於可按壓保持部91的位置上坐落有上部側肋15、上部側肋17的中任一者。According to this embodiment, since the planar shapes of the upper side rib 15 and the upper side rib 17 are cross-shaped, even if the installation angle on the plane of the upper buffer material 1 is shifted by 90 ° with respect to the storage container 7, it can be pressed and held. One of the upper side rib 15 and the upper side rib 17 is located at the position of the portion 91.

因此,可提高設置上部緩衝材1時的位置的自由度,作業效率優異。Therefore, the degree of freedom in the position when the upper buffer material 1 is installed can be improved, and the work efficiency is excellent.

依據本實施形態,由於在上部側肋15、上部側肋17的交叉部設置有上部側孔19,故而於上部緩衝材1與收納容器7接觸的狀態下亦可從上部側孔19中辨認出收納容器7。According to this embodiment, since the upper side hole 19 is provided at the intersection of the upper side rib 15 and the upper side rib 17, the upper side hole 19 can be recognized from the upper side hole 19 even when the upper cushioning material 1 is in contact with the storage container 7. Storage container 7.

因此,可容易地確認上部緩衝材1是否確實地保持於收納容器7中。另外,當從收納容器7中拆卸上部緩衝材1時,藉由代替把手而握住上部側孔19的內周,容易從收納容器7中拆卸上部緩衝材1,因此作業效率優異。Therefore, it can be easily confirmed whether the upper buffer material 1 is reliably held in the storage container 7. In addition, when the upper cushioning material 1 is detached from the storage container 7, the upper cushioning material 1 is easily removed from the storage container 7 by holding the inner periphery of the upper side hole 19 instead of a handle, and thus has excellent work efficiency.

依據本實施形態,緩衝材100具有下部緩衝材3,下部緩衝材3包括:與腳部87分離而與收納容器7的底面86對向的下部對向面33、以及與收納容器7的底面86接觸的下部側肋35。According to this embodiment, the cushioning material 100 includes a lower cushioning material 3, and the lower cushioning material 3 includes a lower facing surface 33 separated from the leg portion 87 and opposed to the bottom surface 86 of the storage container 7, and a bottom surface 86 of the storage container 7. The lower side ribs 35 in contact.

因此,可防止腳部87接觸下部對向面33而使收納容器7的底面86從下部側肋35上浮起,可確實地保護收納容器7的底面86。Therefore, it is possible to prevent the bottom portion 86 of the storage container 7 from floating from the lower side rib 35 by preventing the leg portion 87 from contacting the lower facing surface 33, and to securely protect the bottom surface 86 of the storage container 7.

依據本實施形態,緩衝材100具有中部緩衝材5,中部緩衝材5包括蓋側肋57,其與蓋83接觸,且於接觸的狀態下設置在與蓋83的上表面區域接觸的位置,所述位置位於至少設置有保持部91的區域的正上方。According to this embodiment, the cushioning material 100 has a middle cushioning material 5, and the middle cushioning material 5 includes a cover-side rib 57 which is in contact with the cover 83 and is provided at a position in contact with the upper surface area of the cover 83 in a state of contact. The position is directly above an area where at least the holding portion 91 is provided.

因此,若將中部緩衝材5設置於收納容器7中,則蓋側肋57可按壓保持部91,可於衝擊時優先保護使半導體晶圓200變形・損傷的可能性高的保持部91。Therefore, if the middle buffer material 5 is provided in the storage container 7, the lid-side rib 57 can press the holding portion 91, and can preferentially protect the holding portion 91 that is likely to deform or damage the semiconductor wafer 200 during impact.

另外,中部緩衝材5包括:與腳部87分離而與收納容器7的底面86對向的底面對向面73、以及與收納容器7的底面86接觸的底面側肋75。The middle cushioning material 5 includes a bottom surface facing surface 73 that is separated from the leg portion 87 and faces the bottom surface 86 of the storage container 7, and a bottom surface side rib 75 that is in contact with the bottom surface 86 of the storage container 7.

因此,可防止腳部87接觸底面對向面73而使收納容器7的底面86從底面側肋75上浮起,可確實地保護收納容器7的底面86。Therefore, it is possible to prevent the bottom portion 86 of the storage container 7 from being lifted from the bottom surface side ribs 75 by contacting the bottom portion 87 with the bottom surface facing surface 73, and to reliably protect the bottom surface 86 of the storage container 7.

進而,中部緩衝材5由於包括蓋側肋55、蓋側肋57與底面側肋75此兩者,故而可設置於收納容器7的上表面,亦可設置於底面。Furthermore, since the middle buffer material 5 includes both the lid-side rib 55, the lid-side rib 57 and the bottom-surface side rib 75, it can be provided on the upper surface of the storage container 7 or on the bottom surface.

因此,中部緩衝材5亦可作為上部緩衝材1或下部緩衝材3來使用。另外,可將收納容器7於高度方向上多層地收納。Therefore, the middle buffer material 5 can also be used as the upper buffer material 1 or the lower buffer material 3. The storage container 7 can be stored in multiple layers in the height direction.

依據本實施形態,緩衝材100包含發泡倍率為20倍以上、40倍以下的發泡體。因此,能夠兼顧可耐受來自外部的衝擊的硬度、以及吸收衝擊的柔軟度。According to this embodiment, the cushioning material 100 includes a foam having a foaming ratio of 20 times or more and 40 times or less. Therefore, it is possible to achieve both a hardness capable of withstanding an external impact and a softness capable of absorbing the impact.

依據本實施形態,緩衝材100包含發泡聚胺基甲酸酯、發泡聚乙烯、發泡聚丙烯、或者發泡聚苯乙烯中的任一者。According to this embodiment, the buffer material 100 includes any one of expanded polyurethane, expanded polyethylene, expanded polypropylene, or expanded polystyrene.

因此,容易將緩衝材100形成為發泡倍率為20倍以上、40倍以下的發泡體。Therefore, it is easy to form the buffer material 100 into a foam having a foaming ratio of 20 times or more and 40 times or less.

依據本實施形態,緩衝材100中,上部收納部13A、上部收納部13B、上部收納部13C、下部收納部31A、下部收納部31B、下部收納部31C、中部蓋收納部53A、中部蓋收納部53B、中部蓋收納部53C、中部底面收納部71A、中部底面收納部71B、中部底面收納部71C排列有多組。此處排列有3組。According to this embodiment, in the cushioning material 100, the upper storage portion 13A, the upper storage portion 13B, the upper storage portion 13C, the lower storage portion 31A, the lower storage portion 31B, the lower storage portion 31C, the middle cover storage portion 53A, and the middle cover storage portion 53B, the middle lid storage portion 53C, the middle bottom surface storage portion 71A, the middle bottom surface storage portion 71B, and the middle bottom surface storage portion 71C are arranged in a plurality of groups. There are 3 groups arranged here.

因此,可由1組的上部緩衝材1、下部緩衝材3、中部緩衝材5來保護4個以上(此處為6個)的收納容器7,故而運輸或捆包時的作業效率優異。Therefore, one or more sets of the upper buffer material 1, the lower buffer material 3, and the middle buffer material 5 can protect four or more storage containers 7 (here, six), so the work efficiency during transportation or packing is excellent.

以上,已基於實施形態對本發明進行了說明,但本發明並不限定於所述的實施形態。對於本領域技術人員而言,當然會於本發明的思想的範圍內想到各種變形例及改良例,該些亦包含於本發明的範圍內。As mentioned above, although this invention was demonstrated based on embodiment, this invention is not limited to the said embodiment. It will be apparent to those skilled in the art that various modifications and improvements can be made within the scope of the idea of the present invention, and these are also included in the scope of the present invention.

100‧‧‧緩衝材100‧‧‧ buffer material

200‧‧‧半導體晶圓200‧‧‧Semiconductor wafer

1‧‧‧上部緩衝材1‧‧‧ Upper buffer

3‧‧‧下部緩衝材3‧‧‧ Lower cushioning material

5‧‧‧中部緩衝材5‧‧‧ Central buffer material

7‧‧‧收納容器7‧‧‧Storage Container

9‧‧‧振動吸收材9‧‧‧Vibration absorbing material

9A、9B‧‧‧板材9A, 9B‧‧‧ Plate

9C‧‧‧彈性體9C‧‧‧Elastomer

13A、13B、13C‧‧‧上部收納部13A, 13B, 13C‧‧‧ Upper storage section

14‧‧‧上部對向面14‧‧‧ Opposite the upper part

15、17‧‧‧上部側肋15, 17‧‧‧ upper side ribs

19‧‧‧上部側孔19‧‧‧ Upper side hole

21‧‧‧增強肋21‧‧‧ Reinforcement rib

31A、31B、31C‧‧‧下部收納部31A, 31B, 31C‧‧‧ Lower storage section

33‧‧‧下部對向面33‧‧‧ Opposite the lower part

35‧‧‧下部側肋35‧‧‧Lower side rib

37‧‧‧下部側孔37‧‧‧Lower side hole

51‧‧‧中部緩衝材本體51‧‧‧Central buffer material body

53A、53B、53C‧‧‧中部蓋收納部53A, 53B, 53C‧‧‧Middle lid storage section

54‧‧‧蓋對向面54‧‧‧ opposite

55、57‧‧‧蓋側肋55, 57‧‧‧ cover side ribs

59‧‧‧蓋側孔59‧‧‧ cover side hole

61‧‧‧蓋側增強肋61‧‧‧Cap side reinforcement ribs

71A、71B、71C‧‧‧中部底面收納部71A, 71B, 71C ‧‧‧ Central bottom storage section

73‧‧‧底面對向面73‧‧‧ bottom to face

75‧‧‧底面側肋75‧‧‧ bottom ribs

81‧‧‧本體81‧‧‧ Ontology

81A‧‧‧凹部81A‧‧‧Concave

83‧‧‧蓋83‧‧‧ cover

85‧‧‧晶圓收納部85‧‧‧ Wafer storage

85A‧‧‧側部收納部85A‧‧‧Side Storage

85B‧‧‧底部收納部85B‧‧‧ bottom storage

86‧‧‧底面86‧‧‧ underside

87‧‧‧腳部87‧‧‧foot

89‧‧‧鎖部89‧‧‧Lock

89A、89B‧‧‧鎖棒89A, 89B‧‧‧Locking stick

89C‧‧‧鎖桿89C‧‧‧Locking lever

91‧‧‧保持部91‧‧‧holding department

D1、D2‧‧‧方向D1, D2‧‧‧ direction

H1、H2‧‧‧高度H1, H2‧‧‧ height

圖1為表示將緩衝體設置於收納容器中的狀態的立體圖。 FIG. 1 is a perspective view showing a state where a buffer body is set in a storage container.

圖2為圖1的A1-A1剖面圖。 FIG. 2 is a cross-sectional view taken along A1-A1 of FIG. 1.

圖3為圖1的A2-A2剖面圖的一部分,收納容器是以側面圖來表示。 FIG. 3 is a part of the A2-A2 sectional view of FIG. 1, and the storage container is shown in a side view.

圖4為收納容器的立體圖。 FIG. 4 is a perspective view of a storage container.

圖5A為收納容器的俯視圖。 5A is a plan view of a storage container.

圖5B為蓋的背面圖。 Fig. 5B is a rear view of the cover.

圖6A為從底面側觀察上部緩衝體的立體圖。 FIG. 6A is a perspective view of the upper buffer body as viewed from the bottom surface side. FIG.

圖6B為上部緩衝體的仰視圖。 FIG. 6B is a bottom view of the upper buffer body.

圖6C為表示上部緩衝體的圖,是圖6B的A3-A3剖面圖。 FIG. 6C is a view showing an upper buffer body, and is a cross-sectional view taken along A3-A3 of FIG. 6B.

圖7A為下部緩衝體的立體圖。 FIG. 7A is a perspective view of a lower buffer body. FIG.

圖7B為下部緩衝體的俯視圖。 FIG. 7B is a plan view of the lower buffer body.

圖7C為表示下部緩衝體的圖,是圖7B的A4-A4剖面圖。 FIG. 7C is a view showing a lower buffer, and is a cross-sectional view taken along A4-A4 of FIG. 7B.

圖8A為中部緩衝體的立體圖。 FIG. 8A is a perspective view of a middle buffer body. FIG.

圖8B為中部緩衝體的仰視圖。 FIG. 8B is a bottom view of the middle buffer body.

圖9A為中部緩衝體的俯視圖。 FIG. 9A is a plan view of a middle buffer body. FIG.

圖9B為表示中部緩衝體的圖,是圖9A的A5-A5剖面圖。 FIG. 9B is a view showing a middle buffer, and is a cross-sectional view taken along A5-A5 of FIG. 9A.

Claims (8)

一種緩衝材,其於將收納半導體晶圓的收納容器捆包於捆包箱中時,配置於所述收納容器與所述捆包箱之間,所述緩衝材的特徵在於:所述收納容器包括:上表面開放的箱型的本體;遮蓋所述上表面的蓋;以及保持部,設置於所述蓋的背面側,與容納於所述本體內的所述半導體晶圓的上部周緣抵接來限制所述半導體晶圓的移動;所述緩衝材具有包括與所述蓋的上表面接觸的上部收納部的上部緩衝材;所述上部收納部包括:與所述蓋的上表面分離而對向的上部對向面、以及從所述上部對向面上突出且與所述蓋的上表面接觸的上部側肋;所述上部側肋設置在與所述蓋的上表面區域接觸的位置,所述位置位於至少設置有所述保持部的區域的正上方;並且所述上部側肋的平面形狀為十字形。 A buffer material is arranged between the storage container and the packing box when a storage container containing semiconductor wafers is packed in a packing box, and the buffer material is characterized in that: the storage container It includes: a box-shaped body with an open upper surface; a cover covering the upper surface; and a holding portion provided on a back side of the cover and abutting an upper peripheral edge of the semiconductor wafer accommodated in the body. To limit the movement of the semiconductor wafer; the buffer material has an upper buffer material including an upper storage portion in contact with the upper surface of the cover; the upper storage portion includes: An upper facing surface facing upward, and an upper side rib protruding from the upper facing surface and contacting the upper surface of the cover; the upper side rib is provided at a position in contact with the upper surface area of the cover, The position is directly above an area where at least the holding portion is provided; and a planar shape of the upper side rib is a cross shape. 如申請專利範圍第1項所述的緩衝材,其中所述上部側肋於十字的交叉部設置有上部側孔。 The cushioning material according to item 1 of the scope of patent application, wherein the upper side rib is provided with an upper side hole at the intersection of the cross. 如申請專利範圍第1項所述的緩衝材,其中所述收納容器包括以從底面突出的方式設置於所述底面上的至少一對腳部,所述緩衝材具有包括與所述底面接觸的下部收納部的下部緩 衝材,並且所述下部收納部包括:與所述腳部分離而與所述收納容器的所述底面對向的下部對向面、以及從所述下部對向面突出且與所述收納容器的所述底面接觸的下部側肋。 The cushioning material according to item 1 of the scope of patent application, wherein the storage container includes at least a pair of feet provided on the bottom surface in a manner protruding from the bottom surface, and the cushioning material includes a material including contact with the bottom surface. Lower part of lower storage section Punching material, and the lower storage portion includes a lower facing surface separated from the leg portion and facing the bottom surface of the storage container, and a lower facing surface protruding from the lower facing surface and facing the storage A lower side rib that the bottom surface of the container contacts. 如申請專利範圍第3項所述的緩衝材,其中所述緩衝材具有與所述蓋及所述底面接觸的中部緩衝材;所述中部緩衝材包括:板狀的中部緩衝材本體;中部蓋收納部,具有:設置於所述中部緩衝材本體的底面且與所述蓋的上表面分離而對向的蓋對向面、及從所述蓋對向面突出且與所述蓋的上表面接觸的蓋側肋;以及中部底面收納部,具有:設置於所述中部緩衝材本體的上表面且與所述腳部分離而與所述收納容器的所述底面對向的底面對向面、及從所述底面對向面突出且與所述收納容器的所述底面接觸的底面側肋;並且所述蓋側肋設置在與所述蓋的上表面區域接觸的位置,所述位置位於至少設置有所述保持部的區域的正上方。 The buffer material according to item 3 of the patent application scope, wherein the buffer material has a middle buffer material in contact with the cover and the bottom surface; the middle buffer material includes: a plate-shaped middle buffer material body; a middle cover The accommodating portion includes a cover facing surface which is provided on the bottom surface of the middle buffer material body and is separated from the upper surface of the cover, and which faces the cover, and an upper surface which protrudes from the cover facing surface and is opposite to the cover. A lid side rib in contact; and a middle bottom storage portion having a bottom surface provided on an upper surface of the middle cushion material body and separated from the leg portion to face the bottom surface of the storage container A bottom surface side rib protruding from the bottom surface to the surface and contacting the bottom surface of the storage container; and the cover side rib is provided at a position in contact with an upper surface area of the lid, the The position is directly above an area where at least the holding portion is provided. 如申請專利範圍第4項所述的緩衝材,其中所述上部收納部、所述下部收納部、所述中部蓋收納部、所述中部底面收納部排列有多組。 The buffer material according to item 4 of the scope of patent application, wherein the upper storage portion, the lower storage portion, the middle cover storage portion, and the middle bottom storage portion are arranged in a plurality of groups. 如申請專利範圍第1項至第5項中任一項所述的緩衝材,其包含發泡倍率為20倍以上、40倍以下的發泡體。 The cushioning material according to any one of claims 1 to 5 of the scope of patent application, which comprises a foam having a foaming magnification of 20 times or more and 40 times or less. 如申請專利範圍第1項至第5項中任一項所述的緩衝 材,其包含發泡聚胺基甲酸酯、發泡聚乙烯、發泡聚丙烯、或者發泡聚苯乙烯中的任一者。 Buffering as described in any of claims 1 to 5 Material including any one of expanded polyurethane, expanded polyethylene, expanded polypropylene, or expanded polystyrene. 一種緩衝材,其於將收納半導體晶圓的收納容器捆包於捆包箱中時,配置於所述收納容器與所述捆包箱之間,所述緩衝材的特徵在於:所述收納容器包括:上表面開放的箱型的本體;遮蓋所述上表面的蓋;保持部,設置於所述蓋的背面側,與容納於所述本體內的所述半導體晶圓的上部周緣抵接來限制所述半導體晶圓的移動;以及以從底面突出的方式設置於所述底面的端部的至少一對腳部;所述緩衝材具有與所述蓋的上表面及所述收納容器的所述底面接觸的中部緩衝材;所述中部緩衝材包括:板狀的中部緩衝材本體;中部蓋收納部,具有:設置於所述中部緩衝材本體的底面且與所述蓋的上表面分離而對向的蓋對向面、及從所述蓋對向面突出且與所述蓋的上表面接觸的蓋側肋;中部底面收納部,具有:設置於所述中部緩衝材本體的上表面且與所述腳部分離而與所述收納容器的所述底面對向的底面對向面、及從所述底面對向面突出且與所述收納容器的所述底面接觸的底面側肋;並且所述蓋側肋設置在與所述蓋的上表面區域接觸的位置,所述 位置位於至少設置有所述保持部的區域的正上方。 A buffer material is arranged between the storage container and the packing box when a storage container containing semiconductor wafers is packed in a packing box, and the buffer material is characterized in that: the storage container It includes: a box-shaped body with an open upper surface; a cover covering the upper surface; a holding portion provided on a back side of the cover and abutting on an upper peripheral edge of the semiconductor wafer accommodated in the main body; Restricting movement of the semiconductor wafer; and at least a pair of leg portions provided at ends of the bottom surface so as to protrude from the bottom surface; the buffer material has a space between the upper surface of the lid and the storage container. The middle buffer material in contact with the bottom surface; the middle buffer material includes: a plate-shaped middle buffer material body; a middle cover accommodating portion having: a bottom surface of the middle buffer material body provided on the bottom surface of the middle buffer material and separated from the upper surface of the cover; An opposite cover facing surface, and a cover-side rib protruding from the cover facing surface and in contact with the upper surface of the cover; a middle bottom surface storage portion is provided on the upper surface of the middle buffer material body and With the feet A bottom surface facing away from the bottom surface facing the bottom surface of the storage container, and a bottom surface side rib protruding from the bottom surface facing the surface and contacting the bottom surface of the storage container; and A cover side rib is provided at a position in contact with an upper surface area of the cover, and the cover The position is directly above an area where at least the holding portion is provided.
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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7263752B2 (en) * 2018-12-11 2023-04-25 三菱電機株式会社 packing equipment
JP2023162706A (en) * 2022-04-27 2023-11-09 株式会社Sumco Packaging unit and shipping container

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003072460A1 (en) * 2002-02-26 2003-09-04 Entegris, Inc. Wafer container cushion system
TWM488102U (en) * 2014-06-12 2014-10-11 Yeuh Tai Ind Co Ltd Combination of wafer cassette buffer body structure
CN104471696A (en) * 2012-05-04 2015-03-25 安格斯公司 Wafer container with door mounted shipping cushions
TWI498261B (en) * 2011-07-11 2015-09-01 Toshiba Kk Wafer transfer container protection box
TWI554455B (en) * 2010-03-11 2016-10-21 恩特葛瑞斯股份有限公司 Wafer shipper

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5946880U (en) * 1982-09-21 1984-03-28 積水化成品工業株式会社 Cushioning packaging materials for automobile heater units, etc.
JPS60110676A (en) * 1983-11-09 1985-06-17 株式会社日立製作所 Cushioning material for packaging braun tube
JP3556185B2 (en) * 2000-06-13 2004-08-18 信越ポリマー株式会社 Seal member, sealed container and sealing method thereof
JP4193472B2 (en) * 2002-11-15 2008-12-10 株式会社カネカ Wafer container buffer
JP4827500B2 (en) * 2005-11-16 2011-11-30 信越ポリマー株式会社 Package
JP5165623B2 (en) * 2009-03-10 2013-03-21 積水化成品工業株式会社 Buffer packaging material
JP5503258B2 (en) * 2009-11-13 2014-05-28 積水化成品工業株式会社 Package and its assembly method
JP6119287B2 (en) * 2013-02-14 2017-04-26 株式会社Sumco Buffer material for packing wafer storage containers

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003072460A1 (en) * 2002-02-26 2003-09-04 Entegris, Inc. Wafer container cushion system
TWI554455B (en) * 2010-03-11 2016-10-21 恩特葛瑞斯股份有限公司 Wafer shipper
TWI498261B (en) * 2011-07-11 2015-09-01 Toshiba Kk Wafer transfer container protection box
CN104471696A (en) * 2012-05-04 2015-03-25 安格斯公司 Wafer container with door mounted shipping cushions
TWM488102U (en) * 2014-06-12 2014-10-11 Yeuh Tai Ind Co Ltd Combination of wafer cassette buffer body structure

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