TWI668456B - Display panel, testing device and testing method - Google Patents

Abstract

A display panel includes an active area and a test circuit. The test circuit is electrically connected to the active area. The test circuit includes a first main switch, a first test pad, a second test pad, and a first operation pad. The first test pad is electrically connected to the first end of the first main switch. The second test pad is electrically connected to the second end of the first main switch. The first operation pad is electrically connected to the control terminal of the first main switch.

Description

   Display panel, test device and test method   

This case relates to an electronic device and method. Specifically, this case relates to a display panel, a test device, and a test method.

With the development of technology, display panels have been widely used in people's lives.

The display panel needs to be tested before leaving the factory. Generally speaking, a test device can provide a test signal to a display panel using a probe for testing. However, poor contact between the probe and the display panel can easily cause misjudgment. Therefore, new test methods should be proposed.

An embodiment of the present invention relates to a display panel. According to an embodiment of the present invention, the display panel includes an active area and a test circuit. The test circuit is electrically connected to the active area. The test circuit includes a first main switch, a first test pad, a second test pad, and a first operation pad. The first test pad is electrically connected to the first end of the first main switch. The second test pad is electrically connected to the second end of the first main switch. The first operation pad is electrically connected to the control terminal of the first main switch.

Another aspect of the present invention relates to a test device. According to an embodiment of the present invention, the test device includes a voltage providing circuit, a feedback comparison circuit, and an alarm system. The voltage supply circuit is used to provide a test voltage to the first test pad of the display panel, wherein the first test pad is electrically connected to the second test pad through the first main switch. The feedback comparison circuit is electrically connected to the voltage supply circuit for receiving the test voltage from the voltage supply circuit, detecting the detection test voltage on the second test pad, and comparing the test voltage with the detection test voltage. The alarm system is electrically connected with a feedback comparison circuit, and is used for providing a first alarm when the test voltage and the detected test voltage are different.

Another aspect of this case involves a test method. According to an embodiment of the present invention, the test method includes: providing a test voltage to a first test pad of the display panel, wherein the first test pad is electrically connected to the second test pad through the first main switch; and a detection test on the second test pad Voltage; comparing the test voltage with the detection test voltage; and providing a first alarm if the test voltage and the detection test voltage are different.

By applying the above embodiment, it can be quickly judged whether the line between the test device and the display panel is abnormal (such as poor contact or abnormal connection, etc.).

10‧‧‧test system

100‧‧‧ display panel

110‧‧‧active zone

120‧‧‧test circuit

200‧‧‧test device

210‧‧‧Voltage supply circuit

220‧‧‧Feedback comparison circuit

230‧‧‧Alarm system

PO, PO1, PO2 ‧‧‧ operation pad

P1‧‧‧test pad

P2‧‧‧test pad

PR‧‧‧Test Pad

PG‧‧‧Test Pad

PB‧‧‧Test Pad

PM‧‧‧Test Pad

PD‧‧‧Test Pad

PE‧‧‧Test Pad

TR‧‧‧Switch

TR0-TR4‧‧‧Switch

OT1-OT2‧‧‧Switch

GO‧‧‧Voltage supply sub-circuit

GR‧‧‧ voltage supply sub-circuit

GB‧‧‧ voltage supply sub-circuit

GD‧‧‧Voltage supply sub-circuit

GT‧‧‧ voltage supply sub-circuit

GE‧‧‧ Voltage Supply Sub-Circuit

GO1‧‧‧ voltage supply sub-circuit

GO2‧‧‧ Voltage Supply Sub-Circuit

222‧‧‧ Comparator

224‧‧‧ Comparator

226‧‧‧ Comparator

228‧‧‧ Comparator

DL‧‧‧Data Line

GL‧‧‧Gate line

VCOM‧‧‧Common electrode

XR‧‧‧Pixel Circuit

XG‧‧‧Pixel Circuit

XB‧‧‧Pixel Circuit

CMP1-CMP4‧‧‧Comparative signal

VGH‧‧‧High Voltage Level

VGL‧‧‧High Voltage Level

During PRD1, PRD2 ‧‧‧

300‧‧‧ Method

S1-S4‧‧‧ Operation

FIG. 1 is a schematic diagram of a test system according to an embodiment of the case; FIG. 2 is a schematic diagram of a test system according to an embodiment of the case; and FIG. 3 is a schematic diagram of a test system according to another embodiment of the case. A schematic diagram of a test system; FIG. 4 is a schematic diagram of a test system according to another embodiment of the present case; FIG. 5 is a voltage change diagram of different periods according to an embodiment of the present case; and FIG. 6 is based on A flowchart of a test method according to an embodiment of the present invention.

The following will clearly illustrate the spirit of the present disclosure with diagrams and detailed descriptions. Any person with ordinary knowledge in the technical field who understands the embodiments of the present disclosure can be changed and modified by the techniques taught in the present disclosure. It does not depart from the spirit and scope of this disclosure.

Regarding the "first", "second", ..., etc. used herein, they do not specifically mean the order or order, nor are they used to limit the present invention. They are only used to distinguish elements described in the same technical terms or operating.

As used herein, "electrical connection" may refer to two or more components directly making physical or electrical contact with each other, or indirectly making physical or electrical contact with each other, and "electrical connection" may also refer to two or Multiple elements operate or act on each other.

The terms "including", "including", "having", "containing" and the like used in this article are all open-ended terms, which means including but not limited to.

As used herein, "and / or" includes any or all combinations of the things described.

Regarding the directional terms used in this article, such as: up, down, left, right, front or back, etc., are only directions referring to the attached drawings. Therefore, the directional terms used are used to illustrate and not to limit the case.

Regarding the terms used in this article, unless otherwise specified, each term usually has the ordinary meaning of being used in this field, the content disclosed here, and the special content. Certain terms used to describe this disclosure are discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art on the description of this disclosure.

FIG. 1 is a schematic diagram of a test system 10 according to an embodiment of the present invention. In this embodiment, the test system 10 includes a display panel 100 and a test device 200.

In this embodiment, the display panel 100 includes an active area 110 and a test circuit 120. The test circuit 120 is electrically connected to the active area 110 (such as a pixel circuit in the active area). The test circuit 120 includes a switch TR, a test pad P1, a test pad P2, and an operation pad PO. The test pad P1 is electrically connected to the first end of the switch TR. The test pad P2 is electrically connected to the second end of the switch TR. The operation pad PO is electrically connected to the control terminal of the switch TR. The test pads P1 and P2 are electrically connected to the active area 110 (such as a pixel circuit in the active area).

In this embodiment, the operation pad PO is used to receive an operation voltage from the test device 200, and the switch TR is turned on according to the operation voltage (for example, having a high voltage level). In this embodiment, the test pad P1 is used to receive a test voltage (eg, having a high voltage level) from the test device 200. When the switch TR is turned on, the test pad P1 can provide a test voltage to the test pad P2.

In this way, the test device 200 can quickly determine the test by detecting the voltage on the test pad P2 (hereinafter referred to as the detection test voltage), and comparing the detection test voltage with the test voltage provided to the test pad P1. Whether the line between the device 200 and the display panel 100 is abnormal (such as poor contact or abnormal connection, etc.). For example, in a case where the test device 200 provides an operating voltage to the operating pad PO and a test voltage to the testing pad P1, when the detected test voltage is different from the test voltage, it is determined that the line is abnormal; when the detected test voltage and the test voltage are detected When they are the same, the line is judged to be normal.

In one embodiment, the test apparatus 200 includes a voltage providing circuit 210, a feedback comparison circuit 220, and an alarm system 230. In one embodiment, the feedback comparison circuit 220 is electrically connected to the voltage providing circuit 210. In one embodiment, the alarm system 230 is electrically connected to the feedback comparison circuit 220.

In one embodiment, the voltage supply circuit 210 is used to generate and provide a test voltage to the test pad P1 and the feedback comparison circuit 220. In one embodiment, the voltage supply circuit 210 is also used to generate and provide an operation voltage to the operation pad PO. In one embodiment, the voltage supply circuit 210 is electrically connected to the test pad P1 and the operation pad PO through a pin contact, for example, but the present invention is not limited thereto.

In one embodiment, the feedback comparison circuit 220 is used to receive the test voltage from the voltage supply circuit 210, detect the detection test voltage on the test pad P2, and compare the test voltage and the detection test voltage. In an embodiment, the feedback comparison circuit 220 is configured to generate and provide a comparison signal to the alarm system 230 according to a comparison result of the test voltage and the detected test voltage. In one embodiment, the feedback comparison circuit 220 is electrically connected to the test pad P2 through a pin contacting the test pad P2, but is not limited thereto.

In one embodiment, the alarm system 230 provides an alarm (such as a red light) based on the comparison signal. In one embodiment, the alarm system 230 may provide an alarm when the test voltage is different from the detected test voltage.

Thereby, it can be quickly judged whether the line between the test device 200 and the display panel 100 is abnormal.

In an embodiment of the present case, before performing a function test (such as a lighting test) of the display panel 100, the test device 200 may first provide an operating voltage (such as providing a high voltage level) to the operation pad PO to check whether the line is abnormal. test.

If the alarm system 230 does not provide an alarm, it means that the line between the testing device 200 and the display panel 100 is normal, then the testing device 200 stops supplying the operating voltage (such as providing a low voltage level) to the operating pad PO to turn off the switch TR, and Then, a function test (such as a lighting test) of the display panel 100 is performed.

If the alarm system 230 provides an alarm, it means that the line between the test device 200 and the display panel 100 may be abnormal, and the administrator can perform further debugging.

FIG. 2 is a schematic diagram of a test system 10 according to an embodiment of the present invention.

In this embodiment, the active region 110 is provided with pixel circuits XR, XG, XB arranged in a matrix form, data lines DL parallel to each other, gate lines GL parallel to each other, and a common electrode VCOM. In one embodiment, the pixel circuit XR is, for example, a red pixel circuit, the pixel circuit XG is, for example, a green pixel circuit, and the pixel circuit XB is, for example, a blue pixel circuit, but the present invention is not limited thereto. It should be noted that the number of the pixel circuits XR, XG, XB, the data lines DL, and the gate lines GL can be changed according to actual needs, so this embodiment is not limited to this embodiment.

In this embodiment, the test circuit 120 includes a test pad PR, a test pad PG, a test pad PB, a test pad PM, a test pad PD, a test pad PE, an operation pad PO, a switch TR1, a switch TR2, and a switch TR3.

In this embodiment, the test pad PR is electrically connected to the first end of the switch TR1, and is electrically connected to a row of pixel circuits XR through the data line DL. The test pad PG is electrically connected to the second end of the switch TR1, and is electrically connected to a row of pixel circuits XG through the data line DL. The control terminal of the switch TR1 is electrically connected to the operation pad PO.

In this embodiment, the test pad PB is electrically connected to the first end of the switch TR2, and is electrically connected to a row of pixel circuits XB through the data line DL. The test pad PM is electrically connected to the second end of the switch TR2, and is electrically connected to the common electrode VCOM. The control terminal of the switch TR2 is electrically connected to the operation pad PO.

In this embodiment, the test pad PD is electrically connected to the first end of the switch TR3 and is electrically connected to the odd-numbered column gate lines GL (such as the first and third column gate lines GL). The test pad PE is electrically connected to the second end of the switch TR3, and is electrically connected to the even-numbered gate lines GL (such as the second-row gate lines GL). The control terminal of the switch TR3 is electrically connected to the operation pad PO.

In some aspects, the test pad P1 in the first diagram may be the test pad PR in the second diagram, the test pad P2 in the first diagram may be the test pad PG in the second diagram, and the switch in the first diagram TR may be the switch TR1 in the second figure, and the operation pad PO in the first figure may be the operation pad PO in the second figure.

In other aspects, the test pad P1 in FIG. 1 may be the test pad PB in FIG. 2, and the test pad P2 in FIG. 1 may be the test pad PM in FIG. 2 and the test pad P1 in FIG. 1. The switch TR may be the switch TR2 in the second figure, and the operation pad PO in the first figure may be the operation pad PO in the second figure.

In other aspects, the test pad P1 in Fig. 1 may be the test pad PD in Fig. 2 and the test pad P2 in Fig. 1 may be the test pad PE in Fig. 2 and the test pad P1 in Fig. 1 The switch TR may be the switch TR3 in the second figure, and the operation pad PO in the first figure may be the operation pad PO in the second figure.

That is, with the above settings, the test device 200 can detect the voltages on the test pads PG, PM, and PE (that is, detect the test voltages), and respectively provide the detected test voltages and the test pads PR, PB, and The test voltages of the PDs are compared to quickly determine whether the line between the test device 200 and the display panel 100 is abnormal.

When the test device 200 provides an operating voltage (such as a high voltage level) to the operation pad PO to turn on the switches TR1-TR3, when the test voltage (such as a high voltage level) provided to the test pad PR is different from the self-test pad When the detection test voltage detected on the PG, when the test voltage (such as a high voltage level) provided to the test pad PB is different from the detection test voltage detected on the test pad PM, or / and when provided When the test voltage (such as high voltage level) to the test pad PD is different from the detected test voltage detected on the test pad PE, the test device 200 determines that the line between the test device 200 and the display panel 100 is abnormal. In contrast, when the test voltage supplied to the test pad PR is the same as the detection test voltage detected on the self-test pad PG, the test voltage supplied to the test pad PB is the same as the detection voltage detected on the self-test pad PM. When the test voltage is measured, and when the test voltage provided to the test pad PD is the same as the detected test voltage detected on the self-test pad PE, the test device 200 determines that the line between the test device 200 and the display panel 100 is normal.

In this embodiment, the voltage supply circuit 210 may include a voltage supply sub-circuit GO, a voltage supply sub-circuit GR, a voltage supply sub-circuit GB, and a voltage supply sub-circuit GD. In this embodiment, the feedback comparison circuit 220 includes a comparator 222, a comparator 224, and a comparator 226.

In this embodiment, the voltage providing sub-circuit GO is used to generate and provide an operating voltage to the operating pad PO. In this embodiment, the voltage supply sub-circuit GR is used to generate and provide a test voltage to the test pad PR and the comparator 222. In this embodiment, the voltage supply sub-circuit GB is used to generate and provide a test voltage to the test pad PB and the comparator 224. In this embodiment, the voltage supply sub-circuit GD is used to generate and provide a test voltage to the test pad PD and the comparator 226. In one embodiment, the voltage supply sub-circuits GO, GR, GB, and GD are electrically connected to the operation pads PO, test pads PR, PG, and PB, respectively, by contacting the operation pads PO, test pads PR, PG, and PB through pin headers. Sexual connection, but this case is not limited to this.

In this embodiment, the comparator 222 is configured to receive the test voltage from the voltage supply sub-circuit GR, detect the detection test voltage on the test pad PG, and compare the test voltage from the voltage supply sub-circuit GR with the test pad PG. Detected detection test voltage. Then, the comparator 222 generates and provides a comparison signal CMP1 to the alarm system 230 according to the comparison result.

In this embodiment, the comparator 224 is used to receive the test voltage from the voltage supply sub-circuit GB, detect the detection test voltage on the test pad PM, and compare the test voltage from the voltage supply sub-circuit GB and the test pad PM. Detected detection test voltage. Then, the comparator 224 generates and provides a comparison signal CMP2 to the alarm system 230 according to the comparison result.

In this embodiment, the comparator 226 is configured to receive the test voltage from the voltage supply sub-circuit GD, detect the detection test voltage on the test pad PE, and compare the test voltage from the voltage supply sub-circuit GD with the test pad PE. Detected detection test voltage. Then, the comparator 226 generates and provides a comparison signal CMP3 to the alarm system 230 according to the comparison result.

In one embodiment, the comparators 222, 224, and 226 are electrically connected to the test pads PG, PM, and PE, respectively, by contacting the test pads PG, PM, and PE through a pin, but are not limited thereto.

In one embodiment, the alarm system 230 provides an alarm (such as a red light) based on the comparison signals CMP1, CMP2, and CMP3. In an embodiment, the alarm system 230 may detect the test voltage from the voltage supply sub-circuit GB and the test voltage when the test voltage from the voltage supply sub-circuit GR and the detected test voltage detected on the test pad PG are different. An alarm is provided when the detection test voltage detected on the test pad PM is different, or when the test voltage from the voltage supply sub-circuit GD and the detection test voltage detected on the test pad PE are different.

Thereby, it can be quickly judged whether the line between the test device 200 and the display panel 100 is abnormal.

In an embodiment of the present case, before performing a function test (such as a lighting test) of the display panel 100, the test device 200 may first provide an operating voltage (such as providing a high voltage level) to the operation pad PO to check whether the line is abnormal. test.

If the alarm system 230 does not provide an alarm, it means that the line between the test device 200 and the display panel 100 is normal, then the test device 200 stops providing the operating voltage (such as providing a low voltage level) to the operation pad PO to turn off the switches TR1-TR3. Then, a function test (such as a lighting test) of the display panel 100 is performed.

If the alarm system 230 provides an alarm, it means that the line between the test device 200 and the display panel 100 may be abnormal, and the administrator can perform further debugging.

FIG. 3 is a schematic diagram of a test system 10 according to an embodiment of the present invention. Some components in the test system 10 in this embodiment are similar to those in the test system 10 in FIG. 2, so the duplicated parts are not repeated here.

In this embodiment, the test circuit 120 includes a test pad PR, a test pad PG, a test pad PB, a test pad PM, a test pad PD, a test pad PE, an operation pad T1, an operation pad T2, a switch TR0, a switch TR1, and a switch TR2. And switch TR3. The details of the test pad PR, the test pad PG, the test pad PB, the test pad PM, the test pad PD, the test pad PE, the switch TR1, the switch TR2, and the switch TR3 can be generally referred to the foregoing paragraphs, and will not be repeated here.

In this embodiment, the operation pad T1 is electrically connected to the first end and the control end of the switch TR0. The operation pad T2 is electrically connected to the second terminal of the switch TR0 and the control terminals of the switches TR1-TR3. In this embodiment, the operation pad T1 is electrically connected to the control terminals of the switches TR1-TR3 through the switch TR0 and the operation pad T2.

In some aspects, the test pad P1 in Fig. 1 may be the test pad PR in Fig. 3, the test pad P2 in Fig. 1 may be the test pad PG in Fig. 3, and the switch in Fig. 1 TR may be the switch TR1 in FIG. 3, and the function of the operation pad PO in FIG. 1 may be similar to that of the operation pad T1 in FIG. 3.

In other aspects, the test pad P1 in Fig. 1 may be the test pad PB in Fig. 3, and the test pad P2 in Fig. 1 may be the test pad PM in Fig. 3, The switch TR may be the switch TR2 in FIG. 3, and the function of the operation pad PO in FIG. 1 may be similar to that of the operation pad T1 in FIG. 3.

In some aspects, the test pad P1 in Fig. 1 may be the test pad PD in Fig. 3, the test pad P2 in Fig. 1 may be the test pad PE in Fig. 3, and the switch in Fig. 1 TR may be the switch TR3 in FIG. 3, and the function of the operation pad PO in FIG. 1 may be similar to that of the operation pad T1 in FIG.

That is, with the above settings, the test device 200 can detect the voltages on the test pads PG, PM, and PE (that is, detect the test voltages), and respectively provide the detected test voltages and the test pads PR, PB, and The test voltages of the PDs are compared to quickly determine whether the line between the test device 200 and the test pads PR, PG, PB, PM, PD, and PE of the display panel 100 is abnormal.

When the test device 200 provides an operating voltage (such as a high voltage level) to the operation pad T1 to turn on the switch TR0 and further turn on the switches TR1-TR3, when the test voltage (such as a high voltage level) is supplied to the test pad PR ) Is different from the detection test voltage detected on the self-test pad PG, when the test voltage (such as high voltage level) provided to the test pad PB is different from the detection test voltage detected on the self-test pad PM And / or when the test voltage (such as high voltage level) provided to the test pad PD is different from the detected test voltage detected on the test pad PE, the test device 200 judges the test of the test device 200 and the display panel 100 Pad PR, PG, PB, PM, PD, PE line abnormal. In contrast, when the test voltage supplied to the test pad PR is the same as the detection test voltage detected on the self-test pad PG, the test voltage supplied to the test pad PB is the same as the detection voltage detected on the self-test pad PM. When the test voltage is measured, and when the test voltage provided to the test pad PD is the same as the detected test voltage detected on the self-test pad PE, the test device 200 determines that the test device 200 and the test pads PR, PG, and The lines between PB, PM, PD, and PE are normal.

On the other hand, with the above setting, the test device 200 can also detect the voltage on the operation pad T2 (hereinafter referred to as the detection operation voltage), and separately perform the detection operation voltage and the operation voltage provided on the operation pad T1. The comparison is performed to quickly determine whether the wiring between the test device 200 and the operation pad T1 and the operation pad T2 of the display panel 100 is abnormal.

For example, when the test device 200 provides an operation voltage (such as a high voltage level) to the operation pad T1 to turn on the switch TR0, the detection operation voltage detected on the operation pad T2 and the operation pad T1 are provided to the operation pad T1. When the operating voltages are different, the test device 200 determines that the line between the test device 200 and the operation pads T1 and T2 of the display panel 100 is abnormal. When the detected operation voltage detected on the operation pad T2 is the same as the operation voltage provided on the operation pad T1, the test device 200 determines that the wiring between the test device 200 and the operation pad T1 and the operation pad T2 of the display panel 100 is normal.

In this embodiment, the voltage supply circuit 210 may include a voltage supply sub-circuit GT, a voltage supply sub-circuit GR, a voltage supply sub-circuit GB, and a voltage supply sub-circuit GD. In this embodiment, the feedback comparison circuit 220 includes a comparator 222, a comparator 224, a comparator 226, and a comparator 228. The details of the voltage supply sub-circuit GR, the voltage supply sub-circuit GB, the voltage supply sub-circuit GD, the comparator 222, the comparator 224, and the comparator 226 can be referred to the foregoing paragraphs, so they will not be repeated here.

In this embodiment, the voltage supply sub-circuit GT is used to generate and provide an operation voltage to the operation pad T1 and the comparator 228. In this embodiment, the comparator 228 is used to receive the operation voltage from the voltage supply sub-circuit GT, detect the detection operation voltage on the operation pad T2, and compare the operation voltage from the voltage supply sub-circuit GT and the operation pad T2. Detected operating voltage. Then, the comparator 228 generates and provides a comparison signal CMP4 to the alarm system 230 according to the comparison result. In one embodiment, the voltage supply sub-circuit GT and the comparator 228 are respectively electrically connected to the operation pads T1 and T2 through the contact pins of the operation pads T1 and T2, but the present invention is not limited thereto.

In this embodiment, the alarm system 230 provides a first alarm (such as a bright red light) based on the comparison signals CMP1, CMP2, and CMP3. In an embodiment, the alarm system 230 may detect the test voltage from the voltage supply sub-circuit GB and the test voltage when the test voltage from the voltage supply sub-circuit GR and the detected test voltage detected on the test pad PG are different. In the case where the detection test voltage detected on the test pad PM is different, or when the test voltage from the voltage supply sub-circuit GD and the detection test voltage detected on the test pad PE are different, the first An alert.

In addition, in this embodiment, the alarm system 230 provides a second alarm (such as a bright yellow light) according to the comparison signal CMP4. In one embodiment, the alarm system 230 may provide a second alarm when the operating voltage from the voltage supply sub-circuit GT and the detected operating voltage detected on the operation pad T2 are different. The second alarm is different from the first alarm alarm.

With the first and second alarms, it is possible to quickly determine whether the line between the test device 200 and the operation pads T1 and T2 is abnormal, and whether the line between the test device 200 and the test pads PR, PG, PB, PM, PD, and PE is abnormal. .

The following table shows whether the line between the first alarm and the second alarm and test device 200 and the operation pads T1 and T2 (hereinafter referred to as test lines) is abnormal, and the test device 200 and the test pads PR, PG, PB, PM, Whether the line between PD and PE (hereinafter referred to as the data line) is abnormal.

As shown above, when the alarm system 230 does not provide the first alarm and the second alarm, the representative data line and the test line are normal. When the alarm system 230 does not provide the first alarm and provides the second alarm, it means that the data line is normal and the test line is abnormal. In the case where the alarm system 230 provides the first alarm without providing the second alarm, it means that the data line is abnormal and the test line is normal. When the alarm system 230 provides the first alarm and the second alarm, it means that the test line is abnormal. In this case, because the operation pad T2 does not receive the operation voltage from the operation pad T1, the switches TR1-TR3 cannot be turned on, which causes the alarm system 230 to provide a first alarm, so the normality of the data line remains to be confirmed.

In an embodiment of the present case, before performing a functional test (such as a lighting test) of the display panel 100, the test device 200 may first provide an operating voltage (such as providing a high voltage level) to the operating pad T1 to determine whether the line is abnormal. test.

If the alarm system 230 does not provide the first alarm or the second alarm, it means that the line between the test device 200 and the display panel 100 is normal, and the test device 200 stops supplying the operating voltage (such as providing a low voltage level) to the operating pad. T1 to turn off the switches TR0-TR3 and perform a function test (such as a lighting test) of the display panel 100.

If the alarm system 230 provides the first alarm or the second alarm, it means that the line between the test device 200 and the display panel 100 may be abnormal, and the administrator can perform further debugging.

FIG. 4 is a schematic diagram of a test system 10 according to an embodiment of the present invention. Some components in the test system 10 in this embodiment are similar to those in the test system 10 in FIG. 2, so the duplicated parts are not repeated here.

In this embodiment, the test circuit 120 includes a test pad PR, a test pad PG, a test pad PB, a test pad PM, an operation pad PO1, an operation pad PO2, a switch TR1, a switch TR2, a switch OT1, and a switch OT2. The details of the test pad PR, the test pad PG, the test pad PB, the test pad PM, the switch TR1, and the switch TR2 can be generally referred to the foregoing paragraphs, and will not be repeated here.

In this embodiment, the first terminal of the switch OT1 is electrically connected to the control terminal of the switch TR1, the control terminal of the switch TR2, and the second terminal of the switch OT2. The second terminal of the switch OT1 is electrically connected to the operation pad PO2 and the control terminal of the switch OT2. The control terminal of the switch OT1 is electrically connected to the operation pad PO1 and the first terminal of the switch OT2. The first terminal of the switch OT2 is electrically connected to the operation pad PO1 and the control terminal of the switch OT1. The second terminal of the switch OT2 is electrically connected to the first terminal of the switch OT1, the control terminal of the switch TR1, and the control terminal of the switch TR2. The control terminal of the switch OT2 is electrically connected to the operation pad PO2 and the second terminal of the switch OT1. In this embodiment, the operation pad PO1 is electrically connected to the odd-numbered column gate lines GL (such as the first and third column gate lines GL). In this embodiment, the operation pad PO2 is electrically connected to the even-numbered gate lines GL (such as the second-row gate lines GL).

In this embodiment, the operation pad PO1 can be electrically connected to the control terminal of the switch TR1 and the control terminal of the switch TR2 through the switch OT2. In this embodiment, the operation pad PO2 can be electrically connected to the control terminal of the switch TR1 and the control terminal of the switch TR2 through the switch OT1.

In some aspects, the test pad P1 in FIG. 1 may be the test pad PR in FIG. 4, the test pad P2 in FIG. 1 may be the test pad PG in FIG. 4, and the switch in FIG. 1. TR may be the switch TR1 in FIG. 4, and the function of the operation pad PO in FIG. 1 may be similar to that of the operation pad PO1 in FIG. 4.

In other aspects, the test pad P1 in FIG. 1 may be the test pad PB in FIG. 4, and the test pad P2 in FIG. 1 may be the test pad PM in FIG. 4 and the test pad P1 in FIG. 1. The switch TR may be the switch TR2 in FIG. 4, and the function of the operation pad PO in FIG. 1 may be similar to that of the operation pad PO1 in FIG. 4.

With the above settings, the test device 200 can detect the voltages on the test pads PG and PM (that is, detect the test voltages) and compare the detected test voltages with the test voltages provided to the test pads PR and PB, respectively. To quickly determine whether the line between the test device 200 and the display panel 100 is abnormal.

When the test device 200 provides an operating voltage (such as a high voltage level) to the operating pads PO1 and PO2 to turn on the switches OT1 and OT2 and further turn on the switches TR1 and TR2, the test voltage provided to the testing pad PR is provided. (E.g. high voltage level) is different from the detected test voltage detected on the self-test pad PG, or / and when the test voltage (e.g. high-voltage level) provided to the test pad PB is different from the self-test pad PM When the detected test voltage is detected, the test device 200 determines that the line between the test device 200 and the display panel 100 is abnormal. When the test voltage supplied to the test pad PR is the same as the detection test voltage detected on the self-test pad PG, and when the test voltage supplied to the test pad PB is the same as the detection test detected on the self-test pad PM When the voltage is applied, the test device 200 determines that the line between the test device 200 and the display panel 100 is normal.

On the other hand, when the test device 200 fails to provide at least one of the operation pad PO1 and the operation pad PO2 with the operation voltage (such as a high voltage level) (such as failure due to poor contact or abnormal operation voltage, etc.), the switch OT1 is switched. And at least one of OT2 is turned off, which causes switches TR1-TR2 to turn off. As a result, the test voltage (e.g., high voltage level) provided to the test pad PR will be different from the detection test voltage (e.g., low voltage level) detected on the test pad PG, and / or provided to the test pad The test voltage of the PB (such as a high voltage level) is different from the detection test voltage (such as a low voltage level) detected on the self-test pad PM, so the test device 200 can determine that the line between the test device 200 and the display panel 100 is abnormal. .

In this embodiment, the voltage supply circuit 210 may include a voltage supply sub-circuit GR, a voltage supply sub-circuit GB, a voltage supply sub-circuit GO1, and a voltage supply sub-circuit GO2. In this embodiment, the feedback comparison circuit 220 includes a comparator 222 and a comparator 224. The details of the voltage supply sub-circuit GR, the voltage supply sub-circuit GB, the comparator 222, and the comparator 224 can be referred to the foregoing paragraphs, so they will not be repeated here.

In this embodiment, the voltage supply sub-circuit GO1 is used to generate and provide an operation voltage to the operation pad PO1. In this embodiment, the voltage providing sub-circuit GO2 is used to generate and provide an operating voltage to the operating pad PO2. In one embodiment, the voltage supply sub-circuit GO1 and the voltage supply sub-circuit GO2 are respectively electrically connected to the operation pad PO1 and the operation pad PO2 through a pin contact, but the present invention is not limited thereto.

In this embodiment, the alarm system 230 provides an alarm (such as a bright red light) based on the comparison signals CMP1 and CMP2. In one embodiment, the alarm system 230 may detect the test voltage from the voltage supply sub-circuit GR and the detection test voltage detected on the test pad PG in different situations, or / and the test from the voltage supply sub-circuit GB. Provides an alarm when the voltage and the detected test voltage detected on the test pad PM are different.

Thereby, it can be quickly judged whether the line between the test device 200 and the display panel 100 is abnormal.

Please refer to FIG. 4 and FIG. 5 at the same time. In this embodiment, before performing a functional test (such as a lighting test) of the display panel 100 (such as a period PRD1), the voltage supply sub-circuit GO1 and the voltage supply sub-circuit GO2 may be At the same time, provide the operating voltage (such as with a high voltage level VGH) to the operating pads PO1 and PO2 to test whether the line is abnormal.

If the alarm system 230 provides an alarm, it means that the line between the test device 200 and the display panel 100 may be abnormal, and the administrator can perform further debugging.

If the alarm system 230 does not provide an alarm, it means that the line between the test device 200 and the display panel 100 is normal, so the test device 200 can perform a function test (such as a lighting test) of the display panel 100. During the function test (such as the lighting test) (such as during the period PRD2), the voltage supply sub-circuit GO1 and the voltage supply sub-circuit GO2 can respectively provide function test voltages that are opposite to each other to the operation pads PO1 and PO2. For example, when the voltage supply sub-circuit GO1 provides a function test voltage of a high voltage level VGH to the operation pad PO1, the voltage supply sub-circuit GO2 provides a function test voltage of a low voltage level VGL to the operation pad PO2, and vice versa. At this time, since one of the switches OT1 and OT2 receives the function test voltage with a low voltage level VGL and is turned off, the function test voltage with a high voltage level VGH cannot be provided to the control terminals of the switches TR1 and TR2, so that The switches TR1 and TR2 are closed.

With the above settings, the wiring between the test device 200 and the display panel 100 can be performed without additional contact pads (such as the operation pads PO in FIGS. 1 and 2 and the operation pads T1 and T2 in FIG. 3). Exception test.

FIG. 6 is a flowchart of a test method 300 according to an embodiment of the present invention.

It should be noted that the test method 300 can be applied to a test device having the same or similar structure as that shown in the foregoing embodiment. In order to make the description simple, the test method 300 will be described below by taking the test device 200 in FIG. 1 as an example according to an embodiment of the present invention, but the present invention is not limited to this application.

In addition, it should be understood that the operations of the test method 300 mentioned in this embodiment can be adjusted according to actual needs, except for those specifically described in order, and can even be performed simultaneously or partially simultaneously.

Moreover, in different embodiments, these operations may be adaptively added, replaced, and / or omitted.

In this embodiment, the test method 300 includes the following operations.

In operation S1, the test apparatus 200 provides a test voltage to the test pad P1 of the display panel 100. In one embodiment, the test pad P1 is electrically connected to the test pad P2 through the switch TR.

In operation S2, the test device 200 detects a detection test voltage on the test pad P2.

In operation S3, the test device 200 compares the test voltage with the detected test voltage.

In operation S4, when the test voltage and the detected test voltage are different, the test device 200 provides an alarm.

It should be noted that the specific details of the above operations can refer to the foregoing paragraphs, so they will not be repeated here.

Through the above operations, it is possible to quickly determine whether the line between the test device 200 and the display panel 100 is abnormal.

Although the present invention has been disclosed as above by way of example, it is not intended to limit the present invention. Any person skilled in the art can make various modifications and retouches without departing from the spirit and scope of the present invention. Therefore, the protection of the present invention The scope shall be determined by the scope of the attached patent application.

Claims (12)

A display panel includes: an active area; and a test circuit electrically connected to the active area. The test circuit includes: a first main switch; a first test pad electrically connected to a first main switch; One end is electrically connected between the active area and the first main switch; a second test pad is electrically connected to a second end of the first main switch and electrically connected to the active area and the first Between the main switches; and a first operation pad, which is electrically connected to a control terminal of the first main switch. The display panel according to claim 1, wherein the test circuit further includes: a second main switch, wherein a control terminal of the second main switch is electrically connected to the first operation pad; a third test pad, electrically A first end of the second main switch is connected; and a fourth test pad is electrically connected to a second end of the second main switch. The display panel according to claim 2, wherein the test circuit further includes: an operation main switch, wherein a first end and a control end of the operation main switch are electrically connected to the first operation pad; and a second operation Pad, which is electrically connected to a second end of the operation main switch, the control end of the first main switch and the control end of the second main switch, wherein an operation voltage is provided to the first operation pad to be turned on The operation main switch further turns on the first main switch and the second main switch, wherein the first operation pad is electrically connected with the control end of the first main switch and the second operation pad through the operation main switch and the second operation pad. The control terminal of the second main switch. The display panel according to claim 2, wherein the test circuit further includes: a first operation switch, wherein a first terminal of the first operation switch is electrically connected to the control terminal and the second terminal of the first main switch. The control end of the main switch, and a control end of the first operation switch is electrically connected to the first operation pad; a second operation pad is electrically connected to a second end of the first operation switch; and a second An operation switch, wherein a first terminal of the second operation switch is electrically connected to the control terminal of the first operation switch, and a second terminal of the second operation switch is electrically connected to the control terminal of the first main switch and The control terminal of the second main switch, and a control terminal of the second operation switch is electrically connected to the second terminal of the first operation switch and the second operation pad. A test device includes: a voltage supply circuit for providing a test voltage to a first test pad of a display panel, wherein the first test pad is electrically connected to a second test pad through a first main switch, wherein The first test pad is electrically connected between an active area of the display panel and the first main switch, and the second test pad is electrically connected between the active area and the first main switch; a feedback comparison circuit Electrically connected to the voltage supply circuit for receiving the test voltage from the voltage supply circuit, detecting a detection test voltage on the second test pad, and comparing the test voltage with the detection test voltage; and The alarm system is electrically connected to the feedback comparison circuit for providing a first alarm when the test voltage and the detected test voltage are different. The test device according to claim 5, wherein the voltage supply circuit is further configured to provide an operating voltage to a first operation pad of the display panel, wherein the first operation pad is electrically connected to a control of the first main switch. end. The test device according to claim 6, wherein the first operation pad is electrically connected to a second operation pad through an operation main switch, and the feedback comparison circuit is further configured to receive the operation voltage from the voltage supply circuit, and detect Measuring a detection operation voltage on the second operation pad, and comparing the operation voltage with the detection operation voltage, and in the case where the operation voltage and the detection operation voltage are different, a second alarm is provided, the first The second alarm is different from the first alarm. The test device according to claim 6, wherein the voltage supply circuit is further configured to provide a first operation voltage and a second operation voltage to a first operation pad and a second operation pad of the display panel, respectively, wherein The first operation pad and the second operation pad are electrically connected to a control terminal of the first main switch through a first operation switch and a second operation switch, respectively, and wherein the first operation voltage and the second operation switch are When the operating voltages have a first voltage level, the first main-on relationship is turned on. A test method includes: providing a test voltage to a first test pad of a display panel, wherein the first test pad is electrically connected to a second test pad through a first main switch, and the first test pad is electrically Connected between an active area of the display panel and the first main switch, and the second test pad is electrically connected between the active area and the first main switch; detecting a detection on the second test pad Test voltage; comparing the test voltage with the detection test voltage; and providing a first alarm if the test voltage and the detection test voltage are different. The test method according to claim 9, further comprising: providing an operating voltage to a first operation pad of the display panel to turn on the first main switch, wherein the first operation pad is electrically connected to the first main switch. A control side. The test method according to claim 10, wherein the first operation pad is electrically connected to a second operation pad through an operation main switch, and the test method further includes: detecting a detection operation voltage on the second operation pad, And comparing the operation voltage with the detection operation voltage; and providing a second alarm if the operation voltage and the detection operation voltage are different. The test method according to claim 9, further comprising: providing a first operation voltage and a second operation voltage to a first operation pad and a second operation pad of the display panel, respectively; wherein the first operation pad and The second operation pad is electrically connected to a control terminal of the first main switch through a first operation switch and a second operation switch, respectively, and the first operation voltage and the second operation voltage both have a When the first voltage level is reached, the first main switch is turned on.