TWI665457B - Measuring system and its measuring method thereof - Google Patents

Abstract

The invention provides a measurement system, which includes: a main control device and a plurality of measurement stations. Each measurement workstation is connected to the main control device and corresponds to a component under test. Among them, the measurement workstation simultaneously performs a common project measurement procedure on the corresponding component under test according to the instruction of the main control device, and measures The workstations further perform specific demand item measurement procedures of adjustable measurement items according to the requirements of the corresponding components to be tested, in which at least two specific demand item measurement procedures have overlapping periods.

Description

Measuring system and measuring method

The invention relates to a measuring system and a measuring method, and particularly relates to a measuring system and a measuring method suitable for measuring a plurality of integrated circuits.

Although the conventional integrated circuit (IC) can perform measurement simultaneously, except for the common measurement items, the other measurement items must be performed sequentially, that is, after the measurement of an IC is completed The next IC is the turn, so if the number of ICs is large, a lot of time cost must be consumed. In addition, after the IC receives the measurement signal, it may take a period of response time, and the conventional measurement mechanism must wait until the response time of all ICs is over before the subsequent measurement, because the response time of each IC is not necessarily Same, so it will take a lot of waiting time. In addition, the characteristics of some ICs must be measured immediately after the end of the response time, so the conventional measurement mechanism of these ICs must be the response time of one IC and the end of the measurement item before the next IC's response time. And measurement items, this will take more time, resulting in very low efficiency.

In view of this, the present invention provides a measurement system and a measurement method to solve the above problems.

An object of the present invention is to provide a measurement system including: a main control device and a plurality of measurement stations. The measurement workstations are each connected to the main control device, and each of the measurement workstations corresponds to a component under test; wherein the measurement workstation simultaneously performs a common project measurement procedure on the corresponding component under test according to the instruction of the main control device, and the The isometry workstation further performs a specific item measurement procedure of an adjustable measurement item according to the requirements of the corresponding DUT, and at least two specific requirement item measurement procedure parts overlap during the execution period. Therefore, the present invention can save a lot of time and cost.

In one embodiment, after the common item measurement procedure and the specific measurement item procedure of the components to be tested are completed, the measurement workstations respectively transmit a measurement result to the main control device. In one embodiment, the specific item measurement procedure of the device under test is performed between two common item measurement procedures. In one embodiment, the common item measurement procedure or the specific item measurement procedure includes a signal response period of the integrated circuit and an actual measurement period. In one embodiment, the measurement workstations each perform a specific project measurement procedure. In an embodiment, after the common item measurement procedure of the waiting-for-measurement component is completed, each measurement workstation further adjusts the test-measurement according to the measurement result of the common item measurement procedure of the corresponding DUT. The component-specific measurement procedure for this component. Furthermore, after the specific item measurement procedure of each DUT is adjusted, the waiting-measurement element receives a measurement signal corresponding to its specific item measurement procedure, and enters its respective signal response period, and After the end of the signal response period, each of them enters the measurement process of the specific item. Among them, when the signal response of one of the components under test is abnormal, the other components under test continue to perform the corresponding signal response period, and the signal response period ends. Then enter their respective measurement procedures for that specific item.

Another object of the present invention is to provide a measurement method executed by a measurement system. The measurement system includes a main control device and a plurality of measurement workstations connected to the main control device. Measuring element, the measuring method includes the following steps: making the measuring station according to the main control Instructions of the device and simultaneously perform a common item measurement procedure on the corresponding DUT; and enable the measurement workstation to perform a specific item measurement procedure on each of the adjustable measurement items according to the requirements of the corresponding DUT, At least two of the specific demand item measurement procedures will have overlapping periods. Therefore, the present invention can save a lot of time and cost.

In one embodiment, the method further includes the steps of: after the common item measurement procedure and the specific item measurement procedure of the components to be tested are completed, transmitting a measurement result to the main control device through the measurement workstation. In one embodiment, the specific item measurement procedure of the device under test is performed between two common item measurement procedures. In one embodiment, the common item measurement program or the specific item measurement program includes a signal response period of the integrated circuit and an actual measurement period. In an embodiment, the measurement workstations each perform the specific item measurement procedure. In an embodiment, the steps of causing each measurement station to perform a specific item measurement procedure of an adjustable measurement item according to the corresponding requirements of the device under test further include sub-steps: After the common item measurement program is completed, the specific item measurement program of each test element is adjusted according to the measurement results of the common item measurement program of each test element. Furthermore, after the measurement procedure of the specific item of each DUT is adjusted, each DUT receives a measurement signal corresponding to its specific item measurement procedure and enters its own signal response period. , And enter the respective specific item measurement procedure after the signal response period ends; when the signal response of the component under test is abnormal, the remaining signal components continue to perform the corresponding signal response period, and the signal response After the end of the period, enter each of the specific project measurement procedures.

1‧‧‧ measurement system

10‧‧‧Master Control Device

21 ~ 24‧‧‧Measurement Workstation

30‧‧‧Measuring machine

41 ~ 44‧‧‧DUT

50‧‧‧Server

Steps S21 ~ S25‧‧‧‧

Test_com‧‧‧Common project measurement procedure

Test_1 ~ Test_4‧‧‧‧Specific project measurement procedures

O1‧‧‧ Overlap period

S31 ~ S36‧‧‧step

S41 ~ S47‧‧‧step

S51 ~ S56‧‧‧step

S61 ~ S66‧‧‧step

1 is a schematic diagram of a system architecture of a measurement system according to a first embodiment of the present invention; 2 is a flowchart of the steps of the measurement method performed by the measurement system of the first embodiment of the present invention; FIG. 3 (A) is a detailed flowchart of the measurement method of the measurement system of the first embodiment of the present invention; 3 (B) is a schematic diagram of a comparison between the measurement situation of the first embodiment of the present invention and the operation of the conventional technology; FIG. 4 (A) is a detailed flowchart of the measurement method of the measurement system of the second embodiment of the present invention; FIG. 4 (B) is a schematic diagram of a comparison between the measurement situation of the second embodiment of the present invention and the operation of the conventional technology; FIG. 5 (A) is a detailed flowchart of the measurement method of the measurement system of the third embodiment of the present invention 5 (B) is a schematic diagram of a comparison between the measurement situation of the third embodiment of the present invention and the operation of the conventional technology; FIG. 6 (A) is a detailed flow of the measurement method of the measurement system of the fourth embodiment of the present invention Figure

FIG. 6 (B) is a schematic diagram of the operation of the measurement method according to the fourth embodiment of the present invention.

In the following, implementation examples and operation principles of the measurement device of the present invention will be described through multiple embodiments. Those with ordinary knowledge in the technical field to which the present invention pertains can understand the features and effects of the present invention through the above-mentioned embodiments, and can combine, modify, replace or divert based on the spirit of the present invention.

The term "connected" as used herein includes aspects such as direct connection or indirect connection, and is not limited. The word "When ...", "... 时" in this article means "present, before or after" and is not limited. In addition, when multiple effects (or elements) are described in the present invention, if the word "or" is used between multiple effects (or elements), it means that the effects (or elements) can exist independently, but it does not exclude multiple effects. (Or elements) can exist simultaneously. In addition, the term "connected" in the present invention means a form including direct connection and wireless connection. Furthermore, the ordinal numbers used in the description, such as "first embodiment", "second embodiment", etc., to modify the embodiments of the present invention, are not intended to represent or represent the embodiments themselves. Any previous ordinal number does not represent the order of an embodiment and another embodiment. The use of these ordinal numbers is only used to modify different embodiments, and the invention is not limited to these embodiments.

FIG. 1 is a schematic diagram of a system architecture of a measurement system 1 according to a first embodiment of the present invention. As shown in FIG. 1, the measurement system 1 includes a main control device 10 and a plurality of measurement stations 21 to 24. The main control device 10 can be connected to the measurement stations 21 to 24, so the measurement stations 21 to 24 can receive instructions transmitted by the main control device 10. The measurement workstations 21 to 24 may correspond to a plurality of DUTs 41 to 44. Each of the measurement workstations 21 to 24 may correspond to a DUT 41 to 44, for example, the measurement workstation 21 may correspond to the DUT 41. Etc. Therefore, each measuring station 21 ~ 24 can control a measuring program of a DUT 41 ~ 44. Wherein, the measurement stations 21 to 24 may simultaneously perform a common item measurement procedure according to an instruction of the main control device 10, so that the waiting measurement elements 41 to 44 perform a common item measurement. In addition, these measurement workstations 21 to 24 can each perform a specific item measurement procedure according to the requirements of the corresponding DUT 41 to 44, and the measurement items of the specific item measurement procedure can be based on each DUT The measurement results of the common items 41 to 44 are dynamically adjusted (for example, the measurement station 21 can adjust the measurement items accordingly according to the measurement results of the common items 41 of the device to be tested). In addition, part of the measurement procedure of the specific item of the at least two measurement stations (for example, the measurement station 21 and the measurement station 22) may overlap. It should be noted that the number of the measurement stations 21 to 24 and the number of components to be measured 41 to 44 in this embodiment are merely examples, and in fact, the present invention may have a larger or smaller number. Next, the elements and features of the present invention will be described in more detail.

In an embodiment, the main control device 10 may be an electronic device with a network function, and may include a processor or a controller, such as a desktop computer, an industrial computer, a notebook computer, a smart phone, a tablet computer, or Other similar devices are not limited to this. In another embodiment, the main control device 10 may also be implemented in other forms, such as a workstation, a platform, or a security station mounted on a server. The main program and the like installed in the electronic device are not limited thereto. In order to make the present invention clearer, the following description uses the state where the main control device 10 is a computer as an example.

In an embodiment, the measurement workstations 21 to 24 may be electronic devices with network functions, and may be provided with a processor or controller. For example, the measurement workstations 21 to 24 may be desktop computers, industrial computers, notebook computers, smart phones, A tablet, or other similar device, and is not limited to this. In another embodiment, the measurement workstations 21 to 24 can also be implemented in other forms, such as a workstation, platform, webpage set up on a server, or a main program installed on an electronic device, or they can be directly It is set on the measuring machine as the control program of the measuring machine, and it is not limited to this. In order to make the description clearer, the following description is based on the measurement of the measuring stations 21 to 24 as a computer. In addition, in one embodiment, one measurement workstation can correspond to one component under test, but in other embodiments, one measurement workstation can also correspond to multiple components under test, so "each measurement workstation corresponds to one The description of “measurement element” does not mean that the present invention is limited to a measurement workstation corresponding to only one element to be measured. In order to make the present invention clearer, the following description is based on a measurement station corresponding to a component under test.

In one embodiment, the DUTs 41 to 44 may be integrated circuits (ICs) or other electronic components that need to be electrically tested. In order to make the present invention clearer, the following descriptions are based on the state where the DUTs 41 to 44 are ICs. In one embodiment, the DUTs 41 to 44 can be placed on the carrier of a measuring machine table 30, and the DUTs 41 to 44 can each have multiple pins (PIN), and the pins can be connected to the measuring machine. The signal output terminal of the station 30 is electrically connected, which means that the measuring machine 30 can send signals to the pins of the DUT 41 to 44 to test whether the pins are normal. In an embodiment, one measuring machine 30 can measure a plurality of test elements 41 to 44 at the same time, and the measuring machine 30 can be divided into a plurality of sub-sections, and each sub-section can be performed on each of the test elements 41-44. Different measurement means that each sub-section can transmit different measurement signals according to the measurement results of common items 41 to 44 of each DUT, but it is not limited to this. In addition, the measuring machine 30 can be controlled by the measuring stations 21-24, for example For example, the measurement stations 21 to 24 execute a measurement program, so that the control measurement machine 30 performs the actual measurement, thereby completing the measurement procedure, but it is not limited thereto.

In one embodiment, the measurement system 1 may further include a server 50. The server 50 can store test programs containing various test items, the main control device 10 can download the test programs from the server 50 through the network, and the measurement stations 21 to 24 can obtain the test programs from the main control device 10, and Corresponding DUTs 41 to 44 find the corresponding test items, and perform the measurement procedure. It should be noted that the server 50 is not limited to storing only a single test program, which means that different measurement items can be integrated in the same test program, or can be dispersed into multiple test programs.

In one embodiment, the common item measurement program can be defined as an item that all of the DUTs 41 to 44 need to be tested, so the DUT 41 to 44 can also perform the common item measurement program at the same time. In an embodiment, the specific item measurement program can adjust its measurement items according to the characteristics of each of the DUTs 41-44. Therefore, for the DUT 41-44, the specific item measurement program may have Different measurement items. In addition, according to the characteristics of the DUT 41 ~ 44, after receiving the measurement signal, it takes a period of signal response time to respond to the measurement signal. Therefore, this type of DUT 41 ~ 44 measures specific items The program may include the signal response period of the integrated circuit and the actual measurement period of a specific measurement item, but is not limited.

Next, the measurement method of the present invention will be described in detail. FIG. 2 is a flowchart of the steps of the measurement method performed by the measurement system 1 according to the first embodiment of the present invention. Please refer to FIG. 1 at the same time. First, step S21 is executed. The main control device 10 downloads a test program from the server 50 and sends the test program to the measurement workstations 21-24. Step S22 is then executed, and the main control device 10 sends a message to the measurement stations 21 to 24 to inform the measurement stations 21 to 24 to enter the measurement procedure. Step S23 is then executed, the measurement stations 21 to 24 execute a test program, and control the measurement machine 30 to perform a common item measurement procedure on the components 41 to 44 to be measured. After Step S24 is executed. After the common item measurement of the components to be tested 41 to 44 is completed, the measurement workstations 21 to 24 each perform a specific item measurement program, and the measurement items of the specific item measurement program can be measured according to each of the measurement items The requirements of the components 41 to 44 are adjusted individually, and the specific item measurement procedure of each of the components to be tested 41 to 44 can be performed simultaneously, but it is not limited. Step S25 is then performed. After the measurement is completed, the measurement stations 21 to 24 respectively transmit the measurement results to the main control device 10, and the main control device 10 aggregates the measurement results.

It should be noted that although the execution time of the common item measurement program in this embodiment is earlier than the execution time of the specific item measurement program, in other embodiments, the specific item measurement program may be performed first and wait until After the specific item measurement procedures of the measurement elements 41 to 44 are completed, the common item measurement procedure is started. In addition, in one embodiment, the execution time of the specific item measurement procedure of the DUT 41 to 44 may be between two common item measurement procedures, and in another embodiment, the time of the common item measurement procedure The execution time may be between two specific project measurement procedures and is not limited.

In this way, the measurement stations 21 to 24 control the measurement of the DUTs 41 to 44 respectively, and the present invention can perform specific measurement items individually and synchronously according to the needs of the DUTs 41 to 44 to save a lot of time .

Next, several embodiments will be used to describe in detail the flow of the measurement method of the present invention and the effect difference from the conventional technology. These examples are merely examples and are not a limitation of the present invention.

First, the aspect of the first embodiment will be described. FIG. 3 (A) is a detailed flowchart of the measurement method of the measurement system 1 according to the first embodiment of the present invention, and FIG. 3 (B) is the measurement method and knowledge of the measurement system 1 according to the first embodiment of the present invention A schematic diagram of the operation of the technology, please refer to FIGS. 1 to 3 (B) at the same time.

As shown in FIGS. 3 (A) and 3 (B), the measurement method of the first embodiment first executes step S31. The main control device 10 downloads a test program from the server 50 and transmits the test program to the measurement workstation 21 ~ 24. Step S32 is then performed, and the main control device 10 sends a message to the measurement stations 21 to 24 to inform The measurement stations 21 ~ 24 enter the measurement program. Step S33 is then executed, the measurement stations 21 to 24 execute a test program, and control the measurement machine 30 to perform a common item measurement procedure on the components 41 to 44 to be measured. Steps S31 to S33 are similar to steps S21 to S23 in FIG. 2, so they will not be described in detail. In addition, the common item measurement procedures (Test_com) of the components to be tested 41 to 44 are performed simultaneously. After that, step S34 is executed. After the common item measurement procedure (Test_com) of the DUTs 41 to 44 is completed, according to the respective requirements of each of the DUTs 41 to 44 (for example, according to the common item measurement procedure (Test_com)). The measurement results are not limited, and the specific item measurement procedures (Test_1 ~ Test_4) of each of the DUTs 41 to 44 are adjusted. After that, step S35 is executed, and the specific item measurement procedures (Test_1 ~ Test_4) of the DUTs 41 to 44 are performed synchronously. After that, step S36 is executed, and the measurement stations 21 to 24 each transmit the measurement results to the main control device 10 The measurement results are aggregated by the main control device 10.

In this embodiment, the DUTs 41 to 44 are assumed to be four DUTs of the same type, and the conventional technology assumes that the measurement of all of the DUTs 41 to 44 is controlled by a single computer device. After the common project measurement procedure (Test_com) is completed, a single computer device of the conventional technology can only perform the specific project measurement procedures (Test_1 ~ Test_4) of the DUT 41 ~ 44 in sequence, and must wait for the same type of test After the specific item measurement program (for example, Test_1) of the component (for example, the device under test 41) is completed, the specific item measurement program (for example, Test_2) of the next type of device under test (for example, the device under test 42) can be performed. In comparison, the measurement system 1 of the present invention may be provided with a plurality of measurement stations 21 to 24, and the measurement stations 21 to 24 each control the measurement of the components to be measured 41 to 44. Therefore, when a common item measurement program ( After the completion of Test_com), the measurement workstations 21 to 24 can individually and synchronously perform specific project measurement procedures (Test_1 to Test_4) of the components to be tested 41 to 44. As shown in FIG. 3, the present invention can greatly reduce the measurement time of the conventional technology.

Next, an aspect of the second embodiment will be described. FIG. 4 (A) is a detailed flowchart of the measurement method of the measurement system 1 according to the second embodiment of the present invention, and FIG. 4 (B) is the measurement of the measurement system 1 according to the second embodiment of the present invention A schematic diagram of the comparison between the method and the operation of the conventional technology. Please refer to FIG. 1, FIG. 2, FIG. 4 (A) and FIG. 4 (B) at the same time.

As shown in FIGS. 4 (A) and 4 (B), the measurement method of the second embodiment first executes steps S41 to S43; since steps S41 to S43 are similar to steps S21 to S23 of FIG. 2, they are not described in detail . After that, step S44 is executed. After the common item measurement procedures (Test_com) of the DUTs 41 to 44 are completed, according to the respective needs of the DUTs 41 to 44 (for example, measurement according to the common project measurement program (Test_com) As a result, but not limited to, the specific item measurement procedures (Test_1 to Test_4) of each of the DUTs 41 to 44 are adjusted. Step S45 is then performed. Each of the DUTs 41 to 44 receives a measurement signal corresponding to its specific item measurement procedure (Test_1 to Test_4) and enters its respective signal response time. If the signal response of the DUT (for example, DUT 44) is abnormal, step S45 (b) is performed. The DUT 44 waits for the abnormal end of the signal, and the remaining DUTs (DUT 41 to 43) Continue to perform its signal response time and subsequent measurements. After that, step S46 is executed. After the signal response is completed, the test components (for example, Test_1 ~ Test_3) with a normal signal response each perform a specific item measurement procedure (Test_1 ~ Test_3). Therefore, the signal response is completed earlier and normally wait The measuring element will directly carry out its specific project measurement procedure. After that, step S47 is executed. When the specific item measurement procedure (Test_1 ~ Test_4) of each of the DUTs 41 to 44 is completed, the measurement stations 21 to 24 respectively transmit the measurement results to the main control device 10, and The main control device 10 aggregates the measurement results.

In this embodiment, the DUTs 41 to 44 are four types of DUTs of the same type, and have different signal response periods for the same or different measurement signals. Therefore, the DUTs 41 to 44 are performing actual measurement. Before the test, you must wait for the end of the signal response period. In addition, the conventional technology controls the measurement of all the DUTs 41 to 44 by a single computer device. During the measurement (for example, the specific measurement item program Test_1 ~ Test_4), the computer device of the known technology controls the measurement machine (not shown in FIG. 4B) to transmit the measurement signal to the DUT 41 to 44, and the DUT 41 ~ 44 Need to wait for the response to the measurement signal. The actual measurement can only be performed after the signal response period of the DUTs 41 to 44 ends, so the conventional technology will spend a lot of time waiting for the DUTs 41 to 44 to respond to the signals. In addition, when the response of the DUT (such as DUT 44) is abnormal, although the signal response period of other DUTs 41 to 43 has ended, it is necessary to wait for the abnormal end of DUT 44 to begin. The actual measurement will take more time and cost. In comparison, the measurement system 1 of the present invention includes multiple measurement stations 21 to 24, and each of the measurement stations 21 to 24 controls the measurement of the DUTs 41 to 44. Therefore, the DUTs 41 to 44 can be performed individually. 44 signal response period and actual measurement period. Therefore, even when the response of the DUT 44 is abnormal, the other DUTs 41 to 43 can still perform actual measurement respectively, so a lot of time and cost can be saved.

It should be noted that although the embodiment of FIG. 4B uses a specific measurement item program Test_1 ~ Test_4 as an example to describe the situation of the signal response period, those skilled in the art know that this common project measurement procedure may also need to wait for the signal response period to end The measurement can be started only after that, and it is not limited to this.

Next, an aspect of the third embodiment will be described. Fig. 5 (A) is a detailed flowchart of the measurement method of the measurement system 1 according to the third embodiment of the present invention, and Fig. 5 (B) is the measurement method and knowledge of the measurement system 1 of the third embodiment of the present invention A schematic diagram of the operation of the technology, please refer to FIG. 1, FIG. 2, FIG. 5 (A) and FIG. 5 (B) at the same time. It should be noted that the DUTs 41 to 44 in the third embodiment belong to a type that must be measured immediately after the signal response time ends.

As shown in FIG. 5 (A) and FIG. 5 (B), the measurement method of the third embodiment first executes steps S51 to S53; since steps S51 to S53 are similar to steps S21 to S23 of FIG. 2, no longer Elaborate. After that, step S54 is executed. After the common item measurement procedures (Test_com) of the DUTs 41 to 44 are completed, according to the respective needs of the DUTs 41 to 44 (for example, the measurement according to the common project measurement program (Test_com)) (Results, but not limited) and adjust the specific item measurement procedures for each of the DUTs 41 to 44 (Test_1 ~ Test_4). Then step S55 is executed, the DUTs 41 to 44 are synchronized and each receives a measurement signal corresponding to its specific project measurement procedure (Test_1 to Test_4), and enters its own signal response time, and each DUT 41 to 44 Immediately after its signal response time has elapsed, its specific project measurement procedures are performed. After that, step S56 is executed. When the specific item measurement program (Test_1 ~ Test_4) of each of the DUTs 41 to 44 is completed, the measurement workstations 21 to 24 respectively transmit the measurement results to the main control device 10, and The main control device 10 aggregates the measurement results.

In this embodiment, the DUTs 41 to 44 are four DUTs of the same type, and have different response times for the same or different measurement signals, and the DUTs 41 to 44 have The characteristics that must be measured immediately. Because the conventional technology controls the measurement of all the DUTs 41 to 44 by a single computer device, it must wait for the end of the signal response period of DUTs 41 to 44 before performing the actual measurement. ~ 44 must be measured immediately after the reaction time is over, so its architecture must be configured to wait for the signal response period of the same type of DUT (such as DUT 41) in sequence and the actual measurement period to complete before it can be performed. The signal response period and actual measurement period of the next DUT (such as DUT 42); it can be seen that the measurement time in this embodiment will be longer than the measurement time in the previous embodiment, so it will consume more Time costs. In comparison, the measurement system 1 of the present invention is provided with a plurality of measurement stations 21 to 24, and the measurement stations 21 to 24 each control the measurement programs of the DUT 41 to 44, so the DUT can be performed individually The signal measurement period of 41 ~ 44 and the actual measurement period of the adjacent signal reaction period. Therefore, even if the DUTs 41 to 44 must be measured immediately after the signal response is completed, the DUTs 41 to 43 can still perform the measurement procedure independently, which will save a lot of time and cost.

Next, an aspect of the fourth embodiment will be described. FIG. 6 (A) is a detailed flowchart of the measurement method of the measurement system 1 according to the fourth embodiment of the present invention, and FIG. 6 (B) is a schematic diagram of the operation of the measurement method of the fourth embodiment of the present invention. Refer to Figure 3.

As shown in FIG. 6 (A) and FIG. 6 (B), first steps S61 to S63 are performed; since steps S61 to S63 are similar to steps S21 to S23 of FIG. 2, they will not be described in detail. Step S64 is then performed. After the common item measurement of the DUTs 41 to 44 is completed, the measurement workstations 21 to 24 each perform a specific item measurement program, and the measurement items of the specific item measurement program can be determined according to each The requirements of the measuring elements 41 to 44 are adjusted individually. Step S65 is then performed, and the DUTs 41 to 44 each perform a specific item measurement procedure (Test_1 to Test_4), and at least two DUT (eg, DUTs 41 and 42) specific item measurement procedures (Test_1, Test_2) ) At least partially overlap. Step S66 is then performed. When the specific item measurement procedure (Test_1 ~ Test_4) of each of the DUTs 41 to 44 is completed, the measurement workstations 21 to 24 respectively transmit the measurement results to the main control device 10, and the main control device 10 The control device 10 aggregates the measurement results.

In this embodiment, the specific demand item measurement procedures of the DUTs 41 to 44 can be performed individually, and are not limited to be performed simultaneously. For example, the specific demand item measurement program (Test_2) of the DUT 42 may be started after a period of time when the specific demand item measurement program (Test_1) of the DUT 41 is started, and is not limited thereto. Therefore, the measurement method of the present invention can be defined as that at least two components under test (eg, components under test 41, 42) require specific measurement items (such as Test_1, Test_2) to overlap during the execution period (such as overlapping period O1) .

In this way, the present invention can perform the specific requirements measurement procedures of the DUTs simultaneously, and can be applied to various types of DUTs, which can greatly reduce the measurement time and improve the measurement efficiency.

The above embodiments are merely examples for the convenience of description. The scope of the claimed rights of the present invention should be based on the scope of the patent application, rather than being limited to the above embodiments.

Claims (10)

A measurement system includes: a main control device; and a plurality of measurement stations, each of which is connected to the main control device, and each measurement station corresponds to a component to be tested; wherein, the measurement stations are based on the main An instruction from the control device and simultaneously perform a common item measurement procedure on the corresponding DUT, and the measurement workstations each perform an adjustable measurement item according to the corresponding needs of the DUT. Specific demand item measurement procedures, in which at least two specific demand item measurement procedures are partially overlapped during the execution period; wherein when the common item measurement procedure of the waiting-for-measurement component is completed, each measurement workstation is more in accordance with the corresponding The measurement result of the common item measurement program of the test component is used to adjust the specific item measurement program of the test component; wherein when the specific item measurement program of each test component is adjusted, the waiting test component Receives a measurement signal corresponding to its specific project measurement procedure, and enters its respective signal response period, and enters its own after the signal response period ends. A certain item measurement procedure; when an abnormal signal response occurs in one of the components under test, the remaining components under test continue to perform the corresponding signal response period, and enter their respective specific item measurement procedures after the signal response period ends . The measurement system according to item 1 of the scope of patent application, wherein when the common item measurement procedure and the specific measurement item procedure of the awaiting measurement element are completed, the measurement stations each transmit a measurement result to The master control device. The measurement system according to item 1 of the scope of patent application, wherein the specific item measurement procedure of the waiting-for-measurement element is performed between two common item measurement procedures. The measurement system according to item 1 of the scope of patent application, wherein the common item measurement procedure or the specific item measurement procedure includes a signal response period of an integrated circuit and an actual measurement period. The measurement system according to item 1 of the scope of patent application, wherein the measurement stations perform the measurement procedure of the specific item synchronously. A measurement method is executed by a measurement system, wherein the measurement system includes a main control device and a plurality of measurement workstations connected to the main control device, wherein each measurement workstation corresponds to a component to be tested, the The measurement method includes the following steps: each measurement station simultaneously performs a common item measurement procedure on the corresponding component under test according to an instruction of the main control device; and each measurement station performs a corresponding measurement procedure according to the corresponding A specific item measurement procedure of an adjustable measurement item is separately performed for the demand of the component under test, in which at least two specific demand item measurement procedure parts are overlapped in duration; each measurement station is caused to correspond to the corresponding one The steps of a specific item measurement procedure for each of the components under test that can be adjusted for measurement can further include sub-steps: after the common item measurement procedure for the waiting component under test is completed, according to the common for each component under test, The measurement results of the item measurement program, respectively adjust the specific item measurement program of each DUT; and when the specific item quantity of each DUT is adjusted After the procedure is adjusted, each DUT receives a measurement signal corresponding to its specific item measurement procedure, and enters its own signal response period, and enters its own specific item measurement procedure after the signal response period ends. Wherein, when the signal response of one of the DUTs is abnormal, the remaining DUTs continue to perform the corresponding signal response period, and enter their respective specific item measurement procedures after the signal response period ends. The measurement method according to item 6 of the scope of patent application, further comprising the step of: after the common item measurement procedure and the specific item measurement procedure of the awaiting measurement element are completed, a The measurement results are transmitted to the main control device. The measurement method according to item 6 of the patent application scope, wherein the specific item measurement procedure of the waiting-for-measurement element is performed between two common item measurement procedures. The measurement method according to item 6 of the scope of patent application, wherein the common item measurement procedure or the specific item measurement procedure includes a signal response period of an integrated circuit and an actual measurement period. The measurement method according to item 9 of the scope of patent application, wherein the measurement stations perform the measurement procedure of the specific item simultaneously.