TWI663405B - Automatic change apparatus for probe - Google Patents

Automatic change apparatus for probe Download PDF

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Publication number
TWI663405B
TWI663405B TW107103852A TW107103852A TWI663405B TW I663405 B TWI663405 B TW I663405B TW 107103852 A TW107103852 A TW 107103852A TW 107103852 A TW107103852 A TW 107103852A TW I663405 B TWI663405 B TW I663405B
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Taiwan
Prior art keywords
probe
rotating
rotating plate
rotation
plate
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TW107103852A
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Chinese (zh)
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TW201835577A (en
Inventor
李尙文
鄭載學
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南韓商De&T股份有限公司
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere

Abstract

本發明關於探頭自動更換裝置。上述探頭自動更換裝置包括:轉動桿,能夠以設定的軸為基準按照設定的角度進行轉動;轉動板,與上述轉動桿相連接,並根據上述轉動桿的轉動進行轉動;複數個固定體,以兩個以上的數量設置於上述轉動板,根據上述轉動板的轉動進行轉動,並固定有與顯示裝置的接觸部相接觸的探頭。 The invention relates to an automatic probe changing device. The above-mentioned automatic probe changing device includes: a rotating rod capable of rotating at a set angle with a set axis as a reference; a rotating plate connected to the rotating rod and rotating according to the rotation of the rotating rod; a plurality of fixed bodies to Two or more numbers are provided on the rotating plate, and are rotated in accordance with the rotation of the rotating plate, and a probe contacting a contact portion of the display device is fixed.

Description

探頭自動更換裝置    Automatic probe changing device   

本發明關於一種探頭自動更換裝置。尤其,關於一種可自動更換藉由與顯示裝置相接觸來試驗顯示裝置是否出現故障的探頭的裝置。 The invention relates to an automatic probe changing device. In particular, the present invention relates to a device capable of automatically replacing a probe that tests whether a display device malfunctions by coming into contact with the display device.

隨著資訊技術的發展,作為使用者與資訊之間的連接媒介的顯示裝置的市場正在增加。由此,液晶顯示裝置(Liquid Crystal Display)、有機發光二極體顯示裝置(Organic Light Emitting Diodes Display)以及電漿顯示裝置面板(Plasma Display Panel)等的顯示裝置的使用正在增加。 With the development of information technology, the market for display devices as a connection medium between users and information is increasing. As a result, the use of liquid crystal display devices (Liquid Crystal Display), organic light emitting diode display devices (Organic Light Emitting Diodes Display), and display devices such as plasma display panel (Plasma Display Panel) is increasing.

一般而言,顯示裝置中的液晶顯示裝置可包括:顯示裝置面板,由填充在電晶體陣列基板和濾色器基板之間的規定單元一間隙的液晶層構成;驅動電路部,用於驅動液晶顯示裝置面板;以及背光單元,用於向液晶顯示裝置面板照射光。 Generally speaking, a liquid crystal display device in a display device may include a display device panel composed of a liquid crystal layer filled in a predetermined unit and a gap between a transistor array substrate and a color filter substrate; and a driving circuit portion for driving the liquid crystal. A display device panel; and a backlight unit for irradiating light to the liquid crystal display device panel.

亦即,顯示裝置由相對貼合下部基板和上部基板形成,上述下部基板藉由交叉複數個閘極線及複數個資料線來定義複數個畫素區域,在上述上部基板形成有濾色器和公共電極。在此情況下,在形成液晶面板的下部基板及上部基板之間也可具有使兩個基板之間維持固定間距的間隔物及液晶層。 That is, the display device is formed by relatively bonding a lower substrate and an upper substrate. The lower substrate defines a plurality of pixel regions by crossing a plurality of gate lines and a plurality of data lines. A color filter and a color filter are formed on the upper substrate. Common electrode. In this case, a spacer and a liquid crystal layer may be provided between the lower substrate and the upper substrate forming the liquid crystal panel to maintain a fixed distance between the two substrates.

為了檢查各畫素區域的閘極線及資料線是否短路或斷開, 在顯示裝置形成有從閘極線及資料線延伸的閘極焊盤、資料焊盤及公共電壓焊盤,並將各焊盤與用於點燈檢查的檢查裝置(探頭)相連接,以提供各種測試訊號。 In order to check whether the gate line and the data line of each pixel area are short-circuited or disconnected, a gate pad, a data pad, and a common voltage pad extending from the gate line and the data line are formed on the display device. The pads are connected to an inspection device (probe) for lighting inspection to provide various test signals.

像這樣執行試驗步驟的原因是,即使顯示裝置的大部分的步驟由機械自動化製造,但是還不能100%所有產品都完全地藉由機械機動化製造。 The reason why the test steps are performed like this is that even though most of the steps of the display device are manufactured by mechanical automation, 100% of all products cannot be manufactured completely by mechanical motorization.

亦即,在一些部分中不免會產生不良品,由於這種不良品的商品性差,因而銷售前進行過濾不良品的檢查作業尤為重要。 That is to say, defective products are inevitably generated in some parts. Due to the poor commerciality of such defective products, it is particularly important to inspect the defective products before filtering.

圖1為示出現有探頭和探頭固定裝置的圖。 FIG. 1 is a diagram showing a conventional probe and a probe fixing device.

探頭10包括電纜端口11、印刷電路板(PCB)12、接觸部13。電纜端口11接收電源,並將該電源供給至印刷電路板12。電纜端口11所接收的電源供給至印刷電路板12。接觸部13與所要判斷正常與否的顯示裝置對齊並相接觸。與接觸部13相接觸的顯示裝置可藉由探頭10來確認是否有故障(例如,是否點燈)。 The probe 10 includes a cable port 11, a printed circuit board (PCB) 12, and a contact portion 13. The cable port 11 receives power and supplies the power to the printed circuit board 12. The power received by the cable port 11 is supplied to the printed circuit board 12. The contact portion 13 is aligned and in contact with a display device to be judged to be normal or not. The display device that is in contact with the contact portion 13 can confirm whether there is a malfunction (for example, whether it is turned on) by the probe 10.

探頭固定裝置包括固定架40和固定於固定架的固定體50。 The probe fixing device includes a fixing frame 40 and a fixing body 50 fixed to the fixing frame.

探頭10固定於固定體50,以使上述接觸部13與顯示裝置的接觸部相接觸並試驗顯示裝置是否工作。 The probe 10 is fixed to the fixed body 50 so that the above-mentioned contact portion 13 is in contact with the contact portion of the display device and tests whether the display device operates.

製造探頭10時,形成為規定的形狀,探頭10的接觸部13也在製造時被已確定形狀。因此,有必要將固定於探頭固定裝置的探頭10變更對齊到所要接觸的顯示裝置的接觸部。進行試驗的操作者從固定體分離探頭10,以將新的探頭10組裝在固定體50後進行試驗。 When the probe 10 is manufactured, it is formed into a predetermined shape, and the contact portion 13 of the probe 10 is also shaped at the time of manufacture. Therefore, it is necessary to change the alignment of the probe 10 fixed to the probe fixing device to the contact portion of the display device to be contacted. The test operator separates the probe 10 from the fixed body to assemble a new probe 10 to the fixed body 50 and performs the test.

然而,以往,在將上述探頭重新組裝到固定體50的過程中,會遇到以下的問題。 However, conventionally, the following problems have been encountered in the process of reassembling the probe to the fixed body 50.

首先,在組裝的正確性產生問題。當探頭的接觸部與顯示 裝置的接觸部錯接時,不能執行正常的試驗,因此,探頭的接觸部與顯示裝置的接觸部的非常精確地匹配並相接觸是重要的。然而,探頭的重量較重,因此,在將其固定於固定體的過程中,產生操作者不能精確地將探頭水平固定於固定體的問題。亦即,這意味著更換固定探頭的作業可根據操作者的熟練度而其精確組裝度被變更。亦即,可產生依賴操作者的技能的問題。 First, problems arise in the correctness of assembly. When the contact portion of the probe and the contact portion of the display device are misconnected, a normal test cannot be performed. Therefore, it is important that the contact portion of the probe and the contact portion of the display device are accurately matched and come into contact. However, the probe is heavy, and therefore, in the process of fixing the probe to the fixed body, there is a problem that an operator cannot accurately fix the probe horizontally to the fixed body. That is, this means that the work of replacing the fixed probe can be changed in its precise assembly degree according to the skill of the operator. That is, a problem that depends on the skills of the operator may arise.

其次,產生浪費時間的問題。執行試驗的操作者需要對大量的顯示裝置進行檢查,並且在分解探頭並重新組裝過程中消耗很多時間。這種時間的浪費不僅對操作者的作業成果產生影響,而且從管理者的角度也被歸結為損失。 Second, there is the problem of wasting time. The operator performing the test needs to inspect a large number of display devices, and consumes a lot of time in disassembling the probe and reassembling it. This waste of time not only affects the operator's work results, but also comes down to a loss from the manager's perspective.

[先前技術文獻] [Prior technical literature]

[專利文獻] [Patent Literature]

專利文獻0001:韓國授權專利“用於檢查顯示面板的點燈的探頭裝置(PROBE APPARATUS USED FOR TESTING LIGHTING OF A DISPLAY PANEL)”。 Patent Document 0001: Korean authorized patent "PROBE APPARATUS USED FOR TESTING LIGHTING OF A DISPLAY PANEL".

專利文獻0002:韓國授權專利“顯示面板點燈檢查方法(Method for Light Test of Display Panel)”。 Patent Document 0002: Korean authorized patent "Method for Light Test of Display Panel".

本發明的目的在於,提供用於解決上述問題的探頭自動更換裝置。 An object of the present invention is to provide an automatic probe changing device for solving the above problems.

亦即,本發明的目的在於,提供探頭自動更換裝置,以解決從固定體分離探頭,並在重新組裝新的探頭的過程中,依賴操作者的熟練度的現有問題。 That is, an object of the present invention is to provide an automatic probe changing device to solve the existing problems of separating a probe from a fixed body and relying on the skill of an operator in the process of reassembling a new probe.

並且,本發明的目的在於提供藉由節約組裝新探頭的時間來提高作業的效率探頭自動更換裝置。 Furthermore, an object of the present invention is to provide an automatic probe changing device that saves time in assembling a new probe to improve work efficiency.

本發明所要解決的技術問題並不局限於以上所提及的技術問題,從下面的描述中,本發明所屬技術領域中具有通常知識者可以清楚地理解未提及的其他技術問題。 The technical problems to be solved by the present invention are not limited to the above-mentioned technical problems. From the following description, those with ordinary knowledge in the technical field to which the present invention belongs can clearly understand other technical problems not mentioned.

本發明的探頭自動更換裝置包括:轉動桿,能夠以設定的軸為基準按照設定的角度進行轉動;轉動板,與上述轉動桿相連接,並根據上述轉動桿的轉動進行轉動;複數個固定體,以兩個以上的數量設置於上述轉動板,根據上述轉動板的轉動進行轉動,並固定有與顯示裝置的接觸部相接觸的探頭。 The automatic probe changing device of the present invention includes: a rotating rod capable of rotating at a set angle based on a set axis; a rotating plate connected to the rotating rod and rotating according to the rotation of the rotating rod; a plurality of fixed bodies A plurality of probes are arranged on the rotating plate in two or more numbers, rotate according to the rotation of the rotating plate, and fix a probe contacting the contact portion of the display device.

其中,本發明包括馬達,上述馬達藉由與上述轉動桿相連接來賦能使上述轉動桿進行轉動的設定的轉動力。 Wherein, the present invention includes a motor, and the motor is connected to the rotation lever to impart a set turning force to rotate the rotation lever.

其中,在轉動板形成有複數個設置槽,上述複數個設置槽以沿著上述轉動板的周圍隔開設定間距的方式設置,在上述複數個固定體分別形成有與上述設置槽相對應的固定孔,向上述設置槽和固定孔插入固定單元來使上述複數個固定體分別固定於上述轉動板。 Wherein, a plurality of installation grooves are formed in the rotating plate, and the plurality of installation grooves are provided so as to be spaced apart from each other along the circumference of the rotation plate, and fixings corresponding to the installation grooves are respectively formed in the plurality of fixing bodies. A fixing unit is inserted into the installation groove and the fixing hole to fix the plurality of fixing bodies to the rotating plate, respectively.

其中,上述固定體包括:支撐部,藉由至少以設定面積與上述轉動板的相接觸來被支撐,並形成有上述固定孔;以及延伸部,從上述支撐部的兩端向一方向延伸來固定上述探頭。 Wherein, the fixed body includes: a support portion that is supported by being in contact with the rotating plate at least at a set area and is formed with the fixing hole; and an extension portion that extends from both ends of the support portion in one direction. Fix the above probe.

其中,在轉動板形成有切開部,上述切開部以從上述兩端延伸的延伸部之間的隔開距離被切開,使得上述轉動板不與上述延伸部相接觸。 A cutting portion is formed in the rotating plate, and the cutting portion is cut at a distance between the extending portions extending from the two ends so that the rotating plate does not contact the extending portion.

其中,轉動板具有中心部,當從上述轉動板的中心部朝向各個上述複數個設置槽畫出虛擬直線時,上述虛擬直線維持等角並具有相同的長度。 Wherein, the rotating plate has a central portion, and when a virtual straight line is drawn from the central portion of the rotating plate toward each of the plurality of setting grooves, the virtual straight lines maintain an equal angle and have the same length.

藉由上述結構形成的本發明由於僅需首次固定探頭而無需分離並重新組裝探頭過程,因而可解決現有的探頭的組裝依賴於操作者的熟練度的問題。 The invention formed by the above-mentioned structure can solve the problem that the assembly of the existing probe depends on the skill of the operator, because the probe only needs to be fixed for the first time without the need to separate and reassemble the probe.

並且,藉由上述結構形成的本發明無需將任一個探頭更換為另一個探頭,僅按照設定的角度轉動轉動台,來使新探頭的接觸部與顯示裝置的接觸部相接觸,從而可節約現有的分離並重新組裝探頭時所浪費的時間。 In addition, the present invention formed by the above structure does not need to replace any probe with another probe, and only rotates the turntable according to a set angle to make the contact portion of the new probe contact the contact portion of the display device, thereby saving the existing Time wasted while separating and reassembling the probe.

10‧‧‧探頭 10‧‧‧ Probe

11‧‧‧電纜端口 11‧‧‧cable port

12‧‧‧印刷電路板 12‧‧‧printed circuit board

13‧‧‧接觸部 13‧‧‧Contact

40‧‧‧固定架 40‧‧‧ fixed frame

50‧‧‧固定體 50‧‧‧Fixed body

60‧‧‧固定機構 60‧‧‧Fixed institutions

100‧‧‧轉動板 100‧‧‧Rotating plate

110‧‧‧切開部 110‧‧‧ Cutting section

120‧‧‧設置槽 120‧‧‧ set slot

130‧‧‧螺栓槽 130‧‧‧bolt groove

140‧‧‧支撐部插入槽 140‧‧‧ support part insertion slot

200‧‧‧固定體 200‧‧‧Fixed body

210‧‧‧支撐部 210‧‧‧ support

220‧‧‧延伸部 220‧‧‧ extension

240‧‧‧螺栓孔 240‧‧‧ Bolt holes

300‧‧‧控制部 300‧‧‧ Control Department

400‧‧‧馬達 400‧‧‧ Motor

500‧‧‧位置識別感應器 500‧‧‧Position recognition sensor

圖1為示出先前技術之探頭固定裝置的圖。 FIG. 1 is a diagram showing a probe fixing device of the prior art.

圖2為示出本發明的探頭自動更換裝置的圖。 FIG. 2 is a diagram showing an automatic probe changing device according to the present invention.

圖3為示出本發明另一實施例的探頭自動更換裝置的圖。 FIG. 3 is a diagram showing an automatic probe changing device according to another embodiment of the present invention.

圖4為示出本發明又一實施例的探頭自動更換裝置的圖。 FIG. 4 is a diagram showing an automatic probe changing device according to another embodiment of the present invention.

以下,藉由例示性圖式對本發明一實施例進行詳細說明。然而,這並不意圖限制本發明的範圍。 Hereinafter, an embodiment of the present invention will be described in detail by using illustrative drawings. However, this is not intended to limit the scope of the invention.

應該注意的是,在對各圖式的結構要素添加元件符號時,即使在不同的圖式中示出了相同的結構要素,也盡可能使用相同的元件符號。並且,在說明本發明的過程中,在判斷為相關公知結構或功能的說明有可能使本發明的主旨變得模糊的情況下,將省略對其的詳細說明。 It should be noted that when adding element symbols to the structural elements of each drawing, even if the same structural elements are shown in different drawings, the same element symbols are used as much as possible. In the course of explaining the present invention, if it is determined that the description of the related known structure or function may obscure the gist of the present invention, the detailed description thereof will be omitted.

並且,圖式所示的結構要素的大小或形狀等可以為了說明的明確性和方便而以誇張的方式示出。考慮到本發明的結構和作用而特別定義的術語僅用於解釋本發明的實施例,並不限制本發明的範圍。 In addition, the size, shape, and the like of the structural elements shown in the drawings may be exaggerated for clarity and convenience of explanation. Terms specifically defined in consideration of the structure and function of the present invention are only used to explain the embodiments of the present invention, and do not limit the scope of the present invention.

本發明的探頭自動更換裝置包括轉動板100、轉動桿、馬達 400、複數個固定體200、控制部300。 The automatic probe changing device of the present invention includes a rotating plate 100, a rotating rod, a motor 400, a plurality of fixed bodies 200, and a control unit 300.

轉動板100呈設定的形狀,並在其中央部形成中心孔。 The rotating plate 100 has a predetermined shape, and a center hole is formed in a central portion thereof.

轉動桿插入並連接到轉動板100的中心孔。因此,當轉動桿轉動時,根據轉動桿的轉動而轉動。 The rotation lever is inserted and connected to a center hole of the rotation plate 100. Therefore, when the rotation lever is rotated, it is rotated in accordance with the rotation of the rotation lever.

在圖2中,作為一例顯示轉動板100呈圓形,但是顯然不局限與此。然而,當轉動板100在轉動時,較佳不觸碰與轉動板100隔開配置並固定的顯示裝置,因此,較佳地,轉動板100呈圓形。 In FIG. 2, the rotating plate 100 is shown as a circle as an example, but it is obviously not limited thereto. However, when the rotating plate 100 is rotating, it is preferable not to touch a display device which is arranged and fixed at a distance from the rotating plate 100. Therefore, the rotating plate 100 is preferably circular.

在轉動板100形成有沿著上述轉動板100的周圍相互隔開的複數個設置槽120。該設置槽120使固定體200與轉動板100相連接。亦即,將設置槽120與固定孔對應配置後,可藉由貫通並連接固定體200與設置槽120的連接機構來使其相連接。 A plurality of installation grooves 120 are formed in the rotating plate 100 along the periphery of the rotating plate 100. The installation groove 120 connects the fixed body 200 and the rotating plate 100. That is, after the installation grooves 120 are arranged corresponding to the fixing holes, they can be connected by a connection mechanism that penetrates and connects the fixing body 200 and the installation grooves 120.

其中,作為一例,連接機構可以是把手(knob)。然而,本發明並不局限與此,利用任何可以藉由其他機構固定的機構都不成問題。 Among them, as an example, the connection mechanism may be a knob. However, the present invention is not limited to this, and it is not a problem to use any mechanism that can be fixed by other mechanisms.

在轉動板100的兩端可設置有與設置槽120隔開的螺栓槽130。該螺栓槽130藉由固定體200的螺栓孔240來進行輔助固定體200的固定的作用。 Bolt grooves 130 spaced from the installation grooves 120 may be provided at both ends of the rotating plate 100. The bolt groove 130 assists the fixing of the fixed body 200 through the bolt hole 240 of the fixed body 200.

亦即,如上所述,當固定體200的固定孔配置為對應於設置槽120時,形成於兩端的螺栓孔240則被配置為對應於螺栓槽130。在此情況下,螺栓插入於螺栓孔240和螺栓槽130,使得固定體200與轉動板100更牢固地相連接。這是為了消除如下的可能性,亦即,在轉動板100轉動的情況下,複數個固定體200與轉動板100一同進行轉動的同時,因其轉動力,以上述固定機構60為軸而自轉,從而可改變已固定的位置。 That is, as described above, when the fixing hole of the fixing body 200 is configured to correspond to the installation groove 120, the bolt holes 240 formed at both ends are configured to correspond to the bolt groove 130. In this case, the bolt is inserted into the bolt hole 240 and the bolt groove 130, so that the fixed body 200 and the rotating plate 100 are more firmly connected. This is to eliminate the possibility that, when the rotating plate 100 rotates, the plurality of fixed bodies 200 rotates together with the rotating plate 100, and rotates with the fixing mechanism 60 as an axis due to the rotational force thereof. To change the fixed position.

轉動板100的設置槽120形成為複數個,在該複數個設置 槽120分別設置有固定體200。亦即,在轉動板100固定設置有複數個固定體200。該被設置的固定體200可分別與探頭10相連接,將在說明固定體200時進行詳細描述,以避免重複提及。 A plurality of installation grooves 120 of the rotary plate 100 are formed, and the fixed bodies 200 are provided in the plurality of installation grooves 120, respectively. That is, a plurality of fixing bodies 200 are fixedly provided on the rotating plate 100. The fixed bodies 200 provided can be connected to the probes 10 respectively, and will be described in detail when the fixed body 200 is described, so as to avoid repeated references.

轉動板100的設置槽120與轉動板100的中心部隔開相同距離,並具有相等的角度。亦即,當從轉動板100的中心部朝向各個複數個設置槽120畫出虛擬直線時,上述虛擬直線維持等角,並具有相同的長度。這是為了精準的位置控制和控制的便利性。 The installation groove 120 of the rotating plate 100 is spaced apart from the center of the rotating plate 100 by the same distance and has an equal angle. That is, when a virtual straight line is drawn from the central portion of the rotating plate 100 toward each of the plurality of setting grooves 120, the virtual straight lines maintain an equal angle and have the same length. This is for the convenience of precise position control and control.

如上所述,在從轉動板100的中心部隔開相同距離而形成的複數個設置槽120固定有複數個固定體200,在該固定體200分別設置有複數個探頭10。如果由於轉動板100轉動,因而與已配置的探頭10不同的另一探頭10的接觸部13與顯示器的接觸部具有不同的距離,則精準對齊顯示器的作業變得非常困難。並且,若探頭10不以等角固定於轉動板100,則在將任一個探頭10與固定於其他位置的探頭10進行更換的情況下,使轉動板100的轉動角度每次都不一樣,因而難以將轉動板100轉動到精準的位置。 As described above, a plurality of fixing bodies 200 are fixed to the plurality of installation grooves 120 formed at the same distance from the center portion of the rotating plate 100, and the plurality of probes 10 are respectively provided in the fixing bodies 200. If the contact plate 13 of another probe 10 which is different from the configured probe 10 has a different distance from the contact portion of the display due to the rotation of the rotating plate 100, it becomes very difficult to precisely align the display. In addition, if the probe 10 is not fixed to the rotating plate 100 at an equal angle, when any one of the probes 10 is replaced with a probe 10 fixed at another position, the rotating angle of the rotating plate 100 is different every time. It is difficult to turn the rotating plate 100 to a precise position.

為了解決這種問題,較佳地,複數個設置槽120從轉動板100的中心部具有相同的距離,並分別以等角沿著轉動板100的周圍配置。然而,根據情況明顯可以變更上述內容。 In order to solve such a problem, it is preferable that the plurality of setting grooves 120 have the same distance from the center portion of the rotating plate 100 and are arranged along the periphery of the rotating plate 100 at equal angles, respectively. However, it is obvious that the above can be changed depending on the situation.

轉動桿以設定的軸為基準進行轉動。轉動桿設置於轉動板100的中心孔。因此,轉動板100也根據轉動桿的轉動而轉動。轉動桿與馬達400相連接。 The rotation lever rotates based on the set axis. The rotation lever is disposed in a center hole of the rotation plate 100. Therefore, the rotation plate 100 is also rotated in accordance with the rotation of the rotation lever. The rotation lever is connected to the motor 400.

其中,轉動桿與馬達400相連接,使得轉動軸變更為垂直。 Among them, the rotation lever is connected to the motor 400 so that the rotation axis is changed to be vertical.

儘管未作為一例在本說明書的圖式中示出,但馬達400的軸與轉動桿可藉由錐齒輪相連接。因此,在圖2中,以橫軸為 基準進行轉動的馬達400可使以縱軸為軸進行轉動的轉動桿進行轉動。 Although not shown in the drawings of this specification as an example, the shaft of the motor 400 and the rotation lever may be connected by a bevel gear. Therefore, in FIG. 2, the motor 400 that rotates with the horizontal axis as a reference can rotate the rotation lever that rotates with the vertical axis as an axis.

其中,作為一例,將馬達400的轉動軸與轉動桿的轉動軸的變更作為錐齒輪進行了說明,但並不局限與此,也可以在轉動桿與馬達400之間設置減速器等,以將馬達400的轉動軸變更為垂直,並傳遞至轉動桿。 Among them, as an example, the change of the rotation axis of the motor 400 and the rotation axis of the rotation lever has been described as a bevel gear, but it is not limited to this. A reduction gear or the like may be provided between the rotation lever and the motor 400 to change The rotation axis of the motor 400 is changed to vertical and transmitted to the rotation lever.

馬達400應當被控制成能夠以設定角度向第一方向轉動,以及以設定角度向與第二方向相反的第二方向轉動。其中,當第一方向為順時針方向,則第二方向意味著逆時針方向,反之亦然。作為一例,馬達400可使不僅馬達400或伺服馬達400。 The motor 400 should be controlled to be capable of rotating in a first direction at a set angle and in a second direction opposite to the second direction at a set angle. Wherein, when the first direction is clockwise, the second direction means counterclockwise, and vice versa. As an example, the motor 400 may be not only the motor 400 or the servo motor 400.

馬達400與控制部300相連接,並根據控制訊號執行工作。控制部300藉由對馬達400施加第一訊號和第二訊號來控制馬達400。接收控制部300的第一訊號的馬達400向第一方向進行轉動,接收第二訊號的馬達400向第二方向進行轉動。 The motor 400 is connected to the control unit 300 and performs a work according to a control signal. The control unit 300 controls the motor 400 by applying a first signal and a second signal to the motor 400. The motor 400 receiving the first signal of the control unit 300 rotates in the first direction, and the motor 400 receiving the second signal rotates in the second direction.

亦即,馬達400可由控制部300所施加的訊號被動地工作。由此,藉由馬達400的設定方向的設定轉動來轉動轉動板100,從而轉動板100可藉由轉動來將已設置的複數個探頭10中所期望的探頭10移動到與顯示裝置相對應的位置。 That is, the motor 400 can be passively operated by a signal applied from the control unit 300. Thereby, the rotation plate 100 is rotated by the set rotation of the setting direction of the motor 400, so that the rotation plate 100 can move the desired probe 10 among the plurality of probes 10 which have been set to the display device by rotation. position.

固定體200可在轉動板100設置為複數個。固定體200包括支撐部210和延伸部220。支撐部210作為與轉動板100相接觸並被支撐的部分,即使探頭10固定設置於固定體200也可以支撐探頭10。 A plurality of the fixing bodies 200 may be provided on the rotating plate 100. The fixed body 200 includes a support portion 210 and an extension portion 220. The support portion 210 is a portion that is in contact with and supported by the rotating plate 100, and can support the probe 10 even if the probe 10 is fixed to the fixed body 200.

參照圖2,延伸部220從支撐部210的兩端向一方向延伸而成,延伸部220向遠離轉動板100的中心部的方向形成在支撐部210的兩端。亦即,形成兩個延伸部220。在兩個延伸部220的端部形成第一插入孔。探頭10以連接上述兩個延伸部220的 隔開距離之間的形態配置於兩個延伸部200之間的隔開距離,在兩端形成第二插入孔,該第二插入孔與第一插入孔相對應,並且螺栓、螺母插入於第一插入孔和第二插入孔,使得探頭10固定於固定體200。 Referring to FIG. 2, the extension portion 220 is extended in one direction from both ends of the support portion 210, and the extension portion 220 is formed at both ends of the support portion 210 in a direction away from the center portion of the rotating plate 100. That is, two extensions 220 are formed. A first insertion hole is formed at an end portion of the two extension portions 220. The probe 10 is arranged at a separation distance between the two extensions 200 in a form connecting the separation distance between the two extensions 220, and a second insertion hole is formed at both ends, and the second insertion hole and the first insertion The holes correspond to each other, and bolts and nuts are inserted into the first insertion hole and the second insertion hole, so that the probe 10 is fixed to the fixed body 200.

在轉動板100可形成有切開部110,使得與固定體200的支撐部210相接觸,而不與延伸部220相接觸。在轉動板100中,由於形成切開部110,在固定體200的兩個延伸部220之間形成可連通上部和下部的連通部分。 A cutout portion 110 may be formed on the rotating plate 100 so as to be in contact with the support portion 210 of the fixed body 200 and not in contact with the extension portion 220. In the rotating plate 100, since the cutout portion 110 is formed, a communication portion that can communicate the upper and lower portions is formed between the two extension portions 220 of the fixed body 200.

由於切開部110是連通轉動板100的上部和下部的空間,因而可穿過各種線(Line)。因此,藉助上述線防止轉動板100的受到阻礙。 Since the cutout portion 110 is a space connecting the upper and lower portions of the rotating plate 100, it can pass through various lines. Therefore, obstruction of the rotating plate 100 is prevented by the above-mentioned wires.

圖3為示出本發明另一實施例的探頭自動更換裝置的圖。 FIG. 3 is a diagram showing an automatic probe changing device according to another embodiment of the present invention.

在本發明另一實施例的探頭自動更換裝置設置有位置識別感應器500,上述位置識別感應器500以向從支撐部210的兩側延伸的延伸部220的內側隔開設置。 In another embodiment of the present invention, a probe automatic replacement device is provided with a position recognition sensor 500. The position recognition sensor 500 is spaced from the inside of the extension portion 220 extending from both sides of the support portion 210.

其中,如圖3所示,較佳地,位置識別感應器500靠近延伸部220。這是防止訊號由探頭10的連接器阻斷的位置。 Among them, as shown in FIG. 3, preferably, the position recognition sensor 500 is close to the extending portion 220. This is a position where the signal is prevented from being blocked by the connector of the probe 10.

該位置識別感應器500與控制部300相連接,並將檢測訊號輸出到控制部300,並且被未圖示的設置於與配置有顯示裝置的工作臺的對應位置的又一位置識別感應器檢測。 The position recognition sensor 500 is connected to the control unit 300, and outputs a detection signal to the control unit 300. .

由此,轉動工作臺按照馬達400的轉動以設定角度轉動,來在已配置的探頭10變更為其他探頭10的情況下,僅藉由簡單轉動也能掌握正確的位置,從而可更容易地將顯示器的接觸部與探頭10的接觸部13對齊。 Thus, the rotary table rotates at a set angle in accordance with the rotation of the motor 400, so that when the configured probe 10 is changed to another probe 10, the correct position can be grasped only by simple rotation, so that it is easier to move The contact portion of the display is aligned with the contact portion 13 of the probe 10.

圖4為示出本發明的又一實施例的探頭自動更換裝置的圖。 FIG. 4 is a diagram showing a probe automatic replacement device according to still another embodiment of the present invention.

根據又一實施例,在轉動板100形成有具有等角且可夾入 固定體200的支撐部210的支撐部插入槽140。 According to still another embodiment, the rotation plate 100 is formed with a support portion insertion groove 140 having an equiangular shape and capable of sandwiching the support portion 210 of the fixed body 200.

亦即,固定體200藉由夾入於支撐部插入槽140來與轉動板100第一次相連接,並藉由貫通插入槽和插入槽的固定機構60來與轉動板100第二次相連接。支撐部插入槽140呈與支撐部210相同的形狀,使得即使轉動板100進行轉動,固定體200也不能移動到被夾入的槽以外的位置。 That is, the fixed body 200 is connected to the rotating plate 100 for the first time by being clamped in the support part insertion groove 140, and is connected to the rotating plate 100 for the second time by a fixing mechanism 60 penetrating the insertion groove and the insertion groove. . The support part insertion groove 140 has the same shape as the support part 210, so that even if the rotating plate 100 is rotated, the fixed body 200 cannot move to a position other than the sandwiched groove.

因此,藉由與轉動板100的轉動進行相同的轉動,從而可更容易地控制探頭10。 Therefore, the probe 10 can be controlled more easily by performing the same rotation as the rotation of the rotating plate 100.

雖然已經參照特定實施例示出和說明本發明,但是對於本領域的技術人員而言是顯而易見的,在不脫離根據發明要求保護範圍提供的本發明的技術思想的範圍內,可對本發明進行多種改良及變化。 Although the present invention has been shown and described with reference to specific embodiments, it will be apparent to those skilled in the art that various modifications can be made to the present invention without departing from the technical idea of the present invention provided in accordance with the scope of the claims of the invention. And change.

Claims (4)

一種探頭自動更換裝置,包括:轉動桿,能夠以設定的軸為基準按照設定的角度進行轉動;轉動板,與前述轉動桿相連接,並根據前述轉動桿的轉動進行轉動;以及複數個固定體,以兩個以上的數量設置於前述轉動板,根據前述轉動板的轉動進行轉動,並固定有與顯示裝置的接觸部相接觸的探頭;其中在前述轉動板形成有複數個設置槽,前述複數個設置槽以沿著前述轉動板的周圍隔開設定間距的方式設置;在前述複數個固定體分別形成有與前述複數個設置槽相對應的固定孔;向前述複數個設置槽和前述固定孔插入固定單元來使前述複數個固定體分別固定於前述轉動板;其中前述複數個固定體各自包括:支撐部,藉由至少以設定面積與前述轉動板的相接觸來被支撐,並形成有前述固定孔;以及延伸部,從前述支撐部的兩端向一方向延伸來固定前述探頭。An automatic probe changing device includes: a rotating rod capable of rotating at a set angle with a set axis as a reference; a rotating plate connected to the rotating rod and rotating according to the rotation of the rotating rod; and a plurality of fixed bodies Is provided on the rotating plate in two or more numbers, and is rotated according to the rotation of the rotating plate, and a probe contacting the contact portion of the display device is fixed; wherein a plurality of setting grooves are formed on the rotating plate, and the plurality The plurality of installation grooves are provided so as to be spaced apart from each other along the circumference of the rotation plate; fixed holes corresponding to the plurality of installation grooves are respectively formed in the plurality of fixed bodies; and the plurality of installation grooves and the fixed holes are formed in the plurality of fixed bodies. A fixing unit is inserted to fix the plurality of fixed bodies to the rotating plate, respectively; wherein the plurality of fixed bodies each include a support portion that is supported by contact with the rotating plate at least in a set area, and is formed with the foregoing A fixing hole; and an extension portion extending in one direction from both ends of the support portion to fix the probe . 如請求項1所記載之探頭自動更換裝置,其中前述探頭自動更換裝置進一步包括馬達,前述馬達藉由與前述轉動桿相連接來賦能使前述轉動桿進行轉動的設定的轉動力。The automatic probe changing device according to claim 1, wherein the automatic probe changing device further includes a motor, and the motor is connected with the rotating rod to impart a set turning force for rotating the rotating rod. 如請求項1所記載之探頭自動更換裝置,其中在前述轉動板形成有切開部,前述切開部以從前述兩端延伸的延伸部之間的隔開距離被切開,使得前述轉動板不與前述延伸部相接觸。The automatic probe replacement device according to claim 1, wherein a cutout portion is formed in the rotation plate, and the cutout portion is cut at a separation distance between extension portions extending from the two ends so that the rotation plate is not connected to the rotation plate. The extensions are in contact. 如請求項1所記載之探頭自動更換裝置,其中前述轉動板具有中心部,當從前述轉動板的中心部朝向各個前述複數個設置槽畫出虛擬直線時,前述虛擬直線維持等角並具有相同的長度。 The automatic probe changing device according to claim 1, wherein the rotary plate has a central portion, and when a virtual straight line is drawn from the central portion of the rotary plate toward each of the plurality of setting grooves, the virtual straight lines maintain an equal angle and have the same angle. length.
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