WO2020098081A1 - Flexible circuit board, display panel, and display device - Google Patents

Flexible circuit board, display panel, and display device Download PDF

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Publication number
WO2020098081A1
WO2020098081A1 PCT/CN2018/123380 CN2018123380W WO2020098081A1 WO 2020098081 A1 WO2020098081 A1 WO 2020098081A1 CN 2018123380 W CN2018123380 W CN 2018123380W WO 2020098081 A1 WO2020098081 A1 WO 2020098081A1
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WIPO (PCT)
Prior art keywords
trace
reserved
substrate
short
circuit board
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PCT/CN2018/123380
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French (fr)
Chinese (zh)
Inventor
黄世帅
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惠科股份有限公司
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Publication of WO2020098081A1 publication Critical patent/WO2020098081A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0268Marks, test patterns or identification means for electrical inspection or testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements

Definitions

  • the present application relates to the field of display technology, in particular to a flexible circuit board, display panel and display device.
  • a flip-chip thin film substrate (Chip On Film, COF) is usually used to connect the printed circuit board (PCB) and the liquid crystal panel together , So that the PCB board can output the drive control signal to the liquid crystal panel to complete the corresponding drive control.
  • the COF substrate has bonding leads. One end of the bonding lead is connected to the PCB board, and the other end is connected to the substrate body of the COF substrate.
  • the traditional method is to remove the COF at the defective location and re-press the other COF. Furthermore, it was determined that the COF or the liquid crystal panel caused the vertical line defect or the horizontal line defect.
  • the traditional detection method requires a dedicated COF laminating machine, and the detection takes a long time, resulting in the low convenience of the traditional COF lamination detection method.
  • a flexible circuit board, a display panel, and a display device are provided to solve the problem of low convenience in operation of a conventional method for detecting poor COF compression.
  • a flexible circuit board including:
  • Short-circuit traces, the short-circuit traces and the welding leads are provided on the same surface of the substrate body, and the short-circuit traces are used to connect an external test pad;
  • Reserved traces are provided on the side of the insulating layer away from the short-circuit traces and the welding leads, and the projections of the reserved traces on the substrate body are The short-circuit trace and the soldered lead cross.
  • a display panel including:
  • a second substrate which is opposite to the first substrate
  • the dielectric layer is provided between the first substrate and the second substrate;
  • a flexible circuit board the flexible circuit board is pressed and connected with the second substrate through the adhesive layer
  • the flexible circuit board includes: a substrate body; a welding lead; a short connection trace, the short connection
  • the trace and the welding lead are provided on the same surface of the substrate body, the short-circuit trace is used to connect an external test pad; an insulating layer, the insulation layer covers the short-circuit trace and the welding lead;
  • reserved traces the reserved traces are provided on a side of the insulating layer away from the short-circuit traces and the welding leads, and the projections of the reserved traces on the substrate body are respectively The short-circuit trace and the soldered lead cross.
  • a display device includes a backlight module and a display panel.
  • the display panel includes:
  • a second substrate which is opposite to the first substrate
  • the dielectric layer is provided between the first substrate and the second substrate;
  • a flexible circuit board the flexible circuit board is pressed and connected with the second substrate through the adhesive layer
  • the flexible circuit board includes: a substrate body; a welding lead; a short connection trace, the short connection
  • the trace and the welding lead are provided on the same surface of the substrate body, the short-circuit trace is used to connect an external test pad; an insulating layer, the insulation layer covers the short-circuit trace and the welding lead;
  • reserved traces the reserved traces are provided on a side of the insulating layer away from the short-circuit traces and the welding leads, and the projections of the reserved traces on the substrate body are respectively The short-circuit trace and the soldered lead cross.
  • FIG. 1 is a schematic structural view of a flexible circuit board in an embodiment
  • FIG. 2 is a schematic diagram of welding reserved traces, short-circuited traces and welding leads in an embodiment
  • FIG. 3 is a schematic structural view of a flexible circuit board in another embodiment
  • FIG. 4 is a schematic structural view of a flexible circuit board in another embodiment
  • FIG. 5 is a schematic structural view of a flexible circuit board in yet another embodiment
  • FIG. 6 is a schematic structural view of a flexible circuit board in another embodiment
  • FIG. 7 is a schematic view of the structure of a display panel in an embodiment.
  • a flexible circuit board includes: a substrate body 100; soldering leads 200; short-circuiting traces 300, the shorting traces 300 and the welding leads 200 are disposed on the same surface of the substrate body 100, short-circuiting traces 300 is used to connect the external test pad 500; an insulating layer (not shown), the insulating layer covers the shorted traces and the welding leads; the trace 400 is reserved, and the trace 400 is set on the insulating layer away from the shorted trace 300 and On one side of the soldering lead 200, the projection of the reserved trace 400 on the substrate body 100 crosses the shorting trace 300 and the soldering lead 200, respectively.
  • the circuit board that provides the drive signal is separated from the substrate that displays based on the drive signal.
  • the drive signal is provided by PCBA (Printed Circuit Board Assembly) and connected through a flexible circuit board (ie COF substrate) To the substrate for display;
  • PCBA refers to the circuit board obtained after SMT (Surface Mount Technology) and DIP (Dual Inline-pin Package) plug-in processing.
  • SMT Surface Mount Technology
  • DIP Dual Inline-pin Package
  • the COF substrate includes a substrate body 100 and soldering leads 200 and shorting traces 300 all provided on the same surface of the substrate body 100, and a reserved trace 400 is provided on a different layer from the soldering lead 200 and the shorting trace 300, The projections of the reserved traces 400 on the substrate body 100 intersect the welding leads 200 and the shorting traces 300, respectively.
  • the reserved trace 400 and the welding lead 200 can be directly soldered to the corresponding intersection point, and the reserved trace 400 and the short circuit can be The position corresponding to the projection intersection point of the line 300 is welded.
  • the position corresponding to the projection intersection point is the pre-corresponding pre-corresponding point when the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300 or the welding lead 200.
  • the shorting trace 300 and the welding lead 200 are connected through the reserved trace 400, so that the signal output from the welding lead 200 can be output to the test pad 500 connected to the shorting trace 300.
  • the oscilloscope probe can be used to directly detect the output waveform of the drive control signal corresponding to the occurrence of the wire defect, and display it on the oscilloscope.
  • the detected waveform is abnormal, it means that the cause of the wire defect is the COF substrate; No abnormality is detected in the detected waveform, which means that the COF substrate is working normally, and the cause of the line defect is the internal problem of the display substrate.
  • a reserved trace 400 is provided inside the COF substrate. When a line defect occurs, there is no need to directly remove the COF substrate, which reduces the detection time and effectively avoids the waste of the COF substrate. It should be noted that, in one embodiment, when the reserved trace 400 is welded to the shorting trace 300 or the reserved trace 400 is welded to the welding lead 200, the laser welding method is used.
  • the number of reserved traces 400 is two or more. Specifically, taking two reserved traces as an example, please refer to FIG. 2, for convenience of description, the welding leads 200 are sequentially numbered as 210, 220, 230, 240, and 250.
  • the number of short-circuit traces 300 inside the COF substrate There are usually two, the first short-circuit trace 310 and the second short-circuit trace 320, of which the welding lead 220 is the welding lead corresponding to the occurrence of wire defect, and the welding lead 230 is the normal working welding lead.
  • the welding lead 220 In order to detect the welding lead The reason for the bad line corresponding to 220, welding the welding lead 220 to the position corresponding to the projected intersection of the first reserved trace 410, and the position corresponding to the projected intersection of the first reserved trace 410 and the first shorted trace 310 At the same time, the welding lead 230 is welded to the position corresponding to the projected intersection of the second reserved trace 420, and the position corresponding to the projected intersection of the second reserved trace 420 and the second shorting trace 320 is welded.
  • the two output waveforms can be displayed on the same oscilloscope, which is convenient for comparative analysis of the waveforms; in another embodiment, two oscilloscopes can also be used to display the correspondence between different welding leads. Waveform, to avoid interference between the two waveform signals, resulting in low accuracy of the detection results, the specific way to display the waveform, you can choose according to the actual situation.
  • the oscilloscope may be preset to have a normal output signal waveform corresponding to the welding lead. As long as the welding lead corresponding to the defective wire is welded to the reserved trace, the signal waveform is output to the oscilloscope for comparative analysis. However, in this embodiment, there is no need to weld the welding leads and reserved wiring corresponding to the normal conditions, which has the advantage of simple operation.
  • the number of welding leads 200 corresponding to simultaneous line defects may be multiple, that is, there are multiple vertical or horizontal lines that are defective.
  • a plurality of corresponding settings of the trace 400 are provided.
  • each welding lead 200 corresponding to a defective wire can be welded with the corresponding reserved trace 400, and the signal is output to the test pad 500 for detection and analysis; it should be noted that in this embodiment, there is also The normal working welding lead 200 is welded to the reserved trace 400, and the reserved trace 400 is welded to the corresponding shorting trace 300, and the normal working waveform is output for comparison with the waveform of the welding lead 200 corresponding to the bad wire.
  • multiple reserved traces 400 may be provided.
  • the corresponding welding lead 200 is welded to the reserved trace 400, and the trace 300 is shorted to the reserved trace Welding line 400; simultaneously welding multiple welding leads 200 corresponding to normal work with different reserved traces 400 simultaneously, outputting multiple waveforms corresponding to normal conditions, and then comparing and analyzing the waveforms corresponding to abnormal conditions, can also detect whether It is a defective wire caused by the COF substrate.
  • By setting multiple reserved traces 400 not only can the detection of multiple defective lines be achieved, but also the accuracy of the detection can be effectively improved.
  • the short-circuit trace 300 includes a main line, and the projection of the reserved trace 400 on the substrate body 100 crosses the main line of the short-circuit trace 300.
  • the welding leads 200 are divided into odd-numbered welding leads and even-numbered welding leads according to the arrangement position, and the odd-numbered and even-numbered columns of pixel signals can be controlled separately by the odd-numbered welding leads and the even-numbered welding leads, which is convenient for testing and identification.
  • the welding leads 200 are respectively connected to the branch lines of the short-circuit trace 300.
  • the branch line of the short-circuit trace 300 is laser cut The connection of the soldering lead 200 is cut off to avoid the mutual influence of the signals when the subsequent COF substrate provides drive control signals to the surface, resulting in abnormal display.
  • the projection of the reserved trace 400 on the substrate body 100 crosses the main line of the short-circuited trace 300 and the welding lead 400 respectively.
  • the corresponding welding lead 200 can be directly connected to the reserved trace 400
  • the reserved trace 400 is welded to the main line of the shorted trace 300, so that the output signal can be transmitted to the test pad 500 connected to the shorted trace 300 via the main line of the shorted trace 300, thereby detecting the cause of the defect.
  • the shorting trace 300 includes a first shorting trace 310 and a second shorting trace 320
  • the reserved trace 400 includes a first reserved trace 410 and a second The reserved trace 420
  • the projection of the first reserved trace 410 on the substrate body 100 crosses the main line of the first shorted trace 310
  • the projection of the second reserved trace 420 on the substrate body 100 and the second short The main line connecting the line 320 crosses.
  • the number of shorting traces 300 is two, which are the first shorting trace 310 and the second shorting trace 320 respectively, and the number of reserved traces 400 is also two, which are respectively reserved for the first The trace 410 and the second reserved trace 420.
  • the first reserved trace 410 and the second reserved trace 420 are in the same direction so that the projections on the substrate body 100 are the same as the corresponding short
  • the main line of the connecting trace 300 crosses, that is, the projection of the first reserved trace 410 on the substrate body 100 crosses the main line of the first shorting trace 310, and the projection of the second reserved trace 420 on the substrate body 100
  • the main lines of the second short-circuit trace 320 cross.
  • the corresponding welding lead 200 is welded to the first reserved trace 410, the first reserved trace 410 is welded to the main line of the first short-circuit trace 310, and any set of normal working vertical lines Or the welding lead 200 corresponding to the horizontal line is welded to the second reserved trace 420, the second reserved trace 420 is welded to the main line of the second short-circuit trace 320, and the signal waveform is output to the oscilloscope for comparative analysis.
  • the first reserved trace 410 and the second reserved trace 420 may also be projected on the substrate body 100 and shorted to the trace 300 from different directions
  • the main line crosses, for example, the projection of the first reserved trace 410 on the substrate body 100 extends in the first direction as shown in FIG. 3, and then crosses the main line of the first shorted trace 310, and the second reserved trace
  • the projection of 420 on the substrate body 100 extends in a second direction opposite to the first direction, and then crosses the main line of the second short-circuit trace 320, and the same detection result can also be achieved.
  • the shorting trace 300 includes a branch line, and the projection of the reserved trace 400 on the substrate body 100 crosses the branch line of the shorting trace 300.
  • the short-circuit trace 300 includes a branch line.
  • the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300, it can also directly cross the branch line, and can also output the signal to the corresponding test
  • the pad 500 is used to analyze the cause of the defect.
  • the specific analysis process is similar to the projection of the reserved trace 400 on the substrate body 100 and the main line crossing of the shorted trace 300, which will not be repeated here.
  • the shorting trace 300 includes a first shorting trace 310 and a second shorting trace 320
  • the reserved trace 400 includes a first reserved trace 410 and a second The reserved trace 420, the projection of the first reserved trace 410 on the substrate body 100 crosses the branch line of the first shorted trace 310, and the projection of the second reserved trace 420 on the substrate body 100 and the second short Branches that take the line 320 cross.
  • the waveform corresponding to the signal can also be output to the oscilloscope for comparative analysis.
  • the specific process is similar to the connection between the two preset traces and the main line of the short-circuited trace 300, which will not be repeated here. It should be noted that, in one embodiment, please refer to FIG.
  • the projections of the first reserved trace 410 and the second reserved trace 420 on the substrate body 100 may also be realized by short-circuiting from different directions
  • the branch lines of the line 300 cross, for example, the projection of the first reserved trace 410 on the substrate body 100 extends in the first direction as shown in FIG. 5, and then crosses the branch line of the first short-circuit trace 310, and the second reserved
  • the projection of the trace 420 on the substrate body 100 extends in a second direction opposite to the first direction, and then crosses the branch line of the second short-circuit trace 320, and the same detection result can also be achieved.
  • the shorting trace 300 includes a main line and a branch line
  • the shorting trace 300 includes a first shorting trace 310 and a second shorting trace 320
  • the trace is reserved 400 includes a first reserved trace 410 and a second reserved trace 420
  • the projection of the first reserved trace 410 on the substrate body 100 crosses the main line of the first short-circuit trace 310
  • the second reserved trace The projection of 420 on the substrate body 100 crosses the branch line of the second shorting trace 320.
  • the main line and the branch line of the shorted trace 300 are connected to each other.
  • the corresponding waveform of the signal can also be output to the oscilloscope A comparative analysis is performed.
  • the specific process is similar to the projection of the above two reserved traces 400 on the substrate body 100 and the main line crossing of the shorted trace 300, which will not be repeated here.
  • the above-mentioned flexible circuit board is provided with reserved traces, and the projection of the reserved traces on the substrate body crosses the short-circuit trace and the welding lead respectively.
  • the short-circuit trace is used to connect the external test pad.
  • the test pad analyzes and judges, and then obtains the cause of the bad straight line. Compared with the traditional detection method, it does not require the removal of the flexible circuit board, which effectively reduces the detection time, and has the advantage of high operation convenience when performing line defect analysis.
  • a display panel includes a first substrate 20; a second substrate 30, which is disposed opposite to the first substrate 20; a dielectric layer 40, which is disposed between the first substrate 20 and the second substrate 30; an adhesive layer 50 and the above-mentioned flexible circuit board 10, the adhesive layer 50 is provided on the second substrate 30, and the flexible circuit board 10 is pressed and connected to the second substrate 30 through the adhesive layer 50.
  • the flexible circuit board 10 may specifically be the flexible circuit board described in any of the above embodiments, and the specific structure has been explained in detail in the above embodiments, and will not be repeated here.
  • the circuit board that provides the driving signal is separated from the substrate that displays according to the driving signal.
  • the driving signal is provided by the PCBA, and is connected to the substrate that performs the display via the flexible circuit board (ie, COF substrate);
  • PCBA refers to the circuit board obtained after processing through SMT upload and DIP plug-in.
  • One end of the COF substrate is connected to the PCBA circuit board through the welding lead 200, and the other end is press-connected to the substrate for display through conductive adhesive, so that the drive control signal output from the PCBA circuit board can be transmitted to the substrate, providing the drive control signal for the substrate, Then display the corresponding image.
  • the COF substrate includes a substrate body 100 and soldering leads 200 and shorting traces 300 all provided on the same surface of the substrate body 100, and a reserved trace 400 is provided on a different layer from the soldering lead 200 and the shorting trace 300, The projections of the reserved traces 400 on the substrate body 100 intersect the welding leads 200 and the shorting traces 300, respectively.
  • the reserved trace 400 and the welding lead 200 can be directly soldered to the corresponding intersection point, and the reserved trace 400 and the short circuit can be The position corresponding to the projection intersection point of the line 300 is welded.
  • the position corresponding to the projection intersection point is the pre-corresponding pre-corresponding point when the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300 or the welding lead 200.
  • the shorting trace 300 and the welding lead 200 are connected through the reserved trace 400, so that the signal output from the welding lead 200 can be output to the test pad 500 connected to the shorting trace 300.
  • the oscilloscope probe can be used to directly detect the output waveform of the drive control signal corresponding to the occurrence of the wire defect, and display it on the oscilloscope.
  • the detected waveform is abnormal, it means that the cause of the wire defect is the COF substrate; No abnormality is detected in the detected waveform, which means that the COF substrate is working normally, and the cause of the line defect is the internal problem of the display substrate.
  • a reserved trace 400 is provided inside the COF substrate.
  • the first substrate 20 is a color filter substrate
  • the second substrate 30 is an array substrate
  • the dielectric layer 40 is a liquid crystal layer
  • the adhesive layer 50 is ACF (Anisotropic Conductive Film). Film) conductive adhesive layer.
  • Color filter is a kind of optical filter substrate that expresses color. It can accurately select the light passing through a certain wavelength range and reflect the light of other wavelengths.
  • the basic structure of the color film substrate is composed of a glass substrate (Glass Substrate), a black matrix (Black Matrix), a color layer (Color Layer), a protective layer (Over Coat) and an ITO conductive film.
  • Liquid crystal refers to the fact that after the molten state or the solvent is dissolved, the rigidity of the solid substance is lost, and the fluidity of the liquid is obtained, and the anisotropic order of the molecules of some crystalline substances is retained, forming a kind of crystal and Substances in the liquid state that are intermediate in nature.
  • a dielectric layer 40 formed by liquid crystal molecules is arranged between the array substrate and the color filter substrate. When the power is turned on, the dielectric layer 40 is turned on and the arrangement becomes orderly, so that the light passes easily; when the power is not turned on, the arrangement is disordered to prevent the light from passing.
  • the display panel is a twisted nematic display panel (Twisted Nematic, TN panel). It can be understood that, in other embodiments, it may also be other types of display panels, for example, IPS panel (In-Pane Swinging, plane switching), VA panel (Multi-domain Vertica Aignment, multi-quadrant vertical alignment), etc. can.
  • IPS panel In-Pane Swinging, plane switching
  • VA panel Multi-domain Vertica Aignment, multi-quadrant vertical alignment
  • the above display panel is provided with reserved traces on the flexible circuit board, and the projection of the reserved traces on the substrate body crosses the short-circuited trace and the welding lead respectively.
  • the short-circuited trace is used to connect the external test pad.
  • a display device includes a backlight module and the above display panel. It can be understood that the display panel may specifically be the display panel described in any of the foregoing embodiments, and the specific structure has been explained in detail in the foregoing embodiments, and will not be repeated here.
  • the circuit board that provides the driving signal is separated from the substrate that displays according to the driving signal.
  • the driving signal is provided by the PCBA, and is connected to the substrate that performs the display via the flexible circuit board (ie, COF substrate);
  • PCBA refers to the circuit board obtained after processing through SMT upload and DIP plug-in.
  • One end of the COF substrate is connected to the PCBA circuit board through the welding lead 200, and the other end is press-connected to the substrate for display through conductive adhesive, so that the drive control signal output from the PCBA circuit board can be transmitted to the substrate, providing the drive control signal for the substrate, Then display the corresponding image.
  • the COF substrate includes a substrate body 100 and soldering leads 200 and short-circuiting traces 300 that are both disposed on the same surface of the substrate body 100, and pre-positions are provided on different layers from the soldering lead 200 and the shorting traces 300.
  • the trace 400 is left, and the projection of the reserved trace 400 on the substrate body 100 intersects the solder wire 200 and the short-circuit trace 300 respectively.
  • the reserved trace 400 and the welding lead 200 can be directly soldered to the corresponding intersection point, and the reserved trace 400 and the short circuit can be The position corresponding to the projection intersection point of the line 300 is welded.
  • the position corresponding to the projection intersection point is the pre-corresponding pre-corresponding point when the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300 or the welding lead 200.
  • the shorting trace 300 and the welding lead 200 are connected through the reserved trace 400, so that the signal output from the welding lead 200 can be output to the test pad 500 connected to the shorting trace 300.
  • the oscilloscope probe can be used to directly detect the output waveform of the drive control signal corresponding to the occurrence of the wire defect, and display it on the oscilloscope.
  • the detected waveform is abnormal, it means that the cause of the wire defect is the COF substrate; No abnormality is detected in the detected waveform, which means that the COF substrate is working normally, and the cause of the line defect is the internal problem of the display substrate.
  • a reserved trace 400 is provided inside the COF substrate.
  • the display device further includes a first polarizer disposed on the side of the second substrate away from the dielectric layer, and a second polarizer disposed on the side of the first substrate away from the dielectric layer.
  • the dielectric layer is a liquid crystal layer.
  • the liquid crystal material is placed between two pieces of transparent conductive glass attached with a polarizer with a vertical optical axis.
  • the liquid crystal molecules are distributed parallel to the transparent conductive glass when no voltage is applied, and the two pieces of transparent
  • the conductive glass is respectively arranged with alignment films oriented perpendicular to each other, and the liquid crystal molecules are sequentially arranged in accordance with the direction of the fine grooves of the alignment film. If no electric field is applied, the light enters from the second polarizer, and the polarization direction is in accordance with the arrangement of the liquid crystal molecules It can be emitted from the first polarizer by rotating 90 degrees, and it is in the bright state at this time.
  • the backlight module is an edge-lit backlight module.
  • the edge-lit backlight module means that the light source (Edge) is disposed on the side of the light guide plate, and the light guide plate illuminates the light evenly behind the liquid crystal panel.
  • the design of the edge-lit backlight module makes the display device have the advantages of light weight, thin, narrow frame and low power consumption. It can be understood that, in other embodiments, the backlight module may also be a direct type backlight module or a hollow type backlight module, as long as it can provide a corresponding light source for the display device.
  • the flexible circuit board is provided with reserved traces, and the projection of the reserved traces on the substrate body crosses the short-circuit trace and the welding lead respectively.
  • the short-circuit trace is used to connect the external test pad when the When a bad wire condition occurs, it is only necessary to directly weld the corresponding welding leads to the reserved traces, and at the same time to weld the reserved traces and short-circuit traces, so that the corresponding signals pass through the reserved traces and short-circuit traces Output to the external test pad for analysis and judgment, and then obtain the cause of the straight line failure.
  • it does not require the removal of flexible circuit boards, which effectively reduces the detection time, and has the advantage of high operation convenience when performing line defect analysis.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Liquid Crystal (AREA)

Abstract

A flexible circuit board, a display panel, and a display device. The flexible circuit board comprises: a substrate; a bonding lead; a short-circuit trace for connecting an external test pad, the short-circuit trace and the bonding lead being disposed on the same surface of the substrate; an insulation layer covering the short-circuit trace and the bonding lead; and a reserved trace disposed at a side of the insulation layer away from the short-circuit trace and the bonding lead, a projection of the reserved trace on the substrate main component respectively intersecting with the short-circuit trace and the bonding lead.

Description

软性电路板、显示面板及显示装置Flexible circuit board, display panel and display device
本申请要求于2018年11月12日提交中国专利局,申请号为201811338858.3,申请名称为“软性电路板、显示面板及显示装置”的中国专利申请的优先权,其全部内容通过引用结合在本申请中。This application requires priority to be submitted to the Chinese Patent Office on November 12, 2018, with the application number 201811338858.3 and the application name of the Chinese patent application titled "flexible circuit board, display panel and display device", the entire content of which is incorporated by reference in In this application.
技术领域Technical field
本申请涉及显示技术领域,特别涉及一种软性电路板、显示面板及显示装置。The present application relates to the field of display technology, in particular to a flexible circuit board, display panel and display device.
背景技术Background technique
这里的陈述仅提供与本申请有关的背景信息,不必然地构成现有技术。在薄膜晶体管液晶显示器(Thin Film Transistor-Liquid Crystal Display,TFT-LCD)中,通常使用覆晶薄膜基板(Chip On Film,COF)将印刷电路板(Printed Circuit Board,PCB)和液晶面板连接到一起,从而使PCB板能够将驱动控制信号输出至液晶面板,完成相应的驱动控制。COF基板上具有焊接引线(bonding lead),焊接引线的一端连接PCB板,另一端与COF基板的基板本体连接。The statements here only provide background information related to the present application and do not necessarily constitute prior art. In thin-film transistor liquid crystal displays (Thin Film Transistor-Liquid Crystal) (TFT-LCD), a flip-chip thin film substrate (Chip On Film, COF) is usually used to connect the printed circuit board (PCB) and the liquid crystal panel together , So that the PCB board can output the drive control signal to the liquid crystal panel to complete the corresponding drive control. The COF substrate has bonding leads. One end of the bonding lead is connected to the PCB board, and the other end is connected to the substrate body of the COF substrate.
在实际生产过程中,经常会出现由于压合制程不良出现垂直线不良或水平线不良的现象,为了检测发生不良的原因,传统的方法是将发生不良位置的COF去除,重新压接其它的COF,进而判断是COF或者液晶面板导致垂直线不良或水平线不良。传统的检测方法需要专用的COF压合机台,同时检测耗时较长,导致传统的COF压合不良的检测方法操作便利性低。In the actual production process, the phenomenon of vertical line defects or horizontal line defects often occurs due to poor bonding process. In order to detect the cause of the defect, the traditional method is to remove the COF at the defective location and re-press the other COF. Furthermore, it was determined that the COF or the liquid crystal panel caused the vertical line defect or the horizontal line defect. The traditional detection method requires a dedicated COF laminating machine, and the detection takes a long time, resulting in the low convenience of the traditional COF lamination detection method.
申请内容Application content
根据本申请的各种实施例,提供一种软性电路板、显示面板及显示装置, 以解决传统的COF压合不良的检测方法操作便利性低的问题。According to various embodiments of the present application, a flexible circuit board, a display panel, and a display device are provided to solve the problem of low convenience in operation of a conventional method for detecting poor COF compression.
一种软性电路板,包括:A flexible circuit board, including:
基板本体;Substrate body
焊接引线;Welding lead
短接走线,所述短接走线与所述焊接引线设置于所述基板本体的同一表面,所述短接走线用于连接外部测试垫;Short-circuit traces, the short-circuit traces and the welding leads are provided on the same surface of the substrate body, and the short-circuit traces are used to connect an external test pad;
绝缘层,所述绝缘层覆盖所述短接走线和所述焊接引线;以及An insulating layer, the insulating layer covering the shorted trace and the soldered lead; and
预留走线,所述预留走线设置于所述绝缘层远离所述短接走线和所述焊接引线的一侧,所述预留走线在所述基板本体上的投影分别与所述短接走线、所述焊接引线交叉。Reserved traces, the reserved traces are provided on the side of the insulating layer away from the short-circuit traces and the welding leads, and the projections of the reserved traces on the substrate body are The short-circuit trace and the soldered lead cross.
一种显示面板,包括:A display panel, including:
第一基板;First substrate
第二基板,与所述第一基板相对设置;A second substrate, which is opposite to the first substrate;
介质层,设置基于所述第一基板与所述第二基板之间;The dielectric layer is provided between the first substrate and the second substrate;
粘接层,设置于所述第二基板;以及An adhesive layer provided on the second substrate; and
软性电路板,所述软性电路板通过所述粘接层与所述第二基板压合连接,所述软性电路板包括:基板本体;焊接引线;短接走线,所述短接走线与所述焊接引线设置于所述基板本体的同一表面,所述短接走线用于连接外部测试垫;绝缘层,所述绝缘层覆盖所述短接走线和所述焊接引线;以及预留走线,所述预留走线设置于所述绝缘层远离所述短接走线和所述焊接引线的一侧,所述预留走线在所述基板本体上的投影分别与所述短接走线、所述焊接引线交叉。A flexible circuit board, the flexible circuit board is pressed and connected with the second substrate through the adhesive layer, the flexible circuit board includes: a substrate body; a welding lead; a short connection trace, the short connection The trace and the welding lead are provided on the same surface of the substrate body, the short-circuit trace is used to connect an external test pad; an insulating layer, the insulation layer covers the short-circuit trace and the welding lead; And reserved traces, the reserved traces are provided on a side of the insulating layer away from the short-circuit traces and the welding leads, and the projections of the reserved traces on the substrate body are respectively The short-circuit trace and the soldered lead cross.
一种显示装置,包括背光模组以及显示面板,所述显示面板包括:A display device includes a backlight module and a display panel. The display panel includes:
第一基板;First substrate
第二基板,与所述第一基板相对设置;A second substrate, which is opposite to the first substrate;
介质层,设置基于所述第一基板与所述第二基板之间;The dielectric layer is provided between the first substrate and the second substrate;
粘接层,设置于所述第二基板;以及An adhesive layer provided on the second substrate; and
软性电路板,所述软性电路板通过所述粘接层与所述第二基板压合连接,所述软性电路板包括:基板本体;焊接引线;短接走线,所述短接走线与所述焊接引线设置于所述基板本体的同一表面,所述短接走线用于连接外部测试垫;绝缘层,所述绝缘层覆盖所述短接走线和所述焊接引线;以及预留走线,所述预留走线设置于所述绝缘层远离所述短接走线和所述焊接引线的一侧,所述预留走线在所述基板本体上的投影分别与所述短接走线、所述焊接引线交叉。A flexible circuit board, the flexible circuit board is pressed and connected with the second substrate through the adhesive layer, the flexible circuit board includes: a substrate body; a welding lead; a short connection trace, the short connection The trace and the welding lead are provided on the same surface of the substrate body, the short-circuit trace is used to connect an external test pad; an insulating layer, the insulation layer covers the short-circuit trace and the welding lead; And reserved traces, the reserved traces are provided on a side of the insulating layer away from the short-circuit traces and the welding leads, and the projections of the reserved traces on the substrate body are respectively The short-circuit trace and the soldered lead cross.
本申请的一个或多个实施例的细节在下面的附图和描述中提出。本申请的其它特征、目的和优点将从说明书、附图以及权利要求书变得明显。The details of one or more embodiments of the application are set forth in the drawings and description below. Other features, objects, and advantages of this application will become apparent from the description, drawings, and claims.
附图说明BRIEF DESCRIPTION
为了更清楚地说明本申请实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其它的附图。In order to more clearly explain the embodiments of the present application or the technical solutions in the prior art, the following will briefly introduce the drawings required in the embodiments or the description of the prior art. Obviously, the drawings in the following description are only These are some embodiments of the present application. For those of ordinary skill in the art, without paying any creative work, other drawings may be obtained based on these drawings.
图1为一实施例中软性电路板结构示意图;1 is a schematic structural view of a flexible circuit board in an embodiment;
图2为一实施例中预留走线与短接走线和焊接引线的焊接示意图;2 is a schematic diagram of welding reserved traces, short-circuited traces and welding leads in an embodiment;
图3为另一实施例中软性电路板结构示意图;3 is a schematic structural view of a flexible circuit board in another embodiment;
图4为又一实施例中软性电路板结构示意图;4 is a schematic structural view of a flexible circuit board in another embodiment;
图5为再一实施例中软性电路板结构示意图;5 is a schematic structural view of a flexible circuit board in yet another embodiment;
图6为又一实施例中软性电路板结构示意图;6 is a schematic structural view of a flexible circuit board in another embodiment;
图7为一实施例中显示面板结构示意图。7 is a schematic view of the structure of a display panel in an embodiment.
具体实施方式detailed description
为了便于理解本申请,下面将参照相关附图对本申请进行更全面的描述。附图中给出了本申请的较佳的实施例。但是,本申请可以以许多不同的形式 来实现,并不限于本文所描述的实施例。相反地,提供这些实施例的目的是使对本申请的公开内容的理解更加透彻全面。In order to facilitate understanding of the present application, the present application will be described more fully below with reference to related drawings. The drawings show preferred embodiments of the present application. However, this application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the present application more thorough and comprehensive.
请参阅图1,一种软性电路板,包括:基板本体100;焊接引线200;短接走线300,短接走线300和焊接引线200设置于基板本体100的同一表面,短接走线300用于连接外部测试垫500;绝缘层(图未示),绝缘层覆盖短接走线和焊接引线;预留走线400,预留走线400设置于绝缘层远离短接走线300和焊接引线200的一侧,预留走线400在基板本体100上的投影分别与短接走线300、焊接引线200交叉。Referring to FIG. 1, a flexible circuit board includes: a substrate body 100; soldering leads 200; short-circuiting traces 300, the shorting traces 300 and the welding leads 200 are disposed on the same surface of the substrate body 100, short-circuiting traces 300 is used to connect the external test pad 500; an insulating layer (not shown), the insulating layer covers the shorted traces and the welding leads; the trace 400 is reserved, and the trace 400 is set on the insulating layer away from the shorted trace 300 and On one side of the soldering lead 200, the projection of the reserved trace 400 on the substrate body 100 crosses the shorting trace 300 and the soldering lead 200, respectively.
具体地,在显示行业中,提供驱动信号电路板与根据驱动信号进行显示的基板之间是分离的,驱动信号由PCBA(Printed Circuit Board Assembly)提供,经过软性电路板(即COF基板)连接到进行显示的基板;其中,PCBA是指进过SMT(Surface Mount Technology,表面贴装技术)上件和DIP(Dual Inline-pin Package,双列直插式封装)插件处理之后得到的电路板。COF基板的一端经过焊接引线200连接到PCBA电路板,另一端通过导电胶与用于显示的基板压合连接,使得PCBA电路板输出的驱动控制信号能够传输到基板,为基板提供驱动控制信号,进而显示相应的图像。COF基板包括基板本体100以及均设置于基板本体100同一表面的焊接引线200和短接走线300,并且,在与焊接引线200和短接走线300不同层面上设置有预留走线400,预留走线400在基板本体100上的投影分别与焊接引线200和短接走线300交叉。请参阅图2,当由于压接制程导致垂直线不良或水平线不良时,可以直接将预留走线400和焊接引线200投影交叉点对应的位置焊接,同时将预留走线400和短接走线300投影交叉点对应的位置焊接,投影交叉点对应的位置即为预留走线400在基板本体100上的投影与短接走线300或焊接引线200交叉时,该交叉点所对应的预留走线400和短接走线300对应的位置,或者是预留走线400和焊接引线200对应的位置。通过预留走线400将短接走线300和焊接引线200连接起来,使焊接引线200输出的信号能够输出至与短接走线300相连的测试垫500。此时,可采用示波器探针直接侦测发生 线不良对应的驱动控制信号输出波形,并在示波器上显示,若所侦测的波形出现异常,则说明导致线不良的原因是COF基板;若所侦测的波形并未发生异常,则说明COF基板正常工作,导致线不良的原因是进行显示的基板内部问题。采用上述方法,在COF基板内部设置预留走线400,当发生线不良时,不需要直接清除COF基板,在减少检测时长的同时,有效地避免了COF基板的浪费。应当指出的是,在一个实施例中,将预留走线400与短接走线300焊接或将预留走线400与焊接引线200焊接时,采用的时激光焊接的方式。Specifically, in the display industry, the circuit board that provides the drive signal is separated from the substrate that displays based on the drive signal. The drive signal is provided by PCBA (Printed Circuit Board Assembly) and connected through a flexible circuit board (ie COF substrate) To the substrate for display; PCBA refers to the circuit board obtained after SMT (Surface Mount Technology) and DIP (Dual Inline-pin Package) plug-in processing. One end of the COF substrate is connected to the PCBA circuit board through the welding lead 200, and the other end is press-connected to the substrate for display through conductive adhesive, so that the drive control signal output from the PCBA circuit board can be transmitted to the substrate, providing the drive control signal for the substrate, Then display the corresponding image. The COF substrate includes a substrate body 100 and soldering leads 200 and shorting traces 300 all provided on the same surface of the substrate body 100, and a reserved trace 400 is provided on a different layer from the soldering lead 200 and the shorting trace 300, The projections of the reserved traces 400 on the substrate body 100 intersect the welding leads 200 and the shorting traces 300, respectively. Please refer to FIG. 2, when the vertical line or the horizontal line is bad due to the crimping process, the reserved trace 400 and the welding lead 200 can be directly soldered to the corresponding intersection point, and the reserved trace 400 and the short circuit can be The position corresponding to the projection intersection point of the line 300 is welded. The position corresponding to the projection intersection point is the pre-corresponding pre-corresponding point when the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300 or the welding lead 200. The position corresponding to the left trace 400 and the short-circuit trace 300, or the position corresponding to the reserved trace 400 and the welding lead 200. The shorting trace 300 and the welding lead 200 are connected through the reserved trace 400, so that the signal output from the welding lead 200 can be output to the test pad 500 connected to the shorting trace 300. At this time, the oscilloscope probe can be used to directly detect the output waveform of the drive control signal corresponding to the occurrence of the wire defect, and display it on the oscilloscope. If the detected waveform is abnormal, it means that the cause of the wire defect is the COF substrate; No abnormality is detected in the detected waveform, which means that the COF substrate is working normally, and the cause of the line defect is the internal problem of the display substrate. Using the above method, a reserved trace 400 is provided inside the COF substrate. When a line defect occurs, there is no need to directly remove the COF substrate, which reduces the detection time and effectively avoids the waste of the COF substrate. It should be noted that, in one embodiment, when the reserved trace 400 is welded to the shorting trace 300 or the reserved trace 400 is welded to the welding lead 200, the laser welding method is used.
在一个实施例中,预留走线400的数量为两条或两条以上。具体地,以两条预留走线为例,请参阅图2,为了方便进行描述,将焊接引线200依次编号为210、220、230、240和250,COF基板内部的短接走线300数量通常为两条,分别为第一短接走线310和第二短接走线320,其中焊接引线220为发生线不良对应的焊接引线,焊接引线230为正常工作的焊接引线,为了检测焊接引线220对应的线不良发生的原因,将焊接引线220与第一预留走线410投影交叉点对应的位置焊接,第一预留走线410与第一短接走线310投影交叉点对应的位置焊接,同时将焊接引线230与第二预留走线420投影交叉点对应的位置焊接,第二预留走线420和第二短接走线320投影交叉点对应的位置焊接。使得焊接引线220与第一短接走线310之间能够进行信号传输,将相应的信号输出至与第一短接走线310相连的测试垫500,焊接引线230与第二短接走线320进行信号传输,将相应的信号输出至与第二短接走线320相连的测试垫500。然后经过示波器探针分别将对应的信号波形输出至示波器并显示,通过对两个输出波形的对比分析,判断发生线不良的原因是否是COF基板,若一致,则不是COF基板导致的线不良,若不一致,则是COF基板导致的线不良。应当指出的是,在一个实施例中,两个输出波形可以在同一示波器上进行显示,方便对波形进行对比分析;在另一个实施例中,还可以是分别采用两个示波器显示不同焊接引线对应的波形,避免两个波形信号之间发生干扰,导致检测结果准确性低,具体采用何种方式显示波形,可以根据实际情况进行选择。在一个实施例中,还可以是示波器预设 有正常情况是焊接引线对应的输出信号波形,只要将发生线不良对应的焊接引线与预留走线焊接,将信号波形输出至示波器进行对比分析即可,在本实施例中,不需要焊接正常情况对应的焊接引线与预留走线,具有操作简单的优点。In one embodiment, the number of reserved traces 400 is two or more. Specifically, taking two reserved traces as an example, please refer to FIG. 2, for convenience of description, the welding leads 200 are sequentially numbered as 210, 220, 230, 240, and 250. The number of short-circuit traces 300 inside the COF substrate There are usually two, the first short-circuit trace 310 and the second short-circuit trace 320, of which the welding lead 220 is the welding lead corresponding to the occurrence of wire defect, and the welding lead 230 is the normal working welding lead. In order to detect the welding lead The reason for the bad line corresponding to 220, welding the welding lead 220 to the position corresponding to the projected intersection of the first reserved trace 410, and the position corresponding to the projected intersection of the first reserved trace 410 and the first shorted trace 310 At the same time, the welding lead 230 is welded to the position corresponding to the projected intersection of the second reserved trace 420, and the position corresponding to the projected intersection of the second reserved trace 420 and the second shorting trace 320 is welded. Enables signal transmission between the welding lead 220 and the first shorting trace 310, and outputs the corresponding signal to the test pad 500 connected to the first shorting trace 310, and the welding lead 230 and the second shorting trace 320 Signal transmission is performed, and the corresponding signal is output to the test pad 500 connected to the second shorting trace 320. Then output the corresponding signal waveform to the oscilloscope through the oscilloscope probe and display it respectively. By comparing and analyzing the two output waveforms, it is determined whether the cause of the line defect is the COF substrate. If they are consistent, it is not the line defect caused by the COF substrate. If they do not match, it is a line defect caused by the COF substrate. It should be noted that in one embodiment, the two output waveforms can be displayed on the same oscilloscope, which is convenient for comparative analysis of the waveforms; in another embodiment, two oscilloscopes can also be used to display the correspondence between different welding leads. Waveform, to avoid interference between the two waveform signals, resulting in low accuracy of the detection results, the specific way to display the waveform, you can choose according to the actual situation. In one embodiment, the oscilloscope may be preset to have a normal output signal waveform corresponding to the welding lead. As long as the welding lead corresponding to the defective wire is welded to the reserved trace, the signal waveform is output to the oscilloscope for comparative analysis. However, in this embodiment, there is no need to weld the welding leads and reserved wiring corresponding to the normal conditions, which has the advantage of simple operation.
可以理解,同时发生线不良对应的焊接引线200数量可能有多个,即有多条垂直线或水平线发生不良,针对这种情况,在一个实施例中,预留走线400对应的设置多条,以保证每一发生线不良对应的焊接引线200均能与相应的预留走线400进行焊接,将信号输出至测试垫500进行检测分析;应当指出的是,在本实施例中,同时有一组正常工作的焊接引线200与预留走线400焊接,且预留走线400与对应的短接走线300焊接,输出正常工作的波形用于与线不良对应的焊接引线200的波形进行对比。在另一个实施例中,还可以是设置多条预留走线400,当仅有一条线不良时,将对应的焊接引线200与预留走线400焊接,短接走线300与预留走线400焊接;同时将多条正常工作对应的焊接引线200分别与不同预留走线400焊接,同时输出多个正常情况对应的波形,然后与异常情况对应的波形进行对比分析,同样能够检测是否是COF基板导致的线不良。通过设置多条预留走线400的方式,不仅能够实现多条线不良时的检测,还能有效地提高检测的准确性。It can be understood that the number of welding leads 200 corresponding to simultaneous line defects may be multiple, that is, there are multiple vertical or horizontal lines that are defective. In this case, in one embodiment, a plurality of corresponding settings of the trace 400 are provided. In order to ensure that each welding lead 200 corresponding to a defective wire can be welded with the corresponding reserved trace 400, and the signal is output to the test pad 500 for detection and analysis; it should be noted that in this embodiment, there is also The normal working welding lead 200 is welded to the reserved trace 400, and the reserved trace 400 is welded to the corresponding shorting trace 300, and the normal working waveform is output for comparison with the waveform of the welding lead 200 corresponding to the bad wire. . In another embodiment, multiple reserved traces 400 may be provided. When only one line is defective, the corresponding welding lead 200 is welded to the reserved trace 400, and the trace 300 is shorted to the reserved trace Welding line 400; simultaneously welding multiple welding leads 200 corresponding to normal work with different reserved traces 400 simultaneously, outputting multiple waveforms corresponding to normal conditions, and then comparing and analyzing the waveforms corresponding to abnormal conditions, can also detect whether It is a defective wire caused by the COF substrate. By setting multiple reserved traces 400, not only can the detection of multiple defective lines be achieved, but also the accuracy of the detection can be effectively improved.
请参阅图2,在一个实施例中,短接走线300包括主线,预留走线400在基板本体100上的投影与短接走线300的主线交叉。Referring to FIG. 2, in one embodiment, the short-circuit trace 300 includes a main line, and the projection of the reserved trace 400 on the substrate body 100 crosses the main line of the short-circuit trace 300.
具体地,焊接引线200根据排列位置划分为奇数条焊接引线和偶数条焊接引线,通过奇数条焊接引线和偶数条焊接引线能够实现像素信号的奇数列和偶数列分别控制,便于测试和鉴别。在生产制程中,焊接引线200分别与短接走线300的支线对应连接,在将COF基板与用于显示的基板进行压合连接之前,采用激光切割的方式将短接走线300的支线与焊接引线200的连接切断,以避免后续COF基板向面内提供驱动可控制信号时信号之间会相互影响,导致显示发生异常。采用预留走线400在基板本体100上的投影分别与短接走线300的主线和焊接引线400交叉的方式,当发生线不良时,可以直 接将相应的焊接引线200与预留走线400焊接,预留走线400与短接走线300的主线焊接,从而输出信号能够经短接走线300的主线传输至与短接走线300相连的测试垫500,进而检测导致不良的原因。Specifically, the welding leads 200 are divided into odd-numbered welding leads and even-numbered welding leads according to the arrangement position, and the odd-numbered and even-numbered columns of pixel signals can be controlled separately by the odd-numbered welding leads and the even-numbered welding leads, which is convenient for testing and identification. In the production process, the welding leads 200 are respectively connected to the branch lines of the short-circuit trace 300. Before the COF substrate is pressed and connected to the substrate for display, the branch line of the short-circuit trace 300 is laser cut The connection of the soldering lead 200 is cut off to avoid the mutual influence of the signals when the subsequent COF substrate provides drive control signals to the surface, resulting in abnormal display. The projection of the reserved trace 400 on the substrate body 100 crosses the main line of the short-circuited trace 300 and the welding lead 400 respectively. When a wire defect occurs, the corresponding welding lead 200 can be directly connected to the reserved trace 400 For soldering, the reserved trace 400 is welded to the main line of the shorted trace 300, so that the output signal can be transmitted to the test pad 500 connected to the shorted trace 300 via the main line of the shorted trace 300, thereby detecting the cause of the defect.
请继续参阅图2,在一个实施例中,短接走线300包括第一短接走线310和第二短接走线320,预留走线400包括第一预留走线410和第二预留走线420,第一预留走线410在基板本体上100的投影与第一短接走线310的主线交叉,第二预留走线420在基板本体100上的投影与第二短接走线320的主线交叉。Please continue to refer to FIG. 2. In one embodiment, the shorting trace 300 includes a first shorting trace 310 and a second shorting trace 320, and the reserved trace 400 includes a first reserved trace 410 and a second The reserved trace 420, the projection of the first reserved trace 410 on the substrate body 100 crosses the main line of the first shorted trace 310, and the projection of the second reserved trace 420 on the substrate body 100 and the second short The main line connecting the line 320 crosses.
具体地,短接走线300的数量为两条,分别为第一短接走线310和第二短接走线320,预留走线400的数量也为两条,分别为第一预留走线410和第二预留走线420,在本实施例中,第一预留走线410与第二预留走线420沿相同的方向使在基板本体100上的投影均与对应的短接走线300的主线交叉,即第一预留走线410在基板本体100上的投影与第一短接走线310的主线交叉,第二预留走线420在基板本体100上的投影与第二短接走线320的主线交叉。当发生线不良时,将对应的焊接引线200与第一预留走线410焊接,第一预留走线410与第一短接走线310的主线焊接,同时任意一组正常工作的垂直线或水平线对应的焊接引线200与第二预留走线420焊接,第二预留走线420与第二短接走线320的主线焊接,将信号波形输出至示波器进行对比分析即可。Specifically, the number of shorting traces 300 is two, which are the first shorting trace 310 and the second shorting trace 320 respectively, and the number of reserved traces 400 is also two, which are respectively reserved for the first The trace 410 and the second reserved trace 420. In this embodiment, the first reserved trace 410 and the second reserved trace 420 are in the same direction so that the projections on the substrate body 100 are the same as the corresponding short The main line of the connecting trace 300 crosses, that is, the projection of the first reserved trace 410 on the substrate body 100 crosses the main line of the first shorting trace 310, and the projection of the second reserved trace 420 on the substrate body 100 The main lines of the second short-circuit trace 320 cross. When a wire defect occurs, the corresponding welding lead 200 is welded to the first reserved trace 410, the first reserved trace 410 is welded to the main line of the first short-circuit trace 310, and any set of normal working vertical lines Or the welding lead 200 corresponding to the horizontal line is welded to the second reserved trace 420, the second reserved trace 420 is welded to the main line of the second short-circuit trace 320, and the signal waveform is output to the oscilloscope for comparative analysis.
进一步地,在一个实施例中,请参阅图3,第一预留走线410和第二预留走线420还可以是从不同的方向实现在基板本体100上的投影与短接走线300的主线交叉,例如,第一预留走线410在基板本体100上的投影如图3所示的第一方向延伸,然后与第一短接走线310的主线交叉,第二预留走线420在基板本体100上的投影沿与第一方向相反的第二方向延伸,然后与第二短接走线320的主线交叉,也能实现相同的检测结果。Further, in one embodiment, please refer to FIG. 3, the first reserved trace 410 and the second reserved trace 420 may also be projected on the substrate body 100 and shorted to the trace 300 from different directions The main line crosses, for example, the projection of the first reserved trace 410 on the substrate body 100 extends in the first direction as shown in FIG. 3, and then crosses the main line of the first shorted trace 310, and the second reserved trace The projection of 420 on the substrate body 100 extends in a second direction opposite to the first direction, and then crosses the main line of the second short-circuit trace 320, and the same detection result can also be achieved.
请参阅图4,在一个实施例中,短接走线300包括支线,预留走线400在基板本体100上的投影与短接走线300的支线交叉。Referring to FIG. 4, in one embodiment, the shorting trace 300 includes a branch line, and the projection of the reserved trace 400 on the substrate body 100 crosses the branch line of the shorting trace 300.
具体地,短接走线300包括支线,预留走线400在基板本体100上的投影与短接走线300交叉时,还可以是直接与支线实现交叉,同样能够将信号输出至对应的测试垫500,从而进行不良原因的分析,具体分析过程与上述预留走线400在基板本体100上的投影与短接走线300的主线交叉类似,在此不再赘述。Specifically, the short-circuit trace 300 includes a branch line. When the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300, it can also directly cross the branch line, and can also output the signal to the corresponding test The pad 500 is used to analyze the cause of the defect. The specific analysis process is similar to the projection of the reserved trace 400 on the substrate body 100 and the main line crossing of the shorted trace 300, which will not be repeated here.
请继续参阅图4,在一个实施例中,短接走线300包括第一短接走线310和第二短接走线320,预留走线400包括第一预留走线410和第二预留走线420,第一预留走线410在基板本体100上的投影与第一短接走线310的支线交叉,第二预留走线420在基板本体100上的投影与第二短接走线320的支线交叉。同样的,以两条短接走线300和两条预留走线400为例,短接走线300的主线和支线是相互连接的,将预留走线400与短接走线300的投影交叉点位置焊接之后,同样能够将信号对应的波形输出至示波器进行对比分析,具体过程和上述两条预设走线与短接走线300的主线相连类似,在此不再赘述。应当指出的是,在一个实施例中,请参阅图5,第一预留走线410和第二预留走线420在基板本体100上的投影还可以是从不同的方向实现与短接走线300的支线交叉,例如,第一预留走线410在基板本体100上的投影如图5所示的第一方向延伸,然后与第一短接走线310的支线交叉,第二预留走线420在基板本体100上的投影沿与第一方向相反的第二方向延伸,然后与第二短接走线320的支线交叉,也能实现相同的检测结果。Please continue to refer to FIG. 4. In one embodiment, the shorting trace 300 includes a first shorting trace 310 and a second shorting trace 320, and the reserved trace 400 includes a first reserved trace 410 and a second The reserved trace 420, the projection of the first reserved trace 410 on the substrate body 100 crosses the branch line of the first shorted trace 310, and the projection of the second reserved trace 420 on the substrate body 100 and the second short Branches that take the line 320 cross. Similarly, taking two shorted traces 300 and two reserved traces 400 as an example, the main line and the branch of the shorted trace 300 are connected to each other, and the projection of the reserved trace 400 and the shorted trace 300 is projected After the welding at the intersection point, the waveform corresponding to the signal can also be output to the oscilloscope for comparative analysis. The specific process is similar to the connection between the two preset traces and the main line of the short-circuited trace 300, which will not be repeated here. It should be noted that, in one embodiment, please refer to FIG. 5, the projections of the first reserved trace 410 and the second reserved trace 420 on the substrate body 100 may also be realized by short-circuiting from different directions The branch lines of the line 300 cross, for example, the projection of the first reserved trace 410 on the substrate body 100 extends in the first direction as shown in FIG. 5, and then crosses the branch line of the first short-circuit trace 310, and the second reserved The projection of the trace 420 on the substrate body 100 extends in a second direction opposite to the first direction, and then crosses the branch line of the second short-circuit trace 320, and the same detection result can also be achieved.
进一步地,请参阅图6,在一个实施例中,短接走线300包括主线和支线,短接走线300包括第一短接走线310和第二短接走线320,预留走线400包括第一预留走线410和第二预留走线420,第一预留走线410在基板本体100上的投影与第一短接走线310的主线交叉,第二预留走线420在基板本体100上的投影与第二短接走线320的支线交叉。具体地,短接走线300的主线和支线是相互连接的,将预留走线400与短接走线300的支线投影交叉点对应的位置焊接之后,同样能够将信号对应的波形输出至示波器进行对比分析,具体过程和上述两条预留走线400在基板本体100上的投影与短接走 线300的主线交叉类似,在此不再赘述。Further, referring to FIG. 6, in one embodiment, the shorting trace 300 includes a main line and a branch line, and the shorting trace 300 includes a first shorting trace 310 and a second shorting trace 320, and the trace is reserved 400 includes a first reserved trace 410 and a second reserved trace 420, the projection of the first reserved trace 410 on the substrate body 100 crosses the main line of the first short-circuit trace 310, and the second reserved trace The projection of 420 on the substrate body 100 crosses the branch line of the second shorting trace 320. Specifically, the main line and the branch line of the shorted trace 300 are connected to each other. After welding the position corresponding to the projected intersection of the branch line of the shorted trace 300 and the shorted trace 300, the corresponding waveform of the signal can also be output to the oscilloscope A comparative analysis is performed. The specific process is similar to the projection of the above two reserved traces 400 on the substrate body 100 and the main line crossing of the shorted trace 300, which will not be repeated here.
上述软性电路板,设置有预留走线,并且预留走线在基板本体上的投影分别与短接走线和焊接引线交叉,短接走线用于连接外部测试垫,当发生线不良的情况时,只需要直接将对应的焊接引线与预留走线焊接,同时将预留走线和短接走线焊接,从而使相应的信号经预留走线和短接走线输出至外部测试垫进行分析判断,进而得到导致直线不良的原因。与传统的检测方法相比,不需要软性电路板去除,有效地减少了检测时长,在进行线不良分析时具有操作便利性高的优点。The above-mentioned flexible circuit board is provided with reserved traces, and the projection of the reserved traces on the substrate body crosses the short-circuit trace and the welding lead respectively. The short-circuit trace is used to connect the external test pad. In the case of the situation, it is only necessary to directly weld the corresponding welding leads to the reserved traces, and at the same time weld the reserved traces and the shorted traces, so that the corresponding signals are output to the outside through the reserved traces and the shorted traces The test pad analyzes and judges, and then obtains the cause of the bad straight line. Compared with the traditional detection method, it does not require the removal of the flexible circuit board, which effectively reduces the detection time, and has the advantage of high operation convenience when performing line defect analysis.
请参阅图7,一种显示面板,包括第一基板20;第二基板30,与第一基板20相对设置;介质层40,设置基于第一基板20与第二基板30之间;粘接层50以及上述的软性电路板10,粘接层50设置于第二基板30,软性电路板10通过粘接层50与第二基板30压合连接。可以理解,软性电路板10具体可以是上述任一实施例中所述的软性电路板,具体结构已经在上述实施例中进行详细的解释说明,在此不再赘述。7, a display panel includes a first substrate 20; a second substrate 30, which is disposed opposite to the first substrate 20; a dielectric layer 40, which is disposed between the first substrate 20 and the second substrate 30; an adhesive layer 50 and the above-mentioned flexible circuit board 10, the adhesive layer 50 is provided on the second substrate 30, and the flexible circuit board 10 is pressed and connected to the second substrate 30 through the adhesive layer 50. It can be understood that the flexible circuit board 10 may specifically be the flexible circuit board described in any of the above embodiments, and the specific structure has been explained in detail in the above embodiments, and will not be repeated here.
具体地,在显示行业中,提供驱动信号电路板与根据驱动信号进行显示的基板之间是分离的,驱动信号由PCBA提供,经过软性电路板(即COF基板)连接到进行显示的基板;其中,PCBA是指进过SMT上件和DIP插件处理之后得到的电路板。COF基板的一端经过焊接引线200连接到PCBA电路板,另一端通过导电胶与用于显示的基板压合连接,使得PCBA电路板输出的驱动控制信号能够传输到基板,为基板提供驱动控制信号,进而显示相应的图像。COF基板包括基板本体100以及均设置于基板本体100同一表面的焊接引线200和短接走线300,并且,在与焊接引线200和短接走线300不同层面上设置有预留走线400,预留走线400在基板本体100上的投影分别与焊接引线200和短接走线300交叉。请参阅图2,当由于压接制程导致垂直线不良或水平线不良时,可以直接将预留走线400和焊接引线200投影交叉点对应的位置焊接,同时将预留走线400和短接走线300投影交叉点对应 的位置焊接,投影交叉点对应的位置即为预留走线400在基板本体100上的投影与短接走线300或焊接引线200交叉时,该交叉点所对应的预留走线400和短接走线300对应的位置,或者是预留走线400和焊接引线200对应的位置。通过预留走线400将短接走线300和焊接引线200连接起来,使焊接引线200输出的信号能够输出至与短接走线300相连的测试垫500。此时,可采用示波器探针直接侦测发生线不良对应的驱动控制信号输出波形,并在示波器上显示,若所侦测的波形出现异常,则说明导致线不良的原因是COF基板;若所侦测的波形并未发生异常,则说明COF基板正常工作,导致线不良的原因是进行显示的基板内部问题。采用上述方法,在COF基板内部设置预留走线400,当发生线不良时,不需要直接清除COF基板,在减少检测时长的同时,有效地避免了COF基板的浪费。Specifically, in the display industry, the circuit board that provides the driving signal is separated from the substrate that displays according to the driving signal. The driving signal is provided by the PCBA, and is connected to the substrate that performs the display via the flexible circuit board (ie, COF substrate); Among them, PCBA refers to the circuit board obtained after processing through SMT upload and DIP plug-in. One end of the COF substrate is connected to the PCBA circuit board through the welding lead 200, and the other end is press-connected to the substrate for display through conductive adhesive, so that the drive control signal output from the PCBA circuit board can be transmitted to the substrate, providing the drive control signal for the substrate, Then display the corresponding image. The COF substrate includes a substrate body 100 and soldering leads 200 and shorting traces 300 all provided on the same surface of the substrate body 100, and a reserved trace 400 is provided on a different layer from the soldering lead 200 and the shorting trace 300, The projections of the reserved traces 400 on the substrate body 100 intersect the welding leads 200 and the shorting traces 300, respectively. Please refer to FIG. 2, when the vertical line or the horizontal line is bad due to the crimping process, the reserved trace 400 and the welding lead 200 can be directly soldered to the corresponding intersection point, and the reserved trace 400 and the short circuit can be The position corresponding to the projection intersection point of the line 300 is welded. The position corresponding to the projection intersection point is the pre-corresponding pre-corresponding point when the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300 or the welding lead 200. The position corresponding to the left trace 400 and the short-circuit trace 300, or the position corresponding to the reserved trace 400 and the welding lead 200. The shorting trace 300 and the welding lead 200 are connected through the reserved trace 400, so that the signal output from the welding lead 200 can be output to the test pad 500 connected to the shorting trace 300. At this time, the oscilloscope probe can be used to directly detect the output waveform of the drive control signal corresponding to the occurrence of the wire defect, and display it on the oscilloscope. If the detected waveform is abnormal, it means that the cause of the wire defect is the COF substrate; No abnormality is detected in the detected waveform, which means that the COF substrate is working normally, and the cause of the line defect is the internal problem of the display substrate. Using the above method, a reserved trace 400 is provided inside the COF substrate. When a line defect occurs, there is no need to directly remove the COF substrate, which reduces the detection time and effectively avoids the waste of the COF substrate.
应当指出的是,在一个实施例中,第一基板20为彩膜基板,第二基板30为阵列基板,介质层40为液晶层,粘接层50为ACF(Anisotropic Conductive Film,易方性导电胶膜)导电胶层。彩膜基板(Color Filter)是一种表现颜色的光学滤光基板,能够精确选择通过一定波段范围的光,并将其它波段的光反射。彩膜基板基本结构是由玻璃基板(Glass Substrate)、黑色矩阵(Black Matrix)、彩色层(Color Layer)、保护层(Over Coat)和ITO导电膜组成。液晶是指在熔融状态或被溶剂溶解之后,失去固态物质的刚性的同时,得到液体的易流动性,并且保留着部分晶态物质分子的各向异性有序排列,形成一种兼有晶体和液体的部分性质的中间态的物质。阵列基板和彩膜基板之间设置有液晶分子形成的介质层40,当通电时导通,排列变得有秩序,使光线容易通过;不通电时排列混乱,阻止光线通过。It should be noted that in one embodiment, the first substrate 20 is a color filter substrate, the second substrate 30 is an array substrate, the dielectric layer 40 is a liquid crystal layer, and the adhesive layer 50 is ACF (Anisotropic Conductive Film). Film) conductive adhesive layer. Color filter is a kind of optical filter substrate that expresses color. It can accurately select the light passing through a certain wavelength range and reflect the light of other wavelengths. The basic structure of the color film substrate is composed of a glass substrate (Glass Substrate), a black matrix (Black Matrix), a color layer (Color Layer), a protective layer (Over Coat) and an ITO conductive film. Liquid crystal refers to the fact that after the molten state or the solvent is dissolved, the rigidity of the solid substance is lost, and the fluidity of the liquid is obtained, and the anisotropic order of the molecules of some crystalline substances is retained, forming a kind of crystal and Substances in the liquid state that are intermediate in nature. A dielectric layer 40 formed by liquid crystal molecules is arranged between the array substrate and the color filter substrate. When the power is turned on, the dielectric layer 40 is turned on and the arrangement becomes orderly, so that the light passes easily; when the power is not turned on, the arrangement is disordered to prevent the light from passing.
在一个实施例中,显示面板为扭曲向列型显示面板(Twisted Nematic,即TN面板)。可以理解,在其它实施例中,还可以是其它类型的显示面板,例如,IPS面板(In-Pane Switcing,平面转换)、VA面板(Multi-domain Vertica Aignment,多象限垂直配向)等,适用即可。In one embodiment, the display panel is a twisted nematic display panel (Twisted Nematic, TN panel). It can be understood that, in other embodiments, it may also be other types of display panels, for example, IPS panel (In-Pane Swinging, plane switching), VA panel (Multi-domain Vertica Aignment, multi-quadrant vertical alignment), etc. can.
上述显示面板,软性电路板上设置有预留走线,并且预留走线在基板本 体上的投影分别与短接走线和焊接引线交叉,短接走线用于连接外部测试垫,当发生线不良的情况时,只需要直接将对应的焊接引线与预留走线焊接,同时将预留走线和短接走线焊接,从而使相应的信号经预留走线和短接走线输出至外部测试垫进行分析判断,进而得到导致直线不良的原因。与传统的检测方法相比,不需要软性电路板去除,有效地减少了检测时长,在进行线不良分析时具有操作便利性高的优点。The above display panel is provided with reserved traces on the flexible circuit board, and the projection of the reserved traces on the substrate body crosses the short-circuited trace and the welding lead respectively. The short-circuited trace is used to connect the external test pad. When a bad wire condition occurs, it is only necessary to directly weld the corresponding welding leads to the reserved traces, and at the same time to weld the reserved traces and short-circuit traces, so that the corresponding signals pass through the reserved traces and short-circuit traces Output to the external test pad for analysis and judgment, and then obtain the cause of the straight line failure. Compared with the traditional detection method, it does not require the removal of the flexible circuit board, which effectively reduces the detection time, and has the advantage of high operation convenience when performing line defect analysis.
一种显示装置,显示装置包括背光模组以及上述的显示面板。可以理解,显示面板具体可以是上述任一实施例中所述的显示面板,具体结构已经在上述实施例中进行详细的解释说明,在此不再赘述。A display device includes a backlight module and the above display panel. It can be understood that the display panel may specifically be the display panel described in any of the foregoing embodiments, and the specific structure has been explained in detail in the foregoing embodiments, and will not be repeated here.
具体地,在显示行业中,提供驱动信号电路板与根据驱动信号进行显示的基板之间是分离的,驱动信号由PCBA提供,经过软性电路板(即COF基板)连接到进行显示的基板;其中,PCBA是指进过SMT上件和DIP插件处理之后得到的电路板。COF基板的一端经过焊接引线200连接到PCBA电路板,另一端通过导电胶与用于显示的基板压合连接,使得PCBA电路板输出的驱动控制信号能够传输到基板,为基板提供驱动控制信号,进而显示相应的图像。请参阅图1,COF基板包括基板本体100以及均设置于基板本体100同一表面的焊接引线200和短接走线300,并且,在与焊接引线200和短接走线300不同层面上设置有预留走线400,预留走线400在基板本体100上的投影分别与焊接引线200和短接走线300交叉。请参阅图2,当由于压接制程导致垂直线不良或水平线不良时,可以直接将预留走线400和焊接引线200投影交叉点对应的位置焊接,同时将预留走线400和短接走线300投影交叉点对应的位置焊接,投影交叉点对应的位置即为预留走线400在基板本体100上的投影与短接走线300或焊接引线200交叉时,该交叉点所对应的预留走线400和短接走线300对应的位置,或者是预留走线400和焊接引线200对应的位置。通过预留走线400将短接走线300和焊接引线200连接起来,使焊接引线200输出的信号能够输出至与短接走线300相连的测试垫500。 此时,可采用示波器探针直接侦测发生线不良对应的驱动控制信号输出波形,并在示波器上显示,若所侦测的波形出现异常,则说明导致线不良的原因是COF基板;若所侦测的波形并未发生异常,则说明COF基板正常工作,导致线不良的原因是进行显示的基板内部问题。采用上述方法,在COF基板内部设置预留走线400,当发生线不良时,不需要直接清除COF基板,在减少检测时长的同时,有效地避免了COF基板的浪费。Specifically, in the display industry, the circuit board that provides the driving signal is separated from the substrate that displays according to the driving signal. The driving signal is provided by the PCBA, and is connected to the substrate that performs the display via the flexible circuit board (ie, COF substrate); Among them, PCBA refers to the circuit board obtained after processing through SMT upload and DIP plug-in. One end of the COF substrate is connected to the PCBA circuit board through the welding lead 200, and the other end is press-connected to the substrate for display through conductive adhesive, so that the drive control signal output from the PCBA circuit board can be transmitted to the substrate, providing the drive control signal for the substrate, Then display the corresponding image. Referring to FIG. 1, the COF substrate includes a substrate body 100 and soldering leads 200 and short-circuiting traces 300 that are both disposed on the same surface of the substrate body 100, and pre-positions are provided on different layers from the soldering lead 200 and the shorting traces 300. The trace 400 is left, and the projection of the reserved trace 400 on the substrate body 100 intersects the solder wire 200 and the short-circuit trace 300 respectively. Please refer to FIG. 2, when the vertical line or the horizontal line is bad due to the crimping process, the reserved trace 400 and the welding lead 200 can be directly soldered to the corresponding intersection point, and the reserved trace 400 and the short circuit can be The position corresponding to the projection intersection point of the line 300 is welded. The position corresponding to the projection intersection point is the pre-corresponding pre-corresponding point when the projection of the reserved trace 400 on the substrate body 100 crosses the short-circuit trace 300 or the welding lead 200. The position corresponding to the left trace 400 and the short-circuit trace 300, or the position corresponding to the reserved trace 400 and the welding lead 200. The shorting trace 300 and the welding lead 200 are connected through the reserved trace 400, so that the signal output from the welding lead 200 can be output to the test pad 500 connected to the shorting trace 300. At this time, the oscilloscope probe can be used to directly detect the output waveform of the drive control signal corresponding to the occurrence of the wire defect, and display it on the oscilloscope. If the detected waveform is abnormal, it means that the cause of the wire defect is the COF substrate; No abnormality is detected in the detected waveform, which means that the COF substrate is working normally, and the cause of the line defect is the internal problem of the display substrate. Using the above method, a reserved trace 400 is provided inside the COF substrate. When a line defect occurs, there is no need to directly remove the COF substrate, which reduces the detection time and effectively avoids the waste of the COF substrate.
在一个实施例中,显示装置还包括设置于第二基板远离介质层一侧的第一偏光片,以及设置于第一基板远离介质层一侧的第二偏光片。In one embodiment, the display device further includes a first polarizer disposed on the side of the second substrate away from the dielectric layer, and a second polarizer disposed on the side of the first substrate away from the dielectric layer.
具体地,介质层为液晶层,将液晶材料置于两片贴附光轴垂直的偏光片的透明导电玻璃之间,液晶分子在不加电压时平行于透明导电玻璃分布,并且在两片透明导电玻璃上分别配置有取向彼此垂直的配向膜,液晶分子依配向膜的细沟槽方向依序旋转排列,如果不加电场,光线从第二偏光片射入,其偏振方向依液晶分子的排列旋转90度,能够从第一偏光片射出,此时为亮态。如果在两片导电玻璃通电之后,两片导电玻璃间会形成电场,进而影响其间液晶分子的排列,当电压足够大时,分子沿电场垂直排列,光线的偏振方向不发生改变,光线无法穿透,进而遮住光源,从而在加电压的情况下形成了暗态。Specifically, the dielectric layer is a liquid crystal layer. The liquid crystal material is placed between two pieces of transparent conductive glass attached with a polarizer with a vertical optical axis. The liquid crystal molecules are distributed parallel to the transparent conductive glass when no voltage is applied, and the two pieces of transparent The conductive glass is respectively arranged with alignment films oriented perpendicular to each other, and the liquid crystal molecules are sequentially arranged in accordance with the direction of the fine grooves of the alignment film. If no electric field is applied, the light enters from the second polarizer, and the polarization direction is in accordance with the arrangement of the liquid crystal molecules It can be emitted from the first polarizer by rotating 90 degrees, and it is in the bright state at this time. If after two pieces of conductive glass are energized, an electric field will be formed between the two pieces of conductive glass, which will affect the arrangement of liquid crystal molecules between them. When the voltage is large enough, the molecules are arranged vertically along the electric field, the polarization direction of the light does not change, and the light cannot penetrate , And then the light source is blocked, so that a dark state is formed when voltage is applied.
在一个实施例中,背光模组为侧光式背光模组。具体地,侧光式背光模组是指发光源(Edge lighting)设置在导光板的侧面,导光板将光均匀地在液晶面板后面发亮。采用侧光式背光模组的设计,使得显示装置拥有轻量、薄型、窄框化、低耗电的优点。可以理解,在其它实施例中,背光模组还可以是直下型背光模组或中空型背光模组,只要能够为显示装置提供相应的光源即可。In one embodiment, the backlight module is an edge-lit backlight module. Specifically, the edge-lit backlight module means that the light source (Edge) is disposed on the side of the light guide plate, and the light guide plate illuminates the light evenly behind the liquid crystal panel. The design of the edge-lit backlight module makes the display device have the advantages of light weight, thin, narrow frame and low power consumption. It can be understood that, in other embodiments, the backlight module may also be a direct type backlight module or a hollow type backlight module, as long as it can provide a corresponding light source for the display device.
上述显示装置,软性电路板上设置有预留走线,并且预留走线在基板本体上的投影分别与短接走线和焊接引线交叉,短接走线用于连接外部测试垫,当发生线不良的情况时,只需要直接将对应的焊接引线与预留走线焊接,同时将预留走线和短接走线焊接,从而使相应的信号经预留走线和短接走线输出至外部测试垫进行分析判断,进而得到导致直线不良的原因。与传统的检 测方法相比,不需要软性电路板去除,有效地减少了检测时长,在进行线不良分析时具有操作便利性高的优点。In the above display device, the flexible circuit board is provided with reserved traces, and the projection of the reserved traces on the substrate body crosses the short-circuit trace and the welding lead respectively. The short-circuit trace is used to connect the external test pad when the When a bad wire condition occurs, it is only necessary to directly weld the corresponding welding leads to the reserved traces, and at the same time to weld the reserved traces and short-circuit traces, so that the corresponding signals pass through the reserved traces and short-circuit traces Output to the external test pad for analysis and judgment, and then obtain the cause of the straight line failure. Compared with the traditional detection method, it does not require the removal of flexible circuit boards, which effectively reduces the detection time, and has the advantage of high operation convenience when performing line defect analysis.
以上所述实施例的各技术特征可以进行任意的组合,为使描述简洁,未对上述实施例中的各个技术特征所有可能的组合都进行描述,然而,只要这些技术特征的组合不存在矛盾,都应当认为是本说明书记载的范围。The technical features of the above-mentioned embodiments can be combined arbitrarily. To simplify the description, all possible combinations of the technical features in the above-mentioned embodiments are not described. However, as long as there is no contradiction in the combination of these technical features, All should be considered within the scope of this description.
以上所述实施例仅表达了本申请的几种实施方式,其描述较为具体和详细,但并不能因此而理解为对申请专利范围的限制。应当指出的是,对于本领域的普通技术人员来说,在不脱离本申请构思的前提下,还可以做出若干变形和改进,这些都属于本申请的保护范围。因此,本申请专利的保护范围应以所附权利要求为准。The above-mentioned embodiments only express several implementation manners of the present application, and their descriptions are more specific and detailed, but they should not be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which all fall within the protection scope of the present application. Therefore, the protection scope of the patent of this application shall be subject to the appended claims.

Claims (17)

  1. 一种软性电路板,包括:A flexible circuit board, including:
    基板本体;Substrate body
    焊接引线;Welding lead
    短接走线,所述短接走线与所述焊接引线设置于所述基板本体的同一表面,所述短接走线用于连接外部测试垫;Short-circuit traces, the short-circuit traces and the welding leads are provided on the same surface of the substrate body, and the short-circuit traces are used to connect an external test pad;
    绝缘层,所述绝缘层覆盖所述短接走线和所述焊接引线;以及An insulating layer, the insulating layer covering the shorted trace and the soldered lead; and
    预留走线,所述预留走线设置于所述绝缘层远离所述短接走线和所述焊接引线的一侧,所述预留走线在所述基板本体上的投影分别与所述短接走线、所述焊接引线交叉。Reserved traces, the reserved traces are provided on the side of the insulating layer away from the short-circuit traces and the welding leads, and the projections of the reserved traces on the substrate body are The short-circuit trace and the soldered lead cross.
  2. 根据权利要求1所述的软性电路板,其中,所述预留走线的数量为两条或两条以上。The flexible circuit board according to claim 1, wherein the number of the reserved traces is two or more.
  3. 根据权利要求1所述的软性电路板,其中,所述短接走线包括主线,所述预留走线在所述基板本体上的投影与所述短接走线的主线交叉。The flexible circuit board according to claim 1, wherein the short-circuit trace includes a main line, and a projection of the reserved trace on the substrate body crosses the main line of the short-circuit trace.
  4. 根据权利要求3所述的软性电路板,其中,所述短接走线包括第一短接走线和第二短接走线,所述预留走线包括第一预留走线和第二预留走线,所述第一预留走线在所述基板本体上的投影与所述第一短接走线的主线交叉,所述第二预留走线在所述基板本体上的投影与所述第二短接走线的主线交叉。The flexible circuit board according to claim 3, wherein the shorting trace includes a first shorting trace and a second shorting trace, and the reserved trace includes a first reserved trace and a first Two reserved traces, the projection of the first reserved trace on the substrate body crosses the main line of the first shorted trace, and the second reserved trace on the substrate body The projection crosses the main line of the second short-circuited trace.
  5. 根据权利要求4所述的软性线路板,其中,所述第一预留走线和所述第二预留走线分别沿相同的方向实现在所述基板本体上的投影与对应的所述短接走线的主线交叉。The flexible circuit board according to claim 4, wherein the first reserved trace and the second reserved trace are respectively projected on the substrate body and the corresponding The main line of the short circuit is crossed.
  6. 根据权利要求4所述的软性线路板,其中,所述第一预留走线和所述第二预留走线分别沿不同的方向实现在所述基板本体上的投影与对应的所述短接走线的主线交叉。The flexible circuit board according to claim 4, wherein the first reserved trace and the second reserved trace are respectively projected on the substrate body and the corresponding The main line of the short circuit is crossed.
  7. 根据权利要求1所述的软性电路板,其中,所述短接走线包括支线,所述预留走线在所述基板本体上的投影与所述短接走线的支线交叉。The flexible circuit board according to claim 1, wherein the short-circuit trace includes a branch line, and a projection of the reserved trace on the substrate body crosses the branch line of the short-circuit trace.
  8. 根据权利要求7所述的软性电路板,其中,所述短接走线包括第一短接走线和第二短接走线,所述预留走线包括第一预留走线和第二预留走线,所述第一预留走线在所述基板本体上的投影与所述第一短接走线的支线交叉,所述第二预留走线在所述基板本体上的投影与所述第二短接走线的支线交叉。The flexible circuit board according to claim 7, wherein the shorting trace includes a first shorting trace and a second shorting trace, and the reserved trace includes a first reserved trace and a first Two reserved traces, the projection of the first reserved trace on the substrate body crosses the branch line of the first shorted trace, and the second reserved trace on the substrate body The projection crosses the branch line of the second short-circuit trace.
  9. 根据权利要求8所述的软性线路板,其中,所述第一预留走线和所述第二预留走线分别沿相同的方向实现在所述基板本体上的投影与对应的所述短接走线的支线交叉。The flexible circuit board according to claim 8, wherein the first reserved trace and the second reserved trace are respectively projected on the substrate body and the corresponding The spurs shorting the trace cross.
  10. 根据权利要求8所述的软性线路板,其中,所述第一预留走线和所述第二预留走线分别沿不同的方向实现在所述基板本体上的投影与对应的所述短接走线的支线交叉。The flexible circuit board according to claim 8, wherein the first reserved trace and the second reserved trace are respectively projected on the substrate body and the corresponding The spurs shorting the trace cross.
  11. 根据权利要求1所述的软性电路板,其中,所述短接走线包括主线和支线,所述短接走线包括第一短接走线和第二短接走线,所述预留走线包括第一预留走线和第二预留走线,所述第一预留走线在所述基板本体上的投影与所述第一短接走线的主线交叉,所述第二预留走线在所述基板本体上的投影与所述第二短接走线的支线交叉。The flexible circuit board according to claim 1, wherein the shorting trace includes a main line and a branch line, the shorting trace includes a first shorting trace and a second shorting trace, the reserved The trace includes a first reserved trace and a second reserved trace, the projection of the first reserved trace on the substrate body crosses the main line of the first short-circuit trace, and the second The projection of the reserved trace on the substrate body crosses the branch line of the second short-circuit trace.
  12. 一种显示面板,所述显示面板包括:A display panel including:
    第一基板;First substrate
    第二基板,与所述第一基板相对设置;A second substrate, which is opposite to the first substrate;
    介质层,设置基于所述第一基板与所述第二基板之间;The dielectric layer is provided between the first substrate and the second substrate;
    粘接层,设置于所述第二基板;以及An adhesive layer provided on the second substrate; and
    如权利要求1-11任意一项所述的软性电路板。The flexible circuit board according to any one of claims 1-11.
  13. 根据权利要求12所述的显示面板,其中,第一基板为彩膜基板,第二基板为阵列基板,介质层为液晶层,粘接层为易方性导电胶膜层。The display panel according to claim 12, wherein the first substrate is a color filter substrate, the second substrate is an array substrate, the dielectric layer is a liquid crystal layer, and the adhesive layer is an easily conductive conductive adhesive film layer.
  14. 根据权利要求12所述的显示面板,其中,所述显示面板为扭曲向列型显示面板。The display panel according to claim 12, wherein the display panel is a twisted nematic display panel.
  15. 一种显示装置,所述显示装置包括背光模组以及如权利要求12或 13项所述显示面板。A display device comprising a backlight module and the display panel according to claim 12 or 13.
  16. 根据权利要求15所述的显示装置,其中,所述显示装置还包括设置于所述第二基板远离所述介质层一侧的第一偏光片,以及设置于所述第一基板远离所述介质层一侧的第二偏光片。The display device according to claim 15, wherein the display device further comprises a first polarizer disposed on a side of the second substrate away from the dielectric layer, and a first polarizer disposed on the first substrate away from the medium The second polarizer on the side of the layer.
  17. 根据权利要求15所述的显示装置,其中,所述背光模组为侧光式背光模组。The display device according to claim 15, wherein the backlight module is an edge-lit backlight module.
PCT/CN2018/123380 2018-11-12 2018-12-25 Flexible circuit board, display panel, and display device WO2020098081A1 (en)

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