TWI661275B - Light source device, exposure device and light source control method - Google Patents
Light source device, exposure device and light source control method Download PDFInfo
- Publication number
- TWI661275B TWI661275B TW105117041A TW105117041A TWI661275B TW I661275 B TWI661275 B TW I661275B TW 105117041 A TW105117041 A TW 105117041A TW 105117041 A TW105117041 A TW 105117041A TW I661275 B TWI661275 B TW I661275B
- Authority
- TW
- Taiwan
- Prior art keywords
- light
- emitting element
- exposure
- wavelength characteristic
- output
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000005259 measurement Methods 0.000 claims abstract description 61
- 239000013307 optical fiber Substances 0.000 claims description 71
- 239000000835 fiber Substances 0.000 claims description 15
- 238000009825 accumulation Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 description 40
- 238000003384 imaging method Methods 0.000 description 24
- 239000000758 substrate Substances 0.000 description 20
- 238000012545 processing Methods 0.000 description 16
- 229920002120 photoresistant polymer Polymers 0.000 description 15
- 238000010586 diagram Methods 0.000 description 12
- 230000008569 process Effects 0.000 description 8
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 7
- 229910052753 mercury Inorganic materials 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 6
- 230000006866 deterioration Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000005286 illumination Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 230000005291 magnetic effect Effects 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000005294 ferromagnetic effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- SZVJSHCCFOBDDC-UHFFFAOYSA-N iron(II,III) oxide Inorganic materials O=[Fe]O[Fe]O[Fe]=O SZVJSHCCFOBDDC-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2004—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-111865 | 2015-06-02 | ||
JP2015111865A JP6503235B2 (ja) | 2015-06-02 | 2015-06-02 | 光源装置、露光装置及び光源制御方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201716876A TW201716876A (zh) | 2017-05-16 |
TWI661275B true TWI661275B (zh) | 2019-06-01 |
Family
ID=57440968
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW105117041A TWI661275B (zh) | 2015-06-02 | 2016-05-31 | Light source device, exposure device and light source control method |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6503235B2 (ja) |
KR (1) | KR102055670B1 (ja) |
CN (1) | CN107850850B (ja) |
TW (1) | TWI661275B (ja) |
WO (1) | WO2016194378A1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6503235B2 (ja) * | 2015-06-02 | 2019-04-17 | 株式会社アドテックエンジニアリング | 光源装置、露光装置及び光源制御方法 |
JP6623847B2 (ja) * | 2016-03-07 | 2019-12-25 | ウシオ電機株式会社 | 光源装置及びこれを備えた露光装置 |
CN109983396B (zh) | 2016-11-17 | 2022-04-19 | 凸版印刷株式会社 | 反射型显示装置 |
CN110945430B (zh) * | 2017-07-25 | 2022-08-12 | 凸版印刷株式会社 | 曝光装置及曝光方法 |
CN107678251B (zh) * | 2017-11-10 | 2024-02-27 | 中国电子科技集团公司第四十一研究所 | 一种激光直写仪加工微波毫米波电路的样品台和使用方法 |
JP7060244B2 (ja) * | 2018-12-12 | 2022-04-26 | フェニックス電機株式会社 | 露光装置用光源、それを用いた露光装置、およびレジストの露光方法 |
US20220255288A1 (en) * | 2019-05-22 | 2022-08-11 | Cymer, Llc | Apparatus for and method of generating multiple laser beams |
CN110806682B (zh) * | 2019-12-05 | 2024-05-28 | 中山新诺科技股份有限公司 | 阻焊线路一体曝光的多光谱数字化曝光方法及系统 |
WO2024023885A1 (ja) * | 2022-07-25 | 2024-02-01 | 株式会社ニコン | パターン露光装置、及びデバイス製造方法 |
WO2024166268A1 (ja) * | 2023-02-08 | 2024-08-15 | 株式会社ニコン | 露光方法、露光装置、及びデバイス製造方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003215809A (ja) * | 2002-01-28 | 2003-07-30 | Pentax Corp | 露光装置および露光方法 |
JP2006017689A (ja) * | 2004-07-04 | 2006-01-19 | Ccs Inc | 光源装置 |
JP2009237490A (ja) * | 2008-03-28 | 2009-10-15 | Fujifilm Corp | 露光システム |
JP2012063390A (ja) * | 2010-09-14 | 2012-03-29 | Dainippon Screen Mfg Co Ltd | 露光装置および光源装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4458229B2 (ja) * | 2002-08-30 | 2010-04-28 | 日亜化学工業株式会社 | 露光用半導体レーザ光源装置 |
JP4450739B2 (ja) * | 2005-01-21 | 2010-04-14 | 富士フイルム株式会社 | 露光装置 |
JP4410134B2 (ja) | 2005-03-24 | 2010-02-03 | 日立ビアメカニクス株式会社 | パターン露光方法及び装置 |
JP4937808B2 (ja) * | 2007-03-26 | 2012-05-23 | フェニックス電機株式会社 | 光源装置ならびにこれを用いた露光装置 |
JP6093525B2 (ja) * | 2012-08-31 | 2017-03-08 | 株式会社オーク製作所 | 照明モニタ装置およびそれを備えた露光装置 |
JP6503235B2 (ja) * | 2015-06-02 | 2019-04-17 | 株式会社アドテックエンジニアリング | 光源装置、露光装置及び光源制御方法 |
-
2015
- 2015-06-02 JP JP2015111865A patent/JP6503235B2/ja active Active
-
2016
- 2016-05-31 TW TW105117041A patent/TWI661275B/zh active
- 2016-06-02 CN CN201680030951.0A patent/CN107850850B/zh active Active
- 2016-06-02 KR KR1020187000038A patent/KR102055670B1/ko active IP Right Grant
- 2016-06-02 WO PCT/JP2016/002671 patent/WO2016194378A1/ja active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003215809A (ja) * | 2002-01-28 | 2003-07-30 | Pentax Corp | 露光装置および露光方法 |
JP2006017689A (ja) * | 2004-07-04 | 2006-01-19 | Ccs Inc | 光源装置 |
JP2009237490A (ja) * | 2008-03-28 | 2009-10-15 | Fujifilm Corp | 露光システム |
JP2012063390A (ja) * | 2010-09-14 | 2012-03-29 | Dainippon Screen Mfg Co Ltd | 露光装置および光源装置 |
Also Published As
Publication number | Publication date |
---|---|
WO2016194378A1 (ja) | 2016-12-08 |
CN107850850A (zh) | 2018-03-27 |
TW201716876A (zh) | 2017-05-16 |
JP2016224321A (ja) | 2016-12-28 |
KR20180016471A (ko) | 2018-02-14 |
CN107850850B (zh) | 2021-06-08 |
KR102055670B1 (ko) | 2019-12-13 |
JP6503235B2 (ja) | 2019-04-17 |
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