TWI655699B - Electronic component mounting device - Google Patents

Electronic component mounting device Download PDF

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Publication number
TWI655699B
TWI655699B TW105137224A TW105137224A TWI655699B TW I655699 B TWI655699 B TW I655699B TW 105137224 A TW105137224 A TW 105137224A TW 105137224 A TW105137224 A TW 105137224A TW I655699 B TWI655699 B TW I655699B
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Taiwan
Prior art keywords
film
electronic component
substrate
hole
tool
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TW105137224A
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Chinese (zh)
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TW201730997A (en
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瀬山耕平
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日商新川股份有限公司
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Publication of TWI655699B publication Critical patent/TWI655699B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/75Apparatus for connecting with bump connectors or layer connectors

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  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Wire Bonding (AREA)

Abstract

本發明之課題為於使構裝頭沿水平方向移動之電子零件構裝裝置100中抑制絕緣樹脂附著於構裝工具。本發明為電子零件構裝裝置100,係將半導體晶片150熱壓接至基板並且利用絕緣樹脂將半導體晶片150與基板之間隙加以密封,且包括:膜切下機構200,將長條膜210呈切片狀切下;以及構裝工具110,真空吸附半導體晶片150並將其熱壓接至基板。 An object of the present invention is to prevent an insulating resin from adhering to a mounting tool in an electronic component mounting apparatus 100 that moves a mounting head in a horizontal direction. The present invention is an electronic component assembly apparatus 100 that thermally seals a semiconductor wafer 150 to a substrate and seals a gap between the semiconductor wafer 150 and the substrate by using an insulating resin, and includes: a film cutting mechanism 200, and the long film 210 is formed The slice is cut; and the tool 110 is vacuum-adsorbed to the semiconductor wafer 150 and thermocompression bonded to the substrate.

Description

電子零件構裝裝置 Electronic component mounting device

本發明係關於一種將半導體晶片等電子零件熱壓接至基板之電子零件構裝裝置之構造。 The present invention relates to a configuration of an electronic component mounting device for thermocompression bonding electronic components such as semiconductor wafers to a substrate.

於將半導體晶片等電子零件構裝於基板之方法之一,有如下方法,即,對基板塗布液狀之絕緣樹脂或將膜狀之絕緣樹脂貼附於電子零件之背側後,利用構裝工具將電子零件熱壓接至基板之上。該構裝方法中,可一次性地進行基板與電子零件之接合、及電子零件與基板之間之密封樹脂之硬化。然而,該構裝方法中,存在自電子零件與基板之間伸出之絕緣樹脂污染構裝工具之問題。因此,使用如下方法,即,藉由於構裝工具與電子零件之間夾著膜進行熱壓接,而防止自電子零件與基板之間伸出之絕緣樹脂附著於構裝工具。該方法中,使用如下方法,即,每次於藉由膜搬送機構搬送膜而構裝電子零件時更新夾在構裝工具與電子零件之間之膜(例如參照專利文獻1)。 One of the methods of attaching an electronic component such as a semiconductor wafer to a substrate is to apply a liquid resin insulating resin or a film-shaped insulating resin to the back side of the electronic component, and then use the package. The tool thermocompresses the electronic components onto the substrate. In the mounting method, the bonding between the substrate and the electronic component and the curing of the sealing resin between the electronic component and the substrate can be performed at one time. However, in this mounting method, there is a problem that the insulating resin protruding from the electronic component and the substrate contaminates the mounting tool. Therefore, a method of preventing the insulating resin extending from the electronic component and the substrate from adhering to the mounting tool is prevented by thermocompression bonding between the mounting tool and the electronic component. In this method, a film sandwiched between the mounting tool and the electronic component is renewed each time the electronic component is assembled by transporting the film by the film transport mechanism (see, for example, Patent Document 1).

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2015-35493號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2015-35493

專利文獻1記載之電子零件構裝裝置具備:使構裝工具相對於基板上下移動之構裝頭,以及保持基板並且使基板沿水平方向移動而進行基板之接合位置與構裝工具之位置對準之基板平台,依次更新膜之膜搬送機構搭載於構裝頭。 The electronic component mounting device described in Patent Document 1 includes a mounting head that moves the mounting tool up and down with respect to the substrate, and holds the substrate and moves the substrate in the horizontal direction to position the bonding position of the substrate and the position of the mounting tool. The substrate platform and the film transport mechanism that sequentially updates the film are mounted on the construction head.

另一方面,近年來,使用如下之電子零件構裝裝置,即,使構裝頭沿水平方向移動而將半導體晶片熱壓接至基板之上,該構裝頭係使吸附半導體晶片之構裝工具沿上下方向移動。 On the other hand, in recent years, an electronic component mounting apparatus has been used in which a semiconductor wafer is thermocompression bonded to a substrate by moving the mounting head in a horizontal direction, and the mounting head is a mounting tool for adsorbing a semiconductor wafer. Move in the up and down direction.

此種電子零件構裝裝置中,亦存在自電子零件與基板之間伸出之絕緣樹脂污染構裝工具之問題。然而,因如專利文獻1記載般之膜搬送機構大型且重量亦大,故若搭載於使構裝頭沿水平方向移動之電子零件構裝裝置則存在電子零件構裝裝置之體積增大之問題。 In such an electronic component mounting device, there is also a problem that the insulating resin protruding from the electronic component and the substrate contaminates the mounting tool. However, since the film transport mechanism as described in Patent Document 1 is large and has a large weight, there is a problem that the electronic component mounting device is increased in size when mounted on an electronic component mounting device that moves the mounting head in the horizontal direction. .

因此,本發明之目的在於利用簡便之方法抑制絕緣樹脂附著於構裝工具。 Therefore, an object of the present invention is to suppress adhesion of an insulating resin to a mounting tool by a simple method.

本發明之電子零件構裝裝置將電子零件熱壓接至基板或其他電子零件,並且利用絕緣樹脂將電子零件與基板之間隙或電子零件與其他電子零件之間隙加以密封,上述電子零件構裝裝置之特徵在於包括:膜切下機構,將長條膜呈切片狀膜切下;以及構裝工具,經由切片狀膜真空吸附電子零件,將電子零件熱壓接至基板或其他電子零件。 The electronic component mounting device of the present invention thermocompresses electronic components to a substrate or other electronic components, and seals a gap between the electronic component and the substrate or a gap between the electronic component and other electronic components by using an insulating resin, and the electronic component mounting device The invention comprises the following steps: a film cutting mechanism for cutting the long film into a slice film; and a forming tool for vacuum-adsorbing the electronic component through the slice film to thermocompress the electronic component to the substrate or other electronic parts.

本發明之電子零件構裝裝置中,較佳為包括自構裝工具之表面接收上述切片狀膜之膜回收機構。 In the electronic component mounting apparatus of the present invention, it is preferable that the film collecting mechanism that receives the sliced film is formed on the surface of the self-assembling tool.

本發明之電子零件構裝裝置中,較佳為構裝工具包括:基 底,以及自基底突出且將電子零件真空吸附至表面之島狀物,膜切下機構包括:基體部,具有大於島狀物之平面形狀之形狀之孔;夾具,具有與基體部相同之形狀之孔,與基體部之間夾住長條膜;以及沖頭,對基體部之孔與夾持器之孔拔出插入且自長條膜切下切片狀膜,沖頭之與長條膜相接之面為將切片狀膜交付至構裝工具之表面之平面。 In the electronic component mounting device of the present invention, preferably, the mounting tool comprises: a base a bottom, and an island protruding from the base and vacuum-adsorbing the electronic component to the surface, the film cutting mechanism comprising: a base portion having a shape larger than a planar shape of the island; the clamp having the same shape as the base portion a hole, sandwiching the long film between the base portion; and a punch, inserting and inserting the hole of the base portion and the hole of the holder, and cutting the slice film from the long film, the punch and the long film The interface is the plane that delivers the film to the surface of the tool.

本發明之電子零件構裝裝置中,較佳為膜回收機構包括:平板狀之平台;以及吸附帶,沿著平台之面移動而自構裝工具之表面依次接收切片狀膜。 In the electronic component mounting apparatus of the present invention, preferably, the film recovery mechanism includes: a flat plate-shaped platform; and an adsorption belt that moves along the surface of the platform to sequentially receive the slice-like film from the surface of the self-assembling tool.

本發明利用簡便之方法可抑制絕緣樹脂附著於構裝工具。 The present invention can suppress adhesion of an insulating resin to a mounting tool by a simple method.

10‧‧‧構裝平台 10‧‧‧Building platform

11‧‧‧主架台 11‧‧‧Main frame

12、86‧‧‧線性導件 12, 86‧‧‧ linear guides

15‧‧‧基板 15‧‧‧Substrate

20‧‧‧門型框架 20‧‧‧Door frame

23‧‧‧腳部 23‧‧‧ feet

24‧‧‧臂 24‧‧‧arm

26、75‧‧‧滑塊 26, 75‧‧‧ slider

27‧‧‧線性導件 27‧‧‧Linear Guides

30‧‧‧X方向固定件 30‧‧‧X direction fixings

35‧‧‧X方向線性馬達 35‧‧‧X direction linear motor

40‧‧‧X方向可動件 40‧‧‧X direction movable parts

42、62‧‧‧線圈 42, 62‧‧‧ coil

50‧‧‧Y方向固定件 50‧‧‧Y direction fixing parts

51‧‧‧框架 51‧‧‧Frame

52‧‧‧永久磁石 52‧‧‧ permanent magnet

53‧‧‧連接構件 53‧‧‧Connecting components

55‧‧‧Y方向線性馬達 55‧‧‧Y direction linear motor

60‧‧‧Y方向可動件 60‧‧‧Y direction movable parts

61‧‧‧框架 61‧‧‧Frame

65‧‧‧XY方向驅動機構 65‧‧‧XY direction drive mechanism

70‧‧‧構裝頭 70‧‧‧Construction head

72‧‧‧軸 72‧‧‧Axis

73‧‧‧Z方向驅動機構 73‧‧‧Z-direction drive mechanism

74‧‧‧垂吊構件 74‧‧‧ hanging components

76、77、78、114、115、121、122、123‧‧‧真空孔 76, 77, 78, 114, 115, 121, 122, 123‧‧‧ vacuum holes

80‧‧‧副架台 80‧‧‧Substitute

81、82‧‧‧柱 81, 82‧‧ ‧ column

84、85‧‧‧梁 84, 85‧‧ ‧ beams

90‧‧‧控制部 90‧‧‧Control Department

100‧‧‧電子零件構裝裝置 100‧‧‧Electronic part assembly device

110‧‧‧構裝工具 110‧‧‧Building tools

111‧‧‧基底 111‧‧‧Base

112‧‧‧島狀物 112‧‧‧ island

116、124‧‧‧槽 116, 124‧‧‧ slots

118‧‧‧表面 118‧‧‧ surface

119‧‧‧下表面 119‧‧‧ lower surface

120‧‧‧加熱器 120‧‧‧heater

150‧‧‧半導體晶片 150‧‧‧Semiconductor wafer

151、154‧‧‧電極 151, 154‧‧‧ electrodes

152‧‧‧絕緣樹脂膜 152‧‧‧Insulating resin film

153‧‧‧絕緣樹脂 153‧‧‧Insulating resin

156‧‧‧殘渣 156‧‧‧residue

200‧‧‧膜切下機構 200‧‧‧membrane cutting mechanism

201‧‧‧基體部 201‧‧‧Base Department

201a、203a、301a‧‧‧上表面 201a, 203a, 301a‧‧‧ upper surface

202、205‧‧‧孔 202, 205‧ ‧ holes

203‧‧‧沖頭 203‧‧‧ Punch

204‧‧‧夾持器 204‧‧‧Clamps

204a‧‧‧下表面 204a‧‧‧ lower surface

206‧‧‧膜進給輥 206‧‧‧film feed roller

207、209、303、305‧‧‧中心軸 207, 209, 303, 305‧‧‧ central axis

208‧‧‧膜捲取輥 208‧‧‧film take-up roll

210‧‧‧長條膜 210‧‧‧ long film

211、212‧‧‧孔 211, 212‧ ‧ holes

220‧‧‧切片狀膜 220‧‧‧ sliced film

300‧‧‧膜回收機構 300‧‧‧membrane recycling agency

301‧‧‧平台 301‧‧‧ platform

302‧‧‧帶進給輥 302‧‧‧With feed roller

304‧‧‧帶捲取輥 304‧‧‧With take-up roll

310‧‧‧吸附帶 310‧‧‧Adsorption belt

圖1係本發明之實施形態之電子零件構裝裝置之立體圖。 Fig. 1 is a perspective view of an electronic component mounting apparatus according to an embodiment of the present invention.

圖2係本發明之實施形態之電子零件構裝裝置之俯視圖。 Fig. 2 is a plan view showing an electronic component mounting apparatus according to an embodiment of the present invention.

圖3係本發明之實施形態之電子零件構裝裝置之門型框架之剖視圖。 Fig. 3 is a cross-sectional view showing a door frame of the electronic component mounting device according to the embodiment of the present invention.

圖4係表示圖3所示之A部之詳細情況之剖視圖。 Fig. 4 is a cross-sectional view showing the details of the portion A shown in Fig. 3.

圖5係本發明之實施形態之電子零件構裝裝置之膜切下機構之立體圖。 Fig. 5 is a perspective view showing a film cutting mechanism of the electronic component mounting device according to the embodiment of the present invention.

圖6係本發明之實施形態之電子零件構裝裝置之膜回收機構之立體圖。 Fig. 6 is a perspective view showing a film collecting mechanism of the electronic component mounting apparatus according to the embodiment of the present invention.

圖7A係表示本發明之實施形態之電子零件構裝裝置之膜切下機構中之膜傳送動作之說明圖。 Fig. 7A is an explanatory view showing a film transfer operation in a film cutting mechanism of the electronic component mounting device according to the embodiment of the present invention.

圖7B係表示本發明之實施形態之電子零件構裝裝置之膜切下機構中之膜夾住動作之說明圖。 Fig. 7B is an explanatory view showing a film clamping operation in the film cutting mechanism of the electronic component mounting device according to the embodiment of the present invention.

圖7C係表示本發明之實施形態之電子零件構裝裝置之膜切下機構中之切片狀膜切下動作之說明圖。 Fig. 7C is an explanatory view showing a slicing film cutting operation in the film cutting mechanism of the electronic component mounting apparatus according to the embodiment of the present invention.

圖8係表示圖7C中切下之切片狀膜之立體圖。 Fig. 8 is a perspective view showing the sliced film cut out in Fig. 7C.

圖9A係表示本發明之實施形態之電子零件構裝裝置中之切片狀膜交付動作之說明圖(1)。 Fig. 9A is an explanatory view (1) showing a delivery operation of a sliced film in the electronic component mounting apparatus according to the embodiment of the present invention.

圖9B係表示本發明之實施形態之電子零件構裝裝置中之切片狀膜交付動作之說明圖(2)。 Fig. 9B is an explanatory view (2) showing a delivery operation of the sliced film in the electronic component mounting apparatus according to the embodiment of the present invention.

圖10A係表示將半導體晶片吸附至本發明之實施形態之電子零件構裝裝置之構裝工具之動作之說明圖。 Fig. 10A is an explanatory view showing an operation of a semiconductor wafer to be attached to a mounting tool of an electronic component mounting apparatus according to an embodiment of the present invention.

圖10B係表示藉由本發明之實施形態之電子零件構裝裝置將半導體晶片熱壓接至基板之動作之說明圖。 Fig. 10B is an explanatory view showing an operation of thermocompression bonding a semiconductor wafer to a substrate by an electronic component mounting apparatus according to an embodiment of the present invention.

圖11A係表示圖9B所示之熱壓接後之構裝工具與膜回收機構之說明圖。 Fig. 11A is an explanatory view showing a mounting tool and a film collecting mechanism after thermocompression bonding shown in Fig. 9B.

圖11B係表示本發明之電子零件構裝裝置中之切片狀膜接收動作之說明圖。 Fig. 11B is an explanatory view showing a receiving operation of a sliced film in the electronic component mounting device of the present invention.

圖11C係表示本發明之電子零件構裝裝置之膜回收機構之膜傳送動作之說明圖。 Fig. 11C is an explanatory view showing a film transfer operation of the film recovery mechanism of the electronic component mounting device of the present invention.

以下,一面參照圖式,一面對本發明之實施形態進行說明。首先,一面參照圖1、2,一面對本實施形態之電子零件構裝裝置100之整體構造進行說明。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. First, the overall structure of the electronic component mounting apparatus 100 of the present embodiment will be described with reference to Figs.

如圖1所示,本實施形態之電子零件構裝裝置100包括:主 架台11,支持於主架台11之上之門型框架20,支持於門型框架20之構裝頭70,將門型框架20沿X方向驅動之X方向線性馬達35,將構裝頭70沿Y方向驅動之Y方向線性馬達55,與主架台11隔開而配置之副架台80,以及安裝於副架台80之Y方向負載接收部54。Y方向線性馬達55之Y方向固定件50之一端與Y方向負載接收部54利用連接構件53而連接。另外,X方向、Y方向為於水平面上彼此正交之方向,本實施形態中,如圖1所示般將門型框架20延伸之方向設為Y方向,將與其正交之方向設為X方向而進行說明。而且,Z方向為與XY面垂直之上下方向。 As shown in FIG. 1, the electronic component mounting apparatus 100 of the present embodiment includes: a main The gantry 11 supports the gantry frame 20 above the main gantry 11, supports the styling head 70 of the gantry frame 20, drives the X-direction linear motor 35 in the X direction of the gantry frame 20, and moves the gantry 70 along the Y The Y-direction linear motor 55 that is driven in the direction, the sub-frame 80 that is disposed apart from the main frame 11 and the Y-direction load receiving portion 54 that is attached to the sub-frame 80. One end of the Y-direction stator 50 of the Y-direction linear motor 55 and the Y-direction load receiving portion 54 are connected by a connecting member 53. Further, the X direction and the Y direction are directions orthogonal to each other on the horizontal plane. In the present embodiment, as shown in FIG. 1, the direction in which the portal frame 20 extends is referred to as the Y direction, and the direction orthogonal thereto is referred to as the X direction. And explain. Further, the Z direction is perpendicular to the XY plane and the upper and lower directions.

如圖1所示,主架台11為具有四方形狀之平面之架台,於其上表面安裝有:對安裝作為電子零件之半導體晶片150之基板15進行真空吸附之構裝平台10,膜切下機構200,以及膜回收機構300。於主架台11上表面之對向之兩邊之附近彼此並行地安裝有線性導件12。滑塊26沿X方向移動自如地安裝於線性導件12之上。而且,於2個線性導件12之各滑塊26之上分別安裝有門型框架20之各腳部23。即,門型框架20以跨越主架台11之上之方式沿Y方向延伸,兩端之各腳部23安裝於滑塊26且沿X方向移動自如地受到支持。 As shown in FIG. 1, the main gantry 11 is a gantry having a square shape, and a mounting platform 10 for vacuum absorbing the substrate 15 on which the semiconductor wafer 150 as an electronic component is mounted is mounted on the upper surface thereof, and the film cutting mechanism is provided. 200, and a membrane recovery mechanism 300. Linear guides 12 are mounted in parallel with each other in the vicinity of opposite sides of the upper surface of the main gantry 11. The slider 26 is movably mounted on the linear guide 12 in the X direction. Further, the leg portions 23 of the portal frame 20 are attached to the respective sliders 26 of the two linear guides 12, respectively. That is, the portal frame 20 extends in the Y direction so as to straddle the main gantry 11, and the leg portions 23 at both ends are attached to the slider 26 and are movably supported in the X direction.

而且,本實施形態之電子零件構裝裝置100如圖1所示,具備以包圍主架台11之周圍之方式與主架台11隔開之副架台80。副架台80為由柱81、82、以及將柱81、82連接之梁84所構成之框架。於沿X方向延伸之梁84之上,安裝有將永久磁石52相向配置所得之槽形X方向線性馬達35之X方向固定件30。而且,於自門型框架20之腳部23延伸之臂24之前端,安裝有於X方向固定件30之永久磁石52之間沿X方向移動之 包含線圈42之X方向可動件40。X方向線性馬達35之X方向可動件40與各門型框架20一併沿X方向移動。 Further, as shown in FIG. 1, the electronic component mounting apparatus 100 of the present embodiment includes a sub-frame 80 that is spaced apart from the main gantry 11 so as to surround the periphery of the main gantry 11. The sub-mount 80 is a frame composed of the columns 81 and 82 and the beam 84 connecting the columns 81 and 82. An X-direction stator 30 of a slot-shaped X-direction linear motor 35 in which the permanent magnets 52 are opposed to each other is attached to the beam 84 extending in the X direction. Further, at the front end of the arm 24 extending from the leg portion 23 of the door frame 20, the permanent magnet 52 mounted in the X direction fixing member 30 is moved in the X direction. The X-direction movable member 40 of the coil 42 is included. The X-direction movable member 40 of the X-direction linear motor 35 moves together with the respective portal frames 20 in the X direction.

如圖1、圖3所示,門型框架20支持構裝頭70。構裝頭70中儲存有Z方向驅動機構73,該Z方向驅動機構73使前端安裝有加熱器120與構裝工具110之軸72沿Z方向而上下移動。Z方向驅動機構73使加熱器120與構裝工具110上下移動,將半導體晶片150按壓至吸附固定於構裝平台10之基板15之上。如圖3所示,於門型框架20之內部設置有空間,於門型框架20之內表面之兩側安裝有2根沿Y方向延伸之線性導件27。於各線性導件27安裝有滑塊75,於2個滑塊75安裝有構裝頭70之垂吊構件74。 As shown in FIGS. 1 and 3, the portal frame 20 supports the construction head 70. The Z-direction drive mechanism 73 is stored in the assembly head 70. The Z-direction drive mechanism 73 moves the heater 120 and the shaft 72 of the assembly tool 110 in the Z direction up and down. The Z-direction driving mechanism 73 moves the heater 120 and the mounting tool 110 up and down to press the semiconductor wafer 150 onto the substrate 15 adsorbed and fixed to the mounting platform 10. As shown in FIG. 3, a space is provided inside the door frame 20, and two linear guides 27 extending in the Y direction are attached to both sides of the inner surface of the portal frame 20. A slider 75 is attached to each linear guide 27, and a hanging member 74 of the construction head 70 is attached to the two sliders 75.

如圖1、圖2所示,Y方向線性馬達55之Y方向固定件50經由板彈簧58而安裝於門型框架20之各腳部23之間。如圖3所示,Y方向固定件50係於槽形框架51之內表面隔開空間將永久磁石52對向配置而成。於Y方向固定件50之永久磁石52之間之空間,配置有內部安裝有線圈62且自構裝頭70延伸之框架61。利用該構成,Y方向可動件60與構裝頭70一併沿Y方向移動。 As shown in FIGS. 1 and 2, the Y-direction stator 50 of the Y-direction linear motor 55 is attached between the leg portions 23 of the portal frame 20 via the leaf springs 58. As shown in FIG. 3, the Y-direction fixing member 50 is formed by arranging the permanent magnets 52 in a space on the inner surface of the grooved frame 51. A space between the permanent magnets 52 of the Y-direction fixing member 50 is disposed with a frame 61 in which the coil 62 is mounted and the self-contained head 70 extends. With this configuration, the Y-direction movable member 60 moves together with the configuration head 70 in the Y direction.

如圖1、2所示,於副架台80之梁85安裝有線性導件86,於線性導件86能夠沿X方向滑動地安裝有Y方向負載接收部54。Y方向負載接收部54與Y方向固定件50利用連接構件53而連接,Y方向負載接收部54將Y方向之負載傳遞至梁85。 As shown in FIGS. 1 and 2, a linear guide 86 is attached to the beam 85 of the sub-frame 80, and a Y-direction load receiving portion 54 is slidably attached to the linear guide 86 in the X direction. The Y-direction load receiving portion 54 and the Y-direction stator 50 are connected by the connecting member 53, and the Y-direction load receiving portion 54 transmits the Y-direction load to the beam 85.

如以上般構成之電子零件構裝裝置100中,藉由X方向線性馬達35使門型框架20沿X方向移動,藉由Y方向線性馬達55使安裝於 門型框架20之構裝頭70沿Y方向移動。進而,電子零件構裝裝置100中,藉由安裝於構裝頭70之Z方向驅動機構73使加熱器120與構裝工具110沿Z方向移動。因此,X方向線性馬達35、Y方向線性馬達55及門型框架20構成將構裝頭70沿水平方向驅動之水平方向驅動機構即XY方向驅動機構65。而且,本實施形態之電子零件構裝裝置100利用與主架台11隔開而配置之副架台80接收使門型框架20沿X方向移動時之X方向上之反作用力、及使構裝頭70沿Y方向移動時之Y方向上之反作用力。因此,安裝有構裝平台10、膜切下機構200、膜回收機構300之主架台11幾乎不會發生振動。 In the electronic component mounting apparatus 100 configured as described above, the door frame 20 is moved in the X direction by the X-direction linear motor 35, and is attached to the linear motor 55 in the Y direction. The gantry 70 of the gantry frame 20 moves in the Y direction. Further, in the electronic component mounting apparatus 100, the heater 120 and the mounting tool 110 are moved in the Z direction by the Z-direction driving mechanism 73 attached to the mounting head 70. Therefore, the X-direction linear motor 35, the Y-direction linear motor 55, and the portal frame 20 constitute an XY-direction drive mechanism 65 that is a horizontal drive mechanism that drives the assembly head 70 in the horizontal direction. Further, the electronic component mounting apparatus 100 of the present embodiment receives the reaction force in the X direction when the door frame 20 is moved in the X direction by the sub-frame 80 disposed apart from the main gantry 11, and causes the constituting head 70 The reaction force in the Y direction when moving in the Y direction. Therefore, the main gantry 11 on which the structuring platform 10, the film dicing mechanism 200, and the film recovery mechanism 300 are mounted hardly vibrates.

其次,一面參照圖4,一面對安裝於軸72之前端之加熱器120與構裝工具110之構成進行說明。 Next, the configuration of the heater 120 and the mounting tool 110 attached to the front end of the shaft 72 will be described with reference to FIG.

如圖4所示,構裝工具110具備:四方板狀之基底111,以及自基底111之下表面119呈四方台座狀突出之島狀物112。島狀物112於表面118真空吸附圖3所示之半導體晶片150。島狀物112為小於基底111且與真空吸附於表面118之半導體晶片150大致相同之四方形狀。於構裝工具110之中心設置有用以真空吸附半導體晶片150之真空孔114。而且,於基底111之與島狀物112之外周面鄰接之位置設置有複數個真空孔115。真空孔115利用設置於基底111之上表面之環狀槽116而相互連通。 As shown in FIG. 4, the mounting tool 110 includes a square plate-shaped base 111 and islands 112 projecting in a square shape from the lower surface 119 of the base 111. The island 112 vacuum adsorbs the semiconductor wafer 150 shown in FIG. 3 on the surface 118. The island 112 is substantially quadrilateral in shape that is smaller than the substrate 111 and is substantially identical to the semiconductor wafer 150 that is vacuum adsorbed onto the surface 118. A vacuum hole 114 for vacuum absorbing the semiconductor wafer 150 is disposed at the center of the mounting tool 110. Further, a plurality of vacuum holes 115 are provided at a position of the base 111 adjacent to the outer peripheral surface of the island 112. The vacuum holes 115 communicate with each other by an annular groove 116 provided on the upper surface of the base 111.

如圖4所示,加熱器120係於例如氮化鋁等陶瓷之內部埋入由鉑或鎢等構成之發熱電阻體而成之四方板狀者,其大小與構裝工具110之基底111大致相同。於加熱器120之中心設置有與構裝工具110之真空孔114連通之真空孔122。而且,於加熱器120之下表面設置有槽124,於槽 124之一端連通有於厚度方向上貫通加熱器120之真空孔123。而且,於與構裝工具110之環狀槽116連通之加熱器120之位置,設置有真空孔121。加熱器120之各真空孔121、122、123於厚度方向上貫通。 As shown in FIG. 4, the heater 120 is formed in a square plate shape in which a heating resistor made of platinum or tungsten is embedded in a ceramic such as aluminum nitride, and the size thereof is substantially the same as the base 111 of the mounting tool 110. the same. A vacuum hole 122 communicating with the vacuum hole 114 of the forming tool 110 is disposed at the center of the heater 120. Moreover, a groove 124 is provided on the lower surface of the heater 120 in the groove One end of the 124 is connected to a vacuum hole 123 penetrating the heater 120 in the thickness direction. Further, a vacuum hole 121 is provided at a position of the heater 120 that communicates with the annular groove 116 of the mounting tool 110. Each of the vacuum holes 121, 122, and 123 of the heater 120 penetrates in the thickness direction.

如圖4所示,於軸72中與加熱器120之各真空孔121、122、123對應之位置分別設置有真空孔76、77、78,加熱器120之各真空孔121、122、123與軸72之各真空孔76、77、78分別連通。如圖4所示,若藉由未圖示之真空裝置使真空孔78為真空,則與真空孔78連通之真空孔123和與真空孔123連通之槽124為真空,從而構裝工具110被吸附固定於加熱器120之下表面。 As shown in FIG. 4, vacuum holes 76, 77, and 78 are respectively disposed in the shaft 72 corresponding to the vacuum holes 121, 122, and 123 of the heater 120, and the vacuum holes 121, 122, and 123 of the heater 120 are respectively Each of the vacuum holes 76, 77, 78 of the shaft 72 is in communication. As shown in FIG. 4, when the vacuum hole 78 is made vacuum by a vacuum device (not shown), the vacuum hole 123 communicating with the vacuum hole 78 and the groove 124 communicating with the vacuum hole 123 are evacuated, so that the assembly tool 110 is The adsorption is fixed to the lower surface of the heater 120.

其次,一面參照圖5,一面對膜切下機構200之詳細情況進行說明。膜切下機構200係以於基體部201之上表面201a與夾持器204之下表面204a之間夾住長條膜210之狀態使沖頭203沿Z方向移動,自長條膜210切下如圖8所示之四方切片狀膜220。如圖5所示,若將切片狀膜220切下則長條膜210中殘留有與切片狀膜220相同大小之四方孔212。 Next, the details of the film cutting mechanism 200 will be described with reference to Fig. 5 . The film cutting mechanism 200 moves the punch 203 in the Z direction in a state in which the long film 210 is sandwiched between the upper surface 201a of the base portion 201 and the lower surface 204a of the holder 204, and is cut from the long film 210. The square slice film 220 shown in FIG. As shown in FIG. 5, when the slice film 220 is cut, the square hole 212 having the same size as the slice film 220 remains in the long film 210.

膜切下機構200包括:中央設置有四方孔202之長方體之基體部201,配置於基體部201之上側之四方框形狀之夾持器204,配置於基體部201之孔202中之沖頭203,繞中心軸207旋轉之圓筒狀之膜進給輥206,以及配置於基體部201之與膜進給輥206相反之側且繞中心軸209旋轉之圓筒狀之膜捲取輥208。初始狀態下,長條膜210捲繞於膜進給輥206,一端超過基體部201之上表面201a而沿膜捲取輥208延伸,固定於膜捲取輥208。 The film cutting mechanism 200 includes a base portion 201 having a rectangular parallelepiped having a square hole 202 in the center, a square-shaped holder 204 disposed on the upper side of the base portion 201, and a punch 203 disposed in the hole 202 of the base portion 201. A cylindrical film feed roller 206 that rotates about the central axis 207, and a cylindrical film take-up roller 208 that is disposed on the opposite side of the base portion 201 from the film feed roller 206 and that rotates about the central axis 209. In the initial state, the long film 210 is wound around the film feed roller 206, and one end thereof extends beyond the upper surface 201a of the base portion 201 and extends along the film take-up roll 208, and is fixed to the film take-up roll 208.

圖5所示之基體部201之四方孔202之形狀大於參照圖4說 明之四方形狀之島狀物112之形狀。島狀物112之形狀為與構裝之半導體晶片150大致相同尺寸之四方形狀,因而基體部201之孔202為大於電子零件構裝裝置100構裝之半導體晶片150之四方形剖面之孔。而且,夾具204之孔205為與基體部201之孔202相同之大小。 The shape of the square hole 202 of the base portion 201 shown in FIG. 5 is larger than that described with reference to FIG. The shape of the island 112 in the shape of a square. The shape of the island 112 is a square shape of substantially the same size as the semiconductor wafer 150. Thus, the hole 202 of the base portion 201 is larger than the square of the semiconductor wafer 150 of the electronic component mounting device 100. Moreover, the aperture 205 of the clamp 204 is the same size as the aperture 202 of the base portion 201.

夾持器204以下表面204a與基體部201之上表面201a相接分離之方式,藉由未圖示之驅動裝置沿Z方向移動。如先前說明般,夾持器204之孔205與基體部201之孔202為相同之大小,因而若夾持器204之下表面204a與基體部201之上表面201a相接,則基體部201之孔202與夾持器204之孔205構成連通之一體之孔。 The lower surface 204a of the holder 204 is separated from the upper surface 201a of the base portion 201, and is moved in the Z direction by a driving device (not shown). As previously explained, the hole 205 of the holder 204 is the same size as the hole 202 of the base portion 201, so that if the lower surface 204a of the holder 204 is in contact with the upper surface 201a of the base portion 201, the base portion 201 is The aperture 202 and the aperture 205 of the holder 204 form a hole that communicates with one of the bodies.

沖頭203配置於基體部201之孔202之中且沿Z方向移動。沖頭203之外表面尺寸為稍小於孔202、孔205之內表面尺寸且與孔202、孔205之內表面之間形成微小間隙之尺寸。沖頭203之上表面203a為平面,且為與長條膜210相接之面。 The punch 203 is disposed in the hole 202 of the base portion 201 and moves in the Z direction. The outer surface of the punch 203 has a size slightly smaller than the inner surface of the hole 202, the hole 205, and a small gap formed between the hole 202 and the inner surface of the hole 205. The upper surface 203a of the punch 203 is a flat surface and is a surface that is in contact with the long film 210.

圖5所示之長條膜210為具備能夠經受得住如將半導體晶片150熱壓接至基板15時之溫度般之耐熱性、及圖10B所示之絕緣樹脂153不易附著之防黏性之膜。就長條膜210而言,較佳為例如聚四氟乙烯(PTFE,polytetrafluorethylene)、四氟乙烯.全氟烷基乙烯醚共聚物(PFA,perfluoroalkyl vinyl ether copolymer)等氟樹脂。而且,關於長條膜210之厚度,考慮機械強度及對半導體晶片150之導熱性,較佳為20~50μm左右。如圖5所示,於長條膜210之寬度方向中央,以不堵住真空吸附設置於構裝工具110之中央之半導體晶片150之真空孔114之方式,設置有孔211。孔211沿長條膜210之長度方向以大於孔202之長度方向長度之間距而設置。 The long film 210 shown in FIG. 5 is provided with a heat-resistant property capable of withstanding the temperature when the semiconductor wafer 150 is thermocompression-bonded to the substrate 15, and the adhesion preventing property of the insulating resin 153 shown in FIG. 10B is not easily adhered. membrane. For the long film 210, it is preferably, for example, polytetrafluoroethylene (PTFE) or tetrafluoroethylene. A fluororesin such as a perfluoroalkyl vinyl ether copolymer (PFA). Further, the thickness of the long film 210 is preferably about 20 to 50 μm in consideration of mechanical strength and thermal conductivity to the semiconductor wafer 150. As shown in FIG. 5, a hole 211 is provided in the center in the width direction of the long film 210 so as not to block the vacuum hole 114 of the semiconductor wafer 150 which is vacuum-adsorbed in the center of the mounting tool 110. The holes 211 are disposed along the length direction of the long film 210 at a distance greater than the length of the holes 202 in the longitudinal direction.

而且,關於長條膜210,只要具備耐熱性與防黏性則不限於上述氟樹脂等,亦可使用除耐熱性與防黏性外亦具備通氣性與防水性之不織布或者多孔質之樹脂材料。於使用不織布或者多孔質之樹脂材料之情形時,因切片狀膜220不堵住真空吸附半導體晶片150之真空孔114,故無需於長條膜210預先設置孔211。 In addition, the long film 210 is not limited to the above-mentioned fluororesin or the like as long as it has heat resistance and anti-adhesive property, and a non-woven fabric or a porous resin material which has air permeability and water repellency in addition to heat resistance and anti-adhesive property may be used. . In the case where a non-woven fabric or a porous resin material is used, since the slit film 220 does not block the vacuum hole 114 of the vacuum-adsorbing semiconductor wafer 150, it is not necessary to previously provide the hole 211 in the long film 210.

其次,一面參照圖6,一面對膜回收機構300進行說明。膜回收機構300如以後將要說明之圖11A至圖11C所示,係使保持於構裝工具110之表面118、下表面119之切片狀膜220吸附於位於平台301之上表面301a之吸附帶310,且將吸附有切片狀膜220之吸附帶310捲取於帶捲取輥304者。 Next, a film facing mechanism 300 will be described with reference to Fig. 6 . The film recovery mechanism 300 adsorbs the slice film 220 held on the surface 118 and the lower surface 119 of the mounting tool 110 to the adsorption tape 310 located on the upper surface 301a of the platform 301, as shown in FIGS. 11A to 11C which will be described later. And the adsorption tape 310 to which the sliced film 220 is adsorbed is taken up by the take-up roll 304.

如圖6所示,膜回收機構300具備:平板狀之平台301,繞中心軸303旋轉之圓筒狀之帶進給輥302,以及配置於平台301之與帶進給輥302相反之側且繞中心軸305旋轉之圓筒狀之帶捲取輥304。初始狀態下,吸附帶310捲繞於帶進給輥302,一端超過平台301之上表面301a而向帶捲取輥304延伸,且固定於帶捲取輥304。而且,平台301之上表面301a為平面。 As shown in FIG. 6, the film recovery mechanism 300 includes a flat plate-shaped platform 301, a cylindrical belt feed roller 302 that rotates about a central axis 303, and a platform 301 that is disposed on the opposite side of the platform 301 from the belt feed roller 302. A cylindrical tape take-up roll 304 that rotates about a central axis 305. In the initial state, the adsorption belt 310 is wound around the belt feeding roller 302, and one end thereof extends beyond the upper surface 301a of the stage 301 to the belt take-up roller 304, and is fixed to the belt take-up roller 304. Moreover, the upper surface 301a of the platform 301 is a flat surface.

如圖1所示,本實施形態之電子零件構裝裝置100於主架台11之內部具備控制部90,該控制部90控制X方向線性馬達35、Y方向線性馬達55、Z方向驅動機構73、膜切下機構200、及膜回收機構300之動作。控制部90為包含進行運算處理之CPU(Central Processing Unit,中央處理單元)及儲存控制程式、控制資料之記憶部之電腦。 As shown in FIG. 1, the electronic component assembly apparatus 100 of the present embodiment includes a control unit 90 inside the main gantry 11, and the control unit 90 controls the X-direction linear motor 35, the Y-direction linear motor 55, and the Z-direction drive mechanism 73, The operation of the film cutting mechanism 200 and the film recovery mechanism 300. The control unit 90 is a computer including a CPU (Central Processing Unit) that performs arithmetic processing, a storage control program, and a memory unit that controls data.

其次,一面參照圖7A至圖11C一面對本實施形態之電子零 件構裝裝置100之動作進行說明。 Next, the electronic zero of the embodiment is faced with reference to FIGS. 7A to 11C. The operation of the component mounting apparatus 100 will be described.

如圖7A所示,初始狀態下,膜切下機構200之夾持器204位於基體部201之上部,於基體部201之上表面201a與夾持器204之下表面204a之間形成間隙。長條膜210捲繞於膜進給輥206,一端通過基體部201之上表面201a與夾持器204之下表面204a之間之間隙而沿膜捲取輥208延伸,且固定於膜捲取輥208。而且,存儲於基體部201之孔202之沖頭203之上表面203a為較基體部201之上表面201a於Z方向上稍微靠下之位置。 As shown in Fig. 7A, in the initial state, the holder 204 of the film cutting mechanism 200 is located above the base portion 201, and a gap is formed between the upper surface 201a of the base portion 201 and the lower surface 204a of the holder 204. The long film 210 is wound around the film feed roller 206, and one end extends along the film take-up roll 208 through the gap between the upper surface 201a of the base portion 201 and the lower surface 204a of the holder 204, and is fixed to the film take-up roll. Roller 208. Further, the upper surface 203a of the punch 203 stored in the hole 202 of the base portion 201 is located slightly lower than the upper surface 201a of the base portion 201 in the Z direction.

控制部90如圖7A所示,使膜進給輥206與膜捲取輥208旋轉,如圖5所示,以按照規定之間隔設置於長條膜210之孔211來到沖頭203之中心之方式將長條膜210向X方向送出。 As shown in Fig. 7A, the control unit 90 rotates the film feed roller 206 and the film take-up roller 208, and as shown in Fig. 5, is placed at the center of the punch 203 at a predetermined interval in the hole 211 of the long film 210. In this manner, the long film 210 is sent out in the X direction.

其次,控制部90如圖7B所示,使夾持器204向Z方向下降,於基體部201之上表面201a與夾持器204之下表面204a之間夾住並固定長條膜210。基體部201之孔202與夾持器204之孔205大小相同,孔202與孔205配置於同一位置。因此,如圖7B所示,當夾住長條膜210時,孔202與孔205夾著長條膜210而構成連通之一體之孔。 Next, as shown in FIG. 7B, the control unit 90 lowers the holder 204 in the Z direction, and sandwiches and fixes the long film 210 between the upper surface 201a of the base portion 201 and the lower surface 204a of the holder 204. The hole 202 of the base portion 201 is the same size as the hole 205 of the holder 204, and the hole 202 and the hole 205 are disposed at the same position. Therefore, as shown in FIG. 7B, when the long film 210 is sandwiched, the hole 202 and the hole 205 sandwich the long film 210 to form a hole that communicates with one body.

其次,控制部90如圖7C所示,使沖頭203之上表面203a超過基體部201之上表面201a而使沖頭203向Z方向上升直至進入至夾持器204之孔205中為止。藉此,自長條膜210切下與基體部201之孔205之大小大致相同之切片狀膜220(參照圖7)。所切下之切片狀膜220於中央具有孔211。於圖7C所示之狀態下,所切下之切片狀膜220位於平面狀之沖頭203之上表面203a。 Next, as shown in FIG. 7C, the control unit 90 causes the upper surface 203a of the punch 203 to exceed the upper surface 201a of the base portion 201 to raise the punch 203 in the Z direction until it enters the hole 205 of the holder 204. Thereby, the slice film 220 having substantially the same size as the hole 205 of the base portion 201 is cut out from the long film 210 (see FIG. 7). The cut slice film 220 has a hole 211 at the center. In the state shown in Fig. 7C, the cut slice film 220 is placed on the upper surface 203a of the flat punch 203.

於切片狀膜220之切下結束後,控制部90如圖9A所示,使 X方向線性馬達35、Y方向線性馬達55、Z方向驅動機構73驅動,以構裝工具110之真空孔114處於圖8所示之切片狀膜220之孔211之位置之方式對XY方向上之位置進行調整,使構裝工具110之表面118下降至沖頭203之上表面203a為止。而且,控制部90如圖9B所示,藉由未圖示之真空裝置使軸72之真空孔76為真空。於是,通過與真空孔76連通之真空孔121而構裝工具110之上表面之槽116為真空,與槽116連通之複數個真空孔115為真空。藉此,位於沖頭203之上表面203a之切片狀膜220如圖9B所示,以覆蓋島狀物112之表面118、島狀物112之側面、基底111之下表面119之方式吸附於構裝工具110之Z方向下側。另外,構裝工具110之真空孔114不會因存在切片狀膜220之孔211而堵住。 After the cutting of the sliced film 220 is completed, the control unit 90 is made as shown in FIG. 9A. The X-direction linear motor 35, the Y-direction linear motor 55, and the Z-direction drive mechanism 73 are driven in such a manner that the vacuum hole 114 of the mounting tool 110 is at the position of the hole 211 of the slice film 220 shown in FIG. The position is adjusted such that the surface 118 of the forming tool 110 is lowered to the upper surface 203a of the punch 203. Further, as shown in FIG. 9B, the control unit 90 causes the vacuum hole 76 of the shaft 72 to be vacuumed by a vacuum device (not shown). Thus, the groove 116 of the upper surface of the tool 110 is vacuumed by the vacuum hole 121 communicating with the vacuum hole 76, and the plurality of vacuum holes 115 communicating with the groove 116 are vacuum. Thereby, the slice film 220 located on the upper surface 203a of the punch 203 is adsorbed to cover the surface 118 of the island 112, the side surface of the island 112, and the lower surface 119 of the substrate 111 as shown in FIG. 9B. The lower side of the tool 110 is in the Z direction. In addition, the vacuum hole 114 of the mounting tool 110 is not blocked by the presence of the hole 211 of the sliced film 220.

控制部90如圖9B所示,自沖頭203之上表面203a向構裝工具110之下側表面之切片狀膜220交付結束後,使膜進給輥206與膜捲取輥208旋轉,如圖5所示,將長條膜210之包含切除切片狀膜220後所得之孔212之部分捲取於膜捲取輥208,自膜進給輥206將新的長條膜210送出至基體部201、沖頭203之上。 As shown in FIG. 9B, the control unit 90 rotates the film feed roller 206 and the film take-up roller 208 from the upper surface 203a of the punch 203 to the slice film 220 on the lower surface of the mounting tool 110, as shown in FIG. As shown in FIG. 5, a portion of the long film 210 including the hole 212 obtained by cutting the slice film 220 is taken up by the film take-up roll 208, and a new long film 210 is fed from the film feed roll 206 to the base portion. 201, above the punch 203.

如圖10A所示,控制部90驅動X方向線性馬達35、Y方向線性馬達55而使構裝工具110移動至半導體晶片150之上,藉由Z方向驅動機構73使構裝工具110下降至半導體晶片150之上表面為止。然後,若使真空孔77為真空則與真空孔77連通之構裝工具110之真空孔114為真空,半導體晶片150經由切片狀膜220而真空吸附於表面118。如圖10A所示,於半導體晶片150之進行熱壓接之面形成有電極151,於電極側面貼附有絕緣樹脂膜152。 As shown in FIG. 10A, the control unit 90 drives the X-direction linear motor 35 and the Y-direction linear motor 55 to move the structuring tool 110 onto the semiconductor wafer 150, and the Z-direction driving mechanism 73 lowers the structuring tool 110 to the semiconductor. Up to the upper surface of the wafer 150. Then, when the vacuum hole 77 is made vacuum, the vacuum hole 114 of the mounting tool 110 that communicates with the vacuum hole 77 is vacuumed, and the semiconductor wafer 150 is vacuum-adsorbed to the surface 118 via the slice film 220. As shown in FIG. 10A, an electrode 151 is formed on the surface of the semiconductor wafer 150 which is thermocompression bonded, and an insulating resin film 152 is attached to the electrode side surface.

如圖10B所示,控制部90驅動X方向線性馬達35、Y方向線性馬達55而使構裝工具110移動至基板15之構裝位置之正上方為止。然後,控制部90接通加熱器120而將半導體晶片150之溫度自250℃加熱至300℃左右為止。然後,控制部90藉由Z方向驅動機構73使構裝工具110下降,使半導體晶片150之電極151熱壓接至基板15之電極154,並且使半導體晶片150與基板15之間之絕緣樹脂膜152熱硬化而形成絕緣樹脂153將間隙加以密封。此時,絕緣樹脂153之一部分向半導體晶片150之周圍伸出而絕緣樹脂153到達構裝工具110之島狀物112側面為止。然而,因該部分之表面由切片狀膜220所覆蓋,故絕緣樹脂153不會附著於構裝工具110之表面。 As shown in FIG. 10B, the control unit 90 drives the X-direction linear motor 35 and the Y-direction linear motor 55 to move the structuring tool 110 directly above the mounting position of the substrate 15. Then, the control unit 90 turns on the heater 120 to heat the temperature of the semiconductor wafer 150 from 250 ° C to about 300 ° C. Then, the control unit 90 lowers the mounting tool 110 by the Z-direction driving mechanism 73, thermally crimps the electrode 151 of the semiconductor wafer 150 to the electrode 154 of the substrate 15, and causes an insulating resin film between the semiconductor wafer 150 and the substrate 15. 152 is thermally hardened to form an insulating resin 153 to seal the gap. At this time, one portion of the insulating resin 153 protrudes toward the periphery of the semiconductor wafer 150 and the insulating resin 153 reaches the side of the island 112 of the mounting tool 110. However, since the surface of the portion is covered by the dicing film 220, the insulating resin 153 does not adhere to the surface of the structuring tool 110.

以規定時間將半導體晶片150熱壓接至基板15後,控制部90解除真空孔77、114之真空從而解除半導體晶片150之吸附,斷開加熱器120並藉由Z方向驅動機構73使構裝工具110上升,驅動X方向線性馬達35、Y方向線性馬達55而如圖11A所示,使構裝工具110移動至膜回收機構300之平台301之正上方為止。此時,於切片狀膜220之表面附著絕緣樹脂153之殘渣156。 After the semiconductor wafer 150 is thermocompression-bonded to the substrate 15 for a predetermined period of time, the control unit 90 releases the vacuum of the vacuum holes 77 and 114 to release the adsorption of the semiconductor wafer 150, turns off the heater 120, and causes the mounting by the Z-direction driving mechanism 73. The tool 110 is raised to drive the X-direction linear motor 35 and the Y-direction linear motor 55, and as shown in FIG. 11A, the construction tool 110 is moved to directly above the stage 301 of the film recovery mechanism 300. At this time, the residue 156 of the insulating resin 153 is adhered to the surface of the sliced film 220.

其次,控制部90如圖11B所示,使Z方向驅動機構73動作而使構裝工具110下降至膜回收機構300之平台301之上,從而解除真空孔76、槽116、真空孔115之真空。於是,藉由切片狀膜220之真空孔115吸附於基底111之下表面119之部分離開下表面119。然後,切片狀膜220之覆蓋構裝工具110之表面118之部分被吸附於吸附帶310之表面。吸附帶310為具有較構裝工具110之表面118保持切片狀膜220之附著力、引力等 大之黏著力、吸附力者即可,例如,亦可為黏著帶等。 Next, as shown in FIG. 11B, the control unit 90 operates the Z-direction drive mechanism 73 to lower the assembly tool 110 onto the stage 301 of the film recovery mechanism 300, thereby releasing the vacuum of the vacuum hole 76, the groove 116, and the vacuum hole 115. . Thus, the portion of the lower surface 119 of the substrate 111 is removed from the lower surface 119 by the vacuum hole 115 of the slice film 220. Then, a portion of the surface 118 of the cover film 220 covering the mounting tool 110 is adsorbed to the surface of the adsorption belt 310. The adsorption tape 310 has the adhesion, gravity, etc. of the slice film 220 with the surface 118 of the mounting tool 110. The adhesion and the adsorption force can be, for example, an adhesive tape or the like.

如圖11C所示,控制部90若使Z方向驅動機構73動作而使構裝工具110上升,則吸附於吸附帶310之上之切片狀膜220以被吸附之狀態殘留。然後,控制部90於吸附帶310自構裝工具110之下側之表面118、下表面119接收到切片狀膜220之後,如圖6、圖11C所示,驅動帶進給輥302與帶捲取輥304而將吸附有切片狀膜220之部分向帶捲取輥304捲入,自帶進給輥302將吸附帶310之新的吸附面送出至平台301之上表面301a之上。 As shown in FIG. 11C, when the control unit 90 operates the Z-direction drive mechanism 73 to raise the structuring tool 110, the dicing film 220 adsorbed on the adsorption belt 310 remains in a state of being adsorbed. Then, after the adsorption belt 310 receives the slice film 220 from the surface 118 and the lower surface 119 on the lower side of the tool 110, the control belt 90 drives the tape feed roller 302 and the tape roll as shown in FIGS. 6 and 11C. The roller 304 is taken up and the portion to which the sliced film 220 is adsorbed is taken up to the take-up reel 304, and the new feed surface of the adsorption belt 310 is fed to the upper surface 301a of the stage 301 by the self-feeding roller 302.

如以上說明般,根據本實施形態之電子零件構裝裝置100,使經切下之切片狀膜220吸附於構裝工具110之表面118、下表面119,並經由切片狀膜220使半導體晶片150熱壓接至基板15,由此沿XY方向移動之構裝頭70中未搭載重量較大之膜搬送機構且可抑制絕緣樹脂153吸附於構裝工具110。進而,可一方面抑制絕緣樹脂153附著於構裝工具110,一方面使構裝頭70高速地移動,從而可縮短半導體晶片150之構裝時間。 As described above, according to the electronic component mounting apparatus 100 of the present embodiment, the cut slice film 220 is adsorbed on the surface 118 and the lower surface 119 of the mounting tool 110, and the semiconductor wafer 150 is made via the slice film 220. When the substrate 15 is thermocompression-bonded, the film transfer mechanism having a large weight is not mounted in the structuring head 70 that moves in the XY direction, and the insulating resin 153 is prevented from being adsorbed to the structuring tool 110. Further, on the one hand, the insulating resin 153 can be prevented from adhering to the structuring tool 110, and the structuring head 70 can be moved at a high speed, whereby the mounting time of the semiconductor wafer 150 can be shortened.

而且,本實施形態之電子零件構裝裝置100如專利文獻1記載之先前技術之膜搬送機構般,無須一直於構裝工具110之表面118之側配置卷狀之膜,因而可根據進行熱壓接之半導體晶片150之種類簡單地更換構裝工具110。而且,亦可於未吸附切片狀膜220之狀態下藉由玻璃標記進行位置校正等附帶動作,從而可提高構裝精度。 Further, in the electronic component mounting apparatus 100 of the present embodiment, as in the film transport mechanism of the prior art described in Patent Document 1, it is not necessary to always arrange a roll-shaped film on the side of the surface 118 of the mounting tool 110, so that it can be subjected to hot pressing. The type of semiconductor wafer 150 is simply replaced with the tool 110. Further, it is also possible to carry out an additional operation such as position correction by a glass mark in a state where the sliced film 220 is not adsorbed, and the assembly accuracy can be improved.

將以上說明之電子零件構裝裝置100之膜回收機構300作為於吸附帶310吸附、回收切片狀膜220者而進行了說明,但不限於此,亦可例如於平台301之上表面301a配置真空抽吸孔,利用較構裝工具110之表 面118之保持切片狀膜220之附著力、引力等大之力真空抽吸而將切片狀膜220真空抽吸並加以回收。而且,於下側之面配置有真空抽吸孔之盒中放入構裝工具110之前端,解除構裝工具110之真空孔115之真空,並且使盒內為真空而將切片狀膜220吸入並回收至盒中。 The film recovery mechanism 300 of the electronic component assembly apparatus 100 described above is described as the adsorption and recovery of the sliced film 220 on the adsorption tape 310. However, the present invention is not limited thereto, and for example, a vacuum may be disposed on the upper surface 301a of the stage 301. Suction hole, using the table of the relatively constructed tool 110 The surface 118 holds the force of the adhesion of the sliced film 220, the force of gravity, and the like, and vacuum suction, and the sliced film 220 is vacuum-sucked and recovered. Further, in the case where the vacuum suction hole is disposed on the lower side, the front end of the construction tool 110 is placed, the vacuum of the vacuum hole 115 of the construction tool 110 is released, and the inside of the case is vacuumed to suck the slice film 220. And recycled to the box.

而且,將本實施形態之電子零件構裝裝置100之膜切下機構200之沖頭203之上表面203a設為平面而進行了說明,但亦可於圖5所示之孔211之位置配置上推針。而且,於使沖頭203上升而自長條膜210切下切片狀膜220時,利用上推針於長條膜210開設孔211後,以上推針進入至構裝工具110之真空孔114之方式,使構裝工具110下降至沖頭203之上表面203a,使真空孔115為真空而自沖頭203之上表面203a向構裝工具110之表面118、下表面119交付切片狀膜220。 Further, although the upper surface 203a of the punch 203 of the film cutting mechanism 200 of the electronic component mounting apparatus 100 of the present embodiment has been described as a flat surface, it may be disposed at the position of the hole 211 shown in FIG. Push the needle. Further, when the punch 203 is raised and the slice film 220 is cut from the long film 210, the hole 211 is opened in the long film 210 by the push-up needle, and the push pin is pushed into the vacuum hole 114 of the mounting tool 110. In a manner, the forming tool 110 is lowered to the upper surface 203a of the punch 203, and the vacuum hole 115 is vacuumed, and the slice film 220 is delivered from the upper surface 203a of the punch 203 to the surface 118 and the lower surface 119 of the mounting tool 110.

而且,上述說明中,設為將半導體晶片150熱壓接至基板15之上而進行了說明,但本發明亦可用於如下情形,即,於將半導體晶片150熱壓接至基板15之上後,將其他半導體晶片熱壓接至該半導體晶片150之上。 Further, in the above description, the description has been made on the surface of the substrate 15 by thermocompression bonding of the semiconductor wafer 150. However, the present invention can also be applied to the case where the semiconductor wafer 150 is thermocompression bonded onto the substrate 15 Other semiconductor wafers are thermocompression bonded onto the semiconductor wafer 150.

進而,以上說明中,已說明了如下情況,即,於半導體晶片150之電極側面貼附絕緣樹脂膜152,於將半導體晶片150熱壓接至基板15時使半導體晶片150與基板15之間之絕緣樹脂膜152熱硬化而形成絕緣樹脂153並將間隙加以密封,但亦可代替絕緣樹脂膜152而將絕緣樹脂漿料塗布於半導體晶片150之電極側面,於熱壓接半導體晶片150時使上述絕緣樹脂漿料熱硬化而形成絕緣樹脂153。而且,亦可將絕緣樹脂漿料塗布於基板15之表面,於熱壓接半導體體晶片150時使上述絕緣樹脂漿料熱硬化而形 成絕緣樹脂153。本實施形態之電子零件構裝裝置100使經切下之切片狀膜220吸附於構裝工具110之表面118、下表面119,並經由切片狀膜220使半導體晶片10熱壓接至基板15,因而任一情形時,均可抑制絕緣樹脂153附著於構裝工具110。 Further, in the above description, the case where the insulating resin film 152 is attached to the electrode side surface of the semiconductor wafer 150 and the semiconductor wafer 150 is thermally bonded to the substrate 15 between the semiconductor wafer 150 and the substrate 15 has been described. The insulating resin film 152 is thermally cured to form the insulating resin 153 and seals the gap. However, instead of the insulating resin film 152, the insulating resin paste may be applied to the electrode side surface of the semiconductor wafer 150, and when the semiconductor wafer 150 is thermocompression bonded, the above The insulating resin paste is thermally cured to form an insulating resin 153. Further, an insulating resin slurry may be applied onto the surface of the substrate 15 to thermally cure the insulating resin paste when the semiconductor wafer 150 is thermocompression bonded. Insulating resin 153. In the electronic component assembly apparatus 100 of the present embodiment, the cut slice film 220 is adsorbed on the surface 118 and the lower surface 119 of the mounting tool 110, and the semiconductor wafer 10 is thermocompression bonded to the substrate 15 via the slice film 220. Therefore, in any case, the adhesion of the insulating resin 153 to the mounting tool 110 can be suppressed.

Claims (4)

一種電子零件構裝裝置,將電子零件熱壓接至基板或其他電子零件,並且利用絕緣樹脂將上述電子零件與上述基板之間隙或上述電子零件與上述其他電子零件之間隙加以密封,上述電子零件構裝裝置之特徵在於包括:膜切下機構,將長條膜除了寬度方向之端部外呈切片狀膜切下;以及構裝工具,隔著上述切片狀膜真空吸附上述電子零件,將上述電子零件熱壓接至上述基板或其他電子零件;上述膜切下機構具備:基體部;膜進給輥,配置於上述基體部之一方,捲繞有上述長條膜;膜捲取輥,配置於上述基體部之另一方,固定有上述長條膜之一端;上述膜進給輥供給上述長條膜,上述膜捲取輥回收上述切片狀膜切下後之上述長條膜。 An electronic component mounting device for thermocompression bonding electronic parts to a substrate or other electronic parts, and sealing the gap between the electronic parts and the substrate or the gap between the electronic parts and the other electronic parts by using an insulating resin, the electronic parts The structuring device is characterized by comprising: a film cutting mechanism for cutting a long film in a strip shape film except for an end portion in the width direction; and a structuring tool for vacuum-absorbing the electronic component via the dicing film The electronic component is thermocompression-bonded to the substrate or other electronic component; the film cutting mechanism includes: a base portion; a film feeding roller disposed on one of the base portions, and the long film is wound; the film winding roller is disposed One of the ends of the long film is fixed to the other of the base portions, the film feeding roller supplies the long film, and the film winding roller recovers the long film after the slice film is cut. 如申請專利範圍第1項之電子零件構裝裝置,其包括自上述構裝工具之表面接收上述切片狀膜之膜回收機構。 The electronic component mounting apparatus of claim 1, comprising a film recovery mechanism for receiving the sliced film from a surface of the mounting tool. 如申請專利範圍第1項之電子零件構裝裝置,其中上述構裝工具包括:基底,以及自上述基底突出且將上述電子零件真空吸附至表面之島狀物,上述膜切下機構之上述基體部具有:大於上述島狀物之平面形狀之形狀之孔;上述膜切下機構進一步具備: 夾持器,具有與上述基體部相同之形狀之孔,與上述基體部之間夾住上述長條膜;以及沖頭,對上述基體部之孔與上述夾持器之孔拔出插入且自上述長條膜切下上述切片狀膜,上述沖頭之與上述長條膜相接之面為將上述切片狀膜交付至上述構裝工具之表面之平面。 The electronic component mounting device of claim 1, wherein the mounting tool comprises: a substrate; and an island protruding from the substrate and vacuum-adsorbing the electronic component to a surface, the substrate of the film cutting mechanism The portion has a hole having a shape larger than a planar shape of the island; the film cutting mechanism further includes: a holder having a hole having the same shape as the base portion and sandwiching the long film from the base portion; and a punch for inserting and inserting the hole of the base portion and the hole of the holder The strip film is cut out from the long film, and the surface of the punch that is in contact with the long film is a flat surface on which the slice film is delivered to the surface of the mounting tool. 如申請專利範圍第2項之電子零件構裝裝置,其中上述膜回收機構包括:平板狀之平台;以及吸附帶,沿著上述平台之面移動而自上述構裝工具之表面依次接收上述切片狀膜。 The electronic component assembly device of claim 2, wherein the film recovery mechanism comprises: a flat plate-shaped platform; and an adsorption belt that moves along the surface of the platform to sequentially receive the slice shape from the surface of the construction tool membrane.
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