TWI600894B - Measuring apparatus and measuring method - Google Patents

Measuring apparatus and measuring method Download PDF

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Publication number
TWI600894B
TWI600894B TW102138198A TW102138198A TWI600894B TW I600894 B TWI600894 B TW I600894B TW 102138198 A TW102138198 A TW 102138198A TW 102138198 A TW102138198 A TW 102138198A TW I600894 B TWI600894 B TW I600894B
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TW
Taiwan
Prior art keywords
light
sample
phosphor
light receiving
measurement
Prior art date
Application number
TW102138198A
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English (en)
Chinese (zh)
Other versions
TW201439519A (zh
Inventor
Hisashi Shiraiwa
Takeshi Kamada
Shunsuke Mishima
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Otsuka Electronics Co Ltd
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Publication date
Application filed by Otsuka Electronics Co Ltd filed Critical Otsuka Electronics Co Ltd
Publication of TW201439519A publication Critical patent/TW201439519A/zh
Application granted granted Critical
Publication of TWI600894B publication Critical patent/TWI600894B/zh

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Health & Medical Sciences (AREA)
  • Luminescent Compositions (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
TW102138198A 2013-01-31 2013-10-23 Measuring apparatus and measuring method TWI600894B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013017231A JP6041691B2 (ja) 2013-01-31 2013-01-31 測定装置および測定方法

Publications (2)

Publication Number Publication Date
TW201439519A TW201439519A (zh) 2014-10-16
TWI600894B true TWI600894B (zh) 2017-10-01

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Family Applications (1)

Application Number Title Priority Date Filing Date
TW102138198A TWI600894B (zh) 2013-01-31 2013-10-23 Measuring apparatus and measuring method

Country Status (4)

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JP (1) JP6041691B2 (ko)
KR (1) KR101987506B1 (ko)
CN (1) CN103969230B (ko)
TW (1) TWI600894B (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105810604B (zh) * 2014-12-30 2021-04-09 江西省晶能半导体有限公司 一种测试荧光薄片的方法
JP6613063B2 (ja) * 2015-07-07 2019-11-27 大塚電子株式会社 光学特性測定システム
JP6856558B2 (ja) 2018-01-23 2021-04-07 浜松ホトニクス株式会社 光測定装置及び光測定方法
JP6856559B2 (ja) * 2018-01-23 2021-04-07 浜松ホトニクス株式会社 光測定装置及び光測定方法
CN109164773B (zh) * 2018-09-29 2020-03-27 厦门大学 一种基于LabVIEW的多功能光学测试系统及方法
CN109596320B (zh) * 2018-11-29 2021-06-29 江西省晶能半导体有限公司 荧光膜片性能测试方法及荧光膜片中原料配比确定方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200302340A (en) * 2002-01-23 2003-08-01 Hitachi Int Electric Inc Flourescent material detecting method and apparatus
TW200940979A (en) * 2008-03-28 2009-10-01 Ind Tech Res Inst System for detecting defect of panel device
TW201135197A (en) * 2010-03-18 2011-10-16 Otsuka Denshi Kk Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator

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Publication number Priority date Publication date Assignee Title
US6825921B1 (en) * 1999-11-10 2004-11-30 Molecular Devices Corporation Multi-mode light detection system
JP3902939B2 (ja) * 2001-10-26 2007-04-11 株式会社日立ハイテクノロジーズ 標本中の微小領域測定装置及び方法
JP2003294633A (ja) * 2002-03-29 2003-10-15 Otsuka Denshi Co Ltd 蛍光測定装置
JP2009058256A (ja) * 2007-08-30 2009-03-19 Konica Minolta Medical & Graphic Inc 蛍光検出ユニット、反応検出装置、マイクロチップ検査システム
JP2010101835A (ja) 2008-10-27 2010-05-06 Toshiba Corp 蛍光基準部材、及び蛍光基準部材を備える蛍光検知装置
US8119996B2 (en) * 2009-01-20 2012-02-21 Otsuka Electronics Co., Ltd. Quantum efficiency measurement apparatus and quantum efficiency measurement method
KR101034716B1 (ko) * 2009-01-20 2011-05-17 오츠카 일렉트로닉스 가부시키가이샤 양자 효율 측정 장치 및 양자 효율 측정 방법
JP4698766B2 (ja) * 2009-06-12 2011-06-08 三井造船株式会社 蛍光検出装置および蛍光検出方法
JP2011204406A (ja) * 2010-03-24 2011-10-13 Caravell Co Ltd 発光ダイオードと蛍光体の組み合わせ照明
JP2011214942A (ja) * 2010-03-31 2011-10-27 Fujifilm Corp 光断層計測装置
JP5760589B2 (ja) * 2011-03-30 2015-08-12 豊田合成株式会社 白色ｌｅｄ装置用蛍光体の蛍光スペクトルの測定方法及び測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200302340A (en) * 2002-01-23 2003-08-01 Hitachi Int Electric Inc Flourescent material detecting method and apparatus
TW200940979A (en) * 2008-03-28 2009-10-01 Ind Tech Res Inst System for detecting defect of panel device
TW201135197A (en) * 2010-03-18 2011-10-16 Otsuka Denshi Kk Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator

Also Published As

Publication number Publication date
JP2014149194A (ja) 2014-08-21
KR20140098676A (ko) 2014-08-08
CN103969230B (zh) 2018-06-26
TW201439519A (zh) 2014-10-16
KR101987506B1 (ko) 2019-06-10
JP6041691B2 (ja) 2016-12-14
CN103969230A (zh) 2014-08-06

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