TWI600894B - Measuring apparatus and measuring method - Google Patents

Measuring apparatus and measuring method Download PDF

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TWI600894B
TWI600894B TW102138198A TW102138198A TWI600894B TW I600894 B TWI600894 B TW I600894B TW 102138198 A TW102138198 A TW 102138198A TW 102138198 A TW102138198 A TW 102138198A TW I600894 B TWI600894 B TW I600894B
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light
sample
phosphor
light receiving
measurement
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TW102138198A
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TW201439519A (en
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Hisashi Shiraiwa
Takeshi Kamada
Shunsuke Mishima
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Otsuka Electronics Co Ltd
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Description

測定裝置及測定方法 Measuring device and measuring method

本發明係關於用以測定螢光體的光學性能的測定裝置及測定方法。 The present invention relates to a measuring device and a measuring method for measuring the optical properties of a phosphor.

自以往以來在各種用途之下利用含有螢光物質的各種螢光體。近年來,被廣泛應用在使用LED(Light Emitting Diode,發光二極體)等的發光元件、液晶顯示器或有機EL(Electro Luminescence,有機電激發光)顯示器等顯示元件等。如上所示之螢光體會左右發光元件或顯示元件的性能,因此必須適當評估其光學性能。 Various phosphors containing fluorescent substances have been utilized for various purposes in the past. In recent years, it has been widely used as a light-emitting element such as an LED (Light Emitting Diode), a liquid crystal display, or a display element such as an organic EL (Electro Luminescence) display. The phosphor shown above will affect the performance of the light-emitting element or the display element, and therefore its optical properties must be properly evaluated.

以有關如上所示之螢光體之評估的構成而言,日本特開2012-208024號公報係揭示一種用以分散在封裝材中來測定發光裝置所使用之螢光體的螢光頻譜的構成。 In the structure of the evaluation of the phosphors as described above, Japanese Laid-Open Patent Publication No. 2012-208024 discloses a configuration for measuring the fluorescence spectrum of the phosphor used in the light-emitting device by dispersing in a package. .

上述日本特開2012-208024號公報所揭示之構成係適用於測定使螢光體分散在封裝材中的試料(試樣)的螢光體頻譜,基本上係假想測定每個試料的螢光頻譜。 The configuration disclosed in Japanese Laid-Open Patent Publication No. 2012-208024 is applied to measuring a spectrum of a phosphor of a sample (sample) in which a phosphor is dispersed in a package, and basically determines a fluorescence spectrum of each sample. .

另一方面,在螢光體的製造線等,係有欲以更短時間來測定成為檢査對象的複數螢光體的需求。例如,在全面形成為螢光體的薄片的狀態下進行製造或檢査。如上所示之全面形成為螢光體的薄片係被切出所需尺寸的區域,作為製品來 加以使用。在日本特開2012-208024號公報所揭示之構成中,係必須使積分球接觸板狀試料來進行測定。因此,若測定位於同一面內的複數測定點的螢光頻譜時,係必須反覆積分球的移動及對試料的接觸,難以縮短測定所需時間。 On the other hand, in the production line of a phosphor or the like, there is a demand for measuring a plurality of phosphors to be inspected in a shorter period of time. For example, manufacturing or inspection is performed in a state in which a sheet of a phosphor is formed in its entirety. The sheet formed as a phosphor as described above is cut out of a desired size area as an article. Use it. In the configuration disclosed in Japanese Laid-Open Patent Publication No. 2012-208024, it is necessary to measure the integrating sphere by contacting the plate-shaped sample. Therefore, when measuring the fluorescence spectrum of a plurality of measurement points located in the same plane, it is necessary to repeat the movement of the integrating sphere and the contact with the sample, and it is difficult to shorten the time required for the measurement.

本發明係為解決如上所示之課題所研創者,其目的在提供可以更短時間測定螢光體的光學性能的測定裝置及測定方法。 The present invention has been made in order to solve the problems as described above, and an object thereof is to provide a measuring device and a measuring method capable of measuring the optical performance of a phosphor in a shorter period of time.

按照本發明之某態樣之用以測定螢光體的光學性能的測定裝置係包括:用以對螢光體照射激勵光的光源;用以接受激勵光之中透過螢光體的光、及藉由激勵光而在螢光體所發生的螢光的受光部;及用以檢測藉由受光部所接受到的光的檢測部。受光部係包含:在激勵光的照射方向具有預定的長度的框體;被配置在框體之螢光體之側的光擴散部;及被配置在框體之光擴散部的相反側,用以將所入射的螢光導引至檢測部的窗。 An apparatus for measuring an optical property of a phosphor according to a certain aspect of the present invention includes: a light source for irradiating the phosphor with excitation light; and a light for transmitting the excitation light through the phosphor; a light receiving portion of the fluorescent light generated by the fluorescent body by the excitation light; and a detecting portion for detecting the light received by the light receiving portion. The light receiving unit includes a frame body having a predetermined length in the irradiation direction of the excitation light, a light diffusion portion disposed on the side of the phosphor of the frame body, and a light diffusion portion disposed on the opposite side of the light diffusion portion of the frame body. The window that guides the incident fluorescent light to the detecting portion.

較佳為,受光部係以預定距離遠離螢光體作配置。 Preferably, the light receiving portion is disposed away from the phosphor at a predetermined distance.

較佳為,光擴散部係被配置在包含來自窗的視野的範圍。 Preferably, the light diffusing portion is disposed in a range including a field of view from the window.

較佳為,測定裝置係另外包含變更來自光源的激勵光入射至螢光體的位置的移動機構。 Preferably, the measuring device further includes a moving mechanism that changes the position at which the excitation light from the light source is incident on the phosphor.

較佳為,對於螢光體,按照預定規則,配置有複數受光部,檢測部係並列測定藉由複數受光部而分別所接受到的螢光。 Preferably, in the phosphor, a plurality of light receiving portions are arranged in accordance with a predetermined rule, and the detecting portion measures the fluorescence received by the plurality of light receiving portions in parallel.

按照本發明之其他態樣之用以測定螢光體的光學 性能的測定方法係包括:由光源對螢光體照射激勵光的步驟;在受光部接受激勵光之中透過螢光體的光、及藉由激勵光而在螢光體所發生的螢光的步驟;及在檢測部檢測藉由受光部所接受到的光的步驟。受光部係包含:在激勵光的照射方向具有預定的長度的框體;被配置在框體之螢光體之側的光擴散部;及被配置在框體之光擴散部的相反側,用以將所入射的螢光導引至檢測部的窗。 Other aspects of the invention for determining the optics of a phosphor The method for measuring performance includes a step of irradiating the phosphor with excitation light by a light source, a light that transmits the excitation light through the light receiving portion, and a fluorescent light that is generated in the phosphor by the excitation light. And a step of detecting, by the detecting unit, the light received by the light receiving unit. The light receiving unit includes a frame body having a predetermined length in the irradiation direction of the excitation light, a light diffusion portion disposed on the side of the phosphor of the frame body, and a light diffusion portion disposed on the opposite side of the light diffusion portion of the frame body. The window that guides the incident fluorescent light to the detecting portion.

藉由本發明,可以更短時間測定螢光體的光學性能。 According to the present invention, the optical properties of the phosphor can be measured in a shorter time.

本發明之上述內容及其他目的、特徵、局面及優點應可由與所附圖式相關所被理解的有關本發明的接下來的詳細說明清楚得知。 The above and other objects, features, aspects and advantages of the present invention will become apparent from

1‧‧‧測定裝置 1‧‧‧Measurement device

2‧‧‧試樣 2‧‧‧sample

10‧‧‧受光部 10‧‧‧Receiving Department

12‧‧‧框體 12‧‧‧ frame

14‧‧‧光擴散部 14‧‧‧Light Diffusion Department

16‧‧‧內面 16‧‧‧ inside

18‧‧‧窗 18‧‧‧ window

20、66‧‧‧光纖 20, 66‧‧‧ fiber

22‧‧‧連接端 22‧‧‧Connecting end

24‧‧‧視野 24 ‧ ‧ Vision

50、60‧‧‧照射部 50, 60‧‧‧ Department of Irradiation

52‧‧‧光源 52‧‧‧Light source

54‧‧‧聚光透鏡 54‧‧‧ Concentrating lens

56‧‧‧電源裝置 56‧‧‧Power supply unit

62‧‧‧激勵光源 62‧‧‧Excited light source

64‧‧‧波長選擇部 64‧‧‧Wavelength Selection Department

80‧‧‧半球型積分球 80‧‧‧hemispherical integrating sphere

84、94‧‧‧受光窗 84, 94‧‧‧light window

86‧‧‧試料窗 86‧‧‧Test window

90‧‧‧積分球 90‧‧·score ball

92‧‧‧反射板 92‧‧‧reflector

96‧‧‧入射窗 96‧‧‧Injection window

200‧‧‧檢測部 200‧‧‧Detection Department

202‧‧‧繞射光柵 202‧‧‧Diffraction grating

204‧‧‧檢測元件 204‧‧‧Detection components

206‧‧‧快門 206‧‧ ‧Shutter

208‧‧‧開縫 208‧‧‧ slit

220‧‧‧多輸入分光光度計 220‧‧‧Multiple input spectrophotometer

300‧‧‧處理裝置 300‧‧‧Processing device

302‧‧‧CPU 302‧‧‧CPU

304‧‧‧RAM 304‧‧‧RAM

306‧‧‧硬碟 306‧‧‧ Hard disk

307‧‧‧計測程式 307‧‧‧Measurement program

308‧‧‧光碟片驅動裝置 308‧‧‧Disc drive

309‧‧‧光碟片 309‧‧‧DVD

310‧‧‧輸入部 310‧‧‧ Input Department

312‧‧‧顯示部 312‧‧‧Display Department

314‧‧‧輸出入界面 314‧‧‧Import and export interface

316‧‧‧匯流排 316‧‧ ‧ busbar

400、402、500‧‧‧檢査裝置 400, 402, 500‧‧‧ inspection devices

410‧‧‧測定用暗箱 410‧‧‧Black box for measurement

412‧‧‧試樣載台 412‧‧‧Sample stage

414‧‧‧位置控制控制器 414‧‧‧ Position Control Controller

420‧‧‧校正用暗箱 420‧‧‧Black box for calibration

422‧‧‧標準光源 422‧‧‧Standard light source

424‧‧‧標準光源用電源 424‧‧‧Power supply for standard light source

440‧‧‧試樣保持器 440‧‧‧sample holder

450‧‧‧匣盒 450‧‧‧匣 box

460‧‧‧搬運機器人 460‧‧‧Handling robot

462‧‧‧臂部 462‧‧‧ Arms

464‧‧‧區域感測器 464‧‧‧area sensor

470‧‧‧支持構件 470‧‧‧Support components

490‧‧‧試樣收納部 490‧‧‧sample storage unit

第1圖係顯示按照本實施形態之測定裝置的全體構成的模式圖。 Fig. 1 is a schematic view showing the overall configuration of a measuring apparatus according to the present embodiment.

第2圖係顯示按照本實施形態之檢測部的構成例的模式圖。 Fig. 2 is a schematic view showing a configuration example of a detecting unit according to the present embodiment.

第3圖係顯示按照本實施形態之處理裝置的構成例的模式圖。 Fig. 3 is a schematic view showing a configuration example of a processing apparatus according to the present embodiment.

第4圖係用以說明薄片狀試樣中的螢光的發生的模式圖。 Fig. 4 is a schematic view for explaining the occurrence of fluorescence in a flaky sample.

第5圖係顯示用以使用積分球來測定薄片狀試樣的光學性能的構成的模式圖。 Fig. 5 is a schematic view showing a configuration for measuring the optical performance of a flaky sample using an integrating sphere.

第6圖係顯示積分球的餘弦特性之一例的圖。 Fig. 6 is a view showing an example of the cosine characteristic of the integrating sphere.

第7圖係顯示用以使用半球型積分球來測定薄片狀試樣的光學性能的構成的模式圖。 Fig. 7 is a schematic view showing a configuration for measuring the optical performance of a flaky sample using a hemispherical integrating sphere.

第8圖係顯示用以使用按照本實施形態之測定裝置來測定薄片狀試樣的光學性能的構成的模式圖。 Fig. 8 is a schematic view showing a configuration for measuring the optical performance of a flaky sample using the measuring apparatus according to the embodiment.

第9圖係顯示按照本實施形態之測定裝置的受光部的餘弦特性之一例的圖。 Fig. 9 is a view showing an example of the cosine characteristic of the light receiving portion of the measuring device according to the embodiment.

第10圖係顯示使用按照本實施形態之測定裝置的受光部的色度測定結果之一例的圖。 Fig. 10 is a view showing an example of the result of chromaticity measurement using the light receiving unit of the measuring apparatus according to the present embodiment.

第11圖係顯示將第10圖所示之測定結果關於試樣與受光部的距離加以標繪的圖表。 Fig. 11 is a graph showing the measurement results shown in Fig. 10 plotted on the distance between the sample and the light receiving portion.

第12圖係顯示針對第10圖所示之測定結果,關於試樣與受光部的距離,將色度x及色度y的差加以標繪的圖表。 Fig. 12 is a graph showing the difference between the chromaticity x and the chromaticity y with respect to the measurement result shown in Fig. 10 regarding the distance between the sample and the light receiving portion.

第13圖係顯示使用按照本實施形態之測定裝置的受光部的頻譜測定結果之一例的圖。 Fig. 13 is a view showing an example of the result of spectrum measurement using the light receiving unit of the measuring apparatus according to the present embodiment.

第14圖係用以說明按照本實施形態之受光部中的受光角的模式圖。 Fig. 14 is a schematic view for explaining a light receiving angle in the light receiving portion according to the embodiment.

第15圖係顯示在按照本實施形態之受光部中保持維持受光直徑的狀況下使投光直徑改變時的受光角的變化的圖表。 Fig. 15 is a graph showing a change in the light receiving angle when the light projecting diameter is changed while maintaining the light receiving diameter in the light receiving portion according to the embodiment.

第16圖係顯示在按照本實施形態之受光部中保持維持投光直徑的狀況下使受光直徑改變時的受光角的變化的圖表。 Fig. 16 is a graph showing a change in the light receiving angle when the light receiving diameter is changed while maintaining the light projecting diameter in the light receiving portion according to the embodiment.

第17圖係顯示包含按照本實施形態之測定裝置之檢査裝置之一例的模式圖。 Fig. 17 is a schematic view showing an example of an inspection apparatus including the measuring apparatus according to the embodiment.

第18圖係顯示使用第17圖所示之檢査裝置來測定試樣的光學性能的順序的流程圖。 Fig. 18 is a flow chart showing the procedure for measuring the optical performance of the sample using the inspection apparatus shown in Fig. 17.

第19圖係顯示包含按照本實施形態之測定裝置之檢査裝置之一例的模式圖。 Fig. 19 is a schematic view showing an example of an inspection apparatus including the measuring apparatus according to the embodiment.

第20圖係顯示包含按照本實施形態之測定裝置之檢査裝置之其他一例的模式圖。 Fig. 20 is a schematic view showing another example of the inspection apparatus including the measuring apparatus according to the embodiment.

一面參照圖示,一面詳加說明本發明之實施形態。其中,關於圖中相同或相當部分,係標註相同符號且不重覆其說明。 Embodiments of the present invention will be described in detail with reference to the drawings. In the drawings, the same or corresponding parts are denoted by the same reference numerals and the description thereof is not repeated.

<A.測定裝置的概略構成> <A. Schematic configuration of the measuring device>

首先,說明按照本實施形態之測定裝置的概略構成。第1圖係顯示按照本實施形態之測定裝置1的全體構成的模式圖。測定裝置1係測定螢光體的光學性能。測定對象的螢光體在以下亦稱為「試樣2」。 First, a schematic configuration of a measuring apparatus according to the present embodiment will be described. Fig. 1 is a schematic view showing the overall configuration of a measuring apparatus 1 according to the present embodiment. The measuring device 1 measures the optical properties of the phosphor. The phosphor to be measured is also referred to as "sample 2" hereinafter.

參照第1圖,測定裝置1係對試樣2照射激勵光,檢測該激勵光之中透過螢光體的光、及藉由該激勵光而在試樣2所發生的螢光。典型而言,測定裝置1係透過型的螢光測定裝置。 Referring to Fig. 1, the measuring device 1 irradiates the sample 2 with excitation light, and detects the light that has passed through the phosphor among the excitation light and the fluorescence that has occurred in the sample 2 by the excitation light. Typically, the measuring device 1 is a transmission type fluorescence measuring device.

第1圖所示之測定裝置1係包含:用以對試樣2照射激勵光的照射部50;用以接受激勵光之中透過螢光體的光、及藉由激勵光而在試樣2所發生的螢光的受光部10;用以檢測藉由受光部10所接受到的光的檢測部200;及處理裝置300。 The measuring device 1 shown in Fig. 1 includes an illuminating unit 50 for irradiating the sample 2 with excitation light, light for transmitting the excitation light through the phosphor, and sample 2 by the excitation light. The light-receiving portion 10 that generates the fluorescence; the detecting portion 200 for detecting the light received by the light-receiving portion 10; and the processing device 300.

照射部50係包含:用以發生激勵光的光源52、被配置在激勵光的光軸上的聚光透鏡54、及用以驅動光源52的 電源裝置56。光源52係以發生包含因應試樣2的特性的波長頻寬的激勵光的方式予以設計。更具體而言,採用藍色LED等作為光源52。或者,亦可採用附分光器之鹵素光源、氙光源、水銀燈等作為光源52。藉由採用該等光源,可使包含特定波長的激勵光發生。聚光透鏡54係包含用以將來自光源52的激勵光轉換成平行光的光學系統。電源裝置56係供給因應光源52的種類的電力。 The illuminating unit 50 includes a light source 52 for generating excitation light, a condensing lens 54 disposed on an optical axis of the excitation light, and a driving light source 52. Power supply unit 56. The light source 52 is designed to generate excitation light having a wavelength bandwidth corresponding to the characteristics of the sample 2. More specifically, a blue LED or the like is employed as the light source 52. Alternatively, a halogen light source with a spectroscope, a xenon light source, a mercury lamp or the like may be used as the light source 52. By using these light sources, excitation light containing a specific wavelength can be generated. Condenser lens 54 includes an optical system for converting excitation light from source 52 into parallel light. The power supply device 56 supplies electric power corresponding to the type of the light source 52.

若來自照射部50的激勵光入射至試樣2時,因應試樣2的成分或組成的波長成分被吸收而發生螢光。在激勵光之中未被吸收且亦未被反射的光係成為透過光而被輸出。受光部10係接受該所發生的螢光及透過光且導引至檢測部200。 When the excitation light from the irradiation unit 50 is incident on the sample 2, the wavelength component of the component or composition of the sample 2 is absorbed and fluorescence is generated. The light that is not absorbed and is not reflected by the excitation light is transmitted as transmitted light. The light receiving unit 10 receives the generated fluorescence and transmitted light and guides it to the detecting unit 200.

受光部10並非為直接接受來自試樣2的螢光及透過光,而是接受透過光擴散部14後的光。亦即,受光部10係包含:在激勵光的照射方向具有預定長度的框體12、被配置在框體12的試樣2側的光擴散部14、及被配置在框體12的試樣2的相反側,用以將所入射的螢光導引至檢測部200的窗18。 The light receiving unit 10 does not directly receive the fluorescent light and the transmitted light from the sample 2, but receives the light transmitted through the light diffusing portion 14. In other words, the light receiving unit 10 includes a frame body 12 having a predetermined length in the irradiation direction of the excitation light, a light diffusion portion 14 disposed on the sample 2 side of the frame body 12, and a sample disposed on the frame body 12. The opposite side of 2 is for guiding the incident fluorescent light to the window 18 of the detecting portion 200.

框體12係為了儘可能加大來自窗18的視野範圍(剖面積),構成為在激勵光的照射方向(光軸方向)具有預定的長度。典型而言,以圓筒狀的框體12為佳,但是框體12的剖面形狀並非侷限於圓。亦可採用例如具有六角形或八角形的多角形剖面形狀的筒狀構造。亦即,來自窗18的視野範圍(剖面積)若未受到框體12的內面16的限制,則亦可採用任何形狀。此外,以框體12而言,亦可採用光擴散部14側的剖面積更大、窗18之側的剖面積更小,如圓錐或圓錐台般的形 狀。 The frame 12 is configured to have a predetermined length in the irradiation direction (optical axis direction) of the excitation light in order to increase the field of view (sectional area) from the window 18 as much as possible. Typically, the cylindrical frame 12 is preferred, but the cross-sectional shape of the frame 12 is not limited to a circle. For example, a cylindrical structure having a hexagonal or octagonal polygonal cross-sectional shape can also be employed. That is, the field of view (sectional area) from the window 18 may be any shape if it is not limited by the inner surface 16 of the frame 12. Further, in the case of the frame 12, the cross-sectional area on the side of the light diffusing portion 14 may be larger, and the cross-sectional area on the side of the window 18 may be smaller, such as a cone or a truncated cone. shape.

光擴散部14係用以將來自試樣2之朝各方向發光的螢光進行積分(均一化)者。典型而言,光擴散部14係以具有預定的透光性的擴散薄片予以實現。光擴散部14並不需要覆蓋框體12的開口部的全體,但是較佳為包覆透過窗18而被導引至檢測部200的光的全體。亦即,光擴散部14係被配置在包含來自窗18的視野24的範圍。藉由通過如上所示之光擴散部14,可實質上獲得與使用積分球來對螢光進行積分(均一化)同樣的效果。 The light diffusing portion 14 is for integrating (uniformizing) the fluorescent light emitted from the sample 2 in each direction. Typically, the light diffusing portion 14 is realized by a diffusion sheet having a predetermined light transmittance. The light diffusing portion 14 does not need to cover the entire opening of the casing 12, but is preferably the entire light that is guided to the detecting portion 200 by the transmission window 18. That is, the light diffusing portion 14 is disposed in a range including the field of view 24 from the window 18. By passing through the light diffusing portion 14 as described above, the same effect as the integration (homogenization) of the fluorescent light using the integrating sphere can be substantially obtained.

在窗18係插入有用以將受光部10及檢測部200作光學上連接的光纖20的連接端22,入射至受光部10的光係透過光纖20而被導引至檢測部200。以光纖20而言,係可採用由複數線材所成之構成,該情形下係複數線材在連接端22集合。若使用如上所示之連接端22,視野24依光纖20的開口數而定。或者,亦可採用開縫來作為窗18。此時視野24依開縫寬幅等而定。此外,亦可未使用光纖20而將檢測部200及受光部10直接連接。 The connection end 22 of the optical fiber 20 for optically connecting the light receiving unit 10 and the detecting unit 200 is inserted into the window 18, and the light entering the light receiving unit 10 is transmitted through the optical fiber 20 and guided to the detecting unit 200. In the case of the optical fiber 20, it may be constituted by a plurality of wires, in which case the plurality of wires are gathered at the connecting end 22. If the connection end 22 as shown above is used, the field of view 24 depends on the number of openings of the optical fiber 20. Alternatively, a slit can be used as the window 18. At this time, the field of view 24 depends on the slit width and the like. Further, the detecting unit 200 and the light receiving unit 10 may be directly connected without using the optical fiber 20.

檢測部200係檢測藉由受光部10所接受到的光。典型而言,檢測部200係測定所入射的光的分光放射照度。以如上所示之檢測部200之一例而言,使用可按每個波長測定螢光所包含的特性值的分光光度計。以分光光度計而言,係可採用測定在單一波長的特性值的單色儀,亦可採用同時測定某波長範圍內的特性值(頻譜)的多色儀。以試樣2的特性值而言,若不需要頻譜而僅需要色度時,亦可採用色度感測器。因應對 試樣2所被要求的評估項目等,選擇適當的檢測部200。 The detecting unit 200 detects the light received by the light receiving unit 10. Typically, the detecting unit 200 measures the spectral illuminance of the incident light. As an example of the detecting unit 200 as described above, a spectrophotometer that can measure the characteristic value included in the fluorescence for each wavelength is used. In the case of a spectrophotometer, a monochromator that measures a characteristic value at a single wavelength can be used, or a polychromator that simultaneously measures a characteristic value (spectrum) in a certain wavelength range can be used. In the case of the characteristic value of the sample 2, a chromaticity sensor can also be used if a spectrum is not required and only chromaticity is required. Coping with The appropriate detection unit 200 is selected for the evaluation item or the like required for the sample 2.

第2圖係顯示按照本實施形態之檢測部200的構成例的模式圖。在第2圖係顯示使用分光光度計(多色儀)來實現檢測部200之例。更具體而言,檢測部200係包含:繞射光柵202、檢測元件204、快門206、及開縫208。透過光纖20所入射的光係在通過開縫208之後,在繞射光柵202被反射。繞射光柵202中光所含有的各波長成分係以因應其波長的各個方向作反射。接著,所被反射的各波長成分係入射至對應檢測元件204的波長的區域。檢測元件204的表面區域係劃分為預定的單位區域,根據在各單位區域的強度值,檢測受光頻譜。 Fig. 2 is a schematic view showing a configuration example of the detecting unit 200 according to the present embodiment. In the second drawing, an example in which the detecting unit 200 is realized using a spectrophotometer (polychromator) is shown. More specifically, the detecting unit 200 includes a diffraction grating 202, a detecting element 204, a shutter 206, and a slit 208. Light incident through the optical fiber 20 is reflected by the diffraction grating 202 after passing through the slit 208. Each wavelength component contained in the light in the diffraction grating 202 is reflected in various directions in accordance with the wavelength thereof. Then, each of the reflected wavelength components is incident on a region corresponding to the wavelength of the detecting element 204. The surface area of the detecting element 204 is divided into predetermined unit areas, and the received light spectrum is detected based on the intensity values in the respective unit areas.

快門206係在進行暗修正等時等,遮斷入射至檢測部200的內部的光。此外,為了減低迷光成分等,亦可在快門206的後段配置遮斷測定波長範圍外的波長的光的彩色濾光片。 The shutter 206 is configured to block light incident on the inside of the detecting unit 200 when dark correction or the like is performed. Further, in order to reduce the glare component or the like, a color filter that blocks light of a wavelength outside the measurement wavelength range may be disposed in the rear stage of the shutter 206.

再次參照第1圖,處理裝置300係根據由檢測部200所被輸出的檢測訊號,算出及輸出試樣2的光學性能。試樣2的光學性能係除了分光特性(分光放射照度)以外,還包含明亮度或色調等評估值。在此,明亮度意指試樣2的亮度或光度等,色調意指試樣2的色度座標、主波長、刺激純度、及相關色溫度等。 Referring again to Fig. 1, the processing device 300 calculates and outputs the optical performance of the sample 2 based on the detection signal outputted by the detecting unit 200. The optical properties of the sample 2 include evaluation values such as brightness or color tone in addition to the spectral characteristics (spectral illuminance). Here, the brightness means the brightness or luminosity of the sample 2, and the color tone means the chromaticity coordinate, the dominant wavelength, the stimulation purity, and the correlated color temperature of the sample 2.

第3圖係顯示按照本實施形態之處理裝置300的構成例的模式圖。如第3圖所示,處理裝置300在典型上係藉由通用電腦予以實現。更具體而言,處理裝置300係包含:CPU(Central Processing Unit,中央處理單元)302、作為主記憶 體的RAM(Random Access Memory,隨機存取記憶體)304、硬碟(HDD)306、光碟片驅動裝置308、輸入部310、顯示部312、及輸出入界面314。該等組件係透過匯流排316而相互連接。 Fig. 3 is a schematic view showing a configuration example of the processing apparatus 300 according to the present embodiment. As shown in FIG. 3, the processing device 300 is typically implemented by a general purpose computer. More specifically, the processing device 300 includes a CPU (Central Processing Unit) 302 as a main memory. A RAM (Random Access Memory) 304, a hard disk (HDD) 306, an optical disk drive device 308, an input unit 310, a display unit 312, and an input/output interface 314. The components are interconnected by a bus bar 316.

在硬碟306係安裝有用以實現後述之測定處理的計測程式307。計測程式307係在RAM304等被展開而藉由CPU302予以執行。如上所示之程式係儲存在光碟片309等記錄媒體,或透過網路等來流通。被儲存在光碟片309等記錄媒體來流通的程式係藉由光碟片驅動裝置308等而從記錄媒體中被讀取,且被安裝在硬碟306。 A measurement program 307 for realizing measurement processing to be described later is attached to the hard disk 306. The measurement program 307 is developed in the RAM 304 or the like and executed by the CPU 302. The program shown above is stored in a recording medium such as a disc 309 or distributed through a network or the like. The program stored in the recording medium such as the optical disk 309 is read from the recording medium by the optical disk drive device 308 or the like, and is mounted on the hard disk 306.

輸入部310係包含鍵盤、滑鼠、觸控面板等,接受來自使用者的指令或操作。顯示部312係包含顯示器或各種指示器,輸出藉由處理裝置300所被算出的測定結果。 The input unit 310 includes a keyboard, a mouse, a touch panel, and the like, and accepts commands or operations from the user. The display unit 312 includes a display or various indicators, and outputs measurement results calculated by the processing device 300.

輸出入界面314係對測定裝置1所包含的組件輸出指令,並且接受來自檢測部200等的輸入訊號。以輸出入界面314而言,亦可採用USB(Universal Serial Bus,通用序列匯流排)等通用界面。此外,在輸出入界面314亦可視需要而連接印表機等輸出裝置。 The input/output interface 314 outputs an instruction to the component included in the measurement device 1, and receives an input signal from the detection unit 200 or the like. In the input/output interface 314, a general interface such as a USB (Universal Serial Bus) can also be used. In addition, an output device such as a printer can be connected to the input/output interface 314 as needed.

在按照本實施形態之測定裝置1的處理裝置300中,針對由通用的處理器(CPU302)執行程式來實現如後所述之測定處理之例加以說明,但是亦可使用專用的處理器或IC(Integrated Circuit,積體電路)等來實現該測定處理的全部或一部分。或者,亦可使用ASIC(Application Specific Integrated Circuit,特定功能積體電路)等專用的硬體電路來實現。 In the processing device 300 of the measuring device 1 according to the present embodiment, an example in which a measurement process to be described later is executed by executing a program by a general-purpose processor (CPU 302) will be described, but a dedicated processor or IC may be used. (Integrated Circuit, etc.) or the like to realize all or part of the measurement process. Alternatively, it can be realized by using a dedicated hardware circuit such as an ASIC (Application Specific Integrated Circuit).

<B.背景及關連技術> <B. Background and related technologies>

(1:背景及需求) (1: background and needs)

如上所述,螢光體係製造發光元件或顯示元件時不可或缺的材料。在典型的螢光體的製造線中,螢光體係以薄片狀予以製造,亦在該狀態下進行品質管理。以如上所示之品質管理的一部分而言,要求螢光體薄片的光學性能的面內分布測定。另一方面,為了使螢光體薄片的生產效率提升,要求迅速的測定(檢査)。亦即,在製造線中,欲以更短時間來測定螢光體薄片上所設定的複數測定點的需求日漸增高。此外,關於以可達成測定的迅速化,並且可長期安定的測定的方式,可以更為簡化的順序來校正測定裝置的功能,需求亦在增高。 As described above, the fluorescent system is an indispensable material for manufacturing a light-emitting element or a display element. In a typical phosphor manufacturing line, the fluorescent system is manufactured in a sheet form, and quality management is also performed in this state. In part of the quality management as described above, the in-plane distribution measurement of the optical properties of the phosphor sheet is required. On the other hand, in order to improve the production efficiency of the phosphor sheet, rapid measurement (inspection) is required. That is, in the manufacturing line, the demand for measuring the plurality of measurement points set on the phosphor sheet in a shorter period of time is increasing. Further, in the case of a measurement that can achieve rapid measurement and long-term stability, the function of the measuring device can be corrected in a more simplified order, and the demand is also increasing.

(2:螢光的發生) (2: the occurrence of fluorescence)

第4圖係用以說明薄片狀試樣2中的螢光的發生的模式圖。如第4圖所示,藉由對薄片狀試樣2照射激勵光所發生的螢光的配光圖案係依試樣2(螢光體)的種類及測定位置而改變。此外,螢光的配光圖案亦依波長而異。因此,要測定薄片狀試樣2的光學性能並不容易。 Fig. 4 is a schematic view for explaining the occurrence of fluorescence in the flaky sample 2. As shown in Fig. 4, the light distribution pattern of the fluorescent light generated by irradiating the excitation light to the sheet-like sample 2 is changed depending on the type of the sample 2 (fluorescent body) and the measurement position. In addition, the fluorescent light distribution pattern also varies depending on the wavelength. Therefore, it is not easy to measure the optical properties of the flaky sample 2.

(3:使用積分球的測定) (3: Measurement using an integrating sphere)

首先,以相關技術而言,針對用以使用積分球來測定薄片狀試樣2的光學性能的構成進行說明。 First, a configuration for measuring the optical performance of the flaky sample 2 using an integrating sphere will be described with reference to the related art.

第5圖係顯示用以使用積分球來測定薄片狀試樣2的光學性能的構成的模式圖。參照第5圖,對試樣2照射激勵光,並且將藉由該激勵光的照射所發生的透過光及螢光以積分球90進行積分(均一化)後,在受光窗94中測定分光放射照度等。其中,在受光窗94的近傍,設有用以抑制所入射的光 直接到達受光窗94的反射板(baffle)92。 Fig. 5 is a schematic view showing a configuration for measuring the optical performance of the sheet-like sample 2 using an integrating sphere. Referring to Fig. 5, the sample 2 is irradiated with excitation light, and the transmitted light and the fluorescence generated by the irradiation of the excitation light are integrated (uniformized) by the integrating sphere 90, and then the spectroscopic emission is measured in the light receiving window 94. Illumination and so on. Wherein, in the vicinity of the light receiving window 94, it is provided to suppress the incident light The baffle 92 of the light receiving window 94 is directly reached.

由於積分球90為球體,因此接觸試樣2的範圍亦形成為曲面狀。因此,在積分球90係以接觸試樣2的範圍設有包含金屬口的入射窗96。亦即,形成在平面上的金屬口的表面接觸試樣2,來自試樣2的螢光被接受在積分球90內。在此,以金屬口而言,係必須要有約10~15mm左右的厚度,會有受到該厚度的影響而無法正確地測定螢光的光學性能的情形。亦即,依來自試樣2的螢光的配光圖案,會有金屬口的厚度妨礙螢光的放射,而無法進行正確測定的情形。 Since the integrating sphere 90 is a sphere, the range in which the sample 2 is contacted is also formed into a curved shape. Therefore, the entrance window 96 including the metal port is provided in the range in which the integrating sphere 90 is in contact with the sample 2. That is, the surface of the metal port formed on the plane contacts the sample 2, and the fluorescence from the sample 2 is received in the integrating sphere 90. Here, in the case of the metal port, it is necessary to have a thickness of about 10 to 15 mm, and the optical performance of the fluorescent light cannot be accurately measured due to the influence of the thickness. That is, depending on the fluorescent light distribution pattern from the sample 2, the thickness of the metal port may hinder the emission of the fluorescent light, and the accurate measurement may not be performed.

此外,必須使積分球90接觸試樣2來進行測定,若欲對螢光體薄片進行面內分布的測定時,必須在積分球90與試樣2之間反覆接觸及分離,無法提高測定效率。 In addition, the integrating sphere 90 must be brought into contact with the sample 2 for measurement. If the in-plane distribution of the phosphor sheet is to be measured, it is necessary to repeatedly contact and separate between the integrating sphere 90 and the sample 2, and the measurement efficiency cannot be improved. .

此外,若使用積分球90時,亦會有入射光特性因該內部的反射板92的影響而劣化的情形。 Further, when the integrating sphere 90 is used, there is a case where the incident light characteristics are deteriorated by the influence of the internal reflecting plate 92.

第6圖係顯示積分球的餘弦特性之一例的圖。亦即,第6圖所示之餘弦特性係表示由積分球90的入射窗96所觀看到的入射光的斜向特性(入射的角度與入射窗中的相對強度的關係)。在第6圖中分別顯示積分球的直徑為2吋及4吋之例。如餘弦特性的名稱所示,入射光的斜向特性在理想上係應與餘弦函數(cosθ)相一致。但是,積分球90的現實上的餘弦特性係會與理想上的特性產生偏移。 Fig. 6 is a view showing an example of the cosine characteristic of the integrating sphere. That is, the cosine characteristic shown in Fig. 6 indicates the oblique characteristic (the relationship between the incident angle and the relative intensity in the incident window) of the incident light viewed by the incident window 96 of the integrating sphere 90. An example in which the diameter of the integrating sphere is 2 吋 and 4 分别 is shown in Fig. 6, respectively. As indicated by the name of the cosine characteristic, the oblique nature of the incident light should ideally coincide with the cosine function (cos θ). However, the actual cosine characteristics of the integrating sphere 90 are offset from the ideal characteristics.

(4:使用半球型積分球的測定) (4: Measurement using a hemispherical integrating sphere)

接著,說明用以使用半球型積分球來測定薄片狀試樣2的光學性能的構成。第7圖係顯示用以使用半球型積分球80來 測定薄片狀試樣2的光學性能的構成的模式圖。參照第7圖,半球型積分球80係將在內面設有擴散反射層的半球、與在內面設有鏡面反射層的圓板加以組合的積分裝置。關於如上所示之半球型積分球80的詳細內容,請參照例如日本特開2009-103654號公報等。在第7圖所示之半球型積分球80中,係透過設在圓板的試料窗86來接受來自試樣2的透過光及螢光,且在將該所接受到的光在半球型積分球80的內部進行積分(均一化)之後,在受光窗84中測定分光放射照度等。其中,在將受光窗84與試料窗86相連結的線上設有用以抑制所入射的光直接到達至受光窗84的反射板(baffle)82。 Next, a configuration for measuring the optical performance of the flaky sample 2 using a hemispherical integrating sphere will be described. Figure 7 shows the use of a hemispherical integrating sphere 80. A schematic diagram of the configuration of the optical properties of the flaky sample 2 was measured. Referring to Fig. 7, the hemispherical integrating sphere 80 is an integrating device in which a hemisphere having a diffuse reflection layer on the inner surface and a circular plate having a specular reflection layer on the inner surface are combined. For details of the hemispherical integrating sphere 80 as described above, please refer to, for example, Japanese Laid-Open Patent Publication No. 2009-103654. In the hemispherical integrating sphere 80 shown in Fig. 7, the transmitted light and the fluorescent light from the sample 2 are received through the sample window 86 provided in the circular plate, and the received light is subjected to the hemispherical integral. After the inside of the ball 80 is integrated (uniformized), the spectroscopic illuminance and the like are measured in the light receiving window 84. The line connecting the light receiving window 84 and the sample window 86 is provided with a baffle 82 for suppressing the incident light from directly reaching the light receiving window 84.

與使用第5圖所示之積分球90時不同,在半球型積分球80,接觸試樣2的部分(試料窗86)係形成為平面狀。因此,不會有因與試樣2的接觸部分而妨礙來自試樣2的螢光的照射的情形。亦即,藉由使用半球型積分球80,不會有取決於來自試樣2的螢光的配光圖案的情形,而可接受該所被照射的全部螢光,而可實現正確的測定。 Unlike the case where the integrating sphere 90 shown in Fig. 5 is used, the portion of the hemispherical integrating sphere 80 that contacts the sample 2 (sample window 86) is formed in a planar shape. Therefore, there is no possibility of obstructing the irradiation of the fluorescent light from the sample 2 due to the contact portion with the sample 2. That is, by using the hemispherical integrating sphere 80, there is no need for a light distribution pattern depending on the fluorescence from the sample 2, and all of the irradiated fluorescent light can be accepted, and accurate measurement can be realized.

但是,與使用第5圖所示之積分球90時同樣地,即使為使用半球型積分球80的情形,亦必須使半球型積分球80接觸試樣2來進行測定。因此,若欲對螢光體薄片進行面內分布的測定時,必須在半球型積分球80與試樣2之間反覆接觸與分離,無法提高測定效率。 However, similarly to the case of using the integrating sphere 90 shown in FIG. 5, even when the hemispherical integrating sphere 80 is used, the hemispherical integrating sphere 80 must be brought into contact with the sample 2 for measurement. Therefore, in order to measure the in-plane distribution of the phosphor sheet, it is necessary to repeatedly contact and separate the hemispherical integrating sphere 80 and the sample 2, and the measurement efficiency cannot be improved.

<C.按照本實施形態之測定裝置> <C. Measuring device according to the present embodiment>

(1:構成) (1: composition)

第8圖係顯示用以使用按照本實施形態之測定裝置1來測 定薄片狀試樣2的光學性能的構成的模式圖。如參照第1圖所作之說明所示,受光部10係包含:在激勵光的照射方向具有預定的長度的框體12、及被配置在框體12的試樣2側的光擴散部14。在此,受光部10係以預定距離遠離試樣2作配置。第8圖所示之試樣2與受光部10的距離d係考慮激勵光的點亦即投光直徑ψ 0與框體12的受光直徑ψ 1的關係、及光擴散部14的透過率等予以最適化。 Figure 8 is a view showing measurement using the measuring device 1 according to the present embodiment. A schematic diagram of the configuration of the optical properties of the flaky sample 2. As described with reference to Fig. 1, the light receiving unit 10 includes a frame body 12 having a predetermined length in the irradiation direction of the excitation light, and a light diffusion portion 14 disposed on the sample 2 side of the frame body 12. Here, the light receiving unit 10 is disposed away from the sample 2 by a predetermined distance. The distance d between the sample 2 and the light-receiving portion 10 shown in Fig. 8 is a relationship between the projection light diameter ψ 0 and the light-receiving diameter ψ 1 of the frame 12, and the transmittance of the light-diffusing portion 14 in consideration of the point of the excitation light. Optimize.

其中,為了提高測定感度及測定精度,較佳為減小試樣2與受光部10之間的距離d,並且加大受光部10的口徑(受光直徑ψ 1)。此外,受光直徑ψ 1較佳為比投光直徑ψ 0充分大(ψ 1>>ψ 0)。 In order to increase the measurement sensitivity and the measurement accuracy, it is preferable to reduce the distance d between the sample 2 and the light receiving unit 10 and to increase the aperture (light receiving diameter ψ 1) of the light receiving unit 10. Further, the light receiving diameter ψ 1 is preferably sufficiently larger than the light projecting diameter ψ 0 (ψ 1>>ψ 0).

藉由採用第8圖所示之構成,由於不需要在測定時使受光部10接觸試樣2,因此可縮短對於螢光體薄片之面內分布測定所需時間。此外,由於光學路徑短即可,因此可提高受光感度,且可實現更高的處理量。例如,針對使用同一檢測部200,使用按照本實施形態之受光部10來測定螢光的情形、及使用半球型積分球80來測定螢光的情形,若將各自的測定所需的曝光時間加以比較,使用半球型積分球80時係必須要有5500ms,相對於此,若使用以厚度15mm的光擴散部14所構成的檢測部200時,則為450ms。亦即,藉由使用按照本實施形態之受光部10,可將曝光時間形成為約1/10。換言之,藉由使用按照本實施形態之受光部10,入射至受光部10的螢光的明亮度為約10倍,可將處理量形成為約10倍。如上所示藉由提高處理量,可縮短製造線的工站時間(tact time)。 According to the configuration shown in Fig. 8, since it is not necessary to bring the light receiving unit 10 into contact with the sample 2 during the measurement, the time required for the measurement of the in-plane distribution of the phosphor sheet can be shortened. Further, since the optical path is short, the light sensitivity can be improved, and a higher throughput can be realized. For example, when the same detection unit 200 is used, the case where the fluorescence is measured by the light receiving unit 10 according to the present embodiment and the case where the fluorescence is measured using the hemispherical integrating sphere 80 are used, and the exposure time required for each measurement is added. In comparison, when the hemispherical integrating sphere 80 is used, it is necessary to have 5500 ms. On the other hand, when the detecting portion 200 composed of the light diffusing portion 14 having a thickness of 15 mm is used, it is 450 ms. That is, by using the light receiving portion 10 according to the present embodiment, the exposure time can be formed to be about 1/10. In other words, by using the light receiving unit 10 according to the present embodiment, the brightness of the fluorescent light incident on the light receiving unit 10 is about 10 times, and the processing amount can be formed to be about 10 times. As shown above, by increasing the throughput, the tact time of the manufacturing line can be shortened.

此外,與使用積分球時相比較,裝置構成可簡化,因此可更為精簡化,並且成本亦可減低。 In addition, the device configuration can be simplified as compared with when the integrating sphere is used, so that it can be more simplified and the cost can be reduced.

(2:測定性能) (2: Measurement performance)

在按照本實施形態之測定裝置1中,係可抑制入射光特性的劣化。第9圖係顯示按照本實施形態之測定裝置1的受光部10的餘弦特性之一例的圖。亦即,第9圖所示之餘弦特性係表示由受光部10的光擴散部14所觀看到的入射光的斜向特性(入射的角度與光擴散部14中的相對強度的關係)。如第9圖所示,受光部10的入射光的斜向特性係與理想的餘弦特性大致相一致,與使用積分球90時相比較,可更加提高測定精度。 In the measuring apparatus 1 according to the present embodiment, deterioration of incident light characteristics can be suppressed. Fig. 9 is a view showing an example of cosine characteristics of the light receiving unit 10 of the measuring device 1 according to the present embodiment. That is, the cosine characteristic shown in FIG. 9 indicates the oblique characteristic (the relationship between the incident angle and the relative intensity in the light diffusing portion 14) of the incident light viewed by the light diffusing portion 14 of the light receiving portion 10. As shown in Fig. 9, the oblique characteristic of the incident light of the light receiving portion 10 substantially coincides with the ideal cosine characteristic, and the measurement accuracy can be further improved as compared with the case where the integrating sphere 90 is used.

(3:試樣與受光部的距離) (3: distance between the sample and the light receiving portion)

接著,說明試樣2與受光部的距離d。如上所述,使用第7圖所示之半球型積分球80來測定試樣2的光學性能,藉此與使用積分球90時相比較,可提高測定精度。因此,在以下之檢討中係將使用半球型積分球80時所得之測定結果視為基準值。 Next, the distance d between the sample 2 and the light receiving portion will be described. As described above, the optical performance of the sample 2 is measured using the hemispherical integrating sphere 80 shown in Fig. 7, whereby the measurement accuracy can be improved as compared with when the integrating sphere 90 is used. Therefore, in the following review, the measurement result obtained when the hemispherical integrating sphere 80 is used is regarded as a reference value.

第10圖係顯示使用按照本實施形態之測定裝置1的受光部10的色度測定結果之一例的圖。在第10圖中係顯示使試樣2與受光部10的距離d不同來進行測定的結果。在第10圖所示之測定結果中,顯示在同一試樣2及檢測部200的條件下,與使用第7圖所示之半球型積分球80所測定的色度(色度x及色度y)的基準值的差。亦即,第10圖所示之△x及△y係表示分別針對色度x及色度y的測定結果的差,色差係表示△x及△y的平方和的平方根(色差=√(△x2+△y2))。 Fig. 10 is a view showing an example of the result of chromaticity measurement using the light receiving unit 10 of the measuring apparatus 1 according to the present embodiment. In Fig. 10, the results of measurement by measuring the distance d between the sample 2 and the light receiving unit 10 are shown. In the measurement results shown in Fig. 10, the chromaticity (chromaticity x and chromaticity) measured by using the hemispherical integrating sphere 80 shown in Fig. 7 under the conditions of the same sample 2 and the detecting unit 200 are displayed. The difference between the reference values of y). That is, Δx and Δy shown in Fig. 10 indicate the difference between the measurement results for the chromaticity x and the chromaticity y, respectively, and the chromatic aberration indicates the square root of the sum of the squares of Δx and Δy (color difference = √ (Δ) x 2 + Δy 2 )).

第11圖係顯示將第10圖所示之測定結果關於試樣2與受光部10的距離d所標繪的圖表。第12圖係顯示針對第10圖所示之測定結果,關於試樣2與受光部10的距離d而標繪色度x及色度y的差的圖表。 Fig. 11 is a graph showing the measurement result shown in Fig. 10 plotted on the distance d between the sample 2 and the light receiving portion 10. Fig. 12 is a graph showing the difference between the chromaticity x and the chromaticity y with respect to the measurement result shown in Fig. 10 regarding the distance d between the sample 2 and the light receiving portion 10.

如第10圖~第12圖所示,可知藉由使試樣2與受光部10的距離d改變,可將與色差,亦即使用半球型積分球80的測定結果(基準值)的差(誤差)最小化。換言之,藉由將試樣2與受光部10的距離d最適化,可提高測定精度。更具體而言,可使用將第11圖所示之試樣2與受光部10的距離d及色差分別設為軸的座標系,或者使用將第12圖所示之色度x的差及色度y的差分別設為軸的座標系,來決定距離d的最適值。若由第10圖~第12圖所示之結果來看,可知試樣2與受光部10的距離d係以形成為10mm左右為佳。 As shown in FIGS. 10 to 12, it is understood that the difference between the color difference, that is, the measurement result (reference value) of the hemispherical integrating sphere 80 can be changed by changing the distance d between the sample 2 and the light receiving portion 10 ( The error) is minimized. In other words, by optimizing the distance d between the sample 2 and the light receiving unit 10, the measurement accuracy can be improved. More specifically, a coordinate system in which the distance d and the chromatic aberration of the sample 2 and the light receiving unit 10 shown in Fig. 11 are respectively used as axes can be used, or the difference and color of the chromaticity x shown in Fig. 12 can be used. The difference of degrees y is set to the coordinate system of the axis to determine the optimum value of the distance d. From the results shown in Figs. 10 to 12, it is understood that the distance d between the sample 2 and the light receiving portion 10 is preferably about 10 mm.

第13圖係顯示使用按照本實施形態之測定裝置1的受光部10的頻譜測定結果之一例的圖。在第13圖中係顯示使試樣2與受光部10的距離d不同來進行測定的結果。其中,關於頻譜的強度,係規格化而形成為相對強度來表現。 Fig. 13 is a view showing an example of the result of spectrum measurement by the light receiving unit 10 of the measuring apparatus 1 according to the present embodiment. In Fig. 13, the results of measurement were performed by setting the distance d between the sample 2 and the light receiving unit 10 to be different. Among them, the intensity of the spectrum is normalized and expressed as relative intensity.

在第13圖所示之頻譜之中,在同一試樣2及檢測部200的條件下,最為接近使用第7圖所示之半球型積分球80所測定到的頻譜者,係將試樣2與受光部10的距離d設定為10mm左右時者。亦即,與由第10圖~第12圖所示之測定結果所決定的距離d相一致。 Among the spectrums shown in Fig. 13, under the conditions of the same sample 2 and the detecting unit 200, the spectrum measured by using the hemispherical integrating sphere 80 shown in Fig. 7 is the closest to the sample 2 The distance d from the light receiving unit 10 is set to about 10 mm. That is, it corresponds to the distance d determined by the measurement results shown in Figs. 10 to 12 .

如上所示,較佳為預先取得作為基準的測定值,以與該基準值最為一致的方式,將試樣2與受光部10的距離d 最適化。 As described above, it is preferable to obtain a measurement value as a reference in advance, and to distance the sample 2 from the light receiving portion 10 so as to be most consistent with the reference value. Optimum.

(4.受光部中的受光角) (4. Light receiving angle in the light receiving section)

接著,說明受光部10中的受光角。第14圖係用以說明按照本實施形態之受光部10中的受光角的模式圖。 Next, the light receiving angle in the light receiving unit 10 will be described. Fig. 14 is a schematic view for explaining a light receiving angle in the light receiving unit 10 according to the embodiment.

如第14圖所示,受光部10的受光角θ係被定義為由試樣2所發生的螢光可入射至受光部10的最大角度。基本上,該受光角θ係取決於試樣2與受光部10的距離d、投光直徑ψ 0(激勵光的點徑)、及受光直徑ψ 1(取決於受光部10的口徑的3個參數)而改變。因此,例如若變更試樣2與受光部10的距離d時,較佳為以該受光角θ在距離d變更前後成為相同的方式,亦調整其他參數。 As shown in Fig. 14, the light receiving angle θ of the light receiving unit 10 is defined as the maximum angle at which the fluorescent light generated by the sample 2 can enter the light receiving unit 10. Basically, the light receiving angle θ depends on the distance d between the sample 2 and the light receiving unit 10, the light projecting diameter ψ 0 (the spot diameter of the excitation light), and the light receiving diameter ψ 1 (depending on the diameter of the light receiving unit 10) Change). Therefore, for example, when the distance d between the sample 2 and the light receiving unit 10 is changed, it is preferable that the light receiving angle θ is the same before and after the change of the distance d, and other parameters are also adjusted.

第15圖係顯示在按照本實施形態之受光部10中保持維持受光直徑ψ 1的狀況下使投光直徑ψ 0改變時的受光角的變化的圖表。第16圖係顯示在按照本實施形態之受光部10中保持維持投光直徑ψ 0的狀況下使受光直徑ψ 1改變時的受光角的變化的圖表。 Fig. 15 is a graph showing a change in the light receiving angle when the light projecting diameter ψ 0 is changed while maintaining the light receiving diameter ψ 1 in the light receiving unit 10 according to the present embodiment. Fig. 16 is a graph showing a change in the light receiving angle when the light receiving diameter ψ 1 is changed while maintaining the light projecting diameter ψ 0 in the light receiving unit 10 according to the present embodiment.

如第15圖所示,由於若使投光直徑ψ 0改變,則受光角θ即會改變,因此為了在投光直徑ψ 0變更前後使受光角θ維持為相同,必須針對試樣2與受光部10的距離d,亦進行調整。另一方面,如第16圖所示,即使使受光直徑ψ 0改變,受光角θ亦會改變。該受光角θ的變化程度係與使投光直徑ψ 0改變時相比較,變得更大。因此,為了在受光直徑ψ 1變更前後使受光角θ維持為相同,必須針對試樣2與受光部10的距離d進行調整,該調整量係與使投光直徑ψ 0改變時相比 較,變得更大。 As shown in Fig. 15, when the light-emitting diameter ψ 0 is changed, the light-receiving angle θ changes. Therefore, in order to maintain the light-receiving angle θ before and after the change of the light-emitting diameter ψ 0, it is necessary to measure the light and the light. The distance d of the portion 10 is also adjusted. On the other hand, as shown in Fig. 16, even if the light receiving diameter ψ 0 is changed, the light receiving angle θ changes. The degree of change in the light receiving angle θ becomes larger as compared with when the light projecting diameter ψ 0 is changed. Therefore, in order to maintain the light receiving angle θ before and after the change of the light receiving diameter ψ 1, it is necessary to adjust the distance d between the sample 2 and the light receiving unit 10, which is compared with when the light projecting diameter ψ 0 is changed. It is bigger and bigger.

<D.應用例1> <D. Application Example 1>

(1:全體構成) (1: overall composition)

接著,說明按照本實施形態之測定裝置1之應用例。第17圖係顯示包含按照本實施形態之測定裝置1之檢査裝置400之一例的模式圖。檢査裝置400係測定螢光體薄片的光學性能的面內分布。更具體而言,檢査裝置400係包含:測定用暗箱410、及校正用暗箱420。試樣2係被配置在測定用暗箱410內,被照射來自激勵光源62的激勵光。藉由該激勵光的照射所發生的螢光透過受光部10及光纖20,藉由檢測部200予以測定。 Next, an application example of the measuring device 1 according to the present embodiment will be described. Fig. 17 is a schematic view showing an example of an inspection apparatus 400 including the measuring apparatus 1 according to the present embodiment. The inspection device 400 measures the in-plane distribution of the optical properties of the phosphor sheet. More specifically, the inspection apparatus 400 includes a measurement dark box 410 and a correction dark box 420. The sample 2 is placed in the measurement dark box 410 and is irradiated with excitation light from the excitation light source 62. The fluorescent light generated by the irradiation of the excitation light passes through the light receiving unit 10 and the optical fiber 20, and is measured by the detecting unit 200.

更具體而言,在激勵光源62所發生的激勵光係透過光纖66而被導引至照射部60。由照射部60所被照射的激勵光係朝向試樣2傳遞。藉由激勵光的入射而由試樣2所發生的透過光及螢光係在受光部10被受光,透過光纖20而被導引至檢測部200。在此,為了變更試樣2上的激勵光所入射的位置,在測定用暗箱410內設有試樣載台412。亦即,試樣載台412係相當於變更來自激勵光源62的激勵光入射至試樣2(螢光體)的位置的移動機構。試樣載台412係按照來自位置控制控制器414的指示,可移動至任意位置。 More specifically, the excitation light generated by the excitation light source 62 is transmitted to the irradiation unit 60 through the optical fiber 66. The excitation light that is irradiated by the irradiation unit 60 is transmitted toward the sample 2. The transmitted light and the fluorescent light generated by the sample 2 by the incidence of the excitation light are received by the light receiving unit 10 and transmitted through the optical fiber 20 to the detecting unit 200. Here, in order to change the position at which the excitation light on the sample 2 is incident, the sample stage 412 is provided in the measurement dark box 410. In other words, the sample stage 412 corresponds to a moving mechanism that changes the position at which the excitation light from the excitation light source 62 enters the sample 2 (the phosphor). The sample stage 412 is movable to an arbitrary position in accordance with an instruction from the position control controller 414.

在激勵光源62的照射側設有波長選擇部64,構成為可選擇適於測定的波長。以波長選擇部64而言,係可採用利用分光器的濾光片。此外,亦可準備複數不同種類的光源,按照測定對象的試樣2來適當選擇。若激勵光的波長改變,由 於透過光量及螢光量會改變,因此在透過型的螢光測定裝置中,將激勵光的波長控制為一定極為重要。 The wavelength selection unit 64 is provided on the irradiation side of the excitation light source 62, and is configured to select a wavelength suitable for measurement. As the wavelength selecting unit 64, a filter using a spectroscope can be used. Further, a plurality of different types of light sources may be prepared and appropriately selected in accordance with the sample 2 to be measured. If the wavelength of the excitation light changes, Since the amount of transmitted light and the amount of fluorescence change, it is extremely important to control the wavelength of the excitation light to be constant in the transmission type fluorescence measuring device.

其中,亦可裝載進行激勵光源62之調光的功能。以該調光功能而言,以在激勵光的路徑上未存在試樣2的方式使試樣載台412移動的狀態下,照射激勵光,根據此時的測定結果,調整激勵光源62的發光強度。若激勵光的波長改變,透過光量及螢光量即會改變,因此在透過型的螢光測定裝置中,將激勵光的波長控制為一定極為重要。 Among them, the function of dimming the excitation light source 62 may be carried. In the state in which the sample stage 412 is moved so that the sample 2 does not exist in the path of the excitation light, the excitation light is irradiated, and the light emission of the excitation light source 62 is adjusted based on the measurement result at this time. strength. When the wavelength of the excitation light changes, the amount of transmitted light and the amount of fluorescence change. Therefore, it is extremely important to control the wavelength of the excitation light to be constant in a transmissive fluorescence measuring device.

檢測部200係測定透過受光部10及光纖20所入射的光的頻譜。處理裝置300係使藉由檢測部200所得之測定結果與相對應的試樣2的位置(座標值)產生關連而依序儲存。以該測定結果而言,包含CIE表色系中的色度(色度x及色度y)或相關色溫度等。以試樣2的位置(座標值)而言,係使用位置控制控制器414的位置資訊。 The detecting unit 200 measures the spectrum of light incident on the light receiving unit 10 and the optical fiber 20. The processing device 300 sequentially stores the measurement result obtained by the detecting unit 200 in association with the position (coordinate value) of the corresponding sample 2. The chromaticity (chromaticity x and chromaticity y) or the correlated color temperature in the CIE color system is included in the measurement result. The position information of the position control controller 414 is used in terms of the position (coordinate value) of the sample 2.

此外,處理裝置300亦可根據所被測定到的面內分布,來判斷對象試樣2的良否。試樣2為不良係列舉例如光學性能在面內不均一(不均超過預定的臨限值)時、或所被測定到的色度超過預定的臨限範圍時等。 Further, the processing device 300 can also determine the quality of the target sample 2 based on the measured in-plane distribution. Sample 2 is a defective series, for example, when the optical performance is uneven in-plane (the unevenness exceeds a predetermined threshold), or when the measured chromaticity exceeds a predetermined threshold range.

在第17圖所示之檢査裝置400係另外構裝有校正功能。更具體而言,在校正用暗箱420內配置有校正用的標準光源422。在校正時,係在校正用暗箱420內配置有受光部10,並且藉由標準光源用電源424使標準光源422亮燈。對於此時藉由檢測部200所得之測定值進行校正(定位)。其中,校正所需之補正計算係在檢測部200及/或處理裝置300中被執 行。 The inspection apparatus 400 shown in Fig. 17 is additionally provided with a correction function. More specifically, a standard light source 422 for calibration is disposed in the correction dark box 420. At the time of correction, the light receiving unit 10 is disposed in the correction dark box 420, and the standard light source 422 is turned on by the standard light source power source 424. At this time, the measurement value obtained by the detecting unit 200 is corrected (positioned). The correction calculation required for the correction is performed in the detection unit 200 and/or the processing device 300. Row.

(2:處理順序) (2: processing order)

接著,說明使用第17圖所示之檢査裝置400來測定試樣2的光學性能的順序。第18圖係顯示使用第17圖所示之檢査裝置400來測定試樣2的光學性能的順序的流程圖。關於第18圖所示之運算處理,典型而言,藉由由處理裝置300執行程式來實現。 Next, the procedure for measuring the optical performance of the sample 2 using the inspection apparatus 400 shown in Fig. 17 will be described. Fig. 18 is a flow chart showing the procedure for measuring the optical performance of the sample 2 using the inspection apparatus 400 shown in Fig. 17. The arithmetic processing shown in Fig. 18 is typically realized by executing the program by the processing device 300.

參照第18圖,首先執行針對在檢測部200所被檢測的分光放射照度的校正。更具體而言,使用者係將受光部10配置在校正用暗箱420內而使標準光源422亮燈(步驟S2)。處理裝置300係將被定位成標準光源422的基準頻譜與藉由檢測部200所得之測定值相比較來決定校正係數(步驟S4)。 Referring to Fig. 18, the correction for the spectral illuminance detected by the detecting unit 200 is first performed. More specifically, the user places the light receiving unit 10 in the correction dark box 420 to turn on the standard light source 422 (step S2). The processing device 300 determines the correction coefficient by comparing the reference spectrum positioned as the standard light source 422 with the measured value obtained by the detecting unit 200 (step S4).

接著,執行被照射至試樣2的激勵光的調光。亦即,測定來自激勵光源62的激勵光的分光放射照度,以該所被測定到的分光放射照度在預先設定的規定範圍內的方式調整激勵光源62的發光強度。若激勵光的光量改變,則透過螢光的值即會改變,因此對於相同品種的試樣的測定,係必須使激勵光的光量成為一定。 Next, dimming of the excitation light irradiated to the sample 2 is performed. In other words, the spectral illuminance of the excitation light from the excitation light source 62 is measured, and the luminous intensity of the excitation light source 62 is adjusted such that the measured spectral illuminance is within a predetermined range set in advance. When the amount of light of the excitation light changes, the value of the transmitted fluorescence changes. Therefore, it is necessary to make the amount of excitation light constant for the measurement of the sample of the same type.

更具體而言,使用者係將受光部10配置在測定用暗箱410內,並且在試樣2不存在於激勵光的光路上的方式使試樣載台412移動至預定位置之後,控制波長選擇部64來設定波長,而使激勵光源62亮燈(步驟S6)。接著,處理裝置300係判斷藉由檢測部200所被測定到的分光放射照度是否在規定範圍內、及峰值波長是否由設定波長偏離(步驟S8)。若 藉由檢測部200所被測定到的分光放射照度不在規定範圍內時,及/或峰值波長由設定波長偏離時(步驟S8中為NO時),處理裝置300係對激勵光源62輸出用以調整激勵光的強度的指令(步驟S10)。接著,反覆步驟S8的處理。 More specifically, the user sets the light receiving unit 10 in the measurement dark box 410, and controls the wavelength selection after moving the sample stage 412 to a predetermined position in such a manner that the sample 2 does not exist on the optical path of the excitation light. The portion 64 sets the wavelength to cause the excitation light source 62 to light (step S6). Next, the processing device 300 determines whether or not the spectral illuminance measured by the detecting unit 200 is within a predetermined range and whether the peak wavelength is shifted by the set wavelength (step S8). If When the spectroscopic illuminance measured by the detecting unit 200 is not within the predetermined range, and/or the peak wavelength is deviated from the set wavelength (NO in step S8), the processing device 300 outputs the excitation light source 62 for adjustment. An instruction to excite the intensity of the light (step S10). Next, the processing of step S8 is repeated.

相對於此,若藉由檢測部200所被測定到的分光放射照度在規定範圍內,而且峰值波長由設定波長偏離時(步驟S8中為YES時),係開始對試樣2的測定處理。具體而言,處理裝置300係輸出用以使試樣載台412移動的指令,使試樣2的測定點與激勵光的光路相一致(步驟S12)。檢測部200係接受藉由受光部10所接受到的激勵光,來測定由試樣2所發生的透過光及螢光的分光放射照度(步驟S14)。接著,處理裝置300係將藉由檢測部200所得的測定結果,與現在的試樣2(或者試樣載台412)的位置(座標)產生關連來進行儲存(步驟S16)。 On the other hand, when the spectral illuminance measured by the detecting unit 200 is within a predetermined range and the peak wavelength is shifted by the set wavelength (YES in step S8), the measurement processing of the sample 2 is started. Specifically, the processing device 300 outputs a command for moving the sample stage 412 so that the measurement point of the sample 2 matches the optical path of the excitation light (step S12). The detecting unit 200 receives the excitation light received by the light receiving unit 10, and measures the spectral irradiance of the transmitted light and the fluorescent light generated by the sample 2 (step S14). Next, the processing device 300 stores the measurement result obtained by the detecting unit 200 in association with the position (coordinate) of the current sample 2 (or the sample stage 412) (step S16).

其中,在對試樣2的面內分布的測定中,可由激勵光源62經常照射激勵光,亦可在試樣2的定位完成的時點,以點式照射激勵光。 Here, in the measurement of the in-plane distribution of the sample 2, the excitation light may be constantly irradiated by the excitation light source 62, or the excitation light may be irradiated by the point when the positioning of the sample 2 is completed.

接著,處理裝置300係判斷針對試樣2的全部測定點,是否測定已完成(步驟S18)。若在試樣2的測定點之中有測定未完成的測定點時(步驟S18中為NO時),處理裝置300係輸出用以使試樣載台412移動的指令,且使試樣2的接下來的測定點與激勵光的光路相一致(步驟S20)。接著,執行步驟S14以下的處理。 Next, the processing device 300 determines whether or not the measurement is completed for all the measurement points of the sample 2 (step S18). When there is an unfinished measurement point among the measurement points of the sample 2 (NO in step S18), the processing device 300 outputs a command for moving the sample stage 412, and the sample 2 is made. The subsequent measurement point coincides with the optical path of the excitation light (step S20). Next, the processing of step S14 and below is performed.

相對於此,若針對試樣2的全部測定點,測定已 完成時(步驟S18中為YES時),處理裝置300係輸出所被儲存的測定結果(步驟S22)。此時,亦可以附加式進行算出各種光學特性的處理或判定有無異常的處理等。 On the other hand, if all the measurement points of the sample 2 are measured, the measurement has been performed. When it is completed (YES in step S18), the processing device 300 outputs the stored measurement result (step S22). In this case, a process of calculating various optical characteristics or a process of determining whether or not there is an abnormality may be added in addition.

藉由以上順序,對1個試樣2的測定即完成。 By the above procedure, the measurement of one sample 2 was completed.

(3:變形例) (3: Modification)

在第17圖中係具代表性地顯示進行對1個試樣2的測定的情形,但是在實際的製造線中,係必須有效率地測定多數試樣2。在如上所示之情形下,可採用例如以下所示之構成。 In the case of Fig. 17, the measurement of one sample 2 is representatively shown. However, in the actual manufacturing line, it is necessary to efficiently measure the majority of the sample 2. In the case as shown above, for example, the configuration shown below can be employed.

第19圖係顯示包含按照本實施形態之測定裝置1的檢査裝置402之一例的模式圖。在第19圖(a)係顯示檢査裝置402的平面圖,在第19圖(b)係顯示檢査裝置402的側面圖。在檢査裝置402中係複數薄片狀試樣2按照預定規則而被配置在試樣保持器。在第19圖(a)所示之例中,係顯示在1個試樣保持器440配置有4個試樣2之例。在1個試樣2的面內係設定有複數(在第19圖中為9個)的測定點,針對各測定點,測定光學性能。若根據任何測定點的測定結果,被判斷為不良時,對於包含該測定點的試樣2,(以未圖示之標記裝置)進行表示為不良的標記。 Fig. 19 is a schematic view showing an example of an inspection device 402 including the measurement device 1 according to the present embodiment. Fig. 19(a) shows a plan view of the inspection device 402, and Fig. 19(b) shows a side view of the inspection device 402. In the inspection device 402, a plurality of flaky samples 2 are placed in the sample holder in accordance with a predetermined rule. In the example shown in Fig. 19(a), an example in which four samples 2 are disposed in one sample holder 440 is shown. Measurement points of a plurality (9 in Fig. 19) were set in the plane of one sample 2, and optical performance was measured for each measurement point. When it is judged to be defective based on the measurement result of any measurement point, the sample 2 including the measurement point is marked with a defect (indicated by a marking device (not shown)).

配置有複數試樣2的試樣保持器440的各個係被裝設在匣盒450。匣盒450係構成為可朝重力方向堆積。如上所示所被堆積的複數匣盒450被收納在試樣收納部490。搬運機器人460係將臂部462依序插入在匣盒450的各凹槽,將被收存在對象凹槽的試樣保持器440搬運至試樣載台412。該試樣保持器440的移動係藉由設在試樣載台412之前段的區域感 測器464予以檢測。對於被載置在試樣載台412上的試樣保持器440內的試樣2,按照如上所述之順序,執行所需光學性能的測定。 Each of the sample holders 440 in which the plurality of samples 2 are disposed is attached to the cassette 450. The cassette 450 is configured to be stacked in the direction of gravity. The plurality of cassettes 450 stacked as described above are housed in the sample storage unit 490. The transport robot 460 sequentially inserts the arm portions 462 into the respective grooves of the cassette 450, and transports the sample holder 440 collected in the target recess to the sample stage 412. The movement of the sample holder 440 is sensed by the area provided in the preceding stage of the sample stage 412. The detector 464 detects it. The measurement of the required optical performance is performed on the sample 2 in the sample holder 440 placed on the sample stage 412 in the order described above.

其中,照射部60及受光部10係被固定在以試樣載台412的上下方向作配置的支持構件470。 Among these, the irradiation unit 60 and the light receiving unit 10 are fixed to the support member 470 disposed in the vertical direction of the sample stage 412.

藉由採用第19圖所示之構成,可連續進行對複數試樣2的測定。以配置複數試樣收納部490為佳。藉由配置複數試樣收納部490,在對於被收納在其中一方試樣收納部490的複數匣盒450執行測定處理的期間,對於其他試樣收納部490,可進行新的複數匣盒450的裝設、或測定完畢的複數匣盒450的取出。 The measurement of the plurality of samples 2 can be continuously performed by adopting the configuration shown in Fig. 19. It is preferable to arrange the plurality of sample storage portions 490. By arranging the plurality of sample storage units 490, the measurement processing is performed on the plurality of cassettes 450 accommodated in one of the sample storage units 490, and the new sample storage unit 490 can be used to perform the new plurality of cassettes 450. The removal of the plurality of cassettes 450 installed or measured.

<E.應用例2> <E. Application Example 2>

在上述說明中,係例示僅配置一對用以對試樣2照射激勵光的照射部50、及用以接受藉由激勵光而在試樣2所發生的透過光及螢光的受光部10的構成,但是亦可配置複數該等照射部50與受光部10的成對。 In the above description, only a pair of the irradiation unit 50 for irradiating the sample 2 with the excitation light and the light receiving unit 10 for receiving the transmitted light and the fluorescence generated in the sample 2 by the excitation light are disposed. However, a plurality of the irradiation units 50 and the light receiving unit 10 may be arranged in pairs.

第20圖係顯示包含按照本實施形態之測定裝置1之檢査裝置500之其他一例的模式圖。在第20圖所示之檢査裝置500中,係顯示對應被設定在試樣2的複數測定點,配置有複數照射部50與受光部10的成對的構成例。亦即,檢査裝置500中係對試樣2(螢光體),按照預定規則,配置複數受光部10,檢測部係並列測定藉由複數受光部10而分別所被接受到的透過光及螢光。 Fig. 20 is a schematic view showing another example of the inspection apparatus 500 including the measuring apparatus 1 according to the present embodiment. In the inspection apparatus 500 shown in FIG. 20, a configuration example in which a plurality of measurement points are set in the sample 2 and a pair of the plurality of irradiation units 50 and the light receiving unit 10 are arranged is displayed. In other words, in the inspection apparatus 500, the sample 2 (the phosphor) is placed in accordance with a predetermined rule, and the plurality of light receiving units 10 are arranged, and the detecting unit measures the transmitted light and the fluorescent light received by the plurality of light receiving units 10 in parallel. Light.

在第20圖所示構成中,可使用多輸入分光光度計 220作為檢測部。多輸入分光光度計220係例如可使用並列配置的複數線感測器等,並列同時測定複數螢光的分光放射照度。藉由使用多輸入分光光度計220,可更加縮短測定所需時間,並且可實現簡化試樣載台412的構成,或未使用試樣載台412的構成。其中,可將色度感測器安裝在受光部10,來並列同時測定透過螢光色度,來取代多輸入分光光度計220。 In the configuration shown in Figure 20, a multi-input spectrophotometer can be used. 220 is used as a detecting unit. The multi-input spectrophotometer 220 can measure the spectral irradiance of the complex fluorescent light in parallel using, for example, a plurality of line sensors arranged in parallel. By using the multi-input spectrophotometer 220, the time required for measurement can be further shortened, and the configuration of the sample stage 412 can be simplified or the sample stage 412 can be used. Here, the chromaticity sensor can be mounted on the light receiving unit 10, and the transmitted chromaticity can be measured in parallel to replace the multi-input spectrophotometer 220.

在第20圖中顯示照射部50與受光部10之成對被配置成行列狀的構成,但是並不一定需要配置成行列狀,亦可僅配置一列份。此外,測定點被設定成鋸齒狀時,若在分別對應如上所示之被設定成鋸齒狀的測定點的位置配置照射部50與受光部10的成對即可。 In the 20th drawing, the pair of the irradiation unit 50 and the light-receiving unit 10 are arranged in a matrix, but it is not necessarily required to be arranged in a matrix, and only one column may be arranged. In addition, when the measurement points are set in a zigzag shape, the pair of the irradiation unit 50 and the light receiving unit 10 may be arranged at positions corresponding to the measurement points set in the zigzag shape as described above.

<F.優點> <F. Advantages>

藉由本實施形態,在測定螢光體的光學性能時,並不需要與使用積分球時般的試樣接觸,可在以預定距離遠離試樣的位置配置受光部來進行測定,因此可以更短時間進行面內分布測定。此外,由於不會與試樣接觸,因此可避免誤使試樣損傷的情形。 According to the present embodiment, when the optical performance of the phosphor is measured, it is not necessary to contact the sample when the integrating sphere is used, and the light receiving unit can be placed at a position away from the sample by a predetermined distance, and the measurement can be performed. Time for in-plane distribution determination. In addition, since it is not in contact with the sample, it is possible to avoid erroneous damage to the sample.

藉由本實施形態,可構裝校正功能,可對受光部在光擴散部的分光放射照度進行校正。藉由構裝如上所示之校正功能,可將測定本身長期安定化。 According to the present embodiment, the correction function can be configured to correct the spectroscopic illuminance of the light receiving portion in the light diffusing portion. The measurement itself can be stabilized for a long period of time by constructing the correction function as shown above.

藉由本實施形態,亦可構裝對激勵光源的調光功能,可藉由該調光功能,將激勵光的光量維持為一定。藉由構裝如上所示之調光功能,可將測定本身長期安定化。 According to this embodiment, a dimming function for the excitation light source can be configured, and the amount of excitation light can be maintained constant by the dimming function. The measurement itself can be stabilized for a long period of time by arranging the dimming function as shown above.

在上述說明中,主要針對以被廣泛應用在發光元 件或顯示元件等的螢光材料為測定對象的情形加以說明的測定對象的螢光並非侷限於該等。例如亦可應用在由Langmuir Blodgett(LB)膜或功能性分子膜所產生的螢光、或由生物細胞或蛋白質所產生的螢光等的測定。 In the above description, it is mainly targeted to be widely used in illuminating elements. The fluorescent material to be measured, which is described in the case where the fluorescent material such as a member or a display element is a measurement target, is not limited to these. For example, it can also be applied to measurement of fluorescence generated by a Langmuir Blodgett (LB) film or a functional molecular film, or fluorescence generated by biological cells or proteins.

藉由上述說明,應可清楚瞭解有關按照本實施形態之測定裝置的除此之外的優點。 From the above description, it is possible to clearly understand the other advantages of the measuring apparatus according to the present embodiment.

以上詳加說明本發明之實施形態,惟應明確理解其僅為供例示之用,並非止於限定,發明範圍係藉由所附申請專利範圍予以解釋。 The embodiments of the present invention have been described in detail above, but are to be construed as illustrative only, and not limited by the scope of the accompanying claims.

1‧‧‧測定裝置 1‧‧‧Measurement device

2‧‧‧試樣 2‧‧‧sample

10‧‧‧受光部 10‧‧‧Receiving Department

12‧‧‧框體 12‧‧‧ frame

14‧‧‧光擴散部 14‧‧‧Light Diffusion Department

16‧‧‧內面 16‧‧‧ inside

18‧‧‧窗 18‧‧‧ window

20‧‧‧光纖 20‧‧‧Fiber

22‧‧‧連接端 22‧‧‧Connecting end

24‧‧‧視野 24 ‧ ‧ Vision

50‧‧‧照射部 50‧‧‧ Department of Irradiation

52‧‧‧光源 52‧‧‧Light source

54‧‧‧聚光透鏡 54‧‧‧ Concentrating lens

56‧‧‧電源裝置 56‧‧‧Power supply unit

200‧‧‧檢測部 200‧‧‧Detection Department

300‧‧‧處理裝置 300‧‧‧Processing device

Claims (6)

一種測定裝置,用以測定螢光體的光學性能,其包括:光源,用以對前述螢光體照射激勵光;受光部,以預定距離遠離前述螢光體作配置,用以接受前述激勵光之中透過前述螢光體的光、及藉由前述激勵光而在前述螢光體所發生的螢光;及檢測部,用以檢測藉由前述受光部所接受到的光,前述受光部係包含:框體,在前述激勵光的照射方向具有預定的長度;光擴散部,被配置在前述框體之前述螢光體之側;及窗,被配置在前述框體之前述光擴散部的相反側,用以將所入射的螢光導引至檢測部。 An apparatus for measuring optical properties of a phosphor, comprising: a light source for illuminating the phosphor with excitation light; and a light receiving portion disposed away from the phosphor at a predetermined distance for receiving the excitation light The light that has passed through the phosphor and the fluorescent light that is generated by the fluorescent light by the excitation light; and the detecting unit that detects light received by the light receiving unit, wherein the light receiving unit is The housing includes a predetermined length in a direction in which the excitation light is irradiated, a light diffusion portion disposed on a side of the phosphor body of the housing, and a window disposed in the light diffusion portion of the housing The opposite side is for guiding the incident fluorescent light to the detecting portion. 如申請專利範圍第1項之測定裝置,其中,前述光擴散部係被配置在包含來自前述窗的視野的範圍。 The measuring device according to claim 1, wherein the light diffusing portion is disposed in a range including a field of view from the window. 如申請專利範圍第1或2項之測定裝置,其中,另外包括變更來自前述光源的激勵光入射至前述螢光體的位置的移動機構。 The measuring device according to claim 1 or 2, further comprising a moving mechanism that changes a position at which excitation light from the light source is incident on the phosphor. 如申請專利範圍第1或2項之測定裝置,其中,對於前述螢光體,按照預定規則,配置有複數前述受光部,前述檢測部係並列測定藉由複數受光部而分別所接受到的螢光。 The measuring device according to claim 1 or 2, wherein the fluorescent body is provided with a plurality of light receiving portions in accordance with a predetermined rule, and the detecting portion measures the fluorescent light received by the plurality of light receiving portions in parallel. Light. 如申請專利範圍第1或2項之測定裝置,其中,前述預定距離係依前述激勵光的投光直徑與前述框體的受光直徑的關係、以及前述光擴散部的透過率而定。 The measuring device according to claim 1 or 2, wherein the predetermined distance is determined by a relationship between a light projecting diameter of the excitation light and a light receiving diameter of the frame, and a transmittance of the light diffusing portion. 一種測定方法,用以測定螢光體的光學性能,其包括:由光源對前述螢光體照射激勵光的步驟;以預定距離遠離前述螢光體作配置的受光部接受前述激勵光之中透過前述螢光體的光、及藉由前述激勵光而在前述螢光體所發生的螢光的步驟;及在檢測部檢測藉由前述受光部所接受到的光的步驟,前述受光部係包含:在前述激勵光的照射方向具有預定的長度的框體;被配置在前述框體之前述螢光體之側的光擴散部;及被配置在前述框體之前述光擴散部的相反側,用以將所入射的螢光導引至檢測部的窗。 A measuring method for measuring optical properties of a phosphor, comprising: a step of irradiating the phosphor with excitation light by a light source; and receiving, by the light receiving portion disposed away from the phosphor at a predetermined distance, receiving the excitation light a step of emitting light of the phosphor and a fluorescent light generated by the excitation light by the excitation light; and a step of detecting light received by the light receiving unit by the detecting unit, wherein the light receiving unit includes a frame having a predetermined length in the irradiation direction of the excitation light; a light diffusion portion disposed on the side of the phosphor of the frame; and a light diffusion portion disposed on the opposite side of the light diffusion portion of the frame A window for guiding the incident fluorescent light to the detecting portion.
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