KR101034716B1 - Quantum efficiency measurement apparatus and quantum efficiency measurement method - Google Patents

Abstract

A sample OBJ1, which is a measurement target part of quantum efficiency, and a standard body REF1 having a known reflectance characteristic, are mounted on the sample window 2 provided in the planar mirror 5, respectively. In the case where the sample OBJ1 and the standard body REF1 are mounted, the quantum efficiency of the sample OBJ1 is measured based on the respective spectra measured by the spectroscope. By substantially matching the opening surface of the observation window 3 with the exposure surface of the sample OBJ1 or the standard body REF1, the excitation light L1 is received and the fluorescence generated in the sample OBJ1 and the excitation reflected from the sample OBJ1 are reflected. The light L1 is suppressed from being incident directly on the observation window 3.

Sample, reflectance, aperture, observation window, excitation light

Description

QUANTUM EFFICIENCY MEASUREMENT APPARATUS AND QUANTUM EFFICIENCY MEASUREMENT METHOD

The present invention relates to an apparatus and a method for measuring the quantum efficiency of a measurement object.

In recent years, development of a fluorescent lamp and a display is progressing rapidly. With such development, quantum efficiency is attracting attention as an index for more accurately evaluating the performance of phosphors used in them. In general, quantum efficiency refers to the ratio of the number of photons of fluorescence to the number of photons absorbed by a measurement object (typically, a phosphor).

As a typical method for measuring such quantum efficiency, "Okubo, Shigeta" measurement of quantum efficiency of NBS standard phosphor "" discloses a measurement optical system for phosphor quantum efficiency. Instead of such a configuration, Japanese Patent Application Laid-Open No. 09-292281 (Patent Document 1), Japanese Patent Application Laid-Open No. 10-142152 (Patent Document 2) and Japanese Patent Application Publication No. 10-293063 (Patent Document) 3) and the like have proposed a structure and method for measuring quantum efficiency.

In the apparatus for measuring the quantum efficiency according to the above-described prior art, the integrating sphere is used to capture fluorescence emitted from the object to be measured (phosphor). In general, since the fluorescence from the phosphor is weak, it is preferable to use an integrating sphere having a smaller diameter in order to increase the measurement accuracy.

By the way, in such an integrating sphere, a light shielding plate for preventing the fluorescence emitted from the phosphor and / or the excitation light reflected from the surface of the phosphor is directly incident on the detector.

Patent Document 1: Japanese Patent Application Laid-Open No. 09-292281

Patent Document 2: Japanese Patent Application Laid-open No. Hei 10-142152

Patent Document 3: Japanese Patent Application Laid-open No. Hei 10-293063

[Non-Patent Document 1] Okubo, Shigeta, "Measurement of Quantum Efficiency of NBS Standard Phosphors," Journal of the Korean Society of Illumination, Illumination Society of Japan, 1999, Vol. 83, No. 2, p.87-93

However, when a smaller diameter integrating sphere is used, the influence of light absorption by the light shielding plate is relatively increased, which may adversely affect measurement accuracy.

This invention is made | formed in order to solve such a subject, The objective is to provide the quantum efficiency measuring apparatus and the quantum efficiency measuring method which can measure quantum efficiency with higher precision.

A quantum efficiency measuring device according to an aspect of the present invention includes a hemisphere having an optical diffusion reflecting layer on its inner surface, and a planar mirror arranged to block an opening of the hemisphere while passing through a substantially center of curvature of the hemisphere. The planar mirror is provided at a position of the center of curvature of the hemisphere, and includes a first window for mounting the measurement object and a second window provided at a position spaced a predetermined distance from the first window. The apparatus for measuring quantum efficiency further includes a spectrometer for measuring the spectrum in the hemisphere through the second window, and excitation light through the third window provided at the hemisphere to open the first window at a predetermined angle with respect to the normal of the plane mirror. The light source to be irradiated toward the light source, the first spectrum measured by the spectroscope when the measurement object is placed in the first window, and the standard body having a known reflectance characteristic instead of the measurement object by the spectroscope. An arithmetic processing part which calculates the quantum efficiency of a measurement object based on the measured 2nd spectrum is included.

Preferably, the first window is configured to mount the measurement object such that the exposed surface of the measurement object substantially coincides with the surface inside the hemisphere of the planar mirror.

Preferably, the second window comprises a light transmitting diffuser member, disposed between the interior of the hemisphere and the spectrometer.

A quantum efficiency measuring device according to another aspect of the present invention includes a hemisphere having an optical diffusion reflecting layer on its inner surface, and a planar mirror disposed so as to pass through a substantial center of curvature of the hemisphere and to block the opening of the hemisphere. The planar mirror includes a first window provided near the substantial center of curvature of the hemisphere and a second window provided at a position spaced apart from the first window by a predetermined distance. The present quantum efficiency measuring device further includes a light source for irradiating excitation light through a first window toward a measurement object disposed by exposing at least a portion thereof in the hemisphere, and a spectrometer for measuring a spectrum in the hemisphere through a second window. Include. The second window regulates that light from the measurement object is directly incident on the spectrometer. The present quantum efficiency measuring apparatus further includes a first spectrum measured by a spectroscope when the measurement object is placed in the hemisphere, and a known reflectance characteristic or transmittance characteristic in place of the measurement object. An arithmetic processing part which calculates the quantum efficiency of a measurement object based on the 2nd spectrum measured by WHEREIN.

Preferably, the second window is an opening having a larger diameter on the outer side of the hemisphere than the diameter on the inner side of the hemisphere.

Preferably, the hemisphere is installed at the intersection of the normal to the plane mirror passing through the substantially center of curvature of the hemisphere and further comprises a third window for mounting the measurement object and the standard, wherein the light source is configured to It is arranged to irradiate toward the third window at a predetermined angle with respect to the normal.

Preferably, the object to be measured is a liquid enclosed in a container having light transmissivity, and is disposed on the optical axis of the light source.

More preferably, the measurement object is entirely contained in the hemisphere.

Preferably, the hemisphere is provided at a point of intersection with the normal of the planar mirror passing through the substantially center of curvature of the hemisphere, and includes a third window for mounting the measurement object and the standard body. The first window is provided at a position of a substantially center of curvature of the hemisphere on the planar mirror, the measurement object is a liquid enclosed in a cylindrical container, and the surface mounted on the third window of the cylindrical container is made of a light transmitting material. At the same time, the other part is composed of a member having light reflectivity.

A quantum efficiency measuring method according to another aspect of the present invention provides a device comprising a hemisphere having a light diffusing reflective layer on its inner surface and a planar mirror arranged to pass through a substantial center of curvature of the hemisphere and to block the opening of the hemisphere. A step of attaching the measurement object to a first window provided at a position including a substantially center of curvature of the hemisphere of the planar mirror, and a predetermined window with respect to the normal of the plane mirror through the third window provided at the hemisphere. Irradiating toward the measurement object at an angle and measuring the spectrum in the hemisphere when the measurement object is mounted as a first spectrum through a second window provided at a position spaced apart from the first window of the plane mirror by a predetermined distance; And a step of attaching a standard body having a known reflectance characteristic to the first window and a plane mirror method for exciting light through the third window. Irradiating toward the standard body at a predetermined angle with respect to the line, measuring the spectrum in the hemisphere when the standard body is mounted as a second spectrum through a second window, and based on the first spectrum and the second spectrum Calculating the quantum efficiency of the measurement object.

According to the present invention, the quantum efficiency can be measured with higher accuracy.

1 is a schematic configuration diagram of a quantum efficiency measuring device according to a first embodiment of the present invention.

2 is an external view of a quantum efficiency measuring device according to the first embodiment of the present invention.

It is sectional drawing which shows the principal part of the quantum efficiency measuring apparatus which concerns on 1st Embodiment of this invention.

It is a figure for demonstrating the measuring principle in the quantum efficiency measuring apparatus which concerns on 1st Embodiment of this invention.

It is a figure which shows the control structure in the arithmetic processing part of the quantum efficiency measuring apparatus which concerns on 1st Embodiment of this invention.

Fig. 6 is a flowchart showing the processing procedure according to the quantum efficiency measurement using the quantum efficiency measuring device according to the first embodiment of the present invention.

It is a top view which shows the positional relationship of the spectroscope and the light source in the quantum efficiency measuring apparatus which concerns on the 1st modification of 1st Embodiment of this invention.

It is sectional drawing which shows the principal part of the quantum efficiency measuring apparatus which concerns on the 2nd modified example of 1st Embodiment of this invention.

It is sectional drawing which shows the principal part of the quantum efficiency measuring apparatus which concerns on 2nd Embodiment of this invention.

It is a schematic block diagram of the quantum efficiency measuring apparatus which concerns on 3rd embodiment of this invention.

It is sectional drawing which shows the principal part of the quantum efficiency measuring apparatus which concerns on 3rd embodiment of this invention.

It is a figure which shows the control structure in the arithmetic processing part of the quantum efficiency measuring apparatus which concerns on 3rd Embodiment of this invention.

It is sectional drawing which shows the principal part of the quantum efficiency measuring apparatus which concerns on the 1st modified example of the 3rd Embodiment of this invention.

It is sectional drawing which shows the principal part of the quantum efficiency measuring apparatus which concerns on the 2nd modified example of the 3rd Embodiment of this invention.

It is sectional drawing which shows the principal part of the quantum efficiency measuring apparatus which concerns on 4th embodiment of this invention.

<Code description>

1, 1A: hemisphere

1a: light diffusing reflective layer

2, 9, 312: Sample window

3, 13, 316, 368: observation window

4, 10, 12, 314, 366: light source window

5, 5A, 5B, 5C: flat mirror

5a: reflective surface

6: spectrometer

6a: Mounting part

6b: fiber end

6c: reflector

6d, 308, 362: optical fiber

6e: Detector

7: light source

7a: lamp

7b: condensing optical system

14: light transmission diffusion member

15, 15A: seal member

16, 16A, 16B: transparent cell

100: hemisphere integrator

102: base portion

104: rotation axis

200, 200A: arithmetic processing unit

202: switching part

204, 206: buffer

208, 210: selection

212, 222 multiplier

214, 224: integral part

216, 226: division

218: initial setting holding unit

220: additive and subtractive part

300, 350: Quantum efficiency measuring device

302, 352: integrating sphere

304, 358: shading plate

306, 360: light receiver

310, 364: Spectrophotometer

320, 370, L1: excitation light

354 support

356: transparent container

Ax1, Ax2, Ax3: optical axis

OBJ, OBJ1, OBJ2: Sample

REF, REF1, REF2: standard

Quantum Efficiency Measuring Device: SYS1, SYS1A, SYS2, SYS3, SYS3A, SYS3B

EMBODIMENT OF THE INVENTION Embodiment of this invention is described in detail, referring drawings. In addition, the same code | symbol is attached | subjected about the same or substantial part in drawing, and the description is not repeated.

[First Embodiment]

<Related Technology>

First, in order to make understanding of the quantum efficiency measuring device according to the present embodiment easier, first, the quantum efficiency measuring device according to the present embodiment will be described with reference to FIG. 1.

The quantum efficiency measuring apparatus 300 according to the present embodiment shown in FIG. 1 measures the quantum efficiency of a measurement object (hereinafter also referred to as "sample (OBJ)") such as a phosphor. Specifically, the quantum efficiency measuring device 300 includes an integrating sphere 302, a light shielding plate 304, a light receiving unit 306, an optical fiber 308, and a spectroscopic measuring device 310. In this quantum efficiency measuring apparatus 300, a sample OBJ is mounted on a sample window 312 provided in the integrating sphere 302, and a light source (shown in the outside of the integrating sphere 302) is provided to the sample OBJ. Excitation light 320 is irradiated through the light source window 314. As the excitation light 320, in the case of a low-pressure mercury fluorescent lamp, ultraviolet monochromatic light of 200 to 400 nm is used, and ultraviolet or visible monochromatic light of 300 to 600 nm is used in the field of LED (Light Emitting Diode). The sample OBJ receives this excitation light 320 and emits fluorescent light. Fluorescence emitted from the sample OBJ is reflected by the multiple reflection on the inner surface of the integrating sphere 302 and integrated (uniformized). In the sample OBJ, part of the excitation light 320 to be irradiated is reflected, and the reflected excitation light 320 is also multi-reflected in the integrating sphere 302.

The light receiving unit 306 extracts a part of the light of the integrating sphere 302 through the observation window 316 installed in the integrating sphere 302 and guides the light to the spectroscopic measuring device 310 through the optical fiber 308. In addition, a light transmitting diffusion member is generally provided at a portion of the light receiving portion 306 in contact with the observation window 316. Thus, after bringing the viewing angle characteristic in the observation window 316 close to the fully diffusive characteristic, inducing the illuminance (light spectrum) by the light from the entire inner wall surface of the integrating sphere 302 to the optical fiber 308 It is common.

The spectroscopic measuring device 310 measures the spectrum of light extracted from the light receiving unit 306. That is, the spectroscopic measuring device 310 measures the illuminance (light spectrum) on the inner wall surface of the integrating sphere 302.

The same measurement as described above is performed even in a state where a standard body REF having a known reflectance characteristic is attached instead of the sample OBJ. The quantum efficiency of the sample OBJ is calculated based on the spectrum measured when the sample OBJ is mounted and the spectrum measured when the standard body REF is attached.

As described above, by using the integrating sphere 302, the quantum efficiency can be accurately measured even when the sample OBJ does not have the fully diffuse reflection characteristic, such as when the sample OBJ has specularity on its surface. Can be. In addition, since the integrating sphere 302 itself functions as a light shielding container, there is also an effect of suppressing the influence of external light.

However, in the quantum efficiency measurement apparatus 300, the sample window is a measurement error when the fluorescence generated in the sample OBJ and the excitation light 320 reflected by the sample OBJ directly enter the observation window 316. A light shielding plate 304 is provided between the 312 and the observation window 316.

In general, since the fluorescence from the phosphor is weak, it is preferable to use the integrating sphere 302 having a smaller diameter in order to increase the measurement accuracy. However, when the integrating sphere 302 having a smaller diameter is used, the influence of light absorption by the light shielding plate 304 is relatively large, which may adversely affect measurement accuracy. That is, since the light shielding plate 304 inhibits mutual reflection on the inner wall surface of the integrating sphere 302, and absorption of light by the light shielding plate 304 lowers the integration efficiency, the light shielding plate 304 becomes a measurement error factor. There was a challenge.

<Device configuration>

Next, the quantum efficiency measuring device SYS1 according to the present embodiment will be described with reference to FIGS. 2 and 3.

The quantum efficiency measuring device SYS1 shown in FIG. 2 includes a hemisphere integrator 100 and an arithmetic processing unit 200. As shown in FIG. 3, the hemispherical integrator 100 is composed of a hemispherical part 1 and a disk-shaped planar mirror 5 arranged to block an opening of the hemisphere part 1. The hemispherical part 1 is rotatably connected with the base part 102 via the rotating shaft 104. The quantum efficiency measuring device SYS1 further includes a spectroscope 6 for measuring illuminance (light spectrum) of the inner wall surface of the hemisphere 1 and a light source 7 for generating excitation light L1. .

As will be described later, in the quantum efficiency measuring apparatus SYS1 according to the present embodiment, the sample OBJ1 which is the measurement target portion of the quantum efficiency and the standard body REF1 having known reflectivity characteristics are provided in the plane mirror 5, respectively. It is mounted on the sample window 2. And when the sample OBJ1 and the standard body REF1 are each mounted, the quantum efficiency of the sample OBJ1 is measured based on each spectrum measured by the spectroscope 6.

The quantum efficiency measuring device SYS1 according to the present embodiment is typically suitable for quantum efficiency measurement on a solid state sample such as a phosphor for a fluorescent lamp or a phosphor for an LED. Also, the standard body REF1 is typically an object obtained by coating barium sulfate on the surface thereof. The sample OBJ1 and the standard body REF1 are both molded to substantially match the diameter of the sample window 2. This is because it is preferable to function the hemispherical integrator 100 as a light shielding container for the purpose of avoiding the influence on measurement accuracy by external light. In addition, the diameter of the sample OBJ1 and the reference body REF1 should just be substantially equal to the diameter of the sample window 2, and is not limited at all about the shape other than that.

As shown in FIG. 3, the light diffusion reflecting layer 1a is provided on the inner surface (inner wall) of the hemisphere. This light-diffusion reflection layer 1a is typically formed by apply | coating or spraying light-diffusion material, such as barium sulfate and PTFE (polytetrafluoroethylene).

In addition, the hemisphere part 1 is provided with a light source window 4 for guiding the excitation light L1 emitted from the light source 7 provided outside the hemisphere part 1 into the hemisphere part 1. This excitation light L1 is irradiated along the optical axis Ax1 which has an angle (theta) with respect to the normal line N1 of the planar mirror 5 toward the sample OBJ1 or the standard body REF1. This is for suppressing generation of the specular reflection component in the sample OBJ1 or the standard body REF1 by the excitation light L1 from the light source 7. That is, the light generated by the excitation light L1 reflected from the sample OBJ1 or the standard body REF1 is guided in a direction different from the optical axis Ax1 which is the incident path. Moreover, about 5 degrees are preferable as angle (theta).

The planar mirror 5 is arranged to pass through the substantial center of curvature O of the hemisphere 1 and to block the opening of the hemisphere 1. Here, the center of curvature O of the hemispherical part 1 means the geometric center with respect to the inner surface side of the hemisphere part 1 typically. At least on the inner surface side of the hemisphere 1 of the planar mirror 5, a reflecting surface (mirror surface) 5a is formed.

In addition, the planar mirror 5 is provided with a sample window 2 and an observation window 3 capable of communicating between the inner surface side and the outer surface side of the hemisphere part 1. The sample window 2 is an opening for mounting the sample OBJ1 or the standard body REF1 and is provided at the position of the substantial center of curvature O of the hemisphere. In other words, the sample window 2 is formed in a region including the substantial center of curvature O of the hemisphere 1. In addition, the observation window 3 is an opening for observing the illuminance of the inner surface of the hemispherical part 1, and is provided in the position spaced apart from the sample window 2 by the predetermined distance to the outer peripheral side. Then, light is guided to the spectrometer 6 through the observation window 3.

The light source 7 includes a lamp 7a, a condensing optical system 7b, and a wavelength control optical system 7c. The lamp 7a is typically a xenon discharge lamp (Xe lamp) or the like. The condensing optical system 7b guides the light generated by the lamp 7a to be imaged on the sample OBJ1 or the standard body REF1. That is, the condensing optical system 7b narrows the optical path so that the entire excitation light L1 can be settled within the range of the sample OBJ1 or the standard body REF1. The wavelength control optical system 7c controls the wavelength component of the excitation light L1. The wavelength control optical system 7c is typically disposed between the lamp 7a and the condensing optical system 7b, and an optical interference filter (wavelength band transmission filter) or a spectroscope is used.

The spectrometer 6 includes a mounting portion 6a, a fiber end 6b, a reflecting portion 6c, an optical fiber 6d, and a detector 6e. The mounting part 6a is arrange | positioned at the planar mirror 5 so that the observation window 3 may be covered. The optical fiber 6d and the fiber end 6b connected to the optical fiber 6d are inserted into the mounting portion 6a. Moreover, the reflection part 6c is provided on the extension line of the downward direction of the paper which follows the normal line of the observation window 3. The reflecting portion 6c converts the propagation direction of the light incident through the observation window 3 by approximately 90 degrees and then guides the fiber end 6b.

The detector 6e detects the spectrum of the light introduced by the optical fiber 6d. Typically, the detector 6e comprises a diffraction grating and a line sensor associated with the diffraction direction of the diffraction grating and outputs the intensity for each wavelength of the input light. When the sample OBJ1 is a phosphor, the measurable range of the detector 6e is generated in the sample OBJ1 in response to the wavelength range of the excitation light L1 and the excitation light L1 irradiated from the light source 7. It is selected to cover both sides of the wavelength range of the fluorescence.

<Integration function>

Next, the integration function in the quantum efficiency measuring device SYS1 according to the present embodiment will be described. As shown in FIG. 3, when the excitation light L1 irradiated from the light source 7 is incident on the sample OBJ1 mounted on the sample window 2, the excitation light L1 is formed at a ratio according to the material or shape. Absorbed into the sample OBJ1, part of its energy generates fluorescence. In addition, the excitation light L1 which is not absorbed by the sample OBJ1 is reflected by the sample OBJ1. The light beam including the fluorescence emitted from the sample OBJ1 and the excitation light L1 reflected from the sample OBJ1 mainly propagates toward the inner surface of the hemisphere 1.

On the other hand, the planar mirror 5 reflects the light beam from the sample OBJ1 incident after being reflected by the hemisphere 1 and generates a virtual image of the inner surface of the hemisphere 1. As described above, since the planar mirror 5 is arranged to pass through the center of curvature of the hemisphere 1, the space formed between the planar mirror 5 and the hemisphere 1 is a hemisphere with a constant curvature. Therefore, the roughness distribution equivalent to the case where the integrating sphere of a sphere is used can be obtained substantially by the inner surface of this hemispherical part 1 and the virtual image which the planar mirror 5 produces | generates. In other words, it can be considered that the excitation light L1 is irradiated to two samples OBJ1 arranged symmetrically with each other in the integrating sphere of the sphere.

The fluorescence generated from the sample OBJ1 and the excitation light L1 reflected from the sample OBJ1 are repeatedly reflected in the space surrounded by the hemisphere 1 and the planar mirror 5, whereby The roughness of the inner surface is equalized. By measuring this uniform roughness (spectrum), the quantum efficiency of the sample OBJ1 can be measured.

As described above, in the quantum efficiency measuring apparatus SYS1 according to the present embodiment, a space formed between the planar mirror 5 and the hemispheres 1 and a virtual image of this space generated by the planar mirror 5 are formed. What is necessary is just to be able to consider a synthesized state substantially as a sphere. Therefore, the "substantial center of curvature of the hemispherical part" means not only the complete center of curvature of the hemisphere part 1, but also to the near position where roughness distribution substantially equivalent to the case of using the integrating sphere of the sphere as described above can be obtained. It is a concept to include.

The same integration effect can be obtained even when the standard body REF1 is attached to the sample window 2 instead of the sample OBJ1. In addition, since the fluorescence does not occur in the standard body REF1, when the excitation light L1 irradiated from the light source 7 is incident on the standard body REF1 mounted on the sample window 2, the reflectance characteristics of the standard body REF1 Light is reflected.

<Mounting of Samples and Standards>

As described above, the sample OBJ1 and the standard body REF1 are mounted on the sample window 2 provided in the planar mirror 5, but at this time, the sample OBJ1 and the standard body REF1 have a flat mirror 5 with an exposed surface thereof. It is preferable to be mounted so as to substantially coincide with the surface (reflective surface 5a) on the side of hemisphere 1 of (). This is because, if the opening surface of the observation window 3 does not substantially coincide with the exposure surface of the sample OBJ1 or the standard body REF1, for example, the exposure surface of the sample OBJ1 is larger than the opening surface of the observation window 3. When it is lowered, measurement error occurs because the fluorescence generated by the sample OBJ1 in response to the excitation light L1 and the excitation light L1 reflected from the sample OBJ1 are absorbed from the side of the observation window 3. . Alternatively, when the exposed surface of the sample OBJ1 protrudes from the opening surface of the observation window 3, the protruded portion of the light diffusing reflective layer 1a and the planar mirror 5 on the inner surface of the hemisphere 1 is formed. In the integration space constituted by the reflecting surface 5a, the excitation light L1 is received to inhibit the mutual reflection of the fluorescence generated in the sample OBJ1 and the excitation light L1 reflected from the sample OBJ1.

In addition, in the structure shown in FIG. 3, since the sample window 2 and the observation window 3 are on the plane mirror 5 which is coplanar, if the exposure surface of the sample OBJ and the standard body REF1 is planar, The fluorescence and reflected light do not directly enter the observation field of view from the observation window 3. Therefore, it is not necessary to arrange the light shielding plate 304 as shown in FIG. Therefore, the light absorption error by the light shielding plate can be suppressed, and the illuminance of the inner wall surface of the hemisphere 1 can be further increased by the above-mentioned "imaginary image". By these two actions, quantum efficiency can be measured with higher precision.

Measurement principle

Next, with reference to FIG. 4A and FIG. 4B, the measurement principle in the quantum efficiency measuring apparatus SYS1 which concerns on this embodiment is demonstrated.

Typically, when the excitation light L1 is irradiated onto the sample OBJ1, which is a phosphor, a portion (photon) of the excitation light is absorbed and used for fluorescence emission, while the remaining excitation light L1 is reflected on its surface. Here, the wavelength range of the excitation light L1 is λ _1L to λ _1H , and the wavelength range of the fluorescent component generated from the sample OBJ1 is λ _2L to λ _2H . In addition, in general, since the excitation light L1 is an ultraviolet ray and the fluorescence is visible light, the wavelength ranges λ _1L to λ _1H and the wavelength ranges λ _2L to λ _2H do not overlap. Therefore, by selectively extracting the component corresponding to each wavelength range from the spectrum measured by the spectroscope 6, both can be isolate | separated.

As shown in Fig. 4A, the spectrum of the excitation light L1 is set to E ₀ (λ). At this time, by irradiating the excitation light L1, the spectrum of the fluorescent component generated from the sample OBJ1 is set to P (λ), and the spectrum of the reflected light component reflected from the sample OBJ1 is set to R (λ). That is, the spectrum P (λ) of the fluorescent component has a wavelength range (λ _2L to λ _2H ) corresponding to the fluorescence of the spectrum E ⁽¹⁾ (λ) measured by the spectroscope 6 when the sample OBJ1 is mounted. The spectrum R (λ) of the reflected light component corresponds to the component of, and the wavelength range (λ _1L to λ _1H ) corresponding to the excitation light L1 of the spectrum E ⁽¹⁾ (λ) measured by the spectroscope 6. It corresponds to the ingredient of.

In addition, as shown in FIG. 4B, when the reflectance characteristic of the standard body REF1 is ρ _S (λ), the standard body REF1 is irradiated with the excitation light L1 having the spectrum E ₀ (λ). The spectrum to be measured is set to E ⁽²⁾ (λ) = ρ _S (λ) E ₀ (λ). From this equation, the spectrum E ₀ (λ) of the excitation light L1 can be expressed as in Equation (1).

In addition, as shown in Fig. 4A, the component (photon) except for the spectrum R (λ) of the reflected light component reflected from the sample OBJ1 from the spectrum E ₀ (λ) of the excitation light L1 is sampled. Can be regarded as absorbed by (OBJ1).

Therefore, in order to convert the spectrum (radiation power) to the number of photons, when the spectrum is divided by hc / λ (h: flank constant, c: luminous flux), the number of photons absorbed by the sample OBJ1 is represented by Equation 2 It can be expressed as Moreover, k = 1 / hc.

In addition, the photon number Pph of fluorescence can be expressed as in Equation (3).

Therefore, the internal quantum efficiency QEin of the sample OBJ1 can be expressed as in Equation 4.

<Control structure>

Next, with reference to FIG. 5, the control structure in the arithmetic processing part 200 of the quantum efficiency measuring apparatus SYS1 which concerns on this embodiment is demonstrated.

As shown in FIG. 5, the arithmetic processing unit 200 has a control structure, and includes a switching unit 202, buffers 204 and 206, selection units SEL and 208 and 210, and a division unit 216. , 226, an initial setting holding unit 218, an addition subtraction unit 220, a multiplication unit 212 and 222, and an integration unit 214 and 224.

The switching unit 202 switches the storage destination of the output (detection spectrum) from the spectrometer 6 to either of the buffers 204 and 206 in accordance with a signal input in accordance with the mounting state to the sample window 2. do. That is, the switching unit 202 stores the spectrum E ⁽¹⁾ (λ) detected by the spectroscope 6 in the buffer 204 when the sample OBJ1 is mounted on the sample window 2. When the standard body REF1 is attached to the window 2, the spectrum E ⁽²⁾ (λ) detected by the spectroscope 6 is stored in the buffer 206.

The buffers 204 and 206 are memories for storing the spectra detected by the spectrometer 6 and have areas according to the wavelength resolution of the spectrometer 6. That is, when the spectrometer 6 outputs the spectrum which consists of a total of n wavelength of wavelength (lambda) 1, (lambda) 2, ..., (lambda) n, it has an area for storing the intensity | strength corresponding to n wavelengths.

Selectors 208 and 210 selectively read out the wavelength components of the spectrum stored in buffers 204 and 206, respectively. The selector 208 outputs, to the multiplier 222, the one included in the wavelength range λ _1L to λ _1H of the excitation light L1 among the wavelength components of the read spectrum E ⁽¹⁾ (λ). What is included in the wavelength range λ _2L to λ _2H of the fluorescent component generated from OBJ1) is output to the multiplier 212. The selector 208 also outputs the wavelength? Of the read wavelength component to the multipliers 212 and 222.

The multiplication unit 212 and the integrating unit 214 calculate the photon number Pph of fluorescence by performing the calculation corresponding to the above expression (3). Specifically, the multiplication unit 212 multiplies the wavelength λ itself by the wavelength component of the spectrum E ⁽¹⁾ (λ) read by the selection unit 208. The multiplier 212 then outputs the multiplied value to the integrator 214. The integrator 214 calculates the sum of the values output from the multiplier 212. As described above, since the wavelength component of the spectrum E ⁽¹⁾ (λ) corresponding to the wavelength range λ _2L to λ _2H of the fluorescent component is output to the multiplier 212, the multiplication unit 212 substantially corresponds to Equation 3 described above. The calculation is performed for each wavelength.

The divider 216, the adder / subtracter 220, the multiplier 222, and the integrator 224 calculate the number of photons Ab absorbed in the sample OBJ1 by performing calculations corresponding to Equation 2 described above. do. Specifically, the divider 216 sets the reflectance characteristic of the reference body REF1 stored in the initial setup holding unit 218 with the wavelength component of the spectrum E ⁽²⁾ (λ) read by the selector 210. Divide by the corresponding wavelength component in _S (λ). The division unit 216 then outputs the quotient E ⁽²⁾ (λ) / ρ _S (λ) to the addition and subtraction unit 220. The adder / subtracter 220 subtracts the quotient calculated by the divider 216 from the wavelength component of the spectrum E ⁽¹⁾ (λ) read by the selector 208. The addition and subtraction unit 220 outputs the calculated value to the multiplication unit 222. The multiplier 222 multiplies the wavelength λ corresponding to the value calculated by the adder / subtracter 220. The multiplier 222 outputs the multiplied value to the integrator 224. The integrator 224 calculates the sum of the values output from the multiplier 222. As described above, since the wavelength component of the spectrum E ⁽¹⁾ (λ) corresponding to the wavelength range λ _1L to λ _1H of the excitation light L1 is output to the multiplier 222, the above-described equation Calculations equivalent to two are performed for each wavelength.

The divider 226 divides the photon number Pph of fluorescence calculated by the integrator 214 by the photon number Ab absorbed by the sample OBJ1 calculated by the integrator 224. The division unit 226 then outputs the quotient Pph / Ab as the internal quantum efficiency QEin of the sample OBJ1.

<Processing procedure>

Next, with reference to FIG. 6, the processing procedure by the quantum efficiency measurement using the quantum efficiency measuring apparatus SYS1 which concerns on this embodiment is demonstrated.

The user prepares the quantum efficiency measuring device SYS1 (step S100). Subsequently, the user attaches the sample OBJ1 to the sample window 2 (step S102), starts the irradiation of the excitation light L1 from the light source 7 and the measurement by the spectroscope 6 (step S104). ). At this time, the user may input that the sample OBJ1 is mounted in the sample window 2 with respect to the arithmetic processing unit 200. Then, the calculation processing unit 200 stores the spectrum E ⁽¹⁾ (λ) measured by the spectroscope 6 (step S106).

Next, the user attaches the standard body REF1 to the sample window 2 (step S108), and starts the irradiation of the excitation light L1 from the light source 7 and the measurement by the spectroscope 6 (step) S110). At this time, the user may input that the standard body REF1 is attached to the sample window 2 with respect to the arithmetic processing part 200. Then, the calculation processing unit 200 stores the spectrum E ⁽²⁾ (λ) measured by the spectroscope 6 (step S112).

When the acquisition of the spectra E ⁽¹⁾ (λ) and E ⁽²⁾ (λ) is completed, the calculation processing unit 200 calculates the internal quantum efficiency QEin of the sample OBJ1 based on these spectra (step S114). . More specifically, the calculation processing unit 200 includes a wavelength component corresponding to the wavelength range λ _1L to λ _1H of the spectrum E ⁽¹⁾ (λ), a wavelength component of the spectrum E ⁽²⁾ (λ), and a standard body REF1. ) on the basis of the reflectance properties of the _S ρ (λ), and calculates the number of photons (Ab) absorbed in the sample (OBJ1). Further, the calculation processing unit 200 calculates the photon number Pph of fluorescence based on the wavelength component corresponding to the wavelength range λ _2L to λ _2H of the spectrum E ⁽¹⁾ (λ). In addition, the calculation processing unit 200 calculates the internal quantum efficiency QEin of the sample OBJ1 based on the photon number Ab and the photon number Pph.

In addition, the arithmetic processing unit 200 outputs the calculated internal quantum efficiency QEin of the sample OBJ1 (step S116). Examples of the output of the internal quantum efficiency QEin include display on the monitor of the internal quantum efficiency QEin, print output of the internal quantum efficiency QEin, storage of the internal quantum efficiency QEin, and the like. Can be mentioned.

In addition, in the flowchart shown in FIG. 6, the spectrum E ⁽¹⁾ ((lambda) ⁾ regarding the sample OBJ1 is acquired first as an example of a measurement procedure, and then the spectrum E ⁽²⁾ ((lambda) ⁾ regarding the standard body REF1. Although the case of acquiring is demonstrated, it is not limited to this procedure as long as spectrum E ⁽¹⁾ ((lambda)) and spectrum E ⁽²⁾ ((lambda)) can be acquired. For example, you may acquire the spectrum E ⁽²⁾ ((lambda) ⁾ about the standard body REF1, and then acquire the spectrum E ⁽¹⁾ ((lambda) ⁾ regarding the sample OBJ1. In this case, the plurality of samples OBJ1 is obtained by sequentially obtaining the spectra E ⁽¹⁾ (λ) for each of the plurality of samples OBJ1 using the spectra E ⁽²⁾ (λ) acquired with respect to the standard body REF1. The internal quantum efficiency (QEin) with respect to) can be calculated efficiently. That is, after attaching the standard body REF1 to the sample window 2 and acquiring the spectrum E ⁽²⁾ ((lambda)), what is necessary is just to mount several sample OBJ1 in the sample window 2 one by one.

<Effect by this embodiment>

According to this embodiment, since it is not necessary to provide the light shielding plate for suppressing incidence of direct light from a sample in a hemispherical integrator, generation of the measurement error by the light absorption of a light shielding plate can be suppressed. In addition, according to the present embodiment, in principle, twice as much light intensity can be obtained as compared with the case where the integrating sphere having the same radius is used by the virtual image generated by the planar mirror. Therefore, the quantum efficiency can be measured with higher precision.

In addition, according to this embodiment, since the light intensity of 2 times is obtained in principle, it is not necessary to make the radius of a hemispherical part excessively small in order to improve measurement accuracy. Therefore, since the opening area of the observation window can be made relatively small with respect to the surface area of the hemisphere integrator, the occurrence of measurement error by the observation window can be suppressed.

[First Modification of First Embodiment]

In the first embodiment described above, the positional relationship between the spectrometer 6 and the light source 7 is not particularly limited, but it is preferable to arrange them in the positional relationship shown in FIG. 7.

As shown in the plan view of the hemispherical integrator 100 of FIG. 7 viewed from the hemisphere unit 1 side, in the first modification of the first embodiment, the mounting portion 6a of the spectroscope 6 is a light source 7. It is arrange | positioned so that it may extend | stretch in the direction of the water line LN1 orthogonal to the optical axis Ax1 of the excitation light L1 radiated | emitted from the inside. By arranging the spectrometer 6 and the light source 7 in such a positional relationship, the excitation light L1 irradiated to the sample OBJ1 can be suppressed from directly entering the spectrometer 6.

Second Modified Example of First Embodiment

In the quantum efficiency measuring apparatus SYS1 according to the above-described first embodiment, it is preferable to arrange the light transmitting diffusion member on the propagation path of the light of the observation window 3. Hereinafter, with reference to FIG. 8, the quantum efficiency measuring apparatus SYS1A which concerns on the 2nd modified example of this embodiment is demonstrated.

In the quantum efficiency measuring device SYS1A shown in FIG. 8, in the quantum efficiency measuring device SYS1 according to the first embodiment shown in FIG. 3, the light transmitting diffusion member 14 is added to the observation window 3. will be. That is, the light transmitting diffusion member 14 is disposed between the inside of the hemisphere 1 and the spectrometer 6. Since it is the same as that of FIG. 3 about the structure other than that, detailed description is not repeated.

The light transmitting diffusion member 14 diffuses the light flux in the hemispherical integrator 100 and then guides the light to the spectrometer 6. Therefore, even when the observation field of the observation window 3 is comparatively narrow, the influence of the reflectance variation etc. in the light-diffusion reflection layer 1a provided in the inner surface of the hemispherical part 1 can be reduced. In other words, when the light transmitting diffusion member 14 does not exist, only the illuminance of the portion of the inner surface of the hemisphere 1 corresponding to the viewing field is observed in the observation window 3. Therefore, if there exists a deviation of reflectance etc. in the part corresponding to an observation visual field, it will be easy to be influenced also in a measurement result. On the other hand, in the case where the light transmitting diffusing member 14 is present, since the light flux existing around the observation window 3 is diffused, it is guided to the spectrometer 6, so that the above problems can be avoided.

Second Embodiment

In 1st Embodiment mentioned above, the quantum efficiency measuring apparatus SYS1 with which a sample is attached to the sample window provided in the plane mirror was illustrated. In addition, in 2nd Embodiment, the structure by which a sample is attached to the sample window provided in the hemisphere part is illustrated.

Since the external appearance of the quantum efficiency measuring apparatus SYS2 which concerns on 2nd Embodiment of this invention is the same as that of FIG. 2 mentioned above, detailed description is not repeated. With reference to FIG. 9, the hemispherical integrator of the quantum efficiency measuring device SYS2 includes a hemispherical part 1A, a disk-shaped flat mirror 5A and a hemispherical part 1A arranged to block the opening of the hemispherical part 1A. It further includes a spectroscope 6 for measuring illuminance (light spectrum) of the inner wall surface of the light source, and a light source 7 for generating excitation light L1.

The hemisphere 1A is the same as the hemisphere 1 shown in FIG. 3 except that the sample window 9 for mounting the sample OBJ1 and the reference body REF1 is provided. The sample window 9 is provided at the position of the intersection point of the normal line N2 of the planar mirror 5A passing through the substantial center of curvature O of the hemispherical part 1A. That is, the sample window 9 is provided at the apex position of the hemisphere surrounded by the hemisphere 1A and the planar mirror 5A. In addition, about the sample OBJ1 and the standard body REF1, it is the same as that of 1st Embodiment mentioned above, and detailed description is not repeated.

The planar mirror 5A is provided with a light source window 10 and an observation window 13 capable of communicating between the inner surface side and the outer surface side of the hemisphere 1A.

The light source window 10 is provided near the substantial center of curvature O of the hemisphere 1A. More specifically, the light source window 10 is provided at a position where the excitation light L1 is irradiated toward the sample window 9 at an angle θ with respect to the normal line N2 of the planar mirror 5. That is, the light source 7 includes the sample OBJ1 mounted on the sample window 9 along the optical axis Ax2 having the excitation light L1 at an angle θ with respect to the normal line N2 of the planar mirror 5A, or Irradiated toward the standard body REF1.

The observation window 13 is an opening for observing the illuminance of the inner surface of the hemispherical portion 1A and is provided at a position spaced apart from the light source window 10 by a predetermined distance to the outer peripheral side. Then, light is guided to the spectrometer 6 through the observation window 13. The observation window 13 restricts the fluorescence generated by the sample OBJ1 in response to the excitation light L1 and the excitation light L1 reflected from the sample OBJ1 directly entering the spectrometer 6. More specifically, the observation window 13 is a kind of aperture, and is an opening configured to increase the diameter of the outer side of the hemisphere 1A as compared with the diameter of the inner side of the hemisphere 1A. By providing the observation window 13 which restricts such an observation field, the quantum efficiency can be measured with higher accuracy without arranging the light shielding plate 304 as shown in FIG. 1.

Since the other parts of the planar mirror 5A are the same as the planar mirror 5 shown in FIG. 3, detailed description is not repeated. In addition, since the spectrometer 6 and the light source 7 were mentioned above, detailed description is not repeated. In addition, it is preferable to arrange | position both about the spectroscope 6 and the light source 7 by the positional relationship shown in FIG. 7 mentioned above.

Moreover, the control structure in the arithmetic processing part 200 of the quantum efficiency measuring apparatus SYS2 which concerns on this embodiment, and the processing procedure by the quantum efficiency measurement which used the quantum efficiency measuring apparatus SYS2 which concerns on this embodiment are shown. Since the flowcharts are the same as in Figs. 5 and 6, respectively, detailed description will not be repeated.

<Effect by this embodiment>

According to this embodiment, it is not necessary to provide a light shielding plate for suppressing the incidence of direct light from a sample in the hemisphere integrator by employing an observation window with a limited viewing field. Therefore, generation | occurrence | production of the measurement error by the light absorption of a light shielding plate can be suppressed. In addition, according to the present embodiment, in principle, twice the light intensity can be obtained compared to the case of using the integrating sphere having the same radius by the virtual image generated by the planar mirror. Therefore, sufficient brightness can be obtained even if the observation field of the observation window is limited.

Therefore, the quantum efficiency can be measured with higher precision.

[Third Embodiment]

In 1st Embodiment and 2nd Embodiment mentioned above, the structure suitable for the measurement of the quantum efficiency of the sample of a solid state mainly was illustrated. In addition, in 3rd Embodiment, the structure suitable for the measurement of the quantum efficiency of the sample of a liquid state is illustrated.

<Related Technology>

First, in order to make understanding of the quantum efficiency measuring apparatus according to the present embodiment easier, first, the quantum efficiency measuring apparatus according to the present embodiment will be described with reference to FIG. 10.

The quantum efficiency measuring apparatus 350 according to the present embodiment shown in FIG. 10 mainly measures the quantum efficiency of the sample OBJ in the liquid state. Specifically, the quantum efficiency measuring apparatus 350 includes an integrating sphere 352, a supporting portion 354, a light shielding plate 358, a light receiving portion 360, an optical fiber 362, and a spectroscopic measuring device 364. ). In this quantum efficiency measuring apparatus 350, the transparent container 356 which enclosed the sample is suspended in the integrating sphere 352 by the support part 354, and the outside of the integrating sphere 352 with respect to this sample OBJ. The excitation light 370 is irradiated through a light source window 366 from a light source (not shown) provided in the. The sample OBJ receives this excitation light 370 and emits fluorescent light. The fluorescence emitted from the sample OBJ is multi-reflected on the inner surface of the integrating sphere 352 and integrated (uniformized). The light receiver 360 extracts a part of the light of the integrating sphere 352 through the observation window 368 installed in the integrating sphere 352 and guides the light to the spectroscopic measuring device 364 through the optical fiber 362.

Here, since the fluorescence generated from the sample OBJ and the excitation light 370 reflected from the sample OBJ are directly incident on the observation window 368, the measurement error becomes a measurement error, and thus, between the transparent container 356 and the observation window 368. A light shielding plate 358 is installed in this.

As described above, since the support part 354 and the light shield plate 358 absorb fluorescence or the like, in the quantum efficiency measuring apparatus 350, the support part 354 and the light shield plate 358 serve as measurement errors as internal structures.

<Device configuration>

Next, the quantum efficiency measuring apparatus SYS3 according to the present embodiment will be described.

Since the external appearance of the quantum efficiency measuring apparatus SYS3 which concerns on 3rd Embodiment of this invention is the same as that of FIG. 2 mentioned above, detailed description is not repeated. Referring to FIG. 11, the hemispherical integrator of the quantum efficiency measuring device SYS3 includes a hemispherical part 1A, a disk-shaped planar mirror 5B arranged to block an opening of the hemispherical part 1A, and a hemispherical part 1A. It further includes a spectroscope 6 for measuring the illuminance (light spectrum) of the inner wall surface of the () and a light source 7 for generating the excitation light L1.

The hemispherical part 1A is basically the same as the hemispherical part 1A shown in FIG. 9, but the point that the sample OBJ2 in the liquid state enclosed in the transparent cell 16 is mounted, not the sample OBJ1. different. The hemispherical section 1A can also be equipped with a standard body REF2 corresponding to the sample OBJ2. The standard body REF2 is typically an object in which the same amount of the reference substance (typically, only the medium excluding the fluorescent substance in the sample) and the sample OBJ2 are enclosed in the same transparent cell 16. In this standard REF2, it can be considered that there is substantially no fluorescent light emission.

The planar mirror 5B is provided with a light source window 12 and an observation window 13 capable of communicating between the inner surface side and the outer surface side of the hemisphere 1A.

The light source window 12 is provided at the position of substantially the center of curvature O of the hemisphere 1A. In other words, the light source window 12 is formed in a region including the substantial center of curvature O of the hemisphere 1A. The light source 7 includes a sample OBJ2 or a standard body, in which the excitation light L1 is attached to the sample window 9 along the optical axis Ax3 coinciding with the normal of the plane mirror 5B through the light source window 12. REF2).

The observation window 13 is an opening for observing the illuminance of the inner surface of the hemispherical part 1A and is provided at a position spaced apart from the light source window 12 by a predetermined distance on the outer circumferential side. Then, light is guided to the spectrometer 6 through the observation window 13. The observation window 13 receives the excitation light L1 and restricts the fluorescence generated in the sample OBJ2 and the excitation light L1 reflected from the sample OBJ2 directly entering the spectrometer 6. More specifically, the observation window 13 is a kind of aperture, and is an opening configured to increase the diameter of the outer side of the hemisphere 1A as compared with the diameter of the inner side of the hemisphere 1A. By providing the observation window 13 which restricts such an observation field, the quantum efficiency can be measured with higher accuracy without arranging the light shielding plate 358 as shown in FIG.

Since the other parts of the planar mirror 5B are the same as the planar mirror 5 shown in FIG. 3, detailed description is not repeated. In addition, since the spectrometer 6 and the light source 7 were also mentioned above, detailed description is not repeated.

The transparent cell 16 is a cylindrical container composed of a material having a light transmissive wall surface. The transparent cell 16 is disposed on the optical axis Ax3 of the light source 7 by being attached to the sample window 9. That is, the excitation light L1 is irradiated along the optical axis Ax3 with respect to the sample OBJ2 enclosed in the transparent cell 16. In addition, when the transparent cell 16 is attached to the sample window 9, the whole is accommodated in 1 A of hemispheres. At this time, the sealing member 15 is attached to the outermost part of the transparent cell 16. This sealing member 15 prevents the excitation light L1 after passing through the transparent cell 16 and the sample OBJ2 therein from leaking from the hemisphere 1A. Therefore, the sealing member 15 is provided with the light-diffusion reflection layer of the same grade as the light-diffusion reflection layer 1a of 1 A of hemispherical part at least in the surface which contact | connects the transparent cell 16. As shown in FIG.

Measurement principle

Next, the measuring principle in the quantum efficiency measuring apparatus SYS3 according to the present embodiment will be described.

As shown in FIG. 11, when the excitation light L1 is irradiated onto a sample OBJ2, which is typically a phosphor, a portion (photon) thereof is absorbed and used for fluorescence emission, while the remaining excitation light L1 is After passing through the sample OBJ2, it is scattered and reflected by the sealing member 15 or the like. Here, the wavelength range of the excitation light L1 is λ _1L to λ _1H , and the wavelength range of the fluorescent component generated from the sample OBJ2 is λ _2L to λ _2H .

The spectrum of the excitation light L1 is set to E ₀ (λ). In addition, the spectrum of the fluorescent component generated from the sample OBJ2 by irradiating the excitation light L1 is P (λ), and the spectrum of the transmitted light component scattered and reflected after passing through the sample OBJ2 is T (λ). . That is, the spectrum P (λ) of the fluorescent component has a wavelength range (λ _2L to λ _2H ) corresponding to the fluorescence of the spectrum E ⁽¹⁾ (λ) measured by the spectroscope 6 when the sample OBJ2 is mounted. The spectrum T (λ) of the transmitted light component corresponds to the component in the wavelength range λ _1L to λ _1H corresponding to the excitation light L1 of the spectrum E ⁽¹⁾ (λ).

In addition, the spectrum E ⁽²⁾ ((lambda) ⁾ measured by the spectroscope 6 when the standard body REF2 is attached is corresponded to the radiation power which can be used for the fluorescent emission irradiated to the standard body REF2.

Therefore, in order to convert the spectrum (radiation power) to the number of photons, if the spectrum is divided by hc / λ (h: flank constant, c: luminous flux), the number of photons absorbed by the sample OBJ2 is expressed by Equation 5 It can be expressed as Moreover, k = 1 / hc.

In addition, the photon number Pph of fluorescence can be expressed as in Equation (6).

Therefore, the internal quantum efficiency QEin of the sample OBJ2 can be expressed by Equation 7.

<Control structure>

Next, with reference to FIG. 12, the control structure in 200 A of arithmetic processing units of the quantum efficiency measuring apparatus SYS3 which concerns on this embodiment is demonstrated.

The operation processing unit 200A shown in FIG. 12 removes the division unit 216 and the initial setting holding unit 218 in the control structure of the operation processing unit 200 according to the first embodiment shown in FIG. 5. The wavelength component of the spectrum E ⁽²⁾ (λ) read by the selection unit 210 is output to the addition / subtraction unit 220. That is, according to Equation 5 described above, the number of photons absorbed by the sample OBJ2 is calculated.

Other parts are the same as those of the arithmetic processing unit 200 shown in FIG. 5, and thus detailed description thereof will not be repeated.

<Processing procedure>

Since the flowchart showing the processing procedure according to the quantum efficiency measurement using the quantum efficiency measuring device SYS3 according to the present embodiment is the same as in FIG. 6 except for the calculation formula for the photon number Ab, detailed description is not repeated. .

<Effect by this embodiment>

According to this embodiment, it is not necessary to provide the light shielding plate in the hemispherical integrator to suppress the incidence of the direct light from the sample by employing the observation window with limited observation field. Therefore, generation | occurrence | production of the measurement error by the light absorption of a light shielding plate can be suppressed. In addition, according to the present embodiment, in principle, twice as much light intensity can be obtained as compared with the case where the integrating sphere having the same radius is used by the virtual image generated by the planar mirror. Therefore, sufficient brightness can be obtained even if the observation field of the observation window is limited.

Therefore, the quantum efficiency can be measured with higher precision.

[First Modification of Third Embodiment]

In 3rd Embodiment mentioned above, the structure which irradiates the excitation light L1 toward the sample mounted in the hemispherical part 1 from the light source window 12 provided in the hemispherical part 1 was illustrated. In contrast, the light source and the sample may be arranged in close proximity. Hereinafter, with reference to FIG. 13, the quantum efficiency measuring apparatus SYS3A which concerns on the 1st modified example of this embodiment is demonstrated.

In the quantum efficiency measuring device SYS3A shown in FIG. 13, in the quantum efficiency measuring device SYS3 according to the third embodiment shown in FIG. 11, the sample OBJ2 in a liquid state is sealed in the light source window 12. It corresponds to attaching the transparent cell 16A and the light source 7 which were provided, and attaching only the sealing member 15 to the sample window 9 further.

The transparent cell 16A is a cylindrical container made of a material having a light transmissive whole. This transparent cell 16A is mounted on the optical axis Ax3 of the light source 7 by being mounted in contact with the irradiation port of the light source 7. The light source 7 is a sample OBJ2 (or a standard body) mounted on the light source window 12 along the optical axis Ax3 coinciding with the normal of the planar mirror 5B through the light source window 12. (REF2). Thereby, the excitation light L1 is irradiated along the optical axis Ax3 with respect to the sample OBJ2 enclosed in the transparent cell 16A. In addition, when the transparent cell 16A is attached to the light source window 12, the whole is accommodated in the hemisphere 1A.

Except for the positional relationship between the transparent cell 16A and the light source 7, the configuration other than that is the same as in FIG.

In addition, a control structure in the arithmetic processing unit of the quantum efficiency measuring apparatus SYS3A according to the first modification, and the processing procedure according to the quantum efficiency measurement using the quantum efficiency measuring apparatus SYS3A according to the first modification About the flowchart shown, it is the same as that of FIG. 12 and FIG. 6, respectively, and detailed description is not repeated.

According to the first modification, since the distance between the light source and the sample can be made shorter, stronger excitation light can be irradiated to the sample. Therefore, since the intensity of the fluorescence generated from the sample can be made stronger, the quantum efficiency can be measured with higher accuracy.

Second Modification of Third Embodiment

In 3rd Embodiment mentioned above, the structure which the whole of the transparent cell which enclosed the sample was accommodated in the hemisphere part was illustrated. However, if the excitation light can be irradiated to the transparent cell (sample), the entire transparent cell containing the sample may not be stored in the hemisphere. Hereinafter, with reference to FIG. 14, the quantum efficiency measuring apparatus SYS3B which concerns on the 2nd modified example of this embodiment is demonstrated.

In the quantum efficiency measuring device SYS3 according to the third embodiment shown in FIG. 11, the quantum efficiency measuring device SYS3B shown in FIG. 14 substantially takes the shape of the transparent cell mounted on the sample window 9. It is equivalent to change. 14, in the quantum efficiency measuring apparatus SYS3B, it is preferable to arrange | position so that the sample window 9 may be located under gravity.

More specifically, the transparent window 16B and the sealing member 15A in which the sample OBJ2 in the liquid state is sealed are attached to the sample window 9 of the quantum efficiency measuring device SYS3B. The transparent cell 16B is basically a cylindrical container made of a material having a light transmissive whole. This transparent cell 16B is disposed on the optical axis Ax3 of the light source 7 by being attached to the sample window 9. That is, the excitation light L1 is irradiated along the optical axis Ax3 with respect to the sample OBJ2 enclosed in the transparent cell 16B. At this time, the cylindrical seal member 15A is mounted on a surface other than the surface on which the excitation light L1 of the transparent cell 16B is incident. This sealing member 15A prevents the excitation light L1 after passing through the transparent cell 16B and the sample OBJ2 therein from leaking from the hemisphere 1A. Therefore, as for the sealing member 15A, the light-diffusion reflection layer of the same grade as the light-diffusion reflection layer 1a of 1A of hemispheres is provided in the inner peripheral surface.

Except for the configuration of the transparent cell 16B and the seal member 15A described above, other configurations are the same as those in FIG. 11, and thus, detailed description thereof will not be repeated.

In addition, the control structure in the arithmetic processing part of the quantum efficiency measuring apparatus SYS3B which concerns on this 2nd modification, and the processing procedure by the quantum efficiency measurement which used the quantum efficiency measuring apparatus SYS3B which concerns on this 2nd modification About the flowchart shown, it is the same as that of FIG. 12 and FIG. 6, respectively, and detailed description is not repeated.

According to the second modification, it is not necessary to store the sample and the standard body in the hemispherical integrator, so that the sample and the standard body can be attached in a shorter time. Therefore, a measurement can be performed more efficiently.

[4th Embodiment]

A hemispherical integrator as shown in FIG. 15 may be employed as a configuration for realizing the configuration of the quantum efficiency measuring apparatus described in the second embodiment, the third embodiment, and the modifications described above as necessary. .

With reference to FIG. 15, the hemispherical integrator of the quantum efficiency measuring apparatus which concerns on 4th Embodiment of this invention is a disk-shaped planar mirror 5C arrange | positioned so that the opening of the hemispherical part 1A and the hemispherical part 1A may be closed. ). The planar mirror 5C is provided with light source windows 10 and 12 and an observation window 13 which can communicate between the inner surface side and the outer surface side of the hemisphere 1A. The light source window 10 is for realizing the quantum efficiency measuring apparatus SYS2 according to the second embodiment shown in FIG. 9. The light source window 12 is for realizing the quantum efficiency measuring apparatus SYS3, SYS3A, SYS3B which concerns on 3rd Embodiment shown in FIG. 11, FIG. 13 and FIG. 14 and its modification.

Of these light source windows 10 and 12 and the observation window 13, a sample OBJ2, a light source, or the like is mounted as necessary, and corresponding seal members are attached to windows that are not used, thereby measuring the quantum efficiency described above. It is possible to realize what the user wants among the devices.

According to the present embodiment, the quantum efficiency can be measured with a device configuration desired by a user using a common hemisphere integrator.

[Other Embodiments]

The reflectance characteristic of a sample can also be measured using the quantum efficiency measuring apparatus mentioned above.

It should be thought that embodiment disclosed this time is an illustration and restrictive at no points. The scope of the present invention is shown not by the above description but by the claims, and is intended to include all modifications within the meaning and range equivalent to the claims.

Claims (10)

A hemispherical portion 1 having a light diffusion reflecting layer 1a on an inner surface thereof, Having a planar mirror 5 arranged to pass through a substantially center of curvature of the hemisphere, and to block an opening of the hemisphere, wherein the planar mirror is installed at a position of a substantial center of curvature of the hemisphere, and mounts a measurement object. And a second window 3 installed at a position spaced apart from the first window by a predetermined distance, A spectrometer 6 for measuring a spectrum in the hemisphere through the second window; A light source 7 for irradiating excitation light toward the first window at a predetermined angle with respect to the normal of the planar mirror through a third window provided in the hemisphere; The first spectrum measured by the spectrometer when the measurement object is placed in the first window, and the spectrometer when the standard body having a known reflectance characteristic is placed in the first window instead of the measurement object. A quantum efficiency measuring device, comprising a calculation processing unit (200) for calculating the quantum efficiency of the measurement target based on the measured second spectrum. The quantum efficiency measuring apparatus according to claim 1, wherein the first window is configured to be mountable such that the exposed surface of the measured object substantially coincides with a surface inside the hemisphere of the planar mirror. The quantum efficiency measuring device according to claim 1, wherein the second window includes a light transmitting diffusion member (14) disposed between the inside of the hemisphere and the spectrometer. 1A of hemispheres which have a light-diffusion reflection layer 1a in an inner surface, A planar mirror 5A, 5B, 5C arranged to pass through a substantially center of curvature of the hemisphere, and to block an opening of the hemisphere, wherein the planar mirror is a first installed near the center of substantial curvature of the hemisphere. Windows 10 and 12, and a second window 13 provided at a position spaced apart from the first window by a predetermined distance, A light source 7 for irradiating excitation light through the first window toward a measurement object disposed by exposing at least a portion thereof in the hemisphere; A spectroscope 6 for measuring the spectra in the hemisphere through the second window, wherein the second window restricts light from the object to be directly incident on the spectrometer, The spectrometer being measured when the measurement object is placed in the hemisphere and a standard having a known reflectance or transmittance characteristic instead of the measurement object in the hemisphere. A quantum efficiency measuring device, comprising arithmetic processing unit (200, 200A) for calculating the quantum efficiency of the measurement target based on the second spectrum measured by the second spectrum. The quantum efficiency measuring device according to claim 4, wherein the second window is an opening having a larger diameter on the outer side of the hemisphere than the diameter on the inner side of the hemisphere. The said hemispherical part is provided in the position of the intersection with the normal line of the said planar mirror passing through the substantially center of curvature of the said hemisphere, and further includes the 3rd window for mounting the said measurement object and the said standard body, , The light source is disposed so that the excitation light is irradiated toward the third window at a predetermined angle with respect to the normal of the plane mirror. The quantum efficiency measuring device according to claim 4, wherein the measurement object is a liquid enclosed in a light transmitting container and is disposed on an optical axis of the light source. The quantum efficiency measuring apparatus according to claim 7, wherein the measurement object is entirely contained in the hemisphere. The said hemispherical part is provided in the position of the intersection with the normal of the said planar mirror passing through the substantially center of curvature of the said hemisphere, Comprising: The 3rd window for mounting the said measurement object and the said standard body, The first window is provided at a position of a substantially center of curvature of the hemisphere on the plane mirror, The object to be measured is a liquid enclosed in a cylindrical container, and a surface mounted on the third window of the cylindrical container is made of a light-transmitting material, and the other part is made of a member having light reflectivity. Efficiency measuring device. A step (S100) of preparing a device including a hemisphere having a light-diffusing reflective layer on its inner surface, a planar mirror disposed through the substantially center of curvature of the hemisphere and blocking the opening of the hemisphere; (S102) mounting a measurement object on a first window provided at a position including a substantial center of curvature of the hemisphere of the planar mirror; Step (S104) of irradiating excitation light toward the measurement object at a predetermined angle with respect to the normal of the planar mirror through a third window provided in the hemisphere; Step (S106) of measuring the spectrum in the hemisphere when the measurement object is mounted as a first spectrum through a second window provided at a position spaced apart from the first window of the planar mirror by a predetermined distance; Attaching a standard body having a known reflectance characteristic to the first window (S108); Step (S110) of irradiating the excitation light toward the standard body at the predetermined angle with respect to the normal of the plane mirror through the third window; Step (S112) of measuring the spectrum in the hemisphere when the standard body is mounted as the second spectrum through the second window; And a step (S114) of calculating the quantum efficiency of the measurement object based on the first spectrum and the second spectrum.

Images