TWI596126B - Block copolymer - Google Patents

Block copolymer Download PDF

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Publication number
TWI596126B
TWI596126B TW103142786A TW103142786A TWI596126B TW I596126 B TWI596126 B TW I596126B TW 103142786 A TW103142786 A TW 103142786A TW 103142786 A TW103142786 A TW 103142786A TW I596126 B TWI596126 B TW I596126B
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Taiwan
Prior art keywords
block
block copolymer
chain
less
polymer layer
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TW103142786A
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Chinese (zh)
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TW201538549A (en
Inventor
李政圭
姜妍朱
金廷根
吳誠濬
李濟權
尹聖琇
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Lg化學股份有限公司
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    • C08F293/00Macromolecular compounds obtained by polymerisation on to a macromolecule having groups capable of inducing the formation of new polymer chains bound exclusively at one or both ends of the starting macromolecule
    • C08F293/005Macromolecular compounds obtained by polymerisation on to a macromolecule having groups capable of inducing the formation of new polymer chains bound exclusively at one or both ends of the starting macromolecule using free radical "living" or "controlled" polymerisation, e.g. using a complexing agent
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    • C07C217/82Compounds containing amino and etherified hydroxy groups bound to the same carbon skeleton having amino groups and etherified hydroxy groups bound to carbon atoms of six-membered aromatic rings of the same carbon skeleton having amino groups and etherified hydroxy groups bound to carbon atoms of non-condensed six-membered aromatic rings of the same non-condensed six-membered aromatic ring
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    • C08F12/02Monomers containing only one unsaturated aliphatic radical
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    • C08F212/02Monomers containing only one unsaturated aliphatic radical
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    • C08F212/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring
    • C08F212/02Monomers containing only one unsaturated aliphatic radical
    • C08F212/04Monomers containing only one unsaturated aliphatic radical containing one ring
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    • C08F212/02Monomers containing only one unsaturated aliphatic radical
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    • C08F212/02Monomers containing only one unsaturated aliphatic radical
    • C08F212/04Monomers containing only one unsaturated aliphatic radical containing one ring
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    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
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    • C09D153/00Coating compositions based on block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Coating compositions based on derivatives of such polymers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
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    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
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    • G03F7/004Photosensitive materials
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    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
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    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00388Etch mask forming
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    • B81MICROSTRUCTURAL TECHNOLOGY
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    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00436Shaping materials, i.e. techniques for structuring the substrate or the layers on the substrate
    • B81C1/00523Etching material
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2201/00Manufacture or treatment of microstructural devices or systems
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    • B81C2201/0101Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
    • B81C2201/0147Film patterning
    • B81C2201/0149Forming nanoscale microstructures using auto-arranging or self-assembling material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
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    • C07C2601/00Systems containing only non-condensed rings
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    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
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    • C08F220/10Esters
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    • C08J2353/00Characterised by the use of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Derivatives of such polymers

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Description

嵌段共聚物 Block copolymer

本申請案係關於嵌段共聚物及其應用。 This application relates to block copolymers and their use.

嵌段共聚物具有化學結構彼此不同之聚合物子單元係藉由共價鍵彼此鍵聯的分子結構。嵌段共聚物能經由相分離而形成週期性對準結構,諸如球體、圓柱體或片層。藉由嵌段共聚物之自組合所形成的結構之域的大小可在廣範圍內調整,且可製備各種結構之形狀。因此,彼等可用於藉由微影術之圖案形成方法、各種磁性記錄媒體或下一代奈米裝置,諸如金屬點、量子點或奈米線、高密度磁性儲存媒體等。 The block copolymer has a molecular structure in which polymer subunits having different chemical structures are bonded to each other by covalent bonds. The block copolymer can form a periodic alignment structure, such as a sphere, cylinder or sheet, via phase separation. The size of the domains formed by the self-combination of the block copolymers can be adjusted over a wide range, and the shapes of various structures can be prepared. Thus, they can be used in patterning methods by lithography, various magnetic recording media or next generation nanodevices such as metal dots, quantum dots or nanowires, high density magnetic storage media, and the like.

本申請案提供一種嵌段共聚物、包括該嵌段共聚物之聚合物層、形成該聚合物層之方法及圖案形成方法。 The present application provides a block copolymer, a polymer layer including the block copolymer, a method of forming the polymer layer, and a pattern forming method.

該嵌段共聚物可包括第一嵌段及與該第一嵌段不同之第二嵌段。該第一或第二嵌段可包括如下述之側鏈。下文,在第一及第二嵌段當中之一種嵌段包括側鏈的情況下,該包括側鏈之嵌段可稱為第一嵌段。該嵌段共聚物可為只包括上述第一及第二嵌段之雙嵌段共聚物,或可為包括除了該第一及該第二嵌段以外的額外嵌段。 The block copolymer can include a first block and a second block that is different from the first block. The first or second block may comprise a side chain as described below. Hereinafter, in the case where one of the first and second blocks includes a side chain, the block including the side chain may be referred to as a first block. The block copolymer may be a diblock copolymer comprising only the first and second blocks described above, or may comprise additional blocks in addition to the first and second blocks.

該等嵌段共聚物可經相分離,因其包含二或多個經由共價鍵彼此鍵聯的聚合鏈。在本申請案中,因該嵌段共聚物滿足如下述至少一個參數,該相分離可非常有效地發生,且因此其可藉由微相分離而形成奈米級之結構。根據本申請案,藉由控制尺寸(諸如分子量)或嵌段之間的相對比,可自由地調整該奈米結構之大小及形狀。藉由上述,該嵌段共聚物可自由形成各種大小之相分離結構,諸如球體、圓柱體、螺旋二十四面體、片層及倒置結構等。本發明人已發現,若嵌段共聚物滿足下述參數當中至少一個參數,則上述之自組合性質及相分離性質獲得大幅改善。確認可藉由使該嵌段共聚物滿足適當參數而使其顯示垂直對準性質。本文所使用之用語「垂直對準性質」可指嵌段共聚物之對準性質及可指藉由嵌段共聚物所形成之奈米級結構係垂直對準基板之方向的情況。控制使嵌段共聚物之自組合結構相對於各種不同基板垂直或平行對準的技術為嵌段共聚物之實際應用的一大部分。以往,在嵌 段共聚物層中之奈米級結構的對準方向取決於形成該嵌段共聚物之嵌段當中哪一嵌段曝露於表面或空氣。通常,因很多基板為極性且空氣為非極性,嵌段共聚物中極性比其他嵌段大之嵌段濕潤該基板,而該嵌段共聚物中極性比其他嵌段小之嵌段濕潤介於空氣間之界面。提出許多技術以使嵌段共聚物之具有不同彼此性質的嵌段同時濕潤該基板,且最典型方法係藉由製備中性表面來控制對準。然而,在一實施態樣中,藉由控制下述參數,嵌段共聚物可相對於未進行用以完成垂直對準之習知處理(包括中性表面處理)的基板垂直對準。例如,根據本申請案一實施態樣之嵌段共聚物可顯示在未進行任何前置處理之疏水性表面及親水性表面二者上的垂直對準性質。此外,在額外實施態樣中,垂直對準藉由熱退火在短時間內達成相對於大區域之垂直對準。 The block copolymers may be phase separated as they comprise two or more polymeric chains bonded to each other via a covalent bond. In the present application, since the block copolymer satisfies at least one of the following parameters, the phase separation can occur very efficiently, and thus it can form a nano-scale structure by microphase separation. According to the present application, the size and shape of the nanostructure can be freely adjusted by controlling the size (such as molecular weight) or the relative ratio between the blocks. By the above, the block copolymer can freely form phase-separated structures of various sizes, such as spheres, cylinders, spiral tetrahedrons, sheets, and inverted structures. The inventors have found that if the block copolymer satisfies at least one of the following parameters, the above self-combination properties and phase separation properties are greatly improved. It was confirmed that the block copolymer was allowed to exhibit vertical alignment properties by satisfying appropriate parameters. As used herein, the term "vertical alignment property" may refer to the alignment properties of a block copolymer and may refer to the direction in which the nanoscale structure formed by the block copolymer is vertically aligned with the substrate. The technique of controlling the vertical or parallel alignment of the self-assembled structure of the block copolymer relative to a variety of different substrates is a large part of the practical application of block copolymers. In the past, embedded The alignment direction of the nanoscale structure in the segment copolymer layer depends on which of the blocks forming the block copolymer is exposed to the surface or air. Generally, since many substrates are polar and the air is non-polar, the block copolymer has a polarity greater than that of the other blocks, and the block is wetted by the block which is less polar than the other blocks. The interface between the air. A number of techniques have been proposed to simultaneously wet the substrate of blocks of different properties of the block copolymer, and the most typical method is to control alignment by preparing a neutral surface. However, in one embodiment, the block copolymer can be vertically aligned with respect to a substrate that is not subjected to conventional processing for performing vertical alignment, including neutral surface treatment, by controlling the following parameters. For example, a block copolymer according to an embodiment of the present application can exhibit vertical alignment properties on both a hydrophobic surface and a hydrophilic surface without any pretreatment. Moreover, in an additional embodiment, vertical alignment achieves vertical alignment with respect to a large area in a short time by thermal annealing.

在一實施態樣中,介於第一及第二嵌段的表面能之間的差異之絕對值可為10mN/m或更小,9mN/m或更小,8mN/m或更小,7.5mN/m或更小或7mN/m或更小。表面能之間的差異之絕對值可為1.5mN/m或更大,2mN/m或更大或2.5mN/m或更大。表面能之間的差異之絕對值在上述範圍內的第一及第二嵌段係經由共價鍵鍵聯之結構可藉由因適當不相容性所造成的相分離而實現有效微相分離。前文中,第一嵌段可為具有如上述之鏈的嵌段或包含如上述不具有鹵素原子的芳族結構。 In an embodiment, the absolute value of the difference between the surface energies of the first and second blocks may be 10 mN/m or less, 9 mN/m or less, 8 mN/m or less, 7.5. mN/m or less or 7 mN/m or less. The absolute value of the difference between the surface energies may be 1.5 mN/m or more, 2 mN/m or more or 2.5 mN/m or more. The first and second blocks in which the absolute value of the difference in surface energy is within the above range are linked by covalent bonding, and the effective microphase separation can be achieved by phase separation due to appropriate incompatibility. . In the foregoing, the first block may be a block having a chain as described above or an aromatic structure having no halogen atom as described above.

表面能係使用液滴形狀分析儀(KRUSS,Co. 所製造之DSA100產品)測量。具體而言,表面能可針對將藉由將待測量之樣本(嵌段共聚物或同元聚合物)在氟苯中稀釋至固體含量為約2重量%所製備之塗覆溶液塗覆於基板上,使該塗層的厚度為50nm且塗覆面積為4cm2(寬度:2cm,長度:2cm);在室溫下乾燥該塗層約1小時;然後在160℃下進行熱退火約1小時所製備之層測量。在該層進行熱退火之後,使已知表面張力之去離子水滴落,然後測量接觸角。上述用於獲得去離子水之接觸角的程序係重複5次,且計算這5個所獲得之接觸角的平均值。同樣地,在該層進行熱退火之後,使已知表面張力之二碘甲烷滴落,然後測量接觸角。上述用於獲得二碘甲烷之接觸角的程序係重複5次,且計算這5個所獲得之接觸角的平均值。之後,表面能可經由Owens-Wendt-Rabel-Kaelble法代入關於該溶劑表面張力的值(Strom值)並使用所獲得之去離子水及二碘甲烷的接觸角平均值而獲得。該嵌段共聚物中各嵌段之表面能可藉由上述方法針對由形成對應嵌段之單體所製備的同元聚合物而獲得。 The surface energy was measured using a droplet shape analyzer (DSA100 product manufactured by KRUSS, Co.). Specifically, the surface energy can be applied to the substrate by a coating solution prepared by diluting a sample (block copolymer or homopolymer) to be measured in fluorobenzene to a solid content of about 2% by weight. The coating was made to have a thickness of 50 nm and a coating area of 4 cm 2 (width: 2 cm, length: 2 cm); the coating was dried at room temperature for about 1 hour; then thermally annealed at 160 ° C for about 1 hour. The layer prepared was measured. After the layer was subjected to thermal annealing, deionized water droplets of known surface tension were dropped, and then the contact angle was measured. The above procedure for obtaining the contact angle of deionized water was repeated 5 times, and the average of the contact angles obtained by the 5 was calculated. Similarly, after the layer was subjected to thermal annealing, diiodomethane having a known surface tension was dropped, and then the contact angle was measured. The above procedure for obtaining the contact angle of diiodomethane was repeated 5 times, and the average of the contact angles obtained by the 5 was calculated. Thereafter, the surface energy can be obtained by substituting the value of the surface tension of the solvent (Strom value) via the Owens-Wendt-Rabel-Kaelble method and using the obtained contact angle average value of deionized water and diiodomethane. The surface energy of each block in the block copolymer can be obtained by the above method for the homopolymer prepared from the monomer forming the corresponding block.

在該嵌段共聚物包含上述鏈之情況下,包含該鏈的嵌段之表面能大於其他嵌段。例如,若第一嵌段包含鏈,則第一嵌段的表面能大於第二嵌段。在此情況下,第一嵌段之表面能可在約20mN/m至約40mN/m。在其他實施態樣中,第一嵌段之表面能可為約22mN/m或更大,約24mN/m或更大,約26mN/m或更大或約28mN/m或更大。第一嵌段之表面能可為約38mN/m或更 小,約36mN/m或更小,約34mN/m或更小或約32mN/m或更小。包括上述第一嵌段且顯示上述介於嵌段的表面能之間的差異之嵌段共聚物可顯示優異自組合性質。 In the case where the block copolymer contains the above chain, the surface energy of the block containing the chain is larger than that of the other blocks. For example, if the first block comprises a chain, the surface energy of the first block is greater than the second block. In this case, the surface energy of the first block may range from about 20 mN/m to about 40 mN/m. In other embodiments, the surface energy of the first block can be about 22 mN/m or greater, about 24 mN/m or greater, about 26 mN/m or greater, or about 28 mN/m or greater. The surface energy of the first block can be about 38 mN/m or more Small, about 36 mN/m or less, about 34 mN/m or less or about 32 mN/m or less. The block copolymer including the above first block and exhibiting the above difference in surface energy between the blocks can exhibit excellent self-combination properties.

該參數可藉由例如控制嵌段共聚物而達成。 This parameter can be achieved, for example, by controlling the block copolymer.

在一實施態樣中,滿足上述參數之嵌段共聚物可在第一或第二嵌段中包括具有鏈形成原子的側鏈。下文,為了方便解釋,可將包含該側鏈之嵌段稱為第一嵌段。 In one embodiment, the block copolymer satisfying the above parameters may include a side chain having a chain forming atom in the first or second block. Hereinafter, for convenience of explanation, a block including the side chain may be referred to as a first block.

本文所使用之用語「鏈形成原子」係指形成鍵聯至嵌段共聚物之側鏈的原子以及形成該側鏈之直鏈結構的原子。該側鏈具有直鏈或支鏈結構;然而,鏈形成原子之數目僅藉由形成最長直鏈的原子之數目計算。因此,其他原子(諸如在鏈形成原子為碳原子之情況下為鍵聯至該碳原子等的氫原子)不計入鏈形成原子之數目。此外,在支鏈之情況下,鏈形成原子的數目為形成最長鏈之原子的數目。例如,該鏈為正戊基,則所有鏈形成原子為碳原子且其數目為5。若該鏈為2-甲基戊基,則所有鏈形成原子亦為碳原子且其數目為5。鏈形成原子可為碳、氧、硫或氮等,以及適當之鏈形成原子可為碳、氧或氮;或碳或氧。鏈形成原子之數目可為8或更多、9或更多、10或更多、11或更多;或12或更多。鏈形成原子之數目可為30或更少、25或更少、20或更少或16或更少。 The term "chain-forming atom" as used herein refers to an atom that forms a side chain bonded to a block copolymer and an atom that forms a linear structure of the side chain. The side chain has a linear or branched structure; however, the number of chain forming atoms is calculated only by the number of atoms forming the longest straight chain. Therefore, other atoms (such as a hydrogen atom bonded to the carbon atom or the like in the case where the chain forming atom is a carbon atom) are not counted in the number of chain forming atoms. Further, in the case of branching, the number of atoms forming the chain is the number of atoms forming the longest chain. For example, if the chain is n-pentyl, then all of the chain forming atoms are carbon atoms and the number is 5. If the chain is a 2-methylpentyl group, then all of the chain forming atoms are also carbon atoms and the number is 5. The chain forming atom may be carbon, oxygen, sulfur or nitrogen, and the like, and the appropriate chain forming atom may be carbon, oxygen or nitrogen; or carbon or oxygen. The number of chain forming atoms may be 8 or more, 9 or more, 10 or more, 11 or more; or 12 or more. The number of chain forming atoms may be 30 or less, 25 or less, 20 or less, or 16 or less.

在其他實施態樣中,第一嵌段及第二嵌段其中之一或二者可至少包括滿足上述參數之嵌段共聚物中的 芳族結構。第一嵌段及第二嵌段二者均可包括芳族結構,及在此情況下,該第一嵌段中之芳族結構可與在第二嵌段中之芳族結構相同或不同。此外,在滿足本文件中所述參數之嵌段共聚物的第一及第二嵌段當中之至少一種嵌段可包括如下述之側鏈或至少一個鹵素原子,且此種側鏈或至少一個鹵素原子可經該芳族結構取代。該嵌段共聚物可包括二或多個嵌段。 In other embodiments, one or both of the first block and the second block may include at least one of the block copolymers satisfying the above parameters. Aromatic structure. Both the first block and the second block may comprise an aromatic structure, and in this case, the aromatic structure in the first block may be the same or different from the aromatic structure in the second block. Further, at least one of the first and second blocks of the block copolymer satisfying the parameters described in the present document may include a side chain or at least one halogen atom as described below, and such a side chain or at least one A halogen atom may be substituted by the aromatic structure. The block copolymer can include two or more blocks.

如上述,該嵌段共聚物之第一嵌段及/或第二嵌段可包括芳族結構。此種芳族結構可包括在第一嵌段及第二嵌段其中之一或二者中。在該等嵌段二者均包括芳族結構的情況下,於第一嵌段中之芳族結構可與在第二嵌段中之芳族結構相同或不同。 As mentioned above, the first block and/or the second block of the block copolymer may comprise an aromatic structure. Such an aromatic structure can be included in one or both of the first block and the second block. Where both of the blocks comprise an aromatic structure, the aromatic structure in the first block may be the same or different than the aromatic structure in the second block.

本文所使用之用語「芳族結構」可指芳基或伸芳基,以及可指從包括一個苯環結構或其中至少兩個苯環係共用一或兩個碳原子或藉由隨意的鍵聯子鍵聯之結構的化合物或該化合物之衍生物所衍生的單價或二價取代基。除非另外界定,否則該芳基或伸芳基可為具有6至30、6至25、6至21、6至18、或6至13個碳原子之芳基。作為該芳基或伸芳基,可舉從苯、萘、偶氮苯、蒽、菲、稠四苯、芘、苯并芘等所衍生的單價或二價取代基為例。 The term "aromatic structure" as used herein may mean aryl or aryl, and may refer to a benzene ring structure or at least two benzene ring systems sharing one or two carbon atoms or by random bonding. A monovalent or divalent substituent derived from a compound of a sub-bond structure or a derivative of the compound. Unless otherwise defined, the aryl or extended aryl group can be an aryl group having 6 to 30, 6 to 25, 6 to 21, 6 to 18, or 6 to 13 carbon atoms. Examples of the aryl group or the aryl group include a monovalent or divalent substituent derived from benzene, naphthalene, azobenzene, anthracene, phenanthrene, fused tetraphenyl, anthracene, benzofluorene or the like.

該芳族結構可為包括在嵌段之主鏈中的結構或可為鍵聯至嵌段之主鏈作為側鏈的結構。例如,適當調整可包括在各嵌段中之芳族結構可實現參數之控制。 The aromatic structure may be a structure included in the main chain of the block or may be a structure in which a main chain linked to the block is used as a side chain. For example, proper adjustment of the aromatic structure that can be included in each block can enable control of the parameters.

例如,為了控制參數,具有8或更多個鏈形成原子之鏈可鍵聯至該嵌段共聚物之第一嵌段作為側鏈。在本文件中,用語「側鏈」及用語「鏈」可指示相同對象。在第一嵌段包括芳族結構之情況下,該鏈可鍵聯至該芳族結構。 For example, to control the parameters, a chain having 8 or more chain-forming atoms may be bonded to the first block of the block copolymer as a side chain. In this document, the term "sidechain" and the term "chain" indicate the same object. Where the first block comprises an aromatic structure, the chain can be bonded to the aromatic structure.

該側鏈可為鍵聯至聚合物之主鏈的鏈。如上述,該側鏈可為包括8或更多、9或更多、10或更多、11或更多;或12或更多個鏈形成原子之鏈。鏈形成原子之數目可為30或更少、25或更少、20或更少或16或更少。該鏈形成原子可為碳、氧、氮或硫、或適當地為碳或氧。 The side chain can be a chain that is bonded to the backbone of the polymer. As described above, the side chain may be a chain including 8 or more, 9 or more, 10 or more, 11 or more; or 12 or more chains forming atoms. The number of chain forming atoms may be 30 or less, 25 or less, 20 or less, or 16 or less. The chain forming atom can be carbon, oxygen, nitrogen or sulfur, or suitably carbon or oxygen.

該側鏈可為烴鏈,諸如烷基、烯基或炔基。該烴鏈中至少一個碳原子係經硫原子、氧原子或氮原子置換。 The side chain can be a hydrocarbon chain such as an alkyl, alkenyl or alkynyl group. At least one carbon atom in the hydrocarbon chain is replaced by a sulfur atom, an oxygen atom or a nitrogen atom.

在該側鏈係鍵聯至該芳族結構之情況下,該鏈可直接鍵聯至該芳族結構或經由鍵聯子鍵聯至該芳族結構。該鍵聯子可為氧原子、硫原子、-NR1-、-S(=O)2-、羰基、伸烷基、伸烯基、伸炔基、-C(=O)-X1-或-X1-C(=O)-。前文中,R1可為氫、烷基、烯基、炔基、烷氧基或芳基且X1可為單鍵、氧原子、硫原子、-NR2-、-S(=O)2-、伸烷基、伸烯基或伸炔基,且R2可為氫、烷基、烯基、炔基、烷氧基、或芳基。適當鍵聯子可為氧原子。該側鏈可經由例如氫原子或氮鍵聯至該芳族結構。 Where the side chain is bonded to the aromatic structure, the chain can be directly bonded to the aromatic structure or bonded to the aromatic structure via a bond. The bond may be an oxygen atom, a sulfur atom, -NR 1 -, -S(=O) 2 -, a carbonyl group, an alkylene group, an alkenyl group, an alkynyl group, -C(=O)-X 1 - Or -X 1 -C(=O)-. In the above, R 1 may be hydrogen, alkyl, alkenyl, alkynyl, alkoxy or aryl and X 1 may be a single bond, an oxygen atom, a sulfur atom, -NR 2 -, -S(=O) 2 An alkyl, an alkenyl or an alkynyl group, and R 2 may be hydrogen, alkyl, alkenyl, alkynyl, alkoxy, or aryl. A suitable linkage can be an oxygen atom. The side chain can be bonded to the aromatic structure via, for example, a hydrogen atom or a nitrogen bond.

在該芳族結構係鍵聯至嵌段之主鏈作為側鏈 的情況下,該芳族結構亦可直接鍵聯至該主鏈或可經由鍵聯子鍵聯至該主鏈。該鍵聯子可為氧原子、硫原子、-S(=O)2-、羰基、伸烷基、伸烯基、伸炔基、-C(=O)-X1-或-X1-C(=O)-。前文中,X1可為單鍵、氧原子、硫原子、-S(=O)2-、伸烷基、伸烯基或伸炔基。將該芳族結構鍵結至該主鏈之鍵聯子可為-C(=O)-O-或-O-C(=O)-,但不侷限於此。 In the case where the aromatic structure is bonded to the main chain of the block as a side chain, the aromatic structure may also be directly bonded to the main chain or may be bonded to the main chain via a bond. The bond may be an oxygen atom, a sulfur atom, -S(=O) 2 -, a carbonyl group, an alkylene group, an alkenyl group, an alkynyl group, -C(=O)-X 1 - or -X 1 - C(=O)-. In the above, X 1 may be a single bond, an oxygen atom, a sulfur atom, -S(=O) 2 -, an alkylene group, an extended alkenyl group or an extended alkynyl group. The bond to which the aromatic structure is bonded to the main chain may be -C(=O)-O- or -OC(=O)-, but is not limited thereto.

在其他實施態樣中,該嵌段共聚物之第一嵌段及/或第二嵌段中的芳族結構可包括1或多個、2或多個、3或多個、4或多個或5或多個鹵素原子。該鹵素原子之數目可為30或更少、25或更少、20或更少、15或更少或10或更少。該鹵素原子可為氟或氯;及可使用氟。包含包括該鹵素原子之芳族結構的嵌段可藉由與其他嵌段之適當相互作用而有效形成相分離結構。 In other embodiments, the aromatic structure in the first block and/or the second block of the block copolymer may comprise one or more, two or more, three or more, four or more Or 5 or more halogen atoms. The number of halogen atoms may be 30 or less, 25 or less, 20 or less, 15 or less, or 10 or less. The halogen atom may be fluorine or chlorine; and fluorine may be used. A block comprising an aromatic structure including the halogen atom can effectively form a phase-separated structure by appropriate interaction with other blocks.

作為包括該鹵素原子之芳族結構,可舉具有6至30、6至25、6至21、6至18或6至13個碳原子之芳族結構為例,但不侷限於此。 As the aromatic structure including the halogen atom, an aromatic structure having 6 to 30, 6 to 25, 6 to 21, 6 to 18 or 6 to 13 carbon atoms can be exemplified, but is not limited thereto.

為了實現適當相分離,在該第一及第二嵌段均包括芳族結構之情況下,該第一嵌段可包括不具鹵素原子的芳族結構且該第二嵌段可包括具有鹵素原子之芳族結構。此外,該第一嵌段之芳族結構可包括直接鍵聯或經由包括氧或氮原子之鍵聯子鍵聯的側鏈。 In order to achieve proper phase separation, in the case where the first and second blocks each comprise an aromatic structure, the first block may include an aromatic structure having no halogen atom and the second block may include a halogen atom Aromatic structure. Furthermore, the aromatic structure of the first block may comprise a direct linkage or a side chain linked via a bond comprising an oxygen or nitrogen atom.

在該嵌段共聚物包括具有側鏈之嵌段的情況下,該嵌段可為由例如式1所表示之嵌段。 In the case where the block copolymer includes a block having a side chain, the block may be a block represented by, for example, Formula 1.

在式1中,R可為氫或具有1至4個碳原子之烷基,X可為單鍵、氧原子、硫原子、-S(=O)2-、羰基、伸烷基、伸烯基、伸炔基、-C(=O)-X1-或-X1-C(=O)-,其中X1可為氧原子、硫原子、-S(=O)2-、伸烷基、伸烯基或伸炔基,且Y可為包括環狀結構之單價取代基且該環狀結構上鍵聯有具有8或更多個鏈形成原子之鍵。 In Formula 1, R may be hydrogen or an alkyl group having 1 to 4 carbon atoms, and X may be a single bond, an oxygen atom, a sulfur atom, -S(=O) 2 -, a carbonyl group, an alkylene group, an alkylene group. Alkyl, alkynyl, -C(=O)-X 1 - or -X 1 -C(=O)-, wherein X 1 may be an oxygen atom, a sulfur atom, -S(=O) 2 -, a stretched alkyl a group, an alkenyl group or an alkynyl group, and Y may be a monovalent substituent including a cyclic structure having a bond having 8 or more chain-forming atoms bonded thereto.

本文所使用之用語「單鍵」可指對應之位點無原子的情況。例如,若式1中之X為單鍵,可實現Y係直接鍵聯至聚合物鏈的結構。 The term "single bond" as used herein may refer to the case where the corresponding site is atom-free. For example, if X in Formula 1 is a single bond, a structure in which the Y system is directly bonded to the polymer chain can be realized.

除非另外界定,否則本文所使用之用語「烷基」可指具有1至20、1至16、1至12、1至8、或1至4個碳原子之直鏈、支鏈或環狀烷基,且該烷基可隨意地經至少一個取代基取代。在該側鏈為烷基之情況下,該烷基可包括8或更多、9或更多、10或更多、11或更多或12或更多個碳原子,且該烷基中之碳原子的數目可為30或更少、25或更少、20或更少或16或更少。 The term "alkyl" as used herein, unless otherwise defined, may mean a straight, branched or cyclic alkane having from 1 to 20, from 1 to 16, from 1 to 12, from 1 to 8, or from 1 to 4 carbon atoms. And the alkyl group may be optionally substituted with at least one substituent. In the case where the side chain is an alkyl group, the alkyl group may include 8 or more, 9 or more, 10 or more, 11 or more or 12 or more carbon atoms, and the alkyl group The number of carbon atoms may be 30 or less, 25 or less, 20 or less, or 16 or less.

除非另外界定,否則本文所使用之用語「烯基或炔基」可指具有2至20、2至16、2至12、2至8、或2至4個碳原子之直鏈、支鏈或環狀烯基或炔基,且該 烯基或炔基可隨意地經至少一個取代基取代。在該側鏈為烯基或炔基之情況下,該烯基或炔基可包括8或更多、9或更多、10或更多、11或更多或12或更多個碳原子,且該烯基或炔基中之碳原子的數目可為30或更少、25或更少、20或更少或16或更少。 The term "alkenyl or alkynyl" as used herein, unless otherwise defined, may mean a straight chain, a branched chain having 2 to 20, 2 to 16, 2 to 12, 2 to 8, or 2 to 4 carbon atoms or a cyclic alkenyl or alkynyl group, and The alkenyl or alkynyl group may be optionally substituted with at least one substituent. Where the side chain is an alkenyl or alkynyl group, the alkenyl or alkynyl group may comprise 8 or more, 9 or more, 10 or more, 11 or more or 12 or more carbon atoms, And the number of carbon atoms in the alkenyl or alkynyl group may be 30 or less, 25 or less, 20 or less, or 16 or less.

除非另外界定,否則本文所使用之用語「伸烷基」可指具有1至20、1至16、1至12、1至8或1至4個碳原子伸烷基。該伸烷基可具有直鏈、支鏈或環狀結構,且可隨意地經至少一個取代基取代。 The term "alkylene" as used herein, unless otherwise defined, may mean an alkylene group having from 1 to 20, from 1 to 16, from 1 to 12, from 1 to 8, or from 1 to 4 carbon atoms. The alkylene group may have a linear, branched or cyclic structure and may be optionally substituted with at least one substituent.

除非另外界定,否則本文所使用之用語「伸烯基或伸炔基」可指具有2至20、2至16、2至12、2至8或2至4個碳原子之伸烯基或伸炔基。該伸烯基或伸炔基可具有直鏈、支鏈或環狀結構,且可隨意地經至少一個取代基取代。 The term "alkenyl or alkynyl" as used herein, unless otherwise defined, may mean an alkenyl group or a stretch having 2 to 20, 2 to 16, 2 to 12, 2 to 8 or 2 to 4 carbon atoms. Alkynyl. The alkenyl or alkynyl group may have a linear, branched or cyclic structure and may be optionally substituted with at least one substituent.

在其他實施態樣中,式1之X可為-C(=O)O-或-OC(=O)-。 In other embodiments, X of Formula 1 can be -C(=O)O- or -OC(=O)-.

式1中之Y為包括該鏈之取代基,其可為包括例如具有6至18或6至12個碳原子的芳族結構之取代基。前文中,該鏈可為具有8或更多、9或更多、10或更多、11或更多或12或更多個碳原子之烷基。該烷基可包括30或更少、25或更少、20或更少或16或更少個碳原子。該鏈可直接鍵聯至該芳族結構或經由如上述之鍵聯子而鍵聯至該芳族結構。 Y in Formula 1 is a substituent including the chain, which may be a substituent including, for example, an aromatic structure having 6 to 18 or 6 to 12 carbon atoms. In the foregoing, the chain may be an alkyl group having 8 or more, 9 or more, 10 or more, 11 or more or 12 or more carbon atoms. The alkyl group can include 30 or fewer, 25 or fewer, 20 or fewer, or 16 or fewer carbon atoms. The chain can be bonded directly to the aromatic structure or to the aromatic structure via a bond as described above.

在其他實施態樣中,該第一嵌段可以下式2 表示。 In other embodiments, the first block can be of the following formula 2 Said.

在式2中,R可為氫原子或具有1至4個碳原子之烷基,X可為-C(=O)-O-,P可為具有6至12個碳原子之伸芳基,Q可為氧原子,Z為具有8或更多個鏈形成原子之鏈。 In Formula 2, R may be a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, X may be -C(=O)-O-, and P may be an extended aryl group having 6 to 12 carbon atoms. Q may be an oxygen atom, and Z is a chain having 8 or more chain forming atoms.

在式2之其他實施態樣中,P可為伸苯基。又,Z可為具有9至20、9至18或9至16個碳原子之直鏈烷基。在P為伸苯基之情況下,Q可鍵聯至該伸苯基之對位。該烷基、伸芳基、伸苯基及該鏈可隨意地經至少一個取代基取代。 In other embodiments of Formula 2, P can be a pendant phenyl group. Further, Z may be a linear alkyl group having 9 to 20, 9 to 18 or 9 to 16 carbon atoms. In the case where P is a phenyl group, Q may be bonded to the para position of the phenyl group. The alkyl group, the aryl group, the phenyl group, and the chain are optionally substituted with at least one substituent.

在嵌段共聚物包括具有含鹵素原子之芳族結構的嵌段之情況下,該嵌段可為以下式3表示之嵌段。 In the case where the block copolymer includes a block having an aromatic structure containing a halogen atom, the block may be a block represented by the following formula 3.

在式3中,X2可為單鍵、氧原子、硫原子、 -S(=O)2-、伸烷基、伸烯基、伸炔基、-C(=O)-X1-或-X1-C(=O)-,其中X1為單鍵、氧原子、硫原子、-S(=O)2-、伸烷基、伸烯基或伸炔基,且W可為包括至少一個鹵素原子之芳基。 In Formula 3, X 2 may be a single bond, an oxygen atom, a sulfur atom, -S(=O) 2 -, an alkylene group, an alkenyl group, an alkynyl group, -C(=O)-X 1 - or -X 1 -C(=O)-, wherein X 1 is a single bond, an oxygen atom, a sulfur atom, -S(=O) 2 -, an alkylene group, an extended alkenyl group or an alkynyl group, and W may be included At least one aryl group of a halogen atom.

在式3之其他實施態樣中,X2可為單鍵或伸烷基。 In other embodiments of Formula 3, X 2 can be a single bond or an alkylene group.

在式3中,W之芳基可為具有6至12個碳原子之芳基或苯基。該芳基或該苯基可包括1或更多、2或更多、3或更多、4或更多或5或更多個鹵素原子。該鹵素原子之數目可為30或更少、25或更少、20或更少、15或更少或10或更少。作為鹵素原子,可使用氟原子。 In Formula 3, the aryl group of W may be an aryl group having 6 to 12 carbon atoms or a phenyl group. The aryl group or the phenyl group may include 1 or more, 2 or more, 3 or more, 4 or more or 5 or more halogen atoms. The number of halogen atoms may be 30 or less, 25 or less, 20 or less, 15 or less, or 10 or less. As the halogen atom, a fluorine atom can be used.

在其他實施態樣中,式3之嵌段可以下式4表示。 In other embodiments, the block of Formula 3 can be represented by Formula 4 below.

在式4中,X2與式3中之定義相同,且R1至R5可各獨立地為氫、烷基、鹵烷基或鹵素原子。R1至R5中所包括之鹵素原子的數目為1或更多。 In Formula 4, X 2 is the same as defined in Formula 3, and R 1 to R 5 may each independently be a hydrogen, an alkyl group, a haloalkyl group or a halogen atom. The number of halogen atoms included in R 1 to R 5 is 1 or more.

在式4中,R1至R5可獨立地為氫、具有1至 4個碳原子之烷基或具有1至4個碳原子鹵烷基或鹵素原子,且該鹵素原子可為氟或氯。 In Formula 4, R 1 to R 5 may independently be hydrogen, an alkyl group having 1 to 4 carbon atoms or a halogenated alkyl group having 1 to 4 carbon atoms or a halogen atom, and the halogen atom may be fluorine or chlorine .

在式4中,R1至R5可包括1或更多、2或更多、3或更多、4或更多、5或更多或6或更多個鹵素原子。鹵素原子之數目的上限無特別限制,且在R1至R5中之鹵素原子的數目可為例如12或更少、8或更少、或7或更少。 In Formula 4, R 1 to R 5 may include 1 or more, 2 or more, 3 or more, 4 or more, 5 or more, or 6 or more halogen atoms. The upper limit of the number of halogen atoms is not particularly limited, and the number of halogen atoms in R 1 to R 5 may be, for example, 12 or less, 8 or less, or 7 or less.

該嵌段共聚物可只包括上述兩種嵌段或可包括上述兩種嵌段其中之一或二者連同其他嵌段。 The block copolymer may comprise only the two blocks described above or may comprise one or both of the above two blocks together with other blocks.

用於製備嵌段共聚物之方法無特別限制。例如,該嵌段共聚物可藉由活性自由基聚合(living radical polymerization)(LRP)來製備。例如,有許多方法,諸如其中嵌段共聚物係於無機酸鹽(諸如鹼金屬或鹼土金屬之鹽)存在下藉由使用有機稀土金屬錯合物或有機鹼金屬化合物作為聚合引發劑而合成之陰離子聚合;嵌段共聚物係在有機鋁化合物存在下藉由使用有機鹼金屬化合物作為聚合引發劑而合成之陰離子聚合;使用原子轉移自由基聚合劑(atom transfer radical polymerizer)作為聚合控制劑之原子轉移自由基聚合(ATRP);藉由在有機或無機還原劑產生電子存在下使用原子轉移自由基聚合劑作為聚合控制劑進行聚合之電子轉移再生的活化劑(ATGET)之ATRP;用於連續活化劑再生之引發劑(ICAR)的ATRP;使用無機還原劑可逆加成-開環鏈轉移劑之可逆加成-開環鏈轉移(RAFT)聚合;及使用有機碲化合物作為 引發劑之方法,且可從上述方法中選擇適當方法。 The method for preparing the block copolymer is not particularly limited. For example, the block copolymer can be prepared by living radical polymerization (LRP). For example, there are many methods, such as in which a block copolymer is synthesized in the presence of a mineral acid salt such as a salt of an alkali metal or an alkaline earth metal by using an organic rare earth metal complex or an organic alkali metal compound as a polymerization initiator. Anionic polymerization; block copolymer is an anionic polymerization synthesized by using an organic alkali metal compound as a polymerization initiator in the presence of an organoaluminum compound; an atom using a atom transfer radical polymerizer as a polymerization control agent Transfer radical polymerization (ATRP); ATRP of an electron transfer regeneration activator (ATGET) using an atom transfer radical polymerization agent as a polymerization control agent in the presence of electrons generated by an organic or inorganic reducing agent; for continuous activation ATRP of initiator regeneration agent (ICAR); reversible addition-open-loop chain transfer (RAFT) polymerization of reversible addition-ring-opening chain transfer agent using inorganic reducing agent; and use of organic ruthenium compound as The method of the initiator, and an appropriate method can be selected from the above methods.

在一實施態樣中,嵌段共聚物可藉由包括藉由活性自由基聚合來聚合包含能於自由基引發劑存在下形成嵌段之單體的材料及活性自由基聚合試劑的方法製備。該用於製備嵌段共聚物之方法可進一步包括例如在非溶劑中沉澱從上述程序所形成之聚合產物。 In one embodiment, the block copolymer can be prepared by a method comprising polymerizing a material comprising a monomer capable of forming a block in the presence of a radical initiator and a living radical polymerization reagent by living radical polymerization. The method for preparing a block copolymer may further include, for example, precipitating a polymerization product formed from the above procedure in a non-solvent.

自由基引發劑之種類可考慮聚合效率而適當地選擇且無特定限制,且可使用偶氮化合物,諸如偶氮雙異丁腈(AIBN)或2,2’-偶氮雙-(2,4-二甲基戊腈),或過氧化合物,諸如過氧化苯甲醯基(BPO)或過氧化二(第三丁基)(DTBP)。 The kind of the radical initiator can be appropriately selected in consideration of the polymerization efficiency without particular limitation, and an azo compound such as azobisisobutyronitrile (AIBN) or 2,2'-azobis-(2,4) can be used. - dimethyl valeronitrile), or a peroxy compound such as benzammonium peroxide (BPO) or di(tert-butyl peroxide) (DTBP).

LRP可在溶劑中進行,該溶劑係諸如氯甲烷、1,2-二氯乙烷、氯苯、二氯苯、苯、甲苯、丙酮、氯仿、四氫呋喃、二烷、單乙二醇二甲醚、二乙二醇二甲醚、二甲基甲醯胺、二甲亞碸或二甲基乙醯胺。 LRP can be carried out in a solvent such as methyl chloride, 1,2-dichloroethane, chlorobenzene, dichlorobenzene, benzene, toluene, acetone, chloroform, tetrahydrofuran, Alkane, monoethylene glycol dimethyl ether, diethylene glycol dimethyl ether, dimethylformamide, dimethyl hydrazine or dimethyl acetamide.

作為非實例,可使用例如醇(諸如甲醇、乙醇、正丙醇或異丙醇)、二醇(諸如乙二醇)、或醚化合物(諸如正己烷、環己烷、正庚烷或石油醚)而無限制。 As a non-example, for example, an alcohol such as methanol, ethanol, n-propanol or isopropanol, a diol such as ethylene glycol, or an ether compound such as n-hexane, cyclohexane, n-heptane or petroleum ether can be used. ) without restrictions.

上述之嵌段共聚物展現優異相分離性質及自組合性質,且其垂直對準性質亦優異。本發明人已確認,若該嵌段共聚物另外滿足下述參數當中至少一個參數,則上述性質可獲得進一步改善。 The above block copolymer exhibits excellent phase separation properties and self-combination properties, and is also excellent in vertical alignment properties. The inventors have confirmed that the above properties can be further improved if the block copolymer additionally satisfies at least one of the following parameters.

例如,該嵌段共聚物可在疏水性表面上形成顯示掠角入射小角度X射線散射(GISAXS)之面內相繞 射圖案的層。該嵌段共聚物可在親水性表面上形成顯示掠角入射小角度X射線散射(GISAXS)之面內相繞射圖案的層。 For example, the block copolymer can form an in-plane phase winding on a hydrophobic surface that exhibits a grazing angle incident small angle X-ray scattering (GISAXS). The layer of the pattern is projected. The block copolymer can form a layer on the hydrophilic surface that exhibits an in-plane phase diffraction pattern of grazing angle incident small angle X-ray scattering (GISAXS).

本文所使用之用語「顯示掠角入射小角度X射線散射(GISAXS)之面內相繞射圖案」可指當進行GISAXS分析時在該GISAXS繞射圖案中觀察到與X座標垂直之峰的情況。此種峰可由該嵌段共聚物之垂直對準性質確認。因此,該顯示面內相繞射圖案之嵌段共聚物顯示垂直對準性質。此外,若觀察到上述峰具有規律間隔,該相分離效率可獲得進一步改善。 As used herein, the phrase "displaying the in-plane phase diffraction pattern of the grazing angle incident small-angle X-ray scattering (GISAXS)" may refer to the case where a peak perpendicular to the X coordinate is observed in the GISAXS diffraction pattern when performing the GISAXS analysis. . Such peaks can be confirmed by the vertical alignment properties of the block copolymer. Therefore, the block copolymer showing the in-plane phase diffraction pattern exhibits a vertical alignment property. Furthermore, if it is observed that the above peaks have regular intervals, the phase separation efficiency can be further improved.

本文所使用之用語「垂直」係考慮誤差之用語,及例如可包括±10度、±8度、±6度、±4度或±2度內之誤差。 As used herein, the term "vertical" refers to the term of error and may include, for example, errors of ±10 degrees, ±8 degrees, ±6 degrees, ±4 degrees, or ±2 degrees.

能在疏水性及親水性表面二者上形成顯示面內相繞射圖案之層的嵌段共聚物可在未進行任何用以引發垂直對準之處理的各種表面上顯示垂直對準性質。本文所使用之用語「疏水性表面」可指純水之濕潤角係在50度至70度之範圍的表面。該疏水性表面可包括經食人魚溶液(piranha solution)、硫酸、氧電漿處理之聚矽氧的表面,但不侷限於此。本文所使用之用語「親水性表面」可指純水之濕潤角係在5度至20度之範圍的表面。該親水性表面之實例可包括經氟化氫處理之聚矽氧、經六甲基二矽氮烷處理之聚矽氧或經氧電漿處理之聚二甲基矽氧烷的表面,但不侷限於此。 A block copolymer capable of forming a layer exhibiting an in-plane phase diffraction pattern on both hydrophobic and hydrophilic surfaces can exhibit vertical alignment properties on various surfaces that are not subjected to any treatment for inducing vertical alignment. As used herein, the term "hydrophobic surface" may refer to a surface having a wet angle of from 50 degrees to 70 degrees. The hydrophobic surface may include, but is not limited to, a surface of a polyoxyn oxide treated with a piranha solution, sulfuric acid, or oxygen plasma. As used herein, the term "hydrophilic surface" may refer to a surface having a wet angle of from 5 degrees to 20 degrees. Examples of the hydrophilic surface may include, but are not limited to, hydrogen fluoride-treated polyfluorene oxide, hexamethyldiazane-treated polyfluorene oxide or oxygen plasma-treated polydimethyloxane. this.

除非另外界定,否則本文件中,諸如根據室溫而改變之性質(諸如濕潤角)係在室溫測量。本文所使用之用語「室溫」可指未加熱及冷卻之自然狀態下的溫度,且可指在約10℃至30℃,或約25℃或約23℃之範圍內的溫度。 Unless otherwise defined, properties such as varying from room temperature, such as wetting angle, are measured at room temperature in this document. The term "room temperature" as used herein may refer to a temperature in a natural state without heating and cooling, and may refer to a temperature in the range of about 10 ° C to 30 ° C, or about 25 ° C or about 23 ° C.

在疏水性或親水性表面上形成且在GISAXS顯示面內相繞射圖案之層可為進行熱退火之層。在一實施態樣中,用於測量GISAXS之層係例如藉由將嵌段共聚物在溶劑(例如氟苯)中稀釋至約0.7重量%之濃度所製備的塗覆溶液塗覆於對應之疏水性或親水性表面上,使所塗層的厚度為約25nm且面積為約2.25cm2(寬度:1.5cm,長度1.5cm),然後對其進行熱退火來製備。該熱退火可藉由使該層維持在約160℃之溫度約1小時來進行。GISAXS可藉由使用X射線照射上述製備之層,使其入射角在0.12至0.23度之範圍內來測量。藉由慣用測量裝置(例如2D marCCD)可獲得從該層散射之繞射圖案。從上述獲得之繞射圖案確認存在面內相繞射圖案的技術在本領域中已為人知。 The layer formed on the hydrophobic or hydrophilic surface and showing the in-plane phase diffraction pattern in the GISAXS may be a layer that is thermally annealed. In one embodiment, the layer for measuring GISAXS is applied to a corresponding hydrophobic solution, for example, by diluting the block copolymer in a solvent (eg, fluorobenzene) to a concentration of about 0.7% by weight. On the surface of the hydrophilic or hydrophilic surface, the thickness of the coating was about 25 nm and the area was about 2.25 cm 2 (width: 1.5 cm, length 1.5 cm), which was then thermally annealed. The thermal annealing can be carried out by maintaining the layer at a temperature of about 160 ° C for about 1 hour. GISAXS can be measured by irradiating the above-prepared layer with X-rays so that the incident angle is in the range of 0.12 to 0.23 degrees. A diffraction pattern scattered from the layer can be obtained by a conventional measuring device such as a 2D marCCD. Techniques for confirming the presence of an in-phase phase diffraction pattern from the diffraction pattern obtained above are well known in the art.

在GISAXS中顯示上述峰之嵌段共聚物可顯示優異自組合性質及可根據對象而有效地予以控制之性質。 The block copolymer showing the above peaks in GISAXS can exhibit excellent self-combination properties and properties which can be effectively controlled depending on the object.

在其他實施態樣中,該嵌段共聚物可在如上述XRD(X射線繞射)分析中展現至少一個在預定散射向量(q)範圍內之峰。 In other embodiments, the block copolymer can exhibit at least one peak in the range of a predetermined scattering vector (q) in an XRD (X-ray diffraction) analysis as described above.

例如,在XRD分析中,該嵌段共聚物可顯示在0.5nm-1至10nm-1之散射向量(q值)範圍內顯示至少一個峰。在其他實施態樣中,觀察到該至少一個峰之散射向量(q值)範圍可為0.7nm-1或更大,0.9nm-1或更大,1.1nm-1或更大,1.3nm-1或更大或1.5nm-1或更大。在其他實施態樣中,觀察到該至少一個峰之散射向量(q值)範圍可為9nm-1或更小,8nm-1或更小,7nm-1或更小,6nm-1或更小,5nm-1或更小,4nm-1或更小,3.5nm-1或更小或3nm-1或更小。 For example, in XRD analysis, the block copolymer can exhibit at least one peak in the range of scattering vectors (q values) from 0.5 nm to 1 to 10 nm -1 . In other aspects of the embodiments, the at least one peak was observed the scattering vector (q value) may range from 0.7nm -1 or greater, 0.9nm -1 or greater, 1.1nm -1 or greater, 1.3nm -1 Or larger or 1.5nm -1 or larger. In other embodiments, it is observed that the scattering vector (q value) of the at least one peak may range from 9 nm -1 or less, 8 nm -1 or less, 7 nm -1 or less, and 6 nm -1 or less. 5 nm -1 or less, 4 nm -1 or less, 3.5 nm -1 or less or 3 nm -1 or less.

在上述散射向量(q)範圍內觀察到之峰的FWHM(半高寬)可為0.2nm-1至0.9nm-1。在其他實施態樣中,該FWHM可為0.25nm-1或更大,0.3nm-1或更大或0.4nm-1或更大。在其他實施態樣中,該FWHM可為0.85nm-1或更小,0.8nm-1或更小或0.75nm-1或更小。 The FWHM (full width at half maximum) of the peak observed in the above range of the scattering vector (q) may be 0.2 nm -1 to 0.9 nm -1 . In other embodiments, the FWHM can be 0.25 nm -1 or greater, 0.3 nm -1 or greater, or 0.4 nm -1 or greater. In other aspects of the embodiment, the FWHM may be 0.85nm -1 or less, 0.8nm -1 or less or 0.75 nm -1 or less.

本文所使用之用語「FWHM(半高寬)」可指顯示最大強度之一半強度的峰之寬度(介於散射向量(q)之間的差異)。形成FWHM之方法如上述。 As used herein, the term "FWHM" may refer to the width of the peak (between the scattering vectors (q)) showing one of the maximum intensity and half intensity. The method of forming the FWHM is as described above.

散射向量(q)及FWHM為針對如下述XRD分析之結果使用最小平方技術的數值分析所獲得之值。在上述方法中,在XRD繞射圖案具有最低強度之位置成為基線且將該最低強度轉換成零的狀態下,針對XRD圖案中之峰的輪廓進行高斯擬合(Gaussian fitting),然後從該高斯擬合之結果獲得散射向量(q)及FWHM。高斯擬 合之R平方為至少0.9或更大,0.92或更大,0.94或更大或0.96或更大。從XRD分析獲得上述資訊之方法為已知,及例如可使用數值分析程式(諸如Origin)。 The scattering vector (q) and FWHM are values obtained by numerical analysis using the least squares technique as the result of the XRD analysis described below. In the above method, Gaussian fitting is performed on the contour of the peak in the XRD pattern in a state where the position where the XRD diffraction pattern has the lowest intensity becomes the baseline and the minimum intensity is converted to zero, and then from the Gaussian The result of the fitting obtains the scattering vector (q) and FWHM. Gaussian The R square is at least 0.9 or greater, 0.92 or greater, 0.94 or greater or 0.96 or greater. Methods for obtaining the above information from XRD analysis are known, and for example, a numerical analysis program (such as Origin) can be used.

顯示具有在上述散射向量(q)範圍內之上述FWHM的峰之嵌段共聚物可包括適於自組合的結晶部分。顯示具有在上述散射向量(q)範圍內之上述FWHM的峰之嵌段共聚物可顯示優異自組合性質。 The block copolymer showing a peak having the above FWHM in the range of the above scattering vector (q) may include a crystalline portion suitable for self-combination. A block copolymer showing a peak having the above FWHM in the range of the above scattering vector (q) can exhibit excellent self-combination properties.

XRD分析可藉由使X射線通過嵌段共聚物之樣本,然後根據散射向量測量散射強度來進行。XRD分析可針對未經任何特定預處理之嵌段共聚物進行,及例如可藉由在適當條件下乾燥該嵌段共聚物然後使X射線通過彼來進行。至於該X射線,可使用垂直尺寸為0.023mm且水平尺寸為0.3mm之X射線。藉由使用測量裝置(例如2D marCCD),以影像形式獲得從該樣本散射之2D繞射圖案,然後針對所獲得之繞射圖案進行上述擬合,以獲得散射向量及FWHM等。 XRD analysis can be performed by passing X-rays through a sample of the block copolymer and then measuring the scattering intensity based on the scattering vector. XRD analysis can be carried out on block copolymers without any particular pretreatment, and can be carried out, for example, by drying the block copolymer under suitable conditions and then passing X-rays therethrough. As the X-ray, X-rays having a vertical size of 0.023 mm and a horizontal size of 0.3 mm can be used. A 2D diffraction pattern scattered from the sample is obtained in the form of an image by using a measuring device (for example, 2D marCCD), and then the above-described fitting is performed for the obtained diffraction pattern to obtain a scattering vector, FWHM, and the like.

如下述,在嵌段共聚物之至少一個嵌段包括側鏈的情況下,鏈形成原子之數目(n)及從XRD分析所獲得之散射向量(q)可滿足下下列方程式1。 As described below, in the case where at least one block of the block copolymer includes a side chain, the number of chain forming atoms (n) and the scattering vector (q) obtained from XRD analysis can satisfy the following Equation 1.

[方程式1]3nm-1~5nm-1=nq/(2×π) [Equation 1] 3 nm -1 ~ 5 nm -1 = nq / (2 × π)

在方程式1中,「n」為鏈形成原子之數目,及「q」為在XRD分析中觀察到峰之散射向量當中的最小散射向量或觀察到具有最大面積之峰的散射向量。此外, 方程式1中之π為圓的周長對其直徑之比。 In Equation 1, "n" is the number of atoms forming the chain, and "q" is the smallest scattering vector among the scattering vectors of the peak observed in the XRD analysis or the scattering vector of the peak having the largest area observed. In addition, π in Equation 1 is the ratio of the circumference of a circle to its diameter.

以方程式1代入之散射向量等可根據XRD分析方法中所述之方法獲得。 The scattering vector or the like substituted by the equation 1 can be obtained by the method described in the XRD analysis method.

以方程式1之值代入的散射值可為在0.5nm-1至10nm-1範圍內之散射值。在其他實施態樣中,以方程式1之值代入的散射值可為在0.5nm-1至10nm-1範圍內之散射值。在其他實施態樣中,以方程式1之值代入的散射值可為0.7nm-1或更大,0.9nm-1或更大,1.1nm-1或更大,1.3nm-1或更大或1.5nm-1或更大。在其他實施態樣中,以方程式1之值代入的散射值可為9nm-1或更小,8nm-1或更小,7nm-1或更小,6nm-1或更小,5nm-1或更小,4nm-1或更小,3.5nm-1或更小或3nm-1或更小。 The scattering value substituted by the value of Equation 1 may be a scattering value in the range of 0.5 nm -1 to 10 nm -1 . In other embodiments, the scatter value substituted with the value of Equation 1 may be a scatter value in the range of 0.5 nm -1 to 10 nm -1 . In other embodiments, the scattering value substituted by the value of Equation 1 may be 0.7 nm -1 or more, 0.9 nm -1 or more, 1.1 nm -1 or more, 1.3 nm -1 or more or 1.5 nm -1 or more. In other embodiments, the scattering value substituted by the value of Equation 1 may be 9 nm -1 or less, 8 nm -1 or less, 7 nm -1 or less, 6 nm -1 or less, 5 nm -1 or Smaller, 4 nm -1 or less, 3.5 nm -1 or less or 3 nm -1 or less.

方程式1可表示介於鏈形成原子之數目與在嵌段共聚物係自組合且形成相分離結構之狀態下介於包括該等鏈之嵌段之間的間隔(D)之間的關係。若包括該鏈之嵌段共聚物的鏈形成原子之數目滿足方程式1,由該鏈展現的可結晶性獲得改善,且因此可大幅改善相分離性質及垂直對準性質。在其他實施態樣中,方程式1中之nq/(2×π)可為4.5nm-1或更小。前文中,介於包括該等鏈之嵌段之間的間隔(D,單位:nm)可藉由數值公式D=2×π/q計算。前文中,「D」為介於嵌段之間的間隔(D,單位:nm),且π及q與方程式1中之定義相同。 Equation 1 may represent a relationship between the number of atoms forming a chain and the interval (D) between blocks including the chains in a state in which the block copolymers are self-assembled and form a phase-separated structure. If the number of chain-forming atoms of the block copolymer including the chain satisfies Equation 1, the crystallinity exhibited by the chain is improved, and thus the phase separation property and the vertical alignment property can be greatly improved. In other embodiments, nq/(2×π) in Equation 1 may be 4.5 nm -1 or less. In the foregoing, the interval (D, unit: nm) between the blocks including the chains can be calculated by the numerical formula D = 2 × π / q. In the foregoing, "D" is the interval between blocks (D, unit: nm), and π and q are the same as defined in Equation 1.

在該嵌段共聚物中,第一及第二嵌段其中一者之體積分率可在0.4至0.8之範圍,及另一嵌段之體積 分率可在0.2至0.6之範圍。在嵌段共聚物包含側鏈的情況下,具有側鏈之嵌段的體積分率可為0.4至0.8。例如,若該第一嵌段包含該側鏈,則該第一嵌段之體積分率可為0.4至0.8,且該第二嵌段之體積分率可在0.2至0.6之範圍。此外,如下述,若該第一嵌段包含不具鹵素原子之芳族結構且該第二嵌段包含具有該鹵素原子之芳族結構,該第一嵌段之體積分率可為0.4至0.8且該第二嵌段之體積分率可在0.2至0.6之範圍。第一及第二嵌段之體積分率的總和可為1。包括上述體積分率之各羧酸的嵌段共聚物可顯示優異自組合性質及相分離性質,且可確認垂直對準性質。該嵌段共聚物之各嵌段的體積分率可藉由各嵌段之密度以及藉由凝膠滲透層析(GPC)獲得分子量而獲得。 In the block copolymer, the volume fraction of one of the first and second blocks may range from 0.4 to 0.8, and the volume of the other block The fraction can range from 0.2 to 0.6. In the case where the block copolymer contains a side chain, the volume fraction of the block having the side chain may be from 0.4 to 0.8. For example, if the first block comprises the side chain, the first block may have a volume fraction of 0.4 to 0.8, and the second block may have a volume fraction of 0.2 to 0.6. Further, as described below, if the first block comprises an aromatic structure having no halogen atom and the second block comprises an aromatic structure having the halogen atom, the first block may have a volume fraction of 0.4 to 0.8 and The volume fraction of the second block may range from 0.2 to 0.6. The sum of the volume fractions of the first and second blocks may be one. The block copolymer of each carboxylic acid including the above volume fraction can exhibit excellent self-combination properties and phase separation properties, and the vertical alignment property can be confirmed. The volume fraction of each block of the block copolymer can be obtained by the density of each block and the molecular weight obtained by gel permeation chromatography (GPC).

在該嵌段共聚物中,介於第一及第二嵌段的密度之間的差異之絕對值可為0.25g/cm3或更大,0.3g/cm3或更大,0.35g/cm3或更大,0.4g/cm3或更大或0.45g/cm3或更大。介於該等密度之間的差異之絕對值可為0.9g/cm3或更小,0.8g/cm3或更小,0.7g/cm3或更小,0.65g/cm3或更小或0.6g/cm3或更小。密度之間的差異之絕對值在上述範圍內的第一及第二嵌段係經由共價鍵鍵聯之結構可藉由因適當不相容性所造成的相分離而實現有效微相分離。 In the block copolymer, the difference between the densities of the first and second blocks may be 0.25 g/cm 3 or more, 0.3 g/cm 3 or more, 0.35 g/cm. 3 or more, 0.4 g/cm 3 or more or 0.45 g/cm 3 or more. The absolute value of the difference between the densities may be 0.9 g/cm 3 or less, 0.8 g/cm 3 or less, 0.7 g/cm 3 or less, 0.65 g/cm 3 or less or 0.6 g/cm 3 or less. The structure in which the absolute value of the difference between the densities in the above range and the first and second block systems are bonded via a covalent bond can achieve effective microphase separation by phase separation due to appropriate incompatibility.

該嵌段共聚物中各嵌段之密度可經由已知的浮力法獲得。例如,藉由在質量及於空氣中之密度為已知 的溶劑中分析嵌段共聚物之質量而獲得。 The density of each block in the block copolymer can be obtained by known buoyancy methods. For example, by mass and density in air is known Obtained in the solvent by analyzing the mass of the block copolymer.

在該嵌段共聚物包含上述側鏈之情況下,包含該鏈的嵌段之密度低於其他嵌段。例如,若第一嵌段包含鏈,則第一嵌段的密度低於第二嵌段。在該情況下,第一嵌段之密度可在約0.9g/cm3至約1.5g/cm3之範圍。在其他實施態樣中,第一嵌段之密度可為約0.95g/cm3或更大。第一嵌段之密度可為約1.4g/cm3或更小,約1.3g/cm3或更小,約1.2g/cm3或更小,約1.1g/cm3或更小或約1.05g/cm3或更小。包括上述第一嵌段且顯示上述介於嵌段的密度之間的差異之嵌段共聚物可顯示優異自組合性質。表面能及密度係在室溫下測量。 In the case where the block copolymer contains the above side chain, the density of the block containing the chain is lower than that of the other blocks. For example, if the first block comprises a chain, the density of the first block is lower than the second block. In this case, the density of the first block may range from about 0.9 g/cm 3 to about 1.5 g/cm 3 . In other embodiments, the first block may have a density of about 0.95 g/cm 3 or greater. The first block may have a density of about 1.4 g/cm 3 or less, about 1.3 g/cm 3 or less, about 1.2 g/cm 3 or less, about 1.1 g/cm 3 or less, or about 1.05. g/cm 3 or less. The block copolymer including the above first block and exhibiting the above difference between the densities of the blocks can exhibit excellent self-combination properties. Surface energy and density are measured at room temperature.

該嵌段共聚物可具有在大約3,000至300,000之範圍的數量平均分子量(Mn)。本文所使用之用語「數量平均分子量」可指藉由GPC(凝膠滲透層析術)所測量之針對標準聚苯乙烯的轉化值。除非另外界定,否則本文所使用之用語「分子量」可指數量平均分子量。在其他實施態樣中,分子量(Mn)可為例如3000或更大,5000或更大,7000或更大,9000或更大,11000或更大,13000或更大或15000或更大。在其他實施態樣中,分子量(Mn)可為例如250000或更小,200000或更小,180000或更小,160000或更小,140000或更小,120000或更小,100000或更小,90000或更小,80000或更小,70000或更小,60000或更小,50000或更小,40000或更小,30000或更小,或25000或更小。該嵌段共聚物可具 有在1.01至1.60之範圍內的多分散性(Mw/Mn)。在其他實施態樣中,多分散性可為約1.1或更大,約1.2或更大,約1.3或更大,或約1.4或更大。 The block copolymer may have a number average molecular weight (Mn) in the range of from about 3,000 to 300,000. The term "number average molecular weight" as used herein may refer to a conversion value for standard polystyrene measured by GPC (gel permeation chromatography). The term "molecular weight" as used herein, unless otherwise defined, may refer to a number average molecular weight. In other embodiments, the molecular weight (Mn) may be, for example, 3000 or more, 5000 or more, 7,000 or more, 9000 or more, 11,000 or more, 13,000 or more, or 15,000 or more. In other embodiments, the molecular weight (Mn) may be, for example, 250,000 or less, 200,000 or less, 180,000 or less, 160,000 or less, 140,000 or less, 120,000 or less, 100,000 or less, 90,000. Or smaller, 80,000 or less, 70,000 or less, 60,000 or less, 50,000 or less, 40,000 or less, 30,000 or less, or 25,000 or less. The block copolymer can have There is polydispersity (Mw/Mn) in the range of 1.01 to 1.60. In other embodiments, the polydispersity can be about 1.1 or greater, about 1.2 or greater, about 1.3 or greater, or about 1.4 or greater.

在上述範圍中,該嵌段共聚物可展現適當自組合性質。可考慮目標自組合結構來控制該嵌段共聚物之數量平均分子量等。 Within the above range, the block copolymer can exhibit suitable self-combining properties. The target self-assembling structure can be considered to control the number average molecular weight and the like of the block copolymer.

若嵌段共聚物至少包括第一及第二嵌段,該嵌段共聚物中之第一嵌段(例如包括該鏈的嵌段)的比率可在10莫耳%至90莫耳%之範圍。 If the block copolymer comprises at least the first and second blocks, the ratio of the first block (eg, the block comprising the chain) in the block copolymer may range from 10 mol% to 90 mol% .

本申請案係關於包括該嵌段共聚物之聚合物層。該聚合物層可用於各種應用。例如,其可用於生物感測器、記錄媒體(諸如快閃記憶體)、磁性儲存媒體或圖案形成方法或電氣裝置或電子裝置等。 This application is directed to a polymer layer comprising the block copolymer. The polymer layer can be used in a variety of applications. For example, it can be used for a biosensor, a recording medium such as a flash memory, a magnetic storage medium or a pattern forming method, or an electric device or an electronic device.

在一實施態樣中,該聚合物層中之嵌段共聚物可藉由自組合而形成週期性結構,包括球體、圓柱體、螺旋二十四面體或片層。例如,在該嵌段共聚物中經由共價鍵鍵聯至上述嵌段之第一嵌段或第二嵌段或其他嵌段的一片段中,另一片段可形成規律性結構,諸如片層形式、圓柱體形式等。且上述結構可垂直對準。 In one embodiment, the block copolymers in the polymer layer can form a periodic structure by self-assembly, including spheres, cylinders, spiral tetrahedrons or sheets. For example, in the block copolymer, a segment of the first block or the second block or other block of the above block may be bonded via a covalent bond, and the other segment may form a regular structure such as a sheet layer. Form, cylinder form, etc. And the above structure can be vertically aligned.

該聚合物層可顯示上述面內相繞射圖案,即,在GISAXS之GISAXS繞射圖案中與X座標垂直之峰。在其他實施態樣中,GISAXS繞射圖案之X座標中可觀察到二或多個峰。在觀察到二或多個峰之情況下,散射向量(q值)可以具有恆定比率來確認。 The polymer layer can exhibit the above-described in-phase phase diffraction pattern, that is, a peak perpendicular to the X coordinate in the GISAXS diffraction pattern of the GISAXS. In other embodiments, two or more peaks are observed in the X coordinate of the GISAXS diffraction pattern. In the case where two or more peaks are observed, the scattering vector (q value) can be confirmed with a constant ratio.

本申請案亦關於一種使用該嵌段共聚物形成聚合物層之方法。該方法可包括在基板上形成包括呈自組合狀態之嵌段共聚物的聚合物層。例如,該方法可包括藉由塗覆等在基板上形成該嵌段共聚物之層或將稀釋於適當溶劑中之嵌段共聚物的塗覆溶液之層,且若有必要,使該層老化或熱處理。 This application also relates to a method of forming a polymer layer using the block copolymer. The method can include forming a polymer layer comprising a block copolymer in a self-assembled state on a substrate. For example, the method may include forming a layer of the block copolymer on a substrate by coating or the like or a layer of a coating solution of a block copolymer diluted in a suitable solvent, and aging the layer if necessary Or heat treatment.

該老化或熱處理可根據例如該嵌段共聚物之相轉變溫度或玻璃轉化溫度來進行,及例如可在高於該玻璃轉化溫度或相轉變溫度之溫度下進行。熱處理之時間無特別限制,且該熱處理可進行大約1分鐘至72小時,但若要必要可改變時間。此外,該聚合物層之熱處理的溫度可為例如100℃至250℃,但可考慮此處所使用之嵌段共聚物而改變。 The aging or heat treatment can be carried out, for example, according to the phase transition temperature or the glass transition temperature of the block copolymer, and can be carried out, for example, at a temperature higher than the glass transition temperature or the phase transition temperature. The heat treatment time is not particularly limited, and the heat treatment can be carried out for about 1 minute to 72 hours, but the time can be changed if necessary. Further, the temperature of the heat treatment of the polymer layer may be, for example, 100 ° C to 250 ° C, but may be changed in consideration of the block copolymer used herein.

所形成之層可在室溫下於非極性溶劑及/或極性溶劑中老化大約1分鐘至72小時。 The resulting layer can be aged in a non-polar solvent and/or a polar solvent at room temperature for about 1 minute to 72 hours.

本申請案亦關於圖案形成方法。該方法可包括從包含基板及在該基板表面上形成且包括自組合嵌段共聚物之聚合物層的積層物選擇性移除該嵌段共聚物的第一嵌段或第二嵌段。該方法可為用於在上述基板上形成圖案之方法。例如,該方法可包括在基板上形成該聚合物層,選擇性移除在該聚合物層中之嵌段共聚物的一種嵌段或二或多種嵌段;然後蝕刻該基板。藉由上述方法,例如,可形成奈米級微圖案。此外,根據該聚合物層中之嵌段共聚物的形狀,藉由上述方法可形成各種圖案之形狀,諸如奈 米棒或奈米孔。若有必要,為了形成圖案,可將該嵌段共聚物與其他共聚物或同元聚合物混合。應用於該方法之基板的種類可經選擇而無特別限制,及例如可應用氧化矽等。 This application also relates to a pattern forming method. The method can include selectively removing a first block or a second block of the block copolymer from a laminate comprising a substrate and a polymer layer formed on the surface of the substrate and comprising a self-assembling block copolymer. The method can be a method for forming a pattern on the above substrate. For example, the method can include forming the polymer layer on a substrate, selectively removing one block or two or more blocks of the block copolymer in the polymer layer; and then etching the substrate. By the above method, for example, a nano-scale micropattern can be formed. Further, depending on the shape of the block copolymer in the polymer layer, various patterns such as Nai can be formed by the above method. Rice stick or nano hole. If necessary, the block copolymer may be mixed with other copolymers or homopolymers in order to form a pattern. The kind of the substrate to be applied to the method can be selected without particular limitation, and for example, ruthenium oxide or the like can be applied.

例如,根據該方法,可形成具有高縱橫比之氧化矽的奈米級圖案。例如,各種圖案類型(諸如奈米棒或奈米孔圖案)可藉由在該氧化矽上形成該聚合物層,在該聚合物層中之嵌段共聚物係形成預定結構之狀態下選擇性移除該嵌段共聚物的任一嵌段,及以各種不同方法(例如反應性離子蝕刻)來蝕刻該氧化矽而形成。此外,根據上述方法,可形成具有高縱橫比之奈米圖案。 For example, according to this method, a nano-scale pattern of cerium oxide having a high aspect ratio can be formed. For example, various pattern types (such as nanorods or nanopore patterns) can be selectively formed by forming the polymer layer on the ruthenium oxide in a state in which the block copolymer in the polymer layer forms a predetermined structure. Any block of the block copolymer is removed and formed by etching the yttrium oxide in a variety of different ways (eg, reactive ion etching). Further, according to the above method, a nano pattern having a high aspect ratio can be formed.

例如,該圖案可形成數十奈米之等級,且此種圖案可應用於各種不同用途,包括下一代資訊電子磁性記錄媒體。 For example, the pattern can be formed on the order of tens of nanometers, and such a pattern can be applied to various purposes, including next generation information electronic magnetic recording media.

例如,可藉由上述方法形成寬度為大約3至40nm之奈米結構(例如奈米線)係以大約6至80nm的間隔配置之圖案。在其他實施態樣中,可實施以大約6至80nm之間隔配置具有例如直徑為大約3至40nm之寬度的奈米孔。 For example, a nanostructure (e.g., a nanowire) having a width of about 3 to 40 nm can be formed by a pattern of about 6 to 80 nm at intervals. In other embodiments, a nanopore having a width of, for example, a diameter of about 3 to 40 nm may be disposed at intervals of about 6 to 80 nm.

此外,在該結構中,可形成具有高縱橫比之奈米線或奈米孔。 Further, in this structure, a nanowire or a nanopore having a high aspect ratio can be formed.

在該方法中,選擇性移除嵌段共聚物之任一嵌段的方法無特別限制,及例如可使用藉由對聚合物層照射適當電磁波(例如紫外線)來移除相對柔軟嵌段的方 法。在該情況下,紫外線輻射之條件可根據該嵌段共聚物之嵌段的類型決定,及可照射波長為大約254nm之紫外線1至60分鐘。 In the method, the method of selectively removing any block of the block copolymer is not particularly limited, and for example, a method of removing a relatively soft block by irradiating a polymer layer with an appropriate electromagnetic wave (for example, ultraviolet ray) may be used. law. In this case, the conditions of the ultraviolet radiation may be determined depending on the type of the block of the block copolymer, and the ultraviolet rays having a wavelength of about 254 nm may be irradiated for 1 to 60 minutes.

此外,在紫外線照射之後,該聚合物層可經酸處理以進一步移除該紫外線降解的片段。 Further, after ultraviolet irradiation, the polymer layer may be acid treated to further remove the ultraviolet-degraded fragment.

此外,可藉由反應性離子蝕刻使用CF4/Ar離子來進行使用已選擇性移除嵌段之聚合物層的基板之蝕刻,然後進行上述程序,及可進一步進行藉由氧電漿處理從該基板移除該聚合物層。 In addition, etching of the substrate using the polymer layer from which the block has been selectively removed may be performed by reactive ion etching using CF 4 /Ar ions, followed by the above procedure, and further processing by oxygen plasma treatment may be performed. The substrate removes the polymer layer.

圖1至6顯示聚合物層之SEM影像。 Figures 1 to 6 show SEM images of polymer layers.

圖7至11顯示GISAXS繞射圖案。 Figures 7 through 11 show the GISAXS diffraction pattern.

圖13至14顯示聚合物層之SEM影像。 Figures 13 through 14 show SEM images of polymer layers.

效果 effect

本申請案可提供具有優異自組合及相分離性質且因此可有效用於各種不同應用之嵌段共聚物。本申請案亦可提供該等嵌段共聚物之應用。 The present application can provide block copolymers having excellent self-combination and phase separation properties and thus can be effectively used in a variety of different applications. The application of such block copolymers can also be provided in the present application.

下文茲參考實施例及比較實例詳細說明本申請案,但本申請案範圍不侷限於下列實例。 The present application is described in detail below with reference to the embodiments and comparative examples, but the scope of the application is not limited to the following examples.

1. NMR分析 NMR analysis

NMR分析係在室溫下使用包括具有三重共振5mm探針之Varian Unity Inova(500MHz)光譜儀進行。待分析之樣本係在將其稀釋於供NMR分析用之溶劑(CDCl3)中達濃度為大約10mg/ml之後使用,且化學位移(δ)係以ppm表示。 NMR analysis was performed at room temperature using a Varian Unity Inova (500 MHz) spectrometer including a triple resonance 5 mm probe. The sample to be analyzed was used after diluting it in a solvent for NMR analysis (CDCl 3 ) to a concentration of about 10 mg/ml, and the chemical shift (δ) was expressed in ppm.

<縮寫> <abbreviation>

br=寬信號,s=單態,d=二重態,dd=雙重二重態,t=三重態,dt=雙重三重態,q=四重態,p=五重態,m=多重態 Br = wide signal, s = singlet, d = doublet, dd = doublet, t = triplet, dt = double triplet, q = quadruple, p = pentad, m = multiplet

2. GPC(凝膠滲透層析) 2. GPC (gel permeation chromatography)

數量平均分子量及多分散性係藉由GPC(凝膠滲透層析)測量。在5mL之小瓶中置入實施例及比較實例之待測量嵌段共聚物或巨分子引發劑(macroinitiator),然後稀釋至濃度為約1mg/mL。然後,藉由注射器過濾器(孔徑:0.45μm)過濾用於校正之標準樣本及待分析之樣本,然後分析之。使用得自Agilent technologies,Co.之ChemStation作為分析程式。藉由比較樣本之溶析時間與校正曲線而獲得數量平均分子量(Mn)及重量平均分子量(Mw),然後從其比(Mw/Mn)獲得多分散性(PDI)。GPC之測量條件如下。 The number average molecular weight and polydispersity are measured by GPC (gel permeation chromatography). The block copolymer or macroinitiator to be measured of the examples and comparative examples was placed in a 5 mL vial and then diluted to a concentration of about 1 mg/mL. Then, the standard sample for calibration and the sample to be analyzed were filtered by a syringe filter (pore size: 0.45 μm), and then analyzed. ChemStation from Agilent Technologies, Co. was used as an analytical program. The number average molecular weight (Mn) and the weight average molecular weight (Mw) were obtained by comparing the elution time of the sample with the calibration curve, and then the polydispersity (PDI) was obtained from the ratio (Mw/Mn). The measurement conditions of GPC are as follows.

<GPC測量條件> <GPC measurement conditions>

裝置:得自Agilent technologies,Co.之1200系列 Device: 1200 Series from Agilent technologies, Co.

管柱:使用兩個得自Polymer laboratories,Co.之PLgel mixed B String: Use two PLgel mixed B from Polymer laboratories, Co.

溶劑:THF Solvent: THF

管柱溫度:35℃ Column temperature: 35 ° C

樣本濃度:1mg/mL,200L注射 Sample concentration: 1mg/mL, 200L injection

標準樣本:聚苯乙烯(Mp:3900000,723000,316500,52200,31400,7200,3940,485) Standard sample: polystyrene (Mp: 3900000, 723000, 316500, 52200, 31400, 7200, 3940, 485)

3. GISAXS(掠角入射小角度X射線散射) 3. GISAXS (grazing angle incident small angle X-ray scattering)

GISAXS分析係在Pohang Light Source之3C beam line中進行。塗覆溶液係藉由將待評估之嵌段共聚物溶解於氟苯中以使固體含量為0.7重量%而製備,將該塗覆溶液旋塗於基板上至具有約5nm之厚度。塗覆面積係控制為約2.25cm2(塗覆面積:寬度=1.5cm,長度=1.5cm)。在室溫下乾燥塗層約1小時,然後在約160℃進行熱退火約1小時,以實現相分離結構。因此,形成已實現相分離結構之層。以X射線照射所形成之層以使入射角為約0.12度至0.23度(其對應於介於該層的臨界角與該基板的臨界角之間的角度),然後使用2D marCCD獲得從該層散射之X射線繞射圖案。此時,該層至偵測器之距離可經選擇以能在約2m至3m之範圍內有效觀察該層中的自組合圖案。至於基板,係使用具有親水性表面之基板 (經食人魚溶液處理且在室溫下對於純水的濕潤角為約5度之聚矽氧基板)或具有疏水性表面之基板(經HMDS(六甲基二矽氮烷)處理且在室溫下對於純水的濕潤角為約60度之聚矽氧基板)。 GISAXS analysis was performed in the 3C beam line of Pohang Light Source. The coating solution was prepared by dissolving the block copolymer to be evaluated in fluorobenzene to have a solid content of 0.7% by weight, and the coating solution was spin-coated on the substrate to have a thickness of about 5 nm. The coating area was controlled to be about 2.25 cm 2 (coating area: width = 1.5 cm, length = 1.5 cm). The coating was dried at room temperature for about 1 hour and then thermally annealed at about 160 ° C for about 1 hour to achieve a phase separation structure. Therefore, a layer in which the phase separation structure has been realized is formed. The layer formed by X-ray irradiation is such that the incident angle is about 0.12 degrees to 0.23 degrees (which corresponds to an angle between the critical angle of the layer and the critical angle of the substrate), and then the layer is obtained from the layer using a 2D marCCD. The scattered X-ray diffraction pattern. At this point, the distance from the layer to the detector can be selected to effectively observe the self-combining pattern in the layer in the range of about 2 m to 3 m. As for the substrate, a substrate having a hydrophilic surface (polyoxyl plate treated with a piranha solution and having a wet angle of about 5 degrees at room temperature) or a substrate having a hydrophobic surface (via HMDS (six) Methyl diazonium) is a polymethoxyl plate treated at room temperature with a wetting angle of about 60 degrees for pure water.

4. XRD分析 4. XRD analysis

XRD圖案係藉由使X射線通過Pohang Light Source之4C beam line中的樣本測量丁根據散射向量(q)測量散射強度來評估。作為樣本,使用藉由將未進行任何特定預處理的嵌段共聚物純化以移除雜質而從彼所獲得之粉末,然後將其置於供XRD測量用之單元中。在XRD圖案分析期間,使用垂直尺寸為0.023mm且水平尺寸為0.3mm之X射線作為X射線,且使用測量裝置(例如,2D marCCD)作為偵測器。以影像形式獲得從該樣本散射之2D繞射圖案。諸如散射向量及FWHM等資訊係使用藉由最小平方技術的數值分析來分析所獲得之繞射圖案而獲得。該分析係藉由Origin程式進行。XRD繞射圖案具有最低強度之位置成為基線且將該最低強度轉換成零,然後針對XRD圖案中之峰的輪廓進行高斯擬合,然後從該高斯擬合之結果獲得散射向量(q)及FWHM。高斯擬合之R平方設為0.96或更大。 The XRD pattern was evaluated by measuring the scattering intensity from the sample in the 4C beam line of the Pohang Light Source by measuring the scattering intensity according to the scattering vector (q). As a sample, a powder obtained by purifying a block copolymer which was not subjected to any specific pretreatment to remove impurities was used, and then placed in a unit for XRD measurement. During XRD pattern analysis, X-rays having a vertical dimension of 0.023 mm and a horizontal dimension of 0.3 mm were used as X-rays, and a measuring device (for example, 2D marCCD) was used as a detector. A 2D diffraction pattern scattered from the sample is obtained in the form of an image. Information such as scattering vectors and FWHM is obtained by analyzing the obtained diffraction pattern by numerical analysis of the least squares technique. The analysis was performed by the Origin program. The XRD diffraction pattern has the lowest intensity position as the baseline and converts the lowest intensity to zero, then performs a Gaussian fit on the contour of the peak in the XRD pattern, and then obtains the scattering vector (q) and FWHM from the Gaussian fitting result. . The R square of the Gaussian fit is set to 0.96 or more.

5. 表面能測量 5. Surface energy measurement

表面能係使用液滴形狀分析儀(得自KRUSS, Co.之DSA產品)測量。表面能係針對藉由將待評估之材料溶解於氟苯中使固體含量為約2重量%所製備之塗覆溶液旋塗於矽晶圓上,使該塗層的厚度為50nm(塗覆面積:寬度=2cm,長度=2cm),且在室溫下乾燥該塗層約1小時,然後在160℃下對其進行熱退火約1小時所製備之聚合物層評估。重複將表面張力已知之去離子水滴在熱退火後之層上然後獲得其接觸角的程序5次,並計算所獲得之5個接觸角的平均值。相同地,重複將表面張力已知之二碘甲烷滴在熱退火後之層上然後獲得其接觸角的程序5次,並計算所獲得之5個接觸角的平均值。表面能係藉由Owens-Wendt-Rabel-Kaelble法使用所獲得之去離子水及二碘甲烷的接觸角平均值並代入關於溶劑表面張力的值(Strom值)而獲得。該嵌段共聚物之各嵌段的表面能係如上述針對僅由形成該嵌段的單體所製備之同元聚合物而獲得。 Surface energy using a droplet shape analyzer (available from KRUSS, Co. DSA product) measurement. The surface energy is applied to the tantalum wafer by spin coating the coating solution prepared by dissolving the material to be evaluated in fluorobenzene to a solid content of about 2% by weight, so that the coating has a thickness of 50 nm (coating area). : width = 2 cm, length = 2 cm), and the coating was dried at room temperature for about 1 hour, and then subjected to thermal annealing at 160 ° C for evaluation of the polymer layer prepared for about 1 hour. The procedure of deionized water droplets having a known surface tension on the layer after thermal annealing was then repeated 5 times, and the average of the obtained 5 contact angles was calculated. Similarly, the procedure of dropping the diiodomethane having a known surface tension on the layer after the thermal annealing and then obtaining the contact angle thereof was repeated 5 times, and the average value of the obtained five contact angles was calculated. The surface energy was obtained by using the Owens-Wendt-Rabel-Kaelble method using the average value of the contact angle of deionized water and diiodomethane obtained and substituting the value of the surface tension of the solvent (Strom value). The surface energy of each block of the block copolymer is obtained as described above for the homopolymer prepared only from the monomer forming the block.

6. 體積分率測量 6. Volume fraction measurement

根據藉由GPC(凝膠滲透層析)所測量之分子量及室溫下之密度來計算該嵌段共聚物各嵌段的體積分率。前文中,密度係藉由浮力法測量,明確地說,係藉由在質量及於空氣中之密度為已知的溶劑(乙醇)中測量之樣本的質量來計算。 The volume fraction of each block of the block copolymer was calculated from the molecular weight measured by GPC (gel permeation chromatography) and the density at room temperature. In the foregoing, the density is measured by the buoyancy method, specifically, by the mass of the sample measured in the mass and the density in air in a known solvent (ethanol).

製備實例1. 合成單體(A) Preparation Example 1. Synthetic monomer (A)

藉由下述方法合成式A之化合物(DPM-C12)。於250mL燒瓶中,添加氫醌(10.0g,94.2mmole)及1-溴十二烷(23.5g,94.2mmole)並溶解於100mL乙腈中,於其中添加過量碳酸鉀,然後在75℃於氮下反應該混合物48小時。反應之後,移除用於該反應之殘留的碳酸鉀及乙腈。藉由添加二氯甲烷(DCM)及水之混合溶劑來進行處理,並收集分離的有機層且經由MgSO4脫水。隨後,使用DCM經由管柱層析術獲得白色固態中間物,產率為大約37%。 The compound of the formula A (DPM-C12) was synthesized by the following method. In a 250 mL flask, hydroquinone (10.0 g, 94.2 mmole) and 1-bromododecane (23.5 g, 94.2 mmole) were added and dissolved in 100 mL of acetonitrile, and excess potassium carbonate was added thereto, followed by nitrogen at 75 ° C. The mixture was reacted for 48 hours. After the reaction, the residual potassium carbonate and acetonitrile used in the reaction were removed. Treatment was carried out by adding a mixed solvent of dichloromethane (DCM) and water, and the separated organic layer was collected and dried over MgSO 4 . Subsequently, a white solid intermediate was obtained via column chromatography using DCM with a yield of approximately 37%.

<中間物之NMR分析結果> <Results of NMR analysis of intermediates>

1H-NMR(CDCl3):δ6.77(dd,4H);δ4.45(s,1H);δ3.89(t,2H);δ1.75(p,2H);δ1.43(p,2H);δ1.33-1.26(m,16H);δ0.88(t,3H)。 1 H-NMR (CDCl 3 ): δ 6.77 (dd, 4H); δ 4.45 (s, 1H); δ 3.89 (t, 2H); δ 1.75 (p, 2H); δ 1.43 (p , 2H); δ 1.33-1.26 (m, 16H); δ 0.88 (t, 3H).

將該合成之中間物(9.8g,35.2mmole)、甲基丙烯酸(6.0g,69.7mmole)、二環己基碳二醯亞胺、(DCC;10.8g,52.3mmole)及對二甲胺基吡啶(DMPA;1.7g,13.9mmol)置入燒瓶,添加120ml之二氯甲烷,並在室溫於氮下進行反應24小時。在反應完成之後,經由過濾器移除在反應中產生之脲鹽,且亦移除殘留的二氯甲烷。雜質係經由管柱層析術使用己烷及DCM(二氯甲烷)作為流動相予以移除,且在甲醇及水之混合溶劑(以1:1重量比混合)中再結晶所獲得之產物,從而獲得白色固態產物(DPM-C12)(7.7g,22.2 mmol),產率為63%。 The synthesized intermediate (9.8 g, 35.2 mmole), methacrylic acid (6.0 g, 69.7 mmole), dicyclohexylcarbodiimide, (DCC; 10.8 g, 52.3 mmole) and p-dimethylaminopyridine (DMPA; 1.7 g, 13.9 mmol) was placed in a flask, 120 ml of dichloromethane was added, and the reaction was carried out under nitrogen at room temperature for 24 hours. After the reaction was completed, the urea salt produced in the reaction was removed via a filter, and residual dichloromethane was also removed. The impurities were removed by column chromatography using hexane and DCM (dichloromethane) as a mobile phase, and the product obtained by recrystallization in a mixed solvent of methanol and water (mixed in a 1:1 weight ratio), Thereby obtaining a white solid product (DPM-C12) (7.7g, 22.2 Methyl), yield 63%.

<NMR分析結果> <NMR analysis results>

1H-NMR(CDCl3):δ7.02(dd,2H);δ6.89(dd,2H);δ6.32(dt,1H);δ5.73(dt,1H);δ3.94(t,2H);δ2.05(dd,3H);δ1.76(p,2H);δ1.43(p,2H);1.34-1.27(m,16H);δ0.88(t,3H)。 1 H-NMR (CDCl 3 ): δ 7.02 (dd, 2H); δ 6.89 (dd, 2H); δ 6.32 (dt, 1H); δ 5.73 (dt, 1H); δ 3.94 (t) , 2H); δ2.05 (dd, 3H); δ 1.76 (p, 2H); δ 1.43 (p, 2H); 1.34-1.27 (m, 16H); δ 0.88 (t, 3H).

前文中,R為具有12個碳原子之直鏈烷基。 In the above, R is a linear alkyl group having 12 carbon atoms.

製備實例2. 合成單體(G) Preparation Example 2. Synthetic monomer (G)

下式G之化合物係根據製備實例1之方法合成,惟獨使用1-溴丁烷代替1-溴十二烷。針對上述化合物之NMR分析結果係如下。 The compound of the following formula G was synthesized according to the method of Preparation Example 1, except that 1-bromobutane was used instead of 1-bromododecane. The NMR analysis results for the above compounds are as follows.

<針對DPM-C4之NMR分析結果> <NMR analysis results for DPM-C4>

1H-NMR(CDCl3):δ7.02(dd,2H);δ6.89(dd,2H);δ6.33(dt,1H);δ5.73(dt,1H);δ3.95(t,2H);δ2.06(dd,3H);δ1.76(p,2H);δ1.49(p,2H);δ0.98(t,3H)。 1 H-NMR (CDCl 3 ): δ 7.02 (dd, 2H); δ 6.89 (dd, 2H); δ 6.33 (dt, 1H); δ 5.73 (dt, 1H); δ 3.95 (t) , 2H); δ2.06 (dd, 3H); δ 1.76 (p, 2H); δ 1.49 (p, 2H); δ 0.98 (t, 3H).

前文中,R為具有4個碳原子之直鏈烷基。 In the above, R is a linear alkyl group having 4 carbon atoms.

製備實例3. 合成單體(B) Preparation Example 3. Synthetic monomer (B)

下式B之化合物係根據製備實例1之方法合成,惟獨使用1-溴辛烷代替1-溴十二烷。針對上述化合物之NMR分析結果係如下。 The compound of the following formula B was synthesized according to the method of Preparation Example 1, except that 1-bromooctane was used instead of 1-bromododecane. The NMR analysis results for the above compounds are as follows.

<針對DPM-C8之NMR分析結果> <NMR analysis results for DPM-C8>

1H-NMR(CDCl3):δ7.02(dd,2H);δ6.89(dd,2H);δ6.32(dt,1H);δ5.73(dt,1H);δ3.94(t,2H);δ2.05(dd,3H);δ1.76(p,2H);δ1.45(p,2H);1.33-1.29(m,8H);δ0.89(t,3H)。 1 H-NMR (CDCl 3 ): δ 7.02 (dd, 2H); δ 6.89 (dd, 2H); δ 6.32 (dt, 1H); δ 5.73 (dt, 1H); δ 3.94 (t) , 2H); δ2.05 (dd, 3H); δ 1.76 (p, 2H); δ 1.45 (p, 2H); 1.33-1.29 (m, 8H); δ 0.89 (t, 3H).

前文中,R為具有8個碳原子之直鏈烷基。 In the above, R is a linear alkyl group having 8 carbon atoms.

製備實例4. 合成單體(C) Preparation Example 4. Synthetic monomer (C)

下式C之化合物(DPM-C10)係根據製備實例1之方法合成,惟獨使用1-溴癸烷代替1-溴十二烷。 針對上述化合物之NMR分析結果係如下。 The compound of the following formula C (DPM-C10) was synthesized according to the method of Preparation Example 1, except that 1-bromodecane was used instead of 1-bromododecane. The NMR analysis results for the above compounds are as follows.

<針對DPM-C10之NMR分析結果> <NMR analysis results for DPM-C10>

1H-NMR(CDCl3):δ7.02(dd,2H);δ6.89(dd,2H);δ6.33(dt,1H);δ5.72(dt,1H);δ3.94(t,2H);δ2.06(dd,3H);δ1.77(p,2H);δ1.45(p,2H);1.34-1.28(m,12H);δ0.89(t,3H)。 1 H-NMR (CDCl 3 ): δ 7.02 (dd, 2H); δ 6.89 (dd, 2H); δ 6.33 (dt, 1H); δ 5.72 (dt, 1H); δ 3.94 (t) , 2H); δ2.06 (dd, 3H); δ 1.77 (p, 2H); δ 1.45 (p, 2H); 1.34-1.28 (m, 12H); δ 0.89 (t, 3H).

前文中,R為具有10個碳原子之直鏈烷基。 In the above, R is a linear alkyl group having 10 carbon atoms.

製備實例5. 合成單體(D) Preparation Example 5. Synthetic monomer (D)

下式D之化合物係根據製備實例1之方法合成,惟獨使用1-溴十四烷代替1-溴十二烷。針對上述化合物之NMR分析結果係如下。 The compound of the following formula D was synthesized according to the method of Preparation Example 1, except that 1-bromotetradecane was used instead of 1-bromododecane. The NMR analysis results for the above compounds are as follows.

<針對DPM-C14之NMR分析結果> <NMR analysis results for DPM-C14>

1H-NMR(CDCl3):δ7.02(dd,2H);δ6.89(dd,2H);δ6.33(dt,1H);δ5.73(dt,1H);δ3.94(t,2H);δ2.05(dd,3H);δ1.77(p,2H);δ1.45(p,2H);1.36-1.27(m,20H);δ0.88(t,3H.)。 1 H-NMR (CDCl 3 ): δ 7.02 (dd, 2H); δ 6.89 (dd, 2H); δ 6.33 (dt, 1H); δ 5.73 (dt, 1H); δ 3.94 (t) , 2H); δ2.05 (dd, 3H); δ 1.77 (p, 2H); δ 1.45 (p, 2H); 1.36-1.27 (m, 20H); δ 0.88 (t, 3H.).

前文中,R為具有14個碳原子之直鏈烷基。 In the above, R is a linear alkyl group having 14 carbon atoms.

製備實例6. 合成單體(E) Preparation Example 6. Synthetic monomer (E)

下式E之化合物係根據製備實例1之方法合成,惟獨使用1-溴十六烷代替1-溴十二烷。針對上述化合物之NMR分析結果係如下。 The compound of the following formula E was synthesized according to the method of Preparation Example 1, except that 1-bromohexadecane was used instead of 1-bromododecane. The NMR analysis results for the above compounds are as follows.

<針對DPM-C16之NMR分析結果> <NMR analysis results for DPM-C16>

1H-NMR(CDCl3):δ7.01(dd,2H);δ6.88(dd,2H);δ6.32(dt,1H);δ5.73(dt,1H);δ3.94(t,2H);δ2.05(dd,3H);δ1.77(p,2H);δ1.45(p,2H);1.36-1.26(m,24H);δ0.89(t,3H)。 1 H-NMR (CDCl 3 ): δ 7.01 (dd, 2H); δ 6.88 (dd, 2H); δ 6.32 (dt, 1H); δ 5.73 (dt, 1H); δ 3.94 (t , 2H); δ2.05 (dd, 3H); δ 1.77 (p, 2H); δ 1.45 (p, 2H); 1.36-1.26 (m, 24H); δ 0.89 (t, 3H).

前文中,R為具有16個碳原子之直鏈烷基。 In the above, R is a linear alkyl group having 16 carbon atoms.

實施例1 Example 1

將2.0g之製備實例1的化合物(DPM-C12)、64mg之RAFT(可逆加成斷裂鏈轉移)劑(二硫 代苯甲酸氰基異丙酯)、23mg之AIBN(偶氮雙異丁腈)及5.34mL之苯添加至10mL燒瓶,然後在室溫下攪拌30分鐘,然後在70℃進行RAFT(可逆加成斷裂鏈轉移)聚合4小時。在聚合之後,使經反應溶液在為萃取溶劑之250ml甲醇中沉澱,真空過濾並乾燥之以獲得粉紅色巨分子引發劑。該巨分子引發劑之產率為約86%,且其數量平均分子量(Mn)及多分散性(Mw/Mn)分別為9,000及1.16。 2.0 g of the compound of Preparation Example 1 (DPM-C12), 64 mg of RAFT (reversible addition fragmentation chain transfer) agent (disulfide) Benzyl isopropyl benzoate), 23 mg of AIBN (azobisisobutyronitrile) and 5.34 mL of benzene were added to a 10 mL flask, then stirred at room temperature for 30 minutes, and then subjected to RAFT at 70 ° C (reversible addition) The cleavage chain transfer) was polymerized for 4 hours. After the polymerization, the reaction solution was precipitated in 250 ml of methanol as an extraction solvent, vacuum filtered and dried to obtain a pink macromolecule initiator. The macroinitiator yield was about 86%, and its number average molecular weight (Mn) and polydispersity (Mw/Mn) were 9,000 and 1.16, respectively.

將0.3g之該巨分子引發劑、2.7174g之五氟苯乙烯及1.306mL之苯添加至10mL Schlenk燒瓶,然後在室溫下攪拌30分鐘,然後於115℃進行RAFT(可逆加成斷裂鏈轉移)聚合4小時。在聚合之後,使經反應溶液在為萃取溶劑之250mL甲醇中沉澱,真空過濾並乾燥之以獲得淺粉紅色嵌段共聚物。該嵌段共聚物之產率為約18%,且其數量平均分子量(Mn)及多分散性(Mw/Mn)分別為16,300及1.13。嵌段共聚物包括從製備實例1之單體(A)衍生的第一嵌段及從該五氟苯乙烯衍生的第二嵌段。 0.3 g of the macroinitiator, 2.7174 g of pentafluorostyrene and 1.306 mL of benzene were added to a 10 mL Schlenk flask, then stirred at room temperature for 30 minutes, and then subjected to RAFT at 115 ° C (reversible addition fragmentation chain transfer) ) Polymerization for 4 hours. After the polymerization, the reacted solution was precipitated in 250 mL of methanol as an extraction solvent, vacuum filtered and dried to obtain a light pink block copolymer. The yield of the block copolymer was about 18%, and the number average molecular weight (Mn) and polydispersity (Mw/Mn) thereof were 16,300 and 1.13, respectively. The block copolymer includes a first block derived from the monomer (A) of Preparation Example 1 and a second block derived from the pentafluorostyrene.

實施例2 Example 2

以與實施例1相同方法製備嵌段共聚物,惟獨使用製備實例3之單體(B)代替製備實例1之單體(A)以及使用五氟苯乙烯來製備巨分子引發劑。嵌段共聚物包括從製備實例3之單體(B)衍生的第一嵌段及從 該五氟苯乙烯衍生的第二嵌段。 A block copolymer was prepared in the same manner as in Example 1, except that the monomer (B) of Preparation Example 3 was used instead of the monomer (A) of Preparation Example 1 and pentafluorostyrene was used to prepare a macroinitiator. The block copolymer includes the first block derived from the monomer (B) of Preparation Example 3 and The pentafluorostyrene derived second block.

實施例3 Example 3

以與實施例1相同方法製備嵌段共聚物,惟獨使用製備實例4之單體(C)代替製備實例1之單體(A)以及使用五氟苯乙烯來製備巨分子引發劑。嵌段共聚物包括從製備實例4之單體(C)衍生的第一嵌段及從該五氟苯乙烯衍生的第二嵌段。 A block copolymer was prepared in the same manner as in Example 1, except that the monomer (C) of Preparation Example 4 was used instead of the monomer (A) of Preparation Example 1 and pentafluorostyrene was used to prepare a macroinitiator. The block copolymer includes a first block derived from the monomer (C) of Preparation Example 4 and a second block derived from the pentafluorostyrene.

實施例4 Example 4

以與實施例1相同方法製備嵌段共聚物,惟獨使用製備實例5之單體(D)代替製備實例1之單體(A)以及使用五氟苯乙烯來製備巨分子引發劑。嵌段共聚物包括從製備實例5之單體(D)衍生的第一嵌段及從該五氟苯乙烯衍生的第二嵌段。 A block copolymer was prepared in the same manner as in Example 1, except that the monomer (D) of Preparation Example 5 was used instead of the monomer (A) of Preparation Example 1 and pentafluorostyrene was used to prepare a macroinitiator. The block copolymer included a first block derived from the monomer (D) of Preparation Example 5 and a second block derived from the pentafluorostyrene.

實施例5 Example 5

以與實施例1相同方法製備嵌段共聚物,惟獨使用製備實例6之單體(E)代替製備實例1之單體(A)以及使用五氟苯乙烯來製備巨分子引發劑。嵌段共聚物包括從製備實例6之單體(E)衍生的第一嵌段及從該五氟苯乙烯衍生的第二嵌段。 A block copolymer was prepared in the same manner as in Example 1, except that the monomer (E) of Preparation Example 6 was used instead of the monomer (A) of Preparation Example 1 and pentafluorostyrene was used to prepare a macroinitiator. The block copolymer included a first block derived from the monomer (E) of Preparation Example 6 and a second block derived from the pentafluorostyrene.

比較實例1 Comparative example 1

以與實施例1相同方法製備嵌段共聚物,惟獨使用製備實例2之單體(G)代替製備實例1之單體(A)以及使用五氟苯乙烯來製備巨分子引發劑。嵌段共聚物包括從製備實例2之單體(G)衍生的第一嵌段及從該五氟苯乙烯衍生的第二嵌段。 A block copolymer was prepared in the same manner as in Example 1, except that the monomer (G) of Preparation Example 2 was used instead of the monomer (A) of Preparation Example 1 and pentafluorostyrene was used to prepare a macroinitiator. The block copolymer includes a first block derived from the monomer (G) of Preparation Example 2 and a second block derived from the pentafluorostyrene.

比較實例2 Comparative example 2

以與實施例1相同方法製備嵌段共聚物,惟獨使用甲基丙烯酸4-甲氧苯酯代替製備實例1之單體(A)以及使用五氟苯乙烯來製備巨分子引發劑。嵌段共聚物包括從甲基丙烯酸4-甲氧苯酯衍生的第一嵌段及從該五氟苯乙烯衍生的第二嵌段。 A block copolymer was prepared in the same manner as in Example 1, except that 4-methoxyphenyl methacrylate was used instead of the monomer (A) of Preparation Example 1 and pentafluorostyrene was used to prepare a macroinitiator. The block copolymer includes a first block derived from 4-methoxyphenyl methacrylate and a second block derived from the pentafluorostyrene.

比較實例3 Comparative example 3

以與實施例1相同方法製備嵌段共聚物,惟獨使用甲基丙烯酸十二酯代替製備實例1之單體(A)以及使用五氟苯乙烯來製備巨分子引發劑。嵌段共聚物包括從甲基丙烯酸十二酯衍生的第一嵌段及從該五氟苯乙烯衍生的第二嵌段。 A block copolymer was prepared in the same manner as in Example 1, except that the dodecyl methacrylate was used instead of the monomer (A) of Preparation Example 1 and pentafluorostyrene was used to prepare a macroinitiator. The block copolymer includes a first block derived from dodecyl methacrylate and a second block derived from the pentafluorostyrene.

關於巨分子引發劑及實施例之嵌段共聚物的GPC結果係列於表1。 The GPC results for the macroinitiator and the block copolymer of the examples are shown in Table 1.

測試實例1. 表面能測量 Test example 1. Surface energy measurement

對如上述製備之共聚物評估的表面能係列於下表2。 The surface energies evaluated for the copolymers prepared as described above are listed in Table 2 below.

測試實例2. 自組合性質測量 Test Example 2. Self-combination property measurement

自組合聚合物層係藉由將實施例或比較實例之嵌段共聚物溶解於氟苯中至固體含量為約0.7重量%所製備的塗覆溶液旋塗在矽晶圓上,使塗覆厚度為5nm(塗覆面積:寬度×長度=1.5cm×1.5cm),且於室溫下乾燥1小時,然後在約160℃下對其進行熱退火1小時而獲得。然後,獲得該形成之聚合物層的SEM(掃描式電子顯 微鏡)影像。圖1至5分別為實施例1至5的結果。從圖式確認,在實施例之嵌段共聚物的情況下,有效形成具有線狀圖案的自組合聚合物層。然而,在比較實例中未實現適當相分離。例如,圖6為比較實例3之SEM結果,且確認未實現有效相分離。 The self-assembled polymer layer is spin-coated on a tantalum wafer by dissolving the block copolymer of the embodiment or the comparative example in fluorobenzene to a solid content of about 0.7% by weight to make a coating thickness. It was obtained by 5 nm (coating area: width × length = 1.5 cm × 1.5 cm), and dried at room temperature for 1 hour, and then thermally annealed at about 160 ° C for 1 hour. Then, SEM (scanned electronic display) of the formed polymer layer is obtained Micromirror) image. 1 to 5 are the results of Examples 1 to 5, respectively. It was confirmed from the drawings that in the case of the block copolymer of the example, the self-assembled polymer layer having a linear pattern was efficiently formed. However, proper phase separation was not achieved in the comparative example. For example, FIG. 6 is the SEM result of Comparative Example 3, and it was confirmed that effective phase separation was not achieved.

測試實例3. Test example 3.

此外,根據與實施例1相同之方法製備具有不同體積分率的嵌段共聚物,惟獨控制單體與巨分子引發劑之莫耳比。 Further, block copolymers having different volume fractions were prepared according to the same method as in Example 1, except that the molar ratio of the monomer to the macroinitiator was controlled.

體積分率如下。 The volume fraction is as follows.

根據藉由GPC(凝膠滲透層析)所測量之分子量及室溫下之密度來計算該嵌段共聚物各嵌段的體積分率。前文中,密度係藉由浮力法測量,明確地說,係藉由在質量及於空氣中之密度為已知的溶劑(乙醇)中之質量計算,並根據上述方法進行GPC。 The volume fraction of each block of the block copolymer was calculated from the molecular weight measured by GPC (gel permeation chromatography) and the density at room temperature. In the foregoing, the density is measured by the buoyancy method, specifically, by mass in a known solvent (ethanol) in mass and density in air, and GPC is carried out according to the above method.

聚合物層係藉由將各樣本之嵌段共聚物溶解於氟苯中至固體含量為約0.7重量%所製備的塗覆溶液旋塗在矽晶圓上,使塗覆厚度為5nm(塗覆面積:寬度=1.5 cm,長度=1.5cm),且於室溫下乾燥1小時,然後在約160℃下對其進行熱退火1小時而獲得。然後,進行GISAXS且結果係圖示於圖式中。圖7至9分別為樣本1至3的結果。從該等圖式可確認,針對樣本1至3觀察到面內相繞射圖案。 The polymer layer was spin-coated on the tantalum wafer by dissolving the block copolymer of each sample in fluorobenzene to a solid content of about 0.7% by weight to a coating thickness of 5 nm (coating) Area: width = 1.5 Cm, length = 1.5 cm), and dried at room temperature for 1 hour and then thermally annealed at about 160 ° C for 1 hour. Then, GISAXS is performed and the results are shown in the drawing. Figures 7 to 9 are the results of samples 1 to 3, respectively. From these figures, it was confirmed that the in-plane phase diffraction pattern was observed for the samples 1 to 3.

測試實例3. GISAXS繞射圖案確認 Test example 3. GISAXS diffraction pattern confirmation

圖10顯示針對實施例1之嵌段共聚物在室溫下對於純水之接觸角為約5度的親水性表面進行之GISAXS(掠角入射小角度X射線散射)分析結果,而圖11顯示針對實施例1之嵌段共聚物在室溫下對於純水之接觸角為約60度的疏水性表面進行之GISAXS(掠角入射小角度X射線散射)分析結果。從圖10及11可確認在任何情況下均觀察到面內相繞射圖案。從上述,可確認該嵌段共聚物可顯示對於各種基板之垂直對準性質。 Figure 10 shows the results of a GISAXS (grazing angle incident small angle X-ray scattering) analysis of the hydrophilic surface of the block copolymer of Example 1 at room temperature for a contact angle of about 5 degrees with respect to pure water, and Figure 11 shows The results of the GISAXS (grazing angle incidence small angle X-ray scattering) analysis of the hydrophobic surface of the block copolymer of Example 1 at room temperature for a contact angle of pure water of about 60 degrees. It can be confirmed from Figs. 10 and 11 that the in-plane phase diffraction pattern was observed in any case. From the above, it was confirmed that the block copolymer can exhibit vertical alignment properties for various substrates.

另外,藉由使用實施例1之嵌段共聚物,以上述相同方法形成聚合物層。聚合物層分別形成於下列基板上:經食人魚溶液處理且在室溫下的純水接觸角為5度之聚矽氧基板、在室溫下的純水接觸角為45度之氧化矽基板,及在室溫下的純水接觸角為60度之經HMDS(六甲基二矽氮烷)處理的聚矽氧基板。圖13至15分別為關於在接觸角為5度、45度及60度之表面上的聚合物層之SEM影像。從該等圖式可確認,無論基板表面性質為何,嵌段共聚物均形成相分離結構。 Further, a polymer layer was formed in the same manner as described above by using the block copolymer of Example 1. The polymer layers are respectively formed on the following substrates: a polymethoxyl plate treated with a piranha solution and having a pure water contact angle of 5 degrees at room temperature, and a cerium oxide substrate having a pure water contact angle of 45 degrees at room temperature. And a HMDS (hexamethyldioxane)-treated polydecyloxy plate having a pure water contact angle of 60 degrees at room temperature. 13 to 15 are SEM images of polymer layers on surfaces having contact angles of 5, 45 and 60, respectively. From these figures, it was confirmed that the block copolymer forms a phase separation structure regardless of the surface properties of the substrate.

測試實例4. XRD分析 Test Example 4. XRD Analysis

根據上述方法對於嵌段共聚物所進行之XRD分析的結果係列於下表3(在比較實例3之情況下,在0.5nm-1至10nm-1之散射向量範圍內未觀察到峰)。 The results of the XRD analysis performed on the block copolymer according to the above method are shown in the following Table 3 (in the case of Comparative Example 3, no peak was observed in the range of scattering vectors of 0.5 nm -1 to 10 nm -1 ).

測試實例5. 嵌段共聚物之性質測量 Test Example 5. Measurement of properties of block copolymer

如上述方法所測量之關於各嵌段共聚物的評估結果係列於下表。 The evaluation results for each block copolymer as measured by the above method are summarized in the following table.

Claims (10)

一種嵌段共聚物,其包含第一嵌段及與該第一嵌段不同之第二嵌段,其中該第一嵌段與該第二嵌段的表面能之間的差異之絕對值為2.5mN/m至7mN/m,且其中該第一嵌段係以下式1表示及該第二嵌段係以下式3表示: 其中R為氫或具有1至4個碳原子之烷基,X為氧原子、硫原子、-C(=O)-、-C(=O)-X1-或-X1-C(=O)-,其中X1為氧原子或硫原子,且Y為具有6至12個碳原子之芳族結構且該芳族結構上鍵聯有具有8至20個鏈形成原子之鏈且其中該等鏈形成原子包括碳原子; 其中X2為單鍵、氧原子或硫原子,且W為具有6至12個碳原子且包含3至10個鹵素原子之芳基。 a block copolymer comprising a first block and a second block different from the first block, wherein the absolute difference between the surface energy of the first block and the second block is 2.5 mN/m to 7 mN/m, and wherein the first block is represented by the following formula 1 and the second block is represented by the following formula 3: Wherein R is hydrogen or an alkyl group having 1 to 4 carbon atoms, X is an oxygen atom, a sulfur atom, -C(=O)-, -C(=O)-X 1 - or -X 1 -C (= O)-, wherein X 1 is an oxygen atom or a sulfur atom, and Y is an aromatic structure having 6 to 12 carbon atoms and the aromatic structure is bonded to a chain having 8 to 20 chain-forming atoms and wherein Equal chain forming atoms include carbon atoms; Wherein X 2 is a single bond, an oxygen atom or a sulfur atom, and W is an aryl group having 6 to 12 carbon atoms and containing 3 to 10 halogen atoms. 如申請專利範圍第1項之嵌段共聚物,其中該第一嵌段具有高於該第二嵌段之表面能。 The block copolymer of claim 1, wherein the first block has a surface energy higher than the second block. 如申請專利範圍第1項之嵌段共聚物,其中該第一 嵌段之表面能為20mN/m至35mN/m。 Such as the block copolymer of claim 1 of the patent, wherein the first The surface energy of the block is from 20 mN/m to 35 mN/m. 如申請專利範圍第1項之嵌段共聚物,其中該第一嵌段與該第二嵌段的密度之間的差異之絕對值為0.3g/cm3或更大。 The block copolymer of claim 1, wherein the difference between the density of the first block and the second block is 0.3 g/cm 3 or more. 如申請專利範圍第1項之嵌段共聚物,其數量平均分子量為3,000至300,000。 The block copolymer of claim 1 has a number average molecular weight of 3,000 to 300,000. 如申請專利範圍第1項之嵌段共聚物,其多分散性(Mw/Mn)為1.01至1.60。 The block copolymer of claim 1 has a polydispersity (Mw/Mn) of from 1.01 to 1.60. 一種聚合物層,其包含如申請專利範圍第1項之嵌段共聚物的自組合產物。 A polymer layer comprising the self-assembled product of the block copolymer of claim 1 of the patent application. 如申請專利範圍第7項之聚合物層,其在掠角入射小角度X射線散射(grazing incidence small angle X ray scattering)中展現面內相繞射圖案。 The polymer layer of claim 7, which exhibits an in-phase phase diffraction pattern in a grazing incidence small angle X ray scattering. 一種用於形成聚合物層之方法,其包括形成包含如申請專利範圍第1項之嵌段共聚物的自組合產物之聚合物層。 A method for forming a polymer layer comprising forming a polymer layer comprising a self-assembled product of the block copolymer of claim 1 of the patent application. 一種圖案形成方法,其包括從包含基板及形成在該基板上且包含如申請專利範圍第1項之嵌段共聚物的自組合產物之聚合物層的積層物,選擇性移除該嵌段共聚物的第一嵌段或第二嵌段。 A pattern forming method comprising selectively removing a block copolymer from a laminate comprising a substrate and a polymer layer formed on the substrate and comprising a self-assembled product of the block copolymer of claim 1 The first block or the second block of matter.
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