TWI582125B - Method for manufacturing hardened anisotropic conductive material, connecting structure and connecting structure for electronic parts - Google Patents
Method for manufacturing hardened anisotropic conductive material, connecting structure and connecting structure for electronic parts Download PDFInfo
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- TWI582125B TWI582125B TW103101876A TW103101876A TWI582125B TW I582125 B TWI582125 B TW I582125B TW 103101876 A TW103101876 A TW 103101876A TW 103101876 A TW103101876 A TW 103101876A TW I582125 B TWI582125 B TW I582125B
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- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
- H05K3/323—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
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- H01L2224/8119—Arrangement of the bump connectors prior to mounting
- H01L2224/81193—Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed on both the semiconductor or solid-state body and another item or body to be connected to the semiconductor or solid-state body
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- H01L2224/8138—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/81399—Material
- H01L2224/814—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H01L2224/819—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector with the bump connector not providing any mechanical bonding
- H01L2224/81901—Pressing the bump connector against the bonding areas by means of another connector
- H01L2224/81903—Pressing the bump connector against the bonding areas by means of another connector by means of a layer connector
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- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/832—Applying energy for connecting
- H01L2224/83201—Compression bonding
- H01L2224/83203—Thermocompression bonding, e.g. diffusion bonding, pressure joining, thermocompression welding or solid-state welding
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- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8338—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/83399—Material
- H01L2224/834—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H01L2224/83447—Copper [Cu] as principal constituent
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- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
- H01L2224/83851—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester being an anisotropic conductive adhesive
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- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
- H01L2224/83855—Hardening the adhesive by curing, i.e. thermosetting
- H01L2224/83862—Heat curing
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- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/27—Manufacturing methods
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H01L2924/0001—Technical content checked by a classifier
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- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15788—Glasses, e.g. amorphous oxides, nitrides or fluorides
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
- H05K2201/0203—Fillers and particles
- H05K2201/0206—Materials
- H05K2201/0218—Composite particles, i.e. first metal coated with second metal
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
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- Manufacturing & Machinery (AREA)
- Conductive Materials (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Epoxy Resins (AREA)
- Wire Bonding (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Applications Claiming Priority (1)
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JP2013006583 | 2013-01-17 |
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JP (1) | JP5681327B2 (ja) |
KR (1) | KR20150109322A (ja) |
CN (1) | CN104540869B (ja) |
TW (1) | TWI582125B (ja) |
WO (1) | WO2014112541A1 (ja) |
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CN107077914B (zh) * | 2015-02-19 | 2019-05-31 | 积水化学工业株式会社 | 导电糊剂及连接结构体 |
KR102569944B1 (ko) * | 2015-05-25 | 2023-08-24 | 세키스이가가쿠 고교가부시키가이샤 | 도전 재료 및 접속 구조체 |
JPWO2017029993A1 (ja) * | 2015-08-19 | 2018-05-31 | 積水化学工業株式会社 | 導電材料及び接続構造体 |
JP6630284B2 (ja) * | 2015-08-24 | 2020-01-15 | 積水化学工業株式会社 | 導電材料及び接続構造体 |
JP6551794B2 (ja) * | 2016-05-30 | 2019-07-31 | パナソニックIpマネジメント株式会社 | 導電粒子、ならびに回路部材の接続材料、接続構造、および接続方法 |
KR20180024099A (ko) * | 2016-08-26 | 2018-03-08 | 삼성디스플레이 주식회사 | 접합 조립체 및 이를 포함하는 표시 장치 |
JP2018131569A (ja) * | 2017-02-16 | 2018-08-23 | パナソニックIpマネジメント株式会社 | 導電性粒子を含む樹脂組成物 |
KR20210149265A (ko) * | 2020-06-01 | 2021-12-09 | 삼성디스플레이 주식회사 | 표시장치 및 이의 제조 방법 |
EP3979298A1 (en) * | 2020-09-30 | 2022-04-06 | Infineon Technologies Austria AG | Device for controlling trapped ions and method of manufacturing the same |
WO2023166973A1 (ja) * | 2022-03-02 | 2023-09-07 | ナミックス株式会社 | 硬化性樹脂組成物、接着剤、硬化物、カメラモジュール、及び電子機器 |
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JP2001081155A (ja) * | 1999-09-13 | 2001-03-27 | Sumitomo Bakelite Co Ltd | 半導体用樹脂ペースト及びそれを用いた半導体装置 |
TW201233725A (en) * | 2011-02-03 | 2012-08-16 | Namics Corp | Epoxy resin composition and semiconductor-sealing material using the same |
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CN1213442C (zh) * | 1999-04-01 | 2005-08-03 | 三井化学株式会社 | 各向异性导电性糊 |
JP2012021114A (ja) * | 2010-07-16 | 2012-02-02 | Sekisui Chem Co Ltd | 硬化性組成物及び接続構造体 |
JP5886582B2 (ja) * | 2010-09-28 | 2016-03-16 | 積水化学工業株式会社 | 異方性導電材料、bステージ状硬化物、bステージ状硬化物の製造方法及び接続構造体 |
JP2012124479A (ja) * | 2011-11-24 | 2012-06-28 | Hitachi Chem Co Ltd | 半導体パッケージ |
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JP2001081155A (ja) * | 1999-09-13 | 2001-03-27 | Sumitomo Bakelite Co Ltd | 半導体用樹脂ペースト及びそれを用いた半導体装置 |
TW201233725A (en) * | 2011-02-03 | 2012-08-16 | Namics Corp | Epoxy resin composition and semiconductor-sealing material using the same |
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JP5681327B2 (ja) | 2015-03-04 |
WO2014112541A1 (ja) | 2014-07-24 |
CN104540869B (zh) | 2016-12-28 |
JPWO2014112541A1 (ja) | 2017-01-19 |
CN104540869A (zh) | 2015-04-22 |
KR20150109322A (ko) | 2015-10-01 |
TW201446827A (zh) | 2014-12-16 |
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