TWI577482B - Laser processing device and laser processing method - Google Patents

Laser processing device and laser processing method Download PDF

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TWI577482B
TWI577482B TW104109187A TW104109187A TWI577482B TW I577482 B TWI577482 B TW I577482B TW 104109187 A TW104109187 A TW 104109187A TW 104109187 A TW104109187 A TW 104109187A TW I577482 B TWI577482 B TW I577482B
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laser
processed
processing
pulse
physical quantity
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TW201540406A (en
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Hiroshi Ishihara
Tomoyuki Yamaguchi
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Sumitomo Heavy Industries
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means
    • H05K3/0026Etching of the substrate by chemical or physical means by laser ablation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • B23K26/0626Energy control of the laser beam
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/067Dividing the beam into multiple beams, e.g. multifocusing
    • B23K26/0673Dividing the beam into multiple beams, e.g. multifocusing into independently operating sub-beams, e.g. beam multiplexing to provide laser beams for several stations

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Laser Beam Processing (AREA)

Description

雷射加工裝置及雷射加工方法 Laser processing device and laser processing method

本發明係有關一種按照順序使脈衝雷射光束入射到在加工對象物表面劃定的複數個被加工點而進行雷射加工的雷射加工裝置及雷射加工方法。 The present invention relates to a laser processing apparatus and a laser processing method for performing laser processing by sequentially injecting a pulsed laser beam onto a plurality of processed points defined on a surface of a workpiece.

下述專利文獻1中公開了一種使用脈衝雷射光束在配線基板上進行開孔加工的技術。在專利文獻1所公開的方法中,若具有小於容許值的脈衝能量的雷射脈衝入射到配線基板時,藉由對該部位入射額外的雷射脈衝,能夠補償脈衝能量的不足量。 Patent Document 1 listed below discloses a technique of performing hole drilling on a wiring substrate using a pulsed laser beam. In the method disclosed in Patent Document 1, when a laser pulse having a pulse energy smaller than an allowable value is incident on a wiring board, an insufficient amount of pulse energy can be compensated by injecting an additional laser pulse into the portion.

在下述專利文獻2所公開的方法中,檢測雷射脈衝的上升部份的能量。若檢測結果在容許範圍內,則使該雷射脈衝的後續部份入射到加工對象物而進行加工。若檢測結果超出容許範圍,則不使該雷射脈衝入射到加工對象物。由此,能夠防止能量不足或能量過剩的不良雷射脈衝入射到加工對象物。 In the method disclosed in Patent Document 2 below, the energy of the rising portion of the laser pulse is detected. When the detection result is within the allowable range, the subsequent portion of the laser pulse is incident on the object to be processed. If the detection result is out of the allowable range, the laser pulse is not incident on the object to be processed. Thereby, it is possible to prevent a defective laser pulse having insufficient energy or excessive energy from entering the object to be processed.

(先前技術文獻) (previous technical literature) (專利文獻) (Patent Literature)

專利文獻1:日本專利第2858236號公報 Patent Document 1: Japanese Patent No. 2858236

專利文獻2:日本特開2009-148812號公報 Patent Document 2: Japanese Laid-Open Patent Publication No. 2009-148812

為了準確地決定雷射脈衝的脈衝能量的容許範圍或雷射脈衝的上升部份的能量的容許範圍,需要以不同的脈衝能量進行各種評價試驗。亦可以依據雷射光源正常動作時的脈衝能量的偏差來決定脈衝能量的容許範圍。藉由該方法能夠輕鬆地決定容許範圍。 In order to accurately determine the allowable range of the pulse energy of the laser pulse or the allowable range of the energy of the rising portion of the laser pulse, various evaluation tests are required with different pulse energies. The allowable range of pulse energy can also be determined according to the deviation of the pulse energy when the laser light source is normally operated. This method makes it easy to determine the allowable range.

脈衝能量依賴於脈衝的重複頻率(以下間稱為“頻率”)。因此,若雷射加工時的頻率產生偏差,則脈衝能量的偏差變大。若脈衝能量的偏差變大,則即使雷射光源正常動作,脈衝能量亦有可能超出最初決定之容許範圍。若以最初決定之容許範圍為基準來判定雷射脈衝的良好及不良,有時正常動作中輸出的雷射脈衝會被判定為不良。 The pulse energy depends on the repetition frequency of the pulse (hereinafter referred to as "frequency"). Therefore, if the frequency at the time of laser processing varies, the variation in pulse energy becomes large. If the deviation of the pulse energy becomes large, even if the laser light source operates normally, the pulse energy may exceed the allowable range determined initially. If the laser pulse is judged to be good or bad based on the allowable range determined initially, the laser pulse output during normal operation may be judged to be defective.

本發明的目的在於提供一種即使頻率發生變動亦能夠準確地判定雷射脈衝的良好及不良的雷射加工裝置及雷射加工方法。 An object of the present invention is to provide a laser processing apparatus and a laser processing method capable of accurately determining the goodness and the poorness of a laser pulse even if the frequency fluctuates.

根據本發明的一觀點,提供一種雷射加工裝置,其具有:雷射光源,輸出脈衝雷射光束; 載物台,保持加工對象物;光束掃描器,使從前述雷射光源輸出的前述脈衝雷射光束入射到前述加工對象物,並且使前述加工對象物表面上的入射位置移動;光檢測器,檢測從前述雷射光源輸出的前述脈衝雷射光束的各雷射脈衝的依賴於脈衝能量之物理量;路徑切換器,將從前述雷射光源輸出的前述脈衝雷射光束的路徑在入射到前述加工對象物的第1路徑與不入射到前述加工對象物的第2路徑之間進行切換;及控制裝置,存儲前述加工對象物表面的複數個被加工點的位置及加工順序,並依據前述被加工點的位置、前述加工順序及前述光檢測器的檢測結果來控制前述光束掃描器及前述路徑切換器,前述控制裝置執行加工前準備製程,在前述加工前準備製程中控制前述光束掃描器,以使前述脈衝雷射光束依據前述加工順序入射到前述被加工點的位置,同時藉由前述光檢測器檢測各雷射脈衝的依賴於脈衝能量之前述物理量,並依據前述物理量的分佈來決定前述物理量的容許範圍,在前述加工前準備製程之後,前述控制裝置在前述加工對象物的加工過程中沿著前述第1路徑傳輸藉由前述光檢測器檢測出之前述物理量在前述容許範圍內的雷射脈衝的至少一部份,沿著前述第2路徑傳輸超出前述容許範圍的雷射脈衝。 According to an aspect of the present invention, a laser processing apparatus is provided having: a laser light source outputting a pulsed laser beam; a stage that holds the object to be processed, and a beam scanner that causes the pulsed laser beam outputted from the laser light source to be incident on the object to be processed, and moves an incident position on a surface of the object to be processed; a photodetector, Detecting a physical quantity of each of the laser pulses of the pulsed laser beam outputted from the laser light source, which is dependent on the pulse energy; and a path switch, the path of the pulsed laser beam outputted from the laser light source is incident on the processing The first path of the object is switched between the first path and the second path not incident on the object to be processed, and the control device stores the position and processing order of the plurality of processed points on the surface of the object to be processed, and is processed according to the foregoing. Controlling the beam scanner and the path switch by the position of the dot, the processing sequence, and the detection result of the photodetector, the control device executing a pre-processing preparation process, and controlling the beam scanner in the pre-processing preparation process to Having the aforementioned pulsed laser beam incident on the position of the processed point according to the processing order, The photodetector detects the physical quantity of each laser pulse depending on the pulse energy, and determines an allowable range of the physical quantity according to the distribution of the physical quantity. After the pre-processing preparation process, the control device is in the processing object. And transmitting at least a portion of the laser pulse whose physical quantity is detected within the allowable range by the photodetector along the first path, and transmitting the lightning beyond the allowable range along the second path along the first path Shoot the pulse.

根據本發明的另一觀點,提供一種雷射加工方法,其具有以下製程:控制光束掃描器,以使脈衝雷射光束按照規定的加工順序入射到規定的被加工點的位置,同時測量各雷射脈衝的依賴於脈衝能量之物理量之製程;依據測量出之前述物理量的分佈來決定前述物理量的容許範圍之製程;及按照前述加工順序使脈衝雷射光束入射到加工對象物上的前述被加工點的位置,並進行雷射加工之製程,在前述進行雷射加工之製程中,測量前述脈衝雷射光束的各雷射脈衝的前述物理量,測量結果在前述容許範圍內時使該雷射脈衝的至少一部份入射到前述加工對象物,測量結果超出前述容許範圍時不使該雷射脈衝入射到前述加工對象物。 According to another aspect of the present invention, there is provided a laser processing method having a process of controlling a beam scanner to cause a pulsed laser beam to be incident on a predetermined point to be processed in a predetermined processing order while measuring each of the mines a process in which a pulse pulse is dependent on a physical quantity of pulse energy; a process for determining an allowable range of the physical quantity based on the measured distribution of the physical quantity; and the aforementioned processing of causing the pulsed laser beam to be incident on the object to be processed according to the processing order The position of the point and the laser processing process, in the foregoing laser processing process, measuring the physical quantity of each laser pulse of the pulsed laser beam, and the laser pulse is obtained when the measurement result is within the allowable range At least a part of the object is incident on the object to be processed, and when the measurement result exceeds the allowable range, the laser pulse is not incident on the object to be processed.

由於實際上在控制光束掃描器的同時輸出脈衝雷射光束,並測量依賴於脈衝能量之物理量,因此,因加工時的脈衝雷射光束的頻率的偏差產生的脈衝能量的偏差體現在容許範圍的決定中。因此,能夠準確地判定雷射脈衝的良好及不良。 Since the pulsed laser beam is actually output while controlling the beam scanner, and the physical quantity depending on the pulse energy is measured, the deviation of the pulse energy due to the deviation of the frequency of the pulsed laser beam during processing is reflected in the allowable range. Decided. Therefore, it is possible to accurately determine the goodness and the poorness of the laser pulse.

10‧‧‧雷射光源 10‧‧‧Laser light source

11‧‧‧照射光學系統 11‧‧‧Optical optical system

13‧‧‧光圈 13‧‧‧ aperture

15‧‧‧路徑切換器 15‧‧‧Path Switcher

16‧‧‧加工路徑 16‧‧‧Processing path

17‧‧‧阻尼器路徑 17‧‧‧Damper path

18‧‧‧折回反射鏡 18‧‧‧Return mirror

20‧‧‧光束掃描器 20‧‧‧beam scanner

21‧‧‧物鏡 21‧‧‧ Objective lens

23‧‧‧載物台 23‧‧‧stage

24‧‧‧移動機構 24‧‧‧Mobile agencies

30‧‧‧部份反射鏡 30‧‧‧Partial mirror

31‧‧‧光束阻尼器 31‧‧‧ Beam damper

32‧‧‧光檢測器 32‧‧‧Photodetector

40‧‧‧加工對象物 40‧‧‧Processing objects

41‧‧‧被加工點 41‧‧‧Processed points

50‧‧‧控制裝置 50‧‧‧Control device

51‧‧‧存儲裝置 51‧‧‧Storage device

Lp1、Lp2、Lp3‧‧‧雷射脈衝 Lp1, Lp2, Lp3‧‧‧ laser pulses

con‧‧‧控制訊號 Con‧‧‧ control signal

det‧‧‧檢測訊號 Det‧‧‧detection signal

trg‧‧‧觸發訊號 Trg‧‧‧trigger signal

R0‧‧‧正常範圍 R0‧‧‧Normal range

R1‧‧‧容許範圍 R1‧‧‧allowable range

第1圖係實施例之雷射加工裝置的概略圖。 Fig. 1 is a schematic view showing a laser processing apparatus of an embodiment.

第2圖係表示觸發訊號trg、入射到路徑切換器的雷射脈衝Lp1、在加工路徑傳輸的雷射脈衝Lp2、在阻尼器路徑傳輸的雷射脈衝Lp3、控制路徑切換器的控制訊號con、及從光檢測器向控制裝置發送之檢測訊號det的時序圖及波形的一例之圖表。 Figure 2 shows the trigger signal trg, the laser pulse Lp1 incident on the path switcher, the laser pulse Lp2 transmitted on the processing path, the laser pulse Lp3 transmitted on the damper path, the control signal con of the control path switcher, And a timing chart of the detection signal det transmitted from the photodetector to the control device, and a graph of an example of the waveform.

第3A圖係從雷射光源以恆定頻率輸出雷射脈衝時的時序圖,第3B圖係以恆定頻率輸出雷射脈衝時的判定能量的直方圖。 Fig. 3A is a timing chart when a laser pulse is outputted from a laser light source at a constant frequency, and Fig. 3B is a histogram of the determination energy when a laser pulse is output at a constant frequency.

第4A圖係加工對象物的概略俯視圖,第4B圖係加工過程中的雷射脈衝的時序圖,第4C圖係加工過程中的雷射脈衝的判定能量的直方圖。 Fig. 4A is a schematic plan view of the object to be processed, Fig. 4B is a timing chart of laser pulses during processing, and Fig. 4C is a histogram of determination energy of laser pulses during processing.

第5圖係實施例之雷射加工方法的流程圖。 Figure 5 is a flow chart of a laser processing method of an embodiment.

第6A圖係在步驟S1中從雷射光源輸出的雷射脈衝的時序圖,第6B圖係在第6A圖所示之時刻輸出的雷射脈衝的判定能量的直方圖。 Fig. 6A is a timing chart of the laser pulse outputted from the laser light source in step S1, and Fig. 6B is a histogram of the determination energy of the laser pulse outputted at the timing shown in Fig. 6A.

第7圖係表示被加工點的配置圖案與容許範圍之間的對應關係之圖表。 Fig. 7 is a graph showing the correspondence relationship between the arrangement pattern of the processed points and the allowable range.

第1圖是實施例的雷射加工裝置的概略圖。實施例的雷射加工裝置例如為對配線基板進行開孔加工的雷射鑽孔。雷射光源10藉由從控制裝置50接收觸發訊號trg而輸出脈衝雷射光束。雷射光源10例如使用二氧化碳雷射。 Fig. 1 is a schematic view of a laser processing apparatus according to an embodiment. The laser processing apparatus of the embodiment is, for example, a laser drilled hole for drilling a wiring board. The laser light source 10 outputs a pulsed laser beam by receiving a trigger signal trg from the control device 50. The laser light source 10 uses, for example, a carbon dioxide laser.

從雷射光源10輸出的脈衝雷射光束入射到照射光學系統11。照射光學系統11使脈衝雷射光束的擴散角及束徑中的至少1個發生變化。透過照射光學系統11的脈衝雷射光束入射到光圈13。照射光學系統11也具有使在光圈13位置上的光束分佈均勻化的功能。光圈13對光束截面進行整形。 The pulsed laser beam output from the laser light source 10 is incident on the illumination optical system 11. The illumination optical system 11 changes at least one of the diffusion angle and the beam diameter of the pulsed laser beam. The pulsed laser beam transmitted through the illumination optical system 11 is incident on the aperture 13. The illumination optical system 11 also has a function of uniformizing the beam distribution at the position of the aperture 13. The aperture 13 shapes the beam section.

透過光圈13的脈衝雷射光束入射到路徑切換器15。路徑切換器15藉由從控制裝置50接收控制訊號con而在加工路徑16與阻尼器路徑17之間切換脈衝雷射光束的路徑。路徑切換器15例如使用聲光偏轉器(Acousto-Optic Deflector:AOD)。被輸入的雷射脈衝Lp1直線前進的路徑相當於阻尼器路徑17,雷射脈衝繞射的路徑相當於加工路徑16。 The pulsed laser beam transmitted through the aperture 13 is incident on the path switch 15. The path switcher 15 switches the path of the pulsed laser beam between the processing path 16 and the damper path 17 by receiving the control signal con from the control device 50. The path switcher 15 uses, for example, an Acousto-Optic Deflector (AOD). The path in which the input laser pulse Lp1 advances linearly corresponds to the damper path 17, and the path of the laser pulse diffraction corresponds to the processing path 16.

沿著加工路徑16傳輸的雷射脈衝Lp2藉由折回反射鏡18偏向,入射到光束掃描器20。光束掃描器20藉由控制裝置50而被控制,使脈衝雷射光束的行進方向變為二維方向。光束掃描器20例如使用一對電流掃描儀。 The laser pulse Lp2 transmitted along the processing path 16 is deflected by the folding mirror 18 and incident on the beam scanner 20. The beam scanner 20 is controlled by the control device 50 to change the direction of travel of the pulsed laser beam into a two-dimensional direction. The beam scanner 20 uses, for example, a pair of current scanners.

通過了光束掃描器20的脈衝雷射光束透過物鏡21而入射到加工對象物40。物鏡21例如使用f θ透鏡。加工對象物40例如為應進行開孔加工的配線基板。加工對象物40保持於載物台23。載物台23藉由移動機構24在與加工對象物40表面平行的二維方向移動。移動機構24藉由控制裝置50而被控制。 The pulsed laser beam that has passed through the beam scanner 20 passes through the objective lens 21 and enters the object 40. The objective lens 21 uses, for example, an f θ lens. The object 40 to be processed is, for example, a wiring board to be subjected to drilling. The object 40 is held on the stage 23 . The stage 23 is moved in a two-dimensional direction parallel to the surface of the object 40 by the moving mechanism 24. The moving mechanism 24 is controlled by the control device 50.

藉由物鏡21,光圈13的開口部縮小投影到加工對象 物40表面。藉由光束掃描器20改變脈衝雷射光束的行進方向,由此能夠使脈衝雷射光束的入射位置在加工對象物40表面上移動。 By the objective lens 21, the opening of the aperture 13 is reduced and projected onto the object to be processed. The surface of the object 40. The direction in which the pulsed laser beam travels is changed by the beam scanner 20, whereby the incident position of the pulsed laser beam can be moved on the surface of the object 40.

沿著阻尼器路徑17傳輸的雷射脈衝Lp3入射到部份反射鏡30。透過部份反射鏡30的雷射脈衝入射到光束阻尼器31。藉由部份反射鏡30反射的雷射脈衝入射到光檢測器32。光檢測器32例如使用對從雷射光源10輸出的脈衝雷射光束的波長區域具有靈敏度的能量表。基於光檢測器32的檢測訊號det輸入到控制裝置50。 The laser pulse Lp3 transmitted along the damper path 17 is incident on the partial mirror 30. The laser pulse transmitted through the partial mirror 30 is incident on the beam damper 31. The laser pulse reflected by the partial mirror 30 is incident on the photodetector 32. The photodetector 32 uses, for example, an energy meter having sensitivity to a wavelength region of a pulsed laser beam output from the laser light source 10. The detection signal det based on the photodetector 32 is input to the control device 50.

控制裝置50包括存儲裝置51。存儲裝置51中存儲有加工對象物40的複數個被加工點的位置資訊、加工順序、及控制所需的各種資訊。 The control device 50 includes a storage device 51. The storage device 51 stores position information, processing order, and various information required for control of a plurality of processed points of the object 40 to be processed.

第2圖中顯示出觸發訊號trg、入射到路徑切換器15的雷射脈衝Lp1、在加工路徑16傳輸的雷射脈衝Lp2、在阻尼器路徑17傳輸的雷射脈衝Lp3、控制路徑切換器15的控制訊號con、及從光檢測器32向控制裝置50發送之檢測訊號det的時序圖及波形的一例。 The second diagram shows the trigger signal trg, the laser pulse Lp1 incident on the path switch 15, the laser pulse Lp2 transmitted on the processing path 16, the laser pulse Lp3 transmitted on the damper path 17, and the control path switcher 15. An example of a timing chart and a waveform of the control signal con and the detection signal det transmitted from the photodetector 32 to the control device 50.

在時刻t1中,若觸發訊號trg上升,則雷射脈衝Lp1稍晚在時刻t2上升。在該時刻,路徑切換器15的輸出路徑切換為阻尼器路徑17。因此,在阻尼器路徑17傳輸的雷射脈衝Lp3上升。 At time t1, if the trigger signal trg rises, the laser pulse Lp1 rises later at time t2. At this moment, the output path of the path switcher 15 is switched to the damper path 17. Therefore, the laser pulse Lp3 transmitted on the damper path 17 rises.

光檢測器32檢測雷射脈衝Lp3,並將檢測訊號det發送到控制裝置50。檢測訊號det的大小與雷射脈衝Lp3的功率大致成比例。控制裝置50在從上升時刻t2起經過一 定時間之後的時刻t3為止,對檢測訊號det進行積分。積分結果存儲在存儲裝置51中。 The photodetector 32 detects the laser pulse Lp3 and transmits the detection signal det to the control device 50. The size of the detection signal det is approximately proportional to the power of the laser pulse Lp3. The control device 50 passes through one from the rising time t2 The detection signal det is integrated at time t3 after the fixed time. The integration result is stored in the storage device 51.

在時刻t4中,控制裝置50向路徑切換器15發送切換為加工路徑16的控制訊號con。路徑切換器15的輸出路徑由阻尼器路徑17切換為加工路徑16,由此雷射脈衝Lp3下降而雷射脈衝Lp2上升。由於雷射脈衝Lp3下降,光檢測器32的檢測訊號det亦成為0。 At time t4, the control device 50 transmits a control signal con switched to the processing path 16 to the path switcher 15. The output path of the path switcher 15 is switched by the damper path 17 to the machining path 16, whereby the laser pulse Lp3 is lowered and the laser pulse Lp2 is raised. Since the laser pulse Lp3 falls, the detection signal det of the photodetector 32 also becomes zero.

在時刻t5中,控制裝置50向路徑切換器15發送切換為阻尼器路徑17的控制訊號con。路徑切換器15的輸出路徑由加工路徑16切換為阻尼器路徑17,由此雷射脈衝Lp3上升而雷射脈衝Lp2下降。由於雷射脈衝Lp3上升,光檢測器32的檢測訊號det亦上升。 At time t5, the control device 50 transmits a control signal con switched to the damper path 17 to the path switcher 15. The output path of the path switcher 15 is switched by the machining path 16 to the damper path 17, whereby the laser pulse Lp3 rises and the laser pulse Lp2 falls. As the laser pulse Lp3 rises, the detection signal det of the photodetector 32 also rises.

在時刻t6中,觸發訊號trg下降。由此,雷射脈衝Lp1及雷射脈衝Lp3下降。由於雷射脈衝Lp3下降,光檢測器32的檢測訊號det亦下降。 At time t6, the trigger signal trg drops. Thereby, the laser pulse Lp1 and the laser pulse Lp3 are lowered. As the laser pulse Lp3 falls, the detection signal det of the photodetector 32 also drops.

將光檢測器32的檢測訊號det從時刻t2至t3進行積分之值(第2圖中帶陰影部份的面積)相當於雷射脈衝Lp1的上升部份的能量。若作為加工用而從雷射脈衝Lp1切取之雷射脈衝Lp2的脈衝寬度為恆定,則雷射脈衝Lp2的脈衝能量與雷射脈衝Lp1的上升部份的能量具有相關關係。因此,能夠藉由雷射脈衝Lp1的上升部份的能量來判定雷射脈衝Lp2的脈衝能量是否正常。將雷射脈衝Lp1的上升部份的能量作為“判定能量”。判定能量為依賴於脈衝能量之物理量。 The value obtained by integrating the detection signal det of the photodetector 32 from time t2 to t3 (the area of the hatched portion in Fig. 2) corresponds to the energy of the rising portion of the laser pulse Lp1. If the pulse width of the laser pulse Lp2 cut out from the laser pulse Lp1 is constant for processing, the pulse energy of the laser pulse Lp2 is correlated with the energy of the rising portion of the laser pulse Lp1. Therefore, it is possible to determine whether or not the pulse energy of the laser pulse Lp2 is normal by the energy of the rising portion of the laser pulse Lp1. The energy of the rising portion of the laser pulse Lp1 is referred to as "determination energy". The energy is determined to be a physical quantity that depends on the pulse energy.

從時刻t2至時刻t3為止的時間依據雷射脈衝Lp1的平均上升時間來決定。作為從時刻t2至時刻t3為止的時間,可以採用雷射脈衝Lp1的功率達到穩定狀態為止的平均時間,亦可以採用雷射脈衝Lp2的功率達到穩定狀態功率的90%為止的平均時間。 The time from the time t2 to the time t3 is determined in accordance with the average rise time of the laser pulse Lp1. As the time from the time t2 to the time t3, the average time until the power of the laser pulse Lp1 reaches the steady state can be used, and the average time until the power of the laser pulse Lp2 reaches 90% of the steady state power can be used.

作為依賴於脈衝能量之物理量,亦可以採用雷射脈衝Lp1的上升部份的功率來代替上升部份的能量。若在上升部份中,將時間軸上的僅1點的功率作為依賴於脈衝能量之物理量而採用,則由功率推測出之脈衝能量的可靠性降低。藉由在上升部份中,將時間軸上的複數個部位的功率作為依賴於脈衝能量之物理量而採用,能夠提高由功率推測出之脈衝能量的可靠性。 As the physical quantity depending on the pulse energy, the power of the rising portion of the laser pulse Lp1 may be used instead of the energy of the rising portion. In the rising portion, the power of only one point on the time axis is used as the physical quantity depending on the pulse energy, and the reliability of the pulse energy estimated from the power is lowered. By using the power of a plurality of parts on the time axis as the physical quantity depending on the pulse energy in the rising portion, the reliability of the pulse energy estimated from the power can be improved.

第3A圖中顯示出從雷射光源10以恆定頻率輸出雷射脈衝Lp1時的時序圖。 A timing chart when the laser light 10 outputs the laser pulse Lp1 at a constant frequency from the laser light source 10 is shown in Fig. 3A.

第3B圖中顯示出以恆定頻率輸出雷射脈衝Lp1時的判定能量的直方圖。橫軸表示判定能量,縱軸表示次數。當雷射光源10正常動作時,判定能量的分佈大致按照正常分佈。若用m表示判定能量的平均值,σ表示標準偏差,則絕大部份的雷射脈衝Lp1的判定能量在m±3σ範圍內(以下稱為正常範圍R0)。 Fig. 3B shows a histogram of the determination energy when the laser pulse Lp1 is output at a constant frequency. The horizontal axis represents the determination energy, and the vertical axis represents the number of times. When the laser light source 10 operates normally, it is determined that the distribution of energy is substantially in accordance with the normal distribution. If m is used to represent the average value of the determination energy, and σ is the standard deviation, the determination energy of the vast majority of the laser pulse Lp1 is in the range of m ± 3σ (hereinafter referred to as the normal range R0).

第4A圖是加工對象物40的概略俯視圖。在加工對象物40表面劃定有複數個被加工點41。藉由使雷射脈衝Lp2(第1圖)入射到被加工點41,進行開孔加工。被加工點41的加工順序是事先確定的。在第4A圖中,用箭頭 表示加工順序的一例。如第4A圖所示,從被加工的被加工點41至下一次要加工的被加工點41為止的距離並非恆定,而是會產生偏差。若脈衝雷射光束的入射位置的移動距離變長,則光束掃描器20的調整時間亦變長。因此,在加工對象物40的加工過程中,脈衝雷射光束的頻率並非恆定,而是依脈衝雷射光束的入射位置的移動距離而變動。 4A is a schematic plan view of the object 40 to be processed. A plurality of processed points 41 are defined on the surface of the object 40. The hole drilling process is performed by causing the laser pulse Lp2 (Fig. 1) to be incident on the workpiece 41. The processing order of the processed points 41 is determined in advance. In Figure 4A, with arrows An example of the processing sequence is shown. As shown in FIG. 4A, the distance from the processed workpiece 41 to the workpiece 41 to be processed next time is not constant, but varies. If the moving distance of the incident position of the pulsed laser beam becomes long, the adjustment time of the beam scanner 20 also becomes long. Therefore, during the processing of the object 40, the frequency of the pulsed laser beam is not constant, but varies depending on the moving distance of the incident position of the pulsed laser beam.

第4B圖中顯示出從雷射光源10輸出的脈衝雷射光束在加工期間中的時序圖的一例。如第4B圖所示,脈衝雷射光束的頻率產生偏差。 An example of a timing chart of the pulsed laser beam output from the laser light source 10 during the processing period is shown in Fig. 4B. As shown in Fig. 4B, the frequency of the pulsed laser beam is deviated.

第4C圖是脈衝雷射光束的頻率產生偏差時的判定能量的直方圖。為了方便比較,用虛線表示脈衝雷射光束的頻率為恆定時的判定能量的直方圖。通常,從雷射光源10輸出的脈衝雷射光束的脈衝能量依賴於頻率。例如,二氧化碳雷射中,若頻率變高,則有脈衝能量下降的傾向。 Fig. 4C is a histogram of the determination energy when the frequency of the pulsed laser beam is deviated. For convenience of comparison, a histogram of the determination energy when the frequency of the pulsed laser beam is constant is indicated by a broken line. Generally, the pulse energy of the pulsed laser beam output from the laser source 10 is frequency dependent. For example, in a carbon dioxide laser, if the frequency becomes high, there is a tendency for the pulse energy to decrease.

對於頻率產生偏差時的判定能量的偏差,在頻率為恆定時的判定能量的偏差基礎上疊加了因頻率產生偏差而導致的判定能量的偏差。因此,若頻率產生偏差,則判定能量的偏差增大。當頻率並非恆定時,即使雷射光源10正常動作時,亦會發生判定能量超出正常範圍R0的情況。 The deviation of the determination energy when the frequency is deviated is superimposed on the variation of the determination energy due to the deviation of the frequency when the frequency is constant. Therefore, if the frequency is deviated, it is determined that the deviation of the energy is increased. When the frequency is not constant, even if the laser light source 10 operates normally, it may occur that the determination energy exceeds the normal range R0.

當進行僅將判定能量在正常範圍R0內的雷射脈衝用於雷射加工的控制時,即使雷射光源10正常動作,具有超出正常範圍R0的判定能量的雷射脈衝亦不會被用於加 工。因此,雷射能量的利用效率降低。以下說明的實施例中,能夠抑制在雷射光源10正常動作的條件下因判定能量的偏差導致的雷射能量的利用效率的降低。 When a laser pulse in which only the determination energy is within the normal range R0 is used for the control of the laser processing, even if the laser light source 10 operates normally, a laser pulse having a determination energy exceeding the normal range R0 is not used. plus work. Therefore, the utilization efficiency of the laser energy is lowered. In the embodiment described below, it is possible to suppress a decrease in the utilization efficiency of the laser energy due to the variation in the determination energy under the condition that the laser light source 10 is normally operated.

第5圖是實施例的雷射加工方法的流程圖。在步驟S1中,依據加工對象物40的被加工點41(第4A圖)的位置及加工順序來控制雷射光源10及光束掃描器20,由此從雷射光源10輸出脈衝雷射光束。此時,路徑切換器15維持輸出路徑切換為阻尼器路徑17的狀態。因此,載物台23上不會有脈衝雷射光束入射。但是,由於控制著光束掃描器20,因此脈衝雷射光束的頻率體現了光束掃描器20的調整時間的偏差。 Fig. 5 is a flow chart of the laser processing method of the embodiment. In step S1, the laser light source 10 and the beam scanner 20 are controlled in accordance with the position of the processed object 41 (Fig. 4A) of the object 40 and the processing order, thereby outputting the pulsed laser beam from the laser light source 10. At this time, the path switcher 15 maintains the state in which the output path is switched to the damper path 17. Therefore, no pulsed laser beam is incident on the stage 23. However, since the beam scanner 20 is controlled, the frequency of the pulsed laser beam reflects the deviation of the adjustment time of the beam scanner 20.

第6A圖是在步驟S1中從雷射光源10輸出的雷射脈衝Lp1的時序圖。步驟S1中的脈衝雷射光束的頻率與第4B圖所示之加工期間中的脈衝雷射光束的頻率同樣地產生偏差。光束掃描器20依據實際被加工點41的位置及加工順序而被控制,因此步驟S1中的脈衝雷射光束的頻率的偏差程度與加工時的脈衝雷射光束的頻率的偏差程度相同。 Fig. 6A is a timing chart of the laser pulse Lp1 output from the laser light source 10 in step S1. The frequency of the pulsed laser beam in step S1 is deviated in the same manner as the frequency of the pulsed laser beam in the processing period shown in Fig. 4B. The beam scanner 20 is controlled in accordance with the position and processing order of the actual workpiece 41, so that the degree of deviation of the frequency of the pulsed laser beam in step S1 is the same as the degree of deviation of the frequency of the pulsed laser beam during processing.

光檢測器32的檢測結果輸入到控制裝置50。控制裝置50求出各雷射脈衝Lp1的判定能量,並將求出之判定能量儲存在存儲裝置51中。 The detection result of the photodetector 32 is input to the control device 50. The control device 50 obtains the determination energy of each of the laser pulses Lp1, and stores the obtained determination energy in the storage device 51.

在步驟S2中,依據判定能量的分佈來決定判定能量的容許範圍R1。 In step S2, the allowable range R1 of the determination energy is determined in accordance with the distribution of the determination energy.

參閱第6B圖對判定能量的容許範圍R1的決定方法 進行說明。第6B圖是判定能量的直方圖。為了方便比較,用虛線表示脈衝雷射光束的頻率為恆定時的判定能量的分佈。用m1表示在步驟S1中求出之判定能量的分佈的平均值,σ1表示標準偏差。作為一例,將容許範圍R1的上限值設為m1+3σ1,下限值設為m1-3σ1。依判定能量的偏差寬度,比起頻率恆定時的正常範圍R0,頻率產生偏差時的容許範圍R1變得更寬。 Refer to Figure 6B for the determination method of the allowable range R1 of the determination energy. Be explained. Figure 6B is a histogram of the determination energy. For convenience of comparison, the distribution of the determination energy when the frequency of the pulsed laser beam is constant is indicated by a broken line. The average value of the distribution of the determination energy obtained in step S1 is represented by m1, and σ1 represents the standard deviation. As an example, the upper limit of the allowable range R1 is m1 + 3σ1, and the lower limit is m1-3σ1. The allowable range R1 when the frequency is deviated becomes wider depending on the deviation width of the determination energy than the normal range R0 when the frequency is constant.

在步驟S3(第5圖)中,將加工對象物40載置於載物台23(第1圖)。在步驟S4中,使光束掃描器20動作,並等待至脈衝雷射光束的光束掃描器20穩定為止。光束掃描器20穩定後,在步驟S5中從雷射光源10輸出1個雷射脈衝Lp1。在雷射脈衝Lp1的輸出開始時刻,路徑切換器15的輸出路徑切換為阻尼器路徑17。因此,基於光檢測器32的光強度的檢測訊號det輸入到控制裝置50。控制裝置50依據從光檢測器32輸入的檢測訊號det來計算判定能量。 In step S3 (fifth diagram), the object 40 is placed on the stage 23 (Fig. 1). In step S4, the beam scanner 20 is operated and waits until the beam scanner 20 of the pulsed laser beam is stabilized. After the beam scanner 20 is stabilized, one laser pulse Lp1 is output from the laser light source 10 in step S5. At the start of the output of the laser pulse Lp1, the output path of the path switch 15 is switched to the damper path 17. Therefore, the detection signal det based on the light intensity of the photodetector 32 is input to the control device 50. The control device 50 calculates the determination energy based on the detection signal det input from the photodetector 32.

在步驟S6中,判定判定能量是否在容許範圍R1內。判定能量超出容許範圍R1時,雷射脈衝Lp1下降後,返回到步驟S5,輸出下1個雷射脈衝Lp1。判定能量在容許範圍R1內時,在步驟S7中,藉由控制路徑切換器15,從雷射脈衝Lp1切取雷射脈衝Lp2(第2圖),沿著加工路徑16傳輸。雷射脈衝Lp2入射到加工對象物40而進行開孔加工。 In step S6, it is determined whether or not the determination energy is within the allowable range R1. When it is determined that the energy exceeds the allowable range R1, the laser pulse Lp1 falls, and the process returns to step S5, and the next laser pulse Lp1 is output. When it is determined that the energy is within the allowable range R1, in step S7, the laser beam Lp2 (second drawing) is cut out from the laser pulse Lp1 by the control path switch 15, and transmitted along the processing path 16. The laser pulse Lp2 is incident on the object 40 and is subjected to drilling.

在步驟S8中,判定所有的被加工點41的加工是否已 結束。當還留有未加工的被加工點41時,返回到步驟S4,進行下一次被加工點41的加工。對每1個被加工點41入射複數個雷射脈衝而進行加工時,可應用循環模式加工或觸發模式加工。 In step S8, it is determined whether or not all of the processed points 41 have been processed. End. When the unprocessed workpiece 41 is left, the process returns to step S4, and the processing of the next processed point 41 is performed. When a plurality of laser pulses are incident on each of the processed points 41 for processing, cyclic mode processing or trigger mode processing can be applied.

在循環模式加工中,每對1個被加工點41入射1個雷射脈衝時,使入射位置移動到下1個被加工點41。將對所有的被加工點41入射1次雷射脈衝的順序作為1個循環,藉由重複複數次該循環,能夠使所希望的發射次數的雷射脈衝入射到被加工點41。在進行循環模式加工時,在步驟S8中,重複了所希望次數的循環時,判定為加工結束。 In the cyclic mode processing, when one laser pulse is incident on each of the pair of processed points 41, the incident position is moved to the next processed point 41. The order in which one laser pulse is incident on all of the processed points 41 is taken as one cycle, and by repeating the cycle several times, the laser pulse of the desired number of times of emission can be incident on the processed point 41. When the loop mode processing is performed, when the loop of the desired number of times is repeated in step S8, it is determined that the machining is completed.

在觸發模式加工中,對1個被加工點41連續入射所希望的發射次數的雷射脈衝之後,進行下一次應加工的被加工點41的加工。在進行觸發模式加工時,使上一次雷射脈衝及下一次雷射脈衝入射到相同的被加工點41時,無需在步驟S4中使光束掃描器20動作。 In the trigger mode processing, after one laser beam having a desired number of shots is continuously incident on one of the processed points 41, the processing of the processed point 41 to be processed next is performed. When the trigger mode processing is performed, when the last laser pulse and the next laser pulse are incident on the same processed point 41, it is not necessary to operate the beam scanner 20 in step S4.

當所有的被加工點41的加工結束時,在步驟S9中,判定是否留有被加工點41的配置圖案相同的未加工的加工對象物40。當留有未加工的加工對象物40時,返回到步驟S3,將下一次應加工的加工對象物40載置於載物台23。當沒有未加工的加工對象物40時,結束加工製程。 When the machining of all the machining points 41 is completed, it is determined in step S9 whether or not the unprocessed machining object 40 having the same arrangement pattern of the machining points 41 is left. When the unprocessed object 40 is left, the process returns to step S3, and the object 40 to be processed next time is placed on the stage 23. When there is no unprocessed object 40, the processing is terminated.

在加工具有與上一次加工的加工對象物40的被加工點41的配置圖案不同的配置圖案的加工對象物40時,執行步驟S1~步驟S2的加工前準備製程,並重新決定容許 範圍R1。 When the object 40 having the arrangement pattern different from the arrangement pattern of the workpiece 41 to be processed of the object 40 to be processed is processed, the pre-processing preparation process of steps S1 to S2 is executed, and the permission is again determined. Range R1.

上述實施例中,即使是具有第6B圖所示之超出正常範圍R0的判定能量的雷射脈衝Lp1,判定能量在容許範圍R1內的雷射脈衝亦可用於加工用。因此,能夠抑制雷射能量的利用效率的降低。並且,雷射光源10的動作變得不穩定,且判定能量超出容許範圍R1時,該雷射脈衝Lp1無法用於加工。因此,能夠防止因脈衝能量不足或入射過多的雷射脈衝Lp2而導致的加工品質的下降。 In the above embodiment, even in the case of the laser pulse Lp1 having the determination energy exceeding the normal range R0 shown in Fig. 6B, the laser pulse having the energy within the allowable range R1 can be used for processing. Therefore, it is possible to suppress a decrease in the utilization efficiency of the laser energy. Further, when the operation of the laser light source 10 becomes unstable and the determination energy exceeds the allowable range R1, the laser pulse Lp1 cannot be used for processing. Therefore, it is possible to prevent a decrease in processing quality due to insufficient pulse energy or excessive incident laser pulse Lp2.

上述實施例中,在開始被加工點41的配置圖案相同的複數個加工對象物40的加工之前,實施步驟S1~步驟S2(第5圖)的加工前製程,並決定容許範圍R1。亦可以將對所決定之容許範圍R1與被加工點41的配置圖案建立關聯的對應關係存儲在存儲裝置51中。 In the above-described embodiment, before the processing of the plurality of processing objects 40 having the same arrangement pattern of the machining points 41, the pre-machining process of steps S1 to S2 (Fig. 5) is performed, and the allowable range R1 is determined. A correspondence relationship between the determined allowable range R1 and the arrangement pattern of the processed point 41 may be stored in the storage device 51.

第7圖中顯示出該對應關係的一例。按照每1個被加工點41的配置圖案,存儲容許範圍R1的下限值及上限值。下一次應加工的加工對象物40的被加工點41的配置圖案存儲在第7圖的對應表中時,可以省略步驟S1~步驟S2(第2圖)。在步驟S6中,只要判定存儲在存儲裝置51中的判定能量是否在容許範圍R1內即可。 An example of this correspondence is shown in Fig. 7. The lower limit value and the upper limit value of the allowable range R1 are stored in accordance with the arrangement pattern of each of the processed points 41. When the arrangement pattern of the workpieces 41 to be processed 40 to be processed next time is stored in the correspondence table of Fig. 7, steps S1 to S2 (second diagram) can be omitted. In step S6, it is only necessary to determine whether or not the determination energy stored in the storage device 51 is within the allowable range R1.

藉由以上實施例對本發明進行了說明,但本發明並不限定於此。例如,能夠進行各種變更、改進以及組合等,這對本領域技術人員來說是顯而易見的。 The present invention has been described by the above embodiments, but the present invention is not limited thereto. For example, it will be apparent to those skilled in the art that various changes, modifications, combinations and the like can be made.

Claims (7)

一種雷射加工裝置,其特徵為具有:雷射光源,輸出脈衝雷射光束;載物台,保持加工對象物;光束掃描器,使從前述雷射光源輸出的前述脈衝雷射光束入射到前述加工對象物,並且使前述加工對象物表面上的入射位置移動;光檢測器,檢測從前述雷射光源輸出的前述脈衝雷射光束的各雷射脈衝的依賴於脈衝能量之物理量;路徑切換器,將從前述雷射光源輸出的前述脈衝雷射光束的路徑在入射到前述加工對象物的第1路徑與不入射到前述加工對象物的第2路徑之間進行切換;及控制裝置,存儲前述加工對象物表面的複數個被加工點的位置及加工順序,並依據前述被加工點的位置、前述加工順序及前述光檢測器的檢測結果來控制前述光束掃描器及前述路徑切換器,前述控制裝置執行加工前準備製程,在前述加工前準備製程中控制前述光束掃描器,以使前述脈衝雷射光束依據前述加工順序入射到前述被加工點的位置,同時藉由前述光檢測器檢測各雷射脈衝的依賴於脈衝能量之前述物理量,並依據前述物理量的分佈來決定前述物理量的容許範圍,在前述加工前準備製程之後,前述控制裝置在前述加工對象物的加工過程中沿著前述第1路徑傳輸藉由前述光 檢測器檢測出之前述物理量在前述容許範圍內的雷射脈衝的至少一部份,沿著前述第2路徑傳輸超出前述容許範圍的雷射脈衝。 A laser processing apparatus characterized by comprising: a laser light source outputting a pulsed laser beam; a stage holding the object to be processed; and a beam scanner for causing the pulsed laser beam outputted from the laser source to be incident on the foregoing Processing an object and moving an incident position on a surface of the object to be processed; and a photodetector detecting a physical quantity of each of the laser pulses of the pulsed laser beam outputted from the laser light source depending on pulse energy; the path switcher And switching a path of the pulsed laser beam output from the laser light source between a first path incident on the object to be processed and a second path not incident on the object to be processed; and a control device storing the foregoing Controlling the position and processing order of the plurality of processed points on the surface of the object, and controlling the beam scanner and the path switch according to the position of the processed point, the processing order, and the detection result of the photodetector, the control The device performs a pre-processing preparation process, and controls the aforementioned beam scanner in the aforementioned pre-processing preparation process so that The pulsed laser beam is incident on the position of the processed point according to the processing sequence, and the aforementioned physical quantity of each laser pulse dependent on the pulse energy is detected by the photodetector, and the physical quantity is determined according to the distribution of the physical quantity. The allowable range, after the pre-processing preparation process, the control device transmits the light along the first path during the processing of the object to be processed The detector detects at least a portion of the laser pulse having the physical quantity within the allowable range, and transmits a laser pulse that exceeds the allowable range along the second path. 如申請專利範圍第1項所述之雷射加工裝置,其中,前述控制裝置依據前述物理量的標準偏差來決定前述容許範圍的上限值及下限值。 The laser processing apparatus according to claim 1, wherein the control device determines an upper limit value and a lower limit value of the allowable range based on a standard deviation of the physical quantity. 如申請專利範圍第1或2項所述之雷射加工裝置,其中,前述控制裝置在下一次應加工的加工對象物的被加工點的配置圖案與上一次加工的加工對象物的被加工點的配置圖案不同時,在進行下一次應加工的加工對象物的加工之前,執行前述加工前準備製程並重新決定前述容許範圍。 The laser processing apparatus according to the first or second aspect of the invention, wherein the control device is arranged at a processing point of a workpiece to be processed next time and a processed point of the workpiece to be processed last time. When the arrangement pattern is different, the pre-processing preparation process is executed and the allowable range is newly determined before the processing of the object to be processed next. 如申請專利範圍第1或2項所述之雷射加工裝置,其中,前述物理量為前述雷射脈衝的上升部份的能量。 The laser processing apparatus according to claim 1 or 2, wherein the physical quantity is energy of a rising portion of the laser pulse. 一種雷射加工方法,其特徵為具有以下製程:控制光束掃描器,以使脈衝雷射光束按照規定的加工順序入射到規定的被加工點的位置,同時測量各雷射脈衝的依賴於脈衝能量之物理量之製程;依據測量出之前述物理量的分佈來決定前述物理量的容許範圍之製程;及按照前述加工順序使脈衝雷射光束入射到加工對象物 上的前述被加工點的位置,並進行雷射加工之製程,在前述進行雷射加工之製程中,測量前述脈衝雷射光束的各雷射脈衝的前述物理量,測量結果在前述容許範圍內時使該雷射脈衝的至少一部份入射到前述加工對象物,測量結果超出前述容許範圍時不使該雷射脈衝入射到前述加工對象物。 A laser processing method characterized by having the following process: controlling a beam scanner to cause a pulsed laser beam to be incident on a predetermined processed point in accordance with a predetermined processing order, while measuring pulse-dependent energy of each laser pulse a process for determining a physical quantity; a process for determining an allowable range of the physical quantity based on the measured distribution of the physical quantity; and causing the pulsed laser beam to be incident on the object to be processed according to the processing order The position of the processed point above and the laser processing process, in the laser processing process described above, measuring the physical quantity of each laser pulse of the pulsed laser beam, and the measurement result is within the allowable range At least a part of the laser pulse is incident on the object to be processed, and when the measurement result exceeds the allowable range, the laser pulse is not incident on the object to be processed. 如申請專利範圍第5項所述之雷射加工方法,其中,依據前述物理量的標準偏差來決定前述容許範圍的上限值及下限值。 The laser processing method according to claim 5, wherein the upper limit and the lower limit of the allowable range are determined based on a standard deviation of the physical quantity. 如申請專利範圍第5或6項所述之雷射加工方法,其中,前述物理量為前述雷射脈衝的上升部份的能量。 The laser processing method according to claim 5, wherein the physical quantity is energy of a rising portion of the laser pulse.
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