TWI573990B - 測定裝置及控制方法 - Google Patents

測定裝置及控制方法 Download PDF

Info

Publication number
TWI573990B
TWI573990B TW104128621A TW104128621A TWI573990B TW I573990 B TWI573990 B TW I573990B TW 104128621 A TW104128621 A TW 104128621A TW 104128621 A TW104128621 A TW 104128621A TW I573990 B TWI573990 B TW I573990B
Authority
TW
Taiwan
Prior art keywords
light
emitting element
shielding portion
probe
led
Prior art date
Application number
TW104128621A
Other languages
English (en)
Chinese (zh)
Other versions
TW201625908A (zh
Inventor
望月學
藤森昭一
Original Assignee
日本先鋒公司
日本先鋒自動化公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本先鋒公司, 日本先鋒自動化公司 filed Critical 日本先鋒公司
Publication of TW201625908A publication Critical patent/TW201625908A/zh
Application granted granted Critical
Publication of TWI573990B publication Critical patent/TWI573990B/zh

Links

Landscapes

  • Testing Of Optical Devices Or Fibers (AREA)
  • Led Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW104128621A 2015-01-15 2015-08-31 測定裝置及控制方法 TWI573990B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015005773A JP6402307B2 (ja) 2015-01-15 2015-01-15 測定装置及び制御方法

Publications (2)

Publication Number Publication Date
TW201625908A TW201625908A (zh) 2016-07-16
TWI573990B true TWI573990B (zh) 2017-03-11

Family

ID=56415402

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104128621A TWI573990B (zh) 2015-01-15 2015-08-31 測定裝置及控制方法

Country Status (2)

Country Link
JP (1) JP6402307B2 (ja)
TW (1) TWI573990B (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017116372A (ja) * 2015-12-24 2017-06-29 日東電工株式会社 蛍光体層付光半導体素子の検査方法
KR102016222B1 (ko) * 2017-10-31 2019-08-29 한국광기술원 조명기기 평가장치
JP2022124177A (ja) 2021-02-15 2022-08-25 株式会社日本マイクロニクス 接続装置及び集光基板

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM414583U (en) * 2011-05-10 2011-10-21 Guan-Nan Chen Integrating sphere close to an object to be measured
CN202869647U (zh) * 2012-09-26 2013-04-10 合肥彩虹蓝光科技有限公司 积分球
TWM459403U (zh) * 2013-02-26 2013-08-11 Saultech Technology Co Ltd Ｌｅｄ晶粒發光量測設備
US20140084188A1 (en) * 2012-09-26 2014-03-27 Epistar Corporation Apparatus for measuring the optoelectronic characteristics of light-emitting diode

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0992699A (ja) * 1995-09-25 1997-04-04 Rohm Co Ltd 発光素子の測定方法
JP2010249718A (ja) * 2009-04-17 2010-11-04 Micronics Japan Co Ltd Ｌｅｄの試験に用いる光検出装置
JP2012073261A (ja) * 2011-11-02 2012-04-12 Seiwa Electric Mfg Co Ltd 光学特性測定装置
WO2014020713A1 (ja) * 2012-07-31 2014-02-06 パイオニア株式会社 光量測定装置及び光量測定方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM414583U (en) * 2011-05-10 2011-10-21 Guan-Nan Chen Integrating sphere close to an object to be measured
CN202869647U (zh) * 2012-09-26 2013-04-10 合肥彩虹蓝光科技有限公司 积分球
US20140084188A1 (en) * 2012-09-26 2014-03-27 Epistar Corporation Apparatus for measuring the optoelectronic characteristics of light-emitting diode
TWM459403U (zh) * 2013-02-26 2013-08-11 Saultech Technology Co Ltd Ｌｅｄ晶粒發光量測設備

Also Published As

Publication number Publication date
TW201625908A (zh) 2016-07-16
JP6402307B2 (ja) 2018-10-10
JP2016130715A (ja) 2016-07-21

Similar Documents

Publication Publication Date Title
KR101091791B1 (ko) 적분구 광도계 및 그 측정 방법
TWI573990B (zh) 測定裝置及控制方法
JP2008076126A (ja) 測光装置及び測光方法
TWI460405B (zh) Light amount measuring device and light amount measuring method
KR20160143536A (ko) 연마 장치
JP2019100736A (ja) 分光反射測定器
US8358146B2 (en) CMOS image sensor test probe card
WO2012073357A1 (ja) 半導体発光素子用受光モジュール及び半導体発光素子用検査装置
JP2010217109A (ja) 発光素子測定装置
KR101473064B1 (ko) 광학 시험 장치
JP2014115144A (ja) 形状測定装置、光学装置、形状測定装置の製造方法、構造物製造システム、及び構造物製造方法
JP2024010105A (ja) 試験装置、試験方法およびプログラム
JP6082758B2 (ja) 光量測定装置
JPWO2012073346A1 (ja) 発光ダイオード素子用受光モジュール及び発光ダイオード素子用検査装置
JP5665324B2 (ja) 全光量測定システム、全光量測定装置、および、全光量測定方法
TWI608222B (zh) 光學測定裝置
US9683888B2 (en) Measurement of the light radiation of light-emitting diodes
TWI479131B (zh) 發光二極體之量測裝置
JP5839548B2 (ja) 発光装置の製造方法、面光源装置の製造方法、及び表示装置の製造方法
KR20140114500A (ko) 스테이지 장치 및 이의 구동 방법
WO2012120613A1 (ja) 発光状況測定装置
JP2016184607A (ja) 半導体発光素子の評価装置および評価方法
JP2013011542A (ja) 検査装置
JP5567223B2 (ja) 光量測定装置及び光量測定方法
KR20240058908A (ko) 역반사기를 정의하는 프로브, 프로브를 포함하는 프로브 시스템 및 프로브를 이용하는 방법