M414583 五、新型說明： 【新型所屬之技術領域】 本新型是有關於-種積分球，特別是指一種接近待測 物的積分球。 【先前技術】 參閱圖1，習知與一量測機器10搭配的積分球^，包 括-中空球狀空間12,及—與該球狀空間12連通的收光口 13。該量測機ft 1G搭配該積分球u，可用於分析發光二極 體W的光學特性。該量測機器1〇包括—針臂μ及一晶圓 座15’該針臂Η上夾設有一控斜μ 益 穴又句抓針16。错由晶圓座15的抬 升，使位在該晶圓座15上的發光二極體w，碰觸到該探针 16,由於該探針16上帶有電流，促使發光二極體W發亮， 此時紐便可透過該積分球u的收光π 13，進人到該. 球11的中空球狀空間12。該中线狀空間12是與一感測 裝置（圖未示）連接，該感測裝置便可利用該中空球狀空 間12内接收到的光線，進行光學特性的量測分析。 參閱圖2，由於該積分球丨 二收尤口 13與待測發光二 極體W的遠近，將影響進入刭兮 幻該積分球11内部中空球狀空 間12的先線。收光口 13盘女往-iii jt%. >k , ，、及得測發先二極體W越遠，入 射中空球狀空間12的角声蔣合勒，_ 月度將會越小，這也表錢人到該中 空球狀空間12的光線量較少， 、 &里权乂，而收先口 13與該待測發光 二極體W越近，入射中空破壯命Μ μ n * 衣狀二間12的角度將會越大，表 示進入到該中空球狀空間12的光後詈妨夕 町尤踝里較多。但由於量測機 器10的針臂14具有一定屋洚 ^ ，而这厚度往往是影響待測 3 M414583 發光二極體W與積分球11之收光孔13距離的最主要因素 ，因此習知的積分球11與一量測機器1〇搭配使用，進入到 該中空球狀空間12的光線便會有所限制。 【新型内容】 因此，本新型之目的，即在提供一種接近待測物的積 分球。 於是，本新型接近待測物的積分球，搭配一量測器使 用，該量測器具有至少一夾設有一探針的針臂，該積分球 包含-形Μ内部的球狀空間’―形成於該積分球底面並 徑向連通至該球狀空間的收光孔，及至少—自該收光孔橫 向貫穿至外部空間的穿設槽，該穿設槽可供該針臂穿設。 本新型之功效在於：透過將該針臂穿設在該穿設槽内 ，使該探針接觸待測物時，能更為接近該積分球，進而大 幅提升待測物的探測效果’減少誤差，充分達成本新型的 功效》 【實施方式】 有關本新型之前述及其他技術内容、特點與功效，在 以下S己合參考圖式《—個較佳實施例的詳細 清楚的呈現。 r將可 參閱圖3、圖4,本新型接近待測物的積分球之 施例是搭配-量測器2使用，該量測包括至 ： 有。。探針211的針臂21及―晶圓座22，於本實施例中該旦 測盗2之針臂21數量為兩個，且分別夾設-個探針211^ 該積分球剖面形狀為矩形，並包含一形成於内部的球 4 M414583 狀空間3 1，及一形成於該積分球的底面且徑向連通該球狀 • 空間3 1與外部空間的收光孔32。 該積分球還包含至少一自該收光孔32橫向貫穿至外部 空間的穿設槽33，在本實施例中，該積分球之穿設槽33數 . 量為兩個，且是以該收光孔32為中心，彼此夾角呈18〇度 ‘ 排列。其中’該等穿設槽33是形成於該積分球的底面，並 延伸至該積分球的側面，實際製造時，當該量測器2的針 φ 臂21數量只有一個時，該積分球只需要一個穿設槽33。 藉由上述結構，本新型的操作方式敘述如下： 同h•參閱圖5，該積分球是搭配該量測器2，對待測的 發光二極體界分析其光學特性。該量測器2的針臂21個數 是對應於該等穿設槽33,操作上，將該等針臂21分別穿設 了該等穿設槽33内，接著啟動該量測器2，該量測器2之 晶圓座22便會向上抬升，將位於該晶圓座22上的待測發 光二極體W，肖該等針臂21上夾設的探針2U互相碰觸， φ 由於電流的導通使得待測發光二極體W受到驅動而發光。 待測發光二極體W發出的光線，將透過該收光孔32進 人到該球狀空間31内，而該球狀空間31是與—感測器（M414583 V. New description: [New technical field] The new type is related to an integrating sphere, especially an integrating sphere close to the object to be tested. [Prior Art] Referring to Fig. 1, an integrating sphere that is conventionally associated with a measuring machine 10 includes a hollow spherical space 12, and a light collecting opening 13 communicating with the spherical space 12. The measuring machine ft 1G is used with the integrating sphere u to analyze the optical characteristics of the light-emitting diode W. The measuring machine 1 includes a pin arm μ and a wafer holder 15'. The pin arm is provided with a control tilting hole and a gripping pin 16. The lift of the wafer holder 15 causes the light-emitting diode w located on the wafer holder 15 to touch the probe 16, and the current is applied to the probe 16 to cause the light-emitting diode to be emitted. When it is bright, the button can enter the hollow spherical space 12 of the ball 11 through the light π 13 of the integrating sphere u. The neutral line space 12 is connected to a sensing device (not shown), and the sensing device can perform measurement analysis of optical characteristics by using the light received in the hollow spherical space 12. Referring to Fig. 2, due to the proximity of the integrating sphere to the light-emitting diode W to be tested, it will affect the trajectory of the hollow spherical space 12 inside the integrating sphere 11. The light-collecting port 13 female to -iii jt%. >k, ,, and the farther the measured first polarizer W, the angle of the incident hollow spherical space 12, Jiang Hele, _ the monthly will be smaller, This also shows that the amount of light to the hollow spherical space 12 is small, and the weight of the first opening 13 is close to the light-emitting diode W to be tested, and the incident hollow is strong. * The angle of the garment-like two rooms 12 will be larger, indicating that there is more light entering the hollow spherical space 12 after the light. However, since the needle arm 14 of the measuring machine 10 has a certain amount of housing, and this thickness is often the most important factor affecting the distance between the 3 M414583 light-emitting diode W and the light-collecting hole 13 of the integrating sphere 11, the conventional one is known. The integrating sphere 11 is used in conjunction with a measuring machine 1 ,, and the light entering the hollow spherical space 12 is limited. [New content] Therefore, the purpose of the present invention is to provide an integrating sphere close to the object to be tested. Therefore, the novel integrating sphere of the object to be tested is used with a measuring instrument having at least one needle arm with a probe, and the integrating sphere includes a spherical space inside the shaped crucible. The light receiving hole of the bottom surface of the integrating sphere and radially communicating with the spherical space, and at least the through groove extending transversely from the light receiving hole to the outer space, the through groove is provided for the needle arm to pass through. The utility model has the advantages that: by inserting the needle arm in the through groove, the probe can be brought closer to the integrating sphere when the probe is in contact with the object to be tested, thereby greatly improving the detection effect of the object to be tested. The present invention and the other technical contents, features and effects of the present invention are fully described in the following description. r will be referred to Fig. 3 and Fig. 4. The novel embodiment of the integrating sphere close to the object to be tested is used by the collocation-meter 2, and the measurement includes: . In the present embodiment, the number of the needle arms 21 of the probe 211 is two, and the number of the needle arms 21 of the probe 2 is two, and the probes 211 are respectively arranged. And comprising a ball 4 M414583 shaped space 3 1 formed inside, and a light collecting hole 32 formed on the bottom surface of the integrating sphere and radially communicating the spherical space 3 1 and the external space. The integrating sphere further includes at least one through groove 33 extending transversely from the light receiving hole 32 to the outer space. In the embodiment, the number of the through holes 33 of the integrating sphere is two. The light holes 32 are centered and arranged at an angle of 18 degrees to each other. Wherein the through grooves 33 are formed on the bottom surface of the integrating sphere and extend to the side of the integrating sphere. In actual manufacture, when the number of the needle φ arms 21 of the measuring device 2 is only one, the integrating sphere only A through slot 33 is required. With the above structure, the operation mode of the present invention is described as follows: Same as h• Referring to Fig. 5, the integrating sphere is matched with the measuring device 2, and the optical characteristics of the LED boundary to be measured are analyzed. The number of the needle arms 21 of the measuring device 2 corresponds to the through grooves 33. In operation, the needle arms 21 are respectively inserted into the through grooves 33, and then the measuring device 2 is activated. The wafer holder 22 of the measuring device 2 is lifted upward, and the light-emitting diodes W to be tested on the wafer holder 22 are touched by the probes 2U sandwiched on the needle arms 21, φ Due to the conduction of the current, the light-emitting diode W to be tested is driven to emit light. The light emitted by the LED to be tested is introduced into the spherical space 31 through the light collecting hole 32, and the spherical space 31 is a sensor (
圖未不）連接，當光線因不斷反射而充斥整個球狀空間B 後，便能透過該感測器量測，得知待測發光二極體 學特性。 幻尤 將本新型的優點敘述如下： 該積分球由於具有穿設槽33，讓該量測器2的！ 能穿設其中’與習知技術相比’可大幅減少待測發光二極 5 M414583 體W與該收光孔32之間的距離。 又由於該待測發光二極體W與該收光孔32之間的距離 越短，待測發光二極體W所發出的光線，將可以較大的角 度入射該球狀空間31，於是溢散的光線便能大幅減少，如 此待測發光二極體w發出的光線在大量進入該球狀空間31 後’分析出來的光學特性，將會較符合待測發光二極體w 的實際情況，不至於因溢散光線過多，讓量測結果產生嚴 重的誤差。 惟以上所述者，僅為本新型之較佳實施例而已，當不 能以此限定本新型實施之範圍，即大凡依本新型申請專利 乾圍及新型說明内容所作之簡單的等效變化與修飾，皆仍 屬本新型專利涵蓋之範圍内。 【圖式簡單說明】 3 疋立體圖’說明習知的一積分球搭配一量測機 器使用； 圖2是一剖面圖，說明習知的積分球光線入射之角度 較小。 又 圖3疋一立體圖，說明本新型的較佳實施例。 圖4疋一剖面圖，說明本新型之内部空間關係；及 圖5疋一剖面圖，說明本新型光線入射之角度較大。 6 M414583 【主要元件符號說明】 2…… •…里測态 32 •…收光孔 21 …-· …·針臂 33 •…穿設槽 211… •…探針 W •… •…發光二極體 22··... •…晶圓座 31··.·· •…球狀空間The figure is connected. When the light is continuously reflected and flooded the entire spherical space B, the sensor can be measured by the sensor to know the physical characteristics of the light-emitting diode to be tested. The special advantages of this novel are described as follows: The integrating sphere has the wear slot 33, allowing the measuring device 2! The distance between the body of the light-emitting diode 5 M414583 and the light-receiving hole 32 can be greatly reduced by being able to be worn in comparison with the conventional technique. Moreover, the shorter the distance between the light-emitting diode W to be tested and the light-receiving hole 32, the light emitted by the light-emitting diode W to be detected can be incident on the spherical space 31 at a large angle, and then overflow. The scattered light can be greatly reduced, so that the optical characteristics of the light emitted from the light-emitting diode w to be analyzed after entering a large amount of the spherical space 31 will be more in line with the actual situation of the light-emitting diode w to be tested. It is not too much due to excessive light, which causes serious errors in the measurement results. However, the above is only the preferred embodiment of the present invention, and the scope of the present invention cannot be limited thereto, that is, the simple equivalent change and modification of the patent application and the new description of the present invention. , are still within the scope of this new patent. [Simple diagram of the diagram] 3 疋 Stereoscopic diagram ′ illustrates the use of a conventional integrating sphere with a measuring machine; Fig. 2 is a cross-sectional view showing that the angle of incidence of the conventional integrating sphere ray is small. 3 is a perspective view showing a preferred embodiment of the present invention. Figure 4 is a cross-sectional view showing the internal spatial relationship of the present invention; and Figure 5 is a cross-sectional view showing that the angle of incidence of the light of the present invention is large. 6 M414583 [Explanation of main component symbols] 2... •...Measurement state 32 •...Light collection hole 21 ...-· ...·Pin arm 33 •...Slot 211... •...Probe W •... •...Lighting diode Body 22··... •... Wafer holder 31····· •...spherical space