CN104111162A - Light detection device and method for light-emitting element to be detected - Google Patents
Light detection device and method for light-emitting element to be detected Download PDFInfo
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- CN104111162A CN104111162A CN201410047701.0A CN201410047701A CN104111162A CN 104111162 A CN104111162 A CN 104111162A CN 201410047701 A CN201410047701 A CN 201410047701A CN 104111162 A CN104111162 A CN 104111162A
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- 238000001514 detection method Methods 0.000 title claims abstract description 45
- 238000000034 method Methods 0.000 title claims abstract description 13
- 238000012856 packing Methods 0.000 claims description 15
- 230000003287 optical effect Effects 0.000 claims description 13
- 238000007639 printing Methods 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 8
- 239000004744 fabric Substances 0.000 claims description 2
- 239000013078 crystal Substances 0.000 description 31
- 238000009792 diffusion process Methods 0.000 description 12
- 230000000694 effects Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 3
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000004020 luminiscence type Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 229920000297 Rayon Polymers 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 210000004907 gland Anatomy 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Abstract
The invention provides a light detection device and a method of a light-emitting element to be detected, the light detection device comprises an integrating sphere, a supporting jig and a point measuring needle, wherein the integrating sphere is a hollow sphere, the wall surface of the integrating sphere is provided with at least one light receiving hole and one light emitting hole, and the inner wall of the integrating sphere is uniformly coated or formed with a reflecting surface; the supporting jig comprises a supporting frame body and a light-transmitting plate, when the supporting frame body is arranged on the integrating sphere, one side of the light-transmitting plate can be attached to the position corresponding to the light-receiving hole, and the other side of the light-transmitting plate is used for supporting and placing a light-emitting element to be tested; the point measuring needle is arranged at a position corresponding to the light-emitting element to be measured and can apply current to the light-emitting element to be measured so that light emitted by the light-emitting element to be measured can enter the integrating sphere through the light-transmitting plate and then be emitted out of the integrating sphere through the light-emitting hole, and a measuring instrument arranged outside the light-emitting hole can measure the light emitted by the light-emitting element to be measured.
Description
Technical field
The present invention relates to a kind of optical detection device and method thereof of light-emitting component to be measured, espespecially a kind of a support jig is installed up to corresponding to one of an integrating sphere and receives the position of unthreaded hole, and by the to-and-fro movement of some chaining pins, a light-emitting component to be measured on this support jig is detected, expand accordingly the receipts optic angle degree of this integrating sphere, and then improve pick-up unit and the method thereof of the receipts light quantity of this integrating sphere.
Background technology
Light emitting diode (Light-Emitting Diode, LED) be a kind of in energising after can produce bright semi-conductor electricity sub-element, compared to traditional lighting apparatus, light emitting diode has that efficiency is high, cost is low, reaction velocity is fast and the advantage such as long service life,, become in economic development and science and technology research and development and have one of gordian technique of influence power even on the field such as optical communication therefore start to be in recent years widely applied at traffic sign, ligthing paraphernalia, display panel.
In light emitting diode, main luminous element is crystal grain (crystal grain), and it is generally formed by wafer (wafer) cutting.Due to characteristics such as luminosity, wavelength, colour temperature and the operating voltages of crystal grain, can be different because of the difference slightly on processing conditions, even and if cut the crystal grain forming by same wafer, its characteristics of luminescence is also not quite similar.Therefore, when dealer cuts into wafer after multiple crystal grain, can carry out trace routine for characterisitic parameters such as the predominant wavelength of indivedual crystal grain, luminous intensity, luminous flux, colour temperature, operating voltage, breakdown reverse voltages, with according to the aforesaid various parameters of each crystal grain by each crystal grain classification, so that can be by the crystal grain of different brackets, be applied to respectively its applicable field.
Traditionally, in the time detecting the characteristics of luminescence of crystal grain, use an integrating sphere (Integrating Sphere) to collect the light that crystal grain sends more, then by a measuring equipment, measure the light being penetrated by this integrating sphere.Integrating sphere is a kind of desirable optical diffuser, and it is configured as a hollow sphere, to form the space of a unglazed evil therein, and then can guarantee that ray cast, to after in this integrating sphere, can not be subject to the light evil impact of other light sources; In addition, integrating sphere inside is coated with a reflection horizon (as: barium sulphate) of high stability, high reflectance conventionally, to pass through this reflection horizon, the light of injecting this integrating sphere is reflected equably and diffusion in this integrating sphere, and then can in this integrating sphere, form uniform light distribution, reduce accordingly the detection error causing because of the responsiveness of light shape, dispersion angle and different detection positions, make testing result more reliable.
Refer to shown in Fig. 1, it is a kind of structure of known pick-up unit 1, this pick-up unit 1 comprises an integrating sphere 11 and some chaining pins 12, this integrating sphere 11 is provided with a receipts light beam 111 and two and goes out light beam 112, this receipts light beam 111 and go out light beam 112 and offer respectively perforate, to be communicated to the space in this integrating sphere 11, this goes out light beam 112 and is connected with an optical fiber 13 and a measuring instrument 14 respectively; This chaining pin 12 is positioned the position to receiving light beam 111 via a spot measurement device (not shown), and this chaining pin 12 belows are placed with a crystal grain 10 of light emitting diode.In the time detecting, this integrating sphere 11 can be jointly to bottom offset with this chaining pin 12, with in the time that this chaining pin 12 is electrically connected to the pin of this crystal grain 10, the light that makes this crystal grain 10 project, can be projected to this integrating sphere 11 inside, subsequently, measure by this optical fiber 13 and measuring instrument 14 light that this crystal grain 10 projects, and then can analyze the characterisitic parameter of this crystal grain 10.
Although, because the light that this crystal grain 10 projects can be in this integrating sphere 11 internal reflections and diffusion, to form uniform light beam, effectively reduce many disturbing factors that may cause error, but, be limited to the configuration mode of known detection means, in fact in the time detecting, the light data that known detection means 1 is detected, still complete reaction goes out the actual characteristic parameter of this crystal grain 10 ideally.The defect that its reason and this pick-up unit 1 are now described in detail in detail is respectively as follows:
(1) distance between crystal grain 10 and receipts light beam 111: because this chaining pin 12 is between this crystal grain 10 and this integrating sphere 11, between this crystal grain 10 and this receipts light beam 111, certainly existing a spacing distance D1, therefore, the light that this crystal grain 10 projects also cannot be in the situation that not being subject to external interference, be projected to ideally in this integrating sphere 11, and this crystal grain 10 is in the time projecting light, still there is a predetermined crevice projection angle A, if this crevice projection angle A is large or this spacing distance D1 is long, this light is after this spacing distance D1, the light that must have part cannot be collected by this receipts light beam 111 smoothly, and the precision of impact on measuring.
(2) pore size of perforate on receipts light beam 111: as previously mentioned, owing to thering is this spacing distance D1 between this receipts light beam 111 and this crystal grain 10, therefore in the time detecting, perforate on this receipts light beam 111 must need to be designed to far beyond this crystal grain 10 for large, so, could avoid as much as possible light after this crevice projection angle A diffusion, cannot all enter the problem of this integrating sphere 11, but, under the perforate and this crystal grain 10 unmatched situation of this receipts light beam 111, the light that this crystal grain 10 projects is after these integrating sphere 11 internal reflections and diffusion, still may be penetrated by this receipts light beam 111, cause the interior former testing environment that should be completely airtight of this integrating sphere destroyed, and then have influence on the accuracy in detection.
Therefore, how known pick-up unit is improved, to solve the past in the time carrying out trace routine, the light that crystal grain 10 produces cannot fully enter this integrating sphere 11, and the light in this integrating sphere 11 after reflection and diffusion, still may leak to extraneous problem by this receipts light beam 111 is loose, become the present invention and desire most ardently the major issue of solution at this.
Summary of the invention
Because known detection means is subject to the restriction of its configuration mode, so that can produce problems in the time carrying out trace routine, inventor is according to its practical experience for many years, after constantly studying, test and improveing, finally design a kind of optical detection device and method thereof of light-emitting component to be measured, to seeing through the present invention, solve the problems of known detection means.
Object of the present invention, be to provide a kind of optical detection device and method thereof of light-emitting component to be measured, wherein, described optical detection device comprises an integrating sphere, one support jig and some chaining pins, wherein, described integrating sphere is a hollow sphere, its wall offers at least one receipts unthreaded hole and a light hole, described receipts unthreaded hole and light hole are connected with the space in described integrating sphere respectively, the inwall of described integrating sphere is evenly coated with or is formed with a reflecting surface, the basic functional principle of described integrating sphere is the light that a light-emitting component to be measured (as: crystal grain of light emitting diode) produces, can be via described receipts unthreaded hole, inject in described integrating sphere, subsequently, light can be reflected equably and diffusion by this reflecting surface in described integrating sphere, to form uniform light distribution in described integrating sphere, again via described light hole, penetrate outside described integrating sphere, therefore, one measuring instrument can be by described light hole, measure diffusion light beam very uniformly, and according to this described light-emitting component to be measured is detected.
Described support jig comprises a support frame and a light-passing board, described support frame and described light-passing board mutually combine integral, when described support frame is installed up on described integrating sphere, can make a side of described light-passing board recline to the position corresponding to described receipts unthreaded hole, the opposite side of described light-passing board is for supporting and place a light-emitting component to be measured.
Described some chaining pin is arranged on the position corresponding to described light-emitting component to be measured, and can be with respect to described light-emitting component shift reciprocately to be measured, under the state at the described light-emitting component to be measured of contact, described light-emitting component to be measured is applied to electric current, so that the light that described light-emitting component to be measured sends, can see through described light-passing board and enter described integrating sphere, penetrate outside described integrating sphere via described light hole again, and then a measuring instrument that makes to be arranged at outside described light hole can measure the light that described light-emitting component to be measured sends.
The light detection method of the light-emitting component to be measured that the present invention proposes, it is applied in the optical detection device of light-emitting component to be measured as above, and the light detection method of described light-emitting component to be measured comprises the following steps:
Described light-emitting component to be measured is positioned over to the described opposite side of described light-passing board;
Under the fixing state of the relative position between described integrating sphere, support jig and light-emitting component to be measured, make described some chaining pin with respect to described light-emitting component shift reciprocately to be measured; And
Under the state of described the described light-emitting component to be measured of chaining pin contact, see through described some chaining pin described light-emitting component to be measured is applied to electric current, so that the light that described light-emitting component to be measured sends, can see through described light-passing board and enter described integrating sphere, penetrate outside described integrating sphere via described light hole again, and then a measuring instrument that makes to be arranged at outside described light hole can measure the light that described light-emitting component to be measured sends.
So, because a side of described light-passing board reclines to described receipts unthreaded hole, and described light-emitting component to be measured is directly placed at the described opposite side of described light-passing board, therefore, when described some chaining pin applies electric current to described light-emitting component to be measured, carry out survey time, all light that described light-emitting component to be measured produces in receipts light angular range, all can be via described receipts unthreaded hole, inject described integrating sphere, and reflected equably and diffusion by described reflecting surface in described integrating sphere, form after uniform beam, again via described light hole, penetrate outside described integrating sphere, therefore can significantly increase the receipts optic angle degree of described integrating sphere, and significantly improve the accuracy of measurement of this measuring instrument to described light-emitting component to be measured.
Brief description of the drawings
Fig. 1 is the schematic diagram of known detection means;
Fig. 2 is the pick-up unit schematic perspective view of preferred embodiment of the present invention;
Fig. 3 A is the illustrative view of receipts electro-optical device of the present invention; And
Fig. 3 B is the illustrative view of receipts electro-optical device of the present invention.
Main element label declaration:
Pick-up unit ... 2
Integrating sphere ... 21
Reflecting surface ... 210
Receive light beam ... 211
Receive unthreaded hole ... 211a
Go out light beam ... 212
Light hole ... 212a
Support jig ... 22
Support frame ... 221
Space, location ... 221a
Packing element ... 221b
Light-passing board ... 222
Point chaining pin ... 30
Light-emitting component to be measured ... L
Printing opacity detection zone ... F1
Light tight echo area ... F2
Receive optic angle degree ... θ
Seal element ... M
Thickness ... D2
Embodiment
Understand the existing the specific embodiment of the present invention that further illustrates by reference to the accompanying drawings for technical characterictic of the present invention, object and effect being had more clearly.
The present invention is a kind of optical detection device and method thereof of light-emitting component to be measured, refer to shown in Fig. 2 and Fig. 3 A, in preferred embodiment of the present invention, this pick-up unit 2 comprises an integrating sphere 21 and a support jig 22, this integrating sphere 21 be configured as a hollow sphere, in inner wall surface thereof, be evenly coated with or be formed with a reflecting surface 210.In a preferred embodiment, on the outer wall of this integrating sphere 21, convex with a receipts light beam 211 and at least one go out light beam 212, the central authorities of this receipts light beam 211 offer a receipts unthreaded hole 211a, the central authorities that respectively go out light beam 212 offer respectively a light hole 212a, and this receipts unthreaded hole 211a and light hole 212a are connected with the space of these integrating sphere 21 inside, but, the present invention is not as limit, when actual applying, also can omit this receipts light beam 211 and go out light beam 212, and the wall that this receipts unthreaded hole 211a and light hole 212a are directly opened in to this integrating sphere 21, first illustrate at this.Special one carry at this, this quantity that goes out light beam 212 can be according to the detection mode adjustment of dealer's reality, and can be by a seal element M by the light hole 212a sealing in non-working condition.
Hold, this support jig 22 comprises a support frame 221 and a light-passing board 222, this support frame 221 offers certain bit space 221a towards the bottom side inner edge of this integrating sphere 21, the configuration of this space, location 221a and the configuration of this receipts light beam 211 match, to make the bottom side of this support frame 221 can be socketed on this receipts light beam 211.This support frame 221 is still provided with multiple packing element 221b, these packing elements 221b is arranged at the position corresponding to this space, location 221a on this support frame 221, to be connected under the state of this receipts light beam 211 at these support frame 221 quilt covers, make this support frame 221 can closely be combined into one with this receipts light beam 211.In a preferred embodiment, these packing elements 221b is multiple screws, its one end is corresponding to the position of this space, location 221a, and these packing elements 221b is arranged on this support frame 221 actively, and user can rotate each packing element 221b by the other end of each packing element 221b, to make this one end energy packing of this packing element 221b to the periphery of this receipts light beam 211, and then this support frame 221 is combined into one with this receipts light beam 211, or rotate each packing element 221b, can be against the periphery to this receipts light beam 211 with this one end that makes each packing element 221b, and then this support frame 221 can be unloaded on this receipts light beam 211.This light-passing board 222 is fixedly arranged on this support frame 221, when this support frame 221 is installed up on this integrating sphere 21, can make a side of this light-passing board 222 recline to the position corresponding to this receipts unthreaded hole 211a, to make extraneous light, can sequentially pass through this light-passing board 222 and this receipts unthreaded hole 211a, enter in this integrating sphere 21.The opposite side of this light-passing board 222 is for supporting and place a light-emitting component L to be measured.
This special one carry be, the locator meams of this support frame 221 and this light-passing board 222 is not limited with aforesaid method, for example, in other embodiments of the invention, this packing element 221b also can be an elastic body, and be arranged at the position corresponding to this space, location 221a on this support frame 221, to be connected under the state of this receipts light beam 211 at these support frame 221 quilt covers, by the elasticity of this packing element 221b, make this support frame 221 and urgent being integrated of these receipts light beam 211 elasticity, so, also can reach impartial effect, or, this support frame 221 also can see through inlay card, the mode such as screw togather, be combined into one with this receipts light beam 211, dealer obtains optionally and freely changes.In addition, in a preferred embodiment, this light-passing board 222 directly sets firmly (as: fixing with viscose glue) in the end face of this support frame 221, but, in other preferred embodiments of the present invention, this light-passing board 222 can also be in the mode of fit or inlay card, is fixedly arranged on this support frame 221, illustrates in the lump at this.
Inventor is according to practical experience for many years, find why known pick-up unit is difficult to reduce detection error, its main cause is the configuration mode of known detection means, make in the time carrying out trace routine, distance between the crystal grain of light emitting diode and receipts unthreaded hole is excessive, so that often there is the problem of light leak in the process detecting, detect the main source of error and become, therefore, refer to shown in Fig. 3 A, one design focal point of pick-up unit 2 of the present invention, be this light-passing board 222 can not only be directly as carrying one light-emitting component L(to be measured as the crystal grain of light emitting diode) supporting surface, and because this light-passing board 222 is close to the position corresponding to this receipts unthreaded hole 211a, therefore, the light that this light-emitting component L to be measured sends, just can see through this light-passing board 222 directly enters in this integrating sphere 21.Accordingly, can not only guarantee that most of light that this light-emitting component L to be measured sends all can be projected in this integrating sphere 21, and the impact that can effectively avoid extraneous other light sources to cause.In the time carrying out aforesaid trace routine, dealer can be respectively this goes out on light beam 212 to connect respectively installing one measuring instrument (not shown); Or respectively this goes out to install on light beam 212 a seal element M(as gland bonnet or reflecting plate), with by this light hole 212a sealing in non-working condition, illustrate in the lump at this.
Refer to shown in Fig. 2 to Fig. 3 B, in the present embodiment, this pick-up unit 2 coordinates a spot measurement device (not shown), this light-emitting component L to be measured is detected, some chaining pins 30 of this spot measurement device are positioned the top of this pick-up unit 2, and can carry out actively shift reciprocately, because this chaining pin 30 is not situated between between this integrating sphere 21 and this light-emitting component L to be measured, therefore, taking up room of this chaining pin 30 can't affect the degree of accuracy of this pick-up unit 2 on detecting.In the time that this chaining pin 30 is electrically connected to the pin of this light-emitting component L to be measured, this light-emitting component L to be measured can be energized driving, and produce light, and this light can be via this receipts unthreaded hole 211a, inject in this integrating sphere 21, subsequently, light can be reflected and diffusion by this reflecting surface equably this integrating sphere 21 is interior, with in the uniform light distribution of the interior formation of this integrating sphere 21, again via this light hole 212a, penetrate outside this integrating sphere 21, make the measuring instrument can be by this light hole 212a, measure diffusion light beam very uniformly, and according to this this light-emitting component L to be measured is detected.
Hold, in a preferred embodiment, the side that this light-passing board 222 is faced receipts unthreaded hole 211a is still coated with a reflector layer, with by the region that is coated with this reflector layer, form a light tight echo area F2, and make on this light-passing board the not region of way this reflector layer of cloth, form a printing opacity detection zone F1, this printing opacity detection zone F1 is corresponding to the position of placing this light-emitting component L to be measured, and its configuration is corresponding to the size of this light-emitting component L to be measured.So, the light that can produce for this light-emitting component L to be measured except this printing opacity detection zone F1 passes through, other positions corresponding to this receipts unthreaded hole 211a all can be covered by this light tight echo area F2, therefore, work as this light-emitting component L to be measured is applied to electric current at this chaining pin 30, carry out survey time, the light that this light-emitting component L to be measured produces, injecting after this integrating sphere 21, to can not penetrated outside this integrating sphere 21 by other positions of this receipts unthreaded hole 211a, and can be reflected back in this integrating sphere 21 by this light tight echo area F2, continue by this reflecting surface reflection and diffusion in this integrating sphere 21, until form even light intensity, via this light hole 212a, till penetrating outside this integrating sphere 21, therefore the light that can avoid having entered in this integrating sphere 21 is scattered and disappeared by this receipts unthreaded hole 211a.
Refer to Fig. 1, 2, shown in 3B, relatively after known detection means 1 and pick-up unit 2 of the present invention, can obviously find out, while utilizing this pick-up unit 2 to detect, distance between this light-emitting component L to be measured and this integrating sphere 21 is only the thickness D2 of this light-passing board 222, this thickness D2 is not only short far beyond the spacing distance D1 in Fig. 1, and because this light-passing board 222 is attached on this receipts light beam 211, therefore the light that this light-emitting component L to be measured produces without first through outside air, enter again this integrating sphere 21, accordingly, can guarantee that light can not be subject to extraneous interference, and promote detect on precision and degree of stability, in addition, though the light that this light-emitting component L to be measured produces has a receipts optic angle degree θ, but, due to this light-passing board 222 this receipts unthreaded hole 211a of next-door neighbour and this printing opacity detection zone F1, therefore the light that this light-emitting component L to be measured produces is entering after integrating sphere 21, can be along with this receipts optic angle degree θ diffusion, meaning, pick-up unit 2 of the present invention can guarantee that the light that this light-emitting component L to be measured produces is fully projected in this integrating sphere 21, the ideal that makes the receipts light quantity of this integrating sphere 21 come far beyond known detection means, simultaneously, also can solve the problem of receiving optic angle degree perfectly.
Special one carry at this, the integrating sphere 21 of drawing in Fig. 2, it is received unthreaded hole 211a and is opened on this receipts light beam 211, but, as aforementioned, this receipts unthreaded hole 211a also can directly be opened on the wall of this integrating sphere 21, and this receipts light beam 211 need not be set on this integrating sphere 21.Dealer only need by the bottom side of this support frame 221 be designed to this integrating sphere 21 on corresponding to the position of this receipts unthreaded hole 211a (as: the arcuation concave surface that matches, to conform on this integrating sphere 21, or this support frame 221 can be embedded in the inlay card groove on this integrating sphere 21), so, also can make this light-passing board 222 be fixedly arranged on hermetically the position corresponding to this receipts unthreaded hole 211a on this integrating sphere 21.
In addition, in the aforementioned embodiment, this light-passing board 222, by reflection horizon, is divided into this printing opacity detection zone F1 and light tight echo area F2, still, dealer can also directly use different materials to make this light-passing board 222, this means, dealer can use light transmissive material to make printing opacity detection zone F1 on this light-passing board 222, and uses the light tight reflecting material of monoblock to make this light tight echo area F2, so, also can reach identical effect.In addition, in the aforementioned embodiment, the material in this reflection horizon is identical with the material of reflecting surface 210 in this integrating sphere 21, preferably detects effect to reach, still, actual applying, the material in this reflection horizon still can be adjusted according to dealer's demand.
Also refer to shown in Fig. 1,2,3B, compared to known detection means 1, when this light-emitting component L to be measured detection through pick-up unit 2 of the present invention, its detection method still possesses following feature: a side of (1) this light-passing board 222 is close to the position corresponding to this receipts unthreaded hole 211a on this integrating sphere 21, and this light-emitting component to be measured is positioned over the opposite side of this light-passing board; (2), under the fixing state of the relative position between this integrating sphere 21, support jig 22 and light-emitting component L to be measured, this chaining pin 30 can be with respect to this light-emitting component L shift reciprocately to be measured; (3) under the state of this chaining pin 30 these light-emitting component L to be measured of contact, this chaining pin 30 can apply electric current to this light-emitting component L to be measured, so that the light that this light-emitting component L to be measured sends, can see through this light-passing board 222 and enter this integrating sphere 21, penetrate outside this integrating sphere 21 via this light hole 212a again, and then a measuring instrument (as shown in Figure 1) that makes to be arranged at outside this light hole 212a can measure the light that this light-emitting component L to be measured sends.In detection method of the present invention, only need to make this chaining pin 30 shift reciprocatelies, can detect for this light-emitting component L to be measured, must make this integrating sphere 11 and the common displacement of this chaining pin 12 compared with known detection means 1, method of the present invention is obviously easy to be many.
The foregoing is only some preferred embodiments of the present invention; but technical scheme of the present invention is not limited to this, the personage of all correlative technology fields; consider in light of actual conditions after technology contents of the present invention can think easily and equivalence change, all should not depart from protection category of the present invention.
Claims (7)
1. an optical detection device for light-emitting component to be measured, is characterized in that, the optical detection device of described light-emitting component to be measured comprises:
One integrating sphere, is a hollow sphere, and its wall offers at least one receipts unthreaded hole and a light hole, and described receipts unthreaded hole and light hole are connected with the space in described integrating sphere respectively, and the inwall of described integrating sphere is evenly coated with or is formed with a reflecting surface;
One support jig, it comprises a support frame and a light-passing board, described support frame and described light-passing board mutually combine integral, when described support frame is installed up on described integrating sphere, can make a side of described light-passing board recline to the position corresponding to described receipts unthreaded hole, the opposite side of described light-passing board is for supporting and place a light-emitting component to be measured; And
Some chaining pins, are arranged on corresponding to the position of placing described light-emitting component to be measured, and can, with respect to described light-emitting component shift reciprocately to be measured, under the state at the described light-emitting component to be measured of contact, apply electric current to described light-emitting component to be measured.
2. device as claimed in claim 1, it is characterized in that, one side of described light-passing board is also coated with a reflector layer, by being coated with the region of described reflector layer, form a light tight echo area, and make on described light-passing board the region of reflector layer described in way cloth not, form a printing opacity detection zone, described printing opacity detection zone is corresponding to the position of placing described light-emitting component to be measured, and described printing opacity detection zone configuration is corresponding to the size of described light-emitting component to be measured, and described light tight echo area is reflected back in described integrating sphere again in order to the light that described integrating sphere internal reflection is come.
3. device as claimed in claim 2, is characterized in that, described integrating sphere is still provided with a receipts light beam, and described receipts unthreaded hole is opened in the central part of described receipts light beam.
4. device as claimed in claim 3, is characterized in that, the bottom side of described support frame offers certain bit space, and the configuration in space, described location and described receipts light beam match, and can be connected to described receipts light beam by quilt cover with the bottom side that makes described support frame.
5. device as claimed in claim 4, it is characterized in that, described support frame is still provided with multiple packing elements, described packing element is arranged at the position corresponding to space, described location on described support frame, to be connected under the state of described receipts light beam at described support frame quilt cover, make described support frame and described receipts light beam closely be combined into one.
6. the device as described in claim 2,3,4 or 5, is characterized in that, on described light-passing board, the material of reflector layer is identical with the material of the reflecting surface on described integrating sphere inwall.
7. the light detection method of a light-emitting component to be measured, be applied to an optical detection device, described optical detection device comprises an integrating sphere, one support jig and some chaining pins, wherein said integrating sphere is a hollow sphere, described integrating sphere wall offers at least one receipts unthreaded hole and a light hole, described receipts unthreaded hole and light hole are connected with the space in described integrating sphere respectively, the inwall of described integrating sphere is evenly coated with or is formed with a reflecting surface, described support jig comprises a support frame and a light-passing board, described support frame and described light-passing board mutually combine integral, when described support frame is installed up on described integrating sphere, can make a side of described light-passing board recline to the position corresponding to described receipts unthreaded hole, the opposite side of described light-passing board is for supporting and place a light-emitting component to be measured, described some chaining pin is arranged on corresponding to the position of placing described light-emitting component to be measured, the method comprises the following steps:
Described light-emitting component to be measured is positioned over to the described opposite side of described light-passing board;
Under the fixing state of the relative position between described integrating sphere, support jig and light-emitting component to be measured, make described some chaining pin with respect to described light-emitting component shift reciprocately to be measured; And
Under the state of described the described light-emitting component to be measured of chaining pin contact, see through described some chaining pin described light-emitting component to be measured is applied to electric current, so that the light that described light-emitting component to be measured sends, can see through described light-passing board and enter described integrating sphere, penetrate outside described integrating sphere via described light hole again, and then a measuring instrument that makes to be arranged at outside described light hole can measure the light that described light-emitting component to be measured sends.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102113415A TW201333499A (en) | 2013-04-16 | 2013-04-16 | Optical detection apparatus of light emission element to be tested and method thereof |
| TW102113415 | 2013-04-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
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| CN104502070A (en) * | 2014-12-31 | 2015-04-08 | 华中科技大学 | Flip LED (light emitting diode) chip on-line detection light receiving testing module |
| CN104502069A (en) * | 2014-12-31 | 2015-04-08 | 华中科技大学 | Flip LED (light emitting diode) chip on-line detection light receiving testing method |
| CN105988025A (en) * | 2015-03-20 | 2016-10-05 | 旺矽科技股份有限公司 | Multi-unit test probe card with illumination adjustment mechanism and illumination adjustment method thereof |
| CN109612969A (en) * | 2018-12-12 | 2019-04-12 | 闽江学院 | A kind of chroma and luminance measurement device can be used for long-persistence luminous object and test method |
| CN117555089A (en) * | 2024-01-10 | 2024-02-13 | 深圳市维度科技股份有限公司 | Clamp for adapting optical fiber connector |
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| TWI502206B (en) * | 2013-12-27 | 2015-10-01 | Hon Tech Inc | Image sensing device for testing electronic components and its application |
| WO2015107655A1 (en) * | 2014-01-16 | 2015-07-23 | パイオニア株式会社 | Optical measuring apparatus |
| CN104075879A (en) * | 2014-06-06 | 2014-10-01 | 致茂电子(苏州)有限公司 | Light emitting diode measurement device |
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| CN105988025A (en) * | 2015-03-20 | 2016-10-05 | 旺矽科技股份有限公司 | Multi-unit test probe card with illumination adjustment mechanism and illumination adjustment method thereof |
| CN109612969A (en) * | 2018-12-12 | 2019-04-12 | 闽江学院 | A kind of chroma and luminance measurement device can be used for long-persistence luminous object and test method |
| CN117555089A (en) * | 2024-01-10 | 2024-02-13 | 深圳市维度科技股份有限公司 | Clamp for adapting optical fiber connector |
| CN117555089B (en) * | 2024-01-10 | 2024-04-12 | 深圳市维度科技股份有限公司 | Clamp for adapting duplex fiber connector |
Also Published As
| Publication number | Publication date |
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| TWI464432B (en) | 2014-12-11 |
| TW201333499A (en) | 2013-08-16 |
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Application publication date: 20141022 |