CN104792498A - Dynamic testing method for light source - Google Patents
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- CN104792498A CN104792498A CN201510142798.8A CN201510142798A CN104792498A CN 104792498 A CN104792498 A CN 104792498A CN 201510142798 A CN201510142798 A CN 201510142798A CN 104792498 A CN104792498 A CN 104792498A
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Abstract
The invention discloses a dynamic testing method for a light source. The dynamic testing method for the light source comprises the steps that a scanning type light source testing system comprises an optical testing disk, a motor and a transmission mechanism, wherein the transmission mechanism is driven by the motor to drive the optical testing disk to conduct scanning in the length direction of the light source to be tested, the radian A of the optical testing disk is an arc surface with the angle ranging from 0 degree to 360 degrees, B photoelectric sensors are uniformly arranged on the arc surface of the optical testing disk, and the angle between every two adjacent photoelectric sensors meets the expression of A/(B-1); a calibration coefficient K of each photoelectric sensor is acquired through standard light source calibration; scanning testing is conducted on the light source to be tested through the scanning type light source testing system, the sum of light illumination values of the positions of the light source to be tested is calculated to obtain the total illumination E<to-be-tested> of the light source to be tested through the scanning type light source testing system, and a light intensity distribution curve chart of the light source to be tested is acquired according to the collected light illumination of various points; the E<to-be-tested> is corrected according to the calibration coefficient K, and the luminous flux Phi<to-be-tested> of the light source to be tested is acquired. According to the dynamic testing method for the light source, light intensity distribution and the luminous flux of the light source can be obtained rapidly and accurately, the position of a damaged lamp is judged, and the dynamic testing method for the light source is applicable to industrial production.
Description
Technical field
The present invention relates to the light source dynamic testing method of the testing light source light distribution of a kind of energy and luminous flux.
Background technology
The important parameter when curve of light distribution of light source and luminous flux are all application is the important indicator evaluating light source.The method of current testing light source luminous flux has two kinds: one passes through integrating sphere, measured light is placed in the integrating sphere of dimension, the light allowing illuminating source send is uniformly distributed, and is then measured the contrast of illumination by standard lamp and tested lamp for twice, calculates luminous flux; Another kind is measured by distribution photometer, by the light intensity of testing light source in space or Illumination Distribution, and obtains total light flux to total space integration.In order to the light intensity on measurement space different directions, distribution photometer needs one usually for supporting and locate the mechanical hook-up of light fixture or light source and luminosity probe, and make light fixture and probe relative to rotating or moving in spatial dimension, luminosity probe obtains data and processes simultaneously.
For integrating sphere measurement luminous flux, due to the calibration of needs standard lamp, if the spectral distribution of sample and light distribution and working standard lamp exist larger difference, larger measuring error can be brought.Especially there is obvious spatial color unevenness in the luminescence of LED lamp product, and the special luminescent properties of LED product has challenge for the accurate measurement of integrating sphere luminous flux.
Distribution photometer system is a kind of optical test equipment of precision, to the requirement that the precision of the parasitic light in measuring distance, test angle, test environment and photometric measurement all will be higher.First for the illumination that the measurement of luminous intensity is by measuring on certain certain distance, light intensity value is calculated according to the distance inverse square law of photometry.
That is: I (C, r)=E (C, r) * R2 (C, r), wherein: I is the light intensity on measurement direction, E is the illumination in detector opto-electronic receiver face, and R is measuring distance.But for many light fixtures, especially LED lamp, the luminosity law near field is inapplicable, clear and definite regulation made by CIE file to this, the luminosity measurement distance of light fixture should be enough large, usual employing two kinds of measuring distances: angle pencil of ray light fixture is 12m ~ 15m, arrow beam of light high-intensity lamp is 30m ~ 35m, ensures far-field measurement precision.Secondly, what distribution photometer was tested is light fixture luminosity data in all directions, has higher requirement, comprise angle precision, axis precision, reflective mirror surface figure accuracy etc. to the angle precision of its rotation and positioning system.Finally, parasitic light affects one of most important factor of measuring accuracy during distributed luminosity is measured, and needs the darkroom test environment of standard, want the parasitic light of strictly controlled environment during test.
In sum, the restriction of integrating sphere measurement and distribution photometer method of testing tested person method and apparatus size, substantially can only measure in laboratory conditions, correctly to test luminous flux and the curve of light distribution of measured light, consider the operation convenience of efficiency and the testing apparatus of testing again, what adapt to that production line tests with measured light fast is easy for installation, and existing method of testing is difficult to the testing requirement meeting production line.
Summary of the invention
The object of this invention is to provide one and quick and precisely and restricted few, the light source dynamic testing method that commercial production detects can be applicable to.
The technical scheme realizing the object of the invention is a kind of light source dynamic testing method, comprises the following steps:
Step one: prepare scan-type test of light source system: described scan-type test of light source system comprises optic test disk, motor and transport sector; Described motor drives transport sector to drive optic test disk to scan along light source length direction to be measured; Described optic test disk to be radian A the be arc surface of 0 ° ~ 360 °; Described optic test disk evenly arranges B photoelectric sensor on arc surface, and B is natural number, and the angle be greater than between 1 adjacent photosensors is A/ (B-1); Or described optic test disk arranges 1 photoelectric sensor, optic test disk rotation 0 ° ~ 360 °;
Step 2: between the luminous flux calculating the standard sources under the luminous flux of the standard sources under standard method of test and this test macro calibration coefficient K;
Step 3: treat light-metering source with this test macro and carry out sweep test, the illuminance value summation treating each position, light-metering source according to this test macro obtains the total illumination E of light source to be measured
to be measured; The light intensity distributions curve map of light source to be measured is obtained according to each point illuminance collected;
Step 4: the calibration coefficient K obtained according to step 2 is to E
to be measuredrevise, obtain the luminous flux Ф of light source to be measured
to be measured.
When optic test disk in described step one arranges B photoelectric sensor, be provided with diaphragm in each photoelectric sensor front portion, the size of aperture guarantees that photoelectric sensor only gathers the light data in A/ (B-1) angle.
The radian of the optic test disk in described step one is 300 °, arranges 31 photoelectric sensors with 30 ° of intervals.
Described photoelectric sensor is silicon photocell.
In described step 2, the method for testing of the luminous flux of the standard sources under standard method of test is the luminous flux with canonical product bulb separation or spatial light intensity Distribution Test system measurement standard light source.
With this test macro standard sources tested in described step 2 and treat the method for carrying out sweep test in light-metering source with this test macro in step 3 and be: optic test disk moves along light source length direction, the illuminance data of each point on each cross section in all photoelectric sensors acquisition light source length directions thus on optic test disk, illuminance summation according to each position obtains total illuminance, then calculates the luminous flux Ф of light source.
Described photoelectric sensor and the distance between standard sources and light source to be measured need guarantee that the distance between each optical sensor and light source reaches the requirement of test.
The method that described photoelectric sensor obtains the data of light source each point illuminance to be measured comprises Static Sampling method or sweeps adopts synchronous method; Described Static Sampling method is: stop after motor removing to test position, then sample, sample to next test position according to test step-length mobile motor again after the illuminance of this position is recorded, calculate again after recording all illuminance of test of light source length direction; Described sweeping is adopted synchronous method and is: utilize motor to scan and A/D sample-synchronous technology, controls motor removing and A/D samples simultaneously, and then the illuminance data obtaining each test position calculate.
After have employed technique scheme, the present invention has following positive effect: (1) invention of the present invention quick and precisely can test luminous flux and the curve of light distribution of various light source, the test mode of scan-type can conveniently combine with the production line of factory or p-wire, arrives production test integration and carries out.
(2) scan method of the present invention can be static employing method also can be sweep to adopt synchronous method, can select flexibly according to actual conditions.
(3) the present invention can be multiple photoelectric sensor that optic test disk distributes, also can be only fill a photoelectric sensor to be rotated by disk, no matter adopt which kind of mode, optic test disk can carry out omnibearing scanning to light source, and test result is more accurate.
(4) distance of light source of the present invention and photoelectric sensor reaches the requirement of test, so just the tiny area that each detector is tested can be considered as pointolite, effectively eliminates the error that lamp tube shapes is brought.
(5) test the surface of intensity distribution obtained according to the inventive method, bad lamp position can also be known in time and exactly.
Accompanying drawing explanation
In order to make content of the present invention more easily be clearly understood, below according to specific embodiment also by reference to the accompanying drawings, the present invention is further detailed explanation, wherein
Fig. 1 is the schematic diagram of optic test disk of the present invention.
Fig. 2 is the curve of light distribution figure adopting method of testing of the present invention to obtain.
Embodiment
(embodiment 1)
A kind of light source dynamic testing method of the present embodiment, comprises the following steps:
Step one: prepare scan-type test of light source system: scan-type test of light source system comprises optic test disk (as shown in Figure 1), motor and transport sector; Motor drives transport sector to drive optic test disk to scan along light source length direction to be measured; Optic test disk to be radian A the be arc surface of 300 °; Optic test disk evenly arranges 31 silicon photocells as photoelectric sensor on arc surface, angle between adjacent photosensors is 30 °, be provided with diaphragm in each photoelectric sensor front portion, the size of aperture guarantees that photoelectric sensor only gathers the light data in 30 ° of angles.
Step 2: between the luminous flux calculating the standard sources under the luminous flux of the standard sources under standard method of test and this test macro calibration coefficient K; The method of testing of the luminous flux of the standard sources under standard method of test is the luminous flux with canonical product bulb separation or spatial light intensity Distribution Test system measurement standard light source.With this test macro standard sources tested and treat the method for carrying out sweep test in light-metering source with this test macro in step 3 and be: optic test disk moves along light source length direction, the illuminance data of each point on each cross section in all photoelectric sensors acquisition light source length directions thus on optic test disk, illuminance summation according to each position obtains total illuminance, then calculates the luminous flux Ф of light source.
Step 3: treat light-metering source with this test macro and carry out sweep test, the illuminance value summation treating each position, light-metering source according to this test macro obtains the total illumination E of light source to be measured
to be measured; The light intensity distributions curve map of light source to be measured is obtained according to each point illuminance collected; The method that photoelectric sensor obtains the data of light source each point illuminance to be measured comprises Static Sampling method or sweeps adopts synchronous method; Static Sampling method is: stop after motor removing to test position, then sample, sample to next test position according to test step-length mobile motor again after the illuminance of this position is recorded, calculate again after recording all illuminance of test of light source length direction; Sweep and adopt synchronous method and be: utilize motor to scan and A/D sample-synchronous technology, control motor removing and A/D samples simultaneously, then the illuminance data obtaining each test position calculate.
Step 4: the calibration coefficient K obtained according to step 2 is to E
to be measuredrevise, obtain the luminous flux Ф of light source to be measured
to be measured.
Photoelectric sensor and the distance between standard sources and light source to be measured need guarantee that the distance between each optical sensor and light source reaches the requirement of test.
Following table is the data of distributed photometer and the inventive method test, then according to the curve of light distribution figure that this test data obtains as shown in Figure 2, known substantially error free.
For luminous flux, will the light fixture of method of the present invention test be adopted to contrast with adopting the light fixture of integrating sphere measurement, deviate be very little, and the accuracy of visible method test result of the present invention is high.
Above-described specific embodiment; object of the present invention, technical scheme and beneficial effect are further described; be understood that; the foregoing is only specific embodiments of the invention; be not limited to the present invention; within the spirit and principles in the present invention all, any amendment made, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (8)
1. a light source dynamic testing method, is characterized in that comprising the following steps:
Step one: prepare scan-type test of light source system: described scan-type test of light source system comprises optic test disk, motor and transport sector; Described motor drives transport sector to drive optic test disk to scan along light source length direction to be measured; The radian A of described optic test disk is the arc surface of 0 ° ~ 360 °; Described optic test disk evenly arranges B photoelectric sensor on arc surface, and B is natural number, is greater than 1, and the angle between adjacent photosensors is A/ (B-1); Or described optic test disk arranges 1 photoelectric sensor, optic test disk rotation 0 ° ~ 360 °;
Step 2: between the luminous flux calculating the standard sources under the luminous flux of the standard sources under standard method of test and this test macro calibration coefficient K;
Step 3: treat light-metering source with this test macro and carry out sweep test, the illuminance value summation treating each position, light-metering source according to this test macro obtains the total illumination E of light source to be measured
to be measured; The light intensity distributions curve map of light source to be measured is obtained according to each point illuminance collected;
Step 4: the calibration coefficient K obtained according to step 2 is to E
to be measuredrevise, the luminous flux Ф obtaining light source to be measured is to be measured.
2. a kind of light source dynamic testing method according to claim 1, it is characterized in that: when the optic test disk in described step one arranges B photoelectric sensor, each photoelectric sensor front portion is provided with diaphragm, and the size of aperture guarantees that photoelectric sensor only gathers the light data in A/ (B-1) angle.
3. a kind of light source dynamic testing method according to claim 2, is characterized in that: the radian of the optic test disk in described step one is 300 °, arranges 31 photoelectric sensors with 30 ° of intervals.
4. a kind of light source dynamic testing method according to claim 3, is characterized in that: described photoelectric sensor is silicon photocell.
5. a kind of light source dynamic testing method according to claim 4, it is characterized in that: in described step 2, the method for testing of the luminous flux of the standard sources under standard method of test is the luminous flux with canonical product bulb separation or spatial light intensity Distribution Test system measurement standard light source.
6. a kind of light source dynamic testing method according to claim 5, it is characterized in that: with this test macro standard sources tested in described step 2 and treat the method for carrying out sweep test in light-metering source with this test macro in step 3 and be: optic test disk moves along light source length direction, the illuminance data of each point on each cross section in all photoelectric sensors acquisition light source length directions thus on optic test disk, illuminance summation according to each position obtains total illuminance, then calculates the luminous flux Ф of light source.
7. a kind of light source dynamic testing method according to claim 6, is characterized in that: described photoelectric sensor and the distance between standard sources and light source to be measured need guarantee that the distance between each optical sensor and light source reaches the requirement of test.
8. a kind of light source dynamic testing method according to claim 7, is characterized in that: the method that described photoelectric sensor obtains the data of light source each point illuminance to be measured comprises Static Sampling method or sweeps adopts synchronous method; Described Static Sampling method is: stop after motor removing to test position, then sample, sample to next test position according to test step-length mobile motor again after the illuminance of this position is recorded, calculate again after recording all illuminance of test of light source length direction; Described sweeping is adopted synchronous method and is: utilize motor to scan and A/D sample-synchronous technology, controls motor removing and A/D samples simultaneously, and then the illuminance data obtaining each test position calculate.
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| CN105222994A (en) * | 2015-09-25 | 2016-01-06 | 北京奥博泰科技有限公司 | A kind of distributed photometer |
| CN106908155A (en) * | 2017-03-03 | 2017-06-30 | 上海应用技术大学 | A kind of wavelength measurement instrument |
| CN109282972A (en) * | 2018-11-23 | 2019-01-29 | 福建工程学院 | A kind of device and method measuring extraordinary lamps and lanterns light intensity parameter |
| CN110849587A (en) * | 2018-08-21 | 2020-02-28 | 深圳市汇顶科技股份有限公司 | Light source tester, method, device, equipment and storage medium |
| CN111000545A (en) * | 2019-12-19 | 2020-04-14 | 广电计量检测（武汉）有限公司 | Wearable device heart rate metering device and method for simulating blood pulsation |
| CN113218631A (en) * | 2021-04-29 | 2021-08-06 | 常州联影智融医疗科技有限公司 | Light intensity distribution testing device and testing method for light source |
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| CN106908155A (en) * | 2017-03-03 | 2017-06-30 | 上海应用技术大学 | A kind of wavelength measurement instrument |
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| CN110849587A (en) * | 2018-08-21 | 2020-02-28 | 深圳市汇顶科技股份有限公司 | Light source tester, method, device, equipment and storage medium |
| CN109282972A (en) * | 2018-11-23 | 2019-01-29 | 福建工程学院 | A kind of device and method measuring extraordinary lamps and lanterns light intensity parameter |
| CN109282972B (en) * | 2018-11-23 | 2023-09-22 | 福建工程学院 | Device and method for measuring light intensity parameters of special lamp |
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| CN113218631A (en) * | 2021-04-29 | 2021-08-06 | 常州联影智融医疗科技有限公司 | Light intensity distribution testing device and testing method for light source |
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