CN204514575U - A kind of scan-type test of light source system - Google Patents

A kind of scan-type test of light source system Download PDF

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Publication number
CN204514575U
CN204514575U CN201520182601.9U CN201520182601U CN204514575U CN 204514575 U CN204514575 U CN 204514575U CN 201520182601 U CN201520182601 U CN 201520182601U CN 204514575 U CN204514575 U CN 204514575U
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CN
China
Prior art keywords
light source
scan
disc body
photoelectric sensor
source system
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Expired - Fee Related
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CN201520182601.9U
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Chinese (zh)
Inventor
金亚方
刘石神
陈要玲
蒋威
刘从峰
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CHANGZHOU INSTITUTE OF OPTOELECTRONIC TECHNOLOGY
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CHANGZHOU INSTITUTE OF OPTOELECTRONIC TECHNOLOGY
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Priority to CN201520182601.9U priority Critical patent/CN204514575U/en
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Publication of CN204514575U publication Critical patent/CN204514575U/en
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Abstract

The utility model discloses a kind of scan-type test of light source system, comprise optic test disk, driving mechanism, transport sector and frame; Described optic test disk, driving mechanism and transport sector are all arranged in frame; Described driving mechanism drives transport sector to drive optic test disk to scan along light source length direction to be measured; Described optic test disk comprises disc body and is arranged at the photoelectric sensor on the arc surface of disc body.Device of the present utility model quick and precisely can test luminous flux and the curve of light distribution of various light source, and the proving installation of scan-type can conveniently combine with the production line of factory or p-wire, arrives production test integration and carries out.

Description

A kind of scan-type test of light source system
Technical field
The utility model relates to a kind of online scan-type light source intensity distribution and luminous flux test macro.
Background technology
Since 2003 start National Semiconductor illuminating engineering, China's semiconductor lighting industry achieves significant progress, and semiconductor lighting encapsulates, application product growth momentum is particularly powerful.But the many characteristics of luminescences due to LED application product make that its detection method exists very big-difference with conventional light source and light fixture, make the detection of semiconductor lighting product especially on-line checkingi challenged.
On-line checkingi mainly contains cold conditions and measures and hot state measurement two kinds of modes, and on-line testing comparatively common at present mostly adopts cold conditions measuring method.The cold conditions measurement of semiconductor lighting product has some to be difficult to the drawback overcome, and accurately cannot indicate the product performance of product when normal operating conditions, this be due to LED cold conditions the parameter such as colour temperature, usefulness from be different time hot.
Therefore, although LED cold conditions is measured can be indicated higher usefulness in product specification, but do not reflect performance during product real work state completely, but the specification that hot state measurement provides can be guaranteed consistent with the use experience of user, therefore the confidence of consumer can be won.As the important step of industry development, if these problems can not get properly settling, the sound development of industry will certainly be had a strong impact on.
The important parameter when curve of light distribution of light source and luminous flux are all application is the important indicator evaluating light source.The method of current testing light source luminous flux has two kinds: one passes through integrating sphere, measured light is placed in the integrating sphere of dimension, the light allowing illuminating source send is uniformly distributed, and is then measured the contrast of illumination by standard lamp and tested lamp for twice, calculates luminous flux; Another kind is measured by distribution photometer, by the light intensity of testing light source in space or Illumination Distribution, and obtains total light flux to total space integration.In order to the light intensity on measurement space different directions, distribution photometer needs one usually for supporting and locate the mechanical hook-up of light fixture or light source and luminosity probe, and make light fixture and probe relative to rotating or moving in spatial dimension, luminosity probe obtains data and processes simultaneously.
For integrating sphere measurement luminous flux, due to the calibration of needs standard lamp, if the spectral distribution of sample and light distribution and working standard lamp exist larger difference, larger measuring error can be brought.Especially there is obvious spatial color unevenness in the luminescence of LED lamp product, and the special luminescent properties of LED product has challenge for the accurate measurement of integrating sphere luminous flux.
Distribution photometer system is a kind of optical test equipment of precision, to the requirement that the precision of the parasitic light in measuring distance, test angle, test environment and photometric measurement all will be higher.First for the illumination that the measurement of luminous intensity is by measuring on certain certain distance, light intensity value is calculated according to the distance inverse square law of photometry.
That is: I (C, r)=E (C, r) * R2 (C, r), wherein: I is the light intensity on measurement direction, E is the illumination in detector opto-electronic receiver face, and R is measuring distance.But for many light fixtures, especially LED lamp, the luminosity law near field is inapplicable, clear and definite regulation made by CIE file to this, the luminosity measurement distance of light fixture should be enough large, usual employing two kinds of measuring distances: angle pencil of ray light fixture is 12m ~ 15m, arrow beam of light high-intensity lamp is 30m ~ 35m, ensures far-field measurement precision.Secondly, what distribution photometer was tested is light fixture luminosity data in all directions, has higher requirement, comprise angle precision, axis precision, reflective mirror surface figure accuracy etc. to the angle precision of its rotation and positioning system.Finally, parasitic light affects one of most important factor of measuring accuracy during distributed luminosity is measured, and needs the darkroom test environment of standard, want the parasitic light of strictly controlled environment during test.
In sum, the restriction of integrating sphere measurement and distribution photometer tested person method and apparatus size, substantially can only measure in laboratory conditions, correctly to test luminous flux and the curve of light distribution of measured light, consider the operation convenience of efficiency and the testing apparatus of testing again, what adapt to that production line tests with measured light fast is easy for installation, and existing proving installation is difficult to the testing requirement meeting production line.
Utility model content
The purpose of this utility model solves prior art Problems existing, provides one quick and precisely and restricted few, can be applicable to the scan-type test of light source system that commercial production detects.
The technical scheme realizing the utility model object is a kind of scan-type test of light source system, comprises optic test disk, driving mechanism, transport sector and frame; Described optic test disk, driving mechanism and transport sector are all arranged in frame; Described driving mechanism drives transport sector to drive optic test disk to scan along light source length direction to be measured; Described optic test disk comprises disc body and is arranged at the photoelectric sensor on the arc surface of disc body.
The radian A of the disc body of described optic test disk is 0 ° ~ 360 °; The arc surface of described disc body is evenly arranged B photoelectric sensor, B is natural number, is greater than 1, and the angle between adjacent photosensors is A/; Described each photoelectric sensor is fixed on pcb board.
Described each photoelectric sensor front portion is all provided with diaphragm, and the size of aperture guarantees that photoelectric sensor only gathers the light data in A/ angle.
The radian of described disc body is 300 °, and arc surface arranges 31 photoelectric sensors with 30 ° of intervals.
The arc surface of described disc body is arranged 1 photoelectric sensor, photodetector is rotation 0 ° ~ 360 ° under the driving of electric rotating machine, and disc body carries out rectilinear scanning operation.
The arc surface of described disc body is arranged 1 photoelectric sensor, disc body is rotation 0 ° ~ 360 ° under the driving of electric rotating machine
Described photoelectric sensor is silicon photocell.
Described disc body forms by two pieces, front and back panel is fastening.
Described optic test disk also comprises the data acquisition shielding case be arranged on disc body.
Described driving mechanism is motor; Described transport sector comprises ball-screw and cable drag chain.
Have employed technique scheme, the utility model has following useful effect: (1) device of the present utility model quick and precisely can test luminous flux and the curve of light distribution of various light source, the proving installation of scan-type can conveniently combine with the production line of factory or p-wire, arrives production test integration and carries out.
(2) the utility model can be multiple photoelectric sensor that optic test disk distributes, also can be only fill a photoelectric sensor to be rotated by disk, no matter adopt which kind of mode, optic test disk can carry out omnibearing scanning to light source, and test result is more accurate.
(3) carry out testing the surface of intensity distribution obtained according to the utility model, the bad lamp position of the strip light fixture being similar to fluorescent-lamp can also be known in time and exactly.Therefore can carry out classification and qualified judge to product, utilize the detection data of the every root fluorescent tube of database purchase, convenient inquiry, and defective fluorescent tube is analyzed and researched targetedly, thus provide improvement foundation for production.
Accompanying drawing explanation
In order to make content of the present utility model more easily be clearly understood, below according to specific embodiment also by reference to the accompanying drawings, the utility model is described in further detail, wherein
Fig. 1 is the structural representation of embodiment 1 of the present utility model.
Fig. 2 is the structural representation of the optic test disk in Fig. 1.
Fig. 3 is the structural representation of diaphragm in Fig. 1, photoelectric sensor
Fig. 4 is the structural representation of embodiment 2 of the present utility model.
Attached number in the figure is:
Optic test disk 1, disc body 11, photoelectric sensor 12, pcb board 13, diaphragm 14, data acquisition shielding case 15, driving mechanism 2, transport sector 3, ball-screw 31, cable drag chain 32, frame 4.
Embodiment
(embodiment 1)
See Fig. 1, a kind of scan-type test of light source system of the present embodiment, comprises optic test disk 1, driving mechanism 2, transport sector 3 and frame 4; Optic test disk 1, driving mechanism 2 and transport sector 3 are all arranged in frame 4; Driving mechanism 2 drives transport sector 3 to drive optic test disk 1 to scan along light source length direction to be measured; The photoelectric sensor 12 that optic test disk 1 comprises disc body 11 and is arranged on the arc surface of disc body 11.Driving mechanism 2 is motor; Transport sector comprises ball-screw 31 and cable drag chain 32.Optic test disk 1 is connected with ball-screw 31 by coupling assembling; driven by motor ball-screw 31 moves; optic test disk 1 is made to carry out scanning motion along ball-screw 31; obtain light intensity test data; cable drag chain 32 protected data gathering line is moved together along with optic test disk 1, and measurement result is transferred on PC and carries out data analysis and process.
See Fig. 1, the radian A of the disc body 11 of optic test disk 1 is 300 °; Disc body 11 is undertaken fastening by two pieces, front and back sheet metal component screw, can reduce other part parasitic lights of light source to the impact of measurement result, the arc surface of disc body 11 evenly be arranged 31 photoelectric sensors 12.Routing of layout position on disc body 11, makes circuit connection attractive in appearance, orderly, stable.Data acquisition shielding case 15 on disc body 11 is screwed with disc body 11, ensure that the stability of image data during scanning.Photoelectric sensor 12 is fixed installation by screw and disc body 11 installed surface, the light intensity data that photoelectric sensor 12 collects is transferred to data acquisition system (DAS) by shielding line, and data acquisition system (DAS) transfers to PC by cable and carries out data processing and analysis.
See Fig. 2, each photoelectric sensor 12 is weldingly fixed on pcb board 13.Each photoelectric sensor 12 front portion is all provided with diaphragm 14, and the size of aperture guarantees that photoelectric sensor 12 gathers the light data in 30 ° of angles.Photoelectric sensor 12 is silicon photocell.Pcb board 13 is fixed by screws on the front panel of diaphragm 14, the front and back panel screw of diaphragm 14 carries out fastening, the luminous energy that photoelectric sensor 12 receives is the light of light source by entering after diaphragm, ensure that the measurement to target light source and minimizing parasitic light, ensure the Stability and veracity of test data.
(embodiment 2)
The present embodiment 2 is the first rotary-type sweep type test macro, as shown in Figure 4, photoelectric sensor 12 is fixed by screws on disc body 11, under electric rotating machine drives, photodetector 12 is rotation 0 ° ~ 360 ° under the driving of electric rotating machine, and disc body 11 carries out rectilinear scanning operation, after having scanned, the light distribution situation in the whole spatial angle range of light source can be obtained.
(embodiment 3)
The present embodiment 3 is another kind of rotary-type sweep type test macro, photoelectric sensor 12 is fixed by screws on disc body 11, under electric rotating machine drives, disc body 11 carries out 0 ° ~ 360 ° rotations, carry out scanning and driven by driving mechanism simultaneously and scan along light source length direction to be measured, after having scanned, the light distribution situation in the whole spatial angle range of light source can be obtained.
Above-described specific embodiment; the purpose of this utility model, technical scheme and beneficial effect are further described; be understood that; the foregoing is only specific embodiment of the utility model; be not limited to the utility model; all within spirit of the present utility model and principle, any amendment made, equivalent replacement, improvement etc., all should be included within protection domain of the present utility model.

Claims (10)

1. a scan-type test of light source system, is characterized in that: comprise optic test disk (1), driving mechanism (2), transport sector (3) and frame (4); Described optic test disk (1), driving mechanism (2) and transport sector (3) are all arranged in frame (4); Described driving mechanism (2) drives transport sector (3) to drive optic test disk (1) to scan along light source length direction to be measured; Described optic test disk (1) comprises disc body (11) and is arranged at the photoelectric sensor (12) on the arc surface of disc body (11).
2. a kind of scan-type test of light source system according to claim 1, is characterized in that: the radian A of the disc body (11) of described optic test disk (1) is 0 ° ~ 360 °; The arc surface of described disc body (11) is evenly arranged B photoelectric sensor (12), B is natural number, is greater than 1, and the angle between adjacent photosensors (12) is A/ (B-1); Described each photoelectric sensor (12) is fixed on pcb board (13).
3. a kind of scan-type test of light source system according to claim 2, it is characterized in that: described each photoelectric sensor (12) front portion is all provided with diaphragm (14), the size of aperture guarantees that photoelectric sensor (12) only gathers the light data in A/ (B-1) angle.
4. a kind of scan-type test of light source system according to claim 3, is characterized in that: the radian of described disc body (11) is 300 °, and arc surface arranges 31 photoelectric sensors (12) with 30 ° of intervals.
5. a kind of scan-type test of light source system according to claim 1, it is characterized in that: the arc surface of described disc body (11) is arranged 1 photoelectric sensor (12), photoelectric sensor (12) is rotation 0 ° ~ 360 ° under the driving of electric rotating machine, and disc body (11) carries out rectilinear scanning operation.
6. a kind of scan-type test of light source system according to claim 1, it is characterized in that: the arc surface of described disc body (11) is arranged 1 photoelectric sensor (12), disc body (11) is rotation 0 ° ~ 360 ° under the driving of electric rotating machine.
7., according to a kind of scan-type test of light source system one of claim 1 to 6 Suo Shu, it is characterized in that: described photoelectric sensor (12) is silicon photocell.
8. a kind of scan-type test of light source system according to claim 7, is characterized in that: described disc body (11) forms by two pieces, front and back panel is fastening.
9. a kind of scan-type test of light source system according to claim 8, is characterized in that: described optic test disk (1) also comprises the data acquisition shielding case (15) be arranged on disc body (11).
10. a kind of scan-type test of light source system according to claim 9, is characterized in that: described driving mechanism (2) is motor; Described transport sector comprises ball-screw (31) and cable drag chain (32).
CN201520182601.9U 2015-03-27 2015-03-27 A kind of scan-type test of light source system Expired - Fee Related CN204514575U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104697752A (en) * 2015-03-27 2015-06-10 常州光电技术研究所 Scanning type light source testing system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104697752A (en) * 2015-03-27 2015-06-10 常州光电技术研究所 Scanning type light source testing system

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Granted publication date: 20150729

Termination date: 20190327