TWI563581B - Flash memory wafer probing method and machine - Google Patents

Flash memory wafer probing method and machine

Info

Publication number
TWI563581B
TWI563581B TW104102490A TW104102490A TWI563581B TW I563581 B TWI563581 B TW I563581B TW 104102490 A TW104102490 A TW 104102490A TW 104102490 A TW104102490 A TW 104102490A TW I563581 B TWI563581 B TW I563581B
Authority
TW
Taiwan
Prior art keywords
machine
flash memory
memory wafer
wafer probing
probing method
Prior art date
Application number
TW104102490A
Other languages
Chinese (zh)
Other versions
TW201628111A (en
Inventor
Yao Ting Tsai
Hsiu Han Liao
Se Chan Lien
Original Assignee
Winbond Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Winbond Electronics Corp filed Critical Winbond Electronics Corp
Priority to TW104102490A priority Critical patent/TWI563581B/en
Publication of TW201628111A publication Critical patent/TW201628111A/en
Application granted granted Critical
Publication of TWI563581B publication Critical patent/TWI563581B/en

Links

TW104102490A 2015-01-26 2015-01-26 Flash memory wafer probing method and machine TWI563581B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW104102490A TWI563581B (en) 2015-01-26 2015-01-26 Flash memory wafer probing method and machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104102490A TWI563581B (en) 2015-01-26 2015-01-26 Flash memory wafer probing method and machine

Publications (2)

Publication Number Publication Date
TW201628111A TW201628111A (en) 2016-08-01
TWI563581B true TWI563581B (en) 2016-12-21

Family

ID=57181853

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104102490A TWI563581B (en) 2015-01-26 2015-01-26 Flash memory wafer probing method and machine

Country Status (1)

Country Link
TW (1) TWI563581B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1453062A1 (en) * 2003-02-27 2004-09-01 STMicroelectronics S.r.l. Built-in testing methodology in flash memory
CN1691309A (en) * 2004-04-26 2005-11-02 旺宏电子股份有限公司 Operation scheme with charge balancing erase for charge trapping non-volatile memory
TW200845256A (en) * 2007-05-08 2008-11-16 Winbond Electronics Corp Clock frequency doubler method and apparatus for serial flash memory testing

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1453062A1 (en) * 2003-02-27 2004-09-01 STMicroelectronics S.r.l. Built-in testing methodology in flash memory
CN1691309A (en) * 2004-04-26 2005-11-02 旺宏电子股份有限公司 Operation scheme with charge balancing erase for charge trapping non-volatile memory
TW200845256A (en) * 2007-05-08 2008-11-16 Winbond Electronics Corp Clock frequency doubler method and apparatus for serial flash memory testing

Also Published As

Publication number Publication date
TW201628111A (en) 2016-08-01

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