SG11201705789RA - Memory device and method for operating thereof - Google Patents

Memory device and method for operating thereof

Info

Publication number
SG11201705789RA
SG11201705789RA SG11201705789RA SG11201705789RA SG11201705789RA SG 11201705789R A SG11201705789R A SG 11201705789RA SG 11201705789R A SG11201705789R A SG 11201705789RA SG 11201705789R A SG11201705789R A SG 11201705789RA SG 11201705789R A SG11201705789R A SG 11201705789RA
Authority
SG
Singapore
Prior art keywords
operating
memory device
memory
Prior art date
Application number
SG11201705789RA
Inventor
Huey Chian Foong
Fei Li
Original Assignee
Agency Science Tech & Res
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency Science Tech & Res filed Critical Agency Science Tech & Res
Publication of SG11201705789RA publication Critical patent/SG11201705789RA/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1673Reading or sensing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1653Address circuits or decoders
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1653Address circuits or decoders
    • G11C11/1655Bit-line or column circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1675Writing or programming circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1693Timing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/02Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/025Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B61/00Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
    • H10B61/20Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
    • H10B61/22Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors of the field-effect transistor [FET] type
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B61/00Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)
  • Semiconductor Memories (AREA)
SG11201705789RA 2015-01-15 2015-12-31 Memory device and method for operating thereof SG11201705789RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SG10201500289W 2015-01-15
PCT/SG2015/050520 WO2016114718A1 (en) 2015-01-15 2015-12-31 Memory device and method for operating thereof

Publications (1)

Publication Number Publication Date
SG11201705789RA true SG11201705789RA (en) 2017-08-30

Family

ID=56406139

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201705789RA SG11201705789RA (en) 2015-01-15 2015-12-31 Memory device and method for operating thereof

Country Status (3)

Country Link
US (1) US20180005678A1 (en)
SG (1) SG11201705789RA (en)
WO (1) WO2016114718A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016110049A1 (en) * 2016-05-31 2017-11-30 Infineon Technologies Ag Determining a state of a memory cell
US9792984B1 (en) * 2016-10-27 2017-10-17 Arm Ltd. Method, system and device for non-volatile memory device operation
US9997239B1 (en) * 2017-05-02 2018-06-12 Everspin Technologies, Inc. Word line overdrive in memory and method therefor
US10354710B2 (en) 2017-07-24 2019-07-16 Sandisk Technologies Llc Magnetoelectric random access memory array and methods of operating the same
CN114171083A (en) * 2020-11-03 2022-03-11 台湾积体电路制造股份有限公司 Memory device
US11823724B2 (en) * 2021-10-26 2023-11-21 International Business Machines Corporation Magneto-electric low power analogue magnetic tunnel junction memory

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0154193B1 (en) * 1994-12-30 1998-12-01 김주용 Sense amplifier circuit
JP4046513B2 (en) * 2002-01-30 2008-02-13 株式会社ルネサステクノロジ Semiconductor integrated circuit
TW556223B (en) * 2002-04-11 2003-10-01 Ememory Technology Inc Memory using two-stage sensing amplifier with additional load unit
KR100484255B1 (en) * 2002-10-31 2005-04-22 주식회사 하이닉스반도체 Semiconductor memory device for reducing noise in operation of sense amplifier
US6898104B2 (en) * 2002-11-12 2005-05-24 Kabushiki Kaisha Toshiba Semiconductor device having semiconductor memory with sense amplifier
JP4941649B2 (en) * 2004-08-25 2012-05-30 日本電気株式会社 Memory cell and magnetic random access memory
WO2006085545A1 (en) * 2005-02-09 2006-08-17 Nec Corporation Toggle magnetic random access memory and toggle magnetic random access memory write method
JPWO2007099874A1 (en) * 2006-02-27 2009-07-16 日本電気株式会社 Magnetoresistive element and magnetic random access memory
US7345912B2 (en) * 2006-06-01 2008-03-18 Grandis, Inc. Method and system for providing a magnetic memory structure utilizing spin transfer
US7616488B2 (en) * 2006-07-10 2009-11-10 Panasonic Corporation Current or voltage measurement circuit, sense circuit, semiconductor non-volatile memory, and differential amplifier
TWI415124B (en) * 2007-08-09 2013-11-11 Ind Tech Res Inst Magetic random access memory
JP5190499B2 (en) * 2010-09-17 2013-04-24 株式会社東芝 Semiconductor memory device
JP5811693B2 (en) * 2011-08-25 2015-11-11 ソニー株式会社 Resistance change type memory device and driving method thereof
CN102487124B (en) * 2011-09-19 2014-07-23 中国科学院物理研究所 Nanometer multilayer film, field-effect tube, sensor, random access memory and preparation method
KR20140023806A (en) * 2012-08-17 2014-02-27 삼성전자주식회사 Architecture of magnetic resistance memory device
US9165629B2 (en) * 2013-03-12 2015-10-20 Taiwan Semiconductor Manufacturing Co., Ltd. Method and apparatus for MRAM sense reference trimming
US9171590B2 (en) * 2014-03-26 2015-10-27 National Tsing Hua University Sensing marging expanding scheme for memory

Also Published As

Publication number Publication date
WO2016114718A1 (en) 2016-07-21
US20180005678A1 (en) 2018-01-04

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