TWI561938B - Method and apparatus for design of a metrology target - Google Patents

Method and apparatus for design of a metrology target

Info

Publication number
TWI561938B
TWI561938B TW103143718A TW103143718A TWI561938B TW I561938 B TWI561938 B TW I561938B TW 103143718 A TW103143718 A TW 103143718A TW 103143718 A TW103143718 A TW 103143718A TW I561938 B TWI561938 B TW I561938B
Authority
TW
Taiwan
Prior art keywords
design
metrology target
metrology
target
Prior art date
Application number
TW103143718A
Other languages
English (en)
Other versions
TW201531810A (zh
Inventor
Guangqing Chen
Wei Liu
Der Schaar Maurits Van
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of TW201531810A publication Critical patent/TW201531810A/zh
Application granted granted Critical
Publication of TWI561938B publication Critical patent/TWI561938B/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70616—Monitoring the printed patterns
    • G03F7/70633—Overlay, i.e. relative alignment between patterns printed by separate exposures in different layers, or in the same layer in multiple exposures or stitching
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70491—Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
    • G03F7/705—Modelling or simulating from physical phenomena up to complete wafer processes or whole workflow in wafer productions
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70616—Monitoring the printed patterns
    • G03F7/70625—Dimensions, e.g. line width, critical dimension [CD], profile, sidewall angle or edge roughness
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70616—Monitoring the printed patterns
    • G03F7/70641—Focus
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70681—Metrology strategies
    • G03F7/70683—Mark designs

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
TW103143718A 2013-12-30 2014-12-15 Method and apparatus for design of a metrology target TWI561938B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201361921939P 2013-12-30 2013-12-30

Publications (2)

Publication Number Publication Date
TW201531810A TW201531810A (zh) 2015-08-16
TWI561938B true TWI561938B (en) 2016-12-11

Family

ID=52003804

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103143718A TWI561938B (en) 2013-12-30 2014-12-15 Method and apparatus for design of a metrology target

Country Status (7)

Country Link
US (2) US11221560B2 (zh)
JP (1) JP6567523B2 (zh)
KR (2) KR102246286B1 (zh)
CN (1) CN105874387B (zh)
SG (1) SG11201604641PA (zh)
TW (1) TWI561938B (zh)
WO (1) WO2015101460A1 (zh)

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CN108431695B (zh) 2015-12-24 2020-07-21 Asml荷兰有限公司 控制图案形成过程的方法、器件制造方法、用于光刻设备的控制系统以及光刻设备
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WO2018202414A1 (en) * 2017-05-04 2018-11-08 Asml Holding N.V. Method, substrate and apparatus to measure performance of optical metrology
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US11333982B2 (en) * 2019-01-28 2022-05-17 Kla Corporation Scaling metric for quantifying metrology sensitivity to process variation
KR102708128B1 (ko) * 2019-02-26 2024-09-19 에이에스엠엘 네델란즈 비.브이. 검사 장치, 리소그래피 장치, 측정 방법
US20220236647A1 (en) * 2019-08-20 2022-07-28 Asml Netherlands B.V. Method for controlling a semiconductor manufacturing process
WO2021073854A1 (en) * 2019-10-14 2021-04-22 Asml Holding N.V. Metrology mark structure and method of determining metrology mark structure
US11487929B2 (en) * 2020-04-28 2022-11-01 Kla Corporation Target design process for overlay targets intended for multi-signal measurements
US20230194435A1 (en) * 2020-05-26 2023-06-22 Saint-Gobain Glass France Method for estimating a quality function of a mono- or multi-layered coated transparent substrate
CN113656995B (zh) * 2021-07-06 2024-03-26 兰州空间技术物理研究所 一种基于电子轨迹积分法的电离规灵敏度数值计算方法
CN117897661A (zh) * 2021-08-18 2024-04-16 Asml荷兰有限公司 量测目标优化

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Also Published As

Publication number Publication date
JP6567523B2 (ja) 2019-08-28
US11221560B2 (en) 2022-01-11
US20220113638A1 (en) 2022-04-14
CN105874387B (zh) 2018-10-16
SG11201604641PA (en) 2016-07-28
CN105874387A (zh) 2016-08-17
WO2015101460A1 (en) 2015-07-09
KR20160103131A (ko) 2016-08-31
KR20190057429A (ko) 2019-05-28
TW201531810A (zh) 2015-08-16
US20150185625A1 (en) 2015-07-02
JP2017502332A (ja) 2017-01-19
KR102246286B1 (ko) 2021-04-30

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