TWI545680B - System and method for flexible high speed transfer of semiconductor components - Google Patents

System and method for flexible high speed transfer of semiconductor components Download PDF

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TWI545680B
TWI545680B TW099137556A TW99137556A TWI545680B TW I545680 B TWI545680 B TW I545680B TW 099137556 A TW099137556 A TW 099137556A TW 99137556 A TW99137556 A TW 99137556A TW I545680 B TWI545680 B TW I545680B
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component
semiconductor
component carrier
pick
carrier
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TW201133684A (en
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金劍平
王利光
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聯達科技設備私人有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65BMACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING
    • B65B35/00Supplying, feeding, arranging or orientating articles to be packaged
    • B65B35/30Arranging and feeding articles in groups
    • B65B35/36Arranging and feeding articles in groups by grippers
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/418Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
    • G05B19/4189Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by the transport system
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67712Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67745Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67757Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a batch of workpieces
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components
    • H05K13/021Loading or unloading of containers
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/31From computer integrated manufacturing till monitoring
    • G05B2219/31002Computer controlled agv conveys workpieces between buffer and cell

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Mechanical Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Specific Conveyance Elements (AREA)

Description

一種彈性化高速運送半導體元件之系統與方法System and method for elasticizing high speed transportation of semiconductor components

本發明通常有關一種處理半導體元件之系統與方法。更明確係,本發明關於一種用於不同封裝構件間運送半導體元件之系統與方法。 The present invention generally relates to a system and method for processing semiconductor components. More specifically, the present invention relates to a system and method for transporting semiconductor components between different package components.

在製造廠的不同處理站間傳送過程、以及在製造後的配送過程,例如半導體晶圓、晶粒和積體電路(Integrated Circuit,IC)晶片之半導體元件典型封裝或儲存在適用的封裝構件(亦已知為傳送構件或運送構件)。半導體元件的封裝構件通常歸類為鬆散封裝構件和固定封裝構件。用於封裝半導體元件的鬆散封裝構件包括(但未限於)JEDEC托盤、TESEC托盤、多通道金屬匣和管。固定封裝構件的一一範例為帶構件。 The transfer process between different processing stations in the manufacturing plant, and the post-manufacturing distribution process, such as semiconductor wafers, die and integrated circuit (IC) wafers, are typically packaged or stored in suitable package components ( It is also known as a transfer member or a transport member). Package components of semiconductor components are generally classified as loose package components and fixed package components. Loose package components for packaging semiconductor components include, but are not limited to, JEDEC trays, TESEC trays, multi-channel metal rafts, and tubes. An example of a fixed package member is a belt member.

時常需要在不同類型封裝構件間運送半導體元件,例如從一多通道金屬匣至一JEDEC托盤。不同封裝構件間運送半導體元件典型明顯耗時和重複處理,且通常為了技術及/或效率原因(例如,ESD保護議題,或增加產生彎曲導線的可能性)不會手動執行。因此,設計及製造用於在封裝構件間運送半導體元件的機械或自動化系統。隨著半導體元件製造和加工產業的逐漸增加市場競爭,提高現有系統在不同封裝構件間運送半導體元件的速度和產量有持續性需求。 It is often desirable to transport semiconductor components between different types of package components, such as from a multi-channel metal crucible to a JEDEC tray. The transport of semiconductor components between different package components typically is significantly time consuming and repetitive, and is typically not performed manually for technical and/or efficiency reasons (eg, ESD protection issues, or the possibility of creating curved wires). Accordingly, mechanical or automated systems for transporting semiconductor components between package components are designed and fabricated. As the semiconductor component manufacturing and processing industries continue to increase market competition, there is a continuing need to increase the speed and throughput of existing systems for transporting semiconductor components between different package components.

檢測和測試(整個稱為處理)半導體元件通常在整個半導體元件製程期間執行。存在用於處理或執行檢測和測試半導 體元件的一些傳統系統與方法。不過,逐漸增加高品質半導體元件的高產量製造之要求,造成相對增加檢測和測試(即是處理)系統與方法能夠以提高的速度和準確性檢測和測試半導體元件的需求。 Detecting and testing (collectively referred to as processing) semiconductor components are typically performed during the entire semiconductor component process. Existence for processing or performing detection and testing of semiconducting Some traditional systems and methods of body components. However, the gradual increase in the high-volume manufacturing requirements of high-quality semiconductor components has resulted in relatively increased detection and testing (ie, processing) systems and methods capable of detecting and testing semiconductor components with increased speed and accuracy.

取放機構係用於使半導體元件從處理系統卸載至封裝構件,供向前運送半導體元件。不過,對於增加半導體元件製造的速度和產量之要求造成逐漸提高更快和更正確取放機構的需求。 The pick and place mechanism is used to unload the semiconductor component from the processing system to the package member for transporting the semiconductor component forward. However, the need to increase the speed and throughput of semiconductor component manufacturing has led to a gradual increase in the need for faster and more accurate pick and place mechanisms.

製造半導體元件期間,半導體元件典型在不同處理站或處理系統之間運送或傳送。如前述,為了有助於不同處理站間的運送,半導體元件典型封裝在適合的封裝構件或傳送構件。會被帶入處理系統的半導體元件普遍稱為輸入半導體元件。處理系統完成處理後,這些半導體元件結果會從處理系統移開,並運送至另一封裝構件。從處理系統移開的半導體元件稱為輸出半導體元件。 During fabrication of semiconductor components, semiconductor components are typically shipped or transferred between different processing stations or processing systems. As previously mentioned, to facilitate transport between different processing stations, the semiconductor components are typically packaged in a suitable package or transfer member. Semiconductor components that are brought into the processing system are commonly referred to as input semiconductor components. After the processing system has finished processing, the results of these semiconductor components are removed from the processing system and transported to another package component. The semiconductor component removed from the processing system is referred to as an output semiconductor component.

輸入半導體元件和輸出半導體元件的封裝構件典型係基於消費者或應用需求加以決定或選擇。處理或檢測及測試半導體元件大部分傳統系統提供封裝或傳送構件(用於封裝從系統卸載的輸出半導體元件)之有限選項。此外,用於處理半導體元件的大部分傳統系統與方法對於處理半導體元件存在不必要的速度和準確度限制。系統與方法的需求在於克服前述傳統系統的限制。 The package components of the input semiconductor component and the output semiconductor component are typically determined or selected based on consumer or application requirements. Processing or Detecting and Testing Semiconductor Components Most conventional systems provide limited options for packaging or transferring components (for packaging output semiconductor components that are unloaded from the system). Moreover, most conventional systems and methods for processing semiconductor components have unnecessarily limited speed and accuracy limitations for processing semiconductor components. A need for systems and methods is to overcome the limitations of the aforementioned conventional systems.

本發明的具體實施例係關於一種用於運送半導體元件之系統與方法。本發明的具體實施例提供之系統與方法尋求處理在「先前技術」強調一些議題或問題之至少一者。 Embodiments of the invention relate to a system and method for transporting semiconductor components. The system and method provided by a particular embodiment of the present invention seeks to address at least one of the issues or problems highlighted in the "prior art."

根據本發明具體實施例的第一態樣,揭示一種用於運送半導體元件之第一示範性系統,該第一示範性系統包括一載體,供連續接收複數個半導體元件。該載體包括其上形成的複數個收受器,複數個收受器之每一者用於接收複數個半導體元件之一者。系統更包括一同時取放機構。同時取放機構操作係用於從載體整個接收複數個半導體元件,且隨後使接收的複數個半導體元件整個運送至一預定封裝構件。同時吸取和放置的使用造成明顯增加系統每小時單位數(UPH)產量。 In accordance with a first aspect of a particular embodiment of the present invention, a first exemplary system for transporting semiconductor components is disclosed, the first exemplary system including a carrier for continuously receiving a plurality of semiconductor components. The carrier includes a plurality of receivers formed thereon, each of the plurality of receivers for receiving one of a plurality of semiconductor components. The system further includes a simultaneous pick and place mechanism. At the same time, the pick and place mechanism operates to receive a plurality of semiconductor components from the carrier as a whole, and then transport the received plurality of semiconductor components to a predetermined package member. At the same time, the use of suction and placement results in a significant increase in system hourly unit (UPH) production.

根據本發明具體實施例的第二態樣,揭示一種用於運送半導體元件之第二示範性系統,第二示範性系統包括一旋轉臺結構。旋轉臺結構包括複數個拾取頭(或旋轉頭),複數個旋轉頭之每一者係組態成可旋轉移位,供使複數個半導體元件之一從第一位置連續運送至第二位置。旋轉臺結構設計使得拾取頭可動態向上和向下移動(在旋轉臺結構的旋轉運動的每個索引期間)。此獨特的特徵造明顯增加系統產量(UPH)。在一些具體實施例中,在旋轉臺結構上周圍載送或安裝的整組拾取頭或其總成係組態成可一致性旋轉、垂直移動,因此旋轉臺總成本身可垂直運動(例如,經由高速馬達或另一構件之一或多個線性或其他類型),明顯減少週期時間和控制複雜度。系統更包括:一組載體,用於從複數個拾 取頭連續接收複數個半導體元件;及一同時取放機構,該同時取放機構操作係用於從載體整個接收複數個半導體元件。同時取放機構的進一步操作係用於使接收的複數個半導體元件整個運送至一封裝構件盤。 In accordance with a second aspect of a particular embodiment of the present invention, a second exemplary system for transporting semiconductor components is disclosed, the second exemplary system including a rotary table structure. The rotary table structure includes a plurality of pick-up heads (or rotary heads), each of the plurality of rotary heads being configured for rotational displacement for continuously transporting one of the plurality of semiconductor components from the first position to the second position. The rotary table structure is designed such that the pick head can move dynamically up and down (during each index of rotational motion of the rotary table structure). This unique feature creates a significant increase in system throughput (UPH). In some embodiments, the entire set of pick-up heads or assemblies thereof that are carried or mounted around the rotatable structure are configured to rotate in unison and vertically, so that the total cost of the rotary table can be moved vertically (eg, Cycle time and control complexity are significantly reduced via one or more linear or other types of high speed motors or another component. The system further includes: a set of carriers for picking up from a plurality of The take-up head continuously receives a plurality of semiconductor components; and a simultaneous pick-and-place mechanism for receiving a plurality of semiconductor components from the carrier as a whole. At the same time, the further operation of the pick-and-place mechanism is for transporting the received plurality of semiconductor components to a package member disk.

根據本發明具體實施例的第三態樣,揭示一種第三示範性系統,其包括兩載體,每個載體係以彼此循環運動,在第一位置(元件從旋轉頭運送至載體的位置)和第二位置之間(元件從載體運送至一同時取放機構的位置)之間運動。當第一載體正接收來自第一位置旋轉臺拾取頭的元件時,第二載體可傳遞元件至同時取放機構,其係接近輸出盤的第二位置。在此元件傳遞後,第二載體向下移動,且放置在第一載體下面。如果填滿第一載體,便會移至同時吸取和放置位置供卸載。此時,第二載體會向上移動至旋轉臺下的載入位置。換句話說,第二載體是在第一載體宜至第二位置之下等待,這是一裝置卸載位置,和第一載體離開載入元件的位置,第二載體便會向上移動且準備接收來自拾取頭的元件。兩載體循環運動可達成明顯增加系統產量(UPH)。 In accordance with a third aspect of a particular embodiment of the present invention, a third exemplary system is disclosed that includes two carriers, each carrier circulating in motion with each other, in a first position (the position at which the component is transported from the rotating head to the carrier) and Movement between the second positions (the position of the components being transported from the carrier to a simultaneous pick-and-place mechanism). When the first carrier is receiving an element from the first position rotary table pickup head, the second carrier can transfer the element to the simultaneous pick and place mechanism that is adjacent to the second position of the output disk. After the component is delivered, the second carrier moves downward and is placed under the first carrier. If the first carrier is filled, it will be moved to the same suction and placement position for unloading. At this point, the second carrier will move up to the loading position under the rotary table. In other words, the second carrier waits under the first carrier to the second position, which is a device unloading position, and the first carrier leaves the loading element, the second carrier moves upwards and is ready to receive from Pick up the components of the head. The two-carrier cyclic motion can achieve a significant increase in system throughput (UPH).

半導體元件的製造典型包括多重製程步驟,例如視覺缺陷檢測和電氣測試。一些處理系統是針對處理半導體元件而設計。對於強化半導體元件製造的品質、速度和產量不斷提高要求,處理系統需能以更高速度和準確性處理半導體元件。半導體元件係從此處理系統卸載至輸出封裝構件,此亦已知為傳送構件或運送構件。在處理系統或處理站間的傳送過程、以及在完成製造後的配送過程,半導體元件封裝、或 放置在封裝構件內或上面。半導體產業的持續性競爭,提供消費者半導體元件後置處理更多可用輸出封裝構件選擇逐漸增加其重要性。本發明的具體實施例提供用於處理一些上述所識別出問題之至少一者之系統與方法。 The fabrication of semiconductor components typically involves multiple process steps such as visual defect inspection and electrical testing. Some processing systems are designed to handle semiconductor components. In order to enhance the quality, speed and throughput of semiconductor component manufacturing, processing systems need to be able to process semiconductor components with higher speed and accuracy. The semiconductor component is unloaded from the processing system to the output package member, which is also known as a transfer member or a transport member. The process of transferring between the processing system or the processing station, and after the completion of the manufacturing process, the semiconductor component package, or Placed in or on the package member. The continued competition in the semiconductor industry to provide consumers with semiconductor components to post-process more available output package components has gradually increased its importance. Particular embodiments of the present invention provide systems and methods for processing at least one of the above identified problems.

為了簡潔和清楚,以下本發明的示範性具體實施例之描述是針對運送半導體元件之系統與方法。不過,所屬技術領域專業人士應明白,本發明並未排除於本發明其他具體實施例中普遍所施行基本原理(例如操作、功能或性能特徵)的其他應用之外。 For the sake of brevity and clarity, the following description of exemplary embodiments of the present invention is directed to systems and methods for transporting semiconductor components. However, it should be understood by those skilled in the art that the present invention is not limited to other applications in which the basic principles (e.g., operational, functional, or performance features) are generally employed in other embodiments of the invention.

根據本發明的一第一具體實施例提供如圖1顯示用於運送半導體元件之一示範性系統(10)。示範性系統(10)包括一旋轉臺結構(旋轉臺)或旋轉結構(12)、一第一載體(14)、一第二載體(16)和一同時取放機構(18)。 In accordance with a first embodiment of the present invention, an exemplary system (10) for transporting semiconductor components is shown in FIG. The exemplary system (10) includes a rotary table structure (rotary table) or rotating structure (12), a first carrier (14), a second carrier (16), and a simultaneous pick-and-place mechanism (18).

系統(10)使半導體元件從載送或封裝構件(20)(亦已知為一輸入封裝構件)的第一裝置運送至載送或封裝構件22(亦已知為一輸出封裝構件)的第二裝置。封裝構件(20、22)亦稱為傳送構件或運送構件。在半導體元件製造廠中,處理系統或處理站間的傳送過程、以及製造完成後的配送過程,半導體元件封裝或儲存、或放置在封裝構件內或上面。 The system (10) transports the semiconductor component from a first device carrying or encapsulating member (20) (also known as an input package member) to a carrier or package member 22 (also known as an output package member) Two devices. The package members (20, 22) are also referred to as transfer members or transport members. In a semiconductor component manufacturing plant, the transfer process between the processing system or the processing station, and the dispensing process after fabrication, the semiconductor component is packaged or stored, or placed in or on the package member.

半導體元件從第一封裝構件(20)運送至第二封裝構件(22)期間,系統(10)亦有助於處理半導體元件。系統(10)運送的半導體元件範例包括(但未限於)半導體晶圓、晶粒和積體電路(IC)。 During transport of the semiconductor component from the first package member (20) to the second package member (22), the system (10) also facilitates processing of the semiconductor component. Examples of semiconductor components carried by system (10) include, but are not limited to, semiconductor wafers, dies, and integrated circuits (ICs).

第一封裝構件(20)為例如一托盤載體或一金屬匣。運送至系統(10)時,半導體元件配置、安排、或封裝在第一封裝 構件(20)中或上面。在第一封裝構件(20)封裝的半導體元件然後從第一封裝構件(20)載入或運送至系統(10)。系統(10)較佳包括一載入模組或載入站(24)。載入站(24)係加以成形和尺寸化,供接收第一封裝構件(20)。半導體元件較佳係從第一封裝構件(20)載入或運送至在載入站(24)的系統(10)。 The first encapsulating member (20) is, for example, a tray carrier or a metal crucible. The semiconductor component is configured, arranged, or packaged in the first package when transported to the system (10) In or on the member (20). The semiconductor component packaged in the first package member (20) is then loaded or transported from the first package member (20) to the system (10). The system (10) preferably includes a load module or load station (24). The loading station (24) is shaped and sized for receiving the first package member (20). The semiconductor component is preferably loaded or transported from the first package member (20) to the system (10) at the loading station (24).

系統(10)額外包括構件、裝置或機構,供使半導體元件從第一封裝構件(20)載入或運送至系統(10)。例如,技術已知為不同設計的拾取和放置機構可用於使半導體元件從第一封裝構件(20)運送至系統(10)。半導體元件較佳係從第一封裝構件(20)運送至一輸送器、輸送器系統或輸送器機構(11)。 The system (10) additionally includes components, devices or mechanisms for loading or transporting semiconductor components from the first package member (20) to the system (10). For example, pick and place mechanisms of various designs known in the art can be used to transport semiconductor components from the first package member (20) to the system (10). The semiconductor component is preferably transported from the first package member (20) to a conveyor, conveyor system or conveyor mechanism (11).

輸送器機構(11)可為例如一帶傳動總成或一皮帶傳動總成。輸送器機構(11)係較佳使半導體元件從載入站(24)傳送向旋轉臺(12)。更明確係,輸送器機構(11)係較佳連續使半導體元件從載入站(24)傳送至旋轉臺(12)。放置在輸送器機構(11)的半導體元件係由輸送器機構(11)從載入站(24)移位至旋轉臺(12)。輸送器機構(11)移置半導體元件的速度可依需要予以決定及調整。例如,輸送器機構(11)的操作可為軟體控制。 The conveyor mechanism (11) can be, for example, a belt drive assembly or a belt drive assembly. The conveyor mechanism (11) preferably transports the semiconductor components from the loading station (24) to the rotary table (12). More specifically, the conveyor mechanism (11) preferably continuously transports the semiconductor components from the loading station (24) to the rotating table (12). The semiconductor component placed in the conveyor mechanism (11) is displaced from the loading station (24) to the rotary table (12) by the conveyor mechanism (11). The speed at which the conveyor mechanism (11) displaces the semiconductor components can be determined and adjusted as needed. For example, the operation of the conveyor mechanism (11) can be software controlled.

圖2A為根據本發明之一具體實施例的旋轉臺結構或旋轉臺(12)之示意圖;及圖2B係說明一旋轉臺結構(12)和系統(10)其他組件之間的示範空間關係上視圖,該系統係組態供彈性化高速運送由本發明之一具體實施例提供的半導體元件。旋轉臺(12)又稱為一旋轉半導體元件處理機構。旋轉臺(12)包括:一固定中央軸;及一可旋轉部分,其耦合至該中 央軸。較佳地係,中央軸將可旋轉部分定義為可旋轉之第一或主軸(例如,一垂直或z軸)。 2A is a schematic view of a rotary table structure or a rotary table (12) according to an embodiment of the present invention; and FIG. 2B illustrates an exemplary spatial relationship between a rotary table structure (12) and other components of the system (10). View, the system is configured to elastically transport high speed semiconductor components provided by one embodiment of the present invention. The rotary table (12) is also referred to as a rotary semiconductor component processing mechanism. The rotary table (12) includes: a fixed central shaft; and a rotatable portion coupled to the middle Central axis. Preferably, the central axis defines the rotatable portion as a rotatable first or main axis (eg, a vertical or z-axis).

可旋轉結構包括耦合其上的許多拾取頭(或旋轉頭)(26)。拾取頭(26)數量可例如介於(且包括)24和36之間。拾取頭(26)數量可依需要改變(例如,介於2和60或更大之間)。拾取頭(26)係以預定組態形成空間配置。拾取頭(26)係較佳在中央軸周圍形成空間配置。此外,拾取頭(26)係較佳彼此以預定距離隔開。繞第一軸之可旋轉結構或部分的旋轉相對造成拾取頭(26)繞第一軸之旋轉移位。在一些具體實施例中,每個拾取頭(26)係定位或配置於與第一軸形成的半徑或徑向距離r上。 The rotatable structure includes a plurality of pick-up heads (or swivel heads) (26) coupled thereto. The number of pick heads (26) can be, for example, between (and including) 24 and 36. The number of pick heads (26) can be varied as desired (eg, between 2 and 60 or greater). The pick-up head (26) forms a spatial configuration in a predetermined configuration. The pick-up head (26) preferably forms a spatial arrangement around the central axis. Further, the pickup heads (26) are preferably spaced apart from each other by a predetermined distance. The rotation of the rotatable structure or portion about the first axis relative to the rotational displacement of the pick-up head (26) about the first axis. In some embodiments, each pick head (26) is positioned or disposed at a radius or radial distance r formed with the first axis.

系統(10)較佳包括一馬達(未在圖顯示)。馬達操作供繞第一軸傳動可旋轉部分,且拾取頭(26)同樣。馬達較佳係耦合至中央軸。馬達操作較佳係能由軟體控制。馬達操作促成拾取頭(26)沿著預定行進路徑或行進路徑繞第一軸移位。應明白,依需要可利用所屬技術領域專業人士熟知的技術改變拾取頭(26)繞第一軸的預定行進路徑。 The system (10) preferably includes a motor (not shown). The motor operates to drive the rotatable portion about the first shaft and the pick head (26) is the same. The motor is preferably coupled to the central shaft. Motor operation is preferably controlled by software. Motor operation causes the pick head (26) to be displaced about the first axis along a predetermined travel path or travel path. It will be appreciated that the predetermined path of travel of the pick-up head (26) about the first axis can be varied as desired using techniques well known to those skilled in the art.

每個拾取頭(26)係在吸取位置(或者已知為第一位置)上從輸送器系統或輸送器機構(11)載送或接收一半導體元件。換句話說,半導體元件係在吸取位置上從輸送器系統連續運送至旋轉臺(12)的拾取頭(26)。 Each pick-up head (26) carries or receives a semiconductor component from a conveyor system or conveyor mechanism (11) at a pick-up position (or known as a first position). In other words, the semiconductor component is continuously transported from the conveyor system to the pick-up head (26) of the rotary table (12) at the pick-up position.

一拾取頭(26)包括一元件夾持或保持機構。拾取頭(26)較佳係採用真空吸取,用以從輸送器拾起元件、及用於旋轉臺(12)運動期間穩固夾持元件。所屬技術領域專業人士應明 白,其他構件或機構可用於從輸送器機構(11)拾起半導體元件、及在沿著預定行進路徑的旋轉移位期間穩固半導體元件。 A pick-up head (26) includes a component holding or holding mechanism. The pick-up head (26) preferably employs vacuum suction for picking up the components from the conveyor and for securing the clamping elements during movement of the rotary table (12). Professionals in the technical field should White, other components or mechanisms may be used to pick up the semiconductor component from the conveyor mechanism (11) and to stabilize the semiconductor component during rotational displacement along a predetermined path of travel.

拾取頭(26)的旋轉位移係從吸取位置旋轉移位至一卸載位置(或已知為第二位置),沿著由旋轉臺(12)定義的圓周路徑移位。如果拾取頭(26)在卸載位置,附著於拾取頭的半導體元件較佳係運送至第一載體(14)或第二載體(16)。 The rotational displacement of the pickup head (26) is rotationally displaced from the suction position to an unloading position (or known as the second position), displaced along a circumferential path defined by the rotary table (12). If the pick-up head (26) is in the unloading position, the semiconductor component attached to the pick-up head is preferably transported to the first carrier (14) or the second carrier (16).

如下詳細說明,拾取頭(26)額外組態係針對繞第一軸的周圍方向移位的高速旋轉z軸/上下運動。在一具體實施例中,一特定拾取頭(26)於第一或主軸周圍旋轉變換期間係垂直移位,其中此垂直拾取頭移位係沿著第二或副軸發生,定義上係與拾取頭(26)本身有關,且平行第一軸,如圖2A所示。在其他具體實施例中,載送多重拾取頭(26)的整個總成(例如,旋轉臺的可旋轉結構)係沿著或平行第一軸(即是,在+/-z軸方向)垂直移位,以提供高速旋轉上下拾取頭運動,減少系統複雜度、簡化系統控制負荷、增加系統輸出、及改善系統可靠度。 As explained in more detail below, the additional configuration of the pick head (26) is for a high speed rotary z-axis/up and down motion that is displaced about the circumferential direction of the first axis. In a specific embodiment, a particular pick-up head (26) is vertically displaced during a rotational transformation around the first or main axis, wherein the vertical pick-up head shift occurs along the second or minor axis, defining the upper and the pick-up The head (26) itself is related and parallel to the first axis, as shown in Figure 2A. In other embodiments, the entire assembly carrying the multiple pick-up heads (26) (eg, the rotatable structure of the rotating table) is vertical along or parallel to the first axis (ie, in the +/- z-axis direction) Shifting to provide high-speed rotation of the upper and lower pickup head movements, reducing system complexity, simplifying system control loads, increasing system output, and improving system reliability.

系統(10)更包括許多處理站或模組(例如,以圖2B所示之方式),操作上用於處理由系統(10)所操縱或傳送的半導體元件。更明確係,半導體元件從吸取位置移向至卸載位置時,處理模組可促成半導體元件的處理。處理模組包括(但未限於)視覺檢測模組(如同影像補捉裝置)和功能測試模組(如同電氣測試模組)。處理模組係以預定空間組態配置。更明確係,處理模組係以繞於旋轉臺(12)的第一軸或中央軸的 預定空間組態加以配置。處理模組的空間組態可依需要改變。處理模組儘量空間組態,以提高系統(10)的空間效率和產量。為了增加系統(10)處理半導體元件(10)的模組數量,更要決定處理模組的空間組態。 The system (10) further includes a number of processing stations or modules (e.g., in the manner shown in Figure 2B) for operatively processing semiconductor components that are manipulated or transmitted by the system (10). More specifically, the processing module can facilitate processing of the semiconductor component as the semiconductor component moves from the pick-up position to the unloading position. The processing module includes (but is not limited to) a visual inspection module (like an image capture device) and a functional test module (like an electrical test module). The processing modules are configured in a predetermined space configuration. More specifically, the processing module is wound around the first or central axis of the rotating table (12). The scheduled space configuration is configured. The spatial configuration of the processing module can be changed as needed. The processing module is configured as far as possible to increase the space efficiency and throughput of the system (10). In order to increase the number of modules in which the system (10) processes the semiconductor component (10), it is also necessary to determine the spatial configuration of the processing module.

系統(10)使用的處理模組數量和類型可依需要改變。所屬技術領域專業人士應瞭解,系統(10)允許執行半導體元件多重處理步驟,但另一方面,系統(10)處理或傳送半導體元件,藉此提高系統(10)處理半導體元件的速度、準確性和產量之至少一者。 The number and type of processing modules used by system (10) can be changed as needed. It will be appreciated by those skilled in the art that the system (10) allows for multiple processing steps of the semiconductor component, but on the other hand, the system (10) processes or transfers the semiconductor components, thereby increasing the speed and accuracy of the processing of the semiconductor components by the system (10). And at least one of the production.

旋轉臺結構(12)係組態以同步或同時方式,可於不同處理站間旋轉移動或變換其拾取頭(26)。從一特別處理站至下一處理站的旋轉臺結構稱為一旋轉臺轉位(Turret Index)。大體上,一旋轉臺轉位為對應或有關處理站間分離距離之旋轉臺結構(12)的旋轉或環向增量。旋轉臺結構(12)載送的相鄰拾取頭(26)係經由旋轉臺結構的旋轉轉位連續到達任何特定處理站。根據具體實施例的詳述,如同考慮的許多及/或一類型處理站,拾取頭(26)行進每個旋轉轉位之線性或曲線距離(例如,旋轉臺旋轉弧長度)為一可組態或可編程的參數。 The rotary table structure (12) is configured to rotate or change its pick-up head (26) between different processing stations in a simultaneous or simultaneous manner. The rotary table structure from a special processing station to the next processing station is called a Turret Index. In general, a rotary table is indexed to a rotational or circumferential increment of the rotary table structure (12) corresponding to or relating to the separation distance between the processing stations. The adjacent pick-up heads (26) carried by the rotary table structure (12) continue to reach any particular processing station via rotational indexing of the rotary table structure. According to the detailed description of the specific embodiment, as with many and/or type of processing stations considered, the linear or curvilinear distance (eg, the rotary table rotation arc length) of the pick-up head (26) traveling each rotational index is a configurable Or programmable parameters.

旋轉臺結構(12)係組態成提供拾取頭(26)的動態上下移動,作為不同處理站間的旋轉臺轉位。例如,針對圖2A舉例的第一處理站P1和第二處理站P2,旋轉臺結構(12)係以上下方式,在垂直方向(例如,沿著第二軸,在平行第一軸的方向)移動位於P1位置的拾取頭(26);及以上下方式,額外垂直移動位於P2的拾取頭(26)。因此,拾取頭(26)可向上 及/或向下運動,成為每個旋轉臺轉位的一部份,即是,旋轉臺轉位發生或進行時的動態行為。關於動態上下拾取頭運動,一特定拾取頭(26)可運送至一拾取頭(26)定位的處理站、及/或從處理站移開一裝置。拾取頭(26)的如此動態上下運動明顯增加系統的產量。 The rotary table structure (12) is configured to provide dynamic up and down movement of the pick head (26) as a rotary table index between different processing stations. For example, for the first processing station P1 and the second processing station P2 exemplified in FIG. 2A, the rotating table structure (12) is in the above manner, in the vertical direction (for example, along the second axis, in the direction parallel to the first axis) Moving the pick-up head (26) at the P1 position; and above, additionally moving the pick-up head (26) at P2 vertically. Therefore, the pickup head (26) can be upward And/or downward movement becomes part of the transposition of each rotary table, that is, the dynamic behavior of the rotary table during the occurrence or progress of the index. With respect to dynamic pick-up head movement, a particular pick-up head (26) can be transported to a processing station positioned by a pick-up head (26) and/or a device removed from the processing station. Such dynamic up and down movement of the pick head (26) significantly increases the throughput of the system.

在特定的具體實施例中,每個拾取頭(26)或一組拾取頭(26)包括(或結合)一氣動致動器,如同一電磁驅動氣動缸,其組態供z軸或副軸方向垂直移位拾取頭26。在各種不同具體實施例中,旋轉臺結構(12)本身係組態供z軸移位,使得藉此載送的拾取頭(26)經由旋轉臺結構的z軸運動,完全一致性垂直上下變換。旋轉臺結構(12)包括(或結合)一氣動缸、一電磁閥、一線性馬達或其他裝置,以促使此z軸移位。以此整個方式提供拾取頭(26)上下動態運動降低系統控制複雜度及增加機器操作速度和系統產量(UPH)。特別具體實施例可額外或另外使用z軸移位機構,如同一凸輪驅動機構,其組態有助於上下拾取頭運動。 In a particular embodiment, each pick head (26) or set of pick heads (26) includes (or incorporates) a pneumatic actuator, such as the same electromagnetically driven pneumatic cylinder, configured for the z-axis or countershaft The pickup head 26 is vertically displaced in the direction. In various embodiments, the rotary table structure (12) is itself configured for z-axis displacement such that the carrier pickup (26) carried thereby moves through the z-axis of the rotary table structure, fully consistent vertically up and down . The rotary table structure (12) includes (or incorporates) a pneumatic cylinder, a solenoid valve, a linear motor or other means to cause the z-axis to shift. Providing the up and down dynamic motion of the pickup head (26) in this manner reduces system control complexity and increases machine operating speed and system throughput (UPH). A particular embodiment may additionally or additionally use a z-axis shifting mechanism, such as the same cam drive mechanism, configured to facilitate up and down pickup movement.

大體上,每個拾取頭(26)包括(或結合)(例如以無線或有線為主之方式)一組限制感測器,其組態成感測一頂端或最上拾取頭位置和一底部或最低拾取頭位置。在一些具體實施例中,一些或所有拾取頭(26)可包括(或結合)一或多個中間限制感測器,其組態成偵測頂端和底部拾取頭位置間的拾取頭位置。特別限制感測器信號表示或幫助判斷拾取頭(26)的位置(a)是否對應一半導體元件拾取或放開位置;及/或(b)是否滿足在拾取頭(26)的末端部分或頂端與一處理站之間的預 定空間或分離距離情況(例如,表示拾取頭(26)是否已垂直清除處理站,且拾取頭(26)的旋轉臺之旋轉傳送能安全繼續)。特定具體實施例額外包括感測器,其組態成偵測對應至一或多個旋轉傳送感測位置的拾取頭位置或旋轉變換。 In general, each pick-up head (26) includes (or combines) (eg, in a wireless or wired manner) a set of limit sensors configured to sense a top or top pick position and a bottom or Minimum pick head position. In some embodiments, some or all of the pick-up heads (26) may include (or incorporate) one or more intermediate limit sensors configured to detect the position of the pick-up head between the top and bottom pick-up head positions. Specifically limiting the sensor signal representation or helping to determine whether the position (a) of the pick-up head (26) corresponds to a semiconductor component pick-up or release position; and/or (b) whether it is satisfied at the end portion or top end of the pick-up head (26) Pre-with a processing station The fixed space or separation distance condition (e.g., indicates whether the pickup head (26) has cleared the processing station vertically, and the rotational transfer of the rotary table of the pickup head (26) can be safely continued). Particular embodiments additionally include a sensor configured to detect a pick head position or a rotational transformation corresponding to one or more rotational transfer sensing locations.

在任何處理站的元件或裝置移位控制(例如,一電氣測試站或一視覺檢測站)較佳包括兩階段。在第一階段,一拾取頭(26)係位於靠近或非常靠近與一特別處理站有關的移位平面之表面。如果拾取頭(26)到達處理站,拾取頭(26)移動短垂直距離並使裝置放置在處理站上。相較於裝置從最高或頂端位置移至處理站,此兩階段放置程序有助於減少負擔。拾取頭(26)移動或移位的垂直距離為一可編程參數,例如,取決於考慮下的元件或半導體裝置的類型或厚度。 The component or device shift control (e.g., an electrical test station or a visual inspection station) at any of the processing stations preferably includes two stages. In the first phase, a pick-up head (26) is located near or very close to the surface of the displacement plane associated with a particular processing station. If the pick-up head (26) reaches the processing station, the pick-up head (26) moves a short vertical distance and places the device on the processing station. This two-stage placement procedure helps reduce the burden compared to moving the device from the highest or top position to the processing station. The vertical distance at which the pick head (26) moves or shifts is a programmable parameter, for example, depending on the type or thickness of the component or semiconductor device under consideration.

典型上,旋轉臺(12)的旋轉運動包括拾取頭26在不同處理站(例如,P1至P2)間變換的一系列短運動。處理站間的旋轉運動暫停、或旋轉臺等待、或延遲時間通常是由最慢處理站的產量決定。例如,在一測試站需約5秒鐘測試一裝置、及一檢測站需約15秒鐘檢測一裝置之情況中,處理站間的旋轉臺等待、或延遲時間約15秒鐘。在各種不同具體實施例中,旋轉臺等待或延遲時間為一可組態或可編程的參數。 Typically, the rotational motion of the rotary table (12) includes a series of short motions that the pickup head 26 transforms between different processing stations (e.g., P1 to P2). The pause in rotational motion between processing stations, or the rotary table wait, or delay time is typically determined by the throughput of the slowest processing station. For example, in the case where a test station takes about 5 seconds to test a device, and a test station takes about 15 seconds to detect a device, the rotary station between the processing stations waits, or the delay time is about 15 seconds. In various embodiments, the rotary table wait or delay time is a configurable or programmable parameter.

旋轉臺總成(12)的慣性運動決定旋轉臺的可旋轉部分及/或拾取頭(26)穩定所需的安定時間,使得元件能可靠或精確拾取及/或放置或放開。此慣性運動取決於旋轉臺總成(12)的質量和震動特性。大體上,鑑於具體實施例的詳述、考慮 的元件類型、先前系統操作歷史及/或嘗試與錯誤測試,可編程指定安定時間及決定適合的安定時間。 The inertial motion of the rotary table assembly (12) determines the settling time required for the rotatable portion of the rotary table and/or the pickup head (26) to stabilize, so that the components can be picked up and/or placed or released reliably or accurately. This inertial motion depends on the mass and vibration characteristics of the rotating table assembly (12). In general, in view of the detailed description and consideration of specific embodiments The component type, previous system operation history, and/or trial and error tests, programmable to specify the settling time and determine the appropriate settling time.

請即參考圖3A-3D和4,半導體元件從拾取頭(26)卸載或分離,並運送至位於卸載位置的載體(14、16)。如前述,系統(10)包括第一載體(14)和第二載體(16)(第一載體(14)和第二載體(16)之每一者亦已知為一移動載具或一載器)。第一載體(14)和第二載體(16)之每一者係穿梭移動(即是,移動或移位)於第一位置(從拾取頭(26)接收半導體元件)和第二位置(接收的半導體元件運送至同時取放機構(18))間。 3A-3D and 4, the semiconductor component is unloaded or detached from the pick-up head (26) and transported to the carrier (14, 16) at the unloading position. As before, the system (10) includes a first carrier (14) and a second carrier (16) (each of the first carrier (14) and the second carrier (16) is also known as a mobile carrier or a carrier Device). Each of the first carrier (14) and the second carrier (16) shuttles (ie, moves or shifts) in a first position (receiving a semiconductor component from the pickup head (26)) and a second position (receiving The semiconductor component is transported between the pick-and-place mechanisms (18)).

載體(14、16)配置使得當一載體(例如,圖4的載體(14))正從旋轉臺(12)接收裝置時,另一載體(16)傳遞元件至同時取放機構(18),並返回就在載體(14)下的等待或預備位置,其正從旋轉臺的拾取頭(26)接收裝置。如果從旋轉臺(12)接收裝置的載體(14)填滿元件,此載體(14)移至傳遞或清空位置,供傳遞或提供元件至同時取放機構(18)。只要此載體(14)移開,等待預備的載體(16)會被舉起或移至收受位置,並開始從拾取頭(26)接收下一組元件。傳遞元件至同時取放機構(18)後,剛清空的載體(14)會放下,並移至就在載體(16)下的等待或預備位置,現在從拾取頭(26)接收元件。兩載體(14、16)的循環運動確保高或非常高的機器產量(UPH)。 The carrier (14, 16) is configured such that when a carrier (e.g., the carrier (14) of Figure 4) is receiving the device from the rotary table (12), the other carrier (16) transmits the component to the simultaneous pick-and-place mechanism (18), And returning to the waiting or preparatory position under the carrier (14), which is receiving the device from the pickup head (26) of the rotary table. If the carrier (14) of the receiving device from the rotary table (12) fills the component, the carrier (14) is moved to a transfer or empty position for transfer or supply of the component to the simultaneous pick-and-place mechanism (18). As long as the carrier (14) is removed, the ready carrier (16) will be lifted or moved to the receiving position and begin receiving the next set of components from the pick head (26). After the transfer element to the simultaneous pick-and-place mechanism (18), the freshly emptied carrier (14) is lowered and moved to a waiting or ready position just below the carrier (16), now receiving the component from the pick-up head (26). The cyclic motion of the two carriers (14, 16) ensures a high or very high machine throughput (UPH).

第一載體(14)和第二載體(16)是在第一位置(半導體元件從旋轉臺(12)的拾取頭(26)運送至載體(14、16)的位置)和第二位置(半導體元件從兩載體(14、16)運送至同時取放機構(18)的位置)間循環運動操作。此是在圖3A-3D和4說明。 The first carrier (14) and the second carrier (16) are in a first position (a position at which the semiconductor element is transported from the pickup head (26) of the turntable (12) to the carrier (14, 16)) and a second position (semiconductor The element is circulated from the two carriers (14, 16) to the position of the simultaneous pick-and-place mechanism (18). This is illustrated in Figures 3A-3D and 4.

較佳係使用兩載體(即是,第一載體(14)和第二載體(16)) 提高半導體元件從拾取頭(26)運送至同時取放機構(18)的速度。在旋轉臺速度增加因此可處理更多裝置的情況,系統(10)可依需引用更多的載體或移動載具(例如,3、4、6、或8載體或移動載具),以增加半導體元件從拾取頭(26)運送至同時取放機構(18)的速度。第一載體(14)和第二載體(16)之每一者可耦合成一移動器或一移動機構,以在第一位置(從拾取頭(26)接收半導體元件)和第二位置(接收的半導體元件運送至同時取放機構(18))間移位第一載體(14)和第二載體(16)。 Preferably, two carriers are used (ie, the first carrier (14) and the second carrier (16)) The speed at which the semiconductor component is transported from the pick-up head (26) to the pick-and-place mechanism (18) is increased. In the case where the speed of the rotary table is increased so that more devices can be handled, the system (10) can reference more carriers or mobile carriers (eg, 3, 4, 6, or 8 carriers or mobile vehicles) as needed to increase The speed at which the semiconductor component is transported from the pick-up head (26) to the pick-and-place mechanism (18). Each of the first carrier (14) and the second carrier (16) can be coupled into a mover or a moving mechanism to receive the semiconductor component in a first position (from the pick-up head (26)) and the second position (received The semiconductor component is transported to the first pick-and-place mechanism (18) to displace the first carrier (14) and the second carrier (16).

如圖4所示,第一載體(14)和第二載體(16)之每一者包括在上表面形成的許多收受器(28)(亦已知為收受槽)。在第一載體(14)和第二載體(16)之每一者的上表面形成的收受器(28)數量可依需要改變。收受器(28)數量之每一者係加以成形和尺寸化,供接收來自旋轉臺(12)的拾取頭(26)的一半導體元件。收受器(28)係以預定組態配置在載體(14、16)。收受器(28)較佳在第一載體(14)和第二載體(16)之每一者的上表面係以直列或直線配置。收受器(28)間的間隔較佳係一致性,且可依需要改變。此外,收受器(28)的列及/或欄數量可根據每一載體(14、16)的想要元件裝載能力加以修改或增加,隨著完成的任何修改,使得收受器(28)的所有列和欄可隨著拾取頭(26)適當定位。 As shown in Figure 4, each of the first carrier (14) and the second carrier (16) includes a plurality of receptacles (28) (also known as receiving slots) formed in the upper surface. The number of receptacles (28) formed on the upper surface of each of the first carrier (14) and the second carrier (16) can be varied as desired. Each of the number of receivers (28) is shaped and sized for receiving a semiconductor component from the pick-up head (26) of the rotary table (12). The receiver (28) is arranged in the carrier (14, 16) in a predetermined configuration. The receiver (28) is preferably arranged in an in-line or straight line on the upper surface of each of the first carrier (14) and the second carrier (16). The spacing between the receivers (28) is preferably consistent and can be varied as desired. In addition, the number of columns and/or columns of the receiver (28) may be modified or increased depending on the desired component loading capabilities of each carrier (14, 16), with all modifications being made, such that the receiver (28) Columns and columns can be properly positioned with the pick head (26).

第一載體(14)和第二載體(16)之每一者為空間移位,促成在一或多個收受器(28)中接收每個連續半導體元件。此移位較佳係由耦合至第一載體(14)和第二載體(16)之每一者的移動器或移動機構促成。更明確係,第一載體(14)和第二載體(16)之每一者的移位距離係等於在一或多個收受器(28)中 接收每個連續半導體元件之間的收受器(28)間距。第一載體(14)和第二載體(16)的空間移位速度較佳係相同,且可依需要改變。此外,第一載體(14)和第二載體(16)的移位速度可由軟體控制。 Each of the first carrier (14) and the second carrier (16) is spatially displaced to facilitate receipt of each successive semiconductor component in one or more receivers (28). This displacement is preferably facilitated by a mover or moving mechanism coupled to each of the first carrier (14) and the second carrier (16). More specifically, the displacement distance of each of the first carrier (14) and the second carrier (16) is equal to one or more receivers (28) The receiver (28) spacing between each successive semiconductor component is received. The spatial displacement speeds of the first carrier (14) and the second carrier (16) are preferably the same and can be varied as desired. Furthermore, the speed of displacement of the first carrier (14) and the second carrier (16) can be controlled by the software.

如前述,第一載體(14)和第二載體(16)係於第一位置上接收半導體元件,且隨後移位至第二位置。第一載體(14)和第二載體(16)接收的半導體元件係運送至位於第二位置的同時取放機構(18)。同時取放機構(18)較佳包括從同時取放機構(18)的主體延伸的許多拾取尖頭(30)。拾取尖頭(30)係以預定組態配置。拾取尖頭(30)較佳係以線性組態配置且有一致性間距。拾取尖頭(30)的空間組態最佳係符合第一載體(14)和第二載體(16)之每一者的收受器(28)組態。更明確係,拾取尖頭(30)的間距係類似第一載體(14)和第二載體(16)之每一者的收受器(28)的間距。 As previously described, the first carrier (14) and the second carrier (16) receive the semiconductor component in a first position and are subsequently displaced to a second position. The semiconductor component received by the first carrier (14) and the second carrier (16) is transported to the pick and place mechanism (18) in the second position. At the same time, the pick-and-place mechanism (18) preferably includes a plurality of pick-up tips (30) extending from the body of the simultaneous pick-and-place mechanism (18). The pick-up tip (30) is configured in a predetermined configuration. The pick-up tip (30) is preferably configured in a linear configuration with consistent spacing. The spatial configuration of the pick-up tip (30) is preferably configured to conform to the receiver (28) of each of the first carrier (14) and the second carrier (16). More specifically, the pitch of the pick-up tip (30) is similar to the pitch of the receiver (28) of each of the first carrier (14) and the second carrier (16).

圖4描述的同時取放機構(18)操作上係使半導體元件從第一載體(14)和第二載體(16)之每一者運送至輸出封裝構件(22)。輸出封裝構件(22)較佳係如圖2B所示的一托盤載體(32)或一盤型載體。托盤載體(32)亦稱為一輸出容器。同時取放機構(18)較佳能夠移位,用於從第一載體(14)和第二載體(16)之每一者整個接收或拾起預定數量半導體元件。同時取放機構(18)從第一位置移至第二位置較佳係平行於第一軸及垂直於載體(14、16)的行進方向。同時取放機構(18)較佳係耦合至一運動控制器,供同時取放機構(18)移位。同時取放機構(18)依需要能以其他方向及不同速度移動或移位。同時取放機構(18)的運動較佳係由一運動控制器加以促成或控制。 The simultaneous pick and place mechanism (18) depicted in Figure 4 is operative to transport semiconductor components from each of the first carrier (14) and the second carrier (16) to the output package member (22). The output package member (22) is preferably a tray carrier (32) or a disk carrier as shown in Figure 2B. The tray carrier (32) is also referred to as an output container. At the same time, the pick-and-place mechanism (18) is preferably displaceable for receiving or picking up a predetermined number of semiconductor components from each of the first carrier (14) and the second carrier (16). Simultaneously, the movement of the pick-and-place mechanism (18) from the first position to the second position is preferably parallel to the first axis and perpendicular to the direction of travel of the carrier (14, 16). At the same time, the pick-and-place mechanism (18) is preferably coupled to a motion controller for displacement of the pick-and-place mechanism (18). At the same time, the pick-and-place mechanism (18) can be moved or displaced in other directions and at different speeds as needed. At the same time, the movement of the pick-and-place mechanism (18) is preferably facilitated or controlled by a motion controller.

更明確係,同時取放機構(18)的拾取尖頭(30)可接收預定數量的半導體元件。預定數量的半導體元件較佳係等於或大於2。接收預定數量的半導體元件後,同時取放機構(18)會進一步移位,用於運送預定數量的半導體元件至托盤載體(32)。此從第一位置至第二位置之移位較佳係平行於第一軸,同時垂直於載體(14、16)的行進方向。更明確係,同時取放機構(18)移位係用於使半導體元件從拾取尖頭(30)運送至在托盤載體(32)上的收受槽或收受器(34)。所屬技術領域專業人士應明白,同時取放機構(18)可促成預定數量的半導體元件從第一載體(14)和第二載體(16)之每一者,同時運送或整個運送至托盤載體(32)。 More specifically, the pick-up tip (30) of the pick-and-place mechanism (18) can receive a predetermined number of semiconductor components. A predetermined number of semiconductor elements are preferably equal to or greater than two. After receiving a predetermined number of semiconductor components, the pick and place mechanism (18) is further displaced for transporting a predetermined number of semiconductor components to the tray carrier (32). This displacement from the first position to the second position is preferably parallel to the first axis while being perpendicular to the direction of travel of the carrier (14, 16). More specifically, the pick and place mechanism (18) shifting mechanism is used to transport the semiconductor component from the pick-up tip (30) to the receiving slot or receiver (34) on the tray carrier (32). It will be understood by those skilled in the art that the simultaneous pick-and-place mechanism (18) can facilitate a predetermined number of semiconductor components from each of the first carrier (14) and the second carrier (16) to be simultaneously transported or transported entirely to the tray carrier ( 32).

本發明的系統(10)有助從一連串運送半導體元件(從輸送器機構(11)至旋轉臺(12),及從旋轉臺(12)至第一載體(14)和第二載體(16)之每一者)至同時或整個運送半導體元件(從第一載體(14)和第二載體(16)之每一者至托盤載體(32))的轉變。同時取放機構(18)整個運送預定數量半導體元件的能力允許系統(10)將托盤載體(32)當做半導體元件的一選擇性輸出封裝構件(22)使用。因此,此允許半導體元件製造者或業者提供消費者可將托盤載體(32)當做輸出封裝構件(22)類型之選項。所屬技術領域專業人士應明白,系統(10)可使用其他設計和結構的托盤載體(32)。 The system (10) of the present invention facilitates the transport of semiconductor components from a series (from the conveyor mechanism (11) to the rotary table (12), and from the rotary table (12) to the first carrier (14) and the second carrier (16) Each of them) to the simultaneous or entire transport of semiconductor elements (from each of the first carrier (14) and the second carrier (16) to the tray carrier (32). The ability of the pick and place mechanism (18) to transport a predetermined number of semiconductor components as a whole allows the system (10) to use the tray carrier (32) as a selective output package member (22) for the semiconductor component. Thus, this allows the semiconductor component manufacturer or manufacturer to provide the consumer with the option of using the tray carrier (32) as an output package member (22) type. Those skilled in the art will appreciate that the system (10) can use other designs and configurations of tray carriers (32).

系統(10)較佳係更包括一可編程控制器或一處理器(未在圖顯示),其能以信號與輸送器機構(11)、旋轉臺(12)、處理模組、第一載體(14)、第二載體(16)及同時取放機構(18)之至少一者進行溝通。可編程控制器較佳係可編程用於控制 旋轉臺(12)、處理模組、第一載體(14)、第二載體(16)及同時取放機構(18)之至少一者的操作。例如,可編程控制器較佳係控制旋轉臺(12)、處理模組、第一載體(14)、第二載體(16)及同時取放機構(18)之至少一者的操作速度和持續時間。 The system (10) preferably further includes a programmable controller or a processor (not shown) capable of signal and conveyor mechanism (11), rotating table (12), processing module, first carrier (14) communicating with at least one of the second carrier (16) and the simultaneous pick-and-place mechanism (18). Programmable controller is preferably programmable for control The operation of at least one of the rotary table (12), the processing module, the first carrier (14), the second carrier (16), and the simultaneous pick-and-place mechanism (18). For example, the programmable controller preferably controls the operation speed and duration of at least one of the rotating table (12), the processing module, the first carrier (14), the second carrier (16), and the simultaneous pick-and-place mechanism (18). time.

根據本發明之一具體實施例亦提供用於運送半導體元件之一示範性方法(100)。圖5提供該方法(100)之一示範性步驟流程。 An exemplary method (100) for transporting semiconductor components is also provided in accordance with an embodiment of the present invention. Figure 5 provides an exemplary flow of steps for one of the methods (100).

在方法(100)的步驟110,半導體元件係載入或引入系統(10)。如前述,半導體元件係載入位於載入模組或載入站(24)的系統。更明確係,在步驟110,半導體元件係從第一封裝構件(20)運送至輸送器機構(11)。此運送可藉由所屬技術領域專業人士已知的各種不同構件或機構達成,例如利用一同時取放機構(18)。在步驟120,輸送器機構(11)係使半導體元件從載入模組(24)連續運送至旋轉臺(12)。 At step 110 of method (100), the semiconductor component is loaded or introduced into system (10). As previously mentioned, the semiconductor component is loaded into a system located at the load module or load station (24). More specifically, at step 110, the semiconductor component is transported from the first package member (20) to the conveyor mechanism (11). This transport can be accomplished by a variety of different components or mechanisms known to those skilled in the art, such as by a simultaneous pick and place mechanism (18). At step 120, the conveyor mechanism (11) continuously transports the semiconductor components from the load module (24) to the rotary table (12).

在步驟130,半導體元件係在吸取位置上從輸送器系統(11)連續運送至的旋轉臺(12)的拾取頭(26)。更明確係,半導體元件係從輸送器機構(11)(例如,一輸送器帶)的一部分連續個別運送至旋轉臺(12)的連續拾取頭(26)。如前述,每一拾取頭(26)包括其間定義的一通道或氣道。真空或吸取應用在通道,以從輸送器機構(11)拾取半導體元件。其他裝置或機構亦可由拾取頭(26)用於拾起半導體元件。 At step 130, the semiconductor component is a pick-up head (26) of the rotary table (12) that is continuously transported from the conveyor system (11) at the pick-up position. More specifically, the semiconductor component is continuously transported individually from a portion of the conveyor mechanism (11) (e.g., a conveyor belt) to a continuous pick-up head (26) of the rotary table (12). As previously mentioned, each pick head (26) includes a channel or air passage defined therebetween. Vacuum or suction is applied to the channels to pick up the semiconductor components from the conveyor mechanism (11). Other devices or mechanisms may also be used by the pick-up head (26) to pick up the semiconductor components.

在步驟140,拾取頭(26)載送的半導體元件係以有助於半導體元件製造、測試、及/或確認程序之方式,旋轉運送至(或通過)一連串處理模組(例如,從起始或第一處理模組至最後處理模組,其中處理模組可執行電氣測試、光學檢測、 及/或其他操作)。在步驟150,拾取頭(26)傳送半導體元件至卸載位置(例如,在此元件已於處理模組處理後)。如前述,馬達驅動可促成拾取頭(26)從吸取位置旋轉移位至卸載位置。拾取頭(26)從吸取位置至卸載位置的移位係遵循預定行進路徑。如果半導體元件從吸取位置移位至卸載位置,拾取頭(26)接收的半導體元件會被處理。步驟130、140、和150因此係經由旋轉臺的前進旋轉移位(拾取頭(26)於不同處理模組間的空間轉變),以連續或同時方式(即是平行)執行。 At step 140, the semiconductor component carried by the pick-up head (26) is rotationally transported (or passed) through a series of processing modules in a manner that facilitates fabrication, testing, and/or validation of the semiconductor component (eg, from the start Or a first processing module to a final processing module, wherein the processing module can perform electrical testing, optical inspection, And/or other operations). At step 150, the pick-up head (26) transports the semiconductor component to the unloading position (e.g., after the component has been processed by the processing module). As previously described, motor drive can cause the pick head (26) to be rotationally displaced from the pick-up position to the unloading position. The displacement of the pickup head (26) from the suction position to the unloading position follows a predetermined travel path. If the semiconductor component is displaced from the pickup position to the unloading position, the semiconductor component received by the pickup head (26) is processed. Steps 130, 140, and 150 are thus performed in a continuous or simultaneous manner (i.e., in parallel) via a forward rotational shift of the rotary table (the spatial transition of the pickup head (26) between the different processing modules).

旋轉臺機構設計之重要態樣為拾取頭(26)於不同處理站間移動時,拾取頭(26)動態上下運動。此造成明顯減少系統(10)的轉位時間且明顯增加系統產量(UPH)。 An important aspect of the design of the rotary table mechanism is that the pickup head (26) moves up and down dynamically as the pickup head (26) moves between different processing stations. This results in a significant reduction in the indexing time of the system (10) and a significant increase in system throughput (UPH).

系統(10)包括處理模組,例如一或多個視覺檢測模組和一或多個電氣、光學、或電光學測試模組,其每個配置係於半導體元件從吸取位置移位至卸載位置期間,處理半導體元件。處理模組的數量和類型可由系統(10)的使用者依需要改變。半導體元件從吸取位置至卸載位置的移位期間,在半導體元件上執行多重處理步驟的能力可提高半導體元件製造的速度、準確性和產量之至少一者。 The system (10) includes a processing module, such as one or more visual inspection modules and one or more electrical, optical, or electro-optical test modules, each configured to shift the semiconductor component from a pick-up position to an unloading position During this process, the semiconductor components are processed. The number and type of processing modules can be changed by the user of the system (10) as needed. The ability to perform multiple processing steps on a semiconductor component during displacement of the semiconductor component from the pick-up position to the unloading position can increase at least one of speed, accuracy, and throughput of semiconductor component fabrication.

在步驟150,半導體元件從旋轉臺(12)的拾取頭(26)的連續運送至位於第一或收受位置的第一載體(14)。更明確係,在步驟150,預定數量半導體元件(亦義知為複數個半導體元件)從拾取頭(26)連續運送至(或運送入)第一載體(14)。預定數量半導體元件之每一者係從一拾取頭(26)運送至位於第一位置的第一載體(14)上形成的收受器(28)數量之一。在步驟150過程,拾取頭(26)較佳係以預定距離移向至第一載體 (14)。空氣最佳係通過拾取頭(26)通道清除,用以促成半導體元件從拾取頭(26)至第一載體(14)的收受器(28)之分離或運送。替代的構件或機構可用於半導體元件從拾取頭(26)運送至第一載體(14)的收受器(28)。 At step 150, the semiconductor component is continuously transported from the pickup head (26) of the rotary table (12) to the first carrier (14) at the first or receiving position. More specifically, at step 150, a predetermined number of semiconductor components (also known as a plurality of semiconductor components) are continuously transported (or transported) from the pickup head (26) to the first carrier (14). Each of the predetermined number of semiconductor components is one of the number of receivers (28) formed from a pick-up head (26) to a first carrier (14) located at a first location. In step 150, the pick-up head (26) is preferably moved to the first carrier at a predetermined distance (14). The air is preferably purged through the pick-up head (26) to facilitate separation or transport of the semiconductor component from the pick-up head (26) to the receiver (28) of the first carrier (14). An alternative component or mechanism can be used to transport the semiconductor component from the pick-up head (26) to the receptacle (28) of the first carrier (14).

第一載體(14)較佳係在第一載體(14)的收受器(28)數量之一者中的每個連續半導體元件間空間移位。更明確係,第一載體(14)的較佳空間移位距離係等於第一載體(14)的收受器(28)數量之一者中的每個半導體元件接收間的收受器間距。 The first carrier (14) is preferably spatially displaced between each of the continuous semiconductor elements of one of the number of receivers (28) of the first carrier (14). More specifically, the preferred spatial displacement distance of the first carrier (14) is equal to the receiver spacing between each of the semiconductor component receiving one of the number of receivers (28) of the first carrier (14).

在步驟160,系統(10)可判斷第一載體(14)是否填滿,即是,第一載體(14)是否應移位至同時取放機構(18)。如果不是,在步驟150,方法(100)連續運送元件至收受載體(在此範例為第一載體(14))。 At step 160, the system (10) can determine if the first carrier (14) is full, i.e., whether the first carrier (14) should be displaced to the simultaneous pick-and-place mechanism (18). If not, at step 150, method (100) continuously transports the component to the receiving carrier (in this example, the first carrier (14)).

在步驟170,如果第一載體(14)被清空或卸載,第一載體(14)從第一位置移位或移動至第二位置,使得同時取放機構(18)可接近及卸載第一載體(14)。此外,在步驟175,第二載體(16)係以與步驟170的第一載體移位同時或通常同時發生的方式,移位或移動至第一收受位置。一旦第二載體(16)位於第一或收受位置(即是,元件或裝置卸載位置,其中元件從拾取頭(26)卸載至載體(16)上或內),在步驟150,元件會從旋轉臺的拾取頭(26)連續運送至第二載體(16)上或內。 At step 170, if the first carrier (14) is emptied or unloaded, the first carrier (14) is displaced or moved from the first position to the second position such that the simultaneous access mechanism (18) can access and unload the first carrier (14). Further, at step 175, the second carrier (16) is displaced or moved to the first receiving position in a manner that occurs simultaneously or generally simultaneously with the first carrier displacement of step 170. Once the second carrier (16) is in the first or receiving position (ie, the component or device unloading position in which the component is unloaded from the pick-up head (26) onto or into the carrier (16), at step 150, the component will rotate from The pick-up head (26) of the stage is continuously transported onto or into the second carrier (16).

在步驟170,一旦第一載體(14)移位、變換、或運送至同時取放機構(18),第一載體(14)載送的預定數量半導體元件從第一載體(14)整個運送至同時取放機構(18),更明確係,運送至在步驟180的同時取放機構(18)的拾取尖頭(30)。 這就是說,在步驟180,預定數量的半導體元件從第一載體(14)的收受器同時運送至同時取放機構(18)的拾取尖頭(30)。同時取放機構(18)的拾取尖頭(30)係整個移向第一載體(14),用以從第一載體(14)拾取兩或多個(例如,2、8、10、12、20或更多)半導體元件。可編程控制器可控制拾取尖頭(30)的距離、速度和位移之每一者,且可依需要改變。 At step 170, once the first carrier (14) is displaced, shifted, or transported to the simultaneous pick-and-place mechanism (18), a predetermined number of semiconductor components carried by the first carrier (14) are transported from the first carrier (14) to the entire carrier. At the same time, the pick-and-place mechanism (18), more specifically, is transported to the pick-up tip (30) of the pick-and-place mechanism (18) at the same time as step 180. That is, at step 180, a predetermined number of semiconductor components are simultaneously transported from the receiver of the first carrier (14) to the pick-up tip (30) of the simultaneous pick-and-place mechanism (18). At the same time, the picking tip (30) of the pick-and-place mechanism (18) is entirely moved toward the first carrier (14) for picking up two or more from the first carrier (14) (for example, 2, 8, 10, 12, 20 or more) semiconductor components. The programmable controller can control each of the distance, velocity and displacement of the pick-up tip (30) and can be changed as needed.

關於步驟180,預定數量的半導體元件是從同時取放機構(18)的拾取尖頭(30)運送至第二或輸出封裝構件(22),在一些具體實施例中,更明確係托盤載體(32)。托盤載體(32)亦稱為半導體元件容器。同時取放機構(18)的拾取尖頭(30)係於步驟180過程移向托盤載體(32)。預定數量的半導體元件係從同時取放機構(18)的拾取尖頭(30)運送至在托盤載體(32)表面形成的收受槽(34)。托盤載體(32)的收受槽(34)係以預定組態空間配置。托盤載體(32)的收受槽(34)間距較佳係一致性。更明確係,托盤載體(32)的收受槽(34)間距符合同時取放機構(18)的拾取尖頭(30)間距,因此符合第一載體(14)和第二載體(16)之每一者的收受器間距。在托盤載體(32)的收受槽(34)、同時取放機構(18)的拾取尖頭(30)、及第一和第二載體(14、16)之每一者的收受器(28)之間的對應會類似間距允許其間正確運送半導體元件。同時取放機構(18)的使用亦造成明顯增加系統產量(UPH)。 With respect to step 180, a predetermined number of semiconductor components are transported from the pick-up tip (30) of the simultaneous pick-and-place mechanism (18) to the second or output package member (22), in some embodiments, more specifically the tray carrier ( 32). The tray carrier (32) is also referred to as a semiconductor component container. At the same time, the picking tip (30) of the pick and place mechanism (18) is moved to the tray carrier (32) in the process of step 180. A predetermined number of semiconductor components are transported from the pick-up tip (30) of the simultaneous pick-and-place mechanism (18) to a receiving groove (34) formed on the surface of the tray carrier (32). The receiving groove (34) of the tray carrier (32) is configured in a predetermined configuration space. The spacing of the receiving grooves (34) of the tray carrier (32) is preferably uniform. More specifically, the spacing of the receiving grooves (34) of the tray carrier (32) conforms to the spacing of the picking tips (30) of the pick-and-place mechanism (18), thus conforming to each of the first carrier (14) and the second carrier (16). One of the receiver spacing. a receiving groove (34) of the tray carrier (32), a pick-up tip (30) of the pick-and-place mechanism (18), and a receiver (28) of each of the first and second carriers (14, 16) The correspondence between the similar spacing allows the semiconductor components to be properly transported therebetween. At the same time, the use of the pick-and-place mechanism (18) also results in a significant increase in system throughput (UPH).

如前述,同時取放機構(18)可依需要以各種不同方向及/或速度移位,有助於在第一載體(14)或第二載體(16)和托盤載體(32)間運送半導體元件。一運動控制器(可為軟體控制)有助於同時取放機構(18)的移位。此外,系統(10)可包括額 外的同時取放機構(18)、及/或載體(14、16)(亦已知為容器),此取決於具體實施例細節需求。卸載或傳送至托盤載體(32)前,可於額外的取放機構與載體間連續或整個運送半導體元件。這些額外的同時取放機構(18)和載體(14、16)可為類似或不同變化的設計和結構。 As described above, the simultaneous pick-and-place mechanism (18) can be displaced in various directions and/or speeds as needed to facilitate transporting the semiconductor between the first carrier (14) or the second carrier (16) and the tray carrier (32). element. A motion controller (which can be software controlled) facilitates the displacement of the pick and place mechanism (18). Additionally, the system (10) can include an amount The external pick-and-place mechanism (18), and/or the carrier (14, 16) (also known as a container) depends on the details of the particular embodiment. The semiconductor component can be transported continuously or entirely between the additional pick-and-place mechanism and the carrier before being unloaded or transferred to the tray carrier (32). These additional simultaneous pick and place mechanisms (18) and carriers (14, 16) may be of similar or different variations in design and construction.

第一載體(14)和第二載體(16)係以循環配置操作,此明顯增加系統產量(UPH)。當第一載體(14)正從位於第一位置的拾取頭(26)接收元件時,第二載體(16)可傳遞元件至位於第二位置的同時取放機構(18),且放低及移回至預備或等待位置,其接近第一位置,且就在載體(14)下面,該載體正從拾取頭接收元件。換句話說,第二載體(16)正等持第一載體(14)完成拾起元件及移回至第二位置(裝置卸載位置)。第一載體(14)一移至卸載位置,第二載體(16)會上移,且預備從拾取頭(26)接收元件。典型上,可減小或忽略從等待位置至收受位置(可從拾取頭(26)接收或載入元件)間垂直移動一空載體(16)的任何時間延遲。 The first carrier (14) and the second carrier (16) operate in a cyclic configuration which significantly increases system throughput (UPH). When the first carrier (14) is receiving an element from the pick-up head (26) in the first position, the second carrier (16) can transfer the element to the pick-and-place mechanism (18) in the second position, and lowers Moving back to the preparatory or waiting position, which is close to the first position, and just below the carrier (14), the carrier is receiving the component from the pick-up head. In other words, the second carrier (16) is holding the first carrier (14) to complete the pick-up element and to move back to the second position (device unloading position). As soon as the first carrier (14) is moved to the unloading position, the second carrier (16) is moved up and ready to receive the component from the pick-up head (26). Typically, any time delay from vertically moving an empty carrier (16) from a waiting position to a receiving position (which can be received or loaded from the pickup head (26)) can be reduced or ignored.

如此確保預定數量的半導體元件從拾取頭(26)運送至位於第一位置的第一載體(14),而對應數量的半導體元件從第二載體(16)運送至位於同時取放機構(18),反之亦然。第一載體(14)和第二載體(16)(即是,兩載體)的使用可提高從拾取頭(26)至同時取放機構(18)的半導體元件的運送速度。更多載體可依需要引用在系統(10),用於進一步增加從拾取頭(26)至同時取放機構(18)的半導體元件運送速度。 This ensures that a predetermined number of semiconductor components are transported from the pick-up head (26) to the first carrier (14) in the first position, while a corresponding number of semiconductor components are transported from the second carrier (16) to the simultaneous pick-and-place mechanism (18) ,vice versa. The use of the first carrier (14) and the second carrier (16) (i.e., the two carriers) can increase the transport speed of the semiconductor components from the pick-up head (26) to the simultaneous pick-and-place mechanism (18). More carriers may be referenced to the system (10) as needed to further increase the semiconductor component transport speed from the pick-up head (26) to the simultaneous pick-and-place mechanism (18).

結論,本發明提供的示範性系統(10)和示範性方法(100)允許半導體元件輸出至托盤載體(即是盤型封裝構件)(14、16) 或其他類型的載送構件。此允許系統的使用者提供消費者額外的半導體元件輸出封裝構件選項。此外,不同輸入封裝構件亦可搭配半導體元件(會被載入或引入系統)使用。輸入封裝構件和輸出封裝構件的彈性提高示範性系統(10)和示範性方法(100)的易用和有效性。 In conclusion, the exemplary system (10) and exemplary method (100) provided by the present invention allow semiconductor components to be output to a tray carrier (ie, a disk-type package member) (14, 16). Or other types of carrier members. This allows the user of the system to provide the consumer with additional semiconductor component output package component options. In addition, different input package components can also be used with semiconductor components that can be loaded or introduced into the system. The flexibility of the input package member and the output package member improves the ease of use and effectiveness of the exemplary system (10) and the exemplary method (100).

此外,本發明提供的示範性系統(10)和示範性方法(100)允許從個別半導體元件的一連串輸入轉變成多重半導體元件的整個或整個輸出。此外,本發明提供的示範性系統(10)和示範性方法(100)允許如果於不同封裝構件間運送半導體元件時,半導體元件可執行多重處理步驟。系統(10)運送期間,執行半導體元件多重處理步驟的能力可提高半導體元件製造的速度、產量、和準確性之至少一者。此外,旋轉臺(12)的使用有助於提高系統(10)的空間效率。 Moreover, the exemplary system (10) and exemplary method (100) provided by the present invention allow for the conversion from a series of inputs of individual semiconductor components to the entire or entire output of multiple semiconductor components. Moreover, the exemplary system (10) and exemplary method (100) provided by the present invention allow for multiple processing steps if the semiconductor component is being transported between different package components. During the transport of the system (10), the ability to perform multiple processing steps of the semiconductor component can increase at least one of speed, throughput, and accuracy of semiconductor component fabrication. Furthermore, the use of a rotating table (12) helps to increase the space efficiency of the system (10).

所屬技術領域專業人士應明白,根據本發明的系統(10)可額外或另外組態成用於卸載元件,其中輸出封裝構件(22)被視為輸入封裝構件(20),且裝置以逆順序流入輸入封裝構件(20)。此特別係與元件或裝置需要重新檢測、及重新檢測之前及後所使用的元件載送構件(20、22)係不同的一些情況有關。 It will be understood by those skilled in the art that the system (10) according to the present invention may additionally or additionally be configured for unloading components, wherein the output package member (22) is considered to be an input package member (20) and the device is in reverse order Flow into the input package member (20). This is particularly the case when the component or device needs to be re-detected and the component carrier members (20, 22) used before and after re-detection are different.

在前述方法中,描述用於運送本發明具體實施例提供的半導體元件之一示範性系統和一示範性方法。示範性系統與方法係處理前述半導體元件製造期間所面對議題或問題的至少之一。不過,所屬技術領域專業人士應明白,本發明未侷限於前述具體實施例的特定形式、配置或結構。所屬技術領域專業人士應明白,鑑於此揭示,可達成許多變化及/或 修改,不致悖離本發明的範疇和精神。 In the foregoing method, an exemplary system and an exemplary method for transporting a semiconductor component provided by a specific embodiment of the present invention are described. Exemplary systems and methods address at least one of the issues or problems faced during the fabrication of the aforementioned semiconductor components. However, it should be understood by those skilled in the art that the present invention is not limited to the specific forms, configurations or structures of the foregoing specific embodiments. It will be apparent to those skilled in the art that many variations and/or changes can be made in view of this disclosure. Modifications do not detract from the scope and spirit of the invention.

3、4、6、8‧‧‧載體或移動載具 3, 4, 6, 8 ‧ ‧ carrier or mobile vehicle

10‧‧‧系統 10‧‧‧System

11‧‧‧輸送器機構 11‧‧‧Conveyor mechanism

12‧‧‧旋轉臺 12‧‧‧Rotating table

14‧‧‧第一載體 14‧‧‧ first carrier

16‧‧‧第二載體 16‧‧‧second carrier

18‧‧‧同時取放機構 18‧‧‧At the same time pick and place institutions

20‧‧‧輸入封裝構件 20‧‧‧Input package components

22‧‧‧輸出封裝構件 22‧‧‧Output package components

24‧‧‧載入站或載入模組 24‧‧‧Loading station or loading module

26‧‧‧拾取頭 26‧‧‧ pick up head

28‧‧‧收受器 28‧‧‧ Receiver

30‧‧‧拾取尖頭 30‧‧‧ Pick up the pointed

32‧‧‧托盤載體 32‧‧‧Tray carrier

34‧‧‧收受槽 34‧‧‧ receiving slot

下列本發明的描述係與圖式有關,其中:圖1為根據本發明的一具體實施例之彈性化高速運送半導體元件之示範性系統示意圖。 The following description of the invention relates to the drawings in which: FIG. 1 is a schematic diagram of an exemplary system for elasticizing high speed transporting semiconductor components in accordance with an embodiment of the present invention.

圖2A為顯示一旋轉臺結構之示意圖,其組態上具有可旋轉運動之複數個拾取頭、和週期性運動之複數個載體,有助從系統進行高產量卸載裝置。 2A is a schematic diagram showing the structure of a rotary table having a plurality of pick-up heads that are rotatably movable and a plurality of carriers that are periodically moved to assist in high-volume unloading of the apparatus from the system.

圖2B為說明在系統中的一旋轉臺結構示範性位置之上視圖,其組態成彈性化高速運送由本發明之一具體實施例提供的半導體元件。 2B is a top view illustrating an exemplary position of a rotating stage structure in a system configured to flexibly transport high speed semiconductor components provided by one embodiment of the present invention.

圖3A-3D為兩載體與同時取放機構工作之立體表示法(一)至(四)。 3A-3D are perspective representations (1) to (4) of the operation of the two carriers and the simultaneous pick-and-place mechanism.

圖4為用於運送半導體元件至托盤載體的一同時取放機構之等角視圖。 4 is an isometric view of a simultaneous pick and place mechanism for transporting semiconductor components to a carrier carrier.

圖5為根據本發明的一具體實施例之彈性化高速運送半導體元件之示範性方法流程步驟。 5 is an exemplary process flow step of elasticizing high speed transport of semiconductor components in accordance with an embodiment of the present invention.

10...系統10. . . system

11...輸送器機構11. . . Conveyor mechanism

12...旋轉臺12. . . Rotary table

14...第一載體14. . . First carrier

16...第二載體16. . . Second carrier

18...同時取放機構18. . . Simultaneous pick and place mechanism

20...輸入封裝構件20. . . Input package member

22...輸出封裝構件twenty two. . . Output package member

24...載入站或載入模組twenty four. . . Load station or load module

Claims (50)

一種用於運送半導體元件的系統,其包括:一元件載體群組,包括至少一元件載體,每一元件載體可在彼此不同的第一位置和第二位置之間移動,其組態成在形成於該元件載體頂部表面的複數個收受器接收複數個半導體元件,該等複數收受器彼此以一間距分隔;一移動機構,其組態成在彼此不同的該第一位置和該第二位置之間循環位移每一元件載體;一旋轉半導體元件處理機構,其組態成用於(a)依次拾取在該旋轉半導體元件處理機構的該吸取位置的半導體元件,同時或平行地(b)在該旋轉半導體元件處理機構的該卸載位置依次卸載半導體元件,其中,該旋轉半導體元件處理機構包含複數個拾取頭,該等複數拾取頭是組態成在該旋轉半導體元件處理機構與設定在該第一位置的該元件載體的該等複數收受器之間依次運送該等複數半導體元件;及一取放機構群組,其操作共同地拾取該等複數半導體元件,並於設定在該第二位置的該元件載體的該等複數收受器和一封裝構件的複數個槽之間共同地運送該等複數半導體元件,該等複數半導體元件在該等處理站之間的運送過程中或是在生產完成後的分發過程中會位於該槽之中或之上。 A system for transporting a semiconductor component, comprising: a component carrier group comprising at least one component carrier, each component carrier being movable between a first position and a second position different from each other, configured to form A plurality of receivers on a top surface of the component carrier receive a plurality of semiconductor components, the plurality of receivers being separated from each other by a pitch; a moving mechanism configured to be in the first position and the second position different from each other Circulatingly shifting each component carrier; a rotating semiconductor component processing mechanism configured to (a) sequentially pick up the semiconductor component at the picking position of the rotating semiconductor component processing mechanism, simultaneously or in parallel (b) at the The unloading position of the rotating semiconductor component processing mechanism sequentially unloads the semiconductor component, wherein the rotating semiconductor component processing mechanism includes a plurality of picking heads configured to be disposed at the rotating semiconductor component processing mechanism and at the first The plurality of semiconductor components are sequentially transported between the plurality of receivers of the component carrier at a position; and a pick-and-place machine a group that operates to collectively pick up the plurality of semiconductor components and collectively transport the plurality of semiconductor components between the plurality of receivers of the component carrier and the plurality of slots of a package member disposed at the second location The plurality of semiconductor components may be located in or on the trench during transport between the processing stations or during distribution after production. 如申請專利範圍第1項所述之系統,其中該旋轉半導體元件處理機構的該等複數拾取頭組態成在一吸取位置上連續接收複數個半導體元件,並使複數個半導體元件從該吸取位置連續運送至該卸載位置。 The system of claim 1, wherein the plurality of pick-up heads of the rotating semiconductor component processing mechanism are configured to continuously receive a plurality of semiconductor components at a pick-up position and to bring the plurality of semiconductor components from the pick-up position Continuously transported to the unloading position. 如申請專利範圍第2項所述之系統,其中該旋轉半導體元件處理機構被組態成用於將複數個半導體元件之一者 依次運送至設置在該第一位置的該元件載體的該等複數收受器,或是被組態成用於由設置在該第一位置的該元件載體的該等複數收受器依次拾取複數個半導體元件之一者,其中該旋轉半導體元件處理機構包括複數個拾取頭,複數個拾取頭之每一者係組態成載送複數個半導體元件之一。 The system of claim 2, wherein the rotating semiconductor component processing mechanism is configured to use one of a plurality of semiconductor components The plurality of receivers that are sequentially transported to the component carrier disposed at the first location, or are configured to sequentially pick up a plurality of semiconductors by the plurality of receivers of the component carrier disposed at the first location One of the components, wherein the rotating semiconductor component processing mechanism comprises a plurality of pick-up heads, each of the plurality of pick-up heads configured to carry one of the plurality of semiconductor components. 如申請專利範圍第3項所述之系統,其中該等複數個拾取頭之每一者係沿著一預定行進路徑進行旋轉移位,以連續地接收或承載該等複數半導體元件之一者,以及將複數個半導體元件之一從吸取位置運送至卸載位置。 The system of claim 3, wherein each of the plurality of pick-up heads is rotationally displaced along a predetermined travel path to continuously receive or carry one of the plurality of semiconductor components, And transporting one of the plurality of semiconductor components from the suction position to the unloading position. 如申請專利範圍第1項所述之系統,其中該旋轉半導體元件處理機構更被組態成用於(c)經由該等複數拾取頭透過複數處理模組以依次旋轉地運送該等複數半導體元件,以及在(a)及(b)中同時或平行地,以及其中該等複數個拾取頭之每一者包括一保持機構,其組態成提供真空吸取,供保持複數個半導體元件之一。 The system of claim 1, wherein the rotating semiconductor component processing mechanism is further configured to (c) sequentially transport the plurality of semiconductor components through the plurality of pick-up heads through the plurality of processing modules. And simultaneously or in parallel in (a) and (b), and wherein each of the plurality of pick-up heads includes a retention mechanism configured to provide vacuum suction for holding one of the plurality of semiconductor components. 如申請專利範圍第5項所述之系統,其中該複數個拾取頭之每一者係可垂直移位。 The system of claim 5, wherein each of the plurality of pick-up heads is vertically displaceable. 如申請專利範圍第5項所述之系統,其中該等複數個處理模組組態成隨沿預定行進路徑的該旋轉半導體元件處理機構的旋轉指引,即處理該等半導體元件。 The system of claim 5, wherein the plurality of processing modules are configured to process the semiconductor components with rotation of the rotating semiconductor component processing mechanism along a predetermined path of travel. 如申請專利範圍第4項所述之系統,其中該元件載體群組包含了一第二元件載體,其中該等複數個處理模組包括:至少一檢測模組及至少一測試模組,供在沿著預定行進 路徑的旋轉移位期間,分別檢測及測試由該等複數個拾取頭載送的複數個半導體元件,其中該取放機構群是被組態用於:當該第二元件載體位於該第二位置時,在該第二元件載體與該封裝構件之間運送半導體元件,或是當該第一元件載體位於該第一位置時,在該旋轉半導體元件處理機構與該第一元件載體之間運送半導體元件;及當該第一元件載體位於該第二位置時,在該第一元件載體與該封裝構件之間運送半導體元件,或是當該第二元件載體位於該第一位置時,在該旋轉半導體元件處理機構與該第二元件載體之間運送半導體元件。 The system of claim 4, wherein the component carrier group comprises a second component carrier, wherein the plurality of processing modules comprise: at least one detection module and at least one test module, Travel along schedule During the rotational shift of the path, a plurality of semiconductor components carried by the plurality of pick-up heads are respectively detected and tested, wherein the pick-and-place mechanism group is configured to: when the second component carrier is located at the second position Transporting the semiconductor component between the second component carrier and the package component, or transporting the semiconductor between the rotary semiconductor component processing mechanism and the first component carrier when the first component carrier is in the first position An element; and when the first component carrier is in the second position, transporting the semiconductor component between the first component carrier and the package component, or when the second component carrier is in the first position, in the rotation A semiconductor component is transported between the semiconductor component processing mechanism and the second component carrier. 如申請專利範圍第1項所述之系統,其更包括:一輸送器機構,其組態成用於將該等複數半導體元件依次運送至該旋轉半導體元件處理機構,或是由該旋轉半導體元件處理機構機依次運送該等複數半導體元件。 The system of claim 1, further comprising: a conveyor mechanism configured to sequentially transport the plurality of semiconductor components to the rotating semiconductor component processing mechanism, or to rotate the semiconductor component The processing mechanism sequentially transports the plurality of semiconductor elements. 如申請專利範圍第9項所述之系統,其更包括:一可編程控制器,用於控制該旋轉半導體元件處理機構的旋轉移位、及取放機構群組的操作之至少一者。 The system of claim 9, further comprising: a programmable controller for controlling at least one of a rotational shift of the rotating semiconductor component processing mechanism and an operation of the pick and place mechanism group. 如申請專利範圍第1項所述之系統,其中該旋轉半導體元件處理機構被組態成將該等複數半導體元件依次卸載至該第一元件載體,或是用於當該第一元件載體位於該第一位置時接收來自該第一元件載體的該等複數半導體元件,而該取放機構群組包括複數個尖頭,其組態成可同時移向該第一元件載體,促成從當該第一元件載體位 於該第二位置時,位於該等收受器與該封裝構件的該等複數槽之間的該第一元件載體整個運送複數個半導體元件。 The system of claim 1, wherein the rotating semiconductor component processing mechanism is configured to sequentially unload the plurality of semiconductor components to the first component carrier, or for when the first component carrier is located The first location receives the plurality of semiconductor components from the first component carrier, and the pick and place mechanism group includes a plurality of prongs configured to simultaneously move toward the first component carrier, facilitating One component carrier In the second position, the first component carrier between the receivers and the plurality of slots of the package member carries a plurality of semiconductor components. 如申請專利範圍第1項所述之系統,其中該元件載體每一者的複數個收受器彼此間距相同,且該等複數半導體元件的每一者為半導體晶粒或積體電路(IC)。 The system of claim 1, wherein the plurality of receivers of the component carrier are spaced apart from each other, and each of the plurality of semiconductor components is a semiconductor die or an integrated circuit (IC). 如申請專利範圍第1項所述之系統,其中該等複數個尖頭係以線性組態配置,其間距係至少實質等於該元件載體每一者的該等複數個收受器的間距。 The system of claim 1, wherein the plurality of pointed ends are configured in a linear configuration, the spacing being at least substantially equal to the spacing of the plurality of receivers of each of the component carriers. 如申請專利範圍第1項所述之系統,其中該等複數個尖頭可同時移位,以達成複數個半導體元件從該元件載體每一者運送至該封裝構件。 The system of claim 1, wherein the plurality of prongs are simultaneously displaceable to achieve a plurality of semiconductor components being transported from the component carrier to the package member. 如申請專利範圍第14項所述之系統,其中該封裝構件為一盤型封裝構件。 The system of claim 14, wherein the package member is a disk type package member. 如申請專利範圍第15項所述之系統,其中該盤型封裝構件包括其上形成的複數個槽,該盤型封裝構件的複數個槽的間距係對應該元件載體每一者的該等複數個收受器的間距。 The system of claim 15 wherein the disk-type package member comprises a plurality of grooves formed thereon, the plurality of grooves of the disk-type package member having a pitch corresponding to each of the component carriers The spacing of the receivers. 如申請專利範圍第1項所述之系統,其中該移動機構更組態成以與該元件載體的該等複數收受器間的該間距相等的距離,將一元件載體放置於該第一位置,其中,該元件載體的該等複數收受器是位於該旋轉元件處理機構與該元件載體之間,而該等複數收受器是與一半導體元件相關。 The system of claim 1, wherein the moving mechanism is further configured to place a component carrier in the first position at a distance equal to the spacing between the plurality of receivers of the component carrier, Wherein the plurality of receivers of the component carrier are located between the rotating component processing mechanism and the component carrier, and the plurality of receivers are associated with a semiconductor component. 一種用以運送元件的系統,其包括: 一第一元件封裝構件,其包含複數個槽,該等複數元件是在該等複數元件與複數個處理站之間運送時位於該等槽之中或之上,或是在該等複數元件製造完成後的分發過程中位於該等槽之中或之上;一第二元件封裝構件,其包含複數個槽,該等複數元件是在該等複數元件與複數個處理站之間運送時位於該等槽之中或之上,或是在該等複數元件製造完成後的分發過程中位於該等槽之中或之上,其中,該第二元件封裝構件不同於該第一元件封裝構件;複數個元件載體,其包括第一元件載體和第二元件載體,第一元件載體和第二元件載體的每一者可於該第一位置與該第二位置之間移位,且第一元件載體和第二元件載體的每一者是組態成用於在複數個收受器中承載該等複數元件,該等複數收受器是形成於第一元件載體和第二元件載體每一者的頂部表面且彼此以一間距分隔;一取放機構群組,其組態成用於該第一元件載體和該第二元件載體之每一者與第一元件封裝構件和第二元件封裝構件之一者間的同時運送元件;一旋轉元件處理機構,其組態上用以(a)依次拾取在該旋轉元件處理機構的該吸取位置的半導體元件,同時或平行地(b)在該旋轉元件處理機構的該卸載位置依次卸載半導體元件,該旋轉元件處理機構進一步組態為在該輸送器機構和第一元件封裝構件與第二元件封裝構件之中的另一個之間依次運送半導體元件;及一移動機構,其組態為用於對該第一元件載體和該第二 元件載體進行協調循環移位,以令該第一元件載體和該第二元件載體之中的每一者可在該第一位置與該第二位置之間移位,使得在該第一位置的元件可依次的該元件載體與該旋轉元件處理裝置之間運送,而在該第二位置的元件亦可共同地在該元件載體與取放機構群組之間運送。 A system for transporting components, comprising: a first component package member comprising a plurality of slots, the plurality of components being located in or on the slots when transported between the plurality of components and the plurality of processing stations, or in the manufacture of the plurality of components The finished component is located in or on the slots; a second component package member includes a plurality of slots, the plurality of components being located when the plurality of components are transported between the plurality of processing stations In or on the grooves, or in or after the dispensing of the plurality of components, wherein the second component package member is different from the first component package member; a component carrier comprising a first component carrier and a second component carrier, each of the first component carrier and the second component carrier being displaceable between the first position and the second position, and the first component carrier And each of the second component carriers is configured to carry the plurality of receptacles in a plurality of receptacles, the plurality of receptacles being formed on a top surface of each of the first component carrier and the second component carrier And each other a spacing separation; a group of pick and place mechanisms configured for simultaneous use of each of the first component carrier and the second component carrier with one of the first component package component and the second component package component a transporting element; a rotating element processing mechanism configured to (a) sequentially pick up a semiconductor component at the picking position of the rotating component processing mechanism, simultaneously or in parallel (b) at the unloading of the rotating component processing mechanism Position sequentially unloading the semiconductor component, the rotary component processing mechanism further configured to sequentially transport the semiconductor component between the conveyor mechanism and the other of the first component package component and the second component package component; and a moving mechanism Configured for the first component carrier and the second The component carrier is coordinated to cyclically shift such that each of the first component carrier and the second component carrier is displaceable between the first position and the second position such that in the first position The components may be transported between the component carrier and the rotary component processing device in sequence, and the components in the second location may also be transported collectively between the component carrier and the pick and place mechanism. 如申請專利範圍第18項所述之系統,其中該移動機構被組態成循環地設置:(a)在該旋轉元件處理機構與該第一元件載體進行元件運送時該第一元件載體會位於該第一位置,同時該第二元件載體會位於(i)該第二位置,其是當該取放機構群組在該第二元件載體與該第一封裝構件及該第二封裝構件其中之一者進行元件群組運送時,隨後會位於(ii)該第一元件載體之下的預備位置,其是當該第二元件載體保持等待,直到該旋轉元件處理裝置和該第一元件載體之間的元件運送完成;及(b)在該旋轉元件處理機構與該第二元件載體進行元件運送時該第二元件載體會位於該第一位置,同時該第一元件載體會位於:(i)該第二位置,其是當該取放機構群組在該第一元件載體與該第一封裝構件及該第二封裝構件其中之一者進行元件群組運送時,隨後會位於(ii)該第二元件載體之下的預備位置,其是當該第一元件載體保持等待,直到該旋轉元件處理裝置和該第二元件載體之間的元件運送完成。 The system of claim 18, wherein the moving mechanism is configured to be cyclically disposed: (a) the first component carrier is located when the rotating component processing mechanism and the first component carrier are transported by the component The first position, and the second component carrier is located at (i) the second position, when the pick-and-place mechanism is in the second component carrier and the first package member and the second package member When the component group is transported, it is then located at (ii) a preliminary position below the first component carrier, when the second component carrier remains waiting until the rotating component processing device and the first component carrier The inter-component transport is completed; and (b) the second component carrier is located in the first position when the rotating component processing mechanism and the second component carrier are transported, and the first component carrier is located at: (i) The second position is when the pick-and-place mechanism group carries the component group in the first component carrier and one of the first package member and the second package member, and then is located at (ii) Second component carrier The lower preparatory position is when the first component carrier remains waiting until the component transport between the rotary component processing device and the second component carrier is completed. 如申請專利範圍第18項所述之系統,其中該取放機構包括複數個拾取尖頭,其移位有助及達成第一和第二元件載體之每一者與第一元件封裝構件和第二元件封裝構件之一者間的同時運送元件。 The system of claim 18, wherein the pick and place mechanism comprises a plurality of pick-up tips, the shifting of which assists in achieving each of the first and second component carriers and the first component package member and A simultaneous transport element between one of the two component package members. 如申請專利範圍第20項所述之系統,其中該等第一和第二元件載體中之每一者的該等複數個收受器係以一致性間距組態予以配置。 The system of claim 20, wherein the plurality of receivers of each of the first and second component carriers are configured in a consistent spacing configuration. 如申請專利範圍第21項所述之系統,其中該等複數個尖頭配置間距係至少實質等於第一和第二元件載體之每一者的複數個收受器的間距。 The system of claim 21, wherein the plurality of pointed configuration spacings are at least substantially equal to the spacing of the plurality of receivers of each of the first and second component carriers. 如申請專利範圍第18項所述之系統,其中該旋轉半導體元件處理機構包括複數個拾取頭,該等複數拾取頭組態成用於在該吸取位置與該卸載位置之間依次承載複數個元件。 The system of claim 18, wherein the rotating semiconductor component processing mechanism comprises a plurality of pick-up heads configured to sequentially carry a plurality of components between the pick-up position and the unloading position . 一種用於運送半導體元件的系統,其包括:一可旋轉的旋轉臺結構,其包括複數個旋轉頭,該等旋轉頭可沿著預定行進路徑旋轉移位以及組態成在旋轉臺結構的該吸取位置依次接收半導體元件,複數個旋轉頭之每一者係組態成在該吸取位置接收複數個半導體元件之一,並透過複數處理站將接收後的半導體元件運送至該卸載位置;一輸送器機構,組態成依次承載半導體元件,以及組態成在吸取位置或卸載位置與該旋轉臺結構進行半導體元件運送;一第一元件載體,組態為承載複數個收受器的複數個半導體元件,該等複數收受器彼此以一間距分隔並形成於該第 一元件載體的頂部表面,該第一元件載體可於第一位置與第二位置之間移位,該第一元件載體係組態成當配位在第一位置時與該旋轉臺結構依次進行元件運送,藉此在對應第一複數個旋轉頭與該第一元件載體之間運送複數個半導體元件的第一部分,其中,該等複數元件的第一部分包含多個元件;及一第一取放機構群組,其組態成當該第一元件載體配置在第二位置時,在該第一元件載體與該第一封裝構件之間共同運送複數個半導體元件的第一部分,其中,該第一封裝構件包含有複數個槽,該半導體元件是在該半導體元件與複數個處理站之間運送時位於該等槽之中或之上,或是在該半導體元件製造完成後的分發過程中位於該等槽之中或之上;一第二取放機構群組,其組態成在該輸送器裝置以及該第二封裝構件之間共同運送半導體元件,該第二封裝構件與該第一封裝構件不同,且該第二封裝構件包含多個槽,而該半導體元件是在該半導體元件與複數個處理站之間運送時位於該等槽之中或之上,或是在該半導體元件製造完成後的分發過程中位於該等槽之中或之上其中,該等半導體元件為半導體晶粒或積體電路(IC)。 A system for transporting a semiconductor component, comprising: a rotatable rotary table structure including a plurality of rotary heads, the rotary heads being rotationally displaceable along a predetermined travel path and configured to be in the rotary table structure The picking position sequentially receives the semiconductor component, each of the plurality of rotating heads configured to receive one of the plurality of semiconductor components at the picking position, and transport the received semiconductor component to the unloading position through the plurality of processing stations; And a device configured to sequentially carry the semiconductor component and configured to carry the semiconductor component transport with the rotary table structure at the pick-up or unloading position; a first component carrier configured to carry a plurality of semiconductor components carrying a plurality of receivers The plurality of receivers are separated from each other by a pitch and formed in the first a top surface of the component carrier, the first component carrier being displaceable between a first position and a second position, the first component carrier being configured to sequentially perform with the rotary table structure when coordinated in the first position Transporting the component, thereby transporting a first portion of the plurality of semiconductor components between the first plurality of rotating heads and the first component carrier, wherein the first portion of the plurality of components comprises a plurality of components; and a first pick and place a group of mechanisms configured to collectively transport a first portion of the plurality of semiconductor components between the first component carrier and the first package component when the first component carrier is disposed in the second position, wherein the first The package member includes a plurality of slots, the semiconductor component being located in or on the slots when the semiconductor component is transported between the plurality of processing stations, or located in the distribution process after the semiconductor component is manufactured In or on an equal groove; a second pick-and-place mechanism group configured to collectively transport a semiconductor component between the conveyor device and the second package member, the second package member The first package member is different, and the second package member includes a plurality of slots, and the semiconductor component is located in or on the slots when the semiconductor component is transported between the plurality of processing stations, or The semiconductor component is in or on the trenches after the fabrication of the semiconductor component is completed, and the semiconductor components are semiconductor dies or integrated circuits (ICs). 如申請專利範圍第24項所述之系統,其更包括一第二元件載體,該第二元件載體包含複數個彼此以該間距分隔並形成於該第二元件載體頂部表面的收受器,該第二元件載體可於第一位置和第二位置間移位,該第二元件載體組態成當配置在第一位置時與該旋轉臺結構依次進行元件運送,藉此於一對應第二複數個旋轉頭以及該第 二元件載體之間運送複數個半導體元件的第二部分,其中,該等複數元件的該第二部分包含複數半導體元件,其中該第一取放機構群組組態成當該第二元件載體配置在第二位置時,在該第二元件載體與該第一封裝構件之間共同運送複數個半導體元件的第二部分。 The system of claim 24, further comprising a second component carrier, the second component carrier comprising a plurality of receivers spaced apart from each other and formed on a top surface of the second component carrier, the The two component carrier is slidable between a first position and a second position, the second component carrier being configured to sequentially perform component transport with the rotary table structure when configured in the first position, thereby corresponding to the second plurality Rotating head and the first Transporting a second portion of the plurality of semiconductor components between the two component carriers, wherein the second portion of the plurality of components comprises a plurality of semiconductor components, wherein the first pick and place mechanism is configured to be configured when the second component carrier is configured In the second position, the second portion of the plurality of semiconductor elements is commonly carried between the second component carrier and the first package member. 如申請專利範圍第25項所述之系統,其更包含了一移動機構,該移動機構組態上是用於該第一元件載體和該第二元件載體在該第一位置和該第二位置間的協調循環移位。 The system of claim 25, further comprising a moving mechanism configured to use the first component carrier and the second component carrier in the first position and the second position Coordinated cyclic shift between. 如申請專利範圍第26項所述之系統,其中該第一和第二元件載體的操作係以獨立方式,分別地與該旋轉臺結構的第一和第二部分運送複數個半導體元件。 The system of claim 26, wherein the operation of the first and second component carriers transports the plurality of semiconductor components separately from the first and second portions of the rotary table structure in an independent manner. 一種用於運送複數個半導體元件之方法,該方法包括:複數個半導體元件從一旋轉半導體元件處理機構連續運送至一元件載體;從該等複數個元件載體整個取回半導體元件;及複數個半導體元件從該元件載體整個運送至一封裝構件。 A method for transporting a plurality of semiconductor components, the method comprising: continuously transporting a plurality of semiconductor components from a rotating semiconductor component processing mechanism to a component carrier; retrieving the semiconductor components from the plurality of component carriers; and a plurality of semiconductors The component is transported from the component carrier to a package member. 如申請專利範圍第28項所述之方法,其中該從元件載體整個取回複數個半導體元件包括移位一取放機構,以從該元件載體整個拾取複數個半導體元件。 The method of claim 28, wherein the recovering the plurality of semiconductor elements from the component carrier comprises shifting a pick-and-place mechanism to pick up a plurality of semiconductor components from the component carrier. 如申請專利範圍第29項所述之方法,其中該旋轉半導體元件處理機構包括複數個頭,以載運複數個半導體元件,而且其中複數個半導體元件從該旋轉半導體元件處理機構連續運送至元件載體包括沿著預定行進路徑旋轉 移位複數個頭之每一者,藉此旋轉移位藉此沿著預定行進路徑載運的半導體元件。 The method of claim 29, wherein the rotating semiconductor component processing mechanism comprises a plurality of heads for carrying a plurality of semiconductor components, and wherein a plurality of semiconductor components are continuously transported from the rotating semiconductor component processing mechanism to the component carrier. Scheduled travel path rotation Each of the plurality of heads is shifted, thereby rotating the semiconductor elements carried by the displacement along the predetermined travel path. 如申請專利範圍第30項所述之方法,其中該等複數個頭之每一者可垂直移位,用於促成及達成藉此載運的半導體元件運送至元件載體。 The method of claim 30, wherein each of the plurality of heads is vertically displaceable for facilitating and achieving transport of the semiconductor component carried thereby to the component carrier. 如申請專利範圍第31項所述之方法,其更包括:沿著預定行進路徑的旋轉移位期間,處理複數個半導體元件。 The method of claim 31, further comprising processing a plurality of semiconductor components during a rotational shift along a predetermined travel path. 如申請專利範圍第32項所述之方法,其中該處理複數個半導體元件包括:沿著預定行進路徑的旋轉移位期間,至少檢測及測試複數個半導體元件。 The method of claim 32, wherein the processing the plurality of semiconductor components comprises: detecting and testing at least a plurality of semiconductor components during a rotational shift along a predetermined travel path. 如申請專利範圍第31項所述之方法,其中該取放機構包括複數個拾取尖頭,其組態成從該元件載體拾起複數個半導體元件。 The method of claim 31, wherein the pick and place mechanism comprises a plurality of pick-up tips configured to pick up a plurality of semiconductor components from the component carrier. 如申請專利範圍第34項所述之方法,其更包括使複數個拾取尖頭移向至該元件載體,藉此促成及達成從該元件載體整個拾取複數個半導體元件。 The method of claim 34, further comprising moving the plurality of pick-up tips toward the component carrier, thereby facilitating and achieving the picking of the plurality of semiconductor components from the component carrier. 如申請專利範圍第35項所述之方法,其更包括同時移位複數個拾取尖頭,供複數個半導體元件從該元件載體整個運送至封裝構件。 The method of claim 35, further comprising simultaneously shifting a plurality of pick-up tips for transporting the plurality of semiconductor components from the component carrier to the package member. 如申請專利範圍第34項所述之方法,其中該等取放機構的複數個拾取尖頭係以一致性間距組態予以配置。 The method of claim 34, wherein the plurality of pick-up tips of the pick-and-place mechanisms are configured in a consistent pitch configuration. 如申請專利範圍第34項所述之方法,該元件載體包括複數個收受器,其組態成接收複數個半導體元件,其中 該元件載體的複數個收受器與該取放機構的複數個拾取尖頭具有一致的間膈組態。 The method of claim 34, the component carrier comprising a plurality of receivers configured to receive a plurality of semiconductor components, wherein The plurality of receivers of the component carrier have a uniform configuration with the plurality of pick-up tips of the pick-and-place mechanism. 如申請專利範圍第34項所述之方法,其中該封裝構件為一盤型封裝構件,包括其上形成的複數個收受槽,而且其中該等複數個收受槽的間距係與該元件載體的複數個收受器、與該取放機構的複數個拾取尖端之每一者的間距一致。 The method of claim 34, wherein the package member is a disk-type package member, comprising a plurality of receiving grooves formed thereon, and wherein the plurality of receiving grooves are spaced apart from the plurality of component carriers The receivers have the same spacing as each of the plurality of pick-up tips of the pick-and-place mechanism. 如申請專利範圍第38項所述之方法,其更包括該移位元件載體一間距,其係等於複數個半導體元件之每一連續半導體元件從該旋轉半導體元件處理機構運送至元件載體之間的複數個收受器間的間距。 The method of claim 38, further comprising a spacing of the displacement element carrier, which is equal to each of the plurality of semiconductor elements being transported from the rotating semiconductor element processing mechanism to the component carrier. The spacing between multiple receivers. 如申請專利範圍第38項所述之方法,其更包括:該元件載體從一輸入位置(其中,該元件載體位於輸入位置時,複數個半導體元件由元件載體的複數個收受器從該旋轉半導體元件處理機構連續收受)移位至一輸出位置(其中,該元件載體位於輸出位置時,該元件載體載送的複數個半導體元件是由該取放機構的複數個拾取尖頭整個拾取)。 The method of claim 38, further comprising: the component carrier is from an input location (wherein the component carrier is at the input location, the plurality of semiconductor components are received by the plurality of receivers of the component carrier from the rotating semiconductor The component processing mechanism is continuously received and shifted to an output position (wherein the component carrier is carried by the plurality of pick-up tips of the pick-and-place mechanism when the component carrier is at the output position). 如申請專利範圍第41項所述之方法,其更包括:耦合一可編程控制器至該旋轉半導體元件處理機構、該元件載體、與該取放機構之至少一者,用於控制該旋轉半導體元件處理機構的旋轉移位、該元件載體的旋轉移位、與該取放機構的操作之至少一者。 The method of claim 41, further comprising: coupling a programmable controller to the rotating semiconductor component processing mechanism, the component carrier, and at least one of the pick and place mechanism for controlling the rotating semiconductor At least one of a rotational displacement of the component processing mechanism, a rotational displacement of the component carrier, and an operation of the pick and place mechanism. 一種用於運送複數個元件之方法,該方法包括:元件從一輸入封裝構件運送至一旋轉元件處理機構的一輸入位置,其中,該輸入封裝構件包含複數個槽,該等複 數元件是在該等複數元件與複數個處理站之間運送時位於該等複數槽之中或之上,或是在該等複數元件製造完成後的分發過程中位於該等複數槽之中或之上;沿著該旋轉元件處理機構該的輸入位置與一卸載位置間的旋轉行進路徑運送元件;及同時或平行地將元件從該輸入封裝構件運送至該旋轉元件處理機構的該輸入位置,將元件從該卸載位置運送至一輸出封裝構件,該輸出封裝構件包含有複數個槽,複數個元件是在該等複數元件與複數個處理站之間運送時位於該等複數槽之中或之上,或是在該等複數元件製造完成後的分發過程中位於該等複數槽之中或之上,其中運送元件至該旋轉元件處理機構的輸入位置、及從卸載位置運送元件至輸出封裝構件之一包括:在該旋轉元件處理機構與複數個元件收受器之間連續運送元件,其中,該等複數元件收受器是形成於一可移動第一元件載體的頂部表面;及在該第一元件載體、與該輸入封裝構件和該輸出封裝構件之一著之間整個運送元件。 A method for transporting a plurality of components, the method comprising: transporting an component from an input package member to an input position of a rotary component processing mechanism, wherein the input package member comprises a plurality of slots, the The plurality of components are located in or on the plurality of slots when transported between the plurality of components and the plurality of processing stations, or are located in the plurality of slots during distribution of the plurality of components or after the plurality of components are manufactured or a transport path transporting element along the rotational travel path between the input position and an unloading position of the rotary element processing mechanism; and transporting the component from the input package member to the input position of the rotary element processing mechanism simultaneously or in parallel, Transporting the component from the unloading position to an output package member, the output package member including a plurality of slots, the plurality of components being located in the plurality of slots when transported between the plurality of components and the plurality of processing stations Or in or among the plurality of slots during the dispensing process after the plurality of components are manufactured, wherein the transporting member to the input position of the rotating member processing mechanism and the transporting member from the unloading position to the output package member One of the following includes: continuously transporting components between the rotating element processing mechanism and a plurality of component receivers, wherein the plurality of component receivers are To first movable member in a top surface of the carrier; and to the first support element, between the input member and one of the package of the output member and the entire package conveying element. 如申請專利範圍第43項所述之方法,其更包括在輸入位置和卸載位置之間運送複數個元件期間,在沿著旋轉行進路徑的特別位置上處理元件。 The method of claim 43, further comprising processing the component at a particular location along the rotational travel path during transport of the plurality of components between the input location and the unloading location. 如申請專利範圍第43項所述之方法,其中該運送元件至旋轉元件處理機構的輸入位置、及該從卸載位置運送元件至輸出封裝構件之一係包括: 在該旋轉元件處理機構與複數個元件收受器之間連續運送元件,其中,該等複數元件收受器是形成於一可移動第二元件載體的頂部表面;及在該第二元件載體的該等複數元件收受器與該輸入封裝構件與該輸出封裝構件之一者間整個運送元件。 The method of claim 43, wherein the input position of the transport element to the rotary element processing mechanism, and the transporting element from the unloading position to the output package member comprises: Continuingly transporting elements between the rotating element processing mechanism and a plurality of component receivers, wherein the plurality of component receivers are formed on a top surface of a movable second component carrier; and in the second component carrier The plurality of component receptacles and the entire transport component between the input package member and one of the output package members. 如申請專利範圍第45項所述之方法,其中該連續運送元件及整個運送元件包括以有關第二元件載體之協調循環方式移位第一元件載體。 The method of claim 45, wherein the continuous transport element and the entire transport element comprise the first element carrier displaced in a coordinated cyclic manner with respect to the second element carrier. 如申請專利範圍第45項所述之方法,其中該在元件載體與輸入封裝構件和輸出封裝構件之一著之間整個運送元件包括利用一取放機構群組同時載送多個元件。 The method of claim 45, wherein the entire transport element between the component carrier and one of the input package member and the output package member comprises simultaneously carrying the plurality of components using a pick and place mechanism group. 如申請專利範圍第47項所述之方法,其中該取放機構群組包括複數個拾取頭,其可移位,藉此促成及達成在元件載體與輸入封裝構件和輸出封裝構件之一者之間同時運送元件。 The method of claim 47, wherein the pick-and-place mechanism group comprises a plurality of pick-up heads that are displaceable, thereby facilitating and achieving one of the component carrier and the input package member and the output package member Transport components simultaneously. 如申請專利範圍第48項所述之方法,其中該等複數個拾取尖頭具有一致性間距組態。 The method of claim 48, wherein the plurality of pick-up tips have a consistent spacing configuration. 如申請專利範圍第49項所述之方法,其中相較於複數個拾取尖頭,該等第一和第二元件載體之每一者的複數個收受器具有一實質相等間距組態。 The method of claim 49, wherein the plurality of receivers of each of the first and second component carriers have a substantially equal spacing configuration as compared to the plurality of picking tips.
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