TWI544209B - Solar cell related sample determination system - Google Patents
Solar cell related sample determination system Download PDFInfo
- Publication number
- TWI544209B TWI544209B TW101134036A TW101134036A TWI544209B TW I544209 B TWI544209 B TW I544209B TW 101134036 A TW101134036 A TW 101134036A TW 101134036 A TW101134036 A TW 101134036A TW I544209 B TWI544209 B TW I544209B
- Authority
- TW
- Taiwan
- Prior art keywords
- sample
- light
- measurement
- unit
- measured
- Prior art date
Links
- 238000005259 measurement Methods 0.000 claims description 219
- 238000005424 photoluminescence Methods 0.000 claims description 156
- 230000003287 optical effect Effects 0.000 claims description 87
- 230000005284 excitation Effects 0.000 claims description 52
- 238000001228 spectrum Methods 0.000 claims description 27
- 238000000034 method Methods 0.000 claims description 17
- 238000003384 imaging method Methods 0.000 claims description 15
- 239000000523 sample Substances 0.000 description 186
- 238000001514 detection method Methods 0.000 description 17
- 238000006243 chemical reaction Methods 0.000 description 13
- 238000005286 illumination Methods 0.000 description 10
- 239000000463 material Substances 0.000 description 8
- 238000011156 evaluation Methods 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 4
- 238000004020 luminiscence type Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000628 photoluminescence spectroscopy Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- 230000002596 correlated effect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000007422 luminescence assay Methods 0.000 description 1
- 238000001748 luminescence spectrum Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6489—Photoluminescence of semiconductors
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Photovoltaic Devices (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011241006A JP5848583B2 (ja) | 2011-11-02 | 2011-11-02 | 太陽電池関連試料測定システム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201319548A TW201319548A (zh) | 2013-05-16 |
| TWI544209B true TWI544209B (zh) | 2016-08-01 |
Family
ID=48191757
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101134036A TWI544209B (zh) | 2011-11-02 | 2012-09-17 | Solar cell related sample determination system |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP5848583B2 (ja) |
| TW (1) | TWI544209B (ja) |
| WO (1) | WO2013065398A1 (ja) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6104112B2 (ja) * | 2013-09-18 | 2017-03-29 | 株式会社アイテス | 太陽電池検査装置、及び太陽電池検査方法 |
| JP6565112B2 (ja) * | 2015-02-13 | 2019-08-28 | 国立研究開発法人産業技術総合研究所 | 太陽電池の評価方法及び評価装置 |
| CN106198407B (zh) * | 2016-07-07 | 2019-03-22 | 中国科学院半导体研究所 | 一种样品空间扫描及定位装置 |
| JP6411683B1 (ja) * | 2017-10-16 | 2018-10-24 | 株式会社デンケン | 太陽電池検査装置及びカメラ付きソーラーシミュレータ |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5148073B2 (ja) * | 2005-06-17 | 2013-02-20 | 日清紡ホールディングス株式会社 | ソーラシミュレータによる測定方法 |
| ES2659781T3 (es) * | 2005-10-11 | 2018-03-19 | Bt Imaging Pty Limited | Método y sistema para inspeccionar una estructura semiconductora de salto de banda indirecto |
| US7847237B2 (en) * | 2006-05-02 | 2010-12-07 | National University Corporation Nara | Method and apparatus for testing and evaluating performance of a solar cell |
| JP2010278192A (ja) * | 2009-05-28 | 2010-12-09 | Lasertec Corp | 太陽電池評価装置 |
-
2011
- 2011-11-02 JP JP2011241006A patent/JP5848583B2/ja active Active
-
2012
- 2012-09-06 WO PCT/JP2012/072763 patent/WO2013065398A1/ja active Application Filing
- 2012-09-17 TW TW101134036A patent/TWI544209B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| TW201319548A (zh) | 2013-05-16 |
| JP2013098407A (ja) | 2013-05-20 |
| JP5848583B2 (ja) | 2016-01-27 |
| WO2013065398A1 (ja) | 2013-05-10 |
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