TWI494570B - - Google Patents

Info

Publication number
TWI494570B
TWI494570B TW102127240A TW102127240A TWI494570B TW I494570 B TWI494570 B TW I494570B TW 102127240 A TW102127240 A TW 102127240A TW 102127240 A TW102127240 A TW 102127240A TW I494570 B TWI494570 B TW I494570B
Authority
TW
Taiwan
Application number
TW102127240A
Other versions
TW201346272A (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW102127240A priority Critical patent/TW201346272A/zh
Publication of TW201346272A publication Critical patent/TW201346272A/zh
Priority to CN201410051772.8A priority patent/CN103777045A/zh
Application granted granted Critical
Publication of TWI494570B publication Critical patent/TWI494570B/zh

Links

TW102127240A 2013-07-30 2013-07-30 組裝式探針卡 TW201346272A (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW102127240A TW201346272A (zh) 2013-07-30 2013-07-30 組裝式探針卡
CN201410051772.8A CN103777045A (zh) 2013-07-30 2014-02-14 组装式探针卡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW102127240A TW201346272A (zh) 2013-07-30 2013-07-30 組裝式探針卡

Publications (2)

Publication Number Publication Date
TW201346272A TW201346272A (zh) 2013-11-16
TWI494570B true TWI494570B (zh) 2015-08-01

Family

ID=49990648

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102127240A TW201346272A (zh) 2013-07-30 2013-07-30 組裝式探針卡

Country Status (2)

Country Link
CN (1) CN103777045A (zh)
TW (1) TW201346272A (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108107243B (zh) * 2017-12-26 2020-10-13 深圳市道格特科技有限公司 快速拆装探针卡
CN110196344B (zh) * 2018-02-26 2021-06-11 中华精测科技股份有限公司 探针组件
CN111103444A (zh) * 2018-10-29 2020-05-05 三赢科技（深圳）有限公司 检测装置
CN110531126A (zh) * 2019-10-09 2019-12-03 严日东 一种紧固组装式垂直探针卡
CN110646649A (zh) * 2019-10-30 2020-01-03 上海华虹宏力半导体制造有限公司 分立器件测试方法
TWI797004B (zh) * 2022-04-29 2023-03-21 中華精測科技股份有限公司 懸臂式探針卡及其承載座

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW533309B (en) * 1999-06-22 2003-05-21 Nihon Micronics Kk Probe device
TWM410978U (en) * 2011-03-31 2011-09-01 Chipbond Technology Corp Wafer Tester mechanism and Probe Combining seat

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010216991A (ja) * 2009-03-17 2010-09-30 Japan Electronic Materials Corp プローブカード
JP2011002408A (ja) * 2009-06-22 2011-01-06 Japan Electronic Materials Corp プローブカード
JP2011117761A (ja) * 2009-12-01 2011-06-16 Japan Electronic Materials Corp プローブカードおよびプローブカードの製造方法
CN201716496U (zh) * 2010-07-28 2011-01-19 船齐股份有限公司 液晶面板检查用的探针装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW533309B (en) * 1999-06-22 2003-05-21 Nihon Micronics Kk Probe device
TWM410978U (en) * 2011-03-31 2011-09-01 Chipbond Technology Corp Wafer Tester mechanism and Probe Combining seat

Also Published As

Publication number Publication date
CN103777045A (zh) 2014-05-07
TW201346272A (zh) 2013-11-16

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