TWI489568B - 形成用於引線回路和導電凸塊的引線接合的方法 - Google Patents

形成用於引線回路和導電凸塊的引線接合的方法 Download PDF

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Publication number
TWI489568B
TWI489568B TW100134754A TW100134754A TWI489568B TW I489568 B TWI489568 B TW I489568B TW 100134754 A TW100134754 A TW 100134754A TW 100134754 A TW100134754 A TW 100134754A TW I489568 B TWI489568 B TW I489568B
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Taiwan
Prior art keywords
bonding
wire
forming
control value
algorithm
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TW100134754A
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English (en)
Chinese (zh)
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TW201214591A (en
Inventor
W 秦
J W 布倫納
P A 里德
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庫利克和索夫工業公司
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    • HELECTRICITY
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    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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    • H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Wire Bonding (AREA)
TW100134754A 2010-09-27 2011-09-27 形成用於引線回路和導電凸塊的引線接合的方法 TWI489568B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US38670110P 2010-09-27 2010-09-27

Publications (2)

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TW201214591A TW201214591A (en) 2012-04-01
TWI489568B true TWI489568B (zh) 2015-06-21

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TW100134754A TWI489568B (zh) 2010-09-27 2011-09-27 形成用於引線回路和導電凸塊的引線接合的方法

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Country Link
US (1) US20120074206A1 (OSRAM)
JP (1) JP6029269B2 (OSRAM)
KR (1) KR101254218B1 (OSRAM)
CN (1) CN102420150B (OSRAM)
SG (1) SG179389A1 (OSRAM)
TW (1) TWI489568B (OSRAM)

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US8899469B2 (en) * 2013-03-04 2014-12-02 Kulicke And Soffa Industries, Inc. Automatic rework processes for non-stick conditions in wire bonding operations
US9093515B2 (en) * 2013-07-17 2015-07-28 Freescale Semiconductor, Inc. Wire bonding capillary with working tip protrusion
US9257403B2 (en) * 2013-11-26 2016-02-09 Freescale Semiconductor, Inc. Copper ball bond interface structure and formation
US20150194395A1 (en) * 2014-01-03 2015-07-09 Sohrab Safai Bond pad having a trench and method for forming
US9889521B2 (en) * 2014-12-02 2018-02-13 Asm Technology Singapore Pte Ltd Method and system for pull testing of wire bonds
JP6445943B2 (ja) * 2015-08-24 2018-12-26 東芝メモリ株式会社 半導体装置の測定方法
US10121759B2 (en) * 2015-11-04 2018-11-06 Kulicke And Soffa Industries, Inc. On-bonder automatic overhang die optimization tool for wire bonding and related methods
CN105760591B (zh) * 2016-02-04 2019-01-25 广州兴森快捷电路科技有限公司 封装基板键合引线的邦定方法
US10325878B2 (en) 2016-06-30 2019-06-18 Kulicke And Soffa Industries, Inc. Methods for generating wire loop profiles for wire loops, and methods for checking for adequate clearance between adjacent wire loops
CN110391129B (zh) * 2018-04-20 2020-10-02 岛津分析技术研发(上海)有限公司 离子化装置、质谱仪、离子迁移谱仪及离子化方法
EP3603826B1 (en) * 2018-07-31 2023-05-10 Infineon Technologies AG Method for calibrating an ultrasonic bonding machine
TWI895537B (zh) 2020-11-05 2025-09-01 美商庫利克和索夫工業公司 引線接合機的操作方法,包括監視引線接合機上的接合力的精確度的方法,以及其相關方法
WO2023158625A1 (en) 2022-02-15 2023-08-24 Kulicke And Soffa Industries, Inc. Methods of determining a sequence for creating a plurality of wire loops in connection with a workpiece

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CN102420150B (zh) 2016-12-07
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US20120074206A1 (en) 2012-03-29
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