TWI465166B - Method and apparatus for reducing stress of printed circuit board - Google Patents

Method and apparatus for reducing stress of printed circuit board Download PDF

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TWI465166B
TWI465166B TW102106249A TW102106249A TWI465166B TW I465166 B TWI465166 B TW I465166B TW 102106249 A TW102106249 A TW 102106249A TW 102106249 A TW102106249 A TW 102106249A TW I465166 B TWI465166 B TW I465166B
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temperature
relief device
stress relief
stress
circuit board
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TW201429341A (en
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Yao Long Wem
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Shanghai Zhuo Kai Electronic Technology Co Ltd
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電路板的去應力方法及電路板的去應力設備Circuit board stress reduction method and circuit board stress relief device

本發明涉及電路板技術領域,尤其涉及電路板的去應力方法及電路板的去應力設備。The present invention relates to the field of circuit board technology, and in particular, to a method for stress reduction of a circuit board and a stress relief device for the circuit board.

目前,隨著市場對消費性電子產品(包括手機、筆記型電腦、數位相機、遊戲機等)需求的大幅度提高,電子產品的印刷電路板(Printed Circuit Board,PCB)也向輕薄短小、高頻及多功能的方向發展。基板是製造印刷電路板的基本材料,通常情況下,基板採用的是覆銅箔層壓板,它是用增強材料(Reinforcement Material)浸以樹脂膠黏劑,通過烘乾、裁剪、固化等製程,再疊合成坯料,然後覆上銅箔,用鋼板作為模具,在熱壓機中經高溫高壓成形加工而製成的。At present, with the market demand for consumer electronic products (including mobile phones, notebook computers, digital cameras, game consoles, etc.), the printed circuit boards (PCBs) of electronic products are also thin, light and high. Frequency and multi-functional development. The substrate is the basic material for manufacturing a printed circuit board. Generally, the substrate is a copper-clad laminate, which is impregnated with a resin adhesive by a reinforcing material, and is dried, cut, and cured. The billet is further laminated, and then the copper foil is coated, and the steel sheet is used as a mold and processed by a high temperature and high pressure forming process in a hot press.

但是,基板在烘乾、固化等製程中,其內部往往會積聚應力,如果上述應力不能夠很好地釋放,很可能會導致基板在應力環境中而彎曲,並且還可能導致基板破裂。However, in the process of drying, curing, etc., the substrate tends to accumulate stress inside. If the above stress is not released well, it is likely to cause the substrate to bend in a stress environment, and may also cause the substrate to rupture.

本發明的目的之一就是在提供一種電路板的去應力方法及去應力設備。One of the objects of the present invention is to provide a method of stress reduction of a circuit board and a stress relief apparatus.

為達上述優點,本發明所提供的電路板的去應力方法,包括步驟:提供一基板;提供一去應力設備,去應力設備沿其長度方向設有至少三個溫區;加熱去應力設備,使其各溫區的溫度位於129.5℃~351℃,且使位於去應力設備中間區域的溫區的溫度高於靠近去應力設備的出口和入口處的溫區的溫度;以及將基板以0.2~3.0米/分的速度通過去應力設備。In order to achieve the above advantages, the method for removing stress of a circuit board provided by the present invention comprises the steps of: providing a substrate; providing a stress relief device, the stress relief device is provided with at least three temperature zones along its length; and heating the stress relief device, The temperature of each temperature zone is set at 129.5 ° C ~ 351 ° C, and the temperature of the temperature zone located in the middle area of the stress relief device is higher than the temperature of the temperature zone near the outlet and the inlet of the stress relief device; and the substrate is 0.2~ The speed of 3.0 m / min passes through the stress relief equipment.

為達上述優點,本發明所提供的電路板的去應力設備,包括傳送帶及加熱裝置,去應力設備沿其長度方向設有至少三個溫區,加熱裝置用於將各溫區的溫度加熱至129.5℃~351℃,且將位於去應力設備中間區域的溫區的溫度加熱至高於靠近去應力設備的出口和入口處的溫區的溫度,傳送帶用於將電路板以0.2~3.0米/分的速度傳送過去應力設備。In order to achieve the above advantages, the stress relief device of the circuit board provided by the present invention comprises a conveyor belt and a heating device. The stress relief device is provided with at least three temperature zones along its length, and the heating device is used to heat the temperature of each temperature zone to 129.5 ° C ~ 351 ° C, and the temperature in the temperature zone in the middle of the stress relief equipment is heated to a temperature higher than the temperature zone near the outlet and inlet of the stress relief device, the conveyor is used to 0.2 to 3.0 m / min of the circuit board The speed of the transmission of the past stress equipment.

在本發明中,通過加熱去應力設備,使其各溫區的溫度位於129.5℃~351℃,且使位於去應力設備中間區域的溫區的溫度高於靠近去應力設備的出口和入口處的溫區的溫度,將基板以0.2~3.0米/分的速度通過去應力設備,以消除基板的熱應力,保證基板的變形大小(即漲縮大小)保持在預定漲縮範圍內。從而使得本發明可以簡單、有效地使基板的應力得以釋放,避免了基板在應力環境中彎曲和破裂現象,並且還能保證基板的漲縮大小維持在管控的範圍內。In the present invention, by heating the stress relief device, the temperature of each temperature zone is located at 129.5 ° C to 351 ° C, and the temperature in the temperature zone located in the middle portion of the stress relief device is higher than that near the exit and the inlet of the stress relief device. The temperature of the temperature zone is passed through the stress-relieving device at a speed of 0.2 to 3.0 m/min to eliminate the thermal stress of the substrate, and to ensure that the deformation size (ie, the size of the expansion and contraction) of the substrate is kept within a predetermined expansion range. Therefore, the invention can simply and effectively release the stress of the substrate, avoid bending and cracking of the substrate in a stress environment, and ensure that the size of the substrate is maintained within the control range.

S101、S102、S103、S105、S107‧‧‧步驟S101, S102, S103, S105, S107‧‧‧ steps

201‧‧‧加熱裝置201‧‧‧ heating device

203‧‧‧傳送帶203‧‧‧Conveyor belt

圖1繪示為本發明實施例提供的電路板的去應力方法的步驟流程圖。FIG. 1 is a flow chart showing the steps of a method for removing stress of a circuit board according to an embodiment of the present invention.

圖2繪示為本發明實施例提出的電路板的去應力設備的主要架構圖。FIG. 2 is a schematic diagram showing the main structure of a stress reduction device for a circuit board according to an embodiment of the present invention.

為更進一步闡述本發明為達成預定發明目的所採取的技術手段及功效,以下結合附圖及較佳實施例,對本發明的具體實施方式、結構、特徵及其功效,詳細說明如後。The specific embodiments, structures, features and functions of the present invention will be described in detail below with reference to the accompanying drawings and preferred embodiments.

圖1是本發明實施例提供的電路板的去應力方法的步驟流程圖。請參閱圖1。本發明實施例的電路板的去應力方法可包括以下步驟:FIG. 1 is a flow chart showing the steps of a method for removing stress of a circuit board according to an embodiment of the present invention. Please refer to Figure 1. The method for removing stress of the circuit board of the embodiment of the present invention may include the following steps:

步驟S101:提供一基板。Step S101: providing a substrate.

本步驟中,此基板可以為現有的覆銅箔層壓板等。基板的製造的方法與現有基本的製造方法相同,此處不再贅述。In this step, the substrate may be an existing copper-clad laminate or the like. The method of manufacturing the substrate is the same as the conventional basic manufacturing method, and will not be described herein.

步驟S102:在基板上設置電阻,並在電阻上塗覆碳墨。Step S102: A resistor is disposed on the substrate, and carbon ink is coated on the resistor.

步驟S103:提供一去應力設備,去應力設備沿其長度方向設有至少三個溫區。Step S103: providing a stress relief device, the stress relief device is provided with at least three temperature zones along its length.

步驟S105:加熱去應力設備,使其各溫區的溫度位於129.5℃~351℃,且使位於去應力設備中間區域的溫區的溫度高於靠近去應力設備的出口和入口處的溫區的溫度。Step S105: heating the stress relief device so that the temperature of each temperature zone is between 129.5 ° C and 351 ° C, and the temperature of the temperature zone located in the middle region of the stress relief device is higher than that of the temperature zone adjacent to the outlet and the inlet of the stress relief device. temperature.

本步驟中,位於去應力設備的中間區域的溫區的溫度為189℃~351℃,靠近去應力設備的入口處的溫區的溫度為178.5℃~331.5℃,靠近去應力設備的出口處的溫區的溫度為129.5℃~240.5℃。優選地,位於去應力設備的中間區域的溫區的溫度為270℃,靠近去應力設備的入口處的溫區的溫度 為255℃,靠近去應力設備的出口處的溫區的溫度為185℃。In this step, the temperature in the temperature zone in the middle region of the stress relief device is 189 ° C ~ 351 ° C, and the temperature in the temperature zone near the entrance of the stress relief device is 178.5 ° C ~ 331.5 ° C, near the exit of the stress relief device The temperature in the temperature zone is 129.5 ° C ~ 240.5 ° C. Preferably, the temperature of the temperature zone located in the intermediate portion of the stress relief device is 270 ° C, near the temperature of the temperature zone at the inlet of the stress relief device At 255 ° C, the temperature in the temperature zone near the outlet of the stress relief device is 185 ° C.

具體地,去應力設備設置有3~25個溫區。在本發明的一個實施例中,去應力設備設置有12個溫區,12個溫區的溫度範圍自去應力設備的入口和出口處依次為:178.5℃~331.5℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、189℃~351℃、175℃~325℃、175℃~325℃、175℃~325℃、161℃~299℃、129.5℃~240.5℃。優選地,12個溫區的溫度自去應力設備的入口和出口處可以依次為:255℃、250℃、250℃、250℃、250℃、250℃、250℃、270℃、250℃、250℃、230℃、185℃。Specifically, the stress relief device is provided with 3 to 25 temperature zones. In one embodiment of the present invention, the stress relief device is provided with 12 temperature zones, and the temperature ranges of the 12 temperature zones are: 178.5 ° C ~ 331.5 ° C, 175 ° C ~ 325 ° C, respectively, from the inlet and the outlet of the stress relief device. 175°C~325°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 189°C~351°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 161°C ~299 ° C, 129.5 ° C ~ 240.5 ° C. Preferably, the temperature of the 12 temperature zones can be sequentially from the inlet and the outlet of the stress relief device: 255 ° C, 250 ° C, 250 ° C, 250 ° C, 250 ° C, 250 ° C, 250 ° C, 270 ° C, 250 ° C, 250 °C, 230 ° C, 185 ° C.

在本步驟中,加熱去應力設備包括:通過改變提供給去應力設備的紅外光源的功率將各溫區加熱至預定的溫度。In this step, heating the stress relief device includes heating each temperature zone to a predetermined temperature by varying the power of the infrared source provided to the strain relief device.

步驟S107:將基板以0.2~3.0米/分的速度通過去應力設備。Step S107: Pass the substrate through the stress relief device at a speed of 0.2 to 3.0 m/min.

本步驟中,將基板以0.2~3.0米/分的速度通過去應力設備,優選地,可以將基板以0.84米/分的速度通過去應力設備。這樣,基板依次通過去應力設備的至少三個溫區進行加熱,通過對基板進行先升溫再降溫的過程,可以有效的消除基板的在烘烤、固化等制程中產生的應力,並能夠保證基板的變形大小保持在預定漲縮範圍內。In this step, the substrate is passed through a stress relief device at a speed of 0.2 to 3.0 m/min. Preferably, the substrate can be passed through a stress relief device at a rate of 0.84 m/min. In this way, the substrate is sequentially heated by at least three temperature zones of the stress relief device, and the process of first heating and lowering the temperature of the substrate can effectively eliminate the stress generated in the baking, curing, and the like of the substrate, and can ensure the substrate. The deformation size remains within the predetermined expansion and contraction range.

下面通過實驗驗證採用本發明電路板的去應力方法所獲得的基板的漲縮範圍,實驗資料如下:將基板以0.84米/分的速度通過設有12個溫區的去應力設備,各溫區的設定溫度如表一所示,根據表一的試驗條件,通過三次實驗,每次抽樣6塊基板進行驗證,可以測得採用本發明電路板的去 應力方法所獲得的基板及其上設置的元件(包括電阻、碳墨等)的變形大小均保持在預定漲縮範圍(+/-2mil)內。The following is an experimental verification of the extent of the substrate obtained by the stress-relief method of the circuit board of the present invention. The experimental data is as follows: the substrate is passed through a de-stressing device with 12 temperature zones at a speed of 0.84 m/min. The set temperature is as shown in Table 1. According to the test conditions in Table 1, through three experiments, each time sampling 6 substrates for verification, it can be measured using the circuit board of the present invention. The deformation of the substrate obtained by the stress method and the components (including resistance, carbon ink, etc.) disposed thereon are maintained within a predetermined expansion range (+/- 2 mil).

在本發明的實施例中,通過加熱去應力設備,使其各溫區的溫度位於129.5℃~351℃,且使位於去應力設備中間區域的溫區的溫度高於靠近去應力設備的出口和入口處的溫區的溫度,將基板以0.2~3.0米/分的速度通過去應力設備,以消除基板的熱應力,並保證基板的變形大小(即漲縮大小)保持在預定漲縮範圍內。還通過改變提供給去應力設備的紅外光源的功率將各溫區加熱至預定的溫度,從而使得本發明可以簡單、有效地使基板的應力得以釋放,避免了基板在應力環境中彎曲和破裂現象,並且還能保證基板的漲縮大小維持在管控的範圍內。In an embodiment of the present invention, the temperature of each temperature zone is set to be between 129.5 ° C and 351 ° C by heating the stress relief device, and the temperature in the temperature zone located in the middle portion of the stress relief device is higher than that near the outlet of the stress relief device and The temperature of the temperature zone at the inlet passes the substrate through the stress relief device at a speed of 0.2 to 3.0 m/min to eliminate the thermal stress of the substrate and ensure that the deformation size of the substrate (ie, the size of the expansion and contraction) remains within the predetermined expansion and contraction range. . The heating zone is also heated to a predetermined temperature by changing the power of the infrared light source supplied to the stress relief device, so that the invention can simply and effectively release the stress of the substrate, thereby avoiding bending and cracking of the substrate in a stress environment. And can also ensure that the size of the substrate is maintained within the control range.

圖2是本發明實施例提出的電路板的去應力設備的主要架構圖。請參閱圖2,電路板的去應力設備包括:加熱裝置201以及傳送帶203。2 is a main architectural diagram of a stress relief device for a circuit board according to an embodiment of the present invention. Referring to FIG. 2, the stress relief device of the circuit board includes: a heating device 201 and a conveyor belt 203.

上述去應力設備沿其長度方向設有至少三個溫區。具體地,去應力設備設置有3~25個溫區,優選地,去應 力設備設置有12個溫區,在本發明中溫區的數量可以根據去應力設備的長度等相關條件進行調整。The stress relief device described above is provided with at least three temperature zones along its length. Specifically, the stress relief device is provided with 3 to 25 temperature zones, preferably, The force device is provided with 12 temperature zones, and the number of the temperature zones in the present invention can be adjusted according to relevant conditions such as the length of the stress relief device.

加熱裝置201用於將各溫區的溫度加熱至129.5℃~351℃,且將位於去應力設備中間區域的溫區的溫度加熱至高於靠近去應力設備的出口和入口處的溫區的溫度。The heating device 201 is for heating the temperature of each temperature zone to 129.5 ° C to 351 ° C, and heating the temperature of the temperature zone located in the intermediate portion of the stress relief device to a temperature higher than the temperature zone near the outlet and the inlet of the strain relief device.

此外,加熱裝置201還可以通過改變提供給去應力設備的紅外光源的功率將各溫區加熱至預定的溫度。在去應力設備設置有12個溫區的實施例中,這12個溫區的溫度範圍自去應力設備的入口和出口處依次為:178.5℃~331.5℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、189℃~351℃、175℃~325℃、175℃~325℃、175℃~325℃、161℃~299℃、129.5℃~240.5℃。也就是說,位於去應力設備的中間區域的溫區的溫度優選為189℃~351℃,靠近去應力設備的入口處的溫區的溫度優選為178.5℃~331.5℃,靠近去應力設備的出口處的溫區的溫度優選為129.5℃~240.5℃。在本發明的一個實施例中,這12個溫區的溫度自去應力設備的入口和出口處優選為:255℃、250℃、250℃、250℃、250℃、250℃、250℃、270℃、250℃、250℃、230℃、185℃。也就是說,在這個實施例中,位於去應力設備的中間區域的溫區的溫度為270℃,靠近去應力設備的入口處的溫區的溫度為255℃,靠近去應力設備的出口處的溫區的溫度為185℃。Further, the heating device 201 can also heat each temperature zone to a predetermined temperature by changing the power of the infrared light source supplied to the strain relief device. In the embodiment where the stress relief device is provided with 12 temperature zones, the temperature range of the 12 temperature zones is from 178.5 ° C to 331.5 ° C, 175 ° C to 325 ° C, and 175 ° C from the inlet and the outlet of the stress relief device. 325°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 189°C~351°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 161°C~299°C 129.5 ° C ~ 240.5 ° C. That is to say, the temperature of the temperature zone located in the intermediate portion of the stress relief device is preferably 189 ° C ~ 351 ° C, and the temperature of the temperature zone near the inlet of the stress relief device is preferably 178.5 ° C ~ 331.5 ° C, close to the outlet of the stress relief device The temperature in the temperature zone is preferably 129.5 ° C ~ 240.5 ° C. In one embodiment of the invention, the temperature of the 12 temperature zones is preferably 255 ° C, 250 ° C, 250 ° C, 250 ° C, 250 ° C, 250 ° C, 250 ° C, 270 at the inlet and outlet of the stress relief device. °C, 250 ° C, 250 ° C, 230 ° C, 185 ° C. That is, in this embodiment, the temperature of the temperature zone located in the intermediate portion of the strain relief device is 270 ° C, and the temperature of the temperature zone near the inlet of the stress relief device is 255 ° C, near the exit of the strain relief device. The temperature in the temperature zone is 185 °C.

傳送帶203用於將電路板以0.2~3.0米/分的速度傳送過去應力設備。優選地,可以將基板以0.84米/分的速度通過去應力設備。這樣,基板依次通過去應力設備的至少三個溫區進行加熱,經過先升溫再降溫的過程,可以有效地消 除基板的應力,並能夠保證基板的變形大小保持在預定漲縮範圍內。Conveyor belt 203 is used to transport the board to the stress device at a speed of 0.2 to 3.0 meters per minute. Preferably, the substrate can be passed through a stress relief device at a rate of 0.84 meters per minute. In this way, the substrate is sequentially heated by at least three temperature zones of the stress relief device, and the process of first heating and then cooling down can effectively eliminate In addition to the stress of the substrate, it is possible to ensure that the deformation of the substrate is maintained within a predetermined range of expansion and contraction.

在本發明的實施例中,通過加熱去應力設備,使其各溫區的溫度位於129.5℃~351℃,且使位於去應力設備中間區域的溫區的溫度高於靠近去應力設備的出口和入口處的溫區的溫度,將基板以0.2~3.0米/分的速度通過去應力設備,以消除基板的熱應力,並保證基板的變形大小(即漲縮大小)保持在預定漲縮範圍內。還通過改變提供給去應力設備的紅外光源的功率將各溫區加熱至預定的溫度,從而使得本發明可以簡單、有效地使基板的應力得以釋放,避免了基板在應力環境中彎曲和破裂現象,並且還能保證基板的漲縮大小維持在管控的範圍內。In an embodiment of the present invention, the temperature of each temperature zone is set to be between 129.5 ° C and 351 ° C by heating the stress relief device, and the temperature in the temperature zone located in the middle portion of the stress relief device is higher than that near the outlet of the stress relief device and The temperature of the temperature zone at the inlet passes the substrate through the stress relief device at a speed of 0.2 to 3.0 m/min to eliminate the thermal stress of the substrate and ensure that the deformation size of the substrate (ie, the size of the expansion and contraction) remains within the predetermined expansion and contraction range. . The heating zone is also heated to a predetermined temperature by changing the power of the infrared light source supplied to the stress relief device, so that the invention can simply and effectively release the stress of the substrate, thereby avoiding bending and cracking of the substrate in a stress environment. And can also ensure that the size of the substrate is maintained within the control range.

在本發明中,位於去應力設備的中間區域的溫區指位於去應力設備的中部,且其溫度高於其兩側的那部分溫區,中間區域的溫區的溫度相對於其兩側的溫區的溫度具有一定範圍的溫度升幅,在具體的實施例中,中間區域的溫區可以包括一個溫區或多個溫區,而靠近去應力設備的入口或出口處的溫區則指位於去應力設備的靠近入口或出口的一側,且其溫度低於中間區域的那部分溫區,在具體的實施例中,靠近去應力設備的入口或出口處的溫區也可以包括一個溫區或多個溫區。In the present invention, the temperature zone located in the middle portion of the stress relief device refers to the portion of the temperature zone in which the temperature is higher than the temperature zone of the middle portion of the stress relief device, and the temperature of the temperature zone of the intermediate zone is opposite to the sides thereof. The temperature of the temperature zone has a range of temperature rises. In a specific embodiment, the temperature zone of the intermediate zone may comprise a temperature zone or a plurality of temperature zone, and the temperature zone near the inlet or outlet of the stress relief device is located a portion of the stress relief device adjacent to the inlet or outlet and having a lower temperature than the portion of the intermediate region. In particular embodiments, the temperature region adjacent the inlet or outlet of the strain relief device may also include a temperature zone. Or multiple temperature zones.

以上所述,僅是本發明的較佳實施例而已,並非對本發明作任何形式上的限制,雖然本發明已以較佳實施例揭露如上,然而並非用以限定本發明,任何熟悉本專業的技術人員,在不脫離本發明技術方案範圍內,當可利用上述揭示的技術內容做出些許更動或修飾為等同變化的等效實施例,但凡 是未脫離本發明技術方案內容,依據本發明的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾,均仍屬於本發明技術方案的範圍內。The above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the present invention. A skilled person may make some modifications or modifications to equivalent variations using the technical contents disclosed above without departing from the scope of the present invention. Any simple modifications, equivalent changes and modifications to the above embodiments in accordance with the technical spirit of the present invention are still within the scope of the technical solutions of the present invention.

S101、S102、S103、S105、S107‧‧‧步驟S101, S102, S103, S105, S107‧‧‧ steps

Claims (10)

一種電路板的去應力方法,包括步驟:提供一基板;提供一去應力設備,該去應力設備沿其長度方向設有至少三個溫區;加熱該去應力設備,使其各溫區的溫度位於129.5℃~351℃,且使位於該去應力設備中間區域的溫區的溫度高於靠近該去應力設備的出口和入口處的溫區的溫度;以及將該基板以0.2~3.0米/分的速度通過該去應力設備。A method for destressing a circuit board, comprising the steps of: providing a substrate; providing a stress relief device, the stress relief device is provided with at least three temperature zones along its length; heating the stress relief device to temperature of each temperature zone Located at 129.5 ° C to 351 ° C, and the temperature in the temperature zone located in the middle portion of the stress relief device is higher than the temperature in the temperature zone near the outlet and the inlet of the stress relief device; and the substrate is 0.2 to 3.0 m / min The speed is passed through the stress relief device. 如申請專利範圍第1項所述之電路板的去應力方法,其中位於該去應力設備的中間區域的溫區的溫度為189℃~351℃,靠近該去應力設備的入口處的溫區的溫度為178.5℃~331.5℃,靠近該去應力設備的出口處的溫區的溫度為129.5℃~240.5℃。The method for stress-removing a circuit board according to claim 1, wherein the temperature in the temperature region of the intermediate portion of the stress relief device is 189 ° C to 351 ° C, near the temperature zone at the entrance of the stress relief device. The temperature is 178.5 ° C ~ 331.5 ° C, and the temperature in the temperature zone near the outlet of the stress relief device is 129.5 ° C ~ 240.5 ° C. 如申請專利範圍第2項所述之電路板的去應力方法,其中位於該去應力設備的中間區域的溫區的溫度為270℃,靠近該去應力設備的入口處的溫區的溫度為255℃,靠近該去應力設備的出口處的溫區的溫度為185℃。The method of stress reduction of a circuit board according to claim 2, wherein a temperature in a temperature zone in an intermediate portion of the stress relief device is 270 ° C, and a temperature in a temperature zone near an inlet of the stress relief device is 255. °C, the temperature in the temperature zone near the exit of the stress relief device is 185 °C. 如申請專利範圍第1項所述之電路板的去應力方法,其中該去應力設備具有3~25個溫區。The method for removing stress of a circuit board according to claim 1, wherein the stress relief device has 3 to 25 temperature zones. 如申請專利範圍第4項所述之電路板的去應力方法,其 中該去應力設備具有12個溫區,該12個溫區的溫度範圍自該去應力設備的入口和出口處依次為:178.5℃~331.5℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、189℃~351℃、175℃~325℃、175℃~325℃、175℃~325℃、161℃~299℃、129.5℃~240.5℃。A method for removing stress of a circuit board as described in claim 4, The destressing device has 12 temperature zones, and the temperature ranges of the 12 temperature zones are: 178.5 ° C ~ 331.5 ° C, 175 ° C ~ 325 ° C, 175 ° C ~ 325 ° C, respectively, from the inlet and outlet of the stress relief device, 175°C~325°C, 175°C~325°C, 175°C~325°C, 189°C~351°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 161°C~299°C, 129.5°C ~240.5 °C. 如申請專利範圍第1項所述之電路板的去應力方法,其中加熱該去應力設備的步驟包括:通過改變提供給該去應力設備的紅外光源的功率將各溫區加熱至預定的溫度。The method of stress removing a circuit board according to claim 1, wherein the step of heating the stress relief device comprises: heating each temperature zone to a predetermined temperature by changing a power of an infrared light source supplied to the strain relief device. 一種電路板的去應力設備,其包括:一傳送帶及一加熱裝置,其中,該去應力設備沿其長度方向設有至少三個溫區,該加熱裝置用於將各溫區的溫度加熱至129.5℃~351℃,且將位於該去應力設備中間區域的溫區的溫度加熱至高於靠近該去應力設備的出口和入口處的溫區的溫度,該傳送帶用於將電路板以0.2~3.0米/分的速度傳送過該去應力設備。A stress reduction device for a circuit board, comprising: a conveyor belt and a heating device, wherein the stress relief device is provided with at least three temperature zones along a length thereof, the heating device is configured to heat the temperature of each temperature zone to 129.5 °C~351 °C, and the temperature of the temperature zone in the middle zone of the stress relief device is heated to a temperature higher than the temperature zone near the outlet and the inlet of the stress relief device, the conveyor belt is used to 0.2 to 3.0 meters of the circuit board The speed of the minute is transmitted through the stress relief device. 如申請專利範圍第7項所述之電路板的去應力設備,其中該去應力設備具有3~25個溫區。The stress relief device of the circuit board of claim 7, wherein the stress relief device has 3 to 25 temperature zones. 如申請專利範圍第8項所述之電路板的去應力設備,其中該去應力設備具有12個溫區,該12個溫區的溫度範圍自該去應力設備的入口和出口處依次為:178.5℃~331.5℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、175℃~325℃、189℃~351℃、175℃~325℃、175℃~325℃、175℃~325 ℃、161℃~299℃、129.5℃~240.5℃。The destressing device of the circuit board of claim 8, wherein the stress relief device has 12 temperature zones, and the temperature ranges of the 12 temperature zones are from the inlet and the outlet of the stress relief device: 178.5 °C~331.5°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 175°C~325°C, 189°C~351°C, 175°C~325°C, 175°C~ 325 ° C, 175 ° C ~ 325 °C, 161 ° C ~ 299 ° C, 129.5 ° C ~ 240.5 ° C. 如申請專利範圍第7項所述之電路板的去應力設備,其中位於該去應力設備的中間區域的溫區的溫度為270℃,靠近該去應力設備的入口處的溫區的溫度為255℃,靠近該去應力設備的出口處的溫區的溫度為185℃。The stress relief device of the circuit board of claim 7, wherein the temperature in the temperature zone in the intermediate portion of the stress relief device is 270 ° C, and the temperature in the temperature zone near the inlet of the stress relief device is 255. °C, the temperature in the temperature zone near the exit of the stress relief device is 185 °C.
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