TWI457193B - Stage device - Google Patents

Stage device Download PDF

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Publication number
TWI457193B
TWI457193B TW096107018A TW96107018A TWI457193B TW I457193 B TWI457193 B TW I457193B TW 096107018 A TW096107018 A TW 096107018A TW 96107018 A TW96107018 A TW 96107018A TW I457193 B TWI457193 B TW I457193B
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Taiwan
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stage
platform
linear motor
disposed
pivot
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TW096107018A
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Chinese (zh)
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TW200740550A (en
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Yasuo Minami
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Sumitomo Heavy Industries
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • G03F7/70725Stages control
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70758Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70816Bearings

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Machine Tool Units (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

載台裝置Stage device

本發明係關於可更安定且精密地實施θ平台之轉動動作之構成的載台裝置。The present invention relates to a stage device capable of more stably and precisely performing a configuration of a turning operation of a θ stage.

例如,載台裝置具有於Y方向移動之Y載台、及於X方向移動之X載台,Y載台沿著固定於平臺上之1對Y方向導軌於移動方向被導引,X載台沿著配載於Y載台之X方向導軌於移動方向被導引(例如,參照專利文獻1)。For example, the stage device has a Y stage that moves in the Y direction and an X stage that moves in the X direction, and the Y stage is guided in the moving direction along a pair of Y-direction rails fixed to the stage, and the X stage The X-direction guide rails mounted on the Y stage are guided in the moving direction (for example, refer to Patent Document 1).

此外,半導體晶圓之移動所使用之載台裝置時,配設於Y載台之兩端之滑塊係利用線性馬達於Y方向進行併進驅動,且X載台上則以可於θ z方向轉動之方式支持著載置著晶圓之θ平台。Further, when the stage device used for the movement of the semiconductor wafer is used, the sliders disposed at both ends of the Y stage are driven in parallel in the Y direction by the linear motor, and the X stage is in the θ z direction. The rotation mode supports the θ platform on which the wafer is placed.

此種載台裝置係用以針對對象物之晶圓進行搬送並保持於θ平台,為了使晶圓之位置能有高精度之定位,其構成上,係實施使θ平台於Z軸周圍之θ z方向進行轉動動作調整晶圓位置之定位控制。The stage device is configured to transport and hold the wafer of the object on the θ platform. In order to position the wafer with high precision, the θ platform is θ around the Z axis. The z-direction rotates to adjust the position control of the wafer position.

[專利文獻1]日本特開2004-317485號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2004-317485

上述傳統之載台裝置時,於以可轉動方式支持著θ平台之支持部,θ平台之負荷全部由X平台來承受,例如,導軌變形而Y載台旋轉時,θ平台也會因為摩擦力而旋轉,而有難以安定且精密地控制θ平台之轉動位置的問題。In the above conventional stage device, the support portion of the θ platform is rotatably supported, and the load of the θ platform is all supported by the X platform. For example, when the guide rail is deformed and the Y stage is rotated, the θ platform is also due to friction. While rotating, there is a problem that it is difficult to stably and precisely control the rotational position of the θ platform.

因此,本發明之目的係在提供可解決如上述之課題的載台裝置。Accordingly, it is an object of the present invention to provide a stage device that can solve the above problems.

本發明之一實施形態之載台裝置係具有:在平臺上移動之載台;及可與該載台一起移動且可在該載台上轉動之θ平台;之載台裝置,其特徵為含有:可於前述載台及前述θ平台之間垂直立起之樞軸;以使前述θ平台可相對於前述載台進行轉動之方式,軸支於前述樞軸及前述θ平台之間、或軸支於前述載台及前述樞軸之間之軸承;以及從下面側對前述θ平台實施旋轉驅動之θ線性馬達。A stage apparatus according to an embodiment of the present invention includes: a stage that moves on a platform; and a stage platform that is movable with the stage and rotatable on the stage; the stage apparatus is characterized by a pivot that can be vertically erected between the stage and the θ platform; such that the θ platform is rotatable relative to the stage, and is axially supported between the pivot and the θ platform, or the shaft a bearing supported between the stage and the pivot; and a θ linear motor that rotationally drives the θ stage from the lower side.

本發明之其他實施形態之載台裝置係具有:在平臺上移動之載台;及可與該載台一起移動且可在該載台上轉動之θ平台;之載台裝置,其特徵為含有:垂直立起於前述載台上面之樞軸;軸支於前述樞軸及前述θ平台之間之軸承;以及從下面側對前述θ平台實施使其相對於前述載台進行旋轉驅動之線性馬達。A stage apparatus according to another embodiment of the present invention includes: a stage that moves on a platform; and a stage platform that is movable with the stage and rotatable on the stage; the stage apparatus is characterized by a pivot that vertically rises above the stage; a bearing that is axially supported between the pivot and the θ platform; and a linear motor that rotates the θ platform from the lower side to rotate with respect to the stage .

此外,於前述平臺或前述載台之間,亦可更具備用以支持前述θ平台之支持手段。In addition, a support means for supporting the θ platform may be further provided between the platform or the aforementioned stage.

此外,前述支持手段含有:於前述θ平台之下面垂直延伸之複數之支柱;及分別配設於前述複數之支柱之下端,靜壓堆置於前述平臺上或前述載台上之複數之氣墊。In addition, the support means includes: a plurality of pillars extending perpendicularly below the θ platform; and a plurality of air cushions respectively disposed at the lower ends of the plurality of pillars, and the static pressure stack is placed on the platform or on the stage.

此外,前述支持手段亦可含有:於前述平臺或前述載台垂直向上方延伸之複數之支柱;及配設於該支柱之上端,靜壓堆置於前述θ載台之複數之氣墊。In addition, the supporting means may further include: a plurality of pillars extending vertically upward from the platform or the loading platform; and an air cushion disposed on the upper end of the pillar and the static pressure stack being disposed on the plurality of the θ stages.

此外,前述軸承亦可以由交叉軸承所構成。Furthermore, the aforementioned bearings may also be formed by crossed bearings.

此外,亦可以為前述θ 線性馬達之固定子配設於前述載台上,前述θ 線性馬達之活動子配設於前述θ 平台之下面。Further, the stator of the θ linear motor may be disposed on the stage, and the movable portion of the θ linear motor may be disposed below the θ stage.

此外,前述載台亦可以為可在前述平臺上之該載台之上面之垂直相交之2軸方向平行移動之XY載台,前述XY載台含有:於Y方向移動之Y載台;及配載於前述Y載台之上,在X方向移動之X載台;且,前述θ 方向線性馬達之固定子配載於前述X載台之上。Further, the stage may be an XY stage that is movable in parallel in a two-axis direction perpendicular to the upper surface of the stage on the stage, and the XY stage includes a Y stage that moves in the Y direction; An X stage that moves on the Y stage and moves in the X direction; and a stator of the θ direction linear motor is placed on the X stage.

依據本發明,可以利用軸承使θ 平台以低負荷進行轉動,且θ 線性馬達以非接觸方式從下面側驅動θ 平台,而具有可將載台之誤差對θ 平台之影響抑制於最小之效果。According to the present invention, the θ platform can be rotated with a low load by the bearing, and the θ linear motor drives the θ stage from the lower side in a non-contact manner, and has an effect of suppressing the influence of the error of the stage on the θ stage to a minimum.

以下,針對應用本發明之載台裝置之實施形態進行說明。Hereinafter, an embodiment of a stage device to which the present invention is applied will be described.

[實施形態1][Embodiment 1]

第1圖係實施形態1之載台裝置之斜視圖。第2圖係實施形態1之載台裝置之正面圖。第3圖係實施形態1之載台裝置之平面圖。Fig. 1 is a perspective view showing a stage device of the first embodiment. Fig. 2 is a front elevational view showing the stage device of the first embodiment. Fig. 3 is a plan view showing the stage device of the first embodiment.

如第1圖至第3圖所示,載台裝置10A係例如組合於半導體晶圓之製造製程所使用之曝光裝置,具有:平臺20;在平臺20之平面上移動之載台30;配載於載台30上,用以載置工件(圖上未標示)之θ平台40;以及使載台30在Y方向移動之1對Y線性馬達50。As shown in FIGS. 1 to 3, the stage device 10A is, for example, an exposure device used in a manufacturing process of a semiconductor wafer, and includes: a stage 20; a stage 30 that moves on the plane of the stage 20; On the stage 30, a θ stage 40 for placing a workpiece (not shown) and a pair of Y linear motors 50 for moving the stage 30 in the Y direction.

載台30具有:突出於平臺20之平面上,沿著於移動方向(Y方向)延伸之1對Y方向導軌28平行移動之1對滑塊32;及利用氣壓而於平臺20之平面上靜壓浮起移動之複數之氣墊(也稱為「空氣軸承」)34。此外,滑塊32係以相對於Y方向導軌28之左右側面及上面而形成為倒U字形,各相對面配設著利用氣壓之非接觸之氣墊(圖上未標示)。因此,滑塊32相對於Y方向導軌28,可利用氣壓以靜壓浮起而非接觸地於Y方向移動。The stage 30 has a pair of sliders 32 protruding from the plane of the platform 20 and extending in parallel with the Y-direction guide rails 28 extending in the moving direction (Y direction); and statically resting on the plane of the platform 20 by using air pressure. The air cushion (also referred to as "air bearing") 34 that floats and moves. Further, the slider 32 is formed in an inverted U shape with respect to the left and right side faces and the upper surface of the Y-direction guide rail 28, and each of the opposing faces is provided with a non-contact air cushion (not shown) by air pressure. Therefore, the slider 32 can be moved in the Y direction by the air pressure by floating pressure instead of contact with respect to the Y direction guide rail 28.

載台30具有:於Y方向移動之Y載台36;及於與Y方向為垂直相交之X方向移動之X載台38。Y載台36橫跨於1對Y方向導軌28之間,其兩端係用以結合滑塊32之H字形。此外,X載台38係配設於滑塊32之間,下面配設著複數之氣墊34。其次,X載台38係以可與上述Y載台36一起於Y方向移動,且可沿著Y載台36於X方向移動之方式來配設。The stage 30 has a Y stage 36 that moves in the Y direction, and an X stage 38 that moves in the X direction that intersects the Y direction perpendicularly. The Y stage 36 spans between the pair of Y-direction guide rails 28, and its both ends are coupled to the H-shape of the slider 32. Further, the X stage 38 is disposed between the sliders 32, and a plurality of air cushions 34 are disposed on the lower surface. Next, the X stage 38 is movable in the Y direction together with the Y stage 36, and is movable along the Y stage 36 in the X direction.

從上方觀看時,θ平台40為四角形狀,其上面42係工件載置面(半導體用之曝光裝置時,係晶圓載置面)。此外,於上面42,配設著用以檢測θ平台40之Y方向位置之用以反射來自雷射干涉儀(圖上未標示)之雷射光之鏡44。When viewed from above, the θ stage 40 has a quadrangular shape, and the upper surface of the θ stage 40 is a workpiece mounting surface (a wafer mounting surface when the semiconductor exposure apparatus is used). Further, on the upper surface 42, a mirror 44 for detecting the position of the θ stage 40 in the Y direction for reflecting the laser light from the laser interferometer (not shown) is disposed.

一對之Y線性馬達50並設於平臺20之左右外側,由:於Y方向延伸形成之磁軛(固定子)52;及於滑塊32之外側面之X方向延伸之線圈單元(活動子)54;所構成。從正面觀看時,磁軛52呈字形,於內壁之上下面,並設著複數之永久磁鐵。此外,磁軛52利用支持構件56將滑塊32支持於移動高度位置。A pair of Y linear motors 50 are disposed on the left and right outer sides of the platform 20, and are: a yoke (fixator) 52 extending in the Y direction; and a coil unit extending in the X direction on the outer side of the slider 32 (active element) ) 54; constitutes. When viewed from the front, the yoke 52 is The glyph is above and below the inner wall and is provided with a plurality of permanent magnets. Further, the yoke 52 supports the slider 32 at the moving height position by the support member 56.

其次,線圈單元54於Y方向連結著複數之線圈,從磁軛52之磁鐵間之側方插入。因此,線圈單元54於對線圈進行通電時,形成相對於永久磁鐵之磁束,而得到對永久磁鐵之Y方向之推力。此外,線圈單元54結合於滑塊32之側面。因此,線圈單元54所得到之Y方向推力施加於滑塊32,而驅動Y載台36。Next, the coil unit 54 is connected to a plurality of coils in the Y direction, and is inserted from the side between the magnets of the yoke 52. Therefore, when the coil unit 54 energizes the coil, a magnetic flux with respect to the permanent magnet is formed, and a thrust force in the Y direction of the permanent magnet is obtained. Further, the coil unit 54 is coupled to the side of the slider 32. Therefore, the Y-direction thrust obtained by the coil unit 54 is applied to the slider 32 to drive the Y stage 36.

此外,載台裝置10A係具備:垂直於θ平台40之下面(亦即,於θ平台40之下面垂直向下)延伸之4支支柱60;及配設於各支柱60之下端,於平臺20之平面上利用氣壓進行靜壓浮起移動之複數之氣墊(亦稱為「空氣軸承」)70;之構成。因此,支柱60及氣墊70一邊直接支持著θ平台40,一邊於平臺20上移動。藉此,θ平台40雖然具有大於X載台38之面積,利用配置於比X載台38之輪廓更為外側之4支支柱60及4個氣墊70,可以利用氣壓於平臺20之上面進行靜壓浮起移動,而且,可以在維持上面42之平面精度(水平精度)下與載台30一起移動。In addition, the stage device 10A is provided with four pillars 60 extending perpendicularly to the lower surface of the θ platform 40 (that is, vertically downward from the θ platform 40); and disposed at the lower end of each of the pillars 60 on the platform 20 The air cushion (also referred to as "air bearing") 70 of the plurality of static pressure floating movements by means of air pressure on the plane. Therefore, the support 60 and the air cushion 70 directly support the θ stage 40 and move on the stage 20. Accordingly, the θ stage 40 has a larger area than the X stage 38, and can be statically placed on the upper surface of the platform 20 by using four pillars 60 and four air cushions 70 disposed outside the contour of the X stage 38. The pressure floats and moves, and can be moved together with the stage 30 while maintaining the plane accuracy (horizontal accuracy) of the upper surface 42.

此外,因為θ平台40之四角獲得4支支柱60及4個氣墊70的支持,可以防止轉動時以樞軸80為支點之擺動,而維持上面42之水平精度。Further, since the four corners of the θ stage 40 are supported by the four pillars 60 and the four air cushions 70, the pivoting with the pivot 80 as a fulcrum during rotation can be prevented, and the horizontal precision of the upper surface 42 can be maintained.

此外,載台30係利用配置於X載台38之下面之4個氣墊34,以利用氣壓於平臺20之各上面進行靜壓浮起移動之方式獲得支持。因此,X載台38及θ 平台40可在互相不會干涉之情形下移動,θ 平台40可以在維持上面42之平面精度之狀態下與X載台38一體移動。此外,因為氣墊34、70係利用氣壓相對於平臺20之平面而為靜壓浮起,故可以非接觸方式進行移動,X載台38及θ 平台40移動時之摩擦會極小,故相對於其部份,移動時之推力也較小即可。Further, the stage 30 is supported by four air cushions 34 disposed under the X stage 38 to perform static pressure floating movement on the upper surface of the stage 20 by air pressure. Therefore, the X stage 38 and the θ stage 40 can be moved without interfering with each other, and the θ stage 40 can move integrally with the X stage 38 while maintaining the plane accuracy of the upper surface 42. In addition, since the air cushions 34 and 70 are suspended by static pressure with respect to the plane of the platform 20, they can be moved in a non-contact manner, and the friction between the X stage 38 and the θ stage 40 is extremely small, so that relative to the air cushions 34 and 70 In part, the thrust during movement is also small.

第4圖係載台30及θ 平台40之側剖面圖。如第4圖所示,樞軸80垂直立起於X載台38之上面。該樞軸80係利用圖上未標示之螺絲螺合固定於X載台38。Figure 4 is a side cross-sectional view of the stage 30 and the θ stage 40. As shown in FIG. 4, the pivot 80 stands upright above the X stage 38. The pivot 80 is screwed to the X stage 38 by means of screws not shown.

於該樞軸80之上端,裝設著軸承82,利用該軸承82,使θ 平台40及樞軸80互相軸支,使θ 平台40可於θ z方向轉動。此外,θ 平台40可轉動之角度為例如1/3600度。At the upper end of the pivot 80, a bearing 82 is mounted, and the θ platform 40 and the pivot 80 are axially supported by the bearing 82, so that the θ stage 40 can be rotated in the θ z direction. Further, the angle at which the θ stage 40 can be rotated is, for example, 1/3600 degrees.

該軸承82之外輪係嵌合配設於配設在θ 平台40之下面中央之凹部40a,內輪則嵌合於樞軸80之上端外側。The outer ring of the bearing 82 is fitted to the recess 40a disposed at the center of the lower surface of the θ table 40, and the inner wheel is fitted to the outer side of the upper end of the pivot 80.

此外,因為軸承82係由例如利用保持框配置著垂直相交排列之於90°V溝之轉動面進行圓筒滾動之間隔件之交叉軸承所構成,即使承受到徑向負荷(半徑方向負荷)、軸向負荷(軸方向負荷)、以及動量(傾斜、滾動、搖動所產生之負荷)等之所有方向之負荷,亦可圓滑地旋轉之構成。Further, since the bearing 82 is constituted by, for example, a cross bearing in which a spacer which is vertically aligned and arranged on a rotating surface of a 90° V groove is used to perform cylindrical rolling, even if a radial load (radial load) is received, The load in all directions, such as the axial load (axial load) and the momentum (load generated by tilting, rolling, and rocking), can also be smoothly rotated.

因此,θ平台40可以利用由樞軸80及軸承82所構成之樞軸軸承構造而獲得安定狀態之支持。此外,軸承82配設於θ平台40之下面中心,樞軸80之軸心與θ平台40之旋轉中心為一致。其次,用以驅動載台30之Y線性馬達50、及後述之X線性馬達之推力,也可介由樞軸80及軸承82傳達至θ平台40。Therefore, the θ stage 40 can be supported by a pivot bearing structure composed of the pivot 80 and the bearing 82 to obtain a stable state. Further, the bearing 82 is disposed at the center of the lower surface of the θ stage 40, and the axis of the pivot 80 coincides with the center of rotation of the θ stage 40. Next, the thrust of the Y linear motor 50 for driving the stage 30 and the X linear motor to be described later may be transmitted to the θ stage 40 via the pivot 80 and the bearing 82.

此外,以上係針對樞軸80之上端利用軸承82軸支於θ平台40之形態進行說明,然而,軸承82之裝設部位並未受限於該部位。亦可以為如下之方式,亦即,例如利用螺絲將樞軸80固定於θ平台40之下面中心等,而且,將軸承82配設於X載台38之上面側,使樞軸80之下端及X載台38利用軸承82互相軸支,θ平台40也可相對於X載台38進行轉動。Further, the above description has been made on the state in which the upper end of the pivot 80 is supported by the θ platform 40 by the bearing 82. However, the mounting position of the bearing 82 is not limited to this portion. Alternatively, the pivot 80 may be fixed to the lower center of the θ stage 40 by screws, for example, and the bearing 82 may be disposed on the upper side of the X stage 38 so that the lower end of the pivot 80 and The X stages 38 are axially supported by bearings 82, and the θ stage 40 is also rotatable relative to the X stage 38.

此外,於X載台38及θ平台40之間,配設著可使θ平台40於θ z方向轉動之1對θ線性馬達84。該θ線性馬達84係配置於樞軸80之附近,由固定於X載台38之上面之磁軛(固定子)86、及固定於θ平台40之下面之線圈單元(活動子)88所構成。磁軛86之剖面形狀為倒U字形,與相對之內面裝設著永久磁鐵。其次,線圈單元88係以非接觸方式插入於磁軛86之永久磁鐵間。Further, between the X stage 38 and the θ stage 40, a pair of θ linear motors 84 that can rotate the θ stage 40 in the θ z direction are disposed. The θ linear motor 84 is disposed in the vicinity of the pivot 80, and is composed of a yoke (fixator) 86 fixed to the upper surface of the X stage 38, and a coil unit (active member) 88 fixed to the lower surface of the θ stage 40. . The yoke 86 has an inverted U shape in cross section, and a permanent magnet is attached to the opposite inner surface. Next, the coil unit 88 is inserted between the permanent magnets of the yoke 86 in a non-contact manner.

此外,1對θ線性馬達84係平行配設,且從上方觀看時,係配置於以樞軸80為中心之對稱位置。因此,1對θ線性馬達84利用對線圈單元88進行通電而產生以樞軸80為中心之偶力,從下面側使θ平台40朝θ z方向轉動。Further, the pair of θ linear motors 84 are arranged in parallel, and are disposed at a symmetrical position centering on the pivot 80 when viewed from above. Therefore, the pair of θ linear motors 84 generate a force centered on the pivot 80 by energizing the coil unit 88, and rotate the θ stage 40 in the θ z direction from the lower side.

此時,θ平台40利用來自配置於樞軸80之附近之1對θ線性馬達84之推力而於樞軸80之軸周圍(θ z方向)轉動,並利用軸承82而為低摩擦、低振動之轉動。此外,因為θ線性馬達84係非接觸構造之驅動手段,轉動θ平台40時,可以不受傳達路徑所造成之驅動力損失或變動的影響,而使θ平台40進行轉動,故可安定且精密地控制θ平台40之轉動動作。At this time, the θ stage 40 is rotated around the axis of the pivot 80 (θ z direction) by the thrust from a pair of θ linear motors 84 disposed in the vicinity of the pivot 80, and is low friction and low vibration by the bearing 82. Rotation. Further, since the θ linear motor 84 is a driving means for the non-contact structure, when the θ stage 40 is rotated, the θ stage 40 can be rotated without being affected by the loss or variation of the driving force caused by the transmission path, so that it can be stabilized and precise. The rotation of the θ platform 40 is controlled.

因此,載台裝置10A可利用軸承82以低負荷使θ平台40進行轉動,且θ線性馬達84為非接觸並從下面側驅動θ平台40,故可將載台30之誤差對θ平台40之影響抑制於最小。Therefore, the stage device 10A can rotate the θ stage 40 with a low load by the bearing 82, and the θ linear motor 84 is non-contact and drives the θ stage 40 from the lower side, so that the error of the stage 30 can be compared with the θ stage 40. The effect is suppressed to a minimum.

此外,θ平台40利用配設於前述支柱60之下端之氣墊70,以利用氣壓於平臺20上進行靜壓浮起移動之方式獲得支持,承受到來自1對θ線性馬達84之旋轉力時,可於只有軸承82之旋轉抵抗會成為負荷之低摩擦狀態下,在θ z方向進行轉動。此外,θ線性馬達84可對應θ平台40之轉動角度而改變與磁軛86及線圈單元88之θ z方向之相對位置,故對應最大轉動角度之間隙形成於磁軛86及線圈單元88之間,而為磁軛86及線圈單元88不會互相干涉之構成。Further, the θ stage 40 is supported by the air cushion 70 disposed at the lower end of the strut 60 to perform static pressure floating movement on the platform 20 by air pressure, and when subjected to the rotational force from the pair of θ linear motors 84, The rotation can be performed in the θ z direction only in a low friction state in which the rotation of the bearing 82 is a load. Further, the θ linear motor 84 can change the relative position with respect to the θ z direction of the yoke 86 and the coil unit 88 in accordance with the rotation angle of the θ stage 40, so that a gap corresponding to the maximum rotation angle is formed between the yoke 86 and the coil unit 88. On the other hand, the yoke 86 and the coil unit 88 do not interfere with each other.

於Y載台38之內部,形成供Y載台36插通之空間120,於該空間120,配設著於X方向驅動X載台38之X線性馬達124。於Y載台36之兩端,配設著被沿著導引28進行導引移動之滑塊32,係與X載台38之內壁為非接觸之移動。Inside the Y stage 38, a space 120 through which the Y stage 36 is inserted is formed, and in this space 120, an X linear motor 124 that drives the X stage 38 in the X direction is disposed. At both ends of the Y stage 36, a slider 32 guided by the guide 28 is disposed to move non-contact with the inner wall of the X stage 38.

此外,Y載台36具有:用以支持與X載台38之內壁相對之氣墊122之垂直部36a;及裝設著X線性馬達124之平面部36b。氣墊122因為介由氣壓與空間120之Y方向之內壁相對,使X載台38於X方向移動時,空間120之內壁與氣墊122為非接觸下進行移動。此外,使Y載台36於Y方向移動時,介由來自氣墊122之氣壓將空間120之Y方向內壁朝移動方向推壓,而使X載台38於Y方向移動之構成。Further, the Y stage 36 has a vertical portion 36a for supporting the air cushion 122 opposed to the inner wall of the X stage 38, and a flat portion 36b to which the X linear motor 124 is mounted. Since the air cushion 122 is opposed to the inner wall of the space 120 in the Y direction, when the X stage 38 is moved in the X direction, the inner wall of the space 120 moves in non-contact with the air cushion 122. Further, when the Y stage 36 is moved in the Y direction, the Y-direction inner wall of the space 120 is pressed in the moving direction by the air pressure from the air cushion 122, and the X stage 38 is moved in the Y direction.

X線性馬達124係由於X方向延伸形成之磁軛(固定子)126及線圈單元(活動子)128所構成。從側面觀看時,磁軛126呈字形,於內壁之上下面並設著複數之永久磁鐵。此外,磁軛126係固定於Y載台36之平面部36b,線圈單元128則獲得固定於X載台38之內壁之托架130之支持。The X linear motor 124 is composed of a yoke (fixator) 126 and a coil unit (active member) 128 which are formed to extend in the X direction. When viewed from the side, the yoke 126 is The glyph is provided with a plurality of permanent magnets above and below the inner wall. Further, the yoke 126 is fixed to the flat portion 36b of the Y stage 36, and the coil unit 128 is supported by the bracket 130 fixed to the inner wall of the X stage 38.

其次,線圈單元128之複數線圈係配設於X方向,從磁軛126之磁鐵間之前方插入。因此,線圈單元128於對線圈進行通電時,會形成磁束,而得到對永久磁鐵之X方向之推力。此外,因為線圈單元128係介由托架130結合於X載台38,線圈單元128所得到之X方向推力會施加於X載台38。Next, the plurality of coils of the coil unit 128 are disposed in the X direction and inserted from the space between the magnets of the yoke 126. Therefore, when the coil unit 128 energizes the coil, a magnetic flux is formed to obtain a thrust in the X direction of the permanent magnet. Further, since the coil unit 128 is coupled to the X stage 38 via the bracket 130, the X-direction thrust obtained by the coil unit 128 is applied to the X stage 38.

因此,X載台38因為來自X線性馬達124之推力而被朝X方向驅動。其次,X線性馬達124之X方向推力介由樞軸80及軸承82而傳達至配載於X載台38上之θ平台40,而與X載台38一起於X方向移動。Therefore, the X stage 38 is driven in the X direction due to the thrust from the X linear motor 124. Next, the X-direction thrust of the X linear motor 124 is transmitted to the θ stage 40 mounted on the X stage 38 via the pivot 80 and the bearing 82, and moves together with the X stage 38 in the X direction.

此外,於用以支持θ平台40之支柱60,配設著用以調整高度之平準機構62。於該平準機構62,分別配設著4支支柱60,用以實施個別高度調整來維持θ平台40之水平精度。Further, a leveling mechanism 62 for adjusting the height is disposed on the pillar 60 for supporting the θ stage 40. The leveling mechanism 62 is provided with four pillars 60 for performing individual height adjustments to maintain the horizontal accuracy of the θ platform 40.

此外,X載台38於X方向及Y方向移動時,介由樞軸80及軸承82支持於X載台38上之θ平台40也於X方向及Y方向移動,且配設於支柱60之下端之氣墊70也利用氣壓於平臺20上進行靜壓浮起移動,而維持θ平台40之水平精度。Further, when the X stage 38 is moved in the X direction and the Y direction, the θ stage 40 supported by the pivot 80 and the bearing 82 on the X stage 38 is also moved in the X direction and the Y direction, and is disposed in the pillar 60. The lower end air cushion 70 also uses the air pressure to perform a static pressure floating movement on the platform 20 while maintaining the horizontal accuracy of the θ stage 40.

因此,載台裝置10A因為係使θ平台40以樞軸80之軸心為中心而於θ z方向轉動,即使X載台38之X方向及Y方向之移動位置發生誤差時,也可防止因為θ平台40之轉動位置而使誤差增大。因此,即使使載台30於Y方向移動後,使θ平台40於θ z方向轉動時,配設於θ平台40之上面42之鏡44與來自雷射干涉儀之雷射光之照射位置並無偏離,可以防止利用雷射干涉儀之位置檢測精度的降低。此外,載台裝置10A可防止例如應用曝光裝置時之相對於光學系之工件(晶圓等)位置因為θ平台40之轉動位置而偏離。Therefore, since the stage device 10A rotates the θ stage 40 around the axis of the pivot 80 in the θ z direction, even if an error occurs in the X-direction and the Y-direction movement position of the X stage 38, it is possible to prevent The rotational position of the θ stage 40 increases the error. Therefore, even if the θ stage 40 is rotated in the θ z direction after the stage 30 is moved in the Y direction, the mirror 44 disposed on the upper surface 42 of the θ stage 40 and the laser light from the laser interferometer are not irradiated. The deviation can prevent the detection accuracy of the position of the laser interferometer from being lowered. Further, the stage device 10A can prevent, for example, the position of the workpiece (wafer or the like) with respect to the optical system when the exposure device is applied, due to the rotational position of the θ stage 40.

[實施形態2][Embodiment 2]

第5圖係實施形態2之載台裝置之正面圖。第6圖係實施形態2之載台裝置之側剖面圖。此外,第5圖及第6圖中,與實施形態1相同之要素附與相同符號並省略其說明。Fig. 5 is a front elevational view showing the stage device of the second embodiment. Figure 6 is a side cross-sectional view showing the stage device of the second embodiment. In the fifth and sixth embodiments, the same components as those in the first embodiment are denoted by the same reference numerals, and their description is omitted.

如第5圖及第6圖所示,實施形態2之載台裝置10B具備:從θ平台40之下面垂直向下延伸之4支支柱60;及配設於各支柱60之下端,利用氣壓於X載台38上進行靜壓浮起移動之複數氣墊70。因此,支柱60及氣墊70直接支持著θ平台40,且於X載台38上進行移動。因此,θ平台40利用4支支柱60及4個氣墊70於X載台38之上面利用氣壓進行靜壓浮起移動,而且,可維持上面42之平面精度(水平精度)下與載台30一起移動。As shown in FIGS. 5 and 6, the stage device 10B of the second embodiment includes four pillars 60 extending vertically downward from the lower surface of the θ stage 40, and is disposed at the lower end of each of the pillars 60, and is pressurized by air. A plurality of air cushions 70 for static pressure floating movement are performed on the X stage 38. Therefore, the strut 60 and the air cushion 70 directly support the θ stage 40 and move on the X stage 38. Therefore, the θ stage 40 uses the four pillars 60 and the four air cushions 70 to perform static pressure floating movement on the X stage 38 by air pressure, and can maintain the plane accuracy (horizontal accuracy) of the upper surface 42 together with the stage 30. mobile.

此外,因為θ平台40之四角獲得4支支柱60及4個氣墊70的支持,可以防止轉動時以樞軸80為支點之擺動,而維持上面42之水平精度。Further, since the four corners of the θ stage 40 are supported by the four pillars 60 and the four air cushions 70, the pivoting with the pivot 80 as a fulcrum during rotation can be prevented, and the horizontal precision of the upper surface 42 can be maintained.

依據本實施形態之載台裝置,因為縮短支柱60之全長(高度方向之長度),故可提高移動X載台38時之θ平台40之安定性。According to the stage apparatus of the present embodiment, since the entire length (length in the height direction) of the support post 60 is shortened, the stability of the θ stage 40 when the X stage 38 is moved can be improved.

[變形例][Modification]

第7圖係本實施形態之變形例之載台裝置之正面圖。該變形例之載台裝置與第5圖所示之載台裝置,支柱60及氣墊70之位置係上下相反。具體而言,4支支柱60係固設於X載台38,並從該X載台38之上面垂直立起。此外,氣墊70係分別配設於各支柱60之上端,靜壓堆置於θ平台40。如此,將支柱60裝設於X載台38側,並以配設於其上端之氣墊70靜壓堆置於θ 平台40之構成,也與第5圖及第6圖所示之載台裝置相同,可以防止轉動θ平台40時以樞軸80為支點之擺動,而維持其上面42之水平精度。Fig. 7 is a front elevational view showing a stage device according to a modification of the embodiment. In the stage device of this modification and the stage device shown in Fig. 5, the positions of the support post 60 and the air cushion 70 are reversed. Specifically, the four pillars 60 are fixed to the X stage 38 and vertically erected from the upper surface of the X stage 38. In addition, the air cushions 70 are respectively disposed at the upper ends of the respective pillars 60, and the static pressure stack is placed on the θ platform 40. In this manner, the post 60 is mounted on the X stage 38 side, and is statically stacked on the θ stage 40 by the air cushion 70 disposed at the upper end thereof, and also the stage device shown in FIGS. 5 and 6 In the same manner, it is possible to prevent the pivot of the θ platform 40 with the pivot 80 as a fulcrum while maintaining the horizontal accuracy of the upper surface 42 thereof.

[實施形態3][Embodiment 3]

第8圖係實施形態3之載台裝置之正面圖。第9圖係實施形態3之載台裝置之側剖面圖。此外,第8圖及第9圖中,與上述實施形態1、2相同之要素附與相同符號並省略其說明。Fig. 8 is a front elevational view showing the stage device of the third embodiment. Figure 9 is a side cross-sectional view showing the stage device of the third embodiment. In the eighth and ninth embodiments, the same components as those in the first and second embodiments are denoted by the same reference numerals, and their description is omitted.

如第8圖所示,本實施形態之載台裝置10C與前述之實施形態1相同,於平臺20之左右側之隔著距離之位置配設著1對Y線性馬達50。Y線性馬達50之以從滑塊32之側面朝水平方向延伸之方式裝設之線圈單元54,從側方插入磁軛52之磁鐵間。此外,利用支持構件56將磁軛52支持於與滑塊32之側面相對之高度位置。As shown in Fig. 8, the stage device 10C of the present embodiment is the same as the first embodiment described above, and a pair of Y linear motors 50 are disposed at positions spaced apart from each other on the left and right sides of the stage 20. The coil unit 54 of the Y linear motor 50 that is disposed to extend in the horizontal direction from the side surface of the slider 32 is inserted between the magnets of the yoke 52 from the side. Further, the yoke 52 is supported by the support member 56 at a height position opposite to the side of the slider 32.

因此,載台裝置10C時,Y線性馬達50之反作用力介由支持構件56傳播至地面。因此,係Y線性馬達50之反作用力不會傳達至Y載台36及X載台38之構成,相對地,可以防止載台30之位置控制誤差,而安定且精密地控制載台30之轉動位置。Therefore, in the stage device 10C, the reaction force of the Y linear motor 50 propagates to the ground through the support member 56. Therefore, the reaction force of the linear motor 50 is not transmitted to the Y stage 36 and the X stage 38. In contrast, the position control error of the stage 30 can be prevented, and the rotation of the stage 30 can be stably and precisely controlled. position.

此外,載台裝置10C時,與前述之實施形態1相同,配設於各支柱60之下端之複數氣墊70係於X載台38上進行靜壓浮起移動之構成。因此,支柱60及氣墊70支持著θ平台40並於X載台38上移動,可維持θ平台40之平面精度(水平精度)並與載台30一起移動。Further, in the stage device 10C, as in the first embodiment, the plurality of air cushions 70 disposed at the lower end of each of the pillars 60 are attached to the X stage 38 to perform a static pressure floating movement. Therefore, the support 60 and the air cushion 70 support the θ stage 40 and move on the X stage 38, and the plane accuracy (horizontal accuracy) of the θ stage 40 can be maintained and moved together with the stage 30.

此外,1對θ線性馬達84,與前述之實施形態1相同,係配設於θ平台40之下方。其次,用以構成θ線性馬達84之磁軛86係獲得立起於X載台38上之支持部90之支持。此外,線圈單元88係從X載台38之下面朝下方突出。此外,θ線性馬達84係以與後述之滑塊32之側方隔著間隔之方式立設於地面上,係θ線性馬達84不會受到移動滑塊32時之振動的影響之構成Further, the pair of θ linear motors 84 are disposed below the θ stage 40 in the same manner as in the first embodiment described above. Next, the yoke 86 for constituting the θ linear motor 84 is supported by the support portion 90 standing on the X stage 38. Further, the coil unit 88 protrudes downward from the lower surface of the X stage 38. Further, the θ linear motor 84 is erected on the ground at a distance from the side of the slider 32 to be described later, and the θ linear motor 84 is not affected by the vibration when the slider 32 is moved.

此外,從上方觀看時,1對θ線性馬達84係平行配設以樞軸80為中心之對稱位置,對線圈單元88進行通電,會產生以樞軸80為中心之偶力,從側面使θ平台40於θ z方向進行轉動。Further, when viewed from above, the pair of θ linear motors 84 are arranged in parallel with the symmetrical position centered on the pivot 80, and energization of the coil unit 88 generates a force centered on the pivot 80, and θ is made from the side. The platform 40 is rotated in the θ z direction.

如第8圖所示,載台裝置10C時,與前述之實施形態1相同,配設於各支柱60之下端之複數氣墊70係於X載台38上進行靜壓浮起移動之構成。因此,支柱60及氣墊70一邊直接支持著θ平台40,一邊於X載台38上移動,可以維持θ平台40之平面精度(水平精度)並與載台30一起移動。As shown in Fig. 8, in the stage device 10C, as in the first embodiment, the plurality of air cushions 70 disposed at the lower ends of the respective pillars 60 are attached to the X stage 38 to perform a static pressure floating movement. Therefore, the support 60 and the air cushion 70 directly support the θ stage 40, and move on the X stage 38, thereby maintaining the plane accuracy (horizontal accuracy) of the θ stage 40 and moving together with the stage 30.

如第8圖所示,於θ平台40及X載台38之間,配設著高度調整機構200。該高度調整機構200具有;具有樞軸80之支持板210;及用以調整支持板210之高度位置之1對平準單元220。As shown in Fig. 8, a height adjustment mechanism 200 is disposed between the θ stage 40 and the X stage 38. The height adjustment mechanism 200 has a support plate 210 having a pivot 80 and a pair of leveling units 220 for adjusting the height position of the support plate 210.

支持板210之上面中央立起著一體之樞軸80,此外,上面四角配設著與θ 平台40之下面相對之氣墊212。因此,θ 平台40承受到來自1對θ 線性馬達84之旋轉力(偶力)時,以樞軸80之軸心為旋轉中心於θz方向進行安定地轉動。An integral pivot 80 is erected in the upper center of the support plate 210. Further, the upper four corners are provided with an air cushion 212 opposite to the lower surface of the θ platform 40. Therefore, when the θ stage 40 receives the rotational force (the even force) from the pair of θ linear motors 84, the θ stage 40 is stably rotated in the θz direction with the axis of the pivot 80 as the center of rotation.

如前面所述,因為垂直配設θ 線性馬達84,並以可相對於磁軛86在Y方向及上方(Z方向)進行相對移動之方式來配設線圈單元88。因此,利用高度調整機構200使θ 平台40進行昇降時,θ 線性馬達84之磁軛86及線圈單元88不會互相干涉,而以不會妨礙θ 平台40之昇降動作之方式來配設θ 線性馬達84。As described above, the θ linear motor 84 is disposed vertically, and the coil unit 88 is disposed so as to be relatively movable in the Y direction and the upper direction (Z direction) with respect to the yoke 86. Therefore, when the θ stage 40 is raised and lowered by the height adjustment mechanism 200, the yoke 86 and the coil unit 88 of the θ linear motor 84 do not interfere with each other, and the θ linearity is arranged so as not to interfere with the lifting operation of the θ stage 40. Motor 84.

如第9圖所示,平準單元220係由支持於氣墊70之下部塊230;及垂吊於支持板210之下面之上部塊240;以及配設於下部塊230及上部塊240之間之致動器250所構成。下部塊230係以沿著Y方向延伸之方式配設,下面則配設著於X載台38上進行靜壓浮起移動之複數氣墊70。As shown in FIG. 9, the leveling unit 220 is supported by the lower block 230 of the air cushion 70; and is suspended from the lower portion 240 of the support plate 210; and is disposed between the lower block 230 and the upper block 240. The actuator 250 is constructed. The lower block 230 is disposed to extend in the Y direction, and the lower portion is disposed on the X stage 38 to perform a plurality of air cushions 70 for static pressure floating movement.

此外。於下部塊230之上部,配設著1對傾斜部232、及凹部234。1對傾斜部232分別具有相對於水平面為相同方向且相同角度之傾斜面,第9圖中,係以左側較低、右側較高之傾斜方向來形成。Also. A pair of inclined portions 232 and a concave portion 234 are disposed on the upper portion of the lower block 230. The pair of inclined portions 232 respectively have inclined surfaces of the same direction and the same angle with respect to the horizontal plane, and in the figure 9, the left side is lower. The upper side is formed by a higher oblique direction.

此外,於上部塊240之上部,配設著相對於支持板210之下面以低摩擦進行滑動之滑動構件260。該滑動構件260只要為高剛性、高耐摩耗性、低摩擦之構件即可,例如,由不鏽鋼或表面實施鐵氟龍(登錄商標)加工之高硬度金屬所構成。此外,於上部塊240之下部,配設著一對之傾斜部242、及凹部244。1對傾斜部242分別具有相對於水平面為相同方向、且相同角度之傾斜面,且朝與上述傾斜部232平行之傾斜方向傾斜。Further, on the upper portion of the upper block 240, a sliding member 260 that slides with a low friction with respect to the lower surface of the support plate 210 is disposed. The sliding member 260 may be a member having high rigidity, high abrasion resistance, and low friction, and is made of, for example, stainless steel or a high-hardness metal whose surface is processed by Teflon (registered trademark). Further, a pair of inclined portions 242 and a concave portion 244 are disposed at a lower portion of the upper block 240. The pair of inclined portions 242 respectively have inclined surfaces of the same direction and at the same angle with respect to the horizontal plane, and are inclined toward the inclined portion. 232 is inclined in parallel with the tilt direction.

此外,於上部塊240之各傾斜部242之內部,形成貫通上下方向(Z方向)之貫通孔246,於該各貫通孔246之內部,分別插通比立起於比傾斜部232更上方之支柱270。其次,支柱270之橫剖面形狀為長方形(相對於圖中之Z軸方向之剖面形狀係X軸方向較短、Y軸方向較長之長方形),且其上端,與支持板210之下面相對並離著一段距離。此外,各貫通孔246之開口形狀為X軸方向較短、Y軸方向較長之長方形狀,係插通於該貫通孔246之支柱270,相對於貫通孔246,只可於Y軸方向進行相對移動之構成。此處,支柱270係連結於下部塊230,另一方面,貫通孔246係形成於上部塊240。為了使上部塊240可相對於下部塊230於Y軸方向移動,實際上,支柱270係可相對於貫通孔246而於Y軸方向移動。後面將針對該移動原理進行說明。Further, inside the inclined portions 242 of the upper block 240, through holes 246 penetrating in the vertical direction (Z direction) are formed, and the insertion holes are respectively formed above the inclined portions 232. Pillar 270. Next, the cross-sectional shape of the pillar 270 is a rectangle (a cross-sectional shape in the Z-axis direction in the drawing is a rectangle having a short X-axis direction and a long Y-axis direction), and an upper end thereof is opposite to the lower surface of the support plate 210. A distance away. Further, the opening shape of each of the through holes 246 is a rectangular shape having a short X-axis direction and a long Y-axis direction, and is inserted into the support 270 of the through hole 246, and is only movable in the Y-axis direction with respect to the through hole 246. The composition of relative movement. Here, the support 270 is coupled to the lower block 230, and the through hole 246 is formed in the upper block 240. In order to move the upper block 240 in the Y-axis direction with respect to the lower block 230, in practice, the support 270 is movable in the Y-axis direction with respect to the through hole 246. This principle of movement will be described later.

配置於凹部234及凹部244之間之致動器250,例如,係由利用馬達驅動滾珠螺桿機構而發生Y方向之驅動力之構成的驅動手段等所構成,左端支桿252係結合於上部塊240,右端支桿254則結合於下部塊230。The actuator 250 disposed between the concave portion 234 and the concave portion 244 is constituted by, for example, a driving means that generates a driving force in the Y direction by driving a ball screw mechanism by a motor, and the left end strut 252 is coupled to the upper block. 240, the right end strut 254 is coupled to the lower block 230.

此外,於傾斜部232及傾斜部242之間,介設著用以減輕滑動抵抗之低摩擦構件280。該低摩擦構件280亦可以由與擺動構件260相同之材質所構成,只要為高剛性、高耐摩耗性、低摩擦之構件即可,例如,由不鏽鋼或表面經過鐵氟龍(登錄商標)加工之高硬度金屬所構成。Further, between the inclined portion 232 and the inclined portion 242, a low friction member 280 for reducing sliding resistance is interposed. The low-friction member 280 may be made of the same material as the swinging member 260, as long as it is a member having high rigidity, high abrasion resistance, and low friction, for example, processed by stainless steel or surface by Teflon (registered trademark). Made of high hardness metal.

例如,致動器250之驅動力以使左端支桿252及右端支桿254朝互相接近之方向作用時,上部塊240之傾斜部242相對於下部塊230之傾斜部232朝右方移動。因此,上部塊240會相對於下部塊230而對應傾斜部232、242之傾斜角度進行上昇,而使支持板210及θ平台40上昇。For example, when the driving force of the actuator 250 causes the left end strut 252 and the right end strut 254 to approach each other, the inclined portion 242 of the upper block 240 moves to the right with respect to the inclined portion 232 of the lower block 230. Therefore, the upper block 240 rises in accordance with the inclination angle of the inclined portions 232 and 242 with respect to the lower block 230, and the support plate 210 and the θ stage 40 are raised.

此外,致動器250之驅動力以使左端支桿252及右端支桿254朝互相離開之方向作用時,上部塊240之傾斜部242相對於下部塊230之傾斜部232朝左方移動。因此,上部塊240會相對於下部塊230而對應傾斜部232、242之傾斜角度進行下降,而使支持板210及θ平台40下降。Further, when the driving force of the actuator 250 acts to cause the left end strut 252 and the right end strut 254 to move away from each other, the inclined portion 242 of the upper block 240 moves to the left with respect to the inclined portion 232 of the lower block 230. Therefore, the upper block 240 is lowered relative to the lower block 230 by the inclination angles of the corresponding inclined portions 232, 242, and the support plate 210 and the θ stage 40 are lowered.

因此,載台裝置10C時,利用來自1對θ線性馬達84之旋轉力(偶力),可使θ平台40於θ z方向轉動,而且,利用高度調整機構200之致動器250之驅動方向,可使θ平台40上昇或下降而調整高度位置。Therefore, in the stage device 10C, the θ stage 40 can be rotated in the θ z direction by the rotational force (the even force) from the pair of θ linear motors 84, and the driving direction of the actuator 250 of the height adjusting mechanism 200 can be utilized. The θ platform 40 can be raised or lowered to adjust the height position.

上述實施形態,係以軸承82軸支樞軸80之上端外側,而以可轉動之方式支持θ平台40之構成為例來進行說明,然而,並未受限於此,例如,樞軸80之上端之形狀形成為圓錐形狀或半球形狀,並配設對應於其前端之形狀的軸承亦可。The above embodiment is described by taking the configuration in which the bearing 82 supports the θ platform 40 in a rotatable manner, but is not limited thereto. For example, the pivot 80 The shape of the upper end is formed into a conical shape or a hemispherical shape, and a bearing corresponding to the shape of the front end thereof may be provided.

以上,係針對本發明之例示實施形態之載台裝置進行說明,然而,具體而言,本發明並未受限於上述實施形態,只要未背離申請專利範圍,可以實施各種變形或變更。The above is a description of the stage device according to the exemplary embodiment of the present invention. However, the present invention is not limited to the above-described embodiments, and various modifications and changes can be made without departing from the scope of the invention.

本發明之載台裝置可以應用於液晶面板或半導體元件等之製造製程。The stage device of the present invention can be applied to a manufacturing process of a liquid crystal panel or a semiconductor element or the like.

10A、10B、10C...載台裝置10A, 10B, 10C. . . Stage device

20...平臺20. . . platform

28...Y方向導軌28. . . Y direction guide

30...載台30. . . Loading platform

32...滑塊32. . . Slider

34、70...氣墊34, 70. . . air cushion

36...Y載台36. . . Y stage

38...X載台38. . . X stage

40...θ平台40. . . θ platform

50...Y線性馬達50. . . Y linear motor

60...支柱60. . . pillar

80...樞軸80. . . Pivot

82...軸承82. . . Bearing

84...θ線性馬達84. . . θ linear motor

86...磁軛86. . . Yoke

88...線圈單元88. . . Coil unit

122...X導軌122. . . X rail

I24...X線性馬達I24. . . X linear motor

第1圖係實施形態1之載台裝置之斜視圖。Fig. 1 is a perspective view showing a stage device of the first embodiment.

第2圖係實施形態1之載台裝置之正面圖。Fig. 2 is a front elevational view showing the stage device of the first embodiment.

第3圖係實施形態1之載台裝置之平面圖。Fig. 3 is a plan view showing the stage device of the first embodiment.

第4圖係從側方觀看實施形態1之載台裝置之載台及θ平台時之側剖面圖。Fig. 4 is a side cross-sectional view showing the stage of the stage device and the θ stage of the first embodiment viewed from the side.

第5圖係實施形態2之載台裝置之正面圖。Fig. 5 is a front elevational view showing the stage device of the second embodiment.

第6圖係實施形態2之載台裝置之側剖面圖。Figure 6 is a side cross-sectional view showing the stage device of the second embodiment.

第7圖係實施形態2之變形例之載台裝置之正面圖。Fig. 7 is a front elevational view showing a stage device according to a modification of the second embodiment.

第8圖係實施形態3之載台裝置之正面圖。Fig. 8 is a front elevational view showing the stage device of the third embodiment.

第9圖係從側方觀看實施形態3之載台裝置時之側剖面圖。Fig. 9 is a side cross-sectional view showing the stage device of the third embodiment as seen from the side.

10A...載台裝置10A. . . Stage device

20...平臺20. . . platform

30...載台30. . . Loading platform

32...滑塊32. . . Slider

34...氣墊34. . . air cushion

36...Y載台36. . . Y stage

38...X載台38. . . X stage

40...θ平台40. . . θ platform

42...上面42. . . Above

44...鏡44. . . mirror

50...Y線性馬達50. . . Y linear motor

52...磁軛52. . . Yoke

54...線圈單元54. . . Coil unit

56...支持構件56. . . Support component

60...支柱60. . . pillar

70...氣墊70. . . air cushion

80...樞軸80. . . Pivot

82...軸承82. . . Bearing

84...θ線性馬達84. . . θ linear motor

86...磁軛86. . . Yoke

88...線圈單元88. . . Coil unit

Claims (6)

一種載台裝置,係具有:平臺;及在平臺上可朝垂直相交的2軸方向移動之載台;及將該載台朝前述2軸方向驅動的第1線性馬達及第2線性馬達;及可與前述載台一起朝前述2軸方向移動且可在前述載台上轉動之θ 平台;及樞軸,可於前述載台及前述θ平台之間垂直立起;及軸承,以使前述θ 平台可相對於前述載台進行轉動之方式,軸支於前述樞軸及前述θ 平台之間、或軸支於前述載台及前述樞軸之間;及θ 線性馬達,從下面側對前述θ 平台實施旋轉驅動;以及支持手段,於前述平臺及前述載台之間,用以支持前述θ 平台;且前述θ 線性馬達之固定子係配設於前述載台上,前述θ 線性馬達之活動子係配設於前述θ 平台之下面。A stage device comprising: a platform; and a stage movable on a platform in a direction perpendicular to the two-axis direction; and a first linear motor and a second linear motor that drive the stage in the two-axis direction; and a θ platform movable in the two-axis direction together with the stage and rotatable on the stage; and a pivot that can be vertically erected between the stage and the θ stage; and a bearing to make the θ The platform is rotatable relative to the stage, the shaft is supported between the pivot and the θ platform, or the shaft is supported between the stage and the pivot; and the θ linear motor is opposite to the θ from the lower side. The platform implements a rotary drive; and a support means between the platform and the carrier to support the θ platform; and the fixed stator of the θ linear motor is disposed on the stage, and the θ linear motor is active It is disposed below the aforementioned θ platform. 一種載台裝置,係具有:平臺;及在平臺上可朝垂直相交的2軸方向移動之載台;及將該載台朝前述2軸方向驅動的第1線性馬達及第2線性馬達;及可與前述載台一起朝前述2軸方向移動且可在前述載 台上轉動之θ 平台;樞軸,垂直立起於前述載台上面;及軸承,軸支於前述樞軸及前述θ 平台之間;及θ 線性馬達,從下面側對前述θ 平台實施旋轉驅動;以及支持手段,於前述平臺及前述載台之間,用以支持前述θ 平台;且前述θ 線性馬達之固定子係配設於前述載台上,前述θ 線性馬達之活動子係配設於前述θ 平台之下面。A stage device comprising: a platform; and a stage movable on a platform in a direction perpendicular to the two-axis direction; and a first linear motor and a second linear motor that drive the stage in the two-axis direction; and a θ platform movable in the two-axis direction together with the aforementioned stage and rotatable on the stage; a pivot standing vertically above the stage; and a bearing supported by the pivot and the θ platform And the θ linear motor, the θ platform is rotationally driven from the lower side; and a supporting means is provided between the platform and the carrier to support the θ platform; and the fixed linear system of the θ linear motor is disposed On the aforementioned stage, the active sub-system of the θ linear motor is disposed below the θ platform. 如申請專利範圍第1或2項所記載之載台裝置,其中前述支持手段含有:複數之支柱,於前述θ 平台之下面垂直延伸;及複數之氣墊,分別配設於前述複數之支柱之下端,靜壓堆置於前述平臺上或前述載台上。The stage device as claimed in claim 1 or 2, wherein the support means comprises: a plurality of pillars extending vertically below the θ platform; and a plurality of air cushions respectively disposed at the lower ends of the plurality of pillars The static pressure reactor is placed on the aforementioned platform or on the aforementioned stage. 如申請專利範圍第1或2項所記載之載台裝置,其中前述支持手段含有:複數之支柱,於前述平臺或前述載台垂直向上方延伸;及複數之氣墊,配設於該支柱之上端,靜壓堆置於前述θ載台。 The stage device according to claim 1 or 2, wherein the support means includes: a plurality of pillars extending vertically upward from the platform or the stage; and a plurality of air cushions disposed at an upper end of the pillar The static pressure reactor is placed on the aforementioned θ stage. 如申請專利範圍第1或2項所記載之載台裝置,其中 前述軸承係由交叉軸承所構成。 The stage device as recited in claim 1 or 2, wherein The aforementioned bearing is composed of a cross bearing. 如申請專利範圍第1或2項所記載之載台裝置,其中前述載台係可在前述平臺上之該載台之上面之垂直相交之2軸方向平行移動之XY載台,前述XY載台含有:Y載台,在Y方向移動;及X載台,配載於前述Y載台之上,在X方向移動;且前述θ 方向線性馬達之固定子配載於前述X載台之上。The stage device according to claim 1 or 2, wherein the stage is an XY stage in which the stage can be moved in parallel in a direction perpendicular to the perpendicular direction of the upper surface of the stage on the stage, the XY stage The Y stage includes: a Y stage that moves in the Y direction; and an X stage that is loaded on the Y stage and moves in the X direction; and the stator of the θ direction linear motor is placed on the X stage.
TW096107018A 2006-03-02 2007-03-01 Stage device TWI457193B (en)

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KR102134789B1 (en) * 2019-11-14 2020-07-16 시너스텍 주식회사 Rotate unit
CN112268549A (en) * 2020-10-14 2021-01-26 温州职业技术学院 Adjustable image testing arrangement of information technology
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KR20070090803A (en) 2007-09-06
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CN101030551A (en) 2007-09-05
TW200740550A (en) 2007-11-01

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